Deterioration analysis method

Provided is a deterioration analysis method which can analyze the state of deterioration of a polymeric material, particularly the state of deterioration of the surface of the polymeric material, in detail. The present invention relates to a deterioration analysis method which can analyze the state of deterioration of a polymer by irradiating a polymeric material with high-brightness X-ray and measuring the amount of the absorbed X-ray while changing the energy of the X-ray.

ТРЕЙЛЕРНАЯ СИСТЕМА ДЛЯ ИНСПЕКТИРОВАНИЯ ТРАНСПОРТНЫХ СРЕДСТВ И СИСТЕМА КОНТРОЛЯ ДЛЯ НЕЕ

FIELD: transport. ^ SUBSTANCE: invention relates to vehicle inspection. Proposed system comprise trailer carrying vehicle to be inspected, rotary base mechanism (12) mounted on trailer upper surface and drive mechanism to turn base plate to trailer upper surface. Drive mechanism comprises coupler (13) and actuator that comprises anti-shock shaft. Actuator end face is coupled with coupler end face to control coupler in actuator activation. X-ray control system comprises accelerator, detector, display, scanner, data processing system and trailer system for vehicle inspection. ^ EFFECT: higher reliability. ^ 20 cl, 4 dwg РОССИЙСКАЯ ФЕДЕРАЦИЯ (19) RU (11) 2 385 250 (13) C2 (51) МПК B62D B60S B61D G01N 65/18 (2006.01) 13/00 (2006.01) 15/00 (2006.01) 23/04 (2006.01) ФЕДЕРАЛЬНАЯ СЛУЖБА ПО ИНТЕЛЛЕКТУАЛЬНОЙ СОБСТВЕННОСТИ, ПАТЕНТАМ И ТОВАРНЫМ ЗНАКАМ (12) ОПИСАНИЕ ИЗОБРЕТЕНИЯ К ПАТЕНТУ (21), (22) Заявка: 2008112110/11, 11.10.2007 (24) Дата начала отсчета срока действия патента: 11.10.2007 (73) Патентообладатель(и): Нуктэч Компани Лимитед (CN) (43) Дата публикации заявки: 20.11.2009 2 3 8 5 2 5 0 (45) Опубликовано: 27.03.2010 Бюл. № 9 (56) Список документов, цитированных в отчете о поиске: CN 1607122 А, 20.04.2005. CN 1607135 A, 20.04.2005. CN 1500685 A, 02.06.2004. US 6542580 В1, 01.04.2003. RU 2091774 C1, 27.09.1997. 2 3 8 5 2 5 0 R U (86) Заявка PCT: CN 2007/002924 (11.10.2007) C 2 C 2 (85) Дата перевода заявки PCT на национальную фазу: 12.05.2008 (87) Публикация PCT: WO 2008/052412 (08.05.2008) Адрес для переписки: 119296, Москва, а/я 98, пат.пов. Л.Г.Багяну (54) ТРЕЙЛЕРНАЯ СИСТЕМА ДЛЯ ИНСПЕКТИРОВАНИЯ ТРАНСПОРТНЫХ СРЕДСТВ И СИСТЕМА КОНТРОЛЯ ДЛЯ НЕЕ (57) Реферат: Изобретение относится к средствам перемещения транспортных средств при их досмотре. Трейлерная система для досмотра транспортных средств включает трейлер, содержащий корпус, несущий инспектируемое транспортное средство, механизм поворотной плиты (12), расположенный на верхней поверхности трейлера для упора торцом в ...

Mesh holder for serial crystallography

The invention provides a device for immobilizing and shipping crystals and for data collection via serial crystallography, the device having a first planar substrate defining a first transversely extending aperture, wherein the first substrate has a first laterally facing surface; a second planar substrate defining a second transversely extending aperture coaxial with the first aperture, wherein the second substrate has a second laterally facing surface; a third planar substrate and a fourth planar substrate positioned between the first and second substrates such that the first planar substrate, the second planar substrate, the third planar substrate and the fourth planar substrate are parallel; and a means for reversibly applying axial pressure to the first and second laterally facing surfaces so as to compress the third and fourth substrates together.

Method and system for high speed detection of diamonds

This invention relates to a method of or system for detecting presence of diamond in an object. The method comprises receiving classification data associated with photons emitted from object as a result of positron annihilation due to irradiation of the object with photons of a predetermined energy at which giant dipole resonance (GDR) occurs due to a nuclear reaction between the photons and carbon. The method then comprises the step of determining whether or not the object is potentially a diamond or diamondiferous by processing the received classification data with a trained machine-based learning classifier. The system typically implements the method described herein.

CROSSLINKED FLUOROPOLYMER RESIN AND CONTROL METHOD FOR SAME

A crosslinked fluoropolymer resin is configured to include a measuring step of irradiating a surface of the crosslinked fluoropolymer resin with a laser to measure a Raman spectrum, and an acceptance or rejection decision step of determining an acceptance or a rejection of a quality of a measurement region irradiated with the laser, on the basis of an intensity of a fluorescence spectrum relative to an intensity of a Raman scattering peak, which is ascribed to a CF2 stretching vibration, in the measured Raman spectrum.

ТРЕЙЛЕРНАЯ СИСТЕМА ДЛЯ ИНСПЕКТИРОВАНИЯ ТРАНСПОРТНЫХ СРЕДСТВ И СИСТЕМА КОНТРОЛЯ ДЛЯ НЕЕ

... 1. Трейлерная система для досмотра транспортных средств, включающая: ! трейлер, содержащий корпус, несущий инспектируемое транспортное средство; ! механизм (2) поворотной плиты, способной вращаться и расположенной на верхней поверхности трейлера для упора торцом в колеса инспектируемого транспортного средства, останавливающегося на трейлере; и ! приводной механизм для вращения механизма (2) поворотной плиты, установленный на трейлере для поворота механизма (2) поворотной плиты к верхней поверхности трейлера. ! 2. Трейлерная система для досмотра транспортных средств согласно п.1, в которой корпус трейлера содержит раму (1). ! 3. Трейлерная система для досмотра транспортных средств согласно п.1 или 2, в которой трейлерная система также включает вспомогательную тележку, расположенную напротив трейлера в направлении движения транспортного средства. ! 4. Трейлерная система для досмотра транспортных средств согласно п.3, в которой приводной механизм для вращения механизма поворотной плиты, включает ...

Method and apparatus for discriminating resin

A resin discriminating apparatus includes an X-ray tube which emits X-rays, an X-ray detector which detects X-rays emitted from a sample irradiated with X-rays, a data processing section which creates a spectrum on the basis of a detection signal obtained by the X-ray detector, a peak extraction section which extracts a spectral line due to Compton scattering and a spectral line due to Rayleigh scattering derived from a target element of the X-ray tube on the spectrum, and obtains a peak intensity, and a discrimination section which calculates a scattering intensity ratio which is a ratio of the Rayleigh scattering intensity to the Compton scattering intensity and discriminates the type of resin contained in the sample from the scattering intensity ratio.

Nondestructive inspection method and apparatus comprising a neutron source and a gamma-ray detection device for determining a depth of a target component in an inspection target

A nondestructive inspection apparatus makes a neutron beam incident on an inspection target, detects a specific gamma ray deriving from a target component in the inspection target, among gamma rays generated by the neutron beam, and determines a depth at which the target component exists, based on a result of the detecting. The nondestructive inspection apparatus includes a neutron source that emits a neutron beam to a surface of the inspection target, a gamma ray detection device that detects, as detection intensities, intensities of a plurality of types of specific gamma rays whose energy differs from each other, and a ratio calculation unit that determines a ratio between the detection intensities of a plurality of types of the specific gamma rays.

METHOD AND SYSTEM FOR HIGH SPEED DETECTION OF DIAMONDS

This invention relates to a method of or system for detecting presence of diamond in an object. The method comprises receiving classification data associated with photons emitted from object as a result of positron annihilation due to irradiation of the object with photons of a predetermined energy at which giant dipole resonance (GDR) occurs due to a nuclear reaction between the photons and carbon. The method then comprises the step of determining whether or not the object is potentially a diamond or diamondiferous by processing the received classification data with a trained machine-based learning classifier. The system typically implements the method described herein.

Access control system and method thereof

The present invention relates to an access control system, an access object and a method for access control. The access control system comprises an access request receiving device being configured and operable for receiving an access object; the access request receiving device comprising an emitter configured and operable for irradiating the access object with a radiation having a wavelength in the range of about 10"12 and 10"9 m and a detector configured and operable for detecting a response signal from the irradiated access object; a control circuit being configured and operable to receive the response signal from the access request receiving device and process the response signal to identify spectral features indicative of an XRF signature of the access object; wherein the control circuit is adapted to generate an unlocking signal for switching a module device between a locked state and an unlocked state upon identification of the XRF signature.

DETERIORATION ANALYSIS METHOD

Provided is a deterioration analysis method which can analyze the state of deterioration of a polymeric material, particularly the state of deterioration of the surface of the polymeric material, in detail. The present invention relates to a deterioration analysis method which can analyze the state of deterioration of a polymer by irradiating a polymeric material with high-brightness X-ray and measuring the amount of the absorbed X-ray while changing the energy of the X-ray.

Device, system and method for X-ray diffraction analysis of an electrode of an electrochemical cell, at operating temperature and under current

A device keeps an electrochemical cell under current and at operating temperature during an X-ray beam diffraction analysis of a first electrode, the cell comprising a solid electrolyte interposed between the electrodes. The device comprises: first and second interconnectors having contact faces contacting the electrodes, which allow a gas flow and exchange between the interconnectors and the electrodes. The contact face of the first interconnector allows an X-ray beam to pass to the first electrode. A thermal and atmospheric containment chamber has an inner cavity housing a stack formed from the cell between the interconnectors and a cover closing the cavity, provided with a window allowing X-rays to pass through, the first interconnector being intended to be arranged facing the cover. The contact face of each interconnector is a slotted element; slotted portions of the slotted element are uniformly arranged and form 30% to 80% of the element's surface area.

다결정 실리콘 봉의 표면 온도의 산출 방법 및 제어 방법, 다결정 실리콘 봉의 제조 방법, 다결정 실리콘 봉, 및 다결정 실리콘 괴

... 본 발명에서는, 제 1 회절 차트와 제 2 회절 차트로부터, 회전 각도(φ)에 대한 평균 회절 강도비(y=(h1, k1, l1)/(h2, k2, l2))를 구하고, 이 평균 회절 강도비에 기초해서, 석출 시의 표면 온도를 산출한다. 그리고, 산출된 다결정 실리콘 봉의 표면 온도와 해당 다결정 실리콘 봉의 석출 시의 공급 전류와 인가 전압의 데이터에 기초하여, 다결정 실리콘 봉을 새로이 제조할 때의 공급 전류와 인가 전압을 제어해서, 석출 프로세스 중의 표면 온도를 제어한다. 이와 같은 온도 제어 방법을 이용하는 것에 의해, 석출 프로세스 중에 있어서의 다결정 실리콘 봉의 중심 온도 Tc와 표면 온도 Ts의 차 ΔT(=Tc-Ts)를 제어해서, 다결정 실리콘 봉 중의 잔류 응력값을 제어하는 것도 가능하다.

SINGLE-SHOT METHOD FOR EDGE ILLUMINATION X-RAY PHASE-CONTRAST TOMOGRAPHY

A method and systems of reconstructing a complex-valued X-ray refractive index distribution of an object having undergone X-ray phase-contrast tomography. The method includes acquiring at least one X-ray image of an object using an edge illumination X-ray phase-contrast tomography (EIXPCT) model, discretizing the model, jointly reconstructing the complex-valued refractive index distribution of the object using penalized least squares estimation of real and imaginary parts of the distribution, and solving the penalized least squares estimation using a batch gradient algorithm. 1. A method of reconstructing a complex-valued X-ray refractive index distribution of an object having undergone X-ray phase-contrast tomography , the method comprising:acquiring at least one X-ray image of an object using an edge illumination X-ray phase-contrast tomography (EIXPCT) model derived from a 2-dimensional Radon transform, the at least one X-ray image including differential phase information discretizing the EIXPCT model;jointly reconstructing the complex-valued refractive index distribution of the object using penalized least squares estimation of real and imaginary parts of the complex-valued refractive index distribution; andsolving the penalized least squares estimation using a batch gradient algorithm.2. The method of further comprising reconstructing the image of the object for viewing by a subject.3. The method of claim 1 , wherein the at least one X-ray image is acquired from a plurality of view angles.4. The method of claim 3 , wherein acquiring the at least one X-ray image comprises utilizing varying aperture offset values over the plurality of view angles.5. The method of claim 1 , wherein solving the penalized least squares estimation using a batch gradient algorithm comprises:calibrating an illumination curve;retrieving measured X-ray intensity data from a memory;initializing the penalized least squares estimation of estimation of the real and imaginary parts of the ...

IN-SITU CELL FOR BATTERY ANALYSIS TECHNIQUE OF X-RAY TRANSMISSION TYPE

The present invention relates to an in-situ cell for a battery analysis technique of an X-ray transmission type, capable of measuring a change of a material in a battery such as a change in an electrode structure or the like during a battery charging and discharging process in real time based on an X-ray transmitted to the battery; and is also capable of enabling a user to perform this measurement using a small-scale X-ray equipment used in a general laboratory or the like. According to an embodiment of the present invention, the in-situ cell comprises: a case having a first light-transmitting slit formed on both sides around an accommodated battery; and a space disk pressing the battery on an inner side of the case to form a second light-transmitting slit, wherein an overlapping area between two light-transmitting slits including the first light-transmitting slit and the second light-transmitting slit may exist an overlapping area, and the first light-transmitting slit and the second transmission ...

Crosslinked fluoropolymer resin and control method for same

A crosslinked fluoropolymer resin is configured to include a measuring step of irradiating a surface of the crosslinked fluoropolymer resin with a laser to measure a Raman spectrum, and an acceptance or rejection decision step of determining an acceptance or a rejection of a quality of a measurement region irradiated with the laser, on the basis of an intensity of a fluorescence spectrum relative to an intensity of a Raman scattering peak, which is ascribed to a CF2stretching vibration, in the measured Raman spectrum.

X-ray inspection method and X-ray inspection device

Access control system and method thereof

Dual-energy detection apparatus and method thereof

The present disclosure provides a dual-energy detection apparatus and method. The dual-energy detection apparatus includes an X-ray source configured to send a first X-ray beam to an object to be measured; a scintillation detector configured to work in an integration mode, and receive a second X-ray beam penetrating through the object to be measured to generate a first electrical signal; a Cherenkov detector configured to be located behind the scintillation detector, work in a counting mode, and receive a third X-ray beam penetrating through the scintillation detector to generate a second electrical signal; and a processor configured to output image, thickness and material information of the object to be measured according to the first electrical signal and the second electrical signal. The dual-energy detection method provided by the present disclosure may acquire an image of the object to be measured that is clearer and contains more information.

Small angle x-ray scattering methods for characterizing the iron core of iron carbohydrate colloid drug products

The present disclosure introduces methods for characterizing iron core carbohydrate colloid drug products, such as iron sucrose drug products. Disclosed methods enable the characterization of the iron core size of the iron core nanoparticles in iron carbohydrates as they exist in the formulation in solution, such as e.g. iron sucrose drug products, and more particularly, the average particle diameter size and size distribution(s) of the iron core nanoparticles. The disclosed methods apply small-angle X-ray scattering (SAXS) in parallel beam transmission geometry, with a sample mounted inside a capillary and centered in the X-ray beam, to iron carbohydrates, such as iron sucrose, in solution without the need to modify the sample, such as to remove unbound carbohydrates, dilute, or dry the sample, to accurately characterize the average iron core particle diameter size of the iron core nanoparticles. An example application of the disclosed method is to perform SAXS measurements under identical ...

METHOD AND SYSTEM FOR HIGH SPEED DETECTION OF DIAMONDS

THIS INVENTION relates to a method of or system for detecting presence of diamond in an object. The method comprises receiving classification data associated with photons emitted from object as a result of positron annihilation due to irradiation of the object with photons of a predetermined energy at which giant dipole resonance (GDR) occurs due to a nuclear reaction between the photons and carbon. The method then comprises the step of determining whether or not the object is potentially a diamond or diamondiferous by processing the received classification data with a trained machine-based learning classifier. The system typically implements the method described herein. 120-. (canceled)21. A method of detecting presence of diamond in an object , the method comprising:receiving classification data associated with photons emitted from object as a result of positron annihilation due to irradiation of the object with photons of a predetermined energy at which giant dipole resonance (GDR) occurs due to a nuclear reaction between the photons and carbon, wherein the photons emitted are detected by a suitable detector arrangement; anddetermining whether or not the object is potentially a diamond or diamondiferous by processing the received classification data with a trained machine-based learning classifier, wherein the trained machine-based learning classifier is trained at least with computer simulated classification data from a computer implemented simulator which simulates at least diamonds or diamondiferous objects.22. The method of claim 21 , wherein the computer implemented simulator is configured to simulate diamonds or diamondiferous objects and barren objects; and wherein the computer implemented simulator is configured to simulate photon emissions from the simulated objects as a result of simulated positron annihilation due to simulated irradiation of the simulated objects with photons of a predetermined energy at which giant dipole resonance (GDR) occurs due to ...

NONDESTRUCTIVE INSPECTION METHOD AND APPARATUS

A nondestructive inspection apparatus makes a neutron beam incident on an inspection target, detects a specific gamma ray deriving from a target component in the inspection target, among gamma rays generated by the neutron beam, and determines a depth at which the target component exists, based on a result of the detecting. The nondestructive inspection apparatus includes a neutron source that emits a neutron beam to a surface of the inspection target, a gamma ray detection device that detects, as detection intensities, intensities of a plurality of types of specific gamma rays whose energy differs from each other, and a ratio calculation unit that determines a ratio between the detection intensities of a plurality of types of the specific gamma rays. 1. A nondestructive inspection apparatus for emitting , to an inspection target , a neutron beam including at least fast neutrons , detecting and identifying a specific gamma ray generated due to the neutron beam , and determining a depth at which the target component exists , based on a result of the detecting , the nondestructive inspection apparatus comprising:a neutron source that emits the neutron beam to a surface of the inspection target;a gamma ray detection device that detects, as detection intensities, intensities of a plurality of types of specific gamma rays whose energy differs from each other; anda ratio calculation unit that determines a ratio between the detection intensities of the plurality of types of specific gamma rays.2. The nondestructive inspection apparatus according to claim 1 , comprising:a data storage unit that stores depth data representing a relation between a depth at which the target component exists in the inspection target and a ratio between detection intensities of the plurality of specific gamma rays; anda depth detection unit that determines a depth at which the target component exists, based on the depth data and the ratio calculated by the ratio calculation unit.3. The ...

METHOD OF ANALYZING DOMAIN STRUCTURE OF DIELECTRIC MATERIAL

The present invention relates to a method of analyzing a voluntary nanopolarization domain of a dielectric material. According to the present invention, the method of analyzing polarization domain of the dielectric material comprises: a step of obtaining an image using a convergent beam electron diffraction (CBED) technology to scan an area of analyzing an object to be analyzed; a step of categorizing a different domain structure via image symmetry analysis; a step of outputting a polarization direction based on a certain categorized domain structure and a mirror surface of a crystal; and a step of visually mapping the polarization direction from a certain crystal surface. COPYRIGHT KIPO 2017 ...

Single-shot method for edge illumination X-ray phase-contrast tomography

A method and systems of reconstructing a complex-valued X-ray refractive index distribution of an object having undergone X-ray phase-contrast tomography. The method includes acquiring at least one X-ray image of an object using an edge illumination X-ray phase-contrast tomography (EIXPCT) model, discretizing the model, jointly reconstructing the complex-valued refractive index distribution of the object using penalized least squares estimation of real and imaginary parts of the distribution, and solving the penalized least squares estimation using a batch gradient algorithm.

X-RAY INSPECTION DEVICE OF REPLACEMENT TYPE MODULE STRUCTURE

The present invention relates to an X-ray inspection device of a replacement type module structure and, more specifically, relates to the X-ray inspection device of a replacement type module structure which has a structure which can be separated from a main body by being manufactured in a module structure and be applied to a distribution method of various structures by corresponding to different types of product inspection. The X-ray inspection device comprises: an inspection main body (11) enabling a subject (D) of a blood test to be inspected by having an X-ray tube (112) and a detector (111); a transfer module (13) connected to the inspection main body (11), and transferring the subject (D) of the blood test in the inspection main body (11); and shielding curtain modules (12a, 12b) installed in a front or a rear of the inspection main body (11). The transfer module (13) continuously transfers the subject of the blood test, and the shielding curtain modules (12a, 12b) can be separated ...

