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Небесная энциклопедия

Космические корабли и станции, автоматические КА и методы их проектирования, бортовые комплексы управления, системы и средства жизнеобеспечения, особенности технологии производства ракетно-космических систем

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Мониторинг СМИ

Мониторинг СМИ и социальных сетей. Сканирование интернета, новостных сайтов, специализированных контентных площадок на базе мессенджеров. Гибкие настройки фильтров и первоначальных источников.

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Форма поиска

Поддерживает ввод нескольких поисковых фраз (по одной на строку). При поиске обеспечивает поддержку морфологии русского и английского языка
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Применить Всего найдено 8614. Отображено 100.
06-12-2012 дата публикации

Switched Multi-Lead Test Adapter

Номер: US20120307981A1
Автор: Kevin B. Larkin
Принадлежит: Individual

A switched multi-lead test adapter is described. The multi-lead adapter has a main lead and a plurality of test leads. Each lead is connected to a switch that selects one of the test leads for connection to the main lead, or for connection to another test lead. The switch allows only one conductive path between the leads, so that the remaining, unselected leads to not cause interference on an active telecommunication wire, such as a DSL line. The test leads include multiple terminating connectors for connecting to various terminal blocks and cabling systems.

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Номер записи: 1
17-01-2013 дата публикации

Cable assembly, connector and semiconductor tester

Номер: US20130015873A1
Автор: Shin Sakiyama, Teruhito Suzuki
Принадлежит: Advantest Corp, Molex Japan LLC

In a cable assembly, when auxiliary ground conductor is provided so as to face the lower surface of supporting insulating member, elastically-deformed piece in an elastically deformed status comes in contact with the tip of ground terminal protruding from the lower surface of supporting insulating member.

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Номер записи: 2
02-05-2013 дата публикации

MICROMACHINED ON-WAFER PROBES AND RELATED METHOD

Номер: US20130106456A1
Автор: Barker Nicolas Scott, Chen Lihan, II Robert M., Lichtenberger Arthur Weston, Reck Theodore James, Weikle, Xu Haiyong
Принадлежит: UNIVERSITY OF VIRGINIA PATENT FOUNDATION

A micromachining process to fabricate a single chip that simple drops into a supporting structure. The micromachining process provides the ability to create a probe that will interface with integrated circuits, for example, operating at frequencies in the range of about 100 GHz to about 3,000 GHz (3 THz). This approach creates a silicon structure (or other applicable choice of material) that provides mechanical force for probing while supporting the transfer of the high frequency energy between a measurement system and the integrated circuit, individual device or material. 1150-. (canceled)151. A device for probing a structure on a surface of an object substrate , said device comprising a microfabricated compliant chip , wherein said microfabricated compliant chip comprises integrated electrical interconnects.152. The device of claim 151 , wherein said microfabricated compliant chip is monolithic.153. The device of claim 151 , wherein said integrated electrical interconnects of said microfabricated compliant chip comprise:at least one compliant beam;at least one transmission circuit; anda waveguide transition element, wherein said at least one transmission circuit suitable to electrically interconnect said at least one compliant beam with said waveguide transition element.154. The device of claim 151 , wherein said microfabricated compliant chip is configured to be secured by a housing.155. The device of claim 154 , wherein said securement comprises detachably engaging said microfabricated compliant chip to said housing.156. The device of claim 154 , wherein said securement is provided by compressive forces.157. The device of claim 154 , wherein said housing comprises an aperture configured to receive said microfabricated compliant chip.158. The device of claim 157 , wherein said housing aperture comprises at least one of the following: slot claim 157 , groove claim 157 , recess claim 157 , channel claim 157 , tunnel claim 157 , indentation claim 157 , passage claim ...

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Номер записи: 3
02-05-2013 дата публикации

Contact-terminal apparatus with pressure sensor

Номер: US20130110459A1
Автор: Kimiyo Takahashi, Koichi Kiryu, Mitsuru Kobayashi, SeungSeaok Beak
Принадлежит: Fujitsu Component Ltd

A contact-terminal apparatus for use in measuring an electrical property of an object includes a first contact-terminal unit made of a conductive material to come in contact with the object, a movable part having a first surface on which the first contact-terminal unit is placed, and a pressure sensor situated beneath a second surface of the movable part, wherein the pressure sensor has a pressure detecting part that is in contact with the second surface of the movable part.

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Номер записи: 4
27-06-2013 дата публикации

Modular Test Plug For Voltage, Current And Current Transformer Saturation Testing

Номер: US20130162264A1
Автор: Don Elliott, Keith Lessard, Kyly Belhumeur
Принадлежит: Hemicycle Controls Inc

A modular test plug for voltage, current and saturation testing has a housing having a handle portion, a plurality of jaw connections for injecting upstream toward the equipment to be tested, a plurality of blade connections for injecting downstream toward a transformer, a first plurality of binding posts on a top of the housing connected to the jaw connections, and a second plurality of binding posts also on a top of the housing connected to the blade connections. Also provided is a short-defeating insert for defeating a shorting mechanism in an FT switch. This insert has a thin flat extension member extending from the body to prevent a bottom cam on a shorting blade from making contact with a shorting spring that would otherwise short the circuit when the switch handle is moved from the open position to the closed position.

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Номер записи: 5
04-07-2013 дата публикации

ELECTRONIC DEVICE TESTING APPARATUS

Номер: US20130169303A1
Автор: Yamashita Tsuyoshi
Принадлежит: ADVANTEST CORPORATION

There is provided an electronic device testing apparatus which can effectively use a space in an electronic device handling apparatus since a preciser is not necessary. 1. An electronic device testing apparatus which tests electronic devices including terminals , the electronic device testing apparatus comprising:a test head which includes sockets to which the electronic devices are electrically connected; andan electronic device handling apparatus which loads the electronic devices onto a first tray, conveys the electronic devices, and presses the electronic devices against the sockets, whereinthe test head is mounted on the electronic device handling apparatus with an attitude where the sockets are directed downward,the electronic device handling apparatus loads the electronic devices onto the first tray and presses the electronic devices against the sockets from below with an attitude where the terminals are directed upward, andeach of the sockets includes a positioning plate which positions the electronic device relative to the socket while using the terminals as a reference.2. The electronic device testing apparatus according to claim 1 , whereinthe socket includes contact portions which come into electrical contact with the terminals,the positioning plate includes through holes of which inner diameters are set so that the terminals pass through the through holes, andthe positioning plate is provided below the contact portions so that the through holes face the contact portions.3. The electronic device testing apparatus according to claim 2 , whereinthe through hole has a tapered inner peripheral surface.4. The electronic device testing apparatus according to claim 1 , whereinthe electronic device handling apparatus includes a heat applying section which applies thermal stress to untested electronic devices which are loaded onto the first tray, andthe heat applying section moves the first tray up.5. The electronic device testing apparatus according to claim 1 , ...

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Номер записи: 6
29-08-2013 дата публикации

Programmable breadboard matrix interconnection box

Номер: US20130223029A1
Автор: Pablo Oscar Olivera Brizzio
Принадлежит: Individual

The present device is a programmable breadboard matrix interconnection box capable of receiving data from a computer or controller and automatically establishing connections between contact points. A conductor layer, a magnetic layer, and a contact layer are used to automate the connections between contact points. The conductor layer provides conductors which move between ‘ON’ and ‘OFF’ positions and rows/columns which can receive electric current. The magnetic layer provides a necessary magnetic field. The contact layer connects the conductor to the designated contact point. A controller activates each conductor using the Laplace Force generated by the magnetic field and electric current.

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Номер записи: 7
05-09-2013 дата публикации

POWER TEST APPARATUS FOR POWER SUPPLY

Номер: US20130229202A1
Автор: CHEN GUO-YI, YIN XIAO-GANG
Принадлежит:

A power test board for a power supply includes a main board and a load circuit. The load circuit includes at least one switch, at least one control circuit, and at least one load resistor. A number of the load resistor being same with a number of the control circuit, each load resistor is electronically connected to one of the at least one control circuit. Toggling of the at least one switch to electronically connect to the control circuit causes the control circuit to be electronically connected to the power supply, the at least one control circuit is turned on, and the at least one load resistor is activated to serve as a load of the power supply. 1. A power test board for a power supply , the power test board comprising:a main board electronically connected to the power supply; anda load circuit integrated on the main board, and comprising at least one switch, at least one control circuit, and at least one load resistor, a number of the load resistor being same with a number of the control circuit, each load resistor electronically connected to one of the at least one control circuit;wherein toggling of the at least one switch to electronically connect to the control circuit causes the control circuit to be electronically connected to the power supply, the at least one control circuit is turned on when the at least one control circuit receives power from the power supply, and the at least one load resistor is activated to serve as a load of the power supply.2. The power test board as claimed in claim 1 , wherein the main board includes a port claim 1 , the main board is electronically connected to the power supply via the port.3. The power test board as claimed in claim 1 , wherein the main board includes a power button claim 1 , when the power button is actuated claim 1 , the main board is activated.4. The power test board as claimed in claim 1 , wherein the main board receives power from the power supply claim 1 , and provides a standby voltage source claim 1 , ...

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Номер записи: 8
17-10-2013 дата публикации

Electrically Conductive Pins For Microcircuit Tester

Номер: US20130271176A1
Автор: Alladio Patrick J., Michalko Gary W., Nelson John E., Oberg Russell F., Sherry Jeffrey C., Warwick Brian
Принадлежит:

The terminals of a device under test are temporarily electrically connected to corresponding contact pads on a load board by a series of electrically conductive pin pairs. The pin pairs are held in place by an interposer membrane that includes a top contact plate facing the device under test, a bottom contact plate facing the load board, and a vertically resilient, non-conductive member between the top and bottom contact plates. Each pin pair includes a top and bottom pin, which extend beyond the top and bottom contact plates, respectively, toward the device under test and the load board, respectively. The top and bottom pins contact each other at an interface that is inclined with respect to the membrane surface normal. When compressed longitudinally, the pins translate toward each other by sliding along the interface. The sliding is largely longitudinal, with a small and desirable lateral component determined by the inclination of the interface. 120.-. (canceled)21. A longitudinally compressible unit which forms a plurality of temporary mechanical and electrical connections for use between a device under test having a plurality of terminals and a circuit board having a plurality of contact pads , each contact pad being laterally arranged to correspond to exactly said terminals , comprising:an electrically insulating top contact plate longitudinally adjacent to the terminals on the device under test;an electrically insulating bottom contact plate longitudinally adjacent to the contact pads on the load board;a longitudinally resilient, electrically insulating interposer between the top and bottom contact plates;a plurality of longitudinally compressible, electrically conductive pin pairs extending through longitudinal holes in the top contact plate, the interposer and the bottom contact plate, each pin pair in the plurality being laterally arranged to correspond to said terminal on the device under test;wherein when a particular pin pair is longitudinally compressed ...

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Номер записи: 9
13-02-2014 дата публикации

Compliant core peripheral lead semiconductor socket

Номер: US20140043782A1
Автор: James Rathburn
Принадлежит: HSIO Technologies LLC

An electrical interconnect between terminals on an IC device and contact pads on a printed circuit board (PCB). The electrical interconnect includes a substrate with a first surface having a plurality of openings arranged to correspond to the terminals on the IC device. A compliant material is located in the openings. A plurality of first conductive traces extend along the first surface of the substrate and onto the compliant material. The compliant material provides a biasing force that resists flexure of the first conductive traces into the openings. Vias extending through the substrate are electrically coupled the first conductive traces. A plurality of second conductive traces extend along the second surface of the substrate and are electrically coupled to a vias. The second conductive traces are configured to electrical couple with the contact pads on the PCB.

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Номер записи: 10
10-04-2014 дата публикации

TEST AND CONNECTION APPARATUS ARRANGEMENT, AND TEST APPARATUS

Номер: US20140097855A1
Автор: Hackemack Frank, Jaschke Bernhard, Richts Joerg
Принадлежит:

A testing arrangement for testing the electrical circuits of a terminal block assembly, comprising a generally rectangular testing unit housing formed of insulating material and containing a chamber, at least one connection device mounted in chamber and having an elongated connector body formed of insulating material and including center and end portions. An integral measuring tab portion extends downwardly from the body center portion for insertion into a testing opening contained in the terminal block assembly, and a pair of coplanar measurement portions extend upwardly from the connector body ends and terminating at different elevations, thereby to afford a compact testing arrangement. Two electrical circuit connecting portions are mounted on the connector body, each including an input conductive contact plate mounted on one side of said measuring tab portion, and an output contact mounted within one of said measurement portions for connection with one end of a testing component. 112-. (canceled)133200. A testing arrangement for testing the electrical circuits of a terminal block assembly () , comprising at least one testing unit () including:{'b': '23', '(a) a generally rectangular testing unit housing () formed of insulating material, said housing including vertical pairs of side and end walls, and horizontal top and bottom walls, said walls defining a chamber contained within said housing;'}{'b': '42', 'claim-text': [ [{'b': '24', '(a) an integral measuring tab portion () extending downwardly from said connector body center portion, and outwardly from said testing unit housing via an opening contained in said housing bottom wall, said tab portion being adapted for insertion into a testing opening contained in the terminal block assembly;'}, {'b': '29', '(b) a pair of coplanar measurement portions () extending upwardly from said connector body end portions, respectively, via corresponding openings contained in said testing unit housing; and'}], '(1) an ...

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Номер записи: 11
05-01-2017 дата публикации

PROBE MODULE SUPPORTING LOOPBACK TEST

Номер: US20170003319A1
Автор: HO CHIH-HAO, Ku Wei-Cheng, LAI JUN-LIANG, Wei Hao
Принадлежит: MPI corporation

A probe module, which supports loopback test and is provided between a PCB and a DUT, includes an adapter, two probes, two inductive components provided at the adapter, and a capacitive component. The adapter has two connecting circuits. An end of each of the probes is connected to one of the connecting circuits, while another end thereof, which is a tip, contacts the DUT. Each of the inductive components has an end electrically connected to one of the connecting circuits, and another end electrically connected to the PCB through a conductive member, which is provided at the adapter, wherein two ends of the capacitive component are electrically connected to one of the connecting circuits, respectively. Whereby, the signal paths are changed by the differences between frequencies of signals, and the transmission path of high-frequency signals is effectively shortened. 1. A probe module , which is provided between a printed circuit board (PCB) and a device-under-test (DUT) to perform a loopback test , comprising:an adapter, which has a surface, and is provided with two connecting circuits;two probes, wherein each of which has an end electrically connected to one of the connecting circuits, while another end thereof, which is a tip, contacts a tested pad on the DUT;two inductive components provided at the surface of the adapter, wherein each of the inductive components has two ends, and one of the ends is electrically connected to one of the connecting circuits, while the other one of the ends is electrically connected to the PCB through a conductive member; anda capacitive component provided at the surface of the adapter, wherein the capacitive component has two ends, and one of the ends is electrically connected to one of the connecting circuits, while the other one of the ends is electrically connected to the other one of the connecting circuits.2. The probe module of claim 1 , wherein the adapter has a first surface claim 1 , a second surface opposite to the first ...

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Номер записи: 12
07-01-2016 дата публикации

TEST CARRIER

Номер: US20160003869A1
Автор: Masuda Noriyuki, MATSUMURA Hidenobu
Принадлежит: ADVANTEST CORPORATION

A test carrier includes a base member on which a first electronic device under test is able to be temporarily mounted, and a second electronic device which is configured to be used to test the first electronic device. The second electronic device is mounted on the base member, and the second electronic device is able to be electrically connected to the first electronic device. 1. A test carrier comprising:a base member on which a first electronic device under test is able to be temporarily mounted; anda second electronic device for testing which is configured to be used to test the first electronic device, whereinthe second electronic device is mounted on the base member, andthe second electronic device is able to be electrically connected to the first electronic device.2. The test carrier according to claim 1 , wherein the base member includes:a first external terminal of the test carrier;a first wiring which is able to electrically connect the first electronic device to the first external terminal, anda second wiring which is able to electrically connect the first electronic device to the second electronic device.3. The test carrier according to claim 2 , wherein the base member includes:an interposer on which the second electronic device is mounted; anda wiring substrate on which the first external terminal is provided and which holds the interposer,the interposer includes;a first main surface on which first and second internal terminals are provided, the first and second internal terminals being able to be in contact with first and second electrodes of the first electronic device; anda second main surface on which a third internal terminal is provided, the third internal terminal being joined to a third electrode of the second electronic device,the first wiring is provided in the interposer and the wiring substrate so as to electrically connect the first internal terminal to the first external terminal, andthe second wiring is provided in the interposer so as to ...

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Номер записи: 13
07-01-2016 дата публикации

Manufacturing a Low Profile Current Measurement Connector

Номер: US20160003870A1
Автор: Pasternak David R.
Принадлежит:

A current measurement connector may include a first part and a second part. Each part may include a mount and a joint. The first and second part may be joined via the respective joints through a current transformer interposed between the first and second parts. The respective mounts may be configured to receive a current from a current source and pass the received current through the current transformer via the first and second parts inducing a current in the current transformer. The induced current may be useable to measure the current from the current source. Methods for fabricating the current measurement connector may include die casting the first and second parts and press fitting the first and second parts at the respective joints through the current transformer. Methods for use may include withstanding a fault current pulse and dissipating heat associated with the pulse via the first and second parts. 1. A method for manufacturing a current measurement connector , the method comprising: a first mount; and', 'a first joint;, 'casting a first part of the current measurement connector, wherein the first part comprises a second mount; and', 'a second joint; and, 'casting a second part of the current measurement connector, wherein the second part comprisesjoining the first part and the second part via the first and second joints through a current transformer interposed between the first part and the second part, thereby electrically coupling the first mount to the second mount, wherein the first mount and the second mount are configured to receive a first current from a current source;wherein the current measurement connector is configured to pass the first current through the first and second joints thereby inducing a second current in the current transformer, wherein the second current is useable to measure the first current.2. The method of claim 1 , wherein the first part further comprises:one or more soldering pins, wherein the one or more soldering pins are ...

