분광 휘도계의 교정에 사용하는 기준 광원 장치 및 그것을 사용하는 교정 방법

... 휘도 기준면에 있어서의 휘도 불균일을 저감시킨다. 개구인 휘도 기준면 (18) 을 구비하는 적분구 (12) 와, 상기 적분구 (12) 의 외벽 (12b) 에 서로 이간되어 형성되고, 상기 적분구 (12) 의 내부에 파장 특성이 동등한 광을 각각 입사하는 복수의 제 1 광 포트 (14a), (14b) 를 포함하는 분광 휘도계 (40) 의 교정에 사용하는 기준 광원 장치 (10) 가 제공된다. 상기 복수의 제 1 광 포트 (14a), (14b) 는, 상기 적분구 (12) 의 외벽 (12b) 에 있어서의, 상기 휘도 기준면 (18) 의 중심으로부터의 거리가 동등하고, 상기 휘도 기준면 (18) 의 중심을 통과하는 상기 적분구 (12) 의 회전 대칭축 (R) 에 대해 회전 대칭성을 갖는 복수 위치에 형성되어도 된다.

Grating ozone spectrophotometer

A holographic grating spectrophotometer for detecting ozone and sulphur dioxide in the atmosphere is described which provides automatic calibration and which provides automatic linearity correction for the photomultiplier tube. Automatic calibration is provided by using a computer to control a stepper motor to move the grating so that the photomultiplier tube receives maximum intensity at the calibration wavelength of 302.1 nm from a mercury source. Automatic linearity correction is obtained by cycling a wavelength selection mask across exit slits located in the focal plane of the device and firstly combines separately taken counts of two different wavelengths and comparing this sum with the sum of counts of these wavelengths taken simultaneously. The difference is used to calculate photomultiplier tube deadtime and improve accuracy of the results. In a preferred embodiment five wavelengths are used to calculate ozone and sulphur dioxide levels, and a stepper motor driving a cylindrical ...

Verfahren zur Kompensation in einem Messsystem

Die Erfindung offenbart ein Verfahren zur Kompensation unterschiedlicher Sensitivitäten bei verschiedenen Wellenlängen bei einem spektrometrischen Messsystem (10), umfassend die Schritte: Kalibrierung des Messystems (10) in einem Wellenlängenbereich bezüglich eines oder mehreren bekannten Referenzstandards; Erstellen eines wellenlängenabhängigen Kompensationsalgorithmus zur Linearisierung; und Justierung des Messsystems (10) mit dem Kompensationsalgorithmus. Die Erfindung offenbart weiter ein entsprechendes Messsystem (10).

SPECTROPHOTOMETRIC INSTRUMENT WITH RAPID SCANNING DISTORTION CORRECTION

SPECTROPHOTOMETRIC INSTRUMENT WITH RAPID SCANNING DISTORTION CORRECTION

In a spectrophotometric instrument, a system is provided to correct for distortion caused by rapid scanning of the spectrum. In the instrument, photodetectors detect light energy which is scanned through a spectrum at a rapid rate. An amplifier amplifies the output signal generated by the photodetectors. The output signal of the amplifier is sampled at increments and the samples are converted to digital values. A first derivative is determined from the digital values by subtracting from each value the value from the preceding increment. The first derivative values are multiplied times a constant selected to correct for the distortion and the resulting product values are added to the amplitude digital values to provide a set of corrected values representing the intensity detected by the photo-detectors.

GRATING OZONE SPECTROPHOTOMETER

GRATING OZONE SPECTROPHOTOMETER

Abstract of the Disclosure A holographic grating spectrophotometer for detecting ozone and sulphur dioxide in the atmosphere is described which provides automatic calibration and which provides automatic linearity correction for the photomultiplier tube. Automatic calibration is provided by using a computer to control a stepper motor to move the grating so that the photomultiplier tube receives maximum intensity at the calibration wavelength of 302.1 nm from a mercury source. Automatic linearity correction is obtained by cycling a wavelength selection mask across exit slits located in the focal plane of the device and firstly combines separately taken counts of two different wavelengths and comparing this sum with the sum of counts of these wavelengths taken simultaneously. The difference is used to calculate photomultiplier tube deadtime and improve accuracy of the results. In a preferred embodiment five wavelengths are used to calculate ozone and sulphur dioxide levels, and a stepper motor driving a cylindrical wavelength selection mask permits exit slits to be exposed to predetermined wavelengths one at a time.

