Настройки

Укажите год
-

Небесная энциклопедия

Космические корабли и станции, автоматические КА и методы их проектирования, бортовые комплексы управления, системы и средства жизнеобеспечения, особенности технологии производства ракетно-космических систем

Подробнее
-

Мониторинг СМИ

Мониторинг СМИ и социальных сетей. Сканирование интернета, новостных сайтов, специализированных контентных площадок на базе мессенджеров. Гибкие настройки фильтров и первоначальных источников.

Подробнее

Форма поиска

Поддерживает ввод нескольких поисковых фраз (по одной на строку). При поиске обеспечивает поддержку морфологии русского и английского языка
Ведите корректный номера.
Ведите корректный номера.
Ведите корректный номера.
Ведите корректный номера.
Укажите год
Укажите год
Применить Всего найдено 7085. Отображено 100.
02-02-2012 дата публикации

Space-based CT scan system toward an astronomical object

Номер: US20120025083A1
Автор: Tomohiro Tsuta
Принадлежит: Individual

A CT scan system toward an astronomical object, including: a first satellite means for equipping a first satellite with an emitting means, said emitting means being for emitting super penetrating elementary particles; a second satellite means for equipping a second satellite with a detection means, said detection means being for detecting said super penetrating elementary particles; a super penetrating elementary particle measurement means for measuring the super penetrating elementary particles that are emitted from said emitting means, transmitted through said astronomical object, and detected by said detection means on said second satellite, said second satellite being, at the time of a measurement, opposite to said first satellite with respect to said astronomical object in between; and a CT reconstructing means for reconstructing a CT scan image regarding internal structure of said astronomical object based on the data obtained from said super penetrating elementary particle measurement means iterated.

Подробнее
Номер записи: 1
19-04-2012 дата публикации

Method and apparatus for assessing the threat status of luggage

Номер: US20120093367A1
Автор: Dan Gudmundson, Luc Perron
Принадлежит: Optosecurity Inc

A method and apparatus for assessing a threat status of a piece of luggage. The method comprises the steps of scanning the piece of luggage with penetrating radiation to generate image data and processing the image data with a computing device to identify one or more objects represented by the image data. The method also includes further processing the image data to compensate the image data for interaction between the object and the penetrating radiation to produce compensated image data and then determine the threat status of the piece of luggage.

Подробнее
Номер записи: 2
21-06-2012 дата публикации

Computer tomographic workpiece measuring device

Номер: US20120155606A1
Автор: Manfred Etzel, Martin Simon, Ralf Hock, Severin Ebner, Siegfried Heeg, Uwe Hilpert
Принадлежит: Wenzel Volumetrik GmbH

A marine device has a floating buoy containing electronics, a submerged payload containing electrical devices and electronics, a power source and a mooring line. At least a part of the power source is submerged and electrically connected to at least one of the submerged payload and the floating buoy, and the mooring line extends between the buoy and at least one of the power source submerged part, the submerged payload and a submerged anchor having a mass allowing it to stay under the water surface.

Подробнее
Номер записи: 3
30-08-2012 дата публикации

Methods and apparatus for displaying images

Номер: US20120219202A1
Автор: Alexander Stewart, Edward Bullard, Martin Stanton
Принадлежит: Dexela Ltd

In one aspect, a method of displaying data is provided. The method comprises obtaining projection data of an object by exposing an object to radiation at a plurality of view angles and detecting at least some of the radiation exiting the object to form the projection data, operating a computer to reconstruct the projection data at a reconstruction resolution to form image data comprising a plurality of voxels representing locations within the object, each of the plurality of voxels being assigned an associated intensity indicative of a density of the subject matter at the respective location, determining a maximum resolution for display, above which variation in intensity between adjacent voxels is not supported by information in the projection data, the maximum resolution being less than the reconstruction resolution, and displaying the image data at or below the maximum resolution.

Подробнее
Номер записи: 4
11-10-2012 дата публикации

Apparatus and a method of determining the proportions of different powders in a powder

Номер: US20120257712A1
Автор: Jonathan M. Taylor, Michael L. BLACKMORE
Принадлежит: Rolls Royce PLC

A method of determining the proportions of different powders in a powder comprises obtaining a sample of a powder, adding and mixing the sample into a molten material and freezing the mixture of powder and molten material to form a block. Computed tomography is performed on the block to produce a three-dimensional image of the block, the three-dimensional image of the block comprises a first shade, a second and a third shade corresponding to the material, a first powder particle and a sec and powder particle. The three-dimensional image of the block is analysed to count the number of regions exhibiting the second shade and the third shade corresponding to the number of first powder particles and second powder particles respectively. The fraction of second particles in the powder is determined by dividing the number of second powder particles by the sum of the number of first powder particles and the number of second powder particles.

Подробнее
Номер записи: 5
22-11-2012 дата публикации

Micro electro-mechanical heater

Номер: US20120292528A1
Автор: Edward Cyrankowski, Oden Lee Warren, Syed Amanulla Syed Asif, Yunje Oh
Принадлежит: Hysitron Inc

A sub-micron scale property testing apparatus including a test subject holder and heating assembly. The assembly includes a holder base configured to couple with a sub-micron mechanical testing instrument and electro-mechanical transducer assembly. The assembly further includes a test subject stage coupled with the holder base. The test subject stage is thermally isolated from the holder base. The test subject stage includes a stage subject surface configured to receive a test subject, and a stage plate bracing the stage subject surface. The stage plate is under the stage subject surface. The test subject stage further includes a heating element adjacent to the stage subject surface, the heating element is configured to generate heat at the stage subject surface.

Подробнее
Номер записи: 6
29-11-2012 дата публикации

Computed Tomography Imaging Process And System

Номер: US20120301004A1
Автор: Adrian Paul Sheppard, Andrew Maurice Kingston, Arthur Sakellariou, Shane Jamie Latham, Trond Karsten Varslot
Принадлежит: Australian National University

A computed tomography imaging process, including: accessing projection data representing two-dimensional projection images of an object acquired using a misaligned tomographic imaging apparatus; and processing the projection data to generate misalignment data representing one or more values that quantify respective misalignments of the tomographic imaging apparatus.

Подробнее
Номер записи: 7
29-11-2012 дата публикации

System for non-destructive testing and method for processing data generated therein

Номер: US20120303309A1
Автор: Andreas Beyer, Ingo Stuke, Michael Wuestenbecker, Til Florian Guenzler
Принадлежит: General Electric Co

Systems and methods are described that reduce the amount of data that is transferred among the components of the system. In one embodiment, the testing system comprises a scanner device such as a computed-tomography (CT) scanner that generates a volumetric representation of a part-under-inspection. The testing system is further configured to identify a region of interest in the volumetric representation, wherein the region of interest may correspond to an area of the part-under-inspection where a defect or flaw may form. The testing system may further format the data of the volumetric representation so the resulting formatted volumetric representation comprises less data than the original volumetric representation.

Подробнее
Номер записи: 8
20-12-2012 дата публикации

Solid material characterization with x-ray spectra in both transmission and fluoresence modes

Номер: US20120321039A1
Автор: Nan Greenlay, Shelly D. Kelly, Simon Russell Bare, Wharton Sinkler
Принадлежит: UOP LLC

Methods are disclosed utilizing synchrotron X-ray microscopy including x-ray fluorescence and x-ray absorption spectra to probe elemental distribution and elemental speciation within a material, and particularly a solid that may have one or more elements distributed on a solid substrate. Representative materials are relatively homogeneous in composition on the macroscale but relatively heterogeneous on the microscale. The analysis of such materials, particularly on a macroscale at which their heterogeneous nature can be observed, provides valuable insights into the relationships or correlations between localized concentrations of elements and/or their species, and concentrations of other components of the materials. Sample preparation methods, involving the use of a reinforcing agent, which are advantageously used in such methods are also disclosed.

Подробнее
Номер записи: 9
31-01-2013 дата публикации

X-Ray Scanners

Номер: US20130028372A1
Автор: Edward James Morton
Принадлежит: Edward James Morton

The present application discloses an X-ray scanner having an X-ray source arranged to emit X-rays from source points through an imaging volume. The scanner may further include an array of X-ray detectors which may be arranged around the imaging volume and may be arranged to output detector signals in response to the detection of X-rays. The scanner may further include a conveyor arranged to convey an object through the imaging volume in a scan direction, and may also include at least one processor arranged to process the detector signals to produce an image data set defining an image of the object. The image may have a resolution in the scan direction that is at least 90 % as high as in one direction, and in some cases two directions, orthogonal to the scan direction.

Подробнее
Номер записи: 10
14-02-2013 дата публикации

Charged-particle microscope providing depth-resolved imagery

Номер: US20130037715A1
Автор: Berend Helmerus Lich, Cornelis Sander Kooijman, Faysal Boughorbel, Pavel Potocek
Принадлежит: FEI Co

A method of examining a sample using a charged-particle microscope, comprising the following steps: Mounting the sample on a sample holder; Using a particle-optical column to direct at least one beam of particulate radiation onto a surface S of the sample, thereby producing an interaction that causes emitted radiation to emanate from the sample; Using a detector arrangement to detect at least a portion of said emitted radiation, which method comprises the following steps: Recording an output O n of said detector arrangement as a function of emergence angle θ n of said emitted radiation, measured relative to an axis normal to S, thus compiling a measurement set M={(O n , θ n )} for a plurality of values of θ n ; Using computer processing apparatus to automatically deconvolve the measurement set M and spatially resolve it into a result set R={(V k , L k )}, in which a spatial variable V demonstrates a value V k at an associated discrete depth level L k referenced to the surface S, whereby n and k are members of an integer sequence, and spatial variable V represents a physical property of the sample as a function of position in its bulk.

Подробнее
Номер записи: 11
14-02-2013 дата публикации

X-ray imaging apparatus

Номер: US20130039466A1
Автор: Kazuhiro Takada, Kazunori Fukuda, Masatoshi Watanabe, Taihei Mukaide
Принадлежит: Canon Inc

To provide an X-ray imaging apparatus capable of easily adjusting the sensitivity or capable of easily extracting the amount of refraction of X-rays. An X-ray imaging apparatus irradiating an object to be measured with an X-ray beam from an X-ray source that generates X-rays of a first energy and X-rays of a second energy different from the first energy to measure an image of the object to be measured includes an attenuator and a detector. The attenuator attenuates the X-ray beam transmitted through the object to be measured and is configured so as to vary the amount of attenuation of the X-rays depending on a position on which the X-ray beam is incident. The detector detects the X-ray beam transmitted through the attenuator and is configured so as to detect the X-rays of the first energy and the second energy.

Подробнее
Номер записи: 12
28-02-2013 дата публикации

Method and apparatus for material analysis by a focused electron beam using characteristic x-rays and back-scattered electrons

Номер: US20130054153A1
Автор: David MOTL, Vojtech FILIP
Принадлежит: Tescan AS

A material analysis method by a focused electron beam and an equipment for performing such an analysis where an electron map B is created describing the intensity of emitted back-scattered electrons at various points on a sample, and a spectral map S is created describing the intensity of emitted X-rays at points on the sample depending on the radiation energy. For selected chemical elements, X-ray maps M i are created representing the intensity of X-rays characteristic for such elements. The X-ray maps M i and the electron map B are converted into differential X-ray maps D i , which are subsequently merged into a final differential X-ray map D. The final differential X-ray map D is then used to search particles. Subsequently, a cumulative X-ray spectrum X j is calculated for each particle and subsequently the classification of particles based on the peak intensities and the intensity of back-scattered electron is performed.

Подробнее
Номер записи: 13
11-04-2013 дата публикации

Evaluation System and Evaluation Method of Plastic Strain

Номер: US20130089182A1
Автор: Junya Kaneda, Masato Koshiishi, Ryo Ishibashi, Yun Wang, Yusaku Maruno
Принадлежит: HITACHI LTD

An evaluation system for plastic strain includes an X-ray diffraction device for irradiating the surface of a measurement object; and an image analyzing device that generates diffraction intensity curves from X-ray diffraction angle and intensity with an implanted database, which can be obtained in advance from test specimens made of the same material of the measurement object, establishing at least one of the relations between the full width at half maximum of the diffraction intensity curve and plastic strain, and between the integral intensity angular breadth of diffraction intensity curve and plastic strain. The image analyzing device obtains plastic strain of the measurement object based on at least one of the diffraction parameters of the full width at half maximum and the integral intensity angular breadth of a diffraction intensity curve corresponding to the implanted database indicative of the relation between the diffraction parameter and plastic strain.

Подробнее
Номер записи: 14
18-04-2013 дата публикации

Method for core thermal conductivity determination

Номер: US20130094624A1
Автор: Aleksander Petrovich Skibin, Aleksandra Evgenievna Komrakova, Darya Aleksandrovna Mustafina
Принадлежит: Schlumberger Technology Corp

A method for core sample effective thermal conductivity provides for scanning a core sample by X-ray micro-computed tomography scanner and transferring a three dimensional scan image to an image analysis computer for processing. Then a layer thickness to be analyzed is set and a layer with maximum thermal resistance is defined within the image. The value of core effective thermal conductivity is defined by the allocated layer.

Подробнее
Номер записи: 15
18-04-2013 дата публикации

Apparatus and method for non-rotational computer tomography

Номер: US20130094741A1
Автор: Randolf Hanke, Theobald Fuchs, Tobias Schoen
Принадлежит: Fraunhofer Gesellschaft zur Forderung der Angewandten Forschung eV

A multi-dimensional representation of an object is obtained in that first and second pictures of the object illuminated using an X-ray source are created using a sensor that is located, in relation to the X-ray source, behind the object in a preferential direction defined by the relative positions of the object and of the sensor. A distance in the preferential direction between the X-ray source and the object is different in the first picture than in the second picture. The multi-dimensional representation of the object is obtained by combining the first and second pictures.

Подробнее
Номер записи: 16
25-04-2013 дата публикации

Method and apparatus pertaining to non-invasive identification of materials

Номер: US20130101156A1
Автор: Kevin M. Holt
Принадлежит: Varian Medical Systems Inc

A control circuit having access to information regarding a plurality of models for different materials along with feasibility criteria processes imaging information for an object (as provided, for example, by a non-invasive imaging apparatus) to facilitate identifying the materials as comprise that object by using the plurality of models to identify candidate materials for portions of the imaging information and then using the feasibility criteria to reduce the candidate materials by avoiding at least one of unlikely materials and combinations of materials to thereby yield useful material-identification information.

Подробнее
Номер записи: 17
02-05-2013 дата публикации

System and method for improved energy series of images using multi-energy ct

Номер: US20130108013A1
Автор: Charles A. Mistretta, Cynthia H. McCollough, Joel G. Fletcher, Lifeng Yu, Shuai Leng
Принадлежит: Individual

A method for creating an energy series of images acquired using a multi-energy computed tomography (CT) imaging system having a plurality of energy bins includes acquiring, with the multi-energy CT imaging system, a series of energy data sets, where each energy data set is associated with at least one of the energy bins. The method includes producing a conglomerate image using at least a plurality of the energy data sets and, using the conglomerate image, reconstructing an energy series of images, each image in the energy series of images corresponding to at least one of the energy data sets.

Подробнее
Номер записи: 18
30-05-2013 дата публикации

Component aperture location using computed tomography

Номер: US20130136225A1
Автор: Derek J. Michaels, Rodney H. Warner
Принадлежит: Individual

An exemplary component measuring method includes determining a position of an aperture of a component using a computed tomography scan of a gage and a component. The gage is inserted into the aperture of the component during the computed tomography scan.

Подробнее
Номер записи: 19
22-08-2013 дата публикации

Method and system unit for stereoscopic x-ray imaging

Номер: US20130216021A1
Автор: Martin Spahn, Philipp Bernhardt
Принадлежит: Individual

A method for stereoscopic x-ray imaging by a stereoscopic x-ray tube and by an x-ray radiation detector is provided. The x-ray radiation detector has a buffer. The stereoscopic x-ray tube has two x-ray beam sources disposed a short distance from one another. 2D image datasets are acquired at relatively short intervals one after the other, which have good quality.

Подробнее
Номер записи: 20
12-09-2013 дата публикации

Radiographic phase-contrast imaging apparatus

Номер: US20130235973A1
Автор: Dai Murakoshi, Shinji Imai, Toshitaka Agano, Wataru Ito
Принадлежит: Fujifilm Corp

A radiographic phase-contrast imaging apparatus obtains a phase-contrast image using two gratings including the first grating and the second grating. The first and second gratings are adapted to form a moire pattern when a periodic pattern image formed by the first grating is superimposed on the second grating. Based on the moire pattern detected by the radiographic image detector, image signals of the fringe images, which correspond to pixel groups located at different positions with respect to a predetermined direction, are obtained by obtaining image signals of pixels of each pixel group, which includes pixels arranged at predetermined intervals in the predetermined direction, as the image signal of each fringe image, where the predetermined direction is a direction parallel to or intersecting a period direction of the moire pattern other than a direction orthogonal to the period direction. Then, a phase-contrast image is generated based on the obtained fringe images.

