Component provided with an integrated circuit comprising a cryptoprocessor and method of installation thereof

In order to protect an integrated circuit provided with a cryptoprocessor from attacks aiming to reveal secrets, it is anticipated to use a component sensitive to the activation of a parasitic (latchup) thyristor and/or to the activation of a parasitic bipolar transistor, or to design a circuit having this property. If the component is stressed due to the presence of this circuit, it is immediately deactivated, actually preventing the revelation of the secrets thereof.

Method of determining the particle sensitivity of electronic components

To analyze an electronic component, this component is exposed to a focused laser beam. The information provided by the laser mapping relating to the position and to the depth of the sensitivity zones of the component is used as input parameter in prediction codes for quantifying the sensitivity of the mapped component to ionizing particles in the natural radioactive environment. The prediction codes are used to determine the occurrence of malfunctions in the electronic component. Determination of the risks associated with the radiative environment imposes two aspects: one, probabilistic, takes into account the particle/matter interaction and the other, electrical, takes into account the charge collection inside the electronic component.

Method for detecting and correcting errors for a memory whose structure shows dissymmetrical behavior, corresponding memory and its use

To produce a memory which resists ion or photon attack, a memory structure is chosen whose memory point behaves asymmetrically with regard to these attacks. It is shown that in this case, it is sufficient to have a reference cell for an identical and periodic storage structure in order to be able to correct all the memory cells assailed by an attack. An error correction efficiency of ½ is thus obtained, with a simple redundancy, whereas the conventional methods make provision, for the same result, to triple the storage, to obtain a less beneficial efficiency of .

METHOD FOR CHARACTERIZING THE SENSITIVITY OF ELECTRONIC COMPONENTS TO DESTRUCTIVE MECHANISMS

A method for characterizing the sensitivity of an electronic component with respect to a natural radiating environment. The safe operating area (SOA) voltage range beyond which destructive events occur is determined for the electronic component for given characteristics of a particle or incident beam. The electronic component is turned on and energized with the particle or incident beam having the given characteristics under the operating conditions that are close to the highest voltage value of the determined SOA voltage range. An efficient section of amplified transient events, which corresponds to an estimation of the destructive occurrences for the electronic component is determined. The characteristics of the particle or beam is modified and the method is repeated with the modified characteristics. 19-. (canceled)10. A method for characterizing the sensitivity of an electronic component to a natural radiation environment , comprising the steps of:turning on the electronic component;determining, for characteristics of an incident beam or particle, a safe operating area (SOA) voltage range beyond which destructive events occur to the electronic component;exciting the electronic component with the incident beam or particle under operating conditions of a highest voltage in the determined SOA voltage range;determining an effective section of amplified transient events, the effective section corresponding to an estimate of an occurrence of an event destructive to the electronic component;modifying the characteristics of the incident beam or particle; andrepeating the steps of exciting the electronic component with the modified incident beam and particle, and determining the effective section for the incident beam or particle with the modified characteristics when one or more amplified transient events are triggered.11. The method of claim 10 , wherein the step of determining the effective section comprises the step of applying at least one of the following test ...

Method for characterizing the sensitivity of an electronic component to energetic interactions

The behavior of a component subjected to pulsed laser radiation is measured. The polarization value, frequency, and temperature (or other operating conditions) to which the component is sensitive are determined by detecting a temporary or permanent fault in the operation of the component. If necessary, the parasitic currents generated are prevented from destroying the tested component at the time of testing. A susceptibility of the component to energetic interactions and the preferred operating conditions for the component are deduced.

COMPONENT PROVIDED WITH AN INTEGRATED CIRCUIT COMPRISING A CRYPTOROCESSOR AND METHOD OF INSTALLATION THEREOF

In order to protect an integrated circuit provided with a cryptoprocessor from attacks aiming to reveal secrets, it is anticipated to use a component sensitive to the activation of a parasitic (latchup) thyristor and/or to the activation of a parasitic bipolar transistor, or to design a circuit having this property. If the component is stressed due to the presence of this circuit, it is immediately deactivated, actually preventing the revelation of the secrets thereof.

ELECTRIC GENERATOR EXCITED BY IONIZING RADIATIONS

The invention relates to an electric generator sensitive to ionizing radiation produced by the reverse mounting of a diode in parallel between a reverse polarization stack and a pulse converter or only with a pulse converter. A generator is thus provided that can be used inside a spacecraft or in the atmosphere by using cosmic radiation, or in an environment containing ionizing radiation such as in the medical or nuclear fields, and which is preferably directly mounted on a printed circuit board receiving a remote sensor.

