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Космические корабли и станции, автоматические КА и методы их проектирования, бортовые комплексы управления, системы и средства жизнеобеспечения, особенности технологии производства ракетно-космических систем

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Мониторинг СМИ

Мониторинг СМИ и социальных сетей. Сканирование интернета, новостных сайтов, специализированных контентных площадок на базе мессенджеров. Гибкие настройки фильтров и первоначальных источников.

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25-05-2017 дата публикации

Устройство для бесконтактного измерения объема движущегося груза, имеющего сложный рельеф поверхности

Номер: RU0000171242U1
Автор: Александр Васильевич Кононов
Принадлежит: Александр Васильевич Кононов

Полезная модель относится к устройствам для бесконтактного определения степени загрузки движущегося транспортного средства. Устройство для бесконтактного измерения объёма движущегося груза, имеющего сложный рельеф поверхности, содержит два сканирующих блока, один из которых расположен над поверхностью груза транспортного средства, с возможностью замера расстояния до точек поверхности груза, второй расположен сбоку транспортного средства, с возможностью измерения вертикального габарита груза или кузова транспортного средства. Также устройство содержит модули регистрации, связанные с вычислительным блоком и расположенные сбоку и сверху относительно транспортного средства с возможностью видео- и фотофиксации передней, задней, верхней и боковой сторон транспортного средства. Причём сканирующие модули и модули регистрации размещены на единой раме. Технический результат заключается в обеспечении возможности измерения объёма груза, имеющего сложный рельеф поверхности, в кузовах, имеющих различные габаритные размеры и конфигурацию. 3 ил. РОССИЙСКАЯ ФЕДЕРАЦИЯ (19) RU (11) (13) 171 242 U1 (51) МПК G01B 11/04 (2006.01) ФЕДЕРАЛЬНАЯ СЛУЖБА ПО ИНТЕЛЛЕКТУАЛЬНОЙ СОБСТВЕННОСТИ (12) ФОРМУЛА ПОЛЕЗНОЙ МОДЕЛИ К ПАТЕНТУ РОССИЙСКОЙ ФЕДЕРАЦИИ (21)(22) Заявка: 2016150695, 22.12.2016 (24) Дата начала отсчета срока действия патента: 22.12.2016 (72) Автор(ы): Кононов Александр Васильевич (RU) (73) Патентообладатель(и): Кононов Александр Васильевич (RU) 25.05.2017 (56) Список документов, цитированных в отчете о поиске: RU 67706 U1, 27.10.2007. US Приоритет(ы): (22) Дата подачи заявки: 22.12.2016 5940170 A1, 17.08.1999. WO 2009031087 A1, 12.03.2009. RU 2310881 C1, 20.11.2007. Адрес для переписки: 109431, Москва, ул. Привольная, 70, ООО "Сервис Групп" R U (57) Формула полезной модели Устройство для бесконтактного измерения объёма движущегося груза, имеющего сложный рельеф поверхности, содержащее соединенные между собой сканирующий и вычислительный блоки, отличающееся тем, что сканирующих блоков ...

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Номер записи: 1
11-12-2020 дата публикации

Установка для испытания пружины на растяжение, сжатие и кручение

Номер: RU0000201387U1
Автор: Александр Иванович Усатый, Денис Александрович Власов
Принадлежит: Публичное акционерное общество завод "Красное знамя"

Установка для испытания пружины на растяжение, сжатие и кручение относится к измерительной технике и может быть использована в машиностроении для определения параметров жесткости пружин при растяжении, сжатии и кручении.Установка для испытания пружины на растяжение, сжатие и кручение содержит основание с закрепленными на нем ходовым винтом с маховиком, направляющие со штангенциркулем, кронштейном и тензодатчиком, плиту, съемную траверсу с крючком для фиксации испытываемой пружины при проверке параметров на растяжение, съемный упор для фиксации испытываемой пружины при проверке параметров на сжатие, съемный узел для проверки параметров испытываемой пружины на кручение.Технический результат предлагаемой полезной модели - расширение функциональных возможностей устройства, а именно обеспечение проверки параметров пружины на кручение. РОССИЙСКАЯ ФЕДЕРАЦИЯ (19) RU (11) (13) 201 387 U1 (51) МПК G01B 11/00 (2006.01) G01M 5/00 (2006.01) ФЕДЕРАЛЬНАЯ СЛУЖБА ПО ИНТЕЛЛЕКТУАЛЬНОЙ СОБСТВЕННОСТИ (12) ОПИСАНИЕ ПОЛЕЗНОЙ МОДЕЛИ К ПАТЕНТУ (52) СПК G01B 11/00 (2020.05); G01M 5/00 (2020.05) (21)(22) Заявка: 2020119438, 29.05.2020 (24) Дата начала отсчета срока действия патента: (73) Патентообладатель(и): Публичное Акционерное Общество завод "Красное знамя" (RU) Дата регистрации: 11.12.2020 (45) Опубликовано: 11.12.2020 Бюл. № 35 2 0 1 3 8 7 R U (54) УСТАНОВКА ДЛЯ ИСПЫТАНИЯ ПРУЖИНЫ НА РАСТЯЖЕНИЕ, СЖАТИЕ И КРУЧЕНИЕ (57) Реферат: Установка для испытания пружины на тензодатчиком, плиту, съемную траверсу с растяжение, сжатие и кручение относится к крючком для фиксации испытываемой пружины измерительной технике и может быть при проверке параметров на растяжение, съемный использована в машиностроении для определения упор для фиксации испытываемой пружины при параметров жесткости пружин при растяжении, проверке параметров на сжатие, съемный узел сжатии и кручении. для проверки параметров испытываемой Установка для испытания пружины на пружины на кручение. растяжение, сжатие и кручение содержит ...

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Номер записи: 2
12-01-2012 дата публикации

Position encoder apparatus

Номер: US20120007980A1
Автор: Andrew P. Gribble, Iain R. Gordon-Ingram
Принадлежит: RENISHAW PLC

A position encoder apparatus, including a scale having a series of position features; and a readhead configured to read the series of position features via a snapshot capture process. The snapshot capture process is adaptable so as to compensate for the relative speed between the scale and readhead.

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Номер записи: 3
26-01-2012 дата публикации

Inspection systems and methods for blow-molded containers

Номер: US20120018925A1
Автор: Georg V. Wolfe, William E. Schmidt
Принадлежит: AGR International Inc

Systems and methods for in-line inspection of plastic blow molded containers. The inspection system may comprise a plurality of emitter assemblies arranged in a vertical array. Each emitter assembly may cyclically emit light energy in at least two different narrow wavelength bands at a container as the container passes through an inspection area. The system may also comprise a plurality of broadband photodetectors arranged in a vertical array, each photodetector facing at least one of the emitter assemblies with the inspection area therebetween such that the photodetectors are capable of sensing light energy that passes through the container when it is in the inspection area. The system may also comprise a processor in communication with the photodetectors for determining a characteristic of the container based on signals from the photodetectors.

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Номер записи: 4
26-01-2012 дата публикации

Information creation device for estimating object position and information creation method and program for estimating object position

Номер: US20120020523A1
Автор: Hiroo Ikeda
Принадлежит: NEC Corp

Score determination means 62 determines a score, which indicates how accurately points in real space in respective images respectively acquired by a plurality of image acquisition means represent a target object, for each combination of image acquisition means and point in real space. View status determination means 63 determines the status of view to each point in real space from each image acquisition means by using non-target object presence information indicating to image acquisition means where a non-target object that conceals a target object is present, and determines probability density functions of a score corresponding to the result of the view status determination. Existence probability calculation means 64 determines an existence probability of a target object being present at a point in real space by using probability density functions for each combination of the image acquisition means and point in real space. Estimation information creation means 65 creates information for estimating position from the existence probability.

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Номер записи: 5
26-01-2012 дата публикации

In-line metrology system

Номер: US20120021539A1
Автор: Arnold Allenic, Chong Lim, II Stephan Paul George, Oleh Karpenko, Sreenivas Jayaraman
Принадлежит: Individual

A metrology system for gauging and spatially mapping a semiconductor material on a substrate can be used in controlling deposition and thermal activation processes.

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Номер записи: 6
09-02-2012 дата публикации

Two dimensional encoder system and method

Номер: US20120032067A1
Автор: Daniel Gene Smith, Eric Peter Goodwin
Принадлежит: Nikon Corp

An encoder system and method are provided, that is designed to improve 2D encoder systems and methods in areas such as accuracy, compactness, stability, resolution, and/or light efficiency. Moreover, the system and method of this invention provides a new concept in a retroreflector that while particularly useful in applicants' system and method, is believed to have more general utility in optical imaging systems and methods.

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Номер записи: 7
09-02-2012 дата публикации

Optical position detection apparatus and appliance having position detection function

Номер: US20120033231A1
Автор: Kanechika Kiyose
Принадлежит: Seiko Epson Corp

An optical position detection apparatus detects the position of a target object based on the result of the light reception through a light receiving unit when a light source is turned on. In a front-side housing portion of a housing of an optical unit, a reflection unit for generating a default light that makes the default light be incident to the light receiving unit is configured even in a state where a target object is not present. Accordingly, the initial setting of the relationship between a drive current in the light source unit and a light intensity in the light receiving unit can be appropriately performed based on the result of receiving the default light.

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Номер записи: 8
23-02-2012 дата публикации

Image measuring apparatus and image measuring method

Номер: US20120044343A1
Автор: Masaki Kurihara
Принадлежит: Mitutoyo Corp

Disclosed in an image measuring apparatus including an image capture unit which captured an image of a measurement subject, an import unit which imports the image of the measurement subject which is captured by the image capture unit, a binarization unit which binarizes the image which is imported by the import unit, an contour detection unit which recognizes graphic information in the image which is binarized by the binarization unit and detects an contour of the graphic information, A corner detection unit which detects corners of the graphic information based on the contour which is detected by the contour detection unit, a setting unit which respectively sets edge detection tools on lines of the contour including the corners detected by the corner detection unit and a measurement unit which measures the graphic information by the edge detection tools which are set by the setting unit.

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Номер записи: 9
23-02-2012 дата публикации

Measuring method of hole diameter, hole position, hole surface roughness, or bending loss of holey optical fiber, manufacturing method of holey optical fiber, and test method of optical line of holey optical fiber

Номер: US20120044482A1
Автор: Itaru ISHIDA, Kazuhide Nakajima, Shoichiro Matsuo, Shoji Tanigawa, Takashi Matsui, Tomoya Shimizu, Toshio Kurashima, Yukihiro Goto
Принадлежит: Fujikura Ltd, Nippon Telegraph and Telephone Corp

A measuring method of a hole diameter of a holey optical fiber includes calculating an arithmetical mean value I(x) from two backscattering light intensities at a position x of two backscattering light waveforms of the holey optical fiber, in which the two backscattering light waveforms are obtained by OTDR measurement; and obtaining the hole diameter at the position x, based on a correlation between an arithmetical mean value I(x) and an hole diameter of the holey optical fiber that is obtained in advance.

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Номер записи: 10
23-02-2012 дата публикации

Position-sensitive metrology system

Номер: US20120045855A1
Автор: Erel Milshtein, Markus E. Beck
Принадлежит: Individual

A metrology system for analyzing a semiconductor device on a substrate can include a metrology sensor.

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Номер записи: 11
01-03-2012 дата публикации

Mounting apparatus for articulated arm laser scanner

Номер: US20120047756A1
Автор: Paul Ferrari
Принадлежит: HEXAGON METROLOGY AB

An articulated arm can include a plurality of articulated arm members, a probe, a receiving portion at a distal end comprising a threaded portion, and a base at a proximal end. A base plate can kinematically mount on the receiving portion and have a hole positioned such that the probe passes through the hole. The base plate can also couple to a laser and an optical sensor located on opposite sides of the hole. A nut can threadably mount to the threaded portion of the receiving portion. Further, a wave spring can mount on the receiving portion between the nut and the base plate. Thus, movement of the nut along the receiving portion can cause the wave spring to urge the base plate against the articulated arm to secure the kinematic mount. The wave spring can then mechanically isolate the base plate from the articulated arm.

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Номер записи: 12
01-03-2012 дата публикации

Displacement detecting device

Номер: US20120050748A1
Автор: Akihiro Kuroda
Принадлежит: Mori Seiki Co Ltd

A displacement detecting device includes an irradiation optical system, an interference optical system, a light-receiving section, and a displacement detecting section. The irradiation optical system causes two light-beams to be incident on a diffraction grating respectively at different angles with respect to a plane perpendicular to the X-direction along which grating structures of the diffraction grating are periodically arranged. The interference optical system causes two Mth-order diffracted lights of respective light-beams incident on the diffraction grating to interfere with each other, so as to generate an interference light. The light-receiving section receives the interference light and detects an interference signal. The displacement detecting section detects a vertical displacement of a surface having the diffraction grating arranged thereon based on the change of the interference signal.