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Номер записи: 14
07-01-2016 дата публикации

SYSTEM AND METHOD FOR CAPACITIVE COUPLING TESTING

Номер: US20160003895A1
Автор: Farr Adrian N., FORSTER Ian James
Принадлежит:

A system for measuring RFID strap characteristics by coupling through a dielectric. The system can include a meter, test pads, springs, and wiring. Test pads may contact a substrate opposite of the RFID strap, and the coupling capacitance through the dielectric substrate may be utilized to calculate the strap capacitance. Similarly, other electrical properties of an RFID strap or other RFID assembly may be measured by coupling through a dielectric. 1. A system for measuring the capacitance of an RFID strap , comprising:an RFID strap comprising an RFID chip, a first contact pad, and at least a second contact pad coupled to the RFID chip;a substrate having a first and second side, wherein the first side and second side are opposite one another; anda measuring system comprising a meter, a first test pad, and a second test pad;wherein the meter and the first and second test pads are communicatively coupled,wherein the RFID strap is placed on the first side of the substrate such that first contact pad and the second contact pad are in contact with the first side of the substrate, the first test pad is placed on the second side of the substrate opposite the first contact pad such that there is an area of overlap through the substrate between the first test pad and the first contact pad, the second test pad is placed on the second side of the substrate opposite the second contact pad such that there is an area of overlap through the substrate between the second test pad and the second contact pad, andwherein the meter measures the total capacitance between the first test pad and the second test pad.2. The system for measuring the capacitance of an RFID strap of claim 1 , further comprising a first spring and a second spring claim 1 , wherein the first spring applies a force to the first test pad against the second side of the substrate and the second spring applies a force to the second test pad against the second side of the substrate.3. The system for measuring the ...

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Номер записи: 15
03-01-2019 дата публикации

Contact probe and inspection jig

Номер: US20190004090A1
Автор: Tsugio Yamamoto
Принадлежит: Yokowo Co Ltd

A contact probe includes a first plunger, a second plunger, and a coil spring. The coil spring is disposed outside the first plunger, and urges the first plunger and the second plunger in a direction away from each other. The first plunger and the second plunger are fitted to each other so as to be slidable with respect to each other. The first plunger includes a large diameter pail, and a small diameter part provided on a proximal end side of the large diameter part. The small diameter part is fitted into the second plunger. The coil spring includes a close winding part on a side of the second plunger. Adjacent lines of the close winding parts are brought into close contact with each other and come into electrical contact with each other at least in a compressed state of the coil spring.

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Номер записи: 16
13-01-2022 дата публикации

Test carrier and carrier assembling apparatus

Номер: US20220011340A1
Автор: Kazuya Ohtani, Toshiyuki Kiyokawa
Принадлежит: Advantest Corp

A test carrier carried in a state of accommodating a device under test (DUT) includes: a carrier body that holds the DUT; and a lid member that covers the DUT and is attached to the carrier body. The lid member includes a through-hole for sucking the DUT that is provided to face the DUT and penetrating through the lid member.

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Номер записи: 17
13-01-2022 дата публикации

TEST CARRIER AND CARRIER ASSEMBLING APPARATUS

Номер: US20220011341A1
Автор: Kiyokawa Toshiyuki, Ohtani Kazuya
Принадлежит: ADVANTEST CORPORATION

A test carrier carried in a state of accommodating a device under test (DUT) includes: a carrier body that holds the DUT, and a lid member that covers the DUT and is attached to the carrier body. The carrier body has a first through-hole for positioning that is provided to face the DUT. 1. A test carrier carried in a state of accommodating a device under test (DUT) , the test carrier comprising:a carrier body that holds the DUT, anda lid member that covers the DUT and is attached to the carrier body, whereinthe carrier body has a first through-hole for positioning that is provided to face the DUT.2. The test carrier according to claim 1 , wherein the carrier body and the lid member are rigid bodies.3. The test carrier according to claim 1 , wherein a plurality of first through-holes are formed on the carrier body.4. The test carrier according to claim 1 , wherein the carrier body comprises a closing member that is inserted into the first through-hole to close the first through-hole.5. The test carrier according to claim 1 , wherein a holding plate holding the DUT; and', 'a tubular body provided on the holding plate and surrounding the DUT., 'the carrier body comprises6. The test carrier according to claim 5 , wherein a plate-like main body; and', 'a pusher protruding from the main body in a convex shape, and, 'the lid member comprisesa size of the holding plate is substantially a same as a size of the plate-like main body in a first planar direction, andthe first planar direction is a direction substantially parallel to a main surface of the DUT.7. The test carrier according to claim 1 , wherein the first through-hole faces to a bump formed on the DUT. The present invention relates to a test carrier carried in a state of accommodating an electronic component to be tested (hereinafter simply referred to as a “device under test” (DUT)) such as a semiconductor integrated circuit device at the time of testing the DUT, and a carrier assembling apparatus for assembling ...

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Номер записи: 18
13-01-2022 дата публикации

TEST CARRIER AND CARRIER ASSEMBLING APPARATUS

Номер: US20220011342A1
Автор: Kiyokawa Toshiyuki, Ohtani Kazuya
Принадлежит: ADVANTEST CORPORATION

A test carrier carried in a state of accommodating a device under test (DUT) includes: a carrier body that holds the DUT; a lid member that covers the DUT and is attached to the carrier body; and an identifier for identifying an individual of the test carrier. 1. A test carrier carried in a state of accommodating a device under test (DUT) , the test carrier comprising:a carrier body that holds the DUT;a lid member that covers the DUT and is attached to the carrier body; andan identifier for identifying an individual of the test carrier.2. The test carrier according to claim 1 , wherein the identifier is formed on the test carrier.3. The test carrier according to claim 1 , wherein the identifier is associated with first information about the test carrier.4. The test carrier according to claim 3 , wherein contactors provided to correspond to terminals of the DUT;', 'external terminals electrically connected to the contactors; and', 'a first through-hole for positioning that is provided to face the DUT, and, 'the carrier body includesthe identifier includes a correction value corresponding to an error of a relative position of the first through-hole with respect to the contactor.5. The test carrier according to claim 4 , wherein the external terminals;', 'internal terminals provided to face the contactors; and', 'a wiring pattern that connects the internal terminals and the external terminals to each other, and, 'the carrier body includesthe identifier includes an electrical resistance value of the test carrier.6. The test carrier according to claim 1 , wherein the identifier is associated with second information about the test carrier.7. The test carrier according to claim 6 , wherein second information includes an individual of the test carrier.8. The test carrier according to claim 6 , wherein second information includes a test result of the DUT. The present invention relates to a test carrier carried in a state of accommodating an electronic component to be tested ...

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Номер записи: 19
13-01-2022 дата публикации

Test carrier and carrier assembling apparatus

Номер: US20220011343A1
Автор: Kazuya Ohtani, Toshiyuki Kiyokawa
Принадлежит: Advantest Corp

A test carrier carried in a state of accommodating a device under test (DUT) includes: a carrier body that holds the DUT; and a lid member that covers the DUT and is attached to the carrier body. The lid member includes: a plate-like main body; and a pusher protruding from the main body in a convex shape.

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Номер записи: 20
05-01-2017 дата публикации

Contact

Номер: US20170005426A1
Автор: Koki Sato, Mitsuru Kobayashi, Takahiro Kondo, Tetsugaku TANAKA
Принадлежит: Fujitsu Component Ltd

A contact includes a first terminal including a plurality of arms; a second terminal; a spring connecting the arms to the second terminal; and a casing covering the spring, wherein the arms outwardly protrude from one end of the casing, wherein an interval between the arms increases from a side of the casing to front edges of the arms, wherein when the arms are pushed toward the casing the arms are retracted into the casing and contact an inner side of the casing so that the interval between the arms decreases.

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Номер записи: 21
08-01-2015 дата публикации

ELECTRIC CONNECTING APPARATUS

Номер: US20150008946A1
Автор: ARAI Osamu, Inoue Tatsuo, KIYOFUJI Hidehiro
Принадлежит:

An apparatus includes a wiring base plate arranged on an upper side of a chuck top and having a wiring path connected to a tester, a probe card having a probe board spaced from the wiring base plate with a first surface thereof opposed to the wiring base plate and having a wiring path corresponding to the wiring path and probes provided on a second surface of the probe board to be connected to the wiring path and enabling to respectively contact connection pads of a semiconductor wafer on the chuck top, and an electric connector connecting the wiring base plate to the probe board by low heat conduction supporting members and decreasing heat conduction therebetween and electrically connecting the wiring paths.

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Номер записи: 22
12-01-2017 дата публикации

Adaptable Interface Assembly For Electronic Test And Control Systems

Номер: US20170010303A1
Автор: II Paul R., McGee Joseph T., Reichle Christopher L., Salopek, Sheridan Michael P.
Принадлежит: Advanced Integration, LLC

An electronic test and control system is provided. The electronic test and control system includes an enclosure configured to enclose one or more electronic boards and connective electrical wires. An adaptable interface assembly is attached to a face of the enclosure. The adaptable interface assembly includes a customized interface panel and one or more connectors connected to the customized interface panel. The adaptable interface assembly is configured to interface with application specific instruments and devices such as to eliminate the need for custom adapters positioned to interface with standard electronic test and control systems and application specific instruments and devices. 1. An electronic test and control system comprising:an enclosure configured to enclose one or more electronic boards and connective electrical wires; andan adaptable interface assembly attached to a face of the enclosure, the adaptable interface assembly including a customized interface panel and one or more connectors connected to the customized interface panel;wherein the adaptable interface assembly is configured to interface with application specific instruments and devices such as to eliminate the need for custom adapters positioned to interface with standard electronic test and control systems and application specific instruments and devices.2. The electronic test and control system of claim 1 , wherein the connectors located on the customized interface panel include one or more from the list of plugs claim 1 , jacks claim 1 , sockets claim 1 , instruments claim 1 , and/or fixtures.3. The electronic test and control system of claim 1 , wherein the customized interface panel includes an illuminated indicator.4. The electronic test and control system of claim 1 , wherein the customized interface panel includes a different assortment of connectors from a customized interface panel configured for a different application specific instrument or device.5. The electronic test and ...

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Номер записи: 23
14-01-2016 дата публикации

TESTING DEVICE AND A CIRCUIT ARRANGEMENT

Номер: US20160011232A1
Автор: Marques Martins Carlos, Theil Aron, Thiele Steffen
Принадлежит:

A testing device in accordance with various embodiments may include: a plurality of first terminals configured to be connected to a plurality of devices-under-test, wherein each first terminal of the plurality of first terminals may be configured to be connected to a respective device-under-test of the plurality of devices-under-test; a signal interface configured to be connected to a tester; and a circuit configured to exchange an identical first signal with each device-under-test of the plurality of devices-under-test through a respective first terminal of the plurality of first terminals, and to exchange at least one interface signal with the tester through the signal interface. 1. A testing device , comprising:a plurality of first terminals configured to be connected to a plurality of devices-under-test, wherein each first terminal of the plurality of first terminals is configured to be connected to a respective device-under-test of the plurality of devices-under-test;a signal interface configured to be connected to a tester; anda circuit configured to exchange an identical first signal with each device-under-test of the plurality of devices-under-test through a respective first terminal of the plurality of first terminals, and to exchange at least one interface signal with the tester through the signal interface.2. The testing device of claim 1 ,wherein the respective first terminal is configured to be connected to a respective pin of the respective device-under-test, and wherein the respective pins of the respective devices-under-test are configured to provide the same function in each respective device-under-test.3. The testing device of claim 1 ,wherein the circuit is configured to provide the identical first signal to each device-under-test of the plurality of devices-under-test via the respective first terminal.4. The testing device of claim 1 ,wherein the identical first signal comprises an identical test signal for testing each device-under-test of the ...

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Номер записи: 24
10-01-2019 дата публикации

CONTACT TERMINAL, INSPECTION JIG, AND INSPECTION APPARATUS

Номер: US20190011479A1
Автор: OTA Norihiro
Принадлежит:

A contact terminal may include a tubular body made of an electrically conductive material; and stick-shaped first and second central conductors made of an electrically conductive material. The first and second central conductors may include first and second stick-shaped bodies, first and second clasped portions configured to have a diameter greater than that of each of the first and second stick-shaped bodies, and first and second swell portions configured to have a diameter greater than that of each of the first and second stick-shaped bodies. The first and second central conductors are arranged to have a distal end portion of the first and second swell portions inserted into a joining portion of the tubular body, and to have a distal end surface of the first swell portion and a distal end surface of the second swell portion opposite each other with a gap therebetween. 2. The contact terminal according to claim 1 , wherein the first and second clasping portions comprise inner surfaces fixed to peripheral surfaces of the first and second clasped portions claim 1 , respectively claim 1 , with pressure.3. The contact terminal according to claim 1 , wherein at least one of the first and second clasping portions includes a slit configured to separate portions of the tubular body in a circumferential direction.4. The contact terminal according to claim 2 , wherein at least one of the first and second clasping portions includes a slit configured to separate portions of the tubular body in a circumferential direction.5. The contact terminal according to claim 3 , wherein the slit extends in an axial direction of the tubular body from an end portion of a helical groove defining the helical body.6. The contact terminal according to claim 4 , wherein the slit extends in an axial direction of the tubular body from an end portion of a helical groove defining the helical body.7. An inspection jig comprising:{'claim-ref': {'@idref': 'CLM-00001', 'claim 1'}, 'the contact terminal ...

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Номер записи: 25
03-02-2022 дата публикации

Connecting device for inspection

Номер: US20220034821A1
Автор: Minoru Sato
Принадлежит: Micronics Japan Co Ltd

A connecting device for inspection includes optical probes, and a probe head including a plurality of guide plates. The probe head includes a first guide plate, and a second guide plate arranged movably with respect to the first guide plate in a radial direction of the penetration holes in a state in which the optical probes are inserted to the respective penetration holes. The probe head holds the optical probes by inner wall surfaces of the penetration holes of the first guide plate and inner wall surfaces of the penetration holes of the second guide plate in a state in which the positions of the central axes of the penetration holes of the first guide plate are shifted in the radial direction from the positions of the central axes of the penetration holes of the second guide plate.

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Номер записи: 26
21-01-2016 дата публикации

PROBE CARD, AND CONNECTING CIRCUIT BOARD AND SIGNAL FEEDING STRUCTURE THEREOF

Номер: US20160018439A1
Автор: HO CHIH-HAO, Ku Wei-Cheng, LAI JUN-LIANG, Wei Hao
Принадлежит: MPI corporation

A probe card includes a connecting circuit board, a connector, and a probe. The connecting circuit board includes a substrate having a signal via and a plurality of ground vias, a signal feeding structure disposed on the substrate, and a connecting layer having the connector disposed thereon. The signal feeding structure includes a signal feeding pad and a ground pad, which is connected to the ground via, and has a matching compensation opening having a first side and a second side wider than the first side. The signal feeding pad does not contact the ground pad, and has a first end and a second end wider than the first end. The second end is connected to the signal via. The connecting layer has a signal connecting portion connected to the signal via, and a ground connecting portion connected to the ground vias. The probe is connected to the first end.

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Номер записи: 27
21-01-2016 дата публикации

Probe card, and connecting circuit board and signal feeding structure thereof

Номер: US20160018441A1
Автор: Chih-Hao Ho, Hao Wei, Jun-Liang Lai, Wei-Cheng Ku
Принадлежит: MPI Corp

A probe card includes a connecting circuit board, a connector, and a probe. The connecting circuit board includes a substrate having a signal via and a plurality of ground vias, a signal feeding structure disposed on the substrate, and a connecting layer having the connector disposed thereon. The signal feeding structure includes a signal feeding pad and a ground pad, which is connected to the ground via, and has a matching compensation opening having a first side and a second side wider than the first side. The signal feeding pad does not contact the ground pad, and has a first end and a second end wider than the first end. The second end is connected to the signal via. The connecting layer has a signal connecting portion connected to the signal via, and a ground connecting portion connected to the ground vias. The probe is connected to the first end.

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Номер записи: 28
17-01-2019 дата публикации

SUBSTRATE FOR MOUNTING LIGHT EMITTING DIODES WITH TESTING CAPABILITIES

Номер: US20190018057A1
Автор: Pappas Ilias
Принадлежит:

Embodiments relate to testing LEDs by applying a voltage difference between anode electrodes and cathode electrodes of the LEDs using transistors and probe pads and determining whether the LEDs satisfy a threshold level of operability. A final substrate has transistors that apply the voltage difference to the LEDs via conductive traces and probe pads during testing mode. A gate voltage is applied to gate terminals of the transistors, a first voltage is applied to anode electrodes of the LEDs, and a second voltage is applied to cathode electrodes of the LEDs. After applying the voltages, turning on of the LEDs is observed. Embodiments also relate to testing current leakage in the final substrate with the transistors and the LEDs. 1. A method comprising:picking up at least one light emitting diode (LED) from a first substrate;placing the at least one LED onto a second substrate with one or more cathode electrodes and one or more anode electrodes of the at least one LED connected to conductive components on the second substrate;applying a voltage difference between the one or more anode electrodes and the one or more cathode electrodes of the at least one LED placed on the second substrate via one or more transistors and one or more conductive traces in the second substrate; anddetermining whether the at least one LED satisfies a threshold level of operability responsive to applying the voltage difference.2. The method of claim 1 , wherein applying the voltage difference comprises:applying a gate voltage to one or more first probe pads on the second substrate to turn on the one or more transistors;applying a first voltage to the one or more anode electrodes of the at least one LED via one or more second probe pads on the second substrate and the one or more transistors; andapplying a second voltage to the one or more cathode electrodes of the at least one LED via one or more third probe pads on the second substrate, the second voltage lower than the first voltage.3. ...

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Номер записи: 29
16-01-2020 дата публикации

Intermediate Connection Member and Inspection Apparatus

Номер: US20200018778A1
Автор: FUJIHARA Jun, Sakamoto Hiroaki
Принадлежит:

There is provided an intermediate connection member which is provided between a first member having a plurality of first terminals and a second member having a plurality of second terminals and electrically connects the plurality of first terminals and the plurality of second terminals, respectively, the intermediate connection member including: a pogo block including a main body and a plurality of pogo pins provided in the main body, the pogo block configured to connect the plurality of first terminals and the plurality of second terminals, respectively; and a pogo frame having an insertion hole into which the pogo block is inserted, wherein the pogo block has a positioning pin, and the pogo frame has a positioning hole into which the positioning pin is inserted, and wherein the pogo block is positioned with respect to the pogo frame when the positioning pin is inserted into the positioning hole. 1. An intermediate connection member which is provided between a first member having a plurality of first terminals and a second member having a plurality of second terminals and electrically connects the plurality of first terminals and the plurality of second terminals , respectively , the intermediate connection member comprising:a pogo block including a main body and a plurality of pogo pins provided in the main body, the pogo block configured to connect the plurality of first terminals and the plurality of second terminals, respectively; anda pogo frame having an insertion hole into which the pogo block is inserted,wherein the pogo block has a positioning pin, and the pogo frame has a positioning hole into which the positioning pin is inserted, andwherein the pogo block is positioned with respect to the pogo frame when the positioning pin is inserted into the positioning hole.2. The intermediate connection member of claim 1 , wherein the pogo block is formed in a rectangular shape having a long side and a short side in a plan view claim 1 , andwherein the positioning ...