METHODS AND APPARATUS FOR MEASURING FASTENER CONCENTRICITY

Systems and methods inspect a fastener installed at least partially through a hole in a part, by measuring fastener concentricity, measuring fastener flushness with a surface, and/or detecting foreign object debris near the fastener. Systems include an x-ray imaging system, a first camera device, a second camera device, a first support structure, and at least one processing unit. The first camera device produces a first image of the fastener from a first vantage point, and the second camera device produces a second image of the fastener from a second vantage point, such that a 3D image of the fastener can be created from the first image and the second image. The system inspects the fastener based on the x-ray image and/or the 3D image, to determine concentricity and/or flushness of the fastener. Systems may be automated and mounted on robot arms to be positioned relative to the fasteners being inspected.

Deterioration analysis method

The present invention provides deterioration analysis method which allows a detailed analysis of deterioration, especially deterioration of surface conditions, of a polymer material. The present invention relates to a deterioration analysis method, including irradiating a polymer material with high intensity X-rays, and measuring X-ray absorption while varying the energy of the X-rays, to analyze deterioration of the polymer.

QUANTITATIVE ANALYSIS METHOD OF CARBON BASED HYBRID NEGATIVE ELECTRODE

A method of quantitatively analyzing a carbon based hybrid negative electrode including the steps of preparing a secondary battery including a carbon based hybrid negative electrode, where the carbon based hybrid negative electrode comprises a carbon based negative electrode active material and a non-carbon based negative electrode active material, measuring a lattice d-spacing of the carbon based negative electrode active material in the carbon based hybrid negative electrode during charging/discharging of the secondary battery using an X-ray diffractometer and then plotting a graph of a change in lattice d-spacing value as a function of charge/discharge capacity, detecting an inflection point of a slope of the graph during discharging; and then, quantifying capacity contribution of the carbon based negative electrode active material and the non-carbon based negative electrode active material in the total discharge capacity of the secondary battery by the inflection point of the slope ...

DETERIORATION ANALYSIS METHOD

Schleppsystem zum Prüfen von Fahrzeugen und Prüfsystem mit diesem

Schleppsystem zum Prüfen eines Fahrzeugs, mit: einem Schlepper mit einer Fahrzeugkarosserie, wobei der Schlepper ein zu prüfendes Fahrzeug trägt; einem Wendeplattenmechanismus, der drehbar auf einer Oberseite des Schleppers vorgesehen ist, zum Stoßen gegen Räder des zu prüfenden Fahrzeugs, das auf dem Schlepper anhält; und einem an dem Schlepper vorgesehenen Wendeplatten-Drehantriebsmechanismus zum Antreiben der Wendeplatte so, dass sie sich zu der Oberseite des Schleppers dreht.

X-RAY INSPECTION METHOD AND X-RAY INSPECTION DEVICE

Detection can be performed even for a thick inspection target object through time delay integration without degradation of spatial resolution. There is provided an X-ray inspection device configured to include: an X-ray source that generates X-rays; a transport unit that performs transporting a sample; a detecting unit that has a time delay integration type detector which detects X-rays generated by the X-ray source and transmitted through the sample transported by the transport unit; and a defect determining unit that processes a signal obtained by detecting the X-rays transmitted through the sample by the time delay integration type detector of the detecting unit and determines a defect in the sample. The transport unit performs transporting the sample while causing the sample to rotate in synchronization with the transporting when the sample passes in front of the time delay integration type detector of the detecting unit. 1. An X-ray inspection device comprising:an X-ray source that generates X-rays;a transport unit that performs transporting a sample;a detecting unit that has a time delay integration type detector which detects X-rays generated by the X-ray source and transmitted through the sample transported by the transport unit; anda defect determining unit that processes a signal obtained by detecting the X-rays transmitted through the sample by the time delay integration type detector of the detecting unit and determines a defect in the sample,wherein the transport unit performs transporting the sample while causing the sample to rotate in synchronization with the transporting when the sample passes in front of the time delay integration type detector of the detecting unit.2. The X-ray inspection device according to claim 1 ,wherein the transport unit performs transporting the sample while causing the sample to rotate around the central axis of the sample in synchronization with the transporting.3. The X-ray inspection device according to claim 1 ,wherein ...

NON-DESTRUCTIVE INSPECTION METHOD

The non-destructive inspection method includes: a water absorbing or drying step of changing a water-content state of a test piece; a transmission image capturing step of irradiating, with a radiation, the test piece absorbed water or dried for a predetermined time in the water absorbing or drying step and capturing a transmission image created by visualizing the radiation transmitted through the test piece; and an evaluation step of evaluating the test piece on the basis of the water-content state of the test piece determined from the transmission image captured in the transmission image capturing step.

INTELLIGENT SYSTEM FOR CONTROLLING OPERATIONAL PARAMETERS OF A SMELTING FURNACE

This application addresses an integrated smart system to control the variables involved in the process for melting mineral concentrates. Specifically, it addresses an integrated smart system that allows the whole melting process operation to be controlled, measuring the mineralogical quality and quantity of the concentrate that is injected into the melting furnace, as well as variables such as the temperature, the level of the liquid phases and the percentage of copper within the furnace. In this manner, by reading said variables, it acts autonomously on manipulated variables, considering uncertainties, allowing a stable temperature to be maintained in the reactor, allowing products to be obtained at the required quality and controlling the liquid phases therein, among other controlled variables, to achieve efficient melting.

METHOD OF PREPARING SAMPLE FOR CRYSTAL STRUCTURE ANALYSIS, METHOD OF DETERMINING ABSOLUTE CONFIGURATION OF CHIRAL COMPOUND, AND POLYNUCLEAR METAL COMPLEX MONOCRYSTAL

Method for preparing a crystal structure analysis sample for determining an absolute configuration of a chiral compound includes bringing a single crystal of a porous compound into contact with a solvent solution that contains a chiral compound, the single crystal of the porous compound including a three-dimensional framework, and either or both of pores and voids that are defined by the three-dimensional framework, and are three-dimensionally arranged in an ordered manner, the three-dimensional framework being formed by one molecular chain or two or more molecular chains, or formed by one molecular chain or two or more molecular chains, and a framework-forming compound, and comprising a chiral substituent of which the absolute configuration is known, the crystal structure analysis sample having a structure in which molecules of the chiral compound are arranged in either or both of the pores and the voids of the single crystal in an ordered manner. 1. A method for preparing a crystal structure analysis sample for determining an absolute configuration of a chiral compound , the method comprising bringing a single crystal of a porous compound into contact with a solvent solution that comprises a chiral compound for which the absolute configuration is to be determined , to prepare a crystal structure analysis sample , the single crystal of the porous compound comprising a three-dimensional framework , and either or both of pores and voids that are defined by the three-dimensional framework , and are three-dimensionally arranged in an ordered manner , the three-dimensional framework being formed by one molecular chain or two or more molecular chains , or formed by one molecular chain or two or more molecular chains , and a framework-forming compound , and comprising a chiral substituent of which the absolute configuration is known , the crystal structure analysis sample having a structure in which molecules of the chiral compound are arranged in either or both of the ...

MESH HOLDER FOR SERIAL CRYSTALLOGRAPHY

The invention provides a device for immobilizing and shipping crystals and for data collection via serial crystallography, the device having a first planar substrate defining a first transversely extending aperture, opening, wherein the first substrate has a first laterally facing surface; a second planar substrate defining a second transversely extending aperture coaxial with the first aperture, wherein the second substrate has a second laterally facing surface; a third planar substrate and a fourth planar substrate positioned between the first and second substrate such that the first planar substrate, the second planar substrate, the third planar substrate and the fourth planar substrate are parallel; and a means for reversibly applying axial pressure to the first and second laterally facing surfaces so as to compress the third and fourth substrates together. 1. A device for positioning crystals , the device comprising:a. a first planar substrate defining a first transversely extending aperture, opening, wherein the first substrate has a first laterally facing surface;b. a second planar substrate defining a second transversely extending aperture coaxial with the first aperture, wherein the second substrate has a second laterally facing surface;c. a third planar substrate and a fourth planar substrate positioned between the first and second substrate such that the first planar substrate, the second planar substrate, the third planar substrate and the fourth planar substrate are parallel; andd. a means for reversibly applying axial pressure to the first and second laterally facing surfaces so as to compress the third and fourth substrates together.2. The device as recited in wherein either the third substrate or the fourth substrate defines a plurality of cells adapted to receive the crystals.3. The device as recited in further comprising a fifth planar substrate positioned between the third and fourth substrate claim 1 , wherein the fifth planar substrate is ...

X-ray fluorescence analysis method, X-ray fluorescence analysis program, and X-ray fluorescence spectrometer

An X-ray fluorescence analysis method according to an FP method uses a predefined theoretical intensity formula in a standard sample theoretical intensity calculation step for obtaining a sensitivity constant and in an unknown sample theoretical intensity calculation step during iterative calculation. In the formula, only in an absorption term relating to absorption of X-rays, a mass fraction of each component is normalized so that a sum of the mass fractions of all components becomes 1.

DETERIORATION ANALYSIS METHOD

The present invention provides deterioration analysis method which allows a detailed analysis of deterioration, especially deterioration of surface conditions, of a polymer material. The present invention relates to a deterioration analysis method, including irradiating a polymer material with high intensity X-rays, and measuring X-ray absorption while varying the energy of the X-rays, to analyze deterioration of the polymer. 1. A deterioration analysis method , comprising:irradiating a polymer material with high intensity X-rays, and measuring X-ray absorption while varying the energy of the X-rays, to analyze deterioration of the polymer,wherein the polymer material is a rubber material containing at least one diene rubber, or a composite material combining the rubber material and at least one resin,an energy range scanned with the high intensity X-rays is 4000 eV or less,the deterioration analysis method comprises:performing waveform separation of an X-ray absorption spectrum at the oxygen K-shell absorption edge obtained by scanning over a range of high intensity X-ray energies of 500 to 600 eV; and [{'br': None, '[peak area of oxygen deterioration]/[(peak area of ozone deterioration)+(peak area of oxygen deterioration)]×100=contribution rate (%) of oxygen deterioration,'}, {'br': None, 'and'}, {'br': None, '[peak area of ozone deterioration]/[(peak area of ozone deterioration)+(peak area of oxygen deterioration)]×100=contribution rate (%) of ozone deterioration. \u2003\u2003(Equation 3)'}], 'calculating contribution rates of oxygen deterioration and ozone deterioration using Equation 3 below, wherein the oxygen deterioration corresponds to a peak on the low energy side with a peak top energy in the range of 532 to 532.7 eV, and the ozone deterioration corresponds to a peak on the high energy side with a peak top energy in the range of 532.7 to 534 eV2. The deterioration analysis method according to claim 1 ,wherein peak intensities are used instead of the peak ...

DETERIORATION ANALYSIS METHOD

The present invention provides deterioration analysis method which allows a detailed analysis of deterioration, especially deterioration of surface conditions, of a polymer material. The present invention relates to a deterioration analysis method, including irradiating a polymer material with high intensity X-rays, and measuring X-ray absorption while varying the energy of the X-rays, to analyze deterioration of the polymer. 1. A deterioration analysis method , comprisingirradiating a polymer material with high intensity X-rays, and measuring X-ray absorption while varying the energy of the X-rays, to analyze deterioration of the polymer,wherein the polymer material is a rubber material containing at least one diene rubber, or a composite material combining the rubber material and at least one resin,an energy range scanned with the high intensity X-rays is 4000 eV or less, [{'br': None, 'i': X', 'K, '[total area of -ray absorption spectrum at carbon -shell absorption edge]×γ=1, and \u2003\u2003(Equation 4)'}, {'br': None, 'i': 'K', '[peak area of oxygen -shell absorption edge]×γ=amount (index) of oxygen and ozone bonded. \u2003\u2003(Equation 5)'}], 'the deterioration analysis method comprises: determining a normalization constant y using Equation 4 below based on an X-ray absorption spectrum at the carbon K-shell absorption edge after deterioration; and correcting a total peak area of the oxygen K-shell absorption edge with the normalization constant y based on Equation 5 below to determine the amount of oxygen and ozone bonded to the polymer material2. The deterioration analysis method according to claim 1 ,{'sup': 7', '10', '2', '2, 'wherein the high intensity X-rays have a number of photons of 10(photons/s) or more and a brilliance of 10(photons/s/mrad/mm/0.1% bw) or more.'} This application is a Divisional of co-pending U.S. patent application Ser. No. 15/462,403 filed on Mar. 17, 2017, which is a Divisional of U.S. patent application Ser. No. 13/881,158 filed ...

METHOD OF ANALYZING STRUCTURE OF RESIN MATERIAL

A structure analysis method includes impregnating a resin material with a radiosensitizer. The resin material contains thermoplastic resin. The radiosensitizer contains a solvent and a radiosensitizing molecule that contains, as a heavy element, an element with an atomic number equal to or greater than that of fluorine. A relative energy difference (RED) represented by R/Ris 1.8 or less in a case where Ris the interaction radius of the thermoplastic resin in a Hansen space and Ris a distance between the Hansen solubility parameters of the thermoplastic resin and the solvent. 1. A method of analyzing a structure of a resin material using radiation , the method comprising:impregnating the resin material with a radiosensitizer,the resin material containing thermoplastic resin, andthe radiosensitizer containing a solvent and a radiosensitizing molecule that contains, as a heavy element, an element with an atomic number equal to or greater than that of fluorine, and{'sub': 1', 'a1', '01', '01', 'a1, 'a relative energy difference (RED) represented by R/Rbeing 1.8 or less in a case where Ris an interaction radius of the thermoplastic resin in a Hansen space and Ris a distance between Hansen solubility parameters of the thermoplastic resin and the solvent.'}2. The method of claim 1 , wherein{'sub': '1', 'the relative energy difference (RED) between the thermoplastic resin and the solvent is 0.4 or less.'}3. The method of claim 1 , wherein{'sub': 2', 'a2', '02', '02', 'a2, 'a relative energy difference (RED) represented by R/Ris 1.0 or less in a case where Ris an interaction radius of the radiosensitizing molecule in the Hansen space and Ris a distance between the Hansen solubility parameters of the radiosensitizing molecule and the solvent.'}4. The method of claim 1 , whereinthe resin material is impregnated with the radiosensitizer set to a temperature equal to or higher than a glass transition point of the resin material.5. The method of claim 1 , whereinthe heavy element ...

DEGREE-OF-CRYSTALLINITY MEASUREMENT APPARATUS, DEGREE-OF-CRYSTALLINITY MEASUREMENT METHOD, AND INFORMATION STORAGE MEDIUM

Provided is a degree-of-crystallinity measurement apparatus including: an X-ray scattering pattern acquisition module which acquires an X-ray scattering pattern of a sample including a crystalline portion and an amorphous portion of a target substance; a pattern decomposition module which acquires a diffraction pattern of the crystalline portion and a continuous pattern from the X-ray scattering pattern; a target substance intensity calculation module which calculates an integrated intensity of the target substance based on the X-ray scattering pattern and chemical formula information of the target substance; a target substance pattern calculation module which calculates, from the continuous pattern, a scattering pattern of the target substance including the crystalline portion and the amorphous portion; a structural disorder parameter determination module which determines a structural disorder parameter of the crystalline portion based on the diffraction pattern of the crystalline portion ...

Sulfate corrosion-resistant concrete and method thereof for optimizing proportion and application

Disclosed is a sulfate corrosion-resistant concrete, a method for optimizing proportion and application thereof. The concrete is formed by mixing and stirring base stocks, aggregates, admixtures, external additives and water. The base stock of the concrete is 17.4-17.5 parts of Portland cement; the aggregates include 38.9 parts of basalt with aggregate size of 5-10 mm and 33.1-33.2 parts of basalt medium sand; the admixtures are 1.9-1.95 parts of silica fume or fly ash, and further including 0.23-0.24 part of polycarboxylate water reducer and 1.34-1.35 part of sulfate corrosion-resistant liquid preservative. Optimized proportion method: according to the corrosion characteristics of sulfate and corrosion environment parameters, determine the composition and proportion of basic samples and comparison samples, make and cure sample components, test the deep components of the samples, and obtain the optimal composition and proportion according to the test results.

DUAL-ENERGY DETECTION APPARATUS AND METHOD THEREOF

The present disclosure provides a dual-energy detection apparatus and method. The dual-energy detection apparatus includes an X-ray source configured to send a first X-ray beam to an object to be measured; a scintillation detector configured to work in an integration mode, and receive a second X-ray beam penetrating through the object to be measured to generate a first electrical signal; a Cherenkov detector configured to be located behind the scintillation detector, work in a counting mode, and receive a third X-ray beam penetrating through the scintillation detector to generate a second electrical signal; and a processor configured to output image, thickness and material information of the object to be measured according to the first electrical signal and the second electrical signal. The dual-energy detection method provided by the present disclosure may acquire an image of the object to be measured that is clearer and contains more information.

Degree-of-crystallinity measurement apparatus, degree-of-crystallinity measurement method, and information storage medium

A measured pattern acquisition unit acquires a measured X-ray scattering pattern of a sample containing a target substance and another known mixed substance. A known pattern acquisition unit acquires a known X-ray scattering pattern of the other known mixed substance. A crystalline pattern acquisition unit at least partially acquires an X-ray diffraction pattern of a crystalline portion included in the target substance. A crystalline integrated intensity calculation unit calculates an integrated intensity for the acquired X-ray diffraction pattern of the crystalline portion. A target substance integrated intensity calculation unit calculates an integrated intensity for an X-ray scattering pattern of the target substance. A degree-of-crystallinity calculation unit calculates a degree of crystallinity of the target substance based on the integrated intensity for the X-ray diffraction pattern of the crystalline portion and the integrated intensity for the X-ray scattering pattern of the target ...

Trace detection method of heavy metals and application thereof

The invention belongs to the technical field of trace detection, and discloses a heavy metal trace detection method and application thereof. The detection method; comprising the following steps: preparing a quality sample; mixing the quality sample with the sample to be tested according to a specific proportion; using X-ray fluorescence spectrometer to detect trace heavy metals; and using standard curve to realize quantitative analysis of heavy metals. For the purpose of detecting heavy metal elements in tea, the application of this invention can shorten the detection time, avoid the use of a large amount of acid liquor, improve the environmental protection performance, and lower the detection cost, moreover, the obtained standard curve by this invention has high correlation and accurate detection results.

METHOD FOR IDENTIFYING FOIL POSITION IN POWER STORAGE DEVICE AND METHOD FOR CALCULATING INTER-FOIL DISTANCE IN POWER STORAGE DEVICE

A method for identifying a foil position in a power storage device includes: analyzing the power storage device by X-ray CT analysis to obtain an X-ray absorbed amount at each position; acquiring an on-path X-ray absorbed amount at each on-path position on a specific imaginary line passing through an electrode sheet; and identifying a foil position of an electrode foil through which the specific imaginary line passes, based on the on-path X-ray absorbed amount. The foil position identifying includes fitting to determine an approximate curve that changes to fit a change in the on-path X-ray absorbed amount in a fitting region and generates a single peak in the fitting region, and estimating a foil position of a single electrode foil from the on-path position corresponding to the single peak of the determined approximate curve.

Method of preparing sample for crystal structure analysis, method of determining absolute configuration of chiral compound, and polynuclear metal complex monocrystal

Method for preparing a crystal structure analysis sample for determining an absolute configuration of a chiral compound includes bringing a single crystal of a porous compound into contact with a solvent solution that contains a chiral compound, the single crystal of the porous compound including a three-dimensional framework, and either or both of pores and voids that are defined by the three-dimensional framework, and are three-dimensionally arranged in an ordered manner, the three-dimensional framework being formed by one molecular chain or two or more molecular chains, or formed by one molecular chain or two or more molecular chains, and a framework-forming compound, and comprising a chiral substituent of which the absolute configuration is known, the crystal structure analysis sample having a structure in which molecules of the chiral compound are arranged in either or both of the pores and the voids of the single crystal in an ordered manner.

