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Небесная энциклопедия

Космические корабли и станции, автоматические КА и методы их проектирования, бортовые комплексы управления, системы и средства жизнеобеспечения, особенности технологии производства ракетно-космических систем

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Мониторинг СМИ

Мониторинг СМИ и социальных сетей. Сканирование интернета, новостных сайтов, специализированных контентных площадок на базе мессенджеров. Гибкие настройки фильтров и первоначальных источников.

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Поддерживает ввод нескольких поисковых фраз (по одной на строку). При поиске обеспечивает поддержку морфологии русского и английского языка
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Применить Всего найдено 27786. Отображено 100.
10-04-2016 дата публикации

Устройство для контрастного анализа элементного состава вещества с помощью рентгеновского излучения

Номер: RU0000161079U1

Устройство для анализа элементного состава вещества с помощью рентгеновского излучения, включающее источник излучения, образец с механизмом крепления и его перемещения, два детектора рентгеновского излучения для регистрации спектра излучения, прошедшего через образец, отличающееся тем, что устройство содержит вторичный излучатель в виде мозаичного кристалла, жестко закрепленного в подставке с возможностью ее перемещения, кроме того, детекторы рентгеновского излучения расположены симметрично под одним и тем же углом относительно направления брэгговского отражения от мозаичного кристалла. РОССИЙСКАЯ ФЕДЕРАЦИЯ (19) RU (11) (51) МПК G01N 23/223 (13) 161 079 U1 (2006.01) ФЕДЕРАЛЬНАЯ СЛУЖБА ПО ИНТЕЛЛЕКТУАЛЬНОЙ СОБСТВЕННОСТИ (12) ТИТУЛЬНЫЙ (21)(22) Заявка: ЛИСТ ОПИСАНИЯ ПОЛЕЗНОЙ МОДЕЛИ К ПАТЕНТУ 2015132833/28, 06.08.2015 (24) Дата начала отсчета срока действия патента: 06.08.2015 (45) Опубликовано: 10.04.2016 Бюл. № 10 1 6 1 0 7 9 R U (57) Формула полезной модели Устройство для анализа элементного состава вещества с помощью рентгеновского излучения, включающее источник излучения, образец с механизмом крепления и его перемещения, два детектора рентгеновского излучения для регистрации спектра излучения, прошедшего через образец, отличающееся тем, что устройство содержит вторичный излучатель в виде мозаичного кристалла, жестко закрепленного в подставке с возможностью ее перемещения, кроме того, детекторы рентгеновского излучения расположены симметрично под одним и тем же углом относительно направления брэгговского отражения от мозаичного кристалла. Стр.: 1 U 1 U 1 (54) УСТРОЙСТВО ДЛЯ КОНТРАСТНОГО АНАЛИЗА ЭЛЕМЕНТНОГО СОСТАВА ВЕЩЕСТВА С ПОМОЩЬЮ РЕНТГЕНОВСКОГО ИЗЛУЧЕНИЯ 1 6 1 0 7 9 Адрес для переписки: 308015, Белгородская обл., г. Белгород, ул. Победы, 85, ОИС НИУ "БелГУ", Цурикова Н.Д. (73) Патентообладатель(и): Федеральное государственное автономное образовательное учреждение высшего профессионального образования "Белгородский государственный национальный исследовательский ...

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02-02-2012 дата публикации

Cryogenic specimen holder

Номер: US20120024086A1
Принадлежит: Fischione E A Instruments Inc

An improved cryogenic specimen holder for imaging and analysis facilitates imaging at very high tilt angles with a large field of view. A retractable specimen holder tip protects the specimen during transport. An optimized Dewar design is positioned at a fixed, tilted angle with respect to the axis of the holder, providing a means of continuously cooling the specimen irrespective of the high tilt angle and the amount of liquid nitrogen present in the vessel. The Dewar neck design reduces the entrapment of nitrogen gas bubbles and its shape prevents the spilling of liquid nitrogen at high tilt angles. The specimen holder has a retractable tip that completely encapsulates the specimen within a shielded environment internal to the specimen holder body. The cooling and specimen transfer mechanisms reduce thermal drift and the detrimental effects of vibrations generated by both the evaporation of liquid nitrogen present in the Dewar as well as other environmental effects.

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02-02-2012 дата публикации

Charged particle beam system

Номер: US20120025094A1
Автор: Gerd Benner, Harald Niebel
Принадлежит: Carl Zeiss NTS GmbH

A charged particle beam system for performing precession diffraction includes a lens 11 for focusing a beam 5 in an object plane 9, and an objective lens 13 having a diffraction plane 27. A doublet 53 of lenses 35, 63 images the diffraction plane 27 into an intermediate diffraction plane 69 where a multipole 55 is located. A doublet 57 of lenses 65, 93 images the intermediate diffraction plane 69 into an intermediate diffraction plane 71 where a multipole 59 is located. A first deflection system 15 upstream of the object plane 9 can tilt to change an angle of incidence of the beam on the object plane. A second deflection system 37 between lenses 35 and 63 tilts the beam such that the change of the angle of incidence of the charged particle beam on the object plane is compensated.

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16-02-2012 дата публикации

Performance evaluation method with x-ray and its usage

Номер: US20120037800A1
Принадлежит: Hoya Corp, Hoya Lens Thailand Ltd

An aspect of the present invention relates to a method of evaluating performance of a film-forming material for forming a functional film on an eyeglass lens substrate or a functional film formed by the use of the film-forming material. The performance to be evaluated is selected from the group consisting of a sliding sensation of a surface of the functional film and an adhesion of the functional film, and the evaluation is conducted based on a change over time in a quantity of photoelectrons generated by irradiating with an X-ray the film-forming material or the functional film.

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01-03-2012 дата публикации

X-ray fluorescence analyzer and x-ray fluorescence analysis method

Номер: US20120051507A1
Принадлежит: SII NanoTechnology Inc

The X-ray fluorescence analyzer ( 100 ) includes: an enclosure ( 10 ); a door ( 20 ) for putting the sample into and out of the enclosure; a height measurement mechanism ( 7 ) capable of measuring a height at the irradiation point; a moving mechanism control unit ( 9 ) for adjusting a distance between the sample and the radiation source as well as the X-ray detector based on the measured height at the irradiation point; a laser unit ( 7 ) for irradiating the irradiation point with a visible light laser beam; a laser start control unit ( 9 ) for irradiating the visible light laser beam by the laser unit ( 7 ) when the door is open state; and a height measurement mechanism start control unit ( 9 ) for starting the height measurement mechanism to measure the height at the irradiation point when the door is opened.

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01-03-2012 дата публикации

X-ray scattering measurement device and x-ray scattering measurement method

Номер: US20120051518A1
Принадлежит: Rigaku Corp

A X-ray scattering measurement device and measurement method can measure, with high resolution, the intensity of X-rays which have undergone small-angle scattering and diffraction with reflection geometry and can easily and accurately measure a microstructure on the surface of a sample. The X-ray scattering measurement device is suitable for microstructural measurement on the surface of a sample includes an X-ray source that generates an X-ray; a first mirror and a second mirror that continuously reflect the generated X-ray; a sample stage that supports the sample; and a two-dimensional detector that detects the X-ray scattered on the surface of the sample. The first mirror focuses the generated X-ray onto the two-dimensional detector within a plane parallel to the surface of the sample, and the second mirror focuses the X-ray reflected by the first mirror onto the surface of the sample within a plane perpendicular to the surface of the sample.

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22-03-2012 дата публикации

System and method for x-ray inspection

Номер: US20120069964A1
Автор: Axel Scholling
Принадлежит: SMITHS HEIMANN GMBH

Methods and systems for x-ray inspection are provided. The system can include a source of radiant energy configured so that the radiant energy traverses a scanning volume. The system can further include a filter between the source and the scanning volume, a conveying apparatus configured to impart relative motion between an exposure-limited subject and the scanning volume, a conveyance monitor configured to generate conveyance data reflecting a conveyance state of the exposure-limited subject, a radiant energy sensing apparatus configured to sense radiant energy from the source and to generate source radiant energy data, and a dose controller configured to acquire conveyance data, source radiant energy data, and a signal related to subject dose data, and to generate a measure that a portion of the exposure-limited subject has acquired a dose of radiant energy above a dose threshold.

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12-04-2012 дата публикации

Line tension measuring device

Номер: US20120085017A1
Автор: David F. Pekin
Принадлежит: Individual

One exemplary embodiment of the invention is a translation stage including a receiving portion adapted to receive a fishing reel, a mounting portion adapted for mounting to a fishing pole, wherein the receiving portion is movably affixed to said mounting portion along a first direction; and a force measurement device configured to produce a response indicative of the force between the base portion and the mounting portion along the first direction. Another embodiment is a fishing reel including a frame for supporting a line spool, a base portion, a line spool rotatably mounted within the frame, a mounting portion adapted for mounting to a fishing pole, the base portion is movably affixed to the mounting portion along a first direction; and a force measurement device.

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03-05-2012 дата публикации

Method for predicting weight gain associated with a pharmaceutical therapy

Номер: US20120108947A1
Автор: Jennifer Kay Leohr
Принадлежит: Eli Lilly and Co

Methods for using TRL V6 as a biomarker for the risk of weight gain associated with treatment of a patient with a pharmaceutical agent, as for example, olanzapine.

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17-05-2012 дата публикации

Method and Apparatus for Rapid Preparation of Multiple Specimens for Transmission Electron Microscopy

Номер: US20120119084A1
Принадлежит: NANOTEM Inc

A method and apparatus for in-situ lift-out rapid preparation of TEM samples. The invention uses adhesives and/or spring-loaded locking-clips in order to place multiple TEM-ready sample membranes on a single TEM support grid and eliminates the use of standard FIB-assisted metal deposition as a bonding scheme. Therefore, the invention circumvents the problem of sputtering from metal deposition steps and also increases overall productivity by allowing for multiple samples to be produced without opening the FIB/SEM vacuum chamber.

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31-05-2012 дата публикации

Method and system for deriving molecular interference functions from xrd profiles

Номер: US20120133516A1
Автор: Geoffrey Harding
Принадлежит: Morpho Detection LLC

A method for identifying a substance includes determining a first molecular interference function (MIF) for a first substance. The method also includes determining a second MIF for a second substance. The method further includes generating a residual MIF at least partially based on a comparison of the second MIF to the first MIF. The method also includes identifying the type of substance based on the residual MIF.

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21-06-2012 дата публикации

Detecting forgery of Art, Bonds and Other Valuables by Neutron Activation and Method Thereof

Номер: US20120155593A1
Автор: Ioan G. Crihan
Принадлежит: Individual

Apparatus and method for detecting forgery by neutron activation of art objects or other valuables such as bonds, wills, etc. comprising of a device applying neutron irradiation to a reference spot sufficient to produce radiation including gamma rays; immediately thereafter, a device and method of the invention determines and records the rate of emission as a function of time that results from the application of the thermal neutron irradiation to the reference spot and produces ‘initial’ data thereof; at one or several selected subsequent intervals thereafter, the device and method determines and records the quantitative measures of the radiation emission in the gamma ranges of energy emanating from the reference spot taken at time intervals after activation and produces ‘subsequent’ data, and a device and method compares ‘initial’ data with ‘subsequent’ data.

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05-07-2012 дата публикации

Nuclear gauges and methods of configuration and calibration of nuclear gauges

Номер: US20120169456A1
Принадлежит: Individual

Nuclear gauges and method of configuration and methods of calibrations of the nuclear gauges are provided. The nuclear gauges are used in measuring the density and/or moisture of construction-related materials. The nuclear gauge can include a gauge housing having a vertical cavity therethrough and at least one radiation detector located within the housing. The nuclear gauge can include a vertically moveable source rod and a radiation source operatively positioned within a distal end of the source rod.

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30-08-2012 дата публикации

An x-ray detector system for assessing the integrity and performance of radiation protective garments

Номер: US20120219113A1
Автор: Thomas J. Beck
Принадлежит: Beck Thomas J

A method for quantitatively testing a radiation shielding garment to determine its radiation shielding integrity, utilizing a fluoroscopic system, the method comprising measuring the amount of radiation passing through the garment at a particular location believed to be possibly damaged; measuring the amount of radiation at one or more locations of the garment believed to be intact; determining the average undamaged transmission if more than one location is tested; and comparing the two values of transmitted radiation to determine whether the first location was damaged beyond an acceptable degree.

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06-09-2012 дата публикации

Adaptive scanning of materials using nuclear resonance fluorescence imaging

Номер: US20120224669A1
Принадлежит: Passport Systems Inc

A method for detecting nuclear species in a sample by adaptive scanning using nuclear resonance fluorescence may comprise illuminating the target sample with photons from a source; detecting a signal in an energy channel; determining a scan evaluation parameter using the signal detected; determining whether the scan evaluation parameter meets a detection efficiency criterion; adjusting one or more system parameters such that the scan evaluation parameter meets the detection efficiency criterion; and comparing the signal in an energy channel to a predetermined species detection criterion to identify a species detection event. In another embodiment, detecting a signal in an energy channel may further comprise detecting photons scattered from the target sample. In another embodiment, detecting a signal in an energy channel may further comprise detecting photons transmitted through the target sample and scattered from at least one reference scatterer.

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27-09-2012 дата публикации

Mask inspection apparatus and mask inspection method

Номер: US20120241645A1
Принадлежит: Individual

According to one embodiment, a mask inspection apparatus includes a decompression chamber, a holder, a light irradiation unit, a detection unit, an electrode, and a control unit. The holder is provided in the decompression chamber and holds a mask. The light irradiation unit irradiates a major surface of the mask held by the holder with a light. The detection unit is provided in the decompression chamber to detect electrons generated when the major surface of the mask is irradiated with the light. The electrode is provided between the holder and the detection unit and guides the electrons in a direction from the holder toward the detection unit. The control unit compares a detection result of the electrons detected by the detection unit with a reference value.

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18-10-2012 дата публикации

System and method for correcting x-ray diffraction profiles

Номер: US20120263275A1
Принадлежит: Morpho Detection LLC

A method for correcting an X-ray diffraction (XRD) profile measured by an X-ray diffraction imaging (XDi) system is provided. The XDi system includes an anode, a detector, and a control system. The method includes obtaining an emission spectrum of the anode using the control system. The emission spectrum includes spectral structures. The method further includes calculating a piecewise spectral-correction function using the spectral structures in the emission spectrum, obtaining a measured spectrum of an object, and applying the spectral-correction function to the measured spectrum to generate a spectrally-corrected measured spectrum.

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18-10-2012 дата публикации

Protection device for x-ray instrumentation

Номер: US20120263278A1
Автор: Monte J. Solazzi
Принадлежит: Solazzi Monte J

An accessory, method, and system is provided for protecting the lower chamber of X-ray spectroscopic instrumentation during analysis, the instrumentation including an upper chamber, a lower chamber, and a dividing plate, the lower chamber including an X-ray detector and an excitation source, the accessory including: a frame with a centrally-located aperture extending from one side of the frame to an opposite side of the frame; an adhesive layer disposed on each side of the frame; a thin film of polymeric material disposed on one side of the frame; and a removably attached release sheet on the adhesive layer disposed on the opposite side of the frame, where the accessory is disposed on a surface of the dividing plate to protect the lower chamber of the instrumentation from damage.

