СПОСОБЫ И СИСТЕМЫ ОПЕРАТИВНОГО КОНТРОЛЯ ФУНКЦИОНАЛЬНОГО СЛОЯ ПЛЕНКИ, СОДЕРЖАЩЕГО ПОДДАЮЩИЙСЯ ОБНАРУЖЕНИЮ КОМПОНЕНТ

FIELD: technological processes. SUBSTANCE: invention relates to a method of estimation of continuity of a functional layer of material. The technical result is achieved by way of estimating continuity of the functional layer of film which includes forming a sheet by extrusion of thermoplastic material through a ring matrix producing ring tape, hardening said tape and flattening into a flat configuration which will further be used for manufacturing multiple packages. The sheet is moving at a speed of five meters per minute. The functional layer of the sheet contains a mixture of a thermoplastic composition and a detectable component which is contained in the thermoplastic composition on a level detectable in the functional layer of the sheet. Detection of the functional layer and discontinuities of the functional layer is conducted through control of the sheet by a computer vision system capable of detecting presence or absence of a detectable component in the functional layer of the sheet. Control is implemented by scanning the shield in movement and in flat configuration. Scanning is conducted via a camera located (i) downstream from the point where the tape is hardened and flattened into a flat configuration, (ii) downstream from the point where the solid ring tape undergoes orientation forming ring sleeve film, (iii) upstream from the point where the ring tape is spooled up and cut, and (iv) in the sheet scanning position prior to the product being put into a package. At the same time, a signal is generated as a response to detecting a discontinuity in the functional layer. EFFECT: increased speed and efficiency of testing for discontinuities of film layers without interruption of film manufacturing process and without destroying any parts thereof. 19 cl, 4 tbl, 12 ex, 16 dwg РОССИЙСКАЯ ФЕДЕРАЦИЯ (19) RU (11) (13) 2 742 755 C1 (51) МПК B29C 48/92 (2019.01) ФЕДЕРАЛЬНАЯ СЛУЖБА ПО ИНТЕЛЛЕКТУАЛЬНОЙ СОБСТВЕННОСТИ (12) ОПИСАНИЕ ИЗОБРЕТЕНИЯ К ПАТЕНТУ (52) СПК B29C 48/92 ...

СПОСОБ И УСТРОЙСТВО ПРОВЕРКИ ИНСПЕКЦИОННОЙ СИСТЕМЫ ДЛЯ ОБНАРУЖЕНИЯ ПОВЕРХНОСТНЫХ ДЕФЕКТОВ

Система и связанный способ измерения оптических характеристик листа стекла на технологической линии

Solar generator for e.g. spacecraft, has light source and light sensors connected to evaluation unit to determine disorder of total reflection properties of internal reflection layer due to collision with space object

The generator (100) has a solar panel with a solar cell layer (102) having solar cells for converting an incident electromagnetic radiation into an electric current. A light source is coupled to a total internal light reflection layer (101) arranged on the solar cell layer. Light sensors are arranged at the periphery of the reflection layer to detect the intensity of light reflected in the reflection layer. The light source and the light sensors are connected to an evaluation unit to determine disorder of total reflection properties of the reflection layer due to collision with a space object.

VERFAHREN ZUR BESTIMMUNG DER OPTISCHEN QUALITAET VON FLACHGLAS ODER FLACHGLASPRODUKTEN

Verfahren zur Bestimmung der optischen Güte von Flachglas oder Flachglaserzeugnissen.

Verfahren zum Messen der winkelmaessigen Abweichung eines Lichtstrahls durch einen Pruefkoerper

VORRICHTUNG ZUR FESTSTELLUNG VON FEHLERN IN DURCHSICHTIGEN KOERPERN, INSBESONDERE FLACHGLASPLATTEN ODER -BAENDERN

VORRICHTUNG ZUM PRUEFEN VON REFLEKTIERENDEN FLAECHEN

Method for detecting bubbles or trapped matter in a glass body such as a glass tube during a continuous manufacturing process whereby images are detected of a surface of the glass body

The method involves coupling a light beam into a coupling region of the glass body such that the light propagates in a predetermined direction in the body by multiple reflection from first and second surfaces of the body. An image of the first or second surface is detected in an observation area which is spaced from the coupling area and the image is analyzed to detect the bubbles or trapped matter. Independent claims also cover an apparatus for manufacturing glass bodies.

Verfahren und Vorrichtung zur Überprüfung von scheibenförmigen Werkstücken auf Oberflächen-oder Einschlußfehler

DETECTION OF FAULTS IN TRANSPARENT MATERIAL USING LASERS

... 1315654 Fault finding PILKINGTON BROS Ltd P H GASKELL and D LOWE 14 May 1970 [21 May 1969] 25996/69 Heading G1A A method or apparatus for inspecting transparent ribbon or sheet material for internal defects includes directing a laser beam into the inside of the sheet material, effecting relative movement between the laser beam and the ribbon or sheet material so that the beam scans the ribbon or sheet material, locating a detector at a position removed from the normal light entry and exit paths of the sheet and detecting light scattered by a defect when the scanning beam impinges on the defect. Two kinds of embodiment are disclosed one in which light enters the sheet by its edge and the detector receives scattered light from the major surface of the sheet, the other in which the light is directed onto the major surface of the sheet and a detector inclined to the major surface receives any light scattered from any defect present. In both embodiments facilities are provided by means of logic ...

METHOD OF DETECTING DEFECTS IN TRANSPARENT MATERIALS

Detecting defects in transparent materials

A method of detecting defects present at the surface and/or internally in transparent materials, particularly of detecting included foreign bodies or bubbles in glass, is disclosed. The test material is scanned with an electromagnetic radiation of a single wavelength which is set to the penetration depth in the test material. The intensity reflected by the defects is picked up and analyzed. By this method only defects located up to a specified depth in the material are detected. Visible light as well as UV- or IR radiation may be applied. The associated test rig comprises a tunable Laser (2), a conveyor belt (6) carrying the test material (5), a fast rotating mirror-wheel (3) which directs the light beam (4) at high speed over the test material (5), and an optical sensor (7) connected with an analyzer unit (8).

Testing for irregularities in transparent sheet material

... 1,086,158. Checking transparent sheets. FORD MOTOR CO. Ltd. Aug. 26, 1965 [Sept. 1, 1964], No. 36667/65. Heading G1A. To detect irregularities in sheets with nominally parallel faces, a light source 12 and associated sensing unit 17 scan the sheet to measure the local transmitted intensity which is compared with the average intensity. In the form shown the output from the sensor 17 is fed to an amplifier 23, the output of which is split into parts A', B', the latter being fed to an integrating circuit 19 which produces an averaged output B. The latter is multiplied in a multiplier 27, by C, the output from an amplifier 26 fed by the product BC added to A', in the network 25. It is shown that C = A'/B if 26 has a high gain this quantity actuates the indicator 22. The mask 18, associated with the sensor 17, provides a narrow field of view. In another embodiment a separate sensor, placed close to the transparent sheet and provided with a diffuser, is used to generate the quantity B directly ...

The optical inspection system for inspecting a flat glass pane

Die Erfindung betrifft eine Inspektionsanlage für das automatische optische Prüfen einer Flachglasscheibe ( 1) , wobei die Inspektionsanlage eine Fördervorrichtung für das lineare Bewegen der Flachglasscheibe (1) entlang einer optischen Prüfungseinheit (5) aufweist, sowie eine Messvorrichtung (6), welche in der zur Förderrichtung der Fördervorrichtung parallelen Richtung die Position der Flachglasscheibe ( 1) relativ zur optischen Prüfungseinheit (5) laufend misst. Die Messvorrichtung ( 6) weist einen parallel zur Förderrichtung ausgerichteten Längenmaßstab (7) auf und einen entlang des Längenmaßstabes bewegbaren Messschieber (8), dessen Relativposition zum Längenmaßstab (7) sensorisch erfassbar ist. Einer der beiden Teile Längenmaßstab ( 7) und Messschieber ( 8) ist gegenüber der optischen Prüfungseinheit (5) ortsfest angeordnet, der andere Teil ist mit der Flachglasscheibe (1) mitbewegbar.

The optical inspection system for inspecting a flat glass pane

Die Erfindung betrifft eine Inspektionsanlage für das automati­ sche optisehe Prüfen einer Flachglasscheibe (1), wobei die In­ spektionsanlage eine Fördervorrichtung (2) für das lineare Bewe­ gen der Flachglasscheibe (1) entlang einer optischen Prüfungsein­ heit (5) aufweist, sowie eine Messvorrichtung (6), welche in der zur Förderrichtung der FördervorrichLung (2) parallelen Richtung die Position der Flachglasscheibe (1) relativ zur optischen Prü­ fungseinheit (5) laufend misst. Die Messvorrichtung (6) weist einen parallel zur Förderrichtung ausgerichteten Längenmaßstab (7) auf und einen entlang des Län­ genmaßstabes bewegbaren Messschieber (8), dessen Relativposition zum Längenmaßstab (7) sensorisch erfassbar ist. Einer der beiden Teile Längenmaßstab (7) und Messschieber (8} ist gegenüber der optischen Prüfungseinheit (5) ortsfest angeordnet, der andere Teil ist mit der Flachglasscheibe (1) mitbe\'7egbar.

METHOD FOR DETECTING DISCONTINUITIES IN A TRANSLUCENT ARTICLE

Verfahren zu einer zerstörungsfreien Detektion von geometrischen Diskontinuitäten in einem lichtdurchlässigen Werkstück, wobei von zumindest einer Lichtquelle emittierte Lichtstrahlen auf das Werkstück gerichtet werden, sodass eine erste Teilmenge der Lichtstrahlen unter einem ersten Reflexionswinkel an der Werkstückoberfläche reflektiert wird und eine zweite Teilmenge der Lichtstrahlen unter einem ersten Brechungswinkel durch das Werkstück transmittiert wird, wobei eine dritte Teilmenge an Lichtstrahlen durch die Diskontinuitäten unter einem zweiten Reflexionswinkel an der Diskontinuitätenoberfläche der Diskontinuität reflektiert wird und durch die Diskontinuitäten unter einem zweiten Brechungswinkel transmittiert wird, wobei die reflektierten Lichtstrahlen durch eine Hyperspektralkamera und/oder monochromatische Lichtstrahlen als transmittierte Lichtstrahlen mittels einer optischen Kamera aufgenommen werden.

Method and system for identifying and measuring a defect that reduces transparency in a substrate for a security document

Verfahren zur Messung eines Defektgrads einer Region eines Substrats für ein Sicherheitsdokument, wobei der Defektgrad mit der verringerten Transparenz der Region des Substrats in Zusammenhang steht, wobei das Verfahren folgende Schritte umfasst: digitale Bilderfassung der Region, um ein digitales Bild zu erzeugen, wobei das digitale Bild Lichtintensitätsdaten enthält; und Analysieren des digitalen Bildes, umfassend: Berechnen eines statistischen Maßes der Lichtintensitätsdaten in der Region; und Zuweisen einer Defektkennzahl an die Region auf Grundlage des statistischen Maßes der Lichtintensitätsdaten in der Region.

ARRANGEMENT FOR THE OPTICAL COLLECTION OF SPATIAL UNEVENNESS IN THE STRUCTURE ONE EXAMINING OBJECT.

ARRANGEMENT FOR EXAMINING THE SEALING OF INSULATION GLASS DISKS

PROCEDURE AND DEVICE FOR EXAMINING TRANSPARENCIES MATERIALBAHNEN, IN PARTICULAR FLACHGLASBAENDERN.

MESSSYSTEM FÜR DIE FORMERFASSUNG VON GLASPLATTEN

Die Gebrauchsmusteranmeldung betrifft ein Meßsystem für die Formerfassung von Glasplatten im Produktionsprozeß. Das System arbeitet mit optoelektronischen Sensorelementen und bietet daher alle Vorteile berührungsloser Meßtechnik. Die zu vermessenden Glasplatten werden gem. Fig. 1 auf einer Rollenbahn unter einer Sensorbrücke durchgeführt. In der Sensorbrücke sind linienförmig Lichtquellen (Infrarot-LEDs) und Empfängerelemente (Fotodioden, -transistoren) angeordnet, welche das von den Lichtquellen ausgehende und in einem definierten Meßbereich von der Glasoberfläche reflektierte Licht erfassen und verarbeiten. Bei Bedarf können zusätzliche Lichtquellen an der Unterseite der Rollenbahn angebracht werden. In einem Meßvorgang wird die gesamte Breite der Rollenbahn abgetastet. Unter der Voraussetzung des Vorschubs der Platten mit bekannter Geschwindigkeit kann eine rasterförmige Abtastung der Platten mit nachfolgender Formberechnung erfolgen. Die Anordnung kann um weitere Sensoren für Glasdicke ...

SYSTEM AND METHOD OF IMAGING THE CHARACTERISTICS OF AN OBJECT

... ²²²A system and method for imaging the characteristics of an object (2) having at ²least a first (2a) and a second (2b) layer. The object (2) is illuminated by ²means of incident light (4), and light (5b) reflected from the object (2) is ²detected by means of an imaging sensor (6) in which the detected light is ²converted into electrical charges, according to which a representation of the ²object (2) is created. Information on light scattered (5a) in the first layer ²(2a) and the second layer (2b) of the object (2) is obtained from the ²representation and this information is compared to stored information in order ²to detect defects on the object (2).² ...

APPARATUS FOR INSPECTING FLAT GLASS

The invention provides novel apparatus for detecting and marking defects in flat glass advancing on a conveyor, for example a ribbon of float glass. There are two viewing stations on opposite sides of the centre line of the conveyor and spaced longitudinally so that there is staggered viewing of the two halves of the width of the advancing glass. Light reflected obliquely through each half is received on a viewing screen mounted above the respective side of the conveyor. Images of defects are recognised by examiners viewing the screens and the defects are marked by operation of appropriate maker guns positioned above the conveyor.

DETECTION OF FAULTS IN TRANSPARENT MATERIAL USING LASERS

METHOD AND APPARATUS FOR TESTING OPTICAL DEFECTS IN TRANSPARENT SHEETS, IN PARTICULAR, GLASS

GLASS SHEET ACQUISITION AND POSITIONING SYSTEM

A glass sheet acquisition and positioning system and associated method are utilized in a glass sheet optical inspection system installed in-line in a glass sheet processing system. The acquisition and positioning system include an exterior support frame and a moveable glass sheet support frame connected to the exterior support frame such that the glass sheet support frame may be selectively positioned from first orientation whereby a glass sheet is removed from a conveyor and retained on the support frame, to a second orientation whereby the glass sheet is positioned for processing by the optical inspection system. The system may also include a glass sheet part identifier and a programmable control including logic for analyzing acquired image data and identifying the glass sheet as one of a set of known part types and thereafter securing and positioning the glass sheet on the glass sheet support frame based upon the part-shape analysis.

PROCESS AND APPARATUS FOR THE DETECTION OF FLAWS IN TRANSPARENT SHEETS OF GLASS

GLASS INSPECTION SYSTEM

An inspection system for a sheet of glass. The system comprises a first laser and a second laser, each of which provide a sheet of light, a cylindrical lens system, and a first light detection system and a second light detection system. The first laser is located at the focal point of the lens system. The second laser is located at a distance from the lens system that is greater than that of the first laser, and off of the axis of the lens system. The first light detection system receives light from the first laser and the second light detection system receives light from the second laser. The inspection system is adapted to position a sheet of glass between the lens system and the detection systems. A method is also described.

Laminated layered body testing method for solar modules, involves scanning layered body according to dot matrix, converting extracted signals into digital data, storing data of modules as data record, and performing evaluation of data

The method involves optically scanning a layered body according to a dot matrix by an optical scanner (2). Extracted signals are converted into digital data. Data of solar modules (1) is stored as data record, and evaluation of the data is performed. Image parameters are changed, and an image is output by a printer. The data record is processed in a data processing system, and is produced based on default output signals. The optical scanner is arranged in an area of transport units. The layered body is transported through a detection area of the scanner. An independent claim is also included for a device for testing a laminated layered body.

DEVICE FOR ANALYSIS OF VISIBLE DEFECTS IN TRANSPARENT SUBSTRATE

СПОСОБ И УСТРОЙСТВО АНАЛИЗА ОПТИЧЕСКОГО КАЧЕСТВА ПРОЗРАЧНОЙ ПОДЛОЖКИ

Это устройство (1) анализа прозрачной поверхности подложки (2) содержит миру (10), располагаемую напротив поверхности измеряемой подложки. Мира сформирована на носителе (11) с малой и большой протяженностью. Предусмотрена камера (3) для получения по меньшей мере одного изображения миры, деформированного измеряемой подложкой. С камерой (3) связаны система (4) освещения миры и средства (5) цифровой обработки изображения и анализа. Носитель (11) имеет вытянутую форму, мира является однонаправленной и представляет собой рисунок (10), расположенный вдоль наименьшей протяженности носителя. Рисунок (10) является периодическим поперечно к малой протяженности, и камера является линейной.

DEVICE AND METHOD FOR MEASURING DEFECTS, CAUSING DISTORTION, IN PERIODS OF BAND OF FLOAT - GLASS

Glass waviness inspection device

PROCESS FOR THE RESEARCH OF THE DEFECTS OF THE GLASS LEAFS AND DEVICE IMPLEMENTING THIS PROCESS

METHOD FOR MEASURING THE TEMPERATURE OF A GLASS

Process for the determination of the quality of glass and in particular of the wire rolled glass

APPARATUS AND PROCESS Of INSPECTION TO DETECT a DISTORTION OF the SURFACE Of a REFLECTIVE MATTER SHEET

DEVICE Of ANALYSIS OF the BLEMISHES Of a TRANSPARENT SUBSTRATE

Dispositif (1) d'analyse de la qualité optique d'un ou plusieurs substrat(s) (2) au moins partiellement transparent(s), par exemple un ruban de verre, en défilement par rapport au dispositif (1), comprenant : • un système d'éclairage (4, 6) pour former une image en transmission à travers le substrat (2) et/ou en réflexion sur le substrat (2) ; • une caméra (12) pour une acquisition de l'image transmise et/ou réfléchie par le ou les substrat(s) (2) ; • une unité de commande (14) comportant une mémoire (15) sur laquelle sont stockés des programmes de commande de l'acquisition des images par la caméra (12), dans lequel • le système d'éclairage (4, 6) est apte à produire simultanément des éclairages de type différent dans des zones disjointes d'éclairage (8A, 8B, 8C, 10A, 10B, 10C) à travers lesquelles le ou chaque substrat (2) est destiné à défiler ; • la caméra (12) est matricielle et apte à acquérir une image de plusieurs lignes de pixels, le dispositif (1) étant configuré de telle sorte ...

A METHOD FOR DETERMINING the QUALITY Of a FLAT GLASS LEAF

La présente invention a pour objet un procédé pour déterminer la qualité d'une feuille de verre plat. Procédé consistant à illuminer ladite feuille de verre avec un rayon de lumière suivant un angle aigu par rapport à ladite feuille de verre, positionner un masque comportant des parties opaques et transparentes alternées de façon à recevoir la lumière provenant dudit rayon après qu'il ait rencontré ladite feuille de verre, déplacer ledit rayon depuis un premier emplacement de ladite feuille jusqu'à un second emplacement de ladite feuille et amener ledit rayon lumineux à se déplacer le long dudit masque, recueillir la lumière passant à travers ledit masque, mesurer la durée d'impulsion de ladite lumière recueillie, et corréler ladite durée mesurée à ladite qualité de ladite feuille de verre.

PROCESS AND DEVICE TO DETECT DEFECTS IN TRANSPARENT MATERIALS

liquid crystal process defect inspection apparatus and inspection method

Glass waviness inspection device and inspection method thereof

필름의 결함 검사 장치, 결함 검사 방법 및 이형 필름

... 장척물의 필름의 결함을 검출하는 검사 장치로서, 상기 필름의 한쪽면측에 상기 필름을 조명하는 조명 수단과, 상기 조명 수단과 상기 필름 사이에 설치된 제 1 편광판과, 상기 필름의 다른쪽면측에 설치된 제 2 편광판과, 상기 필름의 다른쪽면측에 설치되고 상기 조명 수단으로부터 조명되어 상기 제 1 편광판, 상기 필름 및 상기 제 2 편광판을 투과해온 투과광을 수광하는 수광 수단을 갖고, 상기 제 1 편광판의 각도를 상기 제 1 편광판의 면 내에서, 상기 제 2 편광판의 각도를 상기 제 2 편광판의 면 내에서 각각 독자적으로 조정하는 각도 조정 수단을 갖는 것을 특징으로 하는 필름의 결함 검사 장치로 한다.

