25-04-2023 дата публикации
Номер: CN116008767A
Принадлежит:
The invention discloses a semiconductor photoelectric device non-contact characteristic subentry test device and method, the semiconductor photoelectric device non-contact characteristic subentry test device comprises a plurality of test areas for parallel test, each test area comprises a plurality of test devices and a plurality of short circuit devices, each short circuit device comprises an insulated clamp and an inductance coil fixed below the clamp and connected with the clamp in an insulated manner, an electric conductor is fixed in the clamp, inductance coils of the plurality of short-circuit devices are connected in series and are connected with the pulse power supply to form a first closed loop, a to-be-tested piece is clamped in the clamp, an electrode of the to-be-tested piece is in contact with the electric conductor to form a second closed loop, and a light-emitting surface of the to-be-tested piece directly faces a light receiving direction of the testing device; the device ...
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