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Небесная энциклопедия

Космические корабли и станции, автоматические КА и методы их проектирования, бортовые комплексы управления, системы и средства жизнеобеспечения, особенности технологии производства ракетно-космических систем

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Мониторинг СМИ

Мониторинг СМИ и социальных сетей. Сканирование интернета, новостных сайтов, специализированных контентных площадок на базе мессенджеров. Гибкие настройки фильтров и первоначальных источников.

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Форма поиска

Поддерживает ввод нескольких поисковых фраз (по одной на строку). При поиске обеспечивает поддержку морфологии русского и английского языка
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Применить Всего найдено 20644. Отображено 100.
02-02-2012 дата публикации

Space-based CT scan system toward an astronomical object

Номер: US20120025083A1
Автор: Tomohiro Tsuta
Принадлежит: Individual

A CT scan system toward an astronomical object, including: a first satellite means for equipping a first satellite with an emitting means, said emitting means being for emitting super penetrating elementary particles; a second satellite means for equipping a second satellite with a detection means, said detection means being for detecting said super penetrating elementary particles; a super penetrating elementary particle measurement means for measuring the super penetrating elementary particles that are emitted from said emitting means, transmitted through said astronomical object, and detected by said detection means on said second satellite, said second satellite being, at the time of a measurement, opposite to said first satellite with respect to said astronomical object in between; and a CT reconstructing means for reconstructing a CT scan image regarding internal structure of said astronomical object based on the data obtained from said super penetrating elementary particle measurement means iterated.

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16-02-2012 дата публикации

Performance evaluation method with x-ray and its usage

Номер: US20120037800A1
Принадлежит: Hoya Corp, Hoya Lens Thailand Ltd

An aspect of the present invention relates to a method of evaluating performance of a film-forming material for forming a functional film on an eyeglass lens substrate or a functional film formed by the use of the film-forming material. The performance to be evaluated is selected from the group consisting of a sliding sensation of a surface of the functional film and an adhesion of the functional film, and the evaluation is conducted based on a change over time in a quantity of photoelectrons generated by irradiating with an X-ray the film-forming material or the functional film.

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01-03-2012 дата публикации

X-ray fluorescence analyzer and x-ray fluorescence analysis method

Номер: US20120051507A1
Принадлежит: SII NanoTechnology Inc

The X-ray fluorescence analyzer ( 100 ) includes: an enclosure ( 10 ); a door ( 20 ) for putting the sample into and out of the enclosure; a height measurement mechanism ( 7 ) capable of measuring a height at the irradiation point; a moving mechanism control unit ( 9 ) for adjusting a distance between the sample and the radiation source as well as the X-ray detector based on the measured height at the irradiation point; a laser unit ( 7 ) for irradiating the irradiation point with a visible light laser beam; a laser start control unit ( 9 ) for irradiating the visible light laser beam by the laser unit ( 7 ) when the door is open state; and a height measurement mechanism start control unit ( 9 ) for starting the height measurement mechanism to measure the height at the irradiation point when the door is opened.

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19-04-2012 дата публикации

Method and apparatus for assessing the threat status of luggage

Номер: US20120093367A1
Автор: Dan Gudmundson, Luc Perron
Принадлежит: Optosecurity Inc

A method and apparatus for assessing a threat status of a piece of luggage. The method comprises the steps of scanning the piece of luggage with penetrating radiation to generate image data and processing the image data with a computing device to identify one or more objects represented by the image data. The method also includes further processing the image data to compensate the image data for interaction between the object and the penetrating radiation to produce compensated image data and then determine the threat status of the piece of luggage.

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31-05-2012 дата публикации

Method and system for deriving molecular interference functions from xrd profiles

Номер: US20120133516A1
Автор: Geoffrey Harding
Принадлежит: Morpho Detection LLC

A method for identifying a substance includes determining a first molecular interference function (MIF) for a first substance. The method also includes determining a second MIF for a second substance. The method further includes generating a residual MIF at least partially based on a comparison of the second MIF to the first MIF. The method also includes identifying the type of substance based on the residual MIF.

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14-06-2012 дата публикации

Method for operating a battery

Номер: US20120148880A1
Принадлежит: Li Tec Battery GmbH

The task at hand is achieved by a method for operating a battery having at least one galvanic cell. The at least one galvanic cell is subjected at least temporally to an examination, particularly at a predetermined operating state of the battery or the galvanic cell.

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21-06-2012 дата публикации

Computer tomographic workpiece measuring device

Номер: US20120155606A1
Принадлежит: Wenzel Volumetrik GmbH

A marine device has a floating buoy containing electronics, a submerged payload containing electrical devices and electronics, a power source and a mooring line. At least a part of the power source is submerged and electrically connected to at least one of the submerged payload and the floating buoy, and the mooring line extends between the buoy and at least one of the power source submerged part, the submerged payload and a submerged anchor having a mass allowing it to stay under the water surface.

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28-06-2012 дата публикации

Grid for radiography and repairing method thereof, and radiation imaging system

Номер: US20120163535A1
Автор: Yasuhisa Kaneko
Принадлежит: Fujifilm Corp

In a second grid, X-ray absorbing portions and X-ray transparent portions extending in a Y direction are alternately arranged in an X direction. After the manufacture of the second grid, a defective portion is detected in the second grid. A rectangular area to be cut out is set along the X and Y directions so as to enclose this defective portion. By cutting out the rectangular area, a cutout is formed. A micro grid, which is smaller than the cutout, is fitted into the cutout such that two adjoining sides of the micro grid are in contact with two adjoining sides of the cutout. A gap left between an outline of the cutout and the micro grid is filled with Sn—Pb as an X-ray absorbing material.

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30-08-2012 дата публикации

An x-ray detector system for assessing the integrity and performance of radiation protective garments

Номер: US20120219113A1
Автор: Thomas J. Beck
Принадлежит: Beck Thomas J

A method for quantitatively testing a radiation shielding garment to determine its radiation shielding integrity, utilizing a fluoroscopic system, the method comprising measuring the amount of radiation passing through the garment at a particular location believed to be possibly damaged; measuring the amount of radiation at one or more locations of the garment believed to be intact; determining the average undamaged transmission if more than one location is tested; and comparing the two values of transmitted radiation to determine whether the first location was damaged beyond an acceptable degree.

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30-08-2012 дата публикации

Methods and apparatus for displaying images

Номер: US20120219202A1
Принадлежит: Dexela Ltd

In one aspect, a method of displaying data is provided. The method comprises obtaining projection data of an object by exposing an object to radiation at a plurality of view angles and detecting at least some of the radiation exiting the object to form the projection data, operating a computer to reconstruct the projection data at a reconstruction resolution to form image data comprising a plurality of voxels representing locations within the object, each of the plurality of voxels being assigned an associated intensity indicative of a density of the subject matter at the respective location, determining a maximum resolution for display, above which variation in intensity between adjacent voxels is not supported by information in the projection data, the maximum resolution being less than the reconstruction resolution, and displaying the image data at or below the maximum resolution.

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06-09-2012 дата публикации

Adaptive scanning of materials using nuclear resonance fluorescence imaging

Номер: US20120224669A1
Принадлежит: Passport Systems Inc

A method for detecting nuclear species in a sample by adaptive scanning using nuclear resonance fluorescence may comprise illuminating the target sample with photons from a source; detecting a signal in an energy channel; determining a scan evaluation parameter using the signal detected; determining whether the scan evaluation parameter meets a detection efficiency criterion; adjusting one or more system parameters such that the scan evaluation parameter meets the detection efficiency criterion; and comparing the signal in an energy channel to a predetermined species detection criterion to identify a species detection event. In another embodiment, detecting a signal in an energy channel may further comprise detecting photons scattered from the target sample. In another embodiment, detecting a signal in an energy channel may further comprise detecting photons transmitted through the target sample and scattered from at least one reference scatterer.

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04-10-2012 дата публикации

Method for calibrating at least one detector array formed by a plurality of detectors

Номер: US20120248323A1
Автор: Bernd Bergmann
Принадлежит: Fagus Grecon Greten GmbH and Co KG

In a method for calibrating at least one detector array formed by a plurality of detectors that is exposed to a high-energy, fan-shaped expanding radiation emanating from an approximately point-like energy source, serving the penetration of a material for measuring physical properties due to the absorption capacity of the material, it is provided that at least two in each case homogeneously formed calibration bodies whose gradually differing absorption is designed in a way that the absorption capacity of the one calibration body is lower and the one of the other calibration body is higher than the absorbance capacity of the material to be measured.

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11-10-2012 дата публикации

Apparatus and a method of determining the proportions of different powders in a powder

Номер: US20120257712A1
Принадлежит: Rolls Royce PLC

A method of determining the proportions of different powders in a powder comprises obtaining a sample of a powder, adding and mixing the sample into a molten material and freezing the mixture of powder and molten material to form a block. Computed tomography is performed on the block to produce a three-dimensional image of the block, the three-dimensional image of the block comprises a first shade, a second and a third shade corresponding to the material, a first powder particle and a sec and powder particle. The three-dimensional image of the block is analysed to count the number of regions exhibiting the second shade and the third shade corresponding to the number of first powder particles and second powder particles respectively. The fraction of second particles in the powder is determined by dividing the number of second powder particles by the sum of the number of first powder particles and the number of second powder particles.

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18-10-2012 дата публикации

Protection device for x-ray instrumentation

Номер: US20120263278A1
Автор: Monte J. Solazzi
Принадлежит: Solazzi Monte J

An accessory, method, and system is provided for protecting the lower chamber of X-ray spectroscopic instrumentation during analysis, the instrumentation including an upper chamber, a lower chamber, and a dividing plate, the lower chamber including an X-ray detector and an excitation source, the accessory including: a frame with a centrally-located aperture extending from one side of the frame to an opposite side of the frame; an adhesive layer disposed on each side of the frame; a thin film of polymeric material disposed on one side of the frame; and a removably attached release sheet on the adhesive layer disposed on the opposite side of the frame, where the accessory is disposed on a surface of the dividing plate to protect the lower chamber of the instrumentation from damage.

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22-11-2012 дата публикации

Micro electro-mechanical heater

Номер: US20120292528A1
Принадлежит: Hysitron Inc

A sub-micron scale property testing apparatus including a test subject holder and heating assembly. The assembly includes a holder base configured to couple with a sub-micron mechanical testing instrument and electro-mechanical transducer assembly. The assembly further includes a test subject stage coupled with the holder base. The test subject stage is thermally isolated from the holder base. The test subject stage includes a stage subject surface configured to receive a test subject, and a stage plate bracing the stage subject surface. The stage plate is under the stage subject surface. The test subject stage further includes a heating element adjacent to the stage subject surface, the heating element is configured to generate heat at the stage subject surface.

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29-11-2012 дата публикации

Computed Tomography Imaging Process And System

Номер: US20120301004A1
Принадлежит: Australian National University

A computed tomography imaging process, including: accessing projection data representing two-dimensional projection images of an object acquired using a misaligned tomographic imaging apparatus; and processing the projection data to generate misalignment data representing one or more values that quantify respective misalignments of the tomographic imaging apparatus.

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29-11-2012 дата публикации

System for non-destructive testing and method for processing data generated therein

Номер: US20120303309A1
Принадлежит: General Electric Co

Systems and methods are described that reduce the amount of data that is transferred among the components of the system. In one embodiment, the testing system comprises a scanner device such as a computed-tomography (CT) scanner that generates a volumetric representation of a part-under-inspection. The testing system is further configured to identify a region of interest in the volumetric representation, wherein the region of interest may correspond to an area of the part-under-inspection where a defect or flaw may form. The testing system may further format the data of the volumetric representation so the resulting formatted volumetric representation comprises less data than the original volumetric representation.

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20-12-2012 дата публикации

Solid material characterization with x-ray spectra in both transmission and fluoresence modes

Номер: US20120321039A1
Принадлежит: UOP LLC

Methods are disclosed utilizing synchrotron X-ray microscopy including x-ray fluorescence and x-ray absorption spectra to probe elemental distribution and elemental speciation within a material, and particularly a solid that may have one or more elements distributed on a solid substrate. Representative materials are relatively homogeneous in composition on the macroscale but relatively heterogeneous on the microscale. The analysis of such materials, particularly on a macroscale at which their heterogeneous nature can be observed, provides valuable insights into the relationships or correlations between localized concentrations of elements and/or their species, and concentrations of other components of the materials. Sample preparation methods, involving the use of a reinforcing agent, which are advantageously used in such methods are also disclosed.

