ЗАХВАТНОЕ УСТРОЙСТВО ДЛЯ ОБОРУДОВАНИЯ ДЛЯ ПЕРЕМЕЩЕНИЯ ГРУЗОВ И КРАН

Изобретение относится к захватным устройствам для перемещения грузов. Захватное устройство (102, 202) содержит оптическое устройство (104, 204, 304) измерения расстояния и крепежные средства (106, 206, 306a-306c), которые прикрепляют оптическое устройство (104, 204, 304) измерения расстояния к захватному устройству упругим образом. Крепежные средства содержат верхнюю деталь и две полые опорные детали, проходящие вниз от верхней детали в вертикальном направлении и имеющие на своих нижних концах упругие детали. Оптическое устройство прикреплено к крепежным средствам посредством указанных упругих деталей. Захватное устройство (102, 202) может быть предусмотрено в кране, таком как стреловой кран, мостовой кран, контейнерный кран или козловой кран. Достигается снижение вибрации и точность постоянного уровня при перемещении контейнера. 2 н. и 19 з.п. ф-лы, 11 ил.

ПОРТАТИВНАЯ СИСТЕМА, ОБЕСПЕЧИВАЮЩАЯ ВОСПРИЯТИЕ СЛЕПЫМИ ИЛИ СЛАБОВИДЯЩИМИ ЛЮДЬМИ ОКРУЖАЮЩЕГО ПРОСТРАНСТВА ПОСРЕДСТВОМ ЗВУКА ИЛИ КАСАНИЯ

Изобретение относится к медицинской технике, а именно к средствам, обеспечивающим возможность восприятия слепыми или слабовидящими людьми окружающего пространства. Портативная система, обеспечивающая восприятие слепыми или слабовидящими людьми окружающего пространства посредством звука или касания содержит две камеры, отделенные друг от друга и выполненные с возможностью одновременного получения изображения окружающего пространства, средства генерации звуковых и/или тактильных выходных сигналов, средства обработки, соединенные с камерами и средствами генерации звуковых и/или тактильных сигналов, при этом средства обработки выполнены с возможностью объединения изображений, полученных в реальном времени, и обработки информации о глубине элементов, содержащихся в по меньшей мере одной вертикальной полосе комбинированного изображения, где вертикальная полоса по существу охватывает всю высоту комбинированного изображения, причем средства обработки также выполнены с возможностью: разделения вертикальной ...

УСТРОЙСТВО, СПОСОБ И АППАРАТНОЕ УСТРОЙСТВО ДЛЯ ИЗМЕРЕНИЯ РАЗМЕРОВ ПРЕДМЕТА

Предложенная группа изобретений относится к средствам для измерения размеров контролируемого предмета. Устройство для измерения размеров предмета содержит датчик (2) глубины, кронштейн (1) датчика, аппаратное устройство (5) для обеспечения коррекции, платформу (4) для размещения предмета и компьютер (3). Аппаратное устройство (5) для обеспечения коррекции используется для обеспечения коррекции плоскости датчика (2) глубины, содержит сетку или печатный материал, имеющий текстуры черно-белой шахматной доски, и содержит прозрачную плоскую пластину, при этом сетку или печатный материал накладывают на платформу (4) для размещения предмета и прозрачную плоскую пластину прижимают к сетке или печатному материалу. Датчик (2) глубины находится на кронштейне (1) датчика и расположен в пространстве над платформой (4) для размещения предмета. Компьютер (3) соединен с датчиком (2). Кроме того, раскрыты способ и аппаратное устройство для измерения размеров предмета. Устройство и способ обеспечивают эффективное ...

СИСТЕМА И СПОСОБ ДЛЯ УСЛУГИ АВТОНОМНОЙ ПАРКОВКИ С ИСПОЛЬЗОВАНИЕМ ПЛЕНОПТИЧЕСКИХ КАМЕР

САМОХОДНЫЙ СНАРЯД ОБСЛЕДОВАНИЯ СКВАЖИН

Полезная модель относится к области горного дела и предназначена для измерения параметров пробуренных скважин. Предлагаемый самоходный снаряд включает в свою конструкцию передний упор, выполненный с возможностью распирания в скважине; задний упор, выполненный с возможностью распирания в скважине; тело снаряда, соединенное с передним и задним упорами винтовым стержнем и направляющими валами; электромотор для вращения винтового стержня, обеспечивающий перемещение тела снаряда и незакрепленного упора вдоль направляющих валов; электромоторы для вращения винтов, распирающих упоры; трехосевой инклинометр для измерения углов наклона скважины; цифровой магнетометр либо гироскоп для измерения азимута или курса; управляющий контроллер; цифровую камеру с освещением; кабель питания и управления. Использование данного устройства позволяет точно измерять глубину и траекторию скважины, что особенно важно при бурении веером в кровлю выработки, а, следовательно, с возможностью подачи измерительного оборудования ...

Verfahren und Vorrichtung zur Messung der Parameter eines Reifens

VORRICHTUNG UND VERFAHREN ZUM BESTIMMEN EINER PROFILTIEFE

Vorrichtung zum Messen einer Profiltiefe, umfassend: einen Bildsensor; ein erstes und ein zweites Tiefenerfassungsmodul, die entlang einer Trennachse voneinander beabstandet sind, wobei jedes (i) einen Emitter, der so konfiguriert ist, dass er einen Lichtstrahl aussendet, und (ii) eine optische Baugruppe, die so konfiguriert ist, dass sie Reflexionen des Lichtstrahls auf einen jeweiligen Bereich des Bildsensors lenkt, umfasst; eine Steuerung, die mit dem Bildsensor verbunden ist und als Reaktion darauf, dass die Vorrichtung eine profilierte Oberfläche überquert, konfiguriert ist zum: Empfangen einer Folge von Bildern von dem Bildsensor, die mit aufeinanderfolgenden Positionen der Vorrichtung korrespondiert, die die profilierte Oberfläche in einer Bewegungsrichtung im Wesentlichen senkrecht zu der Trennachse überquert, wobei die Folge von Bildern anschließende Reflexionen der Strahlen von der profilierten Oberfläche darstellt; Bestimmen, für jedes Bild in der Folge von Bildern, einer ersten ...

Vorrichtung zum Erfassen und Darstellen von dreidimensionalen Objekten

Vorrichtung zum Erfassen und Darstellen von dreidimensionalen, zumindest zeitweise ruhenden Objekten (7) in einer festlegbaren Umgebung, mit einem zumindest einen Tiefensensor (Sensor 19) aufweisenden Sensorsystem (9), einem gegenüber den zu erfassenden Objekten (7) relativ bewegbaren Sensorträger (13), der vorzugsweise einen Antrieb aufweist, einer Datenverarbeitungseinrichtung (26) für Sensordaten, um ein digitales dreidimensionales Modell (29') von zumindest einem der erfassten Objekte (7) erzeugen zu können, und mit einer Darstellungseinrichtung (30) für das digitale Modell (29).

Laserbearbeitungssystem zur Bearbeitung eines Werkstücks mittels eines Laserstrahls und Verfahren zum Steuern eines Laserbearbeitungssystems

Ein Laserbearbeitungssystem, insbesondere ein Laserschweißsystem, zur Bearbeitung eines Werkstücks mittels eines Laserstrahls, umfasst: einen Laserbearbeitungskopf zum Einstrahlen des Laserstrahls auf eine Werkstückoberfläche zur Erzeugung einer Dampfkapillare; eine optische Messvorrichtung zur Abstandsmessung mittels eines optischen Messstrahls; eine Bilderfassungseinheit, die eingerichtet ist, ein Bild von einem Bereich der Werkstückoberfläche zu erfassen, der die Dampfkapillare und einen durch Einstrahlen des optischen Messstrahls erzeugten Messfleck umfasst, wobei das Laserbearbeitungssystem eingerichtet ist, basierend auf dem erfassten Bild eine Position des Messflecks und eine Position der Dampfkapillare zu bestimmen. Ein Verfahren zum Bearbeiten eines Werkstücks mittels eines Laserstrahls, umfasst die Schritte: Einstrahlen des Laserstrahls auf eine Werkstückoberfläche zur Erzeugung einer Dampfkapillare; Einstrahlen eines optischen Messstrahls auf die Werkstückoberfläche zum Messen ...

Vorrichtung für die Bestimmung von mechanischen Eigenschaften eines zu untersuchenden Objekts

Vorrichtung für die Bestimmung von mechanischen Eigenschaften eines zu untersuchenden Objekts (26) mit einem in das Objekt (26) einpressbaren Prüfkörper (16, 36) und einer Wegemessvorrichtung (18, 28, 29, 30, 42), mit der die vom Prüfkörper (16, 36) zurückgelegte Pressstrecke erfassbar ist, dadurch gekennzeichnet, dass mit einer Einbuchtmessvorrichtung (18, 31, 41, 42) die Einbuchtung (33) des Objekts (26) in der Umgebung einer Kontaktstelle zwischen Objekt (26) und Prüfkörper (16, 36) bei in das Objekt (26) eingepressten Prüfkörper (16, 36) erfassbar ist.

Capturing a surface structure of an object surface

Vehicle tyre inspection

Evaluating an input relative to a display

Water depth estimation apparatus and method

An apparatus 12a, 12b for estimating the depth of water H about a land-based vehicle 10, 110, and a land-based vehicle including such an apparatus are provided. The apparatus comprises: at least one light source 70; at least one imaging means such as a camera 30 mounted to a vehicle; and a control unit 40. The apparatus 12a, 12b is structured and arranged such that a first light signal is emitted toward a water surface 18 about the vehicle, the at least one camera 30 is configured for imaging the first light signal and the control unit 40 is configured and arranged to compute from the imagery obtained by the at least one camera 30 an estimation of a depth of water H about the vehicle. A method of estimating the depth of water about a vehicle is also disclosed.

Railroad track survey system

Methods and apparatuses for vehicle wading safety

Techniques and examples pertaining to vehicle water wading safety are described. A Processor implementable to a vehicle approaching a water body receives topographic data related to the water body from one or more above-water or under-water sensors. The processor determines a top surface and a bottom profile of the water body, and calculates one or more critical trajectories of water-sensitive components of the vehicle if the vehicle is to wade through the water body by traversing the bottom profile. The processor may then determine the wading safety based on the critical trajectories and the top surface of the water body. The processor may further determine a wading route, and autonomously drive the vehicle to wade the water body via the optimal wading route.

Optical surface measuring apparatus and method

Capturing A Surface Structure Of An Object Surface

The invention relates to a method of capturing a surface structure of a surface of an object (1,fig.1) held by holder 13 wherein a pattern of electromagnetic waves is projected from a pattern source 2,4 (pattern projector 2, shiftable lens 4) onto the surface of the object (1), so that a projected pattern is incident on the surface of the object (1). A first reflected image, which is a result of a reflection of the projected pattern by the surface, is received by a camera 5 and is recorded, wherein the first image is recorded as a digital image comprising pixels. The projected pattern is shifted in a direction lateral to a projection direction into which the electromagnetic waves propagate, so that same parts of the projected pattern are incident at different locations at the surface of the object (1) compared to the projected pattern before shifting the pattern, wherein the pattern is shifted by moving at least one part of the pattern source 2, 4(this forms step a (c)). A second reflected ...

Rail track asset survey system

A LINE CLEANING SYSTEM

Tool device apparatus and method

Improved 3D sensing

LASER INTERFEROMETER SYSTEM TO SUPERVISING AND RULES OF THE TREATMENT OF INTEGRATED CIRCUITS

LINE OCT AS OPTICAL SENSOR FOR THE MEASURING AND MEDICAL TECHNOLOGY

Agricultural trench depth sensing systems, methods, and apparatus

An agricultural trench depth sensing system and method includes a light source (2002), a receiver (2003) and a sensor (2004). The light source directs light downwardly toward a trench previously opened in a soil surface. The receiver is disposed at an angle relative to the light source to receive reflected light. A sensor connected to the receiver senses a pattern of the reflected light. A monitoring system in communication with the sensor, generates a data frame containing triangulated line coordinates and intensity values of the reflected light indicative of a measured depth of the trench. The generated data frame may be associated with GPS coordinates for generating spatial maps and may be used to control operating parameters. The generated data frames may also identify relative soil moisture versus trench depth, or presence of dry topsoil or residue in the trench, or to identify seeds, seed spacing and seed depth.

Light field display metrology

Examples of a light field metrology system for use with a display are disclosed. The light field metrology may capture images of a projected light field, and determine focus depths (or lateral focus positions) for various regions of the light field using the captured images. The determined focus depths (or lateral positions) may then be compared with intended focus depths (or lateral positions), to quantify the imperfections of the display. Based on the measured imperfections, an appropriate error correction may be performed on the light field to correct for the measured imperfections. The display can be an optical display element in a head mounted display, for example, an optical display element capable of generating multiple depth planes or a light field display.

METHOD AND DEVICE FOR MEASURING THE DEPTH OF THE VAPOR CAPILLARY DURING A MACHINING PROCESS WITH A HIGH ENERGY BEAM

In a method for measuring the depth of the vapour cavity (88) during an industrial machining process with a high-energy beam (19), an optical measuring beam (70a) is directed towards the base of a vapour cavity (88). An optical coherence tomograph (40) generates interference factors or other raw measurement data from reflections of the measurement beam (70a). An evaluation device (114) generates interference-suppressed measurement data, wherein raw measurement data, that is generated at different times, is processed together in the course of a mathematical operation. This operation can be, in particular, a subtraction or a division. In this way, slowly changing interference factors can be eliminated. An end value for the distance (a1) to the base of the vapour cavity (88) is calculated from the interference-suppressed measurement data using a filter, e.g. a quantile filter. As a result, the depth of the vapour cavity (88) can be determined, in the knowledge of the distance at a part of ...

BLAST HOLE MEASUREMENT AND LOGGING

Provided is a blast hole measurement and logging apparatus (10) which generally comprises a housing (12) configured to operatively house a solid-state LiDAR sensor array (14) configured to transmit and steer pulses of light (18) into a blast hole (8) by shifting a phase of said pulses through the array to compile volumetric data of said sensor's field-of-view. Also included is a processor (22) configured to receive the volumetric data from the LiDAR sensor (14), said volumetric data indicative of an internal volume of the blast hole (8) which is useable in calculating an explosive charge according to a blast plan, the processor (22) configured to store and/or transmit the volumetric data.

TYRE CONDITION ANALYSIS

The condition of a tyre (5) on a wheel (2) is assessed while the wheel (2) is mounted on a vehicle (1) and while the vehicle (1) is moving. As the vehicle (1) moves, the tyre (5) rotates and moves longitudinally along a path of movement. An imaging device (3, 4) captures images of a plurality of different portions (7) of the periphery of the tyre (5), which has tread portions (10) separated by tread gaps (11), whilst the tyre (5) revolves. While the images are being captured, longitudinally spaced flash units (F1, F2, F3, F4) are activated to illuminate portions (7) of the periphery of the tyre (5). The flash units (F1, F2, F3, F4) are positioned to one side of the path of movement of the tyre (5) and direct light at an acute angle to the path of movement of the tyre (5) so that the light causes shadows to be cast in the tread gaps (11) between tread portions (10). Each flash unit (F1, F2, F3, F4) causes a series of flashes of light to be produced when the flash unit (F1, F2, F3, F4) is ...

OPTICAL LIQUID LEVEL MEASUREMENT SYSTEM FOR DISPENSING APPARATUS

An optical liquid height determination system of the present embodiments includes light sensors capturing different amounts of light, based on level of liquid in the tank that blocks or limits light to particular sensors. The tank is enclosed in a container with a light source and the light sensors are installed on walls of the container. Light emitted by the light source is transmitted to the light sensors by passing through the liquid product, scattered, diffused, diffracted or reflected by the dairy product, through the tank walls which may be transparent or translucent, or from other surfaces in the container within which the tank is enclosed by. The set of electrical signals received from all the light sensors are compared against sets of calibrated signals corresponding to known liquid levels in the tank. The known height corresponding to the nearest set of calibrated signals is determined as the measured liquid height in the tank.

DEPTH DETECTION OF A SOIL COULTER

Depth of penetration of a soil coulter is detected using a sensor being mounted on the side of the disk adjacent the edge such that the sensor as the disk rotates is located above the surface of the soil during a first part of its rotation and is located below the surface during a second part of its rotation. The sensor issues a signal which changes in response to whether the sensor is above or below the soil surface which is received by a controller which calculates from the signal a first time when the sensor enters below the soil surface and a second time when the sensor departs the soil surface and calculates from the first and second times the depth of penetration of the coulter in the soil. The system can also detect variations in depth indicative of a value of surface roughness.

A METHOD OF MONITORING A SURFACE FEATURE AND APPARATUS THEREFOR

METHODS AND SYSTEMS FOR CHARACTERIZING LASER MACHINING PROPERTIES BY MEASURING KEYHOLE DYNAMICS USING INTERFEROMETRY

A method, apparatus, and system are provided to monitor and characterize the dynamics of a phase change region (PCR) created during laser welding, specifically keyhole welding, and other material modification processes, using low-coherence interferometry. By directing a measurement beam to multiple locations within and overlapping with the PCR, the system, apparatus, and method are used to determine, in real time, spatial and temporal characteristics of the weld such as keyhole depth, length, width, shape and whether the keyhole is unstable, closes or collapses. This information is important in determining the quality and material properties of a completed finished weld. It can also be used with feedback to modify the material modification process in real time.

INSPECTION OF DRILLED FEATURES IN OBJECTS

Disclosed is a method and apparatus for determining a depth of a feature (4) formed in an object (2), the feature (4) having been formed in the object (2) by a cutting tool (38). The apparatus comprises: a camera (42) configured to capture an image of the feature (4) and a portion of the object (2) proximate to the feature (4); and one or more processors operatively coupled to the camera (42) and configured to: detect, in the image, an edge (72) of the feature (4) between the feature (4) and a surface of the object (2); using the detected edge (72), calculate a diameter for a circle (74, 76, 78); acquire a point angle of the cutting tool (38); and, using the calculated diameter and the acquired point angle, calculate a depth value for the feature (4).

MEASURING APPLIANCE COMPRISING AN AUTOMATIC REPRESENTATION-CHANGING FUNCTIONALITY

The invention relates to a measuring appliance (10) in which inputted or measured spatial points (1, 2, 3, 4, 5, 6) that form a quantity of spatial points can be stored, and a horizontal projection representation or spatial representation of at least some spatial points (1, 2, 3, 4) from the quantity of spatial points can be displayed, said points being at least partially connected by lines. According to the invention, the measuring appliance (10) has a representation-changing functionality in the framework of which, according to a line selected on the user side from the lines displayed in a horizontal projection representation (A) or a spatial representation, in an automatically controlled manner by means of the evaluation and control unit: a virtual surface is defined by the selected line and a direction provided as the vertical; a subset of spatial points (1, 2, 5, 6) is selected from the quantity of spatial points, lying inside a buffer zone surrounding the virtual surface in a defined ...

METHOD AND APPARATUS OF STUD ARRAY UPSTAND SETTING

... 2137678 9400734 PCTABS00030 Apparatus and method of setting the upstand height of the studs (5) of an array (1) of studs used to form antenna panels is disclosed. The apparatus includes a transducer beam (10) having a row of spaced apart distance transducers (12). The apparatus also includes an actuator beam (22) having a row of spaced rotary actuators (26). The actuators (26) rotate the threaded studs (5) to raise or lower same until the corresponding transducer (12) indicates that the stud has achieved an intended height. Also disclosed is a method using an array of laser diodes (60), rather than the transducer beam (10), arranged at one end of the base plate (2) and an array of photodiodes (62) at the opposite end. Output (63) of the diodes (62) indicates the height of the studs (5).

PROCEEDED FOR the OPTICAL MEASUREMENT OF DIFFERENCES IN LEVEL Of a PART COMPARED TO a PART OF REFERS AND MEANS FOR the IMPLEMENTATION OF the PROCESS.

Method for optical measurement of the differences in level of an article with respect to a reference article and means for implementing the method

A grid made of parallel zones, alternately transparent and opaque, is placed in the incident beam inclined by an angle alpha . The lateral displacement DELTA S of the zones projected onto the article makes it possible to calculate the variation in level h with respect to a reference article. The comparison is made either electronically or by producing the negative of the image of the reference article on a photographic medium. Application to the quality control of articles on a production line. ...

Procédé opto-électrique de mesure et de contrôle à distance d'une cote d'une pièce et instrument pour sa mise en oeuvre

PROCEDURE FOR MEASURING A CERTAIN DIMENSION OF AN OBJECT AND A DEVICE FOR THE EXECUTION OF THE PROCEDURE.

[...][...] LA [...][...][...][...] PAR [...] A [...][...] DE [...] DE DE [...] ET lEVEL D' [...][...][...] LA MISE EN [...] DU.

PROCEEDED FOR the OPTICAL MEASUREMENT OF DIFFERENCES IN LEVEL Of a PART COMPARED TO a PART OF REFERS AND MEANS FOR the IMPLEMENTATION OF the PROCESS.

PROCEDURE FOR THE MEASUREMENT OF THE SULCI CUTIS OR THE DEPTH FROM RUNZELN AND DEVICE TO THE EXECUTION OF THE PROCEDURE.