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25-10-2012 дата публикации

Versatile X-Ray Beam Scanner

Номер: US20120269319A1
Принадлежит: American Science and Engineering Inc

Apparatus for interrupting and/or scanning a beam of penetrating radiation, such as for purposes of inspecting contents of a container. A source, such as an x-ray tube, generates a fan beam of radiation effectively emanating from a source axis, with the width of the fan beam collimated by a width collimator, such as a clamshell collimator. An angular collimator, stationary during the course of scanning, limits the extent of the scan, and a multi-aperture unit, such as a hoop, or a nested pair of hoops, is rotated about a central axis, and structured in such a manner that the total beam fluence incident on a target is conserved for different fields of view of the beam on the target. The central axis of hoop rotation need not coincide with the source axis.

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29-11-2012 дата публикации

Method of Extracting Contour Lines of Image Data Obtained By Means of Charged Particle Beam Device, and Contour Line Extraction Device

Номер: US20120300054A1
Принадлежит: Hitachi High Technologies Corp

The present invention is intended to provide a contour extraction method and a contour extraction device with an objective of either suppression of unnecessary contouring processings or selective contouring of necessary portions. To attain the objective, provided are a contour extraction method, and a device, with which contours of pattern edges on an image formed based on charged particles emitted from a sample are extracted and, when contouring of a pattern located in an overlapping region provided in connecting images of plural image-capturing regions to form a synthesized image is performed, either areas of the pattern in the plurality of image-capturing regions, or a pre-set measurement portion is found, and selective contour extraction of the pattern with respect to an image of an image-capturing region is carried out either on a side where the area is large, or on a side where a measurement portion regarding the pattern is located.

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20-12-2012 дата публикации

Pattern measurement apparatus and pattern measurement method

Номер: US20120318976A1
Принадлежит: Individual

A pattern measurement apparatus scans an observation region of a sample surface with an electron beam and detects secondary electrons emitted from the sample surface with the irradiation of the electron beam, by using a plurality of electron detectors arranged around the optical axis of the electron beam. Images are taken in two directions that are orthogonal to a pattern extending direction, and are opposite to each other across the optical axis. Then, profiles of a line orthogonal to each of edges are extracted from the images, and a subtraction between the line profiles is taken to obtain a subtractive profile. The position of an upper end of each edge is detected based on a descending portion of the subtractive profile, and the position of a lower end of the edge is detected based on a rising portion or a descending portion of one of the line profiles.

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20-12-2012 дата публикации

Solid material characterization with x-ray spectra in both transmission and fluoresence modes

Номер: US20120321039A1
Принадлежит: UOP LLC

Methods are disclosed utilizing synchrotron X-ray microscopy including x-ray fluorescence and x-ray absorption spectra to probe elemental distribution and elemental speciation within a material, and particularly a solid that may have one or more elements distributed on a solid substrate. Representative materials are relatively homogeneous in composition on the macroscale but relatively heterogeneous on the microscale. The analysis of such materials, particularly on a macroscale at which their heterogeneous nature can be observed, provides valuable insights into the relationships or correlations between localized concentrations of elements and/or their species, and concentrations of other components of the materials. Sample preparation methods, involving the use of a reinforcing agent, which are advantageously used in such methods are also disclosed.

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20-12-2012 дата публикации

Patient alignment system with external measurement and object coordination for radiation therapy system

Номер: US20120323516A1
Принадлежит: LOMA LINDA UNIVERSITY

A patient alignment system for a radiation therapy system. The alignment system includes multiple external measurement devices which obtain position measurements of components of the radiation therapy system which are movable and/or are subject to flex or other positional variations. The alignment system employs the external measurements to provide corrective positioning feedback to more precisely register the patient and align them with a radiation beam. The alignment system can be provided as an integral part of a radiation therapy system or can be added as an upgrade to existing radiation therapy systems.

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03-01-2013 дата публикации

Neutral Particle Microscope

Номер: US20130001413A1
Автор: Philip James Witham
Принадлежит: Individual

The invention includes a source stream of neutral particles (neutral atoms and neutral molecules, but not neutrons) in free molecular flow, a beam forming element disposed within the source stream having at least one small aperture located proximal to the sample allowing part of the source stream to pass through the aperture as a beam of neutral particles directed at the sample for revealing the sample, a control positioner for scanning the beam of neutral particles over or through portions of said sample surface, optionally one or more detector nozzles having an inlet positioned to collect neutral particles proceeding from or through the sample surface in free molecular flow, at least one detector, the detector arranged to sense neutral particles proceeding from the sample, and a processor connected to the detector and control positioner for generating an image of said sample.

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03-01-2013 дата публикации

Adjustable-Jaw Collimator

Номер: US20130003936A1
Принадлежит: American Science and Engineering Inc

An adjustable collimator for shaping a beam of particles, such as for purposes of inspecting contents of a container. The adjustable collimator has an obscuring element substantially opaque to passage of the particles in a propagation direction that is radial with respect to the axis of rotation of a ring of apertures. A gap in the obscuring element may be characterized by a length taken along a long dimension and a jaw spacing taken along narrow dimension, and at least one of the length of the gap and the jaw spacing is subject to adjustment, either manual or automatic. The adjustable collimator may be disposed either inside or outside the ring of apertures, and, in some embodiments, the jaw spacing may be a function of distance along the long dimension relative to an edge of the gap.

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31-01-2013 дата публикации

Methods, systems, and computer program products for measuring the density of material including an electromagnetic moisture property detector

Номер: US20130026354A1
Автор: Robert E. Troxler
Принадлежит: Troxler Electronic Laboratories Inc

The subject matter described herein includes methods, systems, and computer program products for measuring the density of a material. According to one aspect, a material property gauge includes a nuclear density gauge for measuring the density of a material. A radiation source adapted to emit radiation into a material and a radiation detector operable to produce a signal representing the detected radiation. A first material property calculation function may calculate a value associated with the density of the material based upon the signal produced by the radiation detector. The material property gauge includes an electromagnetic moisture property gauge that determines a moisture property of the material. An electromagnetic field generator may generate an electromagnetic field where the electromagnetic field sweeps through one or more frequencies and penetrates into the material. An electromagnetic sensor may determine a frequency response of the material to the electromagnetic field across the several frequencies.

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31-01-2013 дата публикации

Differential phase contrast x-ray imaging system and components

Номер: US20130028378A1
Принадлежит: JOHNS HOPKINS UNIVERSITY

A differential phase contrast X-ray imaging system includes an X-ray illumination system, a beam splitter arranged in an optical path of the X-ray illumination system, and a detection system arranged in an optical path to detect X-rays after passing through the beam splitter.

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14-02-2013 дата публикации

Charged-particle microscope providing depth-resolved imagery

Номер: US20130037715A1
Принадлежит: FEI Co

A method of examining a sample using a charged-particle microscope, comprising the following steps: Mounting the sample on a sample holder; Using a particle-optical column to direct at least one beam of particulate radiation onto a surface S of the sample, thereby producing an interaction that causes emitted radiation to emanate from the sample; Using a detector arrangement to detect at least a portion of said emitted radiation, which method comprises the following steps: Recording an output O n of said detector arrangement as a function of emergence angle θ n of said emitted radiation, measured relative to an axis normal to S, thus compiling a measurement set M={(O n , θ n )} for a plurality of values of θ n ; Using computer processing apparatus to automatically deconvolve the measurement set M and spatially resolve it into a result set R={(V k , L k )}, in which a spatial variable V demonstrates a value V k at an associated discrete depth level L k referenced to the surface S, whereby n and k are members of an integer sequence, and spatial variable V represents a physical property of the sample as a function of position in its bulk.

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28-02-2013 дата публикации

Method of observing cross-section of cosmetic material

Номер: US20130050431A1
Принадлежит: Shiseido Co Ltd

A method of observing a cross-section of a cosmetic material includes a sample forming step of forming a sample by providing a cosmetic material on a sample holder; a freezing step of freezing the sample; a cutting step of forming a cut surface on the sample by processing the frozen sample by a focused ion beam; and a cut surface image processing step of obtaining a cut surface image of the cut surface using a scanning electron microscope.

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28-02-2013 дата публикации

Method and apparatus for material analysis by a focused electron beam using characteristic x-rays and back-scattered electrons

Номер: US20130054153A1
Автор: David MOTL, Vojtech FILIP
Принадлежит: Tescan AS

A material analysis method by a focused electron beam and an equipment for performing such an analysis where an electron map B is created describing the intensity of emitted back-scattered electrons at various points on a sample, and a spectral map S is created describing the intensity of emitted X-rays at points on the sample depending on the radiation energy. For selected chemical elements, X-ray maps M i are created representing the intensity of X-rays characteristic for such elements. The X-ray maps M i and the electron map B are converted into differential X-ray maps D i , which are subsequently merged into a final differential X-ray map D. The final differential X-ray map D is then used to search particles. Subsequently, a cumulative X-ray spectrum X j is calculated for each particle and subsequently the classification of particles based on the peak intensities and the intensity of back-scattered electron is performed.

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21-03-2013 дата публикации

Adjustable cathodoluminescence detection system and microscope employing such a system

Номер: US20130068966A1

Cathodoluminescence detection system comprising a collecting optic ( 112 ), for collecting light radiation coming from a specimen illuminated by a beam of charged particles and reflecting said light radiation onto analysis means, characterized in that it comprises means ( 606,614 - 618 ) for positioning said collecting optic ( 112 ) along at least one dimension.

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28-03-2013 дата публикации

Analysis method for x-ray diffraction measurement data

Номер: US20130077754A1
Принадлежит: Rigaku Corp

Peak positions and integrated intensities of diffraction X-ray are determined on the basis of X-ray diffraction measurement data output from an X-ray diffractometer, the number of determined peaks of the diffraction X-ray is counted, and analysis processing is started when the counted number of peaks reaches a preset peak number. The analysis processing is repetitively executed on the basis of X-ray diffraction measurement data. The peak positions and the integrated intensities of the diffraction X-ray are determined from the X-ray diffraction measurement data obtained from the start of the measurement till the analysis processing concerned, and qualitative analysis of collating the determined peak positions and integrated intensities with standard peak card data whose data base is made in advance and searching materials contained in a measurement sample, and quantitative analysis of determining the quantities of the materials contained in the measurement sample are executed.

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28-03-2013 дата публикации

System for analyzing a granulate for producing a pharmaceutical product

Номер: US20130077755A1
Принадлежит:

An apparatus for analyzing a granulate for producing a pharmaceutical product has a data receiving unit adapted for receiving X-ray diffraction data indicative of a scattering of X-rays irradiated onto the granulate, a processor unit adapted for processing the X-ray diffraction data to derive information indicative of a compressibility and/or a dissolution characteristic of the granulate, and a control unit adapted for controlling a process of producing a pharmaceutical product based on the derived information. 118-. (canceled)19. An apparatus for analyzing a granulate for producing a pharmaceutical product , the apparatus comprising:a data receiving unit structured for receiving X-ray diffraction data indicative of a scattering of X-rays irradiated onto the granulate, the X-ray diffraction data resulting from Small Angle X-Ray Scattering;a processor unit structured for processing the X-ray diffraction data to derive information indicative of at least one of a compressibility and a dissolution characteristic of the granulate, the processor unit thereby being structured to derive at least one of a second momentum integral of a measurement spectrum and a Porod constant; anda control unit structured for controlling a process of producing a pharmaceutical product based on the derived information.20. The apparatus of claim 19 , wherein the processor unit is structured for processing the X-ray diffraction data to derive information regarding different components of a granulate consisting essentially of multiple solid components.21. The apparatus of claim 19 , wherein the data receiving unit is also structured for receiving X-ray diffraction data resulting from Wide Angle X-Ray Scattering.22. The apparatus of claim 21 , wherein the processor unit is structured for processing the Wide Angle X-Ray Scattering data to derive information indicative of a quality-related property of a physiologically active substance of the granulate claim 21 , a property indicative of a ...

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28-03-2013 дата публикации

MATERIAL SORTING TECHNOLOGY

Номер: US20130079918A1
Принадлежит: SPECTRAMET, LLC

Systems for sorting materials, such as those made of metal, are described. The systems may operate by irradiating the materials with x-rays and then detecting fluoresced x-rays, transmitted x-rays, or both. Detection of the fluoresced x-rays may be performed using an x-ray fluorescence detector array. The systems may be configured to provide high throughput sorting of small pieces of materials. 1. A material sorting system , comprising:a conveyor configured to convey pieces of material;an x-ray source configured to irradiate the pieces of material with incident x-rays as they are conveyed by the conveyor to generate fluoresced x-rays from the pieces of material and transmitted x-rays transmitted through the pieces of material;an x-ray fluorescence detector array configured to detect the fluoresced x-rays and produce x-ray fluorescence data; andan x-ray transmission detector configured to detect the transmitted x-rays and produce x-ray transmission data.2. The material sorting system of claim 1 , further comprising a processor configured to:receive the x-ray fluorescence data and the x-ray transmission data;determine thickness data for one or more of the pieces based at least in part on the x-ray transmission data; andcombine the thickness data with the x-ray fluorescence data to determine at least a partial composition of one or more of the pieces of material.3. The material sorting system of claim 2 , wherein the x-ray transmission data comprises data about two or more energy levels claim 2 , and wherein the processor is configured to determine the thickness data at least in part by comparison of the x-ray transmission data of the two or more energy levels.4. The material sorting system of claim 1 , wherein the x-ray fluorescence detector array comprises an array of x-ray fluorescence detectors configured to detect fluoresced x-rays from pieces of material disposed on different parts of the conveyor.5. The material sorting system of claim 4 , wherein the array of x ...

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04-04-2013 дата публикации

METHOD AND PARTICLE BEAM DEVICE FOR PRODUCING AN IMAGE OF AN OBJECT

Номер: US20130082175A1
Автор: Jaksch Heiner
Принадлежит:

A system for producing an image of an object using a particle beam device is provided. A particle source is used to generate primary particles, in which the primary particles have a primary energy. The primary particles are delivered to an object, in which the primary particles form a particle beam. Interaction particles which are scattered back by the object in the direction of the particle source are detected with at least one energy-resolving detector. Detection signals, which are obtained through the detection, are evaluated in terms of an energy which the detected interaction particles have. The detection signals which stem from the detected interaction particles whose energy deviates by less than 500 eV from the primary energy are selected. An image of the object is produced, in which only the selected detection signals are used to produce the image. 1. A method for producing an image of an object using a particle beam device , comprising:generating primary particles using a particle source, wherein the primary particles have a primary energy;delivering the primary particles to an object, wherein the primary particles form a particle beam;detecting, using at least one energy-resolving detector, interaction particles which are scattered back by the object in the direction of the particle source;evaluating detection signals, which are obtained through the detection, in terms of an energy of the detected interaction particles;selecting the detection signals which stem from the detected interaction particles whose energy deviates by less than 500 eV from the primary energy; andproducing an image of the object, wherein only the selected detection signals are used to produce the image.2. The method according to claim 1 , wherein only those detection signals which stem from the detected interaction particles whose energy deviates by less than 100 eV from the primary energy are selected.3. The method according to claim 1 , wherein the detection takes place using a ...

