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18-03-2008 дата публикации

Topographically defined thin film CPP read head fabrication

Номер: US0007344330B2

Автор: David Eugene Heim, Kim Y. Lee, Tsann Lin, Jih-Shiuan Luo, HEIM DAVID EUGENE, LEE KIM Y, LIN TSANN, LUO JIH-SHIUAN, LEE KIM Y.

Принадлежит: Hitachi Global Storage Technologies Netherlands B.V., HITACHI GLOBAL STORAGE TECH, HITACHI GLOBAL STORAGE TECHNOLOGIES NETHERLANDS B.V.

A method of constructing a small trackwidth magnetorsesistive sensor by defining a trench between first and second hard bias layers and depositing the sensor into the trench.

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Номер записи: 1

03-02-2005 дата публикации

Method and apparatus for enhancing thermal stability, improving biasing and reducing damage from electrostatic discharge in self-pinned abutted junction heads having a second hard bias layer disposed away from the free layer

Номер: US20050024784A1

Автор: Hardayal Gill, Wen-Chien Hsiao, Jih-Shiuan Luo

Принадлежит:

A method and apparatus for enhancing thermal stability, improving biasing and reducing damage from electrical surges in self-pinned abutted junction heads. The head includes a sandwiched hard bias layer having a first hard bias layer coupled to a free layer and a second, anti-parallel hard bias layer disposed away form the free layer to provide a net longitudinal bias on the free layer.

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Номер записи: 2

04-07-2006 дата публикации

Method and apparatus for providing a self-pinned bias layer that extends beyond the ends of the free layer

Номер: US0007072154B2

Автор: Hardayal Singh Gill, Wen-Chien Hsiao, Jih-Shiuan Luo, GILL HARDAYAL SINGH, HSIAO WEN-CHIEN, LUO JIH-SHIUAN

Принадлежит: Hitachi Global Storage Technologies Netherlands B.V., HITACHI GLOBAL STORAGE TECH, HITACHI GLOBAL STORAGE TECHNOLOGIES NETHERLANDS B.V.

A method and apparatus for enhancing thermal stability, improving biasing and reducing damage from electrical surges in self-pinned abutted junction heads. The head includes a free layer having a first end and a second end defining a width selected to form a desired trackwidth and an extended self-pinned bias layer extending beyond the ends of the free layer, the self-pinned bias layer extending beyond the free layer increasing the volume of the extended self-pinned bias layer to provide greater thermal stability and stronger pinning of the free layer.

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Номер записи: 3

23-01-2007 дата публикации

Individual slider testing

Номер: US0007165462B2

Автор: Jih-Shiuan Luo, Ali Sanayei, LUO JIH-SHIUAN, SANAYEI ALI

Принадлежит: Hitachi Global Storage Technologies Netherlands B.V., HITACHI GLOBAL STORAGE TECH, HITACHI GLOBAL STORAGE TECHNOLOGIES NETHERLANDS B.V.

Systems and methods of testing individual sliders are disclosed. One embodiment is a test system that includes a mechanical stress system, a quasi-static measurement system, a transport system, and a slider holder. The individual sliders to be tested are aligned in a row in the slider holder, and the slider holder secures the sliders. The measurement system performs quasi-static measurements on sliders in the slider holder simultaneously. The transport system then transports the slider holder to the mechanical stress system. The mechanical stress system applies mechanical stress to the sliders in slider holder. The transport system then transports the slider holder again to the quasi-static measurement system. This process repeats a desired number of times to complete testing.

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Номер записи: 4

03-02-2005 дата публикации

Method and apparatus for enhancing thermal stability, improving biasing and reducing damage from electrostatic discharge in self-pinned abutted junction heads having a self-pinned bias layer extending beyond the free layer

Номер: US20050024785A1

Автор: Hardayal Gill, Wen-Chien Hsiao, Jih-Shiuan Luo

Принадлежит:

A method and apparatus for enhancing thermal stability, improving biasing and reducing damage from electrical surges in self-pinned abutted junction heads. The head includes a free layer having a first end and a second end defining a width selected to form a desired trackwidth and an extended self-pinned bias layer extending beyond the ends of the free layer, the self-pinned bias layer extending beyond the free layer increasing the volume of the extended self-pinned bias layer to provide greater thermal stability and stronger pinning of the free layer.

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Номер записи: 5

02-08-2022 дата публикации

Optimized dual thermal fly-height design for dual writers for advanced magnetic recording

Номер: US0011404080B2

Автор: Quang Le, Jih-Shiuan Luo, Thao A. Nguyen, Kuok San Ho

Принадлежит: Western Digital Technologies, Inc.

The present disclosure generally relates to a magnetic media drive employing a magnetic recording head. The magnetic recording head comprises a first write head and a second write head each coupled to a first pad and a second pad of a slider pad and an electrical circuit coupled to the first and second pads. The first write head is a wide writing write head, and the second write head a narrow writing write head. The electrical circuit comprises a first sub-circuit and a second sub-circuit connected in parallel. The first sub-circuit comprises a capacitor and a connection to a first thermal fly height control (TFC) of the first write head. The second sub-circuit comprises an inductor and a connection to a second TFC of the second write head. The electrical circuit is further connected to a third TFC of a read head, the second write head comprising the read head.

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Номер записи: 6

28-03-2006 дата публикации

Self-pinned spin valve sensor having its first AP pinned layer thicker than its second AP pinned layer to reduce the likelihood of amplitude flip

Номер: US0007019949B2

Автор: James Mac Freitag, Hardayal Singh Gill, Jih-Shiuan Luo, Mustafa Michael Pinarbasi, FREITAG JAMES MAC, GILL HARDAYAL SINGH, LUO JIH-SHIUAN, PINARBASI MUSTAFA MICHAEL

Принадлежит: Hitachi Global Storage Technologies Netherlands B.V., HITACHI GLOBAL STORAGE TECH, HITACHI GLOBAL STORAGE TECHNOLOGIES NETHERLANDS B.V.