Groove depth detection method used for LED glass lamp cup

SYSTEMS AND METHODS FOR AUGMENTED STEREOSCOPIC DISPLAY

POSITION DESIGNATION DEVICE AND POSITION DESIGNATION METHOD

Microfluidic device

Method for automatically detecting stereoscopic size of bulk grain box

Augmented reality Image processing system and augmented reality Image processing method

Motion sensor array device and depth sensing system and methods of using the same

The invention discloses a motion sensor array device and a depth sensing system and methods of using the same. In one example of the inventive concepts, a motion sensor array device includes a wafer and at least two motion sensors implemented on the wafer, each of the at least two motion sensors including a plurality of motion sensor pixels to sense a motion of an object and generate motion image data. The motion sensor array device further includes at least two lenses respectively arranged on the at least two motion sensors, wherein the motion sensor array is implemented in one of a chip and a package.

SYSTEM FOR SECURING IN THE GROUND SENSOR PACKAGE

METHOD, METHOD AND DEVICE FOR DETERMINING THE DEPTH OF A CRACK IN A SOLID

Le procédé (100) de détermination de la profondeur d'une fissure dans un solide, comporte : - une étape (105) de détermination d'au moins trois vitesses de balayage d'une face du solide, comportant la fissure, par une source thermique positionnée, - pour chaque vitesse déterminée : - une étape (110) de balayage d'une partie de la face du solide, de manière parallèle au sens général de la fissure, par la source thermique à ladite vitesse et - une étape (115) de détection, synchrone à l'étape de balayage, d'au moins une valeur d'une grandeur physique représentative de l'échauffement local de la face du solide balayée, - une étape (120) de détermination de la profondeur de la fissure en fonction d'au moins une valeur détectée à au moins trois vitesses de balayage différentes.

PROCESS AND DEVICE TO MEASURE THE PARTS IN HOLLOW (SULCUS CUTI-REACTIONS) OF THE HUMAN SKIN

Measuring appliance comprising an automatic representation-changing functionality

Biopsy tissue sample cassettes and associated systems and methods

구조형 광에 대한 코드 도메인 파워 제어

... 구조형 광 레이저 시스템들을 제어하기 위한 시스템들 및 방법들이 개시된다. 하나의 양태는 구조형 광 시스템이다. 시스템은 심도 맵을 저장하도록 구성된 메모리 디바이스를 포함한다. 시스템은 코드워드들을 투영하도록 구성된 레이저 시스템을 포함하는 이미지 투영 디바이스를 더 포함한다. 시스템은 센서를 포함하는 수신기 디바이스를 더 포함하고, 이 수신기 디바이스는 오브젝트로부터 반사된 투영된 코드워드들을 감지하도록 구성된다. 시스템은, 심도 맵의 부분을 취출하고, 심도 맵으로부터 예상되는 코드워드들을 계산하도록 구성된 프로세싱 회로를 더 포함한다. 시스템은, 감지된 코드워드들 및 예상되는 코드워드들에 기초하여 레이저 시스템의 출력 파워를 제어하도록 구성된 피드백 시스템을 더 포함한다.

METHOD AND APPARATUS FOR MEASURING CRACK DEPTH OF STRUCTURE USING THERMO-GRAPHICAL IMAGE

APPARATUS FOR AUTOMATIC MEASUREMENT OF CARGO USING TOF CAMERA

Calibragem de propriedades ópticas para medir a profundidade de um líquido

System and method for via structure measurement

A system for via structure measurement is disclosed. The system comprises a reflectometer, a simulation unit and a comparing unit. The reflectometer is configured to collect a reflect spectrum of at least a via. The simulation unit is configured to provide simulated reflect spectrums of the at least a via. The comparing unit is configured to determine the depth and the bottom profile of the at least a via by comparing the collected reflect spectrum and the simulated reflect spectrums.

DEPTH CALCULATING METHOD AND DEVICE

SYSTEM FOR DIRECTLY MEASURING THE DEPTH OF A HIGH ASPECT RATIO ETCHED FEATURE ON A WAFER

A system (10) for directly measuring the depth of a high aspect ratio etched feature on a wafer (80) that includes an etched surface (82) and a non-etched surface (84). The system (10) utilizes an infrared reflectometer (12) that in a preferred embodiment includes a swept laser (14), a fiber circulator (16), a photodetector (22) and a combination collimator (18) and an objective lens (20). From the objective lens (20) a focused incident light (23) is produced that is applied to the non-etched surface (84) of the wafer (80). From the wafer (80) is produced a reflected light (25) that is processed through the reflectometer (12) and applied to an ADC (24) where a corresponding digital data signal (29) is produced. The digital data signal (29) is applied to a computer (30) that, in combination with software (32), measures the depth of the etched feature that is then viewed on a display (34).

MEASURING DEVICE FOR DETECTING THE DIMENSIONS OF TEST SAMPLES

The inventive measuring device (4) is used to detect the dimensions of test samples and can be incorporated into a tool (1) or fixed in a tool holding fixture in place of a tool. A light source (10) produces a light beam which is divided into a reference beam and a measuring beam (27, 28) by means of a beam divider (18). The measuring beam (28) is directed to the test sample and the reference beam (27) is directed to a reference mirror (14). The temporally incoherent beams which are reflected at the measuring point (8) and on the reference mirror (14) are recombined in the beam divider (18) and fed to a receiver (13). The reference mirror (14) and the receiver (13) are laterally offset in relation to the optical axis of the measuring device (4). The beam divider (18) can also be inclined towards to the optical axis, resulting in high-precision measurement.

HOLE INSPECTION METHOD AND APPARATUS

An inspection apparatus initially involves an illuminator for directing an illuminating light beam towards a hole having two extremities and an internal surface extending between the two extremities. The inspection apparatus also involves a lens assembly for imaging the internal surface of the hole into the flat image. The lens assembly has a cylindrical field of view as well as a cylindrical depth of view. The cylindrical depth of field extends at least between the two extremities of the hole. The inspection apparatus further involves an image capturing device for capturing the flat image, and an image processing unit for performing inspection of the flat image to thereby inspect the internal surface of the hole. More specifically, the internal surface of the hole between the two extremities thereof is substantially in-focus along the flat image.

PROCESS AND DEVICE FOR THE OPTICAL EXAMINATION OF A SURFACE

The invention relates to a process and device for the optical examination of a surface. The optical distances of a reference arm (11) and an object arm (12) are set in such a way that the light component in another sub-structure interference signal reflected by sub-structures (31, 32) can also be detected besides a white light interferogram formed by a light component relected by the surface (28). The evaluation of the depth of the sub-structure interference signal also makes it possible, for example, to determine the depth of substructures (31, 32) which could not be laterally resolved with prior art optical methods.

METHOD FOR THE ANALYSIS OF THE TREAD OF A TIRE AND FOR THE TYPE IDENTIFICATION OF A TIRE

The invention relates to a method and an assembly for the analysis of the tread of a tire, which permits an assessment of the condition and type identification of the tire. According to the invention, the method is carried out by means of a rotation assembly, a laser scanner and an evaluation unit, wherein surface profiles of a section of the tread are generated line by line by the laser scanner, are combined by the evaluation unit to form a three-dimensional image, and a two-dimensional tire profile design is generated from the three-dimensional image. By using a two-dimensional tire profile design, a profile reference pattern is generated and the latter is stored in a database. Respectively generated tire profile designs are checked for coincident profile reference patterns such that, in the event of coincidence, the tire type data can be output and thus a type identification is achieved. According to the invention, the assembly has a rotation assembly, a laser scanner and an evaluation ...

SPATIAL MODULATION OF LIGHT TO DETERMINE OBJECT POSITION

Approaches for determining object position in a flow path are disclosed. A system includes a spatial filter having a length disposed along a longitudinal axis of the flow path and a width along a lateral axis of the flow path. The spatial filter has mask features configured to modulate light. Light emanating from objects moving along the flow path is detected. The detected light has a component along a detection axis that makes a non-zero angle with respect to the longitudinal and lateral axes. An electrical output signal that includes information about the trajectory depth of the object is generated in response to the detected light.

System and method for analyzing tire tread parameters

Systems and methods for analyzing tire tread data to assess tire tread parameters, such as irregular wear characteristics of a tire tread, are provided. More particularly, an automated and robust flattening process c be performed to transform tire tread data, such as a tread surface map, into flattened tire tread data. The flattened tire tread data can provide tread heights defined in a measurement direction that is normal to the surface of the tire tread, as opposed to parallel to a radial axis of the tire. The flattened tread data can be analyzed to assess one or more parameters of the tread of the tire. For instance, local height indicators for the flattened tread data can be determined using a local maximum as a reference. Because the local height indicators are relative heights determined from a local maximum, quantification of tread depth can be more easily obtained.

MESH REGISTRATION SYSTEM AND METHOD FOR DIAGNOSING TREAD WEAR

An automated tread analysis system and methods for using are described. The automated tread analysis system may include a sensing system having a plurality of cameras providing a plurality of sequential two-dimensional images. The automated tread analysis system may also include an analysis system configured to provide at least one surface model of a first object via photogrammetry using the plurality of sequential two-dimensional images. The automated tread system may execute processing software reading data corresponding to the at least one surface model of the first object. The surface model may correspond to a current condition of the first object. The processing software executed by the user system may analyze the at least one surface model of the first object and provide at least one indicative wear metric based on the analysis of the surface model of the first object.

System for directly measuring the depth of a high aspect ratio etched feature on a wafer

A system (10) for directly measuring the depth of a high aspect ratio etched feature on a wafer (80) that includes an etched surface (82) and a non-etched surface (84). The system (10) utilizes an infrared reflectometer (12) that in a preferred embodiment includes a swept laser (14), a fiber circulator (16), a photodetector (22) and a combination collimator (18) and an objective lens (20). From the objective lens (20) a focused incident light (23) is produced that is applied to the non-etched surface (84) of the wafer (80). From the wafer (80) is produced a reflected light (25) that is processed through the reflectometer (12) and applied to an ADC (24) where a corresponding digital data signal (29) is produced. The digital data signal (29) is applied to a computer (30) that, in combination with software (32), measures the depth of the etched feature that is then viewed on a display (34).

Method for controlling etching depth

A method for controlling an etching depth in a semiconductor fabricating process is provided. The method includes steps of providing a substrate having a first reflecting region and a second reflecting region, illuminating the first reflecting region and the second reflecting region with a coherence light having a wavelength λ to generate an interference, performing a first etching on the second reflecting region to generate a height difference between the first reflecting region and the second reflecting region, wherein the interference intensity is changed with the first etching, and performing a second etching on the second reflecting region for a specific period of time to make the etching depth as the height difference when the interference intensity is changed to a relative extreme value.

Apparatus for measuring difference in shallow level

An apparatus for measuring a difference in level in a sample comprises a light source section which provides illumination light of a variable-wavelength. The illumination light is irradiated onto the sample. A group of filters is provided for shielding diffraction light rays of O-order or other than O-order of the light reflected from the sample. The intensity of interference light of the light rays not shielded by the filter group is detected by a light detector which in turn converts it into an electric signal. An arithmetic operation unit receives the electric signal while the wavelength of the illumination light from the light source section is continuously varied. In the arithmetic unit, wavelengths at which the electric signal or detected light intensity takes extreme values are determined, and the level difference in the sample is determined on the basis of those wavelengths.

Method for Calculating a Linearization Curve for Determining the Fill Level in a Container and the Use of a Mobile End Device for Said Method

Method for calculating a linearization curve for determining the fill level in a container from a filling height, said method comprising the following steps: acquiring three-dimensional data of the container with a mobile end device, having at least one optical camera, a depth sensor and a motion detector, establishing a three-dimensional model of the container, and calculating the linearization curve from the three-dimensional model for determining a fill level from a measured filling height. 1. A method for calculating a linearization curve for determining the fill level in a container from a filling height , comprising the following steps:acquiring three-dimensional data of the container with a mobile end device, having at least one optical camera, a depth sensor and a motion detector,establishing a three-dimensional model of the container,calculating the linearization curve from the three-dimensional model for determining a fill level from a measured filling height.2. The method claim 1 , as claimed in claim 1 , wherein the three-dimensional data of at least one outer shell of the container are acquired.3. The method of claim 2 , further comprising wherein a material thickness of the container is entered.4. The method of claim 1 , wherein the three-dimensional data of an inner shell of the container are acquired.5. The method of claim 1 , wherein the acquisition of the three-dimensional data of the container occurs in accordance with one or a combination of the methods: time of flight claim 1 , structured light or stereoscopy.6. The method of claim 1 , wherein the three-dimensional acquisition of the container is supported by means of a database with three-dimensional data of possible built-in components.7. The method of claim 1 , further comprising wherein claim 1 , in addition to the linearization curve claim 1 , a suitable fill level measuring method and/or an optimized position for a fill level sensor is/are determined and outputted.8. A method of use of a ...

Glow discharge spectroscopy method and system for measuring in situ the etch depth of a sample

A glow discharge spectrometry system includes a glow discharge lamp suitable for receiving a solid sample (10) and forming a glow discharge etching plasma (19). The system (100) for measuring in situ the depth of the erosion crater generated by etching of the sample (10) includes an optical separator (3), optical elements (4) suitable for directing a first incident beam (21) toward a first zone (11) of the sample, the first zone being exposed to the etching plasma, and a second incident beam (22) toward a second zone (12) of the same side of the sample, the second zone being protected from the etching plasma, respectively, and an optical recombining device (3) suitable for forming an interferometric beam (30) so as to determine the depth (d) of the erosion crater.

SYSTEM AND METHOD FOR MONITORING OPERATIONAL PARAMETERS ASSOCIATED WITH A TILLAGE IMPLEMENT DURING THE PERFORMANCE OF A FIELD OPERATION

In one aspect, a system for monitoring operational parameters associated with a tillage implement may include a first sensor configured to detect data indicative of a first distance between an implement frame forward of a ground engaging tool and a soil surface prior to engagement of the soil by the tool. The system may also include a second sensor configured to detect data indicative of a second distance between the frame aft of the tool and the sod surface following engagement of the soil by the tool. A controller of the system may be configured to determine a soil density change caused by engagement of the soil by the tool based on the first and second distances. Furthermore, the controller may be configured to determine a penetration depth of the tool based at least in part on the determined change in the soil density.

DEPTH MEASUREMENT USING A PULSED STRUCTURED LIGHT PROJECTOR

A depth measurement assembly (DMA) includes a pulsed illuminator assembly, a depth camera assembly, and a controller. The pulsed illuminator assembly has a structured light projector that projects pulses of structured light at a pulse rate into a local area. The depth camera assembly captures images data of an object in the local area illuminated with the pulses of structured light. An exposure interval of the depth camera assembly is pulsed and synchronized to the pulses projected by the pulsed illuminator assembly. The controller controls the pulsed illuminator assembly and the depth camera assembly so that they are synchronized. The controller also determine depth and/or tracking information of the object based on the captured image data. In some embodiments, the pulsed illuminator assembly have a plurality of structured light projectors that projects pulses of structured light at different times.

TOOL, DEVICE, APPARATUS AND METHOD

In one aspect of the invention for which protection is sought there is provided reader apparatus for reading an identification code carried by a surface feature device, the surface feature device having a plurality of respective surface feature portions each provided at respective lateral locations over a lateral surface at one of a plurality of predetermined distances from a lateral reference plane, the apparatus comprising a light source and a light detector, the apparatus being configured to direct light from the light source onto the respective surface feature portions of the surface feature device and to detect by means of the detector light scattered by the respective surface feature portions, the detector being configured to output a detector signal indicative of the intensity of light incident thereon, the apparatus being configured to generate a reader signal responsive to the distance of each of the respective surface feature portions of the surface feature device from the reference plane in dependence on the detector signal. 1. A reader apparatus configured to read an identification code carried by an identification device in the form of a surface feature device , the surface feature device having a plurality of respective recessed surface feature portions each provided at respective lateral locations over a lateral surface at one of a plurality of predetermined distances from a lateral reference plane , the apparatus comprising:a light source and a light detector, wherein the apparatus is configured to direct light from the light source onto the respective surface feature portions of the surface feature device and to detect by the detector, light scattered by the respective surface feature portions, wherein the detector is configured to output a detector signal indicative of an intensity of light incident on the detector;wherein the apparatus is configured to generate a reader signal responsive to a distance of each of the respective recessed surface ...

Determining surface properties of a roadway or runway from a moving vehicle

The present invention relates to the measurement of the depth of a contaminant, e.g. snow, found on a roadway or runway from a moving vehicle by measuring the distance between where a beam of light hits the upper surface of the contaminant and where the beam of light should have hit the roadway or runway based on the position of the light source. To eliminate the effects of pitch and roll on the measurements a second light source provides a reference spot, whereby the contaminant depth calculations can be performed independent of the distance between the roadway or runway and the light sources. A video recording device, such as a digital camera, is used to capture images of the spots, whereby the distances can be measured by adding the number of pixels between the spots in the images. The present invention can also be used for determining the surface texture/roughness and the coefficient of friction of the roadway or runway by increasing the sensitivity of the recording device to capture ...

UNIT FOR DETECTING GEOMETRIC CHARACTERISTICS OF A COMPONENT OF A TIRED WHEEL OF A VEHICLE

The present invention regards a unit for detecting geometric characteristics of a component (T, W) of a tired wheel (TW) of a vehicle (V), including a housing box or casing, at least one lighting means, at least one sensor means, at least one screen component or protection glass for the lighting means and/or for the sensor means and at least one means for delivering a cleaning fluid above the protection screen component.

OBJECT SURFACE MANAGING METHOD AND OBJECT SURFACE MANAGING SYSTEM

An object surface managing method comprising: (a) emitting detecting light to the groove via alight source; (b) receiving first reflected detecting light from the surface and second reflected detecting light from a bottom of the groove via a light sensor; and (c) calculating a groove depth of the groove according to the first reflected detecting light and the second reflected detecting light.

Method and system for adjusting light pattern for structured light imaging

A system and a method for producing an adjustable light pattern are provided herein. The system may include: a transmitter configured to illuminate a scene with a patterned light being adjusted based on predefined criteria; a receiver configured to receive reflections of the adjusted patterned light; and a computer processor configured to control the adjustment of the patterned light and further analyze the received reflections, to yield a depth map of objects within the scene, wherein the transmitter may include: a light source configured to produce a light beam; a first reflector tiltable approximately along a line on an x-y plane in a Cartesian x-y-z coordinate system; and a second reflector tiltable along a z-axis in said coordinate system, wherein the reflectors are tilted along their respective axes back and forth so as to divert the light beam for creating the adjusted patterned light.

Hole inspection method and apparatus

An inspection apparatus initially involves an illuminator for directing an illuminating light beam towards a hole having two extremities and an internal surface extending between the two extremities. The inspection apparatus also involves a lens assembly for imaging the internal surface of the hole into the flat image. The lens assembly has a cylindrical field of view as well as a cylindrical depth of view. The cylindrical depth of field extends at least between the two extremities of the hole. The inspection apparatus further involves an image capturing device for capturing the flat image, and an image processing unit for performing inspection of the flat image to thereby inspect the internal surface of the hole. More specifically, the internal surface of the hole between the two extremities thereof is substantially in-focus along the flat image.

Method and device for optically measuring a thread

A method and a device can be used for optically measuring a thread on an end of a metal pipe by at least one measuring head which is fastened to a manipulator. The measuring head is preferably freely positionable in relation to the metal pipe and has at least one optical measuring path for measuring the thread and at least one position detector. The method includes at least the following method steps: A) providing the metal pipe in a measurement position; B) determining the spatial position of a longitudinal axis of the metal pipe by means of the at least one position detector before and/or while the measuring head is positioned in a measurement position; C) aligning the measuring head parallel to the longitudinal axis of the metal pipe before and/or while the measuring head is positioned in the measurement position; and D) carrying out the optical thread measurement.

Laser interferometer system for monitoring and controlling IC processing

Способ бесконтактного измерения высоты пороховых элементов в гильзе

Предлагаемое изобретение относится к области измерительной техники и касается способа бесконтактного измерения высоты пороховых элементов в гильзе. Способ включает в себя воздействие на контролируемые пороховые элементы направленным лазерным потоком, прием отраженного сигнала и фиксацию временного интервала между зондирующим и отраженным импульсами. Для каждого луча лазерного потока определяют расстояние до пороховых элементов пропорционально этому интервалу. Определяют по совокупности сравнительного анализа расстояние высоты утряски пороховых элементов и расстояние от среза дульца гильзы. Полученная разность результатов сравнивается с чертежным значением. В зависимости от результатов сравнения выводится информация о высоте утряски пороховых элементов в гильзе и подается сигнал на проведение дальнейшей операции сборки метательного заряда. Технический результат заключается в повышении точности контроля и уменьшении риска возникновения аварийных ситуаций на рабочем месте. 1 ил.

КАБЕЛЬНАЯ ЛИНИЯ

Изобретение относится к области прокладки кабельных линий с возможностью определения формы и пространственного положения трассы кабельной линии скрытой прокладки с использованием волоконно-оптических средств. Техническим результатом является повышение точности и достоверности определения фактического пространственного расположения кабельной линии скрытой прокладки. Упомянутый технический результат достигается тем, что кабельная линия содержит силовой электрический кабель, имеющий по меньшей мере один силовой проводник с изоляцией, оболочку и четыре сенсорных оптических волокна, расположенных вдоль оси кабеля, три из которых в качестве распределенных датчиков измерения деформации кабеля встроены в оболочку кабеля, связаны с ней жестко без скольжения и расположены в поперечном сечении кабеля в вершинах треугольника, причем параллельно оси кабеля, а четвертое - в качестве датчика измерения распределения температуры размещено внутри кабеля свободно и выполнено с избыточной длиной, при этом ...