SUBSTRATE INSPECTION APPARATUS AND SUBSTRATE INSPECTION METHOD USING SAME

The present invention is a substrate inspection apparatus and substrate inspection method, which use a single optical sensor per single substrate, or use a smaller number of optical sensors so as to inspect cracking of the substrate. The substrate inspection apparatus according to one embodiment of the present invention comprises at least one optical sensor for inspecting a vertical edge of the substrate which has a horizontal edge parallel to a substrate transfer direction and the vertical edge vertical to the substrate transfer direction; and an optical sensor moving unit for moving the optical sensor, wherein the optical sensor moves at a predetermined angle with respect to the line extending from the horizontal edge of the substrate, and the optical sensor moves along the vertical edge of the substrate while the substrate is being transferred.

method and system for detecting inclusions in float glass based on the analysis of the length (sec) (sec) wavelength

Optical system correction method of an in-line substrate inspection device as well as in-line substrate inspection device

In this invention, a correction operation (maintenance) area for performing a correction operation of an optical system is installed at a position except an inspection area of an inspection stage or a transport conveyer. The inspection stage has a function of transferring a substrate from an upper stream line towards a lower stream line, so that a moving stroke of the optical system can be moved till the correction operation area, and the correction operation of the optical system can be performed outside the inspection area. In the correction operation area, the inspection is performed by using a standard particle-containing substrate that moves in a state the same as the movement of a real substrate, so as to perform accurately the correction operation of the optical system. The correction operation is performed accurately so that the height of the standard particle-containing substrate is consistent with the height of the substrate in the inspection area.

Information storage/readout device for use in continuously manufacturing system for liquid-crystal display elements, and method and system for producing the same

An information storage/readout device for use in a system for continuously manufacturing liquid-crystal display elements comprises an information storage medium which stores therein slitting position information created based on the position of a defect detected by an inspection of a continuous polarizing composite film included in a continuous optical film laminate including a continuous polarizing composite film formed with an adhesive layer and a continuous carrier film releasably laminated on the adhesive layer, to indicate defective-polarizing-sheet slitting positions defining a defective or defect-containing polarizing sheet, and normal-polarizing-sheet slitting positions defining a normal or defect-free polarizing sheet, in the continuous inspected optical film laminate, and a roll of the continuous inspected optical film laminate which is provided with an identification indicia. In continuous manufacturing of liquid-crystal display elements, the present invention can dramatically ...

Method of reducing distortion in a sheet of glass

APPARATUS AND METHOD FOR MEASURING HAZE OF SHEET MATERIALS OR OTHER MATERIALS

A method includes illuminating (902) a material (102, 202, 302) with first light (108, 208, 308, 504, 604, 802) and capturing (904) an image (400, 700) of second light (114-116, 214-216, 314-316, 804, 808, 814, 816, 822) transmitted through the material. The method also includes analyzing (908) multiple regions (402-406, 702) of the image and determining (910) one or more haze measurements associated with the material based on the analyzing. The method further includes storing and/or outputting (910) the one or more haze measurements. Analyzing the multiple regions of the image may include summing pixel values in each region to produce a total pixel value for that region. The multiple regions of the image may include (i) a first region forming a first disc, (ii) a second region forming either a first annular region around the first region or a second disc larger than and including the first disc, and (iii) a third region forming either a second annular region around the second region or ...

METHOD AND APPARATUS FOR IMAGING INHOMOGENEITY IN A TRANSPARENT SOLID MEDIUM

This invention is related with a method and apparatus for inspecting chemical inhomogeneities in a solid transparent material by way of generating a shadow image of the sample material and recorging said image digitally or photographically. The method consists of scanning the shadow image of a stationary sample where the illuminance information across the sample thickness is combined with position information along the sample in order to generate a shadow image of the sample. The method and apparatus signaficantly reduce analysis time, material and energy costs, and increase image quality and test safety especially in the case of analysis of inhomogeneities in samples of glass manufacture such as float glass.

PICK-UP SYSTEM OF GLASS SHEETS

This invention relates to a sheet pick-up system which classifies cut glass sheets into graded products of a plurality of quality levels and picks up products of a desired grade at a time in the production line of the glass sheets. A discriminating type defect detector (101) detects the size and position of any defect existing on ribbon-shape glass sheets withdrawn from a kiln and conveyed on a line conveyor and sends them as defect data to a control unit (102). The control unit (102) sorts the quality grades of the cut glass sheets on the basis of the fault data. A sheet pick-up machine (110) having a push-up device (112) and a suction conveyor (111) picks up products of a desired grade under the control of the control unit (102).

Method and apparatus for optically inspecting a moving web of glass

An automatic optical inspection of a moving web of glass for defects is provided by transversely scanning a moving web of glass with a light source which is internally reflected within the glass and travels towards the edge of the glass when the scanning light source strikes defects within the web. The light leaving the edges of the glass as a result of internal reflection is captured on opposite edges of the glass web. The captured light is detected and converted to electrical signals which are utilized to determine whether defects are present in the glass web in accordance with the characteristics of the electrical signals so generated. An apparatus is provided for the inspection method which includes edge detectors having a mouthlike construction fitting over the edges of the glass web and collecting internally reflected radiation from the edges of the web and applying it to photomultiplier tubes which are cooled. The mouthlike structure is made completely light tight by having brushes ...

METHOD AND SYSTEM FOR DETECTING INCLUSIONS IN FLOAT GLASS BASED ON WAVELENGTH(S) ANALYSIS

A method and/or system is provided for detecting inclusions (e.g., nickel sulfide based inclusions/defects) in soda-lime-silica based glass, such as float glass. In certain example instances, during and/or after the glass-making process, following the stage in the float process where the glass sheet is formed and floated on a molten material (e.g., tin bath) and cooled or allowed to cool such as via an annealing lehr, light is directed at the resulting glass and reflection of various wavelengths (e.g., red and blue wavelengths) is analyzed to detect inclusions. 2. The method of claim 1 , wherein the first wavelength is a red wavelength.3. The method of claim 1 , wherein the second wavelength is a blue wavelength.4. The method of claim 1 , wherein the first wavelength comprises wavelengths in a range from about 650-700 nm.5. The method of claim 1 , wherein the second wavelength comprises wavelengths in a range from about 400-480 nm.6. The method of claim 1 , wherein the reflected wavelengths are wavelengths refracted and/or scattered by the inclusion in the glass.7. The method of claim 1 , wherein said at least one light source comprises a first light source and a second light source.8. The method of claim 7 , wherein a first color filter is provided between the glass and the first light source claim 7 , and a second color filter is provided between the glass and the second light source.9. The method of claim 1 , wherein said determining whether an inclusion comprising nickel sulfide is present in the glass based at least on a difference between first and second reflected wavelengths comprises analyzing at least one image comprising reflections from the inclusion.10. The method of claim 1 , further comprising determining whether to pass or reject the glass based at least on whether an inclusion is detected.11. The method of claim 1 , wherein the light source is located on and/or in a float line claim 1 , and is positioned after an annealing lehr of the float line.12. ...

DEFECT OCCURRENCE SOURCE IDENTIFICATION METHOD AND CONVEYING DEVICE MAINTENANCE METHOD

The present invention relates to a method for identifying a defect occurrence source, said method including identifying a roll that generates defects at constant intervals in a conveying direction of a sheet-shaped glass when the sheet-shaped glass is conveyed by a plurality of rolls in an annealing device including a conveying device having the plurality of rolls, in which a peripheral velocity of a certain roll of the plurality of rolls is changed so as to be different from a conveyance speed of the sheet-shaped glass, thereby identifying a roll constituting the defect occurrence source, according to the result of a determination on whether or not there has been a change in intervals between the defects before and after changing the peripheral velocity.

Method of inspecting transparent substrates

The invention relates to an inspection method for inspecting a distribution of thickness of a transparent substrate, characterized in that: a first transparent substrate having a known distribution of thickness and a second transparent substrate to be inspected are prepared, wherein the difference of thickness in average between first and second transparent substrates is not more than 50 µm, the first transparent substrate and the second transparent substrate are arranged so that light transmits through a first substrate and a second substrate, a substrate gap of at least 0.1 mm is provided between the first substrate and the second substrate, a light source for irradiating light whose half value width with respect to the peak luminance is at least 5 nm is prepared, and the degree of distribution of thickness of the second transparent substrate is judged from an interference intensity distribution of light passing through the first transparent substrate and the second transparent substrate ...

Flaw detection system for light-transmitting plate material

A flaw detection system that can detect not only bubbles, stones and knots but also flaws, such as cords and reams, that are subject to less optical changes in transmitted light is provided. A glass plate (10) travelling in a manufacturing line is scanned with a beam spot (26) in the direction orthogonally intersecting the manufacturing line. The light transmitted through the glass plate (10) is received by an optical-fiber array (32) arranged in a direction orthogonally intersecting the line. Optical fibers (34) in the optical-fiber array are connected cyclically to a plurality of photomultipliers (PM1-PM10), which convert the light received by the optical fibers into electrical signals (SG1-SG10). Flaw signals are produced by extracting flaw information signals (TH+, TH-, MASK) from these electrical signals in an analog processing section (44), and masking them in a masking section (46). Positional information indicating flaw patterns and positions is produced from these flaw signals.

METHOD AND APPARATUS FOR DETECTING DEFECTS IN TRANSPARENT MATERIAL

PROBLEM TO BE SOLVED: To provide a method and an apparatus for detecting defects present in a transparent material. SOLUTION: The method of detecting defects in a transparent material comprises a process of irradiating a certain volume part in the transparent material with a first radiation light source, a process irradiating and coupling the interior of the transparent material with light of a second radiation light source such that the optical path of the light in the volume part diverges only within the transparent material, and a process of detecting scattered light from defects in the volume part, brightness visual-field absorption from the defects in the volume part and/or the deviation of light from the first radiation light source resulting from the defects in the volume part to detect the presence of the defects in the volume part in the transparent material. COPYRIGHT: (C)2005,JPO&NCIPI ...

FLAW DETECTING METHOD OF TRANSPARENT PLATE-SHAPED BODY AND FLAW DETECTOR THEREFOR

PROBLEM TO BE SOLVED: To provide a flaw detecting method of a transparent plate-shaped body constituted so as to be capable of detecting only the surface flaw of the transparent plate-shaped body, and a flaw detector therefor. SOLUTION: The flaw detector 1 is equipped with a luminaire 4 for obliquely irradiating the front 3a of a transparent glass substrate 3 with linear illumination light 2, a line sensor 5 for detecting the linear illumination light 2 regularly reflected by the front 3a, an image processing device 6, a display device 7 and shield plates 8-10. The flaw present in the transparent glass substrate 3 is detected on the basis of the output of the line sensor 5. The width of the linear illumination light 2 is adjusted by the first and second shield plates 8 and 9 so as to separate the linear surface reflected light 2A formed by regularly reflecting the linear illumination light 2 by the front 3a of the transparent glass substrate 3 and the linear rear reflected light 2B formed ...

Система захвата и позиционирования листа

FIELD: glass industry. SUBSTANCE: system for gripping and positioning a glass sheet and a method associated therewith are used in a system for controlling optical characteristics of a glass sheet embedded into a processing line of a glass sheet processing system. Clamping and positioning system comprises an outer support frame and a movable support frame for supporting a glass sheet connected to an outer support frame so that the support frame for supporting the glass sheet can be selectively positioned from its first orientation, as a result of which the glass sheet is removed from the conveyor and held on the support frame, into the second orientation, as a result of which the glass sheet is positioned for processing using the optical characteristics monitoring system. System may also include part identifier in form of glass sheet and programmable control device, comprising a logic device for analyzing captured image data and identifying a glass sheet as one of a set of known types of parts and thereafter and positioning the glass sheet on the support frame to support the glass sheet based on the shape analysis of the part. EFFECT: higher reliability of system. 28 cl, 7 dwg РОССИЙСКАЯ ФЕДЕРАЦИЯ (19) RU (11) (13) 2 733 005 C2 (51) МПК B65G 47/90 (2006.01) B65G 49/06 (2006.01) G01N 21/89 (2006.01) G01N 21/896 (2006.01) G01N 21/958 (2006.01) ФЕДЕРАЛЬНАЯ СЛУЖБА ПО ИНТЕЛЛЕКТУАЛЬНОЙ СОБСТВЕННОСТИ (12) ОПИСАНИЕ ИЗОБРЕТЕНИЯ К ПАТЕНТУ (52) СПК B65G 47/902 (2020.05); B65G 49/068 (2020.05); G01N 21/8914 (2020.05); G01N 21/896 (2020.05); G01N 21/958 (2020.05); G01N 2021/9586 (2020.05) (21)(22) Заявка: 2017131850, 02.02.2016 02.02.2016 Дата регистрации: (73) Патентообладатель(и): Гласстек, Инк. (US) 28.09.2020 05.03.2015 US 14/639,655 (43) Дата публикации заявки: 05.04.2019 Бюл. № 10 (56) Список документов, цитированных в отчете о поиске: US 2012/098959 A1, 26.04.2012. US 4895244 A, 23.01.1990. US 5238100 A, 24.08.1993. US 4325723 A, 20.04.1982. US 2009/0282871 A1, 19.11.2009. ...

ОПТИЧЕСКИЕ УСТРОЙСТВА ДЛЯ КАЛИБРОВКИ И ДЛЯ АНАЛИЗА КАЧЕСТВА ОСТЕКЛЕНИЯ И СПОСОБЫ ДЛЯ ЭТОГО

Verfahren zur Bestimmung der Dicke und des Brechungsindex von optisch transparenten Schichten auf optisch transparenten planparallelen Substraten

ANORDNUNG ZUR OPTISCHEN ERFASSUNG RAEUMLICHER UNEBENHEITEN IN DER STRUKTUR EINES ZU UNTERSUCHENDEN OBJEKTS

Fault detection system for plastic film or paper web comprises two light sources with a reflector below and second reflector between them, two cameras providing image to monitor it and control system for cameras

Fault detection system for strip material comprises two light sources (11a, 11b) with a reflector (13) below them and a second reflector (12) between them. Two cameras (15a, 15b) positioned above the strip provide an image by which it can be monitored. A control system (16) detects the point at which the emitted light exceeds a predetermined value and sends a control signal to the cameras. The control system (16) comprises two photodetectors, each of which is assigned to one light source, detecting the point at which the emitted light exceeds a predetermined value and sends a control signal to the cameras. Independent claims are included for: (a) a lighting system comprising a least two light sources with a main reflector and intermediate reflectors positioned between them; (b) a control system for a receiver system as described above; and (c) a receiver system fitted with the control.

METHOD OF DETECTING DEFECTS IN TRANSPARENT AND SEMI TRANSPARENT BODIES

... 1412990 Detecting defects in a glass sheet ASAHI GLASS CO Ltd 15 Dec 1972 57917/72 Heading G I A In a device for detecting defects in transparent material 22 having a figured surface on one side and a smooth surface on the opposite side, a detector 27 is positioned outside the normal beam paths or regions to only receive scattered light from sources 11 and 21, as shown, that has passed through or scattered off a defect in the material. Fig.5 shows a series of equal intensity distribution curves a, b 1 , b 2 due to normal transmitted and reflected parallel light and a series a', b', due to different kinds of defects (inside the glass or on the smooth surface of the glass), and the detector 27 is positioned, as shown, such that it only receives light scattered from these defects.

METHOD OF AND APPARATUS FOR DETERMINING THE LOCATION OF DEFECTS PRESENT IN FLAT GLASS

APPARATUS AND METHOD FOR INSPECTING GLASS

SYSTEM FOR DETERMINING THE NATURE OF OPTICAL DISTORTION IN GLASS

... 1466118 Investigating sheet glass PPG INDUSTRIES Inc 26 Feb 1974 [31 May 1973] 8602/74 Heading G1A In a device for investigating variations in surface contours and variations in the refractive index of a moving glass sheet 12, both sides of the glass sheet are scanned by light from lasers 22 or 39 directed via a polarization filter attenuator 26 or 42 on to the surfaces 12, 18. The reflected light is received by detectors 30, 46 whose output varies in dependence upon the position of the centroid of the incident beam on its sensitive surface. Thus slight variations in the surface contours will cause corresponding movements of the corresponding light beam on the detector's sensitive surface. Variations in the refractive index of the glass sheet combined with the surface contour variations are measured with the aid of a further position sensitive detector 58 placed to receive the light passing through the sheet from one of the sources 22. All three detectors are processed as shown, Fig. 2, ...

INSPECTING GLASS

Verfahren und Vorrichtung zur Charakterisierung von Spannungen in einem flächigen, transparenten Gegenstand

Die Erfindung betrifft ein Verfahren zur Charakterisierung von Spannungen in einem flächigen, transparenten Gegenstand (2), insbesondere in einer Glasscheibe wie einer Flachglasscheibe, wobei eine Änderung einer Polarisation eines den transparenten Gegenstand (2) durchdringenden Lichtes gemessen wird. Erfindungsgemäß ist vorgesehen, dass das Licht von zumindest einer flächigen Lichtquelle (3) abgestrahlt wird, wobei die Lichtquelle (3) vom transparenten Gegenstand (2) beabstandet ortsfest angeordnet wird. Weiter betrifft die Erfindung eine Vorrichtung (1) zur Charakterisierung von Spannungen in einem flächigen, transparenten Gegenstand (2), insbesondere in einer Glasscheibe wie einer Flachglasscheibe, mit welcher eine Änderung einer Polarisation eines den transparenten Gegenstand (2) durchdringenden Lichtes messbar ist. Erfindungsgemäß ist mindestens eine flächige Lichtquelle (3) vorgesehen, welche das Licht abstrahlt, und eine Transporteinrichtung (7) vorgesehen ist, in welcher der transparente ...

Verfahren zur Detektion von Diskontinuitäten in einem lichtdurchlässigen Werkstück

Verfahren zu einer zerstörungsfreien Detektion von geometrischen Diskontinuitäten in einem lichtdurchlässigen Werkstück, wobei von zumindest einer Lichtquelle emittierte Lichtstrahlen auf das Werkstück gerichtet werden, sodass eine erste Teilmenge der Lichtstrahlen unter einem ersten Reflexionswinkel an der Werkstückoberfläche reflektiert wird und eine zweite Teilmenge der Lichtstrahlen unter einem ersten Brechungswinkel durch das Werkstück transmittiert wird, wobei gegebenenfalls eine dritte Teilmenge an Lichtstrahlen durch die Diskontinuitäten unter einem zweiten Reflexionswinkel an der Diskontinuitätenoberfläche der Diskontinuität reflektiert wird und eine vierte Teilmenge an Lichtstrahlen durch die Diskontinuitäten unter einem zweiten Brechungswinkel transmittiert wird, wobei monochromatische Lichtstrahlen als transmittierte Lichtstrahlen mittels einer optischen Kamera aufgenommen werden und wobei die Lichtstrahlen unter Verwendung eines Streulichtringes von der Lichtquelle abgegeben ...

Method and apparatus for the treatment of flat glass units to a glass processing equipment

Die Erfindung betrifft ein Verfahren und eine Vorrichtung zur Behandlung von Flachglaseinheiten an einer glasverarbeitenden Anlage (100), wobei die Flachglaseinheiten (200; T; 201, 202, 203) mindestens eine mit einer Beschichtung versehe Glasfläche aufweisen, und wobei die Beschichtung mindestens eine Entschichtungskontur entlang einer Grenze zwischen beschichteter und entschichteter Glasfläche aufweist. Insbesondere wird zur Vorbereitung von Schneidvorgängen in einer Schneidevorrichtung (120) die mindestens eine Entschichtungskontur (K, K') mittels einer Sensorik (S) für eine qualitative und/oder quantitative Prüfung erfasst, um beispielsweise eine optimale Schnittlinie zu bestimmen und einen nachfolgenden Schneidvorgang entsprechend zu steuern. Die Sensorik weist vorzugsweise ein optisches Sensormittel (S) auf, der insbesondere einen Kontrast-, Reflexions- und/oder Bildsensor verwendet wird, wobei das Sensormittel insbesondere als Kamera ausgebildet ist.

VORRICHTUNG ZUM ERFASSEN DES UMRISSES UND ALLFÄLLIGER FEHLSTELLEN EINER FLACHGLASSCHEIBE

Es wird eine Vorrichtung zum Erfassen des Umrisses und allfälliger Fehlstellen einer Flachglasscheibe (1) mit einem Förderer (2) für die Flachglasscheibe (1), mit einer dem Förderer (2) zugeordneten, digitalen Bilderfassungseinrichtung (3) zur optischen Erfassung der Flachglasscheibe (1), mit einer der digitalen Bilderfassungseinrichtung (3) bezüglich der Flachglasscheibe (1) gegenüberliegenden, aus Leuchtdioden (6) mit einer nachgeschalteten Optik (7) zur Gleichrichtung des gegen die Flachglasscheibe (1) abgestrahlten Lichts aufgebauten Beleuchtungseinrichtung (4) für die Flachglasscheibe (1) im Bilderfassungsbereich und mit einer Auswerteschaltung (12) für die von der digitalen Bilderfassungseinrichtung (4) aufgenommenen Daten beschrieben. Um eine vorteilhafte Umriss- und Fehlstellenerfassung zu ermöglichen, wird vorgeschlagen, dass die Bilderfassungseinrichtung (3) wenigstens zwei sich über die quer zur Vorschubrichtung (5) erstreckende Breite der Flachglasscheibe (1) erstreckende Reihen ...