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Номер записи: 30
21-01-2021 дата публикации

ENCAPSULATED COMPONENT ATTACHMENT TECHNIQUE USING A UV-CURE CONDUCTIVE ADHESIVE

Номер: US20210018532A1
Автор: Campbell Julie A., Mrozik Regina R., Rinder Karl A.
Принадлежит: TEKTRONIX, INC.

A method for acquiring a signal from an encapsulated test point on a device under test, includes forming a hole in an encapsulant adjacent to the test point, the hole extending through the encapsulant to the test point, delivering a UV-curable conductive adhesive into the hole such that the delivered adhesive contacts the test point, applying UV light from a UV light source to cure the delivered adhesive, and connecting a conductive element between the cured adhesive and a test and measurement instrument. 1. A method for acquiring a signal from an encapsulated test point on a device under test , the method comprising:forming a hole in an encapsulant adjacent to the test point, the hole extending through the encapsulant to the test point;delivering a UV-curable conductive adhesive into the hole such that the delivered adhesive contacts the test point;applying UV light from a UV light source to cure the delivered adhesive; andconnecting a conductive element between the cured adhesive and a test and measurement instrument.2. The method of claim 1 , wherein the encapsulated test point comprises one of a pin claim 1 , a lead claim 1 , a leg claim 1 , a solder ball claim 1 , a pad claim 1 , a throughhole claim 1 , or a via.3. The method of claim 1 , wherein forming the hole in the encapsulant adjacent to the test point comprises drilling a hole in the encapsulant.4. The method of claim 1 , wherein forming the hole in the encapsulant adjacent to the test point comprises forming the hole through the encapsulant at an angle substantially normal to a surface of the test point.5. The method of claim 1 , wherein delivering the UV-curable conductive adhesive into the hole comprises inserting a first end of a tube having translucent walls into the hole claim 1 , the first end of the tube containing a volume of the UV-curable conductive adhesive sufficient to contact the test point.6. The method of claim 5 , further comprising drawing the volume of the UV-curable conductive ...

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Номер записи: 31
28-01-2016 дата публикации

ELECTRICAL CONNECTOR AND CONTACTS THEREOF

Номер: US20160025775A1
Автор: CHEN MING-YUE
Принадлежит:

An electric contact used to electrically connecting an IC socket to a PCB, comprises an upper contact, a lower contact and an elastic member between them. The upper contact comprises a first connecting portion to be connected to the IC socket and a first contacting portion with less length than the first connecting portion. The lower contact comprises a second connecting portion and a second contacting portion connecting with the second connecting portion. The second connecting portion includes an expanding portion adjacent to the second contacting portion. The second contacting portion forms a receiving space for the first contacting portion. The first connecting portion also defines a protruding portion projecting along a thickness direction. 1. An electrical contact for electrically connecting an IC socket to a printed circuit board , comprising:an upper contact having a first connecting portion to be connected to the IC socket and a first contacting portion with less width than the first connecting portion, the first connecting portion and the first contacting portion connecting with each other;a lower contact comprising a second connecting portion to be connected to the printed circuit board and a second contacting portion connecting with the second connecting portion, the second connecting portion having an expanding portion adjacent to the second contacting portion, the second contacting portion forming a receiving space for receiving the first contacting portion;an elastic member receiving the first contacting portion therein and located between the first connecting portion of the upper contact and the second contacting portion of the lower contact;wherein the first connecting portion defines a protruding portion projecting along a thickness direction thereof.2. The electrical contact as claimed in claim 1 , wherein the first contacting portion comprises a bridging portion connecting to the first connecting portion and a first contacting end of a circular ...

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Номер записи: 32
26-01-2017 дата публикации

HANDLER BASED AUTOMATED TESTING OF INTEGRATED CIRCUITS IN AN ELECTRONIC DEVICE

Номер: US20170023643A1
Автор: Barry Keith, LoCicero Rae-Ann Sobral, Pagarkar Sajjad, Ranganathan Vishwanathan Karthik, Shaik Ibrahim
Принадлежит:

A method and apparatus for testing electronic devices installed in a portable device. The apparatus incorporates a socket with receptacles for alignment pins, and an alignment plate with openings for the alignment pins. The holes for the alignment pins are matched to the socket receptacles, providing secure alignment. The spring loaded socket pin mates with at least one solder ball. The apparatus also includes a circuit card, which may be a modem test platform circuit card that has contacts that mate with the at least one solder ball. Other functions may be tested using other circuit card assemblies. A method of testing includes: installing the electronic device to be tested into a socket assembly, aligning the electronic device to be tested into the socket assembly; installing the socket assembly into a test apparatus, and testing the device. 1. An apparatus for testing electronic devices , comprising:a socket having receptacles for alignment pins;an alignment plate having openings for the alignment pins, wherein the holes for the alignment pins are matched to the socket receptacles;at least one alignment pin, matched to the alignment plate and the socket; andat least one socket pin, mating with at least one solder ball.2. The apparatus of claim 1 , further comprising:a modem test platform circuit card assembly having contacts that mate with the at least one solder ball.3. The apparatus of claim 1 , further comprising:a circuit card assembly having contacts that mate with the at least one solder ball.4. The apparatus of claim 1 , further comprising:a stiffener in contact with the modem test platform circuit card assembly.5. The apparatus of claim 1 , wherein the socket is a zero footprint socket.6. A method for testing an electronic device claim 1 , comprising:installing an electronic device to be tested into a socket assembly;aligning the electronic device to be tested into the socket assembly;installing the socket assembly into a test apparatus; andtesting the ...

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Номер записи: 33
04-02-2021 дата публикации

POWER INTERFACE

Номер: US20210033641A1
Автор: KEUM Min Jong, KIM Jung Bae, LEE Kyung Guk, YOON Young Tae
Принадлежит:

The present disclosure relates to a power interface, and more particularly, to a power interface for electrically connecting an object to be tested and a test driving unit. The electric power interface in accordance with an exemplary embodiment includes: a support member; an elastic member fixed to the support member and configured to provide an elastic force in a vertical direction; a first connection terminal disposed on the elastic member; a second connection terminal electrically connected to the first connection terminal; and a flexible sheet has one side fixed to the elastic member and the other side fixed to the support member to restrict a deformation range of the elastic member. 1. A power interface comprising:a support member;an elastic member fixed to the support member and configured to provide an elastic force in a vertical direction;a first connection terminal disposed on the elastic member;a second connection terminal electrically connected to the first connection terminal; anda flexible sheet has one side fixed to the elastic member and the other side fixed to the support member to restrict a deformation range of the elastic member,wherein the flexible sheet is not in contact with the elastic member and the support member in the rest area except for an area fixed to each of the elastic member and the support member.2. The electric power interface of claim 1 , wherein the first connection terminal is disposed on the elastic member to freely move according to deformation of the elastic member.3. The electric power interface of claim 1 , wherein the elastic member has a length and a width claim 1 , which are determined to stand upright on the support member.4. The electric power interface of claim 1 , wherein the flexible sheet is deformed according to movement of the first connection terminal.5. The electric power interface of claim 1 , wherein each of the first connection terminal and the second connection terminal has a pad shape having a ...

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Номер записи: 34
17-02-2022 дата публикации

SPRING LOCK INTERFACE WITH INCREASED CABLE CAPACITY

Номер: US20220052480A1
Автор: Garman Randall, Herron Randall, Rocker David Lawrence
Принадлежит:

A test adapter assembly for an interface. The test adapter assembly has a test adapter frame having a first pair of opposing sides, a second pair of opposing sides and an engagement mechanism support member, the second pair of opposing sides being shorter than the first pair of opposing side, the first and second pairs of opposing sides forming a test adapter face; and a collar support member, the collar support member having plate portion mounted to one of the second pair of opposing sides of the test adapter frame and a collar mounting portion extending from the plate portion at an angle of 40-50° relative to the face of the test adapter frame; 1. An interface device comprising: a test adapter frame having a first pair of opposing sides, a second pair of opposing sides and an engagement mechanism support member, said second pair of opposing sides being shorter than said first pair of opposing side, said first and second pairs of opposing sides forming a test adapter face; and', 'a collar support member, said collar support member having a plate portion mounted to one of said second pair of opposing sides of said test adapter frame and a collar mounting portion extending from said plate portion at an angle of 40-50° relative to said face of said test adapter frame;', 'a collar mounted to said collar mounting portion of said collar support member;', 'a clamp movably mounted to said collar;', 'a cover slidingly mounted in said collar; and', a spring lock nut;', 'a lead screw drive comprising a housing having interior threads, an Acme lead screw in said housing, and a spring lock pin having at least one retractable locking tab; and', 'a handle connected to said spring lock nut; and, 'an engagement mechanism mounted to said engagement mechanism support member in said test adapter frame, said engagement mechanism comprising], 'a test adapter assembly comprising a frame;', 'a channel for receiving said spring lock pin; and', 'means within said channel for engaging said ...

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Номер записи: 35
12-02-2015 дата публикации

CAPACITIVE FLUID LEVEL DETECTION SENSOR

Номер: US20150040659A1
Автор: Yu Hong Geun
Принадлежит:

The present invention relates to a fluid level detection sensor, and an objective of the present invention is to provide a capacitive fluid level detection sensor, in which an electrode for sensing a fluid level in a capacitive method is formed on a film in a printing method so that the film can be easily attached to and detached from a connector module having a wireless transmission function, and thus a value of a sensed fluid level can be transmitted to a central control office at a remote site, and the film can be used as a disposable item. 1a sensor film having a pair of electrodes formed on a base film in parallel to each other in a printing method to make a condenser and an adhesive layer on a bottom surface of the base film; anda connection module connected to connection terminals of the sensor film to convert a capacitance value detected by the electrodes into level information and wirelessly transmit the converted level information to a remote site, whereinthe connector module is configured to include:a receiving groove formed at one side of a housing to receive the connection terminals of the sensor film;a cover provided on the receiving groove and combined with the housing by means of a hinge to cover the receiving groove;connection pins provided inside the cover to pass through and electrically connect to the connection terminals of the sensor film received in the receiving groove; andpin grooves formed on a bottom unit of the receiving groove at positions corresponding to the connection pins, anda battery;a controller electrically connected to the connection pins to convert the detected capacitance value into the level information; anda wireless transmission unit for wirelessly transmitting the level information calculated by the controller to a remote site are embedded inside the housing.. A capacitive fluid level detection sensor comprising: 1. Field of the InventionThe present invention relates to a fluid level detection sensor, in which an electrode ...

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Номер записи: 36
07-02-2019 дата публикации

MODULAR DEVICE ARCHITECTURE

Номер: US20190041427A1
Автор: Bichl Heinrich, Gollon Sven, Holzmann Gottfried
Принадлежит: Rohde & Schwarz GmbH & Co. KG

A modular RF measuring device has a motherboard arranged centrally within the device so as to define a front side and a rear side, the front side and the rear side each comprising module interfaces. 1. A modular RF measuring device , comprising:a motherboard arranged centrally within the device so as to define a front side and a rear side, the front side and the rear side each comprising module interfaces.2. The device of claim 1 , wherein a plurality of insertion slots are provided for modules to be mounted horizontally within the measuring device both on the front side and the rear side of the motherboard.3. The device of claim 1 , wherein at least two measuring modules are received within the insertion slots on the front side of the motherboard.4. The device of claim 3 , wherein the measuring modules each have a recessed portion claim 3 , with an RF connector being arranged at the edge of the recessed portion of each measuring module.5. The device of claim 4 , wherein one or more RF cables are provided which connect the RF connector of one of the measuring modules to the RF connector of another one of the measuring modules.6. The device of claim 5 , wherein a cover for protecting the RF cable(s) is provided.7. The device of claim 3 , wherein the insertion slots for the measuring modules extend over the entire width of the measuring device.8. The device of claim 7 , wherein at least two measuring modules with a width which is a fraction of the entire width of the insertion slot are received within one of the insertion slots on the front side of the motherboard claim 7 , the measuring modules being connected to each other so as to form a unit having the width of the insertion slot.9. The device of claim 1 , wherein the insertion slots on the rear side of the motherboard are adapted for receiving at least one of a computer claim 1 , a power supply and a baseband signal processor.10. The device of claim 9 , wherein at least one of the insertion slots on the rear side ...

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Номер записи: 37
06-02-2020 дата публикации

DEVICE FOR DETECTING A SHORT CIRCUIT OF AN H BRIDGE

Номер: US20200041557A1
Автор: MOURET Julien, PRADELLES Christian
Принадлежит:

Disclosed is a device for detecting a short circuit of an H bridge, the device including a printed circuit including a power trace connecting the H bridge to a first connection area intended to be connected to a first multipin connector connected to a power supply terminal of a power source, and an earth trace connecting the H bridge to a second connection area intended to be connected to a second multipin connector connected to a reference terminal of the power source. The device further includes a measurement unit for measuring two potentials at two different points of the first connector, as well as two potentials at two different points of the second connector, and a processor configured to detect a short circuit of the H bridge by comparison of the potentials. 214141142141142131512. The device as claimed in claim 1 , wherein the measurement means include claim 1 , at the first connection zone () claim 1 , a first contact zone () and a second contact zone () that are electrically isolated from one another on the printed circuit board claim 1 , said first contact zone () and said second contact zone () being linked to the power supply track () and to a first measurement track () claim 1 , respectively claim 1 , and being intended to be connected to different respective pin points on the first connector ().318181182181182171916. The device as claimed in claim 1 , wherein the measurement means include claim 1 , at the second connection zone () claim 1 , a first contact zone () and a second contact zone () that are electrically isolated from one another on the printed circuit board claim 1 , said first contact zone () and said second contact zone () being linked to the ground track () and to a second measurement track () claim 1 , respectively claim 1 , and being intended to be connected to different pin points on the second connector () claim 1 , respectively.4203040203040. The device as claimed in claim 1 , wherein said processing means include a first () claim 1 ...

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Номер записи: 38
16-02-2017 дата публикации

Cable Assembly With Spine For Instrument Probe

Номер: US20170045550A1
Автор: Engquist David Thomas, Jr. James H., MCGRATH
Принадлежит:

Embodiments of the present invention provide an improved cable assembly for connecting an electrical test and measurement probe to a device under test. One end of the probe is connected to a device under test (“DUT”), while the other end is connected to the instrument through one or more cables. To prevent mechanical stresses to the probe-DUT interface caused by the cables' resistance to bending and twisting, embodiments of the improved cable assembly use one or more pliable spines to hold the cable assembly in position after it has been bent or twisted. This provides a more secure connection to the DUT and prevents damage to the probe-DUT interface. Each spine is anchored to the tip of the probe, and may be further secured by an outer housing or additional anchors. A flexible boot may surround the cable assembly and/or outer housing, further protecting the cables from damage. Alternatively, one or more spines may be placed inside the boot. 1. A cable assembly for an electrical test probe , comprising:one or more signal cables; anda pliable spine proximate to the one or more signal cables.2. The cable assembly of claim 1 , further comprising an anchor that connects the pliable spine to a probe tip.3. The cable assembly of claim 2 , wherein the anchor is a first anchor and the pliable spine comprises one or more second anchors that limit the motion of the one or more signal cables with respect to the pliable spine.4. The cable assembly of claim 2 , wherein the anchor consists of a U-shaped portion of the pliable spine that is received by the probe tip.5. The cable assembly of claim 2 , wherein the anchor consists of an L-shaped portion of the pliable spine that is received by the probe tip.6. The cable assembly of claim 1 , wherein a first end of the cable assembly is connected to the probe tip claim 1 , and a second end of the cable assembly is connected to an instrument cable.7. The cable assembly of claim 1 , further comprising a flexible housing that secures the ...

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Номер записи: 39
15-02-2018 дата публикации

High Frequency Time Domain Reflectometry Probing System

Номер: US20180045769A1
Автор: John B. Rettig
Принадлежит: Tektronix Inc

A probe includes a self-aligning connector set, a moveable probe tip, a cable, a housing, and a spring. When the probe tip is pressed to a test point on a device-under-test, the probe tip moves within the housing to cause a first connector and a second connector of the self-aligning connector set to be connected through an adapter of the self-aligning connector set, thereby establishing a signal path through the probe. The first connector, second connector, and adapter are structured so that their respective ground conductors become connected prior to their respective signal conductors becoming connected. Electro-static charge present at the test point is safely discharged through a resistor to ground before the signal path through the probe is established, thereby preventing damage to the probe and connected host instrument. When the probe tip is removed from the device-under-test, the spring forces a disconnection of the first and second connectors.

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Номер записи: 40
08-05-2014 дата публикации

Electrical Connection Module With Interruptible Circuit

Номер: US20140125323A1
Автор: Mark Becker, Roland Tombers
Принадлежит: Individual

An electrical connecting module includes a first electrical connection terminal with a first connection pole and a second connection pole; a module element with a second electrical connection terminal, which comprises a first connection pole and a second connection pole, and with a third electrical connection terminal, which comprises a first connection pole and a second connection pole. A test channel is provided for accommodating a test probe. wherein the test channel is intended for making electrical contact with the second connection pole of the first connection terminal by means of the test probe when there is an electrical connection between the first connection pole of the first connection terminal and the first connection pole of the third connection terminal and when the electrical connection between the second connection pole of the first connection terminal and the second connection pole of the third connection terminal is disconnected.

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Номер записи: 41
03-03-2022 дата публикации

Electronics tester

Номер: US20220065921A1
Автор: Jovan Jovanovic, Kenneth W. Deboe, Scott E. Lindsey, Steven C. Steps
Принадлежит: Aehr Test Systems Inc

A tester apparatus is described. Various components contribute to the functionality of the tester apparatus, including an insertion and removal apparatus, thermal posts, independent gimbaling, the inclusion of a photo detector, a combination of thermal control methods, a detect circuitry in a socket lid, through posts with stand-offs, and a voltage retargeting.