Подробнее
Номер записи: 21
26-09-2013 дата публикации

System for measuring sample pore using computed tomography and standard sample and method thereof

Номер: US20130251095A1
Автор: Jae Hwa Jin, Jun Ho Kim, Min Jun Kim
Принадлежит: Korea Institute of Geoscience and Mineral Resources KIGAM

The present invention relates to a system for measuring a sample pore using a computed tomography (CT) and a standard sample and to a method thereof, more particularly to a system for measuring a sample pore using a computed tomography (CT) and a standard sample and to a method thereof, wherein the number of pixels in the count range of a cross-sectional image of the measurement sample and the number of pixels corresponding to the gray level range of the pore are calculated with reference to the count range utilized in the cross-sectional image of the standard sample and the gray level range of the pore so as to accurately measure the porosity of the measurement sample after performing a CT scan of the standard sample and the measurement sample together using a CT scanner.

Подробнее
Номер записи: 22
03-10-2013 дата публикации

Efficient Method For Selecting Representative Elementary Volume In Digital Representations Of Porous Media

Номер: US20130262028A1
Автор: Giuseppe DE PRISCO, Jonas Toelke
Принадлежит: Ingrain Inc

The present invention relates a method to estimate representative elementary volume (REV) in a sample of porous media wherein the sub-volume selected is a better approximation of the elementary volume than existing methods. REV in a sample of porous media such as rock can be defined wherein the REV is selected with respect to the expected direction of fluid flow through the porous media. The method can quantify how good is the digital representation of a rock and how accurate a description of a fluid flow through Darcy's law will be, and allows the evaluation of different length scales in different directions for the REV and an assessment of the anisotropy of the pores structures when the method is applied in different directions. The method also can determine a robust criteria to understand when a trend of porosity-permeability breaks down due to an insufficient size of the subsample.

Подробнее
Номер записи: 23
10-10-2013 дата публикации

Rotatable drum assembly for radiology imaging modalities

Номер: US20130266116A1
Автор: Daniel Abenaim, Ronald E. Swain
Принадлежит: Analogic Corp

Among other things, a rotatable drum for a radiology imaging modality is provided herein. The rotatable drum comprises a bore, defined by an inner circumference of a sidewall of the rotatable drum. In one embodiment, the sidewall comprises one or more apertures through which radiation may pass. By way of example, a radiation source and a detector array may be mounted outside of the bore (e.g., on an outside surface of the sidewall) and apertures in the sidewall may permit radiation to pass from the radiation source to the detector array without being attenuated by the sidewall of the drum. In another embodiment, the detector array may be comprised of a plurality of detector modules that may be individually mounted/dismounted from the rotatable drum, and in one example, may provide structural support to the rotatable drum.

Подробнее
Номер записи: 24
28-11-2013 дата публикации

System and method for wide cone helical image reconstruction

Номер: US20130315453A1
Автор: Brian Edward Nett, Guangzhi Cao, Jiang Hsieh
Принадлежит: General Electric Co

A tomographic system includes a gantry having an opening for receiving an object to be scanned, a radiation source, a detector positioned to receive radiation from the source that passes through the object, and a computer programmed to acquire a plurality of helical projection datasets of the object, reconstruct a first image using the acquired plurality of helical projection datasets and using a first reconstruction algorithm, reconstruct a second image using the acquired plurality of helical projection datasets and using a second reconstruction algorithm that is different from the first reconstruction algorithm, extract frequency components from each of the first and second images, sum the frequency components from each of the first and second images, and inverse transform the sum of the frequency components to generate a final image.

Подробнее
Номер записи: 25
26-12-2013 дата публикации

Image processing apparatus, image processing method

Номер: US20130343649A1
Автор: Hideki ITAI, Kazunari Asao, Zhigang Wang
Принадлежит: Hitachi High Technologies Corp

In order to solve the problem that the resolution of a back-scattered electron image without a contrast difference between materials with close atomic numbers is low, an image processing apparatus that performs an image process on a back-scattered electron image as an input image includes: a material peak detection unit that determines a peak luminance value with a peak of a frequency of a luminance histogram based on a luminance value obtained for each measurement position by using the input image as an input and information about material-dependent back-scattered electron generation efficiency, and that outputs the peak luminance value for each material; and an image information adjustment unit that emphasizes a material-dependent contrast on the basis of the input image and the peak luminance value for each material.

Подробнее
Номер записи: 26
20-02-2014 дата публикации

System and method for detecting materials or disease states using multi-energy computed tomography

Номер: US20140050378A1
Автор: AJAY Narayanan, Bipul Das, Carlos Eduardo Rochitte, Melissa Megumi Shiraishi Kuriki, Pedro Alves Lemos Neto, Roberto Caldeira Cury, Sandeep Dutta, Souma Sengupta, TOSHIHIRO Rifu
Принадлежит: General Electric Co, INSTITUTO DO CORACAO

The disclosed embodiments relate to characterizing or quantifying an element or composition of interest within an imaged volume. In accordance with one embodiment, high and low energy images are acquired of a volume of interest using a polychromatic emission source. The high and low energy images are processed to generate monochromatic images. Based on the observed attenuation within the monochromatic images, one or more elements or compositions of interest are characterized within the imaged volume.

Подробнее
Номер записи: 27
27-02-2014 дата публикации

Method and apparatus for correcting artifacts during generation of x-ray images, in particular computed tomography, or radiography by means of temporal modulation of primary radiation

Номер: US20140056407A1
Автор: Karsten SCHÖRNER, Matthias Goldammer
Принадлежит: SIEMENS AG

Artifacts caused by scattered radiation when generating X-ray images of objects are corrected using a temporally alterable modulation of the primary radiation. A respective set of originally amplitude-modulated modulation projections of the object is generated and a respective scattered image allocated to the respective modulation projections is calculated. The method is particularly suitable for fast CT scans.

Подробнее
Номер записи: 28
07-01-2021 дата публикации

ANATOMICAL IMAGING SYSTEM WITH CENTIPEDE BELT DRIVE

Номер: US20210000435A1
Автор: Allis Daniel, Bailey Eric M., Tybinkowski Andrew P.
Принадлежит:

An anatomical imaging system comprising: 1. An anatomical imaging system comprising:a CT machine; anda transport mechanism mounted to the base of the CT machine, wherein the transport mechanism comprises a fine movement mechanism for moving the CT machine precisely, relative to the patient, during scanning.2. A system according to wherein the fine movement mechanism is configured to move the CT machine relative to the patient using indexed movement in discrete steps claim 1 , whereby to enable slice scanning.3. A system according to wherein the fine movement mechanism is configured to move the CT machine relative to the patient using substantially continuous movement claim 1 , whereby to enable helical scanning.418.-. (canceled)19. A method for scanning a patient claim 1 , comprising:moving a CT machine across room distances to the patient; andscanning the patient while moving the CT machine precisely relative to the patient during scanning.20. A method for scanning an object claim 1 , comprising:moving a scanner across room distances to the the object; andscanning the object while moving the scanner precisely relative to the object during scanning. This patent application claims benefit of:(i) pending prior U.S. Provisional Patent Application Ser. No. 60/670,164, filed Apr. 11, 2005 by Andrew P. Tybinkowski et al. for ANATOMICAL IMAGING SYSTEM WITH CENTIPEDE DRIVE (Attorney's Docket No. NLOGICA-1 PROV); and(ii) pending prior U.S. Provisional Patent Application Ser. No. 60/593,001, filed Jul. 20, 2004 by Bernard Gordon et al. for ANATOMICAL SCANNING SYSTEM (Attorney's Docket No. NLOGICA-14 PROV).The two above-identified patent applications are hereby incorporated herein by reference.This invention relates to anatomical imaging systems in general, and more particularly to anatomical imaging systems of the sort utilizing Computerized Tomography (CT) systems and the like.Strokes are the third leading cause of death in the United States (causing approximately 177,000 ...

Подробнее
Номер записи: 29
07-01-2021 дата публикации

Systems and Methods for High Throughput Object Handling and Screening

Номер: US20210002078A1
Автор: MacDonald Michael William James
Принадлежит:

Systems and methods described herein are for high throughput object handling and X-Ray screening systems. Material handling systems can adopt the proposed system to assist with the transportation of objects into X-Ray screening machines populated with lead curtains to curtail radiation emissions. The lead curtains associated with X-Ray screening machines can cause numerous problems to the safe and secure transportation of the objects. The systems and methods proposed control several aspects of the object handling to overcome the problems associated with the lead curtains. The system and methods results in the increase of system throughput, improved efficiency, reduction in line stoppages and general wear and tear. Systems can include a smart conveyor that assists objects through lead curtains using flights that are raised behind the trailing edge of the objects. The system can include smart conveyors and control systems that communicate with the X-Ray machine regarding the identity and status of the objects. 1. A conveyor comprising:a conveyor belt having a flight, the flight configured to be selectively positioned in a default position in which the flight is parallel to the conveyor belt and a raised position in which the flight is perpendicular to the conveyor belt; andone or more sensors for sensing an edge of an object on the conveyor belt, wherein the flight is selectively transitioned to the raised position from the default position on the conveyor belt behind the object to assist the object forward.2. The conveyor of claim 1 , further comprising:a plurality of cams on the flight;a wear strip under the conveyor belt to engage with at least one cam in the plurality of cams when each flight is raised; anda plurality of channels running along the length of the conveyor belt in the direction of travel of the conveyor belt to allow the plurality of cams to travel unhindered when the flight remains in the default position.3. The conveyor of claim 2 , further ...

Подробнее
Номер записи: 30
05-01-2017 дата публикации

X-RAY IMAGING APPARATUS AND X-RAY IMAGING METHOD

Номер: US20170003233A1
Автор: BABA Rika, YAMAKAWA Keisuke, YONEYAMA Akio
Принадлежит:

An object of the present invention is to non-destructively obtain, in an X-ray imaging apparatus, a sectional image of a subject with spatial resolution higher than spatial resolution of an image detector. In the present invention, the image detector is two-dimensionally moved with respect to an incident X-ray for each half (180°) rotation of the subject, and a plurality of image groups (CT data sets) is obtained at different positions of the image detector. An image (sinogram) is synthesized from each image group thus obtained, which image is equal to an image obtained with a detector whose pixel size is smaller than the pixel size constituting the above described image detector. From this synthesized image, a sectional image with high spatial resolution is calculated by reconstruction calculation. 1. An X-ray imaging apparatus comprising:an X-ray generation unit that generates an X-ray and irradiates a subject with the X-ray;a subject positioning rotation table unit that adjusts an angle of the subject with respect to an optical path direction of the X-ray and an incident position of the X-ray to the subject;an X-ray image detection unit that detects an X-ray transmitted through the subject;a detector positioning table unit that two-dimensionally moves and positions the X-ray image detection unit on a surface perpendicular to an X-ray;a processing unit that calculates a sectional image of the subject from a plurality of X-ray images obtained by moving the X-ray image detection unit by the detector positioning table unit; anda control unit that controls each of the units, whereinthe X-ray image detection unit obtains an X-ray image while an angle of the subject with respect to the optical path direction of the X-ray is changed by the subject positioning rotation table unit,the detector positioning table unit moves the X-ray image detection unit for each time the angle reaches half rotation, andthe moved X-ray image detection unit repeatedly obtains the X-ray image. ...

Подробнее
Номер записи: 31
07-01-2016 дата публикации

EXTENDED FIELD ITERATIVE RECONSTRUCTION TECHNIQUE (EFIRT) FOR CORRELATED NOISE REMOVAL

Номер: US20160003752A1
Автор: Mahmood Faisal, ÖFVERSTEDT Lars-Göran Wallentin, SKOGLUND Bo Ulf
Принадлежит: OKINAWA INSTITUTE OF SCIENCE AND TECHNOLOGY SCHOOL CORPORATION

Computerized method and system for improving 3D reconstruction images involves applying the Extended Field Iterative Reconstruction Technique (EFIRT) to remove correlated noise, in addition to using COMET (constrained maximum relative entropy tomography) to eliminate uncorrelated noise, wherein the EFIRT is applied by performing a set of successive reconstructions on an extended field larger than a region of interest (ROI); and extracting and averaging the ROI from said set of successive reconstructions. 1. A computer implemented method for removing correlated noise by applying Extended Field Iterative Reconstruction Technique (EFIRT) in a three-dimensional (3D) reconstruction , said method comprising:performing a set of successive reconstructions on an extended field larger than a region of interest (ROI); andextracting and averaging the ROI from said set of successive reconstructions.2. The computer implemented method according to claim 1 , wherein the set of reconstructions is performed by increasing volumes of each successive reconstruction.3. The computer implemented method according to claim 2 , wherein the volume of each successive reconstruction is increased by increasing the value of z in the direction of the electron field.4. The computer implemented method according to claim 1 , further comprising removing uncorrelated noise in said 3D reconstruction with COMET (constrained maximum relative entropy tomography).5. The computer implemented method according to claim 1 , wherein the 3D reconstruction is implemented via a Cryo-Electron Tomography (Cryo-ET) application.6. The computer implemented method according to claim 1 ,wherein the 3D reconstruction is applied to a biological sample or a non-biological sample.7. A system for removing correlated noise in a three-dimensional (3D) reconstruction by applying Extended Field Iterative Reconstruction Technique (EFIRT) claim 1 , said system comprising:a processor; anda memory accessible to said processor, wherein ...

Подробнее
Номер записи: 32
04-01-2018 дата публикации

DEVICES AND METHODS FOR SAMPLE CHARACTERIZATION

Номер: US20180003674A1
Автор: Gentalen Erik
Принадлежит: Intabio, Inc.

Devices and methods for characterization of analyte mixtures are provided. Some methods described herein include performing enrichment steps on a device before expelling enriched analyte fractions from the device for subsequent analysis. Also included are devices for performing these enrichment steps. 1. A method , comprising:introducing an analyte mixture into a microfluidic device containing a separation channel;applying an electric field across the separation channel to effect a separation of the analyte mixture;illuminating a first side of the microfluidic device through an optical slit;detecting light passing through the optical slit and the separation channel to monitor separation of the analyte mixture; andexpelling a fraction of the analyte mixture from an orifice in fluid communication with the separation channel.2. The method of claim 1 , wherein the microfluidic device includes an opaque substrate that defines the separation channel and the optical slit.3. The method of claim 1 , wherein the fraction of the analyte mixture is expelled via electrospray ionization claim 1 ,4. The method of claim 1 , wherein the orifice is disposed within a recess defined by the microfluidic device claim 1 , such that a Taylor cone formed by electrospray ionization is disposed entirely within the recess.5. The method of claim 1 , wherein monitoring separation of the analytes includes imaging the entire separation channel.6. The method of claim 1 , wherein:the microfluidic device is illuminated with ultraviolet light;the microfluidic device includes a substrate constructed of a cyclic olefin copolymer opaque to ultraviolet light; andthe detected light is only ultraviolet light that transits the separation channel.7. The method of claim 1 , wherein the separation channel is a first separation channel claim 1 , the method further comprising:enriching a fraction of the analyte mixture in a second separation channel of the microfluidic device.8. The method of claim 1 , wherein: ...

Подробнее
Номер записи: 33
02-01-2020 дата публикации

SYSTEMS AND METHODS FOR X-RAY COMPUTED TOMOGRAPHY

Номер: US20200003703A1
Автор: GOLDBERG Boris S., GOUZEEV Serguei, HELLMANN Michael G., ZAVAGNO David R.
Принадлежит:

A system and method for X-ray computed tomography includes a robotic arm that moves an X-ray emitter around a subject in a curvilinear path and an X-ray detector that captures 2-dimensional views while the subject is scanned. Movements of the emitter and detector are coordinated such that the position and angle of the emitter relative to the detector remains substantially constant during scanning. A processor uses computed tomography to reconstruct an image of the subject from the captured 2-dimensional views. The robotic arm varies the pitch of the X-ray emitter during the scan to enhance the spatial resolution of the reconstructed image. The processor generates a projection transformation matrix based on movement of the robotic arm for each captured 2-dimensional view that is applied during reconstruction. 1. A method of performing X-ray computed tomography , comprising:rotating an X-ray emitter and an X-ray detector in a curvilinear path about a subject to be scanned;varying the pitch of the X-ray emitter and the X-ray detector while rotating in the curvilinear path;scanning the subject with the X-ray emitter while rotating in the curvilinear path and varying the pitch of the X-ray emitter and the X-ray detector;capturing a plurality of 2-dimensional views by the X-ray detector while scanning the subject; andreconstructing a high spatial resolution digital image of the subject from the captured plurality of 2-dimensional views,wherein movement of the X-ray emitter and the X-ray detector is coordinated such that the position and angle of the X-ray emitter relative to the X-ray detector remains substantially constant during the scanning.2. The method of claim 1 , further comprising:generating a projection transformation matrix associated with each captured 2-dimensional view based at least in part on the movement, andwherein the operation of reconstructing includes applying each generated projection transformation matrix to data associated with each captured 2- ...