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31-01-2013 дата публикации

Methods, systems, and computer program products for measuring the density of material including an electromagnetic moisture property detector

Номер: US20130026354A1
Автор: Robert E. Troxler
Принадлежит: Troxler Electronic Laboratories Inc

The subject matter described herein includes methods, systems, and computer program products for measuring the density of a material. According to one aspect, a material property gauge includes a nuclear density gauge for measuring the density of a material. A radiation source adapted to emit radiation into a material and a radiation detector operable to produce a signal representing the detected radiation. A first material property calculation function may calculate a value associated with the density of the material based upon the signal produced by the radiation detector. The material property gauge includes an electromagnetic moisture property gauge that determines a moisture property of the material. An electromagnetic field generator may generate an electromagnetic field where the electromagnetic field sweeps through one or more frequencies and penetrates into the material. An electromagnetic sensor may determine a frequency response of the material to the electromagnetic field across the several frequencies.

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31-01-2013 дата публикации

X-Ray Scanners

Номер: US20130028372A1
Автор: Edward James Morton
Принадлежит: Edward James Morton

The present application discloses an X-ray scanner having an X-ray source arranged to emit X-rays from source points through an imaging volume. The scanner may further include an array of X-ray detectors which may be arranged around the imaging volume and may be arranged to output detector signals in response to the detection of X-rays. The scanner may further include a conveyor arranged to convey an object through the imaging volume in a scan direction, and may also include at least one processor arranged to process the detector signals to produce an image data set defining an image of the object. The image may have a resolution in the scan direction that is at least 90 % as high as in one direction, and in some cases two directions, orthogonal to the scan direction.

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31-01-2013 дата публикации

Differential phase contrast x-ray imaging system and components

Номер: US20130028378A1
Принадлежит: JOHNS HOPKINS UNIVERSITY

A differential phase contrast X-ray imaging system includes an X-ray illumination system, a beam splitter arranged in an optical path of the X-ray illumination system, and a detection system arranged in an optical path to detect X-rays after passing through the beam splitter.

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14-02-2013 дата публикации

Charged-particle microscope providing depth-resolved imagery

Номер: US20130037715A1
Принадлежит: FEI Co

A method of examining a sample using a charged-particle microscope, comprising the following steps: Mounting the sample on a sample holder; Using a particle-optical column to direct at least one beam of particulate radiation onto a surface S of the sample, thereby producing an interaction that causes emitted radiation to emanate from the sample; Using a detector arrangement to detect at least a portion of said emitted radiation, which method comprises the following steps: Recording an output O n of said detector arrangement as a function of emergence angle θ n of said emitted radiation, measured relative to an axis normal to S, thus compiling a measurement set M={(O n , θ n )} for a plurality of values of θ n ; Using computer processing apparatus to automatically deconvolve the measurement set M and spatially resolve it into a result set R={(V k , L k )}, in which a spatial variable V demonstrates a value V k at an associated discrete depth level L k referenced to the surface S, whereby n and k are members of an integer sequence, and spatial variable V represents a physical property of the sample as a function of position in its bulk.

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14-02-2013 дата публикации

X-ray imaging apparatus

Номер: US20130039466A1
Принадлежит: Canon Inc

To provide an X-ray imaging apparatus capable of easily adjusting the sensitivity or capable of easily extracting the amount of refraction of X-rays. An X-ray imaging apparatus irradiating an object to be measured with an X-ray beam from an X-ray source that generates X-rays of a first energy and X-rays of a second energy different from the first energy to measure an image of the object to be measured includes an attenuator and a detector. The attenuator attenuates the X-ray beam transmitted through the object to be measured and is configured so as to vary the amount of attenuation of the X-rays depending on a position on which the X-ray beam is incident. The detector detects the X-ray beam transmitted through the attenuator and is configured so as to detect the X-rays of the first energy and the second energy.

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28-02-2013 дата публикации

Method for analyzing rubber compound with filler particles

Номер: US20130051656A1
Автор: Masato Naito, Wakana Ito
Принадлежит: Sumitomo Rubber Industries Ltd

A method for analyzing rubber compound including a rubber component and filler particles, comprises: a STEM image acquiring step in which, by the use of a scanning transmission electron microscope (STEM), data of STEM images of the rubber compound are acquired; and a researching step for researching the STEM images or secondary information based on the originally data of STEM images; wherein in the STEM image acquiring step, the focal point of the scanning transmission electron microscope is set in a thickness center region of a specimen of the rubber compound.

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28-02-2013 дата публикации

Method and apparatus for material analysis by a focused electron beam using characteristic x-rays and back-scattered electrons

Номер: US20130054153A1
Автор: David MOTL, Vojtech FILIP
Принадлежит: Tescan AS

A material analysis method by a focused electron beam and an equipment for performing such an analysis where an electron map B is created describing the intensity of emitted back-scattered electrons at various points on a sample, and a spectral map S is created describing the intensity of emitted X-rays at points on the sample depending on the radiation energy. For selected chemical elements, X-ray maps M i are created representing the intensity of X-rays characteristic for such elements. The X-ray maps M i and the electron map B are converted into differential X-ray maps D i , which are subsequently merged into a final differential X-ray map D. The final differential X-ray map D is then used to search particles. Subsequently, a cumulative X-ray spectrum X j is calculated for each particle and subsequently the classification of particles based on the peak intensities and the intensity of back-scattered electron is performed.

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28-03-2013 дата публикации

Nanostructured neutron sensitive materials for well logging applications

Номер: US20130075600A1
Принадлежит: Baker Hughes Inc

Disclosed is an apparatus for detecting a neutron. The apparatus includes: a neutron interaction material configured to emit a charged particle upon absorbing a neutron; a plurality of nanoparticles distributed in the neutron interaction material, each nanoparticle in the plurality being configured to scintillate upon interacting with the charged particle to emit a pulse of light; a photodetector coupled to the neutron interaction material and configured to receive the pulse of light and generate a signal based on the received pulse of light; and a processor configured to receive the signal in order to detect the neutron.

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11-04-2013 дата публикации

Evaluation System and Evaluation Method of Plastic Strain

Номер: US20130089182A1
Принадлежит: HITACHI LTD

An evaluation system for plastic strain includes an X-ray diffraction device for irradiating the surface of a measurement object; and an image analyzing device that generates diffraction intensity curves from X-ray diffraction angle and intensity with an implanted database, which can be obtained in advance from test specimens made of the same material of the measurement object, establishing at least one of the relations between the full width at half maximum of the diffraction intensity curve and plastic strain, and between the integral intensity angular breadth of diffraction intensity curve and plastic strain. The image analyzing device obtains plastic strain of the measurement object based on at least one of the diffraction parameters of the full width at half maximum and the integral intensity angular breadth of a diffraction intensity curve corresponding to the implanted database indicative of the relation between the diffraction parameter and plastic strain.

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18-04-2013 дата публикации

Method for core thermal conductivity determination

Номер: US20130094624A1
Принадлежит: Schlumberger Technology Corp

A method for core sample effective thermal conductivity provides for scanning a core sample by X-ray micro-computed tomography scanner and transferring a three dimensional scan image to an image analysis computer for processing. Then a layer thickness to be analyzed is set and a layer with maximum thermal resistance is defined within the image. The value of core effective thermal conductivity is defined by the allocated layer.

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18-04-2013 дата публикации

Apparatus and method for non-rotational computer tomography

Номер: US20130094741A1

A multi-dimensional representation of an object is obtained in that first and second pictures of the object illuminated using an X-ray source are created using a sensor that is located, in relation to the X-ray source, behind the object in a preferential direction defined by the relative positions of the object and of the sensor. A distance in the preferential direction between the X-ray source and the object is different in the first picture than in the second picture. The multi-dimensional representation of the object is obtained by combining the first and second pictures.

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25-04-2013 дата публикации

Method and apparatus pertaining to non-invasive identification of materials

Номер: US20130101156A1
Автор: Kevin M. Holt
Принадлежит: Varian Medical Systems Inc

A control circuit having access to information regarding a plurality of models for different materials along with feasibility criteria processes imaging information for an object (as provided, for example, by a non-invasive imaging apparatus) to facilitate identifying the materials as comprise that object by using the plurality of models to identify candidate materials for portions of the imaging information and then using the feasibility criteria to reduce the candidate materials by avoiding at least one of unlikely materials and combinations of materials to thereby yield useful material-identification information.

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02-05-2013 дата публикации

System and method for improved energy series of images using multi-energy ct

Номер: US20130108013A1
Принадлежит: Individual

A method for creating an energy series of images acquired using a multi-energy computed tomography (CT) imaging system having a plurality of energy bins includes acquiring, with the multi-energy CT imaging system, a series of energy data sets, where each energy data set is associated with at least one of the energy bins. The method includes producing a conglomerate image using at least a plurality of the energy data sets and, using the conglomerate image, reconstructing an energy series of images, each image in the energy series of images corresponding to at least one of the energy data sets.

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09-05-2013 дата публикации

Portable x-ray system and remote control

Номер: US20130114787A1
Автор: Robert Brown
Принадлежит: WMDTech Services LLC

Disclosed is a system for X-Ray examination of a target, which includes uprange controller means, a scintillator for sensing actually radiation sent, and a dosimeter for placing behind said target, for determining proper exposure of an image plate.

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30-05-2013 дата публикации

Component aperture location using computed tomography

Номер: US20130136225A1
Принадлежит: Individual

An exemplary component measuring method includes determining a position of an aperture of a component using a computed tomography scan of a gage and a component. The gage is inserted into the aperture of the component during the computed tomography scan.

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30-05-2013 дата публикации

X-ray analysis apparatus

Номер: US20130138382A1
Принадлежит: Rigaku Corp

An X-ray analysis apparatus having a function for enabling a plurality of measurement methods to be implemented, the X-ray analysis apparatus having: a measurement system capable of implementing a plurality of measurement methods; measurement software for implementing, in a selective manner, each of the measurement methods; a material evaluation table for storing information relating to a material that may be measured, and a name of an evaluation performed on the material; an input device for inputting the information relating to the material; a wizard program for performing computation for selecting the name of an evaluation on the basis of the information relating to the material inputted using the input device; and a wizard program for selecting a corresponding measurement method on the basis of the selected name of the evaluation.

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06-06-2013 дата публикации

Device for use in normalizing readings on a testing machine

Номер: US20130140444A1
Принадлежит: ABBOTT LABORATORIES

Example apparatus and methods for use in normalization of testing machines used to test samples in vessels are disclosed. An example apparatus includes verification source and a photon emitter positioned in the verification source. The example photon emitter includes a C 14 source, a scintillator adjacent to the C 14 source, and a filter adjacent to the scintillator. The example photon emitter is to emit photons through the filter for detection by a photon counter.

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06-06-2013 дата публикации

Process and Installation for Inspection and/or Sorting Combining Surface Analysis and Volume Analysis

Номер: US20130141115A1

Automatic process and installation for inspecting and/or sorting objects or articles belonging to at least two different categories, and made to advance approximately in a single layer, for example on a conveyor belt or a similar transport support. The process includes subjecting the advancing flow of objects or articles to at least two different types of contactless analysis by radiation, whose results are used in a combined manner for each object or article to perform a discrimination among these objects or articles and/or an evaluation of at least one characteristic of the latter, the analyses including at least one surface analysis process able to determine the physical and/or chemical composition of the outer layer of an object or article exposed to the radiation used in this process, and at least one volume analysis process able to determine the equivalent thickness of material of the same object or article.

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04-07-2013 дата публикации

Controlling bitumen quality in solvent-assisted bitumen extraction

Номер: US20130168294A1
Принадлежит: ExxonMobil Upstream Research Co

Described herein is a method of controlling bitumen quality in a process stream within a solvent-assisted bitumen extraction operation, for instance a hydrocarbon stream from a froth separation unit (FSU). Bitumen quality is a measure of the amount of selected contaminants in the process stream. Contaminants may include asphaltenes (comprising metal porphyrins), sulfur, and inorganic solids (comprising inorganic elements, e.g. Si, Al, Ti, Fe, Na, K, Mg, and Ca). First, the amounts of selected contaminants are measured. Next, these measured values are compared to maximum reference values. If one or more of these contaminants is higher than the maximum reference value, at least one variable of the solvent-assisted bitumen extraction is adjusted to improve bitumen quality.

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25-07-2013 дата публикации

Integrated, portable sample analysis system and method

Номер: US20130191046A1
Принадлежит: Individual

An integrated, portable sample analysis system and method. A viscometer subsystem receives a first portion of a sample. A spectrometer subsystem receives a second portion of the sample. A syringe pump subsystem receives a third portion of the sample and is configured to urge the third portion of the sample through a filter which collects particles in the sample thereon. An x-ray analysis subsystem is configured to x-ray the particles. The x-ray analysis subsystem also receives a fourth portion of the sample in order to determine the composition of any dissolved material in the sample. A processing subsystem provides a report concerning the sample and its viscosity, physical properties, particulate count and size distribution, and the composition of particulate and dissolved elements in the sample.

