A high-energy x-ray spectroscopy-based inspection system and methods to determine the atomic number of materials

The application discloses systems and methods for X-ray scanning for identifying material composition of an object being scanned. The system includes at least one X-ray source for projecting an X-ray beam on the object, where at least a portion of the projected X-ray beam is transmitted through the object, and an array of detectors for measuring energy spectra of the transmitted X-rays. The measured energy spectra are used to determine atomic number of the object for identifying the material composition of the object. The X-ray scanning system may also have an array of collimated high energy backscattered X-ray detectors for measuring the energy spectrum of X-rays scattered by the object at an angle greater than 90 degrees, where the measured energy spectrum is used in conjunction with the transmission energy spectrum to determine atomic numbers of the object for identifying the material composition of the object.

High energy x-ray inspection system using a fan-shaped beam and collimated backscatter detectors

This invention provides an x-ray scanning system for scanning an object (22) in a scanning zone. The system comprises an x-ray linear accelerator (20) arranged to irradiate the object with x- radiation having a peak energy of at least 900keV. The system also comprises a back-scatter detector (26) arranged to detect radiation back-scattered from the object. The radiation beam is cone-shaped or fan-shaped and arranged to irradiate the object over a plurality of regions within a single irradiation event. The back-scatter detector comprises a plurality of detection elements, each detection element being arranged to detect scattered radiation from a predefined part of the scanning zone by use of collimators such as zone plates. A signal processor (40) arranged to calculate scatter intensity across the plurality of detector elements.

A Method of Determining the Density Profile of a Plate-Shaped Material

A method of non-destructively, on-line determining the density profile in a plate-shaped material with a density which varies discretely or continuously over the plate thickness, while the density at a specific depth of the plate is assumed to be constant, such as for instance plates based on wood, by means of X-rays or gamma rays from a source placed on one side of the plate. Two detectors are placed on the other side of the plate, one detector measuring in the emitting direction of the source and the other detector measuring in the other direction and being movable relative to the plate. The counting number of the second detector is adjusted by means of the counting number of the first detector. By a suitable choice of emitting direction and detecting direction it is possible to provi de a measurement of the density in a specific measuring volume merely by dividing the counting number of the second detector by the countin g number of the first detector. As a result, the attenua tion in ...

ANALYTICAL METHOD OF EXTREME SUPER-THIN GRAPHENE USING X-RAY

The present invention relates to an analytical method of graphene and, more specifically, relates to a method to examine a thickness (a number of layers) of graphene samples, the thickness of nanothin films, and a size of nanocrystal grains (average value, distribution, or the like) based on a technology used in a method to accurately measure and determine the thickness of a super thin graphene in units of atoms, molecules, and nanoparticles, which has remained as a difficult problem up until now and has allowed only by theoretical approach, and the data acquired thereof. The present invention provides an analytical method of graphene, which comprises: (a) a step of performing an XRD measurement of graphene defined by a number of layers (002) to acquire a diffraction peak; and (b) a step of deducing effective information on the thickness of graphene including a full width at half maximum (FWHM) and a distance between layers (d_002) from the peaks (002) by number of layers of graphene. COPYRIGHT ...

COHERENT SCATTER COMPUTER TOMOGRAPHY MATERIAL IDENTIFICATION

In a CSCT material identification apparatus CT-information and differential scatter cross-sections are used for material identification. According to an aspect of the present invention, a material identification is provided which uses both the differential and the total scatter cross-sections. This may yield an improved material discrimination, i.e. a better detection rate and a lower false alarm rate.

METHOD AND DEVICE FOR THE ONLINE DETERMINATION OF THE ASH CONTENT OF A SUBSTANCE CONVEYED ON A CONVEYING MEANS, AND DEVICE FOR CARRYING OUT SUCH AN ONLINE DETERMINATION

A system for measuring a particle size distribution of particles of a particulate matter

It is an objective of the present invention to provide a system for measuring the particle size distribution of the particles of a particulate matter and, simultaneously, its crystalline nature. This objective is achieved according to the present invention by a system for measuring the particle size distribution of the particles of a particulate matter; comprising: a) a particle separation unit (4), such as a decanter unit, a centrifugal unit or a magnetic/electric field unit, being designed to force the particles (10a, 10b) to move through a moderating agent (8), such as liquid or a suspension; b) a radiation source (12) and a respective detector (14) enabled to measure dynamically the transmitted and/or particle absorbed amount of the incident light in at least a section of said particle acceleration unit (4), said measurement being preferably performable during predetermined time intervals; c) a radiation source (12) and a respective detector (14) enabled to simultaneously measure dynamically ...

Systems and methods for identifying a substance

A system (10) for identifying a substance (82) is provided. The system includes a first scatter detector (16) configured to detect a first set of scattered radiation (89, 90), a second scatter detector (18) configured to detect a second set of scattered radiation (88, 91), and a processor (190) configured to generate a first effective atomic number from the first set of scattered radiation, to generate a second effective atomic number from the second set of scattered radiation, and to determine (642) whether the first effective atomic number is within a limit of the second effective atomic number.

Systems and methods for identifying a substance

A system (10) for identifying a substance (82) is provided. The system includes a first scatter detector (16) configured to detect a first set of scattered radiation (89, 90), a second scatter detector (18) configured to detect a second set of scattered radiation (88, 91), and a processor (190) configured to generate a first effective atomic number from the first set of scattered radiation, to generate a second effective atomic number from the second set of scattered radiation, and to determine (642) whether the first effective atomic number is within a limit of the second effective atomic number.

Methods, a processor, and a system for improving an accuracy of identification of a substance

A system (10,100) for improving an accuracy of identification of a substance is provided. The system (10,100) includes an X-ray source (64,66,68) configured to generate X-rays, a detector operatively coupled to the X-ray source, and configured to detect the X-rays and output an electrical signal (196,198,200,202,204,206,208,210,212) representative of the detected X-rays, and a processor (190) coupled to the detector and configured to determine whether a relative molecular interference function of the substance includes at least one peak (1056,1058,1060).

METHODE ZUR BESTIMMUNG DES DICHTEPROFILS EINES SCHEIBENFÖRMIGEN MATERIALS

X-ray inspection systems

High energy x-ray inspection system using a fan-shaped beam and collimated backscatter detectors

METHOD AND APPARATUS FOR SAMPLING AND MEASURING TAILINGS

Tailings are selectively fed from a bank of froth flotation cells, for example for coal washing, via a filter through a de-aerator 11 to a vertical measurement column 13. An X-ray ash content monitor 33 and a gamma ray solids content monitor 34, 35 are located at an intermediate part of the column 13 which diverges at an angle not exceeding 8 DEG . The tailings are fed to the base of the column through a gently curved pipe 36 followed by a straight section which establishes laminar flow. ...

Improvements in or relating to sample analysis

METHOD FOR THE DETERMINATION OF THE SEALING PROFILE OF A DISK-SHAPED MATERIAL

Combined scatter and transmission multi-view imaging system

The present specification discloses a multi-view X-ray inspection system having, in one of several embodiments, a three-view configuration with three X-ray sources. Each X-ray source rotates and is configured to emit a rotating X-ray pencil beam and at least two detector arrays, where each detector array has multiple non-pixellated detectors such that at least a portion of the non-pixellated detectors are oriented toward both the two X-ray sources.

COMBINED SCATTER AND TRANSMISSION MULTI-VIEW IMAGING SYSTEM

The present specification discloses a multi-view X-ray inspection system having, in one of several embodiments, a three-view configuration with three X-ray sources. Each X-ray source rotates and is configured to emit a rotating X-ray pencil beam and at least two detector arrays, where each detector array has multiple non-pixellated detectors such that at least a portion of the non-pixellated detectors are oriented toward both the two X-ray sources.

SYSTEM AND METHOD OF X-RAY INSPECTION PHYSICAL PERSONS WITH DETERMINATION OF IRRADIATION DOSE, EXCEEDING THRESHOLD VALUE

X-ray transmission and back-scattering detection device and method

本发明提供一种X射线透射和背散射检测装置，包括：X射线透射检测单元；X射线背散射检测单元；传送单元；传感器单元；数据采集和处理单元；输出单元。本发明还提供一种X射线透射和背散射检测方法。本发明的X射线透射和背散射检测装置和方法能将进入检测区域的物品的透射检测图像和背散射检测图像同时在一张图像上输出显现，便于安检人员更迅速、准确地查看和分辨检测信息。

Scanner for X-ray transmission and back scattering integrated imaging system

X-ray grating differential phase contrast imaging method and device based on two-dimensional dislocation absorption grating

gerador de raios x de escaneamento combinado, aparelho de inspeção de compósito, e método de inspeção para um alvo a ser inspecionado por meio do uso do aparelho de inspeção de compósito

IMPROVEMENTS IN OR RELATING TO SAMPLE ANALYSIS

A method of sample analysis comprises irradiating a sample with electromagnetic radiation such as X-rays; collecting absorption data and scattering data; and combining the absorption and scattering data. The irradiation can be in the form of a tubular beam, a detector may be placed in a plane where Debye cones diffracted from the sample overlap at a central point for the collection of the scattering data.

Stationary Tomographic X-Ray Imaging Systems for Identifying Threats Based on Generated Tomographic Images

An X-ray imaging inspection system for inspecting items comprises an X-ray source extending around an imaging volume , and defining a plurality of source points from which X-rays can be directed through the imaging volume. An X-ray detector array also extends around the imaging volume and is arranged to detect X-rays from the source points which have passed through the imaging volume, and to produce output signals dependent on the detected X-rays. A conveyor is arranged to convey the items through the imaging volume 1. An X-ray imaging system for scanning an object , the system comprising:a plurality of stationary X-ray sources configured at least partially around an imaging volume;a plurality of detectors configured at least partially around the imaging volume, wherein the plurality of detectors are configured to detect X-rays emitted from the plurality of stationary X-ray sources and are configured to generate X-ray image data; extract a plurality of parameters from the X-ray image data;', 'apply one or more functions to the extracted plurality of parameters to generate an output;', 'construct information based on the output; and', 'determine if the information is indicative of a threat., 'at least one processor configured to receive the X-ray image data and generate at least a tomographic image from the X-ray image data, wherein the at least one processor is further configured to2. The X-ray imaging system of claim 1 , wherein the information comprises an extent of volume contiguity.3. The X-ray imaging system of claim 1 , wherein the plurality of parameters comprise at least one of a constant gray level of the X-ray image data or a texture of the X-ray image data.4. The X-ray imaging system of claim 1 , wherein the X-ray image data comprises data representative of two-dimensional images and wherein the plurality of parameters are extracted from at least one of the two-dimensional images and the tomographic image.5. The X-ray imaging system of claim 1 , wherein ...

METHODS AND SYSTEMS FOR DETERMINING THE AVERAGE ATOMIC NUMBER AND MASS OF MATERIALS

Disclosed herein are methods and systems of scanning a target for potential threats using the energy spectra of photons scattered from (lie target to determine the spatial distributions of average atomic number and/or mass in the target. An exemplary method comprises: illuminating each of a plurality of voxels of the target with a photon beam; determining an incident flux upon each voxel; measuring the energy spectrum of photons scattered from the voxel; determining, using the energy spectrum, the average atomic number in the voxel; and determining the mass in the voxel using the incident flux, the average atomic number of the material in the voxel, the energy spectrum, and a scattering kernel corresponding to the voxel. An exemplary system may use threat detection heuristics to determine whether to trigger further action based upon the average atomic number and/or mass of the voxels.

РЕНТГЕНОВСКИЙ ОСМОТР С ПОМОЩЬЮ ОДНОВРЕМЕННОГО ФОРМИРОВАНИЯ ИЗОБРАЖЕНИЙ НА ОСНОВЕ ПРОПУСКАНИЯ И ОБРАТНОГО РАССЕИВАНИЯ СВЕТА

... 1. Способ осмотра объекта, включающийа. облучение объекта первым лучом проникающего излучения,b. генерирование сигнала пропускания на основе проникающего излучения, пропущенного через объект и зарегистрированного датчиком регистрации пропускания,с. сканирование объекта вторым лучом проникающего излучения,d. генерирование сигнала рассеивания на основе проникающего излучения, рассеянного объектом и зарегистрированного датчиком регистрации рассеивания,е. корректирование любой помехи в сигнале рассеивания, возникающей вследствие первого луча проникающего излучения при наличии объекта, иf. отображение изображения, видимого оператору и включающего информацию по меньшей мере от сигнала рассеивания.2. Способ по п.1, в котором генерирование сигнала пропускания включает генерирование энергозависимого сигнала пропускания.3. Способ по п.1, в котором корректирование сигнала рассеивания включает извлечение из сигнала рассеивания фонового сигнала, который измерен датчиком регистрации рассеивания, когда ...

Apparatus and method for characterisation of materials

DETERMINATION OF THE MEAN SIZE OF SOLID PARTICLES CONTAINED IN A MEDIUM

... 1323695 Measuring mean particle size photoelectrically NATIONAL RESEARCH DEVELOPMENT CORP 8 Sept 1970 [2 Oct 1969] 48563/69 Heading G1A The mean size of particles suspended in a liquid or solid medium is determined by subjecting the medium, to radiation, e.g. from radio-isotope X- ray source 11, containing a component which produces Compton-scattered radiation from the medium having an intensity depending on the particle size, and then measuring the ratio of the intensity of this Compton radiation to the intensity of the Rayleigh-scattered radiation derived from the same irradiating component, this ratio being indicative of the particle size. Alternatively, the incident X-radiation 12 contains two components which produce two corresponding Comptonscattered radiation wavelengths from the medium whose intensities are respectively independent of and dependent on the mean particle size. The ratio of these two Compton intensities hence indicates the mean particle size. In both embodiments the ...