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11-04-2013 дата публикации

METHOD FOR DETERMINING NUMBER OF LAYERS OF TWO-DIMENSIONAL THIN FILM ATOMIC STRUCTURE AND DEVICE FOR DETERMINING NUMBER OF LAYERS OF TWO-DIMENSIONAL THIN FILM ATOMIC STRUCTURE

Номер: US20130087705A1
Принадлежит:

Provided is a versatile method of determining the number of layers of a two-dimensional atomic layer thin film as compared with conventional methods. An electron beam is radiated to a two-dimensional thin film atomic structure having an unknown number of layers to determine the number of layers based on an intensity of reflected electrons or secondary electrons generated thereby. In particular, this method is effective for determining the number of layers of graphene. 116-. (canceled)17. A method of determining a number of layers of a two-dimensional thin film atomic structure , the method comprising:(a) acquiring an electron image of reflected electrons or secondary electrons generated by radiating an electron beam to a two-dimensional atomic layer thin film having an unknown number of layers and a substrate supporting the two-dimensional atomic layer thin film;(b) obtaining a relative intensity ratio of the electron image of the two-dimensional atomic layer thin film to an electron image of the substrate; and(c) determining the number of layers of the two-dimensional atomic layer thin film based on the relative intensity ratio.18. A method of determining a number of layers of a two-dimensional thin film atomic structure according to claim 17 , wherein the (c) comprises using a calibration curve indicating a relationship between the relative intensity ratio and the number of layers to determine the number of layers corresponding to the relative intensity ratio obtained in the (b) on the calibration curve as the number of layers of the two-dimensional atomic layer thin film having the unknown number of layers.19. A method of determining a number of layers of a two-dimensional thin film atomic structure according to claim 17 , further comprising:(d) acquiring electronic images of the reflected electrons or the secondary electrons generated by radiating the electronic beam to a plurality of two-dimensional atomic layer thin films having different numbers of layers and ...

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11-04-2013 дата публикации

Evaluation System and Evaluation Method of Plastic Strain

Номер: US20130089182A1
Принадлежит: HITACHI LTD

An evaluation system for plastic strain includes an X-ray diffraction device for irradiating the surface of a measurement object; and an image analyzing device that generates diffraction intensity curves from X-ray diffraction angle and intensity with an implanted database, which can be obtained in advance from test specimens made of the same material of the measurement object, establishing at least one of the relations between the full width at half maximum of the diffraction intensity curve and plastic strain, and between the integral intensity angular breadth of diffraction intensity curve and plastic strain. The image analyzing device obtains plastic strain of the measurement object based on at least one of the diffraction parameters of the full width at half maximum and the integral intensity angular breadth of a diffraction intensity curve corresponding to the implanted database indicative of the relation between the diffraction parameter and plastic strain.

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11-04-2013 дата публикации

ATOMIC-SCALED ELECTRONIC SPECTRUM INFORMATION PURIFICATION

Номер: US20130090865A1
Автор: Sun Changqing
Принадлежит: NANYANG TECHNOLOGICAL UNIVERSITY

Disclosed is a method for electronic residual spectroscopy for atomic-scaled surface and sub-surface information purification. The method comprises collecting at least one reference spectrum and a plurality of spectra under various conditions. The background of all the plurality of spectra is then subtracted and the plurality of spectra are normalized. Subtracting the reference spectrum from the normalized plurality of spectra will give atomic-scaled, meaningful information at selected zones. 18.-. (canceled)9. A method for electronic residual spectroscopy information purification for obtaining atomic-scaled , meaningful information of a surface and sub-surface of a sample , the method comprising:collecting at least one reference spectrum, wherein the at least one reference spectrum is from a clean and as close to perfect surface as possible;collecting a plurality of spectra from the surface of the sample under varied conditions;subtracting the background of all the plurality of spectra;normalizing the plurality of spectra; andsubtracting the reference spectrum from the normalized plurality of spectra to give the meaningful information.10. A method as claimed in claim 12 , wherein the background is subtracted using the standard linear or Shirley methodology.11. A method as claimed in claim 12 , wherein the normalizing of the plurality of spectra is based on a constraint of spectra area conservation to minimize effect of surface scattering.12. A method as claimed in claim 12 , further comprising calibrating and specifying residual spectra based on physical and chemical knowledge of the sample.13. A method as claimed in claim 12 , wherein the varied conditions comprise experimental conditions claim 12 , the experimental conditions comprising at least one selected from the group consisting of: emission angle claim 12 , beam energy claim 12 , crystal orientation claim 12 , and temperature.14. A method as claimed in claim 16 , wherein the emission angle is in the range 0 ...

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25-04-2013 дата публикации

X-RAY DIFFRACTION CONTRAST TOMOGRAPHY (DCT) SYSTEM, AND X-RAY DIFFRACTION CONTRAST TOMOGRAPHY (DCT) METHOD

Номер: US20130101078A1
Принадлежит: DANMARKS TEKNISKE UNIVERSITET

An X-ray diffraction contrast tomography system (DCT) comprising a laboratory X-ray source (), a staging device () rotating a polycrystalline material sample in the direct path of the X-ray beam, a first X-ray detector () detecting the direct X-ray beam being transmitted through the crystalline material sample, a second X-ray detector () positioned between the staging device and the first X-ray detector for detecting diffracted X-ray beams, and a processing device () for analysing detected values. The crystallographic grain orientation of the individual grain in the polycrystalline sample is determined based on the two-dimensional position of extinction spots and the associated angular position of the sample for a set of extinction spots pertaining to the individual grain. 1. An X-ray diffraction contrast tomography method of determining a multi-dimensional representation of grain structures in a polycrystalline material sample having grains , wherean X-ray source provides an X-ray beam in a direct path,a staging device positions and rotates the polycrystalline material sample in the direct path of the X-ray beam,an X-ray detector detects diffraction spots from diffracted X-ray beams leaving the crystalline material sample,a processing device analyses values received from the X-ray detector and representing diffraction spots;wherein the processing device based on the values received from said X-ray detector determines at least one of the following characteristics: a) the crystal structure of one or more individual crystalline phases present in the sample, and b) strain in grains in the polycrystalline material sample, andwherein said X-ray source is a laboratory X-ray source having a target piece of metal, which X-ray source provides a continuous output spectrum of X-rays with sharp peaks in intensity at certain energies depending on the metal of the target piece.2. An X-ray diffraction contrast tomography method according to claim 1 , wherein an X-ray detector ...

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25-04-2013 дата публикации

X-RAY FLUORESCENCE SPECTROMETER AND X-RAY FLUORESCENCE ANALYZING METHOD

Номер: US20130101085A1
Принадлежит: RIGAKU CORPORATION

The X-ray fluorescence spectrometer of the present invention includes a sample table () for a sample (S) having a crystalline structure, an X-ray source (), a detecting unit () for detecting secondary X-rays () from the sample (S), a rotating unit () for rotating the sample table (), a parallel translating unit () for causing the sample table () to undergo a parallel translational movement, a selecting unit () for selecting three of circumvent angles, at which diffracted X-rays can be circumvented, based on a diffraction profile obtained from the angle of rotation of the sample (S) and the intensity of secondary X-rays (), the interval between the neighboring circumvent angles being smaller than 180°, and a control unit () for controlling the rotating unit () so as to set the sample (S) at the circumvent angle at which the sample table () will not interfere with any other structures. 1. An X-ray fluorescence spectrometer which comprises:a sample table on which a sample having a crystalline structure is placed;an X-ray source for irradiating the sample with primary X-rays;a detecting unit for detecting secondary X-rays emitted from the sample;a rotating unit for rotating the sample table about an axis vertical to a sample measuring surface;a parallel translating unit for parallel translating the sample table to allow the primary X-rays to be directed to an arbitrarily chosen position of a half portion of the sample measuring surface while the rotating unit is halted;a control unit for storing a diffraction profile, in which the intensity of the secondary X-rays, emitted from the sample and incident on the detecting unit, and an angle of rotation of the sample are correlated with each other, by radiating the primary X-rays from the X-ray source, while the sample is rotated by the rotating unit an angle of 360 degrees about a predetermined point of the sample, and then displaying the diffraction profile by means of a display unit; anda selecting unit for allowing an ...

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25-04-2013 дата публикации

Methods to Perform Backscatter Inspection of Complex Targets in Confined Spaces

Номер: US20130101090A1
Принадлежит: AMERICAN SCIENCE AND ENGINEERING, INC.

Embodiments of backscatter inspection systems include features to enable inspection of irregular surfaces, tight spacer, and other hard-to-reach places. Some embodiments include arms that maneuver a scan head with at least three degrees of freedom, and some embodiments include arms that maneuver a scan head with at least seven degrees of freedom. Some embodiments include proximity detectors on a scan head or base, detect contact with an object being inspected, and to slow or stop the motion of the system accordingly. Some compact embodiments scan the interior of an object from within, and include a rotating, low-energy source of penetrating radiation, and at least one backscatter detector, which may be stationary, or may rotate with the source. 1. A nimbly positionable backscatter inspection system , the system comprising:a base;an arm coupled to the base, the arm comprising a first segment, a second segment, and a third segment, as well as a first movable joint coupling the first segment to the second segment, and a second movable joint coupling the second segment to the third segment; a source of penetrating radiation for generating a pencil beam of penetrating radiation, the pencil beam characterized by a beam axis, and', 'a primary detector configured to detect scattered penetrating radiation;, 'a scan head coupled to the third segment, the scan head comprising'}wherein the scan head is movable in at least 3 to 7 degrees of freedom with respect to the base, and the system is capable of capturing backscatter radiation in a plurality of orientations by moving the scan head while the first segment remains stationary with respect to the base.2. The nimbly positionable backscatter inspection system of claim 1 , wherein at least one of the first and second segments is extendable.3. The nimbly positionable backscatter inspection system of claim 1 , wherein the third segment has an axis along its length claim 1 , and scan head is rotatable around the axis.4. The nimbly ...

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25-04-2013 дата публикации

Sealed Detector Array for the Collection of Both Wide Angle and Small Angle X-Ray Scattering

Номер: US20130101091A1
Принадлежит: RIGAKU INNOVATIVE TECHNOLOGIES, INC.

A detector system for capturing and resolving WAXS and SAXS beams is provided along with a device for determining structural information of a material incorporating said detector system and a method for examining the structure of a material using said detector system. The detector system generally comprises a sample capable of interacting with the incident x-ray beam, a primary detector and a secondary detector. Upon interaction with a sample of the material, the incident x-ray beam is scattered into wide angle x-ray scattering (WAXS) beams and small angle x-ray scattering (SAXS) beams that are captured by the primary or secondary detectors. 1. A detector system for capturing and resolving an incident x-ray beam , the system comprising:a sample capable of interacting with the incident x-ray beam to form wide angle x-ray scattering (WAXS) beams and small angle x-ray scattering (SAXS) beams;a primary detector for capturing and resolving the WAXS beams, the primary detector including a fiber-optically coupled array, the array having an input window and a tapered passageway along its central axis to allow the passage of the SAXS beams,a primary detector for capturing and resolving the WAXS beams; anda secondary detector placed at a greater distance from the sample than the primary detector; the secondary detector capable of capturing and resolving the SAXS beams;wherein the tapered passageway is sealed within an enclosure to form an evacuated chamber within the detection system through which the SAX beams pass;the evacuated chamber capable of being placed under a vacuum.2. The detector system of claim 1 , wherein the tapered passageway is conical in shape in order to minimize the loss of imaging area on the primary detector.3. The detector system of claim 1 , wherein the detector system further includes an output window claim 1 , the output window located in the path of the SAXS beams prior to the secondary detector.4. The detector system of claim 3 , wherein the input ...

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02-05-2013 дата публикации

Method of Characterizing a Crystalline Specimen by Ion or Atom Scattering

Номер: US20130105688A1
Автор: Jalabert Denis

Method of characterizing a crystalline specimen (E), characterized in that it comprises the steps consisting in: a) directing a substantially mono-energetic beam (F) of projectiles chosen from atoms and ions onto a surface, called the top surface, of said specimen, the direction of propagation of said beam being characterized by an angle of incidence (θ) and by what is called an azimuthal angle (φ) measured in the plane of said surface, the energy of said projectiles being equal to or greater than 50 keV; b) the projectiles scattered by the specimen are filtered in terms of energy, those of said projectiles that are scattered with a defined energy are detected and their scattering angle (θ), defined in a plane perpendicular to said top surface of the specimen, is measured; c) steps a) and b) are repeated for a number of different values of said azimuthal angle; and d) an image representative of the number of detected projectiles as a function of the scattering angle and of said azimuthal angle is constructed. Computer program product specifically designed for implementing such a method. 1. A method of characterizing a crystalline specimen comprising:{'sub': 'i', 'a. directing a substantially mono-energetic beam of projectiles chosen from atoms and ions onto a surface, called the top surface, of said specimen, the direction of propagation of said beam being characterized by an angle of incidence (θ) and by a azimuthal angle (φ) measured in the plane of said surface, the energy of said projectiles being equal to or greater than 50 keV;'}{'sub': 'd', 'b. energy filtering the projectiles scattered by the specimen, detecting those of said projectiles that are scattered with a defined energy and measuring their scattering angle (θ), defined in a plane perpendicular to said top surface of the specimen;'}c. repeating steps a and b for a plurality of different values of said azimuthal angle; andd. constructing an image representative of the number of detected projectiles as ...

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02-05-2013 дата публикации

CHARGED PARTICLE BEAM APPARATUS

Номер: US20130105690A1
Принадлежит: HITACHI HIGH-TECHNOLOGIES CORPORATION

In recent years, in association with the miniaturization and high integration of semiconductor manufacturing processes, there have been arising many cases where observation target portions are densely located. In such a case, if observation is performed using a conventional pre-charge technology, scanning with an electron beam in pre-charging are repeatedly executed, therefore the charge potential on the surface of a specimen exceeds the dielectric breakdown voltage. As a result, dielectric breakdown arises in areas where scanning with an electron beam are repeatedly executed. An object of the present invention is to provide a defect observation method that can reduce the risk of dielectric breakdown, and a charged particle beam apparatus that utilizes the method. In the present invention, when a specimen is observed with the use of a technology relevant to pre-charging, after executing a piece of control processing, plural images are photographed. In addition, by grouping observation target portions, which plural pre-charge scanning areas overlap, into a group where charge control is executed all together on all the observation target portions, and by executing charge control processing on each group, the risk of dielectric breakdown is reduced. 1. A charged particle beam apparatus that obtains a plurality of images of an observation target portion on a specimen , comprising:a charged particle optical system that irradiates a charged particle beam to the specimen;a detector that detects a signal generated by irradiating the charged particle beam to the specimen; andan image processing unit that generates an image of the specimen on the basis of the output of the detector, whereinthe image processing unit generates a plurality of images of the observation target portion on the basis of a piece of charge control processing executed on the observation target portion.2. A charged particle beam apparatus comprising:a specimen stage that transfers a specimen;a charged ...