DEGREE-OF-CRYSTALLINITY MEASUREMENT APPARATUS, DEGREE-OF-CRYSTALLINITY MEASUREMENT METHOD, AND INFORMATION STORAGE MEDIUM

A measured pattern acquisition unit acquires a measured X-ray scattering pattern of a sample containing a target substance and another known mixed substance. A known pattern acquisition unit acquires a known X-ray scattering pattern of the other known mixed substance. A crystalline pattern acquisition unit at least partially acquires an X-ray diffraction pattern of a crystalline portion included in the target substance. A crystalline integrated intensity calculation unit calculates an integrated intensity for the acquired X-ray diffraction pattern of the crystalline portion. A target substance integrated intensity calculation unit calculates an integrated intensity for an X-ray scattering pattern of the target substance. A degree-of-crystallinity calculation unit calculates a degree of crystallinity of the target substance based on the integrated intensity for the X-ray diffraction pattern of the crystalline portion and the integrated intensity for the X-ray scattering pattern of the target ...

Surface temperature calculation method and control method for polycrystalline silicon rod, method for production of polycrystalline silicon rod, polycrystalline silicon rod, and polycrystalline silicon ingot

X-RAY FLUORESCENCE ANALYSIS METHOD, X-RAY FLUORESCENCE ANALYSIS PROGRAM, AND X-RAY FLUORESCENCE SPECTROMETER

An X-ray fluorescence analysis method according to an FP method uses a predefined theoretical intensity formula in a standard sample theoretical intensity calculation step for obtaining a sensitivity constant and in an unknown sample theoretical intensity calculation step during iterative calculation. In the formula, only in an absorption term relating to absorption of X-rays, a mass fraction of each component is normalized so that a sum of the mass fractions of all components becomes 1. 1. An X-ray fluorescence analysis method comprising:a standard sample measurement step of irradiating a standard sample, which contains elements or compounds as components and whose composition is known, with primary X-rays, and measuring an intensity of fluorescent X-rays generated from the component in the standard sample;a standard sample theoretical intensity calculation step of calculating a theoretical intensity of the fluorescent X-rays generated from the component in the standard sample, based on a mass fraction of the component in the standard sample, by using a predefined theoretical intensity formula;a sensitivity constant calculation step of calculating a sensitivity constant, based on the intensity measured in the standard sample measurement step and the theoretical intensity calculated in the standard sample theoretical intensity calculation step;an unknown sample measurement step of irradiating an unknown sample, which contains elements or compounds as components and whose composition is unknown, with the primary X-rays, and measuring an intensity of fluorescent X-rays generated from the component in the unknown sample;a conversion step of converting the intensity measured in the unknown sample measurement step into a theoretical intensity scale by using the sensitivity constant, to obtain a converted measured intensity;an initial value assumption step of assuming an initial value of an estimated mass fraction for the component in the unknown sample;an unknown sample ...

Deterioration analysis method

The present invention provides deterioration analysis method which allows a detailed analysis of deterioration, especially deterioration of surface conditions, of a polymer material. The present invention relates to a deterioration analysis method, including irradiating a polymer material with high intensity X-rays, and measuring X-ray absorption while varying the energy of the X-rays, to analyze deterioration of the polymer.

Access control system and method thereof

ACCESS CONTROL SYSTEM AND METHOD THEREOF

The present invention relates to an access control system, an access object and a method for access control. The access control system comprises an access request receiving device being configured and operable for receiving an access object; the access request receiving device comprising an emitter configured and operable for irradiating the access object with a radiation having a wavelength in the range of about 10″12 and 10″9 m and a detector configured and operable for detecting a response signal from the irradiated access object; a control circuit being configured and operable to receive the response signal from the access request receiving device and process the response signal to identify spectral features indicative of an XRF signature of the access object; wherein the control circuit is adapted to generate an unlocking signal for switching a module device between a locked state and an unlocked state upon identification of the XRF signature.

Trailer System for Inspecting Vehicles and Inspection System Having the Same

The present invention discloses a trailer system for inspecting a vehicle inspection, comprising: a trailer having a vehicle body, the trailer bearing a vehicle to be inspected; a turning plate mechanism rotatably provided on an upper surface of the trailer for abutting against wheels of the vehicle to be inspected halting on the trailer; and a turning plate rotation driving mechanism provided on the trailer for driving the turning plate to turn toward the upper surface of the trailer. The trailer system can trail vehicle with various loads passing through an inspection system such as a scanning passage, while bearing heavy load, maintaining the strength and rigidity thereof without damaging the vehicle to be inspected. In addition, the present invention further discloses a radiation imaging inspection system having the same.

SINGLE-SHOT METHOD FOR EDGE ILLUMINATION X-RAY PHASE-CONTRAST TOMOGRAPHY

A method and systems of reconstructing a complex-valued X-ray refractive index distribution of an object having undergone X-ray phase-contrast tomography. The method includes acquiring at least one X-ray image of an object using an edge illumination X-ray phase-contrast tomography (EIXPCT) model, discretizing the model, jointly reconstructing the complex-valued refractive index distribution of the object using penalized least squares estimation of real and imaginary parts of the distribution, and solving the penalized least squares estimation using a batch gradient algorithm.

Analysis apparatus interlocking in-situ x-ray diffraction and potentiostat and analyzing methods using the same

Provided is an in-situ X-ray analysis apparatus including a potentiostat connected to an in-situ electrochemical cell and configured to adjust voltage, current, and time of the in-situ electrochemical cell or to record information regarding voltage, current, resistance, capacity, and time information of the in-situ electrochemical cell; an X-ray analysis apparatus configured to obtain X-ray diffraction information regarding the in-situ electrochemical cell; and a controller connected to the X-ray analysis apparatus and the potentiostat and configured to provide or receive signals to or from the X-ray analysis apparatus and the potentiostat.

SURFACE TEMPERATURE CALCULATION METHOD AND CONTROL METHOD FOR POLYCRYSTALLINE SILICON ROD, METHOD FOR PRODUCTION OF POLYCRYSTALLINE SILICON ROD, POLYCRYSTALLINE SILICON ROD, AND POLYCRYSTALLINE SILICON INGOT

An average diffraction intensity ratio (y=(h, k, l)/(h, k, l)) for a rotation angle (φ) is obtained from a first diffraction chart and a second diffraction chart, and a surface temperature during deposition is calculated based on this average diffraction intensity ratio. Based on data on the surface temperature of a polycrystalline silicon rod calculated and supplied current and applied voltage during the deposition of the polycrystalline silicon rod, the supplied current and the applied voltage when newly manufacturing a polycrystalline silicon rod is controlled to control a surface temperature during the deposition process. By using such a temperature control method, it is also possible to control the difference ΔT (=T−T) between the center temperature Tand the surface temperature Tof a polycrystalline silicon rod during a deposition process to control the value of residual stress in the polycrystalline silicon rod. 1. A method for calculating a surface temperature of a polycrystalline silicon rod grown by a Siemens process , during a deposition process , comprising:taking a plate-shaped sample having a cross section perpendicular to a radial direction of the polycrystalline silicon rod as a major surface from a position corresponding to a radius R from a center line of a silicon core wire on which the polycrystalline silicon rod is deposited;disposing the plate-shaped sample at a position where Bragg reflection from a Miller index plane (h1, k1, l1) is detected, and in-plane-rotating the plate-shaped sample around a center of the plate-shaped sample as a rotation center at a rotation angle of φ so that an X-ray irradiation region determined by a slit φ-scans the major surface of the plate-shaped sample, thereby obtaining a first diffraction chart showing dependence of an intensity of Bragg reflection from the Miller index plane (h1, k1, l1) on the rotation angle (φ) of the plate-shaped sample;disposing the plate-shaped sample at a position where Bragg reflection ...

Deterioration analysis method

The present invention provides deterioration analysis method which allows a detailed analysis of deterioration, especially deterioration of surface conditions, of a polymer material. The present invention relates to a deterioration analysis method, including irradiating a polymer material with high intensity X-rays, and measuring X-ray absorption while varying the energy of the X-rays, to analyze deterioration of the polymer.

X-ray inspection method and X-ray inspection device

Detection can be performed even for a thick inspection target object through time delay integration without degradation of spatial resolution. There is provided an X-ray inspection device configured to include: an X-ray source that generates X-rays; a transport unit that performs transporting a sample; a detecting unit that has a time delay integration type detector which detects X-rays generated by the X-ray source and transmitted through the sample transported by the transport unit; and a defect determining unit that processes a signal obtained by detecting the X-rays transmitted through the sample by the time delay integration type detector of the detecting unit and determines a defect in the sample. The transport unit performs transporting the sample while causing the sample to rotate in synchronization with the transporting when the sample passes in front of the time delay integration type detector of the detecting unit.

Method and Apparatus for Discriminating Resin

A resin discriminating apparatus includes an X-ray tube which emits X-rays, an X-ray detector which detects X-rays emitted from a sample irradiated with X-rays, a data processing section which creates a spectrum on the basis of a detection signal obtained by the X-ray detector, a peak extraction section which extracts a spectral line due to Compton scattering and a spectral line due to Rayleigh scattering derived from a target element of the X-ray tube on the spectrum, and obtains a peak intensity, and a discrimination section which calculates a scattering intensity ratio which is a ratio of the Rayleigh scattering intensity to the Compton scattering intensity and discriminates the type of resin contained in the sample from the scattering intensity ratio. 1. A resin discriminating apparatus comprising:a) an X-ray source which emits X-rays;b) an X-ray detector which detects X-rays emitted from a sample irradiated with X-rays;c) a spectrum creating unit which creates a spectrum on the basis of a detection signal obtained by the X-ray detector;d) a scattering intensity ratio calculation unit which detects a spectral line due to Compton scattering and a spectral line due to Rayleigh scattering derived from a target element of the X-ray source on the spectrum, and calculates a scattering intensity ratio which is a ratio of the Rayleigh scattering intensity and the Compton scattering intensity; ande) a resin type discrimination unit which discriminates the type of resin contained in the sample from the scattering intensity ratio.2. The resin discriminating apparatus according to claim 1 , further comprising:a discrimination result display section which displays a result discriminated by the resin type discrimination unit.3. The resin discriminating apparatus according to claim 1 , further comprising:a storage section which stores a scattering intensity ratio previously obtained for a plurality of known resins,wherein the resin type discrimination unit discriminates the ...

Trailer system for inspecting vehicles and inspection system having the same

A trailer system for inspecting a vehicle inspection includes a trailer having a trailer body, the trailer bearing a vehicle to be inspected, a turning member rotatably provided on an upper surface of the trailer for abutting against wheels of the vehicle to be inspected that has halted on the trailer, and a turning plate rotation driving mechanism provided on the trailer for driving the turning plate to turn toward the upper surface of the trailer. The trailer system can trail the trailer with various loads passing through an inspection system such as a scanning passage, while bearing a heavy load, and maintaining the strength and rigidity thereof without damaging the vehicle to be inspected. A radiation imaging inspection system includes the trailer system.

Non-destructive inspection method

The non-destructive inspection method includes: a water absorbing or drying step of changing a water-content state of a test piece; a transmission image capturing step of irradiating, with a radiation, the test piece absorbed water or dried for a predetermined time in the water absorbing or drying step and capturing a transmission image created by visualizing the radiation transmitted through the test piece; and an evaluation step of evaluating the test piece on the basis of the water-content state of the test piece determined from the transmission image captured in the transmission image capturing step.

Mineralogical Analysis System of Copper Concentrate

This invention patent application addresses a system for the detection and quantification of mineralogical species via x-ray diffraction (XRD) of the concentrate of dry copper before it is injected into a converter or melting furnace. Specifically, it addresses a device that performs a mineralogical analysis, in line and in real time, of the concentrate of copper in the bath smelting furnace via x-ray diffraction (XRD), which allows for control over the ideal mixture for the optimal process for copper sulfide (Cu2S)-white metal, iron sulfide (FeS)-Slag and pyritic sulfur (S2)-temperature.

A SYSTEM AND METHOD FOR DIFFRACTION-BASED STRUCTURE DETERMINATION WITH SIMULTANEOUS PROCESSING MODULES

A diffraction system for determining a crystalline structure of a sample collects a series of diffraction frames from a crystal sample illuminated by a beam of photonic or particulate radiation, such as X-rays. A plurality of software modules for processing the detected diffraction frames perform different tasks in refining the collected diffraction data, such as harvesting, indexing, scaling, integration, and structure determination. Output parameters from certain modules are used as input parameters in others, and are exchanged between the modules as they become available. The modules operate simultaneously, and generate successive versions of output parameters as corresponding input parameters are changed until a final result is achieved. This provides a system of structure determination that is fast and efficient.

DEVICE, SYSTEM AND METHOD FOR X-RAY DIFFRACTION ANALYSIS OF AN ELECTRODE OF AN ELECTROCHEMICAL CELL, AT OPERATING TEMPERATURE AND UNDER CURRENT

A device keeps an electrochemical cell under current and at operating temperature during an X-ray beam diffraction analysis of a first electrode, the cell comprising a solid electrolyte interposed between the electrodes. The device comprises: first and second interconnectors having contact faces contacting the electrodes, which allow a gas flow and exchange between the interconnectors and the electrodes. The contact face of the first interconnector allows an X-ray beam to pass to the first electrode. A thermal and atmospheric containment chamber has an inner cavity housing a stack formed from the cell between the interconnectors and a cover closing the cavity, provided with a window allowing X-rays to pass through, the first interconnector being intended to be arranged facing the cover. The contact face of each interconnector is a slotted element; slotted portions of the slotted element are uniformly arranged and form 30% to 80% of the element's surface area.

ANALYSIS APPARATUS INTERLOCKING IN-SITU X-RAY DIFFRACTION AND POTENTIOSTAT AND ANALYZING METHODS USING THE SAME

Provided is an in-situ X-ray analysis apparatus including a potentiostat connected to an in-situ electrochemical cell and configured to adjust voltage, current, and time of the in-situ electrochemical cell or to record information regarding voltage, current, resistance, capacity, and time information of the in-situ electrochemical cell; an X-ray analysis apparatus configured to obtain X-ray diffraction information regarding the in-situ electrochemical cell; and a controller connected to the X-ray analysis apparatus and the potentiostat and configured to provide or receive signals to or from the X-ray analysis apparatus and the potentiostat. 1. An in-situ X-ray analysis apparatus comprising:a potentiostat connected to an in-situ electrochemical cell and configured to adjust voltage, current, and time of the in-situ electrochemical cell or to record information regarding voltage, current, resistance, capacity, and time information of the in-situ electrochemical cell;an X-ray analysis device configured to obtain X-ray diffraction information regarding the in-situ electrochemical cell; anda controller connected to the X-ray analysis device and the potentiostat and configured to provide or receive signals to or from the X-ray analysis device and the potentiostat.2. The in-situ X-ray analysis apparatus of claim 1 , wherein the potentiostat is configured to provide the information regarding capacity claim 1 , voltage claim 1 , current claim 1 , and time of the in-situ electrochemical cell to the controller claim 1 , andthe controller is configured to provide a command signal for the X-ray analysis device to irradiate an X-ray to the in-situ electrochemical cell in response to a signal based on the information provided by the potentiostat.3. The in-situ X-ray analysis apparatus of claim 2 , wherein the controller is configured to derive overpotential information and diffusivity information in each state based on the information regarding capacity claim 2 , voltage claim 2 , ...

DYNAMIC STATE OBSERVATION SYSTEM

An example embodiment includes a large observation device that observes the object using a quantum beam; a reproduction device that is installed in the large observation device and reproduces an input to the object in a state where the object can be observed by the large observation device; a dynamic state observation device that observes a dynamic state of a functional object functioning by a combination of a plurality of elements; a first information acquisition unit that functionally decomposes the functional object up to an element corresponding to the object and acquires first information that is input information to the element corresponding to the object; and a transmission unit that transmits the first information to the reproduction device, in which the reproduction device reproduces the input to the object on the basis of the first information.

Deterioration analysis method

Method for analyzing rubber compound with filler particles

A method for analyzing rubber compound including a rubber component and filler particles, comprises: a STEM image acquiring step in which, by the use of a scanning transmission electron microscope (STEM), data of STEM images of the rubber compound are acquired; and a researching step for researching the STEM images or secondary information based on the originally data of STEM images; wherein in the STEM image acquiring step, the focal point of the scanning transmission electron microscope is set in a thickness center region of a specimen of the rubber compound.

Evaluation System and Evaluation Method of Plastic Strain

An evaluation system for plastic strain includes an X-ray diffraction device for irradiating the surface of a measurement object; and an image analyzing device that generates diffraction intensity curves from X-ray diffraction angle and intensity with an implanted database, which can be obtained in advance from test specimens made of the same material of the measurement object, establishing at least one of the relations between the full width at half maximum of the diffraction intensity curve and plastic strain, and between the integral intensity angular breadth of diffraction intensity curve and plastic strain. The image analyzing device obtains plastic strain of the measurement object based on at least one of the diffraction parameters of the full width at half maximum and the integral intensity angular breadth of a diffraction intensity curve corresponding to the implanted database indicative of the relation between the diffraction parameter and plastic strain.

Crystal Structure Analysis System and Crystal Structure Analysis Method

An electron diffraction apparatus measures an overall structure of a crystal of a specimen by electron diffraction. An NMR apparatus measures a local structure of the crystal by NMR measurement. An analysis apparatus combines the overall structure and the local structure to specify a structure of the crystal. 1. A crystal structure analysis system comprising:an electron diffraction apparatus that measures an overall structure of a crystal of a specimen by electron diffraction;a nuclear magnetic resonance (NMR) apparatus that measures a local structure of the crystal by NMR measurement; andan analysis apparatus that combines the overall structure and the local structure to specify a structure of the crystal.2. The crystal structure analysis system according to claim 1 , whereinthe analysis apparatus further optimizes the structure of the crystal by applying a quantum chemical calculation to the overall structure to obtain an optimized overall structure, and combines the optimized overall structure and the local structure.3. The crystal structure analysis system according to claim 1 , whereinthe analysis apparatus fits, in the combining process, an attribution of an atom X obtained by the NMR measurement to a potential map of the crystal obtained by the electron diffraction.4. The crystal structure analysis system according to claim 1 , whereinthe NMR apparatus measures a distance between an atom X and a hydrogen atom in the crystal by measuring a dipole interaction between the atom X and the hydrogen atom by the NMR measurement, andthe analysis apparatus specifies, in the combining process, a position of the hydrogen atom in the overall structure based on the distance.5. The crystal structure analysis apparatus according to claim 1 , whereinthe NMR apparatus executes a correlation measurement between an atom X and a hydrogen atom in the crystal by the NMR measurement, andthe analysis apparatus judges, in the combining process, whether the hydrogen atom is bonded to ...

NON-INTRUSIVE MEASUREMENT OF THE VOLUME DENSITY OF A PHASE IN A PART

Method and system for non-intrusive measurement of volume density of a specific phase in a part, comprising: processor producing a volume image of the part, the image being formed by a three-dimensional grid of voxels, the values of which indicate the disposition of the specific phase in the part, processor associating a binary coefficient with each voxel of the volume image, thus constructing an initial three-dimensional matrix representation of binary coefficients representing a presence or absence of the specific phase in zones of the part corresponding to the voxels, processor convoluting the initial matrix representation with a convolution matrix kernel corresponding to a predetermined reference volume, the convolution performed by effecting a composition of three (successive) monodimensional convolutions in three independent directions, thus forming a resultant matrix representation, each resultant coefficient of which represents a volume ratio (the density) of the specific phase in the reference volume. 110-. (canceled)11. Method for the non-intrusive measurement of the volume density of a specific phase in a part , characterised in that it comprises the following steps:producing a volume (tomographic) image of said part, said image being formed by a three-dimensional grid of voxels, the values of which indicate the disposition of said specific phase in (corresponding zones of) said part,associating a binary coefficient with each voxel of said volume (tomographic) image, thus constructing an initial three-dimensional matrix representation of binary coefficients, said binary coefficients representing a presence or absence of said specific phase in zones of said part corresponding to the voxels,convoluting said initial matrix representation with a convolution matrix kernel corresponding to a predetermined reference volume, said convolution being performed by effecting a composition of three (successive) monodimensional convolutions in three independent ...