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Номер записи: 42
26-02-2015 дата публикации

WIRING BOARD FOR TESTING LOADED PRINTED CIRCUIT BOARD

Номер: US20150054539A1
Автор: Koolis Stephen J., Snyder Kenneth R., SWART Mark A., Tackett Douglas W.
Принадлежит:

A wiring board for transmission of test signals between test point locations on a circuit board under test and an external analyzer having compliant contacts making electrical contact with a pad positioned on a conductive surface circuit layer having a trace extending to a second pad having a hole for receipt of an interface pin having a swaged head electrically connected to the external analyzer. 1. A wiring board for transmission of test signals between test point locations on a circuit board under test and an external test analyzer comprising:a non-conductive board having a conductive circuit layer positioned on a top surface, the conductive circuit layer having a first pad and a trace extending to a second pad having a hole for receipt of an interface pin extending through the non-conductive board; anda complaint contact making electrical contact with the test point locations and the first pad of the circuit layer.2. The wiring board of claim 1 , wherein there are multiple conductive circuits on the non-conductive board.3. The wiring board of claim 1 , wherein there is a compliant contact and an interface pin for each conductive circuit.4. The wiring board of claim 1 , wherein the second pad is a via.5. The transfer board of claim 1 , wherein the interface pin extends through the via.6. The transfer board of claim 1 , wherein a short headless pin extends through the via for the sole purpose of connecting the pad on one layer to another layer.7. The wiring board of claim 1 , wherein the via has at least one flap around an opening which engages the interface pin.8. The wiring board of claim 6 , wherein vias on successive layers have at least one flap rotated with respect to adjacent layers.9. The wiring board of claim 1 , wherein the interface pin has a smooth round portion for contacting the pad at the middle or end of a trace.10. The wiring board of claim 1 , wherein the pad is a via.11. The wiring board of claim 1 , wherein the interface pin has a swaged or ...

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Номер записи: 43
26-02-2015 дата публикации

CONNECTOR, PROBE, AND METHOD OF MANUFACTURING PROBE

Номер: US20150054540A1
Автор: Kobayashi Mitsuru, Sato Koki, Takahashi Koki
Принадлежит:

A connector includes multiple probes and a first insulator part and a second insulator part joined to cover the probes. Each of the probes has a monolithic structure of a single bent metal plate. Each of the probes includes an end part configured to come into contact with an electrode terminal; a spring part having a meandering shape and connected to the end part; a housing part bent to enclose the spring part; and a bent part provided between the spring part and the housing part. The end parts of the probes are at least partially projecting outward from first openings provided in the first insulator part, and the bent parts of the probes are at least partially projecting outward from second openings provided in the second insulator part. 1. A probe , comprising:an end part configured to come into contact with an electrode terminal;a spring part having a meandering shape and connected to the end part;a housing part bent to enclose the spring part; anda bent part provided between the spring part and the housing part,wherein the end part, the spring part, the housing part, and the bent part are formed in a single bent metal plate and continue from a first end to a second end of the single bent metal plate.2. The probe as claimed in claim 1 , wherein the housing part has a cross section of a flat plate shape.3. The probe as claimed in claim 1 , further comprising:a housing connecting part connected to the end part, andthe housing connecting part is configured to come into contact with the housing part so that an electrical signal obtained at the end part is transmitted to the housing part via the housing connecting part. The present application is a division of U.S. patent application Ser. No. 13/353,377, filed on Jan. 19, 2012, which is based upon and claims the benefit of priority of Japanese Patent Application No. 2011-019165, filed on Jan. 31, 2011. The disclosures of the prior applications are hereby incorporated herein in their entirety by reference.1. Field of ...

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Номер записи: 44
14-02-2019 дата публикации

PORTABLE MULTl-FUNCTION CABLE TESTER

Номер: US20190049508A1
Автор: Davis Brent E.
Принадлежит: NSWC CRANE

The methods and apparatus described herein are designed and configured to allow one user to test cable continuity using a wire-configurable directional connector. The methods and apparatus may transmit a first and second voltage pulse through a first and second wire of a cable under test, respectively, having a wire-configurable directional connector attached. Both voltage pulses travel through the wire-configurable directional connector. The first voltage pulse selectively leaves at least one of the second wire and a third wire of the cable under test and the second voltage pulse selectively leaves the third wire. The methods and apparatus may store a pre-determined pattern of a returning voltage pulse specific to the cable under test, and determine a state of the first, second, and third wires in response to receiving the first and second voltage pulses. 1. An apparatus for testing cable continuity comprising:a processor configured to transmit a first voltage pulse through a selected first wire among a plurality of wires of a cable under test, wherein the cable under test has a first end and a wire-configurable directional connector attached to a second end, and a second voltage pulse through a selected second wire among the plurality of wires of the cable under test;memory configured to store a pre-determined pattern of at least one returning voltage pulse specific to the cable under test;an output module operatively connected to the processor and the first and second wires at the first end of the cable under test;an input module operatively connected to the processor and the second wire and a third wire at the first end of the cable under test,wherein the first voltage pulse is directed to selectively enter the first wire at the first end of the cable under test, travel through the wire-configurable directional connector attached to the second end, and selectively leave at least one of the second and third wires at the first end of the cable under test,wherein ...

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Номер записи: 45
14-02-2019 дата публикации

SYSTEMS AND METHODS FOR SIMPLIFYING INTEGRATION OF LEDs INTO MULTIPLE APPLICATIONS

Номер: US20190049512A1
Автор: Lim Chee Sheng, LOW Tek Beng, TAN Eng Wah
Принадлежит: DOMINANT Opto Technologies Sdn Bhd

A system for simplifying integration of a light emitting diode (LED) into multiple applications includes, an identification module to uniquely identify the light emitting diode (LED) during testing, a storage module for storing testing data of the light emitting diode (LED), a transfer module for transferring testing data of the light emitting diode (LED) down a supply chain to customer end for further processing to achieve a required final color mix, and, a light source molded around a frame, the light emitting diode (LED) being attached and electrically connected to the light source. In use, the testing data includes data relating to at least one characteristic of the light emitting diode (LED). In further use, the LED is a red, green and blue (RGB) LED. 1. A system for simplifying integration of a light emitting diode (LED) into multiple applications , said system comprising:an identification module to uniquely identify said light emitting diode (LED) during testing;a storage module for storing testing data of said light emitting diode (LED);a transfer module for transferring testing data of said light emitting diode (LED) for further processing to achieve a required final color mix; and,a light source molded around a frame, said light emitting diode (LED) being attached and electrically connected to said light source,wherein said testing data comprises data relating to at least one characteristic of said light emitting diode (LED).2. The system as claimed in claim 1 , wherein said light source is a plastic light source insert-molded around a copper lead-frame.3. The system as claimed in claim 1 , wherein said LED is a red claim 1 , green and blue (RGB) LED.4. The system as claimed in claim 1 , wherein said light source further comprises a top surface for displaying an identification code.5. The system as claimed in claim 4 , wherein said identification code is selected from a group comprising a two-dimensional (2-D) matrix barcode claim 4 , a combination of a ...

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Номер записи: 46
25-02-2016 дата публикации

Capacitive opens testing of low profile components

Номер: US20160054385A1
Автор: Anthony J. Suto
Принадлежит: Teradyne Inc

A probe assembly for capacitive testing electrical connections of a low profile component to a circuit assembly. The probe assembly is configured to reduce coupling of noise signals from the circuit assembly to the capacitive probe. The probe assembly includes a sensing member with a geometry that allows the probe to preferentially couple to test signals from the pins of a component under test rather than conductive structures on the circuit assembly, such as pads, and signal traces to which those pins are attached. The sensing member may be a vertical capacitive sense plate such that coupling is to an edge of the plate. The sensing member alternatively may be a horizontal capacitive sense plate with an active area of the probe surrounded by an isolation ring. Measurements made with such capacitive probes may provide test measurements that yield a reliable discrimination between a properly attached pin and an open pin.

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Номер записи: 47
23-02-2017 дата публикации

Test connector retaining harness assembly

Номер: US20170052212A1
Автор: Heath W. Haga, Peter M. Heinrich, Ricky M. Peterson, Thomas E. Dowhower
Принадлежит: Boeing Co

An electrical system may include a first electrical connector configured to be coupled to an electrical panel, a second electrical connector configured to be coupled to a testing device that is configured to test components coupled to the electrical panel, and a retaining harness assembly that removably connects to the first and second electrical connectors to maintain a secure mating relationship between the first and second electrical connectors.

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Номер записи: 48
23-02-2017 дата публикации

TEST CONNECTOR FOR COAXIAL CABLES

Номер: US20170052213A1
Автор: Jr. James H., MCGRATH, ROMEY SAMUEL
Принадлежит:

A connector for terminating a cable including a compressible fitting and a crimp nut. The compressible fitting has an inner passage to receive a portion of the cable and a threaded outer wall coaxial with and surrounding the inner passage. The outer wall includes a first slot extending radially through the outer wall and axially away from a first end of the outer wall. The crimp nut is configured to thread onto the outer wall of the compressible fitting. The crimp nut is further configured, in a first position, not to constrict the inner passage and, in a second position, to radially compress the outer wall of the compressible fitting to reduce a bore diameter of the inner passage and to electrically connect the outer wall with the portion of the cable received in the inner passage of the compressible fitting. Methods are also disclosed. 1. A connector for terminating a cable , the connector comprising:a compressible fitting having an inner passage to receive a portion of the cable, the compressible fitting also having a threaded outer wall coaxial with and surrounding the inner passage, the outer wall including a first slot extending radially through the outer wall, the first slot further extending axially away from a first end of the outer wall; anda crimp nut configured to thread onto the outer wall of the compressible fitting, the crimp nut being operable axially between a first position and a second position, the crimp nut further configured, in the first position, not to constrict the inner passage and, in the second position, to radially compress the outer wall of the compressible fitting to reduce a bore diameter of the inner passage and to electrically connect the outer wall with the portion of the cable received in the inner passage of the compressible fitting.2. The connector of claim 1 , further comprising a plurality of additional slots radially spaced about the outer wall from the first slot claim 1 , each of the plurality of additional slots extending ...

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Номер записи: 49
23-02-2017 дата публикации

Position Calibration Method, Test Circuit Board, Sample Panel and Position Calibration Apparatus

Номер: US20170052214A1
Автор: Hu Lei, TAN Wenjing, ZHAO Hui
Принадлежит:

The present invention discloses a position calibration method, a test circuit board, a sample panel and a position calibration apparatus. The position calibration method comprises: Step S, providing a test circuit board and forming at least one first sample connecting finger; Step S, making a sample panel comprising second sample connecting fingers corresponding to each first sample connecting finger; Step S, bringing the test circuit board into contact with the sample panel; and Step S, detecting whether each first sample connecting finger is electrically connected to a corresponding second sample connecting finger, and when any one of the first sample connecting fingers is detected as in disconnection with the corresponding second sample connecting finger, adjusting a position of the test circuit board and/or the sample panel. 1. A position calibration method for calibrating a position of a test circuit board and/or a to-be-tested display panel before the to-be-tested display panel is tested , the test circuit board comprising a first connecting finger setting region that is provided with a plurality of first connecting fingers therein , the to-be-tested display panel comprising a plurality of second connecting fingers corresponding to the plurality of first connecting fingers one by one , the position calibration method comprising:{'b': '1', 'Step S, providing the test circuit board and forming at least one first sample connecting finger outside of the first connecting finger setting region of the test circuit board;'}{'b': '2', 'Step S, making a sample panel comprising a second connecting finger setting region and a second sample connecting finger outside of the second connecting finger setting region corresponding to each of the first sample connecting fingers, so that when each of the first sample connecting fingers is aligned with a corresponding second sample connecting finger, the plurality of first connecting fingers are aligned with positions ...

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Номер записи: 50
23-02-2017 дата публикации

SOLDERLESS TEST FIXTURE FOR TRIMMED COAXIAL CABLE OR RELATED PRODUCTS

Номер: US20170052215A1
Автор: Bisiules Peter J., He Jinchun, Su HuaFeng, Wang Qiang, Yu Junfeng
Принадлежит:

A test fixture for testing performance of a trimmed cable and/or antenna components. The test fixture may be connected without the use of solder allowing for accurate testing or tuning of one or more the antenna components. 1. A solderless test fixture for testing performance of at least one cable or at least one antenna component , the solderless test fixture comprising:a base; and a choke cover including a first cavity defining a first coupling section; and', 'a test body connected to the choke cover, the test body including a second cavity defining a second coupling section, wherein at least a portion of the first cavity and at least a portion of the second cavity define a radio frequency (RF) choke for the at least one cable. And, 'at least one frame mounted on the base, wherein a respective one of the at least one frame includes2. The solderless test fixture of claim 1 , further comprising:at least one connector connected to the at least one frame, the at least one connector including a solderless center terminal configured to be electrically connected to the at least one cable.3. The solderless test fixture of claim 2 , further comprising:at least one clamp mounted on the test body, wherein the at least one clamp is configured to secure an inner conductor of the at least one cable to the solderless center terminal.4. The solderless test fixture of claim 3 , wherein the at least one clamp includes at least one press bolt configured to exert a downward force on the inner conductor of the at least one cable onto the solderless center terminal of the at least one connector.5. The solderless test fixture of claim 1 , further comprising:at least one cable guide dimensioned to guide the at least one cable through the RF choke.6. The solderless test fixture of claim 1 , further comprising:a device support mounted on the base; andat least one second clamp configured to secure the at least one antenna component to the device support.7. The solderless test fixture of ...

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Номер записи: 51
26-02-2015 дата публикации

UNIVERSAL DEVICE MULTI-FUNCTION TEST APPARATUS

Номер: US20150057961A1
Автор: MONTOYA ADAM, Torberntsson Niklas Ake
Принадлежит:

Methods and systems for a universal device multi-function test apparatus are provided. Specifically, the universal device multi-function test apparatus is configured to receive multiple device types, manufacturers, and/or models attached to a nest via an interface module. The device can then be subjected to a battery of tests in a unified and controlled test environment. Information related to the initiated tests, even including results, may be associated with the device and stored in memory, written to the device, and/or forwarded for further processing/repair operations. 1. An apparatus for testing an electronic device , comprising:one or more test modules to test one or more of an operation and characteristic of an electronic device and output a result of the test;a test management module in communication with the one or more test modules, wherein the test management module applies the one or more test modules in a first test sequence, and wherein the test management module receives the result of each test applied in the first test sequence;a control computer that analyzes the result of each test applied and determines whether the result of each test applied requires a modification to at least one of an order of the one or more test modules and an inclusion of the one or more test modules applied in the first test sequence, and when at least one of the results of each test applied requires a modification to the first test sequence, instructs the test management module to dynamically modify the first test sequence; anda communications module, in communication with the test management module, configured to forward a modified first test sequence to a second test management module.2. The apparatus of claim 1 , wherein the modification to the first test sequence includes altering a sequence of tests of at least one of the one or more test modules.3. The apparatus of claim 1 , wherein the communications module forwards the modified first test sequence to the second ...

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Номер записи: 52
05-03-2015 дата публикации

INTERCONNECTION METER SOCKET ADAPTERS

Номер: US20150061644A1
Автор: COLBURN Michael, Parks Ken
Принадлежит: SAN DIEGO GAS & ELECTRIC COMPANY C/O SEMPRA ENERGY

Interconnection meter socket adapters are provided. An interconnection meter socket adapter comprises a housing enclosing a set of electrical connections. The interconnection meter socket adapter may be configured to be coupled to a standard distribution panel and a standard electrical meter, thereby establishing connections between a distribution panel and a user such that electrical power may be delivered to the user while an electrical meter measures the power consumption of the user. An interconnection meter socket adapter may be configured to be coupled to a DC-AC converter, which may be coupled to various energy sources. As such, the energy sources are coupled to an electrical power system. In addition, a connector such as a flexible cable or flexible conduit containing insulated wires can be provided for connecting various energy sources and/or sinks. 1. An interconnection meter socket adapter , comprising:a housing enclosing a set of electrical connections, the housing configured to be coupled to a distribution panel and a meter; andthe set of connections having an input and an output, wherein the set of connections couples the input to an input of the distribution panel and the utility side of the meter in parallel, and couples the output to an output of the distribution panel and the customer side of the meter in parallel.2. The interconnection meter socket adapter of claim 1 , wherein the housing comprises a first flange and a second flange claim 1 , the first flange covered by a ring.3. The interconnection meter socket adapter of claim 1 , wherein the housing is cylindrical.4. The interconnection meter socket adapter of claim 1 , further comprising a set of sockets configured to make contact with the meter claim 1 , wherein the set of sockets are the first output.5. The interconnection meter socket adapter of claim 1 , further comprising a set of jaw blades configured to make contact with the distribution panel6. The interconnection meter socket adapter ...

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Номер записи: 53
03-03-2016 дата публикации

Test Instrument Probe with a Pointed Tip That Is Also Capable of Gripping

Номер: US20160061888A1
Автор: Chait Paul Nicholas, Chait Stanley
Принадлежит:

A test instrument probe that encompasses the dual alternate action of a point or a clamp-grip within the same probe. This probe has approximately the same dimensions as a conventional probe, and allows either the point or clamp action to be used without the necessity of removing the probe from the hand. This alternate action requires only using a thumb and finger pressure to change from a point to a clamp or the clamp to a point. One embodiment allows a clamp jaw opening of up to a nominal ¼ inch that is usually sufficient to grip onto the leads of an electronic component such as resistor, capacitor or integrated circuit pin. The probes are also designed so that when not in use, the two probes can be connected together by a snap-in action that minimizes the potential loss of a probe and importantly allows the points to become safely enclosed to minimize a sharp point hazard. 1. A test instrument probe comprising:a body;a split shaft assembly in said body, said split shaft assembly including a pair of substantially identical shaft halves normally biased together to form a point at a front end thereof, each shaft halve including a tab portion extending through an aperture in the other shaft halve, wherein when said tabs are pressed together, said shaft halves are urged apart and said point opens to form a clamp for releasable capture of a lead on a device under test, and when said tabs are released, said shaft halves return together to form a point.2. The test instrument probe of wherein said shaft halves are joined at a rear end thereof.3. The test instrument probe of wherein said split shaft assembly is connected to a multimeter test lead.4. The test instrument probe of wherein said body includes means for selectively locking said shaft halves in a closed position.5. The test instrument probe of wherein said body includes a finger sleeve for selectively preventing said locking from being pressed together.6. The test instrument probe of wherein said body comprises an ...

