14-07-2023 дата публикации
Номер: CN116430198A
Принадлежит:
The invention discloses a universal chip testing system and method, and belongs to the technical field of chip test.The universal chip testing system comprises an ESD testing machine table and a logic analyzer, the ESD testing machine table comprises a testing main board and a testing sub-board electrically connected with the testing main board, a chip to be tested is arranged on the testing sub-board, and the logic analyzer is electrically connected with the testing sub-board. The test mainboard is provided with at least one first butt joint piece used for outputting a signal and waveform information of the chip to be tested, the logic analyzer is provided with a test load board, the test load board is provided with a third butt joint piece, and the first butt joint piece is electrically connected with the third butt joint piece. Through the test mainboard of the ESD test machine, the interface of the chip is expanded, so that the oscilloscope and the logic analyzer can display the waveform ...
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