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Номер записи: 13
08-03-2012 дата публикации

Distance measurement system and method

Номер: US20120057023A1
Автор: Hsin-Chia Chen, Ren-Hau Gu, Sen-Huang Huang, Shu-Sian Yang
Принадлежит: PixArt Imaging Inc

A distance measurement method comprising: projecting a light beam having a speckle pattern to at least one reference plane to show a plurality of images with the speckle pattern on the at least one reference plane. The speckle pattern has a plurality of speckles, so as to capture the image with the speckle pattern on the reference plane to obtain a plurality of reference image information. When the object enters the area illuminated by a light source module, an image with the speckle pattern on a surface of an object is captured to obtain an object image information. Then, a plurality of brightness relationships among each of the speckles with adjacent speckles rounding each speckle are computed according to the reference image and the object image information to obtain relative brightness information of each speckle, which is used to compute position of the object.

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Номер записи: 14
08-03-2012 дата публикации

Method and apparatus for dynamic 6dof measurement

Номер: US20120059624A1
Автор: Viswanathan Madhavan
Принадлежит: Individual

A method and apparatus is disclosed that modulates the position of one target tracked by a position measuring instrument, measures the path of the target, fits the parameters of a mathematical representation of the time varying path to the path of the target measured as a function of time, and obtains the position, orientation and velocity of the object on which the apparatus is mounted. Key aspects of the modulating nest and the improved method for determining the best fit mathematical representation of the path of the target resulting from the combined effect of the modulation and the motion of the object are disclosed.

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Номер записи: 15
08-03-2012 дата публикации

Depth sensing apparatus and method

Номер: US20120059625A1
Автор: Sang-Wook Han, Seong-jin Kim
Принадлежит: SAMSUNG ELECTRONICS CO LTD

A depth sensing apparatus is provided. The depth sensing apparatus may reset, to a reference voltage value, a voltage of each of a first floating diffusion node and a second floating diffusion node of a sensor pixel for a first time period. For a second time period, the depth sensing apparatus may control the first floating diffusion node to store a voltage of a photodiode in a first phase interval, and may control the second floating diffusion node to store the voltage of the photodiode in a second phase interval. The depth sensing apparatus may calculate a difference between the voltage of the first floating diffusion node and the voltage of the second floating diffusion node for a third time period.

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Номер записи: 16
22-03-2012 дата публикации

Method and apparatus for retrieval of amplitude and phase of nonlinear electromagnetic waves

Номер: US20120069345A1
Автор: Christian Depeursinge, Etienne Shaffer
Принадлежит: Ecole Polytechnique Federale de Lausanne EPFL

The present invention discloses a method and its associated apparatus to retrieve the amplitude and, especially, the phase of nonlinear electromagnetic waves. The application field of the present invention is optical imaging. A sample is probed by coherent electromagnetic radiation, and by a nonlinear interaction such as harmonic generation a nonlinear object wave is emitted. A nonlinear reference wave is generated by interaction of the same nature with the coherent electromagnetic radiation, and an interference between the nonlinear object wave and the nonlinear reference wave is sensed by a detector array. As an example, the technique makes possible real-time nanometric localization and tracking of nonlinear field emitters, such as, but not limited to, nanoparticles.

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Номер записи: 17
05-04-2012 дата публикации

Position-Measuring Device

Номер: US20120081711A1
Автор: Ulrich Benner
Принадлежит: Dr Johannes Heidenhain GmbH

A position-measuring device is suited for detecting the relative position of a scanning unit and a reflection measuring grating movable relative thereto in at least one measuring direction. The scanning unit includes a primary light source as well as at least one detector assembly in a detection plane. A periodic configuration of point light sources is able to be generated in the detection plane from the primary light source. The primary light source is disposed above the detection plane.

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Номер записи: 18
12-04-2012 дата публикации

Tool length measuring method and tool length measuring device

Номер: US20120085893A1
Автор: Satoshi Miyamoto, Takayuki Nishioka
Принадлежит: Mori Seiki Co Ltd

In a tool length measuring method measuring a length of a tool based on a movement amount of the tool from a predetermined position when the tool is moved from the predetermined position in a predetermined direction and interrupts a laser beam, the movement of the tool in a direction in which the tool approaches a main body of a laser device is stopped when a static signal indicating that the tool is interrupting the laser beam is detected.

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Номер записи: 19
19-04-2012 дата публикации

Precision solder resist registration inspection method

Номер: US20120092488A1
Автор: Mark Lawrence Delaney
Принадлежит: Mitutoyo Corp

A method is disclosed for operating a machine vision inspection system to determine a fluorescent imaging height for acquiring a fluorescent image for repeatably determining the location of a feature within the fluorescent material. The height of an exposed workpiece portion exposed outside of the fluorescent material is determined (e.g., using a height sensor or autofocus operations). The determined height is repeatable. The exposed portion has a characteristic height relative to the fluorescent material and/or features located therein. The fluorescent imaging height, which may be inside the fluorescent material, is determined relative to the determined height of the exposed portion. The fluorescent imaging height is determined such that it enhances the detection of the desired feature located within the fluorescent material in the resulting fluorescent image. For a variety of workpieces, the method provides automatic acquisition of appropriately focused fluorescent image more reliably than previously known methods.

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Номер записи: 20
26-04-2012 дата публикации

Laser-based coordinate measuring device and laser-based method for measuring coordinates

Номер: US20120099096A1
Автор: D. Scott Ackerson, James K. West, Lawrence B. Brown, Robert E. Bridges
Принадлежит: Faro Technologies Inc

A laser based coordinate measuring device measures a position of a remote target. The laser based coordinate measuring device includes a stationary portion, a rotatable portion, and at least a first optical fiber. The stationary portion has at least a first laser radiation source and at least a first optical detector, and the rotatable portion is rotatable with respect to the stationary portion. The first optical fiber system, which optically interconnects the first laser radiation source and the first optical detector with an emission end of the first optical fiber system, has the emission end disposed on the rotatable portion. The emission end emits laser radiation to the remote target and receives laser radiation reflected from the remote target with the emission direction of the laser radiation being controlled according to the rotation of the rotatable portion.

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Номер записи: 21
07-06-2012 дата публикации

Apparatus for determining the dimensions of a parcel

Номер: US20120140065A1
Автор: Laurent Farlotti, Ruben RICO
Принадлежит: Neopost Technologies SA

A method of determining the dimensions of a parcel, in which method the parcel to be measured is placed against an orthogonal reference support made up of at least two perpendicular vertical side panels, each of which is provided with a grid, and an image of the support and of the parcel together is acquired so as to determine at least three perpendicular edges of the parcel, and then the number of intervals of the grid that form each of the edges is counted so as to obtain the dimensions in mm of the parcel.

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Номер записи: 22
07-06-2012 дата публикации

Method for measuring the film element using optical multi-wavelength interferometry

Номер: US20120140235A1
Автор: Cheng-Chung Lee, Kai Wu
Принадлежит: National Central University

A method for measuring the film element using optical multi-wavelength interferometry is revealed. The invention uses reflection coefficients of thin films at different wavelengths to measure the thickness and optical constants of thin films. The phase difference coming from the phase difference between test and reference surfaces is distinguished from the phase difference from the spatial path difference between reference and test beams by doing measurements on different wavelengths, because they change in different ways as the measuring wavelength changes. The phase is then acquired. Combining with the measured reflectance of thin film, the reflection coefficient of thin film is obtained. Collecting the reflection coefficients of each point, the thin film thickness and optical constants distribution in 2 dimensions are calculated. The surface profile is known through the spatial path differences between reference and test beams. These can be measured in a interferometer to avoid the vibration influence.

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Номер записи: 23
14-06-2012 дата публикации

Strain gauge, and system for spatially locating such gauges

Номер: US20120147384A1
Автор: Catherine Bosquet, Nicolas Swiergiel, Sebastien Didierjean
Принадлежит: EUROPEAN AERONAUTIC DEFENCE AND SPACE COMPANY EADS FRANCE

A strain gauge includes a substrate ( 2 ) for mounting an element ( 3 ) to be reversibly lengthened by a force applied while displaying a variation in the resistance thereof, the element ( 3 ) lengthening itself along an axis for measurement by the gauge. The gauge includes at least one contrast target ( 5, 6 ) capable of reflecting an incident light beam, the at least one contrast target ( 5, 6 ) being placed on the gauge in a predetermined position that makes it possible to predetermine the center of the axis ( 4 ), for measurement by the strain gauge ( 1 ), by detecting the position of the at least one contrast target ( 5, 6 ).

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Номер записи: 24
14-06-2012 дата публикации

Distance measurement systems and methods

Номер: US20120149281A1
Автор: Charles Walter Muchmore, Guju Song, James Joseph Hoffman, Kevin George Harding, Matthew Michael Gluesenkamp, Robert William Tait, Shukuan Xu, Steven Robert Hayashi, Xinjun Wan
Принадлежит: General Electric Co

A distance measurement system comprises an optical distance sensor configured to generate a light beam, a first optical module, and a processor. The first optical module is configured to receive the light beam, and generate and selectively transmit a plurality of light beams having different light channels for projection onto one or more points of an object to generate one or more reflected light beams scattered from the respective one or more points of the object, and capture and transmit the one or more reflected light beams into the optical distance sensor to retrieve a plurality of distance data to the respective one or more points of the object. The processor is configured to process the distance data to determine position information of the respective one or more points of the object. A distance measurement method is also presented.

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Номер записи: 25
05-07-2012 дата публикации

Alignment master glass for tensioning vapor deposition mask, method for manufacturing the same, and method for tensioning vapor deposition mask using the same

Номер: US20120167822A1
Автор: Sang-Shin Lee
Принадлежит: Samsung Mobile Display Co Ltd

An alignment master glass for aligning a plurality of openings of a vapor deposition mask for tensioning the vapor deposition mask, the alignment master glass includes a transparent substrate, and reflective film patterns on at least one surface of the transparent substrate, the reflective film patterns being only at locations corresponding to the plurality of openings of the vapor deposition mask.

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Номер записи: 26
05-07-2012 дата публикации

Measurement apparatus

Номер: US20120173193A1
Автор: Chih-Kuang Chang, Ping He, Sheng-Qiang Shen, Zhi-Hui Luo
Принадлежит: Hon Hai Precision Industry Co Ltd, Hongfujin Precision Industry Shenzhen Co Ltd

A measurement apparatus includes a platform, a base, and an observation unit. The base is slidably mounted on the platform. The observation unit is slidably mounted on the base. The observation unit comprises an image measurement assembly and a contact measure assembly. The image measure assembly measures an object supported on the platform using the image measurement assembly. The contact measurement assembly can be used to measure the object by direct contact.

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Номер записи: 27
26-07-2012 дата публикации

Machine Tool - Based, Optical Coordinate Measuring Machine Calibration Device

Номер: US20120188380A1
Автор: Erik M. PEDERSEN, Joseph D. Drescher
Принадлежит: Pratt and Whitney Co Inc

A calibration artifact for an inspection system is provided. The calibration artifact comprises a base adapted for placement within a holding fixture of an inspection system during calibration, a sphere operatively connected to the base, and a light source operatively connected to the base. The base, the sphere, and the light source are removable from the inspection system after calibration.

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Номер записи: 28
26-07-2012 дата публикации

Apparatus, optical assembly, method for inspection or measurement of an object and method for manufacturing a structure

Номер: US20120188557A1
Автор: Alec Robertson, Alenxander Cooper, Brian L. Stamper, Daniel Gene Smith, David Michael Williamson, Eric Peter Goodwin, Michel Pharand
Принадлежит: Nikon Corp

An optical assembly for a system for inspecting or measuring of an object is provided that is configured to move as a unit with a system, as the system is pointed at a target, and eliminates the need for a large scanning (pointing) mirror that is moveable relative to other parts of the system. The optical assembly comprises catadioptric optics configured to fold the optical path of the pointing beam and measurement beam that are being directed through the outlet of the system, to compress the size of the optical assembly.

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Номер записи: 29
02-08-2012 дата публикации

Dimension Measuring Apparatus, Dimension Measuring Method, And Program For Dimension Measuring Apparatus

Номер: US20120194673A1
Автор: Yasutaka Kawa
Принадлежит: Keyence Corp

A dimension measuring apparatus is configured of an imaging section that photographs a workpiece on the movable stage; a depth extending section that performs depth extension on a plurality of the workpiece images in different Z-directional positions in the movable stage, to generate a depth extended image; a master image displaying section that screen-displays as a master image the depth extended image obtained by photographing a master workpiece; a measured position information generating section that designates a position to be measured and a measuring method with respect to the master image, to generate measured position information; an edge extracting section that extracts an edge of the position to be measured from the depth extended image, obtained by photographing the workpiece, based on the measured position information; and a dimension value calculating section that obtains a dimension value of the position to be measured based on the extracted edge.