VORRICHTUNG ZUM ERFASSEN DES UMRISSES UND ALLFÄLLIGER FEHLSTELLEN EINER FLACHGLASSCHEIBE

VERFAHREN ZUM PRÜFEN EINES GEGENSTANDES AUS GLAS AUF EINSCHLÜSSE

VORRICHTUNG ZUM ERFASSEN DES UMRISSES UND ALLFÄLLIGER FEHLSTELLEN EINER FLACHGLASSCHEIBE

Es wird eine Vorrichtung zum Erfassen des Umrisses und allfälliger Fehlstellen einer Flachglasscheibe (1) mit einem Förderer (2) für die Flachglasscheibe (1), mit einer dem Förderer (2) zugeordneten, digitalen Bilderfassungseinrichtung (3) zur optischen Erfassung der Flachglasscheibe (1), mit einer der digitalen Bilderfassungseinrichtung (3) bezüglich der Flachglasscheibe (1) gegenüberliegenden, aus Leuchtdioden (6) mit einer nachgeschalteten Optik (7) zur Gleichrichtung des gegen die Flachglasscheibe (1) abgestrahlten Lichts aufgebauten Beleuchtungseinrichtung (4) für die Flachglasscheibe (1) im Bilderfassungsbereich und mit einer Auswerteschaltung (12) für die von der digitalen Bilderfassungseinrichtung (4) aufgenommenen Daten beschrieben. Um eine vorteilhafte Umriss- und Fehlstellenerfassung zu ermöglichen, wird vorgeschlagen, dass die Bilderfassungseinrichtung (3) wenigstens zwei sich über die quer zur Vorschubrichtung (5) erstreckende Breite der Flachglasscheibe (1) erstreckende Reihen ...

PROCEDURE FOR THE INVESTIGATION FROM ERRORS AT GLASS COURSES AND MECHANISM TO THE EXECUTION OF THIS PROCEDURE.

VERFAHREN UND VORRICHTUNG ZUM BESTIMMEN DES ORTS VON IN FLACHGLAS VORHANDENEN FEHLERN

MEASURING SYSTEM FOR THE RECOGNITION OF SURFACE CHARACTERISTICS

Dark view inspection system for transparent media

DETECTION OF FAULTS IN TRANSPARENT MATERIAL USING LASERS

PROCEDE POUR LA DETERMINATION DE LA QUALITE OPTIQUE DU VERRE PLAT OU DE PRODUITS EN VERRE PLAT

BREVET D'INVENTION PROCEDE POUR LA DETERMINATION DE LA QUALITE OPTIQUE DU VERRE PLAT OU DE PRODUITS EN VERRE PLAT On détermine la qualité optique du verre float par ombroscopie à un endroit approprié de la ligne de fabrication de la nappe de verre float. L'image est enregistrée par une caméra vidéo et évaluée à l'aide d'un traitement d'image numérique afin de déterminer le profil de densité lumineuse. Le profil de réfringence est calculé à partir du profil de densité lumineuse et est représenté et évalué numériquement et/ou graphiquement.

SYSTEM AND ASSOCIATED METHOD FOR ONLINE MEASUREMENT OF THE OPTICAL CHARACTERISTICS OF A GLASS SHEET

A glass sheet optical inspection system installed online in a glass sheet processing system includes an apparatus for measuring small optical or obstructive defects in a first selected area of the glass sheet by acquiring and developing a first set of image data, and an apparatus for measuring transmitted optical distortion in a second selected area of the glass sheet by acquiring and developing a second set of image data. The system may also include a glass sheet part identifier and a programmable control including logic for analyzing acquired image data and identifying the glass sheet as one of a set of known part types and thereafter securing and positioning the glass sheet based upon the part-shape analysis.

DEVICE FOR INSPECTING A MATERIAL PROVIDED WITH A COATED SURFACE AND RELATED METHOD

A method and device for inspecting a material having a coated surface (e.g., glass) is described. The device includes a light source that is disposed above the coated surface and emits light in a predefined wavelength range in the direction of the surface and at least one first camera set up to determine a color value of the detected light. Light from the light source is reflected by a first point of the line is detectable at a first viewing angle and the light reflected by a second point of the line is detectable separately at a second viewing angle. The first camera determines a first color value of the light reflected by the first point and a second color value of the light reflected by the second point. An evaluation device, connected to the first camera, compares the first color value and the second color value or the difference between the two, with a certain predefined color setpoint value or with a certain predefined color setpoint value range.

DETECTION SYSTEM BASED ON MODULATION OF LINE STRUCTURED LASER IMAGE OF GLASS

A detection system based on modulation of line structured laser image of glass comprises processing section (2), control system, and roller conveying mechanisms (5). Detection mechanism (6) provided over entrance of the processing section (201) comprises shell and camera (602) with laser (601) which emits beam on the surface of the glass in the gap between sliding rollers. Focal plane of the camera (602) corresponds to the beam irradiation surface, and signal output terminal of the camera (602) is connected with the control system in such a way that when glass passes the detection area, laser irradiates the glass surface and the line structured laser is modulated based on the glass to form laser modulation image with distribution of light and shade, staggered movement direction, or distorted laser lines. The camera (602) will transmit the captured glass information and parameters to the control system. In the system, the detection mechanism (6), with integral design and compact structure ...

METHOD OF INSPECTING MOVING MATERIAL

This disclosure is directed to a glass inspection system for inspecting a transparent web of glass of indeterminate length as it moves along a predetermined linear path of travel at a predetermined, regulated and/or controlled speed. The web of glass is illuminated such that any defect in or upon the glass web appears as a shadow moving upon a relatively white/bright background. A number of high resolution CCD cameras "look" downwardly through the transparent glass web and are focused upon the white background to detect moving defect shadows. Each camera creates a succession of image fields or frames through which a shadow of a defect will pass as the defect moves with the glass web through the scan area of each CCD camera. Each image field defines a nominal light area and each defect shadowis depicted as a defect area of light differing from the nominal light of each image field area. Initially, a first image area is scanned to detect the presence of a first light area/shadow at a first ...

GLASS INSPECTION SYSTEM

An inspection system for a sheet of glass. The system comprises a first laser and a second laser, each of which provide a sheet of light, a cylindrical lens system, and a first light detection system and a second lig ht detection system. The first laser is located at the focal point of the lens system. The second laser is located at a distance from the lens system that is greater than that of the first laser, and off of the axis of the lens system . The first light detection system receives light from the first laser and the second light detection system receives light from the second laser. The inspection system is adapted to position a sheet of glass between the lens system and the detection systems. A method is also described.

DEVICE AND METHOD FOR MEASURING DISTORTION DEFECTS IN A MANUFACTURED FLOAT GLASS STRIP

DEVICE AND METHOD FOR DETECTION OF DEFECTIVE IN LOCATED AT CONTINUOUS FLOAT - GLASS

DEVICE FOR ANALYSIS OF VISIBLE DEFECTS IN TRANSPARENT SUBSTRATE

METHOD AND DEVICE FOR RELIABLE DETECTION OF DEFECTS MATERIAL IN TRANSPARENT MATERIAL

УСТРОЙСТВО АНАЛИЗА ПОВЕРХНОСТИ ПОДЛОЖКИ

Настоящее изобретение относится к устройству (1) анализа прозрачной или зеркальной поверхности подложки (2), содержащему миру (10), располагаемую напротив поверхности исследуемой подложки, камеру (3) для съемки по меньшей мере одного изображения миры, деформированного исследуемой подложкой, систему (4) освещения миры и средства (5) обработки изображения и цифрового анализа, которые связаны с камерой (3). Согласно изобретению камера (3) является матричной, при этом мира (10) скомпонована на держателе (11) вытянутой формы, является двунаправленной и содержит первый рисунок (10а), проходящий в первом направлении и по более короткой протяженности держателя, причем этот первый рисунок является периодическим в поперечном направлении к короткой протяженности, и второй рисунок (10b), проходящий во втором направлении, перпендикулярном к первому рисунку, и по длинной протяженности держателя.

Conveying device maintenance method

The invention relates to a conveying device maintenance method. A conveying device conveys sheet-like glass through a plurality of rollers, the velocity vector of the rollers attached with foreign matters is different from that of the sheet-like glass by means of the contact position of the rollers attached with the foreign matters and the sheet-like glass, so that shearing stress is applied to the foreign matters to remove or reduce the foreign matters.

Method and system for detecting defects of surface and/or interior of transparent substrate

The invention discloses a method and a system for detecting defects of a surface and/or an interior of a transparent substrate. The system comprises at least one imaging component, at least two light sources, a transmitting device and a control device, wherein the at least one imaging component scans the substrate; the at least two light sources light up the substrate in different modes; the transmitting device makes the substrate relatively move between the at least one imaging component and the at least two light sources; and the control device controls the operation of the at least two light sources and the at least one imaging component to ensure that the whole or part of the at least two light sources can be switched on at different times and at least one of the at least one component scans the substrate when the substrate is lighted up, so that the at least imaging component and the at least two light sources form at least two detection channels. The system has the advantages of compact ...

APPAREIL ET PROCEDE D'INSPECTION POUR DETECTER UNE DISTORSION DE LA SURFACE D'UNE FEUILLE DE MATIERE REFLECHISSANTE

L'INVENTION CONCERNE UN APPAREIL ET UN PROCEDE D'INSPECTION DESTINES A DETECTER UNE DISTORSION DE LA SURFACE D'UNE FEUILLE DE MATIERE REFLECHISSANTE. L'APPAREIL COMPORTE UNE SOURCE DE LUMIERE 26 QUI PROJETTE UN FAISCEAU LUMINEUX 32 SUR UNE FEUILLE 12 DE MATIERE REFLECHISSANTE, CETTE FEUILLE RENVOYANT UN FAISCEAU REFLECHI 34 QU'UN MIROIR 36 DIRIGE VERS UN DETECTEUR 38 COMPRENANT UN APPAREIL 44 DE PRISE DE VUES A RESEAU DE PHOTODIODES SUR LEQUEL UNE LENTILLE 42 PROJETTE LE DESSIN LUMINEUX D'UNE FENTE 31 DE LA SOURCE. CETTE IMAGE EST AU POINT LORSQUE LA SURFACE DE LA FEUILLE 12 EST PLANE ET ELLE EST FLOUE LORSQUE LA SURFACE EST CONVEXE OU CONCAVE. DOMAINE D'APPLICATION : CONTROLE DE FABRICATION DU VERRE PLAT.

METHOD AND APPARATUS FOR DETECTING DEFECTS OR IRREGULARITIES IN GLASS SHEET

Method and device for inspection of transparent material

Information storage/readout device for use in continuously manufacturing system for liquid-crystal display elements, and method and system for producing the same

An information storage/readout device for use in a system for continuously manufacturing liquid-crystal display elements comprises an information storage medium which stores therein slitting position information created based on the position of a defect detected by an inspection of a continuous polarizing composite film included in a continuous optical film laminate including a continuous polarizing composite film formed with an adhesive layer and a continuous carrier film releasably laminated on the adhesive layer, to indicate defective-polarizing-sheet slitting positions defining a defective or defect-containing polarizing sheet, and normal-polarizing-sheet slitting positions defining a normal or defect-free polarizing sheet, in the continuous inspected optical film laminate, and a roll of the continuous inspected optical film laminate which is provided with an identification indicia. In continuous manufacturing of liquid-crystal display elements, the present invention can dramatically enhance product accuracy and manufacturing speed and drastically improve product yield.

Method and System for Mitigation of Particulate Inclusions in Optical Materials

A method of fabricating an optical material includes providing input materials having a material softening temperature, melting the input materials, and flowing the melted input materials into a laser inclusion mitigation system. The melted input materials comprise one or more inclusions. The method also includes irradiating the input materials using a laser beam, fragmenting the one or more inclusions in response to the irradiating, and reducing a temperature of the input materials to less than the material softening temperature. The method further includes forming an optical material and annealing the optical material.

Device and method for detecting flaws in continuously produced float glass

The invention relates to a method and device for detecting flaws in a continuously produced float glass band by checking a glass strip, which extends perpendicularly to the conveying direction and which is observed in transmitted light. The device has the following characteristics: a) the flow of a float glass band is monitored without any gaps by a modularly constructed fastening bridge, scanning sensors fastened to the fastening bridge and two transmission lighting means arranged perpendicular to the glass band, b) each scanning sensor can be oriented by an adjusting apparatus according to the three spatial coordinates in positive and negative directions and can be finely adjusted by a target apparatus that can be pivoted in, in the form of an artificial measurement plane, and c) the lighting means are cooled by a cooling apparatus.

Detecting device and method for detecting an edge of transparent material

A detecting device includes an actuating unit for driving a transparent material, a light source for emitting light to the transparent material driven by the actuating unit, a light sensor for sensing the light emitted from the light source as an edge of the transparent material is moved to different positions relative to the light source so as to generate a corresponding optical intensity signal, a transforming circuit coupled to the light sensor for transforming the optical intensity signal into a transforming signal, and a processing unit coupled to the transforming circuit for determining whether the edge of the transparent material is moved to a position between the light source and the light sensor according to the transforming signal transmitted from the transforming circuit.

Process for in-line inspection of functional film layer containing detectable component

The continuity of a functional layer of a web (32, 60, 78) is assessed by forwarding the web, detecting (42, 63) the presence of the functional layer and a discontinuity and/or a thin region in the functional layer, and generating a signal in response to the discontinuity and/or thin region. The functional layer comprises a detectable component (360) in a thermoplastic composition. The detecting is carried out by a machine vision system capable of detecting the detectable component (360) in the functional layer. The detectable component (360) can be active or passive. Also included are systems for carrying out the process.

METHOD AND DEVICE FOR CUTTING GLASS TUBES

The present disclosure relates to a method and device for cutting glass tubes with a length L from a glass tubing that moves at a feed rate v. The glass tubing is investigated for defects with an analytical device. The analytical device determines whether a glass tube to be separated is either defect-free (case 1) or contains defects (case 2). In case 1, a defect-free glass tube of the length L is separated from the glass tubing. In case 2, the device and method of the present disclosure determines a distance Lin the lengthwise direction between the defect and a free end of the glass tube to be separated. The distance Lis determined from the portion of the defect at the greatest distance from the free end of the tube. The device and method of the present disclosure then separates a piece of a glass tube or a glass tube that contains defects from the glass tubing at a distance Lfrom the free end of the glass tube, as a function of L. 1. A method for cutting glass tubes having a length L from a glass tubing that moves at a feed rate v , comprising the steps of:investigating the glass tubing with an analytical device;determining whether a glass tube of length L to be separated from the glass tubing is either defect-free (case 1) or contains defects (case 2);in case 1, separating the glass tube of the length L from the glass tubing; and [{'sub': A', 'A, 'a) determining a distance Lin the lengthwise direction between the defect and a free end of the glass tube to be separated, wherein the distance Lis determined from the portion of the defect at the greatest distance from the free end of the tube; and'}, {'sub': S', 'A, 'b) separating a piece of a glass tube or a glass tube that contains defects from the glass tubing at a distance Lfrom the free end of the glass tube as a function of L.'}], 'in case 2,'}2. The method of claim 1 , further comprising the steps of:{'sub': 1', 'n+1, 'subdividing the glass tubing, starting from the free end of the glass tube to be separated, ...

SYSTEM AND METHOD FOR INSPECTION OF WET OPHTHALMIC LENS

The present invention relates to an inspection system and more particularly to a system and method for inspection of wet ophthalmic lens, preferably in an automated lens manufacturing line. The inspection system provides for capturing multiple images of an ophthalmic lens using multiple cameras, each with a customized optical unit which may use wavelength filters, and the ophthalmic lens illuminated by multiple lighting modules each configured for a different wavelength, or a different polarization and triggered to strobe the illumination at the same instance or at different instances in the time domain. Suitable filters used in the optical module for each camera ensures appropriate images at different illuminating wavelength, especially when all the illuminations are strobed at the same time. Images captured and inspected by this configuration aids in improvement in method of inspection with enhanced degree of reliability and quality. 1. A vision system for inspection of ophthalmic lenses transported in an automatic production line comprising:a plurality of Illuminating modules to illuminate the ophthalmic lens that emit light comprising different light technique;a plurality of beam splitters for guiding the plurality of illumination to highlight the ophthalmic lens;a plurality of beam splitters for receiving a plurality of conditioned images of the ophthalmic lens;a plurality of filters for filtering the images of appropriate method;a plurality of optical modules to acquire plurality of images of the ophthalmic lens, each of the plurality of the optical elements conditioning the image to enhance contrast of different defects of the ophthalmic lens;a plurality of optical detectors to receive filtered and conditioned images;a lens holder to transport the ophthalmic lens;a image analyzing equipment to process and analyze the plurality of images for defects in the ophthalmic lens;2. A vision system according to claim 1 , wherein the light emitted by the illumination ...

MEASURING DEVICE, MEASUREMENT ABNORMALITY DETECTING METHOD, AND PROGRAM

Presently disclosed is a way to provide a measuring device capable of easily detecting measurement abnormality without increasing load in hardware. The measuring device may include: an emission means that may emit light to a measurement target region; a light measurement means that may measure light output from the measurement target region by emission with the emission means; a driving means that may move a position of at least one of the measurement target region and the emission means; and a determination means that may compare measurement values of the light measured a plurality of times by the light measurement means while changing positions of the measurement target region by the driving means and thereby determines abnormality of a measurement result. The determination means may determine measurement abnormality in a case where a reference measurement value being a measurement value obtained for a first time is lower than a comparison measurement value being a highest measurement value among measurement values obtained for second and subsequent times. 1. A measuring device comprising:an emitter that emits light to a measurement target region;a light measurer that measures light output from the measurement target region by emission with the emitter;a driver that moves a position of at least one of the measurement target region and the emitter; anda hardware processor that compares measurement values of the light measured a plurality of times by the light measurer while changing positions of the measurement target region by the driver and thereby determines abnormality of a measurement result, wherein the hardware processor determines measurement abnormality in a case where a reference measurement value being a measurement value obtained for a first time is lower than a comparison measurement value being a highest measurement value among measurement values obtained for second and subsequent times.2. The measuring device according to claim 1 ,wherein a first ...

METHODS OF MAKING LITHIUM ION CONDUCTING SULFIDE GLASS

A lithium ion-conductive solid electrolyte including a freestanding inorganic vitreous sheet of sulfide-based lithium ion conducting glass is capable of high performance in a lithium metal battery. Such an electrolyte is also manufacturable, and readily adaptable for battery cell and cell component manufacture, in a cost-effective, scalable manner using an automated machine based system, apparatus and methods based on inline spectrophotometry to assess and inspect the quality of such vitreous solid electrolyte sheets and associated components. Suitable manufacturing methods can involve providing a sulfur precursor, providing a boron precursor material having lithium as a second constituent, combining the sulfur and boron precursor materials to form a precursor mixture, melting the mixture, and cooling the melt to form a solid lithium ion conducting glass. The glass may have a Li conductivity of at least 10S/cm. The vessels in which the precursor materials are melted may include a secondary container or liner composed of a metal nitride or a metalloid nitride, such as boron nitride, silicon nitride, aluminum nitride, titanium nitride, zirconium nitride and hafnium nitride. 1. A method of making a lithium ion conducting sulfide glass , the method comprising:providing a primary vessel for melting glass;providing a secondary container or liner, and positioning the secondary container or liner inside the primary vessel;providing a precursor material mixture, the mixture comprising sulfur, lithium and at least one of boron or silicon.disposing the precursor mixture into the secondary container or liner; andheating the primary vessel to a temperature sufficient to form a melt of the precursor mixture;wherein the melt does not contact the primary vessel and is chemically compatible in direct contact with the secondary container or liner.2. The method of wherein the secondary container or liner is a metal or metalloid nitride.3. The method of wherein the metal or metalloid ...