In one illustrative example, a spin valve (SV) sensor of the self-pinned type includes a free layer; an antiparallel (AP) self-pinned layer structure; and a non-magnetic electrically conductive spacer layer in between the free layer and the AP self-pinned layer structure. The AP self-pinned layer structure includes a first AP pinned layer having a first thickness; a second AP pinned layer having a second thickness; and an antiparallel coupling (APC) layer formed between the first and the second AP pinned layers. The first thickness is slightly greater than the second thickness. Configured as such, the AP pinned layer structure provides for a net magnetic moment that is in the same direction as a magnetic field produced by the sense current flow, which reduces the likelihood of amplitude flip in the SV sensor.

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Номер записи: 7

22-03-2007 дата публикации

Read sensor defined by lateral stack templates and method for fabrication

Номер: US20070064353A1

Автор: David Heim, Kim Lee, Tsann Lin, Jih-Shiuan Luo, Chun-Ming Wang

Принадлежит: Hitachi Global Storage Technologies Netherlands BV

A method is disclosed for fabricating a read sensor for a magnetic head for a hard disk drive having a read sensor stack and two lateral stacks. The method of fabrication includes forming lateral stacks on a gap layer, surrounding a groove to form a template. The read sensor stack is then formed in the groove, which defines the lateral dimensions of the read sensor stack, and lead layers are then formed on the lateral stacks. Also disclosed is a read head for a disk drive having a sensor stack defined by pre-established lateral stacks, and a disk drive having the read head.

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Номер записи: 8

02-07-2013 дата публикации

Method for enhancing thermal stability, improving biasing and reducing damage from electrostatic discharge in self-pinned abutted junction heads

Номер: US0008474127B2

Автор: Hardayal Singh Gill, Wen-Chien Hsiao, Jih-Shiuan Luo, GILL HARDAYAL SINGH, HSIAO WEN-CHIEN, LUO JIH-SHIUAN

Принадлежит: HGST Netherlands B.V., GILL HARDAYAL SINGH, HSIAO WEN-CHIEN, LUO JIH-SHIUAN, HGST NETHERLANDS BV, HGST NETHERLANDS B.V.

A method for enhancing thermal stability, improving biasing and reducing damage from electrical surges in self-pinned abutted junction heads. The method includes forming a free layer, forming first hard bias layers abutting the free layer and forming second hard bias layers over the first hard bias layers discontiguous from the free layer, the second hard bias layers being anti-parallel to the first hard bias layers, the first and second hard bias layers providing a net longitudinal bias on the free layer.

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Номер записи: 9

23-10-2003 дата публикации

Method for the rapid measurement of magnetoresistive read head dimensions

Номер: US20030197854A1

Автор: Ciaran Fox, Peter Melz, Jih-Shiuan Luo, Joseph Smyth, Chin-Yu Yeh

Принадлежит: INTERNATIONAL BUSINESS MACHINES CORPORATION

An automated production process for the screening of the read-width (RW) and/or the stripe-height (SH) for every magnetoresistive (MR) read sensor element in a wafer substrate. The method of this invention uses the RW and/or SH values found with optical examination by electron microscopy of several of the MR sensor elements to estimate two substrate coefficients that relates the optical RW and SH measurements to heating-delta measurements, δ=(RH−RC)/RC, where RH is the sensor resistance when hot and RC is the sensor resistance when cold, both of which can be measured using automated equipment. These relationships are sufficiently similar among all MR sensor elements manufactured on a single wafer substrate during a single manufacturing procedure that, when the hot resistance RH is measured at a constant applied voltage, the heating-delta, may be used with a first substrate coefficient to estimate the read-width RW of each MR sensor element for quality-control purposes during manufacture ...

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Номер записи: 10

16-12-2008 дата публикации

Self-pinned spin valve sensor having its first AP pinned layer thicker than its second AP pinned layer to reduce the likelihood of amplitude flip

Номер: US0007466524B2

Автор: James Mac Freitag, Hardayal Singh Gill, Jih-Shiuan Luo, Mustafa Michael Pinarbasi, FREITAG JAMES MAC, GILL HARDAYAL SINGH, LUO JIH-SHIUAN, PINARBASI MUSTAFA MICHAEL

Принадлежит: Hitachi Global Storage Technologies Netherlands B.V., HITACHI GLOBAL STORAGE TECH, HITACHI GLOBAL STORAGE TECHNOLOGIES NETHERLANDS B.V.

In one illustrative example, a spin valve (SV) sensor of the self-pinned type includes a free layer; an antiparallel (AP) self-pinned layer structure; and a non-magnetic electrically conductive spacer layer in between the free layer and the AP self-pinned layer structure. The AP self-pinned layer structure includes a first AP pinned layer having a first thickness; a second AP pinned layer having a second thickness; and an antiparallel coupling (APC) layer formed between the first and the second AP pinned layers. The first thickness is slightly greater than the second thickness. Configured as such, the AP pinned layer structure provides for a net magnetic moment that is in the same direction as a magnetic field produced by the sense current flow, which reduces the likelihood of amplitude flip in the SV sensor.

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Номер записи: 11

27-11-2003 дата публикации

Nonvolatile memory device utilizing spin-valve-type designs and current pulses

Номер: US20030218903A1

Автор: Jih-Shiuan Luo

Принадлежит: INTERNATIONAL BUSINESS MACHINES

A memory device includes a plurality of memory elements each having: an antiferromagnetic layer, a first pinned layer coupled to the antiferromagnetic layer, a nonmagnetic spacer layer coupled to the first pinned layer, a second pinned layer coupled to the spacer, and a free layer coupled to the second pinned layer. A plurality of single wiring circuits are provided, each wiring circuit being coupled to a memory element. An addressing mechanism applies current pulses to the memory elements via the single wiring circuits for writing to the memory elements. The addressing mechanism also applies a sense current to the memory elements via the single wiring circuits for reading the memory elements.