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Номер записи: 30
16-08-2012 дата публикации

Structured illumination for contrast enhancement in overlay metrology

Номер: US20120206729A1
Автор: Daniel Kandel, Joel Seligson, Noam Sapiens
Принадлежит: KLA Tencor Corp

Contrast enhancement in a metrology tool may include generating a beam of illumination, directing a portion of the generated beam onto a surface of a spatial light modulator (SLM), directing at least a portion of the generated beam incident on the surface of the SLM through an aperture of an aperture stop and onto one or more target structures of one or more samples, and generating a selected illumination pupil function of the illumination transmitted through the aperture utilizing the SLM in order to establish a contrast level of one or more field images of the one or more target structures above a selected contrast threshold, and performing one or more metrology measurements on the one or more target structures utilizing the selected illumination pupil function.

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Номер записи: 31
23-08-2012 дата публикации

Optical Apparatus, Method of Scanning, Lithographic Apparatus and Device Manufacturing Method

Номер: US20120212718A1
Автор: Arie Jeffrey Den Boef
Принадлежит: ASML Netherlands BV

An apparatus measures positions of marks on a lithographic substrate. A measurement optical system comprises illumination subsystem for illuminating the mark with a spot of radiation and a detecting subsystem for detecting radiation diffracted by the mark. A tilting mirror moves the spot of radiation relative to the reference frame of the measurement optical system synchronously with a scanning motion of the mark itself, to allow more time for accurate position measurements to be acquired. The mirror tilt axis is arranged along the intersection of the mirror plane with a pupil plane of the objective lens to minimize artifacts of the scanning. The same geometrical arrangement can be used for scanning in other types of apparatus, for example a confocal microscope.

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Номер записи: 32
30-08-2012 дата публикации

Method and apparatus for performing film thickness measurements using white light scanning interferometry

Номер: US20120218560A1
Автор: Ki-Nam JOO
Принадлежит: Mitutoyo Corp

The invention relates to a method and an apparatus for measuring the thickness of a transparent film by broad band interferometry, comprising the steps of preparing a correlogram of the film by an interferometer, applying a Fourier transformation to said correlogram to obtain a Fourier phase function, removing a linear component thereof, applying a second integral transformation to the remaining non-linear component to obtain an integral amplitude function of said non-linear component, identifying the peak location of said integral amplitude function and determining the thickness of the film as the double value of the abscissa at said peak location considering a refractive index of a film which is dependent on wavelength. The last two steps may be replaced by identifying the peak locations of said integral amplitude function and determining the thickness of the films as the double values of the abscissas at the peak locations.

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Номер записи: 33
30-08-2012 дата публикации

Devices and methods for position determination and surface measurement

Номер: US20120218563A1
Автор: Bernd Spruck, Christian Koos, Cristina Alvarez Diez, Enrico Geissler, Frank Hoeller, Lars-Christian Wittig, Oliver Schmidt, Simon Brattke, Stefan Richter
Принадлежит: CARL ZEISS AG

In an embodiment a method for position determination of an object ( 25 ) in a spatial area ( 28 ) is provided in which the object ( 25 ) is illuminated with at least one light beam ( 22, 27 ). The light beam ( 22, 27 ) does not cover the complete spatial area ( 28 ) and is guided into a part of the spatial area in which the object ( 25 ) is present depending on the position of the object ( 25 ). In another aspect a method for measuring a surface is provided.

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Номер записи: 34
27-09-2012 дата публикации

Apparatus for obtaining 3-dimensional content

Номер: US20120242829A1
Автор: Yungwoo Jung, Yunsup Shin
Принадлежит: LG ELECTRONICS INC

An apparatus for obtaining 3D content is provided. The apparatus comprises: a lighting unit for outputting a lighting pattern having coordinate information; a depth sensor for receiving a returning beam output from the lighting unit and reflected from an object; a 2D image capturing unit for obtaining a second-dimensional image; a data processor for calculating the depth of each region using the distribution of characteristics represented on an image obtained by the depth sensor, and processing the 2D image data obtained by the 2D image capturing unit and the calculated depth data and encoding the same according to a predetermined format; and a controller for controlling the lighting unit, the 2D image capturing unit, and the data processor. The lighting unit comprises a light source and an optical element comprising a plurality of sub-grid regions for modulating beams coming from the light source.

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Номер записи: 35
04-10-2012 дата публикации

Methods for measuring and modeling the structural health of pressure vessels based on electronic distance measurements

Номер: US20120250004A1
Автор: David H. Parker, John M. Payne, Sophie Lin
Принадлежит: Individual

Methods are disclosed wherein the structural health of a civil structure, pressure vessel, or the like is measured by electronic distance measurement (EDM) from a plurality of stable locations to a plurality of cardinal points on the structure in a methodical manner. By measuring the coordinates of the cardinal points, the dynamic and long-term static behavior of the structure provide an indication of the health of the structure. Analyses includes: comparison to a Finite Element Model (FEM); comparison to historical data; and modeling based on linearity, hysteresis, symmetry, creep, damping coefficient, and harmonic analysis.

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Номер записи: 36
11-10-2012 дата публикации

Method and surveying system for noncontact coordinate measurement on an object surface

Номер: US20120257017A1
Автор: Benedikt Zebhauser, Bo Pettersson, Knut Siercks
Принадлежит: LEIGA GEOSYSTEMS AG

Noncontact coordinate measurement. With a 3D image recording unit, a first three-dimensional image of a first area section of the object surface is electronically recorded in a first position and first orientation, the first three-dimensional image being composed of a multiplicity of first pixels, with which in each case a piece of depth information is coordinated. First 3D image coordinates in an image coordinate system are coordinated with the first pixels. The first position and first orientation of the 3D image recording unit in the object coordinate system are determined by a measuring apparatus coupled to the object coordinate system by means of an optical reference stereocamera measuring system. First 3D object coordinates in the object coordinate system are coordinated with the first pixels from the knowledge of the first 3D image coordinates and of the first position and first orientation of the 3D image recording unit.

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Номер записи: 37
18-10-2012 дата публикации

Laser tracker with enhanced illumination indicators

Номер: US20120262699A1
Автор: Kenneth Steffey
Принадлежит: Faro Technologies Inc

A coordinate measurement device includes: first and second angle measuring devices; a distance meter; a position detector; a first collection of illuminators rotatable about the first axis and fixed with respect to the second axis, the first collection configured to provide a first light selected from among at least two different colors of light in a visible spectrum, the first collection configured to make the first light visible from first and second points along the second axis and external to the device, the first and second points on opposite sides of the device; a second collection of illuminators rotatable about the first and second axes, the second collection configured to provide at least a second light selected from among two different colors of illumination in the visible spectrum; and a processor configured to provide a pattern of illumination for the first and second collections.

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Номер записи: 38
25-10-2012 дата публикации

Toner-Density Calculating Method, Reflective Optical Sensor, Reflective Optical Sensor Device, and Image Forming Apparatus

Номер: US20120268750A1
Автор: Koji Masuda
Принадлежит: Individual

A toner density is calculated from outputs of light-receiving elements based on a difference between a reflection property of a supporting member and a reflection property of a toner pattern. Light-emitting elements aligned in one direction that is inclined to a sub-direction emit a detection light in such a manner that a distance between adjacent spots falling on the supporting member in a second direction is equal to or smaller than a width of the toner pattern in the second direction. The light-receiving elements receive a reflected light reflected from the supporting member and/or the toner pattern. The light-receiving elements are aligned, opposed to the supporting member, in a one direction corresponding to the light-emitting elements.

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Номер записи: 39
01-11-2012 дата публикации

Device and method of focusing on points of objects

Номер: US20120274763A1
Автор: Chih-Kuang Chang, Xian-Yi Chen, Xiao-Guang Xue, Zhong-Kui Yuan
Принадлежит: Hon Hai Precision Industry Co Ltd, Hongfujin Precision Industry Shenzhen Co Ltd

A measuring device and method is used to select focusing points on an object. A CCD of the measuring device is positioned at the top of an initial focusing range, then moves to the bottom of the initial focusing range at a first speed to capture first images of the object. Image points corresponding to each focusing point in the first images are identified to compute coordinates of a first focal point of each focusing point. The initial focusing range is updated according to Z-coordinates of the first focal points. The CCD is positioned at the bottom of the updated focusing range, then, moves to the top of the updated focusing range at a second speed to capture second images of the object. Image points corresponding to each focusing point in the second images are identified to compute coordinates of a second focal point of each focusing point.

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Номер записи: 40
15-11-2012 дата публикации

Pattern inspection method and device for same

Номер: US20120287426A1
Автор: Hideaki Sasazawa, Kiyotaka HORIE, Shigeru Serikawa, Takenori Hirose
Принадлежит: Hitachi High Technologies Corp

In an optical inspection for patterned media for hard disks, a pattern inspection device is provided for inspecting patterns without being susceptible to variations in film thickness and film quality of an underlying film, the device includes optical characteristics detection means for detecting optical characteristics of multilayers by processing, upon the reflected light being dispersed and detected by the spectroscopic detection means, the reflected light from a non-patterned region on the substrate, and processing a detection signal corresponding to, and detecting optical characteristics of, the reflected light from the patterns including the multilayers; and pattern inspection means for inspecting the patterns formed on the multilayers, by viewing, upon the detection of the optical characteristics by the optical characteristics detection means, information on the optical characteristics of the reflected light from the multilayers, and processing information on the optical characteristics of the reflected light from the patterns including the multilayers.

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Номер записи: 41
29-11-2012 дата публикации

Droop Tester Apparatus and Method

Номер: US20120300063A1
Автор: Benjamin Wong, Carolyn Majkrzak, Eric Richardson, Kshitija Garde, Roger Lee
Принадлежит: MEDTRONIC INC

The invention relates to a system for testing heart valve leaflets. The system includes a leaflet support assembly with a support post for receiving and supporting a leaflet to be tested, the post being disposed in a target region of the support assembly. The system also has a transmitter assembly that includes a light source and is configured and arranged to direct light from the light source onto the target region. The system further includes a receiver assembly that has an image sensor configured and arranged to sense an image of the target region and generate image information indicative of the sensed image, such as leaflet droop.

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Номер записи: 42
29-11-2012 дата публикации

System and method for non-destructive testing

Номер: US20120303333A1
Автор: Andreas Beyer, Holger Lux, Ingo Stuke, Lothar Horn, Michael Wuestenbecker
Принадлежит: General Electric Co

Non-destructive testing and examination systems and methods generate models and other representations of a part. These models can be used to perform analysis such as defect detection and categorization. The present disclosure identifies, in one embodiment, a method and system that identifies particular locations on the part for analysis. These locations correspond to regions of a reference model, which may comprise a representation of the part that a computer aided design (CAD) package can generate. The method provides for test parameters to be assigned or associated with the region so as to direct and instruct the execution of the relevant part analysis protocols. In one example, the test parameters identify criteria for one or more types of defects that may be found on the part.

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Номер записи: 43
13-12-2012 дата публикации

Method and device for measuring motion error of linear stage

Номер: US20120314220A1
Автор: Chabum Lee, Gyu Ha Kim, Sun-Kyu Lee
Принадлежит: GWANGJU INSTITUTE OF SCIENCE AND TECHNOLOGY

Measurement of motion errors of a linear stage is performed to enable accurate measurement of motion errors in linear directions and a rotational direction in the linear stage using a diffraction grating. A first beam splitter splits a laser beam emitted from a light emitting unit. A first measurement unit measures a unidirectional linear motion error of the linear stage using one laser beam component split by the first beam splitter and a second measurement unit measures an angular motion error and another unidirectional linear motion of the linear stage error using a diffracted beam component obtained by diffracting another laser beam component split by the first beam splitter through the diffraction grating. A third measurement unit circularly polarizes the beam component diffracted through the diffraction grating to measure a third unidirectional linear motion error of the linear stage.

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Номер записи: 44
20-12-2012 дата публикации

Optical measuring device for monitoring a joint seam, joining head and laser welding head with same

Номер: US20120318775A1
Автор: Joachim Schwarz
Принадлежит: Precitec KG

An optical measuring device for monitoring a joint seam, joining head and laser welding head. The optical measuring device monitors a joining region in a workpiece and has at least one light-section device with a first light source for casting a light fan in the direction of the workpiece to be joined, making a triangulation light line within the joining region which intersects a joint seam. An illumination device with a second light source homogeneously illuminates the joining region. A first optical sensor with a first observation beam path for spatially resolved imaging of the triangulation light line is projected onto the joint seam. A second optical sensor with a second observation beam path for spatially resolved imaging of the joint seam is coaxially coupled with the first observation beam path. The readout rate of the first and second optical sensors is >1 kHz and <500 Hz, respectively.

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Номер записи: 45
20-12-2012 дата публикации

Data processing apparatus

Номер: US20120320095A1
Автор: Boghos Boghossian, James Black
Принадлежит: IPSOTEK LTD

A method of configuring data processing apparatus for automatically determining the real size of an object in an image of a scene is provided. The method includes responding to user input by displaying in the image of the scene displayed on the display screen a virtual object representative of a real size object to establish a first datum position, and storing data defining the first datum position; varying a size of the virtual object in the image; storing data representative of a horizontal and vertical size of the virtual object relative to the displayed image at the first datum position; displaying said virtual object at a second datum position in said image; varying the size of the virtual object on the display screen at the second datum position; and storing data representative of the vertical and horizontal size of the virtual object at the second datum position.