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02-05-2013 дата публикации

X-RAY SOURCE, X-RAY IMAGING APPARATUS, AND X-RAY COMPUTED TOMOGRAPHY IMAGING SYSTEM

Номер: US20130108012A1
Автор: Sato Genta
Принадлежит: CANON KABUSHIKI KAISHA

An X-ray imaging apparatus includes: an X-ray source including an electron source and a target, the target having a plurality of projections, each having an emitting surface; a diffraction grating configured to diffract X rays emitted from the X-ray source; and a detector configured to detect the X rays diffracted by the diffraction grating. Electron beams output from the electron source are incident on the emitting surfaces so that X rays are emitted from the emitting surfaces and are output to the diffraction grating. The X rays emitted from the emitting surfaces are diffracted by the diffraction grating so as to form a plurality of interference patterns. The projections are arranged such that bright portions of the interference patterns overlap each other and such that dark portions thereof overlap each other. Distances from the emitting surfaces to the diffraction grating are equal to each other. 1. An X-ray imaging apparatus comprising:an X-ray source including an electron source and a target, the target having a plurality of projections, each of the plurality of projections having an emitting surface;a diffraction grating configured to diffract X rays emitted from the X-ray source; anda detector configured to detect the X rays diffracted by the diffraction grating,wherein electron beams output from the electron source are incident on the emitting surfaces of the plurality of projections so that X rays are emitted from the emitting surfaces and are output to the diffraction grating, the X rays emitted from the emitting surfaces are diffracted by the diffraction grating so as to form a plurality of interference patterns, the plurality of projections are arranged such that bright portions of the plurality of interference patterns overlap each other and such that dark portions of the plurality of interference patterns overlap each other, and distances from the plurality of emitting surfaces to the diffraction grating are equal to each other.2. The X-ray imaging ...

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02-05-2013 дата публикации

X-RAY APPARATUS AND X-RAY MEASURING METHOD

Номер: US20130108020A1
Автор: Mukaide Taihei
Принадлежит:

An apparatus for deriving X-ray absorbing and phase information comprises; a splitting element for splitting spatially an X-ray, a detector for detecting intensities of the X-rays transmitted through an object, the intensity of the X-rays changing according to X-ray phase and also position changes, and an calculating unit for calculating an X-ray transmittance image, and an X-ray differential phase contrast or phase sift contrast image as the phase information. The X-ray is split into two or more X-rays having different widths, and emitted onto the detector unit. And, the calculating unit calculates the X-ray absorbing and phase information based on a difference, between the two or more X-rays, in correlation between the changing of the phase of the X-ray and the changing the intensity of the X-ray in the detector unit. 1. An X-ray apparatus for deriving X-ray absorbing information and X-ray phase information of an object to be detected comprising:a splitting element for splitting spatially an X-ray generated by an X-ray generator;a detector unit for detecting intensities of the X-rays or a light, based on the X-rays split by the splitting element and transmitted through the object, the intensity of the X-rays or the light changing according to an X-ray phase shift during the transmitting through the object, and also changing according to an X-ray position change; andan calculating unit for calculating an X-ray transmittance image as the X-ray absorbing information, and an X-ray differential phase contrast image or an X-ray phase sift contrast image as the X-ray phase information by using the intensities of the X-rays or the light, whereinthe splitting element splits the X-ray into two or more the X-rays having different widths, and emitting the X-rays onto the detector unit, andthe calculating unit calculates the X-ray absorbing information and the X-ray phase information based on a difference, between the two or more X-rays, in correlation between the changing of ...

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02-05-2013 дата публикации

Device analysis

Номер: US20130110421A1
Автор: Kay Lederer
Принадлежит: Plastic Logic Ltd

Performing an analysis of an electronic device sample by measuring a property at a plurality of points of said electronic device sample, and in advance of said analysis subjecting said plurality of points to at least one treatment that increases the difference in said property between at least two elements of said electronic device sample.

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16-05-2013 дата публикации

X-RAY STRESS MEASURING APPARATUS

Номер: US20130121470A1
Принадлежит:

An X-ray stress measuring apparatus, for measuring stress on a sample, comprises: a pair of X-ray generating means (′) for irradiating X-ray beams, determining an angle defined between the X-ray beams, mutually, at an arbitrary fixed angle, on a plane inclining by an angle desired with respect to a surface of the sample to be measured stress thereon; an X-ray sensor portion () for detecting plural numbers of Debye rings (C, C′), which are generated by incident X-ray beams from said pair of X-ray generating means; and a battery () for supplying necessary electricity to each of parts of the apparatus, wherein said X-ray sensor portion is made up with only one (1) piece of a 2-dimensional X-ray detector () or a 1-dimensional X-ray detector (′), and is disposed in a position where the plural numbers of Debye rings generated by the incident X-ray beams from the at least one pair of X-ray generating means are adjacent to each other, or intersect with each other, thereby detecting the plural numbers of the Debye rings caused due to the X-ray and the X′-ray in common with. 1. An X-ray stress measuring apparatus , for measuring stress on a sample , comprising , at least:a pair of X-ray generating means for irradiating X-ray beams, determining an angle defined between the X-ray beams, mutually, at an arbitrary fixed angle, on a plane inclining by an angle desired with respect to a surface of the sample to be measured stress thereon;an X-ray sensor portion for detecting plural numbers of Debye rings, which are generated by incident X-ray beams from said pair of X-ray generating means; anda battery means for supplying electricity to said pair of X-ray generating means and said X-ray sensor portion, whereinsaid X-ray sensor portion is made up with one (1) piece of a 2-dimensional X-ray detector or a 1-dimensional X-ray detector, and is disposed in a position where the plural numbers of Debye rings generated by the incident X-ray beams from said at least one pair of X-ray ...

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23-05-2013 дата публикации

X-RAY DIFFRACTION METHOD AND PORTABLE X-RAY DIFFRACTION APPARATUS USING SAME

Номер: US20130129051A1
Принадлежит:

A portable X-ray diffraction apparatus is provided which can be held by a person and on which an image of a spot to be measured can be viewed. The portable X-ray diffraction apparatus includes: X-ray irradiation means that irradiates a sample with collimated X-rays; diffracted X-ray detection means that detects a collimated portion of diffracted X-rays among X-rays diffracted from the sample by the irradiation of the X-rays with the X-ray irradiation means; and signal processing means that processes a signal outputted from the diffracted X-ray detection means. An X-ray diffraction method is used which includes: irradiating a sample with collimated continuous-wavelength X-rays; extracting a collimated portion of diffracted X-rays diffracted from the sample irradiated with the X-rays and condensing the extracted collimated portion of the diffracted X-rays; detecting, using an energy dispersive detection element, the condensed diffracted X-rays; and processing a signal detected by the detection element. 1. A portable X-ray diffraction apparatus comprising:X-ray irradiation means that irradiates a sample with collimated X-rays;diffracted X-ray detection means that detects a collimated portion of diffracted X-rays among X-rays diffracted from the sample by the irradiation of the X-rays with the X-ray irradiation means; andsignal processing means that processes a signal outputted from the diffracted X-ray detection means.2. The portable X-ray diffraction apparatus according to claim 1 , further comprising imaging means that images a spot on the sample to be irradiated with the X-rays and display means that displays an image imaged by the imaging means.3. The portable X-ray diffraction apparatus according to claim 1 , wherein the X-ray irradiation means includes:an X-ray tube for generating continuous wavelength X-rays;shutter means that opens and closes an optical path for X-rays generated by the X-ray tube;irradiation optical means that collimates X-rays generated by the ...

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23-05-2013 дата публикации

METHOD AND ITS APPARATUS FOR X-RAY DIFFRACTION

Номер: US20130129052A1
Принадлежит:

In order to realize a compact and lightweight X-ray diffraction apparatus not requiring a goniometer, an apparatus for X-ray diffraction includes a first X-ray irradiating unit and a second X-ray irradiating unit that irradiate shaped X-rays on a same region of the surface of the sample from respective directions; an X-ray detecting unit that detects a first diffracted X-ray emanated from the region of the sample where the X-ray is irradiated by the first X-ray irradiating unit and a second diffracted X-ray emanated from the region of the sample where the X-ray is irradiated from the second X-ray irradiating unit; and an X-ray diffraction signal processing unit that processes a signal acquired by detecting the first diffracted X-ray and the second diffracted X-ray emanated from the same region of the sample with the X-ray detecting unit. 1. An X-ray diffraction apparatus comprising:a plurality of X-ray irradiating units that irradiate shaped X-rays from different directions onto a same surface of a sample;an X-ray detecting unit that detects a plurality of diffracted X-rays emanated from the sample through the irradiation of the X-rays in the same surface region of the sample by the plurality of X-ray irradiating units; andan X-ray diffraction signal processing unit that processes signals acquired by detecting the plurality of diffracted X-rays emanated from the same surface region of the sample by the X-ray detecting unitwherein a diffraction X-ray pattern caused by one of the plurality of the diffraction X-rays emanated from the sample through the irradiation of an X-ray from one of the plurality of X-ray irradiating units and detected by the X-ray detecting unit has a curvature the direction of which is opposite to a curvature of the other diffraction X-ray pattern caused by the other one of the plurality of the diffraction X-rays emanated from the sample through the irradiation of the other X-ray from the other one of the plurality of X-ray irradiating units and ...

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30-05-2013 дата публикации

X-ray analysis apparatus

Номер: US20130138382A1
Принадлежит: Rigaku Corp

An X-ray analysis apparatus having a function for enabling a plurality of measurement methods to be implemented, the X-ray analysis apparatus having: a measurement system capable of implementing a plurality of measurement methods; measurement software for implementing, in a selective manner, each of the measurement methods; a material evaluation table for storing information relating to a material that may be measured, and a name of an evaluation performed on the material; an input device for inputting the information relating to the material; a wizard program for performing computation for selecting the name of an evaluation on the basis of the information relating to the material inputted using the input device; and a wizard program for selecting a corresponding measurement method on the basis of the selected name of the evaluation.

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06-06-2013 дата публикации

Device for use in normalizing readings on a testing machine

Номер: US20130140444A1
Принадлежит: ABBOTT LABORATORIES

Example apparatus and methods for use in normalization of testing machines used to test samples in vessels are disclosed. An example apparatus includes verification source and a photon emitter positioned in the verification source. The example photon emitter includes a C 14 source, a scintillator adjacent to the C 14 source, and a filter adjacent to the scintillator. The example photon emitter is to emit photons through the filter for detection by a photon counter.

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06-06-2013 дата публикации

Process and Installation for Inspection and/or Sorting Combining Surface Analysis and Volume Analysis

Номер: US20130141115A1

Automatic process and installation for inspecting and/or sorting objects or articles belonging to at least two different categories, and made to advance approximately in a single layer, for example on a conveyor belt or a similar transport support. The process includes subjecting the advancing flow of objects or articles to at least two different types of contactless analysis by radiation, whose results are used in a combined manner for each object or article to perform a discrimination among these objects or articles and/or an evaluation of at least one characteristic of the latter, the analyses including at least one surface analysis process able to determine the physical and/or chemical composition of the outer layer of an object or article exposed to the radiation used in this process, and at least one volume analysis process able to determine the equivalent thickness of material of the same object or article.

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06-06-2013 дата публикации

CRYSTAL STRUCTURE OF A MarR FAMILY POLYPEPTIDE

Номер: US20130144038A1
Принадлежит: Boston University, TUFTS UNIVERSITY

The crystal structure of the product, crystals of the MarR protein, a regulator of multiple antibiotic resistance in Escherichia coli, and methods of crystallization of the MarR protein are described.

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13-06-2013 дата публикации

TRACERS FOR DETECTING THE PRESENCE OF SOLID ADMIXTURES

Номер: US20130145827A1
Принадлежит: ACM CHEMISTRIES, INC.

In some variations, this disclosure provides a method of verifying the presence of an admixture in association with a solid base material, by combining the admixture with a stable inorganic tracer. A sample of the solid base material may be analyzed, using suitable analytical techniques, to detect the presence of the inorganic tracer in excess of any native inorganic tracer. When the inorganic tracer is positively detected, it is confirmed that the traceable admixture has been properly dosed within the base material. The inorganic tracer may comprise a rare earth metal, such as selenium, molybdenum, bismuth, and combinations, alloys, or oxides thereof, for example. The solid base material may be a cementitious material, in some embodiments. The traceable admixture may be a water-repellent admixture, in some embodiments. The principles of the invention, however, are widely applicable. 1. A method of verifying the presence of a water-repellent admixture in association with a cementitious material , said method comprising:(a) providing a water-repellent admixture suitable for combining with a cementitious material;(b) providing an inorganic tracer that is substantially water-insoluble and stable in the presence of said water-repellent admixture and said cementitious material;(c) combining said water-repellent admixture and said inorganic tracer to form a traceable water-repellent admixture;(d) obtaining a sample comprising said cementitious material, in uncured or cured form; and(e) analyzing said sample for the presence of said traceable admixture, by detecting said inorganic tracer, if present in said sample in excess of any native inorganic tracer associated with said cementitious material;wherein positive detection of said inorganic tracer within said sample indicates that a step of combining said traceable admixture with said cementitious material has been performed.2. The method of claim 1 , wherein said inorganic tracer is quantified within said sample claim 1 , ...

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20-06-2013 дата публикации

HANDHELD SPECTROMETER

Номер: US20130156155A1
Принадлежит: i-Nalysis LLC

A handheld X-ray fluorescence spectrometer includes a pyroelectric radiation source for directing X-rays toward a sample to be analyzed and a detector for receiving secondary X-rays emitted from the sample and converting the secondary X-rays into one or more electrical signals representative of the received secondary X-rays. A module is configured to receive the one or more electrical signals and send a representation of the one or more signals over a communication channel to a computing device without performing any spectral analysis on the one or more electrical signals to characterize the sample. The computing device is configured to perform spectral analysis on the one or more electrical signals and send the spectral analysis to the spectrometer over the communications channel. 1. A handheld X-ray fluorescence spectrometer comprising:a pyroelectric radiation source for directing X-rays toward a sample to be analyzed;a detector for receiving secondary X-rays emitted from the sample and converting the secondary X-rays into one or more electrical signals representative of the received secondary X-rays;a module configured to receive the one or more electrical signals and send a representation of the one or more signals over a communication channel to a computing device without performing any spectral analysis on the one or more electrical signals to characterize the sample, the computing device configured to perform spectral analysis on the one or more electrical signals and send the spectral analysis to the spectrometer over the communications channel; andan output display for displaying the spectral analysis.2. The spectrometer of claim 1 , further comprising a standardization material positioned to receive X-rays from the pyroelectric radiation source.3. The spectrometer of claim 2 , wherein the detector receives secondary X-rays emitted from the standardization material.4. The spectrometer of claim 2 , wherein the standardization material comprises a rare earth ...