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Номер записи: 54
01-03-2018 дата публикации

PROBE DEVICE OF VERTICAL PROBE CARD

Номер: US20180059140A1
Автор: HSIEH Kai Chieh, LI Wen Tsung
Принадлежит: CHUNGHWA PRECISION TEST TECH. CO., LTD.

A probe device of a vertical probe card is provided and includes a die assembly and at least one pin assembly. The die assembly includes a first die, a second die, and a middle die disposed between the first die and the second die. The at least one pin assembly has a first pin, a second pin, and at least one electrical connector. The at least one electrical connector is connected to the first pin and the second pin. The at least one pin assembly is electrically contacted with at least one contact pad of a device under test. The at least one contact pad leans against the at least one pin assembly, so that the at least one pin assembly generates a deformation in a longitudinal direction. 1. A probe device of a vertical probe card , comprising: a first die having at least one upper opening which penetrates vertically through the first die;', 'a second die having at least one lower opening which penetrates vertically through the second die, and the at least one lower opening being disposed corresponding to the at least one upper opening; and', 'a middle die disposed between the first die and the second die and having at least one middle opening which penetrates vertically through the middle die; and, 'a die assembly, comprisingat least one pin assembly having a first pin, a second pin, and at least one electrical connector,wherein the at least one electrical connector is connected to the first pin and the second pin, the at least one pin assembly is inserted in the die assembly and passes through the at least one upper opening, the at least one middle opening, and the at least one lower opening, the at least one pin assembly is electrically contacted with at least one contact pad of a device under test, the at least one contact pad leans against the at least one pin assembly, so that the at least one pin assembly generates a deformation in a longitudinal direction, which is perpendicular to a surface of the at least one contact pad of the device under test.2. The probe ...

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Номер записи: 55
20-02-2020 дата публикации

MINIATURE TEST PROBE

Номер: US20200057094A1
Автор: Garcia Daniel A., McTigue Michael Thomas, Swaim Jason Andrew
Принадлежит:

A miniature probe for measuring small voltage signals of a DUT includes a probe body having a flexible substrate and signal transmission lines running a longitudinally, and a first probe connection circuit located at a first end of the probe body and including exposed wires, SMT components coupled between the exposed wires and the signal transmission lines, respectively, and a local mechanical stiffener mounted adjacent the SMT components. The wires are connectable to the DUT for receiving the voltage signals. The probe further includes a second probe connection circuit located at a second end of the probe body, and including transmission line connectors coupled to the signal transmission lines, respectively, and a bent portion of the flexible substrate between the probe body and the transmission line connectors. The bent portion enables the transmission line connectors to exit the probe substantially axially, relative to the longitudinal length of the probe body. 1. A miniature differential probe for measuring small voltage signals of a device under test (DUT) at high speeds , the probe comprising:a probe body comprising a flexible substrate and a plurality of signal transmission lines running a longitudinal length of the probe body;a first probe connection circuit located at a first end of the probe body, the first probe connection circuit comprising a plurality of exposed wires, a plurality of components coupled between the exposed wires and the signal transmission lines, respectively, and a local mechanical stiffener mounted opposite the components, wherein the exposed wires are connectable to the DUT for receiving the small voltage signals; anda second probe connection circuit located at a second end of the probe body, opposite the first end, the second probe connection circuit comprising a plurality of transmission line connectors coupled to the signal transmission lines, respectively, and a bent portion of the flexible substrate located between the probe body ...

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Номер записи: 56
04-03-2021 дата публикации

AUXILIARY DEVICE FOR FUNCTIONAL EXPANSION AND SIGNAL ACQUISITION OF TESTING SYSTEM

Номер: US20210063435A1
Автор: CHANG CHIEN WEN
Принадлежит:

An auxiliary device for functional expansion and signal acquisition of a testing system is provided with a pogo pin attaching device including at least one spiral spring loop, at least one fastening member, and at least one cable. The fastening member includes at least one limiting hole and at least one fastening hole. The spiral spring loop is disposed in the limiting hole. The cable passes through the fastening hole to electrically connect to the spiral spring loop. 1. An auxiliary device for functional expansion and signal acquisition of a testing system , comprising a pogo pin attaching device including at least one spiral spring loop , at least one fastening member , and at least one cable;wherein the fastening member includes at least one limiting hole and at least one fastening hole;wherein the spiral spring loop is disposed in the limiting hole; andwherein the cable passes through the fastening hole to electrically connect to the spiral spring loop.2. The auxiliary device of claim 1 , wherein the fastening member further comprises at least one projection at two ends respectively claim 1 , and wherein the spiral spring loop is positioned adjacent to or on the projection.3. The auxiliary device of claim 2 , wherein an end of the projection includes a support having a top being flush with that of the fastening member.4. The auxiliary device of claim 3 , wherein the fastening member further comprises two hole members through two sides respectively claim 3 , and a resilient member having two ends positioned to the hole members respectively and having at least one end extending out of the side of the fastening member.5. The auxiliary device of claim 4 , further comprising a sleeve covered an end of the spiral spring loop and disposed in the limiting hole.6. The auxiliary device of claim 1 , wherein the spiral spring loop is made of metallic material and has a predetermined elasticity. The invention relates to testing systems and more particularly to an auxiliary ...

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Номер записи: 57
04-03-2021 дата публикации

Resistance measuring device and resistance measuring jig

Номер: US20210063454A1
Автор: Tadashi Takahashi
Принадлежит: Nidec Read Corp

A resistance measuring device includes: a first jig; a plurality of first contacts; a second jig; a plurality of second contacts; a resistance measuring unit that supplies a current between a first contact and a second contact, which correspond to each other, detects a voltage between a first contact and a second contact, and calculates a resistance value of an object to be measured based on a relationship between a value of the supplied current and a value of the detected voltage; first wirings connecting the resistance measuring unit and each of the first contacts, for the first contacts, respectively; and second wirings connecting the resistance measuring unit and each of the second contacts while passing from the resistance measuring unit through the first jig, for the second contacts, respectively.

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Номер записи: 58
04-03-2021 дата публикации

PORTABLE TEST DEVICE WITH AUTOMATIC ROBOTIC ARM

Номер: US20210063462A1
Автор: HSIEH CHIN-LIN
Принадлежит:

A portable test device with automatic robotic arm is provided to use a micro step motor as the power source for the reciprocating movement of the robotic arm. The dual adjustment slots design of the intermediate plate enables quick adjustment of the angle and height of the robotic arm. The intermediate plate is further mounted to a precision guide for precise operation of the robotic arm. 1. A portable test device with automatic robotic arm , comprising:a base;a driving member disposed on the base;an intermediate plate connected to the driving member and moved by the driving member backwards and forwards along a first direction; anda fixture member for holding a test connector, the fixture member locked on the intermediate plate with height and angle adjustability.2. The portable test device of claim 1 , further comprising a control circuit board disposed on the base claim 1 , the control circuit board connected to the driving member and controlling the driving member to move the intermediate plate backwards and forwards.3. The portable test device of claim 1 , further comprising a precision guide disposed on the base claim 1 , the intermediate plate further connected to the precision guide utilized for maintaining precised movement of the intermediate plate when the driving member moves the intermediate plate backwards and forwards along the first direction.4. The portable test device of claim 1 , wherein the driving member is a micro step motor.5. The portable test device of claim 1 , wherein the intermediate plate comprises a first adjusting slot and a second adjusting slot parallel with each other claim 1 , the fixture member locked respectively on the first adjusting slot and the second adjusting slot via two locking points.6. The portable test device of claim 5 , wherein the first adjusting slot and the second adjusting slot have orientation along a second direction where the second direction is perpendicular to the first direction.7. The portable test device ...

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Номер записи: 59
12-03-2015 дата публикации

Power Line Takeoff Clamp Assembly

Номер: US20150069998A1
Автор: JR. Regis J., Nero
Принадлежит:

In a power line takeoff clamp assembly and method of use thereof an electrical power distribution line is clamped to a body of the clamp assembly. A power takeoff supported by the body clamped to the power line generates direct current from alternating current flowing in the power line. One or more sensors supported by the body clamped to the power line sense one or more values related to an electrical current flowing in a power line. A wireless transceiver supported by the body clamped to the power line communicates data regarding the one or more sensed values. Each sensor and the wireless transceiver utilize direct current generated by the power takeoff for the operation thereof. 1. A power line takeoff clamp assembly comprising:a body including a first housing and a second housing;means for moving the first housing and the second housing apart, where a power line is movable from a position that is not between the first housing and the second housing to a position that is between the first housing and the second housing, and together, where the power line positioned between the first housing and the second housing is clamped between the first housing and the second housing;means for sensing one or more values related to an electrical current flowing in the power line disposed between the first housing and the second housing when together;means for wirelessly communicating data regarding the electrical current sensed by the means for sensing; andmeans for converting alternating current (AC) flowing in the power line into direct current (DC) that is provided to the means for sensing and the means for wirelessly communicating data for the operation thereof, wherein the means for sensing, the means for wirelessly communicating data, and the means for converting are supported by the body, wherein the means for converting includes:a core made from a material in which magnetic flux can be established, said core having a first part in the first housing and a second part ...

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Номер записи: 60
12-03-2015 дата публикации

POGO PIN AND PROBE CARD, AND METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE USING THE SAME

Номер: US20150070038A1
Автор: JOO Sung-Ho, KIM Joon-yeon, KIM Yu-Kyum
Принадлежит:

A pogo pin may include a housing, a resilient connecting member and a switching unit. The housing may be arranged between a printed circuit board (PCB) and a probing head. The resilient connecting member may be arranged in the housing to electrically connect the PCB with the probing head. The switching unit may be provided in the housing to selectively cut off an electrical connection between the PCB and the probing head. Thus, because the PCB may not require additional switching substrates, the PCB may have a small size so that the probe card may also have a small size. A semiconductor device may be manufactured using the probe card. 1. A probe card comprising:a printed circuit board (PCB) having a circuit pattern through which a test current passes;a probing head arranged under the PCB, the probing head including circuitry through which the test current passes;a plurality of needles provided to the probing head to supply the test current to an object; anda plurality of pogo pins positioned between the PCB and the probing head, each pogo pin including a housing arranged between the PCB and the probing head, a resilient connecting member arranged in the housing to electrically connect the PCB with the probing head, and a switching unit provided in the housing to selectively cut off an electrical connection between the PCB and the probing head.2. The probe card of claim 1 , further comprising claim 1 , for each pogo pin:a first connecting pin at a first end of the resilient connecting member; anda second connecting pin at a second, opposite end of the resilient connecting member,wherein the switching unit electrically disconnects the first connecting pin from the second connecting pin.3. The probe card of claim 2 , wherein:the switching unit includes an actuator connected to a disconnecting member, the actuator configured to move the disconnecting member so as to electrically disconnect the first connecting pin from the second connecting pin.4. The probe card of ...

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Номер записи: 61
12-03-2015 дата публикации

APPARATUS OF MEASURING SEMICONDUCTOR DEVICE

Номер: US20150070039A1
Автор: SHIMURA MASAHIRO
Принадлежит: KABUSHIKI KAISHA TOSHIBA

According to one embodiment, an apparatus of measuring a semiconductor device includes a first sense terminal, a first force terminal, a second sense terminal, and a plurality of second force terminals. The first sense terminal is configured to be electrically connected to a first electrode provided on a first surface of a semiconductor device. The first force terminal is configured to be electrically connected to the first electrode of the semiconductor device. The second sense terminal is configured to be electrically connected to a second electrode provided on a second surface of the semiconductor device. The second surface is opposite to the first surface. The plurality of second force terminals is disposed in a circumference of the second sense terminal, and is configured to be electrically connected to the second electrode of the semiconductor device. 1. An apparatus of measuring a semiconductor device , comprising:a first sense terminal configured to be electrically connected to a first electrode provided on a first surface of a semiconductor device;a first force terminal configured to be electrically connected to the first electrode of the semiconductor device;a second sense terminal configured to be electrically connected to a second electrode provided on a second surface of the semiconductor device, the second surface being opposite to the first surface; anda plurality of second force terminals disposed in a circumference of the second sense terminal, and configured to be electrically connected to the second electrode of the semiconductor device.2. The apparatus of measuring the semiconductor device according to claim 1 , whereina first distance and a second distance are approximately equal, the first distance is a distance between the second sense terminal and one of the second force terminals, the second distance is a distance between the second sense terminal and another one of the second force terminals.3. The apparatus of measuring the semiconductor ...

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Номер записи: 62
12-03-2015 дата публикации

TEST PROBE ASSEMBLY AND RELATED METHODS

Номер: US20150070040A1
Автор: Hanson Scott, Magnuson Aaron, Treibergs Valts, Yakushev Sergey
Принадлежит:

A test probe assembly includes a first elongate electrically conductive plunger that extends from a proximal first plunger end to a distal first plunger end, and is defined in part by a central longitudinal axis. The first plunger has a first spring latch at the distal first plunger end. At least a portion of the first plunger has an arc with a first plunger outer contact point opposite the first spring latch relative to the longitudinal axis. The first plunger is disposed in a spring. The first plunger outer contact point in contact with the inner diameter of the spring, and the first spring latch engages at least a portion of the spring. A method includes disposing a first plunger within a spring along a spring longitudinal axis, disposing a second probe within the spring along the spring longitudinal axis, and engaging the spring latch and the second plunger spring latch with the spring, for instance by capturing an end coil of the spring with the spring latch of at least one of the spring latch or the second plunger spring latch. 1. A testing apparatus comprising:a spring component extending from a first spring end portion to a second spring end portion and having a spring intermediate portion, the spring intermediate portion having a spring inner diameter, the spring component including a coiled wire defined in part by a wire diameter;at least one testing component including a first elongate electrically conductive plunger extending from a distal end portion to a proximal end portion and having an intermediate portion therebetween, the first plunger disposed within the spring component;the intermediate portion of the first plunger having a central longitudinal axis, and defined in part by an intermediate outer dimension;the first plunger including a spring latch, the spring latch including a hook portion disposed at the distal end portion; andthe distal end portion has a distal outer dimension at a base of the hook portion disposed at a greater distance from ...

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Номер записи: 63
17-03-2022 дата публикации

Two-terminator RF adapter for background/environment noise measurement

Номер: US20220082586A1
Автор: Hurd Erik, Kinzel Robert L., Kolski Jeffrey
Принадлежит:

A two-terminator RF adapter for background noise measurement in a test environment comprises a system test port comprising a system test port termination and a system test port connector to connect to a system under test; and a data acquisition port, comprising a data acquisition port termination and a data acquisition port connector to connect to a data acquisition system. 1. A two-terminator RF adapter for background noise measurement in a test environment , comprising:a system test port, comprising a system test port termination and a system test port connector to connect to a system under test; anda data acquisition port, comprising a data acquisition port termination and a data acquisition port connector to connect to a data acquisition system.2. The two-terminator RF adapter of claim 1 , wherein the system test port connector comprises a male connector and the data acquisition port connector comprises a female connector.3. The two-terminator RF adapter of claim 1 , wherein the system test port connector comprises a female connector and the data acquisition port connector comprises a male connector.4. The two-terminator RF adapter of claim 1 , wherein the system test port connector and the data acquisition port connector are either both male connectors or both female connectors.4. The two-terminator RF adapter of claim 1 , wherein the system test port termination comprises an open claim 1 , short claim 1 , 50 ohm claim 1 , 75 ohm claim 1 , or 100-ohm termination.5. The two-terminator RF adapter of claim 1 , wherein the data acquisition port termination comprises an open claim 1 , short claim 1 , 50 ohm claim 1 , 75 ohm claim 1 , or 100-ohm termination.6. The two-terminator RF adapter of claim 1 , wherein the adapter further comprises a through connection for output of a response signal from a system under test and an internal electrical switch to switch the through connection to the system test port termination. This application claims the benefit of U.S. ...

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Номер записи: 64
28-02-2019 дата публикации

CLAMP JAW FOR BY-PASS TYPE METER SOCKETS

Номер: US20190064213A1
Автор: Harnois Carey D., Rusch Brian J., Zhang Fan
Принадлежит:

A meter socket is provided for watt-hour meters. The meter socket comprises a block assembly mounted at a center of the meter socket, a bypass mechanism situated in the bottom portion of the block assembly and a plurality of clamp jaws. The block assembly includes a top portion and a bottom portion. The bypass mechanism includes a plurality of rotary bypass blades coupled to a lever arm. Each clamp jaw includes a clamp jaw assembly that includes a jigsaw mechanism situated in the top portion of the block assembly. The jigsaw mechanism includes a copper jaw bus, a contact plate, a jaw spring, a bypass spring, a compression spring, a shoulder screw, a rivet or one or more fasteners. Each clamp jaw further includes a clamp jaw bypass mechanism that includes a jaw opening formed between the copper jaw bus and the jaw spring to receive a rotary bypass blade of the plurality of rotary bypass blades of the bypass mechanism. 1. A meter socket for watt-hour meters , the meter socket comprising:a block assembly mounted at a center of the meter socket, wherein the block assembly including a top portion and a bottom portion;a bypass mechanism situated in the bottom portion of the block assembly, wherein the bypass mechanism includes a plurality of rotary bypass blades coupled to a lever arm; and a clamp jaw assembly that includes a jigsaw mechanism situated in the top portion of the block assembly, wherein the jigsaw mechanism includes a copper jaw bus, a contact plate, a jaw spring, a bypass spring, a compression spring, a shoulder screw, a rivet or one or more fasteners', 'wherein the compression spring is disposed external to a gap between the copper jaw bus and a combo of the jaw spring and the bypass spring using the shoulder screw for externally preloading the pressure, and', 'a clamp jaw bypass mechanism that includes a jaw opening formed between the copper jaw bus and the jaw spring to receive a rotary bypass blade of the plurality of rotary bypass blades of the bypass ...