Подробнее
Номер записи: 34
02-01-2020 дата публикации

MEASUREMENT PROCESSING DEVICE, X-RAY INSPECTION DEVICE, MEASUREMENT PROCESSING METHOD, MEASUREMENT PROCESSING PROGRAM, AND STRUCTURE MANUFACTURING METHOD

Номер: US20200003705A1
Автор: HAYANO Fuminori, KAWAI AKITOSHI, YASHIMA Hirotomo
Принадлежит: NIKON CORPORATION

A measurement processing device used for an X-ray inspection device includes: a region information acquisition unit that acquires first region information based on X-rays passing through a first region that is a part of a first specimen; a storage unit that stores second region information related to a second region of a second specimen, the second region being larger than the first region; and a determination unit that determines whether or not a region corresponding to the first region is included in the second region, based on the first region information and the second region information. 127-. (canceled)28. A measurement processing device using an X-ray inspection device , comprising:a region information acquisition unit that detects X-rays passing through a partial region of a first specimen and acquires first region information related to a first region;an inclination detection unit that detects an inclination of the first specimen when acquiring the first region information; anda comparison unit that compares a standard inclination and the inclination of the first specimen detected by the inclination detection unit.29. The measurement processing device according to claim 28 , whereinthe region information acquisition unit detects X-rays passing through a partial region of a second specimen, and acquires second region information related to a second region,the inclination detection unit detects an inclination of the second specimen when acquiring the second region information, andthe comparison unit compares the inclination of the second specimen and the inclination of the first specimen detected by the inclination detection unit.30. The measurement processing device according to claim 28 , whereinthe inclination detection unit detects the inclination of the first specimen when acquiring the first region information, based on the first region information.31. The measurement processing device according to claim 28 , whereinthe inclination of the first specimen ...

Подробнее
Номер записи: 35
02-01-2020 дата публикации

SYSTEM AND METHOD FOR QUANTIFYING X-RAY BACKSCATTER SYSTEM PERFORMANCE

Номер: US20200003707A1
Автор: Edwards Talion, Engel James E., Georgeson Gary E., Grimshaw Matthew T., Lou Taisia Tsukruk, Safai Morteza, Wright Daniel J., Wright Rodney S., Wu Yuan-Jye
Принадлежит:

A system for quantifying x-ray backscatter system performance is disclosed. The system includes one or more x-ray backscatter detectors, an x-ray tube, a support, and a plurality of rods mounted on the support and arranged in groups. Each group of rods includes at least two rods having the same width. The system also includes a user interface configured to connect to the x-ray backscatter detectors to receive a backscatter signal from the x-ray backscatter detectors associated with the x-ray tube, where the user interface plots a modulation transfer function representing x-ray backscatter for each rod of the plurality of rods from x-rays transmitted by the x-ray tube. 1. A system for quantifying x-ray backscatter system performance , the system including one or more x-ray backscatter detectors and an x-ray tube , the system comprising:a support;a plurality of rods mounted on the support and arranged in groups, wherein each group of rods include at least two rods having the same width; anda user interface configured to connect to the x-ray backscatter detectors to receive a backscatter signal from the x-ray backscatter detectors associated with the x-ray tube, wherein the user interface plots a modulation transfer function representing x-ray backscatter for each rod of the plurality of rods from x-rays transmitted by the x-ray tube.2. The system of claim 1 , further comprising a storage in communication with the user interface claim 1 , wherein a reference modulation transfer function plot representing initial readings representing reference settings of the system are kept in the storage.3. The system of claim 2 , wherein the user interface includes a display claim 2 , and wherein a plot representing the modulation transfer function and the reference modulation transfer function plot are both shown upon the display.4. The system of claim 1 , wherein the user interface is configured to display a backscatter image based on the backscatter signal from the x-ray ...

Подробнее
Номер записи: 36
07-01-2021 дата публикации

INSPECTION TOOL AND INSPECTION METHOD

Номер: US20210003521A1
Автор: DILLEN Hermanus Adrianus, HUISMAN Thomas Jarik, OORSCHOT Dorothea Maria Christina, Wuister Sander Frederik
Принадлежит:

Apparatuses, systems, and methods for inspecting a semiconductor sample are disclosed. In some embodiments, the sample may comprise a structure having a plurality of openings in a top layer of the structure. In some embodiments, the method may comprise generating an image of the structure using a SEM; inspecting an opening of the plurality of openings by determining a dimension of the opening based on the image and determining an open-state of the opening, based on a contrast of the image; and determining a quality of the opening based on both the determined dimension and the determined open-state of the opening. 1. A method of inspecting a semiconductor sample , the sample comprising a structure having a plurality of openings in a top layer of the structure , the method comprising:generating an image of the structure using a SEM; determining a dimension of the opening or the plurality of openings based on the image; and', 'determining an open-state of the opening or the plurality of openings, based on a contrast of the image; and, 'inspecting an opening or the plurality of openings bydetermining a quality of the opening or the plurality of openings based on both the determined dimension and the determined open-state.2. The method according to claim 1 , wherein the contrast comprises a difference in intensity observed inside the opening and outside the opening claim 1 , on the image.3. The method according to claim 1 , wherein the dimension of the opening comprises a diameter of the opening and determining the diameter of the opening comprises applying an ellipse fitting algorithm to the image.4. The method according to claim 1 , wherein the dimension of the opening comprises a diameter of the opening and wherein the diameter of the opening is determined based on an intensity distribution along a line across the image claim 1 , the line crossing the opening on the image.5. The method according to claim 1 , wherein determining an open-state of the opening comprises ...

Подробнее
Номер записи: 37
03-01-2019 дата публикации

X-RAY INSPECTION APPARATUS AND CORRECTION METHOD FOR X-RAY INSPECTION APPARATUS

Номер: US20190003989A1
Автор: Hayashi Hisashi, KANAI Takashi, MIYAZAKI Itaru, Tanaka Akihiro
Принадлежит:

To correctly acquire image data of an inspected article by preventing a difference in shade between images caused by a difference in position or sensitivity between sensor elements. An X-ray generation source irradiates an inspection region where an inspected article passes with an X-ray. X-ray detection means receives the X-ray passing through the inspection region using a plurality of sensor elements. Image data generation means generates image data of the inspected article from an output of the X-ray detection means. Incidence condition changing means changes two or more kinds of X-ray incidence conditions common for all of the sensor elements of the X-ray detection means in a state of absence of the inspected article in the inspection region. Correction data generation means acquires correction data that is needed for making a shade of an image uniform for each incidence condition. 1. An X-ray inspection apparatus comprising:transport means for transporting an inspected article to pass through a predetermined inspection region;an X-ray generation source that irradiates the inspection region with an X-ray;X-ray detection means for receiving the X-ray passing through the inspection region using a plurality of sensor elements that are arranged in a direction intersecting with a transport direction of the inspected article;image data generation means for generating image data of the inspected article from an output of the X-ray detection means;incidence condition changing means for changing two or more kinds of X-ray incidence conditions common for all of the sensor elements of the X-ray detection means in a state of absence of the inspected article in the inspection region;correction data generation means for acquiring correction data that is needed for making a shade of an image of the image data acquired by the image data generation means uniform for each incidence condition changed by the incidence condition changing means;correction means for correcting the ...

Подробнее
Номер записи: 38
03-01-2019 дата публикации

COMPUTING DEVICE, COMPUTING PROGRAM, X-RAY MEASURING SYSTEM AND X-RAY MEASURING METHOD

Номер: US20190003991A1
Автор: Mukaide Taihei
Принадлежит:

A computing device configured to obtain information about a subject using a detection result detected by an X-ray detector which detects an X-ray passing through the subject, which device includes: a unit configured to obtain a detection result of the X-ray detector; a first obtaining unit configured to obtain a complex refractive index of the X-ray after passing through the subject using the detection result; and a second obtaining unit configured to obtain information about the subject in accordance with a correlation between the complex refractive index and a mass absorption coefficient. 1. A computing device configured to obtain information about a subject using a detection result detected by an X-ray detector which detects an X-ray transmitted through the subject irradiated with an X-ray in a certain wavelength , the device comprising:a unit configured to obtain detection results detected by the X-ray detector;a first obtaining unit configured to obtain information about a complex refractive index n of the subject for the X-ray; anda second obtaining unit configured to obtain information about a mass absorption coefficient (μ/ρ) of the subject in accordance with a correlation between a parametric ratio (β/δ) according to the complex refractive index n and the mass absorption coefficient (μ/ρ),where μ denotes a linear absorption coefficient of a subject for an X-ray in a certain wavelength, ρ denotes mass density, n denotes a complex refractive index of a subject for an X-ray in a certain wavelength, and 1-δ and -β respectively denote a real part and an imaginary part in the complex refractive index n.3. The computing device according to claim 1 , wherein the information about the subject is at least any one of mass density claim 1 , an average atomic number claim 1 , and an average mass number of the subject.4. The computing device according to claim 1 , wherein the second obtaining unit obtains the mass absorption coefficient on the basis of the complex ...

Подробнее
Номер записи: 39
05-01-2017 дата публикации

NON-INTRUSIVE MEASUREMENT OF THE VOLUME DENSITY OF A PHASE IN A PART

Номер: US20170004613A1
Автор: MORARD Vincent, PARRA Estelle, TOURAIS David
Принадлежит:

Method and system for non-intrusive measurement of volume density of a specific phase in a part, comprising: processor producing a volume image of the part, the image being formed by a three-dimensional grid of voxels, the values of which indicate the disposition of the specific phase in the part, processor associating a binary coefficient with each voxel of the volume image, thus constructing an initial three-dimensional matrix representation of binary coefficients representing a presence or absence of the specific phase in zones of the part corresponding to the voxels, processor convoluting the initial matrix representation with a convolution matrix kernel corresponding to a predetermined reference volume, the convolution performed by effecting a composition of three (successive) monodimensional convolutions in three independent directions, thus forming a resultant matrix representation, each resultant coefficient of which represents a volume ratio (the density) of the specific phase in the reference volume. 110-. (canceled)11. Method for the non-intrusive measurement of the volume density of a specific phase in a part , characterised in that it comprises the following steps:producing a volume (tomographic) image of said part, said image being formed by a three-dimensional grid of voxels, the values of which indicate the disposition of said specific phase in (corresponding zones of) said part,associating a binary coefficient with each voxel of said volume (tomographic) image, thus constructing an initial three-dimensional matrix representation of binary coefficients, said binary coefficients representing a presence or absence of said specific phase in zones of said part corresponding to the voxels,convoluting said initial matrix representation with a convolution matrix kernel corresponding to a predetermined reference volume, said convolution being performed by effecting a composition of three (successive) monodimensional convolutions in three independent ...

Подробнее
Номер записи: 40
02-01-2020 дата публикации

Characterization of regions with different crystallinity in materials

Номер: US20200006034A1
Автор: Andreas Schulze, Wilfried Vandervorst
Принадлежит: Interuniversitair Microelektronica Centrum vzw IMEC

A method of characterizing a region in a sample under study, and related systems, is disclosed. In once aspect, the sample under study comprises a first region having first crystalline properties and a second region having second crystalline properties. The method comprises irradiating the sample under study with an electron beam, the average relative angle between the electron beam and the sample under study being selected so that a contribution in the backscattered or forward scattered signal of the first region is distinguishable from that of the second region. The method further comprises detecting the backscattered or forward scattered electrons, and deriving a characteristic of the first and/or the second region from the detected backscattered or forward scattered electrons. The instantaneous relative angle between the electron beam and the sample under study is modulated with a predetermined modulation frequency during the irradiating the sample under study with an electron beam. Detecting the backscattered or forward scattered electrons is performed at the predetermined modulation frequency.

Подробнее
Номер записи: 41
11-01-2018 дата публикации

INTEGRATED MICROTOMOGRAPHY AND OPTICAL IMAGING SYSTEMS

Номер: US20180008218A1
Автор: Nilson David G., Rice Bradley W., Stearns Daniel G.
Принадлежит:

An integrated microtomography and optical imaging system includes a rotating table that supports an imaging object, an optical stage, and separate optical and microtomography imaging systems. The table rotates the imaging object about a vertical axis running therethrough to a plurality of different rotational positions during a combined microtomography and optical imaging process. The optical stage can be a trans-illumination, epi-illumination or bioluminescent stage. The optical imaging system includes a camera positioned vertically above the imaging object. The microtomography system includes an x-ray source positioned horizontally with respect to the imaging object. Optical and x-ray images are both obtained while the imaging object remains in place on the rotating table. The stage and table are included within an imaging chamber, and all components are included within a portable cabinet. Multiple imaging objects can be imaged simultaneously, and side mirrors can provide side views of the object to the overhead camera. 1. An integrated microtomography and optical imaging system , comprising:an imaging chamber adapted to contain a separate imaging object therewithin;a rotating table located within the imaging chamber and adapted to support the separate imaging object thereupon, wherein the rotating table is further adapted to rotate the imaging object about a vertical axis running therethrough to a plurality of different rotational positions during a combined microtomography and optical imaging process;an optical imaging system located within or about the imaging chamber, said optical imaging system including a camera positioned substantially vertically above the imaging object and adapted to obtain optical images of the imaging object with respect to the vertical axis while the imaging object is on the rotating table; anda microtomography imaging system located within or about the imaging chamber and configured to obtain x-ray images of the imaging object while ...

Подробнее
Номер записи: 42
08-01-2015 дата публикации

Method and system for identifying a liquid product in luggage or other receptacle

Номер: US20150010128A1
Автор: Dan Gudmundson, Luc Perron, Regis POULIN, Stephane Drouin
Принадлежит: Optosecurity Inc

A method, an apparatus and a system are provided for determining if a piece of luggage contains a liquid product comprised of a container holding a body of liquid. The piece of luggage is scanned with an X-ray scanner to generate X-ray image data conveying an image of the piece of luggage and contents thereof. The X-ray image data is processed with a computer to detect a liquid product signature in the X-ray image data and determine if a liquid product is present in the piece of luggage. A detection signal is released at an output of the computer conveying whether a liquid product was identified in the piece of luggage. The detection signal may, for example, be used in rendering a visual representation of the piece of luggage on a display device to convey information to an operator as to the presence of a liquid product in the piece of luggage.

Подробнее
Номер записи: 43
27-01-2022 дата публикации

Sample Analysis Apparatus and Method

Номер: US20220026377A1
Автор: Murano Takanori, Yamamoto Yasuaki
Принадлежит:

Characteristic X-rays (soft X-rays) from a sample are detected using a spectroscope to thereby generate a plurality of intensity spectrums arranged in order of time sequence. A contour map creation unit creates a contour map by converting, in accordance with a color conversion condition, the plurality of intensity spectrums into a plurality of one-dimensional maps, and arranging the plurality of one-dimensional maps in order of time sequence. When displaying the contour map, a waveform array and a difference contour map may also be displayed. Based on the contour map, a timepoint at which a state change occurs in the sample is determined. 1. A sample analysis apparatus , comprising:a creation unit which creates a plurality of one-dimensional maps based on a plurality of spectrums generated in order of time sequence by detecting electromagnetic waves from a sample, and which further creates a contour map in two-dimensional map form by arranging the plurality of one-dimensional maps in order of time sequence; anda display device which displays the contour map.2. The sample analysis apparatus according to claim 1 , whereinthe creation unit converts, for each of the spectrums, respective intensities constituting the spectrum into colors in accordance with a color conversion condition, and thereby creates the one-dimensional maps, andthe contour map is a color map.3. The sample analysis apparatus according to claim 1 , whereinthe electromagnetic waves are characteristic X-rays, andduring a measurement process in which an electron beam is continuously irradiated on the sample, the plurality of spectrums are generated at uniform time intervals.4. The sample analysis apparatus according to claim 3 , whereinduring the measurement process, thermal energy, electric energy, or kinetic energy, which is energy other than the electron beam, is continuously applied to the sample.5. The sample analysis apparatus according to claim 1 , further comprisinga determination unit that ...

Подробнее
Номер записи: 44
11-01-2018 дата публикации

SCANNING METHOD AND APPARATUS

Номер: US20180011208A1
Автор: Bowdon Christopher, FEATONBY Paul David, Howstan James Stephen, Jackson Peter, James Kenneth, RONCHI Emanuele
Принадлежит:

The invention discloses a scanning method and apparatus suitable for scanning a pipeline or process vessel in which a beam of gamma radiation from a source is emitted through the vessel to be detected by an array of detectors which are each collimated to detect radiation over a narrow angle relative to the width of the emitted radiation beam. 1. A method of inspecting an underwater pipeline to determine wall thickness or information about the contents of the pipeline , the method comprising:interposing the pipeline between a gamma radiation source and an array of detector units, the source and the detector units being mounted in a fixed relationship with each other on a support so that the radiation emitted by the source passes along a plurality of paths through a portion of the pipeline and impinges upon the detector units;rotating the support, the source, and the detector units around a circumference of the pipeline and acquiring data at a plurality of radially offset positions around the pipeline to acquire density data at a variety of angles through the pipeline; andpresenting a representation of the pipeline or contents of the pipeline using the density data.2. The method according to claim 1 , wherein the support claim 1 , the source claim 1 , and the array of detector units are provided on an apparatus that comprises a buoyancy material.3. The method according to claim 2 , wherein the apparatus is hinged so that the apparatus is configured to be opened and closed around the pipeline.4. The method according to claim 1 , wherein the representation is a representation of the composition of the pipeline or its contents.5. The method according to claim 1 , wherein the representation is built using tomography algorithms.6. The method according to claim 1 , further comprising detecting a void in the pipeline.7. The method according to claim 1 , further comprising detecting a crack in the pipeline.8. The method according to claim 1 , further comprising detecting wall ...