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Номер записи: 46
27-12-2012 дата публикации

System and method for determining cumulative tow gap width

Номер: US20120328159A9
Автор: Eric Rector, Jeffrey Haywood, Reed Hannebaum, Roger W. Engelbart
Принадлежит: Boeing Co

A system for determining cumulative tow gap width includes an in-process vision system having at least one camera adapted to record images of a composite material and a data analysis computer communicating with and adapted to receive image data from the in-process vision system. The data analysis computer may be adapted to calculate a cumulative gap width of tow gaps in the composite material. A user interface may communicate with and be adapted to receive data analysis results from the data analysis computer. A method for determining cumulative tow width gap of tow gaps in a composite structure is also disclosed.

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Номер записи: 47
03-01-2013 дата публикации

Shape measurement method and shape measurement apparatus for tires

Номер: US20130002856A1
Автор: Akinobu Mizutani, Akira Togii, Daisuke Kato, Kenichi Okude
Принадлежит: Bridgestone Corp

A shape measurement method for a tire includes: detecting an outer surface shape data and an inner surface shape of the tire from image data of the outer surface and the inner surface; subjecting irregularities along the tire circumferential direction around the tire in the outer surface shape data and in the inner surface shape data to Fourier transformation to take out primary waveform components respectively; adjusting the tire circumferential positions of both of the waveform components to adjust the tire circumferential positions thereof; adjusting the tire radial direction cross section positions of the outer surface shape data and the inner surface shape data from information about the placement angles and the positions of the first camera and the second camera; and synthesizing the outer surface shape data and the inner surface shape data based on the adjusted tire circumferential positions and the tire radial direction cross section positions.

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Номер записи: 48
10-01-2013 дата публикации

Method for measuring height, non-transitory computer readable medium storing a program for measuring height, and height measuring apparatus

Номер: US20130010107A1
Автор: Masaya Yamaguchi, Yasuo Suzuki
Принадлежит: Nikon Corp

There are provided a method for measuring a height by a height measuring apparatus including: obtaining, in advance, a height correction value depending on an inclination angle of a surface of the object as an angle correction data; obtaining, from the height value of each pixel of the imaging device, the inclination angle of the surface of the object which corresponds to each pixel position of the imaging device; obtaining the height correction value, which corresponds to the inclination angle obtained, from the angle correction data; and correcting the height value of the surface of the object, which corresponds to each pixel of the imaging device, by using the height correction value obtained.

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Номер записи: 49
10-01-2013 дата публикации

Atmospheric molecular contamination control with local purging

Номер: US20130010311A1
Автор: Hidong Kwak, Jagjit Sandhu, Ning-Yi Neil Wang, Torsten Kaack, Ward Dixon
Принадлежит: KLA Tencor Corp

A local purging tool for purging a portion of a surface of a wafer with purging gas is disclosed. The purging tool includes a purging chamber configured to contain purging gas within a cavity of the purging chamber, a permeable portion of a surface of the purging chamber configured to diffuse purging gas from the cavity of the chamber to a portion of a surface of a wafer, and an aperture configured to transmit illumination received from an illumination source to a measurement location of the portion of the surface of the wafer and further configured to transmit illumination reflected from the measurement location to a detector.

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Номер записи: 50
07-02-2013 дата публикации

Interferometric posture detection system

Номер: US20130033709A1
Автор: Bruno Barbier, Laurent Potin, Siegfried Rouzes
Принадлежит: Thales SA

The general field of the invention is that of optical systems for detection of the orientation of mobile objects in space. The main application is helmet posture detection inside of an aircraft cockpit. The system according to the invention operates by interferometry. It comprises a fixed electro-optical device comprising one or more collimated point-like emission sources and a detection assembly comprising one or more point-like photosensitive detectors. Two or more retro-reflecting devices referred to as “cube corner” are disposed on the mobile object. This system can be completed by optical means operating in polarized light mode allowing the direction of variation of the interference fringes to be determined and by other optical devices allowing an initial orientation to be measured.

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Номер записи: 51
28-02-2013 дата публикации

Proximity sensor calibration

Номер: US20130049641A1
Автор: Chenna Bayapureddy, Kyoung Cheol Oh, Leonid Sheynblat
Принадлежит: Qualcomm Inc

The subject matter disclosed herein relates to proximity sensors to measure distance from a surface, and more particularly, calibrating proximity sensors to adjust for various reflecting surfaces.

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Номер записи: 52
14-03-2013 дата публикации

Die inspection method

Номер: US20130063725A1
Автор: Hidekazu Hayashi, Takao Imaoku
Принадлежит: Sharp Corp

A method is disclosed for inspecting a mold which has a porous alumina layer over its surface. The method includes providing, based on a relationship between a first parameter indicative of a thickness of the porous alumina layer and a color parameter indicative of a color of reflected light from the porous alumina layer, first color information which represents a tolerance of the first parameter of a porous alumina layer which has an uneven structure that is within a tolerance; providing a mold which is an inspection subject, the mold having a porous alumina layer over its surface; obtaining a color parameter which is indicative of a color of reflected light from the porous alumina layer of the inspection subject mold; and determining a suitability of the first parameter of the inspection subject mold based on the obtained color parameter and the first color information.

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Номер записи: 53
14-03-2013 дата публикации

Method for evaluating thin-film-formed wafer

Номер: US20130063733A1
Автор: Kuwabara Susumu
Принадлежит: SHIN-ETSU HANDOTAI CO., LTD.

A method for evaluating a thin-film-formed wafer, being configured to calculate a film thickness distribution of a thin film of the thin-film-formed wafer having the thin film on a surface of a substrate, wherein light having a single wavelength λ is applied to a partial region of a surface of the thin-film-formed wafer, reflected light from the region is detected, reflected light intensity for each pixel obtained by dividing the region into many pieces is measured, a reflected light intensity distribution in the region is obtained, and the film thickness distribution of the thin film in the region is calculated from the reflected light intensity distribution. The method enables a film thickness distribution of the micro thin film (an SOI layer) that affects a device to be measured on the entire wafer surface at a low cost with a sufficient spatial resolution in a simplified manner. 19-. (canceled)10. A method for evaluating a thin-film-formed wafer , the method being configured to calculate a film thickness distribution of a thin film of the thin-film-formed wafer having the thin film on a surface of a substrate ,wherein light having a single wavelength λ is applied to a partial region of a surface of the thin-film-formed wafer, reflected light from the region is detected, reflected light intensity for each pixel obtained by dividing the region into many pieces is measured, a reflected light intensity distribution in the region is obtained, and the film thickness distribution of the thin film in the region is calculated from the reflected light intensity distribution.11. The method for evaluating a thin-film-formed wafer according to claim 10 , wherein the wavelength λ is selected in such a manner that reflectance (R) of irradiation light calculated from a film thickness set value of the thin film of the thin-film-formed wafer becomes 0.2 or above and an absolute value of a reflectance fluctuation coefficient (ΔR/R) with respect to the film thickness of the thin ...

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Номер записи: 54
28-03-2013 дата публикации

LEVEL SENSOR, LITHOGRAPHIC APPARATUS, AND SUBSTRATE SURFACE POSITIONING METHOD

Номер: US20130077079A1
Автор: Benschop Jozef Petrus Henricus, BRINKHOF Ralph, Den Boef Arie Jeffrey, KHUAT DUY Laurent, Macht Lukasz Jerzy, Sarri Dimitra, Venema Willem Jurrianus
Принадлежит: ASML Netherlands B.V.

A level sensor for measuring a position of a surface of a substrate includes a projection unit including an emitter for emitting a radiation beam towards the substrate and a projection grating including a measurement grating and an aperture, such that the radiation beam incident on the projection grating is divided into a measurement radiation beam and a capture radiation beam. The level sensor further includes a detection unit including a first and second measurement detector, a first and second capture detector, a detection grating, and a first and second optical unit. The detection grating includes a ruled grating with multiple rules, which direct radiation towards the first and second measurement detector via the first and second optical unit, and a capture element directing radiation towards the first and second capture detector via the first and second optical unit. 2. A level sensor according to claim 1 , wherein the first capture facet has the same orientation as the first measurement facet claim 1 , and wherein the second capture facet has the same orientation as the second measurement facet.3. A level sensor according to claim 1 , wherein the aperture and capture element are configured such that a width of the capture radiation beam is smaller than the width of the capture element claim 1 , such that the capture radiation beam is not able to illuminate the entire first and second capture facet.4. A level sensor according to claim 1 , wherein the radiation emitted by the light source comprises radiation having a wavelength of less than 400 nm.5. A level sensor according to claim 1 , wherein each rule of the multiple rules of the ruled grating of the detection grating comprises a third measurement facet claim 1 , wherein the detection unit comprises a third measurement detector and a third optical unit claim 1 , wherein the third measurement facet is configured to refract radiation of the measurement radiation beam incident on said third measurement facet ...

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Номер записи: 55
28-03-2013 дата публикации

CRITICAL DIMENSION UNIFORMITY CORRECTION BY SCANNER SIGNATURE CONTROL

Номер: US20130077101A1
Автор: Ben-Zvi Guy, Chason Eran, Dmitriev Vladimir, Sharoni Ofir, Varvaruk Igor
Принадлежит:

A contribution to a wafer level critical dimension distribution from a scanner of a lithography system can be determined based on measured wafer level critical dimension uniformity distribution and a contribution to the wafer level critical dimension distribution from a photo mask. Light transmission () across the photo mask () can be measured, a transmittance variation distribution of the photo mask can be determined, and the contribution to the wafer level critical dimension distribution from the photo mask () can be determined () based on the transmittance variation distribution of the photo mask. 1. A method comprising:determining a contribution to a wafer level critical dimension distribution from a scanner of a lithography system based on measured wafer level critical dimension uniformity distribution and a contribution to the wafer level critical dimension distribution from a photo mask.2. The method of claim 1 , comprising determining the contribution to the wafer level critical dimension distribution from the photo mask by measuring light transmission across the photo mask.3. The method of in which determining the contribution to the wafer level critical dimension distribution from the photo mask comprises determining a transmittance variation distribution of the photo mask claim 2 , and determining the contribution to the wafer level critical dimension distribution from the photo mask based on the transmittance variation distribution of the photo mask.4. The method of in which determining the contribution to the wafer level critical dimension distribution from the photo mask based on the transmittance variation distribution of the photo mask comprises applying a correction factor to the transmittance variation distribution of the photo mask claim 3 , the correction factor being based on a linear ratio between wafer level critical dimension variations and transmission variations.5. The method of in which determining the transmittance variation distribution ...

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Номер записи: 56
28-03-2013 дата публикации

Reciprocating laser scanning device

Номер: US20130077643A1
Автор: Steve Spears
Принадлежит: Individual

The present invention is a sweeping or reciprocating laser scanning device. The reciprocation or sweeping motion is cam driven. As the cam rotates, a lever arm is reciprocated or oscillated between two positions, which causes the laser or beam of light to move linearly, thus creating a triangular plane of light resulting in a reciprocating linear reference across the hypotenuse of the triangular plane of light.

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Номер записи: 57
18-04-2013 дата публикации

PROJECTION DISPLAY DEVICE WITH POSITION DETECTION FUNCTION

Номер: US20130094014A1
Автор: NAKANISHI Daisuke
Принадлежит: SEIKO EPSON CORPORATION

A projection display device having a projection device projecting an image on a surface, and a position detection function of detecting an object's position between the surface and the projection device, includes: a light source emitting light beams toward the object; a light detector detecting the light beams reflected by the object; and a position detector detecting the object's position in an imaginary plane based on the light detector's result, wherein the light source emits, as the light beams, first through third light beams having first through third intensity distributions, the second intensity distribution having a highest intensity at a position failing to overlap a highest intensity of the first intensity distribution, and the third intensity distribution having a highest intensity portion at a position failing to overlap a straight line connecting the highest intensity portions of the first and second intensity distributions. 1. A projection display device having a position detecting function of optically detecting a position of an object matter comprising:a position detection light source section adapted to emit position detection light toward the object matter;a light detector adapted to detect the position detection light reflected by the object matter; anda position detection section adapted to detect the position of the object matter detected by the light detector,wherein the position detection light source section forms position detection light having a first intensity distribution, a second intensity distribution, and a third intensity distribution, respectively,the first intensity distribution, the second intensity distribution, and the third intensity distribution have intensity gradients in given directions that are different from each other.2. The projection display device with a position detection function according to claim 1 , whereinin each of the first intensity distribution, the second intensity distribution, and the third intensity ...

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Номер записи: 58
18-04-2013 дата публикации

System and method for measuring layer thickness and depositing semiconductor layers

Номер: US20130095577A1
Автор: Erel Milshtein
Принадлежит: First Solar Inc

Described herein is a method and apparatus for measuring the thickness of a deposited semiconductor material. A colorimeter has an optical source that illuminates a portion of a deposited semiconductor material with optical radiation, a sensor that collects and measures color information related to reflected radiation from the deposited semiconductor material, and a processor that receives the color information related to the reflected radiation from the sensor and calculates a thickness of the semiconductor material. The processor may control a semiconductor material deposition apparatus.

