29-06-2011 дата публикации
Номер: CN0102110051A
Автор:
YUNZHAN GONG,
YUNSHAN ZHAO,
DAHAI JIN,
QING XIAO,
CHAOHONG YANG,
LI LIU,
GONG YUNZHAN,
ZHAO YUNSHAN,
JIN DAHAI,
XIAO QING,
YANG CHAOHONG,
LIU LI
Принадлежит:
The invention discloses a static defect detection method of an application program slicing technology, which comprises the following steps of: A, acquiring defect characteristics of a defect mode to be detected; B, calculating path conditions of all branch nodes according to the defect characteristics, and generating slicing criteria; C, traversing a control flow graph according to the slicing criteria to perform program slicing, and reconstructing the control flow graph to obtain a reconstructed control flow graph; D, performing defect mode state machine calculation by using the reconstructed control flow graph and using a defect state iterative algorithm; E, if the current control flow graph node is a non-convergence node, converging and updating the state conditions in all defect states; and F, if the current control flow graph node is a convergence node, merging the states according to the state condition of the current defect state. By adopting the method, the defect detection efficiency ...
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