Exploitation of second-order effects in atomic force microscopy

A processing system cooperates with an atomic force microscope operating in ramp mode at a ramp frequency is configured to collect data indicative of at least one of physical and chemical properties of a sample. The system collects data indicative of probe movement at a frequency that is higher than the ramp frequency. This data comprises a second-order portion of the probe's signal. Based at least in part on the second-order portion, the processor obtains a parameter that is indicative at least one of a physical and a chemical property of a sample.

High Resolution, High Speed Multi-Frequency Dynamic Study of Visco-Elastic Properites

The present invention provides an apparatus and method including hardware and software, which allows collecting and analyzing of data to obtain information about mechanical properties of soft materials. This allows surface mapping of viscoelastic properties in a high-resolution and fast manner. It also allows finding the degree of nonlinearity of the material response of the sample during the measurements. The apparatus can be used as a stand-alone device, or an add-on to either the existing atomic force microscope or nanoindenter device.

EXPLOITATION OF SECOND-ORDER EFFECTS IN ATOMIC FORCE MICROSCOPY

A processing system cooperates with an atomic force microscope operating in ramp mode at a ramp frequency is configured to collect data indicative of at least one of physical and chemical properties of a sample. The system collects data indicative of probe movement at a frequency that is higher than the ramp frequency. This data comprises a second-order portion of the probe's signal. Based at least in part on the second-order portion, the processor obtains a parameter that is indicative at least one of a physical and a chemical property of a sample. 1. An apparatus for evaluating one of a physical and a chemical property of a surface , said apparatus comprising a processing system configured to cooperate with an atomic force microscope operating in ramp mode at a ramp frequency , said processing system being configured to collect data indicative of at least one of physical and chemical properties of a sample , wherein said processing system is configured to receive a probe signal indicative of movement of a probe at a frequency that is higher than said ramp frequency , wherein said probe signal comprises a first portion indicative of deflection and a second portion that consists of second-order effects , and wherein said processing system is further configured to obtain a parameter that is indicative at least one of a physical and a chemical property of a sample based at least in part on said second portion of said probe signal.2. The apparatus of claim 1 , wherein said processing system is configured to receive a probe signal that comprises a contact portion and a rebound portion claim 1 , and wherein said second portion comprises said rebound portion.3. The apparatus of claim 2 , wherein said processing system is configured to obtain a restored adhesion.4. The apparatus of claim 2 , wherein said processing system is configured to obtain an average restored adhesion.5. The apparatus of claim 2 , wherein said processing system is configured to obtain a viscoelastic ...

Controlled indentation instrumentation working in dynamical mechanical analysis mode

A method that includes controlling a contact parameter during a measurement of a dynamic property of a material that is a constituent of a sample by causing a probe to indent the sample until a stable value of a contact parameter has been achieved, during a fitting interval, exercising feedback control over the probe to maintain the value, and during a measurement interval, both causing the probe to oscillate towards and away from the material, and abandoning the feedback control over the probe.

Exploitation of second-order effects in atomic force microscopy

Exploitation of second-order effects in atomic force microscopy

A processing system cooperates with an atomic force microscope operating in ramp mode at a ramp frequency is configured to collect data indicative of at least one of physical and chemical properties of a sample. The system collects data indicative of probe movement at a frequency that is higher than the ramp frequency. This data comprises a second-order portion of the probe's signal. Based at least in part on the second-order portion, the processor obtains a parameter that is indicative at least one of a physical and a chemical property of a sample.

Exploitation of second-order effects in atomic force microscopy

Exploitation of second-order effects in atomic force microscopy

A processing system cooperates with an atomic force microscope operating in ramp mode at a ramp frequency is configured to collect data indicative of at least one of physical and chemical properties of a sample. The system collects data indicative of probe movement at a frequency that is higher than the ramp frequency. This data comprises a second-order portion of the probe's signal. Based at least in part on the second-order portion, the processor obtains a parameter that is indicative at least one of a physical and a chemical property of a sample.

High resolution, high speed multi-frequency dynamic study of visco-elastic properites

The present invention provides an apparatus and method including hardware and software, which allows collecting and analyzing of data to obtain information about mechanical properties of soft materials. This allows surface mapping of viscoelastic properties in a high-resolution and fast manner. It also allows finding the degree of nonlinearity of the material response of the sample during the measurements. The apparatus can be used as a stand-alone device, or an add-on to either the existing atomic force microscope or nanoindenter device.