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Номер записи: 12

19-01-2006 дата публикации

System, method, and apparatus for handling and testing individual sliders in a row-like format in single slider processing systems

Номер: US20060012360A1

Автор: Jih-Shiuan Luo, Ali Sanayei, Darrick Smith

Принадлежит: Hitachi Global Storage Technologies Netherlands B.V.

A device for handling and testing individual sliders in a row-like format utilizes an elongated, row-like holder having a series of small pockets, each of which receives a single slider. After the sliders enter the holder, a clamp is moved to a closed position to retain the sliders in the holder. The holder is placed in a test fixture such that permanently mounted probes precisely engage the small pads on the sliders for multiple testing purposes. Enlarged probe pads on the test fixture are electrically interconnected with the probes to provide an operator with easy access to the slider pads. The sliders are tested in a row-like format, side by side, to reduce handling-induced electrostatic discharge and mechanical damage.

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Номер записи: 13

12-04-2005 дата публикации

Nonvolatile memory device utilizing spin-valve-type designs and current pulses

Номер: US0006879512B2

Автор: Jih-Shiuan Luo, LUO JIH-SHIUAN

Принадлежит: International Business Machines Corporation, IBM, INTERNATIONAL BUSINESS MACHINES CORPORATION

A memory device includes a plurality of memory elements each having: an antiferromagnetic layer, a first pinned layer coupled to the antiferromagnetic layer, a nonmagnetic spacer layer coupled to the first pinned layer, a second pinned layer coupled to the spacer, and a free layer coupled to the second pinned layer. A plurality of single wiring circuits are provided, each wiring circuit being coupled to a memory element. An addressing mechanism applies current pulses to the memory elements via the single wiring circuits for writing to the memory elements. The addressing mechanism also applies a sense current to the memory elements via the single wiring circuits for reading the memory elements.

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Номер записи: 14

28-02-2006 дата публикации

System and method for decreasing ESD damage during component level long term testing

Номер: US0007005858B1

Автор: Jih-Shiuan Luo, LUO JIH-SHIUAN

Принадлежит: Hitachi Global Storage Technologies Netherlands, B.V., HITACHI GLOBAL STORAGE TECH, HITACHI GLOBAL STORAGE TECHNOLOGIES NETHERLANDS, B.V.

A method is disclosed for minimizing damage from electrostatic discharge (ESD) during long-term testing of electronic components and assemblies. The method includes conducting a stress-test, during which a protection circuit is engaged, which shields components and assemblies from ESD. Then at least one functional test is conducted, at which time, the protection circuit is disengaged.

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Номер записи: 15

03-07-2012 дата публикации

Magnetic sensor having a physically hard insulation layer over a magnetic bias structure

Номер: US0008213132B2

Автор: David Eugene Heim, Kim Y. Lee, Tsann Lin, Jih-Shiuan Luo, HEIM DAVID EUGENE, LEE KIM Y, LIN TSANN, LUO JIH-SHIUAN, LEE KIM Y.

Принадлежит: Hitachi Global Storage Technologies Netherlands B.V., HEIM DAVID EUGENE, LEE KIM Y, LIN TSANN, LUO JIH-SHIUAN, HITACHI GLOBAL STORAGE TECH NL, LEE KIM Y., HITACHI GLOBAL STORAGE TECHNOLOGIES NETHERLANDS B.V.

A narrow track-width magnetoresistive sensor by defining a trench formed between first and second hard bias layers and depositing the sensor into the trench. The sensor can include a sensor stack sandwiched between first and second electrically conductive lead layers. First and second electrically insulating side walls are formed at either side of the sensor stack. First and second hard bias layers extend from the sides of the sensor stack, being separated from the sensor stack by the first and second electrically insulating side walls. First and second physically hard insulation layers are provided over each of the hard bias layers.

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Номер записи: 16

07-09-2004 дата публикации

System and method for pre-stressing a read head for improving performance thereof

Номер: US0006788500B2

Автор: Lydia Baril, Ciaran A. Fox, Jih-Shiuan Luo, Peter J. Melz, Chin-Yu Yeh, BARIL LYDIA, FOX CIARAN A, LUO JIH-SHIUAN, MELZ PETER J, YEH CHIN-YU, FOX CIARAN A., MELZ PETER J.

Принадлежит: Hitachi Global Storage Technologies Netherlands B.V., HITACHI GLOBAL STORAGE TECH, HITACHI GLOBAL STORAGE TECHNOLOGIES NETHERLANDS B.V.

A system, method and computer program product provide an annealing process for setting a magnetization condition of a read head. An amount of heat for stabilizing magnetization condition of a read head is calculated. A width and amplitude of a voltage pulse that generates the calculated amount of heat in the read head are calculated. A voltage pulse of the calculated width and amplitude is applied to the read head for generating Joule heating in the read head. The width of the voltage pulse is less than one second.

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Номер записи: 17

15-08-2006 дата публикации

Apparatus for enhancing thermal stability, improving biasing and reducing damage from electrostatic discharge in self-pinned abutted junction heads having a first self-pinned layer extending under the hard bias layers

Номер: US0007092220B2

Автор: Hardayal Singh Gill, Wen-Chien Hsiao, Jih-Shiuan Luo, GILL HARDAYAL SINGH, HSIAO WEN-CHIEN, LUO JIH-SHIUAN

Принадлежит: Hitachi Global Storage Technologies, HITACHI GLOBAL STORAGE TECH, HITACHI GLOBAL STORAGE TECHNOLOGIES

A method and apparatus for enhancing thermal stability, improving biasing and reducing damage from electrical surges in self-pinned abutted junction heads. A first self-pinned layer having a first magnetic orientation is provided, wherein the first self-pinned layer has a first end, a second end and central portion. A second self-pinned layer is formed over only the central portion of the first self-pinned layer and an interlayer is disposed between the first and second self-pinned layers. A free layer is formed in a central region over the second self-pinned layer. First and second hard bias layers are formed over the first and second ends of the first self-pinned layer respectively, the first and second hard bias layer abutting the free layer, the first and second end of the first self-pinned layer extending under the hard bias layers at the first and second ends.