Подробнее
Номер записи: 45
12-01-2017 дата публикации

Method for mapping crystal orientations in a sample made of a polycrystalline material

Номер: US20170011518A1
Автор: Cyril Langlois
Принадлежит: CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE CNRS, Institut National des Sciences Appliquees de Lyon , Universite Claude Bernard Lyon 1 UCBL

The invention relates to a method for mapping the crystal orientations of a polycrystalline material, the method comprising: receiving ( 21 ) a series of images of the polycrystalline material, which images are acquired by an acquiring device in respective irradiation geometries; estimating ( 22 ) at least one intensity profile for at least one point of the material from the series of images, each intensity profile representing the intensity associated with the point in question as a function of irradiation geometry; and determining ( 24 ) a crystal orientation for each point in question of the material by comparing ( 23 ) the intensity profile associated with said point in question to theoretical signatures of intensity profiles of known crystal orientations, which signatures are contained in a database.

Подробнее
Номер записи: 46
14-01-2021 дата публикации

Methods and Systems for Defects Detection and Classification Using X-rays

Номер: US20210010953A1
Автор: Adler David Lewis, Babian Freddie Erich
Принадлежит:

In one embodiment, an automated high-speed X-ray inspection system may identify reference objects for an object of interest to be inspected. Each reference object may have a same type and components as the object of interest. The system may generate a reference model for the object of interest based on X-ray images of the reference objects. The system may determine whether the object of interest is associated with one or more defects by comparing an X-ray image of the object of interest to the reference model. The defects may be characterized by one or more pre-determined defect models and may be classified into respective defect categories based on the pre-determined defect models. 1. A method comprising , by an automated high-speed X-ray inspection system:identifying one or more reference objects for an object of interest to be inspected, wherein each reference object has a same type and components as the object of interest;generating a reference model for the object of interest based on one or more X-ray images of the one or more reference objects; anddetermining whether the object of interest is associated with one or more defects by comparing a first X-ray image of the object of interest to the reference model, wherein the one or more defects are characterized by one or more pre-determined defect models, and wherein, when the object of interest is associated with the one or more defects, the one or more defects are classified into respective defect categories based on the one or more pre-determined defect models.2. The method of claim 1 , wherein the reference model and the one or more X-ray images are associated with a first background noise pattern claim 1 , and wherein the first X-ray image of the object of interest is associated with a second background noise pattern that is substantially similar to the first background noise pattern.3. The method of claim 1 , wherein the first X-ray image of the object of interest is captured from a first angle claim 1 , ...

Подробнее
Номер записи: 47
14-01-2021 дата публикации

Methods and Systems for Product Failure Prediction based on X-ray Image Re-examination

Номер: US20210010954A1
Автор: Adler David Lewis, Chrissan Douglas A., Jewler Scott Joseph
Принадлежит:

In one embodiment, an X-ray inspection system may access a first set of X-ray images of one or more first samples that are labeled as being non-conforming. The system may adjust a classification algorithm based on the first set of X-ray images. The classification algorithm may classify samples into conforming or non-conforming categories based on an analysis of corresponding X-ray images. The system may analyze a second set of X-ray images of a number of second samples using the adjusted classification algorithm. The second samples may be previously inspected samples that have been classified as conforming by the classification algorithm during a previous analysis before the classification algorithm is adjusted. The system may identify one or more of the second samples from the second set of X-ray images. Each identified second sample may be classified as non-conforming by the adjusted classification algorithm.

Подробнее
Номер записи: 48
14-01-2021 дата публикации

ELECTRON MICROSCOPY ANALYSIS METHOD

Номер: US20210010956A1
Автор: Bernier Nicolas, HENRY Loïc
Принадлежит:

The present disclosure concerns an electron microscopy method, including the emission of a precessing electron beam and the acquisition, at least partly simultaneous, of an electron diffraction pattern and of intensity values of X rays. 1. An electron microscopy method , comprising the emission of an electron beam having a precessional motion and the acquisition , at least partly simultaneous , of an electron diffraction pattern and of intensity values of X rays.2. The method according to claim 1 , wherein claim 1 , during said acquisition claim 1 , the electron beam has an axis running through a point of an object.3. The method according to claim 2 , comprising a step among:the determination that said point is located in an amorphous portion; andthe determination that said point is located in a crystalline portion.4. The method according to claim 2 , wherein said point corresponds to a pixel among pixels of an image.5. The method according to claim 3 , comprising claim 3 , for each of the pixels of at least one set of pixels of the image associated with an amorphous phase claim 3 , the determination of a chemical composition based on said intensity values.6. The method according to claim 3 , comprising claim 3 , for each of the pixels of at least one set of pixels of the image associated with a same crystalline phase claim 3 , the determination of a chemical composition based on said intensity values.7. The method according to claim 6 , comprising the determination of the structure of said same crystalline phase and/or of one or a plurality of parameters of said same crystalline phase and/or of a crystal orientation.8. The method according to claim 7 , comprising the determination of at least one deformation value based on the chemical composition and on said one or a plurality of parameters of said same crystalline phase.9. The method according to claim 5 , comprising claim 5 , for said set claim 5 , the determination of a statistic chemical composition value ...

Подробнее
Номер записи: 49
10-01-2019 дата публикации

METHOD FOR QUANTIFICATION OF PURITY OF SUB-VISIBLE PARTICLE SAMPLES

Номер: US20190011378A1
Автор: Kylberg Gustaf, Nilsson Josefina, Ryner Martin, Sintorn Ida-Maria
Принадлежит: Intelligent Virus Imaging Inc.

The method is for quantification of purity of sub-visible particle samples. A sample to be analyzed is place in an electron microscope to obtain an electron microscopy image of the sample. The sample contains objects. The objects that have sizes being different from a size range of primary particles and sizes being within the size range of primary particles are enhanced. The objects are detected as being primary particles or debris. The detected primary particles are excluded from the objects so that the objects contain debris but no primary particles. A first total area (T1) of the detected debris is measured. A second total area (T2) of the detected primary particles is measured. 1. A method for quantification of purity of sub-visible particle samples , comprising:placing a sample to be analyzed in an electron microscope to obtain an electron microscopy image of the sample, the sample containing objects;enhancing the objects in the image having sizes being different from a size range of primary particles and sizes being within the size range of primary particles;detecting the objects in the image as being primary particles or debris;excluding the detected primary particles from the objects so that objects contains debris but no primary particles;measuring a first total area (T1) of the detected debris;measuring a second total area (T2) of the detected primary particles; andcalculating a ratio of the first total area (T1) to the second total area (T2) to determine a quantitative measurement of purity of the sample.2. The method according to wherein the method further comprises enhancing edges of objects in the image that have a size that is substantially similar to a size range of primary particles and analyzing a roundness of the objects to identify primary particles.3. The method according to wherein the method further comprises enhancing edges of objects in the image that have a size that is substantially similar to a size range of primary particles and ...

Подробнее
Номер записи: 50
14-01-2021 дата публикации

METHOD AND SYSTEM FOR STRESS TESTING OF MATERIALS

Номер: US20210010958A1
Автор: ANTICI Patrizio, BARBERIO Marianna
Принадлежит:

A system and method for stress testing a sample, the system comprising a high-intensity laser unit and a target for laser-matter interaction, wherein the high-intensity laser unit delivers an intensity of at least 10W/cmon the target, and resulting laser-accelerated particles generated by the target irradiate the sample. 1. A system for stress testing a sample , comprising a high-intensity laser unit and a target for laser-matter interaction , wherein the high-intensity laser unit delivers an intensity of at least 10W/cmon said target , and resulting laser-accelerated particles generated by said target irradiate the sample.2. The system of claim 1 , wherein the intensity delivered on the target is at least 10W/cm.3. The system of claim 1 , wherein the target is a solid target of a thickness comprised in a range between 1 nm and 200 μm.4. The system of claim 1 , wherein the target is a gas of a thickness comprised in a range between 10 nm and 10 mm.5. The system of claim 1 , wherein the target is a plasma of a thickness comprised in a range between 0.1 μm and 100 μm.6. The system of claim 1 , wherein the laser-accelerated particles generated by said target comprise at least one of: protons claim 1 , electrons claim 1 , neutrons claim 1 , X-rays and gamma-rays.7. The system of claim 1 , wherein the sample is positioned at a distance comprised in a range between 0.01 mm and 10 m from the target.8. The system of claim 1 , further comprising a beam steering unit claim 1 , said unit transporting said laser-accelerated particles to said sample.9. Use of laser-accelerated particles for testing a sample claim 1 , comprising delivering an intensity of at least 10W/cmon a target claim 1 , thereby generating laser-accelerated particles claim 1 , and irradiating the sample with the laser-accelerated particles.10. Use of claim 10 , wherein the intensity delivered on the target is at least 10W/cm.11. Use of claim 10 , wherein claim 10 , wherein the target is a solid target of a ...

Подробнее
Номер записи: 51
09-01-2020 дата публикации

DIMENSION MEASUREMENT METHOD USING PROJECTION IMAGE OBTAINED BY X-RAY CT APPARATUS

Номер: US20200011662A1
Автор: Goto Tomonori, ITO Tasuku, KON Masato, Ohtake Yutaka
Принадлежит:

In measuring a dimension of an object to be measured W made of a single material, a plurality of transmission images of the object to be measured W are obtained by using an X-ray CT apparatus, and then respective projection images are generated. The projection images are registered with CAD data used in designing the object to be measured W. The dimension of the object to be measured W is calculated by using a relationship between the registered CAD data and projection images. In such a manner, high-precision dimension measurement is achieved by using several tens of projection images and design information without performing CT reconstruction. 1. A dimension measurement method using a projection image obtained by an X-ray CT apparatus , the dimension measurement method comprising , in measuring a dimension of an object to be measured made of a single material:obtaining a plurality of transmission images of the object to be measured by using the X-ray CT apparatus, and then generating respective projection images;registering the projection images with CAD data used in designing the object to be measured; andcalculating the dimension of the object to be measured by using a relationship between the registered CAD data and the projection images.2. The dimension measurement method according to claim 1 , further comprising:selecting a representative projection image group for the registered CAD data;obtaining combinations of all projection values in the representative projection image group with transmission lengths estimated from the CAD data; andcalculating the dimension of the object to be measured by using a relationship between the obtained projection values and the estimated transmission lengths.3. The dimension measurement method according to claim 1 , further comprising:determining an attenuation coefficient of X-rays by using the registered CAD data so that a difference between a calculated thickness at a measurement point having a known thickness and a design ...

Подробнее
Номер записи: 52
14-01-2021 дата публикации

APPARATUS AND METHOD USING DEEP LEARNING (DL) TO IMPROVE ANALYTICAL TOMOGRAPHIC IMAGE RECONSTRUCTION

Номер: US20210012541A1
Автор: LEE Tzu-Cheng, YU Zhou, Zhou Jian
Принадлежит: Canon Medical Systems Corporation

A method and apparatus is provided to improve the image quality of images generated by analytical reconstruction of a computed tomography (CT) image. This improved image quality results from a deep learning (DL) network that is used to filter a sinogram before back projection but after the sinogram has been filtered using a ramp filter or other reconstruction kernel. 1. An apparatus , comprising: obtain a radiation sinogram representing respective projection images at corresponding view angles, each of the projection images representing an intensity of radiation detected by a plurality of detectors,', 'acquire a first neural network network,', 'filter, using a reconstruction kernel, the radiation sinogram to thereby generate reconstruction-kernel filtered data,', 'apply the reconstruction-kernel filtered data to the first neural network to thereby output a filtered sinogram from the first neural network, and', 'perform analytic reconstruction on the filtered sinogram to generate a computed tomography (CT) image., 'circuitry configured to'}2. The apparatus according to claim 1 , wherein the circuitry is further configured toacquire a second neural network, andapply the radiation sinogram to the second neural network to thereby output the radiation sinogram that has been filtered using the second neural network, whereinthe radiation sinogram that is filtered using the reconstruction kernel is the radiation sinogram that has been filtered using the second neural network.3. The apparatus according to claim 1 , wherein the circuitry is further configured to perform analytic reconstruction on the filtered sinogram by back-projecting the filtered sinogram to reconstruct the CT image.4. The apparatus according to claim 1 , wherein the circuitry is further configured to filter the radiation sinogram using the reconstruction kernel claim 1 , wherein the reconstruction kernel is a ramp filter.5. The apparatus according to claim 2 , wherein the circuitry is further configured ...

Подробнее
Номер записи: 53
14-01-2021 дата публикации

ELECTRON MICROSCOPE APPARATUS, INSPECTION SYSTEM USING ELECTRON MICROSCOPE APPARATUS, AND INSPECTION METHOD USING ELECTRON MICROSCOPE APPARATUS

Номер: US20210012998A1
Автор: Hamaguchi Akira, Ida Chihiro, IIDA Yusuke, Nishihata Takahiro, Osaki Mayuka, Yamamoto Takuma
Принадлежит:

An electron microscope apparatus includes a detection unit that detects reflected electrons reflected from a sample when the sample is irradiated with primary electrons emitted by a primary electron generation unit (electron gun), an image generation unit that generates an image of a surface of the sample with the reflected electrons based on output from the detection unit, and a processing unit that generates a differential waveform signal of the image generated by the image generation unit, processes the image by using information of the differential waveform signal, and measures a dimension of a pattern formed on the sample. 111.-. (canceled)12. An electron microscope apparatus comprising:a detection unit that detects reflected electrons reflected from a sample when the sample is irradiated with primary electrons emitted by a primary electron generation unit;an image generation unit that generates an image of a surface of the sample with the reflected electrons based on output from the detection unit; anda processing unit that generates a differential waveform signal of the image generated by the image generation unit, processes the image using information of the differential waveform signal, and measures a dimension of a pattern formed on the sample, whereinthe processing unit processes the image using information of a position at which the differential waveform signal is maximum, a position at which the differential waveform signal is minimum, and a position at which an absolute value of the differential waveform signal is minimum.13. The electron microscope apparatus according to claim 12 , whereinthe detection unit includes a scintillator, an optical fiber connected to the scintillator, and a photomultiplier tube connected to the optical fiber, and detects the reflected electrons having an energy of 50 eV or more.14. The electron microscope apparatus according to claim 12 , whereinthe processing unit obtains position information of an edge of the pattern ...

Подробнее
Номер записи: 54
19-01-2017 дата публикации

FRACABILITY MEASUREMENT METHOD AND SYSTEM

Номер: US20170016873A1
Автор: LY Chi Vihn, Spence Graham
Принадлежит: CGG SERVICES SA

A method for estimating a fracability index for a geological location includes determining a fabric metric and a mineralogical composition metric for a geological sample extracted from a geological location and estimating a fracability index for the geological location from the fabric metric and the mineralogical composition metric. The fabric metric may be a grain related measurement such as grain size or angularity, or a pore-space related measurement such as pore area, diameter, aspect ratio, and circumference, or statistics associated with such measurements. In certain embodiments, determining the mineralogical composition metric includes detecting a prevalence of at least one organic proxy within the geological sample such as vanadium, iron, uranium, thorium, copper, sulfur, zinc, chromium, nickel, cobalt, lead and molybdenum. Determining the mineralogical composition metric may also include detecting a prevalence of one, two, or all of siliciclastics, carbonate and clay. 1. A method for estimating a fracability index for a geological location , the method comprising:determining a fabric metric for a geological sample extracted from a geological location;determining a mineralogical composition metric for the geological sample; andestimating a fracability index for the geological location from the fabric metric and the mineralogical composition metric.2. The method of claim 1 , wherein the fabric metric comprises a pore-space metric.3. The method of claim 1 , wherein the fabric metric comprises a grain metric.4. The method of claim 1 , wherein determining the mineralogical composition metric for the geological sample comprises detecting a prevalence of at least one organic proxy within the geological sample.5. The method of claim 1 , wherein determining the mineralogical composition metric for the geological sample comprises detecting a prevalence of siliciclastics claim 1 , carbonate claim 1 , and clay.6. The method of claim 1 , wherein the fracability index ...

Подробнее
Номер записи: 55
19-01-2017 дата публикации

Vehicle inspection methods and systems

Номер: US20170017667A1
Автор: Jianping Gu, LI ZHANG, QIANG LI, Yaohong Liu, ZHENG Hu, Zhiqiang Chen, Ziran Zhao
Принадлежит: Nuctech Co Ltd, TSINGHUA UNIVERSITY

A vehicle inspection method and system are disclosed. In one aspect, the method includes acquiring a transmission image of an inspected vehicle. The method further includes acquiring a transmission image template of a vehicle model corresponding to the model of the inspected vehicle from a database. The method further includes performing registration on the transmission image of the inspected vehicle and the transmission image template. The method further includes determining a difference between a transmission image after the registration and a transmission image template after the registration, to obtain a difference area of the transmission image of the vehicle relative to the transmission image template. The method further includes processing the difference area to determine whether the vehicle carries a suspicious object or not. In some embodiments, this solution can avoid the problems of a detection loophole and a poor effect of manually determining an image in a conventional manner, and is important to assist the security inspection for small vehicles.