Verfahren zur Kompensation in einem Messsystem

Die Erfindung offenbart ein Verfahren zur Kompensation unterschiedlicher Sensitivitäten bei verschiedenen Wellenlängen bei einem spektrometrischen Messsystem (10), umfassend die Schritte: Kalibrierung des Messystems (10) in einem Wellenlängenbereich bezüglich eines oder mehreren bekannten Referenzstandards; Erstellen eines wellenlängenabhängigen Kompensationsalgorithmus zur Linearisierung; und Justierung des Messsystems (10) mit dem Kompensationsalgorithmus. Die Erfindung offenbart weiter ein entsprechendes Messsystem (10).

Spectrophotometric instrument with rapid scanning distortion correction

Grating ozone spectrophotometer

A holographic grating spectrophotometer for detecting ozone and sulphur dioxide in the atmosphere is described which provides automatic calibration and which provides automatic linearity correction for the photomultiplier tube. Automatic calibration is provided by using a computer to control a stepper motor to move the grating so that the photomultiplier tube receives maximum intensity at the calibration wavelength of 302.1 nm from a mercury source. Automatic linearity correction is obtained by cycling a wavelength selection mask across exit slits located in the focal plane of the device and firstly combines separately taken counts of two different wavelengths and comparing this sum with the sum of counts of these wavelengths taken simultaneously. The difference is used to calculate photomultiplier tube deadtime and improve accuracy of the results. In a preferred embodiment five wavelengths are used to calculate ozone and sulphur dioxide levels, and a stepper motor driving a cylindrical ...

Spectroscopy with tailored spectral sampling

A spectrometer for tailored spectral sampling includes a dispersive element for spatially dispersing a spectrum of a light beam, a detector including a plurality of pixels distributed along a sampling direction, and a spectrum reshaping element including at least one of a reflective surface or a transmissive surface for reshaping the spatially-dispersed spectrum of the light beam from the dispersive element along the sampling direction to provide a selected distribution of the spectrum to the detector. The detector may spatially sample the spectrum of incident light with the plurality of pixels at selected spectral intervals based on the selected distribution of the spectrum.

Spektrophotometer mit Fehlerkorrektur durch schnelle Abtastung.

Reference light source device used for calibratiom of spectral luminance meter and calibration method

휘도 기준면에 있어서의 휘도 불균일을 저감시킨다. 개구인 휘도 기준면 (18) 을 구비하는 적분구 (12) 와, 상기 적분구 (12) 의 외벽 (12b) 에 서로 이간되어 형성되고, 상기 적분구 (12) 의 내부에 파장 특성이 동등한 광을 각각 입사하는 복수의 제 1 광 포트 (14a), (14b) 를 포함하는 분광 휘도계 (40) 의 교정에 사용하는 기준 광원 장치 (10) 가 제공된다. 상기 복수의 제 1 광 포트 (14a), (14b) 는, 상기 적분구 (12) 의 외벽 (12b) 에 있어서의, 상기 휘도 기준면 (18) 의 중심으로부터의 거리가 동등하고, 상기 휘도 기준면 (18) 의 중심을 통과하는 상기 적분구 (12) 의 회전 대칭축 (R) 에 대해 회전 대칭성을 갖는 복수 위치에 형성되어도 된다. The luminance nonuniformity in a luminance reference plane is reduced. The integrating sphere 12 having the luminance reference plane 18 as an opening and the outer wall 12b of the integrating sphere 12 are formed to be spaced apart from each other, and the light having the same wavelength characteristics is formed inside the integrating sphere 12. There is provided a reference light source device 10 for use in the calibration of the spectroscopic luminance meter 40 including a plurality of first optical ports 14a and 14b respectively incident. The plurality of first optical ports 14a and 14b have the same distance from the center of the luminance reference plane 18 in the outer wall 12b of the integrating sphere 12, and the luminance reference plane ( It may be formed at a plurality of positions having rotational symmetry with respect to the rotational symmetry axis R of the integrating sphere 12 passing through the center of 18).