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Номер записи: 59
25-04-2013 дата публикации

COORDINATE MEASUREMENT MACHINES WITH REMOVABLE ACCESSORIES

Номер: US20130097882A1
Автор: Bridges Robert E., Briggs Clark H., Hoffer, JR. John M.
Принадлежит: FARO TECHNOLOGIES, INC.

A portable articulated arm coordinate measuring machine for measuring the coordinates of an object in space is provided. The AACMM includes a base and an arm portion having an opposed first and second ends. The arm portion including a plurality of connected arm segments that each includes at least one position transducer for producing a position signal. An electronic circuit is provided that receives the position signal from the at least one position transducer and provides data corresponding to a position of the measurement device. A noncontact three-dimensional measuring device is coupled to the first end, the device having an electromagnetic radiation transmitter and is configured to determine a distance to an object based at least in part on the speed of light in air. A processor is configured to determine the three-dimensional coordinates of a point on the object in response to receiving the position signals and the distance to the object. 1. A portable articulated arm coordinate measuring machine (AACMM) for measuring the coordinates of an object in space , comprising:a base;a manually positionable arm portion having an opposed first end and second end, the arm portion being rotationally coupled to the base, the arm portion including a plurality of connected arm segments, each arm segment including at least one position transducer for producing a position signal;an electronic circuit configured to receive the position signal from the at least one position transducer;a probe end coupled to the first end;a noncontact three-dimensional measurement device coupled to the probe end, the noncontact three-dimensional measurement device having an electromagnetic radiation transmitter, the noncontact three-dimensional measurement device configured to determine a distance to an object based at least in part on the speed of light in air; anda processor electrically coupled to the electronic circuit, the processor configured to determine the three-dimensional coordinates ...

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Номер записи: 60
25-04-2013 дата публикации

TRIBOMETER

Номер: US20130098139A1
Автор: ADAMS, Jr. Robert C.
Принадлежит: TRIBIS ENGINEERING, INC.

A test apparatus and methods of measuring wear of a material with a laser displacement measurement apparatus based upon displacement of a test sample of the material or the wear of a testing surface and a specimen. A lubricant test method and apparatus measures the thickness of a lubricant film between two test surfaces by comparing the location of the test surfaces at rest and dynamically. 1. An apparatus for measuring wear of a test specimen , comprising:a support structure;a test surface supported by the support structure;a test specimen supported by a retainer on the support structure to engage the test surface;a drive operatively engaging at least one of the test surface and the test specimen to move the other of the test surface and the test specimen relative thereto;a laser displacement measurement apparatus supported by the support structure that reflects a laser off of a surface of one of the retainer and the test specimen to measure the displacement of the test specimen.2. The apparatus of wherein the laser displacement measurement apparatus is a first laser displacement apparatus and a second laser displacement apparatus is supported by the support structure that reflects a second laser off of the test surface of the disk claim 1 , wherein the displacement measured by the first and second laser are compared to correct for noise factors in displacement measurements.3. The apparatus of wherein the second laser displacement measurement apparatus is supported by the support structure that reflects a second laser off of a wear track formed on the test surface of the disk by the test specimen claim 2 , wherein the second laser displacement apparatus measures the thickness of a film transferred from the test specimen to the test surface claim 2 , and wherein the displacement measurement can be corrected by adjusting for the film thickness.4. The apparatus of wherein an optical profiling system may be used to determine the profile of the wear track including the ...

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Номер записи: 61
25-04-2013 дата публикации

Image Processing Apparatus And Image Processing Program

Номер: US20130100170A1
Автор: Shingo Matsumura, Woobum Kang
Принадлежит: Keyence Corp

Provided is an image processing apparatus and an image processing program which are capable of selectively and readily acquiring a geometrical physical quantity of a desired measuring portion. An object image is displayed based on object image data, and a measuring portion designating image corresponding to a specific portion of the object image is displayed based on designating image data. By operation of an operation part by a user, the displayed measuring portion designating image is moved relatively to the object image. When the measuring portion designating image is moved to a specific portion of the object image, a geometrical physical quantity of a measuring portion of the measuring object, previously set so as to correspond to that specific portion, is measured.

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Номер записи: 62
09-05-2013 дата публикации

STEREOSCOPIC MEASUREMENT SYSTEM AND METHOD

Номер: US20130113893A1
Автор: CLENDENING Grady A., REDDEN Carl, REDDEN Warren, SRACK Janet M., SRACK Robert W., STEVENS George B., WATERS Windflower, WEINTRAUB Steven
Принадлежит:

A stereoscopic measurement system captures stereo images and determines measurement information for user-designated points within stereo images. The system comprises an image capture device for capturing stereo images of an object. A processing system communicates with the capture device to receive stereo images. The processing system displays the stereo images and allows a user to select one or more points within the stereo image. The processing system processes the designated points within the stereo images to determine measurement information for the designated points. 1. A system for obtaining measurements of an object , the system comprising:a plurality of images of the object; and designate a plurality of measurement points in each of the plurality of images;', 'define a plurality of stereo points based on the plurality of measurement points; and', 'calculate a distance between any two of the plurality of stereo points., 'a processing system, wherein the processing system is configured to'}2. The system of wherein:the plurality of images of the object comprises a stereo image pair;the stereo image pair comprises a corresponding first image of the object and a corresponding second image of the object; andthe corresponding first image and the corresponding second image of the stereo image pair are captured substantially simultaneously.3. The system of wherein the processing system further comprises a memory claim 2 , and the processing system is further configured to store the plurality of images in the memory.4. The system of wherein:the plurality of measurement points comprise a first measurement point and a second measurement point;the plurality of stereo points comprise a first stereo point and a second stereo point; the first measurement point in the first image of the stereo image pair;', 'the second measurement point in the first image of the stereo image pair;', 'the first measurement point along a selection assist line in the second image of the stereo ...

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Номер записи: 63
09-05-2013 дата публикации

Template matching processing device and template matching processing program

Номер: US20130114898A1
Автор: Jun&#39;ichi Taguchi, Masahiro Kitazawa, Mitsuji Ikeda, Wataru Nagatomo, Yuichi Abe
Принадлежит: Hitachi High Technologies Corp

The present invention is a template matching processing device capable of evaluating a similarity degree which supports even a case of intensive morphological change between a design image and a photographic image. In the template matching processing device, matching processing between the design image and the photographic image is performed, a partial design image is obtained by clipping a portion having the highest correlation (step 101 ), and processing for deforming the photographic image in accordance with the clipped design image (steps 102 to 105 ) is performed, so that correlation between the deformed image obtained and the design image is taken to be set as the similarity degree.

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Номер записи: 64
16-05-2013 дата публикации

IMAGE GENERATION DEVICE

Номер: US20130120563A1
Автор: Iwaki Yoshitake, Nakamura Tomonori, Takahashi Teruo, TERADA Hirotoshi
Принадлежит: HAMAMATSU PHOTONICS K.K.

An image generation device comprises a laser light source a laser output control unit a laser scanner a modulation pattern control unit for such control as to irradiate the object with illumination light having a plurality of spatial modulation patterns, an electric signal detector for detecting an electric signal issued from the object A, an electric signal imaging unit for generating a two-dimensional characteristic image including characteristic distribution information associating illumination position information with characteristic information, and an image data operation unit for generating a pattern image of the object A according to a plurality of characteristic images generated so as to correspond to the plurality of spatial modulation patterns. 1. An image generation device for generating an image of an object to be measured , the device comprising:a laser light source for emitting laser light;a laser modulation unit for modulating an intensity of the laser light;a laser scanning unit for scanning an irradiation position of the laser light with respect to the object;a control unit for controlling the laser modulation unit and laser scanning unit so as to irradiate the object with illumination light having a plurality of spatial modulation patterns;a detection unit for detecting a signal issued from the object in response to irradiation with the illumination light having the plurality of spatial modulation patterns;a signal generation unit for producing characteristic distribution information associating irradiation position information concerning the irradiation position of the illumination light controlled by the control unit with characteristic information concerning a characteristic of the signal detected by the detection unit in response to the irradiation with the laser light at the irradiation position and generating a two-dimensional characteristic image including a plurality of pieces of the characteristic distribution information corresponding to ...

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Номер записи: 65
16-05-2013 дата публикации

Distance Estimation Between a Fiber End and a Tissue Using Numerical Aperture Modulation

Номер: US20130123769A1
Автор: Arkady Khatchaturov, Igal Koifman, Uri Voitsechov
Принадлежит: LUMENIS LTD

A system and method of estimating a distance between the distal end of an optical fiber and treated tissue, to improve treatment efficiency, is provided herein. The estimation is achieved by modulating the numerical aperture of a light beam transmitted through the fiber to receive reflections from the tissue and distinguish them from other reflections in the fiber, and further by calculating the distance by comparing reflection intensities of beams having different numerical aperture values that illuminate the tissue over a very short period, so that tissue and environment conditions do not change much. Distance estimation may be carried out by modulating the treatment beam itself, or by a light beam transmitted between pulses of a pulsed

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Номер записи: 66
16-05-2013 дата публикации

Transparent object detection system and transparent flat plate detection system

Номер: US20130123985A1
Автор: Hideaki Hirai, Masanori Kobayashi, Shin Aoki, Xue Li
Принадлежит: Ricoh Co Ltd

A disclosed transparent body detection system includes an image acquisition unit acquiring a vertical polarization image and a horizontal polarization image by acquiring an image of a first region, the image including a transparent body having characteristics in which a polarization direction of transmission light changes; a placing table on which the transparent body is to be placed; a polarization filter disposed opposite to the image acquisition unit across the placing table and at a position including a second region, an image of the second region including at least the transparent body in the first region and being acquired; and an image processing apparatus detecting the transparent body based on distribution of vertical/lateral polarization degree of a vertical/lateral polarization degree image based on the vertical polarization image and the horizontal polarization image.

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Номер записи: 67
23-05-2013 дата публикации

COORDINATE MEASUREMENT MACHINES WITH REMOVABLE ACCESSORIES

Номер: US20130125408A1
Автор: Atwell Paul C., Briggs Clark H., Stokes Burnham
Принадлежит: FARO TECHNOLOGIES, INC.

A portable articulated arm coordinate measuring machine is provided. The coordinate measuring machine includes a base with an arm portion. A probe end is coupled to an end of the arm portion distal from the base. A device configured to emit a coded structured light onto an object to determine the three dimensional coordinates of a point on the object. 1. A portable articulated arm coordinate measuring machine (AACMM) for measuring three-dimensional coordinates of an object in space , comprising:a base;a manually positionable arm portion having an opposed first end and second end, the arm portion being rotationally coupled to the base, the arm portion including a plurality of connected arm segments, each arm segment including at least one position transducer for producing a position signal;an electronic circuit which receives the position signal from the at least one position transducer in each arm segment;a probe end coupled to the first end;a noncontact three-dimensional measuring device coupled to the probe end, the noncontact three-dimensional measuring device having a projector and an image sensor, the projector having a source plane, the projector configured to emit a structured light onto the object, the structured light located on the source plane and including at least three non-collinear pattern elements, the image sensor arranged to receive the structured light reflected from the object; anda processor electrically coupled to the electronic circuit, the processor configured to determine the three-dimensional coordinates of a point on the object in response to receiving the position signals from the position transducers and in response to receiving the structured light by the image sensor.2. The AACMM of wherein the noncontact three-dimensional measuring device is removably coupled to the probe end.3. The AACMM of wherein the structured light is a coded structured light pattern.4. The AACMM of wherein the noncontact three-dimensional measuring device is ...

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Номер записи: 68
23-05-2013 дата публикации

CENTRIFUGE IMBALANCE SENSOR AND NON-CONTACT SPECIMEN CONTAINER CHARACTERIZATION

Номер: US20130125648A1
Автор: ALLEN Santiago, GROSS MARK, MURASHIE Ed, TROCHMAN Allan
Принадлежит: Beckman Coulter, Inc.

A system and method for non-contact specimen container characterization includes a processor, and a specimen container diameter sensor, and a specimen container length sensor. The non-contact specimen container can also include a cap color sensor. The sensors are located in a fixed position relative to a conveyor for transporting a plurality of specimen containers. 1. A system for non-contact specimen container characterization , the system comprising:a processor;a specimen container diameter sensor communicatively coupled to the processor, the specimen container diameter sensor including a horizontally oriented linear optical array; anda specimen container length sensor communicatively coupled to the processor, the specimen container length sensor including a vertically oriented linear optical array;wherein the specimen container diameter sensor and the specimen container length sensor are located in a fixed position relative to a conveyor for transporting a plurality of specimen containers.2. The system of claim 1 , further comprising a cap color sensor communicatively coupled to the processor claim 1 , wherein the cap color sensor is located in a fixed position relative to the conveyor for transporting a plurality of specimen containers.3. The system of claim 2 , wherein the cap color diameter sensor includes a light-to-frequency converter.4. The system of claim 1 , further comprising a plurality of cap color diameter sensors communicatively couple dot the processor claim 1 ,wherein each of the plurality of cap color sensors are located in a fixed position relative to the conveyor for transporting a plurality of specimen containers, andwherein a signal received by the processor from the specimen container length sensor is used to determine which of the plurality of cap color sensors generate a signal corresponding to the cap color of a specimen container cap.5. The system of claim 1 , wherein the specimen container is inserted into a sample carrier that is ...