ЗАХВАТНОЕ УСТРОЙСТВО ДЛЯ ОБОРУДОВАНИЯ ДЛЯ ПЕРЕМЕЩЕНИЯ ГРУЗОВ И КРАН

АКТИВНАЯ СТЕРЕОСИСТЕМА С ИСПОЛЬЗОВАНИЕМ СОПУТСТВУЮЩЕГО УСТРОЙСТВА ИЛИ УСТРОЙСТВ

СМЕШИВАНИЕ ИНФРАКРАСНОГО ОБЛАКА ТОЧЕК ДАННЫХ И ОБЛАКА ТОЧЕК ДАННЫХ ЦВЕТОВЫХ СОСТАВЛЯЮЩИХ

Profiltiefenmeßvorrichtung

LASERBEARBEITUNGSGERÄT, LASERBEARBEITUNGSVERFAHREN UND KORREKTURDATEN-ERZEUGUNGSVERFAHREN

Es wird ein Laserbearbeitungsgerät verwendet, das umfasst: einen Laseroszillator, der einen Bearbeitungslaserstrahl an einem zu bearbeitenden Bearbeitungspunkt auf einer Oberfläche eines Werkstücks in Oszillation versetzt; ein optisches Interferometer, das einen Messstrahl zu dem Bearbeitungspunkt aussendet und ein optisches Interferenzintensitätssignal auf der Basis von Interferenz erzeugt, die aufgrund einer optischen Wegdifferenz zwischen dem an dem Bearbeitungspunkt reflektierten Messstrahl und einem Referenzstrahl erzeugt wird; einen ersten Spiegel, der die Laufrichtungen des Bearbeitungslaserstrahls und des Messstrahls ändert; einen zweiten Spiegel, der einen Einfallswinkel des Messstrahls auf den ersten Spiegel ändert; eine Linse, die den Bearbeitungslaserstrahl und den Messstrahl auf den Bearbeitungspunkt fokussiert; einen Speicher, der korrigierte Bearbeitungsdaten speichert; eine Steuereinheit, die den Laseroszillator, den ersten Spiegel und den zweiten Spiegel auf der Basis der ...

Optical surface measuring apparatus and method.

Tyre tread depth measurement

The invention relates to tyre tread depth measurement, and in particular to a tyre tread depth measurement apparatus, and a method for operation thereof. A tread depth measurement apparatus 10 is provided for measuring a tread depth of a tyre 20. The apparatus 10 comprises a body 12 having a measurement device 22 for measuring the tread depth. The body 12 further includes an electronic sensor device 28 to determine an orientation of the measurement device 22 relative to a rolling surface 18 of the tyre 20 to provide the tread depth measurement substantially along a normal (40, figure 3) to the rolling surface 18. The electronic sensor device 28 may be: an inductor circuit using inductor values, eddy current losses, Q factors; magnet; capacitor circuit may have a colpitts oscillator; light level sensor circuit; at least one photomicrosensor in a circuit, measuring displacement of a pin, they may surround the measurement device 22; a strain sensor circuit to sense deformation. The circuits ...

Tyre profiling arrangement

Radiation reflected by a rotating tyre 14 is measured and a profile of the tyre obtained indicating either tyre tread and location or the side wall of the tyre. The radiation incident upon the tyre surface may be a light stripe 28 projected onto the width of the tyre. Radiation projection and detection may be carried out at several locations spaced around the periphery of the tyre. The tyre may be mounted on wheel balancing equipment or alternatively on rollers (fig 3) used to perform automatic checks on vehicle tyres without the removal of the wheel itself. In another embodiment, the radiation source and detector are provided in a sensor head (100, fig 9) detachably mounted on a vehicle by means of an arm mounting means (102 and 110, fig 9 respectively). The profiling of the tyre is performed during or after movement of the vehicle.

Non-contact measurement of filter rod recess depth

A cigarette filter rod is loaded in a filter rod slide chute and falls under its own weight until it reaches a filter rod end stop. An optical source/detector is then arranged opposite the recessed filter end of the rod (disposed so as to project incident light onto a predetermined portion of the recessed filter end while simultaneously receiving and detecting a reflected portion of such light). The source/detector (and/or the filter rod) is then controllably moved so as to alter the separation distance therebetween. The magnitude of the reflected light is recorded, for example in the memory associated with a properly programmed microprocessor at a predetermined number of separation distances. The separation distance corresponding to maximum reflectance is then mathematically determined. Assuming that the system has been properly calibrated (e.g., by performing the same process with the dummy filter having a zero recess distance), the resulting separation distance is used to calculate the ...

Overlapping charge accumulation depth sensors and methods of operating the same

One embodiment includes sequentially resetting rows and applying a gating signal to the rows sequentially in order in which the rows are reset; accumulating at each of the rows photocharge generated in response to an optical signal reflected from an object and the gating signal for an integration time; and reading a result of photocharge accumulation from each of the rows. A phase of the gating signal applied to a row with respect to which the reading has been completed, may be changed. A period of photocharge accumulation based on the gating signal having a changed phase in at least one row, which has been subjected to the reading and then reset, may overlap a period of photocharge accumulation in at least one row in which photocharge accumulation based on the gating signal having a phase before being changed is being carried out.

Method and apparatus for determining the tread depth of a vehicle tire

A method for determining the tread depth of a vehicle tire, with the tire being mounted on a vehicle, the tire being rolled over or placed on a measuring station, the tread of the tire being optically sensed transversely to the rolling direction of the tire on at least one measuring line, a ray fan extending from a light source being reflected at the tire surface and a signal of the reflected ray fan being recorded by a sensor, and the signal of the reflected ray fan being evaluated by way of a triangulation method, is characterized in that the signal is recorded in a non-orthogonal manner to the tire surface.

Reducing Interference Between Multiple Infra-Red Depth Cameras

Systems and methods for reducing interference between multiple infra-red depth cameras are described. In an embodiment, the system comprises multiple infra-red sources, each of which projects a structured light pattern into the environment. A controller is used to control the sources in order to reduce the interference caused by overlapping light patterns. Various methods are described including: cycling between the different sources, where the cycle used may be fixed or may change dynamically based on the scene detected using the cameras; setting the wavelength of each source so that overlapping patterns are at different wavelengths; moving source-camera pairs in independent motion patterns; and adjusting the shape of the projected light patterns to minimize overlap. These methods may also be combined in any way. In another embodiment, the system comprises a single source and a mirror system is used to cast the projected structured light pattern around the environment.

Unit pixels, depth sensors and three-dimensional image sensors including the same

A unit pixel of a depth sensor includes a light-receiver configured to perform photoelectric conversion of an incident light to output an electrical signal and at least two sensors adjacent to the light-receiver to receive the electrical signal from the light-receiver such that a line connecting the sensors forms an angle greater than zero degrees with respect to a first line, the first line passing through a center of the light-receiver in a horizontal direction.

COMPUTERIZED IMAGING OF TARGET ANIMALS

A method of generating and storing three-dimensional digital data indicative of a sporting trophy is provided. The method may be implemented in relation to a wide variety of sporting trophy applications. A sportsman can provide a sporting trophy to a scanning system to obtain three-dimensional image data relative to the sporting trophy. Sporting-relevant measurements can be computed based on the stored three-dimensional image data. 1. A system for obtaining three-dimensional information related to a sporting trophy , the system comprising:a scanner configured to scan a sporting trophy in three dimensions and generate three-dimensional image data indicative of the sporting trophy, the sporting trophy being any non-living biological specimen obtained by a sportsman while engaged in their sport; anda memory for storing the three-dimensional image data of the sporting trophy, the three-dimensional image data being a three-dimensional representation of the sporting trophy.2. The system of further comprising a server coupled to the scanner and memory claim 1 , the server being configured to calculate at least one sporting-relevant measurement relative to the sporting trophy and generate an automated score based upon the plurality of measurements claim 1 , the sporting-relevant measurement based on the three-dimensional representation of the sporting trophy.3. The system of wherein the automated score is based on a preselected sporting trophy scoring systems.4. The system of claim 3 , and further comprising a ranking system operably coupled to the server and configured to maintain a ranking of scored sporting trophies.5. The system of claim 4 , wherein the ranking system is configured to store additional data relative to a particular sporting trophy.6. The system of claim 5 , wherein the additional data includes geography.7. The system of claim 6 , wherein the additional data includes the state in which the sporting trophy was taken.8. The system of claim 5 , where in the ...

SYSTEM AND METHOD FOR MEASUREMENT OF THROUGH SILICON STRUCTURES

A system and method for measurement of high aspect ratio through silicon via structures. A preferred embodiment includes a white light source and optical components adapted to provide a measurement beam which is nearly collimated with a measurement spot size of the same order of magnitude as the diameter (or effective diameter) of the TSV. These embodiments include a white light source with a variable aperture and other optical components chosen to control the angular spectrum of the incident light. In preferred embodiments the optical components include an automated XYZ stage and a system controller that are utilized to direct the illumination light so as to illuminate the top and bottom of TSV under analysis. 1. A method for measurement of high aspect ratio through silicon structures of a variety of sizes in silicon wafers , said method comprising the steps of: 1) a light source and optical components adapted to provide a measurement beam which is nearly collimated with a measurement spot size of the same order of magnitude as the size of the through silicon structure,', '2) an XYZ stage and a system controller adapted to direct illumination from the light source so as to illuminate with a beam spot the top and bottom of the through silicon structures,', '3) a camera adapted for imaging the through silicon structures,', '4) a spectrometer adapted to determine depths of the through silicon structures based on light reflected form top and bottom of the through beam structures,', '5) a beam splitter adapted to direct a portion of the light reflected from the top and bottom of the through silicon structure to a camera for imaging purposes and a portion of the reflected light to a spectrometer, and', '6) a computer processor for determining depth and aspect ratio from optical information produced by said camera and said spectrometer,, 'A) providing an optical measurement system comprisingB) utilizing the optical measurement system to position through silicon structures ...

DISPLAY APPARATUS AND METHOD FOR ESTIMATING DEPTH

A display apparatus and method may be used to estimate a depth distance from an external object to a display panel of the display apparatus. The display apparatus may acquire a plurality of images by detecting lights that are input from an external object and passed through apertures formed in a display panel, may generate one or more refocused images, and may calculate a depth from the external object to the display panel using the plurality of images acquired and one or more refocused images. 1. A display apparatus to estimate a depth , the apparatus comprising:a display panel which includes a plurality of apertures to receive light input from an external object;a sensor panel to acquire a plurality of images by detecting lights transmitted from the display panel through the plurality of apertures; anda processor to generate at least one refocused image based on a disparity set in association with a plurality of image acquiring areas on the sensor panel, and to calculate a depth from the external object to the display panel, using the at least one refocused image.2. The apparatus of claim 1 , wherein each of the plurality of image acquiring areas maintains a constant correlation between a first point at which the image is captured claim 1 , and a second point at which the image is captured in an adjacent image acquiring area.3. The apparatus of claim 2 , whereinthe plurality of image acquiring areas comprises a plurality of points, each having a coordinate value, andthe correlation is maintained to be constant when a difference between a coordinate value of the first point and a coordinate value of the second point is identical in each of the plurality of image acquiring areas.4. The apparatus of claim 2 , whereinthe disparity is set to be a difference value between a reference point at which the image is captured in a reference area and the first point at which the image is captured in a remaining image acquiring area, among the plurality of image acquiring areas ...

Device and method for measuring tire parameters of a vehicle

A device for measuring tire parameters of a vehicle, comprising a detector for detecting a tire pressure of the vehicle, a measuring system for detecting a tire profile depth of the vehicle, and an output unit for outputting measured tire parameters that include and/or take into account the tire pressure and the tire profile depth. The detector and the measuring system have a measuring arrangement which is designed to be driven over by the vehicle and which is designed to measure the tire pressure as well as the tire profile depth in a moving vehicle, and the output unit is designed to display a result of the measurement such that an operating person that drives the vehicle can detect the measurement in the vehicle or from the vehicle directly after driving over the measuring arrangement.

DEVICE AND METHOD FOR MEASURING VIA HOLE OF SILICON WAFER

The present invention pertains to a device and a method for measuring a via hole of a silicon wafer, wherein it is possible to precisely measure the depth of the via hole without damaging the wafer. Broadband infrared light is radiated to a silicon wafer which has a superior light transmission property, so that the depth of the via hole may be measured from the light which is reflected from each boundary surface of the wafer and the interference signal of reference light. The via hole measuring device according to the present invention includes: a light source unit for generating broadband infrared light; and an interferometer for radiating the light generated from the light source unit to a silicon wafer, so as to measure the depth of a via hole formed on the wafer according to the spectrum period of the interference signal of the light, which is reflected from the silicon wafer. 1121. A device for measuring a via hole of a silicon wafer , the device comprising a light source unit () , and an interferometer () that irradiates a light generated from the light source unit () to the silicon wafer and measures a depth of the via hole formed in the wafer from an interference signal of a light reflected by the silicon wafer , wherein:{'b': '1', 'the light source unit () generates a broadband infrared light,'}{'b': '2', 'the interferometer () senses an interference signal that is generated as the broadband infrared light is reflected by interfaces of a bottom surface of the via hole and a front surface or a rear surface of the silicon wafer, and'}optical path differences for a plurality of frequency components are simultaneously acquired through spectrum period analysis for the interference signal to measure a depth and a diameter of the via hole.22. The device according to claim 1 , wherein the interferometer () includes:{'b': 21', '1, 'a collimation lens () that converts the light output from the light source unit () to a parallel light;'}{'b': 22', '21', '100, 'a beam ...

Evaluating an Input Relative to a Display

Disclosed embodiments relate to evaluating an input relative to a display. A processor may receive information from an optical sensor 106 and a depth sensor 108. The depth sensor 108 may sense the distance of an input from the display. The processor may evaluate an input to the display based on information from the optical sensor 106 and the depth sensor 108.

METHOD AND APPARATUS OF MEASURING DEPTH OF OBJECT BY STRUCTURED LIGHT

A method and an apparatus of measuring a depth of an objection by structured light are disclosed. The method may comprise: projecting structured light from a light source to the object through a structured light mask; capturing a first projection image from the structured light reflected by the object, and deriving a first depth value at a first positional point from the first projection image; moving the structured light mask within a prescribed range to project further structured light to the object; capturing a second projection image from the further structured light reflected by the object, and deriving a second depth value at a second positional point from the second projection image; and acquiring a plurality of the second depth values, and performing calculation on the first depth value and the respective second depth values in accordance with a predetermined rule to derive a resultant depth value.

THREE DIMENSIONAL SHAPE MEASUREMENT APPARATUS AND METHOD

A three dimensional shape measurement apparatus includes m projecting sections, each of which includes a light source and a grating element, and, while moving the grating element by n times, projects a grating pattern light onto a measurement target for each movement, wherein the ‘n’ and the ‘m’ are natural numbers greater than or equal to 2, an imaging section photographing a grating pattern image reflected by the measurement target, and a control section controlling that, while photographing the grating pattern image by using one of the m projecting sections, a grating element of at least another projecting section is moved. Thus, measurement time may be reduced. 1. A method of measuring a three dimensional shape comprising:photographing a first image in a first measurement area of a measurement target;arithmetically processing the first image by a first central processing unit to produce a three dimensional shape in the first measurement area;photographing a second image in a second measurement area of the measurement target while the first central processing unit arithmetically processes the first image; andarithmetically processing the second image by a second central processing unit to produce a three dimensional shape in the second measurement area.2. The method of claim 1 , further comprising:photographing a third image in a third measurement area of the measurement target while arithmetically processing the second image by the second central processing unit; andarithmetically processing the third image by the first central processing unit to produce a three dimensional shape in the third measurement area.3. The method of claim 1 , wherein each of the first and second images includes a plurality of way images photographed with respect to the measurement target in different directions claim 1 , andarithmetically processing each of the first and second images is performed by arithmetically processing each image independently, and merging arithmetically ...

DISTANCE DETECTING DEVICE AND IMAGE PROCESSING APPARATUS INCLUDING THE SAME

A distance detecting device and an image processing apparatus including the same are disclosed. The distance detecting device includes a first light source to output a first output beam and a second light source to output a second output beam having a wavelength different from that of the first output beam, a scanner to progressively perform first directional scanning and second directional scanning to output the first output beam and the second output beam to an outside, a first detecting unit to convert a first received beam corresponding to the first output beam into a first electric signal, a second detecting unit to convert a second received beam corresponding to the second output beam into a second electric signal, and a controller to detect a distance from an external target based on the first electric signal and the second electric signal. 1. A distance detecting device comprising:a first light source to output a first output beam and a second light source to output a second output beam having a wavelength different from that of the first output beam;a scanner to progressively perform first directional scanning and second directional scanning to output the first output beam and the second output beam to an outside;a first detecting unit to convert a first received beam corresponding to the first output beam into a first electric signal;a second detecting unit to convert a second received beam corresponding to the second output beam into a second electric signal; anda controller to detect a distance from an external target based on the first electric signal and the second electric signal.2. The distance detecting device according to claim 1 , further comprising a light wavelength splitting unit to transmit the first output beam and to reflect the second output beam to transmit the first output beam and the second output beam to the scanner.3. The distance detecting device according to claim 2 , wherein the light wavelength splitting unit transmits the first ...

Method for Analyzing at Least a Cutting Emerging from a Well, and Associated Apparatus

The method comprises the following steps: —disposing at least a cutting () on a cuttings support surface (); —placing a measuring apparatus () over the support surface (), the measuring apparatus () facing the cutting (), at a distance from the cutting (); —measuring a first distance (d) between a reference plane and the support surface () in the vicinity of the cutting () along an axis (A-A′) transverse to the support surface () using the measuring apparatus (); —measuring a second distance (d) between the reference plane and the cutting () along the transverse axis (A-A′), using the measuring apparatus (); —calculating a representative dimension (d) of the cutting based on the difference between the first distance (d) and the second distance (d). 1. Method for analyzing at least a cutting emerging from a well , the method comprising the following steps:disposing at least a cutting on a cuttings support surface;placing a measuring apparatus over the support surface, the measuring apparatus facing the cutting, at a distance from the cutting;{'sub': '1', 'measuring a first distance (d) between a reference plane and the support surface in the vicinity of the cutting along an axis (A-A′) transverse to the support surface using the measuring apparatus;'}{'sub': '2', 'measuring a second distance (d) between the reference plane and the cutting along the transverse axis (A-A′), using the measuring apparatus;'}{'sub': zz', '1', '2, 'calculating a representative dimension (d) of the cutting based on the difference between the first distance (d) and the second distance (d).'}2. Method according to claim 1 ,wherein the measuring apparatus comprises an optical measuring device;{'sub': 1', '1, 'the measuring of the first distance (d) comprising focusing the optical measuring device on the support surface and measuring a first focusing distance, the first distance (d) being derived from the measured first focusing distance;'}{'sub': 2', '2, 'the measuring of the second distance ( ...

Image processing device, imaging device, and image processing method

An image processing device which creates a depth map using a multi-view image includes: a detection unit which detects at least one feature in each of the images included in the multi-view image; a calculation unit which calculates reliability of correspondence between images included in the multi-view image in preparation for creating the depth map; and a creation unit which creates the depth map using the correspondence between the images included in the multi-view image when the calculated reliability is a first reliability, and creates the depth map without using the correspondence between the images included in the multi-view image when the calculated reliability is a second reliability which is lower than the first reliability.

SYSTEM, METHOD AND COMPUTER PROGRAM FOR RECEIVING A LIGHT BEAM

The invention relates to a system () for receiving a light beam, comprising an array of light sensors (). The system also comprises a pixelated light switch array (), in which each switch is adapted to receive at least one portion of the light beam and direct it to the array of light sensors (), and the pixelated light switch array () comprises a higher number of switches than the number of light sensors comprised in the array of light sensors (). 116-. (canceled)1721. A system () for receiving a light beam , comprising{'b': 26', '24', '26', '24', '26, 'an array of light sensors () and a pixelated light switch array (), in which each switch is adapted to receive at least one portion of the light beam and direct it to the array of light sensors (), the pixelated light switch array () comprising a higher number of switches than the number of light sensors comprised in the array of light sensors (); and'}{'b': 30', '24', '26, 'a computer controller () for controlling the switches of the pixelated light switch array () for sequentially redirecting portions of incoming light beams, in a higher number than the number of light sensors, from the switches to the light sensors, such that an spatial resolution increase is achieved for the array of light sensors (), which receive a higher number of portions of light beams than the number of light sensors.'}1820282228242826. The system of claim 17 , further comprising scanning means () for scanning a surface () claim 17 , comprising: a light source () for transmitting a light beam to the surface () to be scanned claim 17 , the pixelated light switch array () being configured to receive incoming portions of the light beam reflected on the surface () and to sequentially redirect said incoming portions towards the light sensors of the array of light sensors ();{'b': 32', '26, 'a first computer system () for determining the time of flight value of each portion of the light beam received at the light sensors of the array of light ...

Three-dimensional shape measuring apparatus, three-dimensional shape measuring method, program, and storage medium

An information processing apparatus includes a projection unit configured to project a projection pattern onto an object, an imaging unit configured to capture an image of the object on which the projection pattern is projected, and a derivation unit configured to derive a three-dimensional shape of the object based on the image captured by the imaging unit. The projection pattern projected on the object by the projection unit includes a first pattern including a continuous luminance variation repetitively arranged at certain distances in a predetermined direction, and a second pattern having information for identifying the position of the measurement pattern in the captured image in an area between peaks in the measurement pattern.