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01-08-2013 дата публикации

X-Ray Inspector

Номер: US20130195244A1
Автор: Yoshinori Hosokawa
Принадлежит: X RAY INSPECTOR

Provided is an X-ray inspector capable of non-destructively measuring a shape and content of gold (Au) contained in an object to be inspected, promptly with high accuracy. An X-ray inspector includes: an X-ray generator that irradiates an object to be inspected with X-rays having energy of 90 keV or higher; X-ray detector that detects the X-rays transmitted through the object to be inspected; a computing section that measures a shape and content of Au contained in the object to be inspected based on an X-ray signal detected by the X-ray detector, wherein an Au filter and a Pt filter are respectively provided between the X-ray detector and the object to be inspected. The X-ray detector detects X-rays emitted from the X-ray generator and transmitted through the object to be inspected and the Au filter and X-rays emitted from the X-ray generator and transmitted through the object to be inspected and the Pt filter. The computing section measures the shape and the content of Au contained in the object to be inspected based on X-ray signals corresponding respectively to the X-rays.

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08-08-2013 дата публикации

Three-dimensional mapping using scanning electron microscope images

Номер: US20130200255A1
Принадлежит: Applied Materials Israel Ltd

A method includes irradiating a surface of a sample, which is made-up of multiple types of materials, with a beam of primary electrons. Emitted electrons emitted from the irradiated sample are detected using multiple detectors that are positioned at respective different positions relative to the sample, so as to produce respective detector outputs. Calibration factors are computed to compensate for variations in emitted electron yield among the types of the materials, by identifying, for each material type, one or more horizontal regions on the surface that are made-up of the material type, and computing a calibration factor for the material type based on at least one of the detector outputs at the identified horizontal regions. The calibration factors are applied to the detector outputs. A three-dimensional topographical model of the surface is calculated based on the detector outputs to which the calibration factors are applied.

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08-08-2013 дата публикации

System and method for identification of counterfeit gold jewelry using xrf

Номер: US20130202083A1

Techniques disclosed herein include systems and methods for identifying counterfeit gold jewelry and other counterfeit gold items. Techniques include determining—using a non-destructive mechanism—whether an item of interest (such as an article represented as true gold) is solid gold or a gold-plated object. Techniques include using an X-ray fluorescence (XRF) analyzer to differentiate true gold from gold plating. The XRF analyzer can distinguish between gold plating and bulk gold material by comparing a ratio of L-alpha and L-beta x-ray lines of gold. The analyzer measures a ratio of intensities of characteristic L-lines of gold using X-ray fluorescence (XRF) spectroscopy. When implemented using an XRF analyzer, the system nondestructively determines whether a test object is made of solid gold/gold alloy or has gold plating only.

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08-08-2013 дата публикации

Radiation imaging apparatus and control method thereof, and radiation imaging system

Номер: US20130202086A1
Автор: Tetsuya Tsuji
Принадлежит: Fujifilm Corp

An FPD detects an X-ray image of an object. The FPD includes a plurality of pixels arranged in its image capturing field. Each pixel receives X-rays emitted from an X-ray source, and outputs a pixel value in accordance with an X-ray dose applied thereto. A pixel determiner determines a minimum-value pixel out of the pixels based on the pixel values of the pixels. The minimum-value pixel is a pixel whose pixel value is the lowest. The pixel determiner sets the minimum-value pixel as an exposure control pixel. A comparator compares a first integrated value, which is an integrated value of the pixel values of the minimum-value pixel, with a predetermined first threshold value. The comparator performs X-ray emission control such that, when the first integrated value has reached the first threshold value, the X-ray source stops emitting the X-rays.

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08-08-2013 дата публикации

System and method for execution of a secured environment initialization instruction

Номер: US20130205127A1
Принадлежит: Individual

A method and apparatus for initiating secure operations in a microprocessor system is described. In one embodiment, one initiating logical processor initiates the process by halting the execution of the other logical processors, and then loading initialization and secure virtual machine monitor software into memory. The initiating processor then loads the initialization software into secure memory for authentication and execution. The initialization software then authenticates and registers the secure virtual machine monitor software prior to secure system operations.

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22-08-2013 дата публикации

Method and system unit for stereoscopic x-ray imaging

Номер: US20130216021A1
Принадлежит: Individual

A method for stereoscopic x-ray imaging by a stereoscopic x-ray tube and by an x-ray radiation detector is provided. The x-ray radiation detector has a buffer. The stereoscopic x-ray tube has two x-ray beam sources disposed a short distance from one another. 2D image datasets are acquired at relatively short intervals one after the other, which have good quality.

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05-09-2013 дата публикации

Compact Mobile Cargo Scanning System

Номер: US20130230148A1
Принадлежит: Rapiscan Systems Inc

The present invention is a self-contained mobile inspection system and method and, more specifically, improved methods and systems for detecting materials concealed within a wide variety of receptacles and/or cargo containers. In particular, the present invention is an improved method and system with a novel boom structure that reduces the weight of the boom. The single, light-weight boom of the inspection system is relatively compact in a stowed configuration and has a low height and center of gravity lending to greater maneuverability.

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12-09-2013 дата публикации

Radiographic phase-contrast imaging apparatus

Номер: US20130235973A1
Принадлежит: Fujifilm Corp

A radiographic phase-contrast imaging apparatus obtains a phase-contrast image using two gratings including the first grating and the second grating. The first and second gratings are adapted to form a moire pattern when a periodic pattern image formed by the first grating is superimposed on the second grating. Based on the moire pattern detected by the radiographic image detector, image signals of the fringe images, which correspond to pixel groups located at different positions with respect to a predetermined direction, are obtained by obtaining image signals of pixels of each pixel group, which includes pixels arranged at predetermined intervals in the predetermined direction, as the image signal of each fringe image, where the predetermined direction is a direction parallel to or intersecting a period direction of the moire pattern other than a direction orthogonal to the period direction. Then, a phase-contrast image is generated based on the obtained fringe images.

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26-09-2013 дата публикации

Sample analyzing apparatus and sample analyzing method

Номер: US20130248706A1
Автор: Haruko Akutsu
Принадлежит: Individual

In accordance with an embodiment, a sample analyzing apparatus includes a charged beam generating unit, a detecting unit, and an analyzing unit. The charged beam generating unit is configured to generate a charged beam and apply the charged beam to a sample. The detecting unit is configured to detect charged particles and then output a signal, the charged particles being generated from the sample by the application of the charged beam in a manner depending on a three-dimensional structure and material characteristics of the sample. The analyzing unit is configured to process the signal to analyze the sample.

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26-09-2013 дата публикации

System for measuring sample pore using computed tomography and standard sample and method thereof

Номер: US20130251095A1

The present invention relates to a system for measuring a sample pore using a computed tomography (CT) and a standard sample and to a method thereof, more particularly to a system for measuring a sample pore using a computed tomography (CT) and a standard sample and to a method thereof, wherein the number of pixels in the count range of a cross-sectional image of the measurement sample and the number of pixels corresponding to the gray level range of the pore are calculated with reference to the count range utilized in the cross-sectional image of the standard sample and the gray level range of the pore so as to accurately measure the porosity of the measurement sample after performing a CT scan of the standard sample and the measurement sample together using a CT scanner.

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03-10-2013 дата публикации

Efficient Method For Selecting Representative Elementary Volume In Digital Representations Of Porous Media

Номер: US20130262028A1
Принадлежит: Ingrain Inc

The present invention relates a method to estimate representative elementary volume (REV) in a sample of porous media wherein the sub-volume selected is a better approximation of the elementary volume than existing methods. REV in a sample of porous media such as rock can be defined wherein the REV is selected with respect to the expected direction of fluid flow through the porous media. The method can quantify how good is the digital representation of a rock and how accurate a description of a fluid flow through Darcy's law will be, and allows the evaluation of different length scales in different directions for the REV and an assessment of the anisotropy of the pores structures when the method is applied in different directions. The method also can determine a robust criteria to understand when a trend of porosity-permeability breaks down due to an insufficient size of the subsample.

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10-10-2013 дата публикации

Rotatable drum assembly for radiology imaging modalities

Номер: US20130266116A1
Принадлежит: Analogic Corp

Among other things, a rotatable drum for a radiology imaging modality is provided herein. The rotatable drum comprises a bore, defined by an inner circumference of a sidewall of the rotatable drum. In one embodiment, the sidewall comprises one or more apertures through which radiation may pass. By way of example, a radiation source and a detector array may be mounted outside of the bore (e.g., on an outside surface of the sidewall) and apertures in the sidewall may permit radiation to pass from the radiation source to the detector array without being attenuated by the sidewall of the drum. In another embodiment, the detector array may be comprised of a plurality of detector modules that may be individually mounted/dismounted from the rotatable drum, and in one example, may provide structural support to the rotatable drum.

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17-10-2013 дата публикации

Three-dimensional focused anti-scatter grid and method for manufacturing thereof

Номер: US20130272505A1
Автор: Thomas J. Beck
Принадлежит: TURTLE BAY PARTNERS LLC

A device for, and method of manufacture of, a focused anti-scatter grid for improving the image contrast of x-ray images produced in medical, veterinary or industrial applications. The grid comprising a series of modular units so juxtaposed with each other as to form a series of focused channels for the passage of the focused imaging x-rays. The modules comprise a series of focusing ribbons of a heavy metal or a series of mating solid arcuate forms, formed of a polymer and having on at least one side surface a layer of heavy metal.

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24-10-2013 дата публикации

Apparatus for protecting a radiation window

Номер: US20130279654A1
Принадлежит: Bruker AXS Handheld LLC

A radiation detector assembly and a method for using the same are provided. The radiation detector assembly includes an aperture, a window covering the aperture, the window is configured to permit radiation to pass through, the window is configured to prevent the passage of fluids and particles through the aperture, and a protective device covers the window. The protective device includes a plurality of holes at least partially aligned with the aperture, is configured to permit at least some radiation to pass through the holes, is configured to prevent objects larger than the holes to contact the window and is configured to withstand external forces and prevent those forces from damaging the window.

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14-11-2013 дата публикации

Systems and Methods for Fraud Prevention, Supply Chain Tracking, Secure Material Tracing and Information Encoding Using Isotopes and Other Markers

Номер: US20130299591A1
Принадлежит: Columbia University of New York

Encoding information in a material using a material tracing system includes storing information to be encoded in the material, generating a number based on the information, determining an amount of at least one tracer to be incorporated into the material corresponding to the number, and incorporating the determined amount of the at least one tracer into the material. Decoding information encoded in the material includes measuring an amount of the at least one tracer, in some embodiments after tracer activation, determining a number corresponding to the measured at least one tracer, and decoding the number to obtain information associated with the material. A material tracing system is also provided.

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28-11-2013 дата публикации

System and method for wide cone helical image reconstruction

Номер: US20130315453A1
Принадлежит: General Electric Co

A tomographic system includes a gantry having an opening for receiving an object to be scanned, a radiation source, a detector positioned to receive radiation from the source that passes through the object, and a computer programmed to acquire a plurality of helical projection datasets of the object, reconstruct a first image using the acquired plurality of helical projection datasets and using a first reconstruction algorithm, reconstruct a second image using the acquired plurality of helical projection datasets and using a second reconstruction algorithm that is different from the first reconstruction algorithm, extract frequency components from each of the first and second images, sum the frequency components from each of the first and second images, and inverse transform the sum of the frequency components to generate a final image.

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28-11-2013 дата публикации

Customizable software platform for x-ray imaging equipment

Номер: US20130318455A1
Автор: Vrindesh Shetty
Принадлежит: V J Technology

The invention provides a software platform to customize the software programming needed to operate industrial X-ray imaging systems. Industrial X-ray systems require systems software for managing and controlling internal machine operation and exposing X-ray imaging and image processing capabilities. The various end users require different software programs to operate the equipment. The invention provides for a single software platform for developing a custom software program for the targeted end use. The customizing can be done without the need for software engineers. End-users can select from a stored list of software components that relate to the desired functional, workflow and graphical user interface requirements. Software components are provided that provide for the necessary linkages to create a customized application that is operable via a graphical user interface.

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05-12-2013 дата публикации

Method and instrument for identifying jewelry with plated element using x-ray florescence

Номер: US20130322595A1
Автор: Brendan Connors
Принадлежит: Individual

The method uses an XRF instrument for identifying a specified element on a jewelry sample by illuminating its surface with excitation radiation and measuring first and second intensities of characteristic emission lines of a specified element and calculating the ratio between the intensities to establish a measured thickness and to determine based on a certain range criteria whether the sample can be considered to be plated jewelry.