Benchmark light source device for correcting bright stars of the meter and correction method using the same

提供一種用於分光亮度計（40）之校正的基準光源裝置（10），其為用以減低亮度基準面中之亮度偏差(不均勻性)，並且包括：具備開口之亮度基準面（18）的積分球（12）、以及相互分隔地被設置在積分球（12）的外壁（12b）且分別地將波長特性相同的光入射到積分球（12）的內部之複數個第1光射出埠（14a）、（14b）。複數個第1光射出埠（14a）、（14b）係可以設置於積分球（12）的外壁（12b）中距離亮度基準面（18）的中心為相等距離、而且對通過亮度基準面（18）的中心之積分球（12）的旋轉對稱軸R而言具有旋轉對稱性之數個位置。

Optisches Messverfahren und optische Messvorrichtung

Es wird ein optisches Messverfahren bereitgestellt, das einen Detektor (120) verwendet, der eine Detektionsempfindlichkeit bis auf mindestens eine Infrarot-nahe Region aufweist. Das optische Messverfahren umfasst Folgendes: Erhalten (S206) eines Ausgabewertes durch Messen einer Lichtprobe bei einer beliebigen Belichtungszeit mit dem Detektor; und Korrigieren (S210, S212) des Ausgabewertes mit einem Korrekturbetrag, der dem Ausgabewert entspricht, wenn die Belichtungszeit, bei welcher der Ausgabewert erhalten wird, innerhalb eines zweiten Bereichs liegt. Der Korrekturbetrag enthält ein Produkt aus einem Koeffizienten und einem Quadrat der Belichtungszeit, wobei der Koeffizient einen Grad anzeigt, in dem ein Ausgabewert, der erhalten wurde, wenn die Lichtprobe mit dem Detektor bei einer Belichtungszeit innerhalb des zweiten Bereichs gemessen wird, von einer Ausgabelinearität abweicht, die erhalten wird, wenn die Lichtprobe mit dem Detektor bei einer Belichtungszeit innerhalb des ersten Bereichs ...

Linearity correction method of optical measuring device, optical measuring method and optical measuring device

To perform linearity correction with high accuracy for an optical measuring device using a CMOS linear image sensor. Provided is a linearity correction method for an optical measuring device comprising a CMOS linear image sensor and including: an exposure step of sequentially making a reference light of constant intensity incident on a light receiving element of interest of the CMOS linear image sensor by changing exposure time; a measured value acquisition step of sequentially acquiring a measured value of the light receiving element of interest; an actual linearity error calculation step of sequentially calculating an actual linearity error indicating the difference between the measured value and a linear value obtained based on the exposure time corresponding to the measured value; and a fitting step of executing fitting of a first function indicating a first linearity error for each of the actual linearity errors.

Spektrophotometer mit Fehlerkorrektur durch schnelle Abtastung.

METHOD FOR COMPENSATION IN A MEASURING SYSTEM

The invention relates to a method for compensation for different sensitivities at different wavelengths in a spectrometric measuring system, including steps of calibrating the measuring system in a wavelength range with respect to one or more known reference standards, creating a wavelength-dependent compensation algorithm for linearization, and adjusting the measuring system using the compensation algorithm. The invention further discloses a corresponding measuring system.

On-board processing of hyperspectral data

Methods and systems to extract a spectrum of a hyperspectral interferogram, with innovative treatment of off-axis spectral correction and other features, which may be efficiently performed on-board a satellite.

Arithmetic Expression Calculation Method for Correcting Output of Photo Detector and Output Correction Method of Photo Detector

A method of this invention obtains a linear output value that is obtained by linearly correcting the output value of a photo detector that detects the light of the first intensity wherein the output of the photo detector becomes non-linear in such a way that the relationship between the output value and the light of the first intensity becomes linear, obtains a non-linear output value as being an output value of the photo detector that detects the light of the second intensity whose output of the photo detector becomes non-linear, and obtains an arithmetic expression to linearly correct the non-linear output value to become a linear relationship between the non-linear output value and the light of the second intensity using the linear output value and the non-linear output value as parameters. 1. An arithmetic expression calculation method that is used for an optical analyzer comprising a photo detector wherein a relationship between intensity of incident light and an output value of the photo detector becomes linear within a predetermined range , whereinobtaining a linear output value that is obtained by linearly correcting the output value of the photo detector that detects the light of the first intensity wherein the output of the photo detector becomes non-linear in such a way that the relationship between the output value and the light of the first intensity becomes linear,obtaining a non-linear output value as being an output value of the photo detector that detects the light of the second intensity whose output of the photo detector becomes non-linear, andobtaining an arithmetic expression to linearly correct the non-linear output value in such a way that a relationship between the non-linear output value and the light of the second intensity becomes linear using the linear output value and the non-linear output value as parameters.2. The arithmetic expression calculation method described in claim 1 , whereinthe light of the first intensity is light from a ...