Method for evaluating quality of sic single crystal body and method for producing silicon carbide single crystal ingot using the same

A method for evaluating the quality of a SiC single crystal by a non-destructive and simple method; and a method for producing a SiC single crystal ingot with less dislocation and high quality with good reproducibility utilizing the same. The method for evaluating the quality of a SiC single crystal body is based on the graph of a second polynomial equation obtained by differentiating a first polynomial equation, the first polynomial equation approximating the relation between a peak shift value and a position of the measurement point and the peak shift value being obtained by an X-ray rocking curve measurement. The method for producing a SiC single crystal ingot manufactures a SiC single crystal ingot by a sublimation recrystallization method using, as a seed crystal, the SiC single crystal body evaluated by the evaluation method.

Method for mapping crystal orientations in a sample made of a polycrystalline material

The invention relates to a method for mapping the crystal orientations of a polycrystalline material, the method comprising: receiving ( 21 ) a series of images of the polycrystalline material, which images are acquired by an acquiring device in respective irradiation geometries; estimating ( 22 ) at least one intensity profile for at least one point of the material from the series of images, each intensity profile representing the intensity associated with the point in question as a function of irradiation geometry; and determining ( 24 ) a crystal orientation for each point in question of the material by comparing ( 23 ) the intensity profile associated with said point in question to theoretical signatures of intensity profiles of known crystal orientations, which signatures are contained in a database.

ELECTRON MICROSCOPY ANALYSIS METHOD

The present disclosure concerns an electron microscopy method, including the emission of a precessing electron beam and the acquisition, at least partly simultaneous, of an electron diffraction pattern and of intensity values of X rays. 1. An electron microscopy method , comprising the emission of an electron beam having a precessional motion and the acquisition , at least partly simultaneous , of an electron diffraction pattern and of intensity values of X rays.2. The method according to claim 1 , wherein claim 1 , during said acquisition claim 1 , the electron beam has an axis running through a point of an object.3. The method according to claim 2 , comprising a step among:the determination that said point is located in an amorphous portion; andthe determination that said point is located in a crystalline portion.4. The method according to claim 2 , wherein said point corresponds to a pixel among pixels of an image.5. The method according to claim 3 , comprising claim 3 , for each of the pixels of at least one set of pixels of the image associated with an amorphous phase claim 3 , the determination of a chemical composition based on said intensity values.6. The method according to claim 3 , comprising claim 3 , for each of the pixels of at least one set of pixels of the image associated with a same crystalline phase claim 3 , the determination of a chemical composition based on said intensity values.7. The method according to claim 6 , comprising the determination of the structure of said same crystalline phase and/or of one or a plurality of parameters of said same crystalline phase and/or of a crystal orientation.8. The method according to claim 7 , comprising the determination of at least one deformation value based on the chemical composition and on said one or a plurality of parameters of said same crystalline phase.9. The method according to claim 5 , comprising claim 5 , for said set claim 5 , the determination of a statistic chemical composition value ...

BALL-MAPPING SYSTEM AND METHOD OF OPERATING THE SAME

A ball-mapping system connectable to an X-ray diffraction apparatus, for collecting X-ray diffraction data at measurement points located on a ball-shaped sample is provided. The system includes a sample stage, including a sample-contacting surface and a guide assembly cooperating with the sample-contacting surface for guiding the sample-contacting surface along a first axis and along a second axis unparallel to the first axis. The system includes a sample holder for keeping the ball-shaped sample in contact with the sample stage and a motor assembly in driving engagement with the guide assembly, the motor assembly driving the sample-contacting surface in translational movement along the first axis and the second axis, the translational movement of the sample-contacting surface causing the ball-shaped sample to rotate, on the sample-contacting surface along the first axis and the second axis. A method for mapping the ball-shaped sample is also provided. 1. A ball-mapping system connectable to an X-ray diffraction apparatus , for collecting X-ray diffraction data at measurement points located on a ball-shaped sample , the ball-mapping system comprising: a sample-contacting surface onto which the ball-shaped sample is placeable; and', 'a guide assembly cooperating with the sample-contacting surface for guiding the sample-contacting surface along a first axis and along a second axis unparallel to the first axis;, 'a sample stage, comprisinga sample holder for keeping the ball-shaped sample in contact with the sample stage;a motor assembly in driving engagement with the guide assembly, the motor assembly driving the sample-contacting surface in translational movement along the first axis and the second axis, the translational movement of the sample-contacting surface causing the ball-shaped sample to rotate, on the sample-contacting surface along the first axis and the second axis; anda control unit for controlling the motor assembly and directing movement of the sample ...

CHARACTERISATION OF AMPORPHOUS CONTENT OF COMPLEX FORMULATIONS BASED ON NON-NEGATIVE MATRIX FACTORISATION

Chemical components in a mixture are analysed using scattering data representing the results of a diffraction experiment performed on the mixture. Using non-negative matrix factorisation or another optimisation technique, the scattering data is deconvolved into non-negative basis components that represent contributions to the scattering data from each chemical component and fitting coefficients are derived in respect of the basis components that represent the proportions of chemical components in the mixture. 1. A method of analysing chemical components in at least one mixture thereof from scattering data representing the results of a diffraction experiment performed on the at least one mixture , the method comprising deconvolving the scattering data into non-negative basis components that represent contributions to the scattering data from each chemical component and deriving fitting coefficients in respect of the basis components that represent the proportions of chemical components in the mixture.2. A method according to claim 1 , wherein the step of deconvolving the scattering data into non-negative basis components and deriving fitting coefficients in respect of the basis components is performed using an optimisation technique that optimises the fit of the basis components and the fitting coefficients to the scattering data.3. A method according to claim 2 , wherein the optimisation technique comprises non-negative matrix factorisation.4. A method according to claim 3 , wherein the non-negative matrix factorisation is performed using a Metropolis Monte Carlo technique to avoid local minima.5. A method according to claim 2 , wherein the step of deconvolving the scattering data into non-negative basis components and deriving fitting coefficients in respect of the basis components is performed applying a constraint on any of the basis components claim 2 , the fitting coefficients claim 2 , or a relationship therebetween.6. A method according to claim 2 , wherein ...

FATIGUE LEVEL ESTIMATION METHOD AND CREATING METHOD FOR DATABASE FOR FATIGUE LEVEL ESTIMATION

A fatigue level estimation method includes estimating a fatigue portion in a metal material, measuring a distribution of a misorientation in the fatigue portion, obtaining a specific area ratio of the fatigue portion based on the distribution of the misorientation in the fatigue portion, and obtaining an estimated fatigue level of the metal material based on at least one of the specific area ratio of the fatigue portion and a degree of change in the specific area ratio of the fatigue portion. The specific area ratio of the fatigue portion is a ratio of a specific area existing in a measurement area of the fatigue portion. 1. A fatigue level estimation method for estimating a fatigue level of a metal material , the fatigue level estimation method comprising:estimating a fatigue portion in which fatigue has occurred in the metal material;measuring a distribution of a misorientation in the fatigue portion;obtaining a specific area ratio of the fatigue portion based on the distribution of the misorientation in the fatigue portion, the specific area ratio of the fatigue portion being a ratio of a specific area existing in a measurement area of the fatigue portion, and the specific area being an area in which the misorientation is a predetermined set value; andobtaining an estimated fatigue level of the metal material based on at least one of the specific area ratio of the fatigue portion and a degree of change in the specific area ratio of the fatigue portion.2. The fatigue level estimation method according to claim 1 , further comprising:measuring a distribution of a misorientation in a surface layer portion between a rolling surface of the metal material and the fatigue portion, the fatigue portion being a portion in which rolling fatigue has occurred and existing in a range in which a depth distance from the rolling surface of the metal material is a predetermined value or more; anddetermining a specific area ratio of the surface layer portion based on the ...

FULL-VIEW-FIELD QUANTITATIVE STATISTICAL DISTRIBUTION REPRESENTATION METHOD FOR MICROSTRUCTURES of y' PHASES IN METAL MATERIAL

The present invention discloses, a full-view-field quantitative statistical distribution representation method for microstructures of γ′ phases in a metal material, comprising the following steps: step a: labeling γ′ phases, cloud clutters and γ matrixes by Labelme, and then making standard feature training samples; step b: building a deep learning-based feature recognition and extraction model by means of BDU-Net; step e: collecting γ′ feature maps in the metal material to be detected; step d: automatically recognizing and extracting the γ′ phases; and step e: performing in-situ quantitative statistical distribution representation on the γ phases in the full view field within a large range. The full-view-field quantitative statistical distribution representation method for microstructures of γ′ phases in a metal material provided by the present invention realizes automatic, high-speed and high-quality recognition and extraction of features of γ phases in the metal material 1. A full-view-field quantitative statistical distribution representation method for microstructures of γ′ phases in a metal material , comprising the following steps:a) performing metallographic sample preparation, polishing and chemical etching on standard metal material samples with the same material as a metal material to be detected, randomly sampling and shooting the processed standard metal material samples by a scanning electron microscope at high magnification, and building a γ′-phase feature map data set; labeling γ′ phases, cloud clutters and γ matrixes by Labelme, and then making standard feature training samples;b) optimizing a deep learning-based image segmentation network U-Net, building a feature recognition and extraction network BDU-Net, performing data augmentation on the standard feature training samples, dividing the augmented data into a training set and a validation set, training with the training set, taking the MPA of the validation set as a judgment condition of training ...

METHOD FOR ACCULATELY CHARACTERIZING CRYSTAL THREE-DIMENSIONAL ORIENTATION AND CRYSTALLOGRAPHIC ORIENTATION

A method for accurately characterizing a crystal three-dimensional orientation and a crystallographic orientation, including the following steps: acquiring a two-dimensional structure topography and an EBSD pattern in an area to-be-detected of a crystal material; using three-dimensional image analysis software to perform three-dimensional image synthesis through so as to obtain a three-dimensional topography; extracting a three-dimensional orientation of a characteristic topography in a coordinate system where the three-dimensional topography is located; and by converting the three-dimensional orientation into a crystallographic coordinate system obtained by EBSD, obtaining the crystallographic orientation of the characteristic topography. By using the method, the orientation of characteristic organization structures of various materials and the crystallographic orientation may be simultaneously analyzed, which has a great significance for research on the material crystal growth orientation and growth behavior.

Opaline flux-calcined diatomite products

A diatomite product and method of using such is disclosed. The diatomite product may comprise sodium flux-calcined diatomite, wherein the diatomite product has a crystalline silica content of less than about 1 wt %, and the diatomite product has a permeability between 0.8 darcy and about 30 darcy. In some embodiments, the diatomite product may be in particulate or powdered form. This disclosure also concerns flux-calcined silica products containing low or non-detectable levels of crystalline silica. Some of these products can be further characterized by high permeabilities and a measurable content of opal-C, a hydrated form of silicon dioxide.

DIATOMITE PRODUCTS

Products () comprising a physical component () and Silica Documentation (), and methods of preparing such products () are disclosed. In some embodiments, the physical component () may be powdered or in particulate form. The physical component () includes diatomite. In such products (), a crystalline silica content of the physical component () by weight is greater as measured according to Traditional Methods than as measured according to a method that differentiates between opal-C and cristobalite. The Silica Documentation () discloses the crystalline silica content present in the physical component () as measured according to the method that differentiates between opal-C and cristobalite. The method of preparing the product () may include analyzing the physical component () for crystalline silica content using an LH Method to determine cristobalite content and preparing Silica Documentation () based on the results of the LH Method. 1. A product comprising:a physical component including diatomite, wherein a crystalline silica content of the physical component by weight is greater as measured according to Traditional Methods than as measured according to a method that differentiates between opal-C and cristobalite; andSilica Documentation that discloses the crystalline silica content present in the physical component as measured according to the method that differentiates between opal-C and cristobalite.2. The product of claim 1 , wherein the method that differentiates between opal-C and cristobalite is the LH Method.3. (canceled)4. The product of claim 2 , wherein the crystalline silica content of the physical component of the product is greater than 1 wt % as measured according to the Traditional Methods and less than 1 wt % as measured according to the LH Method.5. The product of claim 2 , wherein the physical component of the product has a detectable amount of the crystalline silica content as measured according to the Traditional Methods claim 2 , wherein further ...

DIFFRACTION DEVICE AND METHOD FOR NON-DESTRUCTIVE TESTING OF INTERNAL CRYSTAL ORIENTATION UNIFORMITY OF WORKPIECE

A diffraction device and a method for non-destructive testing of internal crystal orientation uniformity of a workpiece. The diffraction device comprises: an X-ray irradiation system used for irradiating X-ray to a measuring part of a measured sample (); an X-ray detection system used for detecting a plurality of diffraction X-rays formed by diffracting the X-ray with a plurality of parts of the measured sample (), to measure X-ray diffraction intensity distribution of the measured sample (). The detected X-ray is short-wavelength feature X-ray, and the X-ray detection system is an array detection system (). The method comprises steps of selecting the short-wavelength feature X-ray, performing texture analysis on the measured sample (), and determining a diffraction vector Q to be measured; and obtaining the X-ray diffraction intensity of the corresponding part of the measured sample (). The method can rapidly and non-destructively test the internal crystal orientation uniformity of a centimeter-thick workpiece in its entire thickness direction, and implement online testing and characterization of the internal crystal orientation uniformity of the centimeter-thick workpiece in the entire thickness direction of its movement trajectory. 1. A diffraction apparatus , comprising:an X-ray irradiation system for irradiating an X-ray to a measured part of a sample under testing, andan X-ray detection system for simultaneously detecting a plurality of diffracted X-rays formed by diffraction of a plurality of parts of the sample under testing, to measure an X-ray diffraction intensity distribution of the sample under testing,wherein the detected diffracted X-rays are short-wavelength characteristic X-rays, and the X-ray detection system is an array detection system.2656. The diffraction apparatus according to claim 1 , wherein the array detection system comprises a receiving array collimator () claim 1 , and an array detector () that matches the receiving array collimator () ...

Fluoroscopic image density correction method, and image processing device

A reference density profile is generated in an outer circumference direction of a pipe having a reference welded portion on the basis of a reference fluoroscopic image generated from a radiation detection medium when a radiation source is disposed on a central axis of the pipe. A weld inspection density profile is generated in an outer circumference direction of a pipe having an inspection target welded portion on the basis of a weld inspection fluoroscopic image. On the basis of the reference density profile and the weld inspection density profile, density correction information is calculated. The density correction information is for correcting density irregularities in the weld inspection fluoroscopic image in the outer circumference direction of the pipe. On the basis of the density correction information, the density irregularities in the weld inspection fluoroscopic image arc corrected.

Method for measuring stress

A method that measures stress of a test subject including a metal includes: detecting, using a two-dimensional detector, a diffraction ring of diffracted X-rays which is formed by causing X-rays from an irradiation unit to be incident on the test subject and to be diffracted by the test subject; and calculating the stress of the test subject based on detection results during the detection step. Therein, the detection step involves causing X-rays from the irradiation unit to be incident on each of a plurality of sites on the test subject with the irradiation unit angled relative to the test subject in a manner such that the angle of incidence on the test subject is within the range of 5-20°, inclusive, and detecting, using a two-dimensional detector, the diffraction ring formed by the diffraction of the X-rays by the test subject.

IMAGING SYSTEM FOR INDUSTRIAL EQUIPMENT AND PROCESS

An imaging process for industrial equipment is described using gamma-ray or X-ray profiling techniques and tomographic image reconstruction, wherein (a) a radiation emission subsystem with at least one radiation source emits that passes through an industrial equipment to be analyzed by imaging; (b) a radiation detection subsystem with at least one radiation detector detects the energy of the radiation emitted by the radiation emission subsystem that has passed through said industrial equipment; (c) processing and imaging means receive and evaluate the radiation samples detected by the radiation detection subsystem and generate a tomogram of the analyzed region, selecting the radiation samples detected with an energy value within a range of values corresponding to a maximum defined scattering angle of the radiation emitted by the radiation source, and generating a tomographic reconstruction of images of the industrial equipment based on these selected radiation samples. 1. An imaging system for industrial equipment using gamma-ray or X-ray profiling techniques and tomographic image reconstruction , comprising:(a) a radiation emission subsystem with at least one radiation source that emits radiation passing through an industrial equipment to be analyzed by imaging;(b) a radiation detection subsystem with at least one radiation detector, which detects the radiation energy emitted by the radiation emission subsystem that has passed through said industrial equipment;(c) processing and imaging means that receive and evaluate the radiation samples detected by the radiation detection subsystem and generate a tomogram of the analyzed region,the system characterized in that processing and imaging means select the radiation samples detected with energy value within a range of values corresponding to a maximum defined scattering angle of the radiation emitted by the radiation source, and generates a tomographic reconstruction of images of the industrial equipment based on these ...

SYSTEM AND METHOD FOR COMPUTED LAMINOGRAPHY X-RAY FLUORESCENCE IMAGING

A system and a method use x-ray fluorescence to analyze a specimen by illuminating a specimen with an incident x-ray beam having a near-grazing incident angle relative to a surface of the specimen and while the specimen has different rotational orientations relative to the incident x-ray beam. Fluorescence x-rays generated by the specimen in response to the incident x-ray beam are collected while the specimen has the different rotational orientations. 1. A method for using x-ray fluorescence to analyze a specimen , the method comprising:illuminating a specimen with an incident x-ray beam while the specimen has a first rotational orientation relative to the incident x-ray beam, the incident x-ray beam having a near-grazing incident angle relative to a surface of the specimen;collecting fluorescence x-rays generated by the specimen in response to the incident x-ray beam while the specimen has the first rotational orientation;rotating the specimen about a direction substantially perpendicular to the surface such that the specimen has a second rotational orientation relative to the incident x-ray beam, the second rotational orientation different from the first rotational orientation by a rotation angle;illuminating the specimen with the incident x-ray beam while the specimen has the second rotational orientation; andcollecting fluorescence x-rays generated by the specimen in response to the incident x-ray beam while the specimen has the second rotational orientation.2. The method of claim 1 , wherein the near-grazing incident angle is in a range of 1 degree to 15 degrees relative to the surface.3. The method of claim 2 , wherein the near-grazing incident angle is greater than a critical angle of the specimen.4. The method of claim 1 , wherein the incident x-ray beam is focused at the specimen with a spot size that is less than or equal to 50 microns in at least one direction substantially parallel to the surface.5. The method of claim 1 , further comprising energy- ...

X-RAY MULTIGRAIN CRYSTALLOGRAPHY

Disclosed is method of determining one or more unit cells of a poly-crystalline sample and indexing a set DV of 3D diffraction vectors. The method comprising obtaining a plurality of candidate first lattice plane normal vectors and a plurality of candidate second lattice plane normal vectors for a particular unknown grain; using said plurality of candidate first lattice plane normal vectors and said plurality of candidate second lattice plane normal vectors to select a plurality of subsets SSDV_n of the set DV of 3D diffraction vectors and processing said plurality of subsets SSDV_n of 3D diffraction vectors to determine a primary candidate unit cell PCUC defined by three lattice vectors; wherein the primary candidate unit cell PCUC is validated by evaluating the fit of the PCUC with the full set DV of 3D diffraction vectors. 1. A method of determining one or more unit cells of a poly-crystalline sample and indexing a set DV of 3D diffraction vectors obtained by illuminating said poly-crystalline sample with an X-ray source at one or more orientations and recording diffraction spots using a at least one 2D or 3D X-ray detector for each of said one or more orientations , said set DV of 3D diffraction vectors being indexed into a plurality of grains , said method comprising the steps of:(A) obtaining a plurality of candidate first lattice plane normal vectors and a plurality of candidate second lattice plane normal vectors for a particular unknown grain; using said plurality of candidate first lattice plane normal vectors and said plurality of candidate second lattice plane normal vectors to select a plurality of subsets SSDV_n of the set DV of 3D diffraction vectors and processing said plurality of subsets SSDV_n of 3D diffraction vectors to determine a primary candidate unit cell PCUC defined by three lattice vectors; wherein the correspondence of the primary candidate unit cell PCUC is validated by evaluating the fit of the PCUC with the full set DV of 3D ...