SYSTEM AND METHOD FOR MONITORING THE FRAME LEVELNESS OF AN AGRICULTURAL IMPLEMENT

In one aspect, a system for monitoring the frame levelness of an agricultural implement include first and second sensors configured to capture data indicative of a position differential defined between a soil surface and a portion of an a first and second ground engaging tool positioned below the soil surface, respectively. The captured data may be associated at least partially with the receipt of sensor signals reflected off of the portion of the associated ground engaging tool positioned below the soil surface. The system may also include a controller configured to determine penetration depths of the first and second ground engaging tools based on the captured data received from the first and second sensors, respectively. The controller may also be configured to monitor the frame levelness based on a penetration depth differential defined between the first and second penetration depths. 1. A system for monitoring the frame levelness of an agricultural implement , the system comprising:a frame extending in a longitudinal direction between a forward end and an aft end and in a lateral direction between a first side and a second side;first and second ground engaging tools coupled to the frame, the first and second ground engaging tools being spaced apart from each other in at least one of the longitudinal direction or the lateral direction;a first sensor configured to capture data indicative of a first position differential defined between a soil surface and a portion of the first ground engaging tool positioned below the soil surface, the captured data being associated at least partially with the receipt of sensor signals reflected off of the portion of the first ground engaging tool positioned below the soil surface;a second sensor configured to capture data indicative of a second position differential defined between the soil surface and a portion of the second ground engaging tool positioned below the soil surface, the captured data being associated at least ...

Detector for an optical detection of at least one object

A detector ( 110 ) for an optical detection of at least one object ( 112 ) is proposed. The detector ( 110 ) comprises: —at least one transfer device ( 120 ), wherein the transfer device ( 120 ) comprises at least two different focal lengths ( 140 ) in response to at least one incident light beam ( 136 ); —at least two longitudinal optical sensors ( 132 ), wherein each longitudinal optical sensor ( 132 ) has at least one sensor region ( 146 ), wherein each longitudinal optical sensor ( 132 ) is designed to generate at least one longitudinal sensor signal in a manner dependent on an illumination of the sensor region ( 146 ) by the light beam ( 136 ), wherein the longitudinal sensor signal, given the same total power of the illumination, is dependent on a beam cross-section of the light beam ( 136 ) in the sensor region ( 146 ), wherein each longitudinal optical sensor ( 132 ) exhibits a spectral sensitivity in response to the light beam ( 136 ) in a manner that two different longitudinal optical sensors ( 132 ) differ with regard to their spectral sensitivity; wherein each optical longitudinal sensor ( 132 ) is located at a focal point ( 138 ) of the transfer device ( 120 ) related to the spectral sensitivity of the respective longitudinal optical sensor ( 132 ); and —at least one evaluation device ( 150 ), wherein the evaluation device ( 150 ) is designed to generate at least one item of information on a longitudinal position and/or at least one item of information on a color of the object ( 112 ) by evaluating the longitudinal sensor signal of each longitudinal optical sensor ( 132 ). Thereby, a simple and, still, efficient detector for an accurate determining of a position and/or a color of at least one object in space is provided.

METHODS AND DEVICES FOR CORRECTING UNDERWATER PHOTON DISPLACEMENT AND FOR DEPTH SOUNDING WITH SINGLE-PHOTON LIDAR

Methods and devices for correcting underwater photon displacement and for depth sounding with a single-photon Lidar are provided. The method includes: acquiring a pointing angle of a photon emitted by the single-photon Lidar, and coordinates of a water-surface photon signal and a water-bottom photon signal returned by the photon emitted by the single-photon Lidar; performing a sea wave fitting according to the water-surface photon signal to determine a sea wave model; determining an intersection of the photon and an air-water interface according to coordinates of any water-bottom photon, the pointing angle and the sea wave model; determining an underwater displacement error of the photon according to the intersection, the sea wave model and the pointing angle; and correcting the coordinates of the water-bottom photon according to the underwater displacement error. The invention performs sea wave modeling through water surface photon signal and determines intersection of the photon and water-air interface.

SYSTEMS AND METHOD FOR ADVANCED ADDITIVE MANUFACTURING

A manufacturing computer device for dynamically adapting additive manufacturing of a part is configured to store a build file for building the part including one or more build parameters and receive build information. The manufacturing computer device is also configured to compare the sensor information to the one or more build parameters to determine one or more differences. The computer device is further configured to determine one or more adjustments to the one or more build parameters. Moreover, the computer device is configured to generate an updated build file based on the one or more adjustments. In addition, the computer device is further configured to transmit the updated build file to at least one machine of the plurality of machines for manufacture. 1. A manufacturing computer device for dynamically adapting additive manufacturing of a part , said manufacturing computer device comprising at least one processor in communication with at least one memory device , said at least one memory device stores a build file for building the part including one or more build parameters , said manufacturing computer device configured to:receive build information, wherein the build information comprises sensor information of a build of the part by at least one of a plurality of machines;compare the sensor information to the one or more build parameters to determine one or more differences;determine one or more adjustments to the one or more build parameters; andgenerate an updated build file based on the one or more adjustments.2. The manufacturing computer device in accordance with claim 1 , wherein the build information further includes a plurality of real-time adjustments to the build parameters made by the corresponding machine while building the part claim 1 , and wherein said manufacturing computer device is further configured to:compare the plurality of real-time adjustments to the sensor information for the plurality of builds; anddetermine the one or more ...

TEMPERATURE COMPENSATION FOR STRUCTURED LIGHT DEPTH IMAGING SYSTEM

Disclosed are an apparatus and a method of compensating temperature shifts of a structured light pattern for a depth imaging system. In some embodiments, a depth imaging device includes a light source, an imaging sensor and a processor. The light source emits light corresponding to a pattern. A temperature drift of the light source can cause a shift of the pattern. The imaging sensor receives the light reflected by environment in front of the depth imaging device and generates a depth map including a plurality of pixel values corresponding to depths of the environment relative to the depth imaging device. The processor estimates the shift of the pattern based on a polynomial model depending on the temperature drift of the light source. The processor further adjusts the depth map based on the shift of the pattern. 1. A depth imaging device , comprising: receive light as reflected by an environment of the depth imaging device;', 'generate, based on the light, a depth map including a plurality of pixel values corresponding to depths of the environment relative to the depth imaging device;, 'an imaging sensor configured toa temperature sensor configured to measure a temperature drift from a reference temperature of one or more of a light source, an optical component of the depth imaging device, or the environment of the depth imaging device; and estimate a shift of a pattern of the light based on the temperature drift; and', 'adjust the depth map based on the shift of the pattern., 'a processor configured to2. The depth imaging device of claim 1 , wherein the pattern is a speckle pattern corresponding to a reference image including a plurality of dots claim 1 , each of the dots of the plurality of dots having known coordinates in the reference image.3. The depth imaging device of claim 1 , wherein the shift of the pattern is estimated by using a polynomial model depending on the temperature drift.4. The depth imaging device of claim 3 , wherein the polynomial model is ...

AUTOMATED APPARATUS TO IMPROVE IMAGE QUALITY IN X-RAY AND ASSOCIATED METHOD OF USE

A system or method for improving quality in projection and tomographic x-ray, which includes a depth sensing device to measure a depth of at least one body part of a patient from the depth sensing device and a control unit to calculate a thickness and/or circumference of the body part using the depth information. The calculated thickness and circumference information is used to determine an optimal level of x-ray exposure for the body part. The system or method also includes a camera to identify the body part that needs to be examined and to detect any motion of the identified body part. 1. A system for improving quality in projection and tomographic x-ray imaging comprising:an x-ray tube emitting x-rays;a depth sensing device measuring a depth of at least one body part of a patient, wherein the depth represents a distance between said depth sensing device and the body part; anda control unit comprising a memory, wherein said memory stores depth reference data that represents the distance between said depth sensing device and the body part, wherein said depth reference data is used to calculate one of a thickness of the body part and a circumference of the body part, wherein the calculated thickness or circumference is used to determine an optimal level of x-ray exposure for the body part.2. The system for improving quality in projection and tomographic x-ray according to claim 1 , wherein the circumference of the body part is used to determine an optimal level of x-ray exposure for the body part when using a CT scanner.3. The system for improving quality in projection and tomographic x-ray according to claim 1 , wherein the optimal level of x-ray exposure for the body part is used for determining a patient geometry when using a fluoroscopy claim 1 , wherein the patient geometry is further used for determining at least one of a patient entrance exposure and a peak skin dose.4. The system for improving quality in projection and tomographic x-ray imaging according to ...

Multi Functional Camera With Multiple Reflection Beam Splitter

An apparatus is described. The apparatus includes a camera comprising a beam splitter to impose different optical paths for visible light and infra red light received by the camera. The camera also includes an infra red light detector to detect the infra red light and a visible light detector to detect the visible light, wherein, the different optical paths include an optical path having more than one internal reflection within the beam splitter.

VERIFICATION METHOD

The present invention relates to a verification method of tablets, in particular pharmaceutical tablets. It further relates to an invisible secure marking or information which is a part of such tablet. The invention further relates to tablets suitable for such verification method, to processes for manufacturing such tablets and methods for reading the information. 1. A verification method for a pharmaceutical tablet , comprising:compressing a powder mixture in a die between two punch tools to produce a core of the tablet, the compressing including embossing one or more three-dimensional structures on the surface of the core;applying a coating over the surface of the core to produce the tablet in finalized form with the one or more three-dimensional structures at an interface between the core and the coating, the coating rendering each of the one or more three-dimensional structures invisible to the unaided eye by appropriate color, thickness, reflection or scattering properties thereof; andverifying authenticity of the tablet after production of the tablet by scanning the tablet with an optical interferometry microscope to detect the one or more three-dimensional structures.2. The verification method of claim 1 , wherein verifying authenticity of the tablet further comprises:recording a data set with the detection device, the data set describing characteristics of the one or more three-dimensional structures; andcomparing the recorded data set with at least one predefined data set associated with the punch tools.3. The verification method of claim 2 , wherein the die and punch tools define one of a plurality of embossing tools used to make pharmaceutical tablets claim 2 , each of which is associated with one of a plurality of predefined data sets defining characteristics of the corresponding embossing tool claim 2 , and comparing the recorded data set further comprises:confirming whether the recorded data set matches at least one of the plurality of predefined data ...

SYSTEMS AND METHODS FOR WIDE-ANGLE LiDAR USING NON-UNIFORM MAGNIFICATION OPTICS

Methods and systems for wide-angle LiDAR are provided that utilize magnification optics that provide non-uniform resolution in different areas of a Field of View (FoV). 1. A LiDAR system , comprising:an emission unit configured for emitting an optical signal that illuminates at least part of a field of view (FoV);magnification optics configured for receiving an optical signal that is a version of the emitted optical signal reflected from at least one object in the FoV, the magnification optics having an image point distribution function that is non-linear relative to a vertical field angle of object points in the FoV; anda sensor unit, the sensor unit being configured for processing the received optical signal and outputting a depth map of the FoV, the depth map having at least one substantially expanded zone and at least one substantially compressed zone in the vertical direction.2. The LiDAR system of claim 1 , wherein the magnification optics comprises an objective lens claim 1 , wherein the sensor unit comprises a plurality of sensor elements placed in an image plane of the objective lens.3. The LiDAR system of claim 2 , wherein a number of sensor elements per degree of vertical field angle differs over portions of the FoV by more than 10% relative to the average number of sensor elements per degree of vertical field angle over the total FoV in the vertical direction.4. The LiDAR system of claim 2 , wherein the objective lens and the plurality of sensor elements are configured such that claim 2 , in each substantially expanded zone claim 2 , a number of sensor elements per degree of vertical field angle is greater than the average number of sensor elements per degree of vertical field angle over the total FoV in the vertical direction and claim 2 , in each substantially compressed zone claim 2 , the number of sensor elements per degree of vertical field angle is less than the average number of sensor elements per degree of vertical field angle over the total FoV ...

MEASUREMENT APPARATUS AND MEASURING METHOD

A measurement apparatus may include: an irradiating unit configured to shape at least one terahertz wave and irradiate first and second surfaces of the object with the at least one shaped terahertz wave; a positional information acquiring unit configured to acquire positional information on a measurement area of the at least one shaped terahertz wave; and a position adjusting unit configured to relatively adjust a converging position of the at least one shaped terahertz wave and a position of the object in a depth direction of the object on a basis of the acquired positional information, which may be acquired by using relationship information indicating a relationship between positions of the first and second surfaces and intensities or beam propagation shapes of at least one first pulse and at least one second pulse of the at least one terahertz wave reflected respectively from the first and second surfaces. 1. A measurement apparatus configured to irradiate an object to be measured with a terahertz wave and measure a time waveform of the terahertz wave reflected from the object to be measured , comprising:an irradiating unit configured to shape the terahertz wave and irradiate a first surface of the object to be measured and a second surface of the object to be measured with the shaped terahertz wave;a positional information acquiring unit configured to acquire positional information relating to or on a measurement area of the terahertz wave shaped in the irradiating unit; anda position adjusting unit configured to relatively adjust a converging position of the terahertz wave shaped in the irradiating unit and a position of the object to be measured in a depth direction of the object to be measured on a basis of the positional information relating to or on the measurement area acquired by the positional information acquiring unit, whereinthe positional information acquiring unit acquires the positional information relating to or on the measurement area by using ...

DEPTH MAPPING BASED ON PATTERN MATCHING AND STEREOSCOPIC INFORMATION

A method for depth mapping includes projecting a pattern of optical radiation onto an object. A first image of the pattern on the object is captured using a first image sensor, and this image is processed to generate pattern-based depth data with respect to the object. A second image of the object is captured using a second image sensor, and the second image is processed together with another image to generate stereoscopic depth data with respect to the object. The pattern-based depth data is combined with the stereoscopic depth data to create a depth map of the object. 1. A method for depth mapping , comprising:projecting a pattern of infrared optical radiation onto an object;capturing an infrared image of the pattern on the object using a first image sensor, and processing the infrared image alone to generate pattern-based depth data with respect to the object;capturing a color image of the object using a second image sensor, wherein the projected pattern does not appear in the color image, and processing the color image together with the infrared image to generate stereoscopic depth data with respect to the object; andcombining the pattern-based depth data with the stereoscopic depth data to create a depth map of the object.24-. (canceled)5. The method according to claim 1 , wherein the color image comprises pixels claim 1 , and the depth map comprises depth values claim 1 , and wherein the method comprises outputting the color image to a display together with the depth coordinates that are associated with the pixels.6. The method according to claim 1 , wherein projecting the pattern comprises projecting multiple spots onto the object claim 1 , and wherein processing the infrared image comprises finding respective transverse shifts between the spots on the object and the spots in a reference image of the pattern claim 1 , and computing the depth data based on the transverse shifts.7. The method according to claim 1 , wherein combining the pattern-based depth data ...

Calibration for laser inspection

A method of calibrating a laser measurement device includes positioning a calibration part, having known geometric specifications, at varying distances from the laser measurement device (within a measurement depth-of-field of the laser measurement device). The detected geometric specifications, measured at these different positions, are compared with the known specification(s) of the calibration part in order to improve the accuracy of the calibration. A calibration standoff fixture having a plurality of adjustable legs may be used in conjunction with the method to facilitate changing the position of the calibration part relative to the laser measurement device.

HAND-HELD TIRE SCANNER

A hand-held device for obtaining a three-dimensional topological surface profile of a tire, the device comprising: a base comprising an aperture; a light source arranged in use to generate an elongate pattern of light, and to project said pattern through the aperture onto a rolling surface of the tire; a detector arranged to image a region of the rolling surface of the tire; a plurality of pairs of guide wheels mounted on respective axles mounted on the base, wherein the guide wheels on adjacent axles are linked by gears; and a rotary encoder arranged to generate a signal corresponding to rotation of an axle. 1. A hand-held device for obtaining a three-dimensional topological surface profile of a tire , the hand-held device comprising:a light source arranged in use to generate a pattern of light, and to project said pattern of light onto a surface of the tire;a detector arranged to image the surface of the tire;a plurality of guides linked by a linking assembly and arranged to generate a signal corresponding to movement of the hand-held device along the surface of the tire.2. The hand-held device as claimed in claim 1 , wherein guides of the plurality of guides are arranged in a concave arc extending in a direction of said movement of the hand-held device.3. The hand-held device as claimed in claim 1 , further comprising at least one processor configured to generate a three-dimensional topological surface profile of the tire using data obtained from an image of the surface of the tire and the signal generated by the plurality of guides.4. The hand-held device as claimed in claim 3 , wherein the at least one processor is further configured to identify tire side walls by analyzing a directionality of the signal generated by the plurality of guides to determine a position of an outer edge and an inner edge of the tire.5. The hand-held device as claimed in wherein the plurality of guides comprises a rotary encoder for generating the signal.6. The hand-held device as ...

METHODS FOR REDUCING POWER CONSUMPTION OF A 3D IMAGE CAPTURE SYSTEM

A method for reducing power consumption of a 3D image capture system includes capturing 3D image data with the 3D image capture system while the 3D image capture system is in a first power state, detecting a power state change trigger, and switching from the first power state to a second power state based on the power state change trigger, wherein the 3D image capture system consumes less power in the second power state than in the first power state. 121-. (canceled)22. A method comprising:capturing, by a sensor and a camera associated with the sensor, active depth data and image data;analyzing, by a processing resource, the active depth data and the image data to generate a three dimensional (3D) map of an environment;detecting a device motion change;determining a rate of the device motion change; andreducing power to the sensor in response to determining that the rate of the device motion change satisfies a motion threshold.23. The method of claim 22 , wherein the camera is visible camera and the sensor is an active depth camera.24. The method of claim 22 , wherein reducing the power to the sensor is at least partially in response to determining that a set of poses of the 3D map of the environment satisfies a completion threshold.25. The method of claim 22 , wherein the first image capture technique comprises capturing image data by pulsing an emitter of the 3D image capture system or reducing power of the emitter to capture the image data.26. The method of claim 22 , wherein determining the rate of the device motion change further comprises:determining a distance to an image target has satisfied a distance threshold.27. The method of claim 22 , wherein reducing the power to the sensor in response to determining that the rate of the device motion change satisfies a motion threshold further comprises:switching the sensor from a continuous mode to a pulsed mode.28. The method of claim 22 , wherein determining the rate of the device motion change further comprises: ...

APPARATUS AND METHOD FOR DETERMINING SPECTRAL INFORMATION

Embodiments of the present invention provide an apparatus for determining spectral information of a three-dimensional object, comprising a cavity () for location in relation to the object, an imaging light source () located in relation to the cavity, wherein the imaging source is controllable to selectively emit light in a plurality of wavelength ranges, structured light source () for emitting structured illumination toward the object, wherein the structured light source comprises a plurality of illumination devices arranged around the cavity, one or more imaging devices () for generating image data relating to at least a portion of the object, a control unit, wherein the control unit () is arranged to control the structured light source to emit the structured illumination and to control the imaging light source to emit light in a selected one or more of the plurality of wavelength ranges, a data storage unit () arranged to store image data corresponding to the structured illumination and each of the selected one or more of the plurality of wavelength ranges, and processing means () arranged to determine depth information relating to at least a portion of the object in dependence on the image data corresponding to the structured illumination stored in the data storage means. 1. An apparatus for determining spectral information of a three-dimensional object , comprising:a cavity for location in relation to the object;an imaging light source located in relation to the cavity, wherein the imaging source is controllable to selectively emit light in a plurality of wavelength ranges;a structured light source for emitting structured illumination toward the object, wherein the structured light source comprises a plurality of illumination devices arranged around the cavity;one or more imaging devices for generating image data relating to at least a portion of the object;a control unit, wherein the control unit is arranged to control the structured light source to emit the ...

3D SENSOR AND METHOD OF MONITORING A MONITORED ZONE

A 3D sensor for monitoring a monitored zone is provided, wherein the 3D sensor has at least one light receiver for generating a received signal from received light from the monitored zone and has a control and evaluation unit that is configured to detect objects in the monitored zone by evaluating the received signal and to determine the shortest distance of the detected objects from at least one reference volume, and to read at least one distance calculated in advance from the reference value from a memory for the determination of the respective shortest distance of a detected object. 1. A 3D sensor for monitoring a monitored zone , wherein the 3D sensor comprises:at least one light receiver for generating a received signal from received light from the monitored zone anda control and evaluation unit having a memory, the control and evaluation unit detecting objects in the monitored zone by evaluating the received signal, determining the shortest distance of the detected objects from at least one reference volume, and reading at least one distance calculated in advance from the reference volume from a memory for the determination of the respective shortest distance of a detected object.2. The 3D sensor in accordance with claim 1 ,wherein the 3D sensor is a 3D camera.3. The 3D sensor in accordance with claim 1 ,wherein the reference volume is a hazard zone that secures a machine.4. The 3D sensor in accordance with claim 1 ,wherein the control and evaluation unit is implemented as an embedded system.5. The 3D sensor in accordance with claim 1 ,wherein the control and evaluation unit reads a distance calculated in advance from an intermediate reference zone from the memory and determines the shortest distance from it.6. The 3D sensor in accordance with claim 1 ,wherein the control and evaluation unit calculates shortest distances from the reference volume for different regions of the monitored zone and stores them in the memory.7. The 3D sensor in accordance with claim ...