Spectrophotometric instrument with rapid scanning distortion correction

In a spectrophotometric instrument, a system is provided to correct for distortion caused by rapid scanning of the spectrum. In the instrument, photodetectors (19) detect light energy which is scanned through a spectrum at a rapid rate. An amplifier (20) amplifies the output signal generated by the photodetectors (19). The output signal of the amplifier (20) is sampled at increments and the samples are converted to digital values. A first derivative is determined from the digital values by subtracting from each value the value from the preceding increment. The first derivative values are multiplied times a constant selected to correct for the distortion and the resulting product values are added to the amplitude digital values to provide a set of corrected values representing the intensity detected by the photodetectors.

Spectroscopy with tailored spectral sampling

一種用於經修裁之光譜取樣之光譜儀包含：一色散元件，其用於使一光束之一光譜在空間上色散；一偵測器，其包含沿著一取樣方向分佈之複數個像素；及一光譜重塑元件，其包含一反射表面或一透射表面中之至少一者以用於沿著該取樣方向重塑來自該色散元件之該光束之該經空間上色散光譜以將該光譜之一選定分佈提供至該偵測器。該偵測器可用該複數個像素基於該光譜之該選定分佈而以選定光譜間隔對入射光之該光譜進行空間上取樣。

Spectrophotometric instrument with rapid scanning distortion correction

On-Board Processing of Hyperspectral Data

Methods and systems to extract a spectrum of a hyperspectral interferogram, with innovative treatment of off-axis spectral correction and other features, which may be efficiently performed on-board a satellite.

PHOTODETECTOR OUTPUT CORRECTION METHOD USED FOR SPECTROSCOPIC ANALYZER

The present invention is adapted to make light beams emitted from a light source enter a photodetector both when interposing an optical element having known characteristics and when not interposing the optical element, and acquire a first output value and a second output value that are the output values of the photodetector with respect to each of light beams that respectively have predetermined multiple wavenumbers and are included in the incident light beams, and obtain an arithmetic expression for calculating intensity of incident light beams from an output value of the photodetector, using parameters that are a ratio between the first output value and the second output value at each of the predetermined wavenumbers and the wavenumber transmission or reflection characteristic of the optical element.

Spectrophotometric instrument with rapid scanning distortion correction

In a spectrophotometric instrument, a system is provided to correct for distortion caused by rapid scanning of the spectrum. In the instrument, photodetectors detect light energy which is scanned through a spectrum at a rapid rate. An amplifier amplifies the output signal generated by the photodetectors. The output signal of the amplifier is sampled at increments and the samples are converted to digital values. A first derivative is determined from the digital values by subtracting from each value the value from the preceding increment. The first derivative values are multiplied times a constant selected to correct for the distortion and the resulting product values are added to the amplitude digital values to provide a set of corrected values representing the intensity detected by the photodetectors.

Spectrometer, metrology tool and method for spectral sampling

一種用於經修裁之光譜取樣之光譜儀包含：一色散元件，其用於使一光束之一光譜在空間上色散；一偵測器，其包含沿著一取樣方向分佈之複數個像素；及一光譜重塑元件，其包含一反射表面或一透射表面中之至少一者以用於沿著該取樣方向重塑來自該色散元件之該光束之該經空間上色散光譜以將該光譜之一選定分佈提供至該偵測器。該偵測器可用該複數個像素基於該光譜之該選定分佈而以選定光譜間隔對入射光之該光譜進行空間上取樣。

Optical measurement method and optical measurement apparatus

There is provided an optical measurement method using a detector having a detection sensitivity to at least a near-infrared region. The optical measurement method including: obtaining an output value by measuring a light sample at any exposure time with the detector; and correcting the output value with an amount of correction corresponding to the output value, when the exposure time at which the output value is obtained is within a second range. The amount of correction includes a product of a coefficient and a square of the exposure time, the coefficient indicating a degree to which an output value obtained when the light sample is measured with the detector at an exposure time within the second range deviates from output linearity obtained when the light sample is measured with the detector at an exposure time within a first range.