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27-06-2013 дата публикации

IMAGING APPARATUS

Номер: US20130163717A1
Автор: Nagai Kentaro
Принадлежит: CANON KABUSHIKI KAISHA

An imaging apparatus includes a light source unit; a diffraction grating diffracting light from the light source unit; and a detector detecting light from the diffraction grating, wherein the light source unit includes first light-emitting parts emitting light forming a first interference pattern by being diffracted at the diffraction grating, and second light-emitting parts emitting light forming a second interference pattern by being diffracted at the diffraction grating, wherein the first and the second light-emitting parts are disposed so that at least part of the first and second interference pattern overlap and the positions of light regions in the first interference pattern differ from the positions of light regions in the second interference pattern, and wherein a combined pattern is formed by the first interference pattern and the second interference pattern. 1. An imaging apparatus comprising:a light source unit;a diffraction grating configured to diffract light from the light source unit; anda detector configured to detect light from the diffraction grating, first light-emitting parts configured to emit light forming a first interference pattern by being diffracted at the diffraction grating, and', 'second light-emitting parts configured to emit light forming a second interference pattern by being diffracted at the diffraction grating,, 'wherein the light source unit includes'}wherein the first light-emitting parts and the second light-emitting parts are disposed so that at least part of the first interference pattern and at least part of the second interference pattern overlap and the positions of light regions in the first interference pattern differ from the positions of light regions in the second interference pattern, andwherein a combined pattern is formed by the first interference pattern and the second interference.2. The imaging apparatus according to claim 1 , wherein claim 1 ,the first interference pattern and the second interference pattern ...

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04-07-2013 дата публикации

Controlling bitumen quality in solvent-assisted bitumen extraction

Номер: US20130168294A1
Принадлежит: ExxonMobil Upstream Research Co

Described herein is a method of controlling bitumen quality in a process stream within a solvent-assisted bitumen extraction operation, for instance a hydrocarbon stream from a froth separation unit (FSU). Bitumen quality is a measure of the amount of selected contaminants in the process stream. Contaminants may include asphaltenes (comprising metal porphyrins), sulfur, and inorganic solids (comprising inorganic elements, e.g. Si, Al, Ti, Fe, Na, K, Mg, and Ca). First, the amounts of selected contaminants are measured. Next, these measured values are compared to maximum reference values. If one or more of these contaminants is higher than the maximum reference value, at least one variable of the solvent-assisted bitumen extraction is adjusted to improve bitumen quality.

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04-07-2013 дата публикации

X-Ray Fluorescence Spectrometer and X-Ray Fluorescence Analyzer

Номер: US20130170613A1
Принадлежит:

An X-ray fluorescence spectrometer irradiates a measurement sample with primary X rays from an X-ray source, and excites an element in the sample to emit fluorescence X rays and scattered X rays from the sample A spectroscopic system is placed so that a first spectroscopic unit, a second spectroscopic unit, and a single X-ray detector form an optimized optical system. The first spectroscopic unit disperses the fluorescence X rays to collect the resultant X rays onto the X-ray detector. The second spectroscopic unit disperses the scattered X rays to collect the resultant X rays onto the X-ray detector. In this manner, the spectroscopic system disperses the fluorescence X rays and the scattered X rays so that the intensity of the fluorescence X rays and the intensity of the scattered X rays can be detected by the single X-ray detector 24. 1. An X-ray fluorescence spectrometer , comprising:an X-ray source that emits primary X rays to irradiate a sample to be measured with said primary X rays;a first spectroscopic unit that disperses fluorescence X rays emitted from said sample;a second spectroscopic unit that disperses scattered X rays scattered from said sample; anda single X-ray detector that is positioned so as to be able to receive said fluorescence X rays dispersed by said first spectroscopic unit and said scattered X rays dispersed by said second spectroscopic unit, and that receives said fluorescence X rays and said scattered X rays.2. The X-ray fluorescence spectrometer according to claim 1 , whereinsaid first spectroscopic unit is formed to have a curved surface, and is positioned so as to be able to collect said fluorescence X rays onto said X-ray detector,said second spectroscopic unit is formed to have a curved surface, and is positioned so as to be able to collect said scattered X rays onto said X-ray detector,said first spectroscopic unit, said second spectroscopic unit, and said single X-ray detector are thus selected so as to achieve an optimal optical ...

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18-07-2013 дата публикации

SAMPLE ANALYSIS SYSTEM

Номер: US20130182824A1
Принадлежит:

A hair sample analysis system; said system comprising multiple sample arrays located within a container, an automated drive mechanism for removing an individual array from said container and for urging a. hair sample of said sample array to a first approximate location, and a monitoring and control system, for adjustment of said drive mechanism to locate said hair sample into substantial coincidence with an X-ray diffraction beam; locating said sample in substantial coincidence with said X-ray diffraction beam; irradiating said sample with said beam for a predetermined time; receiving and storing for analysis data derived from said step of irradiating said hair sample; repeating said steps for a consecutive one of said hair 5 samples from said sample array; returning said sample array to its original location in said container and removing another array from said sample container and repeating said steps for consecutive arrays. 1. A method for automatically aligning a sample comprising a hair fiber within an x-ray beam , said sample mounted on a positioning device , said hair fiber comprising a linear arrangement of filamentary elements , said method comprising the steps of:a. providing a sample, said sample mounted on a sample holding device having provisions for multiple separate samples to be mounted, each sample being uniquely identified;b. providing an apparatus capable of viewing said mounted sample, whereby said apparatus is capable of imaging said mounted sample, reading the sample identifier and determining coordinates of said sample relative to a reference position, wherein no portion of said sample mounted in said positioning device is initially at said reference position;c. providing a source of power for adjusting said positioning device linearly along at least two orthogonal axes;d. activating said source of power to cause said positioning device to be adjusted such that said sample is positioned into the path of a beam of X-rays. whereby the said ...

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25-07-2013 дата публикации

SYSTEM AND METHOD FOR MEASURING ASH CONTENT AND CALORIFIED VALUE OF COAL

Номер: US20130188776A1
Принадлежит: TSINGHUA UNIVERSITY

A system and a method for measuring an ash content and a calorific value of a coal are provided. The system comprises: an X ray device, disposed over the coal and configured to emit an X ray to the coal; at least one X ray measuring device, disposed over the coal and configured to measure an energy spectrum of an X ray reflected by the coal; a distance sensor, disposed over the coal and configured to measure a distance between the coal and the at least one X ray measuring device; and a computing device, configured to receive the energy spectrum and the distance from the at least one X ray measuring device and the distance sensor and to compute the ash content and the calorific value of the coal according to the energy spectrum and the distance. 1. A system for measuring an ash content and a calorific value of a coal , comprising:an X ray device, disposed over the coal and configured to emit an X ray to the coal;at least one X ray measuring device, disposed over the coal and configured to measure an energy spectrum of an X ray reflected by the coal;a distance sensor, disposed over the coal and configured to measure a distance between the coal and the at least one X ray measuring device; anda computing device, connected with the at least one X ray measuring device and the distance sensor respectively, and configured to receive the energy spectrum of the X ray reflected by the coal and the distance between the coal and the at least one X ray measuring device and to compute the ash content and the calorific value of the coal according to the energy spectrum and the distance.2. The system of claim 1 , wherein the X ray emitted by the X ray device comprises a bremsstrahlung X ray with a continuous energy.3. The system of claim 1 , further comprising a standard block claim 1 , whereinduring a conveyance of the coal on a conveyer belt, the standard block is taken away to make the X ray emitted by the X ray device directly incident on the coal and to make the X ray reflected ...

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25-07-2013 дата публикации

Integrated, portable sample analysis system and method

Номер: US20130191046A1
Принадлежит: Individual

An integrated, portable sample analysis system and method. A viscometer subsystem receives a first portion of a sample. A spectrometer subsystem receives a second portion of the sample. A syringe pump subsystem receives a third portion of the sample and is configured to urge the third portion of the sample through a filter which collects particles in the sample thereon. An x-ray analysis subsystem is configured to x-ray the particles. The x-ray analysis subsystem also receives a fourth portion of the sample in order to determine the composition of any dissolved material in the sample. A processing subsystem provides a report concerning the sample and its viscosity, physical properties, particulate count and size distribution, and the composition of particulate and dissolved elements in the sample.

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01-08-2013 дата публикации

Systems and Methods for Investigating a Characteristic of a Material Using Electron Microscopy

Номер: US20130193321A1
Принадлежит: Edax Inc

Various embodiments of the present invention provide systems and methods for determining an characteristic of a material. The characteristics may include, but are not limited to, crystallographic and chemical composition characteristics of a material.

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01-08-2013 дата публикации

ON-BELT ANALYSER SYSTEM

Номер: US20130193328A1
Принадлежит: SCANTECH INTERNATIONAL PTY LTD

An analyser system including an on-belt analyser having a housing adapted to be positioned across a path of a conveyor belt which carries material to be analysed, wherein the housing defines a tunnel dimensioned to allow the belt to travel therethrough in suspended relation in order to allow analysis of the material without the belt contacting the analyser. 119-. (canceled)20. A bulk material analyser , comprising:a housing including a tunnel for receiving a conveyor belt carrying a material to be analysed;a neutron source disposed below the conveyor belt to emit neutrons into the material in the tunnel for interaction with the material disposed therein; anda gamma ray detector disposed above the conveyor belt to detect gamma rays emitted from the material in response to the neutron interaction,wherein the conveyor belt is suspended within the tunnel.21. The bulk material analyser according to claim 20 , wherein the conveyor belt travels freely suspended through the tunnel claim 20 , so that the conveyor belt is not subject to wear within the tunnel.22. The bulk material analyser according to claim 21 , wherein the housing is adapted to be positioned across a path of an existing conveyor belt without disrupting the existing conveyor belt.23. The bulk material analyser according to claim 21 , wherein the housing is a C-shaped housing which allows the housing to be retro-fitted across a bulk material conveyor belt claim 21 , wherein the housing is dimensioned to allow the belt to travel freely suspended therethrough in order to allow analysis of material carried on the belt claim 21 , without the belt contacting the analyser.24. The bulk material analyser according to claim 21 , wherein the tunnel is dimensioned to receive a belt of between 600 mm and 1400 mm in width claim 21 , with a trough angle of between 30° and 45° without requiring any modification to the belt profile.25. The bulk material analyser according to claim 21 , further comprising a conveyor assembly ...

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01-08-2013 дата публикации

METHOD FOR DISASSEMBLING LIQUID CRYSTAL DISPLAY DEVICE

Номер: US20130195242A1
Автор: IWAMOTO Hiroshi
Принадлежит: Panasonic Corporation

In the present disclosure, before disassembly of liquid crystal module () having liquid crystal panel () and a back light, irradiation is performed with X-rays () from the front surface side of liquid crystal panel () of liquid crystal module (). By this irradiation with X-rays (), generated fluorescent X-rays () are detected to analyze an element contained in liquid crystal panel (), while X-rays () backscattered or transmitted to the rear surface side of liquid crystal module () are detected to determine a type and a state of the back light. Then, based on the determined type and state of the back light, liquid crystal module () is disassembled. 1the method comprising:before disassembly of a liquid crystal module having a liquid crystal panel and a back light, irradiating the module with X-rays from a front surface side of the liquid crystal panel of the liquid crystal module to detect generated fluorescent X-rays for analyzing an element contained in the liquid crystal panel, as well as to detect X-rays backscattered or transmitted to a rear surface side of the liquid crystal module for determining a type and a state of the back light; andthereafter, based on results of the analysis of the element and the detection of the X-rays, deciding a method for disassembling the liquid crystal module.. A method for disassembling a liquid crystal display device, The present disclosure relates to a method for disassembling a liquid crystal display device.In recent years, as display devices appropriate for slimming and upsizing, flat-panel televisions, such as liquid crystal televisions using liquid crystal display panels and plasma televisions using plasma display panels, have been mass-produced and sales thereof have been expanded. Therewith, the number of waste of used flat-panel televisions is on the gradual increase. From viewpoints of environmental issues and resource savings, it is becoming important to improve a system for disassembling a variety of members and ...

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01-08-2013 дата публикации

Hand-Held X-Ray Backscatter Imaging Device

Номер: US20130195248A1
Принадлежит: AMERICAN SCIENCE AND ENGINEERING, INC.

Apparatus for imaging items behind a concealing barrier. A source of penetrating radiation is contained entirely within a housing. A spatial modulator forms the penetrating radiation into a beam and sweeps the beam to irradiate an inspected object. A detector generates a scatter signal based on penetrating radiation scattered by contents of the inspected object, and a sensor senses motion relative to a previous position of the apparatus with respect to the inspected object. A processor receives the scatter signal and generates an image of the contents of the inspected object based at least on the scatter signal. The housing may be adapted for singled-handed retention by an operator 1. An imaging apparatus comprising:a. a housing;b. a source of penetrating radiation contained entirely within the housing for generating penetrating radiation;c. a spatial modulator for forming the penetrating radiation into a beam for irradiating the object and for sweeping the beam;d. a detector for generating a scatter signal based on penetrating radiation scattered by contents of the inspected object;e. a sensor to sense motion relative to a previous position of the apparatus with respect to the inspected object; andf. a processor for receiving the scatter signal and for generating an image of the contents of the inspected object based at least on the scatter signal.2. An imaging apparatus in accordance with claim 1 , wherein the housing is adapted for single-handed retention by an operator.3. An imaging apparatus in accordance with claim 1 , wherein the sensor is a mechanical encoder.4. An imaging apparatus in accordance with claim 1 , wherein the sensor is an accelerometer.5. An imaging apparatus in accordance with claim 1 , wherein the sensor is an optical sensor.6. An imaging apparatus in accordance with claim 1 , wherein the processor is adapted to modulate an intensity of the penetrating radiation based on sensed motion of the apparatus.7. An imaging apparatus in accordance ...

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01-08-2013 дата публикации

METHOD FOR FORMING PROTEIN CRYSTAL

Номер: US20130196160A1
Автор: Sugahara Michihiro
Принадлежит: RIKEN

A method for producing a capsule for protein crystallization is provided. The method comprises adding a solution containing a protein and a gelling agent to an ionic cross-linking solution to form an ionically cross-linked gel capsule that encapsulates a solution of the protein. 1. A method for producing a capsule for protein crystallization , comprising:adding a solution containing a protein and a gelling agent to an ionic cross-linking solution to form an ionically cross-linked gel capsule that encapsulates a solution of the protein.2. A composition for protein crystallization comprising a shell including an ionically cross-linked gel , wherein the shell encapsulates a solution including a protein.3. A kit for producing a capsule for protein crystallization , comprising a gelling agent and an ionic cross-linking solution.4. The kit for producing a capsule for protein crystallization according to claim 3 , further comprising:a crystallization solution;a non-volatile oil; anda plate for protein crystallization, wherein the plate has one or more wells for placing the crystallization solution and the non-volatile oil therein.5. The kit for producing a capsule for protein crystallization according to claim 4 , wherein the cross-linking solution and the crystallization solution are identical to each other.6. The kit for producing a capsule for protein crystallization according to claim 4 , wherein the crystallization solution and the non-volatile oil are placed in each well of the plate claim 4 , and the kit further comprises a film for sealing the well.7. A method for producing a protein crystal claim 4 , comprising:(a) adding a solution containing a protein and a gelling agent to an ionic cross-linking solution to form an ionically cross-linked gel capsule; and(b) maintaining the capsule formed in step (a) in a crystallization solution.8. The method for producing a protein crystal according to claim 7 , wherein the ionic cross-linking solution and the crystallization ...