Подробнее
Номер записи: 56
17-01-2019 дата публикации

LAMELLA-SHAPED TARGETS FOR X-RAY GENERATION

Номер: US20190017942A1
Автор: FILEVICH Jorge
Принадлежит: FEI COMPANY

A method and system are disclosed for producing an x-ray image of a sample using a lamella-shaped target to improve the usual tradeoff between imaging resolution and image acquisition time. A beam of electrons impacts the lamella-shaped target normal to the narrower dimension of the lamella which then determines the virtual source size along that axis. For low-energy x-ray generation, the small electron penetration depth parallel to the wider dimension of the lamella determines the virtual source size along that axis. Conductive cooling of the target is improved over post targets with the same imaging resolution. The lamella-shaped target is long enough to ensure that the electron beam does not impact the support structure which would degrade the imaging resolution. Target materials may be selected from the same metals used for bulk or post targets, including tungsten, molybdenum, titanium, scandium, vanadium, silver, or a refractory metal. 1. A method for producing an x-ray image of a sample , the method comprising:directing a beam of electrons having landing energies of less than 2,000 eV along a first axis onto a first surface of a lamella-shaped target, the impact of the electrons in the beam onto the lamella-shaped target generating x-rays from within an interaction volume within the lamella-shaped target, wherein a portion of the x-rays are emitted towards an x-ray detector;positioning a sample along a second axis between the lamella-shaped target and the x-ray detector; andacquiring an x-ray image by collecting the x-rays which are not absorbed by the sample using the x-ray detector, the lamella-shaped target has a height in a direction along the first axis, a length in a direction along the second axis, and a width along a third axis that is different from the first and second axes;', 'the height and the length are at least twice the width; and', 'the electron beam interaction volume extends along the first axis from the first surface a distance of less than ...

Подробнее
Номер записи: 57
17-01-2019 дата публикации

X-RAY DETECTION SYSTEM, X-RAY DEVICE, AND DEVICE AND METHOD FOR PROCESSING X-RAY DETECTION DATA

Номер: US20190017943A1
Автор: OKADA Masahiro, YAMAKAWA Tsutomu, Yamamoto Shuichiro, Yamasaki Masashi
Принадлежит:

Circuitry for converting frame data outputted from an obliquely arranged detector, to frame data in a coordinate system for reconstruction is avoided from becoming larger in size and an processing amount is reduced. An X-ray apparatus is provided with a two-dimensional pixel array, the two-dimensional pixel array having a plurality of rectangular pixels, having a predetermined size and outputting an electrical signal in response to an incident X-ray photon. The pixels of the array are arranged in the row and column directions in a first Cartesian coordinate system. The row direction is set obliquely to a scan direction. In this array, when viewing from any one of sides in the scan direction, a pixel group is provided solely or repeatedly, the pixel group being composed of “M columns×N pieces” pixels (M is a positive integer equal to or larger than 1, N is a positive integer equal to or larger than 2, and M and N have a relationship of prime numbers), the group of pixels providing a quadrangle whose diagonal line is parallel with the scan direction. The frame data, outputted at the constant period from the respective pixels, are converted to frame data in a second Cartesian coordinate system configured in a memory space, the second Cartesian coordinate system having a row direction which is set to accord with the scan direction and a column direction orthogonal to the row direction. 1. An X-ray apparatus characterized in that the apparatus comprises:a detector provided with a two-dimensional pixel array, the two-dimensional pixel array having a plurality of pixels each being shaped into a rectangular, having a predetermined size and outputting an electrical signal in response to an incident X-ray photon, the plurality of pixels being allocated in mutually-orthogonal row and column directions both configuring a first Cartesian coordinate system, the row direction being oblique to a scan direction with a predetermined angle; anda processor that processes as a two- ...

Подробнее
Номер записи: 58
18-01-2018 дата публикации

AUGMENTED AUTOMATIC DEFECT CLASSIFICATION

Номер: US20180018542A1
Автор: Ma Weimin, Wu Xiaomei, Zhang Zhaoli
Принадлежит:

A method for managing defects for an augmented automatic defect classification (ADC) process is disclosed. The method includes receiving a defect record based on an inspection of a target specimen; extracting, from a design database, relevant design data associated with a patch surrounding a location of a defect from the defect record; performing, by a processor, lithographic simulation on the relevant design data associated with the patch to determine a context patch; comparing, by the processor, the context patch with an image of the defect from the defect record to determine whether there exists a match between the context patch and the image of the defect; and defining the defect as a systematic defect based on a determination that there exists a match between the context patch and the image of the defect. 1. A method for managing defects for an augmented automatic defect classification (ADC) process , comprising:receiving a defect record based on an inspection of a target specimen;extracting, from a design database, relevant design data associated with a patch surrounding a location of a defect from the defect record;performing, by a processor, lithographic simulation on the relevant design data associated with the patch to determine a context patch;comparing, by the processor, the context patch with an image of the defect from the defect record to determine whether there exists a match between the context patch and the image of the defect; anddefining the defect as a systematic defect based on a determination that there exists a match between the context patch and the image of the defect.2. The method of claim 1 , further comprising:defining the defect as a non-systematic defect based on a determination that there does not exist a match between the context patch and the image of the defect.3. The method of claim 1 , further comprising sorting the defect into a defect group selected from a plurality of defect groups based on similarity of the image of the ...

Подробнее
Номер записи: 59
22-01-2015 дата публикации

Solid scintillator, radiation detector, and radiation examination device

Номер: US20150021485A1
Автор: Makoto Hayashi, Takao Sawa, Yukihiro Fukuta
Принадлежит: Toshiba Corp, Toshiba Materials Co Ltd

A solid scintillator in an embodiment includes a polycrystal body of an oxide having a garnet structure. In the solid scintillator, a linear transmittance at a wavelength of 680 nm is 10% or more. The oxide constituting the solid scintillator has a composition represented by, for Example, General formula: (Gd 1−α−β−γ Tb α Lu β Ce γ ) 3 (Al 1−x Ga x ) a O b , wherein 0<α≦0.55, 0<β≦0.55, 0.0001≦γ≦0.1, α+β+γ<1, 0<x<1, 4.8≦a≦5.2, 11.6≦b≦12.4.

Подробнее
Номер записи: 60
17-04-2014 дата публикации

Apparatus and method for spectrum estimation

Номер: US20140105364A1
Автор: Dong Goo Kang, Hyun Hwa Oh, Jae Hyun Kwon, Seok Min Han, Sung Hoon KANG, Sung Su Kim, Young Hun Sung
Принадлежит: SAMSUNG ELECTRONICS CO LTD

Provided is an apparatus for spectrum estimation. The apparatus includes a threshold setter which sets at least one threshold in order to separate a spectrum into at least one energy bin; a reference value setter which sets one of the at least one threshold as a reference threshold; a threshold adjuster which adjusts the at least one threshold based on a predetermined condition; a comparer which compares the reference threshold with the adjusted threshold; and an output unit which outputs a spectrum in which the adjusted threshold is set, when a value which is determined based on the comparison result corresponds to a predetermined maximum value.

Подробнее
Номер записи: 61
21-01-2021 дата публикации

COMPUTER IMPLEMENTED METHODS FOR TRAINING OR USING A SOFTWARE INFRASTRUCTURE BASED ON MACHINE LEARNING TECHNIQUES

Номер: US20210019873A1
Автор: Giudiceandrea Federico, URSELLA ENRICO, VICARIO ENRICO
Принадлежит:

Computer implemented method for training a software infrastructure based on machine learning techniques and intended for analysis of data obtained from a three-dimensional tomographic inspection of objects of a predetermined type, such as logs, with the aim of determining information about internal characteristics of interest of the self-same objects, wherein, once a training set comprising a plurality of objects of the same predetermined type has been selected, for each object the software infrastructure is supplied with training input data and corresponding training output data, which are processed by the software infrastructure for setting internal processing parameters of the software infrastructure which correlate the training input data with the training output data; where the training input data comprise data obtained from a three-dimensional tomographic inspection of the object, and the training output data comprise information about internal characteristics of interest assessed at internal points of the object, and where the information about the internal characteristics of interest is at least partly assessed at real internal points of the object, previously made accessible by cutting or breaking the object. 2. The computer implemented method according to claim 1 , wherein claim 1 , for each piece of the object claim 1 , the labelling step comprises first a step of identifying the object from which the piece was obtained.3. The computer implemented method according to claim 2 , wherein the step of identifying the object from which the piece was obtained comprises either a recognition of the piece or a tracking of the objects and of the pieces inside the processing plant.4. The computer implemented method according to claim 2 , wherein claim 2 , for each piece of the object claim 2 , the labelling step also comprises a step of identifying the position of the piece inside the object from which it was obtained.5. The computer implemented method according to ...

Подробнее
Номер записи: 62
26-01-2017 дата публикации

INSPECTION METHOD AND DEVICE

Номер: US20170023494A1
Автор: CHEN Chun-Ti, CHOU Hao-Kai, LEE Meng-Kun, YEN Chia-Ho, YU Liang-Pin
Принадлежит:

An inspection method is provided herein. The inspection method is adapted for an inspection device. The inspection method includes: optically scanning an examining target for generating a scanned image; reconstructing the scanned image for a reconstructed volume; adjusting a slicing direction associated with the examining target for slicing the reconstructed volume into a sliced image; inspecting the sliced image for analyzing one or more features of the examining target; and outputting an inspection result of the examining target. 1. An inspection method , comprising:optically scanning an examining target for generating a scanned image;reconstructing the scanned image for a reconstructed volume;adjusting a slicing direction associated with the examining target for slicing the reconstructed volume into a sliced image, wherein the slicing direction comprises a non-horizontal slicing direction;inspecting the sliced image for analyzing one or more features of the examining target; andoutputting an inspection result of the examining target.2. The inspection method of claim 1 , wherein the step of inspecting the sliced image and outputting the inspection result of the examining target comprises:inspecting a symmetry of the sliced image; andoutputting an abnormal result when the symmetry of the sliced image is under a predetermined threshold value.3. The inspection method of claim 1 , wherein the step of inspecting the sliced image for analyzing the one or more features of the examining target comprises:inspecting the sliced image for detecting whether the examining target is abnormal in real time during the examining target on a drive mechanism, wherein the drive mechanism is configured to transfer the examining target.4. The inspection method of claim 1 , wherein the features of the examining target comprise gradient claim 1 , thickness claim 1 , curvature claim 1 , shape claim 1 , or geometric characteristic.5. The inspection method of claim 1 , wherein the non- ...

Подробнее
Номер записи: 63
26-01-2017 дата публикации

REAL-TIME ANALYSIS AND CONTROL OF ELECTRON BEAM MANUFACTURING PROCESS THROUGH X-RAY COMPUTED TOMOGRAPHY

Номер: US20170023499A1
Автор: Mitchell Steven Wylie
Принадлежит:

Electron beam manufacturing processes, and systems that perform the processes, are described that utilize real-time analysis and control of the electron beam manufacturing processes by detecting secondary x-rays that are generated as a result of the electron beam contacting a workpiece. The detected secondary x-rays are used to generate, in real-time, a three-dimensional cross-sectional image of the portion or region of the workpiece surrounding the location contacted by the electron beam. In addition, real-time analysis of the three-dimensional cross-sectional image can be used to detect defects and real-time re-work or correction of defects can be performed by directing an electron beam back to an area with a defect. 1. A process comprising:detecting secondary x-rays resulting from an electron beam contacting a portion of a workpiece with sufficient energy to generate the secondary x-rays;in real-time, using the detected secondary x-rays to generate a three-dimensional cross-sectional image of the workpiece adjacent to the portion thereof contacted by the electron beam;in real-time, analyzing the generated three-dimensional cross-sectional image to detect a defect in the workpiece; andthereafter using a correction electron beam to correct a detected defect in the workpiece without conducting a separate inspection of the workpiece.2. The process of claim 1 , wherein the workpiece is a joint between two structures being welded together claim 1 , and the electron beam is used to weld the two structures to each other.3. The process of claim 1 , wherein the workpiece is a structure that is being built up by adding material to the structure in an additive manufacturing process claim 1 , and the electron beam is used in the additive manufacturing process.4. The process of claim 1 , comprising using the electron beam to modify the portion of the workpiece in a welding process or in an additive manufacturing process.5. The process of claim 1 , comprising generating the ...

Подробнее
Номер записи: 64
25-01-2018 дата публикации

IMAGE RECONSTRUCTION METHOD FOR X-RAY MEASURING DEVICE, STRUCTURE MANUFACTURING METHOD, IMAGE RECONSTRUCTION PROGRAM FOR X-RAY MEASURING DEVICE, AND X-RAY MEASURING DEVICE

Номер: US20180024079A1
Автор: Yamada Atsushi
Принадлежит: NIKON CORPORATION

An image reconstruction method, includes: generating differential data indicating a difference between detection data generated by detecting X-ray that passed through a measurement object by irradiating X-rays to the measurement object and estimate data generated by estimating X-rays that are assumed to have been passed through an estimated structure having been generated by estimating a shape of the measurement object; and generating an image using the differential data and the estimated structure. 119-. (canceled)20. An image reconstruction method for an X-ray measuring device , comprising:generating differential data indicating a difference between detection data generated by detecting X-rays that passed through a measurement object by irradiating X-rays to the measurement object and estimate data generated by estimating X-rays that are assumed to have been passed through an estimated structure having been generated by estimating a shape of the measurement object; and generating an image using the differential data and the estimated structure.21. The image reconstruction method for an X-ray measuring device according to claim 20 , whereingenerating multiple sets of the detection data by detecting the X-ray that passed through the measurement object by irradiating the X-rays to the measurement object in each of multiple different irradiation directions;generating multiple sets of estimated data by estimating the X-rays that are assumed to have been passed through the estimated structure in each of the multiple different irradiation directions of the X-rays;an image is generated by performing a back projection image that has been generated by performing back projection of the multiple sets of extracted differential data; those have been generated in each of the multiple different irradiation directions of the X-rays, with the estimated structure.22. The image reconstruction method for an X-ray measuring device according to claim 21 , whereinan image of an inside ...

Подробнее
Номер записи: 65
25-01-2018 дата публикации

METHOD FOR OPERATING AN X-RAY DEVICE AND ASSOCIATED X-RAY DEVICE

Номер: US20180024080A1
Автор: GRAF Alexander, Hartmann Stefan
Принадлежит: Siemens Healthcare GmbH

A method is disclosed for operating an x-ray device, in particular a computed tomograph, including a controller and a number of detector units coupled thereto for signaling purposes. Each of the detectors includes a functional unit and a number of detector elements coupled thereto. In an embodiment of the method, a synchronized clock signal for activating the detector elements is created from a control signal of the controller on the functional unit side. 1. A method for an x-ray device including a controller and a number of detector units coupled to the controller for signaling purposes , each of the detector units including a respective functional unit and a number of detector elements coupled to the respective functional unit , the method comprising:creating a synchronized clock signal, for activating the detector elements, from a control signal of the controller on a functional unit side of the controller.2. The method of claim 1 , wherein the synchronized clock signal is created by the plurality of the functional units claim 1 , through clock recovery claim 1 , from the control signal.3. The method of claim 1 , wherein signals are routed claim 1 , between the controller and a respective functional unit claim 1 , bidirectionally.4. The method of claim 3 , wherein the signals are transmitted by way of a multiplexing method claim 3 , between the functional units and the controller.5. An x-ray device claim 3 , comprising:a controller; anda number of detector units coupled to the controller for signaling purposes, each of the number of detector units including a respective functional unit and a number of detector elements coupled to the respective functional unit, wherein each of the respective functional units including a control unit to create a synchronized clock signal for activating the respective detector elements from a control signal of the controller.6. The x-ray device of claim 5 , wherein the controller is coupled via a serial signal line to each of the ...

Подробнее
Номер записи: 66
10-02-2022 дата публикации

METHODS FOR GROWING CRYSTALS ON QCM SENSORS

Номер: US20220042164A1
Автор: Abdel-Fattah Amr I., Gizzatov Ayrat, Kawelah Mohammed R., Poitzsch Martin E., Wang Wei
Принадлежит: Saudi Arabian Oil Company

According to one or more embodiments, a method of growing crystals on a QCM sensor may include treating a crystal growth surface of the QCM sensor with a coupling agent, applying a cation stream to the crystal growth surface of the QCM sensor, and applying an anion stream to the crystal growth surface of the QCM sensor. The crystals forming a crystal layer may have an average thickness greater than 5 nanometers. According to one or more embodiments, a QCM sensor may include a crystal layer on a crystal growth surface of the QCM sensor, where the crystal layer is formed by a process including treating the crystal growth surface of the QCM sensor with a coupling agent, applying a cation stream to the crystal growth surface of the QCM sensor, and applying an anion stream to the crystal growth surface of the QCM sensor. 1. A method of growing crystals on a QCM sensor , the method comprising:treating a crystal growth surface of the QCM sensor with a coupling agent comprising carboxylic acid functional groups to bond the carboxylic acid functional groups of the coupling agent to the crystal growth surface of the QCM sensor;applying a cation stream to the crystal growth surface of the QCM sensor, wherein the cation stream comprises one or more metallic compounds comprising metal elements selected from Ca, Mg, K, Al, Na, Ti, Fe, Sn, or combinations thereof, where metallic cations of the cation stream attach to the carboxylic acid functional groups on the crystal growth surface; andapplying an anion stream to the crystal growth surface of the QCM sensor, wherein the anion stream comprises one or more salts, where salts of the anion stream combine with the attached cations to form crystals on the crystal growth surface of the QCM sensor, the crystals forming a crystal layer comprising an average thickness greater than 5 nanometers.2. The method of claim 1 , wherein the method further comprises washing the QCM sensor with a cleaning agent.3. The method of claim 2 , wherein the ...