SPECTROPHOTOMETER AND ITS METHOD

PURPOSE: To correct the distortion of photometric data by multiplying a linear differentiation calculated from digital values obtained from photodetecting means by a selected constant and adding the product to a digital amplitude value. CONSTITUTION: A spectrophotometer 11 introduces light in a narrow wavelength band to a sample 17 through an exit-slit optical element 15. When a diffraction grating 13 oscillates, the center wavelength of the light irradiating the sample 17 is scanned in an infrared spectral range. The light reflected by the sample 17 is detected by means of a pair of photodetectors 19 (photodetecting means) for infrared rays after the light is passed through the grating 13. The wavelength of the light is scanned by passing the light through a spectrum at such a sufficiently high speed that the output signals of the detectors 19 are distorted against the intensity of the light energy detected by means of the detectors 19. When the output signals of the detectors 19 change ...

Optical measurement method and optical measurement apparatus

There is provided an optical measurement method using a detector having a detection sensitivity to at least a near-infrared region. The optical measurement method including: obtaining an output value by measuring a light sample at any exposure time with the detector; and correcting the output value with an amount of correction corresponding to the output value, when the exposure time at which the output value is obtained is within a second range. The amount of correction includes a product of a coefficient and a square of the exposure time, the coefficient indicating a degree to which an output value obtained when the light sample is measured with the detector at an exposure time within the second range deviates from output linearity obtained when the light sample is measured with the detector at an exposure time within a first range.

Reference light source device used for calibration of spectral luminance meter and calibration method using same

A reference light source device for calibration of a spectral radiance meter includes an integrating sphere having a radiance reference plane, which is an opening; and a plurality of first optical ports, which are formed apart from each other in an outer wall of the integrating sphere to allow light rays with equivalent wavelength characteristics to enter an interior of the integrating sphere.

Optical measurement method and optical measurement apparatus

提供使用至少近紅外線區域中具有檢出感度的檢出器之光學測量方法。光學測量方法包含取得步驟，以任意的曝光時間由檢出器測量任意的取樣光時取得輸出值；以及補正步驟，如果取得輸出值時的曝光時間在第2範圍內，以根據輸出值的補正量補正輸出值。補正量，包含以第2範圍內的曝光時間由檢出器測量時得到的輸出值對於以第1範圍內的曝光時間由檢出器測量時得到的輸出直線性顯示偏離到哪種程度的係數與曝光時間平方的積。

Verfahren zur Kompensation in einem Messsystem

Die Erfindung offenbart ein Verfahren zur Kompensation unterschiedlicher Sensitivitäten bei verschiedenen Wellenlängen bei einem spektrometrischen Messsystem (10), umfassend die Schritte: Kalibrierung des Messsystems (10) in einem Wellenlängenbereich bezüglich eines oder mehreren bekannten Referenzstandards; Erstellen eines wellenlängenabhängigen Kompensationsalgorithmus zur Linearisierung; und Justierung des Messsystems (10) mit dem Kompensationsalgorithmus. Die Erfindung offenbart weiter ein entsprechendes Messsystem (10).

光学測定装置のリニアリティ補正方法、光学測定方法及び光学測定装置

用于在测量系统中进行补偿的方法

本发明涉及一种用于在测量系统中进行补偿的方法。用于补偿在光谱测量系统(10)中不同波长处的不同灵敏度的方法，包括以下步骤：在相对于一个或多个已知参考标准的波长范围内校准测量系统(10)；创建用于线性化的波长相关补偿算法；以及使用补偿算法调整测量系统(10)。本发明进一步公开了相应的测量系统(10)。

光学測定装置のリニアリティ補正方法、光学測定方法及び光学測定装置

【課題】ＣＭＯＳリニアイメージセンサを用いた光学測定装置のリニアリティ補正を高精度に行うこと。【解決手段】強度一定の基準光を、露光時間を変化させてＣＭＯＳリニアイメージセンサの注目受光素子に順次入射させる露光ステップと、前記注目受光素子の測定値を順次取得する測定値取得ステップと、前記測定値に対応する前記露光時間に基づいて得られる線形値と、該測定値との差を示す実リニアリティエラーを順次算出する実リニアリティエラー算出ステップと、前記各実リニアリティエラーに対して、第１リニアリティエラーを示す第１関数のフィッティングを実行するフィッティングステップと、を含む、ＣＭＯＳリニアイメージセンサを備える光学測定装置のリニアリティ補正方法が提供される。【選択図】図９