STRESS ANALYSIS APPARATUS, METHOD, AND PROGRAM

A stress analysis apparatus capable of improving the accuracy of a stress value, a method, and a program are provided. A stress analysis apparatus that calculates a residual stress of a sample S includes an analysis unit configured to calculate an error as one of solutions by using an equation including an error term and prescribing a relationship between stress and strain with using measured values by diffracted X-rays with respect to a plurality of scattering vectors and a provisional value when the stress in the direction perpendicular to the surface of the sample S is constant, and a provisional value correction unit configured to correct the provisional value by the calculated error, and the analysis unit and the correction unit repeat the calculation of the error and the correction of the provisional value. 1. A stress analysis apparatus that calculates a residual stress of a sample , comprising:an analysis unit configured to calculate an error as one of solutions by using an equation including an error term and prescribing a relationship between stress and strain with measured values by diffracted X-rays with respect to a plurality of scattering vectors and a provisional value when the stress in the direction perpendicular to a surface of the sample is constant; anda provisional value correction unit configured to correct the provisional value by the calculated error, wherein the analysis unit and the correction unit repeat the calculation of the error and the correction of the provisional value.2. The stress analysis apparatus according to claim 1 , whereinthe provisional value correction unit corrects the provisional value by approximating that the error rate of spacing of crystal lattice planes is equal to the error of strain the signs of which are inverted.3. The stress analysis apparatus according to claim further comprising:an output unit configured to output each stress value obtained when substituting the final value of the corrected provisional value ...

SYSTEMS AND METHODS FOR MATERIALS ANALYSIS

A system for the x-ray topography analysis of a sample, comprising in combination, a goniometer having a base, a tube arm rotatably associated with the base, a detector arm rotatably associated with the base, and a sample stage operatively associated with the base. The system also includes an x-ray source operatively coupled with the tube arm and is capable of emitting a non-collimated beam of x-rays. A collimator is operatively associated with the x-ray source and converts the non-collimated beam of x-rays into a collimated beam of x-rays having a quasi-rectangular shape with a divergence less than three degrees in all directions. A detector operatively coupled to the detector arm. 1. A method for the characterization of micro-textured regions in a sample containing more than one crystalline phase , comprising:providing an x-ray diffraction system, the system having a base, a tube arm rotatably associated with the base, a detector arm rotatably associated with the base, and a sample stage that includes three axes of translation and three axes of rotation, an x-ray source capable of emitting a non-collimated beam of x-rays, and a collimatoroperatively associated with the x-ray source, the collimator capable of converting the non-collimated beam of x-rays into a collimated beam of x-rays having a quasi-rectangular shape with a divergence less than one degree in all directions, wherein the collimated beam of x-rays is directed towards a surface of a sample on the sample stage at an angle of incidence relative to the surface of the sample;activating the pixelated area detector operatively coupled to the detector arm, the detector continuously creating an output signal, wherein the detector has a detector surface and the detector arm is an automated detector arm capable of varying the distance between the detector surface and the sample and an angle between the collimated beam of x-rays and the detector surface, wherein the detector captures quasi-parallel x-rays ...

SERIAL SYNCHROTRON CRYSTALLOGRAPHY SAMPLE HOLDING SYSTEM

A fixed target sample holder for serial synchrotron crystallography comprising a goniometer compatible base, a carrier, a sample holding insert which can be placed into the carrier. The sample holding insert comprising fiducials and windows, wherein each of the windows are respectively configured to accept a sample. The windows can also have holes and texture within each window. Additionally, a sample loading workstation for loading crystals into the sample holder and the removal of excess liquid from the sample, comprising a humidity-controlled chamber, a sample support within the chamber, a capture to place the goniometer-compatible base, and a channel in communication with the chamber that allows for the flow of humidified air into the chamber. 115-. (canceled)16. A fixed target sample holder for serial synchrotron crystallography at both room temperature and cryogenic temperature , comprising:a magnetic metal base sized and shaped to be compatible with a goniometer;a flat rigid carrier sheet attached to the base and centered on its axis, the carrier sheet forming at least one aperture;an X-ray transparent polymer sample support film comprising a pattern of regions of at least two thicknesses, that spans and is sealed to at least one aperture of the carrier;a set of fiducials on thick portions of the sample support film to define a coordinate system on the film; anda set of thin regions on the sample support film that act as transparent windows for examining samples;wherein each of the thin windows of the sample support film are configured to accept a sample containing one or more crystals in a liquid.17. The apparatus of claim 16 , where the carrier sheet has a width of less than 8 millimeters and preferably 2.5 millimeters claim 16 , and a length of approximately 18 mm.18. The apparatus of claim 16 , where the carrier sheet has a thickness between 25 and 500 micrometers.19. The apparatus of claim 16 , where the carrier sheet has a thickness of 50 to 500 ...

MEASURING AND ANALYZING RESIDUAL STRESSES AND THEIR GRADIENTS IN MATERIALS USING HIGH RESOLUTION GRAZING INCIDENCE X-RAY DIFFRACTION

A high resolution grazing incidence X-ray diffraction technique for measuring residual stresses and their gradients as a function of depth in thin film materials on substrates or in bulk materials is disclosed. The technique includes positioning a material relative to an X-ray source and an X-ray detector, performing an Omega scan to determine an Omega offset, setting the incidence angle at a first target incidence angle based on the Omega offset and greater than the critical angle of the material, performing a grazing incidence X-ray diffraction scan, analyzing the results to identify diffraction peaks, selecting a diffraction peak, setting the incidence angle at a second target incidence angle based on the Omega offset and a desired penetration depth, performing two theta scanning on a range of two theta values around the selected diffraction peak, performing refraction correction, and determining residual stress values for the material. 1. A method comprising:performing an Omega scan to determine an Omega offset of an X-ray beam generated by an X-ray source relative to a material with respect to an incidence angle between the X-ray source and the material;setting the incidence angle between the X-ray source and the material at a first target incidence angle, the first target incidence angle based on the Omega offset and greater than the critical angle of the material;performing a grazing incidence X-ray diffraction scan on the material, the grazing incidence X-ray diffraction scan generating first measurement data comprising intensities of X-ray photons at a plurality of two theta angles;analyzing the first measurement data to identify a plurality of diffraction peaks from the material, each diffraction peak having an intensity occurring at a corresponding two theta value;selecting a diffraction peak of the plurality of diffraction peaks based on the analysis of the first measurement data;setting the incidence angle between the X-ray source and the material at a ...

MEASURING AND ANALYZING RESIDUAL STRESSES AND THEIR GRADIENTS IN MATERIALS USING HIGH RESOLUTION GRAZING INCIDENCE X-RAY DIFFRACTION

A high resolution grazing incidence X-ray diffraction technique for measuring residual stresses and their gradients as a function of depth in thin film materials on substrates or in bulk materials is disclosed. The technique includes positioning a material relative to an X-ray source and an X-ray detector, performing an Omega scan to determine an Omega offset, setting the incidence angle at a first target incidence angle based on the Omega offset and greater than the critical angle of the material, performing a grazing incidence X-ray diffraction scan, analyzing the results to identify diffraction peaks, selecting a diffraction peak, setting the incidence angle at a second target incidence angle based on the Omega offset and a desired penetration depth, performing two theta scanning on a range of two theta values around the selected diffraction peak, performing refraction correction, and determining residual stress values for the material. 1. A system comprising:a testing apparatus comprising an X-ray source and an X-ray detector;at least one processor comprising hardware; and perform an Omega scan to determine an Omega offset of an X-ray beam generated by the X-ray source relative to a material with respect to an incidence angle between the X-ray source and the material;', 'set the incidence angle between the X-ray source and the material at a first target incidence angle, the first target incidence angle based on the Omega offset and greater than the critical angle of the material;', 'perform a grazing incidence X-ray diffraction scan on the material, the grazing incidence X-ray diffraction scan generating first measurement data comprising intensities of X-ray photons at a plurality of two theta angles;', 'analyze the first measurement data to identify a plurality of diffraction peaks from the material, each diffraction peak having an intensity occurring at a corresponding two theta value;', 'select a diffraction peak of the plurality of diffraction peaks based on ...

MEASURING AND ANALYZING RESIDUAL STRESSES AND THEIR GRADIENTS IN MATERIALS USING HIGH RESOLUTION GRAZING INCIDENCE X-RAY DIFFRACTION

A high resolution grazing incidence X-ray diffraction technique for measuring residual stresses and their gradients as a function of depth in thin film materials on substrates or in bulk materials is disclosed. The technique includes positioning a material relative to an X-ray source and an X-ray detector, performing an Omega scan to determine an Omega offset, setting the incidence angle at a first target incidence angle based on the Omega offset and greater than the critical angle of the material, performing a grazing incidence X-ray diffraction scan, analyzing the results to identify diffraction peaks, selecting a diffraction peak, setting the incidence angle at a second target incidence angle based on the Omega offset and a desired penetration depth, performing two theta scanning on a range of two theta values around the selected diffraction peak, performing refraction correction, and determining residual stress values for the material. 1. A computer readable medium comprising instructions that , when executed by at least one processor comprising hardware , configure the at least one processor to:receive first measurement data comprising intensities of X-ray photons at a plurality of two theta angles, the first measurement data generated by a performance of a grazing incidence X-ray diffraction scan on a material with an incidence angle between an X-ray source and the material set at a first target incidence angle greater than the critical angle of the material;analyze the first measurement data to identify a plurality of diffraction peaks from the material, each diffraction peak having an intensity occurring at a corresponding two theta value;select a diffraction peak of the plurality of diffraction peaks based on the analysis of the first measurement data;receive second measurement data, the second measurement data generated by a performance of two theta scanning on the material on a range of two theta values around the two theta value of the selected ...

Method and device for determining structure of multi-element crystal

A method for determining a stable structure of a multi-element crystal, the method including: determining a multi-layered matrix of the multi-element crystal based on a layer of the multi-element crystal and a composition ratio of transition metals included in the multi-element crystal; grouping candidate structures of the multi-element crystal into a plurality of candidate structure groups based on a trace of the multi-layered matrix; and determining at least one stable structure group including the stable structure from among the plurality of candidate structure groups to determine the stable structure.

APPARATUS AND METHOD FOR INDUCING HIGH-SPEED VARIABLE-TILT WOBBLE MOTIONS

An apparatus and method for inducing high-speed wobble motions to a sample of interest is provided. After the sample is securely attached to a sample mounting block, the sample is variably tilted by using a hexapod stage and simultaneously rotated at a high speed about a rotation axis that is substantially perpendicular to a planar top surface of the hexapod stage. The position of the sample is continuously adjusted during the wobble motion to align a surface center of the sample with a testing center of an X-ray diffractometer. The simultaneous variable tilting and high-speed rotation of the sample induces wobble motions to the sample for randomizing orientations of a sample material's crystallites relative to the source and detector of an X-ray diffractometer. 1. An apparatus for inducing high-speed wobble motions to a sample for identifying and quantifying crystalline phases of a material of the sample by using an X-ray diffractometer , wherein the X-ray diffractometer has a pre-defined testing center , the apparatus comprising:a position adjustment structure disposed on a part of the X-ray diffractometer, wherein the position adjustment structure is configured to adjust the position of the sample with respect to the X-ray diffractometer, such that a surface center of the sample is aligned with the testing center of the X-ray diffractometer in a space defined by a longitudinal axis, a lateral axis and a vertical axis;a hexapod stage disposed on the position adjustment structure, wherein the hexapod stage is configured to tilt the sample;a rotation stage disposed on the hexapod stage, wherein the rotation stage is configured to rotate the sample about a rotation axis that is substantially perpendicular to a planar top surface of the hexapod stage; anda sample mounting block disposed on the rotation stage, wherein the sample mounting block has a top surface on which the sample is securely mounted,wherein the hexapod stage tilts the sample simultaneously with the ...

METHOD FOR IDENTIFYING MOLECULAR STRUCTURE

The present invention provides a novel method for identifying a molecular structure by single crystal X-ray analysis. A single crystal that gives an X-ray diffraction spectrum sufficient for determining the structure of the molecule can be efficiently obtained by including a test molecule in a metal complex and then crystallizing the test-molecule-including metal complex. By analyzing this single crystal by X-ray analysis, it is possible to determine the structure of the test molecule without obtaining a single crystal of the test molecule. With the method according to the present invention, the structure of a test molecule in a trace amount of sample can also be determined. 1. A method for structural analysis of a test molecule with an X-ray or a neutron beam , the method comprising the steps of:(A) mixing together a sample containing the test molecule and a metal complex capable of including the test molecule to generate a test molecule-metal complex inclusion body;(B) dispensing an inclusion solution containing the inclusion body to prepare a plurality of independent crystallization solutions at least including a first crystallization solution and a second crystallization solution;(C) generating a plurality of crystals in the plurality of independent crystallization solutions under similar or different crystallization conditions;(D) screening the plurality of crystals generated in the step (C) to select a targeted crystal;(E) irradiating the targeted crystal with an X-ray or a neutron beam to acquire diffraction data; and(F) analyzing the diffraction data to determine the structure of the test molecule.2. The method according to claim 1 , wherein the volumes of the first crystallization solution and the second crystallization solution are each 100 nL to 10 μL.3. The method according to claim 1 , wherein the volumes of the first crystallization solution and the second crystallization solution are each 200 nL to 2 μL.4. The method according to claim 1 , wherein the ...

NITRIDE CRYSTAL, NITRIDE CRYSTAL SUBSTRATE, EPILAYER-CONTAINING NITRIDE CRYSTAL SUBSTRATE, SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME

A nitride crystal is characterized in that, in connection with plane spacing of arbitrary specific parallel crystal lattice planes of the nitride crystal obtained from X-ray diffraction measurement performed with variation of X-ray penetration depth from a surface of the crystal while X-ray diffraction conditions of the specific parallel crystal lattice planes are satisfied, a uniform distortion at a surface layer of the crystal represented by a value of |d−d|/dobtained from the plane spacing dat the X-ray penetration depth of 0.3 μm and the plane spacing dat the X-ray penetration depth of 5 μm is equal to or lower than 2.1×10. The above configuration provides the nitride crystal having a crystal surface layer that is evaluated directly and reliably without breaking the crystal so that it can be used in a preferred fashion as a substrate for a semiconductor device as well as the nitride crystal substrate, an epilayer-containing nitride crystal substrate, a semiconductor device and a method of manufacturing the same. 114-. (canceled)15. An epilayer-containing nitride crystal substrate comprising:one or more semiconductor layer(s) formed by epitaxial growth on at least one of main surface sides of a nitride crystal substrate formed of a nitride crystal, wherein,{'sub': 1', '2', '2', '1', '2, 'sup': '−3', 'in connection with plane spacing of arbitrary specific parallel crystal lattice planes of the nitride crystal obtained from X-ray diffraction measurement performed with variation of X-ray penetration depth from a surface of said crystal while X-ray diffraction conditions of said specific parallel crystal lattice planes being satisfied, a uniform distortion at a surface layer of said crystal represented by a value of |d−d|/dobtained from said plane spacing dat said X-ray penetration depth of 0.3 mm and said plane spacing dat the X-ray penetration depth of 5 mm is equal to or lower than 2.1×10.'}16. An epilayer-containing nitride crystal substrate comprising:one or ...

Systems and methods for monitoring slope stability

This disclosure relates to monitoring and assessing the mechanical stability and fluid accumulation in natural or man-made slopes comprising primarily of unconsolidated material, such as embankments, dams, roads, waste dumps, as well as man-made heaps of bulk materials that may occur in the stockpiling of grains, gravel, stones, sand, coal, cement, fly ash, salts, chemicals, clays, crushed limestone as well as heaps of mining ores, including crushed, milled and/or agglomerated ore, and run-of-mine materials.

"4D" DYNAMIC TOMOGRAPHY SYSTEM

Tomographs comprise at least one first emission source, one first matrix detector and calculation means arranged to produce an initial tomograph of an object on the basis of radiographs arising from the first matrix detector taken from various angles. The tomography scanner comprises a second emission source and a second matrix detector arranged so that, when the object is subjected to a stress which is known at a given instant in time, the calculation means determine the changes in the object subjected to stress based only on the information from a first radiograph of the object under stress arising from the first matrix detector, from a second radiograph of the object under stress arising from the second matrix detector and the initial tomograph, the first radiograph and the second radiograph being taken at the same given instant in time. 1. A tomography scanner comprising at least one first emission source , one first matrix detector and calculation means arranged to produce an initial tomograph of an object on the basis of radiographs arising from the first matrix detector which are taken from various angles , wherein:the tomography scanner comprises a second emission source, a second matrix detector and,when the object is subjected to a stress whose descriptive framework is known at a given instant in time, the calculation means determine the changes in the object subjected to said stress based only on the information from a first radiograph of the object under stress arising from the first matrix detector, from a second radiograph of the object under stress arising from the second matrix detector and the initial tomograph, the first radiograph and the second radiograph being taken at the same given instant in time.2. The tomography scanner as claimed in claim 1 , wherein the tomography scanner comprises means arranged so as to record a temporal succession of pairs of first and second radiographs so as to reconstruct the change in the object over time.3. The ...

Strain Mapping in TEM Using Precession Electron Diffraction

A sample material is scanned with a transmission electron microscope (TEM) over multiple steps having a predetermined size at a predetermined angle. Each scan at a predetermined step and angle is compared to a template, wherein the template is generated from parameters of the material and the scanning. The data is then analyzed using local mis-orientation mapping and/or Nye's tensor analysis to provide information about local strain states. 1. A method for strain mapping a material rising the steps of:scanning a sample of a material with a transmission electron microscope (TEM), wherein the scanning of the material occurs over multiple steps having a step size and at a beam precession angle;comparing each scan at each step and beam precession angle to a template to produce data, wherein the template is generated from parameters of the material and information from the scanning step;analyzing the data using local mis-orientation mapping analysis or Nye to analysis; andproducing a local strain map of the sample.21. The method of , wherein the step of analyzing is performed using Nye tensor analysis , and a least squares contortion value is calculated for each of the multiple steps.3. The method of claim 2 , wherein the Nye tensor analysis further comprises estimating a lower bound GND density.4. The method of claim 2 , wherein the Nye tensor analysis further comprises calculating a Nye tensor.5. The method of claim 1 , wherein the step of analyzing is performed using local mis-orientation mapping analysis and further wherein a number n is selected for determining a number of nearest neighbors for each of the multiple steps.6. The method of claim 5 , wherein the number n is selected from the range of 1-10.7. The method of claim 5 , wherein the average mis-orientation between each nearest neighbor for each of the multiple steps is calculated.8. The method of claim 1 , further comprising determining reliability claim 1 , wherein reliability is a comparison of a best ...

METHOD FOR MEASURING STRESS

A method for measuring the stress of a concave section of a test subject which comprises a metal and has a surface and a concave section, the method including: a detection step for detecting, using a two-dimensional detector, a diffraction ring of diffracted X-rays which is formed by causing X-rays to be incident on the concave section and to be diffracted by the concave section; and a calculation step for calculating the stress of the concave section on the basis of the detection results during the detection step. Therein, the detection step involves causing X-rays to be incident on each of a plurality of sites inside the concave section of the test subject, and detecting, using a two-dimensional detector, the diffraction ring formed by the diffraction of the X-rays by the concave section. 1. A method for measuring stress in a concavity of a target object , which is composed of a metal and includes a surface and the concavity , the concavity recessing from the surface and extending like a groove , the method comprising the steps of:causing X-rays to be incident on the concavity and detecting, using a two-dimensional detector, diffraction rings of diffracted X-rays generated as the X-rays are diffracted from the concavity; andcalculating the stress in the concavity on a basis of a result of the step of detecting,wherein, in the step of detecting, the X-rays are caused to be incident on a plurality of parts of the concavity of the target object and the two-dimensional detector detects the diffraction rings generated as the X-rays are diffracted from the concavity.2. The method for measuring stress according to claim 1 ,wherein, in the step of detecting, continuous parts of the concavity are selected as the plurality of parts and the X-rays are caused to be successively incident on the parts.3. The method for measuring stress according to claim 2 ,wherein, in the step of detecting, parts continuous in a direction in which the concavity extends are selected as the ...

METAL ELECTRODE BASED 3D PRINTED DEVICE FOR TUNING MICROFLUIDIC DROPLET GENERATION FREQUENCY AND SYNCHRONIZING PHASE FOR SERIAL FEMTOSECOND CRYSTALLOGRAPHY

Methods and systems are provided for serial femtosecond crystallography for reducing the vast amount of waste of injected crystals practiced with traditional continuous flow injections. A micrometer-scale 3-D printed water-in-oil droplet generator device includes an oil phase inlet channel, an aqueous phase inlet channel, a droplet flow outlet channel, and two embedded non-contact electrodes. The inlet and outlet channels are connected internally at a junction. The electrodes comprise gallium metal injected within the 3-D printed device. Voltage across the electrodes generates water-in-oil droplets, determines a rate for a series of droplets, or triggers a phase shift in the droplets. An external trigger generates the droplets based on the frequency of an XFEL utilized in droplet detection, thereby synchronizing a series of droplets with x-ray pulses for efficient crystal detection. The generated droplets can be coupled to an SFX with XFEL experiment compatible with common liquid injector such as a GDVN. 1. A system for synchronizing water droplet phase of a microfluidic water droplet in oil stream with a phase of an x-ray free electron laser water droplet detector , the system comprising: an upstream water in oil droplet generator device at a first inlet of the microfluidic T-junction phase synchronizer via a first capillary;', 'a downstream x-ray free electron laser water droplet detector at an outlet of the microfluidic T-junction phase synchronizer via a second capillary; and', 'an upstream sacrificial oil source at a second inlet of the microfluidic T-junction phase synchronizer via a third capillary;, 'a microfluidic T-junction phase synchronizer, the microfluidic T-junction phase synchronizer interfaced towherein the microfluidic T-junction phase synchronizer injects sacrificial oil received at the second inlet from the upstream sacrificial oil source into a microfluidic water droplet in oil stream received at the first inlet from the upstream water in oil ...