METHOD AND DEVICE FOR AUTOMATICALLY IDENTIFYING A POINT OF INTEREST IN A DEPTH MEASUREMENT ON A VIEWED OBJECT

A method and device for automatically identifying a point of interest in a depth measurement on a viewed object using a video inspection device is disclosed. The video inspect device determines the three-dimensional coordinates in a region of interest on the viewed object and analyzes those surface points to determine the desired measurement application (e.g., determining the deepest point, the highest point, or the clearance between two surfaces). Based on the desired measurement application, the video inspection device automatically identifies the point of interest on the viewed object and places a cursor at that location. 1. (canceled)2. A method for automatically identifying an offset measurement point on a viewed object , the method comprising:displaying an image of the viewed object in a display;determining, by a data processor, three-dimensional coordinates of a plurality of points on a surface of the viewed object;receiving, by the data processor, a plurality of reference surface points manually selected on the displayed image via an input device;determining, by the data processor, a reference surface using three-dimensional coordinates associated with the plurality of reference surface points;determining, by the data processor, a region of interest based on the plurality of reference surface points;determining, by the data processor, a target feature type using three-dimensional coordinates within the region of interest;selecting, by the data processor, an offset measurement point based on the target feature type;determining, by the data processor, a distance between the reference surface and the offset measurement point;displaying an offset cursor in the display at the offset measurement point; andproviding the distance in the display.3. The method of claim 2 , wherein the target feature type is one of a recessed feature claim 2 , a protruding feature claim 2 , a perpendicular surface gap claim 2 , or an opposite surface gap.4. The method of claim 3 , ...

IMAGE PROCESSING APPARATUS AND METHOD

The present technology relates to an image processing apparatus and method that allow to more accurately identify image processing target areas in an image. An image processing apparatus of the present technology includes a determination unit that determines, on the basis of reliability information indicating reliability of depth information, whether to make a determination on the basis of the depth information, the determination being as to whether an area is a target area for predetermined image processing, and the depth information indicating a depth of an image. The present technology can be applied to, for example, an imaging apparatus that captures a subject, a server that processes a captured image, etc. 1. An image processing apparatus comprisinga determination unit that determines, on the basis of reliability information indicating reliability of depth information, whether to make a determination on the basis of the depth information, the determination being as to whether an area is a target area for predetermined image processing, and the depth information indicating a depth of an image.2. The image processing apparatus according to claim 1 , wherein the determination unit determines claim 1 , on the basis of the depth information claim 1 , whether an area whose reliability of depth information is higher than a predetermined threshold value is a target area for the image processing.3. The image processing apparatus according to claim 2 , wherein the determination unit determines that an area whose depth is nearer than a predetermined threshold value is a target area for the image processing.4. The image processing apparatus according to claim 1 , wherein the determination unit determines claim 1 , on the basis of other information different than the depth information claim 1 , whether an area whose reliability of depth information is not higher than a predetermined threshold value is a target area for the image processing.5. The image processing apparatus ...

Facing and Quality Control in Microtomy

The present disclosure also relates to systems and methods for quality control in histology systems. In some embodiments, a method is provided that includes receiving a tissue block comprising a tissue sample embedded in an embedding material, imaging the tissue block to create a first imaging data of the tissue sample in a tissue section on the tissue block, removing the tissue section from the tissue block, the tissue section comprising a part of the tissue sample, imaging the tissue section to create a second imaging data of the tissue sample in the tissue section, and comparing the first imaging data to the second imaging data to confirm correspondence in the tissue sample in the first imaging data and the second imaging data based on one or more quality control parameters. 1. A method for quality control in histology system comprising:receiving a tissue block comprising a tissue sample embedded in an embedding material;imaging the tissue block, prior to removing one or more tissue sections, to generate a baseline imaging data of the tissue sample;imaging the tissue block to create a first imaging data of the tissue sample in a tissue section of the one or more tissue sections on the tissue block;removing the tissue section from the tissue block, the tissue section comprising a part of the tissue sample;imaging the tissue section to create a second imaging data of the tissue sample in the tissue section;comparing the first imaging data to the second imaging data to confirm correspondence in the tissue sample in the first imaging data and the second imaging data based on one or more quality control parameter; andcomparing the first imaging data, the second imaging data or both to the baseline imaging data.2. The method of claim 1 , wherein the tissue section is non-confirming if there is no correspondence in one or more quality control parameters in the tissue sample in the first imaging data and the second imaging data.3. The method of claim 2 , wherein the one ...

Facing and Quality Control in Microtomy

The present disclosure relates to systems and methods for tracking and printing within a histology system. In some embodiments, a system is provided that includes an information reader configured to read identifying data associated with a tissue block, a microtome configured to cut one or more tissue sections from the tissue block, one or more slides for receiving the one or more tissue sections, and a printer configured to receive the identifying data and print, after the one or more tissue sections are cut from the tissue block, one or more labels for the one or more slides, the one or more labels comprising information associating the one more tissue sections on the one or more slides with the tissue block. 1. A system comprising:an information reader configured to read identifying data associated with a tissue block;a microtome configured to cut one or more tissue sections from the tissue block;one or more slides for receiving the one or more tissue sections;a printer configured to receive the identifying data and print, after the one or more tissue sections are cut from the tissue block, one or more labels for the one or more slides, the one or more labels comprising information associating the one more tissue sections on the one or more slides with the tissue block; anda visualization system configured to track the one or more tissue sections from the microtome to the one or more slides as the one or more tissue sections are being transferred from the microtome to the one or more slides.2. The system of claim 1 , wherein the visualization system is configured to make a comparison between the one or more tissue sections on the one or more slides with one or more images of the tissue block or the image of the section on a transfer medium.3. The system of claim 2 , wherein the visualization system is configured to make a comparison between the one or more tissue sections on the one or more slides claim 2 , on the tissue block or the transfer medium with a ...

Vision sensor system, control method, and non-transitory computer readable storage medium

On the basis of a measured shape, which is a three-dimensional shape of a subject measured by means of a measuring unit using an image captured when an image capturing unit is disposed in a first position and a first attitude, a movement control unit determines a second position and a second attitude for capturing an image of the subject again, and sends an instruction to a movement mechanism. The three-dimensional shape is represented by means of height information from a reference surface. The movement control unit extracts, from the measured shape, a deficient region having deficient height information, and determines the second position and the second attitude on the basis of the height information around the deficient region of the measured shape. The position and attitude of the image capturing unit can be determined in such a way as to make it easy to eliminate the effects of shadows.

Visual Depth Measurement Gage

Systems and methods for depth measurement are described herein. A depth measurement device may comprise a first light source configured to direct a first beam of light, a second light source configured to direct a second beam of light, and a mirror. The mirror may be for viewing at least one of the first beam of light and the second beam of light. The depth measurement device may further comprise a housing. The depth measurement device may further comprise an eyepiece. The first beam of light and the second beam of light may be configured to intersect at a desired location. The eyepiece may be configured to maintain a consistent line-of-sight between the eyepiece, the mirror, and the desired location. In various embodiments, the second beam of light may be oriented at an acute angle with respect to the first beam of light. 1. A depth measurement device comprising:a first light source configured to direct a first beam of light;a second light source configured to direct a second beam of light; anda mirror for viewing at least one of the first beam of light and the second beam of light.2. The depth measurement device of claim 1 , wherein the second beam of light is oriented at an acute angle with respect to the first beam of light.3. The depth measurement device of claim 1 , further comprising a housing and an eyepiece coupled to the housing.4. The depth measurement device of claim 3 , wherein the first beam of light and the second beam of light are configured to intersect at a desired distance from the housing.5. The depth measurement device of claim 4 , wherein the desired distance corresponds to a distance between the housing and an internal feature.6. The depth measurement device of claim 5 , wherein at least one of the internal feature claim 5 , the first beam of light claim 5 , or the second beam of light are viewable through the eyepiece via the mirror.7. The depth measurement device of claim 5 , wherein the depth measurement device is configured to indicate ...

DYNAMIC STRUCTURED LIGHT FOR DEPTH SENSING SYSTEMS BASED ON CONTRAST IN A LOCAL AREA

A depth camera assembly (DCA) determines depth information. The DCA projects a dynamic structured light pattern into a local area and captures images including a portion of the dynamic structured light pattern. The DCA determines regions of interest in which it may be beneficial to increase or decrease an amount of texture added to the region of interest using the dynamic structured light pattern. For example, the DCA may identify the regions of interest based on contrast values calculated using a contrast algorithm, or based on the parameters received from a mapping server including a virtual model of the local area. The DCA may selectively increase or decrease an amount of texture added by the dynamic structured light pattern in portions of the local area. By selectively controlling portions of the dynamic structured light pattern, the DCA may decrease power consumption and/or increase the accuracy of depth sensing measurements. 1. A depth camera assembly (DCA) comprising:a structured light (SL) projector configured to project one or more SL patterns into a local area in accordance with illumination instructions;a camera assembly configured to capture images of a portion of the local area including the one or more SL patterns; and provide first illumination instructions to the SL projector, wherein the first illumination instructions cause the SL projector to project a first SL pattern having a first pattern element density into a first region of interest based on a first amount of contrast in the first region of interest; and', 'provide second illumination instructions to the SL projector, wherein the second illumination instructions cause the SL projector to project a second SL pattern having a second pattern element density into a second region of interest based on a second amount of contrast in the second region of interest, wherein the second amount of contrast is greater than the first amount of contrast., 'a controller configured to2. The DCA of claim 1 , ...

TREAD LINE SCANNER

A device for measuring tread depth of tyres, wherein in use a tyre can be driven over the device in a first direction, the device comprising: a light source arranged to illuminate the tyre; an obstruction extending in a second direction substantially perpendicular to the first direction and arranged to partially block the light emitted from the light source such that a shadow is cast on the tyre when the tyre is located above the device, and such that the shadow is cast on the tyre in a direction substantially perpendicular to the tread of the tyre; and a camera arranged to view an illuminated section of the tyre. 1. A device for measuring tread depth of tyres ,wherein in use a tyre can be driven over the device in a first direction, a light source arranged to illuminate the tyre;', 'an obstruction extending in a second direction substantially perpendicular to the first direction and arranged to partially block the light emitted from the light source such that a shadow is cast on the tyre when the tyre is located above the device, and such that the shadow is cast on the tyre in a direction substantially perpendicular to the tread of the tyre; and', 'a camera arranged to view an illuminated section of the tyre., 'the device comprising2. The device according to claim 1 , wherein the light source is linear and parallel to the obstruction.3. The device according to claim 2 , wherein the light source is a strip of LED lights.4. The device according to claim 1 , wherein the obstruction is substantially linear.5. The device according to claim 1 , further comprising reflective optical elements arranged to direct light reflected from the tyre onto the camera.6. The device according to claim 5 , wherein the reflective optical elements include a mirror having a parabolic shape in the direction parallel to the obstruction.7. The device according to claim 5 , wherein the reflective optical elements comprise one or more flat minors to direct the reflected light towards the camera ...

Time-To-Digital Converter Circuit and Method for Single-Photon Avalanche Diode Based Depth Sensing

A self-calibration time-to-digital converter (TDC) integrated circuit for single-photon avalanche diode (SPAD) based depth sensing is disclosed. The circuit includes a SPAD matrix with a plurality of SPAD pixels arranged in m rows and n columns, the SPAD pixels in each column of SPAD pixels are connected by a column bus; a global DLL unit with n buffers and n clock signals; and an image signal processing unit for receiving image signals from the column TDC array. The circuit can also include a row control unit configured to enable one SPAD pixel in each row for a transmitting signal; a circular n-way multiplexer for circularly multiplexing n clock signals in the global DLL unit; a column TDC array with n TDCs, each TDC further comprises a counter and a latch, the latch of each TDC is connected to the circular n-way multiplexer for circular multiplexing. 1. A self-calibration time-to-digital converter (TDC) integrated circuit for single-photon avalanche diode (SPAD) based depth sensing , the circuit comprising:a SPAD matrix with a plurality of SPAD pixels arranged in m rows and n columns, wherein the SPAD pixels in each column of SPAD pixels are connected by a column bus;a global delay-locked loop (DLL) unit with n buffers and n clock signals; andan image signal processing unit for receiving image signals from the column TDC array.2. The circuit of claim 1 , wherein the circuit further comprises:a row control unit configured to enable one SPAD pixel in each row for a transmitting signal.3. The circuit of claim 2 , wherein the circuit further comprises:a circular n-way multiplexer for circularly multiplexing n clock signals in the global DLL unit.4. The circuit of claim 3 , wherein the circuit further comprises:a column TDC array with n TDCs, wherein each TDC further comprises a counter and a latch, wherein the latch of each TDC is connected to the circular n-way multiplexer for circular multiplexing.5. The circuit of claim 4 , wherein the SPAD matrix is implemented ...

METHOD OF MEASURING DEPTH OF DEFECTS IN LARGE-SCALE WIND TURBINE BLADE USING INFRARED THERMOGRAPHY

The invention relates to the technical field of operation and maintenance of wind turbines, and is also applicable to non-destructive measurement of a depth of a defect of other resin-based composite materials. It is aimed at the problem that the depth of the defect cannot be determined by an intuitive infrared thermal image in the measurement of a depth of a defect of a large wind turbine blade. This method not only ensures accuracy of the measurement, but can also be widely applied. The method comprises the following steps: S1: continuously heating a surface of a wind turbine blade with an irradiation heat source; S2: collecting and storing a real-time heat map sequence of a surface of the blade with an NEC R300 infrared thermal imaging camera; S3: extracting a surface temperature rise curve at a defect location and organizing the results into a temperature rise curve family of the layers in a depth direction at the defect location; S4: extracting a surface temperature rise curve at a non-defect location, and calculating the similarity between the two temperature rise curve families; S5-S7: obtaining a reference depth value of the defect; and S8: determining whether the depth value is in a characteristic interval. 2. The method of measuring a depth of an internal defect of a large-scale wind turbine blade using infrared thermography according to claim 1 , characterized in that in step S1 claim 1 , a heating device used for heating is a halogen lamp or a heating device for continuous irradiation.3. The method of measuring a depth of an internal defect of a large-scale wind turbine blade using infrared thermography according to claim 1 , characterized in that the detecting parameter β can be automatically adapted to changes of a detection object.4. The method of measuring a depth of an internal defect of a large-scale wind turbine blade using infrared thermography according to claim 1 , characterized in that the detection process S2-S8 occurs during the heating ...

IMAGE DEPTH CALCULATING DEVICE AND METHOD

An image depth calculating device, which can calculate depth information of a binocular video with reduced computation, includes multiple modules. Modules receives a first frame information set that corresponds to a first frame time of the binocular video and establishes a first rhombic area that centers on a first pixel in a first viewing angle frame, to calculate a total pixel value of the first rhombic area. Modules further establishes a plurality of second rhombic areas that center on a plurality of second pixels of a pixel area in a second viewing angle frame to calculate a second total pixel value of each of the plurality of second rhombic areas. A depth calculating module compares the first total pixel value with each second total pixel value and calculates first frame depth information according to the result. An image depth calculating method is also provided. 1. An image depth calculating method comprising:receiving a first frame information set that corresponds to a first frame time of a binocular video, the first frame information set comprising first view angle frame information and second view angle frame information;establishing a first rhombic area that centers on a first pixel of a first view angle frame;calculating a first total pixel value of the first rhombic area;establishing a pixel area in a second view angle frame according to a predetermined depth level and the first pixel, the pixel area comprising a plurality of second pixels, and establishing a plurality of second rhombic areas that center on each of the plurality of second pixels;calculating a second total pixel value of each of the plurality of second rhombic areas; andcomparing the first total pixel value with each of the second total pixel values, and calculating first frame depth information according to a result of the comparison;wherein the first rhombic area and each of the second rhombic areas have the same size and shape.2. The image depth calculating method of claim 1 , further ...

Endoscope Having Depth Determination

An endoscope for determining the depth of a partial area of a cavity by a triangulation analysis may include a projection channel for projecting a pattern onto a surface of the cavity and an imaging channel provided for imaging an image of the projected pattern reflected by the surface of the cavity. The projection channel may have at least one diffractive optical element for producing the pattern, a collimator, and a focusing lens. The focusing lens may be arranged between the collimator and the diffractive optical element. 1. An endoscope for determining the depth of a portion of a cavity by a triangulation calculation , the endoscope comprising:at least one projection channel that projects a pattern onto a surface of the cavity, andat least one imaging channel that images an image of the projected pattern reflected by the surface of the cavity, at least one diffractive optical element that generates the pattern,', 'a collimator, and', 'a focusing lens, and, 'wherein the projection channel compriseswherein the focusing lens is arranged between the collimator and the diffractive optical element.2. The endoscope of claim 1 , wherein the diffractive optical element claim 1 , the collimator claim 1 , and the focusing lens are arranged in a portion of the projection channel claim 1 , wherein the portion has an axial extent of at most 5 mm along a direction of an optical axis.3. The endoscope of wherein the collimator claim 1 , the focusing lens claim 1 , and the diffractive optical element are arranged in the projection channel in coaxial fashion with respect to an optical axis.4. The endoscope of claim 1 , wherein a cross-sectional area of the imaging channel is greater than a cross-sectional area of the projection channel.5. The endoscope of claim 4 , wherein the cross-sectional area of the projection channel is less than or equal to 2 mm.6. The endoscope of claim 4 , wherein the cross-sectional area of the imaging channel is greater than or equal to 2 mm.7. The ...

ESTABLISHING A WEAR STATE OF A CUTTING NOZZLE

Methods, systems, and devices for establishing a wear state of a cutting nozzle of a laser processing machine. An actual state of the cutting nozzle shape is established by a three-dimensional evaluation performed by a nozzle shape sensor and an associated controller. The established actual state of the cutting nozzle shape is compared to a desired state of the cutting nozzle shape, and the wear state of the cutting nozzle is established based on a result of the comparison. 1. A method of establishing a wear state of a cutting nozzle of a laser processing machine , the method comprising:establishing an actual state of the cutting nozzle shape by a three-dimensional evaluation performed by a nozzle shape sensor and an associated controller;comparing the established actual state of the cutting nozzle shape with a desired state of the cutting nozzle shape; andestablishing the wear state of the cutting nozzle based on a result of the comparison.2. The method of claim 1 , further comprising:recording digital data corresponding to the actual state of the cutting nozzle shape using the nozzle shape sensor; andperforming the three-dimensional evaluation based on the recorded digital data using the associated controller.3. The method of claim 1 , wherein comparing the established actual state of the cutting nozzle shape with a desired state of the cutting nozzle shape comprises:digitally comparing data representing the established actual state of the cutting nozzle shape with stored data representing the desired state of the cutting nozzle shape.4. The method of claim 1 , wherein the established actual state of the cutting nozzle shape includes a three-dimensional cutting nozzle shape containing depth information of the cutting nozzle.5. The method of claim 1 , wherein establishing the wear state of the cutting nozzle comprises establishing the wear state based on at least one of three-dimensional defect locations in cutting nozzle material claim 1 , three-dimensional ...

Facing and Quality Control in Microtomy

The present disclosure relates to systems and methods for facing a tissue block. In some embodiments, a method is provided for facing a tissue block that includes imaging a tissue block to generate imaging data of the tissue block, the tissue block comprising a tissue sample embedded in an embedding material, estimating, based on the imaging data, a depth profile of the tissue block, wherein the depth profile comprises a thickness of the embedding material to be removed to expose the tissue sample to a pre-determined criteria, and removing the thickness of the embedding material to expose the tissue to the pre-determined criteria. 1. A method for facing a tissue block comprising:imaging a tissue block to generate imaging data of the tissue block, the tissue block comprising a tissue sample embedded in an embedding material;estimating, based on the imaging data, a depth profile of the tissue block, wherein the depth profile comprises a thickness of the embedding material to be removed to expose the tissue sample to a predetermined criteria; andremoving the thickness of the embedding material to expose the tissue sample to the predetermined criteria,wherein the tissue block is imaged with a structured light to determine the depth profile.2. The method of claim 1 , further comprising:progressively removing one or more sections from a tissue block comprising a tissue sample embedded in an embedding material;imaging the one or more sections to generate imaging data associated with the one or more sections; andconfirming, based on the imaging data, that the tissue sample is exposed to the predetermined criteria.3. A method for facing a tissue block comprising:illuminating the tissue block with a structured light in a UV range;imaging the tissue block, prior to removing the one or more sections, to generate a baseline imaging data of the tissue sample progressively removing one or more sections from a tissue block comprising a tissue sample embedded in an embedding ...

METHOD FOR MEASURING A HIGH ACCURACY HEIGHT MAP OF A TEST SURFACE

Method for measuring a height map of a test, including measuring a coarse height map of the test surface with a pre-map sensor provided to an optical profiler with a relatively long working distance and/or a large field of view, storing the coarse height map in a memory, subdividing the coarse height map into sections appropriate for the field of view of a high resolution optical profiler sensor provided to the optical profiler, calculating corresponding X, Y and Z positions for the optical profiler sensor with respect to the test surface, calculating a trajectory in the X, Y, Z-direction for the optical profiler sensor with respect to the test surface using the calculated X, Y, Z-positions, moving the optical profiler in the X, Y, Z-direction with respect to the test surface according to the trajectory, and measuring a high accuracy height map with the high resolution optical profiler sensor. 1. A method for measuring a high accuracy height map of a test surface using a multi sensor optical profiler , the optical profiler including a low resolution pre-map sensor and a high resolution optical profiling sensor having a resolution higher than a resolution of the low resolution pre-map sensor , comprising:measuring a coarse height map of the test surface with the low resolution pre-map sensor at at least one of a working distance longer than a working distance of the high resolution optical profiling sensor and a field of view larger than a field of view of the high resolution optical profiling sensor;storing the coarse height map in a memory;subdividing the coarse height map into sections as appropriate for the field of view of the high resolution optical profiling sensor provided to the optical profiler;calculating corresponding X, Y and Z positions for the high resolution optical profiling sensor with respect to the test surface;calculating, using the calculated X Y Z positions, a trajectory in the X Y Z direction for the high resolution optical profiling sensor ...

