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Применить Всего найдено 3. Отображено 3.
26-06-2008 дата публикации

Electron Microscope and Combined Illumination Lens

Номер: US2008149833A1
Автор: ENDOH HISAMITSU, ACHIHARA MASATO, TSUNO KATSUSHIGE, OIKAWA TETSUO
Принадлежит:

An object of the present invention is to provide an electron microscope that employs a hologram of a diffraction pattern to reconstruct a microscopic image involving no imaging aberration due to image forming lenses, as well as a combined illumination lens used for such an electron microscope. The electron microscope according to the present invention has an electron source ( 11 ), a condenser lens ( 12 ), a biprism ( 13 ) to split an electron beam supplied from the condenser lens ( 12 ) into coherent first and second electron beams (L 1 , L 2 ) that are parallel to each other, a combined illumination lens ( 15 ) to make the first electron beam (L 1 ) into a parallel wave and the second electron beam (L 2 ) into a converging wave that converges at a predetermined distance, a sample stage ( 16 ) to hold a sample illuminated with the first electron beam (L 1 ), a detector ( 17 ) to detect a hologram of a diffraction pattern formed by interference of the first electron beam (L 1 ) with the ...

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Номер записи: 1
13-10-2009 дата публикации

Electron microscope and combined illumination lens

Номер: US0007601957B2
Автор: Hisamitsu Endoh, Masato Achihara, Katsushige Tsuno, Tetsuo Oikawa, ENDOH HISAMITSU, ACHIHARA MASATO, TSUNO KATSUSHIGE, OIKAWA TETSUO
Принадлежит: National University Corporation Kyoto Institute of Technology, NAT UNIV CORP KYOTO INST TECH, NATIONAL UNIVERSITY CORPORATION KYOTO INSTITUTE OF TECHNOLOGY

An object of the present invention is to provide an electron microscope that employs a hologram of a diffraction pattern to reconstruct a microscopic image involving no imaging aberration due to image forming lenses, as well as a combined illumination lens used for such an electron microscope. The electron microscope according to the present invention has an electron source (11), a condenser lens (12), a biprism (13) to split an electron beam supplied from the condenser lens (12) into coherent first and second electron beams (L1, L2) that are parallel to each other, a combined illumination lens (15) to make the first electron beam (L1) into a parallel wave and the second electron beam (L2) into a converging wave that converges at a predetermined distance, a sample stage (16) to hold a sample illuminated with the first electron beam (L1), a detector (17) to detect a hologram of a diffraction pattern formed by interference of the first electron beam (L1) with the second electron beam (L2) ...

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Номер записи: 2
24-04-2008 дата публикации

Fresnel Zone Plate and X-Ray Microscope Using the Fresnel Zone Plate

Номер: US2008094710A1
Автор: ENDOH HISAMITSU
Принадлежит:

... [Object] To provide a Fresnel's zone plate having a complex illumination function capable of improving resolution even when the outermost opaque band width cannot be reduced and an X-ray microscope using the Fresnel's zone plate. [Solution] A Fresnel's zone plate 1 having a complex illumination function according to the invention has opaque bands 3 and transparent bands 4 arranged alternately in the radial direction from the center concentrically on a flat transparent substrate 2 , and a transmission window 7 formed such that a portion of a plane wave vertically applied onto the upper surface vertically enters directly a sample 6 disposed below the Fresnel's zone plate 1 without dispersion.

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Номер записи: 3