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Номер записи: 18

12-02-2008 дата публикации

Dual polarity bias for prolonging the life of a heating element in magnetic data storage devices

Номер: US0007330336B2

Автор: Jih-Shiuan Luo, Samuel Wei-san Yuan, LUO JIH-SHIUAN, YUAN SAMUEL WEI-SAN

Принадлежит: Hitachi Global Storage Technologies Netherlands B. V., HITACHI GLOBAL STORAGE TECH, HITACHI GLOBAL STORAGE TECHNOLOGIES NETHERLANDS B. V.

A magnetic read/write head having a heating element to induce a desired amount of thermal protrusion in the read and write elements to control the fly height of the read and write elements over a magnetic medium. The heating element is connected with circuitry that provides an electrical bias (voltage or current) that switches polarity in order to prevent electromigration, thereby greatly increasing the life of the heating element. The polarity of the heating element can be switched upon the occurrence of a predetermined event such as between read or write events or upon activating deactivating the disk drive device or could be performed at regular, predetermined time intervals. The dual polarity bias could also be provided by applying an AC bias to the heating element.

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Номер записи: 19

06-11-2003 дата публикации

System and method for pre-stressing a read head for improving performance thereof

Номер: US20030206361A1

Автор: Lydia Baril, Ciaran Fox, Jih-Shiuan Luo, Peter Melz, Chin-Yu Yeh

Принадлежит: INTERNATIONAL BUSINESS MACHINES

A system, method and computer program product provide an annealing process for setting a magnetization condition of a read head. An amount of heat for stabilizing magnetization condition of a read head is calculated. A width and amplitude of a voltage pulse that generates the calculated amount of heat in the read head are calculated. A voltage pulse of the calculated width and amplitude is applied to the read head for generating Joule heating in the read head. The width of the voltage pulse is less than one second.

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Номер записи: 20

23-08-2007 дата публикации

Self-pinned spin valve sensor having its first AP pinned layer thicker than its second AP pinned layer to reduce the likelihood of amplitude flip

Номер: US20070195468A1

Автор: James Freitag, Hardayal Gill, Jih-Shiuan Luo, Mustafa Pinarbasi

Принадлежит:

In one illustrative example, a spin valve (SV) sensor of the self-pinned type includes a free layer; an antiparallel (AP) self-pinned layer structure; and a non-magnetic electrically conductive spacer layer in between the free layer and the AP self-pinned layer structure. The AP self-pinned layer structure includes a first AP pinned layer having a first thickness; a second AP pinned layer having a second thickness; and an antiparallel coupling (APC) layer formed between the first and the second AP pinned layers. The first thickness is slightly greater than the second thickness. Configured as such, the AP pinned layer structure provides for a net magnetic moment that is in the same direction as a magnetic field produced by the sense current flow, which reduces the likelihood of amplitude flip in the SV sensor.

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Номер записи: 21

03-02-2005 дата публикации

Method and apparatus for enhancing thermal stability, improving biasing and reducing damage from electrostatic discharge in self-pinned abutted junction heads having a first self-pinned layer extending under the hard bias layers

Номер: US20050024786A1

Автор: Hardayal Gill, Wen-Chien Hsiao, Jih-Shiuan Luo

Принадлежит:

A method and apparatus for enhancing thermal stability, improving biasing and reducing damage from electrical surges in self-pinned abutted junction heads. A first self-pinned layer having a first magnetic orientation is provided, wherein the first self-pinned layer has a first end, a second end and central portion. A second self-pinned layer is formed over only the central portion of the first self-pinned layer and an interlayer is disposed between the first and second self-pinned layers. A free layer is formed in a central region over the second self-pinned layer. First and second hard bias layers are formed over the first and second ends of the first self-pinned layer respectively, the first and second hard bias layer abutting the free layer, the first and second end of the first self-pinned layer extending under the hard bias layers at the first and second ends.

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Номер записи: 22

22-11-2007 дата публикации

DUAL POLARITY BIAS FOR PROLONGING THE LIFE OF A HEATING ELEMENT IN MAGNETIC DATA STORAGE DEVICES

Номер: US20070268624A1

Автор: Jih-Shiuan Luo, Samuel Yuan

Принадлежит: HITACHI GLOBAL STORAGE TECHNOLOGIES

A magnetic read/write head having a heating element to induce a desired amount of thermal protrusion in the read and write elements to control the fly height of the read and write elements over a magnetic medium. The heating element is connected with circuitry that provides an electrical bias (voltage or current) that switches polarity in order to prevent electromigration, thereby greatly increasing the life of the heating element. The polarity of the heating element can be switched upon the occurrence of a predetermined event such as between read or write events or upon activating deactivating the disk drive device or could be performed at regular, predetermined time intervals. The dual polarity bias could also be provided by applying an AC bias to the heating element.

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Номер записи: 23

18-02-2020 дата публикации

Data storage device reverse biasing head element to counter electro-migration

Номер: US0010566018B2

Автор: Joey M. Poss, Ian R. McFadyen, Jih-Shiuan Luo, Yunfei Ding, POSS JOEY M, MCFADYEN IAN R, LUO JIH-SHIUAN, DING YUNFEI, Poss, Joey M., McFadyen, Ian R., Luo, Jih-Shiuan, Ding, Yunfei

Принадлежит: WESTERN DIGITAL TECHNOLOGIES, INC., WESTERN DIGITAL TECH INC, Western Digital Technologies, Inc.

A data storage device is disclosed comprising a first head actuated over a first disk surface, the first head comprising a plurality of elements including a first element. During a first write operation of the first head, a first bias signal having a first polarity is applied to the first element, and a write interval of the first write operation is measured. During a non-write mode of the first head, a second bias signal having a second polarity opposite the first polarity is applied to the first element during a reverse bias interval that is based on the write interval of the first write operation.