INSPECTION DEVICE FOR SHEET OBJECT, AND INSPECTION METHOD FOR SHEET OBJECT

An inspection device for a sheet object includes: an irradiation unit configured to irradiate, with irradiation light, the sheet object that is continuously conveyed; a projection unit configured to project transmitted light or reflected light from the sheet object; an image capture unit configured to capture a projection image projected on the projection unit; and a data processing unit configured to detect a defect present on the sheet object from image data captured by the image capture unit. A longitudinal direction of the irradiation unit viewed from a direction perpendicular to a traveling surface of the sheet object is same as a conveyance direction of the sheet object, and the irradiation unit is configured to emit light spreading in a sheet width direction of the sheet object. 1. An inspection device for a sheet object , the inspection device comprising:an irradiation unit configured to irradiate, with irradiation light, the sheet object that is continuously conveyed;a projection unit configured to project transmitted light or reflected light from the sheet object;an image capture unit configured to capture a projection image projected on the projection unit; anda data processing unit configured to detect a defect present on the sheet object from image data captured by the image capture unit, whereina longitudinal direction of the irradiation unit viewed from a direction perpendicular to a traveling surface of the sheet object is same as a conveyance direction of the sheet object, and the irradiation unit is configured to emit light spreading in a sheet width direction of the sheet object.2. The inspection device for the sheet object according to claim 1 , wherein the defect to be detected by the data processing unit has an irregular shape extending in the same direction as the conveyance direction of the sheet object.3. The inspection device for the sheet object according to claim 1 , wherein a surface parallel to the traveling surface of the sheet object ...

METHODS AND APPARATUS FOR EDGE SURFACE INSPECTION OF A MOVING GLASS WEB

Methods and apparatus provide for sourcing a glass web, the glass web having a length and a width transverse to the length; moving the glass web from the source to a destination in a transport direction along the length of the glass web; cutting the glass web, at a cutting zone, along the length of the glass web into at least first and second glass ribbons as the glass web is moved in the transport direction from the source to the destination, such that respective first and second edge surfaces are produced on the first and second glass ribbons; and optically inspecting at least one of the first and second edge surfaces in real-time as the first and second glass ribbons of the glass web are moved in the transport direction to the destination. 1. A method , comprising:moving a glass web comprising a length and a width transverse to the length from a source to a destination in a transport direction along the length of the glass web;cutting the glass web, at a cutting zone, along the length of the glass web into at least first and second glass ribbons as the glass web is moved in the transport direction from the source to the destination such that respective first and second edge surfaces are produced on the first and second glass ribbons; andoptically inspecting at least one of the first and second edge surfaces in real-time as the first and second glass ribbons are moved in the transport direction to the destination,wherein the inspecting step includes: (i) taking at least one image of the at least one of the first and second edge surfaces as the first and second glass ribbons are moved in the transport direction, (ii) extracting one or more features of the at least one of the first and second edge surfaces from the at least one image, and (iii) detecting one or more defects, and identifying one or more types of the one or more defects based on the one or more extracted features.2. The method of claim 1 , wherein the inspecting step includes:directing incident light ...

Optical fiber inspecting device, optical fiber manufacturing apparatus, method for inspecting optical fiber, and method for manufacturing optical fiber

An optical fiber inspecting device is disclosed. The optical fiber inspecting device includes a first light-emitting unit that irradiates an optical fiber with a first light beam, the optical fiber including a glass fiber and a coating resin and moving in an axial direction, and a first light-receiving unit that receives scattered light resulting from the first light beam scattered in the optical fiber, and converts the scattered light to an electrical signal. An optical axis of the first light-receiving unit passes through an irradiation position where the first light beam strikes the optical fiber, and the first light beam and the optical axis of the first light-receiving unit diagonally intersect each other, thereby preventing the first light beam from directly entering the first light-receiving unit.

System and method for inspection of wet ophthalmic lens

The present invention relates to an inspection system and more particularly to a system and method for inspection of wet ophthalmic lens, preferably in an automated lens manufacturing line. The inspection system provides for capturing multiple images of an ophthalmic lens using multiple cameras, each with a customized optical unit which may use wavelength filters, and the ophthalmic lens illuminated by multiple lighting modules each configured for a different wavelength, or a different polarization and triggered to strobe the illumination at the same instance or at different instances in the time domain. Suitable filters used in the optical module for each camera ensures appropriate images at different illuminating wavelength, especially when all the illuminations are strobed at the same time. Images captured and inspected by this configuration aids in improvement in method of inspection with enhanced degree of reliability and quality.

OPTICAL DEVICES FOR CALIBRATING, AND FOR ANALYZING THE QUALITY OF A GLAZING, AND METHODS

An optical device comprises a first polariscope and a set of first photodetectors and an optical retardation generator. The device is configured to analyze the quality of a glazing. 1. An optical device comprising a first polariscope including in this order , in an optical alignment along an optical axis:a first, preferably polychromatic, light source with a given spectrum, placed orthogonal to the optical axis and delivering configured to deliver a light beam;a first circular polarizer that polarizes in a first polarization rotation direction, placed orthogonal to the optical axis and including a first linear polarizer followed by a first quarter waveplate;a first analyzer, which is a circular polarizer that polarizes in a second polarization rotation direction that is opposite to the first polarization rotation direction, placed orthogonal to the optical axis, said first analyzer including a second quarter waveplate followed by a second linear polarizer; 'placed orthogonal to the optical axis, between the first polarizer and the first analyzer, and in said optical alignment, a calibrated first optical retardation generator for generating optical retardations in a range AB, the first optical retardation generator being in said focal plane;', 'downstream of the first analyzer and in said optical alignment, a first digital sensor, placed orthogonal to the optical axis, and a first objective, placed orthogonal to the optical axis and defining a focal plane, said first objective being located facing the first digital sensor, between the first analyzer and the first digital sensor;'}wherein the first digital sensor includes a set of first photodetectors that are sensitive to the spectrum of the first light source, having a given spectral response, one or more of the first photodetectors, which photodetectors are calibration photodetectors, being located facing the calibrated first optical retardation generator, each calibration first photodetector receiving, in ...

GLASS SHEET ACQUISITION AND POSITIONING SYSTEM AND ASSOCIATED METHOD FOR AN INLINE SYSTEM FOR MEASURING THE OPTICAL CHARACTERISTICS OF A GLASS SHEET

A method is provided for measuring optical characteristics of a glass sheet as the glass sheet is conveyed in a system for fabricating glass sheets including one or more processing stations and one or more conveyors for conveying the glass sheet during processing. The method comprises providing a background screen including contrasting elements arranged in a pre-defined pattern and a camera for acquiring an image of the background screen; acquiring data associated with a shape of a glass sheet travelling on a conveyor upstream from the background screen; removing the glass sheet from the conveyor; and positioning the glass sheet between the camera and the screen and thereafter acquiring an image of the background screen; re-positioning the glass sheet for continued movement of the glass sheet on the conveyor; and performing one or more processing operations using the acquired image data to analyze the optical characteristics of the glass sheet. 1providing a background screen including contrasting elements arranged in a pre-defined pattern and a camera for acquiring an image of the background screen;acquiring data associated with the shape of a glass sheet travelling on a conveyor upstream from the background screen;capturing a glass sheet at a preselected location as it is transported on the conveyor;removing the glass sheet from the conveyor; andpositioning the glass sheet between the camera and the screen in a preselected orientation and thereafter acquiring an image of the background screen;re-positioning the glass sheet for continued movement of the glass sheet on the conveyor; andperforming one or more processing operations using the acquired image data to analyze the optical characteristics of the glass sheet.. A method for measuring the optical characteristics of a glass sheet as the glass sheet is conveyed in a system for fabricating glass sheets including one or more processing stations and one or more conveyors for conveying the glass sheet from station to ...

Film inspection device

A film inspection device is equipped with a first fixed roll, a second fixed roll, a first moving roll, and a second moving roll. The first and second fixed rolls stretch an electrolyte film, which includes a part that is irradiated with light between first and second driving rolls, from one surface side thereof. The first moving roll stretches the electrolyte film from the other surface side thereof. The second moving roll stretches the electrolyte film from the other surface side thereof. The second moving roll is moved such that a conveyance path of the electrolyte film between the second driving roll and the second fixed roll becomes short, while the first moving roll is moved such that the conveyance path of the electrolyte film between the first driving roll and the first fixed roll becomes long.

INSPECTION SYSTEM AND INSPECTION METHOD

An inspection system includes a detection device arranged between a connector that couples a plurality of optical fibers to a port and the port; and a determination device that determines whether there is dart between the connector and the port, based on an output from the detection device, wherein the detection device includes a plurality of diodes that convert light that is output from each of the plurality of optical fibers to an electrical signal indicating intensity and distribution of the light, and the determination device includes a processor configured to determine whether there is dart between the connector and the port, based on the intensity and distribution of the light, which are indicated by the electrical signal. 1. An inspection system comprising:a detection device arranged between a connector that couples a plurality of optical fibers to a port and the port; anda determination device that determines whether there is dart between the connector and the port, based on an output from the detection device, whereinthe detection device includes a plurality of diodes that convert a light that is output from each of the plurality of optical fibers to an electrical signal indicating intensity and distribution of the light, andthe determination device includes a processor configured to determine whether there is dart between the connector and the port, based on the intensity and distribution of the light, which are indicated by the electrical signal.2. The inspection system according to claim 1 ,wherein the detection device includes a housing including two members having different refractive indexes, anda contact surface of the two members is arranged so as to be oblique to an optical path of the light that is output from each of the plurality of optical fibers.3. The inspection system according to claim 1 ,wherein the contact surface reflects the light that has been output from each of the plurality of optical fibers and the light that has been reflected by ...

METHOD OF PREDICTING GRAVITY-FREE SHAPE OF GLASS SHEET AND METHOD OF MANAGING QUALITY OF GLASS SHEET BASED ON GRAVITY-FREE SHAPE

A method of predicting the gravity-free shape of a glass sheet and a method of managing the quality of a glass sheet based on the gravity-free shape of the glass sheet. The initial shape of a glass sheet is determined. When the glass sheet is flattened, values of stress at a plurality of locations in the glass sheet are obtained. A shape that the glass sheet will have when the flattened glass sheet is deformed such that the values of stress are zero is predicted as a stress-induced shape and a gravity-free shape of the glass sheet is predicted by combining the initial shape and the stress-induced shape. Quality management is performed on glass sheets based on gravity-free shapes thereof predicted using the method of predicting the gravity-free shape of a glass sheet. 1. A method of predicting a gravity-free shape of a glass sheet , comprising:a) determining an initial shape of a glass sheet, the initial shape of the glass sheet comprising a one-dimensional shape which the glass sheet has when the glass sheet is formed;b) determining stress values applied to the glass sheet at a plurality of locations when the glass sheet is flattened;c) generating a glass sheet model having the same initial shape and to which the same stress values are applied; andd) predicting a shape which the glass sheet model will have when the same stress values are removed, as a gravity-free shape of the glass sheet.2. The method of claim 1 ,wherein obtaining the stress values comprises:irradiating the flattened glass sheet with polarized light,measuring retardation values and azimuth angles of the polarized light having passed through the flattened glass sheet at the plurality of locations in the glass sheet, andconverting the retardation values and azimuth angles to the stress values.3. The method of claim 1 , whereinthe glass sheet is produced by a drawing process or a float process,determining the one-dimensional shape of the glass sheet comprises measuring a shape of a glass ribbon in the ...

Scanning micro profiler

An optical scanning system includes a radiating source capable of outputting a source light beam, a de-scan lens that is configured to output a de-scanned light beam, the de-scan lens is located approximately one focal length of the de-scan lens from a sample irradiation location, a focusing lens that is configured to output a focused light beam, a first non-polarizing beam splitter configured to be irradiated by at least a portion of the focused light beam, a second non-polarizing beam splitter configured to be irradiated by at least a portion of the focused light beam that is reflected by the first non-polarizing beam splitter, and a detector that is located at approximately one focal length of the focusing lens from the focusing lens, the detector is configured to be irradiated by at least a portion of the focused light beam that is reflected by the second non-polarizing beam splitter.

Device for Inspecting Printed Images

An apparatus for inspecting images is disclosed. In an embodiment an apparatus includes a camera for recording a surface of a printed product, the printed product being movable relative to the apparatus, a first illumination unit of a first type for illuminating a first partial region of a region that is capturable by the camera, a second illumination unit of a second type for illuminating a second partial region of the region that is capturable by the camera, and an evaluation unit for processing image information captured by the camera, wherein the first illumination unit differs from the second illumination unit, and wherein the first illumination unit forms a diffuse illumination source and has an internally illuminated tunnel. 111-. (canceled)12. An apparatus for inspecting printed images comprising:a camera for recording a surface of a printed product, the printed product being movable relative to the apparatus;a first illumination unit of a first type for illuminating a first partial region of a region that is capturable by the camera;a second illumination unit of a second type for illuminating a second partial region of the region that is capturable by the camera; andan evaluation unit for processing image information captured by the camera,wherein the first illumination unit differs from the second illumination unit, andwherein the first illumination unit forms a diffuse illumination source and has an internally illuminated tunnel.13. The apparatus as claimed in claim 12 , wherein the second illumination unit is arranged to illuminate the printed product on a side that faces away from the camera.14. The apparatus as claimed in claim 12 , wherein the second illumination unit is arranged outside the tunnel for illuminating a partial region of the region that is capturable by the camera outside the tunnel.15. The apparatus as claimed in claim 12 , wherein the second illumination unit forms a directional light source.16. The apparatus as claimed in claim 15 , ...

METHOD AND DEVICE FOR DETERMINING THE TRANSMITTANCE OF A FLAT GLASS SUBSTRATE

The invention relates to a method and an associated device for determining the transmittance of a flat-glass substrate () with a measuring device (), with which light of at least one light source () is guided from one side of the flat-glass substrate () through the flat-glass substrate () to the opposite side of the flat-glass substrate (), where it is captured by at least one receiving unit () and the transmittance of the flat-glass substrate () is determined by means of a comparison between the intensity of the light emitted by the light source () and the light incident upon the receiving unit (). The light source is a surface-like diffuse light source (), and the receiving unit () comprises at least one spatially resolving receiver (). By evaluating brightness values in the measuring image () of the spatially resolving receiver (), the transmittance is determined in a spatially resolved manner in a partial surface of the flat-glass substrate (), which is covered by the measuring image (). 1. A method for determining the transmittance of a flat-glass substrate with a measuring device , with which light of at least one light source is guided from one side of the flat-glass substrate through the flat-glass substrate to the opposite side of the flat-glass substrate , where it is captured by at least one receiving unit and the transmittance of the flat-glass substrate is determined by means of a comparison between the intensity of the light emitted by the light source and the light incident upon the receiving unit , wherein the light source is a surface-like diffuse light source , and the receiving unit comprises at least one spatially resolving receiver , between which the flat-glass substrate is positioned , and the transmittance is determined in a spatially resolved manner in a partial surface of the flat-glass substrate , which is covered by the measuring image , by an evaluation of brightness values in the measuring image of the spatially resolving receiver.2. ...

Optical fiber inspecting device, optical fiber manufacturing apparatus, method for inspecting optical fiber, and method for manufacturing optical fiber

An optical fiber inspecting device is disclosed. The optical fiber inspecting device includes a first light-emitting unit that irradiates an optical fiber with a first light beam, the optical fiber including a glass fiber and a coating resin and moving in an axial direction, and a first light-receiving unit that receives scattered light resulting from the first light beam scattered in the optical fiber, and converts the scattered light to an electrical signal. An optical axis of the first light-receiving unit passes through an irradiation position where the first light beam strikes the optical fiber, and the first light beam and the optical axis of the first light-receiving unit diagonally intersect each other, thereby preventing the first light beam from directly entering the first light-receiving unit.

DEFECT INSPECTION DEVICE, DEFECT INSPECTION METHOD, METHOD FOR PRODUCING SEPARATOR ROLL, AND SEPARATOR ROLL

To inspect a separator roll for a defect inside the separator roll with use of only a small number of defect inspection devices, a defect inspection device () includes: a radiation source section () configured to emit an electromagnetic wave () to a separator roll (); and a sensor section () configured to detect the electromagnetic wave () having passed through the separator roll (). 1. A defect inspection device , comprising:a radiation source section configured to emit an electromagnetic wave to a separator roll including (i) a core in a cylindrical shape and (ii) a separator for use in a battery which separator is wound around the core, the electromagnetic wave being capable of passing through the separator roll; anda sensor section configured to detect the electromagnetic wave having been emitted by the radiation source section and passed through the separator roll.2. The defect inspection device according to claim 1 , further comprising:a holding mechanism configured to hold the separator roll.3. The defect inspection device according to claim 1 ,whereinthe separator roll and a detecting surface of the sensor section are not separated from each other by a structure.4. The defect inspection device according to claim 1 ,wherein{'b': 2', '1', '1', '2, 'D/D is more than 1 and not more than 40, where D is a distance from an emitting surface of the radiation source section to a second side surface of the separator roll which second side surface is one of opposite side surfaces of the separator roll and which second side surface faces the sensor section, and D is a distance from the emitting surface of the radiation source section to a detecting surface of the sensor section.'}5. The defect inspection device according to claim 1 ,whereinthe radiation source section is configured to emit the electromagnetic wave to the separator roll from a side of a side surface of the separator roll.6. The defect inspection device according to claim 1 ,wherein:the radiation source ...

APPARATUS AND METHOD FOR INSPECTING GLASS SUBSTRATE

An apparatus and method for inspecting a glass substrate. The apparatus for inspecting a glass substrate includes a stage configured to support the glass substrate, a first light source for irradiating light onto a surface of the glass substrate at a first angle, a first camera for capturing scattered light of the light irradiated from the first light source, a second light source for irradiating light onto the surface of the glass substrate at a second angle greater than the first angle, a second camera for capturing reflected light and scattered light of the light irradiated from the second light source, and a defect detection unit for detecting a defect of the glass substrate using a first image provided by the first camera and a second image provided by the second camera. 1. An apparatus for inspecting a glass substrate , the apparatus comprising:a stage configured to support the glass substrate;a first light source for irradiating light onto a surface of the glass substrate at a first angle;a first camera for capturing scattered light of the light irradiated from the first light source;a second light source for irradiating light onto the surface of the glass substrate at a second angle greater than the first angle;a second camera for capturing reflected light and scattered light of the light irradiated from the second light source; anda defect detection unit for detecting a defect of the glass substrate using a first image provided by the first camera and a second image provided by the second camera.2. The apparatus of claim 1 , wherein the stage includes a driving unit for moving the glass substrate in one direction.3. The apparatus of claim 2 , wherein the first light source and the first camera are positioned before the second light source and the second camera along the one direction.4. The apparatus of claim 1 , wherein the first and second cameras are arranged in a direction normal to the stage.5. The apparatus of claim 1 , wherein each of the first and ...

Apparatus for Photographing Glass in Multiple Layers

The invention discloses a new apparatus to photograph glasses in multiple layers for taking high quality photo images with scratch, crash, black/white defect, lack, crack, pin-hole, concave edge and raised edge, bubble and smudge defects on the surface-layer, backside-layer or/and mid-layer of the glasses. The invention also introduces flexible and expendable photographing hardware architecture that will meet various customers inspecting defects requirements and speed requirements. 1: An apparatus for photographing glass(es) to expose defects , comprising: at least one camera , at least one light source , at least one computer and/or a conveyor;wherein said defects comprising of one or more of the following types: scratches, silk print defects, black/white defects, lacks, cracks, pin-holes, concave and raised edges, bubbles and smudges on the surface, backside or/and mid-layer of the glass(es);wherein the angle and distance between said glass and said light sources is designed based on the type of said defects;wherein the angle and distance between said glass(es) and at least one cameras is designed based on the type of said defects;wherein said camera is a line-scan camera or area-scan camera; andwherein said light source is a strip-shaped light source made of LED lights or other type of lights.2: The apparatus for photographing glass(es) of claim 1 , said camera is mounted on the topside of said glass(es) or on the bottom of backside of said glasses; the distance between said camera and said glass(es) is between 50-1500 mm; one or more strip-shaped light sources are mounted at any position surrounding said camera claim 1 , and every light source spreads over the entire scanning area of said camera; the length of said strip-shaped light sources is greater than the width of said glass(es); and the width of said strip-shaped light sources is between 2 mm and the length of said glass(es).3: The apparatus for photographing glass(es) to expose defects of claim 1 , ...

Optical device for detecting an internal flaw of a transparent substrate and method for the same

An optical device and a method for detecting a flaw of a transparent substrate. A first detection unit is configured to detect the substrate at a predetermined low resolution, where the first detection unit includes a first photosensitive element and a first lens between the substrate and the first photosensitive element, and the first photosensitive element and the first lens are disposed such that an object plane is inclined relative to the substrate; a second detection unit configured to detect the substrate at a predetermined high resolution, where the second detection unit includes a second photosensitive element and a second lens between the substrate and the second photosensitive element; and a processor configured to determine a portion of the flaws detected by the first detection unit as flaws to be detected by the second detection unit, and to determine a type of flaw for the substrate imaged.