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26-12-2013 дата публикации

Image processing apparatus, image processing method

Номер: US20130343649A1
Принадлежит: Hitachi High Technologies Corp

In order to solve the problem that the resolution of a back-scattered electron image without a contrast difference between materials with close atomic numbers is low, an image processing apparatus that performs an image process on a back-scattered electron image as an input image includes: a material peak detection unit that determines a peak luminance value with a peak of a frequency of a luminance histogram based on a luminance value obtained for each measurement position by using the input image as an input and information about material-dependent back-scattered electron generation efficiency, and that outputs the peak luminance value for each material; and an image information adjustment unit that emphasizes a material-dependent contrast on the basis of the input image and the peak luminance value for each material.

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30-01-2014 дата публикации

Method for measuring film thickness of soi layer of soi wafer

Номер: US20140027633A1
Автор: Susumu Kuwabara
Принадлежит: Shin Etsu Handotai Co Ltd

A method for measuring a film thickness of an SOI layer of an SOI wafer including at least an insulator layer and the SOI layer which is formed on the insulator layer and is formed of a silicon single crystal, wherein a surface of the SOT layer is irradiated with an electron beam, characteristic X-rays are detected from a side of the SOI layer surface irradiated with the electron beam, the characteristic X-rays being generated by exciting a specific element in the insulator layer with the electron beam that has passed through the SOI layer and has been attenuated in the SOI layer, and the film thickness of the SOI layer is calculated on the basis of an intensity of the detected characteristic X-rays.

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20-02-2014 дата публикации

System and method for detecting materials or disease states using multi-energy computed tomography

Номер: US20140050378A1
Принадлежит: General Electric Co, INSTITUTO DO CORACAO

The disclosed embodiments relate to characterizing or quantifying an element or composition of interest within an imaged volume. In accordance with one embodiment, high and low energy images are acquired of a volume of interest using a polychromatic emission source. The high and low energy images are processed to generate monochromatic images. Based on the observed attenuation within the monochromatic images, one or more elements or compositions of interest are characterized within the imaged volume.

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27-02-2014 дата публикации

Method and apparatus for correcting artifacts during generation of x-ray images, in particular computed tomography, or radiography by means of temporal modulation of primary radiation

Номер: US20140056407A1
Принадлежит: SIEMENS AG

Artifacts caused by scattered radiation when generating X-ray images of objects are corrected using a temporally alterable modulation of the primary radiation. A respective set of originally amplitude-modulated modulation projections of the object is generated and a respective scattered image allocated to the respective modulation projections is calculated. The method is particularly suitable for fast CT scans.

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06-03-2014 дата публикации

Integrated backscatter x-ray system

Номер: US20140064453A1
Автор: Morteza Safai
Принадлежит: Boeing Co

The different advantageous embodiments provide a method and apparatus. The apparatus comprises a moveable platform, a housing connected to the moveable platform, a power supply located inside of the housing, and an x-ray tube located inside of the housing. The power supply and the x-ray tube are immersed in a coolant. The x-ray tube is configured to generate an x-ray beam.

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10-04-2014 дата публикации

Method and apparatus for investigating the x-ray radiographic properties of samples

Номер: US20140098940A1
Принадлежит: ANTON PAAR GMBH

The invention relates to a method and an apparatus for studying the X-ray properties of samples ( 3 c ), wherein X-ray radiation scattered by a sample ( 3 c ) is recorded by a detector ( 5 ) positioned at a distance from the sample ( 3 c ) and is evaluated with respect to the characteristics of the sample. According to the invention, it is provided that at a predetermined distance between the X-ray beam source ( 1 ) and the detector ( 5 ) or between the starting point ( 2 b ) of the X-ray beam ( 10 ) directed at the sample ( 3 c ) and the detector ( 5 ), for a predetermined number of successive measurements the distance (S 1, S 2 ) between the sample ( 3 c ) and the detector ( 5 ) is changed and is set at a predetermined different value.

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07-01-2021 дата публикации

ANATOMICAL IMAGING SYSTEM WITH CENTIPEDE BELT DRIVE

Номер: US20210000435A1
Принадлежит:

An anatomical imaging system comprising: 1. An anatomical imaging system comprising:a CT machine; anda transport mechanism mounted to the base of the CT machine, wherein the transport mechanism comprises a fine movement mechanism for moving the CT machine precisely, relative to the patient, during scanning.2. A system according to wherein the fine movement mechanism is configured to move the CT machine relative to the patient using indexed movement in discrete steps claim 1 , whereby to enable slice scanning.3. A system according to wherein the fine movement mechanism is configured to move the CT machine relative to the patient using substantially continuous movement claim 1 , whereby to enable helical scanning.418.-. (canceled)19. A method for scanning a patient claim 1 , comprising:moving a CT machine across room distances to the patient; andscanning the patient while moving the CT machine precisely relative to the patient during scanning.20. A method for scanning an object claim 1 , comprising:moving a scanner across room distances to the the object; andscanning the object while moving the scanner precisely relative to the object during scanning. This patent application claims benefit of:(i) pending prior U.S. Provisional Patent Application Ser. No. 60/670,164, filed Apr. 11, 2005 by Andrew P. Tybinkowski et al. for ANATOMICAL IMAGING SYSTEM WITH CENTIPEDE DRIVE (Attorney's Docket No. NLOGICA-1 PROV); and(ii) pending prior U.S. Provisional Patent Application Ser. No. 60/593,001, filed Jul. 20, 2004 by Bernard Gordon et al. for ANATOMICAL SCANNING SYSTEM (Attorney's Docket No. NLOGICA-14 PROV).The two above-identified patent applications are hereby incorporated herein by reference.This invention relates to anatomical imaging systems in general, and more particularly to anatomical imaging systems of the sort utilizing Computerized Tomography (CT) systems and the like.Strokes are the third leading cause of death in the United States (causing approximately 177,000 ...

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06-01-2022 дата публикации

X-RAY ANALYZER

Номер: US20220003691A1
Автор: Soejima Hiroyoshi
Принадлежит: APPLIED SCIENCE LABORATORY CO., LTD

An X-ray analyzer includes an X-ray source, a straight tube type multi-capillary, a flat plate spectroscopic crystal, a parallel/point focus type multi-capillary X-ray lens, and a Fresnel zone plate. A qualitative analysis is performed over an area on the sample, the flat plate spectroscopic crystal and the Fresnel zone plate are removed from the X-ray optical path, and X-rays are collected by the multi-capillary lens and the sample is irradiated. When analyzing the chemical morphology of an element, the multi-capillary lens retracts from the optical path, the source rotates, and the flat plate spectroscopic crystal and the Fresnel zone plate are inserted on the optical path. A narrow sample area is irradiated by the Fresnel zone plate with X-rays having energy extracted from the flat plate spectroscopic crystal. This makes it possible to carry out accurate qualitative analysis on the sample and perform detailed analysis of more minute parts. 1. An X-ray analyzer for irradiating a sample containing various components with X-rays to detect X-rays emitted from the sample , wherein an X-ray irradiation unit that irradiates the sample with X-rays includesa) an X-ray source configured to emit X-rays,b) a first multi-capillary which is composed of a large number of X-ray guiding capillaries parallel to each other, and has an incident end face arranged at a position where X-rays emitted from the X-ray source are introduced,c) a second multi-capillary which is composed of a large number of X-ray guiding capillaries, and is a parallel/point focus multi-capillary X-ray lens formed such that the capillaries are parallel on an incident end side and converged in a tapered shape mildly curved on an exit end side,d) a Fresnel zone plate, ande) a first moving section configured to move the second multi-capillary and the Fresnel zone plate such that one of the second multi-capillary and the Fresnel zone plate is selectively inserted on an X-ray optical path from the first multi- ...

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06-01-2022 дата публикации

X-RAY SPECTROMETER AND METHODS FOR USE

Номер: US20220003694A1
Принадлежит:

A spectrometer includes a crystal analyzer having a radius of curvature that defines a Rowland circle, a sample stage configured to support a sample such that the sample is offset from the Rowland circle, x-ray source configured to emit unfocused x-rays toward the sample stage, and a position-sensitive detector that is tangent to the Rowland circle. A method performed via a spectrometer includes emitting, via an x-ray source, unfocused x-rays toward a sample that is mounted on a sample stage such that the sample is offset from the Rowland Circle, thereby causing the sample to emit x-rays that impinge on the crystal analyzer or transmit a portion of the unfocused x-rays to impinge on the crystal analyzer; scattering, via the crystal analyzer, the x-rays that impinge on the crystal analyzer; and detecting the scattered x-rays via a position-sensitive detector that is tangent to the Rowland circle. 1. A spectrometer comprising:a crystal analyzer having a radius of curvature that defines a Rowland circle;a sample stage configured to support a sample such that the sample is offset from the Rowland circle;an x-ray source configured to emit first x-rays that are unfocused; anda position-sensitive detector.2. The spectrometer of claim 1 , wherein the spectrometer is configured in an emission mode such that the position-sensitive detector is configured to detect x-rays emitted by the sample.3. The spectrometer of claim 1 , wherein the spectrometer is configured in a transmission mode such that the position-sensitive detector is configured to detect x-rays transmitted through the sample.4. The spectrometer of claim 1 , wherein the position-sensitive detector is configured to detect the first x-rays after the first x-rays are transmitted through the sample after being redirected by the crystal analyzer.5. The spectrometer of claim 1 , wherein the x-ray source is configured to emit the first x-rays toward the sample stage.6. The spectrometer of claim 1 , wherein the x-ray ...

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04-01-2018 дата публикации

Identifying a characteristic of a material for additive manufacturing

Номер: US20180001565A1
Автор: Thomas Hocker
Принадлежит: SABIC Global Technologies BV

Systems, devices, and methods according to the present disclosure are configured for use in additive manufacturing, e.g. 3D printing. Various materials, including thermoplastic materials, can be used with an additive manufacturing system to create a part composite. Systems, devices, and methods described herein can be used to identify a characteristic of a material or of a material container for use with an additive manufacturing system. The identified characteristic can be used to determine an authenticity of the material. Based on the authenticity, one or more features or functions of the additive manufacturing system can be updated. The characteristic of the material may be optical information on the container of the material, e.g. a bar code, may be identified by emitting x-ray radiation and receiving a spectral characteristic, may be an electrical or magnetic characteristic or may be engraved on the surface of the material itself.

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07-01-2021 дата публикации

CONVEYOR SYSTEM

Номер: US20210002077A1
Принадлежит:

A conveyor system is described for use with a scanning apparatus () for the scanning of objects (), such as bottles. The system comprises a transverse conveyor having a conveyor surface (); a plurality of object support modules (), each object support module () comprising a lower surface that sits upon the conveyor surface () of the conveyor and an upper part in which an object receiving recessed portion is defined, wherein the object receiving recessed portion defines an elongate recess having a constant transverse profile. A scanning system comprising the conveyor system in combination with an object scanner and a method of scanning embodying the principles of such a scanner are also described. 1. A conveyor system for use with a scanning apparatus for the scanning of objects comprising:a transverse conveyor having a conveyor surface;a plurality of object support modules, each object support module comprising a lower surface that sits upon the conveyor surface of the conveyor and an upper part in which an object receiving recessed portion is defined;wherein the object receiving recessed portion defines an elongate recess having a constant transverse profile.2. A conveyor system in accordance with wherein each object support module has a recessed portion that provides a generally concave recess claim 1 , wherein the recessed portion extends in an elongate direction claim 1 , the elongate direction being such as in use to correspond to a direction of travel of the conveyor claim 1 , and wherein the elongate recess has a constant transverse profile in that the cross-sectional profile of the recess in the horizontal plane does not change as the recess extends along the object support module in the elongate direction corresponding to the x direction in use claim 1 , wherein the constant transverse profile along the elongate direction corresponds to the direction of travel of the conveyor.3. A conveyor system in accordance with wherein the object receiving recessed ...

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07-01-2021 дата публикации

Systems and Methods for High Throughput Object Handling and Screening

Номер: US20210002078A1
Принадлежит:

Systems and methods described herein are for high throughput object handling and X-Ray screening systems. Material handling systems can adopt the proposed system to assist with the transportation of objects into X-Ray screening machines populated with lead curtains to curtail radiation emissions. The lead curtains associated with X-Ray screening machines can cause numerous problems to the safe and secure transportation of the objects. The systems and methods proposed control several aspects of the object handling to overcome the problems associated with the lead curtains. The system and methods results in the increase of system throughput, improved efficiency, reduction in line stoppages and general wear and tear. Systems can include a smart conveyor that assists objects through lead curtains using flights that are raised behind the trailing edge of the objects. The system can include smart conveyors and control systems that communicate with the X-Ray machine regarding the identity and status of the objects. 1. A conveyor comprising:a conveyor belt having a flight, the flight configured to be selectively positioned in a default position in which the flight is parallel to the conveyor belt and a raised position in which the flight is perpendicular to the conveyor belt; andone or more sensors for sensing an edge of an object on the conveyor belt, wherein the flight is selectively transitioned to the raised position from the default position on the conveyor belt behind the object to assist the object forward.2. The conveyor of claim 1 , further comprising:a plurality of cams on the flight;a wear strip under the conveyor belt to engage with at least one cam in the plurality of cams when each flight is raised; anda plurality of channels running along the length of the conveyor belt in the direction of travel of the conveyor belt to allow the plurality of cams to travel unhindered when the flight remains in the default position.3. The conveyor of claim 2 , further ...