NON-DESTRUCTIVE DENSITOMETRIC MEASUREMENT

... 1414655 Measurement of electron density within a body ATOMIC ENERGY OF CANADA Ltd 13 Nov 1972 [24 Nov 1971] 52277/72 Heading G1A The electron density of a small volume of material within a body (which may be irregularly shaped and non-uniform) is measured non- destructively by passing two finely collimated beams of photons through the volume at an angle to one another and making specified measurements including ones involving the flux densities of transmitted and Compton scattered photons, and calculating the electron density. In a first method two unequal high-energy sources of X or -radiation are arranged so that the angle between the beams results in the mean energy of the Compton-scattered photons from the more energetic source Sl received at the second detector D2 being equal to the mean energy of the photons from the less energetic source S2. The measurements taken are then the photon flux densities of the directly transmitted radiations measured individually, the photon flux densities ...

METHOD AND APPARATUS OF SAMPLING AND MEASURING TAILINGS

Liquid detection method and system

METHOD AND SYSTEM FOR ANALYZING AN OBJECT BY USING A BROADCAST SPECTRUM DIFFRACTOMETRY SPECTRUM TRANSMISSION AND

SYSTEM AND METHOD FOR X-RAY DIFFRACTION IMAGING

An X-ray diffraction imaging system is provided. The X-ray diffraction imaging system includes an X-ray source configured to emit an X-ray pencil beam and a scatter detector configured to receive scattered radiation having a scatter angle from the X-ray pencil beam. The scatter detector is located substantially in a plane and includes a plurality of detector strips. A first detector strip has a first width equal to a linear extent of the X-ray pencil beam measured at the plane in a direction parallel to the first width.

СИСТЕМА КОНТРОЛЯ ОБЪЕКТА (ВАРИАНТЫ)

FIELD: physics. SUBSTANCE: disclosed is a system for inspecting luggage using an X-ray image. The image is formed in transmitted light using a fan beam and a segmented array of detector elements (segmented sensor array) and a scanning narrow beam is used to obtain the image in diffused light. Both beams act simultaneously. Interference between the beams is suppressed by combining such factors as screening, design, arrangement and alignment of the diffused radiation (back-scattered) light sensor, as well as the corresponding image processing. During image processing, the measured beam intensity value of the subsystem for image formation in transmitted light is subtracted from that scattered onto detectors of the subsystem for image formation in diffused radiation (back-scattered). EFFECT: possibility of reducing interference of X-ray radiation in two subsystems using transmitted and diffused light in one compact image formation system. 28 cl, 3 dwg РОССИЙСКАЯ ФЕДЕРАЦИЯ (19) RU (11) 2 448 342 (13) C2 (51) МПК G01N 23/04 (2006.01) ФЕДЕРАЛЬНАЯ СЛУЖБА ПО ИНТЕЛЛЕКТУАЛЬНОЙ СОБСТВЕННОСТИ (12) ОПИСАНИЕ ИЗОБРЕТЕНИЯ К ПАТЕНТУ Приоритет(ы): (30) Конвенционный приоритет: 11.08.2006 US 60/822,162 (73) Патентообладатель(и): Эмерикэн Сайэнс энд Энджиниэринг, Инк. (US) (43) Дата публикации заявки: 20.09.2010 Бюл. № 26 2 4 4 8 3 4 2 (45) Опубликовано: 20.04.2012 Бюл. № 11 (56) Список документов, цитированных в отчете о поиске: US 6151381 A, 21.11.2000. US 6546072 B1, 08.04.2003. US 6192104 B1, 20.02.2001. WO 2004043740 A2, 27.05.2004. RU 2256169 C1, 10.07.2005. RU 2253861 C2, 10.06.2005. 2 4 4 8 3 4 2 R U (86) Заявка PCT: US 2007/075323 (07.08.2007) C 2 C 2 (85) Дата начала рассмотрения заявки PCT на национальной фазе: 11.03.2009 (87) Публикация заявки РСТ: WO 2008/021807 (21.02.2008) Адрес для переписки: 127055, Москва, а/я 11, пат.пов. Н.К.Попеленскому, рег. № 31 (54) СИСТЕМА КОНТРОЛЯ ОБЪЕКТА (ВАРИАНТЫ) (57) Реферат: Использование: для контроля объекта посредством проникающего ...

СИСТЕМА КОНТРОЛЯ ОБЪЕКТА (ВАРИАНТЫ)

... 1. Система контроля объекта, состоящая из первого источника излучения, формирующего веерный луч проникающего излучения, сегментной матрицы детекторных элементов, измеряющей интенсивность проникающего излучения, проходящего через объект от первого источника излучения, второго источника излучения, формирующего острый луч проникающего излучения, по меньшей мере одного детектора рассеянного излучения, обнаруживающего проникающее излучение посредством отражения объектом сканирующего острого луча, процессора, дисплея и блока памяти, содержащей команды, посредством которых процессор выполняет операцию вычитания фонового сигнала из сигнала, измеренного детектором рассеянного излучения, при этом фоновый сигнал измеряется детектором рассеянного излучения, когда острый сканирующий луч не освещает объект, с формированием скорректированного измеренного сигнала подсистемы формирования изображений в рассеянном свете, и операцию отображения на дисплее указанного скорректированного сигнала, измеренного ...

X-ray tomography inspection systems

An X-ray imaging inspection system for inspecting items comprises an X- ray source (10) extending around an imaging volume (16), and defining a plurality of source points (14) from which X-rays can be directed through the imaging volume. An X-ray detector array (12) also extends around the imaging volume (16) and is arranged to detect X-rays from the source points which have passed through the imaging volume, and to produce output signals dependent on the detected X-rays. A conveyor (20) is arranged to convey the items through the imaging volume (16).

Coherent scatter computer tomography material identification

Estimating strengths of wooden supports

ESTIMATING STRENGTHS OF WOODEN SUPPORTS

A method of estimating the strength of a wooden support wherein gamma rays (4) are transmitted and detected parallel to a neutral axis (5) through a cross section of the support. It also includes a method of locating regions of unsound wood in a wooden support using detection of transmitted gamma rays (4), as well as apparatus suitable for conducting both methods.

METHOD FOR ANALYZING AN OBJECT IN TWO TIME USING RADIATION IN TRANSMISSION AND A BROADCAST SPECTRUM.

L'invention concerne un procédé d'analyse d'un objet qui se déroule en deux parties, - une première partie comprenant les étapes : irradiation de l'objet par un rayonnement photonique incident ; acquisition d'un rayonnement transmis par l'objet au moyen d'un détecteur placé en transmission ; détermination d'au moins une première caractéristique de l'objet à partir du rayonnement en transmission mesuré ; vérification de la réalisation d'au moins un critère de suspicion portant sur la première caractéristique de l'objet et traduisant le fait que l'objet contient un matériau potentiellement suspect pour une application considérée ; - et une seconde partie exécutée uniquement lorsque le critère de suspicion est réalisé, et comprenant : acquisition d'un spectre énergétique diffracté par l'objet au moyen d'un détecteur spectrométrique placé en diffusion selon un angle inférieur à 15° ; détermination d'une seconde caractéristique de l'objet à partir au moins du spectre en diffusion mesuré ; - comparaison au moins de la seconde caractéristiques de l'objet avec des caractéristiques de matériaux étalons mémorisées dans une base de données, aux fins d'identification d'un matériau constitutif de l'objet. The invention relates to a method for analyzing an object that takes place in two parts, - a first part comprising the steps of: irradiating the object with incident photon radiation; acquisition of radiation transmitted by the object by means of a detector placed in transmission; determining at least a first characteristic of the object from the measured transmission radiation; verifying the achievement of at least one criterion of suspicion relating to the first characteristic of the object and reflecting the fact that the object contains a potentially suspect material for a considered application; and a second part executed only when the criterion of suspicion is achieved, and comprising: ...

METHOD AND SYSTEM FOR ANALYZING AN OBJECT BY USING A BROADCAST SPECTRUM DIFFRACTOMETRY SPECTRUM TRANSMISSION AND

L'invention concerne un procédé d'analyse d'un objet comprenant : irradiation de l'objet par un rayonnement photonique incident ; acquisition d'un spectre énergétique diffusé par le matériau à l'aide d'un détecteur spectrométrique (6) placé en diffusion ; acquisition d'un spectre énergétique transmis par le matériau à l'aide d'un détecteur spectrométrique (7) placé en transmission ; reconstruction d'une signature (f) représentative de l'objet, à partir à la fois du spectre en diffusion mesuré et du spectre en transmission mesuré ; comparaison de la signature ainsi reconstruite à des signatures de matériaux étalons. The invention relates to a method for analyzing an object comprising: irradiating the object with incident photon radiation; acquiring an energy spectrum diffused by the material using a spectrometric detector (6) placed in diffusion; acquiring an energy spectrum transmitted by the material using a spectrometric detector (7) placed in transmission; reconstructing a signature (f) representative of the object, from both the measured scatter spectrum and the measured transmission spectrum; comparison of the signature thus reconstructed with signatures of standard materials.

SIGNATURE ANALYSIS ELECTRODE MATERIAL IN AN ELECTROCHEMICAL CELL

L'invention est un système de mesure des caractéristiques d'un matériau d'électrode d'une cellule (1) électrochimique pendant un cycle de décharge et de charge de la cellule électrochimique, combinant des moyens de cyclage aptes à charger/décharger la cellule (1) électrochimique sur un cycle de mesure et à fournir des mesures relatives à un cycle électrochimique, un spectromètre Mössbauer (4, 5, 6), un diffractomètre à rayons X (7, 8) en configuration θ-θ, et un cache (9) apte à être interposé sur la trajectoire du rayonnement X incident (Xi) pour au moins une position du générateur (7) afin d'empêcher le rayonnement X incident (Xi) d'atteindre la cellule. Lors du cycle de mesure, un rayonnement gamma incident (Yi) et un rayonnement X incident (Xi) sont générés continûment et un système d'acquisition acquiert les mesures relatives au cycle électrochimique et en alternance les données provenant d'une part, du détecteur (6) de rayonnement gamma du spectromètre, et d'autre part, du détecteur ...

X-RAY TOMOGRAPHY INSPECTION SYSTEMS

An X-ray imaging inspection system for inspecting items comprises an X- ray source (10) extending around an imaging volume (16), and defining a plurality of source points (14) from which X-rays can be directed through the imaging volume. An X-ray detector array (12) also extends around the imaging volume (16) and is arranged to detect X-rays from the source points which have passed through the imaging volume, and to produce output signals dependent on the detected X-rays. A conveyor (20) is arranged to convey the items through the imaging volume (16).

ESTIMATING STRENGTHS OF WOODEN SUPPORTS

A method of estimating the strength of a wooden support wherein gamma rays (4) are transmitted and detected parallel to a neutral axis (5) through a cross section of the support. It also includes a method of locating regions of unsound wood in a wooden support using detection of transmitted gamma rays (4), as well as apparatus suitable for conducting both methods.

Method and system for electron microscope with multiple cathodes

An electron microscope system includes a laser system operable to generate an optical pulse and a pump pulse and a microscope column. The microscope column includes a multiple cathode structure having a plurality of spatially separated cathode regions. Each of the cathode regions are operable to generate an electron pulse. The microscope column also includes an electron acceleration region adjacent the multiple cathode structure, a specimen region operable to support a specimen, and a detector.

METHOD AND SYSTEM FOR DETERMINING SAMPLE COMPOSITION FROM SPECTRAL DATA

Method and system are disclosed for determining sample composition from spectral data acquired by a charged particle microscopy system. Chemical elements in a sample are identified by processing the spectral data with a trained neural network (NN). If the identified chemical elements not matching with a known elemental composition of the sample, the trained NN is retrained with the spectral data and the known elemental composition of the sample. The retrained NN can then be used to identify chemical elements within other samples.

Verfahren und Einrichtung zur dreimdimensional ortsaufgelösten, bildhaften Darstellung von vollständigen Defektinformationen in massiven Kristallkörpern mittels harter Röntgenstrahlung

X-ray tomography inspection system with two different energy spectra

An X-ray scanning system has an X-ray source having two target areas of two different materials for example one target area 602 of tungsten and one 604 of uranium, arranged to produce X-rays at two different energy spectra. A pair of electrodes 612, 614 may be provided on opposite sides of the path of electron beam 616 which can be controlled to switch an electric field on and off to control the path of the electron beam so that it strikes either one or the other of the target areas 602, 604. The energy spectrum of the X-rays produced at the anode will vary depending on which of the target areas is struck by the electron beam. The target areas may be formed as parallel strips extending along the anode.

X-ray inspection systems

METHOD AND APPARATUS FOR ANALYZING SLUDGY MATERIALS

Scannign systems

ESTIMATING STRENGTHS OF WOODEN SUPPORTS

A method of estimating the strength of a wooden support wherein gamma rays ( 4) are transmitted and detected parallel to a neutral axis (5) through a cross section of the support. It also includes a method of locating regions of unsound wood in a wooden support using detection of transmitted gamma rays (4), as well as apparatus suitable for conducting both methods.

X-ray tomography inspection systems

An X-ray imaging inspection system for inspecting items comprises an X-ray source (10) extending around an imaging volume (16), and defining a plurality of source points (14) from which X-rays can be directed through the imaging volume. An X-ray detector array (12) also extends around the imaging volume (16) and is arranged to detect X-rays from the source points which have passed through the imaging volume, and to produce output signals dependent on the detected X-rays. A conveyor (20) is arranged to convey the items through the imaging volume (16).

Method and device for the online determination of the ash content of a substance conveyed on a conveyor, and device for carrying out such an online determination

A method for the online determination of the ash content of a substance conveyed on a conveying device, includes a first measurement for determining the mass per unit area of the substance and a second measurement for determining the mean atomic number of the atoms present in the substance. An additional X-ray fluorescence measurement is carried out.