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Номер записи: 69
23-05-2013 дата публикации

Aliquotter system and workflow

Номер: US20130125675A1
Автор: Charles W. JOHNS, Martin Müller
Принадлежит: Beckman Coulter Inc

A method is disclosed. The method includes aspirating an aliquot volume of a sample in a primary sample container located in an aspiration position in an aliquotter module, and dispensing the aliquot volume of the sample in a secondary sample container located in a dispensing position in the aliquotter module. The method also includes the step of causing the secondary sample container to leave the aliquotter module before the primary sample container.

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Номер записи: 70
23-05-2013 дата публикации

Method for Smear Measurement of Display Device and Device for Smear Measurement of Display Device

Номер: US20130128033A1
Автор: Guochuan Huang, Hao Jin, Jianli Dai
Принадлежит: Shenzhen China Star Optoelectronics Technology Co Ltd

The present invention discloses a method for smear measurement of display device and a device for smear measurement of display device which comprises the following steps: a flash with a moving pattern and an unmovable scale is played in the display device; the smear extent of the moving pattern is judged in accordance with the scale number occupied by the smear in the flash. The present invention plays a flash with a moving pattern and an unmovable scale in the display device and judges smear extent of the moving pattern in accordance with the scale number occupied by the smear in the flash, so that the smear can be quantified by scales and different scale numbers corresponding to different smear extents are formed, to accurately judge the smear extent by observing the scale number occupied by the smear, thereby effectively monitoring the product quality.

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Номер записи: 71
23-05-2013 дата публикации

Level Sensor, a Method for Determining a Height Map of a Substrate, and a Lithographic Apparatus

Номер: US20130128247A1
Автор: Erik Johan Koop, Laurent Khuat Duy, Lukasz Jerzy MACHT, Martinus Cornelis Reijnen
Принадлежит: ASML Netherlands BV

The invention provides a level sensor configured to determine a height level of a surface of a substrate, comprising a detection unit arranged to receive a measurement beam after reflection on the substrate, wherein the detection unit comprises an array of detection elements, wherein each detection element is arranged to receive a part of the measurement beam reflected on a measurement subarea of the measurement area, and is configured to provide a measurement signal based on the part of the measurement beam received by the respective detection element, and wherein the processing unit is configured to calculate, in dependence of a selected resolution at the measurement subarea, a height level of the measurement subarea, or to calculate a height level of a combination of multiple measurement subareas.

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Номер записи: 72
23-05-2013 дата публикации

INTERFERENCE OPTICAL SYSTEM, SUBSTRATE PROCESSING APPARATUS, AND MEASURING METHOD

Номер: US20130128275A1
Автор: MATSUDO Tatsuo, NAGAI Kenji
Принадлежит: TOKYO ELECTRON LIMITED

The interference optical system includes a light source, a collimator, a light-receiving element, a tunable filter, and a calculation apparatus. The collimator emits measuring light from the light source to a first main surface of the object, and receives reflected light from the first main surface and a second main surface. The light-receiving element acquires an intensity of light from the collimator. The tunable filter sweeps a wavelength of the light incident to the light-receiving element. The calculation apparatus measures an interference intensity distribution that has wavelength dependence and is an intensity distribution of the reflected light from the first main surface and the second main surface, and measures the thickness or the temperature of the object based on a waveform obtained by Fourier transforming the interference intensity distribution. 1. An interference optical system for measuring a thickness or a temperature of an object which has a first main surface and a second main surface opposite to the first main surface , the interference optical system comprising:a light source which emits measuring light having a wavelength transmitting through the object;a collimator which is connected to the light source to emit the measuring light from the light source to the first main surface of the object, and receive reflected light from the first main surface and the second main surface;a single light-receiving element which receives the light from the collimator to obtain an intensity of the light;a sweeping unit which sweeps a wavelength of the light incident to the light-receiving element;is a spectrum acquisition unit which measures an interference intensity distribution that has wavelength dependence and is an intensity distribution of the reflected light from the first main surface and the second main surface, by using the sweeping unit and the light-receiving element; anda measuring unit which measures the thickness or the temperature of the object ...

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Номер записи: 73
23-05-2013 дата публикации

SYSTEM AND METHOD FOR MEASURING LENGTH OF GAP BETWEEN ROTATING TOOL AND WORKPIECE

Номер: US20130128285A1
Автор: Khajornrungruang Panart, Kimura Keiichi
Принадлежит:

The present invention is to generate a pulsed laser beam having a width greater than the gap between a rotating tool and a workpiece opposed thereto, and then irradiate the gap with the generated laser beam while the optical axis thereof is tilted relative to a workpiece plane. The pulsed laser beam has one lased-pulse period per one revolution or an integer number of revolutions of the rotating tool and is directed in the same angle range relative to the rotating tool within the ON durations of the lased pulse. The light which has irradiated the gap and has not been interrupted but diffracted by the gap is detected on a light-receiving sensor to measure the length of the gap. 1. A method for measuring a length of a gap between a rotating tool and a workpiece using a pulsed laser beam ,the method comprising:generating a pulsed laser beam having a width greater than the gap between the rotating tool and the workpiece oppositely disposed to the rotating tool, and irradiating the gap with the generated pulsed laser beam whose optical axis is tilted relative to a plane of the workpiece;emitting the pulsed laser beam in an identical angle range of the rotating tool during oscillation pulse ON durations, the pulsed laser beam having an oscillation pulse period that is one pulse per revolution or per an integer number of revolutions of the rotating tool; anddetecting on a light receiving sensor a light which is irradiated toward the gap and which is diffracted through the gap without being interrupted, so as to measure a length of the gap.2. The method for measuring a length of a gap according to claim 1 , whereinthe light receiving sensor receives the pulsed laser beam emitted for a predetermined number of the periods, and detects an integrated diffracted light pattern during the predetermined number of the periods.4. A system for measuring a length of a gap between a rotating tool and a workpiece using a pulsed laser beam claim 1 ,the system comprising:a laser source for ...

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Номер записи: 74
30-05-2013 дата публикации

Pattern generation using diffractive optical elements

Номер: US20130136305A1
Автор: Alexander Shpunt, Zeev Zalevsky
Принадлежит: PRIMESENSE LTD

Apparatus ( 20 ) for 3D mapping of an object ( 28 ) includes an illumination assembly ( 30 ), including a coherent light source ( 32 ) and a diffuser ( 33 ), which are arranged to project a primary speckle pattern on the object. A single image capture assembly ( 38 ) is arranged to capture images of the primary speckle pattern on the object from a single, fixed location and angle relative to the illumination assembly. A processor ( 24 ) is coupled to process the images of the primary speckle pattern captured at the single, fixed angle so as to derive a 3D map of the object.

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Номер записи: 75
13-06-2013 дата публикации

Method of detecting a component of an article and method of preparing a component for detection

Номер: US20130147076A1
Автор: Kristopher K. Biegler, Michael R. Gorman, Neelakandan Chandrasekaran, Timothy P. Pariseau
Принадлежит: 3M Innovative Properties Co

A method of detecting the presence or position of a first component in an article is disclosed. The first component, which has a predefined response to incident light, includes a microporous film of a semi-crystalline polyolefin and a beta-nucleating agent. The method includes irradiating the article with incident light, detecting light received from the irradiated article; and identifying the predefined response of the first component in the light received from the irradiated article to detect the presence or the position of the first component. A method for preparing a mechanical fastening component for use in an article is also disclosed. The method includes stretching a film backing containing beta-spherulites and having upstanding fastening elements to provide a microporous film backing with sufficient porosity to allow it to be detected when subjected to an inspection system comprising a light detector.

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Номер записи: 76
13-06-2013 дата публикации

DETECTION OF OBSTACLES AT NIGHT BY ANALYSIS OF SHADOWS

Номер: US20130147957A1
Автор: Stein Gideon
Принадлежит: MOBILEYE TECHNOLOGIES LTD.

A driver assistance systems mountable in a host vehicle while the host vehicle is moving forward with headlights on for detection of obstacles based on shadows. The driver assistance system includes a camera operatively connectible to a processor. A first image frame and a second image frame are captured of a road. A first dark image patch and a second dark image patch include intensity values less than a threshold value. The first and the second dark image patches are tracked from the first image frame to the second image frame as corresponding images of the same portion of the road. Respective thicknesses in vertical image coordinates are measured of the first and second dark image patches responsive to the tracking. 1. A computerized method performable at night by a driver assistance system mountable in a host vehicle while the host vehicle is moving forward with headlights on , wherein the driver assistance system includes a camera operatively connectible to a processor , the method comprising:capturing a first image frame and a second image frame of a road in the field of view of the camera;processing said first image frame and said second image frame to locate a first dark image patch of said first image frame and a second dark image patch of said second image frame;tracking said first and said second dark image patches from said first image frame to said second image frame as corresponding images of the same portion of the road; andmeasuring respective thicknesses in vertical image coordinates of said first and second dark image patches responsive to said tracking from said first image frame to said second image frame.2. The method of claim 1 , wherein said processing is performed by filtering said first image frame and said second image frame with a threshold value of gray scale to produce said first dark image patch of said first image frame and said second dark image patch of said second image frame claim 1 , wherein said first dark image patch and said ...

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Номер записи: 77
13-06-2013 дата публикации

Device Manufacturing Method and Associated Lithographic Apparatus, Inspection Apparatus, and Lithographic Processing Cell

Номер: US20130148121A1
Автор: Arie Jeffrey Den Boef, Kaustuve Bhattacharyya, Martin Jacobus Johan Jak, Michael Kubis
Принадлежит: ASML Netherlands BV

Disclosed is a device manufacturing method, and accompanying inspection and lithographic apparatuses. The method comprises measuring on the substrate a property such as asymmetry of a first overlay marker and measuring on the substrate a property such as asymmetry of an alignment marker. In both cases the asymmetry is determined. The position of the alignment marker on the substrate is then determined using an alignment system and the asymmetry information of the alignment marker and the substrate aligned using this measured position. A second overlay marker is then printed on the substrate; and a lateral overlay measured on the substrate of the second overlay marker with respect to the first overlay marker using the determined asymmetry information of the first overlay marker.

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Номер записи: 78
13-06-2013 дата публикации

SENSOR HEAD HOLDER

Номер: US20130148132A1
Автор: Wagner Jean-Jacques
Принадлежит: ELESTA RELAYS GMBH

A position measuring device comprises 17-. (canceled)8. A position measuring device , comprising:a housing;a transparent substrate:a sensor head on the transparent substrate having an opening and a light receiver element arranged in the housing, an edge of the transparent substrate having a first keyed connection with the opening;a rotatable material measure having a plurality of optical elements at a distance from the sensor head, the material measure configured to be arranged on a rotary encoder mounted on a shaft of a device, the light receiver element arranged in a defined position relative to the plurality of optical elements to interact with the plurality of optical elements to produce a signal;a sensor head holder comprising a second keyed connection with the housing and the sensor head, the housing, the sensor head holder and the sensor head configured so that the second keyed connection establishes the defined position of the light receiver element relative to the plurality of optical elements, and for this purpose.9. The position measuring device of claim 8 , wherein the deviation from the defined position is less than 0.2 mm.10. The position measuring device of claim 8 , wherein the deviation from the defined position is less than 0.1 mm.11. The position measuring device of claim 8 , wherein the deviation from the defined position is less than 0.05 mm.12. The position measuring device of claim 8 , wherein the transparent substrate is formed from a larger substrate plate by dividing up the substrate plate and wherein the defined position of the light receiver element relative to the edge of the transparent substrate is determined by the dividing-up of the larger substrate plate claim 8 , wherein the deviation from the defined position is less than 0.05 mm13. The position measuring device of claim 8 , wherein the transparent substrate is formed on a larger substrate plate by dividing up the substrate plate and wherein the defined position of the light ...

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Номер записи: 79
20-06-2013 дата публикации

Electronic device and method for focusing and measuring points of objects

Номер: US20130155313A1
Автор: Chih-Kuang Chang, Dong-Hai Li, LI Jiang, Xiao-Guang Xue, Zhong-Kui Yuan
Принадлежит: Individual

In an electronic device, an image point A on an image of an object is selected. A spectral confocal sensor is controlled to move to a position above a measuring point A′ on the object, where the measuring point A′ corresponds to the image point A, and a Z-coordinate of the measuring point A′ is computed using the spectral confocal sensor. A focal position of the measuring point A′ is computed according to the Z-coordinate of the measuring point A′, and a CCD lens is controlled to move to the focal position. The Z-coordinate of the measuring point A′ is stored into a storage unit of the electronic device.