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01-01-2015 дата публикации

Method of operating a radiographic inspection system with a modular conveyor chain

Номер: US20150003583A1
Принадлежит: Mettler Toledo Safeline Ltd

A method of operating a radiographic inspection system is designed for a radiographic inspection system in which a conveyor chain with identical modular chain segments transports the articles being inspected. The method encompasses a calibration mode and an inspection mode of the radiographic inspection system. In the calibration mode, calibration data characterizing the radiographic inspection system with the empty conveyor chain are generated and stored as a template image. In the inspection mode, raw images ( 50 ) of the articles ( 3 ) under inspection with the background ( 41 ) of the conveyor chain are acquired and arithmetically merged with the template image. The method results in a clear output image ( 51 ) of the articles under inspection being obtained without the interfering background of the conveyor chain.

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05-01-2017 дата публикации

X-RAY IMAGING APPARATUS AND X-RAY IMAGING METHOD

Номер: US20170003233A1
Принадлежит:

An object of the present invention is to non-destructively obtain, in an X-ray imaging apparatus, a sectional image of a subject with spatial resolution higher than spatial resolution of an image detector. In the present invention, the image detector is two-dimensionally moved with respect to an incident X-ray for each half (180°) rotation of the subject, and a plurality of image groups (CT data sets) is obtained at different positions of the image detector. An image (sinogram) is synthesized from each image group thus obtained, which image is equal to an image obtained with a detector whose pixel size is smaller than the pixel size constituting the above described image detector. From this synthesized image, a sectional image with high spatial resolution is calculated by reconstruction calculation. 1. An X-ray imaging apparatus comprising:an X-ray generation unit that generates an X-ray and irradiates a subject with the X-ray;a subject positioning rotation table unit that adjusts an angle of the subject with respect to an optical path direction of the X-ray and an incident position of the X-ray to the subject;an X-ray image detection unit that detects an X-ray transmitted through the subject;a detector positioning table unit that two-dimensionally moves and positions the X-ray image detection unit on a surface perpendicular to an X-ray;a processing unit that calculates a sectional image of the subject from a plurality of X-ray images obtained by moving the X-ray image detection unit by the detector positioning table unit; anda control unit that controls each of the units, whereinthe X-ray image detection unit obtains an X-ray image while an angle of the subject with respect to the optical path direction of the X-ray is changed by the subject positioning rotation table unit,the detector positioning table unit moves the X-ray image detection unit for each time the angle reaches half rotation, andthe moved X-ray image detection unit repeatedly obtains the X-ray image. ...

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05-01-2017 дата публикации

System And Method For Radiation Inspection On Moving Object

Номер: US20170003415A1
Принадлежит: Powerscan Company Limited

A system and method for radiation inspection on a moving object. The system comprises a radiation source and a radiation detector. Rays emitted by the radiation source are limited in a scanning area. The scanning area is provided by a first boundary surface and a second boundary surface. The system also comprises: multiple detection units arranged along a detection channel in turn and used for triggering and sending a signal when detecting that the moving object arrives or leaves; and a control module used for receiving signals sent by the multiple detection units and controlling the radiation source according to the received signal. The first to third detection units among the multiple detection units are located at one side of the scanning area and near the first boundary surface. The fourth to sixth detection units among the multiple detection units are located at the other side of the scanning area and near the second boundary surface. The system and the method can implement radiation inspection on moving objects traveling in multiple directions. 1. A system for radiation inspection on a moving object , comprising: a radiation source and a radiation detector , with the radiation source emitting rays and the radiation detector collecting rays for radiation imaging , wherein ,the radiation source emits the rays which are restricted within a scanning region having a first boundary plane and a second boundary plane; and the system further comprises:a plurality of detecting units arranged in sequence along a detection passage, for sending a signal when detecting that the moving object arrives or leaves; anda control module used for receiving the signal sent by the plurality of detecting units, and controlling the radiation source based on the received signal to perform radiation inspection on the moving object; whereina first, second, and third detecting units of the plurality of detecting units are located at one side of the scanning region, and near the first ...

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07-01-2016 дата публикации

EXTENDED FIELD ITERATIVE RECONSTRUCTION TECHNIQUE (EFIRT) FOR CORRELATED NOISE REMOVAL

Номер: US20160003752A1

Computerized method and system for improving 3D reconstruction images involves applying the Extended Field Iterative Reconstruction Technique (EFIRT) to remove correlated noise, in addition to using COMET (constrained maximum relative entropy tomography) to eliminate uncorrelated noise, wherein the EFIRT is applied by performing a set of successive reconstructions on an extended field larger than a region of interest (ROI); and extracting and averaging the ROI from said set of successive reconstructions. 1. A computer implemented method for removing correlated noise by applying Extended Field Iterative Reconstruction Technique (EFIRT) in a three-dimensional (3D) reconstruction , said method comprising:performing a set of successive reconstructions on an extended field larger than a region of interest (ROI); andextracting and averaging the ROI from said set of successive reconstructions.2. The computer implemented method according to claim 1 , wherein the set of reconstructions is performed by increasing volumes of each successive reconstruction.3. The computer implemented method according to claim 2 , wherein the volume of each successive reconstruction is increased by increasing the value of z in the direction of the electron field.4. The computer implemented method according to claim 1 , further comprising removing uncorrelated noise in said 3D reconstruction with COMET (constrained maximum relative entropy tomography).5. The computer implemented method according to claim 1 , wherein the 3D reconstruction is implemented via a Cryo-Electron Tomography (Cryo-ET) application.6. The computer implemented method according to claim 1 ,wherein the 3D reconstruction is applied to a biological sample or a non-biological sample.7. A system for removing correlated noise in a three-dimensional (3D) reconstruction by applying Extended Field Iterative Reconstruction Technique (EFIRT) claim 1 , said system comprising:a processor; anda memory accessible to said processor, wherein ...

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04-01-2018 дата публикации

A FOOD PROCESSING SYSTEM FOR PROCESSING AND BATCHING FOOD ITEMS

Номер: US20180003544A1
Принадлежит:

A food processing system and a method for processing and batching food items conveyed by a conveyor means where the batches fulfil at least one target criteria including at least one weight target, including a first weight determining means for determining the weight of incoming food items, a batching system, a food item separation device positioned downstream in relation to the first weight determining means and upstream in relation to the batching system, and a control system for controlling the batching system and the food item separation device. The controlling including, repeatedly: monitoring the weight of the incoming food items, determining, based on the weight of the incoming food items, a prospect indicator indicating the prospect to meet the target criteria for the batches such that each batch fulfils the at least one target criteria, and comparing if the prospect indicator fulfils a pre-defined criteria. 131-. (canceled)32. A food processing system for processing and batching food items conveyed by a conveyor means where the batches fulfil at least one target criteria including at least one weight target , comprising:a first weight determining means for determining the weight of incoming food items,a batching system,a food item separation device positioned downstream in relation to the first weight determining means and upstream in relation to the batching system,a control system for controlling the batching system and the food item separation device, the controlling including, repeatedly:monitoring the weight of the incoming food items,determining, based on the weight of the incoming food items, a prospect indicator indicating the prospect to meet the target criteria for the batches such that each batch fulfils the at least one target criteria,comparing if the prospect indicator fulfils a pre-defined criteria,in case the prospect indicator does not fulfil the pre-defined criteria, instructing the food item separation device to separate at least some of ...

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04-01-2018 дата публикации

Flex plate with removable inserts and cover

Номер: US20180003599A1
Принадлежит: BROOKHAVEN SCIENCE ASSOCIATES LLC

Technologies are described for methods and systems effective for flex plates. The flex plates may comprise a base plate. The base plate may include walls that define an insert location opening in the base plate. The insert location opening in the base plate may be in communication with a securement area. The flex plates may comprise an insert. The insert may include a reservoir region and a crystallization region separated by a wall including channels. The reservoir region and the crystallization region may include a backing. The insert may further include securement tabs. The securement tabs may be configured to secure the insert to the base plate at the securement area.

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04-01-2018 дата публикации

DEVICES AND METHODS FOR SAMPLE CHARACTERIZATION

Номер: US20180003674A1
Автор: Gentalen Erik
Принадлежит: Intabio, Inc.

Devices and methods for characterization of analyte mixtures are provided. Some methods described herein include performing enrichment steps on a device before expelling enriched analyte fractions from the device for subsequent analysis. Also included are devices for performing these enrichment steps. 1. A method , comprising:introducing an analyte mixture into a microfluidic device containing a separation channel;applying an electric field across the separation channel to effect a separation of the analyte mixture;illuminating a first side of the microfluidic device through an optical slit;detecting light passing through the optical slit and the separation channel to monitor separation of the analyte mixture; andexpelling a fraction of the analyte mixture from an orifice in fluid communication with the separation channel.2. The method of claim 1 , wherein the microfluidic device includes an opaque substrate that defines the separation channel and the optical slit.3. The method of claim 1 , wherein the fraction of the analyte mixture is expelled via electrospray ionization claim 1 ,4. The method of claim 1 , wherein the orifice is disposed within a recess defined by the microfluidic device claim 1 , such that a Taylor cone formed by electrospray ionization is disposed entirely within the recess.5. The method of claim 1 , wherein monitoring separation of the analytes includes imaging the entire separation channel.6. The method of claim 1 , wherein:the microfluidic device is illuminated with ultraviolet light;the microfluidic device includes a substrate constructed of a cyclic olefin copolymer opaque to ultraviolet light; andthe detected light is only ultraviolet light that transits the separation channel.7. The method of claim 1 , wherein the separation channel is a first separation channel claim 1 , the method further comprising:enriching a fraction of the analyte mixture in a second separation channel of the microfluidic device.8. The method of claim 1 , wherein: ...

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02-01-2020 дата публикации

NONDESTRUCTIVE INSPECTION APPARATUS AND NONDESTRUCTIVE INSPECTION METHOD

Номер: US20200003702A1
Принадлежит:

A nondestructive inspection apparatus includes an X-ray source, an imaging panel that detects an X-ray, and a shielding plate that shields the X-ray, and the imaging panel and the shielding plate have flexibility that allows to be curved. 1. A nondestructive inspection apparatus comprising:a radiation source;an imaging panel that detects a radiation emitted from the radiation source and transmitted through an inspection target; anda shielding plate that is arranged so as to be overlapped with the imaging panel on a side opposite to a side facing the radiation source and shields the radiation emitted from the imaging panel, whereinthe imaging panel and the shielding plate have flexibility that allows to be curved.2. The nondestructive inspection apparatus according to claim 1 , further comprising:an image acquisition unit that acquires an electric signal output from the imaging panel which detected the radiation and generates, from the electric signal, an image of the inspection target through which the radiation is transmitted.3. The nondestructive inspection apparatus according to claim 2 , whereinthe radiation source and the imaging panel image the inspection target plural times from different angles, andthe image acquisition unit restructures an image of an inside of the inspection target on a basis of a plurality of images that are obtained by performing imaging plural times.4. The nondestructive inspection apparatus according to claim 1 , whereinthe radiation source includes a first radiation source and a second radiation source.5. A nondestructive inspection method that uses a nondestructive inspection apparatus includinga radiation source,an imaging panel that detects a radiation emitted from the radiation source and transmitted through an inspection target, anda shielding plate that is arranged so as to be overlapped with the imaging panel on a side opposite to a side facing the radiation source and shields the radiation emitted from the imaging panel, the ...