Method and device for determining the spatial distribution of chemicals in an object

The invention relates to a method of determining the share of different chemical elements in a layer of an examination zone. The Compton scattered radiation and the Rayleigh scattered radiation are separately determined and the variation of the differential scatter coefficients derived from the measurement values is influenced by the shares of the various chemical elements contained in the individual pixels. Therefore, the share of these chemical elements can be determined therefrom.

X-ray inspection with contemporaneous and proximal transmission and backscatter imaging

An X-ray imaging inspection system for bags and packages. Transmission imaging is performed using a fan beam and a segmented detector, while scatter imaging is performed with a scanned pencil beam, with both beams active simultaneously. Cross-talk between the beams is mitigated by a combination of shielding, scatter detector design, positioning and orientation, and image processing. Image processing subtracts the measured radiation scattered from the transmission beam into the scatter detectors, reducing cross-talk.

Stationary Tomographic X-Ray Imaging Systems for Automatically Sorting Objects Based on Generated Tomographic Images

An X-ray imaging inspection system for inspecting items comprises an X-ray source 10 extending around an imaging volume 16 , and defining a plurality of source points 14 from which X-rays can be directed through the imaging volume. An X-ray detector array 12 also extends around the imaging volume 16 and is arranged to detect X-rays from the source points which have passed through the imaging volume, and to produce output signals dependent on the detected X-rays. A conveyor 20 is arranged to convey the items through the imaging volume 16.

РЕНТГЕНОВСКИЙ ОСМОТР С ПОМОЩЬЮ ОДНОВРЕМЕННОГО ФОРМИРОВАНИЯ ИЗОБРАЖЕНИЙ НА ОСНОВЕ ПРОПУСКАНИЯ И ОБРАТНОГО РАССЕИВАНИЯ СВЕТА

FIELD: physics. SUBSTANCE: method involves irradiating an object with a first beam of penetrating radiation, generating a transmission signal based on the penetrating radiation transmitted through the object and detected by a transmission detector, scanning the object with a second beam of penetrating radiation, generating a scattering signal based on the penetrating radiation scattered by the object and detected by a scattering detector, correcting any noise in the scattering signal arising from the first beam of penetrating radiation in the presence of an object, and displaying an image visible for the operator and containing information from at least the scattering signal. EFFECT: overcoming interference of radiation while simultaneously forming images in transmitted and scattered radiation. 27 cl, 3 dwg РОССИЙСКАЯ ФЕДЕРАЦИЯ (19) RU (11) 2 499 251 (13) C2 (51) МПК G01N 23/04 (2006.01) ФЕДЕРАЛЬНАЯ СЛУЖБА ПО ИНТЕЛЛЕКТУАЛЬНОЙ СОБСТВЕННОСТИ (12) ОПИСАНИЕ ИЗОБРЕТЕНИЯ К ПАТЕНТУ (21)(22) Заявка: 2011148960/28, 07.08.2007 (24) Дата начала отсчета срока действия патента: 07.08.2007 (73) Патентообладатель(и): ЭМЕРИКЭН САЙЭНС ЭНД ЭНДЖИНИЭРИНГ, ИНК. (US) 2 4 9 9 2 5 1 (43) Дата публикации заявки: 10.06.2013 Бюл. № 16 (45) Опубликовано: 20.11.2013 Бюл. № 32 2 4 9 9 2 5 1 R U Адрес для переписки: 190000, Санкт-Петербург, ул. Малая Морская, 15, офис 5, ВОХ-сервис 1125, ООО "ПАТЕНТИКА" (54) РЕНТГЕНОВСКИЙ ОСМОТР С ПОМОЩЬЮ ОДНОВРЕМЕННОГО ФОРМИРОВАНИЯ ИЗОБРАЖЕНИЙ НА ОСНОВЕ ПРОПУСКАНИЯ И ОБРАТНОГО РАССЕИВАНИЯ СВЕТА объектом и зарегистрированного датчиком регистрации рассеивания, корректирование любой помехи в сигнале рассеивания, возникающей вследствие первого луча проникающего излучения при наличии объекта, и отображение изображения, видимого оператору и включающего информацию по меньшей мере от сигнала рассеивания. Технический результат: обеспечение возможности преодолеть взаимное влияние излучений при одновременном формировании изображений в проходящем и рассеянном излучении. 3 н ...

Non-intrusive inspection systems and methods for the detection of materials interest

Analysing body tissue

A sample inspection system

A sample inspection system is used to identify restricted or illegal substances, for example in luggage. The system 200 includes a beam former 220, a beam modulator 240, a collimator 250 and an energy resolving detector 260. A sample 280 such as a suitcase is placed between the beam former 220 and the modulator 240. The beam former e.g. a mask, generates a primary beam (230, fig 2A) of electromagnetic radiation, for example x-rays. Upon incidence of the primary rays 232, 234 onto the modulator 240, reference rays of diffracted or scattered radiation 272, 274 are produced. The collimator 250 has a plurality of channels through which the diffracted or scattered radiation 272, 274 passes before being detected, for example at a pixel 263. The sample 280 may attenuate part of the primary beam 232, and spectra from the attenuated primary beam 232 may be compared with spectra from the unattenuated portion of the beam 234 to generate a contrast image (fig 6B). A method for using the system to inspect ...

COMBINED SCATTER AND TRANSMISSION MULTI-VIEW IMAGING SYSTEM

The present specification discloses a multi-view X-ray inspection system having, in one of several embodiments, a three-view configuration with three X-ray sources. Each X-ray source rotates and is configured to emit a rotating X-ray pencil beam and at least two detector arrays, where each detector array has multiple non-pixellated detectors such that at least a portion of the non-pixellated detectors are oriented toward both the two X-ray sources.

X-ray tomography inspection systems

An X-ray imaging inspection system for inspecting items comprises an X-ray source (10) extending around an imaging volume (16), and defining a plurality of source points (14) from which X-rays can be directed through the imaging volume. An X-ray detector array (12) also extends around the imaging volume (16) and is arranged to detect X-rays from the source points which have passed through the imaging volume, and to produce output signals dependent on the detected X-rays. A conveyor (20) is arranged to convey the items through the imaging volume (16).

BRIGHT-FIELD PHOTOGRAPHING METHOD USING X-RAY TO SHOW NOT ONLY THE STRUCTURAL NONUNIFORMITY BUT ALSO THE LATTICE DEFECT IN A SAMPLE

PURPOSE: A bright-field photographing method using X-ray is provided to inspect structural nonuniformity and lattice defect in a sample precisely within a short time. CONSTITUTION: A bright-field photographing method using X-ray comprises a step of arranging a sample on a holder in the Laue transmission geometry and setting the sample to make single reflection on the Bragg diffraction, a step of irradiating monochrome X-ray beam onto the sample, and a step of obtaining a penetrating radiation imaging image and an inverted diffraction image of the monochromatic X-ray beam. © KIPO 2009 ...

Combined scatter and transmission multi-view imaging system

본 발명은 여러 실시형태의 하나에서 3개 X-선 소오스를 갖는 3-뷰 구성을 갖는 멀티-뷰 X-선 검사시스템에 관한 것이다. 각 X-선 소오스가 회전하고 X-선 펜슬 빔을 방출할 수 있게 구성되고, 적어도 두개의 검출기 어레이를 포함하며, 각 검출기 어레이는 다수의 비픽셀화 검출기를 가짐으로서 비픽셀화 검출기의 적어도 일부가 두 X-선 소오스를 향하여 배향된다. The present invention relates to a multi-view X-ray inspection system having a three-view configuration with three X-ray sources in one of several embodiments. Wherein each X-ray source is configured to rotate and emit an X-ray pencil beam and includes at least two detector arrays, each detector array having a plurality of non-pixelated detectors, Are directed toward the two X-ray sources.

A METHOD OF DETERMINING THE DENSITY PROFILE OF A PLATE-SHAPED MATERIAL

A method of non-destructively, on-line determining the density profile in a plate-shaped material with a density which varies discretely or continuously over the plate thickness, while the density at a specific depth of the plate is assumed to be constant, such as for instance plates based on wood, by means of X-rays or gamma rays from a source placed on one side of the plate. Two detectors are placed on the other side of the plate, one detector measuring in the emitting direction of the source and the other detector measuring in the other direction and being movable relative to the plate. The counting number of the second detector is adjusted by means of the counting number of the first detector. By a suitable choice of emitting direction and detecting direction it is possible to provide a measurement of the density in a specific measuring volume merely by dividing the counting number of the second detector by the counting number of the first detector. As a result, the attenuation in the ...

METHODE ZUR BESTIMMUNG DES DICHTEPROFILS EINES SCHEIBENFÖRMIGEN MATERIALS

RADIOMETRIC ANALYSIS

A method of measuring the ash content of a sample of coal slurry comprises the steps of: a) passing the sample through a first measurement cell (12) and irradiating the sample with gamma-rays; b) measuring the intensity of gamma-rays transmitted through the sample; c) passing the sample through a second measurement cell (13) where the sample is irradiated with X-rays; d) measuring the intensity of backscattered X-rays; e) measuring the intensity of the iron K alpha X-ray photopeak of emitted X-rays; and, f) using the measurements of transmitted gamma-ray intensity, backscattered X-ray intensity and the intensity of the iron K alpha photopeak to compute a value for the ash content of the sample which includes a correction for the effect of iron minerals in the sample.

X-ray tomography scanning system which utilizes scattering data

An X-ray scanning system with an X-ray source 410 arranged to generate X-rays from a plurality of X-ray source positions around a scanning region, a first set of detectors 412 arranged to detect X-rays transmitted through the scanning region, a second set of detectors 422 arranged to detect X-rays scattered within the scanning region, and processing means arranged to process outputs from the first set of detectors to generate image data which defines an image of the scanning region, to analyse the image data to identify an object within the image, and to process the outputs from the second set of detectors to generate scattering data, and to associate parts of the scattering data with the object. The system also has a memory (506, fig 17) having areas (508, fig 17) each being associated with a respective area of an image.

X-ray tomography inspection systems

Improvements in or relating to sample analysis

A sample inspection system

Multi-modal detection system and method

A multi-modal detection system (100) and method. The multi-modal detection system (100) comprises: a distributed radiation source (101), for irradiating an object to be detected (111); a primary collimator (102), for dividing rays from the distributed radiation source (101) into two portions, wherein one portion is used for XRD detection and the other portion is used for CT detection; a CT detection device (103), for performing CT detection to obtain a CT image of the object to be detected (111); and an XRD detection device (104), for performing XRD detection to obtain an XRD image of the object to be detected (111), wherein the CT detection and the XRD detection are performed simultaneously. According to the multi-modal detection system (100) and method, the CT detection device (103) and the XRD detection device (104) can share one distributed radiation source (101), and can perform CT detection and XRD detection simultaneously.

ADAPTIVE SCANNING IN AN IMAGING SYSTEM

An object within a region is exposed to a first beam of penetrating radiation. The first beam of penetrating radiation is sensed on a side opposite the region from a source of the first beam. An attenuation of the first beam caused by passing the first beam through the object is determined, the attenuation is compared to a threshold attenuation. If the attenuation exceeds the threshold attenuation, a parameter of a second of beam of penetrating radiation is adjusted based on the determined attenuation.

Systems and methods for identifying a substance

MULTIPLE SCATTER CORRECTION

According to an aspect of the present invention, a correction of X-ray intensities measured in an energy-resolved diffraction method may be provided for multiple scattered radiation without any assumptions on the geometry of the object examined. According to an exemplary embodiment of the present invention, the characteristic lines of the anode material in the primary spectrum are evaluated, resulting in a component analysis of the detected spectrum which may allow for a correction for its multiple scatter part.

Combined Scatter and Transmission Multi-View Imaging System

The present specification discloses a multi-view X-ray inspection system having, in one of several embodiments, a three-view configuration with three X-ray sources. Each X-ray source rotates and is configured to emit a rotating X-ray pencil beam and at least two detector arrays, where each detector array has multiple non-pixellated detectors such that at least a portion of the non-pixellated detectors are oriented toward both the two X-ray sources. 1. An X-ray inspection system for scanning an object , the inspection system comprising:at least two rotating X-ray sources configured to simultaneously emit rotating X-ray beams, each of said X-ray beams defining a transmission path;at least two detector arrays, wherein each of said at least two detector arrays is placed opposite one of the at least two X-ray sources to form a scanning area; andat least one controller for controlling each of the X-ray sources to scan the object in a coordinated manner, such that the X-ray beams of the at least two X-ray sources do not cross transmission paths.2. The X-ray inspection system of claim 1 , wherein each of the emitted X-ray beams is a pencil beam and wherein each X-ray source rotates over a predetermined angle of rotation.3. The X-ray inspection system of claim 1 , wherein each detector is a non-pixellated detector.4. The X-ray inspection system of claims 1 , wherein a first claims 1 , a second and a third rotating X-ray sources are configured to simultaneously emit rotating X-ray beams claims 1 , wherein the first X-ray source scans the object by starting at a substantially vertical position and moving in a clockwise manner; wherein the second X-ray source scans the object by starting at a substantially downward vertical position and moving in a clockwise manner; and wherein the third X-ray source scans the object by starting at a substantially horizontal position and moving in a clockwise manner.5. The X-ray inspection system of claim 1 , wherein the controller causes each ...

X-ray imaging system and method of x-ray imaging

An x-ray imaging system includes an x-ray source configured to emit x-ray radiation towards a sample, and a primary detector configured to detect x-ray radiation from the x-ray source passing through the sample. The x-ray imaging system also includes a secondary detector configured to detect x-ray radiation from the x-ray source scattered in the sample, and imaging optics configured to guide x-ray radiation scattered in the sample onto the secondary detector.

X-ray monitoring system

The invention is a method and apparatus for identifying and pinpointing the location of unwanted pieces of material or defects in, for example, de-boned poultry pieces. The poultry pieces to be inspected are carried on a conveyor and passed under an impinging collimated X-ray beam. The Rayleigh scattering resulting is detected and measured, as is the Compton back scattering and the data is processed in a processing unit to determine the location and type of foreign matter involved. The ratio of the Rayleigh and Compton scattering is also determined and used to verify the identity of the foreign material. Transmitted X-rays, i.e., radioscopy, are used to normalize the data, and to aid in a pinpointing of the location of the unwanted material.