METHOD AND ARRANGEMENT FOR IDENTIFYING CRYSTALLINE PHASES, A CORRESPONDING COMPUTER PROGRAM, AND A CORRESPONDING COMPUTER-READABLE STORAGE MEDIUM

A method for identifying crystalline phases in a polycrystalline sample, comprising: 1. A method for identifying crystalline phases in a polycrystalline sample , comprising the method steps of:a) for each crystal structure that is expected to be present in the sample, determining a normalized vector p(i) for the chemical composition of the crystal structure, wherein the basis of the vector represents elements and/or compounds and the coordinates of the vector comprise details about the concentration of the elements and/or compounds within the crystal structure; (i) recording a spectrum by means of energy-dispersive X ray spectroscopy (EDX spectrum) and determining the chemical composition, and', '(ii) recording an electron diffraction image and determining the diffraction bands;, 'b) at each measurement point of the sample,'}c) determining a normalized vector v for the chemical composition at the measurement point, the coordinates of which comprise details about the concentration of the elements and/or compounds at the measurement point;d) comparing the normalized vector v for the chemical composition at the measurement point with each of the normalized vectors p(i) of the expected crystal structures and outputting an evaluation factor s(i) for the similarity of the vectors in each case;e) comparing the diffraction bands determined at the measurement point with the diffraction bands of the expected crystal structures and outputting an evaluation factor n(i) for the similarity of the diffraction bands; andf) determining an overall quality from the two evaluation factors s(i) and n(i) and identifying the crystal structure with the highest overall quality as belonging to the measurement point.2. The method according to claim 1 , wherein the evaluation factor s(i) from step e) is determined as the reciprocal of the distance or square of the distance of the normalized vector v of the chemical composition at the measurement point from the relevant normalized vector p(i) ...

METHODS AND COMPOSITIONS FOR MICRO-ELECTRON DIFFRACTION

A sample preparation method includes disposing a microcrystal on an electrically conductive grid, coating the microcrystal with an electrically conductive material to yield a coated microcrystal, milling the coated microcrystal with a first ion beam to yield a milled microcrystal, and polishing the milled microcrystal with a second ion beam to yield a polished microcrystal. A length of a side of the milled microcrystal is between about 250 nm and about 500 nm, and a length of the corresponding side of the polished microcrystal is between about 150 nm and about 250 nm. Assessing the crystal structure of the polished microcrystal includes rotating the polished microcrystal while accelerating electrons toward the polished microcrystal, diffracting the electrons from the polished microcrystal to yield a multiplicity of diffraction patterns, and assessing, from the multiplicity of diffraction patterns, the crystal structure of the polished microcrystal. 1. A sample preparation method comprising:disposing a microcrystal on an electrically conductive grid;coating the microcrystal with an electrically conductive material to yield a coated microcrystal;milling the coated microcrystal on the electrically conductive grid with a first ion beam to yield a milled microcrystal, wherein a length of a side of the milled microcrystal is between about 250 nm and about 500 nm; andpolishing the milled microcrystal with a second ion beam to yield a polished microcrystal on the electrically conductive grid, thereby reducing the length of the side of the milled microcrystal to yield a polished microcrystal having a length of a corresponding side between about 150 nm and about 250 nm.2. The sample preparation method of claim 1 , wherein the microcrystal comprises a protein.3. The sample preparation method of claim 1 , wherein coating the microcrystal comprises forming a layer having a thickness between about 25 nm and about 100 nm on the microcrystal.4. The sample preparation method of ...

System and method for colorizing a radiograph from cabinet x-ray systems

A cabinet X-ray image system for obtaining X-ray images and colorized or grey scale density X-ray images of a specimen includes a sampling chamber for containing the specimen, a display, an X-ray system including, an X-ray source, a photon counting X-ray detector, and a specimen platform, and a controller configured to selectively energize the X-ray source, control the photon counting X-ray detector to collect a projection X-ray image of the specimen when the X-ray source is energized, determine the density of different areas of the specimen from data collected from the photon counting X-ray detector of the projection X-ray image, create a density X-ray image of the specimen wherein different areas of the specimen are indicated as a density or range of densities based on the determined density of different areas of the specimen, and selectively display the density X-ray image of the specimen on the display.

3D PRINTED MICROFLUIDIC MIXERS AND NOZZLES FOR CRYSTALLOGRAPHY

A D printed hybrid nozzle device combining a microfluidic mixer with a liquid jet injector that addresses the bottleneck of investigating substrate-initiated biological reaction paths employing serial crystallography with XFELs. The hybrid nozzle provides for injecting aqueous protein crystal jets after fast mixing (<5 ms), reaching reaction time points (e.g., about 10 ms to about 150 ms) suitable to resolve enzyme kinetics. 1. A system for conducting time-resolved serial femtosecond X-ray crystallography , the system comprising: a housing;', 'a first fluid inlet channel formed in the housing and configured to receive a substrate solution,', 'a second fluid inlet channel formed in the housing and configured to receive a crystal suspension, and', 'an outlet channel formed in the housing and coaxially formed with the second fluid inlet channel and in fluid communication with the first fluid inlet channel to provide mixing of the substrate solution and the crystal suspension within 1 ms to 5 ms, and', 'wherein the mixture is transported to a chamber via the liquid jet injector for crystallographic analysis., 'a hybrid nozzle including a microfluidic mixer integrally formed with a liquid jet injector, the hybrid nozzle further including'}2. The system of claim 1 , wherein the outlet channel provides mixing of the substrate solution and the crystal suspension in less than 3 ms.3. The system of claim 1 , wherein the first fluid inlet channel includes a first portion having a first diameter claim 1 , a second portion having a second diameter less than the first diameter claim 1 , and a third portion having a third diameter less than the first diameter and the second diameter.4. The system of claim 3 , wherein the first fluid inlet channel includes a first terminal end that merges with the outlet channel and transports the substrate solution into the outlet channel.5. The system of claim 4 , wherein the first fluid inlet channel defines an axis claim 4 , and wherein the ...

APPARATUS FOR X-RAY INSPECTION, AND A METHOD FOR MANUFACTURING A SEMICONDUCTOR DEVICE USING THE SAME

An apparatus for X-ray inspection is provided. The apparatus includes: a stage on which an inspection target is loaded, the stage including a first surface and an opposite second surface; an X-ray generator disposed on or over the first surface of the inspection target and configured to irradiate the inspection target with incident X-rays; and a detection system disposed on or under the second surface of the inspection target and configured to detect first transmitted X-rays transmitted through the inspection target. The detection unit includes a first lens system and a second lens system. The first transmitted X-rays pass through one of the first lens system and the second lens system. The second lens system includes a micro zone plate. 1. An apparatus for X-ray inspection comprising:a stage on which an inspection target is loaded, the stage including a first surface and an opposite second surface;an X-ray generator disposed on or over the first surface of the inspection target and configured to irradiate the inspection target with incident X-rays; anda detection system disposed on or under the second surface of the inspection target and configured to detect first transmitted X-rays transmitted through the inspection target,wherein the detection system includes a first lens system and a second lens system,the first transmitted X-rays pass through one of the first lens system and the second lens system, andthe second lens system includes a micro zone plate (MZP).2. The apparatus for X-ray inspection of claim 1 , wherein the first lens system comprises a first scintillator and a magnifying lens of n magnification claim 1 , with n being greater than one claim 1 ,the second lens system comprises a second scintillator and a relay lens of an equal magnification,when the first transmitted X-rays pass through the first lens system, the first transmitted X-rays pass through the first scintillator and are converted into first ultraviolet rays, and the first ultraviolet rays ...

Anti-Frosting and Anti-Dew Device for Spectroscopic Measurements

The present invention relates to a device for spectroscopic measurements, in particular X-ray diffraction (XRD), temperature-resolved second harmonic generation (TR-SHG) or infrared (IR) measurements, which prevents the formation of condensation (dew) or ice (frost) when carrying out spectroscopic measurements in sub-ambient temperature conditions and to a method of spectroscopic measurements with said device.

Systems and methods for materials analysis

A system for the x-ray topography analysis of a sample, comprising in combination, a goniometer having a base, a tube arm rotatably associated with the base, a detector arm rotatably associated with the base, and a sample stage operatively associated with the base. The system also includes an x-ray source operatively coupled with the tube arm and is capable of emitting a non-collimated beam of x-rays. A collimator is operatively associated with the x-ray source and converts the non-collimated beam of x-rays into a collimated beam of x-rays having a quasi-rectangular shape with a divergence less than three degrees in all directions. A detector operatively coupled to the detector arm.

ANALYSIS OF ANTIMICROBIAL COATINGS USING XRF

A method of quantifying an antimicrobial coatings using a handheld XRF analyzer is disclosed. The method provides an estimate of the expected level of antimicrobial efficacy for a thin film comprising silicon and/or titanium by obtaining a Si or Ti peak intensity using XRF spectroscopy and converting the obtained Si or Ti peak intensity to the expected level of efficacy using a calibration curve. A properly calibrated handheld XRF analyzer allows a user to assess the viability of antimicrobial coatings in the field, such as in a hospital where various fomites may be coated with silane and/or titanium compositions. 1. A method of estimating an expected level of residual antimicrobial efficacy for an antimicrobial coating comprising an organosilane having a quaternary ammonium chloride substituent , the method comprising:{'sub': '17', 'obtaining Cl photon counts from the antimicrobial coating using XRF spectroscopy; and'}{'sub': '17', 'converting the obtained Cl photon counts to the expected level of residual antimicrobial efficacy using a calibration curve.'}2. The method of claim 1 , wherein the organosilane having a quaternary ammonium chloride substituent is selected from the group consisting of 3-(trimethoxysilyl) propyl dimethyl octadecyl ammonium chloride claim 1 , 3-(trihydroxysilyl) propyl dimethyl octadecyl ammonium chloride claim 1 , homopolymers therefrom claim 1 , and mixtures thereof.3. The method of claim 1 , wherein the antimicrobial coating further comprises at least one of 3-chloropropyltrimethoxysilane claim 1 , 3-thioropropyltriethoxysilane claim 1 , 3-chloropropylsilanetriol claim 1 , 3-aminopropyltrimethoxysilane claim 1 , 3-aminopropyltdethoxysilane claim 1 , or 3-aminopropylsilanetriol.4. The method of claim 1 , wherein the antimicrobial coating further comprises an organic amine.5. The method of claim 1 , wherein the step of obtaining the Cl photon counts comprises irradiation of the antimicrobial coating with X-rays emanating from a handheld ...

MICROFLUIDIC DEVICES AND METHODS OF MANUFACTURE AND USE THEREOF

This invention provides microfluidic devices with graphene films as architectural materials and methods of fabrication and use thereof in X-ray analysis. 2. The microfluidic device of claim 1 , further comprising:an inlet port in fluidic communication with the sample holding chamber; andan outlet port in fluidic communication with the sample holding chamber.3. The microfluidic device of claim 1 , wherein the top support layer comprises a thermal plastic material.4. (canceled)5. The microfluidic device of claim 1 , wherein the top support layer comprises an epoxy-based polymer.6. (canceled)7. The microfluidic device of claim 1 , wherein the bottom support layer comprises a thermal plastic material.8. The microfluidic device of claim 1 , wherein the bottom support layer comprises a material selected from the group consisting of polyester claim 1 , cyclic olefin copolymer claim 1 , polycarbonate claim 1 , acrylic claim 1 , polytetrafluoroethylene and poly(dimethylsiloxane).9. The microfluidic device of claim 1 , wherein the bottom support layer comprises an epoxy-based polymer.10. The microfluidic device of claim 1 , wherein the bottom support layer comprises a material selected from the group consisting of SU-8 photoresist claim 1 , Norland optical adhesive claim 1 , mylar claim 1 , glass claim 1 , silicon claim 1 , and silicon nitride.11. (canceled)12. The microfluidic device of claim 1 , wherein the middle layer comprises cyclic olefin copolymer.1314-. (canceled)15. The microfluidic device of claim 1 , wherein the top layer and the middle layer is joined together by an adhesive layer therebetween and/or wherein the bottom layer and the middle layer is joined together by an adhesive layer therebetween.16. (canceled)17. The microfluidic device of claim 15 , wherein the adhesive layer comprises a material selected from the group consisting of acrylic adhesive claim 15 , UV-curing adhesive claim 15 , and epoxy-based adhesive.18. The microfluidic device of claim 1 , ...

METHODS OF EXTENDING A RANGE FOR ASSIGNING ATTRIBUTES TO AN OBJECT IN AN IMAGE

There is provided a method for assigning an attribute to x-ray attenuation including the steps of acquiring first and second reference material equivalent path length information associated with a first range of dual-energy x-ray attenuation information, acquiring second and third reference material equivalent path length information associated with a second range of dual-energy x-ray attenuation information, and, joining the first the first dual-energy x-ray attenuation information range with the second dual-energy x-ray attenuation information range using coefficients representing dual-energy x-ray attenuation information of the second reference material to define a third dual-energy x-ray attenuation information range upon which may be imposed dual-energy x-ray attenuation values within the third dual-energy x-ray attenuation information range to determine corresponding first reference material equivalent path lengths and third reference material equivalent path lengths. 1. A method for assigning an attribute to x-ray attenuation comprising:acquiring first and second reference material equivalent path length information associated with a first range of dual-energy x-ray attenuation information;acquiring second and third reference material equivalent path length information associated with a second range of dual-energy x-ray attenuation information; and,joining the first the first dual-energy x-ray attenuation information range with the second dual-energy x-ray attenuation information range using coefficients representing dual-energy x-ray attenuation information of the second reference material to define a third dual-energy x-ray attenuation information range upon which may be imposed dual-energy x-ray attenuation values within the third dual-energy x-ray attenuation information range to determine corresponding first reference material equivalent path lengths and third reference material equivalent path lengths.2. The method as in claim 1 , wherein the step of ...

IMAGE PROCESSING DEVICE, IMAGE PROCESSING METHOD AND CHARGED PARTICLE MICROSCOPE

An object of the invention is to quantitatively evaluate crystal growth amount in a wide range from an undergrowth state to an overgrowth state with nondestructive inspection. By using a plenty of image feature values such as pattern brightness, a pattern area and a pattern shape which are extracted from an SEM image, and depending on whether brightness inside a pattern is lower than brightness outside the pattern (), undergrowth and overgrowth is determined (). Based on a brightness difference or the pattern area, a growth amount index or a normality index of crystal growth in a concave pattern such as a hole pattern or a trench pattern is calculated (). 1. An image processing device , whereinpattern brightness and a pattern area are extracted as image feature values from an image of a concave pattern obtained by a charged particle beam microscope, anda growth amount index of crystal growth in the pattern is calculated by using the pattern brightness and the pattern area which are extracted.2. The image processing device according to claim 1 , whereinin a case where brightness inside the pattern is lower than brightness outside the pattern, a brightness difference between the brightness inside the pattern and the brightness outside the pattern is measured, and the growth amount index is calculated based on the brightness difference and a first calibration curve prepared in advance, andin a case where the brightness inside the pattern is higher than the brightness outside the pattern, the growth amount index is calculated based on the pattern area and a second calibration curve prepared in advance.3. The image processing device according to claim 1 , whereina pattern shape is extracted from the image of the pattern as the image feature value.4. The image processing device according to claim 3 , whereinthe pattern shape refers to a degree of circularity of the pattern, and a degree of tetragon to a degree of hexagon of the pattern.5. The image processing device ...

METHOD OF MEASURING DEPTH OF DAMAGE OF WAFER

The method of an embodiment includes the steps of: obtaining a first rocking curve with respect to a wafer obtained using an X-ray diffraction device; setting an X-ray incident angle range having a higher intensity than a reference level in the first rocking curve, calculating an inter-plane spacing for the set X-ray incident angle, calculating a strain value of the wafer using the calculated inter-plane spacing, and calculating sampled strain values on the basis of the calculated strain value; modeling a thickness according to the degree of damage of the wafer on the basis of the intensities of X-ray diffraction beams corresponding to the sampled strain values; obtaining a second rocking curve on the basis of the set X-ray incident angle range, the calculated inter-plane spacing, the sampled strain values and the modeled thickness; matching the second rocking curve to the first rocking curve by changing at least one of the X-ray incident angle range, the inter-plane spacing, the sampled strain values and the modeled thickness; and calculating the depth of damage of the wafer on the basis of the matching result. 1. A method of measuring a depth of damage to a wafer , comprising:acquiring a first rocking curve for a prepared wafer using an X-ray diffraction apparatus;setting an X-ray incident angle range having a higher intensity than a reference level in the first rocking curve, calculating an interplanar distance for the set X-ray incident angle, calculating strain values of the wafer using the calculated interplanar distance, and extracting sampled strain values based on the calculated strain values;modeling a thickness according to a degree of damage to the wafer, based on an intensity of an X-ray diffraction beam corresponding to each of the sampled strain values;acquiring a second rocking curve, based on the set X-ray incident angle range, the calculated interplanar distance, the sampled strain values, and the modeled thickness;matching the second rocking curve ...

MULTI-ENERGY SPECTRUM X-RAY GRATING-BASED IMAGING SYSTEM AND IMAGING METHOD

The present disclosure relates to a multi-spectrum X-ray grating-based imaging system and imaging method. The multi-spectrum X-ray grating-based imaging system according to the present disclosure comprises an incoherent X-ray source for emitting X-rays to irradiate an object to be detected, a grating module comprising a first absorption grating and a second absorption grating which are disposed in parallel to each other and are sequentially arranged in an X-ray propagation direction, and an energy-resolved detecting device for receiving the X-rays that have passed through the first absorption grating and the second absorption grating. One of the first absorption grating and the second absorption grating performs phase stepping actions within at least one period; during each phase stepping action, the incoherent X-ray source emits X-rays to irradiate the object to be detected; the energy-resolved detecting device receives the X-rays and performs spectrum identification of the X-rays; and after a series of phase stepping actions and data acquisitions over a period, at each pixel on the energy-resolved detecting device, X-ray intensities in each energy range are represented as an intensity curve. 1. A multi-spectrum X-ray grating-based imaging system , comprising:an incoherent X-ray source, for emitting X-rays to irradiate an object to be detected;a grating module, comprising a first absorption grating and a second absorption grating which are disposed in parallel to each other and are sequentially arranged in an X-ray propagation direction; andan energy-resolved detecting device, for receiving the X-rays that have passed through the first absorption grating and the second absorption grating.2. The multi-spectrum X-ray grating-based imaging system according to claim 1 , wherein the grating module is configured such that one of the first absorption grating and the second absorption grating performs phase stepping actions within at least one period claim 1 ,wherein ...