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Номер записи: 80
20-06-2013 дата публикации

Film thickness monitor

Номер: US20130155390A1
Автор: Earl Jensen, Farhat Quli, Kevin O&#39;Brien, Mei Sun
Принадлежит: Individual

A measurement unit comprising a light source and a photodetector may be formed in a cavity in a substrate. The light source produces light that impinges a material layer and is reflected back to the photodetector. Through methods such as interferometry and ellipsometry, the thickness of the material layer may be calculated from the light intensity data measured by the photodetector. It is emphasized that this abstract is provided to comply with the rules requiring an abstract that will allow a searcher or other reader to quickly ascertain the subject matter of the technical disclosure. It is submitted with the understanding that it will not be used to interpret or limit the scope or meaning of the claims.

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Номер записи: 81
20-06-2013 дата публикации

HEIGHT-MEASURING METHOD AND HEIGHT-MEASURING DEVICE

Номер: US20130155415A1
Автор: Nishikawa Takashi
Принадлежит: NIKON CORPORATION

A height-measuring device () in which the focal position of an image-forming optical system () is moved in relative fashion in the direction of an optical axis with respect to an object () to be measured; scanning is performed; images of the object () to be measured, which are formed by the image-forming optical system (), are obtained in order; and the focal position for individual pixels of the images is found, thereby yielding a relative height value of the object to be measured () at positions corresponding to the pixels; wherein a second function (g) is defined on the basis of a first function (f) fitted to a numerical value sequence comprising a coordinate value on the optical axis and a light intensity value for the pixels of a plurality of the images obtained by the scanning, or the coordinate value and a numerical value obtained by processing the light intensity value; and positions on the optical axis at which a correlation value between the numerical value sequence and the second function (g) becomes a maximum value or a minimum value serve as the relative height values of the object to be measured at the positions corresponding to the pixels. 1. A height-measuring method comprising: moving an optical system relative to be measured along an optical axis of the optical system; forming an image of the object to be measured on a surface; measuring a relative height of the object based on a change in brightness in the surface , andfinding a correlation between a first property indicative of the change in brightness with respect to the relative movement of the optical system based on a portion of the first property where the change in brightness with respect to the relative movement of the optical system is large and a second property indicative of the change in brightness with respect to the relative movement of the optical system, and finding the relative height based on the correlation.2. The height-measuring method according to claim 1 , further comprising ...

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Номер записи: 82
20-06-2013 дата публикации

Authentication of articles

Номер: US20130155421A1
Автор: Robert Stewart, Stephen Langstaff
Принадлежит: Individual

The present invention provides a method of authenticating the provenance of an article marked with a transparent polymer film comprising measuring the thickness of the film or of a layer within in the film by white light interferometry and/or by birefringence.

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Номер записи: 83
20-06-2013 дата публикации

Optical Measurement Device Calibration

Номер: US20130158929A1
Автор: Ehud Chatow, Kok-Wei Koh, Nathan Moroney
Принадлежит: Hewlett Packard Development Co LP

Optical measurement device calibration systems and methods are disclosed. An exemplary method includes receiving calibration information from a plurality of optical measurement devices (200) at a central data store (124), the calibration information comprising at least real-time measurement data stored on the plurality of optical measurement devices, the plurality of optical measurement devices each at different print facilities. The method also includes analyzing at least one trend in the calibration information at the central data store. The method also includes issuing an instruction to at least one of the plurality of optical measurement devices to update a calibration parameter in the at least one optical measurement device based on the at least one trend.

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Номер записи: 84
20-06-2013 дата публикации

INFORMATION PROCESSING APPARATUS, CONTROL METHOD FOR INFORMATION PROCESSING APPARATUS AND STORAGE MEDIUM

Номер: US20130158947A1
Автор: Suzuki Masahiro
Принадлежит: CANON KABUSHIKI KAISHA

An information processing apparatus comprises a first sensor unit configured to obtain, as first information, two-dimensional information or three-dimensional information about a target object; a first measurement unit configured to measure a position and orientation of the target object by analyzing the first information; a second sensor unit mounted on a robot for executing an operation for the target object, and configured to obtain, as second information, two-dimensional information or three-dimensional information about the target object in a position and orientation determined based on a measurement result by the first measurement unit; and a second measurement unit configured to measure the position and orientation of the target object by analyzing the second information. 1. An information processing apparatus comprising:a first sensor unit configured to obtain, as first information, two-dimensional information or three-dimensional information about a target object;a first measurement unit configured to measure a position and orientation of the target object by analyzing the first information;a second sensor unit mounted on a robot for executing an operation for the target object, and configured to obtain, as second information, two-dimensional information or three-dimensional information about the target object in a position and orientation determined based on a measurement result by said first measurement unit; anda second measurement unit configured to measure the position and orientation of the target object by analyzing the second information.2. The apparatus according to claim 1 , further comprisinga determination unit configured to determine, as a position and orientation of said second sensor unit, a position and orientation in which reflected light of projection light projected on the target object when said second sensor unit captures the target object does not enter a capturing range of said second sensor unit, based on the measurement result by ...

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Номер записи: 85
20-06-2013 дата публикации

TECHNIQUES FOR OPTIMIZED SCATTEROMETRY

Номер: US20130158948A1
Автор: Aoyagi Paul, Chard Jeffrey, Chu Hanyou, Flanner, III Phillip D., Iloreta Jonathan, Jiang Peilin, Poslavsky Leonid, Sushchik Mikhail
Принадлежит:

Provided are optimized scatterometry techniques for evaluating a diffracting structure. In one embodiment, a method includes computing a finite-difference derivative of a field matrix with respect to first parameters (including a geometric parameter of the diffracting structure), computing an analytic derivative of the Jones matrix with respect to the field matrix, computing a derivative of the Jones matrix with respect to the first parameters, and computing a finite-difference derivative of the Jones matrix with respect to second parameters (including a non-geometric parameter). In one embodiment, a method includes generating a transfer matrix having Taylor Series approximations for elements, and decomposing the field matrix into two or more smaller matrices based on symmetry between the incident light and the diffracting structure. 1. A method of evaluating a diffracting structure , the method comprising:computing a finite-difference derivative of a field matrix with respect to first parameters, the field matrix comprising material boundary information and the first parameters comprising a parameter describing the material boundaries of the diffracting structure;computing an analytic derivative of a Jones matrix with respect to the first parameters using the finite-difference derivative of the field matrix with respect to the first parameters;computing a finite-difference derivative of the Jones matrix with respect to second parameters comprising a non-material boundary parameter; anddetermining values of parameters of the diffracting structure based on the analytic derivative of the Jones matrix with respect to the first parameters and the finite-difference derivative of the Jones matrix with respect to the second parameters.2. The method of claim 1 , further comprising:concatenating the derivative of the Jones matrix with respect to the first parameters with the derivative of the Jones matrix with respect to the second parameters prior to determining the values ...

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Номер записи: 86
27-06-2013 дата публикации

SYSTEM AND METHOD FOR MEASURING PIPE

Номер: US20130160309A1
Автор: Aguirre Claudio, Lam Clive C., Logan Kevin D., Rodriguez Andres C.
Принадлежит: NATIONAL OILWELL VARCO, L.P.

A system and method for measuring a pipe is provided. The system includes a frame rotatably receiving the pipe, a carriage movably positionable along the frame, a guide floatingly positionable about the carriage, at least one sensor for measuring a position of the pipe, and a measurement unit operatively linked to the sensor for collecting measurements therefrom. The guide has a mouth that receivingly engages the pipe and axially aligns therewith. The pipe is measured with the sensor(s) while moving at least one of the pipe, the carriage and the guide. 1. A system for measuring pipe , the system comprising:a frame rotatably receiving the pipe;a carriage movably positionable along the frame;a guide floatingly positionable about the carriage, the guide having a mouth that receivingly engages the pipe and axially aligns therewith;at least one sensor for measuring a position of the pipe; anda measurement unit operatively linked to the at least one sensor for collecting measurements therefrom.2. The system of claim 1 , wherein the frame has an upper and a lower portion claim 1 , the lower portion having rollers rotatably receiving the pipe.3. The system of claim 1 , wherein the guide is floatingly suspended from the carriage.4. The system of claim 1 , wherein the at least one sensor comprises at least one carriage sensor detecting a position of the carriage claim 1 , a plurality of guide sensors measuring displacement of the pipe claim 1 , and a rotary sensor measuring a rotational position of a marker on the pipe.5. A system for measuring pipe claim 1 , the system comprising:a frame having an upper and lower portion, the lower portion rotatably receiving the pipe, the upper portion having rails positioned a distance above the lower portion;a carriage movably positionable along rails of the frame, the carriage having a carriage sensor that detects a position of the carriage along the rails;a guide floatingly suspended from the carriage, the guide having a mouth that ...

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Номер записи: 87
04-07-2013 дата публикации

CONTROL METHOD FOR PRODUCING GROUND MARKINGS, AND REFERENCE BEAM GENERATOR

Номер: US20130167385A1
Автор: Schneider Klaus
Принадлежит: LEICA GEOSYSTEMS AG

The invention relates to a control method for producing ground markings, with a reference beam generator for determining a reference plane, a reception of the reference beams by means of an optical detector, wherein the position of an application unit for the marking substance can be derived relative to the reference plane by using the received reference beams, a derivation of the orientation relative to the reference plane, and a control of an application of the marking substance to produce ground markings according to the orientation. According to the method, the intensity in the solid angle covered by the reference beam is varied in time during the production of the marking. 1. A reference beam generator for producing an electromagnetic reference beam , comprising:a radiation source for producing electromagnetic radiation;a housing which is contactable on the surface with respect to a distinguished point; andan optical system for the emission of the electromagnetic radiation as a reference beam, the optical system being configured to vary the intensity in the solid angle covered by the reference beam as a function of time, wherein the optical system varies at least one first opening angle of the electromagnetic reference beam as a function of time.2. A reference beam generator according to claim 1 , wherein the optical system has a lens which is longitudinally displaceable in the direction of the optical axis or a mirror which is longitudinally displaceable.3. A reference beam generator according to claim 1 , wherein the optical system has a mechanically moveable mirror surface.4. A reference beam generator according to claim 3 , wherein the mirror surface has a curvature with a radius of curvature which is variable in the direction of movement.5. A reference beam generator according to claim 3 , wherein the mirror surface has a curvature with a radius of curvature which is variable in the direction of movement with a radius of curvature varying cyclically in the ...

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Номер записи: 88
04-07-2013 дата публикации

COMPUTING DEVICE AND METHOD FOR MEASURING WIDTHS OF MEASURED PARTS

Номер: US20130169791A1
Автор: CHANG CHIH-KUANG, JIANG LI, XUE XIAO-GUANG, YUAN ZHONG-KUI, ZOU ZHI-JUN
Принадлежит:

In a method to measure widths of measured parts placed on a platform, a computing device connects to one or more charge coupled device (CCD) cameras. The method controls each of the CCD cameras to capture a digital image from a measured part that is placed near the CCD cameras, obtains the digital image of the measured part from each of the CCD cameras in a predefined order, and obtains a binary expression from the digital image of the measured part. When the measured part is placed in a correct position on the platform, the method further obtains three points from an upper boundary of the measured part in the binary expression and another three points from a lower boundary of the measured part in the binary expression, and calculates width of the measured part according to the obtained six points. 1. A computerized-implemented method of a computing device for measuring widths of measured parts placed on a platform , the computing device electronically connected to one or more charge coupled device (CCD) cameras , the method comprising:(a) controlling each of the CCD cameras to capture a digital image from a measured part that is placed near the CCD cameras, and obtaining the digital image of the measured part from each of the CCD cameras in a predefined order;(b) obtaining a binary expression from the digital image of the measured part;(c) determining whether the measured part is placed in a correct position on the platform according to the binary expression;(d) obtaining three points from an upper boundary of the measured part in the binary expression and another three points from a lower boundary of the measured part in the binary expression when the measured part is placed in the correct position on the platform; and(e) calculating a width of the measured part according to the obtained three points from the upper boundary of the measured part and the obtained three pointed from the lower boundary of the measured part.2. The method according to claim 1 , wherein ...

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Номер записи: 89
04-07-2013 дата публикации

Computing device and method for scanning edges of an object

Номер: US20130169975A1
Автор: Chih-Kuang Chang, Dong-Hai Li, LI Jiang, Zhi-Jun Zou, Zhong-Kui Yuan
Принадлежит: Hon Hai Precision Industry Co Ltd, Hongfujin Precision Industry Shenzhen Co Ltd

In a method for scanning edges of an object using a computing device, the computing device is connected to an image measuring machine including an image capturing device. A start point, an end point, a scan direction, and a scan distance interval are set. Scan points on the edges of the object are determined. For each scan point, the computing device aims the image capturing device at the scan point, controls the image capturing device to capture images of the object at different depths, and records focal points. Definition values of the images are calculated and an image with a highest definition value is determined. A focal point corresponds to the image with the highest definition value and so coordinates of the scan point are determined. Scanned edges of the object are formed based on all the scan points.