Method for further processing a glass tube semi-finished product

A method for further processing a glass tube semi-finished product includes: providing the glass tube semi-finished product, along with defect data for the glass tube semi-finished product; reading the defect data for the glass tube semi-finished product; and further processing the glass tube semi-finished product, for example by cutting to length or sorting out. The further processing of the glass tube semi-finished product is adapted to the defect data, which were read out for the glass tube semi-finished product. In this way, the further processing can be more efficiently adapted to the respective characteristics of a glass tube semi-finished product to be processed or a specific sub-section thereof, and the relevant defects of the respective glass tube semi-finished product do not need to be determined or measured again.

MAKING AND INSPECTING A WEB OF VITREOUS LITHIUM SULFIDE SEPARATOR SHEET AND LITHIUM ELECTRODE ASSEMBLIES AND BATTERY CELLS

A lithium ion-conductive solid electrolyte including a freestanding inorganic vitreous sheet of sulfide-based lithium ion conducting glass is capable of high performance in a lithium metal battery by providing a high degree of lithium ion conductivity while being highly resistant to the initiation and/or propagation of lithium dendrites. Such an electrolyte is also itself manufacturable, and readily adaptable for battery cell and cell component manufacture, in a cost-effective, scalable manner. An automated machine based system, apparatus and methods assessing and inspecting the quality of such vitreous solid electrolyte sheets, electrode sub-assemblies and lithium electrode assemblies can be based on spectrophotometry and can be performed inline with fabricating the sheet or web (e.g., inline with drawing of the vitreous Li ion conducting glass) and/or with the manufacturing of associated electrode sub-assemblies and lithium electrode assemblies and battery cells. 1. A method of making a battery cell separator layer , the method comprising:i) providing a dense solid inorganic glass electrolyte sheet having first and second opposing principal side surfaces; andii) spectrophotometrically inspecting the sheet for defects or flaws.2. The method of claim 1 , wherein the spectrophotometrically inspecting the glass sheet further comprises characterizing and evaluating any defects or flaws present at or within 10 μm of one or more of the first principal side surface and the second principal side surface of the solid electrolyte glass sheet.3. The method of claim 1 , wherein the dense glass sheet is freestanding.4. The method of claim 1 , wherein the first and second opposing surfaces are uncoated claim 1 , and in direct contact with the ambient environment.5. The method of claim 1 , wherein the spectrophotometric inspection is based on a comparison of incident and transmitted light intensities at various wavelengths.6. A method of making a battery cell component claim 1 , ...

METHOD AND SYSTEM FOR DETECTING INCLUSIONS IN FLOAT GLASS BASED ON WAVELENGTH(S) ANALYSIS

A method and/or system is provided for detecting inclusions (e.g., nickel sulfide based inclusions/defects) in soda-lime-silica based glass, such as float glass. In certain example instances, during and/or after the glass-making process, following the stage in the float process where the glass sheet is formed and floated on a molten material (e.g., tin bath) and cooled or allowed to cool such as via an annealing lehr, light is directed at the resulting glass and reflection of various wavelengths (e.g., red and blue wavelengths) is analyzed to detect inclusions. 1. A method comprising:directing light from at least one light source toward soda-lime-silica based glass on a float glass line; anddetermining whether a nickel sulfide related defect is present in the glass based at least on a difference between how first and second reflected wavelengths from the directed light are diffracted, scattered, and/or reflected,wherein one or both of the first and second reflected wavelengths is/are outside of the visible spectrum.2. The method of claim 1 , wherein one of the first and second reflected wavelengths is in the near infrared.3. The method of claim 1 , wherein one of the first and second reflected wavelengths has a wavelength of 700-1200 nm.4. The method of claim 1 , wherein comprising collecting the first and second reflected wavelengths using at least one light detector.5. The method of claim 4 , wherein the at least one light source and the at least one light detector are located on a common side of the glass.6. A method of detecting an inclusion in glass claim 4 , the method comprising:directing first light from a first light source toward the glass;directing second light from a second light source toward the glass; anddetermining whether an inclusion comprising nickel sulfide is present in the glass based at least on a difference between diffraction, scattering, and/or reflection of first and second reflected wavelengths from the first and second light.7. The ...

Apparatus for inspecting edge of substrate

An apparatus for inspecting an edge portion of a substrate can inspect a defect or a chamfered width on an edge portion of a substrate. First and second right-angled prisms are disposed above and below the edge portion such that inclined surfaces thereof are directed toward the upper surface and lower surface of the edge portion. A lighting part irradiates the edge portion of the substrate with light. A photographing part is disposed adjacent to the edge portion. The photographing part takes an image of the upper surface of the edge portion from light that has passed through the first right-angled prism, an image of the lower surface of the edge portion from light that has passed through the second right-angled prism, and an image of an end surface of the edge portion.

Device and method for measuring distortion defects in a manufactured float glass strip

The invention relates to a method and a device for the rapid and reliable measuring of distortion defects in a manufactured float glass strip, having the following features: a) a linear inset LED light source ( 5 ) sweeping the breadth of the glass strip ( 4 ) to be examined, said light source having LEDs that are tightly packed one next to the other below a glass strip ( 4 ) to be examined, b) a linear cylindrical lens 8 ) which is arranged in parallel to the entire length of the inset LED light source ( 5 ) and the distance of which to the inset LED light source ( 5 ) is continuously variable, c) a light source ( 2 ) arranged above the glass strip ( 4 ), d) an array of at least 4 CCD cameras arranged above the glass strip ( 4 ), and a two-stage parallel signal evaluation unit.

OPTICAL INSPECTION SYSTEM FOR TRANSPARENT MATERIAL

A system and a method for inspecting a transparent object. The system may comprise a light source module; a collimating lens system; a sensor; a collector lens system for concentrating the sheet of light, passed through the object, in a plane of the sensor; and an optical element, the optical element being adapted to provide different focus ranges for the light portions emitted with different colors (intensity peak wavelengths). 1. A system for inspecting a transparent object , the system having a plurality of focus ranges and comprising:a light source module adapted to emit light with a first intensity peak at a first peak wavelength and to emit light with a second intensity peak at a second peak wavelength;a collimating lens system adapted to transform the emitted light into a collimated sheet of light;a sensor;a collector lens system for concentrating the sheet of light, passed through the transparent object, in a plane of the sensor; and i) a first focus range for the light emitted with the first intensity peak at the first peak wavelength and', 'ii) a second focus range for the light emitted with the second intensity peak at the second peak wavelength,', 'iii) wherein at least a portion of the first focus range is located outside of the second focus range., 'an optical element located between the collector lens system and the sensor, the optical element being adapted to provide'}2. The inspection system of claim 1 , wherein the first focus range and the second focus range are adjacent to each other claim 1 , so as to define an extended focus range of the system.3. The inspection system of claim 2 , wherein the first focus range and the second focus range are overlapping.4. The inspection system of claim 1 , wherein the light source module comprisesa) at least one first light source adapted to emit light with the first intensity peak at the first peak wavelength andb) at least one second light source adapted to emit light with the second intensity peak at the ...

Method and apparatus for testing optical films

A structure for testing a luminescent film includes a Lambertian light source, an integrating sphere having an input port, and a measuring device. The Lambertian light source includes a mixing chamber having an input port and an output port, and a light emitter coupled to the input port. During testing the luminescent film is positioned between the output port of the mixing chamber and the input port of the integrating sphere. The measuring device is optically coupled to the integrating sphere.

OPTICAL SYSTEM AND METHOD FOR INSPECTING A TRANSPARENT PLATE

An optical system for inspecting a transparent plate includes a light source for casting incident light onto a face of the transparent plate so that there is a primary reflected light and secondary reflected light from the face of the transparent plate, a photo sensor for receiving light from the face of the transparent plate, and a blocking element for blocking the secondary reflected light while allowing the primary reflected light to reach the photo sensor. 1. An optical method for inspecting a transparent plate that includes a first face to be inspected and a second face , the optical method comprising the steps of:providing a light source near the first face of the transparent plate, wherein the light source casts incident light onto the first face of the transparent plate;providing a photo sensor near the first face of the transparent plate, wherein the photo sensor receives light from the first face of the transparent plate;providing a grating between the first face of the transparent plate and both of the light source and the photo sensor, wherein the grating comprises an incident passageway and a reflection passageway, wherein the incident light reaches the first face of the transparent plate through the incident passageway, wherein only primary reflected light from the first face of the transparent plate reaches the photo sensor through the reflection passageway while secondary reflected light and any other light reflected from the second face of the transparent plate and refracted by the first face of the transparent plate is blocked by the grating; andmoving the transparent plate relative to the light source, the photo sensor and the grating, thereby scanning the entire first face to determine whether there is any stain on the first face.2. The optical method according to claim 1 , wherein the incident light reaches the first face of the transparent plate at an incident angle of 15 to 45 degrees.3. The optical method according to claim 1 , wherein the ...

DEVICE AND METHOD FOR DETECTING DEFECT OF OPTICAL FILM

Provided is a device for detecting a defect of an optical film, comprising a light emitting unit, a reflection unit, a screen, and an image capturing unit, and a method for detecting a defect of an optical film, comprising emitting light to a reflection unit, projecting the light reflected by the reflection unit onto an optical film, capturing an image of a screen which displays a projection shape obtained by projecting the light onto the optical film, and analyzing the image. 1. A device for detecting a defect of an optical film , the device comprising:a light emitting unit which emits light;a reflection unit which reflects the light emitted from the light emitting unit and guides the light to the optical film;a screen which displays a projection shape obtained by projecting the light on the optical film to detect the defect of the optical film; andan image capturing unit which captures an image of the projection shape displayed on the screen.2. The device of claim 1 , wherein a first angle (θ) formed between the screen and a direction in which the image capturing unit captures the image of the screen is equal to a second angle (θ) formed between the optical film and the light projected on the optical film.3. The device of claim 2 , wherein the first angle (θ) and the second angle (θ) are from 25° or more to 48° or less.4. The device of claim 1 , wherein a distance between the screen and a region of the optical film on which the light is projected is from 90 mm or more to 130 mm or less.5. The device of claim 1 , wherein a distance between a point on the light emitting unit from which the light is emitted and a point on the reflection unit on which light is reflected is from 165 mm or more to 185 mm or less.6. The device of claim 1 , wherein a distance between a point on the reflection unit on which the light is reflected and a region of the optical film to which the light reflected by the reflection unit is guided is from 580 mm or more to 650 mm or less.7. The ...

MACHINE DIRECTION LINE FILM INSPECTION

Techniques are described for inspection of films in order to detect Machine Direction Line (“MDL”) defects. An example system comprises a light source configured to provide a source of light rays, directed to a film product so that the light rays are incident to a surface of the film product at a non-perpendicular angle of incidence. An image capturing device is configured to generate an image of the film product by capturing a level of light intensity of the light rays exiting the film product in a plurality of image areas, each image area representing a line imaged across the film product that is perpendicular to a direction of manufacture of the film product. An image processing device is configured to process the image of the film product to provide an indication of the detection of one or more machine direction line (MDL) defects in the film product. 1. A system for inspecting a film product , the system comprising:a light source operable to provide a source of light rays, the system operable to direct the light rays to a film product so that the light rays are incident to a surface of the film product at a non-perpendicular angle of incidence, the light rays operable to pass through the film product and to be refracted at an angle of refraction when exiting the film product;an image capturing device operable to generate an image of the film product by capturing a level of light intensity of the light rays exiting the film product in a plurality of image areas, each image area representing a line imaged across the film product, the line having a direction that is perpendicular to a direction of manufacture of the film product;the image capturing device comprising an image sensing array operable to capture, as an electronic signal, variations in a level of light intensity received at the image sensing array for each of the plurality of image areas to generate an image of the film product, the variations in level of light intensity received by the image sensing ...

GLASS SHEET ACQUISITION AND POSITIONING SYSTEM AND ASSOCIATED METHOD FOR AN INLINE SYSTEM FOR MEASURING THE OPTICAL CHARACTERISTICS OF A GLASS SHEET

A glass sheet acquisition and positioning system and associated method are utilized in a glass sheet optical inspection system installed in-line in a glass sheet processing system. The acquisition and positioning system include an exterior support frame and a moveable glass sheet support frame connected to the exterior support frame such that the glass sheet support frame may be selectively positioned from first orientation whereby a glass sheet is removed from a conveyor and retained on the support frame, to a second orientation whereby the glass sheet is positioned for processing by the optical inspection system. The system may also include a glass sheet part identifier and a programmable control including logic for analyzing acquired image data and identifying the glass sheet as one of a set of known part types and thereafter securing and positioning the glass sheet on the glass sheet support frame based upon the part-shape analysis. 1. A glass sheet acquisition and positioning system for an inline system for measuring the optical characteristics of a glass sheet , which inline system includes a background screen including contrasting elements arranged in a pre-defined pattern , a digital camera for acquiring an image of the background screen with the glass sheet positioned between the camera and the screen at a preselected position , and which inline system is installed in a system for fabricating glass sheets including one or more processing stations and one or more conveyors for conveying the glass sheet from station to station during processing , the acquisition and positioning system comprising:an exterior support frame mounted in proximity to the conveyor between the camera and the background screen;a moveable glass sheet support frame operably connected to the exterior support frame such that the glass sheet support frame may be selectively positioned from a first generally horizontal orientation in the plane of the glass sheet on the conveyor to a second, ...

METHODS OF MAKING AND INSPECTING A WEB OF VITREOUS LITHIUM SULFIDE SEPARATOR SHEET AND LITHIUM ELECTRODE ASSEMBLIES

A lithium ion-conductive solid electrolyte including a freestanding inorganic vitreous sheet of sulfide-based lithium ion conducting glass is capable of high performance in a lithium metal battery by providing a high degree of lithium ion conductivity while being highly resistant to the initiation and/or propagation of lithium dendrites. Such an electrolyte is also itself manufacturable, and readily adaptable for battery cell and cell component manufacture, in a cost-effective, scalable manner. An automated machine based system, apparatus and methods assessing and inspecting the quality of such vitreous solid electrolyte sheets, electrode sub-assemblies and lithium electrode assemblies can be based on spectrophotometry and can be performed inline with fabricating the sheet or web (e.g., inline with drawing of the vitreous Li ion conducting glass) and/or with the manufacturing of associated electrode sub-assemblies and lithium electrode assemblies and battery cells. 15-. (canceled)6. A method of inspecting a battery cell component , the method comprising: a dense solid inorganic electrolyte sheet as an ionically conductive separator layer having first and second opposing principal side surfaces; and', 'a material layer coated on the first principal side surface; and, 'i) providing an electrode subassembly comprisingii) spectrophotometrically inspecting the electrode subassembly for defects or flaws at an interface between the dense solid inorganic electrolyte sheet and the material layer, wherein the spectrophotometric inspection is an automated inspection comprising:providing a source of light of a specified wavelength, or the wavelength selectable from a range of wavelengths;providing sensors for measuring intensity of the light;providing a computer that interfaces with the sensors for collecting light intensity data;shining the light at the solid electrolyte sheet for transmission or reflection measurements;measuring the transmitted or reflected light intensity ...

METHOD AND APPARATUS FOR INSPECTING DEFECTS ON TRANSPARENT SUBSTRATE

A method of inspecting defects of a transparent substrate may include: illuminating a transparent substrate; calculating an incidence angle range of light so that a first region where the light meets a first surface of the transparent substrate and a second region where light meets a second surface being opposite the first surface of the transparent substrate do not overlap each other; adjusting an incidence angle according to the incidence angle range; adjusting a position of a first detector so that a first field-of-view of the first detector covers the first region and does not cover the second region; adjusting a position of a second detector so that a second field-of-view of the second detector covers the second region and does not cover the first region; and obtaining a first image of the first region and a second image of the second region from the first and second detector, respectively. 1. A method of inspecting defects of a transparent substrate , the method comprising:illuminating the transparent substrate by emitting light from an illumination optical system;calculating an incidence angle range of light emitted from the illumination optical system and incident on the transparent substrate so that a first region where the light meets a first surface of the transparent substrate and a second region where light transmitted through the transparent substrate meets a second surface of the transparent substrate do not overlap each other in a direction normal to the transparent substrate, the second surface being opposite to the first surface;adjusting an incidence angle of the light according to the calculated incidence angle range;adjusting a position of a first detector so that a first field-of-view of the first detector covers the first region and does not cover the second region;adjusting a position of a second detector so that a second field-of-view of the second detector covers the second region and does not cover the first region;andobtaining a first ...

Method and device for verifying the transmittance of a flat glass substrate

The invention relates to a method and an associated device for verifying the transmittance of a flat-glass substrate (40) with a measuring device (10), with which light of at least one light source (20) is guided from one side of the flat-glass substrate (40) through the flat-glass substrate (40) to the opposite side of the flat-glass substrate (40), where it is captured by at least one receiving unit (30) and the transmittance of the flat-glass substrate (40) is determined by means of a comparison between the intensity of the light emitted by the light source (20) and the light incident upon the receiving unit (30). In a first measurement, a light source (20) generates polychromatic light in the process, wherein the transmittance is determined at a point of the flat-glass substrate (40), and in at least one further measurement, a light source (20) generates monochromatic light of a defined wavelength, the transmittance also being determined at the same point of the flat-glass substrate (40), if possible. By comparing the at least two measurements, it is determined whether the transmittance is approximately the same or not the same in all measurements, in order thus to be able to better narrow down the cause for a reduced transmittance.

Lithium ion conducting sulfide glass fabrication

A lithium ion-conductive solid electrolyte including a freestanding inorganic vitreous sheet of sulfide-based lithium ion conducting glass is capable of high performance in a lithium metal battery. Such an electrolyte is also manufacturable, and readily adaptable for battery cell and cell component manufacture, in a cost-effective, scalable manner using an automated machine based system, apparatus and methods based on inline spectrophotometry to assess and inspect the quality of such vitreous solid electrolyte sheets and associated components. Suitable manufacturing methods can involve multi-stage thinning of a sulfide glass preform that includes a first thinning operation that involves applying a compressive force onto the preform to form a glass sheet and a second thinning operation that involves applying a tensile force on the as-formed glass sheet (e.g., drawing the sheet by pulling)

METHOD AND APPARATUS FOR INSPECTING DEFECTS ON TRANSPARENT SUBSTRATE AND METHOD OF EMITTING INCIDENT LIGHT

A method of inspecting defects on a transparent substrate may include: selecting a gradient of an illumination optical system so that light incident on the transparent substrate has a first angle; selecting a gradient of a detection optical system so that an optical axis of the detection optical system located over the transparent substrate has a second angle, which is equal to or less than the first angle; adjusting a position of at least one of the illumination optical system, the transparent substrate, and the detection optical system so that a field-of-view of the detection optical system covers a first region where the light meets a first surface of the transparent substrate and does not cover a second region where light meets a second surface of the transparent substrate, the second surface being opposite to the first surface; illuminating the transparent substrate; and detecting light scattered from the transparent substrate. 1. A method of inspecting defects of a transparent substrate , the method comprising:selecting a gradient of an illumination optical system so that light emitted from the illumination optical system and incident on the transparent substrate has a first angle relative to a normal direction of the transparent substrate;selecting a gradient of a detection optical system so that an optical axis of the detection optical system located over the transparent substrate has a second angle, which is equal to or less than the first angle, relative to the normal direction of the transparent substrate;adjusting a position of at least one of the illumination optical system, the transparent substrate, and the detection optical system so that a field-of-view of the detection optical system covers a first region where the light meets a first surface of the transparent substrate and does not cover a second region where light transmitted through the transparent substrate meets a second surface of the transparent substrate, the second surface being opposite ...

METHOD FOR PARTICLE DETECTION ON FLEXIBLE SUBSTRATES

Methods for detection of particulate on thin, flexible substrates wherein the substrate is positioned in a bend comprising an apex line. The apex line is illuminated by grazing angle illumination, and light from the illumination scattered by the particulate is captured by a detection apparatus. 1. A method of detecting particulate on a substrate comprising:conveying the substrate over an arcuate surface and producing a first bend in at least a portion of the substrate;illuminating an exterior surface of the substrate at an apex line of the first bend with a laser beam, wherein a central axis of the laser beam is within 10 degrees of a plane tangent to the apex line and the laser beam is elongated in a direction perpendicular to the central axis, the illuminating producing scattered light from particulate on the exterior surface at the apex line; anddetecting the scattered light with a detection device.2. The method according to claim 1 , wherein an optical axis of the detection device is within 10 degrees of the tangent plane at the apex line.3. The method according to claim 1 , wherein the conveying comprises conveying the substrate over a roller.4. The method according to claim 3 , wherein the conveying comprises contacting edge portions of the substrate with spacers positioned on the roller claim 3 , the spacers configured to space the substrate above a surface of the roller.5. The method according to claim 1 , wherein the conveying comprises conveying the substrate over an air bearing to produce the first bend.6. The method according to claim 1 , further comprising directing the laser beam through a slow-axis cylindrical lens that collimates a beam in a direction that is parallel to the apex line.7. The method according to claim 6 , further comprising directing the laser beam through a fast-axis cylindrical lens collimates a beam and focuses it onto a first azimuthal plane.8. The method according to claim 7 , further comprising using a narrow slit to restrict a ...