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Номер записи: 24

23-05-2006 дата публикации

Apparatus having a self-pinned abutted junction magnetic read sensor with hard bias layers formed over ends of a self-pinned layer and extending under a hard bias layer

Номер: US0007050277B2

Автор: Hardayal Singh Gill, Wen-Chien Hsiao, Jih-Shiuan Luo, GILL HARDAYAL SINGH, HSIAO WEN-CHIEN, LUO JIH-SHIUAN

Принадлежит: Hitachi Global Storage Technologies Netherlands B.V., HITACHI GLOBAL STORAGE TECH, HITACHI GLOBAL STORAGE TECHNOLOGIES NETHERLANDS B.V.

A method and apparatus for enhancing thermal stability, improving biasing and reducing damage from electrical surges in self-pinned abutted junction heads. The head includes a self-pinned layer, the self-pinned layer having a first end, a second end and central portion, a free layer disposed over the central portion of the self-pinned layer in a central region and a first and second hard bias layers formed over the first and second ends of the self-pinned layer respectively, the first and second hard bias layer abutting the free layer, the first and second end of the self-pinned layer extending under the hard bias layers at the first and second ends.

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Номер записи: 25

18-10-2011 дата публикации

Method for testing the acceptability of a magnetic read sensor

Номер: US0008040131B2

Автор: David Ernest Call, Ciaran Avram Fox, Jih-Shiuan Luo, Robert Langland Smith, Chin-Yu Yeh, CALL DAVID ERNEST, FOX CIARAN AVRAM, LUO JIH-SHIUAN, SMITH ROBERT LANGLAND, YEH CHIN-YU

Принадлежит: Hitachi Global Storage Technologies Netherlands B.V., HITACHI GLOBAL STORAGE TECH NL, HITACHI GLOBAL STORAGE TECHNOLOGIES NETHERLANDS B.V.

A method for testing a magnetic head to determine whether the magnetic head is unacceptably affected by temperature variations. The test includes testing the magnetic head at different temperatures and measuring either or both of a signal amplitude and a signal asymmetry of a signal from the magnetic head at the different temperatures. If signal amplitude or signal asymmetry vary excessively as a result of the temperature change then the head can be scrapped.

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Номер записи: 26

13-03-2008 дата публикации

TOPOGRAPHICALLY DEFINED THIN FILM CPP READ HEAD

Номер: US20080062576A1

Автор: David Heim, Kim Lee, Tsann Lin, Jih-Shiuan Luo

Принадлежит:

A narrow track-width magnetoresistive sensor by defining a trench formed between first and second hard bias layers and depositing the sensor into the trench. The sensor can include a sensor stack sandwiched between first and second electrically conductive lead layers. First and second electrically insulating side walls are formed at either side of the sensor stack. First and second hard bias layers extend from the sides of the sensor stack, being separated from the sensor stack by the first and second electrically insulating side walls. First and second physically hard insulation layers are provided over each of the hard bias layers.

Подробнее

Номер записи: 27

02-12-2004 дата публикации

System and method for pre-stressing a read head for improving performance thereof

Номер: US20040240096A1

Автор: Lydia Baril, Ciaran Fox, Jih-Shiuan Luo, Peter Melz, Chin-Yu Yeh

Принадлежит:

A system, method and computer program product provide an annealing process for setting a magnetization condition of a read head. An amount of heat for stabilizing magnetization condition of a read head is calculated. A width and amplitude of a voltage pulse that generates the calculated amount of heat in the read head are calculated. A voltage pulse of the calculated width and amplitude is applied to the read head for generating Joule heating in the read head. The width of the voltage pulse is less than one second.

Подробнее

Номер записи: 28

23-03-2006 дата публикации

SYSTEM AND METHOD FOR DECREASING ESD DAMAGE DURING COMPONENT LEVEL LONG TERM TESTING

Номер: US20060061366A1

Автор: Jih-Shiuan Luo

Принадлежит: Hitachi Global Storage Technologies Netherlands BV

A method is disclosed for minimizing damage from electrostatic discharge (ESD) during long-term testing of electronic components and assemblies. The method includes conducting a stress-test, during which a protection circuit is engaged, which shields components and assemblies from ESD. Then at least one functional test is conducted, at which time, the protection circuit is disengaged. Also disclosed is a system for conducting long-term testing of electronic components and assemblies while providing protection from ESD. The system includes a testing circuit for providing current to the components and assemblies during the long-term testing which includes at least one stress-testing phase and at least one functional testing phase. Also included is a protection circuit for protecting the components and assemblies during said stress-testing phase of said long-term testing. A switch is included for disengaging the protection circuit from the components and assemblies during said functional testing phase of said long-term testing.

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Номер записи: 29

18-09-2003 дата публикации

Electrostatic discharge protection for disk drive integrated lead suspension

Номер: US20030174445A1

Автор: Jih-Shiuan Luo

Принадлежит: Hitachi Global Storage Technologies Netherlands BV

The present invention couples shunting pads to the conductor leads of a suspension assembly for supporting a slider in a magnetic storage system, which can be use to temporarily shunt the leads to prevent against damage to the heads by electrostatic discharge. In one embodiment, the suspension assembly includes shunting pads that are sized and positioned to allow shunting using a probe. In another embodiment, a suspension assembly includes a built-in shunting tab that when applied, temporarily shunts the MR read head and prevents any transient voltage from developing across the head. In a further embodiment a tool having multiple probes is integrated into a jig, which is used for holding and shunting one or more suspension assemblies during processing. In one embodiment, the present invention is applied to an integrated lead suspension assembly.