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Номер записи: 90
11-07-2013 дата публикации

METHOD OF MEASUREMENT AND APPARATUS FOR MEASUREMENT OF TOOL DIMENSIONS

Номер: US20130176429A1
Автор: Kurahashi Yasuhiro
Принадлежит: MAKINO MILLING MACHINE CO., LTD.

Provided are a method for measuring tool dimensions and a measurement device, whereby if a machine tool () cannot fit the overall outline of a tool () inside the field of vision (V) for an image from an imaging device (), the field of vision (V) of the imaging device () is moved by relatively moving the imaging device () and the tool (). In addition, the imaging device () can follow the outline () of the tool () by moving the field of vision (V), because the movement direction () for the field of vision (V) is determined on the basis of the partial outline () specified based on image data. In this way, even when measuring dimensions for a tool () with a larger diameter than the field of vision (V) of the imaging device (), a partial outline () of a desired range, for example, is specified. An outline of a desired range for the tool () is extracted if a plurality of specified partial outlines () are combined. Measurement of the dimensions of the tool () is possible by using such outlines. 1. A method of measurement of tool dimensions which uses an image capture device which moves relative to a tool to capture an image of said tool and which uses the obtained image data to measure dimensions of said tool ,the method of measurement of tool dimensions comprising the steps of:using image data of part of the contour of said tool captured by said image capture device as the basis to specify a partial contour of said tool,using said specified partial contour as the basis to make the field of view of said image capture device move in a direction of the contour of said tool outside of the field of view of said image data, andoutputting movement commands for making said image capture device and said tool move relative to each other so that the field of view of said image capture device moves in the determined direction of movement of said field of view.2. The method of measurement of tool dimensions according to claim 1 , which repeats the specification of said partial contour ...

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Номер записи: 91
11-07-2013 дата публикации

METHOD AND APPARATUS FOR NON-DESTRUCTIVE TESTING OF A SEED

Номер: US20130176553A1
Автор: Cope Jason, Kurth David
Принадлежит: PIONEER HI-BRED INTERNATIONAL, INC.

The present invention provides a method and apparatus for non-destructive testing of a seed. In various embodiments, the method may comprise vibrating the seed to orient the seed on an axis, identifying a location of a known feature of the seed, determining a sample location on the seed based on the location of the known feature, and performing a non-destructive testing procedure on the seed proximate the sample location. In one embodiment, the method may comprise removing a sample portion of the seed from the sample location without damaging the embryo of the seed. Accordingly, the viability of the seed may be maintained while allowing for subsequent testing on the sample portion of the seed. 1. A method of non-destructive sampling of a seed , comprising:vibrating the seed to orient the seed on an axis;identifying a location of a known feature of the seed;determining a sample location on the seed based on the location of the known feature; andperforming a non-destructive testing procedure on the seed proximate the sample location.2. The method of claim 1 , wherein the known feature comprises an embryo.3. The method of claim 2 , wherein determining the sample location comprises causing the sample location to be substantially opposite the location of the embryo on the seed.4. The method of claim 1 , wherein the known feature comprises a hilum.5. The method of claim 1 , wherein identifying the location of the known feature comprises rotating the seed about the axis.6. The method of claim 1 , wherein identifying the location of the known feature on the seed comprises illuminating the seed to improve contrast.7. The method of claim 1 , wherein identifying the location of the known feature comprises identifying a known shape.8. The method of claim 7 , wherein identifying a known shape comprises identifying a perimeter of the seed.9. The method of claim 1 , wherein identifying the location of the known feature comprises identifying a known color.10. The method of claim 1 ...

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Номер записи: 92
11-07-2013 дата публикации

Image sensor, attitude detector, contact probe, and multi-sensing probe

Номер: US20130176575A1
Автор: Kazuhiko Hidaka, Nobuhiro Ishikawa
Принадлежит: Mitutoyo Corp

An image sensor for fringe images of interference fringes and the like in which the optical system has a simpler configuration than that of the conventional line image sensor, and faster detection becomes possible includes a light receiving plane on which two or more straight rows of pixels are disposed, and captures images of regular fringes generated from light reflected from an irradiated body in accordance with the amount of light received by each pixel; among the rows of pixels, at least two rows of pixels are disposed at right angles to each other, and acquires images of linear fringes crossing almost at right angles in two directions among the fringe projected onto the light receiving plane.

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Номер записи: 93
11-07-2013 дата публикации

COLLECTING AND USING ANTHROPOMETRIC MEASUREMENTS

Номер: US20130179288A1
Автор: Amitai Mor, Keren Naomi, Moses Asaf
Принадлежит: UPcload GmbH

A computer program for obtaining anthropometric measurements of a person, implementing a method including providing instructions to a person to set up conditions for producing a suitable image, receiving the image from a camera, the image including at least part of the person's body, analyzing the image, providing at least one measurement based, at least in part, on the analyzing. Related apparatus and methods are also described. 1. A computer program for using a first computer to obtain anthropometric measurements of a person , the computer program implementing a method comprising:providing instructions to a person to set up conditions for producing a suitable image;receiving the image from a camera, the image including at least part of the person's body;analyzing the image;providing at least one measurement based, at least in part, on the analyzing.2. The computer program of in which the at least one measurement is provided in units of clothing size.3. The computer program of and further comprising accepting input from the person claim 2 , the input comprising the person's preference for clothing fit.4. The computer program of and further comprising accepting input from the person claim 2 , the input comprising a clothing size of an article of clothing which the person knows claim 2 , and an indication of whether the article fits tight claim 2 , fits well claim 2 , or fits loose.5. The computer program of in which:the providing instructions comprises providing instructions from the first computer;the receiving and the analyzing comprise receiving and analyzing by a second computer; andthe providing at least one measurement comprises providing at the first computer.6. The computer program of in which the measurements are associated with the person and stored for further use.7. The computer program of in which the instructions comprise instructions for the person to hold an object of known dimensions as a dimensional reference in the image.8. The computer program of ...

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Номер записи: 94
18-07-2013 дата публикации

DEVICE FOR MONITORING THICKNESS REDUCTION OF INNER SURFACE IN HEAT TRANSFER TUBE OR INNER SURFACE IN EVAPORATION TUBE

Номер: US20130182265A1
Автор: Ikeda Tetsuya, Kagawa Seiji, OKAMOTO Takuya, Okino Susumu
Принадлежит: MITSUBISHI HEAVY INDUSTRIES, LTD.

There is provided a device for monitoring a thickness reduction of an inner surface in a heat transfer tube or an inner surface in an evaporation tube, the device including: a movement unit which moves along a fin tube; a laser measurement unit which is provided in the movement unit and measures the thickness reduction of the inner surface by a laser; a cable which includes a light guiding path for introducing a laser into the laser measurement unit and a light deriving path for transmitting reflected light; and a thickness reduction determining unit which compares the laser measurement data with past data or standard data and determines the current thickness reduction. 1. A device for monitoring a thickness reduction of an inner surface in a heat transfer tube or an inner surface in an evaporation tube comprising:a movement unit adapted to move along the inner surface in the heat transfer tube or the inner surface in the evaporation tube;a laser measurement unit provided in the movement unit for measuring the thickness reduction of the inner surface in the heat transfer tube or the inner surface in the evaporation tube by a laser;a cable including a light guiding path for introducing a laser into the laser measurement unit and a light deriving path for transmitting reflected light; anda thickness reduction determining unit for comparing data of the laser measurement unit with past data or standard data so as to determine the current thickness reduction, wherein 'a sensor head having a laser displacement sensor; and', 'the laser measurement unit includesa prism or mirror for shortening a focal distance of the laser,the laser measurement unit is configured to guide the laser emitted from the laser displacement sensor, emit the laser in a direction perpendicular to the inner surface, move a reflection surface of the laser by 360° in a peripheral wall surface and continuously read a position of the reflection surface through the laser displacement sensor, so as to ...

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Номер записи: 95
25-07-2013 дата публикации

System and method for object measurement

Номер: US20130188042A1
Автор: Denisa Narmour Borges, Glen William Brooksby, Paulo Ricardo dos Santos Mendonça
Принадлежит: General Electric Co

A technique is provided for measuring an object based on multiple views. The technique includes registering each of the plurality of images and a first model of the object with one another and reconstructing a second model of the object based on the plurality of images and the first model registered with one another.

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Номер записи: 96
01-08-2013 дата публикации

Calibrated hardware sensors for estimating real-world distances

Номер: US20130197793A1
Автор: Chong U. Lee, John H. Hong, Sundeep Vaddadi
Принадлежит: Qualcomm Inc

In some embodiments, methods and systems are provided for assisting a user in determining a real-world distance. Hardware-based sensors (e.g., present in a mobile electronic device) may allow for a fast low-power determination of distances. In one embodiment, one or more telemetry-related sensors may be incorporated into a device. For example, data detected by a frequently-calibrated integrated accelerometer may be used to determine a tilt of the device. A device height may be estimated based on empirical data or based on a time difference between a signal (e.g., a sonar signal) emitted towards the ground and a corresponding detected signal. A triangulation technique may use the estimated tilt and height to estimate other real-world distances (e.g., from the device to an endpoint or between endpoints).

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Номер записи: 97
08-08-2013 дата публикации

Vehicle wash systems and methods

Номер: US20130199565A1
Автор: Thomas J. Petit
Принадлежит: Thomas J. Petit

The invention is directed at systems and methods which provide for effective cleaning and drying of vehicles of different shapes and sizes. The invention in one example includes a vehicle washing apparatus comprising a conveyor system to move a vehicle along a path, and a bridge assembly supported above a vehicle and moveable along the length thereof. At least one trolley assembly is operatively supported by the bridge assembly and is moveable in a direction generally transverse to the movement of the bridge assembly. At least one cleaning arm assembly for delivering cleaning fluid to or for brushing the surface of a vehicle is operatively supported by the at least one trolley assembly or bridge. The cleaning arm assembly is moveable with the bridge assembly along the length of the vehicle, and transversely with the at least one trolley assembly to adjust the location of the cleaning arm relative to the vehicle, wherein the bridge assembly moves in association with movement of the vehicle to position the cleaning arm assembly adjacent at least a portion of the front, sides and rear of the vehicle as it moves along the path. A variable impact or patterning spray arm or drying system is also provided.

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Номер записи: 98
08-08-2013 дата публикации

Displacement sensor

Номер: US20130201490A1
Автор: Hiroaki Takimasa, Yusuke Iida
Принадлежит: Omron Corp

A signal processing unit (C 1 , C 2 , C 3 ) for processing a light reception signal from an imaging element ( 12 ) at different magnifications is provided in a light receiving unit ( 102 ) in a displacement sensor ( 1 ). This sensor ( 1 ) measures a displacement by using light receiving amount data generated by the signal processing unit (C 1 ) for each detection processing by a light projecting unit ( 101 ) and the light receiving unit ( 102 ), and further adjusts sensitivity for next detection processing. In sensitivity adjustment processing, when a peak value in the light receiving amount data generated by the signal processing unit (C 1 ) approximates to 0, a peak value extracted by the signal processing unit (C 2 ) to which higher magnification is applied is employed. Alternatively, when a peak value in the light receiving amount data generated by the signal processing unit (C 1 ) is saturated, a peak value extracted by the signal processing unit (C 3 ) to which 1-fold magnification is applied is employed.

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Номер записи: 99
08-08-2013 дата публикации

COATING DIMENSION MEASURING APPARATUS

Номер: US20130201493A1
Автор: ICHIZAWA Yasushi
Принадлежит: YOKOGAWA ELECTRIC CORPORATION

A coating dimension measuring apparatus may include: a camera that is positioned at a prescribed position distanced from a sheet to capture an image of a coating dimension of the sheet; a roller configured to transport the sheet; a scale that is disposed along a lengthwise direction of the roller to perform numerical calibration of the coating dimension; a scale holding unit configured to hold the scale over the roller, the scale holding unit being disposed so as to enable free insertion and removal of the scale. 1. A coating dimension measuring apparatus comprising:a camera that is positioned at a prescribed position distanced from a sheet to capture an image of a coating dimension of the sheet;a roller configured to transport the sheet;a scale that is disposed along a lengthwise direction of the roller to perform numerical calibration of the coating dimension;a scale holding unit configured to hold the scale over the roller, the scale holding unit being disposed so as to enable free insertion and removal of the scale.2. The coating dimension measurement apparatus according to claim 1 , whereinthe scale is disposed outside an image capturing range when the camera captures an image of the sheet, and is disposed on the roller only when the camera captures an image of the scale.3. The coating dimension measurement apparatus according to claim 1 , whereinthe scale is disposed on an outer periphery of the roller and in contact with the roller along a roller axis.4. The coating dimension measurement apparatus according to wherein claim 1 ,when bringing the scale into contact with the roller, by rotation or compound restricted movement combining rotation and translational movement of the scale holding unit holding the scale, a roller contact position and a retracted position are established,when the sheet is being produced, the scale is retracted from the roller, and when calibration is being performed, the scale is moved onto the roller.5. The coating dimension ...

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Номер записи: 100