TEST SOCKET HAVING CONDUCTIVE PARTICLES IN COUPLED FORM

The purpose of the present invention is to provide a test socket, which: provides a conduction unit having conductive particles easily coupled by dot, line, and surface contact, and thus, when a semiconductor device is tested, has a lower and constant initial resistance value while the conduction unit and a terminal make contact; and can prevent the conductive particles from being separated from the conduction unit or sinking even if used for a long time, thereby preventing a significant increase of a resistance value. To this end, the present invention comprises: an insulation unit formed from silicone rubber; a plurality of conductive particles; and at least one conduction unit having a silicone rubber fused thereto so as to be formed to penetrate the insulation unit, wherein the conductive particles are formed in various column shapes, and two or more conductive particles are formed to be coupled in at least one direction by at least one of mechanical mixing, mechanical impact, and a magnetic force applied to the conduction unit.