Verfahren zur Kompensation in einem Messsystem

Die Erfindung offenbart ein Verfahren zur Kompensation unterschiedlicher Sensitivitäten bei verschiedenen Wellenlängen bei einem spektrometrischen Messsystem (10), umfassend die Schritte: Kalibrierung des Messystems (10) in einem Wellenlängenbereich bezüglich eines oder mehreren bekannten Referenzstandards; Erstellen eines wellenlängenabhängigen Kompensationsalgorithmus zur Linearisierung; und Justierung des Messsystems (10) mit dem Kompensationsalgorithmus. Die Erfindung offenbart weiter ein entsprechendes Messsystem (10).

太阳反射谱段光谱仪的光谱辐射亮度标定方法和系统

本发明提供了一种太阳反射谱段光谱仪的光谱辐射亮度标定方法和系统，包括：通过高温黑体对传递光谱仪的光谱辐射亮度进行标定，得到初始标定的传递光谱仪；采用非线性测量装置对初始标定的传递光谱仪进行线性标定，得到一段光谱辐射亮度区间标定的传递光谱仪；分别采用标定的传递光谱仪和待测光谱仪测量预设光谱辐射亮度源，根据测量结果对待测光谱仪的光谱辐射亮度进行标定。在本发明中，采用传递光谱仪，结合非线性测量的方法实现了对待测光谱仪的光谱辐射亮度进行标定，由于线性标定不需要量值源头，能够消除面积测量和双向反射分布函数测量引入的误差，标定的结果准确性好，精度更高。

Spectroscopy with Tailored Spectral Sampling

A spectrometer for tailored spectral sampling includes a dispersive element for spatially dispersing a spectrum of a light beam, a detector including a plurality of pixels distributed along a sampling direction, and a spectrum reshaping element including at least one of a reflective surface or a transmissive surface for reshaping the spatially-dispersed spectrum of the light beam from the dispersive element along the sampling direction to provide a selected distribution of the spectrum to the detector. The detector may spatially sample the spectrum of incident light with the plurality of pixels at selected spectral intervals based on the selected distribution of the spectrum.

太阳反射谱段光谱仪的光谱辐射亮度标定方法和系统

本发明提供了一种太阳反射谱段光谱仪的光谱辐射亮度标定方法和系统，包括：通过高温黑体对传递光谱仪的光谱辐射亮度进行标定，得到初始标定的传递光谱仪；采用非线性测量装置对初始标定的传递光谱仪进行线性标定，得到一段光谱辐射亮度区间标定的传递光谱仪；分别采用标定的传递光谱仪和待测光谱仪测量预设光谱辐射亮度源，根据测量结果对待测光谱仪的光谱辐射亮度进行标定。在本发明中，采用传递光谱仪，结合非线性测量的方法实现了对待测光谱仪的光谱辐射亮度进行标定，由于线性标定不需要量值源头，能够消除面积测量和双向反射分布函数测量引入的误差，标定的结果准确性好，精度更高。

一种光谱仪功率校准装置及方法

本发明公开了一种光谱仪功率校准装置及方法，该装置包括激光器、可调光衰减器、分束器、光开关、驱动电路、功率调节模块、功率监测模块和校准系数计算模块，激光器在驱动电路的驱动下产生单色光，单色光通过可调光衰减器后进入分束器，分为参考光和校准光两路光束，参考光进入功率监测模块，获取参考光的参考功率值；校准光经光开关的第二通道进入光谱仪的分光模块，再通过探测器、数据采集模块和FPGA获取功率值，校准系数计算模块根据参考光的参考功率值和校准光的功率值计算获得功率校准系数。本发明能够实现对光谱仪的定期维护和自动化功率校准，保证光谱仪长期使用中的功率准确度。

光学测定装置的线性校正方法、光学测定方法以及光学测定装置

本发明提供光学测定装置的线性校正方法、光学测定方法以及光学测定装置，高精度地进行使用了CMOS线性图像传感器的光学测定装置的线性校正。具备CMOS线性图像传感器的光学测定装置的线性校正方法包括：曝光步骤，使曝光时间变化而使强度恒定的基准光依次入射CMOS线性图像传感器的注目受光元件；测定值获取步骤，依次获取所述注目受光元件的测定值；实际线性误差计算步骤，依次计算表示基于与所述测定值对应的所述曝光时间得到的线性值与该测定值之差的实际线性误差；以及拟合步骤，对所述各实际线性误差执行表示第一线性误差的第一函数的拟合。