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02-01-2020 дата публикации

SYSTEMS AND METHODS FOR X-RAY COMPUTED TOMOGRAPHY

Номер: US20200003703A1
Принадлежит:

A system and method for X-ray computed tomography includes a robotic arm that moves an X-ray emitter around a subject in a curvilinear path and an X-ray detector that captures 2-dimensional views while the subject is scanned. Movements of the emitter and detector are coordinated such that the position and angle of the emitter relative to the detector remains substantially constant during scanning. A processor uses computed tomography to reconstruct an image of the subject from the captured 2-dimensional views. The robotic arm varies the pitch of the X-ray emitter during the scan to enhance the spatial resolution of the reconstructed image. The processor generates a projection transformation matrix based on movement of the robotic arm for each captured 2-dimensional view that is applied during reconstruction. 1. A method of performing X-ray computed tomography , comprising:rotating an X-ray emitter and an X-ray detector in a curvilinear path about a subject to be scanned;varying the pitch of the X-ray emitter and the X-ray detector while rotating in the curvilinear path;scanning the subject with the X-ray emitter while rotating in the curvilinear path and varying the pitch of the X-ray emitter and the X-ray detector;capturing a plurality of 2-dimensional views by the X-ray detector while scanning the subject; andreconstructing a high spatial resolution digital image of the subject from the captured plurality of 2-dimensional views,wherein movement of the X-ray emitter and the X-ray detector is coordinated such that the position and angle of the X-ray emitter relative to the X-ray detector remains substantially constant during the scanning.2. The method of claim 1 , further comprising:generating a projection transformation matrix associated with each captured 2-dimensional view based at least in part on the movement, andwherein the operation of reconstructing includes applying each generated projection transformation matrix to data associated with each captured 2- ...

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02-01-2020 дата публикации

METHOD FOR DIMENSIONAL X-RAY MEASUREMENT, IN PARTICULAR BY COMPUTED TOMOGRAPHY, AND X-RAY COMPUTED TOMOGRAPHY SCANNER

Номер: US20200003704A1
Принадлежит:

The invention relates to a method for dimensional measurement by way of X-ray computed tomography, featuring the steps (a) Irradiating a test object () with non-monochromatic X-ray radiation from a virtually punctiform X-ray source (), (b) measuring the intensity (I) of the X-ray radiation () in the radiation path behind the test object () by means of a detector () which has a plurality of pixels (P) to obtain pixel-dependent intensity data (I(P)), and (c) calculating at least one dimension (H) of the test object () using the pixel-dependent intensity data (I(P)). According to the invention, the pixel-dependent intensity data (I(P)) is corrected by the influence of an effective penetration depth (τ) on the detector and/or a displacement of the effective source location (Q) on a target () of the X-ray source (). 1. A method for dimensional X-ray measurement , comprising:(a) irradiating a test object with non-monochromatic X-ray radiation from a virtually punctiform X-ray source,(b) measuring an intensity of the X-ray radiation in a radiation path behind the test object by a detector which has a plurality of pixels to obtain pixel-dependent intensity data, and(c) calculating at least one dimension of the test object using the pixel-dependent intensity data, an effective penetration depth on the detector and/or', 'a displacement of an effective source location on a target of the X-ray source., '(d) correcting the pixel-dependent intensity data based on'}2. The method according to claim 1 , whereinthe pixel-dependent intensity data is corrected by a change in the effective penetration depth on the detector, said change being caused by beam hardening.3. The method according to whereinthe pixel-dependent intensity data is corrected by a displacement of the effective source location on the target of the X-ray source, said change being caused by beam hardening.4. The method according to whereinthe correction by a change in the effective penetration depth comprises the ...

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02-01-2020 дата публикации

MEASUREMENT PROCESSING DEVICE, X-RAY INSPECTION DEVICE, MEASUREMENT PROCESSING METHOD, MEASUREMENT PROCESSING PROGRAM, AND STRUCTURE MANUFACTURING METHOD

Номер: US20200003705A1
Принадлежит: NIKON CORPORATION

A measurement processing device used for an X-ray inspection device includes: a region information acquisition unit that acquires first region information based on X-rays passing through a first region that is a part of a first specimen; a storage unit that stores second region information related to a second region of a second specimen, the second region being larger than the first region; and a determination unit that determines whether or not a region corresponding to the first region is included in the second region, based on the first region information and the second region information. 127-. (canceled)28. A measurement processing device using an X-ray inspection device , comprising:a region information acquisition unit that detects X-rays passing through a partial region of a first specimen and acquires first region information related to a first region;an inclination detection unit that detects an inclination of the first specimen when acquiring the first region information; anda comparison unit that compares a standard inclination and the inclination of the first specimen detected by the inclination detection unit.29. The measurement processing device according to claim 28 , whereinthe region information acquisition unit detects X-rays passing through a partial region of a second specimen, and acquires second region information related to a second region,the inclination detection unit detects an inclination of the second specimen when acquiring the second region information, andthe comparison unit compares the inclination of the second specimen and the inclination of the first specimen detected by the inclination detection unit.30. The measurement processing device according to claim 28 , whereinthe inclination detection unit detects the inclination of the first specimen when acquiring the first region information, based on the first region information.31. The measurement processing device according to claim 28 , whereinthe inclination of the first specimen ...

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02-01-2020 дата публикации

DEVICE AND METHOD FOR MEASURING IN-SITU TIME-RESOLVED X-RAY ABSORPTION SPECTRUM

Номер: US20200003706A1
Принадлежит:

Device and method for measuring in-situ time-resolved X-ray absorption spectrum. The device comprises an X-ray source, a first slit, an acousto-optic tunable X-ray filter, a radio frequency transmitter, a second slit, a front ionization chamber, a front ionization chamber signal amplifier, a sample to be tested, a rear ionization chamber, a rear ionization chamber signal amplifier, a data collector, and a computer. The X-ray source, the acousto-optic tunable X-ray filter, and the radio frequency transmitter are used to generate a monochromatic X-ray beam; the front ionization chamber is used to measure the intensity of the X-ray beam before passing through the sample; the rear ionization chamber is used to measure the intensity of the X-ray beam after passing through the sample; the front ionization chamber signal amplifier, the rear ionization chamber signal amplifier, the data collector, and the computer are used for data acquisition and data processing. 1. A device for measuring in-situ time-resolved X-ray absorption spectrum , comprising:{'b': '1', 'an X-ray source (),'}{'b': '2', 'a first slit (),'}{'b': '9', 'an acousto-optic tunable X-ray filter (),'}{'b': '10', 'a radio frequency transmitter () having an input and sending out an excitation signal,'}{'b': '4', 'a second slit (),'}{'b': '5', 'a front ionization chamber () having an output signal,'}{'b': '11', 'a front ionization chamber signal amplifier (),'}{'b': '6', 'a sample to be tested (),'}{'b': '7', 'a rear ionization chamber () having an output signal,'}{'b': '13', 'a rear ionization chamber signal amplifier (),'}{'b': '12', 'a data collector () having an output, and'}{'b': '14', 'a computer () having an input and an output,'}{'b': 2', '9', '1, 'wherein the first slit () and the acousto-optic tunable X-ray filter () are arranged sequentially along the light beam emitting direction of the X-ray source ();'}{'b': 4', '5', '6', '7', '9, 'the second slit (), the front ionization chamber (), the sample to ...

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02-01-2020 дата публикации

SYSTEM AND METHOD FOR QUANTIFYING X-RAY BACKSCATTER SYSTEM PERFORMANCE

Номер: US20200003707A1
Принадлежит:

A system for quantifying x-ray backscatter system performance is disclosed. The system includes one or more x-ray backscatter detectors, an x-ray tube, a support, and a plurality of rods mounted on the support and arranged in groups. Each group of rods includes at least two rods having the same width. The system also includes a user interface configured to connect to the x-ray backscatter detectors to receive a backscatter signal from the x-ray backscatter detectors associated with the x-ray tube, where the user interface plots a modulation transfer function representing x-ray backscatter for each rod of the plurality of rods from x-rays transmitted by the x-ray tube. 1. A system for quantifying x-ray backscatter system performance , the system including one or more x-ray backscatter detectors and an x-ray tube , the system comprising:a support;a plurality of rods mounted on the support and arranged in groups, wherein each group of rods include at least two rods having the same width; anda user interface configured to connect to the x-ray backscatter detectors to receive a backscatter signal from the x-ray backscatter detectors associated with the x-ray tube, wherein the user interface plots a modulation transfer function representing x-ray backscatter for each rod of the plurality of rods from x-rays transmitted by the x-ray tube.2. The system of claim 1 , further comprising a storage in communication with the user interface claim 1 , wherein a reference modulation transfer function plot representing initial readings representing reference settings of the system are kept in the storage.3. The system of claim 2 , wherein the user interface includes a display claim 2 , and wherein a plot representing the modulation transfer function and the reference modulation transfer function plot are both shown upon the display.4. The system of claim 1 , wherein the user interface is configured to display a backscatter image based on the backscatter signal from the x-ray ...

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02-01-2020 дата публикации

X-ray analysis device and method for optical axis alignment thereof

Номер: US20200003708A1
Принадлежит: Rigaku Corp

To provide an X-ray analysis device and a method for optical axis alignment thereof by which measurement time is shortened and measurement cost may be reduced without optical axis alignment at each measurement using an analyzer. The X-ray analysis device includes a sample stage for supporting a sample, an N-dimensional detector, and an analyzer including analyzer crystals. A detection surface of the N-dimensional detector has first and second detection areas, a plurality of optical paths includes a first optical path that directly reaches the first detection area and a second optical path that reaches via the analyzer crystals, and the N-dimensional detector performs a measurement of the first optical path by X-ray detection of the first detection area, and performs a measurement of the second optical path by X-ray detection of the second detection area.

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02-01-2020 дата публикации

Crystal Structure Analysis System and Crystal Structure Analysis Method

Номер: US20200003710A1
Принадлежит:

An electron diffraction apparatus measures an overall structure of a crystal of a specimen by electron diffraction. An NMR apparatus measures a local structure of the crystal by NMR measurement. An analysis apparatus combines the overall structure and the local structure to specify a structure of the crystal. 1. A crystal structure analysis system comprising:an electron diffraction apparatus that measures an overall structure of a crystal of a specimen by electron diffraction;a nuclear magnetic resonance (NMR) apparatus that measures a local structure of the crystal by NMR measurement; andan analysis apparatus that combines the overall structure and the local structure to specify a structure of the crystal.2. The crystal structure analysis system according to claim 1 , whereinthe analysis apparatus further optimizes the structure of the crystal by applying a quantum chemical calculation to the overall structure to obtain an optimized overall structure, and combines the optimized overall structure and the local structure.3. The crystal structure analysis system according to claim 1 , whereinthe analysis apparatus fits, in the combining process, an attribution of an atom X obtained by the NMR measurement to a potential map of the crystal obtained by the electron diffraction.4. The crystal structure analysis system according to claim 1 , whereinthe NMR apparatus measures a distance between an atom X and a hydrogen atom in the crystal by measuring a dipole interaction between the atom X and the hydrogen atom by the NMR measurement, andthe analysis apparatus specifies, in the combining process, a position of the hydrogen atom in the overall structure based on the distance.5. The crystal structure analysis apparatus according to claim 1 , whereinthe NMR apparatus executes a correlation measurement between an atom X and a hydrogen atom in the crystal by the NMR measurement, andthe analysis apparatus judges, in the combining process, whether the hydrogen atom is bonded to ...

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02-01-2020 дата публикации

X-RAY FLUORESCENCE ANALYSIS METHOD, X-RAY FLUORESCENCE ANALYSIS PROGRAM, AND X-RAY FLUORESCENCE SPECTROMETER

Номер: US20200003712A1
Принадлежит: RIGAKU CORPORATION

An X-ray fluorescence analysis method according to an FP method uses a predefined theoretical intensity formula in a standard sample theoretical intensity calculation step for obtaining a sensitivity constant and in an unknown sample theoretical intensity calculation step during iterative calculation. In the formula, only in an absorption term relating to absorption of X-rays, a mass fraction of each component is normalized so that a sum of the mass fractions of all components becomes 1. 1. An X-ray fluorescence analysis method comprising:a standard sample measurement step of irradiating a standard sample, which contains elements or compounds as components and whose composition is known, with primary X-rays, and measuring an intensity of fluorescent X-rays generated from the component in the standard sample;a standard sample theoretical intensity calculation step of calculating a theoretical intensity of the fluorescent X-rays generated from the component in the standard sample, based on a mass fraction of the component in the standard sample, by using a predefined theoretical intensity formula;a sensitivity constant calculation step of calculating a sensitivity constant, based on the intensity measured in the standard sample measurement step and the theoretical intensity calculated in the standard sample theoretical intensity calculation step;an unknown sample measurement step of irradiating an unknown sample, which contains elements or compounds as components and whose composition is unknown, with the primary X-rays, and measuring an intensity of fluorescent X-rays generated from the component in the unknown sample;a conversion step of converting the intensity measured in the unknown sample measurement step into a theoretical intensity scale by using the sensitivity constant, to obtain a converted measured intensity;an initial value assumption step of assuming an initial value of an estimated mass fraction for the component in the unknown sample;an unknown sample ...