ANALYSIS OF ANTIMICROBIAL COATINGS USING XRF

A method of quantifying an antimicrobial coatings using a handheld XRF analyzer is disclosed. The method provides an estimate of the expected level of antimicrobial efficacy for a thin film comprising silicon and/or titanium by obtaining a Si or Ti peak intensity using XRF spectroscopy and converting the obtained Si or Ti peak intensity to the expected level of efficacy using a calibration curve. A properly calibrated handheld XRF analyzer allows a user to assess the viability of antimicrobial coatings in the field, such as in a hospital where various fomites may be coated with silane and/or titanium compositions. 1. A method of estimating an expected level of residual antimicrobial efficacy for an antimicrobial coating comprising silicon and/or titanium , the method comprising:{'sub': 14', '22, 'obtaining Si or Ti photon counts from the antimicrobial coating using XRF spectroscopy; and'}{'sub': 14', '22, 'converting the obtained Si or Ti photon counts to the expected level of residual antimicrobial efficacy using a calibration curve.'}2. The method of claim 1 , wherein the antimicrobial coating comprises a silane selected from the group consisting of 3-(trimethoxysilyl) propyl dimethyl octadecyl ammonium chloride claim 1 , 3-(trihydroxysilyl) propyl dimethyl octadecyl ammonium chloride claim 1 , 3-chloropropyltrimethoxysilane claim 1 , 3-chloropropyltriethoxysilane claim 1 , 3-chloropropylsilanetriol claim 1 , 3-aminopropyltrimethoxysilane claim 1 , 3-aminopropyltriethoxysilane claim 1 , 3-aminopropylsilanetriol claim 1 , homopolymers therefrom claim 1 , and mixtures thereof.3. The method of claim 1 , wherein the antimicrobial coating comprises nanoparticulate TiO.4. The method of claim 1 , wherein the step of obtaining the Si or Ti photon counts comprises irradiation of the antimicrobial coating with X-rays emanating from a handheld XRF analyzer and detecting X-ray emissions from the coating.5. The method of claim 1 , wherein the calibration curve comprises an x/y ...

Calculation system and calculation method

There is provided a calculating system that can calculate only a gradation image of only a measurement target in monitoring large-scale facility using a transmission imaging on the basis of a cosmic ray. In addition to a gradation image on the basis of a flight track of the cosmic ray, a gradation image of the density length on the basis of structure information of a structural object which is not a measurement target is made and used to correct the gradation image on the basis of the flight track of the cosmic ray.

Laminate state calculation method, laminated state calculation apparatus, and laminated state calculation program

A method for calculating a laminate state of a CFRP laminate according to an embodiment includes acquiring a plurality of images of a cross section of the CFRP laminate orthogonal to a lamination direction by imaging the CFRP laminate with X-rays at a plurality of different positions in the lamination direction, the CFRP laminate including first layers including carbon fibers oriented in a first direction orthogonal to the lamination direction and second layers including carbon fibers oriented in a second direction orthogonal to the lamination direction and different from the first direction, and calculating a parameter correlated with a quantity of voids formed in the first layers and the second layers from the plurality of acquired images, and distinguishing between the first layers and the second layers using the calculated parameter.

System and Method for Authenticating an Additively Manufactured Component

A system and method for authenticating an additively manufactured component is provided. The method includes locating an identifying region of the component that includes localized density variations that define a component identifier. The method further includes interrogating the identifying region of the component using a scanning device such as an x-ray computed tomography device to obtain the component identifier. The method further includes obtaining a reference identifier from a database, comparing the component identifier to the reference identifier, and determining that the component is authentic if the component identifier matches the reference identifier. 1. A method of authenticating an additively manufactured component , the method comprising:locating an identifying region of the component, the identifying region comprising localized density variations that define a component identifier of the component;obtaining data indicative of the component identifier of the component by interrogating the identifying region of the component using a scanning device; anddetermining that the component is authentic based on the data acquired by the scanning device.2. The method of claim 1 , wherein locating the identifying region of the component comprises:locating a datum feature on the component, the datum feature being positioned at a predetermined location relative to the identifying region; anddetermining the location of the identifying region based on the location of the datum feature.3. The method of claim 2 , wherein the datum feature is a localized density variation located outside of the identifying region.4. The method of claim 1 , wherein determining that the component is authentic comprises:obtaining a reference identifier from a database;comparing the component identifier to the reference identifier; anddetermining that the component is authentic if the component identifier substantially matches the reference identifier.5. The method of claim 1 , wherein ...

Methods of determining the mineralogy of calcined and flux-calcined diatomite

A method of determining opal-C and cristobalite contents of a product that comprises diatomite is disclosed. The method may comprise performing thermal processing to determine a loss on ignition for a representative first portion of a sample of the product; identifying and quantifying primary and secondary peaks present in a first diffraction pattern that results from bulk powder X-ray Diffraction on a representative second portion of the sample; and using a known standard sample of cristobalite to determine whether the primary and secondary peaks present in the first diffraction pattern indicate the presence of opal-C or cristobalite in the product.

DEVICE AND METHOD FOR DETERMINING THE MICROSTRUCTURE OF A METAL PRODUCT, AND METALLURGICAL INSTALLATION

A device for determining the microstructure of a metal product during metallurgical production of the metal product, the device having at least one X-ray source, at least one X-ray detector and at least one accommodating chamber, inside which the X-ray source and/or the X-ray detector is/are arranged and which has at least one window which is transparent to X-ray radiation. To allow reliable determination of the microstructure of a metal product during the metallurgical production thereof, the device includes at least one cooling installation for actively cooling the accommodating chamber. 117-. (canceled)18. A device for determining a microstructure of a metal product during a metallurgical production of the metal product , said device comprising: at least one x-ray source; at least one x-ray detector; at least one receptacle chamber , the x-ray source and/or the x-ray detector being disposed within said receptacle chamber , and said receptacle chamber having at least one window that is permeable to x-ray radiation; at least one cooling installation for actively cooling the receptacle chamber , wherein the cooling installation includes at least one supply installation for supplying at least one cooling medium to the receptacle chamber , wherein the receptacle chamber is connected so as to communicate with the supply installation , wherein the cooling installation further includes at least one regulating installation which has at least one sensor and at least one regulating electronics unit that is connected to the at least one sensor , wherein the regulating electronics unit is specified for actuating the at least one supply installation while taking into account signals of the at least one sensor , wherein the cooling installation has a housing and the regulating electronics unit is specified for actuating the at least one supply installation so that a temperature of an external face and/or an internal face of the housing lies above a dew point temperature of an ...

MODEL CREATION METHOD AND DEVICE, AND INSPECTION DEVICE USING THE SAME

There is provided an analysis model creation method which is capable of simply and quickly creating an accurate analysis model with respect to a structure including a crystalline material. In order to solve a problem described above, there is provided a model creation method of an analysis region used in numeral analysis, the method including a step of designating a crystal growth direction if a region is a region including crystallinity including acoustic anisotropy in the analysis region, a step of selecting partial image data to which the crystallinity of the region is reflected, a step of rotating and operating the partial image data along the crystal growth direction, and a step of creating image data which is covered in the region designated using the rotated partial image data. 1. A model creation method of an analysis region used in numeral analysis , the method comprising:a step of designating a crystal growth direction if a region is a region including crystallinity having acoustic anisotropy in the analysis region;a step of selecting partial image data to which the crystallinity of the region is reflected; anda step of rotating and operating the partial image data along the crystal growth direction; anda step of creating image data covered in the region designated using the rotated partial image data.2. The creation method according to claim 1 ,wherein the image data is image data of a metal surface acquired by an electron beam backward scattered diffraction device.3. The model creation method according to claim 1 ,wherein the image data is image data of a metal surface acquired by optical photographing means after etching the metal surface.4. The model creation method according to claim 1 ,wherein the image data is image data generated by a simulation using a phase-field method.5. The model creation method according to claim 1 , further comprising:a step of analyzing colors and a contrasting density of a pixel constituting the created image data and ...

INFORMATION PROCESSING APPARATUS, RADIATION IMAGING APPARATUS, INFORMATION PROCESSING METHOD, AND STORAGE MEDIUM

An information processing apparatus that processes information based on a radiation image capturing a subject, comprises: an average value obtainment unit configured to obtain an average value of pixel values of the radiation image; a variance value obtainment unit configured to obtain a variance value of the pixel values of the radiation image; and an arithmetic processing unit configured to calculate, based on the average value and the variance value, one of an effective atomic number and a surface density forming the subject. 1. An information processing apparatus that processes information based on a radiation image capturing a subject , comprising:an average value obtainment unit configured to obtain an average value of pixel values of the radiation image;a variance value obtainment unit configured to obtain a variance value of the pixel values of the radiation image; andan arithmetic processing unit configured to calculate, based on the average value and the variance value, one of an effective atomic number and a surface density forming the subject.2. The information processing apparatus according to claim 1 , wherein the arithmetic processing unit calculates the effective atomic number based on a rate of change of a pixel average value of a radiation image which is obtained based on an energy spectrum and an attenuation coefficient of radiation with which the subject is irradiated claim 1 , a rate of change of the pixel average value with respect to the surface density claim 1 , and a difference between the average value and the pixel average value.3. The information processing apparatus according to claim 2 , wherein the arithmetic processing unit calculates the surface density based on a rate of change of a pixel variance value of a radiation image which is obtained based on the energy spectrum of the radiation with which the subject is irradiated and the attenuation coefficient claim 2 , a rate of change of the pixel variance value with respect to the ...

X-Ray Based Fatigue Inspection of Downhole Component

Using an X-ray diffractometer, a processing device, and memory, a database models estimates of a number of cycles to failure for each of a plurality of materials. The model estimates are performed on the material at a plurality of applied fatigues up to a failure point and are based on parameters including residual stress, the micro-strain, and the ratio between X-Ray peak intensity and background intensity of the component material. To inspect a component, the material of the component is selected in the database, and measurements are obtained at two or more different depths of at least a portion of the component. Information about current residual stress, micro-strain, and ratio between X-Ray peak intensity and background intensity are determined from the obtained measurements. Then, a fatigue life of the portion of the component is estimated by matching the information to at least one of the modelled estimates of the number of cycles to failure in the database for the selected material. 1. A method implemented using an X-ray diffractometer , at least one processing device , and memory , the method comprising: obtaining, using at least two different incident beams of the X-ray diffractometer, sample measurements of the each component material at each of a plurality of applied fatigues up to a failure point of the each component material;', 'determining, with the at least one processing device from the sample measurements, sample information about the each component material, the sample information including a sample residual stress at each of the applied fatigues and including sample micro-strains at each of the applied fatigues and at at least two different depths in the each component material related to the at least two incident beams; and', 'modelling, with the at least one processing device from the sample information, one or more estimates of a number of cycles to failure for the each component material; and, 'analyzing each of a plurality of component ...

Method and Apparatus for Determining Lattice Parameters of a Strained III-V Semiconductor Layer

A multi-layer arrangement of III-V semiconductor layers includes a strained III-V semiconductor layer having a concentration of a constituent element which effects intensity of a conductive channel formed in the multi-layer arrangement. Lattice parameters of the strained III-V semiconductor layer are determined by generating a first scan in a Qx direction for a chosen reflection in reciprocal space based on diffracted X-Ray beam intensity measurements in the Qx direction. A second scan is generated in a Qz direction for the chosen reflection in the reciprocal space based on diffracted X-Ray beam intensity measurements in the Qz direction. The second scan is aligned with a diffracted X-Ray peak in the first scan which identifies the strained III-V semiconductor layer. The degree of strain of the strained III-V semiconductor layer is determined based on the first scan and the concentration of the constituent element based on the second scan. 1. A method of determining lattice parameters of a strained III-V semiconductor layer of a multi-layer arrangement of III-V semiconductor layers , the strained III-V semiconductor layer having a concentration of a constituent element which effects intensity of a conductive channel formed in the multi-layer arrangement , the method comprising:generating a first scan of the multi-layer arrangement in a Qx direction for a chosen reflection in reciprocal space based on diffracted X-Ray beam intensity measurements in the Qx direction, the reciprocal space describing positions of diffracted X-Ray peaks of the III-V semiconductor layers with respect to one another;generating a second scan of the multi-layer arrangement in a Qz direction for the chosen reflection in in the reciprocal space based on diffracted X-Ray beam intensity measurements in the Qz direction, the second scan being aligned with a diffracted X-Ray peak in the first scan which identifies the strained III-V semiconductor layer; anddetermining a degree of strain of the ...

Crystalline Phase Identification Method, Crystalline Phase Identification Device, and X-Ray Diffraction Measurement System

A crystalline phase contained in a sample is identified, from X-ray diffraction data of the sample which contain data of a plurality of ring-shaped diffraction patterns, using a database in which are registered data related to peak positions and peak intensity ratios of X-ray diffraction patterns for a plurality of crystalline phases. Peak positions and peak intensities for a plurality of the diffraction patterns are detected from the X-ray diffraction data (step ), and the circumferential angle versus intensity data of the diffraction patterns is created (step ). The diffraction patterns are grouped into a plurality of clusters on the basis of the circumferential angle versus intensity data (step ). Crystalline phase candidates contained in the sample are searched from the database on the basis of sets of ratios of peak positions and peak intensities of the diffraction patterns grouped into the same cluster (step ). 1. A crystal phase identification method for identifying a crystal phase contained in a sample ,from X-ray diffraction data of the sample which contain data of a plurality of ring-shaped diffraction patterns,using a database in which are registered data related to peak positions of X-ray diffraction patterns for a plurality of crystal phases and data related to peak intensity ratios of X-ray diffraction patterns for a plurality of crystal phases, comprising:detecting peak positions and peak intensities for a plurality of the diffraction patterns from the X-ray diffraction data;creating circumferential angle versus intensity data for a plurality of the diffraction patterns from the X-ray diffraction data;grouping the diffraction patterns into a plurality of clusters on the basis of the circumferential angle versus intensity data thus created; andsearching the sample for crystal phase candidates contained therein from the database on the basis of sets of ratios of peak positions and peak intensities of the diffraction patterns grouped into the same ...

Method for measuring residual stress

The present invention is a method for measuring a residual stress in a cast and forged steel product, the method using X-rays, including: irradiating a cast and forged steel product with X-rays; two-dimensionally detecting intensities of diffracted X-rays originating from the X-rays; and calculating a residual stress based on a diffraction ring formed by an intensity distribution of the diffracted X-rays detected in the detecting, wherein, when the residual stress is measured for each of a plurality of measurement positions of the cast and forged steel product, the residual stress for each of the measurement positions is calculated in the calculating based on the diffraction ring for each of the measurement positions and an X-ray elastic constant which varies for each of the measurement positions.

X-RAY DIFFRACTION ANALYSIS METHOD AND X-RAY DIFFRACTION ANALYSIS APPARATUS

An X-ray diffraction analysis method includes, placing a sample on a sample stage and acquiring a two-dimensional X-ray diffraction image from the sample using a two-dimensional detection circuit by irradiating the sample with an X-ray in a state where an X-ray irradiation angle is fixed, specifying a collection of diffraction spots having a predetermined range of diffraction angles from the X-ray diffraction image as a diffraction spot group, counting the number of diffraction spots having predetermined intensity or more in the diffraction spot group, grouping the diffraction spot group based on the number of diffraction spots, and identifying a crystal phase contained in the sample based on a diffraction angle of the grouped diffraction spot group. 1. An X-ray diffraction analysis method comprising:placing a sample on a sample stage and acquiring a two-dimensional X-ray diffraction image from the sample using a two-dimensional detection circuit by irradiating the sample with an X-ray in a state where an X-ray irradiation angle is fixed;specifying a collection of diffraction spots having a predetermined range of diffraction angles from the X-ray diffraction image as a diffraction spot group;counting the number of diffraction spots having predetermined intensity or more in the diffraction spot group;grouping the diffraction spot group based on the number of diffraction spots andidentifying a crystal phase contained in the sample based on a diffraction angle of the grouped diffraction spot group.2. The X-ray diffraction analysis method according to claim 1 , further comprising:calculating an X-ray diffraction profile of a relationship between diffraction angle and intensity by integrating the intensity of the diffraction spot in a crystal orientation; andidentifying the crystal phase based on the X-ray diffraction profile.3. The X-ray diffraction analysis method according to claim 1 , wherein the act of counting the number of diffraction spots includes counting the ...

Macrotexture Map Visualizing Texture Heterogeneity in Polycrystalline Parts

This invention provides a method, system, and computer program to visualize texture (crystal orientation distribution) heterogeneity in polycrystalline aggregate part in large length scale. This is a critical representation step for microstructure characterization, useful in effective behavior simulation, risk analysis and hotspot identification. In contrast to orientation image map where each color component represents a crystal orientation, each color in this macrotexture map represents a set of texture. Different color represent different texture and similar texture shall have similar color. This method will provide a critical tool in evaluating texture heterogeneity of components, leading to a first-hand understanding of property heterogeneity and anisotropy. For an experienced user, these maps serve the same purpose in identifying high risk locations in the investigated component as medical imaging maps do for diagnosis purpose. This method will also serve as a starting point in mesoscale simulation with meshing sensitivity based on the texture heterogeneity. It will provide a bridge between texture characterization and behavior simulation of component with texture heterogeneity. This method will also offer a linkage between crystal plasticity simulation in small length scale and finite element/difference simulation in large length scale. 1. A method for visualizing texture heterogeneity by a macrotexture map , where a color code is defined by a texture parameter set representing local textures. Texture is distribution of crystal orientation. Texture heterogeneity is distribution of texture.2. The method as recited in claim 1 , wherein the texture parameter set is composed of weights of texture components used to express local textures.3. The method as recited in claim 2 , wherein the texture components include peak components claim 2 , fiber components claim 2 , random texture claim 2 , and user defined textures.4. The method as recited in claim 1 , wherein ...

METHOD FOR NON-DESTRUCTIVE TESTING OF A TURBOMACHINE PART

A method for controlling the crystallographic orientation of at least one grain of a turbo engine part. The method includes emitting a beam of electromagnetic radiation through an elementary volume of the part and record diffraction information on the electromagnetic radiation passing through the part. This step is repeated on a given area of the part. The method further includes determining the crystal spatial orientation of each of said elementary volumes and deducting the presence of at least one first crystallographic grain for which the elementary volumes are oriented according to the same crystallographic orientation. The method further includes calculating the angular difference between the crystal spatial orientation of said first grain and a predetermined direction taken from the part and comparing it to a first predetermined threshold value and determining a state of use of the part. 1. A method for controlling the crystal orientation of at least one crystallographic grain of a turbo engine part , comprising the steps of:a) emitting a beam of electromagnetic radiation through an elementary volume of the part and record diffraction information on the electromagnetic radiation passing through the part;b) repeating step a) on a given area of the part,c) determining the crystal spatial orientation of each of said elementary volumes and deducting the presence of at least one first crystallographic grain for which the elementary volumes are oriented according to the same crystallographic orientation;d) calculating the angular difference between the crystal spatial orientation of said first grain and a predetermined direction taken from the part and comparing it to a first predetermined threshold value;e) determining a state of use of the part.2. The method according to claim 1 , which further comprises the following steps:i. identifying in the given area the presence of at least a first and second distinct crystallographic grain from the diffraction information; ...

METHOD FOR CALIBRATING A RADIOMETRIC DENSITY MEASURING APPARATUS

The invention relates to a method for calibrating a radiometric apparatus for determining and/or monitoring density of a medium () located in a container (). The method includes method steps as follows: 1613434367614. Method for calibrating a radiometric apparatus for determining and/or monitoring density of a medium () located in a container () , wherein a transmitting unit () and a receiving unit () are provided , wherein the transmitting unit () transmits radioactive radiation of a predetermined intensity and wherein the receiving unit () receives radioactive radiation transmitted by the transmitting unit () after passage through the medium () , and wherein a control/evaluation unit () is provided , which determines density of the medium () located in the container () based on intensity measured by the receiving unit () , wherein the method comprises method steps as follows:{'sub': C', '0', '0', '0', 'C', '0', '0, 'b': 1', '1', '1', '1, 'sup': −μ', {'sub2': 'C'}, '·ρ1D, 'determining the mass attenuation coefficient μof the empty container () with application of the half value thickness N/N=0.5 of the radioactive radiation upon passage through the empty container () according to the formula: N/N˜I/I=e, with μ: mass attenuation coefficient, ρ: density of the material of the wall of the container, D: distance traveled by the radiation, or inner diameter of the container (), I: intensity of the measured radiation, Iintensity of the transmitted radiation, N measured counting rate, Ncounting rate of the transmitted radiation,'}{'sub': 'M', 'b': 1', '2', '1, 'determining the mass attenuation coefficient (μ) based on the measured intensity, or the counting rate, of the radioactive radiation after passage through the container (), when a calibration medium of known density (ρ) is located in the container (),'}{'b': '1', 'ascertaining the dependence of the linear absorption coefficient (p) on the geometric dimensions of the container () based on the two mass attenuation ...

Methods for in situ monitoring and control of defect formation or healing

Production of perforated two-dimensional materials with holes of a desired size range, a narrow size distribution, and a high and uniform density remains a challenge, at least partially, due to physical and chemical inconsistencies from sheet-to-sheet of the two-dimensional material and surface contamination. This disclosure describes methods for monitoring and adjusting perforation or healing conditions in real-time to address inter- and intra-sheet variability. In situ or substantially simultaneous feedback on defect production or healing may be provided either locally or globally on a graphene or other two-dimensional sheet. The feedback data can be used to adjust perforation or healing parameters, such as the total dose or efficacy of the perforating radiation, to achieve the desired defect state.

