Touch probe and related checking method with minimization of thermal and electrical noise
Номер патента: EP2633266A2
Опубликовано: 04-09-2013
Автор(ы): Antonio Gambini, Carlo Dall'Aglio
Принадлежит: Marposs Spa
Опубликовано: 04-09-2013
Автор(ы): Antonio Gambini, Carlo Dall'Aglio
Принадлежит: Marposs Spa
Реферат: A touch probe (1;1';1'';1''' ) for applications in machine tools or measuring machines includes a support frame (2) with a protective casing (3), and a movable armset (5) with a feeler (11) to touch a part to be checked (13). The probe includes a detection device (23) with a laminar piezoelectric transducer (25) made of polymeric material, such as polyvinylidene fluoride, which is connected to the support frame and fixed at a bearing and locating area (7), on which the movable armset rests in a position defined by an isostatic rest system (17). Conditioning electronics (30) connected to the support frame include processing means for processing a force signal (M) provided by the detection device, comparing it with a threshold value (S) and generating a touch signal (T). The conditioning electronics include differential charge amplifiers (3) and a processing system (55) to dynamically vary the threshold value depending on the most recent values of the force signal detected.
Touch probe and related checking method with minimization of thermal and electrical noise
Номер патента: WO2012055868A3. Автор: Carlo Dall'Aglio,Antonio Gambini. Владелец: Marposs Societa' Per Azioni. Дата публикации: 2013-08-22.