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Номер записи: 65
28-02-2019 дата публикации

AUTOMATED TEST SYTEM HAVING ORTHOGONAL ROBOTS

Номер: US20190064261A1
Автор: Bowyer David Paul, Campbell Philip, Pei Jianfa, Smith Marc LeSueur, Toscano John P.
Принадлежит:

An example test system includes a test carrier to hold devices for test; a device shuttle to transport the devices; and a robot to move the devices between the test carrier and the device shuttle. The device shuttle is configured to move, towards a stage of the test system containing the robot, a first device among the devices that has not been tested. The device shuttle is configured to move in a first dimension. The robot is configured to move the first device from the device shuttle to the test carrier. The robot is configured to move in a second dimension that is different from the first dimension. 1. A test system comprising:a test carrier to hold devices for test;a device shuttle to transport the devices; anda robot to move the devices between the test carrier and the device shuttle;wherein the device shuttle is configured to move, towards a stage of the test system containing the robot, a first device among the devices that has not been tested, the device shuttle being configured to move in a first dimension; andwherein the robot is configured to move the first device from the device shuttle to the test carrier, the robot being configured to move in a second dimension that is different from the first dimension.2. The test system of claim 1 , wherein the device shuttle is configured to move claim 1 , away from the stage of the test system containing the robot claim 1 , a second device among the devices that has been tested; andwherein the robot is configured to move the second device from the test carrier to the device shuttle.3. The test system of claim 1 , wherein the robot comprises a component that is movable in a third dimension that is substantially orthogonal to the first dimension and to the second dimension.4. The test system of claim 1 , wherein the first dimension is substantially orthogonal to the second dimension; andwherein movement of the shuttle in the first dimension is independent of movement of the robot in the second dimension.5. The test ...

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Номер записи: 66
28-02-2019 дата публикации

Relay Test Paddle

Номер: US20190064273A1
Автор: Bouasry Eddie, Fussell Howard G.
Принадлежит:

A test paddle is provided that includes a body portion having a first end and a second end. The test paddle includes a plurality of adapters provided about the second end and a plurality of contacts provided about the first end, each of the plurality of adapters electrically coupled to one of the plurality of contacts. The test paddle includes a removable insulation plate selectively attached to the body portion. A method for testing relays is also provided. 1. A test paddle comprising:a body portion; anda removable insulation plate selectively attached to the body portion.2. The test paddle of claim 1 , wherein the body portion further comprises:a first end;a second end;a plurality of adapters provided about the second end and configured for connection to a relay tester; anda plurality of contacts provided about the first end and configured for connection to a test device, each of the plurality of adapters electrically coupled to one of the plurality of contacts.3. The test paddle of claim 1 , wherein the removable insulation plate is coupled to the body portion via one or more removable fasteners.4. The test paddle of claim 3 , wherein the fasteners are threaded.5. The test paddle of claim 2 , wherein the second end of the body portion defines a cavity wherein the plurality of adapters is disposed.6. The test paddle of claim 2 , wherein one or both of an upper or lower surface of the second end of the body portion include an uneven or discontinuous surface.7. The test paddle of claim 6 , wherein one or both of an upper or lower surface of the second end of the body portion include a plurality of ridges.8. The test paddle of claim 1 , further comprising a finger guard positioned between the first end and the second end of the body portion.9. A test paddle claim 1 , comprising:a body portion having a first end and a second end;a plurality of adapters provided about the second end;a plurality of contacts provided about the first end, each of the plurality of adapters ...

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Номер записи: 67
10-03-2016 дата публикации

SEMICONDUCTOR TEST SYSTEM AND METHOD

Номер: US20160069949A1
Автор: Whetsel Lee D.
Принадлежит:

A test controller applies test stimulus signals to the input pads of plural die on a wafer in parallel. The test controller also applies encoded test response signals to the output pads of the plural die in parallel. The encoded test response signals are decoded on the die and compared to core test response signals produced from applying the test stimulus signals to core circuits on the die. The comparison produces pass/fail signals that are loaded in to scan cells of an IEEE 1149.1 scan path. The pass/fail signals then may be scanned out of the die to determine the results of the test. 1. An integrated circuit comprising:(a) input pads;(b) output pads;(c) first core circuitry having an input coupled to an input pad and having an output;(d) second core circuitry having an input coupled to the output of the first core circuitry and having an output;(e) third core circuitry having an input coupled to the output of the second core circuitry and having an output;(f) test connection circuitry having an input coupled with the input pad, having an output coupled with the input of the second core circuitry, and having an output coupled with the input of the third core circuitry; and (i) a tri-state buffer having a core input, a data output coupled to an output pad, and a tristate enable input;', '(ii) comparator circuitry having a core input coupled to the core input of the tri-state buffer, a response input coupled to the output pad, and an enable input lead coupled to the tristate enable input of the tri-state buffer; and', '(iii) multiplex circuitry having a first input coupled to the output of the first core circuitry, a second input coupled to the output of the second core circuitry, a third input coupled to the output of the third core circuitry, a core select input, and a selected core output coupled to the core input of the tri-state buffer circuitry., '(g) output circuitry including2. The integrated circuit of in which the comparator circuitry includes a serial ...

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Номер записи: 68
19-03-2015 дата публикации

TEST TERMINAL BLOCK

Номер: US20150077149A1
Автор: Kloppenburg Christian
Принадлежит: PHOENIX CONTACT GMBH & CO. KG

A test terminal block is formed of a series terminal block and a test plug block pluggable onto the series terminal block and fastening clamps for releasably securing them together. Each of two fastening clamps has a clamp housing contains at least two catch elements and the housing of each has at least two corresponding mating catch elements that determine two interlocking positions of fastening parts in the fastening clamps, one position is arranged after the other in the plug-on direction of the fastening parts. An unlocking element is movably arranged in the housing of each of the two fastening parts, which unlocking element can be brought into a first unlocking position and a second unlocking position, the locking of the first interlocking position being released in the first unlocking position and the locking of the second interlocking position being released in the second unlocking position by the unlocking element. 118-. (canceled)19. A test terminal block , comprising:a modular terminal block having a plurality of modular terminals which are located next to one another and a respective fastening clamp on each side of the plurality of modular terminals, anda test plug block which is releasably clippable onto the modular terminal block, the test plug block having a plurality of tests plugs which are connected to one another and which has a respective fastening part on each side of the plurality of test plugs, the fastening parts being connected to one another via a handle,wherein each of the plurality of modular terminals has two busbars which, together, form an isolating point and each test plug having a contact plug which is pluggable into a respective isolating point, andwherein the fastening clamps each having a clamp housing with a receiving section and the two fastening parts each having a fastener housing with a corresponding plug-in section which is pluggable into a respective receiving section,wherein the clamp housing of each of the fastening clamps ...

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Номер записи: 69
17-03-2016 дата публикации

CHARGING AND DISCHARGING INSPECTION DEVICE AND CHARGING AND DISCHARGING INSPECTION METHOD FOR THIN SECONDARY BATTERY

Номер: US20160079635A1
Автор: Niwa Yoshikazu
Принадлежит:

A plurality of batteries is stacked, together with spacers, in a compressed state. Charging and discharging units are arranged facing lead terminals protruding from the batteries and are independently operable for the respective batteries. The charging and discharging units each independently include substantially V-like shaped power-side and measurement-side contact elements elastically supported by compression coil springs and having floating freedom. When the batteries are moved all together toward the charging and discharging units, front end surfaces of the lead terminals are pressed against and electrically connected to flat surfaces of the power-side and measurement-side contact elements. By this, it is possible to smoothly perform charging and discharging inspection on the batteries even when the lead terminals protruding from the battery package are subjected in advance to surface treatment. 110.-. (canceled)11. A charging and discharging inspection device for a thin secondary battery , the thin secondary battery comprising a battery package and thin plate-shaped positive and negative electrode lead terminals protruding from one side of the battery package ,the charging and discharging inspection device comprising:a support member that supports a plurality of the thin secondary batteries in a stacked state; andcontact probes arranged facing and being contactable with the respective lead terminals of the plurality of the thin secondary battery supported by the support member,wherein the support member and the contact probes are adapted to approach or separate from each other such that the contact probes can be simultaneously brought into contact with or separated from the respective lead terminals of the plurality of the thin secondary battery;wherein the lead terminals respectively have front end surfaces located at front ends thereof in a protruding direction of the lead terminals and formed with a width corresponding to a plate thickness of the lead ...

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Номер записи: 70
17-03-2016 дата публикации

SHORT CONTACT IN A TESTING APPARATUS FOR WIRELESS INTEGRATED CIRCUITS

Номер: US20160079707A1
Автор: FOONG Wei Kuong, GOH Kok Sing, LEE Eng Kiat, MUNDIYATH Shamal
Принадлежит:

An electrical contact for use in an integrated circuit testing apparatus with a very short conducting contact pin. The shortness of the contact pin is made possible due to the unique design and coupling of the contact pin with an elastomer, and both supported by a housing in such a way that the contact pin test height is brought down to 0.5 mm, whilst providing a deflection of 0.1 mm with is sufficient in order to provide adequate penetration to matte tin plated devices. The contact pin of this invention looks almost like the letter “F”, rotated 90° to the left, so that it lies on its left side. The rectangular shaped elastomer is placed between the prongs of the “F”. The bottom part of the “F” is curved upwards so that it is almost parallel to the prongs. 1. An electrical contact for use in an integrated circuit testing apparatus , comprising:{'b': 10', '12', '14', '16', '121', '122', '12', '124', '125, 'a rigid member () comprising a first member () joined perpendicularly to both a second member () and a third member (), said second member joined to an upper side of said first member and close to or at a first end () of said first member, and said third member also joined to an upper side of said first member at an intermediate point () along said first member, and said first member () being bent upwards at an intermediate point () of first member such that a second end () of first member is substantially pointing upwards;'}{'b': 20', '14', '16, 'a compressible member () supported in a space formed between said second member () and said third member (); and'}{'b': 30', '20', '202', '20', '10', '123, 'a housing () supporting said compressible member () via contact with an upper side () of said compressible member (), and a contact pad of a testing apparatus supporting said rigid member () on a lower side () of said first member.'}2125121416. An electrical contact for use in an integrated circuit testing apparatus according to claim 1 , wherein the said second end ...

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Номер записи: 71
18-03-2021 дата публикации

PORTABLE MULTI-FUNCTION CABLE TESTER

Номер: US20210080511A1
Автор: Davis Brent E.
Принадлежит: The United States of America, as represented by the Secretary of the Navy

The methods and apparatus described herein are designed and configured to allow one user to test cable continuity using a wire-configurable directional connector. The methods and apparatus may transmit a first and second voltage pulse through a first and second wire of a cable under test, respectively, having a wire-configurable directional connector attached. Both voltage pulses travel through the wire-configurable directional connector. The first voltage pulse selectively leaves at least one of the second wire and a third wire of the cable under test and the second voltage pulse selectively leaves the third wire. The methods and apparatus may store a pre-determined pattern of a returning voltage pulse specific to the cable under test, and determine a state of the first, second, and third wires in response to receiving the first and second voltage pulses. 110.-. (canceled)11. A method of testing cable continuity comprising:transmitting, by a processor, a first voltage pulse through a selected first wire among a plurality of wires of a cable under test, wherein the cable under test has a first end and a wire-configurable directional connector attached to a second end, and a second voltage pulse through a selected second wire among the plurality of wires of the cable under test;storing, in memory, a pre-determined pattern of at least one returning voltage pulse specific to the cable under test, wherein the first voltage pulse is directed to selectively enter the first wire at the first end of the cable under test, travel through the wire-configurable directional connector attached to the second end, and selectively leave at least one of the second and third wires at the first end of the cable under test, wherein the second voltage pulse is directed to selectively enter the second wire at the first end of the cable under test, travel through the wire-configurable directional connector attached to the second end, and selectively leave the third wire; anddetermining, by ...

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Номер записи: 72
26-03-2015 дата публикации

TEST SOCKET WHICH ALLOWS FOR EASE OF ALIGNMENT

Номер: US20150084658A1
Автор: Lee Jae Hak
Принадлежит:

The present invention relates to a test socket which allows for ease of alignment, and more particularly, to a test socket that is interposed between a device to be inspected and an inspection apparatus so as to electrically connect terminals of the device to be inspected and pads of the inspection apparatus, the test socket including: an alignment member that has a plurality of through-holes formed at points corresponding to the terminals of the device to be inspected or the pads of the inspection apparatus and is attached to the inspection apparatus such that the through-holes are located at the pads of the inspection apparatus; and an elastic conductive sheet including conductive parts that are disposed at the points corresponding to the terminals of the device to be inspected and include a plurality of conductive particles that are distributed in an insulating elastic material, insulating support parts that support the conductive parts and disconnect an electrical connection between adjacent conductive parts, and protruding conductive parts that protrude downward from the conductive parts and are inserted into the plurality of through-holes of the alignment member, wherein when the protruding conductive parts are inserted into the through-holes of the alignment member, the elastic conductive sheet is aligned in the the alignment member. 1. A test socket that is interposed between a device to be inspected and an inspection apparatus so as to electrically connect terminals of the device to be inspected and pads of the inspection apparatus , the test socket comprising:an alignment member that has a plurality of through-holes formed at points corresponding to the terminals of the device to be inspected or the pads of the inspection apparatus and is attached to the inspection apparatus such that the through-holes are located at the pads of the inspection apparatus; andan elastic conductive sheet comprising conductive parts that are disposed at the points ...

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Номер записи: 73
12-06-2014 дата публикации

CONNECTOR FOR ACTUATOR OF CAMERA

Номер: US20140159760A1
Автор: KUO CHANG-WEI
Принадлежит: HON HAI PRECISION INDUSTRY CO., LTD.

A connector includes a support and an arm. The support is to support a to-be-test workpiece. The arm is rotatably connected to the support and includes a number of probes. Pinheads of the probes faces the support. When the arm is rotated to a predetermined position relative to the support, the pinheads of the probes contacts with a flexible printed circuit (FPC) of the to-be-tested workpiece. 1. A connector comprising:a support to support a to-be-test workpiece; andan arm rotatably connected to the support and comprising a plurality of probes, pinheads of the plurality of probes facing the support, when the arm is rotated to a predetermined position relative to the support, the pinheads of the plurality of probes contacting with a flexible printed circuit (FPC) of the to-be-tested workpiece supported by the support.2. The connector as described in claim 1 , wherein the support comprises a first top portion claim 1 , a first bottom portion parallel to the first top portion claim 1 , and a first connecting portion perpendicularly connecting the first top portion to the first bottom portion claim 1 , the arm comprises a second top portion claim 1 , a second bottom portion parallel to the second top portion claim 1 , and a second connecting portion perpendicularly connecting the second top portion to the second bottom portion claim 1 , the second bottom portion comprises a first end connected to the second connecting portion and a second end opposite to the first end claim 1 , the second end of the second bottom portion is rotatably connected to an end of the first bottom portion connected to the first connecting portion claim 1 , the first top portion defines a recess to receive the FPC of the to-be-tested workpiece claim 1 , the plurality of probes are arranged on the second top portion claim 1 , and the pinheads of the plurality of probes face the recess.3. The connector as described in claim 2 , further comprising a base claim 2 , wherein the base comprises a third ...

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Номер записи: 74
22-03-2018 дата публикации

ELECTRICAL TEST FIXTURE

Номер: US20180080977A1
Автор: Chen Han, NING Peihuan, Sun Wei, WAN Bin
Принадлежит:

The present disclosure provides an electrical test fixture, comprising a base provided with an accommodating slot for accommodating therein a circuit board to be detected, and a printed circuit board for providing an electrical test signal, the accommodating slot being provided therein with a connector electrically connected to the printed circuit board; and an upper cover movably connected to the base in a first state in which the upper cover is opened in such a manner that the circuit board to be detected is capable of being placed in the accommodating slot and in a second state in which the upper cover is engaged with the base and is capable of abutting against the circuit board to be detected in the accommodating slot in such a manner that the circuit board to be detected comes into contact and is connected with the connector. 1. An electrical test fixture , comprising:a base provided with an accommodating slot for accommodating therein a circuit board to be detected, and a printed circuit board for providing an electrical test signal, the accommodating slot being provided therein with a connector electrically connected to the printed circuit board; andan upper cover movably connected to the base in a first state in which the upper cover is opened in such a manner that the circuit board to be detected is capable of being placed in the accommodating slot, and in a second state in which the upper cover is engaged with the base and is capable of abutting against the circuit board to be detected in the accommodating slot in such a manner that the circuit board to be detected comes into contact and is connected with the connector.2. The electrical test fixture according to claim 1 , wherein the connector is an ejector pin connector that comprises a plurality of ejector pins in contact with the circuit board to be detected claim 1 , and the accommodating slot is provided with a plurality of mounting holes claim 1 , and each ejector pin of the ejector pin connector is ...

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Номер записи: 75
24-03-2016 дата публикации

MEASURING DEVICE HAVING AN INTERFACE

Номер: US20160084877A1
Автор: NEUBURGER Stephan
Принадлежит:

Described and shown is a measuring device () for determining a measured variable. A sensor device () that generates at least one primary signal depending on the measured variable to be determined, an electronics device (), a transition section () located between the sensor device () and the electronics device (), an interface () arranged in the transition section () for transmitting energy and/or signals and having at least one signal line () between the sensor device () and the electronics device () are provided. 111-. (canceled)12. A measuring device for determining a measured variable , comprising:at least one sensor device,at least one electronics device,at least one transition section located between the sensor device and the electronics device,at least one interface arranged in the transition section for transmitting at least one of energy and signals, andat least one signal line extending between the sensor device and the electronics device,wherein the sensor device is operable to generate at least one primary signal depending on the measured variable to be determined,wherein the interface and the signal line are reversibly connectable for transmitting signals to one another.13. The measuring device according to claim 12 , wherein at least one contact element is provided for transmitting the at least one of energy and signals between the signal line and the interface claim 12 , and wherein claim 12 , in at least one state of the device claim 12 , the contact element interrupts transmission of said at least one of energy and signals via the signal line and enables at least the transmission of signals between the signal line and the interface.14. The measuring device according to claim 13 , wherein the at least one contact element allows said transmission of at least one of energy and signals via the signal line in at least one standard state.15. The measuring device according to claim 12 , wherein at least one flap is assigned to the interface.16. The ...