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Номер записи: 30

24-07-2001 дата публикации

Method, apparatus and computer program product for identifying electrostatic discharge damage to a thin film device

Номер: US0006265885B1

Автор: Jih-Shiuan Luo, Robert Langland Smith, Chin-Yu Yeh, LUO JIH-SHIUAN, SMITH ROBERT LANGLAND, YEH CHIN-YU

Принадлежит: International Business Machines Corporation, IBM, INTERNATIONAL BUSINESS MACHINES CORPORATION

A method, apparatus and computer program product for identifying electrostatic discharge (ESD) damage to a thin film device. The method includes (1) determining a cold resistance of the thin film device, (2) determining a hot resistance of the thin film device, (3) calculating a heating delta resistance (HDR) from the hot and cold resistances and (4) comparing the HDR to a threshold value to ascertain if the thin film device has suffered ESD damage. The HDR of the thin film device is characterized by the following relationship: HDR=(hot resistance-cold resistance)/(cold resistance).

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Номер записи: 31

13-07-2004 дата публикации

Method for the rapid measurement of magnetoresistive read head dimensions

Номер: US0006762914B2

Автор: Ciaran A. Fox, Peter John Melz, Jih-Shiuan Luo, Joseph F. Smyth, Chin-Yu Yeh, FOX CIARAN A, MELZ PETER JOHN, LUO JIH-SHIUAN, SMYTH JOSEPH F, YEH CHIN-YU, FOX CIARAN A., SMYTH JOSEPH F.

Принадлежит: International Business Machines Corporation, IBM, INTERNATIONAL BUSINESS MACHINES CORPORATION

An automated production process for the screening of the read-width (RW) and/or the stripe-height (SH) for every magnetoresistive (MR) read sensor element in a wafer substrate. The method of this invention uses the RW and/or SH values found with optical examination by electron microscopy of several of the MR sensor elements to estimate two substrate coefficients that relates the optical RW and SH measurements to heating-delta measurements, δ=(RH−RC)/RC, where RH is the sensor resistance when hot and RC is the sensor resistance when cold, both of which can be measured using automated equipment. These relationships are sufficiently similar among all MR sensor elements manufactured on a single wafer substrate during a single manufacturing procedure that, when the hot resistance RH is measured at a constant applied voltage, the heating-delta, may be used with a first substrate coefficient to estimate the read-width RW of each MR sensor element for quality-control purposes during manufacture. When the hot resistance RH is measured at a constant applied current, the heating-delta may be used with a second substrate coefficient to estimate the stripe-height SH of each MR sensor element for quality-control purposes during manufacture.

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Номер записи: 32

03-02-2005 дата публикации

Method and apparatus for enhancing thermal stability, improving biasing and reducing damage from electrostatic discharge in self-pinned abutted junction heads having self-pinned layer extending under the hard bias layers

Номер: US20050024783A1

Автор: Hardayal Gill, Wen-Chien Hsiao, Jih-Shiuan Luo

Принадлежит: Hitachi Global Storage Technologies Netherlands BV

A method and apparatus for enhancing thermal stability, improving biasing and reducing damage from electrical surges in self-pinned abutted junction heads. The head includes a self-pinned layer, the self-pinned layer having a first end, a second end and central portion, a free layer disposed over the central portion of the self-pinned layer in a central region and a first and second hard bias layers formed over the first and second ends of the self-pinned layer respectively, the first and second hard bias layer abutting the free layer, the first and second end of the self-pinned layer extending under the hard bias layers at the first and second ends.

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Номер записи: 33

27-03-2007 дата публикации

Method for creating a magnetic head

Номер: US0007194796B2

Автор: Kim Y. Lee, Jih-Shiuan Luo, LEE KIM Y, LUO JIH-SHIUAN, LEE KIM Y.

Принадлежит: Hitachi Global Storage Technologies Netherlands B.V., HITACHI GLOBAL STORAGE TECH, HITACHI GLOBAL STORAGE TECHNOLOGIES NETHERLANDS B.V.

A magnetic head and method for forming the same. Leads are added to a wafer stack having a free layer, a bias layer, and a spacer layer between the free layer and bias layer. A gap is formed between the leads. A protective layer is added to the wafer stack such that the gap is covered, as well as facing ends of the leads. Material is removed from at least one side area of the wafer stack using the protective layer as a mask. The protective layer is removed. A portion of the bias layer below the gap is processed for reducing a magnetic moment of the bias layer in the portion of the bias layer below the gap for forming a sensor in which magnetic moments of end portions of the free layer are pinned by magnetic moments of end portions of the bias layer, and preferably antiparallel thereto.

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Номер записи: 34

16-06-2005 дата публикации

Self-pinned spin valve sensor having its first AP pinned layer thicker than its second AP pinned layer to reduce the likelihood of amplitude flip

Номер: US20050128652A1

Автор: James Freitag, Hardayal Gill, Jih-Shiuan Luo, Mustafa Pinarbasi

Принадлежит:

In one illustrative example, a spin valve (SV) sensor of the self-pinned type includes a free layer; an antiparallel (AP) self-pinned layer structure; and a non-magnetic electrically conductive spacer layer in between the free layer and the AP self-pinned layer structure. The AP self-pinned layer structure includes a first AP pinned layer having a first thickness; a second AP pinned layer having a second thickness; and an antiparallel coupling (APC) layer formed between the first and the second AP pinned layers. The first thickness is slightly greater than the second thickness. Configured as such, the AP pinned layer structure provides for a net magnetic moment that is in the same direction as a magnetic field produced by the sense current flow, which reduces the likelihood of amplitude flip in the SV sensor.

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Номер записи: 35

07-01-2010 дата публикации

METHOD FOR IMPROVING MAGNETIC READ SENSOR MANUFACTURING USING EXTERNAL AND/OR EMBEDDED HEATING ELEMENT

Номер: US20100002327A1

Автор: David Ernest Call, Ciaran Avram Fox, Jih-Shiuan Luo, Robert Langland Smith, Chin-Yu Yeh

Принадлежит: Hitachi Global Storage Technologies Netherlands BV

A method for testing a magnetic head to determine whether the magnetic head is unacceptably affected by temperature variations. The test includes testing the magnetic head at different temperatures and measuring either or both of a signal amplitude and a signal asymmetry of a signal from the magnetic head at the different temperatures. If signal amplitude or signal asymmetry vary excessively as a result of the temperature change then the head can be scrapped.