Подробнее
Номер записи: 67
10-02-2022 дата публикации

X-RAY SINGLE-PIXEL CAMERA BASED ON X-RAY COMPUTATIONAL CORRELATED IMAGING

Номер: US20220042928A1
Автор: CHEN Liming, HE Yuhang, WANG Bingbing, WU Lingan, ZHANG Aixin
Принадлежит: INSTITUTE OF PHYSICS, CHINESE ACADEMY OF SCIENCES

An X-ray single-pixel camera based on X-ray computational correlated imaging, which belongs to the technical research fields of X-ray computational correlated imaging and X-ray single-pixel imaging. The X-ray single-pixel camera includes: an X-ray modulation system (), an X-ray modulation control system (), an X-ray single-pixel detector (), a main control system unit (), a time synchronization system () and a computational imaging system (). The main control system unit () controls each module through software; the time synchronization system () controls synchronization of each module for automatic collection; and the computational imaging system () is configured to perform a second-order correlated computation or a compressed sensing computation or a deep learning computation on the signals collected by the X-ray single-pixel detector () and a preset modulation matrix, so as to obtain an image of an object under test. The X-ray single-pixel camera based on X-ray computational correlated imaging, provided by the present invention, realizes single-pixel imaging, greatly reduces the sampling number while ensuring the imaging quality, and reduces the X-ray radiation dose in an imaging process. 1. An X-ray single-pixel camera based on X-ray computational correlated imaging , characterized by comprising: an X-ray modulation system , an X-ray modulation control system , an X-ray single-pixel detector , a main control system unit , a time synchronization system and a computational imaging system , whereinthe X-ray modulation system is configured to modulate X-rays; the X-ray modulation control system is configured to control the X-ray modulation system; the X-ray single-pixel detector is configured to collect signals; the main control system unit controls each module through software; the time synchronization system controls synchronization of each module for automatic collection; and the computational imaging system is configured to perform a second-order correlated ...

Подробнее
Номер записи: 68
10-02-2022 дата публикации

Ct system and detection device for ct system

Номер: US20220042929A1
Автор: Le SHEN, LI ZHANG, Liang Ll, Qingping Huang, Tiao Zhao, XIN Jin, Yunda Sun, Zhiqiang Chen
Принадлежит: Nuctech Co Ltd, TSINGHUA UNIVERSITY

The present application discloses a CT system and a detection apparatus for the CT system. The detection apparatus includes: a high-energy detector assembly including a plurality of rows of high-energy detectors arranged along a predetermined trajectory; a low-energy detector assembly including a plurality of rows of low-energy detectors arranged at intervals along the predetermined trajectory, the low-energy detector assembly and the high-energy detector assembly being disposed in a stack; a number of rows of the low-energy detectors is smaller than a number or rows of the high-energy detectors; and each row of the low-energy detectors covers a row of high-energy detectors.

Подробнее
Номер записи: 69
10-02-2022 дата публикации

Estimating Background Radiation from Unknown Sources

Номер: US20220042932A1
Автор: Holt Kevin, STAR-LACK Josh, SUN Mingshan
Принадлежит: Varex Imaging Corporation

Embodiments include a method, comprising: receiving measured radiation obtained from a radiation detector that received radiation through an object; simulating the measured radiation obtained from the radiation detector that received radiation through the object; generating an offset based on the measured radiation and the simulated measured radiation; estimating scatter radiation based on the offset; and estimating primary radiation based on the estimated scatter radiation 1. A method , comprising:receiving measured radiation obtained from a radiation detector that received radiation through an object;simulating the measured radiation obtained from the radiation detector that received radiation through the object;generating an offset based on the measured radiation and the simulated measured radiation;estimating scatter radiation based on the offset; andestimating primary radiation based on the estimated scatter radiation.2. The method of claim 1 , further comprising:generating a gain based on the measured radiation and the simulated measured radiation;wherein estimating the scatter radiation further comprises estimating the scatter radiation based on the gain and the offset.3. The method of claim 2 , further comprising:generating the estimated scatter radiation based on the gain, the offset, and a simulated scatter radiation component of the simulated measured radiation; andgenerating the estimated primary radiation based on the estimated scatter radiation and the measured radiation.4. The method of claim 2 , further comprising:fitting a polynomial to a first vector of pixel values of the measured radiation versus a second vector of pixel values of the simulated measured radiation; andgenerating the gain based on the polynomial.5. The method of claim 4 , wherein:the gain is a linear term of the polynomial.6. The method of claim 5 , wherein:the polynomial is at least a second order polynomial.7. The method of claim 2 , further comprising:fitting a first polynomial ...

Подробнее
Номер записи: 70
10-02-2022 дата публикации

X-RAY BASED MEASUREMENTS IN PATTERNED STRUCTURE

Номер: US20220042934A1
Автор: Barak Gilad
Принадлежит: NOVA LTD.

A method and system are presented for use in X-ray based measurements on patterned structures. The method comprises: processing data indicative of measured signals corresponding to detected radiation response of a patterned structure to incident X-ray radiation, and subtracting from said data an effective measured signals substantially free of background noise, said effective measured signals being formed of radiation components of reflected diffraction orders such that model based interpretation of the effective measured signals enables determination of one or more parameters of the patterned structure, wherein said processing comprises: analyzing the measured signals and extracting therefrom a background signal corresponding to the background noise; and applying a filtering procedure to the measured signals to subtract therefrom signal corresponding to the background signal, resulting in the effective measured signal. 1. A method for use in X-ray based measurements on patterned structures , the method being carried out by a computer system and comprising:processing, by a processor utility of the computer system, data indicative of measured signals corresponding to a detected radiation response of a patterned structure to incident X-ray radiation, wherein the processing comprising image processing of measured signals indicative of a) an angular span of diffraction orders that were scattered from the patterned structure, and (b) background signals; andapplying a filtering procedure to the measured signals, the applying comprises subtracting from measured signals within the angular span, the background signals to provide effective measured signals that are substantially free of the background signals.2. A measurement system for use in X-ray based measurements on patterned structures , the system comprising:an illumination unit configured and operable to define an illumination channel for directing illuminating X-Ray radiation onto a measurement plane for interacting ...

Подробнее
Номер записи: 71
10-02-2022 дата публикации

METHOD AND APPARATUS FOR MONITORING BEAM PROFILE AND POWER

Номер: US20220042935A1
Автор: Chan Bin-Da, HUANG DanJing, Ye Ning, Zhang Jian
Принадлежит:

A system and a method for monitoring a beam in an inspection system are provided. The system includes an image sensor configured to collect a sequence of images of a beam spot of a beam formed on a surface, each image of the sequence of images having been collected at a different exposure time of the image sensor, and a controller configured to combine the sequence of images to obtain a beam profile of the beam. 1. A system for monitoring a beam in an inspection system , comprising:an image sensor that includes circuitry to collect a sequence of images of a beam spot of a beam formed on a surface, each image of the sequence of images having been collected at a different exposure time of the image sensor; anda controller having one or more processors and a memory, the controller configured to combine the sequence of images to obtain a beam profile of the beam.2. The system of claim 1 , wherein the controller is further configured to adjust an image of the sequence of images by using a grey level magnification factor associated with the image.3. The system of claim 2 , wherein the controller is further configured to adjust the image by multiplying a grey level of each pixel in the image that contains useful information by the grey level magnification factor associated with the image.4. The system of claim 2 , wherein the controller is configured to determine the grey level magnification factor associated with the image based on an exposure time at which the image is collected.5. The system of claim 2 , wherein the controller is configured to determine the grey level magnification factor associated with the image based on a comparison of grey levels of pixels in the sequence of images.6. The system of claim 5 , wherein the image is a first selected image of the sequence of images claim 5 , and the controller is configured to determine the grey level magnification factor associated with the first selected image based on:a comparison of the first selected image with a ...

Подробнее
Номер записи: 72
23-01-2020 дата публикации

ADAPTIVE SPECIMEN IMAGE ACQUISITION USING AN ARTIFICIAL NEURAL NETWORK

Номер: US20200025696A1
Автор: Potocek Pavel
Принадлежит: FEI COMPANY

Techniques for adapting an adaptive specimen image acquisition system using an artificial neural network (ANN) are disclosed. An adaptive specimen image acquisition system is configurable to scan a specimen to produce images of varying qualities. An adaptive specimen image acquisition system first scans a specimen to produce a low-quality image. An ANN identifies objects of interest within the specimen image. A scan mask indicates regions of the image corresponding to the objects of interest. The adaptive specimen image acquisition system scans only the regions of the image corresponding to the objects of interest, as indicated by the scan mask, to produce a high-quality image. The low-quality image and the high-quality image are merged in a final image. The final image shows the objects of interest at a higher quality, and the rest of the specimen at a lower quality. 1. A method , comprising:obtaining a first image of a specimen that is produced by scanning the specimen using a first set of one or more values for a set of one or more microscopy parameters;using an artificial neural network to identify one or more objects of interest within the first image;generating a scan mask indicating a first set of one or more regions corresponding to the objects of interest identified using the artificial neural network; andbased on the scan mask, providing instructions to scan the first set of regions of the specimen using a second set of values for the set of microscopy parameters to obtain a second image of the specimen,wherein the method is performed by at least one device including a hardware processor.2. The method of claim 1 , wherein the scan mask further indicates a second set of one or more regions not corresponding to the objects of interest identified using the artificial neural network; andfurther comprising: based on the scan mask, refraining from providing any instructions to scan the second set of regions of the specimen using the second set of values for the ...

Подробнее
Номер записи: 73
29-01-2015 дата публикации

Coordinate measuring apparatus and method for measuring an object

Номер: US20150030121A1
Автор: Ralf Christoph, Wolfgang Rauh
Принадлежит: Individual

The invention relates to a coordinate measuring apparatus for measuring an object, having an x-ray sensory mechanism as a first sensory mechanism that is provided with an x-ray source and at least one x-ray sensor which detects the x-rays, and a second sensory mechanism such as a tactile and/or an optical sensory mechanism that can be placed in the x, y, and/or z direction of the coordinate measuring apparatus in relation to the object. In order to be able to easily measure also large-size test objects, the x-ray sensory mechanism can be positioned in the coordinate measuring apparatus according to the second sensory mechanism.

Подробнее
Номер записи: 74
23-01-2020 дата публикации

Enabling High Throughput Electron Channeling Contrast Imaging (ECCI) by Varying Electron Beam Energy

Номер: US20200027690A1
Автор: Bedell Stephen W., Sadana Devendra K., Wacaser Brent A.
Принадлежит:

Techniques for high throughput electron channeling contrast imaging (ECCI) by varying electron beam energy are provided. In one aspect, a method for ECCI of a crystalline wafer includes: placing the crystalline wafer under an electron microscope having an angle of less than 90° relative to a surface of the crystalline wafer; generating an electron beam, by the electron microscope, incident on the crystalline wafer; varying an accelerating voltage of the electron microscope to access a channeling condition of the crystalline wafer; and obtaining an image of the crystalline wafer. A system for ECCI is also provided. 1. A method for electron channeling contrast imaging (ECCI) of a crystalline wafer , the method comprising the steps of:placing the crystalline wafer under an electron microscope having an angle of less than 90° relative to a surface of the crystalline wafer;generating an electron beam, by the electron microscope, incident on the crystalline wafer;varying an accelerating voltage of the electron microscope to access a channeling condition of the crystalline wafer; andobtaining an image of the crystalline wafer.2. The method of claim 1 , further comprising the step of:varying the accelerating voltage in increments of from about 0.01 kV to about 0.1 kV and ranges therebetween to fine-tune imaging conditions.3. The method of claim 1 , wherein the angle is from about 80° to about 89.5° and ranges therebetween.4. The method of claim 1 , wherein the angle is fixed.5. The method of claim 1 , wherein the crystalline wafer has a diameter of greater than or equal to about 300 millimeters (mm).6. The method of claim 1 , further comprising the step of:varying the accelerating voltage of the electron microscope to access at least one different channeling condition of the crystalline wafer.7. The method of claim 1 , further comprising the step of:changing an orientation of the crystalline wafer to access at least one different channeling condition of the crystalline ...

Подробнее
Номер записи: 75
28-01-2021 дата публикации

PATTERN EDGE DETECTION METHOD

Номер: US20210027473A1
Автор: OYA Masahiro
Принадлежит:

The present invention relates to a pattern edge detection method applicable to a semiconductor inspection apparatus that performs a pattern inspection using pattern design data. This method includes: generating an image of a pattern; detecting an edge of the pattern on the image based on a reference pattern generated from design data for the pattern; repeating generating of an image of a pattern and detecting of an edge of the pattern on the image to produce training-data candidates including a plurality of images and corresponding pattern edges; determining training data by removing pattern edges and corresponding images from the training-data candidates, the pattern edges to be removed being pattern edges satisfying a predetermined disqualification condition; producing an edge detection model by machine learning using the training data; generating an image of other pattern; and detecting an edge of the other pattern on the image using the edge detection model. 1. A method of detecting an edge of a pattern , comprising:generating an image of a pattern;detecting an edge of the pattern on the image based on a reference pattern generated from design data for the pattern;repeating generating of an image of a pattern and detecting of an edge of the pattern on the image to produce training-data candidates including a plurality of images and corresponding pattern edges;determining training data by removing pattern edges and corresponding images from the training-data candidates, the pattern edges to be removed being pattern edges satisfying a predetermined disqualification condition;producing an edge detection model by machine learning using the training data;generating an image of other pattern; anddetecting an edge of the other pattern on the image using the edge detection model,wherein the predetermined disqualification condition is that a bias inspection value of a pattern edge is larger than a preset upper limit or smaller than a preset lower limit, the bias ...

Подробнее
Номер записи: 76
01-02-2018 дата публикации

SHIFTING TURN TABLE FOR X-RAY IMAGING MANIPULATOR

Номер: US20180031495A1
Автор: Diehm Jeffrey, Ostby Joel, Ruether Brian
Принадлежит:

A component imaging system having at least one x-ray tube and an x-ray detector comprises a rotatable platform positioned between the x-ray tube and the x-ray detector. The rotatable platform is rotatable about a first rotational axis. A turntable is mounted on top of the rotatable platform. The turntable comprises: a stage platform for holding a component having an area of interest, the area of interest having a rotational axis; and a mounting plate rotating with the rotatable platform about the first rotational axis. The stage platform is movable in at least a first direction from a starting position to an imaging position to align the rotational axis of the area of interest with the rotational axis of the rotatable platform. 1. A component imaging system , the system comprising:a frame, wherein a x-ray detector is mountable at a first end of the frame and a x-ray tube is mountable at a second end of the frame opposite the first end;a rotatable platform positioned between a first end of the frame and the second end of the frame, the rotatable platform being rotatable about a first rotational axis; and a stage platform for holding a component having an area of interest, the area of interest having a rotational axis; and', 'a mounting plate for engagement with the rotatable platform, the mounting plate rotating with the rotatable platform about the first rotational axis;', 'wherein the stage platform is moveable in a first direction from a starting position to an imaging position, the first direction being perpendicular to the first rotational axis., 'a turntable comprising2. The component imaging system of claim 1 , configured such that in the imaging position claim 1 , the rotational axis of the area of interest is aligned with the first rotational axis.3. The component imaging system of claim 1 , further comprising a controller for controlling movement of the stage platform from the starting position to the imaging position.4. The component imaging system of ...

Подробнее
Номер записи: 77
01-02-2018 дата публикации

X-RAY FLUORESCENCE ANALYZER

Номер: US20180031497A1
Автор: Burton Robert Matthew, Doyle Lance Thompson, GU Jiyan, JR. Robert Francis, Kirsch Michael Scott, Parks Brian Scott, Shannon, Vosman Fredericus, Wheeler Kenneth Dean
Принадлежит:

A system and method for processing X-ray fluorescence data in a hand-held X-ray Fluorescence (XRF) analyzer are provided. The X-ray fluorescence (XRF) analyzer includes a radiation source assembly including a first centerline axis and configured to direct an X-ray beam to impinge on a sample to be tested. The XRF analyzer also includes a radiation detector assembly including a second centerline axis configured to sense X-ray fluorescence (XRF) emitted from the sample in response to the X-ray beam. The XRF analyzer further includes a processor configured to determine a property of the sample to be tested from the emitted XRF, and a proximity sensor configured to continuously measure a distance between the XRF analyzer and the sample to be tested, the distance being at least one of displayed to a user and used by the processor to determine the property. 1. An X-ray fluorescence (XRF) analyzer comprising:a radiation source assembly comprising a first centerline axis and configured to direct an X-ray beam to impinge on a sample to be tested;a radiation detector assembly comprising a second centerline axis configured to sense X-ray fluorescence (XRF) emitted from the sample in response to the X-ray beam;a processor configured to determine a property of the sample to be tested from the emitted XRF; anda proximity sensor configured to continuously measure a distance between said XRF analyzer and said sample to be tested, the distance being at least one of displayed to a user and used by the processor to determine the property.2. The XRF analyzer of claim 1 , further comprising a plurality of proximity sensors claim 1 , said processor configured to determine a positional orientation of the XRF analyzer with respect to the sample to be tested using the plurality of proximity sensors.3. The XRF analyzer of claim 1 , wherein the first centerline axis and the second centerline axis are offset laterally by a first angle.4. The XRF analyzer of claim 3 , wherein the first angle is ...