VERFAHREN UND VORRICHTUNG ZUM ANALYSIEREN SCHLAMMIGER STOFFE

Non-intrusive inspection systems and methods for the detection of materials interest

X-ray inspection systems

Combined scatter and transmission multi-view imaging system

X-ray tomography inspection systems

METHOD FOR NON-DESTRUCTIVE DENSITOMETRIC MEASUREMENT OF SMALL VOLUMES INSIDE IRREGULARLY SHAPED NON-UNIFORM OBJECTS

METHOD AND APPARATUS FOR ANALYZING SLUDGY MATERIALS

ABSTRACT OF THE DISCLOSURE The invention relates to a method and apparatus for analyzing sludgy materials by exposing the flowing material in continuous manner to x-ray radiation and by measuring the radiation thus created in the sludgy material. According to the invention, the radiation emitted from the material is measured with respect to the intensities of both x-ray fluorescence radiation and x-ray diffraction radiation, and these intensities are combined in order to form a parameter which describes the proportions of the partial components in a given compound combination. Moreover, the detectors employed in the measurement of the radiation intensities are placed at the same cross-sectional plane of the analyzer.

Methods and systems for determining the average atomic number and mass of materials

Disclosed herein are methods and systems of scanning a target for potential threats using the energy spectra of photons scattered from the target to determine the spatial distributions of average atomic number and/or mass in the target. An exemplary method comprises: illuminating each of a plurality of voxels of the target with a photon beam; determining an incident flux upon each voxel; measuring the energy spectrum of photons scattered from the voxel; determining, using the energy spectrum, the average atomic number in the voxel; and determining the mass in the voxel using the incident flux, the average atomic number of the material in the voxel, the energy spectrum, and a scattering kernel corresponding to the voxel. An exemplary system may use threat detection heuristics to determine whether to trigger further action based upon the average atomic number and/or mass of the voxels.

NON-DESTRUCTIVE DENSITOMETRIC MEASUREMENT

X-RAY IMAGING SYSTEM AND METHOD OF X-RAY IMAGING

An x-ray imaging system includes an x-ray source configured to emit x-ray radiation towards a sample, and a primary detector configured to detect x-ray radiation from the x-ray source passing through the sample. The x-ray imaging system also includes a secondary detector configured to detect x-ray radiation from the x-ray source scattered in the sample, and imaging optics configured to guide x-ray radiation scattered in the sample onto the secondary detector.

Korrektur der Schlitzkollimatorstreuung

Computerimplementiertes Verfahren zum Verarbeiten von Bilddaten, das aufweist: Zugreifen auf Bildintensitätsdaten, die von einem digitalen Bildgebungsdetektor erhalten werden, wobei die Bildintensitätsdaten einen ersten Bereich, der durch primäre Röntgenstrahlen und Streustrahlung erzeugt wird, und wenigstens einen zweiten Bereich aufweisen, der allein durch Streustrahlung erzeugt wird; Identifizieren des ersten Bereichs, der durch primäre Röntgenstrahlen und Streustrahlung erzeugt wird, und des wenigstens einen zweiten Bereichs, der allein durch Streustrahlung erzeugt wird, in den Bildintensitätsdaten; Ermitteln der Streuintensität in dem wenigstens einen zweiten Bereich der Bildintensitätsdaten, der allein durch Streustrahlung erzeugt wird; Schätzen der Streuintensität in dem ersten Bereich der Bildintensitätsdaten auf der Basis der Streuintensität in dem wenigstens einen zweiten Bereich der Bildintensitätsdaten; und Korrigieren des ersten Bereichs der Bildintensitätsdaten hinsichtlich ...

A high-energy x-ray spectroscopy-based inspection system and methods to determine the atomic number of materials

Non-intrusive inspection systems and methods for the detection of materials interest

The present specification discloses methods for inspecting liquids, aerosols and gels (LAGs) for threats. The method includes scanning LAGs packed in plastic bags in a multiple step process. In a primary scan, the bag is scanned using dual energy CT technique with fan beam radiation. In case of an alarm, the alarming LAG container is scanned again using coherent X-ray scatter technique with cone beam radiation. The system has a mechanism to switch between two collimators to produce either fan beam or cone beam. The system also has a mechanism to position the target properly for scanning and prevent container overlap when scanning multiple LAG containers in a bag.

Combined scatter and transmission multi-view imaging system

The present specification discloses a multi-view X-ray inspection system having, in one of several embodiments, a three-view configuration with three X-ray sources. Each X-ray source rotates and is configured to emit a rotating X-ray pencil beam and at least two detector arrays, where each detector array has multiple non-pixellated detectors such that at least a portion of the non-pixellated detectors are oriented toward both the two X-ray sources.

METHOD AND APPARATUS OF SAMPLING AND MEASURING TAILINGS

System and method for x-ray inspection

Methods and systems for x-ray inspection are provided. The system can include a source of radiant energy configured so that the radiant energy traverses a scanning volume. The system can further include a filter between the source and the scanning volume, a conveying apparatus configured to impart relative motion between an exposure-limited subject and the scanning volume, a conveyance monitor configured to generate conveyance data reflecting a conveyance state of the exposure-limited subject, a radiant energy sensing apparatus configured to sense radiant energy from the source and to generate source radiant energy data, and a dose controller configured to acquire conveyance data, source radiant energy data, and a signal related to subject dose data, and to generate a measure that a portion of the exposure-limited subject has acquired a dose of radiant energy above a dose threshold.

Method and system for deriving molecular interference functions from xrd profiles

A method for identifying a substance includes determining a first molecular interference function (MIF) for a first substance. The method also includes determining a second MIF for a second substance. The method further includes generating a residual MIF at least partially based on a comparison of the second MIF to the first MIF. The method also includes identifying the type of substance based on the residual MIF.

SAMPLE ANALYSIS

A method of sample analysis comprises irradiating a sample with electromagnetic radiation such as X-rays; collecting absorption data and scattering data; and combining the absorption and scattering data. The irradiation can be in the form of a tubular beam, a detector may be placed in a plane where Debye cones diffracted from the sample overlap at a central point for the collection of the scattering data. 1. A method of sample analysis comprising: irradiating a sample with electromagnetic radiation; collecting electromagnetic radiation absorption data; collecting electromagnetic radiation scattering data; and combining said absorption and scattering data.2. The method of claim 1 , wherein the irradiating electromagnetic radiation comprises at least one tubular beam.3. The method of claim 2 , wherein the shape of the tubular beam is a right circular cylinder or a cone.4. The method of or claim 2 , wherein the tubular beam is formed by passing the electromagnetic radiation rays through a collimator that comprises an electromagnetic radiation blocking body portion and one or more electromagnetic radiation transmitting apertures claim 2 , the shape of which defines the shape of the tubular beam or beams.5. The method of any preceding claim claim 2 , wherein the collection of electromagnetic radiation absorption data comprises a laminographic technique.6. The method of any preceding claim claim 2 , wherein the collection of electromagnetic radiation scattering data comprises placing a detector in a plane where Debye cones diffracted from the sample overlap at a central point.7. The method of any preceding claim claim 2 , comprising obtaining position information from the absorption data claim 2 , matching a feature in the absorption data with a feature in the scattering data; and corresponding the position information from the absorption data to the scattering data.8. The method of any preceding claim claim 2 , comprising irradiating electromagnetic radiation in a first ...

Multiple Image Collection and Synthesis for Personnel Screening

An apparatus and method for inspecting personnel or their effects. A first and second carriage each carries a source for producing a beam of penetrating radiation incident on a given subject. A positioner provides for relative motion of each beam vis-à-vis the subject in a motion, the vertical component of which is one-way. A detector receives radiation produced by at least one of the sources after the radiation interacts with the subject.

X-ray laser microscopy system and method

Improved system and method of X-ray laser microscopy that combines information obtained from both X-ray diffraction and X-ray imaging methods. The sample is placed in an ultra-cold, ultra-low pressure vacuum chamber, and exposed to brief bursts of coherent X-ray illumination further concentrated using X-ray mirrors and pinhole collimation methods. Higher resolution data from a sample is obtained using hard X-ray lasers, such as free electron X-ray lasers, and X-ray diffraction methods. Lower resolution data from the same sample can be obtained using any of hard or soft X-ray laser sources, and X-ray imaging methods employing nanoscale etched zone plate technology. In some embodiments both diffraction and imaging data can be obtained simultaneously. Data from both sources are combined to create a more complete representation of the sample. Methods to further improve performance, such as concave or curved detectors, improved temperature control, and alternative X-ray optics are also disclosed.

Methods and Systems for the Rapid Detection of Concealed Objects

This invention is directed towards finding, locating, and confirming threat items and substances. The inspection system is designed to detect objects that are made from, but not limited to, special nuclear materials (“SNM”) and/or high atomic number materials. The system employs advanced image processing techniques to analyze images of an object under inspection (“OUI”), which includes, but is not limited to baggage, parcels, vehicles and cargo, and fluorescence detection. 1. (canceled)2. (canceled)3. (canceled)4. (canceled)5. (canceled)6. (canceled)7. (canceled)8. (canceled)9. (canceled)10. (canceled)11. (canceled)12. (canceled)13. (canceled)14. (canceled)15. (canceled)16. (canceled)17. (canceled)18. (canceled)19. (canceled)20. (canceled)21. (canceled)22. (canceled)23. (canceled)24. (canceled)25. (canceled)26. (canceled)27. (canceled)28. (canceled)29. (canceled)30. (canceled)31. (canceled)32. (canceled)33. (canceled)34. (canceled)35. (canceled)36. (canceled)37. (canceled)38. (canceled)39. (canceled)40. (canceled)41. (canceled)42. (canceled)43. (canceled)44. (canceled)45. (canceled)46. (canceled)47. (canceled)48. (canceled)49. (canceled)50. (canceled)51. (canceled)52. (canceled)53. An inspection system comprising at least two stages wherein a conveyor belt transfers an object being inspected from a first inspection stage to a second inspection stage , the first inspection stage comprising an X-ray scanner coupled with a first processor for obtaining at least a threat map and an image volume file of the object being inspected , the second inspection stage comprising a substance identification unit coupled with a second processor for analysing the threat map and inspecting the object to determine if the object represents a threat , the second processor being coupled with the first processor via a transmission link.54. The inspection system of wherein the first inspection stage is an X-ray transmission unit generating imaging data coded in gravimetric density.55. The ...

Combined Scatter and Transmission Multi-View Imaging System

The present specification discloses a multi-view X-ray inspection system having, in one of several embodiments, a three-view configuration with three X-ray sources. Each X-ray source rotates and is configured to emit a rotating X-ray pencil beam and at least two detector arrays, where each detector array has multiple non-pixellated detectors such that at least a portion of the non-pixellated detectors are oriented toward both the two X-ray sources. 1. An X-ray inspection system for scanning an object , the inspection system comprising:at least two rotating X-ray sources configured to simultaneously emit rotating X-ray beams, each of said X-ray beams defining a transmission path;at least two detector arrays, wherein each of said at least two detector arrays is placed opposite one of the at least two X-ray sources to form a scanning area; andat least one controller for controlling each of the X-ray sources to scan the object in a coordinated manner, such that the X-ray beams of the at least two X-ray sources do not cross transmission paths.2. The X-ray inspection system of claim 1 , wherein each of the emitted X-ray beams is a pencil beam and wherein each X-ray source rotates over a predetermined angle of rotation.3. The X-ray inspection system of claim 1 , wherein each detector is a non-pixellated detector.4. The X-ray inspection system of claims 1 , wherein a first claims 1 , a second and a third rotating X-ray sources are configured to simultaneously emit rotating X-ray beams claims 1 , wherein the first X-ray source scans the object by starting at a substantially vertical position and moving in a clockwise manner; wherein the second X-ray source scans the object by starting at a substantially downward vertical position and moving in a clockwise manner; and wherein the third X-ray source scans the object by starting at a substantially horizontal position and moving in a clockwise manner.5. The X-ray inspection system of claim 1 , wherein the controller causes each ...

TONER

A toner including a toner particle, wherein the toner particle includes a toner base particle containing a binder resin, and a shell on the surface of the toner base particle; the shell contains a metal compound and an organosilicon polymer; the shell has at least an exposed portion of the metal compound and an exposed portion of the organosilicon polymer, on the surface of the toner particle; and in an analysis of a cross section of the toner particle by TEM-EDX, Ha (nm) and Hb (nm) which are average distances from the interface of the toner base particle and the shell up to the toner particle surface at the exposed portion of the metal compound and at the exposed portion of the organosilicon polymer, respectively, on the toner particle surface, satisfy Expression (1) below: 4. The toner according to claim 1 , wherein the average distance Ha (nm) and the average distance Hb (nm) satisfy Expressions (4) and (5):{'br': None, '2.5≤Ha≤50.0 \u2003\u2003(4)'}{'br': None, '30.0≤Hb≤300.0 \u2003\u2003(5).'}5. The toner according to claim 1 , wherein a volume resistivity of the metal compound is from 1.0×10Ω·cm to 1.0×10Ω·cm.6. The toner according to claim 1 , wherein the metal compound is a reaction product of a polyhydric acid and a compound containing at least one metal element M selected from the group consisting of metal elements included in group 3 to group 13.1. A toner comprising a toner particle claim 1 , whereinthe toner particle includes a toner base particle containing a binder resin, and a shell on a surface of the toner base particle;the shell contains a metal compound and an organosilicon polymer;the shell has at least an exposed portion of the metal compound and an exposed portion of the organosilicon polymer, on a surface of the toner particle; andin a mapping analysis, by energy-dispersive X-ray spectroscopy EDX, of a cross section of the toner particle observed in a transmission electron microscope TEM,Ha (nm) being an average distance from an interface of ...