TIME-OF-FLIGHT SENSOR AND METHOD OF MEASURING DISTANCE USING THE SAME

A method measures the distance between a time-of-flight (ToF) sensor and an object based on cross time shift. The ToF sensor includes at least one depth pixel and a light source to direct transmission light to an object. The depth pixel may have a multi-tap structure and may generate sampled data based on reception light and demodulation signals having different phases. The reception light corresponds to the transmission light reflected from the object. The method includes generating time shifts between the transmission light and demodulation signals, performing sampling operations to generate the sampled data corresponding to the time shifts, determining a cross time shift based on sampled data of a first reference tap substantially equaling sampled data of a second reference tap, and determining the distance between the ToF sensor and the object based on the cross time shift. 1. A method of measuring a distance using a time-of-flight (ToF) sensor , the ToF sensor including at least one depth pixel and a light source illuminating a transmission light to an object , the at least one depth pixel having a multi-tap structure including a plurality of taps to generate a plurality of sampled data based on a reception light and a plurality of demodulation signals having different phases , the transmission light being reflected from the object back to the ToF sensor as the reception light , the method comprising:generating a plurality of time shifts between the transmission light and a plurality of demodulation signals;performing a plurality of sampling operations to generate the plurality of sampled data corresponding to the plurality of time shifts;determining a cross time shift based on the plurality of sampled data corresponding to the plurality of time shifts, such that the sampled data of a first reference tap and a second reference tap among the plurality of taps become substantially equal to each other with respect to the cross time shift; anddetermining a distance ...

Defect Detection Device and Production System

Provided is a defect detection device capable of measuring the volume of surface defects. The defect detection device includes: an imaging device configured to image an image of an inspection object; a binarization processing unit configured to subject the image to first and second binarization processing by use of different first and second binarization thresholds, so as to calculate first and second sizes for an identical defect in the image; a ratio calculation unit configured to calculate a first ratio of the second size to the first size; and a depth determination unit configured to determine a depth of the defect depending on the first ratio. 1. A defect detection device comprising:a camera configured to image an image of an inspection object;a binarization processor configured to subject the image to first and second binarization processing by use of different first and second binarization thresholds, so as to calculate first and second sizes for an identical defect in the image;a ratio calculation processor configured to calculate a first ratio of the second size to the first size; anda depth determination processor configured to determine a depth of the defect depending on the first ratio.2. The defect detection device according to claim 1 , further comprising:a volume calculation processor configured to calculate a volume of the defect depending on the depth of the defect determined, and calculate a sum of volumes of all defects in the image; anda quality determination processor configured to determine whether the inspection object is fine or inferior according to the sum of the volumes of the all defects.3. The defect detection device according to claim 1 , wherein:the binarization processing processor subjects the image to third binarization processing by use of a third binarization threshold different from the first and second binarization thresholds, so as to calculate a third size for the identical defect in the image;the ratio calculation processor ...

SYSTEM FOR DIRECTLY MEASURING THE DEPTH OF A HIGH ASPECT RATIO ETCHED FEATURE ON A WAFER

A system () for directly measuring the depth of a high aspect ratio etched feature on a wafer () that includes an etched surface () and a non-etched surface (). The system () utilizes an infrared reflectometer () that in a preferred embodiment includes a swept laser (), a fiber circulator (), a photodetector () and a combination collimator () and an objective lens (). From the objective lens () a focused incident light () is produced that is applied to the non-etched surface () of the wafer (). From the wafer () is produced a reflected light () that is processed through the reflectometer () and applied to an ADC () where a corresponding digital data signal () is produced. The digital data signal () is applied to a computer () that, in combination with software (), measures the depth of the etched feature that is then viewed on a display (). 1. A system for directly measuring the depth of a high aspect ratio etched feature on a wafer having an etched surface and a non-etched surface , said system comprising:a) a reflectometer that is positioned to face the non-etched surface of the wafer, wherein said reflectometer having means for producing a focused incident light that is applied to the non-etched surface of the wafer, and means for receiving and processing a reflected light that is also applied from the non-etched surface of the wafer, wherein the output of said reflectometer is an analog spectrum optical frequency signal,b) an analog-to-digital (ADC) converter that converts the analog spectrum optical frequency signal to a corresponding digital data signal,c) a computer, that in combination with software, has means for processing the digital data signal applied from said ADC and to display the depth of the high aspect ratio etched surface of the wafer.2. The system as specified in wherein said reflectometer is comprised of an infrared reflectometer having on objective lens that produces a focused spot on the wafer.3. The system as specified in wherein said ...

Surface topography optical measuring system and surface topography optical measuring method

A surface topography optical measuring system including image capture modules, a control module and a computation module is provided. Each image capture module includes an electronically controlled focal length tunable lens, an optical assembly and an image sensor, wherein the image capture modules respectively capture images at different heights between a lowest and a highest surfaces of an object. The control module is coupled to the image capture modules to independently control the image capture modules. The computation module is coupled to the control module and the image sensor of each image capture module, wherein the computation module perform calibration of the surface topography optical measuring system and assesses in-focused pixels in the captured images to measure a height difference between a highest and a lowest surfaces of the object or between any surfaces of interest of the object. A surface topography optical measuring method is also provided.

COMPLEMENTARY METAL-OXIDE-SEMICONDUCTOR DEPTH SENSOR ELEMENT

A complementary metal-oxide-semiconductor depth sensor element having a photogate formed in a photosensitive area on a substrate. A first transfer gate and a second transfer gate are formed respectively on two sides of the photogate in intervals. A first floating doped area and a second floating doped area are formed respectively on the outer sides of the first transfer gate and the second transfer gate. A semiconductor area is formed on the substrate. A lightly doped region is formed on the semiconductor area. The photogate, the first and second transfer gates and the first and second floating doped area are commonly formed on the lightly doped region. With the lightly doped region, the linear performance that the majority carriers move in the photogate is also affected to achieve the purpose for increasing the reaction rate. 1. A depth sensor element comprising:a substrate comprising a photosensitive region;a semiconductor region formed on the substrate;a photogate formed on the semiconductor region, corresponding to the photosensitive region and having a first side and a second side; a first side; and', 'a second side adjacent to the first side of the photogate;, 'a first transfer gate formed on the semiconductor region and having'}a first gap formed between the second side of the first transfer gate and the first side of the photogate; a first side adjacent to the second side of the photogate; and', 'a second side;, 'a second transfer gate formed on the semiconductor region and having'}a second gap formed between the first side of the second transfer gate and the second side of the photogate;a lightly doped region formed on the semiconductor region, corresponding to the photosensitive region and being below the first and second transfer gates;a first floating doped region formed in the lightly doped region, connected to the first side of the first transfer gate and being as a first transmitting node; anda second floating doped region formed in the lightly doped ...

Coded access optical sensor

A method for performing high dynamic range optical image detection of a scene. The method comprises imaging incident light from a scene onto an object plane of an Optical Array Device, the OAD operating in time modulation mode; determining the locations of those pixels in the object plane of a first light level; detecting the optical irradiance values of those pixels of the first light level to produce a first detected image; detecting the optical irradiance values of those pixels of a second light level to produce a second detected image; and generating a high dynamic range optical irradiance map of the scene by combining the first detected image and the second detected image into a single image.

EMISSION SIGNAL VISUALIZATION DEVICE

An emission signal visualization device includes a front video camera for photographing a measured object from the front, a signal detecting sensor for detecting an emission signal generated from the measured object, a lateral video camera for photographing the signal detecting sensor from a lateral, a spectrum analyzer, and an analyzing body unit, and records and analyzes the state of the spatial distribution of signals detected by the signal detecting sensor. 1. An emission signal visualization device which acquires a signal generated from a measured object as a detection signal while moving a sensor in a rectangular parallelepiped measurement space with one surface stationarily facing a measured object and displays a signal level of the detection signal in a color on a display device , the emission signal visualization device comprising:a photographed image storage unit configured to store a photographed image acquired by photographing the measurement space for every given time;a three-dimensional memory that stores, in an analytical three-dimensional space model defined as a lattice-shaped mesh in which the measurement space is divided into a depth direction, a lateral width direction, and a height direction at respective given intervals, each section of the analytical three-dimensional space model in association with section management information including a three-dimensional coordinate of each section in the analytical three-dimensional space model, the detection signal, and a color value of a maximum signal level in the detection signal;a unit configured to display the photographed image stored in the photographed image storage unit on the display device;a unit configured to overlap and display a screen mesh frame constituted by screen sections associated with the section as a mesh frame for displaying an analytical result and the photographed image;a unit configured to sequentially specify the sections having a depth coordinate corresponding to a specified ...

DEVICE FOR MEASURING A SLAUGHTER ANIMAL BODY OBJECT

The invention relates to a device for measuring a slaughter animal body object, the device including an image camera having an image-camera recording region, a depth camera having a depth-camera recording region, and an evaluation unit. The cameras are positioned in relation to one another by a positioning device in such a manner that the camera recording regions of the image camera and of the depth camera overlap in a common camera recording region at least in certain sections. The evaluation unit is capable of identifying measurement points in the common camera recording region and determining the distances thereof from one another. 16-. (canceled)7. A device for measuring a slaughter animal body object , the device comprising:an image camera having an image-camera recording range for optically recording a section of a surface of a slaughter animal body object and for recording light intensity values of image points and area coordinates of the image points, the light intensity values and the area coordinates being provided as light intensity value data on the surface of the slaughter body for transfer purposes;an evaluation unit connected to said image camera, said evaluation unit registering the light intensity value data provided by the image camera and identifying measurement points on the surface of the slaughter body from the light intensity value data;a depth camera having a depth-camera recording range for optically recording the section of the surface of the slaughter animal body object and for recording space coordinates of image points within the depth-camera recording range, the space coordinates including area coordinates and a depth value, and the space coordinates being provided as space coordinate data for transfer purposes;a positioning unit for positioning said depth camera relative to said image camera, said positioning unit positioning said image camera and said depth camera in relation to one another to have the depth-camera recording range and ...

DEVICE FOR VOLUMETRICALLY MEASURING A SLAUGHTER ANIMAL BODY OBJECT

The invention relates to an apparatus for volumetrically measuring an object in the body of an animal for slaughter. The apparatus has a first depth camera with a first depth camera recording area, a second depth camera with a second depth camera recording area and has a positioning apparatus for positioning the depth cameras relative to one another. The apparatus has an evaluation unit. The evaluation unit is connected to the depth cameras, and acquires the spatial coordinate data provided by the depth cameras. The spatial coordinate data from the depth cameras can be combined as combined spatial coordinate data in a common spatial coordinate system. A surface model of the object in the body of an animal for slaughter is provided from the combined spatial coordinate data, and a volume of the object in the body of an animal for slaughter is calculated from the surface model. 110-. (canceled)11. A device for volumetrically measuring a slaughter animal body object , comprising:a first depth camera having a first depth-camera recording range for optically recording a section of a surface of the slaughter animal body object on a first side and for recording space coordinates of image points on the first side of the slaughter animal body object, the space coordinates including area coordinates and a depth value, and the space coordinates being provided as space coordinate data for transfer purposes;a second depth camera having a second depth-camera recording range for optically recording a second section of a second surface of the slaughter animal body object on a second side and for recording second space coordinates of second image points on the second side of the slaughter animal body object, the second space coordinates including second area coordinates and a second depth value, and the second space coordinates being provided as second space coordinate data for transfer purposes;a positioning device for positioning the first depth camera relative to the second depth ...

FACE AUTHENTICATION DEVICE AND FACE AUTHENTICATION METHOD

A face authentication device includes a three-dimensional face information storage part storing at least one three-dimensional face information, an imaging optical system for forming an optical image containing a face of an authentication target, an image sensor for photographing the optical image of the authentication target to obtain two-dimensional image data and image plane phase differential information of the face of the authentication target and a face authentication processing part for performing a three-dimensional face authentication for the authentication target by collating the face of the authentication target with the three-dimensional face information stored in the three-dimensional face information storage part based on the two-dimensional image data and the image plane phase differential information obtained by the image sensor. 1. A face authentication device , comprising:a three-dimensional face information storage part storing at least one three-dimensional face information;an imaging optical system for forming an optical image containing a face of an authentication target;an image sensor for photographing the optical image of the authentication target to obtain two-dimensional image data and imaging plane phase differential information of the face of the authentication target; anda face authentication processing part for performing a three-dimensional face authentication for the authentication target by collating the face of the authentication target with the three-dimensional face information stored in the three-dimensional face information storage part based on the two-dimensional image data and the imaging plane phase differential information obtained by the image sensor.2. The face authentication device as claimed in claim 1 , wherein the face authentication processing part further performs a two-dimensional face authentication for the authentication target by using the two-dimensional image data of the face of the authentication target and ...

IMAGING DEVICE ASSEMBLY, THREE-DIMENSIONAL SHAPE MEASURING DEVICE, AND MOTION DETECTING DEVICE

An imaging device assembly includes a light source, an imaging device formed with a plurality of imaging elements, and a control device. Each imaging element () includes a light receiving portion (), a first charge storage portion () and a second charge storage portion (), and a first charge transfer control means () and a second charge transfer control means (). Under the control of the control device, the imaging element () captures an image of an object on the basis of high-intensity light and stores first image signal charge into the first charge storage portion () during a first period, and captures an image of the object on the basis of low-intensity light and stores second image signal charge into the second charge storage portion () during a second period. The control device obtains an image signal on the basis of the difference between the first image signal charge and the second image signal charge. 1. An imaging device assembly comprising:a light source that illuminates an object;an imaging device; anda control device that controls the light source and the imaging device,whereinthe imaging device includes a plurality of imaging elements,each imaging element includes:a light receiving portion;a first charge storage portion and a second charge storage portion; anda first charge transfer control means that controls, under control of the control device, transfer of electric charge stored in the light receiving portion to the first charge storage portion, and a second charge transfer control means that controls, under control of the control device, transfer of electric charge stored in the light receiving portion to the second charge storage portion,the imaging device assembly is operated in a first operation mode,in the first operation mode,during a first period, the imaging element under control of the control device captures an image of the object on a basis of high-intensity light emitted from the light source and stores first image signal charge obtained ...

Measuring Depth Of A Surface Of A Test Object

A method for measuring the depth of a surface of a test object may include projecting a colored fringe pattern formed by a sequence of colored fringes onto a surface of the test object, and detecting and evaluating a fringe pattern reflected by the surface of the test object using an evaluation device. The colored fringe pattern and the evaluation device may be designed such that the depth of the surface of the test object is measured based on the sequence of colored fringes of the reflected fringe pattern and based on a sequence of fringe widths of the reflected fringe pattern. 1. A method for depth determination of a surface of a test object , the method comprising:projecting a colored fringe pattern formed from a sequence of colored fringes onto a surface of the test object,capturing, by an evaluation apparatus, a fringe pattern reflected by the surface of the test object,evaluating, by the evaluation apparatus, the reflected fringe pattern to determine a depth of the surface of the test object based at least on:(a) the sequence of colored fringes of the reflected fringe pattern, and(b) a sequence of determined widths of the fringes of the reflected fringe pattern.2. The method of claim 1 , wherein the colored fringe pattern is formed from at least one of (a) the primary colors red claim 1 , green claim 1 , and blue claim 1 , (b) mixed colors of the primary colors red claim 1 , green claim 1 , and blue claim 1 , or black.34. The method of claim 2 , comprising determining the sequence of the widths of the fringes of the reflected fringe pattern based on the extinction of at least one primary color of the colored fringe pattern().4. The method of claim 3 , wherein the sequence of the colored fringes of the colored fringe pattern is derived from a previously known sequence of the widths of the fringes of the reflected fringe pattern such that the previously known sequence of the widths of the fringes is produced by the extinction of at least one primary color from ...

TREAD DEPTH MEASURING SYSTEM

An tread depth measuring system includes a tread measuring apparatus, a processor, a supporter, and a warning apparatus. The tread measuring apparatus is positioned on the ground and configured to measure a tread depth. The processor is coupled to the tread measuring apparatus and configured to compare the tread depth measured by the tread measuring apparatus with a preset critical depth. The supporter stands on the ground. The warning apparatus is supported by the supporter and coupled to the processor. When the tread depth measured by the tread measuring apparatus is less than the preset critical depth, the processor sends a control signal to actuate the warning apparatus. 1. A tread depth measuring system comprising:a tread measuring apparatus positioned on the ground and configured to measure a tread depth;a memory pre-storing a preset critical depth;a processor coupled to the tread measuring apparatus and the memory, and configured to compare the tread depth measured by the tread measuring apparatus with the preset critical depth;a supporter standing on the ground; anda warning apparatus supported by the supporter and coupled to the processor,wherein, when the tread depth measured by the tread measuring apparatus is less than the preset critical depth, the processor sends a first control signal to actuate the warning apparatus.2. The tread depth measuring system of claim 1 , wherein the warning apparatus comprises a signal light coupled to supporter claim 1 , when the tread depth measured by the tread measuring apparatus is less than the preset critical depth claim 1 , the processor sends the first control signal to actuate the signal light.3. The tread depth measuring system of claim 2 , wherein when the tread depth measured by the tread measuring apparatus is less than the preset critical depth claim 2 , the signal light turns red claim 2 , and the preset critical depth is 1.6 mm.4. The tread depth measuring system of claim 1 , wherein the warning apparatus ...

System and method for analyzing tire tread parameters

Systems and methods for analyzing tire tread data to assess tire tread parameters, such as irregular wear characteristics of a tire tread, are provided. More particularly, an automated and robust flattening process c be performed to transform tire tread data, such as a tread surface map, into flattened tire tread data. The flattened tire tread data can provide tread heights defined in a measurement direction that is normal to the surface of the tire tread, as opposed to parallel to a radial axis of the tire. The flattened tread data can be analyzed to assess one or more parameters of the tread of the tire. For instance, local height indicators for the flattened tread data can be determined using a local maximum as a reference. Because the local height indicators are relative heights determined from a local maximum, quantification of tread depth can be more easily obtained.

METHOD AND SYSTEM FOR MEASURING OUTERMOST DIMENSION OF A VEHICLE POSITIONED AT AN INSPECTION STATION

Method and system for measuring outermost dimensions of a vehicle positioned at an inspection station and having top, front, back and side exterior surfaces are provided. The system includes a plurality of 3-D or depth sensors supported around and above the vehicle at the inspection station. Each of the sensors has a field of view so that one of the exterior surfaces of the vehicle is in one of the fields of view. Each sensor includes a set of radiation sensing elements which detect projected radiation reflected from its exterior surface to obtain sensor data. At least one processor processes the sensor data from each of the sensors to obtain a virtual 3-D model of the vehicle. Control logic is employed to obtain measurements of outermost dimensions of the vehicle based on the 3-D model. 1. A method of measuring outermost dimensions of a vehicle positioned at an inspection station and having top , front , back and side exterior surfaces , the method comprising: projecting radiation onto the exterior surface to obtain reflected radiation;', 'sensing at least a portion of the reflected radiation to obtain an image; and', 'imaging and detecting beams of radiation reflected from the exterior surface to obtain an image of the reflected beams; and, 'for each of the exterior surfaces of the vehicleprocessing the images of the reflected radiation and the reflected beams for each exterior surface to obtain measurements of the outermost dimensions of the vehicle.2. The method as claimed in claim 1 , further comprising determining if the vehicle has been illegally modified based on the measurements.3. The method as claimed in claim 1 , wherein the projected radiation has a known pattern and wherein each known pattern of radiation is non-visible light.4. The method as claimed in claim 1 , wherein the image of the reflected beams is a color image.5. The method as claimed in claim 3 , wherein the non-visible light is near-infrared or near-ultraviolet light.6. A system for ...

LASER WELDING METHOD, AND LASER WELDING DEVICE

A plurality of values measured are relatively compared to determine an optical axis deviation direction in which an optical axis of a measurement beam deviates from a laser beam. Then, a first parallel plate and a second parallel plate are rotated to move an irradiation position of the measurement beam so that an optical axis of the measurement beam is substantially coaxial with an optical axis of the laser beam. 1. A laser welding method for welding a weld portion by using a laser beam , the method comprising:emitting, to the weld portion, the laser beam and a measurement beam coaxially aligned with the laser beam, the measurement beam having a wavelength different from a wavelength of the laser beam;measuring a penetration depth of the weld portion in accordance with the measurement beam reflected on the weld portion during the laser welding;determining an optical axis deviation direction in which an optical axis of the measurement beam deviates from the laser beam, by relatively comparing a plurality of values measured; andcorrecting an irradiation position of the measurement beam so that the irradiation position moves into a predetermined area centered at an optical axis of the laser beam.2. The laser welding method of claim 1 , whereinin the correcting of the irradiation position of the measurement beam, the irradiation position of the measurement beam is corrected so as to move to a rear side, in a welding direction, of a center of the optical axis of the laser beam.3. The laser welding method of claim 1 , whereinin the correcting of the irradiation position, a parallel plate arranged on an optical path of the measurement beam is rotated to correct the irradiation position of the measurement beam.4. The laser welding method of claim 1 , further comprising:adjusting the irradiation position of the measurement beam during the laser welding so that the irradiation position of the measurement beam moves around a rotation center that moves on a predetermined ...