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08-08-2013 дата публикации

Three-dimensional mapping using scanning electron microscope images

Номер: US20130200255A1
Принадлежит: Applied Materials Israel Ltd

A method includes irradiating a surface of a sample, which is made-up of multiple types of materials, with a beam of primary electrons. Emitted electrons emitted from the irradiated sample are detected using multiple detectors that are positioned at respective different positions relative to the sample, so as to produce respective detector outputs. Calibration factors are computed to compensate for variations in emitted electron yield among the types of the materials, by identifying, for each material type, one or more horizontal regions on the surface that are made-up of the material type, and computing a calibration factor for the material type based on at least one of the detector outputs at the identified horizontal regions. The calibration factors are applied to the detector outputs. A three-dimensional topographical model of the surface is calculated based on the detector outputs to which the calibration factors are applied.

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08-08-2013 дата публикации

DIFFERENTIAL PHASE-CONTRAST IMAGING

Номер: US20130202081A1
Автор: Rossl Ewald
Принадлежит: KONINKLIJKE PHILIPS ELECTRONICS N.V.

The present invention relates to differential phase-contrast imaging, in particular to a structure of a diffraction grating, e.g. an analyzer grating and a phase grating, for X-ray differential phase-contrast imaging. In order to provide enhanced phase-gradient based image data, a diffraction grating () for X-ray differential phase-contrast imaging, is provided with a first sub-area () comprising at least one portion () of a first grating structure () and at least one portion () of a second grating structure (). The first grating structure comprises a plurality of bars () and gaps () with a first grating orientation G(), being arranged periodically, wherein the bars are arranged such that they change the phase and/or amplitude of an X-ray radiation and wherein the gaps are X-ray transparent. The second grating structure comprises a plurality of bars () and gaps () with a second grating orientation G(), being arranged periodically, wherein the bars are arranged such that they change the phase and/or amplitude of an X-ray radiation and wherein the gaps are X-ray transparent. The first grating orientation Got is different than the second grating orientation G. Thus, phase-gradient based image information can be acquired for different directions without the necessity to rotate or pivot any of the respective gratings between the acquisition steps, for example. 1141523. A diffraction grating ( , ) for X-ray differential phase-contrast imaging , comprising a first sub-area () with{'b': 24', '26, 'at least one portion () of a first grating structure (); and'}{'b': 28', '30, 'at least one portion () of a second grating structure ();'}{'b': 34', '36', '37, 'sub': 'O1', 'wherein the first grating structure comprises a plurality of bars () and gaps () with a first grating orientation G(), being arranged periodically; wherein the bars are arranged such that they change the phase and/or amplitude of an X-ray radiation and wherein the gaps are X-ray transparent;'}{'b': 40', '42', ...

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08-08-2013 дата публикации

System and method for identification of counterfeit gold jewelry using xrf

Номер: US20130202083A1

Techniques disclosed herein include systems and methods for identifying counterfeit gold jewelry and other counterfeit gold items. Techniques include determining—using a non-destructive mechanism—whether an item of interest (such as an article represented as true gold) is solid gold or a gold-plated object. Techniques include using an X-ray fluorescence (XRF) analyzer to differentiate true gold from gold plating. The XRF analyzer can distinguish between gold plating and bulk gold material by comparing a ratio of L-alpha and L-beta x-ray lines of gold. The analyzer measures a ratio of intensities of characteristic L-lines of gold using X-ray fluorescence (XRF) spectroscopy. When implemented using an XRF analyzer, the system nondestructively determines whether a test object is made of solid gold/gold alloy or has gold plating only.

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08-08-2013 дата публикации

Convertible Scan Panel for X-Ray Inspection

Номер: US20130202089A1
Принадлежит: AMERICAN SCIENCE AND ENGINEERING, INC.

An x-ray inspection system using backscatter of an x-ray beam emitted through a scan panel contiguous with, but of a material distinct from, an enclosure that contains an x-ray source by which the x-ray beam is generated. The scan panel is contoured in such a manner as to be visibly blended with a shape characterizing the enclosure. In some embodiments, the beam traverses multiple scan panels, where one or more of the scan panels may be selected for beam filtration properties. The scan panel may be disposed interior to a sliding door, and may be structured to serve as a scatter shield. 1. An inspection system for inspecting an inspected object with backscattered penetrating radiation , the inspection system comprising:a. a source for generating a beam of penetrating radiation, the source disposed within an enclosure;b. a portion of the enclosure traversed by the beam, the portion of the enclosure constituting a first scan panel, characterized by a thickness and including a material distinct from material comprising another portion of the enclosure not traversed by the penetrating radiation, and contoured in such a manner as to be visibly blended with a shape characterizing the enclosure; andc. at least one scatter detector for receiving penetrating radiation scattered from the beam of penetrating radiation by the inspected object.2. An inspection system in accordance with claim 1 , wherein at least one of the material and thickness of the first scan panel is optimized with respect to contrast-to-noise ratio of a selected material within the inspected object.3. An inspection system in accordance with claim 1 , further comprising a second scan panel interposed between the inspected object and the at least one scatter detector.4. An inspection system in accordance with claim 1 , wherein the first scan panel is characterized by an effective atomic number less than 26.5. An inspection system in accordance with claim 3 , wherein the second scan panel is characterized by ...

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08-08-2013 дата публикации

INTERNAL IMAGING SYSTEM

Номер: US20130202090A1
Принадлежит: GEORGETOWN RAIL EQUIPMENT COMPANY

A system for the inspection of the internal structure of a target includes at least one x-ray source that emits collimated x-rays to irradiate the target. At least one detector is positioned to detect backscatter x-rays from the target. The detector may include a collimation slot that limits the field of view of the detector. The target may be a railway component and the system may inspect the internal structure of the component as it is moved along the railway by a vehicle. The system may detect a change in the density of a target based on a comparison of the detected backscatter x-rays. The use of a plurality of segmented backscatter x-ray detectors having a collimation slot may pixelate the internal image in the direction of the collimation slot. 1. A internal imaging system to inspect a plurality of targets along a predetermined path , the system comprising:a vehicle configured to travel along the predetermined path;a first x-ray source connected to the vehicle, the first x-ray source configured to irradiate the plurality of targets with a fan beam of x-rays;a first detector connected to the vehicle, the first detector configured to detect backscatter x-rays from the plurality of targets.2. The system of claim 1 , wherein the predetermined path is a railway track.3. The system of claim 2 , wherein the plurality of targets comprises railway track components.4. The system of claim 3 , further comprisinga second x-ray source connected the vehicle, wherein the first x-ray source is configured to irradiate at least a first rail of the railway track with the fan beam of x-rays and the second x-ray source is configured to irradiate at least a second rail of the railway track with a fan beam of x-rays; anda second detector connected to the vehicle, the second detector configured to detect backscatter x-rays from the plurality of targets.5. The system of claim 4 , wherein first and second x-ray sources are positioned to irradiate the plurality of targets with fan beams ...

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08-08-2013 дата публикации

System and method for execution of a secured environment initialization instruction

Номер: US20130205127A1
Принадлежит: Individual

A method and apparatus for initiating secure operations in a microprocessor system is described. In one embodiment, one initiating logical processor initiates the process by halting the execution of the other logical processors, and then loading initialization and secure virtual machine monitor software into memory. The initiating processor then loads the initialization software into secure memory for authentication and execution. The initialization software then authenticates and registers the secure virtual machine monitor software prior to secure system operations.

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15-08-2013 дата публикации

NEUTRON ACTIVATION ANALYSIS USING A STANDARDIZED SAMPLE CONTAINER FOR DETERMINING THE NEUTRON FLUX

Номер: US20130208843A1
Принадлежит:

A method for the non-destructive elemental analysis of large-volume samples using neutron radiation and a device for carrying out the method. In the method, the sample is irradiated with fast neutrons in a pulsed manner and the gamma radiation emitted by the sample is measured. The quantity of an element contained in the sample is evaluated after the background signal is subtracted from the area of the photopeak caused by the element in a plot of count rate versus energy. The gamma radiation emitted by a subregion of the sample, the composition of which is known, is evaluated in order to determine the neutron flux at the location of the sample. A metallic enclosure of the sample, such as a standardized waste container, can be selected as such a subregion, for example. A novel evaluation method based on multiparameter analysis can quantify, on the basis thereof, the presence of individual elements more quickly and more accurately than is possible according to the previous prior art. The device is characterized by a sample chamber, which is surrounded by a neutron-reflecting material, in particular graphite. 23.-. (canceled)4. The method according to claim 1 , wherein the radial distribution of an element in the sample relative to the rotational axis is evaluated on the basis of the dependence of the gamma radiation on the rotational angle.5. The method according to claim 1 , wherein the sample is approximated for the determination of the photopeak efficiency of the element as a shielded point source comprising the element.6. The method according to claim 1 , wherein a previously determined radial distribution of the element in the sample relative to the rotational axis is used for the approximation of the sample.7. The method according to claim 1 , wherein the area of the photopeak is calculated on the basis of an assumption of a gamma-shielding structure contained in the sample claim 1 , and the comparison of said area with the area obtained from measurement results ...

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15-08-2013 дата публикации

DETERMINING A MATERIAL PROPERTY BASED ON SCATTERED RADIATION

Номер: US20130208850A1
Автор: Schmitt Michael H.

Radiation is directed at an object, and radiation scattered by the object is sensed. An angular distribution of scatter in the sensed scattered radiation relative to a path of the radiation directed at the object is determined, and the angular distribution is evaluated. One or more atomic numbers, or effective atomic numbers, of materials composing the object is determined based on evaluating the angular distribution. 1. A method comprising:directing radiation at an object;sensing radiation scattered by the object;determining an angular distribution of scatter in the sensed scattered radiation relative to a path of the radiation directed at the object;evaluating the angular distribution; anddetermining one or more atomic numbers, or effective atomic numbers, of materials composing the object based on evaluating the angular distribution.2. The method of claim 1 , wherein evaluating the angular distribution comprises determining a ratio of scatter at two angles.3. The method of claim 1 , wherein sensing radiation scattered by the object comprises one or more of measuring x-ray fluency claim 1 , measuring x-ray energy deposited on a detector claim 1 , or measuring the x-ray fluency and a per-photon energy.4. The method of claim 2 , wherein determining the one or more atomic numbers claim 2 , or effective atomic numbers claim 2 , of materials composing the object comprises determining the one or more atomic numbers claim 2 , or effective atomic numbers claim 2 , of materials composing the object based on the ratio of scatter at two angles.5. The method of claim 4 , wherein sensing radiation scatter by the object comprises sensing scattered x-ray radiation at a first angle relative to the path of the radiation directed at the object claim 4 , the radiation directed at the object being x-ray radiation claim 4 , and sensing scattered x-ray radiation at a second angle relative to the path of the x-ray beam incident upon the object claim 4 , the first and second angles being ...

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15-08-2013 дата публикации

X-Ray Inspection using Wavelength-Shifting Fiber-Coupled Scintillation Detectors

Номер: US20130208857A1
Принадлежит: AMERICAN SCIENCE AND ENGINEERING, INC.

A detector and methods for inspecting material on the basis of scintillator coupled by wavelength-shifting optical fiber to one or more photo-detectors, with a temporal integration of the photo-detector signal. An unpixelated volume of scintillation medium converts energy of incident penetrating radiation into scintillation light which is extracted from a scintillation light extraction region by a plurality of optical waveguides. This geometry provides for efficient and compact detectors, enabling hitherto unattainable geometries for backscatter detection and for energy discrimination of incident radiation. Additional energy-resolving transmission configurations are enabled as are skew- and misalignment compensation. 1. A detector of penetrating radiation characterized by a thickness and an area , the detector comprising:a. an unpixelated volume of scintillation medium for converting energy of incident penetrating radiation into scintillation light;b. a plurality of optical waveguides, aligned substantially parallel to each other over a scintillation light extraction region contiguous with the unpixelated volume of the scintillation medium, for guiding light derived from the scintillation light; andc. a photo-detector for detecting photons guided by the plurality of waveguides and for generating a detector signal.2. A detector according to claim 1 , further comprising an integrating circuit for integrating the detector signal over a specified duration of time.3. A detector of penetrating radiation characterized by a thickness and an area claim 1 , the detector comprising:a. a volume of scintillation medium for converting energy of incident penetrating radiation into scintillation light;b. a plurality of optical waveguides, aligned substantially parallel to each other over a scintillation light extraction region contiguous with the volume of the scintillation medium, for guiding light derived from the scintillation light;c. a photo-detector for detecting photons ...

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15-08-2013 дата публикации

SAMPLE ANALYSIS

Номер: US20130208859A1
Автор: EVANS Paul
Принадлежит:

A method of sample analysis comprises irradiating a sample with electromagnetic radiation such as X-rays; collecting absorption data and scattering data; and combining the absorption and scattering data. The irradiation can be in the form of a tubular beam, a detector may be placed in a plane where Debye cones diffracted from the sample overlap at a central point for the collection of the scattering data. 1. A method of sample analysis comprising: irradiating a sample with electromagnetic radiation; collecting electromagnetic radiation absorption data; collecting electromagnetic radiation scattering data; and combining said absorption and scattering data.2. The method of claim 1 , wherein the irradiating electromagnetic radiation comprises at least one tubular beam.3. The method of claim 2 , wherein the shape of the tubular beam is a right circular cylinder or a cone.4. The method of or claim 2 , wherein the tubular beam is formed by passing the electromagnetic radiation rays through a collimator that comprises an electromagnetic radiation blocking body portion and one or more electromagnetic radiation transmitting apertures claim 2 , the shape of which defines the shape of the tubular beam or beams.5. The method of any preceding claim claim 2 , wherein the collection of electromagnetic radiation absorption data comprises a laminographic technique.6. The method of any preceding claim claim 2 , wherein the collection of electromagnetic radiation scattering data comprises placing a detector in a plane where Debye cones diffracted from the sample overlap at a central point.7. The method of any preceding claim claim 2 , comprising obtaining position information from the absorption data claim 2 , matching a feature in the absorption data with a feature in the scattering data; and corresponding the position information from the absorption data to the scattering data.8. The method of any preceding claim claim 2 , comprising irradiating electromagnetic radiation in a first ...

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22-08-2013 дата публикации

In-situ determination of thin film and multilayer structure and chemical composition using x-ray fluorescence induced by grazing incidence electron beams during thin film growth

Номер: US20130216022A1
Принадлежит:

A method utilizing characteristic x-ray emission from a single thin film or multilayer thin film when an electron beam impinges at a grazing angle with respect to the surface of the sample to capture structural and physical properties of the layers such as layer thickness, interfacial roughness, and stoichiometry of the sample. 1. A method comprising determining quantitative structural parameters of a thin film sample wherein the quantitative structural parameters are comprised of layer thickness and interfacial roughness wherein the determination comprisesmeasuring x-ray fluorescence of the sample generated by irradiating the sample with an electron beam at grazing angle incidence as a function of the take-off angle;measuring the intensity of x-rays for each characteristic energy corresponding to each chemical element present in the sample as a function of the take-off angle; andanalyzing these data to determine the electron beam's penetration, the electron beam's efficiency for x-ray fluorescence within the sample, and using the optical reciprocity theorem to make a non-linear least-squares fit to the data.2. The method of wherein a thin film sample is comprised of a single thin film layer of one material.3. The method of wherein a thin film sample is comprised of multiple thin layers of different materials.4. The method of wherein a thin film sample is comprised of multiple thin layers of one material.5. The method of further comprising simultaneously determining the stoichiometry of a thin film sample wherein the determination comprisesmeasuring the intensity of characteristic x-ray fluorescence of each element present in the sample generated by irradiating the sample with an electron beam at grazing angle incidence wherein the x-ray fluorescence is measured at a take-off angle wherein the take-off angle is large compared to the critical angle of characteristic x-rays emitted by the element with the largest critical angle and the critical angle is the angle of ...