MATERIAL DISCRIMINATION USING SCATTERING AND STOPPING OF MUONS AND ELECTRONS

In one aspect, a process for characterizing a range of materials based on the scattering and stopping of incident cosmic ray charged particles passing through each material includes: determining a scattering metric and a stopping metric for each material within the range of materials exposed to cosmic ray charged particles; computing a ratio of the scattering metric to the stopping metric to obtain a scattering-to-stopping ratio for each material within the range of materials for the material; and establishing a scattering-stopping relationship for the range of materials based on the determined pairs of the scattering-to-stopping ratio and the associated scattering metric for the range of materials. 1. A method for characterizing a range of materials based on scattering and stopping of incident cosmic ray charged particles passing through each material , the method comprising: creating a volume of interest (VOI) of the material;', 'determining a scattering metric of cosmic ray charged particles interacting with the VOI to represent a first set of cosmic ray charged particles entering and exiting the VOI;', 'determining a stopping metric of cosmic ray charged particles interacting with the VOI to represent a second set of cosmic ray charged particles entering and stopping inside the VOI; and', 'computing a ratio of the scattering metric to the stopping metric to obtain a scattering-to-stopping ratio for the material; and, 'for a given material within the range of materialsestablishing a scattering-stopping relationship of cosmic ray particles for the range of materials based on the determined pairs of the scattering-to-stopping ratio and the associated scattering metric for the range of materials.2. The method of claim 1 , wherein establishing the scattering-stopping relationship includes obtaining a relationship between the scattering-to-stopping ratio and the scattering metric.3. The method of claim 1 , wherein the obtained relationship between the scattering-to- ...

SYSTEM AND METHOD FOR IDENTIFYING NUCLEAR THREATS

A method and a device for the detection of radioactive sources, based on the simultaneous use of two or more radiation detectors of different types and the composition of the data collected by the two or more radiation detectors. 1. A method for identifying a radioactive source comprising the steps of:detecting, from said radioactive source, gamma emitting sources with a gamma spectroscopic, type I, detector;detecting, from said radioactive source, the plurality of impulses associated with respective neutron emissions and gamma emissions with a gamma/neutron, type II, detector;identifying a first portion of said plurality of impulses associated with respective neutron emissions and a second portion of said plurality of impulses associated with respective gamma emissions, said step of identifying said first and second portion of impulses including the calculation for each impulse of a respective total integral Ltot of the impulse, and further comprising the steps of:{'sub': ['n', 'γ'], '#text': 'determining a first number nof impulses belonging to the first portion and a second number nof impulses belonging to the second portion;'}{'sub': ['n', 'γ', 'n', 'Nn', 'n', 'γ', 'Ng', 'γ'], '#text': 'calculating a first average value Eand a second average value Eof the total integral Ltot, wherein E=Σ(Ltot/n), and E=Σ(Ltot/n);'}{'sub': ['γ', 'n', 'γ', 'n'], '#text': 'calculating parx=n/nand pary=E/E;'}identifying if the radioactive source belongs to a first group of neutron sources or to a second group of gammas sources by the data parx, pary;if the radioactive source belongs to the first group of neutron sources, perform identification of the gamma sources detected with a type I detector, through spectroscopy;double confirmation of the identification if both gamma and neutron are detected;detection of masking condition of neutrons in presence of gamma, performed by merging the results of the identification of the Type I detector with the results of the identification of the ...

High Energy X-Ray Inspection System Using a Fan-Shaped Beam and Collimated Backscatter Detectors

This invention provides a scanning system for scanning an object in a scanning zone. The scanning system includes both a radiation source arranged to irradiate the object with radiation having a peak energy of at least 900 keV and a scatter detector arranged to detect radiation scattered from the object wherein the radiation source is arranged to irradiate the object over a plurality of regions to be scanned within a single irradiation event. The scatter detector includes a plurality of detection elements, each detection element being arranged to detect scattered radiation from a predefined part of the scanning zone and a signal processor arranged to calculate scatter intensity across the plurality of detector elements. 1. A scanning method for scanning an object in a scanning zone , the method comprising:irradiating the object with a radiation source having a peak energy of at least 900 keV, wherein the object is irradiated over a plurality of regions to be scanned within a single irradiation event;detecting radiation scattered from the object wherein said scattered radiation is detected from a predefined part of the scanning zone via a detector having a plurality of detector elements; and,calculating a scatter intensity across the plurality of detector elements using a signal processor.2. The method of further comprising configuring a mask to create an exposure pattern across multiple detection elements.3. The method of wherein said mask is used to restrict scattered radiation that is not from a corresponding part of the scanning zone from reaching its corresponding detector region.4. The method of further comprising analysing the exposure pattern across multiple detection elements.5. The method of wherein the plurality of regions are adjacent to each other.6. The method of wherein the plurality of regions are linearly arranged.7. The method of wherein the object is moved relative to the radiation source such that a different plurality of regions is scanned with a ...

Quantitative x-ray radiology using the absorption and scattering information

A quantitative radiographic method uses X-ray imaging. The method uses a ratio of the absorption signal and the (small-angle) scattering signal (or vice-versa) of the object as a signature for the materials. The ratio image (dubbed R image) is independent from the thickness of the object in a wide sense, and therefore can be used to discriminate materials in a radiographic approach. This can be applied to imaging systems, which can record these two signals from the underlying object (for instance, an X-ray grating interferometer). Possible applications could be in material science, non-destructive testing and medical imaging. Specifically, the method can be used to estimate a volumetric breast density. The use of the R image and the corresponding algorithm are also presented hereafter.

Data Collection, Processing and Storage Systems for X-Ray Tomographic Images

An X-ray imaging inspection system for inspecting items comprises an X-ray source extending around an imaging volume and defining a plurality of source points from which X-rays can be directed through the imaging volume. An X-ray detector array also extends around the imaging volume and is arranged to detect X-rays from the source points which have passed through the imaging volume, and to produce output signals dependent on the detected X-rays. A conveyor is arranged to convey the items through the imaging volume 1. A data collecting system for collecting data from an X-ray scanner , the system comprising a memory having a plurality of areas each being associated with a respective area of an image , data input means arranged to receive input data from a plurality of X-ray detectors in a predetermined sequence , processing means arranged to generate from the input data X-ray transmission data and X-ray scattering data associated with each of the areas of the image , and to store the X-ray transmission data and the X-ray scattering data in the appropriate memory areas.2. A system according to wherein the processing means is arranged to determine which area any part of the data is to be associated with at least partly on the basis of which detector it is received from.3. A system according to wherein the processing means is arranged to determine which area any part of the data is to be associated with claim 1 , at least partly on the basis of the position at which the X-ray was produced.4. A system according to further comprising a look-up table having entries stored therein that associate each of the detectors with a respective area of the image.5. An X-ray imaging system comprising a data collection system according to wherein the processing means is arranged to store image data in the memory for each of a plurality of tomographic scans of an object as the object moves through an imaging region claim 1 , and to extract the image data from the memory after each of ...

Dark field computed tomography imaging

A method includes obtaining a dark-field signal generated from a dark-field CT scan of an object, wherein the dark-field CT scan is at least a 360 degree scan. The method further includes weighting the dark-field signal. The method further includes performing a cone beam reconstruction of the weighted dark-field signal over the 360 degree scan, thereby generating volumetric image data. For an axial cone-beam CT scan, in one non-limiting instance, the cone-beam reconstruction is a full scan FDK cone beam reconstruction. For a helical cone-beam CT scan, in one non-limiting instance, the dark-field signal is rebinned to wedge geometry and the cone-beam reconstruction is a full scan aperture weighted wedge reconstruction. For a helical cone-beam CT scan, in another non-limiting instance, the dark-field signal is rebinned to wedge geometry and the cone-beam reconstruction is a full scan angular weighted wedge reconstruction.

A Method Of Analyzing An Object In Two Stages Using A Transmission Spectrum Then A Scattering Spectrum

A method for analyzing an object, includes irradiating the object with incident photon radiation, acquiring a spectrum transmitted by the object using a spectrometric transmission detector, determining at least one first property of the object from the transmission spectrum, verifying that at least one doubt criterion relating to the first property of the object is met, and translating the fact that the object contains a material that is potentially dubious for the application under consideration. A second part, carried out only when the doubt criterion is met, includes acquiring an energy spectrum scattered by the object using a spectrometric scattering detector at an angle of 1° to 15°, and determining a second property of the object from at least the scatter spectrum and comparing at least the second property of the object with properties of standard materials stored in a database to identify the objects composition material. 2. The analyzing method according to claim 1 , wherein the first characteristic is selected from a form claim 1 , a dimension claim 1 , a coefficient of attenuation for one or more predetermined energies or for a predetermined range of energies claim 1 , an indication as to the nature of a material constituting the object claim 1 , or an effective atomic number.3. The analyzing method according to claim 1 , wherein the second characteristic is selected from a momentum transfer or a scattering signature (ƒ) representative of the object and showing scattering peaks claim 1 , reconstructed from both the measured scattering spectrum and the measured transmission spectrum.4. The analyzing method according to claim 3 , wherein the reconstruction of the scattering signature of the object comprises an operation of constructing an overall response matrix (A) of the detection system claim 3 , which overall response matrix (A) establishes a relationship between an energy detected by the detector placed for scattering and a momentum transfer in the ...

X-RAY INSPECTION DEVICE

An x-ray inspection device includes an x-ray irradiation unit that irradiates an object for inspection with an x-ray; a sensor that detects an electric signal corresponding to a back-scattered x-ray reflected off the object for inspection; a measurement unit that measures the object for inspection with reference to the electric signal output by the sensor; and a heavy metal plate having a pinhole that allows the back-scattered x-ray to pass therethrough, the pinhole forming an image of the back-scattered x-ray on the sensor. 1. An x-ray inspection device , comprising:an x-ray irradiation unit that irradiates an object for inspection with an x-ray;an x-ray detector that detects an electric signal corresponding to a back-scattered x-ray reflected off the object for inspection;a measurement unit that measures the object for inspection with reference to the electric signal detected by the x-ray detector; andan open member that has an opening that allows the back-scattered x-ray to pass therethrough, the opening forming an image of the back-scattered x-ray on the x-ray detector.2. The x-ray inspection device according to claim 1 , a holding unit, which includes an oxide semiconductor and holds an electric signal corresponding to the back-scattered x-ray, and', 'a transfer unit, which includes an oxide semiconductor and transfers the electric signal held by the holding unit to the measurement unit., 'wherein the x-ray detector includes'}3. The x-ray inspection device according to claim 1 ,wherein a center of a detection surface of the x-ray detector is located at a position within an angle range of 150° to 180° with respect to a center line of the x-ray radiated from the x-ray irradiation unit.4. The x-ray inspection device according to claim 1 , further comprising:at least one filter disposed on at least one of upstream and downstream sides of the open member in a travel direction of the back-scattered x-ray, the filter allowing an x-ray having a predetermined amount of ...

A Method And System For Analyzing An Object By Diffractometry Using A Scattering Spectrum And A Transmission Spectrum

A method for analyzing an object includes irradiating the object with incident photon radiation and acquiring an energy spectrum scattered by the material using a spectrometric detector in scatter mode. An energy spectrum transmitted by the material is acquired using a spectrometric detector in transmission mode. A signature (f) is reconstructed representing the object, both from the scatter spectrum measured and from the transmission spectrum measured, and the reconstructed signature thereof is compared with signatures of standard materials. 1. A method of analyzing an object using a detection system comprising a first spectrometric detector , the method comprising:irradiating the object with incident photon radiation;acquiring a measured scattering energy spectrum scattered by the object at a scattering angle (θ) comprising between 1° and 15° using the first spectrometric detector, placed for scattering;acquiring a measured transmission spectrum of energy transmitted by the object, using a second spectrometric detector placed for transmission;reconstructing a signature function (f) representative of the object, based both on the measured scattering energy spectrum and the measured transmission spectrum; andcomparing the signature function so reconstructed with signatures of calibration materials stored in a database for the purposes of identifying a material constituting the object.2. The analyzing method according to claim 1 , wherein reconstructing the signature function of the object comprises an operation of constructing an overall response matrix (A) of the detection system that establishes a relationship between an energy detected by the first spectrometric detector placed for scattering and a momentum transfer.3. The analyzing method according to claim 2 , wherein the operation of constructing the overall response matrix (A) of the detection system is made on the basis of an estimated attenuated incident spectrum (Sinc×Att) and of a calibrated angular ...

GENERATION OF DIFFRACTION SIGNATURE OF ITEM WITHIN OBJECT

A diffraction system configured to generate a diffraction signature based upon an angular disbursement of radiation is provided. In some embodiments, the diffraction system comprises a radiation source comprising a radiographic isotope configured to natural emit radiation due to decay. In some embodiment, the diffraction system is part of an object identification system that comprises one or more other radiation imaging modalities, such as a CT system and/or a line-scan system. By way of example, the one or more other radiation imaging modalities may perform an initial examination of an object to generate data indicative of the object. The data can be analyzed to identify an item of interest within the object, which can subsequently be examined by the diffraction system to generate a diffraction signature of the item. The diffraction signature of the item can be compared to known diffraction signatures of know items to characterize the item. 1. A system for generating a diffraction signature of an item within an object , comprising:a radiation source comprising a radiographic isotope configured to expose the item to radiation;a detector array configured to detect radiation that interacts with the item; anda diffraction signature component configured to generate the diffraction signature of the item based upon an angular disbursement of the radiation that interacts with the item.2. The system of claim 1 , comprising:a diffraction signature comparison component configured to compare the diffraction signature to a set of diffraction signatures of items of interest to determine if the item is an item of interest.3. The system of claim 1 , the diffraction signature indicative of a molecular composition of the item.4. The system of claim 1 , comprising:a threat detection component configured to analyze data indicative of the object to identify the item.5. The system of claim 4 , the data comprising volumetric data generated from a computed tomography (CT) examination of ...