Method for determining the tread depth of a vehicle pneumatic tire

A method for determining the profile depth of a tread of a pneumatic vehicle tire wherein the tread has a wear indicator. The wear indicator has an incision extending in the radial direction of the tire. The incision has a length visible on the tread and the length becomes shorter as wear increases. The wear indicator has two reference marks at a distance from each other. The distance is configured to remain constant and visible throughout the tread wear. A photo of the incision and the reference marks is generated via an application program of a mobile phone having a camera and an image screen. A current profile depth is calculated from the distance of the reference marks and the length of the incision via the application program. The current profile depth and/or a remaining profile depth are displayed until a minimal profile depth is reached on the screen.

ELECTROMAGNETIC WAVE DETECTION APPARATUS, PROGRAM, AND ELECTROMAGNETIC WAVE DETECTION SYSTEM

An electromagnetic wave detection apparatus () includes an irradiator (), a first detector (), a propagation unit (), a memory (), and a controller (). The irradiator () irradiates electromagnetic waves. The first detector () detects reflected waves of the electromagnetic waves irradiated onto an object (ob). The propagation unit () includes propagation elements (px). By irradiation position of the electromagnetic waves irradiated onto the object (ob), the propagation elements (px) switch between propagating and not propagating the reflected waves of the electromagnetic waves towards the first detector (). The memory () stores related information. The controller () updates the related information based on the position of the propagation element (px) that is propagating the reflected waves toward the first detector () when the first detector () detects the reflected waves. 1. An electromagnetic wave detection apparatus comprising:an irradiator configured to emit electromagnetic waves;a first detector configured to detect reflected waves of the electromagnetic waves irradiated onto an object;a propagation unit comprising a plurality of propagation elements that, by irradiation position of the electromagnetic waves irradiated onto the object, switch between propagating and not propagating the reflected waves of the electromagnetic waves towards the first detector;a memory configured to store related information associating an emission direction of the electromagnetic waves from the irradiator and two elements defining two points on a path of the electromagnetic waves emitted from the irradiator to at least the propagation unit via the object; anda controller configured to update the related information based on a position of a propagation element that is propagating the reflected waves towards the first detector when the first detector detects the reflected waves.2. The electromagnetic wave detection apparatus of claim 1 ,wherein the related information comprises first ...

META PROJECTOR AND ELECTRONIC APPARATUS INCLUDING THE SAME

A meta projector includes an edge emitting device configured to emit light through a side surface thereof, a meta-structure layer spaced apart from the upper surface of the edge emitting device that includes a plurality of nanostructures having a sub-wavelength shape dimension smaller than a wavelength of the light emitted from the edge emitting device, and a path changing member configured to change a path of the light emitted from the edge emitting device so as to direct the path toward the meta-structure layer. The meta projector may thus be configured to emit a light pattern of structured light, based on directing the light emitted from the edge emitting device through the meta-structure layer, while having a relatively compact device size. 1. A meta projector comprising:a substrate;an edge emitting device on the substrate, the edge emitting device including an upper surface extending parallel to the substrate and a side surface inclined relative to the upper surface, the edge emitting device configured to emit light through the side surface;a meta-structure layer spaced apart from the upper surface of the edge emitting device, the meta-structure layer including a plurality of nanostructures having a sub-wavelength shape dimension, the sub-wavelength shape dimension smaller than a wavelength of the light emitted from the edge emitting device; anda path changing member configured to change a path of the light emitted from the edge emitting device to direct the path toward the meta-structure layer.2. The meta projector of claim 1 , further comprising:a housing fixing the substrate, the meta-structure layer, and the path changing member, such that the meta projector is an integrated module.3. The meta projector of claim 1 , wherein the substrate includesa cathode and an anode respectively connected to two electrodes of the edge emitting device; andan insulating layer electrically isolating the cathode and the anode from each other.4. The meta projector of claim 1 , ...

Methods and Systems for Characterizing Laser Machining Properties by Measuring Keyhole Dynamics Using Interferometry

A method, apparatus, and system are provided to monitor and characterize the dynamics of a phase change region (PCR) created during laser welding, specifically keyhole welding, and other material modification processes, using low-coherence interferometry. By directing a measurement beam to multiple locations within and overlapping with the PCR, the system, apparatus, and method are used to determine, in real time, spatial and temporal characteristics of the weld such as keyhole depth, length, width, shape and whether the keyhole is unstable, closes or collapses. This information is important in determining the quality and material properties of a completed finished weld. It can also be used with feedback to modify the material modification process in real time. 1. An apparatus comprising:an imaging optical source that produces imaging light that is applied to a material processing system, wherein the material processing system implements a material modification process and creates a phase change region (PCR) in a material;at least one element that directs the imaging light at a plurality of imaging beam positions proximate the PCR;at least one input-output port that outputs a first component of the imaging light to an optical access port of the material processing system and that receives a reflection component of the imaging light;an optical combiner that combines the reflection component and at least another component of the imaging light to produce an interferometry output, the interferometry output based on a path length taken by the first component and the reflection component compared to a path length taken by the at least another component of the imaging light; andan interferometry output processor that processes the interferometry output to determine at least one characteristic of the PCR.2. The apparatus of claim 1 , further comprising a material processing beam source that produces a material processing beam that is applied to the material in the material ...

System for acquiring correspondence between light rays of transparent object

The present disclosure relates to a system for acquiring a correspondence between light rays of a transparent object. The system includes a camera device, a display device, a turntable and a control device; the camera device, the display device and the turntable are electrically connected with the control device respectively; the turntable is configured to rotate a transparent object; the control device is configured to acquire images corresponding to display device in the first preset position, which are photographed by the camera device through the transparent object at different rotation angles, to obtain a primary image set; acquire images corresponding to the display device in the second preset position, which are photographed by the camera device through the transparent object at different rotation angles, to obtain a secondary image set; and obtain the correspondence between light rays of the transparent object from different viewing angles.

Depth calculation device, imaging apparatus, and depth calculation method

A depth calculation device for calculating depth information on an object from captured first image and second image with different blur, the depth calculation device comprising: an extraction unit configured to extract a first frequency component and a second frequency component from each of the first image and the second image, the first frequency component being a component of a first frequency band, the second frequency component being a component of a second frequency band, the second frequency band being lower than the first frequency band; and a depth calculation unit configured to calculate the depth information from the frequency components extracted by the extraction unit.

Fluorescent Dye Loaded Polymeric Taggants for Depth Determination in Drilling Wells

A method of surface logging a well includes adding each of multiple polymeric taggants to a circulating drilling fluid in an addition sequence while drilling the well. Each polymeric taggant includes a polymer and a respective fluorescent dye having an emission wavelength or excitation wavelength different from that of each other fluorescent dye. The method includes taking a sample of drill cuttings carried by a drilling fluid while drilling a well, wherein the sample of drill cuttings includes polymeric taggants attached to the drill cuttings. The method includes extracting the dyes from the sample of drill cuttings into an extract solution; determining an indication of the type of and the concentration of each of the dyes in the extract solution; and determining a depth associated with the sample of drill cuttings based on the indication of the concentration of each of the dyes and on the addition sequence. 1. A method of surface logging a well , the method comprising:adding each of multiple polymeric taggants to a circulating drilling fluid in an addition sequence while drilling the well, wherein each polymeric taggant comprises a polymer and a respective fluorescent dye, wherein each fluorescent dye has an emission wavelength different from the emission wavelength of each other fluorescent dye, an excitation wavelength different from the excitation wavelength of each other fluorescent dye, or both;taking a sample of drill cuttings carried by a drilling fluid while drilling a well in the presence of the drilling fluid, wherein the sample of drill cuttings includes polymeric taggants attached to the drill cuttings;extracting the dyes from the sample of drill cuttings into an extract solution;determining an indication of the type of and the concentration of each of the dyes in the extract solution; anddetermining a depth associated with the sample of drill cuttings based on the indication of the concentration of each of the dyes and on the addition sequence.2. The ...

DEVICE AND METHOD FOR DETERMINING DEPTH AND CONCENTRATION OF A SUBSURFACE FLUORESCENT OBJECT

A method and device for determining the depth and fluorophore concentration of a fluorophore concentration below the surface of an optically absorbing and scattering medium suitable for use in fluorescence-based surgical guidance such as in tumor resection is described. Long-wavelength stimulus light us used to obtain deep tissue penetration. Recovery of depth is performed by fitting measured modulation amplitudes for each spatial frequency to precomputed modulation amplitudes in a table of modulation amplitudes indexed by optical parameters and depth. 1. A device for quantifying and determining depth of concentrations of fluorophores in a turbid medium comprising:an excitation-wavelength light source configurable to excite the fluorophores in the medium using a spatially-modulated light pattern, the spatially-modulated light pattern selectable from a plurality of light patterns with spatial frequencies between 0.2 and 1 lines per millimeter;an optical element configured to transfer light from the turbid medium to an imaging subsystem;the imaging subsystem comprising at least one filter insertable into a light path from the turbid medium to an electronic camera to reject light at the excitation wavelength; andat least one computer configured to control the spatially-modulated light pattern, to capture diffusely-reflected images and fluorescence emission images using the electronic camera, and configured with machine readable instructions to determine a depth of the concentration of fluorophore and determine a concentration of the fluorophore for pixels of the diffusely-reflected and fluorescence emission images; andapparatus configured to display the fluorophore concentration depth and concentration.2. The device of wherein the machine readable instructions to determine a depth of the concentration of fluorophore are configured for a method comprising:extracting measured modulated amplitude at the plurality of spatial frequencies for pixel regions in the fluorescent ...

UNIVERSAL DIRECT MEASUREMENT DEPTH GAUGE

A depth gauge device including a body extending a central longitudinal axis and including a channel and a light-passing hole, the light passing hole open to the channel, a light source mounted in the body for generating a light beam, the light beam passing through the light-passing hole toward a surface of a drill-bit extending through the channel, the light beam forming an incident light beam when reflected away from the drill-bit surface, an image sensor mounted in the body for sensing the incident light beam and generating a plurality of successive images of the drill-bit surface to detect variations in the position of the drill-bit moving through the channel and an clamp coupled to the body, the clamp including a plurality of adjustable arms configured to clamp the device to a protection sleeve. 1. A depth gauge device , comprising:a body extending a central longitudinal axis and including a channel and a light-passing hole, the light passing hole open to the channel;a light source mounted in the body for generating a first light beam, the first light beam passing through the light-passing hole toward a surface of a drill-bit extending through the channel, the first light beam forming an incident light beam when reflected away from the drill-bit surface;an image sensor mounted in the body for sensing the incident light beam and generating a plurality of successive images of the drill-bit surface to detect variations in the position of the drill-bit moving through the channel; anda clamp coupled to the body, the clamp including a plurality of adjustable arms configured to clamp the device to a protection sleeve.2. The device of claim 1 , wherein the clamp further comprises a rotatable clamp adjustment mechanism claim 1 , wherein rotating the adjustment mechanism in a first direction moves the plurality of arms toward the central longitudinal axis and rotating the adjustment mechanism in a second direction moves the plurality of arms away from the central ...

Method for Optically Measuring the Weld Penetration Depth

Embodiments pertain measuring the weld penetration depth, particularly in welding, drilling or machining processes carried out by means of a working laser beam, wherein a measurement light beam of a sensor system is coupled into a processing beam path of the working laser beam in a laser machining head and bundled or focused into a measurement light spot on the surface of a workpiece by means of focusing optics of the processing beam path. The measurement light beam reflected on the surface of the workpiece is then returned to a measurement and evaluation unit of the sensor system in order to obtain information on the distance of the surface of the workpiece from the laser machining head. In order to obtain a surface profile of the workpiece in the region of the vapor capillary, from which the position of the vapor capillary relative to the point of incidence of the working laser beam can be determined, the position of the measurement light spot on the surface of the workpiece is guided over the vapor capillary in the welding direction, as well as transverse to the welding direction. The measurement light spot is during the subsequent laser machining process moved into the determined position of the vapor capillary in order to measure the weld penetration depth. 1. A method for measuring the weld penetration depth , particularly in welding , drilling or machining processes carried out by means of a working laser beam , whereina measurement light beam of a sensor system is coupled into a processing beam path of the working laser beam in a laser machining head and bundled or focused into a measurement light spot on the surface of a workpiece by means of focusing optics of the processing beam path,the measurement light beam reflected on the surface of the workpiece is returned to a measurement and evaluation unit of the sensor system in order to obtain information on the distance of the surface of the workpiece from the laser machining head,the position of the ...

METHOD OF MONITORING A SURFACE FEATURE AND APPARATUS THEREFOR

Dimensions of a surface feature are determined by capturing an image of the surface feature and determining a scale associated with the image. Structured light may be projected onto the surface, such that the position of structured light in the captured image allows determination of scale. A non-planar surface may be unwrapped. The surface may alternatively be projected into a plane to correct for the scene being tilted with respect to the camera axis. A border of the surface feature may be input manually by a user. An apparatus and system for implementing the method are also disclosed. 130-. (canceled)31. A method for determining the area of an anatomical surface feature , the method comprising:capturing an image of the anatomical surface feature;displaying the image of the anatomical surface feature to a user via a display;creating an outline of the anatomical surface feature on the display;enabling the user to adjust the outline manually by selecting and moving a portion of the outline to change the position of the portion relative to the image of the anatomical surface feature, thereby creating a revised outline of the anatomical surface feature; anddetermining the area of the anatomical surface feature based on the outline or the revised outline.32. The method of wherein creating the outline includes enabling the user to trace at least a portion of the outline.33. The method of wherein the display is a touch screen claim 31 , and wherein creating the outline includes enabling the user to trace at least a portion of the outline on the touch screen while the image of the anatomical surface feature is displayed.34. The method of ; further comprising determining a perimeter measurement of the anatomical surface feature based on the outline or the revised outline.35. The method of wherein the outline is created automatically.36. The method of wherein creating the outline includes using image processing techniques.37. The method of wherein the method further ...

Food Waste Detection Method and System

A system () for detecting food related products () before thrown away, the system comprising: one or more cameras (); a display unit (); a computing device () that is communicatively connected to the cameras and the display; and a scale () that is communicatively connected to the computing device, the scale holding a trash bin (), wherein the cameras obtain an image or a video of the products when the products are within a field of view of the cameras and before the products are in the trash bin, the scale configured to weigh the products in the trash bin, and wherein the computing device obtains information about the products from the obtained image or video by applying an image recognition algorithm, receives the weight from the scale and generates and outputs data on the display unit, the data being based on the information about products and the weight. 1. A system for detecting food related products before being thrown away , the system comprising:one or more cameras;a display unit;a computing device that is communicatively connected to the one or more cameras and the display unit; anda scale that is communicatively connected to the computing device, wherein the scale is configured to hold a trash bin,wherein the one or more cameras are configured to obtain an image or a video of the food related products when the food related products are within a field of view of the one or more cameras and before the food related products are in the trash bin,wherein the scale is configured to obtain weight information of the food related products when the food related products are in the trash bin, and{'claim-text': ['obtain information about the food related products from the obtained image or video by applying an image recognition algorithm;', 'receive the weight information from the scale; and', 'generate and output data on the display unit, wherein the data is based on the information about the food related products and the weight information.'], '#text': 'wherein the ...

CMOS IMAGE SENSOR FOR RGB IMAGING AND DEPTH MEASUREMENT WITH LASER SHEET SCAN

An imaging unit includes a light source and a pixel array. The light source projects a line of light that is scanned in a first direction across a field of view of the light source. The line of light oriented in a second direction that is substantially perpendicular to the first direction. The pixel array is arranged in at least one row of pixels that extends in a direction that is substantially parallel to the second direction. At least one pixel in a row is capable of generating two-dimensional color information of an object in the field of view based on a first light reflected from the object and is capable of generating three-dimensional (3D) depth information of the object based on the line of light reflecting from the object. The 3D-depth information includes time-of-flight information. 1. An imaging unit , comprising:a light source that projects a line of light that is scanned in a first direction across a field of view of the light source, the line of light oriented in a second direction that is substantially perpendicular to the first direction; anda pixel array arranged in at least one row of pixels that extends in a direction that is substantially parallel to the second direction, at least one pixel in a row capable of generating two-dimensional (2D) color information of an object in the field of view of the light source based on a first light reflected from the object and capable of generating three-dimensional (3D) depth information of the object based on the line of light reflecting from the object, the 3D-depth information comprising time-of-flight information.2. The imaging unit of claim 1 , further comprising a time-to-digital converter coupled to the pixel claim 1 , the time-to-digital converter generating the 3D-depth information based on the pixel detecting the line of light being reflected from the object.3. The imaging unit of claim 1 , wherein the 3D-depth information comprises timestamp information.4. The imaging unit of claim 1 , further ...

Borehole Inspection Device

Borehole inspection device for inspecting a borehole in a workpiece has a measuring head which includes an endoscope and is insertable into the borehole to be inspected and movable relative to the borehole in different axial positions. Borehole inspection device has an imaging optics with a panoramic view for imaging the inner surface of the borehole, and the imaging optics is in image transmission connection with a digital image recorder. Device has a memory for storing the images recorded in different axial positions of the measuring head, and an evaluation apparatus for evaluating the images stored in the memory. In order to obtain surface depth information about the inner surface of the borehole, the evaluation apparatus is configured for evaluating images recorded at different viewing angles of the imaging optics with regard to the particular surface location, using a 3D reconstruction method.

GLOW DISCHARGE SPECTROSCOPY METHOD AND SYSTEM FOR MEASURING IN SITU THE ETCH DEPTH OF A SAMPLE

A glow discharge spectrometry system includes a glow discharge lamp suitable for receiving a solid sample () and forming a glow discharge etching plasma (). The system () for measuring in situ the depth of the erosion crater generated by etching of the sample () includes an optical separator (), optical elements () suitable for directing a first incident beam () toward a first zone () of the sample, the first zone being exposed to the etching plasma, and a second incident beam () toward a second zone () of the same side of the sample, the second zone being protected from the etching plasma, respectively, and an optical recombining device () suitable for forming an interferometric beam () so as to determine the depth (d) of the erosion crater. 115-. (canceled)16. System of glow discharge spectrometry and in situ measurement of the etching depth of a sample , comprising:a glow discharge lamp adapted to receive a solid sample and to form a glow discharge etching plasma, the sample having, on a same face, a first zone exposed to the etching plasma and a second zone protected from the etching plasma;a spectrometer coupled to the glow discharge lamp, the spectrometer being adapted to measure, as a function the time of exposure of the first zone to said plasma, at least one signal representative of the glow discharge plasma by optical emission spectrometry and/or by mass spectrometry;a system of in situ measurement of the depth of the erosion crater generated by etching of the first zone of the sample as a function of the time of exposure to said plasma;wherein the system of measurement of the erosion crater depth includes:a light source adapted to emit a light beam;an optical splitter adapted to spatially or angularly split the light beam into a first incident beam and a second incident beam;the glow discharge lamp being adapted to provide a first optical path towards the first zone and a second optical path towards the second zone of the sample;optical means adapted to ...

Devices and Methods for Adjustable Resolution Depth Mapping

Devices and methods are described that provide for scanning surfaces and generating 3-dimensional point clouds that describe the depth of the measured surface at each point. In general, the devices and methods utilize scanning mirror(s) that reflect a laser beam into a pattern of scan lines. When the raster pattern of scan lines is directed at a surface, reflections of the laser beam from the surface are received and used to the generate 3-dimensional point clouds that describe the measured surface depth at each point. The motion of the scanning mirror(s) can be dynamically adjusted to modify the characteristics of the resulting 3-dimensional point cloud of the surface. For example, the adjustment of the scanning mirror motion can modify the resolution or data density of the resulting 3-dimensional point cloud that describes the measured depths of the surface. 1. A laser depth sensing device comprising:at least one source of laser light configured to generate a laser beam;a first scanning mirror and a second scanning mirror configured to reflect the laser beam;a depth mapping device configured to receive reflections of the laser beam from a surface and generate a 3-dimensional point cloud of the surface based at least in part on timing of the received reflections of the laser beam from the surface; anda first drive circuit configured to provide a first excitation signal to excite motion of the first scanning mirror and a second drive circuit configured to provide a second excitation signal to excite motion of the second scanning mirror, the motion of the first scanning mirror and the motion of the second scanning mirror configured to reflect the laser beam in a pattern of scan lines on the surface, the motion of the first scanning mirror having a horizontal scan rate, a horizontal scan amplitude, the motion of the second scanning mirror having a vertical scan rate, a vertical scan amplitude and a vertical scan waveform shape, and wherein at least one of the first ...

