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Небесная энциклопедия

Космические корабли и станции, автоматические КА и методы их проектирования, бортовые комплексы управления, системы и средства жизнеобеспечения, особенности технологии производства ракетно-космических систем

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Применить Всего найдено 3. Отображено 3.
21-05-2015 дата публикации

BACKLIGHT MODULE AND METHOD FOR DETECTING ELECTROSTATIC DAMAGE THEREOF

Номер: US20150137709A1
Принадлежит:

A backlight module is disclosed. The backlight module comprises a circuit board, at least one light source disposed on the circuit board, and a positive probe-point and a negative probe-point, both provided on the circuit board. The positive and negative probe-points are electrically connected to the light source, and the positive probe-point and the negative probe-point are electrically connected with a current dividing element so that the light source is connected in parallel with the current dividing element. The positive probe-point and the negative probe-point are also collectively configured to detect an electrostatic damage of the backlight module. 1. A backlight module , comprising:a circuit board;at least one light source disposed on the circuit board; anda positive probe-point and a negative probe-point, both provided on the circuit board and electrically connected to the light source, wherein the positive probe-point and the negative probe-point are electrically connected with a current dividing element so that the light source is connected in parallel with the current dividing element, and wherein the positive probe-point and the negative probe-point are collectively configured to detect an electrostatic damage of the backlight module.2. The backlight module of claim 1 , wherein the backlight module is separate from the current dividing element.3. The backlight module of claim 2 , wherein the current dividing element comprises:at least one first resistor;at least one positive probe; andat least one negative probe,wherein the first resistor is electrically connected with both the positive probe and the negative probe.4. The backlight module of claim 3 , wherein the positive probe is connected to the positive probe-point and the negative probe is connected to the negative probe-point so that the first resistor is connected in parallel with the light source to detect the electrostatic damage of the backlight module.5. The backlight module of claim 3 , ...

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21-05-2015 дата публикации

Backlight module and method for detecting its electrostatic damage

Номер: DE102014205441A1

Die vorliegende Erfindung offenbart ein Hintergrundbeleuchtungsmodul und ein Verfahren zum Erfassen von dessen elektrostatischer Beschädigung, und das Hintergrundbeleuchtungsmodul umfasst: eine Leiterplatte; zumindest eine Lichtquelle, die auf der Leiterplatte angeordnet ist; und zumindest einen positiven Prüfkopfpunkt und zumindest einen negativen Prüfkopfpunkt, die beide auf der Leiterplatte bereitgestellt und elektrisch mit der Lichtquelle verbunden sind; wobei der positive Prüfkopfpunkt und der negative Prüfkopfpunkt elektrisch mit einem Stromteilungselement verbunden sind, so dass die Lichtquelle parallel mit dem Stromteilungselement verbunden ist, um eine elektrostatische Beschädigung des Hintergrundbeleuchtungsmoduls zu erfassen. Das Hintergrundbeleuchtungsmodul kann die Erfassung für die elektrostatische Beschädigung der LED unter der Niedrigstrombedingung sogar nachdem das Hintergrundbeleuchtungsmodul in das Flüssigkristallanzeigemodul montiert ist erreichen.

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25-10-2016 дата публикации

Backlight module and method for detecting electrostatic damage thereof

Номер: US09477115B2

A backlight module is disclosed. The backlight module comprises a circuit board, at least one light source disposed on the circuit board, and a positive probe-point and a negative probe-point, both provided on the circuit board. The positive and negative probe-points are electrically connected to the light source, and the positive probe-point and the negative probe-point are electrically connected with a current dividing element so that the light source is connected in parallel with the current dividing element. The positive probe-point and the negative probe-point are also collectively configured to detect an electrostatic damage of the backlight module.

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