Method and device for estimating simultaneous switching noise in semiconductor device, and storage medium

The method comprises a number of simultaneously switching signals calculation step in which the number of simultaneously switching signals is calculated for each set of user setting information for the input and output signal on the basis of pin arrangement information and the user setting information of the pins in a neighboring area of a pin to be executed in the estimation process; and a simultaneous switching noise calculation step in which a difference is calculated between noise corresponding to an initial point and that to a terminal point in a range of the number of simultaneously switching signals calculated for each set of user setting information on the basis of a relationship between the number of simultaneously switching signals and the noise caused by the number of simultaneously switching signals for each set of user setting information.

Voltage fluctuation estimating method and apparatus, semiconductor device operation verification apparatus, semiconductor device designing method, printed circuit board designing method, and program

A computer determines a first relationship between a maximum frequency of the semiconductor device and an internal power supply voltage of the semiconductor device. Then, the computer determines a second relationship between the maximum frequency and an amount of noise, based on a number of the input/output signal pins. In addition, the computer estimates a fluctuation of the internal power supply voltage corresponding to a amount of noise of the semiconductor device, based on the first relationship and the second relationship. Then, the computer performs a design change of the semiconductor device based on the estimated fluctuation. And the computer stores the changed design of the semiconductor device to a storage device.

VOLTAGE FLUCTUATION ESTIMATING METHOD AND APPARATUS, SEMICONDUCTOR DEVICE OPERATION VERIFICATION APPARATUS, SEMICONDUCTOR DEVICE DESIGNING METHOD, PRINTED CIRCUIT BOARD DESIGNING METHOD, AND PROGRAM

A computer determines a first relationship between a maximum frequency of the semiconductor device and an internal power supply voltage of the semiconductor device. Then, the computer determines a second relationship between the maximum frequency and an amount of noise, based on a number of the input/output signal pins. In addition, the computer estimates a fluctuation of the internal power supply voltage corresponding to a amount of noise of the semiconductor device, based on the first relationship and the second relationship. Then, the computer performs a design change of the semiconductor device based on the estimated fluctuation. And the computer stores the changed design of the semiconductor device to a storage device.

Method and device for estimating simultaneous switching noise in semiconductor device, and storage medium

The method comprises a number of simultaneously switching signals calculation step in which the number of simultaneously switching signals is calculated for each set of user setting information for the input and output signal on the basis of pin arrangement information and the user setting information of the pins in a neighboring area of a pin to be executed in the estimation process; and a simultaneous switching noise calculation step in which a difference is calculated between noise corresponding to an initial point and that to a terminal point in a range of the number of simultaneously switching signals calculated for each set of user setting information on the basis of a relationship between the number of simultaneously switching signals and the noise caused by the number of simultaneously switching signals for each set of user setting information.

Method and device for estimating simultaneous switching noise in semiconductor device, and storage medium

The method comprises a number of simultaneously switching signals calculation step in which the number of simultaneously switching signals is calculated for each set of user setting information for the input and output signal on the basis of pin arrangement information and the user setting information of the pins in a neighboring area of a pin to be executed in the estimation process; and a simultaneous switching noise calculation step in which a difference is calculated between noise corresponding to an initial point and that to a terminal point in a range of the number of simultaneously switching signals calculated for each set of user setting information on the basis of a relationship between the number of simultaneously switching signals and the noise caused by the number of simultaneously switching signals for each set of user setting information.

Method and device for estimating simultaneous switching noise in semiconductor device, and storage medium

The method comprises a number of simultaneously switching signals calculation step in which the number of simultaneously switching signals is calculated for each set of user setting information for the input and output signal on the basis of pin arrangement information and the user setting information of the pins in a neighboring area of a pin to be executed in the estimation process; and a simultaneous switching noise calculation step in which a difference is calculated between noise corresponding to an initial point and that to a terminal point in a range of the number of simultaneously switching signals calculated for each set of user setting information on the basis of a relationship between the number of simultaneously switching signals and the noise caused by the number of simultaneously switching signals for each set of user setting information.

Voltage fluctuation estimating method and apparatus, semiconductor device operation verification apparatus, semiconductor device designing method, printed circuit board designing method, and program