13-05-2021 дата публикации
Номер: US20210142471A1
Принадлежит:
A method for analyzing scan data. In some embodiments, the method includes forming, from a first scan data array, a first mask, each element of the first mask being one or zero according to whether the corresponding element of the first scan data array exceeds a first threshold; forming, from the first scan data array, a second mask, each element of the second mask having a value of one or zero according to whether the corresponding element of the first scan data array exceeds a second threshold, the second threshold being less than the first threshold; and forming a fourth mask, the fourth mask being the element-wise product of the second mask and a third mask, the third mask being based on the first mask. 1. A method for analyzing scan data , the method comprising:forming, from a first scan data array based on raw scan data, a first mask, each element of the first mask being one or zero according to whether the corresponding element of the first scan data array exceeds a first threshold;forming, from the first scan data array, a second mask, each element of the second mask having a value of one or zero according to whether the corresponding element of the first scan data array exceeds a second threshold, the second threshold being less than the first threshold; andforming a fourth mask, the fourth mask being the element-wise product of the second mask and a third mask, the third mask being based on the first mask.2. The method of claim 1 , wherein:the third mask is a three dimensional array based on a fifth mask;the fifth mask is a three dimensional array based on the first mask, one, when any of the corresponding elements of the plurality of slices of the fifth mask has a value of one; and', 'zero, otherwise., 'the forming of the third mask comprises forming a slice of the third mask from a plurality of slices of the fifth mask, each element of the slice of the third mask having a value of3. The method of claim 2 , wherein the fifth mask is based on a sixth mask ...
Подробнее