POLARIZED RESIN FILM AND PROCESS FOR PRODUCING SAME

An object of the present invention is to provide a polarized vinylidene fluoride/tetrafluoroethylene copolymer resin film that can significantly reduce, when used as an optical film, the deterioration of the quality of video or still images formed by display elements. 1. A polarized vinylidene fluoride/tetrafluoroethylene copolymer resin film having 2 ,000 or fewer spot defects per m , the number of spot defects being measured by a defect measurement method;the defect measurement method comprising reading defects of the film, using an surface inspection system in which a CCD camera is placed so as to detect defects at an angle of 45 degrees relative to an LED light source, within a rectangular range of 300 mm in a width direction, which is a direction perpendicular to a scanning direction, and 150 mm in a machine direction, which is the scanning direction, while the film is scanned under the camera at a rate of 20 m/min;wherein,{'sup': 2', '2, 'first, defects having a bright area of 1.5 mmor less and a dark area of 1.4 mmor less are selected; and'}next, in order to remove defects resulting from causes other than a corona treatment from the selected defects, a circumscribed rectangle of defect is set so as to have two sides along the scanning direction, and the number of only defects having a circumscribed width of 2.88 mm or less, a circumscribed length of 0.43 to 2.30 mm, an aspect ratio of −39 to +27, an occupancy area ratio in the circumscribing rectangle of 4,000 to 6,950, and an area ratio of −3,100 to +5,200, is automatically counted as spot defects by the surface inspection system.2. The polarized vinylidene fluoride/tetrafluoroethylene copolymer resin film according to claim 1 , wherein the number of spot defects per mis 50 or fewer.3. A method for producing a polarized resin film claim 1 , comprising:step A of charging a non-polarized resin film directly placed on a ground electrode by a corona treatment using a first electrode while applying a voltage ...

OPTICAL FIBER CONNECTOR INSPECTOR WITH TWO-DIMENSIONAL SCANNING FUNCTION

A connector inspector includes a microscope assembly, a supporting tray, a main frame, and a fitting tip. The microscope assembly is placed within the supporting tray with a bottom cylindrical protrusion inserted into a base plate of the supporting tray, and the supporting tray is coupled with the main frame with a pair of pivoting joints. The microscope assembly is horizontally biased by a spring and an adjusting knob, set between the main frame and the microscope assembly. The microscope assembly is vertically biased by a spring and an adjusting knob, set between the main frame and the microscope assembly. Thus, the microscope assembly may be swung to shift the imaging axis in two dimensions. The design of enables the inspector to be used with just one hand. See-through windows are formed on the sides of the fitting tip for monitoring the shifting of the imaging axis. 1. An optical fiber connector inspector with two-dimensional scanning function , comprising:a microscope assembly having a tubular front portion and a rear housing portion, the tubular front portion having an axis collinear with an imaging axis of the microscope assembly, the rear housing portion having a top surface, a bottom surface, a first side surface and a second side surface;a supporting tray having two side plates and a base plate connected between respective bottom ends of the two side plates, defining a receiving space between the two side plates and above the base plate, wherein two side through holes are respectively formed in the two side plates;a main frame having a tubular front portion and a rear portion, the rear portion having a top plate, a first side plate, a second side plate, and a receiving space between the two side plates and below the top plate and in communication with an internal channel of the tubular front portion, wherein two side through holes are respectively formed in the two side plates;a fitting tip having a front insertion portion for interfacing with a fiber ...

METHOD AND SYSTEM FOR DETECTING INCLUSIONS IN FLOAT GLASS

A method and/or system is provided for detecting inclusions (e.g., nickel sulfide based inclusions/defects) in soda-lime-silica based glass, such as float glass. In certain example instances, during and/or after the glass-making process, following the stage in the float process where the glass sheet is formed and floated on a molten material (e.g., tin bath) and cooled or allowed to cool such as via an annealing lehr, visible light from an intense visible light source(s) is directed at the resulting glass and thermal imaging is used to detect inclusions based on a temperature difference between the inclusions and surrounding float glass. In another example embodiment, inclusion detection may be performed without exposure of the glass to light from a light source(s). Inclusions and surrounding glass may cool at different rates and be at different temperatures just prior to and/or after an annealing lehr, and a difference in residual temperature between inclusions and surrounding glass may be detected via thermal imaging and identified to identify inclusion(s). 2. The method of claim 1 , wherein the at least one light source directs light having a wavelength(s) in a range from 400 to 700 nm toward the glass.3. The method of claim 1 , wherein the inclusion comprises nickel sulfide.4. The method of claim 1 , wherein the glass further comprises a colorant portion comprising iron.5. The method of claim 1 , wherein said detecting the inclusion comprises determining whether an area of the glass is at a temperature higher than a temperature of said another area of the glass by at least a predetermined amount claim 1 , and when the area of the glass is at a temperature higher than a temperature of said another area of the glass by at least the predetermined amount determining that the area of the glass may have an inclusion.6. The method of claim 5 , wherein the predetermined amount is at least 1 degree F.7. The method of claim 5 , wherein the predetermined amount is at least ...

SYSTEM AND METHOD FOR OPTICAL MEASUREMENT ON A TRANSPARENT SHEET

The invention relates to a system for measuring light transmission and/or light reflection properties of a transparent sample sheet, the system comprising a detection assembly and a control unit, wherein the detection assembly comprises an integrating sphere having a sample port, an illumination port, a detection port, an internal light source positioned at the illumination port, and a photodetector coupled to a spectrometer and positioned at the detection port; means to detect radiation coming either directly from the sample port or from the wall of the integrating sphere; an external light source axially aligned with the sample port; means to illuminate with the internal light source or with the external light source; a reference standard, and means to position it at and from the sample port. This system is relatively compact, and can advantageously be used at existing sheet production lines for process and quality control. The invention also relates to a method for measuring light transmission and/or light reflection properties of a transparent sample sheet that applies said system; and to processes of making a sheet, especially an AR-coated glass sheet, comprising said method. 1. A system for measuring light transmission and/or light reflection properties of a transparent sample sheet , the system comprising a detection assembly and a control unit , wherein the detection assembly comprises a sample port,', 'an illumination port;', 'a detection port;', 'an internal light source positioned at the illumination port;', 'a photodetector coupled to a spectrometer and positioned at the detection port; and', 'means to detect radiation coming either directly from the sample port or from the wall of the integrating sphere or both directly from the sample port and from the wall of the integrating sphere;, 'an integrating sphere having'}an external light source or a transmittance detector axially aligned with the sample port;means to illuminate either with the internal ...

OPTICAL INSPECTION SYSTEM, PROCESSING SYSTEM FOR PROCESSING OF A MATERIAL ON A FLEXIBLE SUBSTRATE, AND METHODS OF INSPECTING A FLEXIBLE SUBSTRATE

According to one aspect of the present disclosure, an optical inspection system for inspecting a flexible substrate is provided. The system includes a substrate support with an at least partially convex substrate support surface configured to guide the substrate along a substrate transportation path, the substrate support being arranged on a first side of the substrate transportation path; a light source arranged on a second side of the substrate transportation path and configured to direct a light beam through a portion of the substrate which is supported on and in contact with the convex substrate support surface; and a light detector for conducting a transmission measurement of the substrate. According to a further aspect of the present disclosure, methods of inspecting a flexible substrate are provided. 1. An optical inspection system for inspecting a flexible substrate , comprising:a substrate support with an at least partially convex substrate support surface configured to guide the substrate along a substrate transportation path, the substrate support being arranged on a first side of the substrate transportation path;a light source arranged on a second side of the substrate transportation path and configured to direct a light beam through a supported portion of the substrate which is in contact with the substrate support surface; anda light detector for conducting a transmission measurement of the substrate.2. The optical inspection system of claim 1 , wherein the substrate support comprises a rotatable roller and the at least partially convex substrate support surface is an outer surface of the rotatable roller.3. The optical inspection system of claim 1 , wherein the substrate support is at least partially made of a transparent material for transmitting the light beam at least partially through the substrate support.420. The optical inspection system of claim 16 , wherein an outer circumferential layer of the rotatable roller is made of the transparent ...

APPARATUS AND METHOD FOR INSPECTING A GLASS SHEET

An apparatus and method for inspecting an edge of a glass sheet are disclosed. The apparatus includes an optical system including a light source arranged to illuminate an edge portion of a glass sheet in a direction oblique to the glass sheet and a camera arranged to take an image of the edge portion, and an image processing device configured to process an image of the glass sheet received from the camera to detect an edge defect of the glass sheet. The method includes acquiring an image of a glass sheet, detecting an edge line of the glass sheet from the image, detecting a reference line from the edge line, and detecting an edge defect of the glass sheet by comparing the edge line and the reference line. 1. An apparatus for inspecting an edge of a glass sheet , the apparatus comprising:an optical system comprising a light source arranged to illuminate an edge portion of a glass sheet in a direction oblique to the glass sheet and a camera arranged to acquire an image of the edge portion; andan image processing device configured to receive the image from the camera and process the image to detect an edge defect of the glass sheet.2. The apparatus of claim 1 , further comprising a transport device configured to convey the glass sheet claim 1 , the optical system arranged on one side of the transport device.3. The apparatus of claim 1 , wherein the camera comprises a tilting portion configured to adjust an orientation of a plane of focus of the camera such that the plane of focus of the camera is parallel to the glass sheet.4. The apparatus of claim 1 , wherein the optical system further comprises a first mirror claim 1 , the first mirror and the camera oriented so that a plane of focus of the camera is parallel to the glass sheet.5. The apparatus of claim 4 , wherein the optical system further comprises a second mirror claim 4 , the second mirror and the light source oriented so that light emitted from the light source is reflected by the second mirror and incident on ...

Verfahren und Vorrichtung zur Messung von optischen Kenngrößen transparenter, streuender Messobjekte

Die Erfindung betrifft die Messung verschiedener Transmissions- und Reflexionswerte von transparenten Messobjekten 1, die in einer Inline-Beschichtungsanlage mit transparenten Schichten versehen werden, und eine Vorrichtung zur Durchführung des Verfahrens. Ihr liegt die Aufgabe zugrunde, ein solches Verfahren und dazu verwendbare Vorrichtung anzugeben, mit denen die gewünschten Kenngrößen und insbesondere die Trübung des Messobjektes 1 inline, d.h. auch während einer Relativbewegung zwischen Messobjekt 1 und Messvorrichtung, zu ermitteln und so für die laufende Kontrolle der Kenngröße in einer Inline-Anlage verwendbar sind. Zur Lösung der Aufgabe werden mittels zweier Fotodetektoren 21, 22 Transmissionsanteile in zwei verschiedenen Strahlungsrichtungen einer diffuses Licht aussendenden Beleuchtungsquelle 5 gemessen, von denen in einer Richtung der Anteil des diffusen Lichts der Beleuchtungsquelle 5 unterdrückt wird.

유연한 유리 리본을 검사하기 위한 장치 및 방법

유연한 유리 리본을 검사하기 위한 장치(10, 110, 210)가 제공된다. 일 예에 있어서, 그러한 장치는 소정 길이의 유연한 유리 리본(12)을 저장하기 위한 적어도 하나의 저장 롤(16)을 포함한다. 다른 예에 있어서, 상기 장치는 검사 장치(50, 150, 250)를 더 포함한다. 또 다른 예에 있어서, 상기 검사 장치는 유연한 유리 리본의 이동 경로(14)를 따라 스패닝되는 유연한 유리 리본의 언롤부(28)의 특성을 검사할 수 있다. 다른 예로는 유연한 유리 리본의 특성을 검사하는 방법을 포함한다.

판유리 결함 검출 장치, 판유리 제조 방법, 판유리 물품, 판유리의 양부 판정 장치 및 판유리 검사 방법

(과제) 판유리의 내부, 또는 표면에 발생하는 각종 결함을 신속하고 또한 효율적으로 높은 정밀도로 검출한다. (해결 수단) 판유리 결함 검출 장치(10)는 판유리(G)를 사이에 두는 대향위치에 배치된 광원(20)과 수광 장치(30)를 구비하고 있다. 판유리(G)는 그 두께 방향으로 대향하는 투광면(Ga,Gb)을 갖고, 투광면(Ga,Gb)이 이 판유리 결함 검출 장치(10)의 광학계의 광축(Lx)에 대하여 소정 각도(α)만큼 경사지도록 광원(20)과 수광 장치(30) 사이에 배치되어 있다. 또한 수광 장치(30)와 판유리(G)는 광축(Lx) 상에 있어서 수광 장치(30)의 렌즈계(31)의 초점거리(F)가 수광 장치(30)의 수광 소자부터 판유리(G)까지의 거리(Z)보다 작아지는 위치관계로 배치되어 있다. 판유리 결함 검출 장치

유리패널 크랙 검사장치

본 발명은, TAB 공정이 진행된 유리패널 아래에서 상기 유리패널을 향해 조명 빛을 조사하는 조명부와, 상기 유리패널 아래에서 조명 빛이 비친 상기 유리패널을 촬영하는 카메라부가 하나의 모듈로 묶인 헤드유닛; 상기 헤드유닛을 상기 TAB 공정이 진행된 유리패널 부위를 따라 이동시키는 구동유닛; 및 상기 카메라부에서 촬영된 영상을 받아, TAB 공정이 진행된 유리패널이 깨지거나 금이 갔는지 판독하는 영상판독유닛을 포함한다. 이로 인해, TAB 공정이 진행된 유리패널 부위에 금이 갔거나 깨졌는지 정확하게 판독할 수 있다.

用于处理大面积基板的设备和方法

描述了一种用于处理大面积基板(120)的设备(100)以及一种用于测量基本上竖直地布置的大面积基板的至少一个光学性质的方法。用于处理大面积基板的设备包括：腔室布置(110)，用于以竖直地布置的状态来传输大面积基板通过所述腔室布置(110)，其中，腔室布置包括至少一个腔室、处理装置和出口端口(112)，处理装置用于处理竖直地布置的大面积基板，出口端口(112)用于竖直地布置的大面积基板；传输系统，用于传输基板通过腔室布置；以及测量布置(210)，包括光学测量装置。光学测量装置包括发光装置(211)和光检测装置，发光装置用于将漫射光发射到竖直地布置的大面积基板上，光检测装置用于测量竖直地布置的大面积基板的至少一个光学性质。

ガラス基板表面検査装置受光系

(57)【要約】本公報は電子出願前の出願データであるた め要約のデータは記録されません。

Manufacturing method of glass plate

How to recognize and evaluate defects in reflective surface coatings

컬러 비디오 카메라의 의해서 전달된 이미지의 디지털 데이터 처리에 의해서, 유리 플레이트 위의 반사표면 코팅중에 있는 국소적으로 한정된 색 결함을 인식평가하는 것이 수행된다. 마지막에, 코팅된 유리플레이트(1)는 백색광을 사용해서 조명받고, 표면 코팅부(3)에 의해서 반사된 빛은 영사 스크린(6) 위에 가시화된다. 영사 스크린(6) 위에 나타나는 이미지는 하나 이상의 컬러 비디오 카메라(12, 13, 14, 15)에 의해서 포착된다. 컬러 비디오 카메라에 의해서 포착된 표면의 삼원색의 각각에 대해서, 각 픽셀의 명도가 결정된다. 각 삼원색의 결정된 명도값을 상응하는 픽셀에서 삼원색의 명도값의 합으로 나눔으로써 상대적 색분율이 결정된다. 상대적 색분율을 미리 결정된 설정치와 비교한다.

Glass plate inspection method and its manufacturing method and glass plate inspection equipment

Glass panel crack inspection device

본 발명은, TAB 공정이 진행된 유리패널 아래에서 상기 유리패널을 향해 조명 빛을 조사하는 조명부와, 상기 유리패널 아래에서 조명 빛이 비친 상기 유리패널을 촬영하는 카메라부가 하나의 모듈로 묶인 헤드유닛; 상기 헤드유닛을 상기 TAB 공정이 진행된 유리패널 부위를 따라 이동시키는 구동유닛; 및 상기 카메라부에서 촬영된 영상을 받아, TAB 공정이 진행된 유리패널이 깨지거나 금이 갔는지 판독하는 영상판독유닛을 포함한다. 이로 인해, TAB 공정이 진행된 유리패널 부위에 금이 갔거나 깨졌는지 정확하게 판독할 수 있다.

Sorting system and method for glass sheets

This invention relates to a sheet pick-up system which classifies cut glass sheets into graded products of a plurality of quality levels and picks up products of a desired grade at a time in the production line of the glass sheets. A discriminating type defect detector (101) detects the size and position of any defect existing on ribbon-shape glass sheets withdrawn from a kiln and conveyed on a line conveyor and sends them as defect data to a control unit (102). The control unit (102) sorts the quality grades of the cut glass sheets on the basis of the fault data. A sheet pick-up machine (110) having a push-up device (112) and a suction conveyor (111) picks up products of a desired grade under the control of the control unit (102).

Device for cutting of glass sheet

Disclosed herein is a device for cutting a glass sheet, continuously supplied after a melting and solidification process, into quadrangular glass substrates. The glass sheet cutting device includes two or more cutters for cutting a glass sheet into quadrangular glass substrates, a defect inspector for scanning the glass sheet to three-dimensionally check defect positions in a length direction, a width direction and a thickness direction of the glass sheet, a position adjuster for moving at least one of the cutters to a portion of the glass sheet at which few defects are distributed, and a controller for informing the position adjuster of positions of the cutters based on the scanned results received from the defect inspector.

Defect inspection method

System and related method for measuring optical characteristics of glass sheet on process line

FIELD: measuring equipment. SUBSTANCE: invention relates to a method and a device for measuring both the optical distortion of a transmitted image and small defects in glass sheets, embedded in a process line in a system of glass sheet processing. A system installed on a process line for measuring optical characteristics of a glass sheet, installed in a system for the manufacture of glass sheets, is claimed, containing one or more processing stations and one or more conveyors for transporting a glass sheet from station to station during processing, while the system installed on the process line contains: a device for measuring small optical or view-obstructing defects in the first selected area of a glass sheet, containing the first lumen screen containing contrast elements arranged in the form of a given pattern. It also contains the first chamber for obtaining the first image data set containing at least one image of the first lumen screen associated with the first selected area of the glass sheet, when moving the glass sheet to a pre-selected position on the conveyor between the chamber and the first lumen screen, and a computing device containing at least one processor programmed to implement logic for receiving the first image data set, generating an intensity map from the first image data set and identifying and locating small defects from the intensity map. In this case, the logic for generating an intensity map from the first image data set includes logic for generating a Fourier transform of image data, demodulating a Fourier transform, generating an inverse Fourier transform of demodulated data, extracting a two-dimensional complex number associated with each pixel, while the specified complex number has a phase component and a magnitude component, and generating an intensity map of the inverse Fourier transform by determining the square root of the sum of squares of the imaginary part of the two-dimensional complex number and the real part of the two- ...

System for inspecting an object having irregular pattern

불규칙 패턴들을 가지는 대상물, 예를 들어 투명 필름의 너울 불량을 검사하는 시스템이 개시된다. 불균일한 두께를 가지는 대상물의 너울 불량을 검사하는 불량 검사 시스템은 면광을 출력하는 광원 및 상기 광원으로부터 출력된 면광을 점광으로 변환하는 광 변환부를 포함한다. 여기서, 상기 광원으로부터 출력된 광은 상기 광 변환부를 통하여 상기 대상물로 입사된다.