MOTION SENSOR ARRAY DEVICE AND DEPTH SENSING SYSTEM AND METHODS OF USING THE SAME

In one example of the inventive concepts, a motion sensor array device includes a wafer and at least two motion sensors implemented on the wafer, each of the at least two motion sensors including a plurality of motion sensor pixels to sense a motion of an object and generate motion image data. The motion sensor array device further includes at least two lenses respectively arranged on the at least two motion sensors, wherein the motion sensor array is implemented in one of a chip and a package. 1. A motion sensor array device , comprising:a wafer;at least two motion sensors implemented on the wafer, each of the at least two motion sensors comprising a plurality of motion sensor pixels configured to sense a motion of an object and generate motion image data; andat least two lenses respectively arranged on the at least two motion sensors,wherein the motion sensor array device is implemented in one of a chip and a package.2. The motion sensor array device of claim 1 , further comprising:a depth sensor configured to extract depth information regarding the object from the motion image data generated by the at least two motion sensors.3. The motion sensor array device of claim 2 , further comprising:a three-dimensional image generator configured to generate a three-dimensional image by combining the depth information and the motion image data.4. The motion sensor array device of claim 1 , wherein the at least two lenses are wafer lenses claim 1 , andthe motion sensor array device is implemented in the package.5. The motion sensor array device of claim 1 , wherein each of the motion sensor pixels is a dynamic vision sensor (DVS) pixel.6. The motion sensor array device of claim 5 , wherein each of the at least two motion sensors comprises:a pixel array comprising a plurality of DVS pixels;a row address event representation (AER) circuit configured to process at least a first event signal among a plurality of event signals generated by each of the DVS pixels; anda column AER ...

Depth Detection of a Soil Coulter

Depth of penetration of a soil coulter is detected using a sensor being mounted on the side of the disk adjacent the edge such that the sensor as the disk rotates is located above the surface of the soil during a first part of its rotation and is located below the surface during a second part of its rotation. The sensor issues a signal which changes in response to whether the sensor is above or below the soil surface which is received by a controller which calculates from the signal a first time when the sensor enters below the soil surface and a second time when the sensor departs the soil surface and calculates from the first and second times the depth of penetration of the coulter in the soil. The system can also detect variations in depth indicative of a value of surface roughness. 1. Apparatus for measuring soil penetration comprising:a disk having a peripheral edge and two spaced side walls extending from the peripheral edge toward a center of the disk;a hub mounting the disk for rotation about an axis of the disk so that the peripheral edge rotates in the soil and the coulter penetrates the soil to a depth below a surface of the soil;a sensor mounted in one side wall of the disk;the sensor being mounted on the disk for rotation therewith;the sensor being mounted on the disk at a position such that the sensor as the disk rotates is located above the surface of the soil during a first part of its rotation and is located below the surface during a second part of its rotation;the sensor being adapted to issue a signal which changes in response to whether the sensor is above or below the soil surface;and a controller responsive to the signal and adapted to calculate from the signal a first time when the sensor enters below the soil surface and a second time when the sensor departs the soil surface and to calculate from the first and second times the depth of penetration of the coulter in the soil.2. The apparatus according to wherein the sensor is arranged to ...

SYSTEM AND METHOD FOR DETECTING HUMAN PRESENCE BASED ON DEPTH SENSING AND INERTIAL MEASUREMENT

An electronic device includes a depth sensor and an inertial measurement unit. The electronic device detects a presence of the user of the electronic device by analyzing a combination of inertial sensor signals from the inertial measurement unit and depth sensor signals from the depth sensor.

Method for Acquiring Image, Electronic Device and Readable Storage Medium

The disclosure provides a method for acquiring an image and an electronic device. The method includes: projecting, at a first frequency, a laser to a scene; acquiring a plurality of images at a second frequency which is greater than the first frequency; distinguishing from the images a first image acquired in response to not projecting the laser and a second image acquired in response to projecting the laser; and calculating a depth image based on the first image, the second image and a reference image.

NANOSTRUCTURED OPTICAL ELEMENT, DEPTH SENSOR, AND ELECTRONIC DEVICE

Provided are a nanostructured optical element, a depth sensor, and an electronic device. The nanostructured optical element includes: a light source in which a plurality of laser sources irradiating light are configured as an array; a meta-pattern layer including a plurality of first nano-posts that are two-dimensionally configured while satisfying a sub-wavelength condition, wherein the plurality of first nano-posts are configured to change the light from the light source into structured light; and a deflecting layer between the light source and the meta-pattern layer, and configured to change a proceeding direction of the light to make the light from the light source be incident to the meta-pattern layer. 1. A nanostructured optical element comprising:a light source in which a plurality of laser sources irradiating light are configured as an array;a meta-pattern layer including a plurality of two-dimensionally configured first nano-posts satisfying a sub-wavelength condition, the plurality of first nano-posts being configured to change the light from the light source into structured light; anda deflecting layer between the light source and the meta-pattern layer, the deflecting layer being configured to change a proceeding direction of the light to make the light from the light source incident to the meta-pattern layer.2. The nanostructured optical element of claim 1 , wherein the laser source is one of a VCSEL laser claim 1 , a Fabry-Perot type laser diode claim 1 , and a distributed feedback (DFB) type laser diode.3. The nanostructured optical element of claim 1 , wherein the deflecting layer comprises a convex lens or a Fresnel lens.4. The nanostructured optical element of claim 1 , wherein the deflecting layer comprises a plurality of two-dimensionally configured second nano-posts satisfying the sub-wavelength condition.5. The nanostructured optical element of claim 4 , further comprising:a supporting layer between the meta-pattern layer and the deflecting ...

LIGHT-RECEIVING ELEMENT, SOLID-STATE IMAGING DEVICE, AND DISTANCE MEASUREMENT DEVICE

Distance measurement accuracy is improved. A light-receiving element according to an embodiment includes a semiconductor substrate, and lattice-shaped pixel separating parts that divide the semiconductor substrate into a plurality of pixel regions arranged in a matrix form, wherein each of the pixel regions includes: a first semiconductor region disposed on a first surface side in the semiconductor substrate; a second semiconductor region disposed on the first surface side in the semiconductor substrate separately from the first semiconductor region; and a first blocking region disposed between the first semiconductor region and the second semiconductor region on the first surface side in the semiconductor substrate and having a dielectric constant different from that of the semiconductor substrate. 1. A light-receiving element comprising: a semiconductor substrate; andlattice-shaped pixel separating parts that divide the semiconductor substrate into a plurality of pixel regions arranged in a matrix form,wherein each of the pixel regions includes:a first semiconductor region disposed on a first surface side in the semiconductor substrate;a second semiconductor region disposed on the first surface side in the semiconductor substrate separately from the first semiconductor region; anda first blocking region disposed between the first semiconductor region and the second semiconductor region on the first surface side in the semiconductor substrate and having a dielectric constant different from that of the semiconductor substrate.2. The light-receiving element according to claim 1 , wherein a height of the first blocking region from the first surface is greater than heights of the first and second semiconductor regions from the first surface.3. The light-receiving element according to claim 1 , wherein a cross section of the first blocking region parallel to the first surface has a circular shape claim 1 , an elliptic shape claim 1 , or a polygonal shape.44. The light- ...

Tyre Tread Depth and Tyre Condition Determination

A method for assessing tyre tread depth and/or tyre condition by taking and analysing a camera image or images of a tyre using portable instrumentation. 1. A method for assessing tyre tread depth and/or tyre condition by taking and analysing a camera image or images of a tyre using portable instrumentation.2. A method according to claim 1 , in which the instrumentation comprises portable communication equipment such as a mobile phone which may comprise a smartphone including a camera.3. A method according to claim 2 , in which a separate imaging device is used in conjunction with a smartphone.4. A method according to claim 3 , in which the separate imaging device comprises a camera which can communicate with the smartphone as by Wi-fi.5. A method according to claim 2 , in which the smartphone is loaded with an app that controls or directs the control of a camera claim 2 , whether a built-in smartphone camera or an auxiliary camera claim 2 , to take a prescribed image or images.6. A method according to claim 5 , in which the app contains image analysis software that can assess tread depth and tyre condition on board the smartphone and/or communicate image data to a remote computer adapted to make such assessment and communicate the assessment back to the smartphone.7. A method according to claim 5 , in which the app is an image control app that controls a tyre tread imaging process.8. A method according to claim 7 , in which ‘image control’ means any one or more of:prescribing how an image or images should be taken, for manual camera operationsetting a camera imaging mode, including setting a flash modecontrolling an imaging accessory such as an auxiliary flash or other lighting device9. A method according to claim 8 , in which prescribing how an image or images should be taken includes one or more ofprescribing an imaging sequenceprescribing an imaging modeprescribing an imaging distance and/or orientation10. A method according to claim 8 , in which setting a camera ...

3d sensing technology based on multiple structured illumination

Various embodiments can measure a distance of an object. For achieving this, a first light source and a second light source can be configured to emit first light and a second light toward the object to illuminate the object. The emission of the first light and second light can be configured such that the two lights converge at a first point and diverge at a second point. An optical sensor can be used to capture a first image of the object illuminated by the first light, and capture a second image of the object illuminated by the second light. An image difference between the first image and the second image of the object can be determined. The distance of the object with respect to the first point can then be determined based on the image difference and a distance difference between the first point and the second point.

INFRARED IMAGING ASSEMBLY

The invention describes an infrared imaging assembly () for capturing an infrared image (M, M) of a scene (S), comprising an infrared-sensitive image sensor (); an irradiator () comprising an array of individually addressable infrared-emitting LEDs, wherein each infrared-emitting LED is arranged to illuminate a scene region (S, . . . , S); a driver () configured to actuate the infrared irradiator () by applying a switching pulse train (T, . . . , T) to each infrared-emitting LED; an image analysis module () configured to analyse a preliminary infrared image (M) to determine the required exposure levels () for each of a plurality of image regions (R, . . . , R); and a pulse train adjusting unit () configured to adjust the duration (L, . . . , L) of a switching pulse train (T, . . . , T) according to the required exposure levels (). The invention also described a method of generating a depth map (D) for a scene (S); a depth map generator comprising an embodiment of the inventive infrared imaging assembly (); and a camera comprising such a depth map generator (). 111. An infrared imaging assembly () for capturing an infrared image (M) of a scene (S) , comprising{'b': 14', '15, 'an infrared-sensitive image sensor (, );'}{'b': 10', '1', '9, 'an irradiator () comprising an array of individually addressable infrared-emitting LEDs, wherein each infrared-emitting LED is arranged to illuminate a scene region (S, . . . , S);'}{'b': 11', '10', '1', '9, 'a driver () configured to actuate the infrared irradiator () by applying a switching pulse train (T, . . . , T) to each infrared-emitting LED;'}{'b': 13', '17', '0', '15', '130', '170', '1', '9, 'an image analysis module (, ) configured to analyse a preliminary infrared image (M, M) to determine the required exposure levels (, ) for each of a plurality of image regions (R, . . . , R); and'}{'b': 12', '1', '9', '1', '9', '130', '170, 'a pulse train adjusting unit () configured to adjust the duration (L, . . . , L) of a switching ...

System and method for autonomous valet parking using plenoptic cameras

Exemplary embodiments provide systems and methods for autonomously valet parking a vehicle based on images obtained from a plurality of plenoptic (light field) cameras. An example vehicle includes a plenoptic camera to obtain an image external to the vehicle and a controller. The controller is to autonomously navigate a vehicle toward a parking space identified as unoccupied and generate, based on the image, an occupancy map indicating occupied regions in a plurality of concentric regions. The controller also is to determine whether the parking space is available based on the occupancy map and send, in response to determining the parking space is unavailable, an error message to a driver.

Laser processing apparatus and optical adjustment method

A laser processing apparatus emits processing light, measurement light, processing guide light, and measurement guide light with which a surface of a workpiece is irradiated. Respective wavelengths of the processing guide light and the measurement guide light are set to wavelengths at which a deviation amount between an irradiation position of the processing guide light and an irradiation position of the measurement guide light due to a chromatic aberration of magnification of a lens, and a deviation amount between an irradiation position of the processing light and an irradiation position of the measurement light due to the chromatic aberration of magnification of the lens are equal to each other. Therefore, positioning of spot positions of a plurality of laser lights having different output differences can be realized with high accuracy and high speed.

APPARATUS FOR MEASURING INTERNAL STRAIN FIELD OF DENTAL RESIN

The present disclosure discloses an apparatus for measuring an internal strain field of a dental resin, comprising: an optical measurement system, a probe and a data processor, wherein an optical fiber coupler in the optical measurement system has one input terminal connected to a light source, one output terminal connected to the probe, the other output terminal provided with an optical component including a reflective element for forming reference light and the other input terminal provided with an photoelectric imaging apparatus for receiving interference light formed by object light and the reference light. The probe is configured to irradiate detection light outputted from the optical fiber to a measured tooth and receive object light which is reflected by the tooth; and the data processor is configured to obtain a measurement result of the internal strain field of the measured dental resin according to an interference spectrum obtained through imaging by the photoelectric imaging apparatus. The apparatus for measuring an internal strain field of a dental resin according to the present disclosure achieves online measurement of a distribution of the internal strain field of the resin based on the interference tomography measurement method, so as to detect an internal defect of the resin according to a change of the internal strain field of the resin under a stress. 2. The apparatus according to claim 1 , wherein the optical component comprises at least a first lens claim 1 , a first reflector claim 1 , an optical path adjustment component and a second reflector disposed in turn along an optical path;the first lens is configured to adjust output light from the optical fiber to parallel light;a normal of the first reflector is at an angle of 45 degrees to a central axis of the first lens;the optical path adjustment component comprises at least a third reflector and a fourth reflector disposed perpendicularly to each other and having respective reflection surfaces ...

ACTIVE ILLUMINATION FOR ENHANCED DEPTH MAP GENERATION

A depth map may be generated in conjunction with generation of a digital image such as a light-field image. A light pattern source may be used to project a light pattern into a scene with one or more objects. A camera may be used to capture first light and second light reflected from the one or more objects. The first light may be a reflection of light originating from one or more other light sources independent of the light pattern source. The second light may be a reflection of the light pattern from the one or more objects. In a processor, at least the first light may be used to generate an image such as a light-field image. Further, in the processor, at least the second light may be used to generate a depth map indicative of distance between the one or more objects and the camera. 1. A method for capturing an image and generating a depth map for the image , the method comprising:with a light pattern source, projecting a light pattern into a scene comprising one or more objects;in a camera, capturing first light reflected from the one or more objects, wherein the first light comprises a reflection of light originating from one or more other light sources independent of the light pattern source;in the camera, capturing second light reflected from the one or more objects, wherein the second light comprises a reflection of the light pattern from the one or more objects;in a processor, using at least the first light to generate the image, wherein the image depicts the scene; andin the processor, using at least the second light to generate a depth map indicative of distance between the one or more objects and the camera.2. The method of claim 1 , wherein projecting the light pattern comprises projecting a regular pattern selected from the group consisting of:a regular grid of dots;a regular non-grid array of dots;a regular grid of lines; anda regular non-grid array of lines.3. The method of claim 1 , wherein the camera comprises a light-field camera comprising an ...

Systems and Methods for Estimating Depth from Projected Texture using Camera Arrays

Systems and methods in accordance with embodiments of the invention estimate depth from projected texture using camera arrays. One embodiment of the invention includes: at least one two-dimensional array of cameras comprising a plurality of cameras; an illumination system configured to illuminate a scene with a projected texture; a processor; and memory containing an image processing pipeline application and an illumination system controller application. In addition, the illumination system controller application directs the processor to control the illumination system to illuminate a scene with a projected texture. Furthermore, the image processing pipeline application directs the processor to: utilize the illumination system controller application to control the illumination system to illuminate a scene with a projected texture capture a set of images of the scene illuminated with the projected texture; determining depth estimates for pixel locations in an image from a reference viewpoint using at least a subset of the set of images. Also, generating a depth estimate for a given pixel location in the image from the reference viewpoint includes: identifying pixels in the at least a subset of the set of images that correspond to the given pixel location in the image from the reference viewpoint based upon expected disparity at a plurality of depths along a plurality of epipolar lines aligned at different angles; comparing the similarity of the corresponding pixels identified at each of the plurality of depths; and selecting the depth from the plurality of depths at which the identified corresponding pixels have the highest degree of similarity as a depth estimate for the given pixel location in the image from the reference viewpoint.

Foreign Substance Detection in a Depth Sensing System

Disclosed are an apparatus and a method for detection of foreign substances in a depth sensing system. In one embodiment, a depth sensing device includes a light source to emit light, an image sensor and a processor. The image sensor receives through an optical component the light reflected by environment of the depth sensing device. The image sensor further generates a depth map including a plurality of pixel values corresponding to distances between the depth sensing device and the environment. The processor detects a blurred portion of the depth map due to a presence of a foreign substance on the optical component. The processor may further cause outputting a user alert of the presence of the foreign substance on the optical component. 1. A depth sensing device comprising:a light source to emit light;an image sensor to receive through an optical component the light reflected by an environment of the depth sensing device and that, when in operation, generates a depth map including a plurality of pixel values corresponding to depths of the environment relative to the depth sensing device; anda processor that, when in operation, detects a blurred portion of the depth map due to a presence of a foreign substance on the optical component and to cause outputting of a user alert of the presence of the foreign substance on the optical component.2. The device of claim 1 , wherein the processor is configured to identify in the depth map a plurality of pixels as intermediate depth pixels caused by light scattering of the foreign substance on the optical component.3. The device of claim 1 , wherein the processor is configured to detect that the depth map is blurred by counting a number of intermediate depth pixels in the depth map.4. The device of claim 2 , wherein the intermediate depth pixels have pixel values corresponding to depths that are smaller than depths for a background of the environment and that are larger than depths for a foreground of the environment.5. The ...

Temperature Compensation for Structured Light Depth Imaging System

Disclosed are an apparatus and a method of compensating temperature shifts of a structured light pattern for a depth imaging system. In some embodiments, a depth imaging device includes a light source, an imaging sensor and a processor. The light source emits light corresponding to a pattern. A temperature drift of the light source can cause a shift of the pattern. The imaging sensor receives the light reflected by environment in front of the depth imaging device and generates a depth map including a plurality of pixel values corresponding to depths of the environment relative to the depth imaging device. The processor estimates the shift of the pattern based on a polynomial model depending on the temperature drift of the light source. The processor further adjusts the depth map based on the shift of the pattern. 1. A depth imaging device comprising:a light source to emit light corresponding to a predetermined pattern;an imaging sensor to receive the light reflected by the environment of the depth imaging device and that, when in operation, generates a depth map including a plurality of pixel values corresponding to depths of the environment relative to the imaging device; anda processor that, when in operation, estimates a shift of the pattern by using a polynomial model depending on the temperature drift of the light source and adjusts the depth map based on the shift of the pattern.2. The device of claim 1 , wherein a temperature drift of the light source claim 1 , an optical component of the depth imaging device claim 1 , or an environment of the depth imaging device causes a shift of the pattern.3. The device of claim 1 , further comprising:a temperature sensor to measure a temperature of the light source.4. The device of claim 1 , wherein the light source is a structured light source to emit light corresponding to a known pattern.5. The device of claim 1 , wherein the pattern is a speckle pattern corresponding to a reference image including a plurality of dots ...

CODE DOMAIN POWER CONTROL FOR STRUCTURED LIGHT

Systems and methods for controlling structured light laser systems are disclosed. One aspect is a structured light system. The system includes a memory device configured to store a depth map. The system further includes an image projecting device including a laser system configured to project codewords. The system further includes a receiver device including a sensor, the receiver device configured to sense the projected codewords reflected from an object. The system further includes a processing circuit configured to retrieve a portion of the depth map and calculate expected codewords from the depth map. The system further includes a feedback system configured to control the output power of the laser system based on the sensed codewords and the expected codewords. 1. A structured light system , comprising:a memory device configured to store a depth map;an image projecting device including a laser system configured to project codewords;a receiver device including a sensor, the receiver device configured to sense the projected codewords reflected from an object;a processing circuit configured to retrieve at least a portion of the depth map stored in the memory device and calculate expected codewords from the depth map; anda feedback system configured to control an output power of the laser system based on the sensed codewords and the expected codewords.2. The structured light system of claim 1 , wherein the processing circuit is further configured to update the depth map based on the sensed codewords claim 1 , and wherein the memory device is further configured to store the updated depth map.3. The structured light system of claim 2 , wherein the feedback system is configured to determine a code domain statistic comparing the sensed codewords with the expected codewords claim 2 , and wherein the feedback system controls the output power of the laser system based at least in part on the determined code domain statistic.4. The structured light system of claim 3 , ...

FACILITATING BODY MEASUREMENTS THROUGH LOOSE CLOTHING AND/OR OTHER OBSCURITIES USING THREE-DIMENSIONAL SCANS AND SMART CALCULATIONS

A mechanism is described for facilitating smart measurement of body dimensions despite loose clothing and/or other obscurities according to one embodiment. A method of embodiments, as described herein, includes capturing, by one or more capturing/sensing components of a computing device, a scan of a body of a user, and computing one or more primary measurements relating to one or more primary areas of the body, where the one or more primary measurements are computed based on depth data of the one or more primary areas of the body, where the depth data is obtained from the scan. The method may further include receiving at least one of secondary measurements and a three-dimensional (3D) avatar of the body based on the primary measurements, and preparing a report including body dimensions of the body based on at least one of the secondary measurements and the 3D avatar, and presenting the report at a display device. 1. An apparatus comprising:one or more capturing/sensing components to capture a scan of a body of a user;primary measurement logic to compute one or more primary measurements relating to one or more primary areas of the body, wherein the one or more primary measurements are computed based on depth data of the one or more primary areas of the body, wherein the depth data is obtained from the scan;detection/reception logic to receive at least one of secondary measurements and a three-dimensional (3D) avatar of the body based on the primary measurements;presentation logic to prepare a report including body dimensions of the body based on at least one of the secondary measurements and the 3D avatar; andcommunication/compatibility logic to present the report at a display device.2. The apparatus of claim 1 , wherein the detection/reception logic is further to detect the scan captured using the one or more capturing/sensing components claim 1 , wherein the one or more capturing/sensing components include a depth-sensing camera claim 1 , wherein the detection/ ...