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07-01-2021 дата публикации

METHOD FOR SECURITY INSPECTION AND KIT OF PARTS WITH A DETACHABLE SINGLE-USE INLAY FOR AN X-RAY TRAY

Номер: US20210003516A1
Принадлежит:

This disclosure relates to a method for security inspection of baggage and/or personal items. This disclosure also relates to a kit of parts with a detachable single-use inlay and an X-ray tray of a security check at an airport. 1. A method for security inspection of baggage and/or personal items , the method comprising:a. providing an X-ray tray having a deposition area;b. attaching a single-use inlay to said X-ray tray to cover said deposition area, said single-use inlay comprising a paper and/or polymer layer having an outer side and an inner side;c. putting the baggage and/or personal items onto the single-use inlay without direct contact to the X-ray tray;d. X-ray scanning said baggage and/or personal items disposed in said X-ray tray, wherein the X-ray tray is moved into and out of the scanning area;e. removing the baggage and/or personal items from said single-use inlay; andf. detaching said single-use inlay from said X-ray tray.2. The method for security inspection according to claim 1 , wherein the paper and/or polymer layer is secured to the X-ray tray by stretching it over an edge of said X-ray tray claim 1 , wherein the paper and/or polymer layer contracts at or below said edge on an exterior side of the X-ray tray.3. The method for security inspection according to claim 1 , wherein the method further comprises:g. disposing of said single-use inlay in a waste container; and/orh. crushing, melting and/or shredding of the single-use inlay, in particular wherein the material of the single-use inlay is recycled.4. The method for security inspection according to claim 1 , wherein said paper and/or polymer layer has an essentially circumferential fringe area adapted to grasp and/or cover the edges of said X-ray tray.5. The method for security inspection according to claim 1 , wherein said detachable single-use inlay comprises a protective cover and has a compressed state in which the paper and/or polymer layer is compressed within said protective cover as well ...

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07-01-2021 дата публикации

IMAGE ACQUISITION SYSTEM AND IMAGE ACQUISITION METHOD

Номер: US20210003518A1
Принадлежит: HAMAMATSU PHOTONICS K.K.

An image acquisition system includes a radiation source configured to output radiation toward an object, a rotating stage configured to rotate the object around a rotation axis, a radiation camera having an input surface to which the radiation transmitted through the object is input and an image sensor capable of TDI control, and an image processing apparatus configured to generate a radiographic image of the object at an imaging plane P based on the image data. The angle formed between the rotation axis of the rotating stage and the input surface of the radiation camera is set in accordance with the FOD which is the distance between the radiation source and an imaging plane in the object. The radiation camera is configured to perform TDI control in the image sensor in synchronization with the rotational speed of the object rotated by the rotating stage. 1. An image acquisition system comprising:a radiation source configured to output radiation toward an object;a rotating stage configured to rotate the object around a rotation axis;a radiation camera having an input surface to which the radiation transmitted through the object is input and an image sensor capable of TDI (time delay integration) control and configured to capture an image of the input radiation and output image data; andan image processing apparatus configured to generate a radiographic image of the object at an imaging plane based on the image data,wherein an angle formed between the rotation axis of the rotating stage and the input surface of the radiation camera is an acute angle and is set in accordance with an FOD which is a distance between the radiation source and an imaging plane in the object, andthe radiation camera is configured to perform TDI control in the image sensor in synchronization with a rotational speed of the object rotated by the rotating stage.2. The image acquisition system according to claim 1 , further comprising a stage movement control unit configured to bring the object ...

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07-01-2021 дата публикации

Methods and Means for the Measurement of Tubing, Casing, Perforation and Sand-Screen Imaging Using Backscattered X-ray Radiation in a Wellbore Environment

Номер: US20210003519A1
Принадлежит:

An x-ray-based cased wellbore tubing and casing imaging tool is disclosed, the tool including at least a shield to define the output form of the produced x-rays; a two-dimensional per-pixel collimated imaging detector array; a parallel hole collimator format in one direction that is formed as a pinhole in another direction; Sonde-dependent electronics; and a plurality of tool logic electronics and PSUs. A method of using an x-ray-based cased wellbore tubing and casing imaging tool is also disclosed, the method including at least: producing x-rays in a shaped output; measuring the intensity of backscatter x-rays returning from materials surrounding a wellbore; determining an inner and an outer diameter of tubing or casing from the backscatter x-rays; and converting image data from said detectors into consolidated images of the tubing or casing. 1. An x-ray-based cased wellbore tubing and casing imaging tool , said tool comprising:a shield to define the output form of the produced x-rays;a two-dimensional per-pixel collimated imaging detector array;a parallel hole collimator format in one direction that is formed as a pinhole in another direction;Sonde-dependent electronics; anda plurality of tool logic electronics and PSUs.2. The tool of claim 1 , wherein said imaging detector comprises a two-dimensional per-pixel collimated imaging detector arrays claim 1 , wherein the imaging array is one pixel wide and multiple pixels long.3. The tool of claim 1 , wherein said imaging detectors comprise two sets of two-dimensional per-pixel collimated imaging detector arrays.4. The tool of claim 1 , wherein said imaging detectors comprise a plurality of two-dimensional per-pixel collimated imaging detector arrays.5. The tool of claim 1 , wherein the images contain spectral information to inform characteristics of any wellbore materials or debris.6. The tool of claim 1 , wherein said shield further comprises tungsten.7. The tool of claim 1 , wherein the tool is configured so as to ...

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07-01-2021 дата публикации

X-Ray Fluorescence Analysis Apparatus and Calibration Method Thereof

Номер: US20210003520A1
Автор: Kinugasa Genki
Принадлежит:

An opening is formed on a horizontal plate. A center of the opening coincides with a center of an X-ray passage area. A line-shaped member for calibration is provided passing the center of the opening. When an X-ray is irradiated onto a sample, an X-ray fluorescence from the sample and an X-ray fluorescence from the line-shaped member are detected at an X-ray detector. An X-ray spectrum produced by this detection includes a reference peak corresponding to the X-ray fluorescence from the line-shaped member, and energy calibration or the like is executed based on the reference peak. 1. An X-ray fluorescence analysis apparatus comprising:a partitioning member that is provided between a first space which houses a sample and a second space adjacent to the first space, and on which an opening is formed;an X-ray generator that is provided in the second space, and that generates an X-ray configured to be irradiated onto the sample through the opening;a line-shaped member for calibration that is provided crossing the opening and along the partitioning member;an X-ray detector that is provided in the second space, and that detects an X-ray fluorescence from the sample and an X-ray fluorescence from the line-shaped member; anda spectrum producer that produces an X-ray fluorescence spectrum including a sample peak corresponding to the X-ray fluorescence from the sample and a reference peak corresponding to the X-ray fluorescence from the line-shaped member, based on a detection signal from the X-ray detector.2. The X-ray fluorescence analysis apparatus according to claim 1 , whereinthe line-shaped member crosses a central part of an X-ray passage area in the opening.3. The X-ray fluorescence analysis apparatus according to claim 2 , whereinthe X-ray generator irradiates the X-ray onto the sample from a first slanted direction,the X-ray detector detects the X-ray fluorescence emitted from the sample in a second slanted direction and the X-ray fluorescence emitted from the line- ...

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07-01-2021 дата публикации

INSPECTION TOOL AND INSPECTION METHOD

Номер: US20210003521A1
Принадлежит:

Apparatuses, systems, and methods for inspecting a semiconductor sample are disclosed. In some embodiments, the sample may comprise a structure having a plurality of openings in a top layer of the structure. In some embodiments, the method may comprise generating an image of the structure using a SEM; inspecting an opening of the plurality of openings by determining a dimension of the opening based on the image and determining an open-state of the opening, based on a contrast of the image; and determining a quality of the opening based on both the determined dimension and the determined open-state of the opening. 1. A method of inspecting a semiconductor sample , the sample comprising a structure having a plurality of openings in a top layer of the structure , the method comprising:generating an image of the structure using a SEM; determining a dimension of the opening or the plurality of openings based on the image; and', 'determining an open-state of the opening or the plurality of openings, based on a contrast of the image; and, 'inspecting an opening or the plurality of openings bydetermining a quality of the opening or the plurality of openings based on both the determined dimension and the determined open-state.2. The method according to claim 1 , wherein the contrast comprises a difference in intensity observed inside the opening and outside the opening claim 1 , on the image.3. The method according to claim 1 , wherein the dimension of the opening comprises a diameter of the opening and determining the diameter of the opening comprises applying an ellipse fitting algorithm to the image.4. The method according to claim 1 , wherein the dimension of the opening comprises a diameter of the opening and wherein the diameter of the opening is determined based on an intensity distribution along a line across the image claim 1 , the line crossing the opening on the image.5. The method according to claim 1 , wherein determining an open-state of the opening comprises ...

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03-01-2019 дата публикации

X-RAY INSPECTION APPARATUS AND CORRECTION METHOD FOR X-RAY INSPECTION APPARATUS

Номер: US20190003989A1
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To correctly acquire image data of an inspected article by preventing a difference in shade between images caused by a difference in position or sensitivity between sensor elements. An X-ray generation source irradiates an inspection region where an inspected article passes with an X-ray. X-ray detection means receives the X-ray passing through the inspection region using a plurality of sensor elements. Image data generation means generates image data of the inspected article from an output of the X-ray detection means. Incidence condition changing means changes two or more kinds of X-ray incidence conditions common for all of the sensor elements of the X-ray detection means in a state of absence of the inspected article in the inspection region. Correction data generation means acquires correction data that is needed for making a shade of an image uniform for each incidence condition. 1. An X-ray inspection apparatus comprising:transport means for transporting an inspected article to pass through a predetermined inspection region;an X-ray generation source that irradiates the inspection region with an X-ray;X-ray detection means for receiving the X-ray passing through the inspection region using a plurality of sensor elements that are arranged in a direction intersecting with a transport direction of the inspected article;image data generation means for generating image data of the inspected article from an output of the X-ray detection means;incidence condition changing means for changing two or more kinds of X-ray incidence conditions common for all of the sensor elements of the X-ray detection means in a state of absence of the inspected article in the inspection region;correction data generation means for acquiring correction data that is needed for making a shade of an image of the image data acquired by the image data generation means uniform for each incidence condition changed by the incidence condition changing means;correction means for correcting the ...

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03-01-2019 дата публикации

COMPUTING DEVICE, COMPUTING PROGRAM, X-RAY MEASURING SYSTEM AND X-RAY MEASURING METHOD

Номер: US20190003991A1
Автор: Mukaide Taihei
Принадлежит:

A computing device configured to obtain information about a subject using a detection result detected by an X-ray detector which detects an X-ray passing through the subject, which device includes: a unit configured to obtain a detection result of the X-ray detector; a first obtaining unit configured to obtain a complex refractive index of the X-ray after passing through the subject using the detection result; and a second obtaining unit configured to obtain information about the subject in accordance with a correlation between the complex refractive index and a mass absorption coefficient. 1. A computing device configured to obtain information about a subject using a detection result detected by an X-ray detector which detects an X-ray transmitted through the subject irradiated with an X-ray in a certain wavelength , the device comprising:a unit configured to obtain detection results detected by the X-ray detector;a first obtaining unit configured to obtain information about a complex refractive index n of the subject for the X-ray; anda second obtaining unit configured to obtain information about a mass absorption coefficient (μ/ρ) of the subject in accordance with a correlation between a parametric ratio (β/δ) according to the complex refractive index n and the mass absorption coefficient (μ/ρ),where μ denotes a linear absorption coefficient of a subject for an X-ray in a certain wavelength, ρ denotes mass density, n denotes a complex refractive index of a subject for an X-ray in a certain wavelength, and 1-δ and -β respectively denote a real part and an imaginary part in the complex refractive index n.3. The computing device according to claim 1 , wherein the information about the subject is at least any one of mass density claim 1 , an average atomic number claim 1 , and an average mass number of the subject.4. The computing device according to claim 1 , wherein the second obtaining unit obtains the mass absorption coefficient on the basis of the complex ...