Defect detection method for transparent plate

Inspection apparatus and method for appearance of optically clear adhesive film

본 발명은 OCA필름 외관 검사장치 및 방법에 관한 발명으로, OCA 타발 필름을 안착하는 필름패널을 다단 적재하고 검사장치 내부로 일 단씩 순차 투입하도록 구비하는 투입유닛(100)과, OCA 타발 필름을 흡착하는 흡착패드(210)를 투입유닛(100)과 외관검사유닛(300)의 상측에서 횡동하여 외관검사유닛(300)에 필름을 로딩하도록 구비하는 제1이재유닛(200)과, OCA 타발 필름의 상, 하측에서 투과 조명 광학 방식에 의해 외관을 검사하여 이상을 검출하도록 구비하는 외관검사유닛(300)과, OCA 타발 필름을 흡착하는 흡착패드(410)를 외관검사유닛(300)과 제1배출유닛(500) 및 제2배출유닛(600)의 상측에서 횡동하여 외관검사유닛(300)에서 필름을 언로딩하도록 구비하는 제2이재유닛(400)과, 외관검사유닛(300)에 의해 검사공정을 거친 OCA 타발 필름 중에서 불량품으로 검출된 필름을 안착하는 필름패널을 다단 적재하고 검사장치 외부로 배출하도록 구비하는 제1배출유닛(500)과, 외관검사유닛(300)에 의해 검사공정을 거친 OCA 타발 필름 중에서 양품으로 검출된 필름을 안착하는 필름패널을 다단 적재하고 검사장치 외부로 배출하도록 구비하는 제2배출유닛(600)을 포함하여 구성함에 따라 광학용 점착 소재인 OCA필름의 출하 전에 필름 외관 불량 유무를 정밀하게 검출하는 것이 특징이다. The present invention relates to an apparatus and method for inspecting the appearance of an OCA film, and an input unit 100 having a film panel on which the OCA punched film is seated is loaded in multiple stages and sequentially introduced into the inspection device one by one, and the OCA punched film is adsorbed The first transfer unit 200 having a suction pad 210 to load the film in the appearance inspection unit 300 by traversing from the upper side of the input unit 100 and the appearance inspection unit 300, and the OCA punching film Appearance inspection unit 300 provided to detect abnormalities by inspecting the appearance by transmission illumination optical method from the upper and lower sides, and the adsorption pad 410 for adsorbing OCA punched film are first discharged with the appearance inspection unit 300 Inspection process by the second transfer unit 400 provided to unload the film from the appearance inspection unit 300 by moving from the upper side of the unit 500 and the second discharging unit 600 , and the appearance inspection unit 300 . OCA that has undergone the inspection process by the first discharging unit 500 and the appearance inspection unit 300, which are provided to stack the film panels on which the films detected as defective among the OCA punched films that ...

Polarizing film imaging device, inspection device, and inspection method

Method for identifying defect in transparent material and its equipment

本发明涉及识别透明材料中的缺陷的方法，其中用第一发光装置照射透明材料的一定的部分体积，用第二发光装置如此将光线耦合输入透明材料中，即光路在上述部分体积里只在该材料中延伸，这样识别在该部分体积里的缺陷，即探测由该缺陷散射的光，或探测由该缺陷引起的在明场内的光吸收，和/或探测由该缺陷引起的、所述第一发光装置的光线的偏转。本发明还涉及识别材料中的缺陷的装置，它包括用于照射透明材料的一定部分体积的第一发光装置、用于探测来自该部分体积的光的探测器和第二发光装置，第二发光装置如此相对透明材料布置，即对应的光路在所述部分体积内只在该透明材料内延伸。

Inspection device and inspection method for pattern phase difference filter

위상차 특성이 서로 상이한 패턴 위상차 필터의 제 1, 제 2 영역의 라인 피치나, 제 1, 제 2 영역의 경계선 폭을 정확하게 측정한다. FPR (3) 의 일방의 면에, 광원부 (4) 로부터의 광을 제 1 편광판 (7) 을 통해 조사한다. FPR (3) 의 제 1, 제 2 영역 (3B, 3C) 은 지상축이 직선 편광광의 편광면에 대해 ± 45°기울어져 있기 때문에, 직선 편광광은 제 1, 제 2 영역 (3B, 3C) 을 지난다. 제 2 편광판 (8) 은 제 1 편광판 (7) 에 대해 크로스 니콜 배치되어 있다. 제 1, 제 2 영역 (3B, 3C) 을 통과한 직선 편광광은 제 2 편광판 (8) 에 의해 차단되고, 제 1, 제 2 영역 (3B, 3C) 의 경계부 등에 발생한 위상차 특성이 불완전한 영역을 지난 광의 일부는, 제 2 편광판 (8) 을 통과하여 에어리어 센서 카메라 (6) 로 검사 화상으로서 촬상된다.

Tester Inspecting Many Kinds of Glass and The Method thereof

디스플레이에 사용되는 유리 기판의 상태를 검사하는 유리 기판 검사 장치에 관한 것으로, 정반의 상면에 고정 설치되고, 정반의 상면을 따라 일측 방향으로 힘을 가하여 대상체를 일측 방향을 따라 이동시키는 동력 발생부; 동력 발생부의 작동에 의하여 전후 방향의 중심 대칭축에 대하여 동시에 접근하거나 동시에 멀어지고, 전후 방향의 중심 대칭축 및 좌우 방향의 중심 대칭축에 대하여 각각 대칭으로 구비되는 적어도 4개의 대칭 이동부를 갖는 위치조정 지지부; 및 각 대칭 이동부의 상부에 고정 결합되고, 온 신호에 의하여 수직으로 세워지고 오프 신호에 의하여 소정의 각도로 눕혀지는 위치조정 클램핑부를 포함하여 구성되는 다종 유리 기판 검사 장치로서, 프레임으로 이송되는 다양한 사이즈의 유리 기판이 기준점에 대하여 좌표 설정되도록 유리 기판을 위치 조정한다.

System and related method for detecting small defects on/in glass sheet on process line

FIELD: measuring equipment. SUBSTANCE: invention relates to a method and a device for measuring small defects in glass sheets, embedded in a process line in a system for glass sheet processing. The claimed device for detecting small defects installed in the process line in the system for glass sheet processing contains a single-line camera, a clear screen containing contrasting elements arranged in the form of a preset pattern, an upstream conveyor and a downstream conveyor, while the upstream conveyor and the downstream conveyor are located one after the other at a distance from each other to form a gap of the selected size, so that the camera can receive a set of images of the clear screen, when a part of a glass sheet without support is transported over the gap, and a computing device programmed to implement logic in order to obtain an image data set containing the set of images of the clear screen and identify small defects in glass based on this data. The system may also contain an identifier of a part of a glass sheet and a programmable control device containing logic for analyzing received image data and selecting an area of interest on a glass sheet for analysis. EFFECT: increase in the accuracy of detecting and measuring small defects in glass sheets. 10 cl, 11 dwg РОССИЙСКАЯ ФЕДЕРАЦИЯ (19) RU (11) (13) 2 763 417 C2 (51) МПК B65G 49/06 (2006.01) G01N 21/95 (2006.01) ФЕДЕРАЛЬНАЯ СЛУЖБА ПО ИНТЕЛЛЕКТУАЛЬНОЙ СОБСТВЕННОСТИ (12) ОПИСАНИЕ ИЗОБРЕТЕНИЯ К ПАТЕНТУ (52) СПК B65G 49/06 (2021.08); G01N 21/95 (2021.08) (21)(22) Заявка: 2019126745, 08.02.2018 (24) Дата начала отсчета срока действия патента: Дата регистрации: (73) Патентообладатель(и): Гласстек, Инк. (US) 29.12.2021 09.02.2017 US 15/428,401 (43) Дата публикации заявки: 09.03.2021 Бюл. № 7 (45) Опубликовано: 29.12.2021 Бюл. № 1 (56) Список документов, цитированных в отчете о поиске: WO 2016140753 A1, 09.09.2016. US 20120098959 A1, 26.04.2012. US 20130211736 A1, 15.08.2013. DE 3724638 C2, 16.07.1998. US ...

X-ray apparatus

엑스선 검출 장치, 엑스선 검출 장치를 수납할 수 있는 수납부, 및 수납부에 수납 및 배출되는 버키 트레이를 포함하며, 버키 트레이는 베이스부, 및 베이스부에 대해 회전 가능하도록 배치되고, 일 면에 상기 엑스선 검출 장치가 탑재될 수 있는 제1 플레이트를 구비하는 엑스선 검출 장치 및 이를 포함하는 엑스선 장치를 제공한다. And a bucky tray accommodated in and discharged from the storage section, wherein the bucky tray is arranged to be rotatable with respect to the base section and the base section, And a first plate on which the X-ray detecting apparatus can be mounted. The X-ray detecting apparatus and the X-ray apparatus including the same are provided.

Device for optically detecting local inhomogeneities in the structure of tested objects

Device for the integrated processing of defect images

Defect inspection device, defect inspection method, method for manufacturing circular polarizing plate or elliptical polarizing plate, and method for manufacturing retardation plate

[과제] 높은 범용성을 실현할 수 있는, 원 편광판 또는 타원 편광판의 결함, 또는 원 편광 빛 또는 타원 편광 빛의 생성에 사용되는 위상차판의 결함을 검사하기 위한 결함 검사 장치 및 결함 검사 방법, 그리고 상기 결함 검사 방법을 이용한 원 편광판 또는 타원 편광판의 제조 방법 및 위상차판의 제조 방법을 제공한다. [해결수단] 한 형태에 따른 결함 검사 장치(10)는, 직선 편광판(20) 및 위상차판(22)을 갖는 원 편광판(12) 또는 타원 편광판의 결함을 검사하는 결함 검사 장치로서, 원 편광판 또는 타원 편광판이 갖는 직선 편광판 측에 배치되어 있고, 원 편광판 또는 타원 편광판의 촬상 영역(A)에 검사광을 조사하는 광 조사부(14)와, 원 편광판 또는 타원 편광판으로부터 봤을 때 광 조사부와 반대측에 배치되어 있고, 검사광이 조사된 원 편광판 또는 타원 편광판으로부터 출력되는 빛을 원 편광판 또는 타원 편광판 측에 반사하는 반사 부재(16)와, 원 편광판 또는 타원 편광판으로부터 봤을 때 광 조사부와 같은 측에 배치되는 촬상부(18)를 구비한다.

Apparatus for testing glass transmission rate using light

본 발명은 생산 공정 중에 광을 조사하여 연속적으로 생산되는 유리들의 투과율을 실시간으로 정밀 검사할 수 있는 유리 투과율 검사 장치를 제공하는 것으로서, 일정한 파장을 갖는 광을 조사하기 위한 광 조사수단; 광 조사수단으로부터 조사된 광을 직진으로 유리에 집진시키기 위한 광학수단; 광학수단에 의해 집진되어 유리를 통해 투과되는 광과 유리를 투과하기 전의 광의 광량을 감지하기 위한 광 감지수단; 및 광 감지수단에 의해 감지된 유리의 투과 광량을 검사하여 유리의 투과율을 판단하고, 유리 투과율에 대한 판단 결과를 디스플레이하는 투과율 검사수단을 포함한다. The present invention provides a glass transmittance inspection device capable of precisely inspecting transmittance of glass continuously produced by irradiating light during a production process in real time, comprising: light irradiation means for irradiating light having a predetermined wavelength; Optical means for collecting the light irradiated from the light irradiation means in a straight line to the glass; Light sensing means for sensing the amount of light collected by the optical means and transmitted through the glass and before the light is transmitted; And transmittance inspection means for determining the transmittance of the glass by inspecting the amount of transmitted light of the glass sensed by the light sensing means, and displaying a result of the determination on the glass transmittance.

Apparatus and method for characterizing defects in a transparent substrate

기판을 조명하기 위해 명시야와 암시야 광원의 조합을 동시에 사용함으로써 투명 기판(12)의 결함을 검출하기 위한 장치(10) 및 방법. 상기 장치는 제조 설정에 있어 기판의 특성을 단순화하여, 상기 기판이 동작중일 동안 내부 함유물과 표면 결함 모두를 동시에 검출할 수 있다. Apparatus (10) and method for detecting defects in a transparent substrate (12) by simultaneously using a combination of brightfield and darkfield light sources to illuminate the substrate. The device simplifies the characteristics of the substrate in a manufacturing setup, allowing simultaneous detection of both internal inclusions and surface defects while the substrate is in operation. 이미징 시스템, 라인 스캐닝, 암시야, 명시야, 내부 함유물, 표면 결함 Imaging System, Line Scanning, Dark Field, Bright Field, Internal Inclusions, Surface Defects

Patent RU2019126738A3

ВИ“? 2019126738"” АЗ Дата публикации: 21.06.2021 Форма № 18 ИЗПМ-2011 Федеральная служба по интеллектуальной собственности Федеральное государственное бюджетное учреждение ж 5 «Федеральный институт промышленной собственности» (ФИПС) ОТЧЕТ О ПОИСКЕ 1. . ИДЕНТИФИКАЦИЯ ЗАЯВКИ Регистрационный номер Дата подачи 2019126738/28(052484) 08.02.2018 РСТ/О$2018/017388 08.02.2018 Приоритет установлен по дате: [ ] подачи заявки [ ] поступления дополнительных материалов от к ранее поданной заявке № [ ] приоритета по первоначальной заявке № из которой данная заявка выделена [ ] подачи первоначальной заявки № из которой данная заявка выделена [ ] подачи ранее поданной заявки № [Х] подачи первой(ых) заявки(ок) в государстве-участнике Парижской конвенции (31) Номер первой(ых) заявки(ок) (32) Дата подачи первой(ых) заявки(ок) (33) Код страны 1. 15/428,367 09.02.2017 05 Название изобретения (полезной модели): [Х] - как заявлено; [ ] - уточненное (см. Примечания) Система и связанный способ измерения оптических характеристик листа стекла на технологической линии Заявитель: ГЛАССТЕК, ИНК., 05 2. ЕДИНСТВО ИЗОБРЕТЕНИЯ [Х] соблюдено [ ] не соблюдено. Пояснения: см. Примечания 3. ФОРМУЛА ИЗОБРЕТЕНИЯ: [Х] приняты во внимание все пункты (см. Примечания) [ ] приняты во внимание следующие пункты: [ ] принята во внимание измененная формула изобретения (см. Примечания) 4. КЛАССИФИКАЦИЯ ОБЪЕКТА ИЗОБРЕТЕНИЯ (ПОЛЕЗНОЙ МОДЕЛИ) (Указываются индексы МПК и индикатор текущей версии) В65С 45/00 (2006.01) 5. ОБЛАСТЬ ПОИСКА 5.1 Проверенный минимум документации РСТ (указывается индексами МПК) В65С 49/00, 49/06, СОМ 21/00, 21/84, 21/88, 21/89, 21/95, 21/958 5.2 Другая проверенная документация в той мере, в какой она включена в поисковые подборки: 5.3 Электронные базы данных, использованные при поиске (название базы, и если, возможно, поисковые термины): ВУРАТЕМТЬЗ, ОУУРТ, Е-ГлЬгагу, ЕАРАТТЪУ, ЕВЗСО, Езрасепе боозе, Соое Реп, ]- Р1а(Раё, КТРКЪУ, Гех15Мех15, РАТЕМТЗСОРЕ, Ра еагсв, Оцез{е]-ОтЬи, КОРТО, ИЗРТО 6. ...

Detection system based on modulated glass thread structure laser image

基于调制玻璃线结构激光图像的检测系统，包括加工舱、控制系统和辊道传送机构，检测机构设置在加工舱入口的上方，检测机构包括带有激光器的相机和壳体，激光器发出的光束照射在滑辊之间的空档面上，相机的物焦面与光束照射面相对应，相机的信号输出端连接于控制系统，玻璃通过检测区域时，激光照射在玻璃面上，玻璃对线结构激光进行调制，形成明暗分布、运动方向错位或者激光线扭曲的激光调制图像，相机将捕捉到的玻璃信息参数传输给控制系统。该系统中的检测机构采用一体化设计，结构紧凑，方便安装在加工舱入口处的上方，与其他加工装置配套适应强，而且检测过程中对光的入射角度和检测面的角度无特殊要求，而且测量得出的数据精确度较高。

System of rotational vision inspection and method of the same

The present invention relates to a rotational vision inspection system and a method for inspecting a rotational vision. The rotational vision inspection system comprises a vision camera support unit, a plurality of vision cameras, an object continuous rotation unit, and a vision camera transfer unit. The vision camera support rotates around a first rotation axis extending in the first direction. The vision cameras are arranged along the circumferential direction about the first rotation axis and face an object having the curved surface. The object continuous rotation unit rotates the object continuously about a second rotation axis extending in the second direction intersecting the first direction. The vision camera transfer unit transfers the vision camera support unit in the second direction or the opposite direction of the second direction. Or the vision camera transfer unit transfers the vision camera support unit in the third direction opposite to the first and second directions or in the direction opposite to the third direction.

Method for checking transparent material strip for defects and device for effecting same

1. Method for inspecting a transparent material sheet, especially sheet glass, for defects, such as foreign bodies or gas bubbles, trapped in the sheet, in which the material sheet is scanned across its width using a flying light spot and the light that passes through the sheet and/or is reflected is detected, converted into electrical signals and evaluated, characterised in that, during the scanning cycle, the light emerging laterally from the material sheet is additionally detected and converted into an electrical signal, the components of this signal that originate from trapped defects appearing in the form of electrical impulses, and that these impulses are used for evaluation.

Method and apparatus for measuring warpage of optical film

本发明涉及一种光学膜的翘曲的测定方法以及测定装置。在本发明的测定方法中，以载置于工作台(4)上的光学膜(10)为对象，利用激光从光学膜(10)的上方朝向光学膜(10)的端部扫描，并检测来自端部的激光的反射光，由此获取端部的高度位置的信息。

Optical device and method for detecting internal defects of transparent substrate

本发明提供一种用于检测透明基底瑕疵的光学装置及方法。用于检测透明基底内部瑕疵的光学装置包括：用于在预定低分辨率下检测基底的第一检测单元，包括第一感光元件以及位于所述基底和第一感光元件之间的第一镜头，其中第一感光元件和所述第一镜头放置成：使得物面相对于所述基底倾斜设置；用于在预定高分辨率下检测基底的第二检测单元，包括第二感光元件以及位于基底和所述第二感光元件之间的第二镜头，以及处理器，用于将第一检测单元检测到的瑕疵的一部分确定为有待第二检测单元检测的瑕疵，以及用于根据第二检测单元所成的像确定瑕疵的类型。

Patent RU2017131850A3

7 ВУ“” 2017131850"” АЗ Дата публикации: 17.07.2019 Форма № 18 ИЗПМ-2011 Федеральная служба по интеллектуальной собственности Федеральное государственное бюджетное учреждение 5 «Федеральный институт промышленной собственности» (ФИПС) ОТЧЕТ О ПОИСКЕ 1. . ИДЕНТИФИКАЦИЯ ЗАЯВКИ Регистрационный номер Дата подачи 2017131850/11(055880) 02.02.2016 РСТ/О$2016/016095 02.02.2016 Приоритет установлен по дате: [ ] подачи заявки [ ] поступления дополнительных материалов от к ранее поданной заявке № [ ] приоритета по первоначальной заявке № из которой данная заявка выделена [ ] подачи первоначальной заявки № из которой данная заявка выделена [ ] подачи ранее поданной заявки № [Х] подачи первой(ых) заявки(ок) в государстве-участнике Парижской конвенции (31) Номер первой(ых) заявки(ок) (32) Дата подачи первой(ых) заявки(ок) (33) Код страны 1. 14/639,655 05.03.2015 05 Название изобретения (полезной модели): [Х] - как заявлено; [ ] - уточненное (см. Примечания) Система захвата и позиционирования листа Заявитель: Гласстек, Инк., 05 2. ЕДИНСТВО ИЗОБРЕТЕНИЯ [Х] соблюдено [ ] не соблюдено. Пояснения: см. Примечания 3. ФОРМУЛА ИЗОБРЕТЕНИЯ: [Х] приняты во внимание все пункты (см. Примечания) [ ] приняты во внимание следующие пункты: [ ] принята во внимание измененная формула изобретения (см. Примечания) 4. КЛАССИФИКАЦИЯ ОБЪЕКТА ИЗОБРЕТЕНИЯ (ПОЛЕЗНОЙ МОДЕЛИ) (Указываются индексы МПК и индикатор текущей версии) В65(С 47/90 (2006.01) В65С 49/06 (2006.01) СОМ 21/89 (2006.01) СОМ 21/896 (2006.01) СОМ 21/958 (2006.01) 5. ОБЛАСТЬ ПОИСКА 5.1 Проверенный минимум документации РСТ (указывается индексами МПК) В65< 47/00, 47/74, 47/90 В65С 49/00, 49/05, 49/06 СО1М 21/00, 21/84, 21/88, 21/89, 21/892, 21/896, 21/95, 21/958 5.2 Другая проверенная документация в той мере, в какой она включена в поисковые подборки: 5.3 Электронные базы данных, использованные при поиске (название базы, и если, возможно, поисковые термины): О\/РТ, Ебрасепе, РабЗеагсЬ 6. ДОКУМЕНТЫ, ОТНОСЯЩИЕСЯ К ПРЕДМЕТУ ПОИСКА Кате- ...