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Номер записи: 36

06-01-2009 дата публикации

Method for fabricating a magnetic head having a sensor stack and two lateral stack

Номер: US0007472469B2

Автор: David Eugene Heim, Kim Y. Lee, Tsann Lin, Jih-Shiuan Luo, Chun-Ming Wang, HEIM DAVID EUGENE, LEE KIM Y, LIN TSANN, LUO JIH-SHIUAN, WANG CHUN-MING, LEE KIM Y.

Принадлежит: Hitachi Global Storage Technologies Netherlands B.V., HITACHI GLOBAL STORAGE TECH, HITACHI GLOBAL STORAGE TECHNOLOGIES NETHERLANDS B.V.

A method is disclosed for fabricating a read sensor for a magnetic head for a hard disk drive having a read sensor stack and two lateral stacks. The method of fabrication includes forming lateral stacks on a gap layer, surrounding a groove to form a template. The read sensor stack is then formed in the groove, which defines the lateral dimensions of the read sensor stack, and lead layers are then formed on the lateral stacks. Also disclosed is a read head for a disk drive having a sensor stack defined by pre-established lateral stacks, and a disk drive having the read head.

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Номер записи: 37

23-05-2006 дата публикации

System, method, and apparatus for handling and testing individual sliders in a row-like format in single slider processing systems

Номер: US0007049809B2

Автор: Jih-Shiuan Luo, Ali Sanayei, Darrick Taylor Smith, LUO JIH-SHIUAN, SANAYEI ALI, SMITH DARRICK TAYLOR

Принадлежит: Hitachi Global Storage Technologies Netherlands B.V., HITACHI GLOBAL STORAGE TECH, HITACHI GLOBAL STORAGE TECHNOLOGIES NETHERLANDS B.V.

A device for handling and testing individual sliders in a row-like format utilizes an elongated, row-like holder having a series of small pockets, each of which receives a single slider. After the sliders enter the holder, a clamp is moved to a closed position to retain the sliders in the holder. The holder is placed in a test fixture such that permanently mounted probes precisely engage the small pads on the sliders for multiple testing purposes. Enlarged probe pads on the test fixture are electrically interconnected with the probes to provide an operator with easy access to the slider pads. The sliders are tested in a row-like format, side by side, to reduce handling-induced electrostatic discharge and mechanical damage.

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Номер записи: 38

25-01-2005 дата публикации

Electrostatic discharge protection for disk drive integrated lead suspension

Номер: US0006847505B2

Автор: Jih-Shiuan Luo, LUO JIH-SHIUAN

Принадлежит: Hitachi Global Storage Technologies, The Netherlands B.V., HITACHI GLOBAL STORAGE TECH, HITACHI GLOBAL STORAGE TECHNOLOGIES, THE NETHERLANDS B.V.

The present invention couples shunting pads to the conductor leads of a suspension assembly for supporting a slider in a magnetic storage system, which can be use to temporarily shunt the leads to prevent against damage to the heads by electrostatic discharge. In one embodiment, the suspension assembly includes shunting pads that are sized and positioned to allow shunting using a probe. In another embodiment, a suspension assembly includes a built-in shunting tab that when applied, temporarily shunts the MR read head and prevents any transient voltage from developing across the head. In a further embodiment a tool having multiple probes is integrated into a jig, which is used for holding and shunting one or more suspension assemblies during processing. In one embodiment, the present invention is applied to an integrated lead suspension assembly.

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Номер записи: 39

29-12-2009 дата публикации

System and method for pre-stressing a read head for improving performance thereof

Номер: US0007639458B2

Автор: Lydia Baril, Ciaran A. Fox, Jih-Shiuan Luo, Peter J. Melz, Chin-Yu Yeh, BARIL LYDIA, FOX CIARAN A, LUO JIH-SHIUAN, MELZ PETER J, YEH CHIN-YU, FOX CIARAN A., MELZ PETER J.

Принадлежит: Hitachi Global Storage Technologies Netherlands B.V., HITACHI GLOBAL STORAGE TECH, HITACHI GLOBAL STORAGE TECHNOLOGIES NETHERLANDS B.V.

A system, method and computer program product provide an annealing process for setting a magnetization condition of a read head. An amount of heat for stabilizing magnetization condition of a read head is calculated. A width and amplitude of a voltage pulse that generates the calculated amount of heat in the read head are calculated. A voltage pulse of the calculated width and amplitude is applied to the read head for generating Joule heating in the read head. The width of the voltage pulse is less than one second.

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Номер записи: 40

21-12-2006 дата публикации

Method for enhancing thermal stability, improving biasing and reducing damage from electrostatic discharge in self-pinned abutted junction heads

Номер: US20060285259A1

Автор: Hardayal Gill, Wen-Chien Hsiao, Jih-Shiuan Luo

Принадлежит: Hitachi Global Storage Technologies

A method for enhancing thermal stability, improving biasing and reducing damage from electrical surges in self-pinned abutted junction heads. The method includes forming a free layer, forming first hard bias layers abutting the free layer and forming second hard bias layers over the first hard bias layers discontinguous from the free layer, the second hard bias layers being anti-parallel to the first hard bias layers, the first and second hard bias layers providing a net longitudinal bias on the free layer.

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Номер записи: 41

13-10-2005 дата публикации

Topographically defined thin film CPP read head fabrication

Номер: US20050227184A1

Автор: David Heim, Kim Lee, Tsann Lin, Jih-Shiuan Luo

Принадлежит: HITACHI GLOBAL STORAGE TECHNOLOGIES

A method of constructing a small trackwidth magnetorsesistive sensor by defining a trench between first and second hard bias layers and depositing the sensor into the trench.