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03-01-2019 дата публикации

NANO-LEVEL EVALUATION OF KEROGEN-RICH RESERVOIR ROCK

Номер: US20190003992A1
Принадлежит:

Nano-level evaluation of kerogen-rich reservoir rock is described. A nano-scale beam is formed from kerogen-rich reservoir rock. The nano-scale beam includes reservoir rock and kerogen having polymeric properties. A mechanical experiment is performed on the nano-scale beam. The mechanical experiment is imaged using a scanning electron microscope (SEM) or a transmission electron microscope (TEM). A material parameter of the kerogen in the nano-scale beam is determined based on the mechanical experiment and images obtained responsive to the imaging. 1. A method comprising:forming a beam from a cement mixture comprising cement and a polymer, wherein a maximum dimension of the beam is at most 1000 micrometer (μm);performing a mechanical experiment on the beam, wherein the mechanical experiment comprises a tension test or a compression test;imaging the mechanical experiment using a scanning electron microscope (SEM) or a transmission electron microscope (TEM); anddetermining a material parameter of the polymer in the beam based on results of the mechanical experiment and images obtained responsive to the imaging;before forming the beam, treating the cement mixture with an organic additive configured to alter properties of the polymer in the cement mixture; anddetermining an effect of organic additive on the polymer in the mixture based on the material parameter of the polymer in the beam.2. The method of claim 1 , wherein the mechanical experiment is the tension test claim 1 , and wherein the material parameter of the polymer in the beam comprises a tensile strength of the beam.3. The method of claim 1 , wherein the tension test is a cantilever test claim 1 , wherein performing the cantilever test comprises applying a force of the order of micro-Newtons on a free-end of the beam claim 1 , wherein determining the material parameter comprises measuring a bending of the cantilever responsive to force.4. The method of claim 1 , wherein the maximum dimension of the beam is at ...

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03-01-2019 дата публикации

X-RAY ANALYTICAL INSTRUMENT WITH IMPROVED CONTROL OF DETECTOR COOLING AND BIAS SUPPLY

Номер: US20190004184A1
Автор: Battyani Marc

Disclosed is a circuit for controlling the temperature and the bias voltage of a detector used by an X-ray analytical instrument. The circuit uses a single common reference voltage for the temperature measurement and for all the ADCs and DACs in the circuit, resulting in reduced drift and improved reproducibility of detector temperature and bias voltage. ADCs with a larger number of bits are used to produce precision values of the temperature, the bias voltage, and their respective setpoints. The setpoints are digitally varied until the precision setpoint values correspond to desired values of temperature and bias setpoints. 1. A circuitry for controlling a cooling power supply providing cooling power to a cooling unit of a detector of an X-ray analyzer , the circuitry comprises:a thermal measurement element producing a temperature measurement of the detector and subsequently a temperature voltage, a single common reference element providing a common reference voltage,', 'a digital-to-analog converter (DAC) configured to produce a setpoint voltage based on a pre-determined setpoint temperature value,', 'an analog-to-digital converter (ADC) configured to digitize the temperature voltage and the setpoint voltage and produce a precision setpoint value, wherein the precision setpoint value is used to produce an adjusted setpoint voltage,', 'a comparator producing a differential value between the temperature voltage and the adjusted setpoint voltage wherein the differential value is used as a basis for the control signal, wherein the common reference voltage is referenced by the thermal measurement, the DAC and the ADC., 'a controlling circuit providing a control signal for controlling the cooling power, the controlling circuit further comprises2. The circuitry of wherein the ADC is referenced to the reference voltage.3. The circuitry of wherein the DAC is referenced to the reference voltage.4. The circuitry of wherein the thermal measurement element is referenced to the ...

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13-01-2022 дата публикации

Shutter Assembly for X-Ray Detection

Номер: US20220011252A1
Принадлежит:

An embodiment of a shutter assembly is described that comprises a support structure with a number of stations and operatively coupled to a motor configured to translate each of the stations to a position in front of a detector, wherein a first station comprises a first aperture, a first charged particle filter, and a first window; and a second station comprises a second aperture larger than the first aperture, a second charged particle filter, and a second window thinner than the first window. 1. A shutter assembly , comprising: a first station comprises a first aperture, a first charged particle filter, and a first window; and', 'a second station comprises a second aperture larger than the first aperture, a second charged particle filter, and a second window thinner than the first window., 'a support structure comprising a plurality of stations and operatively coupled to a motor configured to translate each of the stations to a position in front of a detector, wherein2. The shutter assembly of claim 1 , wherein:the support structure comprises six stations.3. The shutter assembly of claim 1 , wherein:the support structure comprises two embodiments of the first station.4. The shutter assembly of claim 3 , wherein:the support structure comprises two embodiments of the second station.5. The shutter assembly of claim 1 , wherein:the second window constructed with a different material from the first window.6. The shutter assembly of claim 5 , wherein:the first window is configured with a material that comprises beryllium.7. The shutter assembly of claim 5 , wherein:the second window is configured with a polymer material.8. The shutter assembly of claim 7 , wherein:{'sub': 3', '4, 'the polymer material comprises SiN.'}9. The shutter assembly of claim 1 , wherein:the support structure is substantially circular in one plane, wherein the stations are circumferentially arranged on the plane.10. The shutter assembly of claim 1 , wherein:the motor comprises a vacuum safe ...

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13-01-2022 дата публикации

METHOD FOR ASSESSING THE CONCENTRATION OF URANIUM IN A SAMPLE BY GAMMA SPECTROMETRY, AND ASSOCIATED DEVICE

Номер: US20220011287A1
Принадлежит:

A method for assessing the mass concentration of uranium in a sample of uranium-bearing material by gamma spectrometry, includes a) acquiring () an energy spectrum of gamma radiation from the sample using a scintillator detector, the energy spectrum () comprising at least a first energy band () between 87 keV and 110 keV, and a second energy band () between 560 keV and 660 keV, the second energy band comprising at least one energy line () at 609 keV from Bi, b) calculating () an initial mass concentration of uranium (Cm) using the energy spectrum, c) measuring () a parameter representative of the height of the sample and a parameter representative of the density of the sample, d) calculating () a corrective coefficient (K), and e) calculating () a corrected mass concentration of uranium (Cm) using the initial mass concentration of uranium (Cm) and the corrective coefficient (K). 110-. (canceled)11. A method for assessing a concentration of uranium in a sample of uranium-bearing material by gamma spectrometry , the sample having a density and a height , the method comprising:{'sup': '214', 'acquiring an energy spectrum of gamma radiation from the sample using a scintillator detector, the energy spectrum comprising at least a first energy band between 87 keV and 110 keV, and a second energy band between 560 keV and 660 keV, the second energy band comprising at least one energy line at 609 keV of Bi;'}{'sup': '214', 'calculating an initial mass concentration of uranium using an area of the first energy band, an area of the second energy band, and a net area of the 609 keV energy line of Bi;'}measuring a parameter that is representative of the height of the sample and a parameter that is representative of the density of the sample;calculating a corrective coefficient using the parameter that is representative of the height of the sample, the parameter that is representative of the density of the sample, and the initial mass concentration of uranium; andcalculating a ...

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05-01-2017 дата публикации

NON-INTRUSIVE MEASUREMENT OF THE VOLUME DENSITY OF A PHASE IN A PART

Номер: US20170004613A1
Принадлежит:

Method and system for non-intrusive measurement of volume density of a specific phase in a part, comprising: processor producing a volume image of the part, the image being formed by a three-dimensional grid of voxels, the values of which indicate the disposition of the specific phase in the part, processor associating a binary coefficient with each voxel of the volume image, thus constructing an initial three-dimensional matrix representation of binary coefficients representing a presence or absence of the specific phase in zones of the part corresponding to the voxels, processor convoluting the initial matrix representation with a convolution matrix kernel corresponding to a predetermined reference volume, the convolution performed by effecting a composition of three (successive) monodimensional convolutions in three independent directions, thus forming a resultant matrix representation, each resultant coefficient of which represents a volume ratio (the density) of the specific phase in the reference volume. 110-. (canceled)11. Method for the non-intrusive measurement of the volume density of a specific phase in a part , characterised in that it comprises the following steps:producing a volume (tomographic) image of said part, said image being formed by a three-dimensional grid of voxels, the values of which indicate the disposition of said specific phase in (corresponding zones of) said part,associating a binary coefficient with each voxel of said volume (tomographic) image, thus constructing an initial three-dimensional matrix representation of binary coefficients, said binary coefficients representing a presence or absence of said specific phase in zones of said part corresponding to the voxels,convoluting said initial matrix representation with a convolution matrix kernel corresponding to a predetermined reference volume, said convolution being performed by effecting a composition of three (successive) monodimensional convolutions in three independent ...

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02-01-2020 дата публикации

Characterization of regions with different crystallinity in materials

Номер: US20200006034A1

A method of characterizing a region in a sample under study, and related systems, is disclosed. In once aspect, the sample under study comprises a first region having first crystalline properties and a second region having second crystalline properties. The method comprises irradiating the sample under study with an electron beam, the average relative angle between the electron beam and the sample under study being selected so that a contribution in the backscattered or forward scattered signal of the first region is distinguishable from that of the second region. The method further comprises detecting the backscattered or forward scattered electrons, and deriving a characteristic of the first and/or the second region from the detected backscattered or forward scattered electrons. The instantaneous relative angle between the electron beam and the sample under study is modulated with a predetermined modulation frequency during the irradiating the sample under study with an electron beam. Detecting the backscattered or forward scattered electrons is performed at the predetermined modulation frequency.

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11-01-2018 дата публикации

INTEGRATED MICROTOMOGRAPHY AND OPTICAL IMAGING SYSTEMS

Номер: US20180008218A1
Принадлежит:

An integrated microtomography and optical imaging system includes a rotating table that supports an imaging object, an optical stage, and separate optical and microtomography imaging systems. The table rotates the imaging object about a vertical axis running therethrough to a plurality of different rotational positions during a combined microtomography and optical imaging process. The optical stage can be a trans-illumination, epi-illumination or bioluminescent stage. The optical imaging system includes a camera positioned vertically above the imaging object. The microtomography system includes an x-ray source positioned horizontally with respect to the imaging object. Optical and x-ray images are both obtained while the imaging object remains in place on the rotating table. The stage and table are included within an imaging chamber, and all components are included within a portable cabinet. Multiple imaging objects can be imaged simultaneously, and side mirrors can provide side views of the object to the overhead camera. 1. An integrated microtomography and optical imaging system , comprising:an imaging chamber adapted to contain a separate imaging object therewithin;a rotating table located within the imaging chamber and adapted to support the separate imaging object thereupon, wherein the rotating table is further adapted to rotate the imaging object about a vertical axis running therethrough to a plurality of different rotational positions during a combined microtomography and optical imaging process;an optical imaging system located within or about the imaging chamber, said optical imaging system including a camera positioned substantially vertically above the imaging object and adapted to obtain optical images of the imaging object with respect to the vertical axis while the imaging object is on the rotating table; anda microtomography imaging system located within or about the imaging chamber and configured to obtain x-ray images of the imaging object while ...

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08-01-2015 дата публикации

Method and system for identifying a liquid product in luggage or other receptacle

Номер: US20150010128A1
Принадлежит: Optosecurity Inc

A method, an apparatus and a system are provided for determining if a piece of luggage contains a liquid product comprised of a container holding a body of liquid. The piece of luggage is scanned with an X-ray scanner to generate X-ray image data conveying an image of the piece of luggage and contents thereof. The X-ray image data is processed with a computer to detect a liquid product signature in the X-ray image data and determine if a liquid product is present in the piece of luggage. A detection signal is released at an output of the computer conveying whether a liquid product was identified in the piece of luggage. The detection signal may, for example, be used in rendering a visual representation of the piece of luggage on a display device to convey information to an operator as to the presence of a liquid product in the piece of luggage.

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27-01-2022 дата публикации

Sample Analysis Apparatus and Method

Номер: US20220026377A1
Принадлежит:

Characteristic X-rays (soft X-rays) from a sample are detected using a spectroscope to thereby generate a plurality of intensity spectrums arranged in order of time sequence. A contour map creation unit creates a contour map by converting, in accordance with a color conversion condition, the plurality of intensity spectrums into a plurality of one-dimensional maps, and arranging the plurality of one-dimensional maps in order of time sequence. When displaying the contour map, a waveform array and a difference contour map may also be displayed. Based on the contour map, a timepoint at which a state change occurs in the sample is determined. 1. A sample analysis apparatus , comprising:a creation unit which creates a plurality of one-dimensional maps based on a plurality of spectrums generated in order of time sequence by detecting electromagnetic waves from a sample, and which further creates a contour map in two-dimensional map form by arranging the plurality of one-dimensional maps in order of time sequence; anda display device which displays the contour map.2. The sample analysis apparatus according to claim 1 , whereinthe creation unit converts, for each of the spectrums, respective intensities constituting the spectrum into colors in accordance with a color conversion condition, and thereby creates the one-dimensional maps, andthe contour map is a color map.3. The sample analysis apparatus according to claim 1 , whereinthe electromagnetic waves are characteristic X-rays, andduring a measurement process in which an electron beam is continuously irradiated on the sample, the plurality of spectrums are generated at uniform time intervals.4. The sample analysis apparatus according to claim 3 , whereinduring the measurement process, thermal energy, electric energy, or kinetic energy, which is energy other than the electron beam, is continuously applied to the sample.5. The sample analysis apparatus according to claim 1 , further comprisinga determination unit that ...

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