Подробнее
Номер записи: 78
01-02-2018 дата публикации

CHARGED PARTICLE BEAM INSPECTION APPARATUS AND CHARGED PARTICLE BEAM INSPECTION METHOD

Номер: US20180031498A1
Автор: NODA Chosaku, Ogawa Riki, Shiratsuchi Masataka
Принадлежит: NuFlare Technology, Inc.

A charged particle beam inspection apparatus includes a first deflector to deflect N×N′ multiple beams collectively to N×N′ small regions having a size p/M in the first direction and arrayed at the pitch p in the first direction, perform tracking deflection, and re-deflect the multiple beams collectively to next N×N′ small regions away from the N×N′ small regions by N small regions in the first direction, by the stage completes a movement of a distance of N/M×p so as to reset the tracking deflection; and a second deflector to deflect the multiple beams collectively to scan the N×N′ small regions concerned while the tracking deflection is performed. 1. A charged particle beam inspection apparatus comprising:a movable stage on which an inspection target substrate is placed;a stage control circuit configured to continuously move the stage in a direction opposite to a first direction;a first deflector configured to deflect multiple beams composed of a plurality of charged particle beams arrayed in N (N is an integer of 2 or larger) rows at an equal pitch p in the first direction and N′ (N′ is an integer of 1 or larger) columns in a second direction that is orthogonal to the first direction on the substrate collectively to a group of N×N′ small regions arrayed in N rows at the pitch p in the first direction and N′ columns in the second direction among a plurality of small regions obtained by dividing an inspection region of the substrate by a size p/M (M is an integer of 2 or larger) in the first direction and a predetermined size in the second direction, perform tracking deflection of the multiple beams such that the multiple beams follow movement of the stage while the stage continuously moves a distance obtained by N/M×p in the direction opposite to the first direction, and re-deflect the multiple beams collectively to a next group of N×N′ small regions arrayed at the pitch p in the first direction, the next group being away from the group of N×N′ small regions by N ...

Подробнее
Номер записи: 79
04-02-2021 дата публикации

X-RAY COMPUTED TOMOGRAPHY APPARATUS WITH SCANNER FUNCTION

Номер: US20210030382A1
Автор: Lee Sang Chul, Sa Yong Jae
Принадлежит:

An X-ray computed tomography apparatus with a scanner function includes a vertical frame, a patient support arm provided below the vertical frame, a horizontal support arm extending horizontally from a top portion of the vertical frame, a rotary arm drive unit provided at an end of the horizontal support arm, a horizontal rotation arm provided horizontally below the rotary arm drive unit to rotate 360 degrees, a general CT imaging X-ray source provided at one end of the horizontal rotation arm, and an X-ray detector provided at the other end of the horizontal rotation arm to face the general CT imaging X-ray source. A micro CT imaging X-ray source is provided on the vertical frame, a rotary table for seating and rotating an object to be imaged is provided above the patient support arm, and the X-ray detector is composed of a common X-ray detector. 1. An X-ray computed tomography apparatus with a scanner function , comprising:a vertical frame;a patient support arm provided below the vertical frame;a horizontal support arm extending horizontally from a top portion of the vertical frame;a rotary arm drive unit provided at an end of the horizontal support arm;a horizontal rotation arm provided horizontally below the rotary arm drive unit to rotate 360 degrees;a general CT imaging X-ray source provided at one end of the horizontal rotation arm; andan X-ray detector provided at the other end of the horizontal rotation arm to face the general CT imaging X-ray source,wherein a micro CT imaging X-ray source is further provided on the vertical frame, a rotary table for seating and rotating an object to be imaged is further provided above the patient support arm, and the X-ray detector is composed of a common X-ray detector capable of being rotated by an X-ray detector drive unit, so that the apparatus can perform both a micro CT imaging operation and a general CT imaging operation.2. The apparatus according to claim 1 , wherein a rotary table drive unit for rotating the ...

Подробнее
Номер записи: 80
01-05-2014 дата публикации

Automated Mineral Classification

Номер: US20140117231A1
Автор: Michael Buhot, Michael James Owen
Принадлежит: FEI Co

The present invention discloses a combination of two existing approaches for mineral analysis and makes use of the Similarity Metric Invention, that allows mineral definitions to be described in theoretical compositional terms, meaning that users are not required to find examples of each mineral, or adjust rules. This system allows untrained operators to use it, as opposed to previous systems, which required extensive training and expertise.

Подробнее
Номер записи: 81
02-02-2017 дата публикации

Digital Core Model Construction

Номер: US20170032532A1
Автор: Alexander Nikolaevich NADEEV, Denis KLEMIN, Dmitry Anatolievich Koroteev, Igor Andreevich Varfolomeev, Ivan Yakimchuk, Mark Andersen, Sergey Sergeevich Safonov
Принадлежит: Schlumberger Technology Corp

A method and system for analysis of a digital core image obtained from a sample are disclosed. The method includes performing segmentations on the digital core image using multiple approaches to obtain multiple segmented images which are statistically analyzed to select the most suitable approach of the multiple approaches. Thereafter, a digital core model is generated using the segmented image corresponding to the most suitable approach. A simulation test may be performed on the digital core model to obtain a model test result and an oilfield operation may be performed based on the model test result. The system includes measurement and testing equipment to obtain the digital core image and a computing system including a data repository for storing a digital core image and a digital core model, and a digital core modeling tool. The digital core modeling tool performs the segmentations, statistical analysis, and generates the digital core model.

Подробнее
Номер записи: 82
17-02-2022 дата публикации

INSPECTION DEVICE, PACKAGING MACHINE, AND PACKAGE INSPECTION METHOD

Номер: US20220050066A1
Автор: Ohtani Takamasa, Ohyama Tsuyoshi, Sakaida Norihiko
Принадлежит: CKD CORPORATION

An inspection device includes: an electromagnetic wave irradiator that irradiates, with a predetermined electromagnetic wave from a first film side, the package that is conveyed along a predetermined direction and that has the spaces at a plurality of positions in a width direction; an imaging device that is disposed opposed to the electromagnetic wave irradiator across the package, includes an electromagnetic wave detector including a plurality of detection elements that is arrayed along the width direction and that detects the electromagnetic wave radiated from the electromagnetic wave irradiator and transmitted through the package, and sequentially outputs an obtained electromagnetic wave transmission image every time the package is conveyed by a predetermined amount; and an image processing device that processes an image signal output from the imaging device. 1. An inspection device that inspects a package comprising a first film made of an opaque material and a second film made of an opaque material attached to each other and a plurality of spaces each for placing a tablet between the first film and the second film , the inspection device comprising:an electromagnetic wave irradiator that irradiates, with a predetermined electromagnetic wave from a first film side, the package that is conveyed along a predetermined direction and that has the spaces at a plurality of positions in a width direction perpendicular to the predetermined direction;{'claim-text': ['is disposed opposed to the electromagnetic wave irradiator across the package,', 'comprises an electromagnetic wave detector comprising a plurality of detection elements that is arrayed along the width direction and that detects the electromagnetic wave radiated from the electromagnetic wave irradiator and transmitted through the package, and', 'sequentially outputs an obtained electromagnetic wave transmission image every time the package is conveyed by a predetermined amount; and'], '#text': 'an imaging ...

Подробнее
Номер записи: 83
30-01-2020 дата публикации

Photon counting x-ray ct apparatus

Номер: US20200033273A1
Автор: Hidenori Takeshima, Hiroaki Nakai, Kenta Moriyasu, Shuhei Nitta, Taichiro Shiodera, Takashi Ida, Tomoyuki Takeguchi, Toshiyuki Ono
Принадлежит: Canon Medical Systems Corp

A photon counting X-ray CT apparatus according to an embodiment includes: data acquiring circuitry, and processing circuitry. The data acquiring circuitry is configured to allocate energy measured by signals output from a photon counting detector in response to incidence of X-ray photons to any of a plurality of first energy bins so as to acquire a first data group as count data of each of the first energy bins. The processing circuitry is configured to determine a plurality of second energy bins obtained by grouping the first energy bins in accordance with a decomposition target material that is a material to be decomposed in a imaging region, allocate the first data group to any of the second energy bins so as to generate a second data group, and use the second data group to generate an image representing a distribution of the decomposition target material.

Подробнее
Номер записи: 84
30-01-2020 дата публикации

Structured detectors and detector systems for radiation imaging

Номер: US20200033486A1
Автор: Robert Sigurd Nelson, William Bert Nelson
Принадлежит: Minnesota Imaging and Engineering LLC

Detector module designs for radiographic imaging include first and second layers of scintillator rods or pixel arrays oriented in first and second directions. The first and second directions are transversely oriented to define a light sharing region between the first and second layers. Encoding features may be disposed in, on or between the first and second layers, and configured to modulate propagation of optical signals therealong or therebetween.

Подробнее
Номер записи: 85
04-02-2021 дата публикации

HIGH-PASS X-RAY FILTER DEVICE AND METHODS OF MAKING THEREOF

Номер: US20210033544A1
Автор: AGYEMAN-BUDU David N., Brock Joel D., Woll Arthur R.
Принадлежит:

A high-pass x-ray filter device is disclosed that includes a substrate defining an elongated opening. A reflecting membrane is positioned across the opening and supported, along all sides, by the substrate. The reflecting membrane is configured to transmit, from an incident x-ray beam, x-ray photons having an energy above about a threshold energy level and reflects, from the incident x-ray beam, x-ray photons having an energy below about the threshold energy level. The elongated opening of the substrate defines an exit path for the transmitted x-ray beam. A high-pass x-ray filter system including the high-pass filter device and a method of fabrication of the high-pass filter device are also disclosed. 1. A high-pass x-ray filter comprising:a substrate defining an elongated opening; anda reflecting membrane positioned across the opening and supported, along all sides, by the substrate, the reflecting membrane configured to transmit, from an incident x-ray beam, x-ray photons having an energy above about a threshold energy level and to reflect, from the incident x-ray beam, x-ray photons having an energy below about the threshold energy level, wherein the elongated opening of the substrate defines an exit path for the transmitted x-ray beam.2. The high-pass x-ray filter of claim 1 , wherein the substrate comprises a silicon wafer.3. The high-pass x-ray filter of claim 2 , wherein the thin reflecting membrane comprises a film formed on at least a second side of the silicon wafer.4. The high-pass x-ray filter of claim 3 , wherein the thin reflecting membrane comprises SiN.5. The high-pass x-ray filter of claim 4 , wherein the elongated opening in the substrate comprises an etched window in the substrate from a first side of the substrate to a SiNlayer formed on the second side of the substrate.6. The high-pass x-ray filter of claim 3 , wherein the thin reflecting membrane comprises polymethyl methacrylate (PMMA) claim 3 , SU-8 claim 3 , Parylene C or a poly(p-xylylene) ...

Подробнее
Номер записи: 86
04-02-2021 дата публикации

Scanning Method And Apparatus Comprising A Buoyancy Material For Scanning An Underwater Pipeline Or A Process Vessel

Номер: US20210033545A1
Автор: Bowdon Christopher, FEATONBY Paul David, Howstan James Stephen, Jackson Peter, James Kenneth, RONCHI Emanuele
Принадлежит:

The invention discloses a scanning method and apparatus suitable for scanning a pipeline or process vessel in which a beam of gamma radiation from a source is emitted through the vessel to be detected by an array of detectors which are each collimated to detect radiation over a narrow angle relative to the width of the emitted radiation beam. 1. An apparatus for inspecting an underwater pipeline to determine wall thickness or information about contents of the pipeline , the apparatus comprising:a gamma radiation source;an array of detector units; anda data acquisition unit,wherein the gamma radiation source and the array of detector units are mounted to enable an underwater pipeline to be interposed between the gamma radiation source and the array of detector units so that gamma radiation emitted by the gamma radiation source passes along a plurality of paths through a portion of the pipeline and impinges upon the array of detector units,wherein the data acquisition unit is configured to acquire data at a plurality of radially offset positions around the pipeline to acquire density data at a variety of angles through the pipeline when the underwater pipeline is interposed between the gamma radiation source and the array of detector units in order to produce a representation of the pipeline or contents of the pipeline using the density data, andwherein the apparatus further comprises a buoyancy material.2. The apparatus according to claim 1 , wherein at least one of the source and detector units are rotatable around a circumference of the pipeline when acquiring data.3. The apparatus according to claim 1 , wherein the apparatus is hinged so that the apparatus is configured to be opened and closed around the pipeline.4. The apparatus according to claim 1 , wherein the representation is a representation of the composition of the pipeline or its contents.5. The apparatus according to claim 1 , wherein the apparatus comprises a tomography algorithm for building the ...

Подробнее
Номер записи: 87
04-02-2021 дата публикации

METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE MICROSCOPE

Номер: US20210033548A1
Автор: Klusácek Jan, Petrek Jiri, Tuma Tomás
Принадлежит: FEI COMPANY

The invention relates to a method of examining a sample using a charged particle microscope, comprising the steps of providing a charged particle beam, as well as a sample; scanning said charged particle beam over said sample; and detecting, using a first detector, emissions of a first type from the sample in response to the beam scanned over the sample. Spectral information of detected emissions of the first type is used for assigning a plurality of mutually different phases to said sample. In a further step, a corresponding plurality of different color hues—with reference to an HSV color space—are associated to said plurality of mutually different phases. Using a second detector, emissions of a second type from the sample in response to the beam scanned over the sample are detected. Finally an image representation of said sample is provided. 1. A method of examining a sample using a charged particle microscope , comprising the steps of:Providing a charged particle beam, as well as a sample;Scanning the charged particle beam over the sample;Detecting, using a first detector, emissions of a first type from the sample in response to the beam scanned over the sample;Using spectral information of detected emissions of the first type, assigning a plurality of mutually different phases to the sample;Associating, with reference to an HSV color space, a corresponding plurality of different color hues to the plurality of mutually different phases;Detecting, using a second detector, emissions of a second type from the sample in response to the beam scanned over the sample; andProviding, by a control unit, an image representation of the sample, wherein use is made of emissions of the second type and wherein the image representation contains the associated different color hues for representing the plurality of different phases.2. The method according to claim 1 , further comprising storing the detected emissions of the first type in a spectral data stack including a plurality ...

Подробнее
Номер записи: 88
04-02-2021 дата публикации

FULL-VIEW-FIELD QUANTITATIVE STATISTICAL DISTRIBUTION REPRESENTATION METHOD FOR MICROSTRUCTURES of y' PHASES IN METAL MATERIAL

Номер: US20210033549A1
Автор: Han Bing, Jia Yunhai, Li Dongling, Li Jie, Lu Yuhua, Shen Xuejing, Wan Weihao, Wang Haizhou, Zhao Lei
Принадлежит:

The present invention discloses, a full-view-field quantitative statistical distribution representation method for microstructures of γ′ phases in a metal material, comprising the following steps: step a: labeling γ′ phases, cloud clutters and γ matrixes by Labelme, and then making standard feature training samples; step b: building a deep learning-based feature recognition and extraction model by means of BDU-Net; step e: collecting γ′ feature maps in the metal material to be detected; step d: automatically recognizing and extracting the γ′ phases; and step e: performing in-situ quantitative statistical distribution representation on the γ phases in the full view field within a large range. The full-view-field quantitative statistical distribution representation method for microstructures of γ′ phases in a metal material provided by the present invention realizes automatic, high-speed and high-quality recognition and extraction of features of γ phases in the metal material 1. A full-view-field quantitative statistical distribution representation method for microstructures of γ′ phases in a metal material , comprising the following steps:a) performing metallographic sample preparation, polishing and chemical etching on standard metal material samples with the same material as a metal material to be detected, randomly sampling and shooting the processed standard metal material samples by a scanning electron microscope at high magnification, and building a γ′-phase feature map data set; labeling γ′ phases, cloud clutters and γ matrixes by Labelme, and then making standard feature training samples;b) optimizing a deep learning-based image segmentation network U-Net, building a feature recognition and extraction network BDU-Net, performing data augmentation on the standard feature training samples, dividing the augmented data into a training set and a validation set, training with the training set, taking the MPA of the validation set as a judgment condition of training ...