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Номер записи: 76
24-03-2016 дата публикации

Triaxial dc-ac connection system

Номер: US20160084878A1
Автор: Gregory Sobolewski, Wayne C. Goeke
Принадлежит: Keithley Instruments LLC

Embodiments of the present invention provide an improved two-cable connection system for connecting electrical test instrumentation to a device under test (DUT). In one embodiment, a single pair of equal-length triaxial cables each has a desired characteristic impedance. Each cable has a center connecter, intermediate conductor, and outer conductor. The proximal end of each cable is connected to the test instrumentation, and the distal ends are located at the DUT. At the distal end, the center conductors are connected to the DUT, the intermediate conductors are allowed to float, and the outer conductors are connected to each other. The proximal end of each cable is connected to the device using an appropriate connection for the test that will be performed. This allows the test instrumentation to perform different types of tests without changing connections to the DUT.

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Номер записи: 77
24-03-2016 дата публикации

CLAMP METER AND CLAMP PROBE

Номер: US20160084879A1
Автор: Luo Shounan
Принадлежит:

The present application relates to a clamp meter and a clamp probe that can be matched for use with the clamp meter. The clamp meter comprises a main meter body having an interfacing connector and one or more clamp probes, wherein each of the clamp probes is detachably connectable to the interfacing connector of the main meter body. Each of the clamp probes has a converting unit that converts a signal measured by the clamp probe to an output measurement signal within a predetermined measurement range of the main meter body, and each of the clamp probes has an identity indicator readable by the main meter body. As the clamp meter according to the present application can be matched with a plurality of clamp probes having different measurement ranges, a user only needs to purchase one main meter body and one or more clamp probes of different models to meet various measuring needs. This can enhance the flexibility and extendibility of the usage of a clamp meter, as well as reduce the user's financial burden. 1. A clamp meter comprising:a main meter body having an interfacing connector; andone or more clamp probes, wherein each of the clamp probes is detachably connectable to the interfacing connector of the main meter body,wherein each of the clamp probes has a converting unit that converts a signal measured by the clamp probe to an output measurement signal within a predetermined measurement range of the main meter body, and each of the clamp probes has an identity indicator readable by the main meter body.2. The clamp meter of claim 1 , wherein the clamp meter comprises a plurality of clamp probes.3. The clamp meter of claim 2 , wherein the clamp probes are configured for measuring different current ranges.4. The clamp meter of claim 1 , wherein each of the clamp probes has a memory readable by the main meter body.5. The clamp meter of claim 4 , wherein the memory of each clamp probe stores the identity indicator of said clamp probe.6. The clamp meter of claim 4 , ...

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Номер записи: 78
24-03-2016 дата публикации

HANDLER AND MANAGEMENT METHOD THEREOF

Номер: US20160084904A1
Автор: Choi Guiheum, KIM Hogyung, LEE Younggil
Принадлежит:

A handler includes a loading unit transporting substrates and sockets coupled to the substrates, a test unit including a printed circuit board, the sockets being mounted on the printed circuit board, and latches fixing the sockets to the printed circuit board, and an unloading unit unloading the substrates and the sockets from the test unit. 1. A handler , comprising:a loading unit to transport substrates and sockets coupled to the substrates; a printed circuit board, the sockets to be mounted on the printed circuit board, and', 'latches to fix the sockets to the printed circuit board; and, 'a test unit includingan unloading unit to unload the substrates and the sockets from the test unit.2. The handler as claimed in claim 1 , wherein the test unit further comprises a mount guide including:a docking plate on the printed circuit board, the docking plate exposing a part of the printed circuit board, andsocket housings in the docking plate, the socket housings to fix the sockets, the latches being on the socket housings.3. The handler as claimed in claim 2 , wherein the latches include:latch plates extended from the docking plate toward the sockets inside the socket housings; andcylinders to move the latch plates from outside of the sockets toward a top portion of the sockets along the docking plate.4. The handler as claimed in claim 3 , wherein the sockets include:sheet sockets connected to the printed circuit board; andsocket inserts surrounding the sheet sockets, guide pins of the socket housings being inserted into edges of the socket inserts to align the sheet sockets on the printed circuit board.5. The handler as claimed in claim 3 , wherein the latches are on a back surface of the docking plate.6. The handler as claimed in claim 3 , wherein the latch plates are on two sides of the socket housings claim 3 , respectively claim 3 , the latch plates being coupled to the sockets when coming close to each other claim 3 , and decoupled from the sockets when going away ...

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Номер записи: 79
23-03-2017 дата публикации

TEST CAP FOR A CABLE

Номер: US20170082655A1
Автор: Rosenberg Avigdor
Принадлежит: Biosense Webster (Israel) Ltd.

An electronic device includes a housing, which is sized and shaped to fit snugly over a connector containing first electrical contacts at an end of a cable. The electronic device further includes second electrical contacts within the housing and test circuitry. The second electrical contacts are configured and positioned to mate with the first electrical contacts when the housing is fitted over the connector. The test circuitry is contained within the housing and coupled to the second electrical contacts and configured to test a functionality of the cable. 1. An electronic device , comprising:a housing, which is sized and shaped to fit snugly over a connector at an end of a cable, the connector containing first electrical contacts;second electrical contacts within the housing, which are configured and positioned to mate with the first electrical contacts when the housing is fitted over the connector; andtest circuitry, which is contained within the housing and coupled to the second electrical contacts and configured to test a functionality of the cable.2. The electronic device according to claim 1 , wherein the electronic device comprises a mechanical interface for attaching the housing to the connector.3. The electronic device according to claim 1 , wherein the electronic device is built as part of the connector.4. The electronic device according to claim 1 , wherein the test circuitry is configured to receive electrical power from an internal battery.5. The electronic device according to claim 1 , wherein the electronic device is configured to connect claim 1 , via the cable claim 1 , to an electronic system at an opposite end of the cable claim 1 , when the housing is fitted over the connector.6. The electronic device according to claim 5 , wherein the test circuitry is configured to receive electrical power from the electronic system via the cable.7. The electronic device according to claim 5 , wherein the electronic device is configured to test a functionality ...

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Номер записи: 80
31-03-2022 дата публикации

CABLE HARNESS AND ASSET INDICATOR DEVICE FOR A DATA COMMUNICATION SENSING AND MONITORING SYSTEM

Номер: US20220099704A1
Автор: Wu Shuguang
Принадлежит:

A sensor cable harness for coupling one or more sensors to at least one electrical asset of a power grid, comprises at least one sensor to sense a condition of the at least one electrical asset. At least one signal cable is configured to carry a sensor data signal from the at least one sensor to an electrical analytics unit (EAU). An asset indicator device is provided to at least temporarily couple to the at least one signal cable to indicate the at least one electrical asset being sensed by an assigned port of the EAU. 1. A sensor cable harness for coupling one or more sensors to at least one electrical asset of a power grid , comprising:at least one sensor to sense a condition of the at least one electrical asset;at least one signal cable configured to carry a sensor data signal from the at least one sensor to an electrical analytics unit (EAU);an asset indicator device at least temporarily coupled to the at least one signal cable to indicate the at least one electrical asset being sensed by an assigned port of the EAU.2. The sensor cable harness of claim 1 , further comprising a memory storage device.3. The sensor cable harness of claim 2 , wherein the asset indicator device is integrated in the sensor cable harness.4. The sensor cable harness of claim 2 , wherein the asset indicator device is a removable device that communicates an asset position to the memory storage device.5. The sensor cable harness of claim 1 , comprising multiple sensors for sensing the condition of multiple electrical assets or multiple portions of a single electrical asset.6. The sensor cable harness of claim 1 , wherein the at least one electrical asset is located underground.7. The sensor cable harness of claim 1 , wherein the EAU is located underground.8. The sensor cable harness of claim 1 , wherein the electrical asset comprises one of a power line claim 1 , a cable accessory claim 1 , a transformer claim 1 , a switch gear claim 1 , and a circuit.9. The sensor cable harness of claim ...

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Номер записи: 81
31-03-2022 дата публикации

Current transducer with magnetic field detector module

Номер: US20220099708A1
Автор: Arnaud Labbe, David SERON, Gerard Lepine
Принадлежит: LEM INTERNATIONAL SA

An electrical current transducer including a magnetic core and a magnetic field detector module, the magnetic core and magnetic field detector module each forming a single unit separably mountable around a primary conductor and to a circuit board, the magnetic core having a general U shape including an end branch and lateral branches extending the end branch to respective free ends, the magnetic field detector module being positioned between the lateral branches and extending across a whole width of a gap formed between the lateral branches. The magnetic field detector module includes at least one magnetic field sensing cell, a pair of magnetic concentrators arranged in mirror opposition forming a magnetic field gap therebetween in which the at least one sensing cell is positioned, and an insulating body supporting the magnetic concentrators and at least one sensing cell.

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Номер записи: 82
31-03-2022 дата публикации

CONDUCTION INSPECTION JIG, AND INSPECTION METHOD OF PRINTED WIRING BOARD

Номер: US20220099727A1
Автор: Mori Takayuki, TAKEDA Taishi
Принадлежит: IBIDEN CO., LTD.

A conduction inspection jig includes a first member having first openings, a second member having second openings and formed to be positioned above the first member, a third member formed to be positioned between the first member and the second member such that the third member forms a space between the first member and the second member and at least substantially surrounds the space, and a probe formed to pass through one of the first openings and one of the second openings such that the probe extends through the space formed between the first member and the second member. 1. A conduction inspection jig , comprising:a first member having a plurality of first openings;a second member having a plurality of second openings and configured to be positioned above the first member;a third member configured to be positioned between the first member and the second member such that the third member forms a space between the first member and the second member and at least substantially surrounds the space; anda probe configured to pass through one of the first openings and one of the second openings such that the probe extends through the space formed between the first member and the second member.2. The conduction inspection jig according to claim 1 , wherein third member is configured to be positioned between the first member and the second member such that the third member completely surrounds by the space between the first member and the second member.3. The conduction inspection jig according to claim 1 , wherein the third member has a frame shape.4. The conduction inspection jig according to claim 1 , wherein the third member comprises a plurality of members.5. The conduction inspection jig according to claim 4 , wherein the plurality of members of the third member includes a fourth member and a fifth member.6. The conduction inspection jig according to claim 5 , wherein the fifth member is configured to be laminated on the fourth member such that the fourth member is ...

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Номер записи: 83
12-03-2020 дата публикации

TEST JIG FOR TESTING ELECTRICAL CHARACTERISTICS OF SEMICONDUCTOR PRODUCT

Номер: US20200081055A1
Автор: Ikeda Daisuke
Принадлежит: Mitsubishi Electric Corporation

A test jig for testing electrical characteristics of a semiconductor product includes a conductive ground block for supporting the semiconductor product thereon; a substrate provided on the ground block, and having a first and a second substrate electrodes formed on the substrate for the respective electrodes to be in contact with leads of the semiconductor; and lead pressers for pressing the leads against the first and the second substrate electrodes, respectively, so that electrical connection is established between the respective leads and the first and the second substrate electrodes in testing the semiconductor product. 2. The test jig for testing electrical characteristics of a semiconductor product claim 1 , of claim 1 , wherein the lead pressers each have a spring-supported conductive pressing electrode changeable in position.3. The test jig for testing electrical characteristics of a semiconductor product claim 1 , of claim 1 , wherein the lead pressers each have a spring-supported conductive pressing electrode changeable in position and have a dielectric enclosure internally provided to the lead pressers claim 1 , for covering the pressing electrodes.4. The test jig for testing electrical characteristics of a semiconductor product claim 2 , of claim 2 , wherein the ground block is provided movably in the thickness direction of the substrate claim 2 , and the lead pressers each press a whole length from top to root of the leads in the longitudinal direction of the substrate claim 2 , to test the electrical characteristics of the semiconductor product.5. The test jig for testing electrical characteristics of a semiconductor product claim 3 , of claim 3 , wherein the ground block is provided movably in the thickness direction of the substrate claim 3 , and the lead pressers each press a whole length from top to root of the leads in the longitudinal direction of the substrate claim 3 , to test the electrical characteristics of the semiconductor product.6. The ...

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Номер записи: 84
25-03-2021 дата публикации

COAXIAL SOCKET OF IMPEDANCE MATCHING STRUCTURE FOR SEMICONDUCTOR CHIP TESTING AND MANUFACTURING METHOD THEREOF

Номер: US20210088574A1
Автор: GAO Zongying, Liu Kai, SHI Yuanjun, YANG Zongmao, YIN Lanyong
Принадлежит:

The present invention relates to a coaxial socket of an impedance matching structure for semiconductor chip testing and a manufacturing method thereof. The coaxial socket includes a test socket locating substrate, a test socket body, a test socket cover, and a test probe. A polymer I and a polymer II are installed and fastened in the test socket body and the test socket cover respectively. A probe slot I and a probe slot II are provided in the polymer I and the polymer II respectively. The test probe is inserted through the probe slot I and the probe slot II. In the present invention, the test socket body and the test socket cover are made of conductive metal, and single-end impedance matching of 50 ohms or differential impedance matching of 100 ohms is performed between them and the probe, to achieve superb signal transmission and heat conduction. 1. A coaxial socket of an impedance matching structure for semiconductor chip testing , comprising a test socket locating substrate , a test socket body , a test socket cover , and a test probe , wherein the test socket locating substrate , the test socket body , and the test socket cover are sequentially disposed from top to bottom , a polymer slot I and a polymer slot II are provided in the test socket body and the test socket cover respectively , a polymer I and a polymer II are installed and fastened in the polymer slot I and the polymer slot II , a probe slot I and a probe slot II are provided in the polymer I and the polymer II respectively , the test probe is inserted through the probe slot I and the probe slot II , and a material of the test socket body and the test socket cover is metal.2. The coaxial socket of an impedance matching structure for semiconductor chip testing according to claim 1 , wherein both the test socket body and the test socket cover are installed on the test socket locating substrate by using fastening screws.3. The coaxial socket of an impedance matching structure for semiconductor chip ...

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Номер записи: 85
30-03-2017 дата публикации

ADJUSTABLE TOOLING

Номер: US20170089949A1
Автор: Buss Eric, Falk Phillip, Migia George Santiago
Принадлежит:

An adjustable tool configured to facilitate mounting an electromechanical device relative to a tester is contemplated. The adjustable tool may be operable to facilitate adjustably mounting a belt tensioner, pulley or other rotating element of the electromechanical device relative to a belt drive or other rotatable testing element included on the tester in a manner sufficient to enable adjusting tensioning and/or positioning therebetween. 1. A tool for adjustably mounting an object to a fixture , the tool comprising:a tine shaped to support the object;a bolt affixed to the tine having a plurality of engagement elements spaced apart along a bolt body;a nut configured to be selectively retained at a plurality of positions along the bolt body corresponding with one or more of the plurality of engagement elements; anda base configured to secure the nut to the fixture such that movement of the nut between the plurality of positions correspondingly adjusts mounting of the bolt relative to the fixture and in turn the object supported on the tine, thereby adjustably mounting the object to the fixture.2. The tool of wherein the plurality of engagement elements are spaced apart along an axial length of the bolt body claim 1 , the axial length being greater than a width of the nut such that the nut can be positioned at a middle position and moved therefrom toward at least a forward position and a rearward position claim 1 , each of the middle claim 1 , forward and rearward positions being a corresponding one of the plurality of positions.3. The tool of wherein the base is immovable affixed to the nut such that an offset measured along the axial length of the bolt body between the tine and the fixture increases when the nut moves from the middle position toward the forward position and decreases when the nut moves from the middle position toward the rearward position.4. The tool of wherein a first distal end of the bolt includes a head having an outer diameter larger than both ...

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Номер записи: 86
09-04-2015 дата публикации

TESTING DEVICE AND TESTING METHOD THEREOF

Номер: US20150097570A1
Автор: CHEN Daching, Hsu Heng-Iang, HU Shih-Hsiang, KAO Shu-Hua, SHEN Yi-Chung, SU Meng-Kai
Принадлежит: ALIFECOM TECHNOLOGY, CORP.

A testing device and a testing method are provided. The testing device includes a connecting module and a processor electrically connected to the connecting module. The connecting module is electrically coupled with a plurality of communication devices under tests (DUTs) synchronously. The processor determines a schedule for the communication DUTs and tests the communication DUTs according to the schedule. The testing method is applied to the testing device to implement the aforesaid operations. 1. A testing device , comprising:a connecting module, electrically coupled with a plurality of communication devices under test (DUTs) synchronously; anda processor, electrically connected with the connecting module and configured to determine a schedule for the communication DUTs and alternately test the communication DUTs according to the schedule.2. The testing device as claimed in claim 1 , wherein the schedule is a time domain schedule claim 1 , and the processor is further configured to:assign at least one sub-frame to each of the communication DUTs in a time interval according to the time domain schedule; andtest the corresponding communication DUT in each of the sub-frames.3. The testing device as claimed in claim 2 , wherein the processor tests each of the communication DUTs in the time interval according to testing characteristics.4. The testing device as claimed in claim 2 , wherein the processor tests each of the communication DUTs in the time interval according to testing items.5. The testing device as claimed in claim 2 , wherein the processor tests each of the communication DUTs in the time interval according to testing characteristics and testing items.6. The testing device as claimed in claim 1 , wherein the schedule is a frequency domain schedule claim 1 , and the processor is further configured to:assign at least one resource block to each of the communication DUTs in a frequency interval according to the frequency domain schedule; andtest the ...

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Номер записи: 87
09-04-2015 дата публикации

Electrical Connection Via Fastener Hole

Номер: US20150097590A1
Автор: Bondurant Phillip D., Bothell David, MACTUTIS Anthony, Nino Giovanni, Rook David W.
Принадлежит:

The systems, apparatus, and methods disclosed herein provide access to systems located within a closed structure, such that the systems are traditionally difficult for humans to access. Exemplary structures include an engine compartment, airplane wing, or fuselage. This access allows a system located within the structure to be electrically coupled with an electrical I/O device located outside the structure. Access to a system located within the closed structure is provided by way of a hole. 1. An electrical connection plug sized and configured to mate with , and thereby form an electrical connection with , one or more electrodes disposed within an interior space of a closed structure by way of insertion through a hole in the closed structure configured to retain a fastener.2. The plug of claim 1 , wherein the fastener is selected from the group consisting of a bolt claim 1 , a rivet claim 1 , a screw claim 1 , an insert claim 1 , a pin claim 1 , a pipe plug claim 1 , a bit claim 1 , an anchor claim 1 , an insert claim 1 , a threaded rod claim 1 , a pin fastener claim 1 , a blind fastener claim 1 , a threaded fastener claim 1 , studs claim 1 , retaining rings claim 1 , and special-purpose fasteners.3. The plug of claim 1 , wherein the one or more electrodes are coupled to a sensor network or excitation device located inside the closed structure.4. The plug of claim 1 , wherein the plug is sized and configured to be anchored when mated with the one or more electrodes.5. The plug of claim 1 , wherein the plug is configured to electrically couple the one or more electrodes to an electronic I/O device.6. The plug of claim 5 , wherein the plug is further configured to pass one or more driving signals from the electronic I/O device through the one or more electrodes to a sensor network comprising at least a first transducer and a second transducer claim 5 , defining a pair of transducers claim 5 , wherein the sensor network is located in the closed structure.7. The plug of ...

