02-06-2023 дата публикации
Номер: CN116202963A
Принадлежит:
The invention provides a light emission microscope, a sample fixing device and a using method thereof, the sample fixing device is applied to failure positioning of an SIL lens of the light emission microscope, a bearing table of the light emission microscope is provided with a plurality of suction holes used for vacuum adsorption, and the sample fixing device comprises a fixing plate. The fixing plate is placed on the bearing table and covers the suction hole, a sample is fixed on the lower surface of the fixing plate, the front surface of the sample faces upwards, a through hole for a probe to be fed is further formed in the fixing plate, and the through hole corresponds to a to-be-analyzed area of the sample. The sample is fixed by arranging the fixing plate, and then the fixing plate is adsorbed and fixed on the bearing table by utilizing the suction holes, so that the fixation of the sample is not influenced by the size of the sample, and the bottom of the sample can be completely ...
Подробнее