Adjustable multifacet x-ray sensor array

Disclosed herein is a system for x-ray inspection. The system comprises an x-ray emitter. The system also comprises an x-ray sensor array comprising a first x-ray sensor, a second x-ray sensor adjacent the first x-ray sensor, and a coupler movably coupling the first x-ray sensor to the second x-ray sensor. The first x-ray sensor is movable into a plurality of orientations relative to the second x-ray sensor via the coupler. The system further comprises an imaging device to generate an inspection image based on information from the x-ray sensor array.

Adaptive scanning in an imaging system

An imaging system exposes an object within a region to a beam of penetrating radiation. The beam of penetrating radiation is sensed on a side opposite the region from a source of the beam. An attenuation of the beam caused by passing the beam through the object is determined, the attenuation is compared to a threshold attenuation. If the attenuation exceeds the threshold attenuation, a parameter of the imaging system is adjusted based on the determined attenuation.

Backscatter X-ray System

Disclosed herein is a backscatter X-ray system comprising: an X-ray source configured to scan a sheet of X-ray across an object, wherein the sheet of X-ray illuminates one line on a surface of the object; a sensor configured to differentiate backscattered X-ray from different spots along the line. 1. A system comprising:an X-ray source configured to scan a sheet of X-ray across an object, wherein the sheet of X-ray illuminates one line on a surface of the object;a sensor configured to differentiate backscattered X-ray from different spots along the line.2. The system of claim 1 , wherein the X-ray source comprises a slit.3. The system of claim 2 , wherein the sheet of X-ray is scanned across the object by moving the slit or moving the object.4. The system of claim 1 , wherein the sheet is not planar.5. The system of claim 1 , wherein the line is curved.6. The system of claim 1 , wherein nothing on the surface of the object is illuminated by X-ray from the X-ray source except the line.7. The system of claim 1 , wherein the sensor comprises a slit.8. The system of claim 7 , wherein the slit is not straight.9. The system of claim 1 , wherein the sensor collects backscattered X-ray from different spots along the line using different portions of the sensor.10. The system of claim 9 , wherein the different portions are different lines on the sensor.11. The system of claim 9 , wherein the different lines on the sensor are not straight.12. The system of claim 9 , wherein the X-ray source comprises a slit and the portions are respective projections of the slit by backscattered X-ray from the spots.13. The system of claim 1 , wherein the sensor comprises a plurality of pixel lines.14. The system of claim 1 , wherein the sensor comprises a plurality of pixel spots.15. The system of claim 7 , wherein the sensor comprises multiple slits.16. The system of claim 1 , wherein the sensor comprises a layer of a material opaque to the backscattered X-ray.17. The system of claim 7 , ...

GENERATION OF DIFFRACTION SIGNATURE OF ITEM WITHIN OBJECT

A diffraction system configured to generate a diffraction signature based upon an angular disbursement of radiation is provided. In some embodiments, the diffraction system comprises a radiation source comprising a radiographic isotope configured to natural emit radiation due to decay. In some embodiment, the diffraction system is part of an object identification system that comprises one or more other radiation imaging modalities, such as a CT system and/or a line-scan system. By way of example, the one or more other radiation imaging modalities may perform an initial examination of an object to generate data indicative of the object. The data can be analyzed to identify an item of interest within the object, which can subsequently be examined by the diffraction system to generate a diffraction signature of the item. The diffraction signature of the item can be compared to known diffraction signatures of known items to characterize the item. 1. A non-transitory computer-readable medium comprising processor-executable instructions configured to enable a processor to perform operations comprising:receiving first image data representative of an item of interest within an object;detecting a potential threat responsive to a threshold property of the item of interest exhibited by the first image data;receiving second image data representative of the item of interest; anddetecting a threat responsive to a property of the item of interest exhibited by the first image data or the second image data.2. The non-transitory computer-readable medium of claim 1 , wherein the property comprises a first diffraction signature of the item of interest exhibited by the first image data or the second image data.3. The non-transitory computer-readable medium of claim 2 , wherein the processor-executable instructions are configured to enable the processor to perform operations comprising: comparing a second diffraction signature of the item of interest with known diffraction signatures ...

Process Monitoring Of Deep Structures With X-Ray Scatterometry

Methods and systems for estimating values of process parameters, structural parameters, or both, based on x-ray scatterometry measurements of high aspect ratio semiconductor structures are presented herein. X-ray scatterometry measurements are performed at one or more steps of a fabrication process flow. The measurements are performed quickly and with sufficient accuracy to enable yield improvement of an on-going semiconductor fabrication process flow. Process corrections are determined based on the measured values of parameters of interest and the corrections are communicated to the process tool to change one or more process control parameters of the process tool. In some examples, measurements are performed while the wafer is being processed to control the on-going fabrication process step. In some examples, X-ray scatterometry measurements are performed after a particular process step and process control parameters are updated for processing of future devices. 1. A wafer processing system comprising:a wafer processing tool configured to process one or more structures on a semiconductor wafer at a first process step of a fabrication process flow; and an x-ray illumination source configured to provide an amount of x-ray illumination light directed to a measurement spot including the one or more structures at the first process step;', 'a detector configured to detect an amount of x-ray light reflected from or transmitted through the semiconductor wafer in response to the amount of x-ray illumination light; and', determine values of one or more parameters of interest associated with the one or more structures based on the detected amount of x-ray light; and', 'communicate an indication of the values of the one or more parameters of interest to the wafer processing tool that causes the wafer processing tool to adjust a value of one or more process control parameters of the wafer processing tool., 'a computing system configured to], 'an x-ray scatterometry based ...

Data Collection, Processing and Storage Systems for X-Ray Tomographic Images

An X-ray imaging inspection system for inspecting items comprises an X-ray source extending around an imaging volume and defining a plurality of source points from which X-rays can be directed through the imaging volume. An X-ray detector array also extends around the imaging volume and is arranged to detect X-rays from the source points which have passed through the imaging volume, and to produce output signals dependent on the detected X-rays. A conveyor is arranged to convey the items through the imaging volume 1. A data collecting system for collecting data from an X-ray scanner , the system comprising a memory having a plurality of areas each being associated with a respective area of an image , data input means arranged to receive input data from a plurality of X-ray detectors in a predetermined sequence , processing means arranged to generate from the input data X-ray transmission data and X-ray scattering data associated with each of the areas of the image , and to store the X-ray transmission data and the X-ray scattering data in the appropriate memory areas.2. A system according to wherein the processing means is arranged to determine which area any part of the data is to be associated with at least partly on the basis of which detector it is received from.3. A system according to wherein the processing means is arranged to determine which area any part of the data is to be associated with claim 1 , at least partly on the basis of the position at which the X-ray was produced.4. A system according to further comprising a look-up table having entries stored therein that associate each of the detectors with a respective area of the image.5. An X-ray imaging system comprising a data collection system according to wherein the processing means is arranged to store image data in the memory for each of a plurality of tomographic scans of an object as the object moves through an imaging region claim 1 , and to extract the image data from the memory after each of ...

X-Ray Diffraction Imaging System Using Debye Ring Envelopes

A sample ( 106 ) is irradiated with electromagnetic radiation such as X-Rays and diffraction data is sampled at inner and outer caustic rims formed at a sensor surface ( 108 ) and defined by a continuum of Debye cones ( 130, 132 ) formed by diffraction of the incident radiation. Intensities of the inner and outer rims while translating and rotating the sample are converted using a tomographic technique into X-ray diffraction images and material discrimination is also possible.

Process Monitoring Of Deep Structures With X-Ray Scatterometry

Methods and systems for estimating values of process parameters, structural parameters, or both, based on x-ray scatterometry measurements of high aspect ratio semiconductor structures are presented herein. X-ray scatterometry measurements are performed at one or more steps of a fabrication process flow. The measurements are performed quickly and with sufficient accuracy to enable yield improvement of an on-going semiconductor fabrication process flow. Process corrections are determined based on the measured values of parameters of interest and the corrections are communicated to the process tool to change one or more process control parameters of the process tool. In some examples, measurements are performed while the wafer is being processed to control the on-going fabrication process step. In some examples, X-ray scatterometry measurements are performed after a particular process step and process control parameters are updated for processing of future devices. 1. An x-ray scatterometry based metrology system comprising:an x-ray illumination source configured to provide an amount of x-ray illumination light directed to a measurement spot including one or more high aspect ratio structures partially fabricated on a semiconductor wafer;a detector configured to detect an amount of x-ray light reflected from or transmitted through the semiconductor wafer in response to the amount of x-ray illumination light; and determine values of one or more parameters of interest associated with the partically fabricated one or more high aspect ratio structures based on the detected amount of x-ray light; and', 'communicate an indication of the values of the one or more parameters of interest to a fabrication tool that causes the fabrication tool to adjust a value of one or more process control parameters of the fabrication tool., 'a computing system configured to2. The x-ray scatterometry based metrology system of claim 1 , wherein the x-ray illumination source provides the amount ...

Combined Scatter and Transmission Multi-View Imaging System

The present specification discloses a multi-view X-ray inspection system having, in one of several embodiments, a three-view configuration with three X-ray sources. Each X-ray source rotates and is configured to emit a rotating X-ray pencil beam and at least two detector arrays, where each detector array has multiple non-pixellated detectors such that at least a portion of the non-pixellated detectors are oriented toward both the two X-ray sources. 1. An X-ray inspection system for scanning an object , the inspection system comprising:at least two rotating X-ray sources configured to simultaneously emit rotating X-ray beams, each of said X-ray beams defining a transmission path;at least two detector arrays, wherein each of said at least two detector arrays is placed opposite one of the at least two X-ray sources to form a scanning area; andat least one controller for controlling each of the X-ray sources to scan the object in a coordinated manner, such that the X-ray beams of the at least two X-ray sources do not cross transmission paths.2. The X-ray inspection system of claim 1 , wherein each of the emitted X-ray beams is a pencil beam and wherein each X-ray source rotates over a predetermined angle of rotation.3. The X-ray inspection system of claim 1 , wherein each detector is a non-pixellated detector.4. The X-ray inspection system of claim 1 , wherein a first claim 1 , a second and a third rotating X-ray sources are configured to simultaneously emit rotating X-ray beams claim 1 , wherein the first X-ray source scans the object by starting at a substantially vertical position and moving in a clockwise manner; wherein the second X-ray source scans the object by starting at a substantially downward vertical position and moving in a clockwise manner; and wherein the third X-ray source scans the object by starting at a substantially horizontal position and moving in a clockwise manner.5. The X-ray inspection system of claim 1 , wherein the controller causes each X- ...

METHOD AND SYSTEM FOR DETERMINING MOLECULAR STRUCTURE

Molecular structure may be determined based on structure factors solved from the diffraction pattern and the electron microscopy image of the sample. In particular, the amplitudes of the structure factors may be determined based on intensities of diffraction peaks in the multiple diffraction patterns. The phases of the structure factors may be determined based on electron microscopy images and the intensities of the diffraction peaks. 1. A method for determining a molecular structure of a sample , comprising:acquiring multiple diffraction patterns of the sample while tilting the sample relative to an incident beam;determining an amplitude of a structure factor based on intensities of a diffraction peak in the multiple diffraction patterns;acquiring a first electron microscopy (EM) image of the sample;after acquiring the first EM image, acquiring a second EM image with a current density higher than a current density for acquiring the first EM image;determining a phase of the structure factor based on the first EM image, the second EM image and the intensities of the diffraction peak in the multiple diffraction patterns; anddetermining the molecular structure of the sample based on the amplitude of the structure factor and the phase of the structure factor.2. (canceled)3. The method of claim 1 , further comprising determining a contrast transfer function (CTF) based on the second EM image claim 1 , and determining the phase of the structure factor based on the second EM image includes determining the phase of the structure factor based on the CTF.4. The method of claim 1 , wherein acquiring the first EM image includes acquiring the first EM image at a tilt angle claim 1 , and determining the phase of the structure factor based on the first EM image claim 1 , the second EM image claim 1 , and the intensities of the diffraction peak in the multiple diffraction patterns includes determining the phase of the structure factor at the tilt angle based on the first EM image ...

包括确定照射剂量超出阈值的x射线个体检查系统和方法

本发明提供用于X射线检查的方法和系统。该系统（100）可以包括辐射能源，该辐射能量源被配置，使得辐射能穿过扫描区。该系统还可以包括：过滤器，该过滤器位于源与扫描区之间；输送装置（120），该输送装置配置成提供受限暴露的对象与扫描区之间的相对运动；输送监控器，该输送监控器配置成产生反映受限暴露的对象的输送状态的输送数据；辐射能传感装置，该辐射能传感装置配置成感测来自源的辐射能并产生源辐射能数据；以及剂量控制器，该剂量控制器配置成获取输送数据、源辐射能数据和与对象剂量数据相关的信号，并产生度量，该度量指示受限暴露的对象的一部分已获取到高于剂量阈值的辐射能剂量。

Moisture content analysis method using X-ray

본 발명은 엑스선을 이용한 수분함량 분석방법에 관한 것으로, 구체적으로는 엑스선 발생장치의 표적물질로부터 발생되는 특성 엑스선을 대상시료에 조사하여 얻어지는 콤프턴선의 산란 신호세기를 이용하여 대상 시료를 파괴하지 않고도, 넓은 범위의 수분함량을 단시간에 측정하여 공업분야뿐만 아니라 농산물, 토양의 수분함량 측정에도 유용하게 사용할 수 있다. The present invention relates to a method for analyzing moisture content using X-rays, and specifically, by using a scattering signal strength of a compton ray obtained by irradiating a target sample with characteristic X-rays generated from a target material of the X-ray generator, without destroying the target sample. As a result, it is possible to measure a wide range of moisture content in a short time, which is useful for measuring moisture content of agricultural products and soil as well as industrial fields. 수분함량분석, 엑스선, 콤프턴 산란 Moisture Content Analysis, X-Ray, Compton Scattering

Combined scatter and transmission multi-view imaging system

본 발명은 여러 실시형태의 하나에서 3개 X선 소오스를 갖는 3-뷰 구성을 갖는 멀티-뷰 X선 검사시스템에 관한 것이다. 각 X선 소오스가 회전하고 X선 펜슬 빔을 방출할 수 있게 구성되고, 적어도 두개의 검출기 어레이를 포함하며, 각 검출기 어레이는 다수의 비픽셀화 검출기를 가짐으로서 비픽셀화 검출기의 적어도 일부가 두 X선 소오스를 향하여 배향된다. The present invention is directed to a multi-view X-ray inspection system having a three-view configuration with three X-ray sources in one of several embodiments. Each X-ray source is configured to rotate and emit an X-ray pencil beam, and includes at least two detector arrays, each detector array having a plurality of non-pixelated detectors so that at least some of the non-pixelated detectors Is oriented towards the X-ray source.