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Номер записи: 88
19-03-2020 дата публикации

Probe card testing device and testing device

Номер: US20200088764A1
Автор: Kai-Chieh Hsieh, Wen-Tsung Lee
Принадлежит: Chunghwa Precision Test Technology Co Ltd

A probe card testing device includes a testing circuit board, a signal transmission board, an electrical connecting module, and a probe head. The testing circuit board has metal pads spaced apart from each other. The signal transmission board has internal pads arranged on a bottom surface thereof and spaced apart from each other. The electrical connecting module includes a spacer having thru-holes and elastic arms positioned on the spacer. The spacer is sandwiched between the testing circuit board and the signal transmission board. The metal pads respectively face the internal pads through the thru-holes. A part of each elastic arm is arranged in one of the thru-holes, and is detachably compressed by one of the metal pads and the corresponding internal pad so as to be elastically deformed to establish an electrical transmission path. The probe head is disposed on a top surface of the signal transmission board.

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Номер записи: 89
19-03-2020 дата публикации

PARASITIC EMULATOR FOR TESTING LIGHTING AND ELECTRIC BRAKE CIRCUITS ON TRAVEL AND FIFTH-WHEEL TRAILERS

Номер: US20200088777A1
Автор: Eaton Joseph Clair, Marshall Jay William
Принадлежит:

A compact and lightweight emulator is provided for parasitic testing individual lighting circuits and the electric brake circuit of travel trailers and fifth-wheel trailers, which are equipped with an on-board rechargeable battery. The emulator is equipped with a flasher circuit that, when activated, flashes the stop/turn lights on the trailer simultaneously in an emergency flasher mode. The emulator includes a housing, which incorporates a 7-blade receptacle for a trailer electrical plug, a digital voltmeter, a circuit selector switch, a keyed ON-OFF switch, which selectively sends power from the trailer battery to device circuitry, and a pair of external terminals, which can be connected to leads from an electrical charger in order to recharge the trailer's on-board battery. 1. A parasitic emulator for testing electrical circuits on a trailer having a 7-way electrical connector plug and an onboard electro-chemical battery having both positive and ground terminals , said parasitic emulator comprising:a housing;a seven-way RV-type connector socket mounted on an exterior surface of the housing into which mates with the 7-way electrical connector plug of the trailer, said mating of the connector plug with the connector socket providing both a positive connection and a ground connection to the trailer battery; anda selector switch mounted on an exterior surface of the housing, which receives battery power from one of seven terminals in the 7-way electrical connector socket, and which can selectively provide power to other terminals in the 7-way electrical connector socket associated with various electrical circuits on the trailer so that each of those circuits can be tested for functionality when the connector plug is inserted into the connector socket.2. The parasitic emulator of claim 1 , which further comprises a voltmeter mounted on an exterior surface of the housing claim 1 , which provides a readout of trailer battery voltage.3. The parasitic emulator of claim 1 ...

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Номер записи: 90
19-03-2020 дата публикации

PROBE CARD INSPECTION WAFER, PROBE CARD INSPECTION SYSTEM, AND METHOD OF INSPECTING PROBE CARD

Номер: US20200088827A1
Автор: Ji Joon-su, JUNG JIN-WOO, Kim Dany, Nam Han-jik
Принадлежит:

A probe card inspection wafer includes a base wafer and first and second probe card inspection chips on the base wafer and apart from each other, wherein each of the first and second probe card inspection chips located on the base wafer is divided into a probe vertical-level inspection region, a probe horizontal-position inspection region, and contact inspection regions, wherein the first and second probe card inspection chips include first pad arrays located on the probe vertical-level inspection region and configured for inspecting vertical levels of first and second alternating-current (AC) probes of a probe card to be inspected, and second pad arrays located on the probe vertical-level inspection region and configured for inspecting vertical levels of first and second VSS probes of the probe card to be inspected. 1. A probe card inspection system comprising:a base wafer; andfirst and second probe card inspection chips on the base wafer and spaced apart from each other,wherein each of the first and second probe card inspection chips located on the base wafer is divided into a probe vertical-level inspection region, a probe horizontal-position inspection region, and contact inspection regions,wherein the first and second probe card inspection chips comprise:first pad arrays on the probe vertical-level inspection region, the first pad arrays being configured for inspecting vertical levels of first and second alternating-current AC probes of a probe card to be inspected; andsecond pad arrays on the probe vertical-level inspection region, the second pad arrays being configured for inspecting vertical levels of first and second VSS probes of the probe card to be inspected.2. The probe card inspection system of claim 1 , wherein the first and second probe card inspection chips are substantially identical to each other.3. The probe card inspection system of claim 1 , wherein each of the first and second AC probes and the first and second VSS probes does not comprise a ...

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Номер записи: 91
01-04-2021 дата публикации

TRANSFORMER AND SOCKET ASSEMBLY FOR POWER METER INSTALLATIONS

Номер: US20210096163A1
Автор: ASHFORD ROBERT, May Greg
Принадлежит:

An electric meter circuit assembly is disclosed which can be used as a conversion kit or in a meter installation generally. The circuit assembly includes an electric meter adapter that has a wiring harness, a meter socket adapter having a socket face adapted to receive a plug-in meter, the meter socket adapter including a plurality of meter connections exposed at the socket face; a current transformer subassembly including a plurality of current transformers, each current transformer being associated with a phase of the multi-phase electrical service, each current transformer of the plurality of current transformers being electrically connected between a meter connection of the plurality of meter connections and a phase of the multi-phase electrical service. The circuit assembly further includes a voltage transformer subassembly electrically connected between phases of the multi-phase electrical service and electrical connections in a connector adapted to be connected to the wiring harness. 1. An electric meter conversion kit comprising: a wiring harness exposing a plurality of electrical connection sets, each electrical connection set including a plurality of electrical connections associated with each phase of a multi-phase electrical service;', 'a meter socket adapter having a socket face adapted to receive a plug-in meter, the meter socket adapter including a plurality of meter connections exposed at the socket face;', 'a current transformer subassembly including a plurality of current transformers, each current transformer being electrically connected between a phase of the multi-phase electrical service and a meter connection of the plurality of meter connections; and, 'an electric meter adapter comprisinga voltage transformer subassembly including a plurality of voltage transformers and a connector, each voltage transformer being electrically connected between a phase of the multi-phase electrical service and an electrical connection of the plurality of ...

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Номер записи: 92
05-04-2018 дата публикации

TEST FIXTURE

Номер: US20180095109A1
Автор: Arena John Joseph, Suto Anthony J., Toscano John P., Wrinn Joseph Francis
Принадлежит:

An example test fixture, which interfaces a tester and a unit under test (UUT), includes the following: first electrical contacts that face the tester; second electrical contacts that face the UUT; a substrate made of sections of printed first material, with the first material being electrically non-conductive, and with the substrate being between the first electrical contacts and the second electrical contacts; and structures through the substrate, with the structures including sections of second material, with the second material being electrically conductive, and with at least one of the structures electrically connecting a first electrical contact and a second electrical contact. 1. A test fixture for interfacing a tester and a unit under test (UUT) , the test fixture comprising:first electrical contacts that face the tester;second electrical contacts that face the UUT;a substrate comprised of sections of printed first material, the first material being electrically non-conductive, the substrate being between the first electrical contacts and the second electrical contacts; andstructures through the substrate, the structures comprising sections of second material, the second material being electrically conductive, at least one of the structures electrically connecting a first electrical contact and a second electrical contact.2. The test fixture of claim 1 , wherein at least one of the structures within the substrate has a section that is non-vertical and non-horizontal relative to upper and lower surfaces of the substrate.3. The test fixture of claim 1 , wherein the first material surrounds claim 1 , and is in contact with claim 1 , at least part of the first electrical contacts.4. The test fixture of claim 1 , further comprising:a base plate holding the second electrical contacts, the sections of printed first material being on the base plate, the base plate comprising at least parts that are electrically non-conductive.5. The test fixture of claim 1 , wherein ...

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Номер записи: 93
05-04-2018 дата публикации

ELECTRICAL CONNECTOR FOR UNTERMINATED CABLES

Номер: US20180097296A1
Автор: Brillhart Theodore J., Hittel John Paul
Принадлежит:

An electrical connector is provided. The electrical connector includes two or more electrically conductive prongs. Each electrically conductive prong may have a tapered distal end operable to axially contact a conductor of a cable when a force is applied to axially push the cable onto the two or more electrically conductive prongs. Each electrically conductive prong may have a proximal end operable to be electrically coupled to a respective connector conductor. 1. An electrical connector , comprising:an insulating base; andtwo or more electrically conductive prongs mounted on the insulating base, each electrically conductive prong having a tapered distal end operable to axially contact a conductor of a cable when a force is applied to axially push the cable onto the two or more electrically conductive prongs, and each electrically conductive prong having a proximal end operable to be electrically coupled to a respective connector conductor.2. The electrical connector of claim 1 , comprising:a guiding and protective wall extending axially from the insulating base and forming a bore through which the two or more electrically conductive prongs axially extend.3. The electrical connector of claim 2 , wherein the insulating base and the guiding and protective wall are one integrated piece.4. The electrical connector of claim 2 , wherein the guiding and protective wall is operable to guide the cable to the two or more electrically conductive prongs such that when the force is applied to axially push the cable claim 2 , the two or more electrically conductive prongs axially contact at least two conductors of the cable.5. The electrical connector of claim 1 , wherein the insulating base has two or more apertures claim 1 , and the two or more electrically conductive prongs respectively extend at least partially through the two or more apertures.6. The electrical connector of claim 1 , wherein the respective connector conductor of each conductive prong is coupled to a testing ...

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Номер записи: 94
14-04-2016 дата публикации

ELECTRICAL TERMINAL TEST POINT AND METHODS OF USE

Номер: US20160103151A1
Автор: Walcher James W.
Принадлежит:

Described herein are embodiments of an electrical terminal test point that can be temporarily attached to an electrical terminal (e.g., terminal block) in order to provide an interface between the test leads/jumpers of a test device and the electrical contact points of the electrical terminal. In one aspect, embodiments of the electrical terminal test point provide a shield for the electrical contact points of the electrical terminal (whether or not being used for testing) from inadvertent contact and prevents test leads/jumpers of test device from accidentally falling of or being knocked off of their contact points. Electrical terminal test point can be installed and removed without affecting the electrical connections made by electrical terminal (e.g., without removing terminal screws of electrical terminal). 1. An electrical terminal test point comprising:a conducting mechanism configured to provide an electrical connection to a contact point, wherein the electrical connection is established and removed from the contact point without disrupting electrical continuity through the contact point; andan attachment mechanism separate from the conducting mechanism, said attachment mechanism configured to maintain the electrical connection between the conducting mechanism and the contact point.2. The electrical terminal test point of claim 1 , wherein the conducting mechanism further comprises:a first portion configured to provide a connection point for one or more test leads of a test device; anda second portion attached to the first portion, said second portion configured to apply pressure to the contact point.3. The electrical terminal test point of claim 2 , wherein the first portion of the conducting mechanism is at least partially insulated and the second portion of the conducting mechanism is at least partially not insulated.4. The electrical terminal test point of claim 2 , wherein at least the second portion of the conducting mechanism is spring-loaded.5. The ...

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Номер записи: 95
14-04-2016 дата публикации

Cable assembly

Номер: US20160104956A1
Автор: Jon Reiner HOFFMAN, Robert Marine SANTOS, Travis Scott Ellis, William Chieng OUYANG
Принадлежит: Samtec Inc

A connector includes a connector body including a hole, a contact disposed in the hole and arranged such that, when the connector is connected to a substrate, the contact is connected to a corresponding electrical pad on the substrate, a conductive elastomeric interface arranged such that, when the connector is connected to the substrate, the conductive elastomeric interface is between the connector body and the substrate, and a cable connected to the contact. The contact includes a ground ferrule and a locking ferrule arranged to mate with the hole, and the hole of the connector body and the locking ferrule are at least partially threaded. When the connector is connected to the substrate and when the locking ferrule is threaded with the hole, the ground ferrule contacts at least one of the conductive elastomeric interface and the upper surface of the substrate.

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Номер записи: 96
12-04-2018 дата публикации

Implementing user configurable probing using magnetic connections and pcb features

Номер: US20180100888A1
Автор: John R. Dangler, Layne A. Berge, Manuel Orozco, Matthew S. Doyle, Thomas W. Liang
Принадлежит: International Business Machines Corp

A method and system are provided for implementing user configurable probing with magnetic connections and printed circuit board (PCB) features. A first magnet is located at a desired probe point on the PCB, a probe having a second magnet of suitable polarity and an electrical contact is moved to the probe point. The first and second magnets attract each other, and the probe point makes electrical contact with an electrical conductor at the probe point.

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Номер записи: 97
26-03-2020 дата публикации

INSPECTION APPARATUS AND INSPECTION METHOD

Номер: US20200096561A1
Автор: FUJIHARA Jun
Принадлежит:

An inspection apparatus includes: a stage on which an inspection target is mounted; a temperature adjustment mechanism configured to adjust a temperature of the stage; an inspecting part configured to exchange electrical signals for an electrical characteristics inspection with the inspection target; a probe card having terminals in contact with the inspection target; an intermediate connection member having connectors electrically connecting the inspecting part and the probe card; a position adjustment mechanism configured to adjust a relative position between the stage and the probe card; a temperature measurement member configured to measure a temperature of the intermediate connection member; a preliminary temperature adjusting part configured to adjust a temperature of the probe card prior to the electrical characteristics inspection; and a determining part configured to determine whether or not the temperature of the probe card is stabilized, based on the temperature of the intermediate connection member. 1. An inspection apparatus for inspecting an inspection target , the apparatus comprising:a stage on which the inspection target is mounted;a temperature adjustment mechanism installed in the stage and configured to adjust a temperature of the stage;an inspecting part configured to exchange electrical signals for an electrical characteristics inspection with the inspection target;a probe card having terminals in contact with the inspection target during the electrical characteristics inspection;an intermediate connection member having connectors electrically connecting the inspecting part and the probe card, the intermediate connection member being located between the inspecting part and the probe card;a position adjustment mechanism configured to adjust a relative position between the stage and the probe card;a temperature measurement member installed in the intermediate connection member and configured to measure a temperature of the intermediate connection ...

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Номер записи: 98
23-04-2015 дата публикации

CONNECTOR

Номер: US20150109014A1
Автор: Kobayashi Mitsuru, Sato Koki, Tanaka Tetsugaku
Принадлежит:

A connector includes a connector case and probe pins that are arranged two-dimensionally in the connector case. Each of the probe pins includes a housing, a first contact terminal disposed at one end of the housing, a second contact terminal disposed at another end of the housing, and plural bent parts formed in the housing and protruding outward from a surface of the housing. The connector case includes through holes. Each of the through holes accommodates the probe pin and includes grooves that are formed in its inner surface and correspond to the bent parts. The grooves of each through hole face substantially the same directions as the grooves of other through holes. 1. A connector , comprising:a connector case; andprobe pins that are arranged two-dimensionally in the connector case, whereineach of the probe pins includes a housing, a first contact terminal disposed at one end of the housing, a second contact terminal disposed at another end of the housing, and plural bent parts formed in the housing and protruding outward from a surface of the housing;the connector case includes through holes formed therein, each of the through holes accommodating the probe pin and including grooves formed in an inner surface thereof, and each of the grooves corresponding to the bent part; andthe grooves of each through hole face substantially same directions as the grooves of other through holes.2. The connector as claimed in claim 1 , wherein the grooves of each through hole face other through holes that are closest to the through hole.3. The connector as claimed in claim 1 , wherein the grooves of each through hole face other through holes that are second closest to the through hole.4. A connector claim 1 , comprising:a connector case; andprobe pins that are arranged two-dimensionally in the connector case, whereineach of the probe pins includes a housing, a first contact terminal disposed at one end of the housing, a second contact terminal disposed at another end of the ...

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Номер записи: 99
08-04-2021 дата публикации

PLACEMENT STAND AND ELECTRONIC DEVICE INSPECTING APPARATUS

Номер: US20210102991A1
Автор: FUJISAWA Yoshinori, Kasai Shigeru
Принадлежит:

Provided is an electronic device inspection apparatus that suppresses cost increase. A prober is provided with a stage on which a carrier or a wafer is placed. The stage is provided with a stage cover on which the carrier is placed, a cooling unit in contact with the stage cover, and an LED irradiation unit facing the carrier across the stage cover and the cooling unit. Each of the stage cover and the cooling unit is formed of light-transmitting material. A light-transmitting coolant flows in a coolant flow path in the cooling unit. The LED irradiation unit has a plurality of LEDs oriented to the carrier. The carrier is formed of a glass substrate having a substantially disk-like shape. A plurality of electronic devices is arranged on a surface of the carrier at predetermined intervals. 113-. (canceled)14. A placement stand comprising:a cooling mechanism on which an inspection object is placed; anda light irradiation mechanism disposed to face the inspection object across from the cooling mechanism,wherein the cooling mechanism is formed of light-transmitting material, and a coolant transmitting light flows in the cooling mechanism,wherein the light irradiation mechanism includes a plurality of LEDs oriented to the inspection object, andwherein irradiation and non-irradiation of the plurality of LEDs is partially controlled to irradiate light to an arbitrary location in the inspection object such that the arbitrary location in the inspection object is heated while the entirety of the inspection object is cooled by the cooling mechanism.15. The placement stand of claim 14 , wherein the inspection object is formed of a glass substrate on which a plurality of electronic devices is disposed.16. The placement stand of claim 14 , wherein the inspection object is formed of a semiconductor wafer on which a plurality of electronic devices is formed.17. The placement stand of claim 14 , wherein the light-transmitting material includes polycarbonate claim 14 , quartz claim 14 ...

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Номер записи: 100