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29-08-2013 дата публикации

METHOD FOR SCANNING ELECTRON MICROSCOPE OBSERVATION OF SAMPLE FLOATING ON LIQUID SURFACE

Номер: US20130221217A1
Принадлежит: HITACHI HIGH-TECHNOLOGIES CORPORATION

A micro sample floating on the surface of an ionic liquid is observed by scanning electron microscopy without the sample being covered with the ionic liquid. A floating or hydrophobic sample is floated on the surface of a hydrophilic ionic liquid aqueous solution to prevent the micro sample from being covered with the ionic liquid. A hydrophobic ionic liquid is used for hydrophilic samples. With the use of an ionic liquid aqueous solution of low viscosity and large flowability, the micro sample is allowed to freely aggregate, disperse, and align on the surface of the ionic liquid, and to refloat even when settled in the ionic liquid. For easy observation with a scanning electron microscope, the ionic liquid aqueous solution is dried to lower the flowability of the ionic liquid aqueous solution, after the form of the micro sample has stabilized and before electron microscope observation. 1. A specimen observation method for observing behaviors of a specimen on a surface of an ionic liquid ,the method comprising floating a sample for scanning electron microscopy so as to allow a specimen to freely move, the ionic liquid including a cation and an anion, and being involatile or hardly volatile in a vacuum.2. A method for preparing a specimen observed by scanning electron microscopy ,the method comprising drying a low-viscosity ionic liquid aqueous solution after allowing a specimen to freely move inside or on a surface of the ionic liquid, and removing the water component to increase the viscosity of the ionic liquid aqueous solution and fix the specimen.3. A method for preparing a specimen to be floated on an ionic liquid and used for scanning electron microscopy ,the method comprising applying a low-viscosity ionic liquid solution onto a sample stage of an electron microscope, and sprinkling a powder specimen over the ionic liquid to fix the specimen.4. A method for preparing a specimen to be floated on an ionic liquid and used for scanning electron microscopy ...

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05-09-2013 дата публикации

INSPECTION METHOD FOR SEMICONDUCTOR WAFER AND APPARATUS FOR REVIEWING DEFECTS

Номер: US20130228685A1
Принадлежит: HITACHI HIGH-TECHNOLOGIES CORPORATION

An object of the present invention is to provide a suitable method of observing a wafer edge by using an electron microscope. The electron microscope includes a column which can take an image in being tilted, and thus allows a wafer edge to be observed from an oblique direction. 619-. (canceled)20. A review apparatus having a function to obtain a scanning electron microscope image of a semiconductor wafer according to a recipe in which an observation process is recorded or given position information , comprising:a sample stage that holds the semiconductor wafer; anda tiltable column comprising an electron optical system that irradiates the semiconductor wafer with an electron beam and a detector that detects secondary electrons or reflection electrons obtained by irradiation with the electron beam, whereina viewing field of the column is moved by the sample stage to a position on an edge of the semiconductor wafer determined by the recipe or the position information, andthe edge of the semiconductor wafer is irradiated with the electron beam while the column is tilted, thereby imaging the scanning electron microscope image.21. The review apparatus according to claim 20 , wherein the sample stage is a rotatable stage.22. The review apparatus according to claim 20 , which is capable of imaging the scanning electron microscope image in a case in which the semiconductor wafer is irradiated with the electron beam from a direction tilted from the direction normal to the semiconductor wafer and in a case in which the semiconductor wafer is irradiated with the electron beam from a vertically upper position of the semiconductor wafer.23. The review apparatus according to claim 20 , further comprising a monitor that displays a screen for providing the position information.24. The review apparatus according to claim 20 , further comprising a monitor that displays a screen for providing the position information claim 20 , whereina graphic showing the outer periphery of the ...

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05-09-2013 дата публикации

CHARGED PARTICLE BEAM APPARATUS PERMITTING HIGH RESOLUTION AND HIGH-CONTRAST OBSERVATION

Номер: US20130228701A1
Принадлежит: HITACHI HIGH-TECHNOLOGIES CORPORATION

A lower pole piece of an electromagnetic superposition type objective lens is divided into an upper magnetic path and a lower magnetic path. A voltage nearly equal to a retarding voltage is applied to the lower magnetic path. An objective lens capable of acquiring an image with a higher resolution and a higher contrast than a conventional image is provided. An electromagnetic superposition type objective lens includes a magnetic path that encloses a coil, a cylindrical or conical booster magnetic path that surrounds an electron beam, a control magnetic path that is interposed between the coil and sample, an accelerating electric field control unit that accelerates the electron beam using a booster power supply, a decelerating electric field control unit that decelerates the electron beam using a stage power supply, and a suppression unit that suppresses electric discharge of the sample using a control magnetic path power supply. 1. A charged particle beam apparatus , comprising:a stage for placing a sample thereon;a detector detecting secondary charged particles generated due to irradiate a primary chargedarticle beam to the sample;an objective lens that focuses the primary charged particle beam on the sample and having an opening through which the primary charged particle beam passes; anda power supply unit applying a negative voltage to the sample,wherein the objective lens includes:a first magnetic pole member that is disposed around the opening and has a terminal portion at a sample side thereof that functions as an upper magnetic pole member of the objective lens;a second magnetic pole member that supplies a magnetic flux to the first magnetic pole member and is formed with a hollow interior;a coil that is disposed within the second magnetic pole member and supplies a magnetic flux to the second magnetic pole member; anda third magnetic pole member that is disposed between the stage and the second magnetic pole member, has the opening and functions as lower ...

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12-09-2013 дата публикации

X-RAY FLUORESCENCE ANALYZER

Номер: US20130235974A1
Принадлежит: SCHLUMBERGER NORGE AS

An x-ray fluorescence apparatus for measuring properties of a sample fluid, the apparatus comprising a housing having an inlet and an outlet; a test chamber disposed within the housing, the test chamber comprising an injection port in fluid communication with the inlet; a slide disposed within the test chamber, the slide comprising a sample cavity; and a test port; an x-ray fluorescence spectrometer disposed within the housing, and at least one motor operatively coupled to the slide of the test chamber. Also, a method of testing a fluid, the method comprising injecting a fluid through an injection port of a test chamber into a sample cavity of a slide; moving the slide laterally within the test chamber to an intermediate position; moving the slide laterally within the test chamber to a test position; and actuating an x-ray fluorescence spectrometer to sample the fluid within the sample cavity when the slide is in the test position.

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12-09-2013 дата публикации

Robust statistical reconstruction for charged particle tomography

Номер: US20130238291A1
Принадлежит: Los Alamos National Security LLC

Systems and methods for charged particle detection including statistical reconstruction of object volume scattering density profiles from charged particle tomographic data to determine the probability distribution of charged particle scattering using a statistical multiple scattering model and determine a substantially maximum likelihood estimate of object volume scattering density using expectation maximization (ML/EM) algorithm to reconstruct the object volume scattering density. The presence of and/or type of object occupying the volume of interest can be identified from the reconstructed volume scattering density profile. The charged particle tomographic data can be cosmic ray muon tomographic data from a muon tracker for scanning packages, containers, vehicles or cargo. The method can be implemented using a computer program which is executable on a computer.

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19-09-2013 дата публикации

Measuring apparatus and measuring method

Номер: US20130243154A1
Автор: Yasuhiko Ishibashi
Принадлежит: Toshiba Corp

In accordance with an embodiment, a measuring apparatus includes an electromagnetic wave applying unit, a detecting unit, a data processing unit, a film structure transforming unit, and a film structure measuring unit. The electromagnetic wave applying unit generates electromagnetic waves to apply it to a periodic structure of films on a substrate. The detecting unit detects the electromagnetic waves scattered or reflected by the substrate. The data processing unit calculates a surface shape of the periodic structure. The film structure transforming unit calculates a virtual film structure regarding the internal structure of the periodic structure. The film structure measuring unit calculates the thickness of each layer constituting the periodic structure by fitting a first reflectance profile by actual measurement regarding the periodic structure to a second reflectance profile obtained by a simulation using the virtual film structure to restructure the shape of the periodic structure.

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19-09-2013 дата публикации

MICRODIFFRACTION

Номер: US20130243159A1
Принадлежит: PANALYTICAL B.V.

A method of X-ray diffraction illuminates a beam () of X-rays along an illuminated strip () on a surface () of a sample (). The X-rays are diffracted by the sample () and pass through a mask () having a slit extending essentially perpendicularly to the strip (). The X-rays are detected by a two-dimensional X-ray detector to measure the diffracted X-rays at different positions along the strip (). 1. A method of X-ray diffraction for measuring a sample having a sample surface , the method comprising:illuminating a beam of X-rays along an illuminated strip extending along the surface of the sample in a y direction;passing X-rays diffracted by the sample along the illuminated strip through a mask between the sample and a two-dimensional detector, the mask having a slit extending substantially perpendicularly to the y direction so that X-rays diffracted from different positions along the illuminated strip are received at different positions along the y direction on the two-dimensional X-ray detector;detecting X-rays diffracted by the sample at the two-dimensional X-ray detector, so that different positions along the y direction at the two-dimensional detector correspond to different positions along the illuminated strip and different positions in the perpendicular direction, z′, to the line direction on the two-dimensional X-ray detector correspond to different diffraction angles 2θ.2. A method according to claim 1 , wherein the step of illuminating a beam comprises generating X-rays using an X-ray source and passing the generated X-rays through a source slit to illuminate the sample.3. A method according to further comprising moving the source slit to move the location of the illuminated strip on the surface of the sample.4. A method according to further comprising passing the beam through additional conditioning optics.5. A method according to claim 1 , wherein the sample is a sample with an inhomogeneous surface.6. A method according to further comprising adjusting ...

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26-09-2013 дата публикации

Sample analyzing apparatus and sample analyzing method

Номер: US20130248706A1
Автор: Haruko Akutsu
Принадлежит: Individual

In accordance with an embodiment, a sample analyzing apparatus includes a charged beam generating unit, a detecting unit, and an analyzing unit. The charged beam generating unit is configured to generate a charged beam and apply the charged beam to a sample. The detecting unit is configured to detect charged particles and then output a signal, the charged particles being generated from the sample by the application of the charged beam in a manner depending on a three-dimensional structure and material characteristics of the sample. The analyzing unit is configured to process the signal to analyze the sample.

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26-09-2013 дата публикации

X-RAY COMPOSITE APPARATUS

Номер: US20130251100A1
Принадлежит: RIGAKU CORPORATION

There is provided an X-ray composite apparatus capable of performing, with one unit, X-ray CT and element analysis by fluorescent X-rays. The X-ray composite apparatus includes an X-ray source generating cone beam X-rays, a sample support holding a sample S, collimator parts and capable of narrowing the cone beam X-rays to form parallel X-rays, depending on the intended use, between the X-ray source and the sample support , a two-dimensional detector detecting the cone beam X-rays transmitted through the sample S, and a fluorescent X-ray detector detecting fluorescent X-rays radiated from the sample S, and when the apparatus is used for X-ray CT, the apparatus irradiates the sample with the cone beam X-rays, while when the apparatus is used for fluorescent X-ray analysis, the apparatus irradiates the sample S with the parallel X-rays. 1. An X-ray composite apparatus comprising:an X-ray source generating cone beam X-rays;a sample support holding a sample to be irradiated with the cone beam X-rays;a collimator part capable of narrowing the cone beam X-rays to form parallel X-rays, depending on the intended use, between the X-ray source and the sample support;a two-dimensional detector detecting the cone beam X-rays transmitted through the sample; anda fluorescent X-ray detector detecting the fluorescent X-rays radiated from the sample, whereinwhen the apparatus is used for the X-ray CT, the apparatus irradiates the sample with the cone beam X-rays, while when the apparatus is used for the fluorescent X-ray analysis, the apparatus irradiates the sample with the parallel X-rays formed by the collimator part.2. The X-ray composite apparatus according to claim 1 , further comprising:a two-dimensional detector detecting the cone beam X-rays transmitted through the sample or the X-rays diffracted by the sample, whereinwhen the apparatus is used for the X-ray diffraction analysis, the apparatus irradiates the sample with the parallel X-rays formed by the collimator part.3. ...

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03-10-2013 дата публикации

X-RAY MEASUREMENT APPARATUS

Номер: US20130259199A1
Автор: Ueji Yoshinori
Принадлежит: RIGAKU CORPORATION

A portable, for example, a hand-held-type, X-ray measurement apparatus, wherein the vibration or hand-shaking of the X-ray measurement apparatus is detected by a vibration-detection sensor such as a distance sensor, a gyro sensor, or the like, and a measurement value for the X-ray intensity obtained using a two-dimensional X-ray detector is corrected on the basis of a variation quantity obtained using the vibration-detection sensor. The correction may be a correction related to an X-ray source, a correction related to an X-ray detector, a correction calculated using the CPU of a computer and a software program, or the like. 1. An X-ray measurement apparatus having:an X-ray source for generating an X-ray incident on a measurement object;X-ray detection means for detecting an X-ray leaving the measurement object; anda housing containing the X-ray source and the X-ray detection means; the X-ray measurement apparatus comprising:a vibration quantity detection sensor for detecting the vibration quantity of the housing;wherein a process for correcting a measurement value obtained using the X-ray detection means is performed on the basis of the vibration quantity obtained using the vibration quantity detection sensor.2. The X-ray measurement apparatus according to claim 1 , wherein the vibration quantity detected by the vibration quantity detection sensor is at least one of:(A) the amount of variation in distance between the vibration quantity detection sensor and the measurement object;(B) the amount of variation within a plane orthogonal to a line connecting the vibration quantity detection sensor and the measurement object; or(C) the amount of variation in inclination of the vibration quantity detection sensor relative to the measurement object.3. The X-ray measurement apparatus according to claim 2 , wherein the vibration quantity detection sensor comprises any one or a combination of two or more of a distance sensor for detecting variation in distance claim 2 , a speed ...

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03-10-2013 дата публикации

X-ray topography apparatus

Номер: US20130259200A1
Принадлежит: Rigaku Corp

Provided is an X-ray topography apparatus capable of separating a desired characteristic X-ray which enters a sample from an X-ray which is radiated from an X-ray source, and increasing an irradiation region of the desired characteristic X-ray. The X-ray topography apparatus includes: the X-ray source for radiating the X-ray from a fine focal point, the X-ray containing a predetermined characteristic X-ray; an optical system including a multilayer mirror with a graded multilayer spacing which corresponds to the predetermined characteristic X-ray, the optical system being configured to cause the X-ray reflected on the multilayer mirror to enter the sample; and an X-ray detector for detecting a diffracted X-ray. The multilayer mirror includes a curved reflective surface having a parabolic cross section, and the fine focal point of the X-ray source is provided onto a focal point of the curved reflective surface.