Detecting system and method

本发明涉及检测系统和方法。检测系统包括：分布式射线源，该分布式射线源上具有多个射线源焦点，每个射线源焦点辐射射线以照射受检物，并且这多个射线源焦点被分成一定数量的群组；前准直器，每个射线源焦点的射线经由前准直器限制而射向XRD检测设备；XRD检测设备，该XRD检测设备包括多个XRD探测器，这多个XRD探测器被分组成与射线源焦点的群组数相同数量的群组并且同一群组的XRD探测器以被其他群组的XRD探测器间隔开的方式排布，并且其中，每个射线源焦点的射线仅由具有与该射线源焦点具有相同群组编号的XRD探测器接收。

A method of analyzing an object in two stages using the transmission spectrum and then the scattering spectrum.

Method for changing the spatial orientation of a microsample in a microscope system, as well as computer program product

Das erfindungsgemäße Verfahren betrifft das Ändern der Raum-Orientierung einer extrahierten Mikroprobe in einem Mikroskop-System. Das Verfahren wird mit Hilfe eines Teilchenstrahlmikroskops ausgeführt wird, das eine Teilchenstrahlsäule zum Erzeugen eines Strahls geladener Teilchen umfasst, die eine optische Achse aufweist. Weiterhin verfügt das Teilchenstrahlmikroskop über eine Haltevorrichtung zum Halten der extrahierten Mikroprobe. Das Verfahren umfasst die Schritte:a) Halten der extrahierten Mikroprobe und eines angrenzenden Scharnierelements mittels der Haltevorrichtung, wobei die Mikroprobe eine erste Raum-Orientierung relativ zur optischen Achse einnimmt;b) Erzeugen einer Biegekante im Scharnier-Element durch Bestrahlen mit einem Strahl geladener Teilchen, so dass die angrenzende Mikroprobe im Raum bewegt wird und die Raum-Orientierung der Mikroprobe verändert wird;c) Halten der Mikroprobe in einer zweiten Raum-Orientierung relativ zur optischen Achse, wobei die zweite Raum-Orientierung von der ersten Raum-Orientierung verschieden ist. The method according to the invention relates to changing the spatial orientation of an extracted microsample in a microscope system. The method is carried out with the aid of a particle beam microscope which comprises a particle beam column for generating a beam of charged particles which has an optical axis. Furthermore, the particle beam microscope has a holding device for holding the extracted microsample. The method comprises the steps of: a) holding the extracted microsample and an adjacent hinge element by means of the holding device, the microsample assuming a first spatial orientation relative to the optical axis; b) generating a bending edge in the hinge element by irradiating with a beam of charged particles , so that the adjacent microsample is moved in space and the spatial orientation of the microsample is changed; c) holding the microsample in a second spatial orientation relative to the optical axis, the second ...

Flying spot scanning device and back scattering safety detection system

本发明涉及一种飞点扫描装置和背散射安全检测系统，其中飞点扫描装置包括射线源(10)、飞点形成装置(20)和驱动装置(30)，射线源(10)用于发射射线，飞点形成装置(20)被配置为将射线源(10)发射的射线处理为连续出射的点状束，驱动装置(30)被配置为驱动飞点形成装置(20)相对于射线源(10)转动，驱动装置(30)包括定子组件(31)和与定子组件(31)转动连接的转子组件(32)，飞点形成装置(20)抵靠于转子组件(32)并与转子组件(32)连接。本发明中飞点形成装置抵靠于驱动装置的转子组件上，并与转子组件直接连接，飞点形成装置与转子组件之间没有中间传动机构，可以简化飞点扫描装置的结构，提高传动效率。

Inspection systems with two X-ray scanners in a first stage inspection system

This invention is directed towards finding, locating, and confirming threat items and substances. The inspection system is designed to detect objects that are made from, but not limited to, special nuclear materials (“SNM”) and/or high atomic number materials. The system employs advanced image processing techniques to analyze images of an object under inspection (“OUI”), which includes, but is not limited to baggage, parcels, vehicles and cargo, and fluorescence detection.

Adaptive scanning in an imaging system

An object within a region is exposed to a first beam of penetrating radiation. The first beam of penetrating radiation is sensed on a side opposite the region from a source of the first beam. An attenuation of the first beam caused by passing the first beam through the object is determined, the attenuation is compared to a threshold attenuation. If the attenuation exceeds the threshold attenuation, a parameter of a second of beam of penetrating radiation is adjusted based on the determined attenuation.

Transmission-back scattering combine detection equipment and detection method for human body

本公开的实施例公开了一种用于人体的检查设备和检查方法。用于人体的检查设备，包括：扫描X射线发生器，配置成能够分别独立地产生用于背散射检测的X射线笔形束和用于透射检测的X射线扇形束，其中X射线笔形束能够扫描一扇形区域，X射线扇形束覆盖一扇形区域；用于探测被人体散射的X射线笔形束的第一探测器；和用于探测透射通过人体的X射线扇形束的第二探测器。在第一探测器和第二探测器之间限定用于被检查人体的检查通道。

Scatter attenuation tomography using a monochromatic radiation source

A system and methods for characterizing an inspected object on the basis of attenuation between identified regions of scattering and a plurality of detectors. An incident beam of substantially monochromatic penetrating radiation is generated by a source, which may be a radioactive source. The incident beam is characterized by a propagation axis and a source energy. Radiation scattered by the object is detected by means of a plurality of detector elements disposed about the beam of penetrating radiation, each detector element generating a detector signal characterizing a detected energy of scattered radiation. The detector signal provides for determining a displacement for each scattering point of the object relative to a fiducial position on the propagation axis of the incident beam, based upon the detected energy of the scattered radiation. By calculating the attenuation of penetrating radiation between pairs of scattering voxels, a tomographic image is obtained characterizing the three-dimensional distribution of attenuation in the object of one or more energies of penetrating radiation, and thus of material characteristics.

Multiple scatter correction

According to an aspect of the present invention, a correction of X-ray intensities measured in an energy-resolved diffraction method may be provided for multiple scattered radiation without any assumptions on the geometry of the object examined. According to an exemplary embodiment of the present invention, the characteristic lines of the anode material in the primary spectrum are evaluated, resulting in a component analysis of the detected spectrum which may allow for a correction for its multiple scatter part.

X-ray inspection with contemporaneous and proximal transmission and backscatter imaging

Monochromatic light grid phase contrast imaging method and system

本发明提供了一种单光栅相衬成像方法及系统，方法包括：选择光源靶结构周期为p 0 的光源、光栅周期为p 1 的光栅及像素尺寸为p的探测器，其中，1/p 0 +1/Kp＝η/p 1 ，K≥3，η为根据光栅类型确定的已知参数；将光源、光栅和探测器放置在同一光路上，其中，光源与光栅之间具有第一距离、光栅与探测器之间具有第二距离，第二距离大于第一距离；将样品台放置在光源和探测器之间，并获取背景图像；将待成像物体放置在样品台上，并对待成像物体成像，得到物体图像，本发明使用一块光栅单次曝光实现相衬成像，缓解现有光栅相衬成像系统的工艺要求高、成本高和普及率低的技术问题，达到了降低光栅相衬成像系统的工艺要求、成本和提高光栅相衬成像系统的普及率的技术效果。

System and method for X-ray diffraction imaging

An X-ray diffraction imaging system is provided. The X-ray diffraction imaging system includes an X-ray source configured to emit an X-ray pencil beam and a scatter detector configured to receive scattered radiation having a scatter angle from the X-ray pencil beam. The scatter detector is located substantially in a plane and includes a plurality of detector strips. A first detector strip has a first width equal to a linear extent of the X-ray pencil beam measured at the plane in a direction parallel to the first width.

Thickness measurement with automatic correction for changes in composition

An apparatus for measuring the thickness of a sheet of metal by irradiating the sheet with x-rays. The intensity of the initial x-rays, the transmitted x-rays, and the backscattered x-rays are detected and the detector signals are processed to produce a signal representing the thickness of the metal sheet.

Multi-modality detection system and method

A multi-modal detection system (100) and method. The multi-modal detection system (100) comprises: a distributed radiation source (101), for irradiating an object to be detected (111); a primary collimator (102), for dividing rays from the distributed radiation source (101) into two portions, wherein one portion is used for XRD detection and the other portion is used for CT detection; a CT detection device (103), for performing CT detection to obtain a CT image of the object to be detected (111); and an XRD detection device (104), for performing XRD detection to obtain an XRD image of the object to be detected (111), wherein the CT detection and the XRD detection are performed simultaneously. According to the multi-modal detection system (100) and method, the CT detection device (103) and the XRD detection device (104) can share one distributed radiation source (101), and can perform CT detection and XRD detection simultaneously.

X-Ray Tomography Inspection Systems

The present invention is an X-ray scanning system with an X-ray source arranged to generate X-rays from X-ray source positions around a scanning region, a first set of detectors arranged to detect X-rays transmitted through the scanning region, a second set of detectors arranged to detect X-rays scattered within the scanning region, and a processor arranged to process outputs from the detectors to generate image data.

Device and method for analyzing short-range ordered structure and long-range ordered structure of material

本发明技术方案公开了一种分析材料短程有序结构和长程有序结构的装置和方法，通过同步辐射光源出射连续光谱的光束照射位于承载组件上的待测材料样品，可以通过多个能量色散探测器获取第一光信息，基于所述第一光信息可以进行所述待测样品的X射线衍射测试，可以通过位敏探测器获取第二光信息，基于所述第二光信息可以进行所述待测样品的X射线吸收精细结构测试。可见，本发明技术方案可以同时快速分析材料短程有序结构和长程有序结构。

Combined scatter and transmission multi-view imaging system

The present specification discloses a multi-view X-ray inspection system having, in one of several embodiments, a three-view configuration with three X-ray sources. Each X-ray source rotates and is configured to emit a rotating X-ray pencil beam and at least two detector arrays, where each detector array has multiple non-pixellated detectors such that at least a portion of the non-pixellated detectors are oriented toward both the two X-ray sources.

Estimating strengths of wooden supports

A method of estimating the strength of a wooden support wherein gamma rays ( 4 ) are transmitted and detected parallel to a neutral axis ( 5 ) through a cross section of the support. It also includes a method of locating regions of unsound wood in a wooden support using detection of transmitted gamma rays ( 4 ), as well as apparatus suitable for conducting both methods.

Multi modal detection system and method

본 발명은 멀티 모달 검출 시스템(100) 및 방법에 관한 것이다. 피검체(111)를 조사하는 분포식 방사선원(101)과, 분포식 방사선원(101)의 방사선을 XRD 검출용 방사선과 CT 검출용 방사선 두 부분으로 분할하는 전방 콜리메이터(102)와, CT 검출을 수행하여 피검체(111)의 CT 이미지를 획득하는 CT 검출 설비(103)와, XRD 검출을 수행하여 피검체(111)의 XRD 이미지를 획득하는 XRD 검출 설비(104)를 포함하고, CT 검출과 XRD 검출이 동시에 수행되는 멀티 모달 검출 시스템(100)이 개시된다. 당해 멀티 모달 검출 시스템(100) 및 방법에 따르면, CT 검출 설비(103)와 XRD 검출 설비(104)는 1 셋트의 분포식 방사선원(101)을 공유할 수 있고, CT 검출과 XRD 검출을 동시에 수행할 수 있다.

X-ray diffraction imaging system with signal aggregation across voxels containing objects and method of operating the same

Method for analyzing mass content of three mixed substances in pipeline

本发明公开了一种管道内混合三物质的质量含量分析方法，包括如下步骤，分别测量放射源穿透三物质的单种物质的数据和反散射三物质单种物质的数据，得到一组6个数据N11、N12、N13、N21、N22、N23；分别测量放射源穿透混合三物质的数据和反散射混合三物质的数据，得到一组2个数据N、N 反 ；根据穿透变化的三物质之后的射线强度建立数据模型，分析计算得出混合三种物质的百分比质量含量，可以准确分析出混合的三种物质的质量含量，且操作简单，适用性广泛。

System and method for x-ray diffraction imaging

Ray intensity detection device

本申请涉及一种射线强度探测装置，其中，该射线强度探测装置包括：包括：遮挡组件、散射组件和探测组件；其中，遮挡组件设置于散射组件与球管之间，且遮挡组件具有通孔；球管所发射的射线部分经通孔直射至散射组件，并经散射组件散射形成第一射线；探测组件，用于探测第一射线的射线强度值。通过本申请，解决了相关技术中的射线强度探测装置对射线强度变化情况的测量准确性低的问题，实现了提高射线强度探测装置对射线强度变化情况的测量准确性的效果。

Combined scatter and transmission multi-view imaging system

Power transmission line conductor strand breakage reason analysis method based on failure fault tree method

本发明属于电力设备检测技术领域，具体涉及基于失效故障树方法的输电线路导线断股原因分析方法，具体步骤包括：（1）开展现场调查分析；（2）开展宏观断口分析；（3）开展导线外观质量、尺寸及材质分析；（4）开展断口微观分析；（5）开展结构受力分析；（6）开展断裂原因综合分析。本发明给出输电线路导线断股原因分析的流程及检测分析方法，并根据各个阶段检测结果选择下一步采用的分析方法，解决了输电线路导线断股原因分析困难问题。采用本发明方法可以指导技术人员快速准确查找输电线路导线断股原因，为输电线路导线制定整改抢修措施提供科学依据。

Backscatter imaging system

An x-ray system, comprising: a backscatter detector, comprising: an x-ray conversion material; a plurality of sensors configured to generate electrical signals in combination with the x-ray conversion material in response to incident x-rays; and a collimator disposed on the x-ray conversion material and including a plurality of partitions extending away from the x- ray conversion material and the sensors and forming a plurality of openings, each opening corresponding to one of the sensors.