Density measurement with gamma backscattering

Measurement of density with application of reverse scattering of gamma-radiation

FIELD: physics. ^ SUBSTANCE: device comprises one source of gamma-radiation located next to reservoir, one detector of gamma radiation located next to reservoir, in which one detector of gamma-radiation is configured to detect gamma radiation from one source of gamma radiation scattered in reverse direction by fluid medium; and converter for transformation of detected gamma radiation scattered in reverse direction into density value. Method includes: location of gamma radiation source next to reservoir; location of gamma radiation detector next to reservoir; detection of gamma radiation from source of gamma radiation scattered in reverse direction with fluid medium, by detector of gamma radiation; detection of fluid medium density on the basis of gamma radiation intensity scattered in reverse direction and perceived by detector of gamma radiation. ^ EFFECT: efficient detection of fluid medium density variances in different sectors of reservoir. ^ 19 cl, 12 dwg, 2 tbl РОССИЙСКАЯ ФЕДЕРАЦИЯ (19) RU (11) 2 386 946 (13) C2 (51) МПК G01N 9/00 (2006.01) ФЕДЕРАЛЬНАЯ СЛУЖБА ПО ИНТЕЛЛЕКТУАЛЬНОЙ СОБСТВЕННОСТИ, ПАТЕНТАМ И ТОВАРНЫМ ЗНАКАМ (12) ОПИСАНИЕ ИЗОБРЕТЕНИЯ К ПАТЕНТУ (21), (22) Заявка: 2007141885/28, 12.11.2007 (24) Дата начала отсчета срока действия патента: 12.11.2007 (73) Патентообладатель(и): ТЕРМО ФИШЕР САЙЕНТИФИК ИНК. (US) (43) Дата публикации заявки: 20.05.2009 2 3 8 6 9 4 6 (45) Опубликовано: 20.04.2010 Бюл. № 11 (56) Список документов, цитированных в отчете о поиске: WO 03/073938 A1, 12.09.2003. US 5003980 A, 02.04.1991. SU 381984 A1, 01.01.1973. RU 34015 U1, 20.11.2003. 2 3 8 6 9 4 6 R U (54) ИЗМЕРЕНИЕ ПЛОТНОСТИ С ИСПОЛЬЗОВАНИЕМ ОБРАТНОГО РАССЕЯНИЯ ГАММАИЗЛУЧЕНИЯ направлении, в величину плотности. Способ включает: размещение источника гаммаизлучения рядом с резервуаром; размещение детектора гамма-излучения рядом с резервуаром; обнаружение гамма-излучения от источника гамма-излучения, рассеянного в обратном направлении текучей средой, детектором гамма-излучения; ...

利用伽玛背散射的密度测量

本发明公开了一种测量容器中的流体的密度的系统，包括：容器，流体容纳在容器中；至少一个位于容器附近的伽玛射线源；多个位于容器附近的伽玛射线检测器，多个伽玛射线检测器围绕容器彼此沿圆周地定位，配置用于检测由流体背散射的来自至少一个伽玛射线源的伽玛射线；以及用于将所检测到的伽玛射线背散射转换为密度值的转换器。本发明还公开了一种确定容器中的流体性质的方法，包括步骤：将伽玛射线源定位到容器附近；将多个伽玛射线检测器定位到容器附近，以使多个伽玛射线检测器围绕容器彼此沿圆周地定位；以多个伽玛检测器检测被流体背散射的来自伽玛射线源的伽玛射线；基于由多个伽玛射线检测器接收到的背散射伽玛射线的强度确定流体的密度。

Density measurement by gamma backscattering

Nitride crystal, nitride crystal substrate, epilayer-containing nitride crystal substrate, semiconductor device and method of manufacturing the same

본 질화물 결정은, 질화물 결정(1)의 임의의 특정 평행 결정 격자면(1d)의 X선 회절 조건을 만족시키면서 결정의 표면부터의 X선 침입 깊이를 변화시키는 X선 회절 측정으로부터 얻어지는 특정 평행 결정 격자면(1d)의 면 간격에 있어서, 0.3 ㎛의 X선 침입 깊이에서의 면 간격(d 1 )과 5 ㎛의 X선 침입 깊이에서의 면 간격(d 2 )로부터 얻어지는 ｜d 1 -d 2 ｜/d 2 의 값으로 나타내는 결정의 표면층(1a)의 균일한 왜곡(uniform distortion)이 2.1×10 -3 이하인 것을 특징으로 한다. 이에 따라, 반도체 장치용 기판으로서 바람직하게 이용될 수 있도록 결정을 파괴하지 않고 직접적이면서 확실하게 평가된 결정 표면층을 갖는 질화물 결정, 질화물 결정 기판, 에피택셜층 부착 질화물 결정 기판, 반도체 장치 및 그 제조 방법이 제공된다. This nitride crystal is a specific parallel crystal obtained from an X-ray diffraction measurement which changes the X-ray diffraction depth from the surface of the crystal while satisfying the X-ray diffraction conditions of any particular parallel crystal lattice plane 1d of the nitride crystal 1 D 1 -d 2 obtained from the plane spacing d 1 at the X-ray penetration depth of 0.3 μm and the plane spacing d 2 at the X-ray penetration depth of 5 μm in the plane spacing of the lattice plane 1d. The uniform distortion of the surface layer 1a of the crystal represented by the value of | / d 2 is characterized by being 2.1 × 10 −3 or less. Accordingly, nitride crystals, nitride crystal substrates, nitride crystal substrates with epitaxial layers having a crystal surface layer evaluated directly and reliably without destroying the crystals so that they can be preferably used as substrates for semiconductor devices, semiconductor devices and manufacturing methods thereof This is provided.

Analysis apparatus, analysis method and analysis program

An analysis apparatus, an analysis method, and an analysis program by which even unskilled ones can perform quantitative analysis of a composition of high-performance cement with high precision. An analysis apparatus 100 for performing quantitative analysis of components of cement, includes: a content percentage conversion unit 120 for converting content percentages of major elements of a cement sample to content ratios of main crystal phases composing the cement sample by predetermined formulae, the content percentages being obtained as an elemental analysis result; a scale factor estimation unit 140 for estimating initial values of scale factors of Rietveld analysis from the content ratios of main crystal phases obtained in the conversion; and a Rietveld analysis unit 150 for performing Rietveld analysis with respect to an X-ray diffraction measurement result of the cement sample using the initial values of scale factors previously been estimated to calculate content percentages of respective phases of the cement sample.

Analytical equipment, analysis method and analysis program

A method of measuring a demage depth of a wafer

The method of an embodiment includes the steps of: preparing a wafer; obtaining a first rocking curve with respect to the wafer by using an X-ray diffraction device; modeling a thickness according to the degree of damage of the wafer based on the first rocking curve; performing a computer simulation based on the modeling result and obtaining a second rocking curve according to the simulation result; matching the second rocking curve to the first rocking curve; and calculating the depth of damage of the wafer based on the matching result.

Sensor device for a packaging machine designed as a capsule filling and sealing machine or for a capsule control device

본 발명은 캡슐 충전 및 밀폐 기계로서 형성된 포장 기계(100) 또는 캡슐 제어 장치(100a)를 위한 센서 장치(30;30a;30b;30c)에 관한 것으로, 센서 장치는 충전 물질로 채워진, 종축선(15)을 갖는 용기(c)를 센서 장치(30;30a;30b;30c)의 영역에서 위치 설정하기 위한 위치 설정 부재(35;35a), 적어도 하나의 방사선원(31;31a;31b), 및 용기(c)를 통한 방사선 조사 후의 방사선을 검출하기 위한 적어도 하나의 검출기(40;40a;40b)를 포함한다. 본 발명에 따라 적어도 하나의 방사선원(31;31a;31b)은 용기(c)를 통해 그 종축선(15)에 대해 수직으로 방사선 조사하고, 위치 설정 부재는 튜브형 또는 샤프트 형태의 컨베이어 부재(35;35a)로서 형성되고, 상기 부재는 방사선원(31;31a;31b)의 방사선 코운(38) 내에서 방사선에 의해 투과될 수 있다.

Method for continuously monitoring platinum loading capacity change of membrane electrode in real time

本发明公开了一种可实现连续实时监测膜电极铂载量变化的方法，包括如下步骤：步骤S1，利用β射线面密度仪获取燃料电池CCM样品的单位面积的吸收系数；步骤S2，根据所述燃料电池CCM样品取若干组待测样品，将各待测样品利用β射线面密度仪进行测量，利用步骤S1得到的吸收系数，得到各待测样品的膜电极片单位面积的质量m，并将各待测样品使用XRF分析仪测量出每一个待测样品的铂含量，根据该若干组数据的m与铂载量建立拟合的关系曲线。步骤S3，实时采集透过CCM材料待测膜电极的射线强度，经分析可到实时铂载量数值，并绘制成数据图，根据该数据图实时监测铂载量变化。

An apparatus for x-ray inspection, and a method for manufacturing a semiconductor device using the same

본 발명은 엑스선 검사 장비에 관한 것이다. 상기 엑스선 검사 장비는 서로 마주보는 제1 면 및 제2 면을 포함하는 피검사체가 로딩되는 스테이지, 피검사체의 제1 면 상에 배치되고, 피검사체에 입사 엑스선을 조사하는 엑스선 출력부, 및 피검사체의 제2 면 상에 배치되고, 피검사체를 투과하는 제1 투과 엑스선을 검출하는 검출부를 포함하고, 검출부는 제1 렌즈부와 제2 렌즈부를 포함하고, 제1 투과 엑스선은 제1 렌즈부와 제2 렌즈부 둘 중 하나를 통과하고, 제1 렌즈부는 마이크로 존 플레이트(MZP: Micro Zone Plate)를 비포함하고, 제2 렌즈부는 마이크로 존 플레이트를 포함한다.

Nitride crystal, nitride crystal substrate, epilayer-containing nitride crystal substrate, semiconductor device and method of manufacturing the same

A nitride crystal is characterized in that, in connection with plane spacing of arbitrary specific parallel crystal lattice planes of the nitride crystal obtained from X-ray diffraction measurement performed with variation of X-ray penetration depth from a surface of the crystal while X-ray diffraction conditions of the specific parallel crystal lattice planes are satisfied, a uniform distortion at a surface layer of the crystal represented by a value of |d 1 −d 2 |/d 2 obtained from the plane spacing d 1 at the X-ray penetration depth of 0.3 μm and the plane spacing d 2 at the X-ray penetration depth of 5 μm is equal to or lower than 2.1×10 −3 . The above configuration provides the nitride crystal having a crystal surface layer that is evaluated directly and reliably without breaking the crystal so that it can be used in a preferred fashion as a substrate for a semiconductor device as well as the nitride crystal substrate, an epilayer-containing nitride crystal substrate, a semiconductor device and a method of manufacturing the same.

Nitride crystal, nitride crystal substrate, epilayer-containing nitride crystal substrate, semiconductor device and method of manufacturing the same

A nitride crystal is characterized in that, in connection with plane spacing of arbitrary specific parallel crystal lattice planes of the nitride crystal obtained from X-ray diffraction measurement performed with variation of X-ray penetration depth from a surface of the crystal while X-ray diffraction conditions of the specific parallel crystal lattice planes are satisfied, a uniform distortion at a surface layer of the crystal represented by a value of |d1−d2|/d2 obtained from the plane spacing d1 at the X-ray penetration depth of 0.3 μm and the plane spacing d2 at the X-ray penetration depth of 5 μm is equal to or lower than 2.1×10−3. The above configuration provides the nitride crystal having a crystal surface layer that is evaluated directly and reliably without breaking the crystal so that it can be used in a preferred fashion as a substrate for a semiconductor device as well as the nitride crystal substrate, an epilayer-containing nitride crystal substrate, a semiconductor device and a method of manufacturing the same.

Nitride crystal, nitride crystal substrate, epilayer-containing nitride crystal substrate, semiconductor device and method of manufacturing the same

A nitride crystal is characterized in that, in connection with plane spacing of arbitrary specific parallel crystal lattice planes of the nitride crystal obtained from X-ray diffraction measurement performed with variation of X-ray penetration depth from a surface of the crystal while X-ray diffraction conditions of the specific parallel crystal lattice planes are satisfied, a uniform distortion at a surface layer of the crystal represented by a value of |d 1 −d 2 |/d 2 obtained from the plane spacing d 1 at the X-ray penetration depth of 0.3 μm and the plane spacing d 2 at the X-ray penetration depth of 5 μm is equal to or lower than 2.1×10 −3 . The above configuration provides the nitride crystal having a crystal surface layer that is evaluated directly and reliably without breaking the crystal so that it can be used in a preferred fashion as a substrate for a semiconductor device as well as the nitride crystal substrate, an epilayer-containing nitride crystal substrate, a semiconductor device and a method of manufacturing the same.

Changable Type of Apparatus for Inspection with X-ray Having Module Structure

본 발명은 교체 방식 모듈 구조의 엑스레이 검사 장치에 관한 것이고, 구체적으로 모듈 구조로 제조되어 본체로부터 분리가 가능한 구조를 가지면서 이로 인하여 서로 다른 종류의 제품 검사에 대응하여 다양한 구조의 물류 이송 방식에 적용될 수 있도록 하는 교체 방식 모듈 구조의 엑스레이 검사 장치에 관한 것이다. 엑스레이 검사 장치는 엑스레이 튜브(112) 및 디텍터(111)가 설치되어 피검사 대상(D)의 검사가 가능하도록 하는 검사 본체(11); 검사 본체(11)에 결합되어 상기 피검사 대상(D)을 검사 본체(11)에서 이송시키는 이송 모듈(13); 및 검사 본체(11)의 앞쪽 또는 뒤쪽에 설치되는 차폐 커튼 모듈(12a, 12b)을 포함하고, 상기 이송 모듈(13)은 상기 피검사 대상을 연속적으로 이송시키고 그리고 상기 차폐 커튼 모듈(12a, 12b)은 상기 검사 본체(11)로부터 분리 가능하다. The present invention relates to an X-ray inspection apparatus of a replaceable modular structure, and more particularly to a structure capable of being separated from a main body by being manufactured in a modular structure, thereby being applied to a logistics transfer system of various structures corresponding to different types of product inspection To an x-ray inspection apparatus of a replaceable module structure. The X-ray inspection apparatus includes an inspection main body 11 provided with an X-ray tube 112 and a detector 111 to enable inspection of an object to be inspected D; A transfer module (13) coupled to the inspection main body (11) for transferring the inspection subject (D) from the inspection main body (11); And a shielding curtain module (12a, 12b) provided at the front or rear of the inspection main body (11), wherein the transfer module (13) feeds the object to be inspected continuously and the shielding curtain modules Is detachable from the inspection main body (11).

Products of flux-calcinated diatomite of opal rocks

FIELD: chemical or physical processes. SUBSTANCE: invention relates to filtration materials for fluids. Disclosed is a diatomaceous material subjected to calcination under flux based on sodium carbonate. Diatomite product has content of crystalline silicon dioxide less than 0.1 wt. % and has permeability within 0.8 darsi and about 30 darsi. EFFECT: diatomite product may contain a certain amount of cristobalite which is determined using a method which distinguishes cristobalite and opal-C, particularly using LH Method. 14 cl, 33 dwg, 20 tbl РОССИЙСКАЯ ФЕДЕРАЦИЯ (19) RU (51) МПК B01D 39/06 B01J 20/14 B01J 20/30 G01N 23/20 (11) (13) 2 716 788 C2 (2006.01) (2006.01) (2006.01) (2006.01) ФЕДЕРАЛЬНАЯ СЛУЖБА ПО ИНТЕЛЛЕКТУАЛЬНОЙ СОБСТВЕННОСТИ (12) ОПИСАНИЕ ИЗОБРЕТЕНИЯ К ПАТЕНТУ (52) СПК B01D 39/06 (2019.08); B01J 20/14 (2019.08) (21)(22) Заявка: 2018118769, 16.06.2016 (24) Дата начала отсчета срока действия патента: Дата регистрации: 16.03.2020 23.10.2015 US 62/245,716; 28.03.2016 US 62/314,005 (43) Дата публикации заявки: 25.11.2019 Бюл. № 33 (45) Опубликовано: 16.03.2020 Бюл. № 8 (86) Заявка PCT: C 2 C 2 (85) Дата начала рассмотрения заявки PCT на национальной фазе: 23.05.2018 (56) Список документов, цитированных в отчете о поиске: US 20110195168 A1, 11.08.2011. US 20100176069 A1, 15.07.2010. US 20150129490 A1, 14.05.2015. RU 2237510 C1, 10.10.2004. US 9095842 B2, 04.08.2015. RU 2173576 C2, 20.09.2001. RU 2176926 C2, 20.12.2001. US 2016/037816 (16.06.2016) (87) Публикация заявки PCT: 2 7 1 6 7 8 8 WO 2017/069808 (27.04.2017) R U 2 7 1 6 7 8 8 (73) Патентообладатель(и): ЕП МИНЕРАЛЗ, ЭлЭлСи (US) Приоритет(ы): (30) Конвенционный приоритет: R U 16.06.2016 (72) Автор(ы): ЛЕНЦ, Питер, Э. (US), ПАЛМ, Скотт, К. (US), НИАМЕКИЕ, Джордж, А. (US), ХАМФРИЗ, Брэдли, С. (US), ВАН, Цюнь (US) Адрес для переписки: 129090, Москва, ул. Б.Спасская, 25, строение 3, ООО "Юридическая фирма Городисский и Партнеры" (54) ПРОДУКТЫ ФЛЮС-КАЛЬЦИНИРОВАННОГО ДИАТОМИТА ОПАЛОВЫХ ПОРОД (57) Реферат: ...

Methods of determining the mineralogy of calcined and flux-calcined diatomite

A method of determining opal-C and cristobalite contents of a product that comprises diatomite is disclosed. The method may comprise performing thermal processing to determine a loss on ignition for a representative first portion of a sample of the product; identifying and quantifying primary and secondary peaks present in a first diffraction pattern that results from bulk powder X-ray Diffraction on a representative second portion of the sample; and using a known standard sample of cristobalite to determine whether the primary and secondary peaks present in the first diffraction pattern indicate the presence of opal-C or cristobalite in the product.

Opaline flux-calcined diatomite products

A diatomite product and method of using such is disclosed. The diatomite product may comprise sodium flux-calcined diatomite, wherein the diatomite product has a crystalline silica content of less than about 1 wt %, and the diatomite product has a permeability between 0.8 darcy and about 30 darcy. In some embodiments, the diatomite product may be in particulate or powdered form. This disclosure also concerns flux-calcined silica products containing low or non-detectable levels of crystalline silica. Some of these products can be further characterized by high permeabilities and a measurable content of opal-C, a hydrated form of silicon dioxide.

Methods for in situ monitoring and control of defect formation or healing

Production of perforated two-dimensional materials with holes of a desired size range, a narrow size distribution, and a high and uniform density remains a challenge, at least partially, due to physical and chemical inconsistencies from sheet-to-sheet of the two-dimensional material and surface contamination. This disclosure describes methods for monitoring and adjusting perforation or healing conditions in real-time to address inter- and intra-sheet variability. In situ or substantially simultaneous feedback on defect production or healing may be provided either locally or globally on a graphene or other two-dimensional sheet. The feedback data can be used to adjust perforation or healing parameters, such as the total dose or efficacy of the perforating radiation, to achieve the desired defect state.

High energy acclerator CT rock mechanics testing system

本发明属于力学试验设备技术领域，具体涉及一种高能加速器CT岩石力学试验系统。本发明的高能加速器CT岩石力学试验系统包括力学试验机、高能加速器CT射线源和探测器，力学试验机设置在高能加速器CT射线源与探测器之间，力学试验机包括固定构件、旋转装置和压力室，旋转装置设置在固定构件上，压力室与旋转装置连接，在进行试验时，压力室在旋转装置的带动下能够相对固定构件转动。通过在试验机上设置旋转装置，在进行试验时，通过旋转装置带动压力室转动，即能够在试验样品进行加载试验过程中对试验样品进行扫描，从而使CT成像能够完全反映出加载时试验样品的结构状态，更有利于科学研究。