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03-10-2013 дата публикации

Apparatus and method for supporting a liquid sample for measuring scattering of electromagnetic radiation

Номер: US20130259201A1
Принадлежит: Bruker AXS GmbH

An apparatus for supporting a liquid sample for measuring an intensity of X-ray radiation scattered by the liquid sample is configured such as to allow the X-ray radiation to impinge along a first direction () through the first support member onto the liquid sample and to leave the liquid sample through the second member along a second direction () different from the first direction to be detected by a detector. Further, a system for measuring an intensity of X-ray radiation scattered by a liquid sample and corresponding methods are provided. 118-. (canceled)19. An apparatus for supporting a liquid sample for measuring an intensity of X-ray radiation scattered by the liquid sample , the apparatus comprising:a first support member having a first surface;a second support member having a second surface, the first surface and the second surface being adapted such that the liquid sample is supportable between the first surface and the second surface by a surface tension force,wherein the apparatus is configured such as to allow the X-ray radiation to impinge along a first direction through the first support member onto the liquid sample and to leave the liquid sample through the second member along a second direction different from the first direction to be detected by a detector, wherein the first member and/or the second member comprises an X-ray transparent window comprising diamond and/or silicon nitride.20. The apparatus according to claim 19 , wherein the second direction and the first direction include an angle between 0.1° and 90° claim 19 , between 2° and 60° claim 19 , between 5° and 40° or between 7° and 35°.21. The apparatus according to claim 19 , wherein the first surface is a plane surface in at least a first region where the X-ray radiation impinges onto the first member and/or the second surface is a plane surface in at least a second region where the X-ray radiation leaves the second member.22. The apparatus according to claim 21 , wherein the first ...

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17-10-2013 дата публикации

System and Method for Step Coverage Measurement

Номер: US20130272496A1
Принадлежит:

Determining an unknown step coverage of a thin film deposited on a 3D wafer includes exposing a planar wafer comprising a first film deposited thereon to X-ray radiation to create first fluorescent radiation; detecting the first fluorescent radiation; measuring a number of XRF counts on the planar wafer; creating an XRF model of the planar wafer; providing a portion of the 3D wafer comprising troughs and a second film deposited thereon; determining a multiplier factor between the portion of the 3D wafer and the planar wafer; exposing the portion of the 3D wafer to X-ray radiation to create second fluorescent radiation; detecting the second fluorescent radiation; measuring a number of XRF counts on the portion of the 3D wafer; calculating a step coverage of the portion of the 3D wafer; and determining a uniformity of the 3D wafer based on the step coverage of the portion of the 3D wafer. 1. A method of characterizing a film on a 3D device , comprising:exposing the film to radiation of sufficient energy to excite secondary X-ray emission from the film;detecting the emission from the film;{'sub': '1', 'quantifying the emission as a count;'}{'sub': '0', 'retrieving a count;'}determining a multiplier factor N; andcalculating a step coverage;{'sub': '0', 'wherein the countis derived from a measurement of secondary X-ray emission from a planar device;'}wherein the multiplier factor N is derived from an actual surface area of the film on the 3D device;{'b': 1', '0, 'wherein the step coverage comprises a ratio resulting from the division of the count by the count;'}and wherein the calculating of the step coverage further comprises multiplying the ratio by the multiplier factor N.2. The method of claim 1 , wherein the radiation comprises high-energy X-rays claim 1 , gamma rays claim 1 , or short-wavelength X-rays.3. The method of claim 1 , wherein the emission is detected by a photomultiplier.4. The method of claim 1 , wherein the multiplier factor N is proportional to the ...

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17-10-2013 дата публикации

X-RAY IMAGING APPARATUS

Номер: US20130272501A1
Принадлежит: CANON KABUSHIKI KAISHA

The present invention relates to an X-ray imaging apparatus including an X-ray source, a grating that divides diverging X-rays irradiated from the X-ray source, and a detector that detects X-rays which are divided by the grating and pass through a sample. The grating includes a plurality of transparent objects which pass the diverging X-rays and a plurality of opaque objects that shield the diverging X-rays. A focused position at which a plurality of extended lines intersect each other and the X-ray source are arranged in different position. The extended lines are formed by extending center lines which connect a center of the X-ray source side of each of the plurality of opaque objects facing the X-ray source with a center of the detector side of each of the plurality of opaque objects facing the detector. 1. An X-ray imaging apparatus comprising:an X-ray source;a grating configured to divide diverging X-rays irradiated from the X-ray source; anda detector configured to detect X-rays which are divided by the grating and pass through a sample,wherein the grating includes a plurality of transparent objects which pass the diverging X-rays, and a plurality of opaque objects which shield the diverging X-rays, anda focused position at which a plurality of extended lines intersect each other and the X-ray source are arranged in different position, each of the extended lines being formed by extending a center line which connects a center of the X-ray source side of each of the plurality of opaque objects facing the X-ray source with a center of the detector side of each of the plurality of opaque objects facing the detector.2. The X-ray imaging apparatus according to claim 1 , wherein the grating is arranged so that a position obtained by moving a position at which the X-ray source is located in a direction perpendicular to an optical axis corresponds to the focused position of the grating.3. The X-ray imaging apparatus according to claim 1 , wherein the grating is arranged ...

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24-10-2013 дата публикации

Apparatus for protecting a radiation window

Номер: US20130279654A1
Принадлежит: Bruker AXS Handheld LLC

A radiation detector assembly and a method for using the same are provided. The radiation detector assembly includes an aperture, a window covering the aperture, the window is configured to permit radiation to pass through, the window is configured to prevent the passage of fluids and particles through the aperture, and a protective device covers the window. The protective device includes a plurality of holes at least partially aligned with the aperture, is configured to permit at least some radiation to pass through the holes, is configured to prevent objects larger than the holes to contact the window and is configured to withstand external forces and prevent those forces from damaging the window.

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31-10-2013 дата публикации

System, Method and Applications Involving Identification of Biological Circuits Such as Neurological Characteristics

Номер: US20130284920A1
Принадлежит: Leland Stanford Junior University

Various aspects are directed to systems and methods for assessing neural activity of a neural region having multiple subfields. In certain embodiments, a method includes evoking a cellular electrical response in at least one subfield due to neural activity in the neural region, capturing image data of the electrical response at a level sufficiently detailed in space and time to differentiate between polarization-based events of two respective portions of the subfield, and then assessing neural activity by correlating space and time information, from the captured data, for the two respective portions of the sub-field. Other more specific aspects of the invention involve different preparation and neural stimulation approaches which can vary depending on the application.

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31-10-2013 дата публикации

Method for Detecting Information of an Electric Potential on a Sample and Charged Particle Beam Apparatus

Номер: US20130284921A1
Принадлежит:

An object of the present invention is to provide a method and apparatus for measuring a potential on a surface of a sample using a charged particle beam while restraining a change in the potential on the sample induced by the charged particle beam application, or detecting a compensation value for a change in a condition for the apparatus caused by the sample being electrically charged. In order to achieve the above object, the present invention provides a method and apparatus for applying a voltage to a sample so that a charged particle beam does not reach the sample (hereinafter, this may be referred to as “mirror state”) in a state in which the charged particle beam is applied toward the sample, and detecting information relating to a potential on the sample using signals obtained by that voltage application. 1. A method for measuring an electric potential on a sample , comprising determining the electric potential on the sample based on charged particles reflected without reaching the sample in a state in which a charged particle beam emitted from a charged particle source is applied toward the sample ,wherein when a retarding voltage for decelerating the charged particle beam is greater than an acceleration voltage for accelerating the charged particle beam, information on an orbit of the charged particles is obtained based on charged particles detected by a charged particle detector placed between the charged particle source and an objective lens that focuses the charged particle beam, andan electric potential on the sample is determined by referring to data showing a correlation between the electric potential on the sample and a difference between the obtained information and information on an orbit of the charged particles detected by the charged particle detector at a predetermined electric potential on the sample.2. The method for measuring an electric potential on a sample according to claim 1 ,wherein the information on the orbit of the charged particles ...

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31-10-2013 дата публикации

CHARGED PARTICLE BEAM APPARATUS

Номер: US20130284924A1
Принадлежит: HITACHI HIGH-TECHNOLOGIES CORPORATION

There is provided an apparatus which can accurately carry out focusing of an optical microscope mounted on a charged particle beam apparatus while restraining an increase in an apparatus cost and a reduction in a throughput. An approximate polynomial is formed based on a focus map of the optical microscope which is previously measured, and a control amount which adds a difference between a piece of wafer height information at that occasion and a piece of wafer height information in actual observation to the approximate polynomial is inputted as a focus control value of the optical microscope. 1. A charged particle beam apparatus comprising:a charged particle optical column of irradiating a wafer mounted on a stage with a primary charged particle beam, detecting a generated secondary electron or reflection electron, and outputting a detection signal;a Z sensor of measuring a height of the wafer;a position measuring means for measuring a moving amount in an in-plane direction of the stage;an optical microscope of taking an image of the wafer by detecting a reflecting beam or a scattering beam provided by irradiating the wafer with a beam; anda control unit of adjusting a focal point of the optical microscope,wherein the control unit calculates a focus value of the optical microscope at an image taking position of the optical microscope on a surface of the wafer from a relationship between a dependency of a focus value of the optical microscope on an in-plane position of the wafer and a measured value of the position measuring means, and corrects the calculated focus value by using a measured value of the Z sensor at a prescribed reference position of the wafer.2. The charged particle beam apparatus according to claim 1 , wherein the control unit calculates the focus value of the optical microscope by storing a difference between the measured value of the Z sensor at the reference position and the measured value of the Z sensor at a predetermined image taking position ...

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07-11-2013 дата публикации

VESSEL INSPECTION APPARATUS AND METHODS

Номер: US20130291632A1
Принадлежит:

Methods for processing a vessel, for example to provide a gas barrier or lubricity, are disclosed. First and second PECVD or other vessel processing stations or devices and a vessel holder comprising a vessel port are provided. An opening of the vessel can be seated on the vessel port. The interior surface of the seated vessel can be processed via the vessel port by the first and second processing stations or devices. Vessel barrier, lubricity and hydrophobic coatings and coated vessels, for example syringes and medical sample collection tubes are disclosed. A vessel processing system and vessel inspection apparatus and methods are also disclosed 1. A method for inspecting the product of a coating process wherein a coating has been applied by plasma enhanced chemical vapor deposition (PECVD to at least a portion of the surface of a vessel to form a coated surface , the method comprising:(a) providing a product of the coating process having a plasma enhanced chemical vapor deposition coating on the surface;(b) providing a space that is a lumen of the vessel adjacent to the plasma enhanced chemical vapor deposition coating;(c) measuring a release characteristic of at least one volatile species into the space adjacent to the plasma enhanced chemical vapor deposition coating;(d) identifying the release characteristic of the at least one volatile species from an acceptably coated surface of the inspection object; and(e) determining whether the release characteristic measured in step (c) satisfies the release characteristic identified in step (d).2. The invention of claim 1 , in which the vessel comprises thermoplastic base material.3. The invention of claim 2 , in which the vessel is an injection-molded thermoplastic part.4. The invention of claim 2 , in which the vessel is a blow molded thermoplastic part.5. The invention of claim 2 , in which the thermoplastic base material comprises a polyester.6. The invention of claim 2 , in which the thermoplastic base material ...

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07-11-2013 дата публикации

Methods and Systems for the Rapid Detection of Concealed Objects

Номер: US20130294574A1
Автор: Peschmann Kristian R.
Принадлежит:

This invention is directed towards finding, locating, and confirming threat items and substances. The inspection system is designed to detect objects that are made from, but not limited to, special nuclear materials (“SNM”) and/or high atomic number materials. The system employs advanced image processing techniques to analyze images of an object under inspection (“OUI”), which includes, but is not limited to baggage, parcels, vehicles and cargo, and fluorescence detection. 152-. (canceled)53. An apparatus for inspecting an object , comprising:a first stage inspection system comprising a conveyor for transporting the object into a first inspection volume, a dual energy X-ray source wherein said dual energy X-ray source is configured to irradiate said first inspection volume with dual energy radiation, and a detector array positioned opposite said dual energy X-ray source, configured to receive dual energy radiation transmitted through said object, and adapted to generate signals, comprising a high energy data component and a low energy data component, based upon said received dual energy radiation;a second stage inspection system configured to inspect a second inspection volume, wherein said second inspection volume is smaller than the first inspection volume; andat least one processor for processing said signals to generate a three dimensional image of said object and to locate a threat within said object.54. The apparatus of wherein said first stage inspection system is adapted to identify a location of the threat within said object and to communicate said location to a human operator.55. The apparatus of wherein said first stage inspection system is adapted to identify a location of the threat within said object and to communicate said location to a second stage inspection system.56. The apparatus of wherein the second stage inspection system inspects said location to confirm the existence of said threat.57. The apparatus of wherein first stage inspection system ...

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07-11-2013 дата публикации

WAVELENGTH DISPERSIVE X-RAY FLUORESCENCE SPECTROMETER

Номер: US20130294577A1
Принадлежит: RIGAKU CORPORATION

In the wavelength dispersive X-ray fluorescence spectrometer of the present invention, a counting loss correcting unit (), when correcting a counting rate of pulses determined by a counting unit () on the basis of a dead time of a detector (), stores beforehand a correlation between a predetermined pulse height range, within which pulses are selected by a pulse height analyzer (), and the dead time and determines the dead time so as to correspond to the predetermined pulse height range during a measurement on the basis of the stored correlation. 1. A wavelength dispersive X-ray fluorescence spectrometer which comprises:an X-ray source for irradiating a sample with primary X-rays;a spectroscopic device for monochromating fluorescent X-rays emitted from the sample;a detector for receiving the fluorescent X-rays, which have been monochromated by the spectroscopic device, and generating pulses of a pulse height proportional to the energy of the fluorescent X-rays in a number dependent on the intensity of the fluorescent X-rays;a pulse height analyzer for selecting pulses of a pulse height within a predetermined pulse height range from the pulses generated by the detector;a counting unit for determining a counting rate of the pulses selected by the pulse height analyzer; anda counting loss correcting unit for correcting the counting rate of the pulses, determined by the counting unit, on the basis of a dead time of the detector with respect to a counting loss of the pulses to be counted;the counting loss correcting unit stores beforehand a correlation between each of a plurality of representative predetermined pulse height ranges and the dead time and determines the dead time, which corresponds to the predetermined pulse height range during a measurement, on the basis of the correlation so stored.2. The wavelength dispersive X-ray fluorescence spectrometer as claimed in claim 1 , in which the counting loss correcting unit stores beforehand a correlation between each of a ...

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07-11-2013 дата публикации

Defect inspection method and defect inspection device

Номер: US20130294677A1
Принадлежит: Hitachi High Technologies Corp

There is provided a defect inspection method including the steps of: acquiring image data sets of a sample under a plurality of imaging conditions; storing a plurality of image data sets acquired under the plurality of imaging conditions in an image storage unit; acquiring a defect candidate from each of the plurality of image data sets; cutting out, from the image data sets acquired under at least two imaging conditions and stored in the image storage unit, a partial images each including a position of the defect candidate detected in any of the plurality of image data sets and the periphery of the defect candidate position; and integrating the partial images acquired under at least two imaging conditions corresponding to the defect candidates, thereby classifying the defect candidates.

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