用于在测量系统中进行补偿的方法

本发明涉及一种用于在测量系统中进行补偿的方法。用于补偿在光谱测量系统(10)中不同波长处的不同灵敏度的方法，包括以下步骤：在相对于一个或多个已知参考标准的波长范围内校准测量系统(10)；创建用于线性化的波长相关补偿算法；以及使用补偿算法调整测量系统(10)。本发明进一步公开了相应的测量系统(10)。

太阳反射谱段光谱仪的光谱辐射亮度标定方法和系统

本发明提供了一种太阳反射谱段光谱仪的光谱辐射亮度标定方法和系统，包括：通过高温黑体对传递光谱仪的光谱辐射亮度进行标定，得到初始标定的传递光谱仪；采用非线性测量装置对初始标定的传递光谱仪进行线性标定，得到一段光谱辐射亮度区间标定的传递光谱仪；分别采用标定的传递光谱仪和待测光谱仪测量预设光谱辐射亮度源，根据测量结果对待测光谱仪的光谱辐射亮度进行标定。在本发明中，采用传递光谱仪，结合非线性测量的方法实现了对待测光谱仪的光谱辐射亮度进行标定，由于线性标定不需要量值源头，能够消除面积测量和双向反射分布函数测量引入的误差，标定的结果准确性好，精度更高。

一种红外面场光谱仪光学系统及设计方法

本发明公开了一种红外面场光谱仪光学系统及设计方法，由视场光栏、准直镜、棱镜组、会聚镜和滤光片组成。光学系统为透射式，来自物方的光线从视场光栏出发，经过准直镜准直，再经过棱镜组色散，经过会聚镜会聚，再经滤光片后到达像面。视场光栏一侧表面刻有根据孔径编码算法设计的二维掩膜图案，色散元件为棱镜组。采用整体综合优化方法进行光学系统设计，确保光谱仪的像质、光谱畸变的同时，能有效减少光学元件数量，增大面区域视场。本发明的优点是：面视场大、像质优、光学效率高、光谱畸变低、光谱线性良好、结构简单紧凑，可用作大面场计算成像光谱仪的分光系统。

一种ccd校正方法、系统、具有ccd校正系统的光谱仪

本发明提供一种CCD校正方法、系统、具有CCD校正系统的光谱仪，所述的方法包括：采集入射光子输入像元一像元产生光电荷的理想值与实际值，获取所述理想值与所述实际值之间的斜率偏差；采集所述像元在不同积分时间下的斜率偏差，并在单位时间内进行归一化处理，获取归一值；通过多个所述归一值确定校正规则；根据所述校正规则以及各个像元的实际值，确定各个所述像元的校正值，完成校正。通过采集数据建立理想值与实际值之间的映射关系，拟合出相应的校正规则，完成光谱曲线的非线性校正，实现像元的校正。

一种框幅式fpi高光谱图像的辐射校正方法

本发明公开了一种框幅式FPI高光谱图像的辐射校正方法，在光谱成像仪系统级别的定标与校正，消除了感光单元内非光照引起的暗电流和边缘入射光线的透镜衰减影响。在辐射处理部分，非理想太阳光照条件导致图像之间的辐射差异很大。使用全局中值照度校正的方法消除了航带间照度变化引起的辐射亮度梯度差异。基于像底点标准化的BRDF校正消除了场景内与观测角度和方向相关的亮度梯度差异。使用Savitzky‑Golay滤波对光谱曲线进行抛光，消除了大气校正残余的吸收峰毛刺噪声。滤波后的图像的信噪比得到了明显的提升，尤其是原本信噪比较低的波段。另外，近红外波段的信噪比提升效果要优于可见光波段，提升幅度约为5个单位。

用于在测量系统中进行补偿的方法

本发明涉及一种用于在测量系统中进行补偿的方法。用于补偿在光谱测量系统(10)中不同波长处的不同灵敏度的方法，包括以下步骤：在相对于一个或多个已知参考标准的波长范围内校准测量系统(10)；创建用于线性化的波长相关补偿算法；以及使用补偿算法调整测量系统(10)。本发明进一步公开了相应的测量系统(10)。