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Номер записи: 42

01-06-2006 дата публикации

Individual slider testing

Номер: US20060112770A1

Автор: Jih-Shiuan Luo, Ali Sanayei

Принадлежит: HITACHI GLOBAL STORAGE TECHNOLOGIES NETHERLANDS B.V.

Systems and methods of testing individual sliders are disclosed. One embodiment is a test system that includes a mechanical stress system, a quasi-static measurement system, a transport system, and a slider holder. The individual sliders to be tested are aligned in a row in the slider holder, and the slider holder secures the sliders. The measurement system performs quasi-static measurements on sliders in the slider holder simultaneously. The transport system then transports the slider holder to the mechanical stress system. The mechanical stress system applies mechanical stress to the sliders in slider holder. The transport system then transports the slider holder again to the quasi-static measurement system. This process repeats a desired number of times to complete testing.

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Номер записи: 43

13-01-2005 дата публикации

Method of fabricating magnetic head with anti-parallel passive pinned regions

Номер: US20050005427A1

Автор: Kim Lee, Jih-Shiuan Luo

Принадлежит: HITACHI GLOBAL STORAGE TECHNOLOGIES

A magnetic head and method for forming the same. Leads are added to a wafer stack having a free layer, a bias layer, and a spacer layer between the free layer and bias layer. A gap is formed between the leads. A protective layer is added to the wafer stack such that the gap is covered, as well as facing ends of the leads. Material is removed from at least one side area of the wafer stack using the protective layer as a mask. The protective layer is removed. A portion of the bias layer below the gap is processed for reducing a magnetic moment of the bias layer in the portion of the bias layer below the gap for forming a sensor in which magnetic moments of end portions of the free layer are pinned by magnetic moments of end portions of the bias layer, and preferably antiparallel thereto.

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Номер записи: 44

29-08-2006 дата публикации

Self-pinned abutted junction heads having an arrangement of a second hard bias layer and a free layer for providing a net net longitudinal bias on the free layer

Номер: US0007099123B2

Автор: Hardayal Singh Gill, Wen-Chien Hsiao, Jih-Shiuan Luo, GILL HARDAYAL SINGH, HSIAO WEN-CHIEN, LUO JIH-SHIUAN

Принадлежит: Hitachi Global Storage Technologies, HITACHI GLOBAL STORAGE TECH, HITACHI GLOBAL STORAGE TECHNOLOGIES

A method and apparatus for enhancing thermal stability, improving biasing and reducing damage from electrical surges in self-pinned abutted junction heads. The head includes a sandwiched hard bias layer having a first hard bias layer coupled to a free layer and a second, anti-parallel hard bias layer disposed away form the free layer to provide a net longitudinal bias on the free layer.

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Номер записи: 45

28-05-2020 дата публикации

Data storage device reverse biasing head element to counter electro-migration

Номер: US20200168247A1

Автор: Ian Robson Mcfadyen, Jih-Shiuan Luo, Joey M. Poss, Yunfei Ding

Принадлежит: Western Digital Technologies Inc

A data storage device is disclosed comprising a first head actuated over a first disk surface, the first head comprising a plurality of elements including a first element. During a first write operation of the first head, a first bias signal having a first polarity is applied to the first element, and a write interval of the first write operation is measured. During a non-write mode of the first head, a second bias signal having a second polarity opposite the first polarity is applied to the first element during a reverse bias interval that is based on the write interval of the first write operation.

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Номер записи: 46

26-09-2019 дата публикации

Data storage device reverse biasing head element to counter electro-migration

Номер: US20190295580A1

Автор: Ian R. McFadyen, Jih-Shiuan Luo, Joey M. Poss, Yunfei Ding

Принадлежит: Western Digital Technologies Inc

A data storage device is disclosed comprising a first head actuated over a first disk surface, the first head comprising a plurality of elements including a first element. During a first write operation of the first head, a first bias signal having a first polarity is applied to the first element, and a write interval of the first write operation is measured. During a non-write mode of the first head, a second bias signal having a second polarity opposite the first polarity is applied to the first element during a reverse bias interval that is based on the write interval of the first write operation.

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Номер записи: 47

20-11-2001 дата публикации

Capacitor coupled chuck for carbon dioxide snow cleaning system

Номер: US6319102B1

Автор: Jih-Shiuan (Sam) Luo

Принадлежит: International Business Machines Corp

The cryogenic aerosol substrate cleaning system of the present invention includes a substrate support system that is disposed within a cleaning enclosure. A wafer, or other article to be cleaned is disposed upon the substrate support system. A cryogenic aerosol spray cleaning device is disposed within the enclosure to direct a cryogenic aerosol spray upon the surface of the wafer. The substrate support system includes an electrically floating chuck which supports the wafer, such that the chuck is separated from a grounded plane by an insulator. The chuck is capacitance-coupled to the grounded plane, and in alternative embodiments the chuck is also electrically coupled to the grounded plane. The substrate support system of the present invention acts to reduce the creation of tribocharges on the wafer, such that damage to wafers caused by such tribocharges is reduced and a cleaner wafer surface is created.

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Номер записи: 48

06-01-2022 дата публикации

Optimized Dual Thermal Fly-Height Design For Dual Writers For Advanced Magnetic Recording

Номер: US20220005502A1

Автор: Jih-Shiuan Luo, Kuok San Ho, Quang Le, Thao A. Nguyen

Принадлежит: Western Digital Technologies Inc

The present disclosure generally relates to a magnetic media drive employing a magnetic recording head. The magnetic recording head comprises a first write head and a second write head each coupled to a first pad and a second pad of a slider pad and an electrical circuit coupled to the first and second pads. The first write head is a wide writing write head, and the second write head a narrow writing write head. The electrical circuit comprises a first sub-circuit and a second sub-circuit connected in parallel. The first sub-circuit comprises a capacitor and a connection to a first thermal fly height control (TFC) of the first write head. The second sub-circuit comprises an inductor and a connection to a second TFC of the second write head. The electrical circuit is further connected to a third TFC of a read head, the second write head comprising the read head.

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Номер записи: 49

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