Method and apparatus for analyzing sludgy materials

The invention relates to a method and apparatus for analyzing sludgy materials by exposing the flowing material in continuous manner to x-ray radiation and by measuring the radiation thus created in the sludgy material. According to the invention, the radiation emitted from the material is measured with respect to the intensities of both x-ray fluorescence radiation and x-ray diffraction radiation, and these intensities are combined in order to form a parameter which describes the proportions of the partial components in a given compound combination. Moreover, the detectors employed in the measurement of the radiation intensities are placed at the same cross-sectional plane of the analyzer.

Multi-modal detection system and method

A multi-modal detection system (100) and method. The multi-modal detection system (100) comprises: a distributed radiation source (101), for irradiating an object to be detected (111); a primary collimator (102), for dividing rays from the distributed radiation source (101) into two portions, wherein one portion is used for XRD detection and the other portion is used for CT detection; a CT detection device (103), for performing CT detection to obtain a CT image of the object to be detected (111); and an XRD detection device (104), for performing XRD detection to obtain an XRD image of the object to be detected (111), wherein the CT detection and the XRD detection are performed simultaneously. According to the multi-modal detection system (100) and method, the CT detection device (103) and the XRD detection device (104) can share one distributed radiation source (101), and can perform CT detection and XRD detection simultaneously.

System and method for identifying nuclear threats

A method and a device for the detection of radioactive sources, based on the simultaneous use of two or more radiation detectors of different types and the composition of the data collected by the two or more radiation detectors.

Methods and systems for determining the average atomic number and mass of materials

这里公开了一种针对潜在威胁扫描目标的方法和系统，其利用自目标散射的光子的能量谱确定目标中平均原子序数和/或质量的空间分布。示范的方法包含：利用光子束照亮目标的多个体元的每一个；确定入射到每个体元上的入射通量；测量自体元散射的光子的能量谱；利用能量谱确定体元中的平均原子序数；以及利用入射通量、体元中材料的平均原子序数、能量谱、以及与体元对应的散射核确定体元中的质量。示范的系统可基于若干体元的平均原子序数和/或质量利用威胁检测试探法来确定是否触发进一步的动作。

Method for changing the spatial orientation of a micro-sample in a microscope system, and computer program product

A method is carried out with the aid of a particle beam microscope which includes a particle beam column for producing a beam of charged particles, the particle beam column having an optical axis. Furthermore, the particle beam microscope includes a holding device for holding the extracted micro-sample. The method includes holding the extracted micro-sample and an adjacent hinge element via the holding device. The micro-sample adopts a first spatial orientation relative to the optical axis. The method also includes producing a bending edge in the hinge element by way of irradiation with a beam of charged particles such that the adjacent micro-sample is moved in space and the spatial orientation of the micro-sample is altered. The method further includes holding the micro-sample in a second spatial orientation relative to the optical axis, wherein the second spatial orientation differs from the first spatial orientation.

Sample analysis method, device, apparatus and storage medium

本发明属于物质检测技术领域，公开了一种样品分析方法、装置、设备及存储介质。该方法包括：根据获取到的X射线光电子能谱图确定目标元素对应的相对原子百分含量；根据相对原子百分含量确定目标元素对应的综合灵敏度因子；根据获取到的反射电子能量损失谱图确定目标元素的非弹性损失峰总面积和氢元素的弹性损失峰面积；基于目标元素的综合灵敏度因子、该非弹性损失峰总面积、氢元素的灵敏度因子以及该弹性损失峰面积确定待测试样品对应的氢元素含量；根据氢元素含量对待测试样品进行样品分析。通过上述方式，利用XPS谱图和REELS谱图结合分析，准确测定待测试样品中的氢元素含量，进一步提升了聚合物薄膜材料的性能分析结果的准确性。

X-ray tomography inspection systems

High Energy X-Ray Inspection System Using a Fan-Shaped Beam and Collimated Backscatter Detectors

This invention provides a scanning system for scanning an object in a scanning zone. The scanning system includes both a radiation source arranged to irradiate the object with radiation having a peak energy of at least 900 keV and a scatter detector arranged to detect radiation scattered from the object wherein the radiation source is arranged to irradiate the object over a plurality of regions to be scanned within a single irradiation event. The scatter detector includes a plurality of detection elements, each detection element being arranged to detect scattered radiation from a predefined part of the scanning zone and a signal processor arranged to calculate scatter intensity across the plurality of detector elements.

Dark field computed tomography imaging

一种方法包括获得从目标的暗场CT扫描生成的暗场信号，其中，所述暗场CT扫描至少是360度扫描。所述方法还包括对所述暗场信号进行加权。所述方法还包括对所述360度扫描上的经加权的暗场信号执行锥形束重建，从而生成体积图像数据。对于轴向锥形束CT扫描，在一个非限制性实例中，所述锥形束重建是全扫描FDK锥形束重建。对于螺旋锥形束CT扫描，在一个非限制性实例中，将所述暗场信号重新分箱到楔形几何结构，并且所述锥形束重建是全扫描孔径加权的楔形重建。对于螺旋锥形束CT扫描，在另一非限制性实例中，将所述暗场信号重新分箱到楔形几何结构，并且所述锥形束重建是全扫描角度加权的楔形重建。

X-ray measuring device

本发明能够在不使用捕捉微弱的X射线的特别结构的情况下检测X射线，使后方散射X射线像成像。本发明的X射线测量装置具备：X射线照射部(10)，其对测量对象(2)照射X射线；传感器(20)，其对与在测量对象(2)上反射的后方散射X射线对应的电信号进行检测；测量部(40)，其参照传感器(20)输出的电信号来测量测量对象(20)；以及重金属板(30)，其使后方散射X射线通过，并形成有使后方散射X射线在传感器(20)上成像的针孔(32)。

X-Ray Tomography Inspection Systems

An X-ray imaging inspection system for inspecting items comprises an X-ray source ( 10 ) extending around an imaging volume ( 16 ), and defining a plurality of source points ( 14 ) from which X-rays can be directed through the imaging volume. An X-ray detector array ( 12 ) also extends around the imaging volume ( 16 ) and is arranged to detect X-rays from the source points which have passed through the imaging volume, and to produce output signals dependent on the detected X-rays. A conveyor ( 20 ) is arranged to convey the items through the imaging volume ( 16 ).

Multi-modal detection system and method

A multi-modal detection system (100) and method. The multi-modal detection system (100) comprises: a distributed radiation source (101), for irradiating an object to be detected (111); a primary collimator (102), for dividing rays from the distributed radiation source (101) into two portions, wherein one portion is used for XRD detection and the other portion is used for CT detection; a CT detection device (103), for performing CT detection to obtain a CT image of the object to be detected (111); and an XRD detection device (104), for performing XRD detection to obtain an XRD image of the object to be detected (111), wherein the CT detection and the XRD detection are performed simultaneously. According to the multi-modal detection system (100) and method, the CT detection device (103) and the XRD detection device (104) can share one distributed radiation source (101), and can perform CT detection and XRD detection simultaneously.

Generation of diffraction signature of item within object

A diffraction system configured to generate a diffraction signature based upon an angular disbursement of radiation is provided. In some embodiments, the diffraction system comprises a radiation source comprising a radiographic isotope configured to natural emit radiation due to decay. In some embodiment, the diffraction system is part of an object identification system that comprises one or more other radiation imaging modalities, such as a CT system and/or a line-scan system. By way of example, the one or more other radiation imaging modalities may perform an initial examination of an object to generate data indicative of the object. The data can be analyzed to identify an item of interest within the object, which can subsequently be examined by the diffraction system to generate a diffraction signature of the item. The diffraction signature of the item can be compared to known diffraction signatures of know items to characterize the item.

System and method for X-ray diffraction imaging

Un sistema de detección de dispersión de rayos X que comprende una fuente de rayos X (12), un colimador secundario (20) y un detector de dispersión (40), en el que: dicha fuente de rayos X (12) está configurada para emitir un haz concentrado de rayos X (70 y 202); dicho colimador secundario (20) está configurado para garantizar que una parte de la radiación dispersa que llega a dicho detector de dispersión (40) posee un ángulo de dispersión constante con respecto al haz concentrado de rayos X; y dicho detector de dispersión (40) está configurado para recibir radiación dispersa (36) que tiene un ángulo de dispersión desde el haz concentrado de rayos X, comprendiendo la radiación dispersa una pluralidad de partes de la radiación dispersa; dicho detector de dispersión está ubicado sustancialmente en un plano y comprende una pluralidad de bandas de detección (100, 102, 104, 106 y 108) y dicha pluralidad de bandas de detección comprenden: una primera banda de detección (104 y 212) que tiene una primera anchura igual y paralela a una extensión lineal del haz concentrado de rayos X, en la que el haz concentrado de rayos X atraviesa el plano; dicha primera banda de detección está configurada para recibir una primera parte de la pluralidad de partes de radiación dispersa, originándose la primera parte desde una primera distancia, medida de forma perpendicular al plano, del plano; y una segunda banda de detección (100, 102, 106 y 108) que está configurada para recibir una segunda parte de la pluralidad de partes de radiación dispersa, originándose la segunda parte desde una segunda distancia del plano, medida de forma perpendicular al plano, que se caracteriza porque dicha segunda banda de detección comprende una segunda anchura definida por: **(Ver fórmula)** donde b es la segunda anchura, bm es la primera anchura, L2m es la primera distancia y L2 es la segunda distancia. An X-ray scattering detection system comprising an X-ray source (12), a secondary collimator (20), and a ...

Combined scatter and transmission multi-view imaging system

The present specification discloses a multi-view X-ray inspection system having, in one of several embodiments, a three-view configuration with three X-ray sources. Each X-ray source rotates and is configured to emit a rotating X-ray pencil beam and at least two detector arrays, where each detector array has multiple non-pixellated detectors such that at least a portion of the non-pixellated detectors are oriented toward both the two X-ray sources.

Method for being directed at spectrometer

本文描述了用于对准光谱仪的示例性方法。该光谱仪包括辐射源、晶体分析仪和探测器，它们都位于仪器平面上。该方法包括：使所述晶体分析仪围绕在所述仪器平面内并且垂直于旋转平面的轴线旋转，使得(i)所述晶体分析仪的倒易晶格矢量在所述仪器平面内，或(ii)所述倒易晶格矢量在所述旋转平面内的分量垂直于所述仪器平面。所述倒易晶格矢量的原点位于所述轴线上。该方法还包括使所述晶体分析仪倾斜或使所述检测器平移，使得所述倒易晶格矢量平分由所述检测器和所述辐射源界定的线段。还公开了与所述示例性方法相关的示例性光谱仪。

Combined scatter and transmission multi-view imaging system

本发明公开了一种多视图X射线检查系统，在多个实施例之一中，其具有三个X射线源的三视图配置。每个X射线源都旋转，并被配置为发射旋转的X射线笔形束，以及至少两个检测器阵列，其中每个检测器阵列都具有多个非像素化的检测器，使得至少一部分非像素化的检测器被定向为朝着这两个X射线源。

Quantitative x-ray analysis

ROENTGENGERAET

Methods and systems for determining the average atomic number and mass of materials

X-ray inspection with contemporaneous and proximal transmission and backscatter imaging

An X-ray imaging inspection system for bags and packages. Transmission imaging is performed using a fan beam and a segmented detector, while scatter imaging is performed with a scanned pencil beam, with both beams active simultaneously. Cross-talk between the beams is mitigated by a combination of shielding, scatter detector design, positioning and orientation, and image processing. Image processing subtracts the measured radiation scattered from the transmission beam into the scatter detectors, reducing cross-talk.

Method and device for detecting object by using forward scattered radiation

公开了一种利用前向散射辐射来检查物体的方法和设备，该方法包括步骤：探测辐射源产生的第一辐射与被检物体相互作用后的第一穿透值；使辐射源产生的第二辐射与散射体相互作用，以产生与该第二辐射成预定角度的前向散射辐射；探测该前向散射辐射与被检物体相互作用后的第二穿透值；以及利用探测的第一穿透值和第二穿透值来获取该被检物体的材料属性信息。本发明可用在海关、港口、机场对货物进行不开箱检查，也可用于生物学研究或医学检测。

High energy x-ray inspection system using a fan-shaped beam and collimated backscatter detectors

X-ray measuring device

X-ray monitoring system

The invention is a method and apparatus for identifying and pinpointing the location of unwanted pieces of material or defects (12) in, for example, de-boned poultry pieces (11). The poultry pieces to be inspected are carried on a conveyor and passed under an impinging collimated X-ray beam. The Rayleigh scattering resulting is detected and measured, as is the Compton back scattering and the data is processed in a processing unit to determine the location and type of foreign matter involved. The ratio of the Rayleigh and Compton scattering is also determined and used to verify the identity of the foreing material. Transmitted X-rays, i.e., radioscopy, are used to normalize the data, and to aid in a pinpointing of the location of the unwanted material.