Patent RU2019126745A3

`7ВУ’” 2019126745” АЗ Дата публикации: 22.06.2021 Форма № 18 ИЗПМ-2011 Федеральная служба по интеллектуальной собственности Федеральное государственное бюджетное учреждение ж 5 «Федеральный институт промышленной собственности» (ФИПС) ОТЧЕТ О ПОИСКЕ 1. . ИДЕНТИФИКАЦИЯ ЗАЯВКИ Регистрационный номер Дата подачи 2019126745/28(052491Т) 08.02.2018 РСТ/О$2018/017397 08.02.2018 Приоритет установлен по дате: [ ] подачи заявки [ ] поступления дополнительных материалов от к ранее поданной заявке № [ ] приоритета по первоначальной заявке № из которой данная заявка выделена [ ] подачи первоначальной заявки № из которой данная заявка выделена [ ] подачи ранее поданной заявки № [Х] подачи первой(ых) заявки(ок) в государстве-участнике Парижской конвенции (31) Номер первой(ых) заявки(ок) (32) Дата подачи первой(ых) заявки(ок) (33) Код страны 1. 15/428,401 09.02.2017 05 Название изобретения (полезной модели): [Х] - как заявлено; [ ] - уточненное (см. Примечания) Система и связанный с ней способ обнаружения мелких дефектов на/в листе стекла на технологической линии Заявитель: Гласстек, Инк., 05 2. ЕДИНСТВО ИЗОБРЕТЕНИЯ [Х] соблюдено [ ] не соблюдено. Пояснения: см. Примечания 3. ФОРМУЛА ИЗОБРЕТЕНИЯ: [Х] приняты во внимание все пункты (см. Примечания) [ ] приняты во внимание следующие пункты: [ ] принята во внимание измененная формула изобретения (см. Примечания) 4. КЛАССИФИКАЦИЯ ОБЪЕКТА ИЗОБРЕТЕНИЯ (ПОЛЕЗНОЙ МОДЕЛИ) (Указываются индексы МПК и индикатор текущей версии) СОМ 21/896 (2006.01) 5. ОБЛАСТЬ ПОИСКА 5.1 Проверенный минимум документации РСТ (указывается индексами МПК) В65С 49/00, 49/06, СОМ 21/00, 21/84, 21/88, 21/89, 21/95, 21/958 5.2 Другая проверенная документация в той мере, в какой она включена в поисковые подборки: 5.3 Электронные базы данных, использованные при поиске (название базы, и если, возможно, поисковые термины): ВУРАТЕМТЬЗ, ОУУРТ, Е-ГлЬгагу, ЕАРАТТЪУ, ЕВЗСО, Езрасепе боозе, Соое Ржепб, /- Р1а(Раё, КТРКЪУ, Гех15Мех15, РАТЕМТЗСОРЕ, Ра еагсв, Оцез{е]-ОтЬи, КОРТО, ...

Detecting system for glass baseplate

本发明提供一种用于检查玻璃基板的缺陷的玻璃基板的检查系统。本发明由于以下部件构成：移动架，驱动装置，主输送装置，次输送装置，第1照明装置。采用本发明，在玻璃基板的输送线上能够以直线状设置，以便能够非常简单、有效地进行玻璃基板的检查，即使在玻璃基板的检查中，也能将后面跟进的玻璃基板连续输送至输送线上，从而能够大大提高抽样检查的效率以及生产率。另外，通过以下结构，即：以简单的工作转变就能非常简单、有效地向能够检查出各种尺寸玻璃基板的灵活性生产系统转换，以及能够稳定输送大型玻璃基板，由此便能在检查中有效地防止缺陷的产生。

Glass substrate inspecting system

본 발명은 유리기판의 결점을 검사하기 위한 유리기판의 검사시스템을 개시한다. 본 발명은 유리기판의 이송라인에 인라인으로 설치되는 베이스프레임의 상부에 유리기판의 이송라인과 정렬되는 유리기판의 이송위치와 검사위치 사이를 운동할 수 있도록 설치되는 모션프레임과, 모션프레임을 운동시키는 작동수단과, 유리기판의 이송위치와 검사위치 각각에 정렬될 수 있도록 설치되며 유리기판의 이송위치에서 이송라인으로부터 유리기판을 인수하여 이송시키는 메인이송수단과, 유리기판의 이송위치에 정렬될 수 있도록 설치되고 유리기판의 이송위치에서 이송라인으로부터 유리기판을 인수하여 이송시키는 서브이송수단과, 메인이송수단의 일측에 설치되어 유리기판을 조명하는 제1 조명수단으로 구성된다. 본 발명에 의하면, 유리기판의 이송라인에 인라인으로 설비하여 유리기판의 검사를 매우 간편하고 효율적으로 실시할 수 있으며, 유리기판의 검사 중에도 후속하는 유리기판을 이송라인으로 지체없이 연속적으로 이송할 수 있어 샘플링검사의 효율성과 생산성을 크게 향상시킬 수 있다. 또한, 간편한 잡체인지에 의하여 다양한 크기의 유리기판을 검사할 수 있는 유연성생산시스템으로의 전환을 매우 간편하고 효율적으로 실시할 수 있으며, 대형 유리기판을 안정적으로 이송시킬 수 있는 구조에 의하여 검사 중에 결점의 발생을 효과적으로 방지할 수 있다. The present invention discloses a glass substrate inspection system for inspecting defects of the glass substrate. The present invention is a motion frame and a motion frame that is installed to move between the transfer position and the inspection position of the glass substrate aligned with the transfer line of the glass substrate on the upper portion of the base frame installed inline on the transfer line of the glass substrate, It is installed so as to be aligned with each of the operation means, the transfer position and the inspection position of the glass substrate, and the main transfer means for taking over the glass substrate from the transfer line at the transfer position of the glass substrate and the transfer position of the glass substrate It is installed so that it is composed of a sub-feeding means for receiving and transferring the glass substrate from the transfer line at the transfer position of the glass substrate, and the first lighting means is installed on one side of the main transfer means for illuminating the glass substrate. According to the present invention, it is possible to carry out the inspection of the glass substrate very simply and efficiently by installing it in-line in the transfer line of the glass substrate, and continuously transfer the subsequent glass substrate to the ...

Optical measuring method and device therefor

투명 측정 대상물(1)의 표면에 대해 레이저 광원(2)에 의해 소정의 입사각으로 라인 빔을 조사하고, 투명 측정 대상물(1)의 표면, 이면으로부터 발생하는 표면광, 이면광을 결상 광학계(3)에 의해 결상시켜, 하프 미러(4)를 투과한 표면광의 결상 위치에 수광면이 위치하도록 배치된 표면광용 센서(5)와, 하프 미러(4)에 의해 반사된 이면광의 결상 위치에 수광면이 위치하도록 배치된 이면광용 센서(6)와, 표면광용 센서(5)로부터의 출력 신호 및 지지 기구의 동작 정보를 입력으로 하여 투명 측정 대상물(1)의 표면에 대응하는 2차원의 광학적 측정 데이터를 생성하여 유지하는 표면용 측정 데이터 유지부(7)와, 이면광용 센서(6)로부터의 출력 신호 및 지지 기구의 동작 정보를 입력으로 하여 투명 측정 대상물(1)의 이면에 대응하는 2차원의 광학적 측정 데이터를 생성하여 유지하는 이면용 측정 데이터 유지부(8)와, 양 광학적 측정 데이터를 입력으로 하여 표리 판정 처리를 행하여, 투명 측정 대상물(1)의 표면에만 대응하는 표면 데이터 및 이면에만 대응하는 이면 데이터를 생성하여 유지하는 표리 데이터 생성 유지부(9)를 갖고, 스캔 소요 시간을 증대시키지 않고, 피검출면의 이물질 검출 정밀도를 높이고, 게다가 표면 뿐만 아니라 이면의 상태도 측정한다. The line beam is irradiated to the surface of the transparent measurement object 1 with a laser beam light source 2 at a predetermined incident angle, and the surface light and the back light generated from the surface, the back surface of the transparent measurement object 1 are formed into an optical system 3. The light receiving surface at the image forming position of the back light reflected by the half mirror 4 and the sensor for surface light 5 arranged so that the light receiving surface is positioned at the image forming position of the surface light transmitted through the half mirror 4. Two-dimensional optical measurement data corresponding to the surface of the transparent measurement object 1 with the input of the back light sensor 6 and the output signal from the surface light sensor 5 and the operation information of the support mechanism arranged as the input. 2-dimensional corresponding to the back surface of the transparent measurement object 1 by inputting the measurement data holding part 7 for surface and the operation signal of the support mechanism and the output signal from the back light sensor 6 which generate | generate and hold | maintain Optical measurement data The measurement data holding part 8 for back surface which produces | generates and hold | maintains, and the front and back determination ...

Apparatus for measuring an optical parameter of a laminated glazing

The present invention relates to an apparatus for measuring an optical parameter of a laminated glazing as well as to a method producing polyvinyl acetals film using such apparatus.

Apparatus for inspecting glass

본 발명은 각도 조절이 가능한 상하부의 조명계 및 카메라, X-Y 방향 이동 및 회전이 가능한 글래스 기판 지그수단 등을 포함하는 새로운 형태의 글래스 표면 검사장치에 관한 것이다. The present invention relates to a novel glass surface inspection apparatus including an illumination system and a camera of the upper and lower parts of which angle is adjustable, and a glass substrate jig means capable of moving and rotating in the X-Y direction. 본 발명은 글래스 기판의 360°회전 및 X-Y 방향 이동을 가능하게 하고, 상하부에 설치한 조명계 및 카메라의 각도조절을 가능하게 하는 등 총 6축으로 동작하면서 글래스 기판의 표면 상태에 따른 모든 산란 성분을 분석할 수 있고, 글래스 기판의 위-아래 표면 재질 및 표면 조도에 따라 투과되는 빛을 분석하고 글래스 내부 성분을 검사할 수 있는 글래스의 표면 검사장치를 제공한다. The present invention enables all the scattering components according to the surface state of the glass substrate while operating in a total of six axes, such as to enable the 360 ° rotation and XY direction movement of the glass substrate, and to adjust the angle of the illumination system and the camera installed on the upper and lower parts. The present invention provides a glass surface inspection apparatus capable of analyzing the light, and analyzing the transmitted light according to the top and bottom surface materials and surface roughness of the glass substrate and inspecting the glass internal components. 광학 글래스 기판, 머신비전, 레이저, 카메라 Optical Glass Substrates, Machine Vision, Lasers, Cameras

Tester for Inspecting Many Kinds of Glass

본 발명은 디스플레이 제조 공정에서 유리기판을 검사하는 장치에 관한 것으로, 정반 상면에 설치되며 외부로부터 이송되는 유리기판을 지지고정하는 프레임; 프레임에 설치되고, 온 제어신호에 의하여 유리기판 방향으로 제1 소정 간격만큼 이동하는 제1 이동수단; 제1 이동수단에 의하여 유리기판 방향으로 제1 소정 간격만큼 이동하며, 온 제어신호에 의하여 유리기판 방향으로 제2 소정 간격만큼 이동하는 제2 이동수단; 및 제2 이동수단에 의하여 유리기판 방향으로 제2 소정 간격만큼 이동하여 유리기판의 가장자리 측면을 가압함으로써 유리기판을 위치조정하는 클램핑부를 포함하여 구성된다. The present invention relates to an apparatus for inspecting a glass substrate in a display manufacturing process, the frame is installed on the upper surface and supporting the glass substrate to be transported from the outside; First moving means installed in the frame and moving in a glass substrate direction by a first predetermined interval by an on control signal; Second moving means moving by the first moving means in the glass substrate direction by a first predetermined interval and moving by the on control signal by the second predetermined interval in the glass substrate direction; And a clamping part for positioning the glass substrate by pressing the edge side surface of the glass substrate by moving the second predetermined interval in the glass substrate direction by the second moving means.

Installation for manufacture of sheet glass with equipment for measurement of stresses and procedure for control of device for glass drawing and hardening

FIELD: machine building. SUBSTANCE: installation consists of melting-boiling furnace with devices for moulding band of sheet glass and device (K) for drawing, positioned behind furnace. The installation also has equipment (G) of linear and contact-free measurement of stresses in the glass band installed in the device (K) for drawing. Linear (on-line) and contact-free measurement of general stress in glass directly in the device for drawing facilitates operative correction of working parametres of the drawing device. EFFECT: level of general stress at any point is less, than specified value. 21 cl, 9 dwg РОССИЙСКАЯ ФЕДЕРАЦИЯ (19) RU (11) 2 438 116 (13) C2 (51) МПК G01N 21/896 (2006.01) ФЕДЕРАЛЬНАЯ СЛУЖБА ПО ИНТЕЛЛЕКТУАЛЬНОЙ СОБСТВЕННОСТИ (12) ОПИСАНИЕ ИЗОБРЕТЕНИЯ К ПАТЕНТУ (21)(22) Заявка: 2009102503/28, 21.06.2007 (24) Дата начала отсчета срока действия патента: 21.06.2007 (73) Патентообладатель(и): ФИВ СТЭН (FR) R U Приоритет(ы): (30) Конвенционный приоритет: 27.06.2006 FR 06/05768 (72) Автор(ы): КУН Вольф Штефан (FR) (43) Дата публикации заявки: 10.08.2010 Бюл. № 22 2 4 3 8 1 1 6 (45) Опубликовано: 27.12.2011 Бюл. № 36 (56) Список документов, цитированных в отчете о поиске: BE 786807 A1, 16.11.1972. RU 2172302 C2, 20.08.2001. US 4703918 A, 03.11.1987. SU 1837720 A1, 27.05.1995. US 3749172 A, 18.11.1969. SU 1789045 A3, 15.01.1993. WO 9910728 A2, 04.03.1999. 2 4 3 8 1 1 6 R U (86) Заявка PCT: FR 2007/001030 (21.06.2007) C 2 C 2 (85) Дата начала рассмотрения заявки PCT на национальной фазе: 27.01.2009 (87) Публикация заявки РСТ: WO 2008/000936 (03.01.2008) Адрес для переписки: 129090, Москва, ул. Б.Спасская, 25, стр.3, ООО "Юридическая фирма Городисский и Партнеры", пат.пов. С.А.Дорофееву, рег.№ 146 (54) УСТАНОВКА ДЛЯ ПРОИЗВОДСТВА ЛИСТОВОГО СТЕКЛА С ОБОРУДОВАНИЕМ ИЗМЕРЕНИЯ НАПРЯЖЕНИЙ И СПОСОБ УПРАВЛЕНИЯ УСТРОЙСТВОМ ВЫТЯГИВАНИЯ И ЗАКАЛИВАНИЯ ЛИСТОВОГО СТЕКЛА (57) Реферат: Изобретение относится к оборудованию для производства листового стекла. Установка содержит ...

Device for Cutting of Glass Sheet

본 발명은 용융 및 고화 과정을 거쳐 연속적으로 공급되는 유리시트로부터 사각형의 유리기판들을 커팅하기 위한 장치로서, 유리시트를 사각형의 유리기판의 형태로 재단하는 둘 이상의 커터들; 상기 유리시트를 스캐닝하여 결함(defect)들의 위치를 유리시트의 길이, 폭 및 두께 방향에서 3차원적으로 확인하는 결함 검사기; 상기 커터들 중 하나 이상의 커터를 유리시트 중 결함들이 적게 분포된 위치로 이동시키는 위치 조정기; 및 상기 결함 검사기로부터의 스캐닝 결과를 바탕으로 커터의 위치를 위치 조정기로 지시하는 제어기;를 포함하는 것으로 구성되어 있는 유리시트 커팅 장치를 제공한다. The present invention provides an apparatus for cutting rectangular glass substrates from a glass sheet continuously supplied through a melting and solidification process, comprising: two or more cutters for cutting the glass sheet in the form of a rectangular glass substrate; A defect inspector which scans the glass sheet and checks the positions of defects three-dimensionally in the length, width and thickness directions of the glass sheet; A position adjuster for moving at least one of the cutters to a position where defects in the glass sheet are less distributed; And a controller for directing the position of the cutter to the position adjuster based on the scanning result from the defect inspector.

Method and device for detecting micro foreign matter within transparent plate

本发明提供一种检测透明板体内部的微小异物的方法及其装置，稳定地检测透明板体内部的遮光性的微小异物，且获得微小异物深度的信息。该方法是通过测量亮度(E、F)来进行检测的方法，该亮度(E、F)是由对存在于具有均匀的折射率的恒定厚度的透明板体(1)内部的微小异物(4)进行照射的光束(2)的散射等而产生的，其特征在于，使光束(2)相对于透明板体的厚度方向以规定的倾斜角度进入到透明板体内部，在透明板体内部形成进入的内部光束(I)和由该内部光束(I)在透明板体表面反射而成的内部光束(II)，不改变上述光束的进入角度地使透明板体和光束相对移动(沿(G)方向)，从透明板体的厚度方向分别检测同一微小异物(4)由上述内部光束(I)照射而产生的亮点(E)和由上述内部光束(II)照射而产生的亮点(F)，从而判断上述微小异物在透明板体中的位置。

Method of correcting in-line substrate inspection apparatus and in-line substrate inspection apparatus

제조 라인 내에 갖추어진 인라인 기판 검사 장치의 광학 시스템의 교정 작업을 제조 라인을 정지시키지 않고 실시할 수 있도록 한다. 이 발명은 상류 라인에서 하류 라인으로 기판의 수수를 실시하는 기능을 갖는 검사 스테이지 혹은 반송 컨베이어 등의 검사 영역 이외의 장소에 광학 시스템의 교정 작업을 실시하기 위한 교정 작업(메인테넌스) 영역을 마련하고, 상기 광학 시스템의 이동 스트로크를 상기 교정 작업 영역까지 이동이 가능하도록 하고, 상기 광학 시스템의 교정 작업을 검사 영역 밖에서 실시 가능하도록 하였다. 교정 작업 영역에서는, 실제 기판의 이동과 같은 상태에서 이동하는 표준 입자 부착 기판을 이용하여 검사하는 것에 의해 광학 시스템의 교정 작업을 정확하게 실시하도록 하였다. 상기 표준 입자 부착 기판의 높이를 검사 영역 내의 기판의 높이에 맞추도록 하여, 교정 작업을 정확하게 실시하도록 하였다. The calibration of the optical system of the in-line substrate inspection apparatus equipped in the production line can be carried out without stopping the production line. The present invention provides a calibration operation (maintenance) area for performing a calibration operation of an optical system at a place other than the inspection area such as an inspection stage or a conveyance conveyor having a function of carrying out substrate transfer from an upstream line to a downstream line The moving stroke of the optical system can be moved to the calibration working region, and the calibration operation of the optical system can be performed outside the inspection region. In the calibration work area, the correction work of the optical system was accurately performed by inspecting using a standard particle-attached substrate moving in the same state as the movement of the actual substrate. And the height of the standard particle mounting substrate was adjusted to the height of the substrate in the inspection area, so that the calibration work was accurately performed.

System and method for repairing display panel

본 발명은 디스플레이 패널의 리페어 시스템 및 리페어 방법에 관한 것으로서, 본 발명의 목적은 디스플레이 패널에 개재된 이물의 사이즈에 상관없이 혼입 이물을 보다 정확히 검출할 수 있는 디스플레이 패널의 리페어 시스템 및 리페어 방법을 제공하는 것이다. 본 발명에 따른 디스플레이 패널 리페어 시스템은 기판 및 박막전극을 포함한 복수의 레이어 구조로 형성된 디스플레이 패널의 불량 픽셀을 리페어하기 위한 리페어 시스템으로서, 상기 디스플레이 패널에 특정 패턴의 빔을 투영하여 상기 디스플레이 패널에 개재된 이물을 검출하는 이물 검사 장치를 포함하고, 상기 이물 검사 장치는 상기 디스플레이 패널의 소정의 레이어에 상기 특정 패턴의 빔을 포커싱하여 플랫 도프(Flat DOF) 영상을 획득함으로써 상기 이물을 검출하도록 구성된 것을 특징으로 한다.

Method for determining a local refractive index and device therefor

본 발명은 투명 물체(12)를 관통하여 제1 카메라(13)에 의해 관찰되는 패턴을 이용하여 상기 투명 물체(12)의 볼륨 소자의 국소 굴절률을 측정하는 방법에 관한 것이다. 국소 굴절률의 고정밀 측정을 더 쉽고 비용 효율적으로 실행하기 위하여, 상기 패턴을 마주하는 투명 물체의 특정 볼륨 소자의 표면(17)의 3차원 형상과 위치를 확정하여 국소 굴절률을 측정하는데 사용한다. 본 발명은 또한 이에 대응하는 장치에 관한 것이다. The present invention relates to a method for measuring the local refractive index of a volume element of the transparent object (12) using a pattern that passes through the transparent object (12) and is observed by the first camera (13). Dimensional shape and position of the surface 17 of the specific volume element of the transparent object facing the pattern is used to measure the local refractive index in order to perform the high-precision measurement of the local refractive index more easily and cost-effectively. The present invention also relates to a corresponding apparatus.