Подробнее
Номер записи: 89
04-02-2021 дата публикации

Spectroscopy and imaging system

Номер: US20210033551A1
Автор: Adam Bushell, Michael Hugh Humpherson, Oliver Greenwood
Принадлежит: VG Systems Ltd

An apparatus and method for characterisation of a sample via spectroscopy and/or imaging. The apparatus comprises a first detector for imaging or spectroscopy, a second detector for imaging or spectroscopy, and a toroidal capacitor type electrostatic energy analyser. The toroidal capacitor type electrostatic energy analyser comprises a first and a second entrance aperture arranged such that charged particles emitted from a sample and passing through the first entrance aperture traverse a first trajectory through the toroidal capacitor type electrostatic energy analyser to be incident at the first detector, and charged particles emitted from a sample and passing through the second entrance aperture traverse a second trajectory through the toroidal capacitor type electrostatic energy analyser to be incident at the second detector. A deflection assembly arranged between the sample and the analyser may be used to direct charged particles emitted from the sample towards the first and/or second entrance aperture of the analyser.

Подробнее
Номер записи: 90
05-02-2015 дата публикации

Random Array DNA Analysis by Hybridization

Номер: US20150038345A1
Автор: Drmanac Radoje
Принадлежит:

The invention relates to methods and devices for analyzing single molecules, i.e., nucleic acids. Such single molecules may be derived from natural samples, such as cells, tissues, soil, air and water without separating or enriching individual components. In certain aspects of the invention, the methods and devices are useful in performing nucleic acid sequence analysis by probe hybridization. 1. A system for analyzing a target nucleic acid , comprising:(a) a reaction platform;(b) an array on a surface of the platform, wherein the array comprises a solid substrate comprising a plurality of areas, each area configured for immobilization of a polynucleotide comprising a fragment of the target nucleic acid;(c) a light source configured to excite fluorescent molecules at or near the surface;(d) a megapixel camera positioned above the reaction platform; and(e) a lens configured to focus areas of the platform such that each area of the array is focused on an individual pixel of the camera.2. The system of claim 1 , wherein each area is 1 μm.3. The system of claim 1 , wherein the array comprises one million or more of the areas.4. The system of claim 1 , wherein the light source is a laser claim 1 , and the system further comprises galvanometers to control light from the laser.5. The system of claim 1 , comprising fragments of the target nucleic acid immobilized on the surface at an average density of approximately one polynucleotide per pixel.6. The system of claim 5 , comprising fluorescently labeled probes hybridized to the fragments of the target nucleic acid.7. The system of claim 1 , wherein the camera is a CCD camera.8. The system of claim 1 , wherein the polynucleotide comprises a fragment of the target nucleic acid and an adapter sequence at each end of the fragment.9. The system of claim 8 , wherein each area comprises an attached oligonucleotide claim 8 , wherein the oligonucleotide is complementary to the adapter sequence.10. A method for analyzing a target ...

Подробнее
Номер записи: 91
08-02-2018 дата публикации

METHOD AND SYSTEM FOR RECONSTRUCTING 3-DIMENSIONAL IMAGES FROM SPATIALLY AND TEMPORALLY OVERLAPPING X-RAYS

Номер: US20180038807A1
Автор: Betteridge Paul, HAUSER Raphael, Klodt Maria, Travish Gil
Принадлежит: ADAPTIX LTD.

An x-ray imaging system and method for reconstructing three-dimensional images of a region of interest from spatially and temporally overlapping x-rays using novel reconstruction techniques. 1. An x-ray imaging system , comprising:a detector capable of generating a signal in response to x-rays incident upon the detector, wherein the signal indicates the intensity of the x-rays incident upon a pixel of the detector,a plurality of x-ray sources, wherein at least two of the plurality of x-ray sources are capable of emitting x-rays such that said x-rays pass through a region of interest (ROI) and spatially and temporally overlap at the pixel of the detector; anda processing unit capable of receiving the signal indicating the intensity of x-rays incident upon the pixel of the detector and generating an estimate of the intensity attributable to each of the two or more x-rays overlapping at the pixel of the detector.2. The system of claim 1 , wherein the processing unit is further capable of generating a three-dimensional representation of the ROI using one or more estimates of the intensity attributable to each of the two or more x-rays overlapping at the pixel of the detector.3. The system of claim 3 , further comprising a display operably coupled to the processing unit claim 3 , wherein the display is capable of displaying one or more two-dimensional views of the three-dimensional representation of the ROI.4. The system of claim 1 , wherein the plurality of x-ray sources comprises two or more emitter elements of a distributed source array.5. The system of claim 1 , wherein the processing unit is further capable of voxelizing the ROI into a plurality of three-dimensional claim 1 , non-overlapping voxels; estimating an attenuation coefficient attributable to each said voxel claim 1 , and re-voxelizing the ROI into a plurality of three-dimensional claim 1 , non-overlapping voxels based on the estimated attenuation coefficients attributable to each said voxel.6. The system ...

Подробнее
Номер записи: 92
08-02-2018 дата публикации

X-ray Tomographic Inspection System for the Identification of Specific Target Items

Номер: US20180038988A1
Автор: Morton Edward James
Принадлежит:

The present invention provides for an improved scanning process with a stationary X-ray source arranged to generate X-rays from a plurality of X-ray source positions around a scanning region, a first set of detectors arranged to detect X-rays transmitted through the scanning region, and at least one processor arranged to process outputs from the first set of detectors to generate tomographic image data. The X-ray screening system is used in combination with other screening technologies, such as NQR-based screening, X-ray diffraction based screening, X-ray back-scatter based screening, or Trace Detection based screening. 1. A method for identifying objects in a container , comprising:performing a first stage screening, comprising: arranging a stationary X-ray source to generate X-rays from a plurality of X-ray source positions around a scanning region, arranging a first set of detectors to detect X-rays transmitted through the scanning region, and arranging a second set of detectors to detect X-rays scattered within the scanning region;processing data output from the first set of detectors using at least one processor to generate at least one tomographic image;processing data output from the second set of detectors to generate scatter image data; and,performing a second stage screening comprising at least one of a NQR-based screening process, X-ray diffraction based screening process, X-ray backscatter based screening process, or trace detection based screening process.2. The method of wherein the at least one processor outputs data indicative of a suspect object in the container.3. The method of wherein the at least one processor outputs a signal indicating said container should be subject to the second stage screening only if the first stage screening identifies a suspect object in the container.4. The method of wherein the at least one processor outputs a signal indicating said container should not be subject to the second stage screening only if the first stage ...

Подробнее
Номер записи: 93
24-02-2022 дата публикации

X-RAY IMAGING APPARATUS

Номер: US20220057340A1
Автор: NIIZAKA Takuma
Принадлежит: SHIMADZU CORPORATION

In an X-ray imaging apparatus, an image processor is configured to generate a super-resolved image having higher resolution in an X direction than a first fluoroscopic X-ray image and a second fluoroscopic X-ray image by dividing, in the X direction, a pixel value of a first pixel in the first fluoroscopic X-ray image based on pixel values of two pixels in the second fluoroscopic X-ray image that overlap the first pixel when the first fluoroscopic X-ray image and the second fluoroscopic X-ray image are shifted in the X direction by an amount corresponding to a movement amount (of an X-ray detection position) and displayed in an overlapping manner 18-. (canceled)9. An X-ray imaging apparatus comprising:an X-ray source;a detector configured to detect X-rays radiated from the X-ray source at a first position and a second position translated in a first direction by a movement amount smaller than a pixel size of the detector from the first position;an image processor configured to generate a first image based on the X-rays detected at the first position, the image processor being configured to generate a second image based on the X-rays detected at the second position; anda moving mechanism configured to move an X-ray detection position of the detector between the first position and the second position; whereinthe image processor is configured to generate a super-resolved image having higher resolution in the first direction than the first image and the second image based on a divided image that has undergone a division process in the first direction to divide, in the first direction, a pixel value of a first pixel in one of the first image and the second image based on pixel values of two pixels in the other of the first image and the second image that overlap the first pixel when the first image and the second image are shifted in the first direction by an amount corresponding to the movement amount and displayed in an overlapping manner10. The X-ray imaging apparatus ...

Подробнее
Номер записи: 94
24-02-2022 дата публикации

Inspection method and manufacturing method for structure and inspection apparatus and manufacturing apparatus for structure

Номер: US20220057342A1
Автор: Hiroki Sugihara, Takahiro Tanino
Принадлежит: TORAY INDUSTRIES INC

It is possible to detect, with high accuracy, whether a structure is a good product or a defective product. This inspection apparatus for a structure comprises: X-ray emitting means ( 1 a, 1 b ) for emitting X-rays through two or more paths; one or more X-ray detection means ( 3 ) for detecting the X-rays passing through the a structure ( 2 ); a multiple position distance measurement means ( 4 ) for measuring the distance from the X-ray emitting means to the structure at a plurality of positions; and an image processing means ( 5 ). The image processing means includes: a defective candidate detection means for detecting a defective candidate in two or more images acquired by the X-ray detection means; a height measurement means; an image calculation means for logically multiplying an image, on which height position information obtained by the height measurement means is recorded, by a defective candidate image obtained by the defective candidate detection means; an inspection range setting means for setting an inspection range from the distance and the thickness of the structure; and a defect determination means for determining that there is a defect when the inspection range includes the defective candidate.

Подробнее
Номер записи: 95
16-02-2017 дата публикации

Device and method for frequency-domain thermoacoustic sensing

Номер: US20170042428A1
Автор: Pouyan Mohajerani, Stephan KELLNBERGER, Vasilis NTZIA-CHRISTOS
Принадлежит: Helmhol Tz Zentrum Muenchen Deutsches Forschungszentrum fur Etc, Helmholtz Zentrum Muenchen Deutsches Forschungszentrum fuer Gesundheit und Umwelt GmbH

The invention relates to a device ( 100 ) and a corresponding method for thermoacoustic sensing, in particular thermoacoustic imaging, the device ( 100 ) comprising: a) an irradiation unit ( 10 ) configured to generate electromagnetic and/or particle energy exhibiting a first modulation, the first modulation comprising at least one frequency and to continuously emit the energy towards a target ( 1 ), whereby acoustic waves are continuously generated in the target, the acoustic waves exhibiting a second modulation, the second modulation comprising the at least one frequency and/or a harmonic frequency of the at least one frequency; b) a detection unit ( 20 ) configured to simultaneously detect the acoustic waves exhibiting the second modulation while the energy exhibiting the first modulation is being continuously emitted towards the target ( 1 ); and c) a processing unit ( 30 ) configured to determine at least one thermoacoustic value of an amplitude and/or a phase of the second modulation of the acoustic waves at the at least one frequency and/or at a harmonic frequency of the at least one frequency. The invention allows for fast and economic thermoacoustic sensing, in particular imaging of a region of interest of an object.

Подробнее
Номер записи: 96
07-02-2019 дата публикации

SYSTEMS AND METHODS FOR SCANNING PALLETIZED CARGO

Номер: US20190041341A1
Автор: Paresi Joseph S.
Принадлежит:

Provided are CT scanning systems and architectures that utilize a unique approach to scanning large objects. Various embodiments of the architecture incorporate a scanning platform and a turntable. The scanning platform may be mounted horizontally. The vertical offset between the scanning platform and the turntable may be changed during a scan. A pallet or other object can be moved into a scanning area under the scanning platform. Both the vertical offset between the scanning platform and the turntable may be changed and the turntable may be rotated during a scan. Scan data may be used to generate a three dimensional image. Additional objects can be quickly positioned (once the vertical offset is adjusted) for subsequent scans allowing for greater throughput than conventional approaches. 1. A scanning apparatus , the apparatus comprising:a scanning platform including an emitter and a detector;a turntable configured to rotate responsive to control signals;a lift configured to change a vertical offset of the scanning platform relative to the turntable, responsive to control signals; and receive imaging data from the detector;', 'generate control signals for changing the vertical offset of the scanning platform relative to the turntable;', 'generate control signals for rotating the turntable; and', 'capture x-ray attenuation data for an object in three dimensions., 'at least one processor when executing configured to2. The scanning apparatus of claim 1 , wherein the scanning platform is constructed and arranged on a horizontal plane relative to an installed surface.3. The scanning apparatus of claim 1 , wherein the lift is configured to change the height of the scanning platform.4. The scanning apparatus of claim 1 , wherein the lift is configured to change the height of the turntable.5. The scanning apparatus of claim 1 , wherein the scanning platform is constructed and arranged to accept large pallets having dimensions of at least 48 inch length claim 1 , by 48-inch ...

Подробнее
Номер записи: 97
06-02-2020 дата публикации

X-RAY IMAGING APPARATUS

Номер: US20200041424A1
Автор: ATSUMI Yoshihiro, WATARI Tomomi, YOSHIDA Koji
Принадлежит:

An X-ray imaging apparatus capable of covering outer peripheral portions of a fixed supporting column and a moving supporting column by a cover even when an SID is set to be large in a configuration in which an imaging system is rotated about an axis extending in a horizontal direction. The supporting column mechanism is provided with a fixed supporting column , a moving supporting column movable relative to the fixed supporting column , and a moving mechanism for moving the moving supporting column . A fixed cover is arranged at the outer peripheral portion of the fixed supporting column . Further, at the outer peripheral portion of the moving supporting column , a moving cover which moves together with the moving supporting column is arranged. An intermediate cover movable in the same direction as the moving cover is arranged between the fixed cover and the moving cover . Between the fixed supporting column and the moving cover , a constant force spring as an energizing member for energizing the intermediate cover to the side of the fixed cover is arranged. 1. An X-ray imaging apparatus comprising:an imaging system including an X-ray tube supported by a support mechanism and an X-ray detector for detecting X-rays emitted from the X-ray tube and passed through a subject;a top board arranged between the X-ray tube and the X-ray detector and capable of placing the subject on a surface;an X-ray tube moving mechanism configured to change a distance between the X-ray tube and the top board by moving the X-ray tube supported by the support mechanism; anda rotation mechanism configured to rotate the imaging system and the top board in synchronization with each other about an axis extending in a horizontal direction,wherein the support mechanism includes:a fixed supporting column;a moving supporting column movable with respect to the fixed supporting column;a fixed cover that covers the fixed supporting column;a moving cover that covers the moving supporting column and ...

Подробнее
Номер записи: 98
24-02-2022 дата публикации

CHARGED PARTICLE BEAM DEVICE AND CONTROL METHOD THEREOF

Номер: US20220059313A1
Автор: Dobashi Takashi, Mise Hiromi, Tamaki Hirokazu
Принадлежит:

A charged particle beam device includes: a movement mechanism configured to hold and move a sample; a charged particle source configured to emit charged particles with which the sample is irradiated to obtain an image of the sample; and a control unit configured to control the movement mechanism to move the sample and to obtain the image of the sample. The control unit obtains a reference image of the sample in a reference arrangement state by the charged particles, generates a goal image of the sample in a target arrangement state different from the reference arrangement state by calculation from the reference image, moves the sample to each of different arrangement states by the movement mechanism, obtains a candidate image of the sample in each of the different arrangement states by the charged particles, and generates a comparison result between respective candidate images and the goal image. 1. A charged particle beam device , comprising:a movement mechanism configured to hold and move a sample;a charged particle source configured to emit charged particles with which the sample is irradiated to obtain an image of the sample; anda control unit configured to control the movement mechanism to move the sample and to obtain the image of the sample, whereinthe control unit is configured toobtain a reference image of the sample in a reference arrangement state by the charged particles,generate a goal image of the sample in a target arrangement state different from the reference arrangement state by calculation from the reference image,move the sample to each of a plurality of different arrangement states by the movement mechanism, and obtain a candidate image of the sample in each of the plurality of different arrangement states by the charged particles, andgenerate a comparison result between respective candidate images and the goal image.2. The charged particle beam device according to claim 1 , whereinthe control unit is configured to move the sample based on the ...

Подробнее
Номер записи: 99
16-02-2017 дата публикации

METHOD FOR CONTROLLING X-RAY EXPOSURE

Номер: US20170045464A1
Автор: FUNK TOBIAS
Принадлежит: TRIPLE RING TECHNOLOGIES, INC.

The present invention pertains to a system and method for X-ray imaging wherein a targeted fluence at the detector for projection images can be achieved at a plurality of projection angles around the imaging subject by control of exposure times implemented during image acquisition. Exposure time for a second projection image may be determined by the fluence in a first projection image, and in a third projection image by the fluence in a second projection image, where projection images are acquired within two degrees of one another. An acquisition parameter calculation can be configured to calculate acquisition parameters, such as said exposure times, to achieve the targeted fluence in projection images and can be coupled to a rotation controller that implements the acquisition parameters by controlling a relative angle between the imaging subject and X-ray image acquisition device. 1. A method of acquiring an X-ray image of an object comprising:positioning said object in field of view of an X-ray image acquisition device;selecting a set of a plurality of unique projection angles between said X-ray image acquisition device and an axis through said object, wherein said set spans at least 45 degrees around said object;selecting a targeted X-ray exposure at a detector region for each of said projection angles;determining a targeted total exposure time for each of said projection angles corresponding to said targeted X-ray exposure;implementing said plurality of targeted total exposure times in said X-ray image acquisition device over said set of projection angles to acquire an image data set; andreconstructing an X-ray image from said image data set.2. The method of further comprising:increasing said targeted exposure time with at least one of said projection angles based on increase of attenuation at said projection angle.3. The method of further comprising:reducing saturation of said detector by reducing said targeted exposure time with at least one of said projection ...

Подробнее
Номер записи: 100