METHOD FOR DETECTING AND CORRECTING ERRORS FOR A MEMORY WHOSE STRUCTURE SHOWS DISSYMMETRICAL BEHAVIOR, CORRESPONDING MEMORY AND ITS USE

To produce a memory which resists ion or photon attack, a memory structure is chosen whose memory point behaves asymmetrically with regard to these attacks. It is shown that in this case, it is sufficient to have a reference cell for an identical and periodic storage structure in order to be able to correct all the memory cells assailed by an attack. An error correction efficiency of ½ is thus obtained, with a simple redundancy, whereas the conventional methods make provision, for the same result, to triple the storage, to obtain a less beneficial efficiency of .

METHOD OF DETERMINING THE PARTICLE SENSITIVITY OF ELECTRONIC COMPONENTS

To analyze an electronic component, this component is exposed to a focused laser beam. The information provided by the laser mapping relating to the position and to the depth of the sensitivity zones of the component is used as input parameter in prediction codes for quantifying the sensitivity of the mapped component to ionizing particles in the natural radioactive environment. The prediction codes are used to determine the occurrence of malfunctions in the electronic component. Determination of the risks associated with the radiative environment imposes two aspects: one, probabilistic, takes into account the particle/matter interaction and the other, electrical, takes into account the charge collection inside the electronic component.

METHOD AND DEVICE FOR CHARACTERISING SENSITIVITY TO ENERGY INTERACTIONS IN AN ELECTRONIC COMPONENT

To analyse an electric component in depth, provision is made to submit said component to focused laser radiation. It is shown that by modifying the altitude of the focus in the component, some internal parts of said component can be characterized more easily.

DEVICE FOR TESTING AN INTEGRATED CIRCUIT AND METHOD FOR IMPLEMENTING SAME

The invention relates to a device for testing an integrated circuit. The device comprises a plate for receiving and subjecting the integrated circuit to a test. The plate comprises a component for powering and operating the integrated circuit and another component for measuring the operation of the integrated circuit during the test. The device also comprises an irradiation device for subjecting the circuit to a proton bombardment and a mask with a variable thickness provided between a bombardment access region on the integrated circuit and an established zone of the integrated circuit.

METHOD FOR CHARACTERIZING THE SENSITIVITY OF AN ELECTRONIC COMPONENT TO ENERGETIC INTERACTIONS

The behavior of a component subjected to pulsed laser radiation is measured. The polarization value, frequency, and temperature (or other operating conditions) to which the component is sensitive are determined by detecting a temporary or permanent fault in the operation of the component. If necessary, the parasitic currents generated are prevented from destroying the tested component at the time of testing. A susceptibility of the component to energetic interactions and the preferred operating conditions for the component are deduced.

Method for characterizing the sensitivity of electronic components to destructive mechanisms

A method for characterizing the sensitivity of an electronic component with respect to a natural radiating environment. The safe operating area (SOA) voltage range beyond which destructive events occur is determined for the electronic component for given characteristics of a particle or incident beam. The electronic component is turned on and energized with the particle or incident beam having the given characteristics under the operating conditions that are close to the highest voltage value of the determined SOA voltage range. An efficient section of amplified transient events, which corresponds to an estimation of the destructive occurrences for the electronic component is determined. The characteristics of the particle or beam is modified and the method is repeated with the modified characteristics.

METHOD OF CHARACTERIZING THE SENSITIVITY OF AN ELECTRONIC COMPONENT SUBJECTED TO IRRADIATION CONDITIONS

A method of selecting a piece of electronic equipment subjected to irradiation conditions comprising at least one electronic component by characterizing a sensitivity parameter of the electronic component to the irradiation conditions listed in a predetermined specifications. The electronic component is irradiated with a source of ionizing radiation having the known irradiation characteristics and geometry. A set of operating values of the electronic component are measured during the irradiation of the electronic component. The sensitivity of the electronic component are measured for a number of irradiation conditions lower than all of the conditions listed in the specifications. The measured results are extrapolated to the other irradiation conditions of the specifications.

Method and device for characterising sensitivity to energy interactions in an electronic component

To analyze an electric component in depth, provision is made to submit the aforementioned component to focused laser radiation. It is shown that by modifying the altitude of the focus in the component, some internal parts of the aforementioned component can be characterized more easily.

Electric generator excited by ionizing radiations

The invention relates to an electric generator sensitive to ionizing radiation produced by the reverse mounting of a diode in parallel between a reverse polarization stack and a pulse converter or only with a pulse converter. A generator is thus provided that can be used inside a spacecraft or in the atmosphere by using cosmic radiation, or in an environment containing ionizing radiation such as in the medical or nuclear fields, and which is preferably directly mounted on a printed circuit board receiving a remote sensor.

Device for testing an integrated circuit and method for implementing same

The invention relates to a device for testing an integrated circuit. The device comprises a plate for receiving and subjecting the integrated circuit to a test. The plate comprises a component for powering and operating the integrated circuit and another component for measuring the operation of the integrated circuit during the test. The device also comprises an irradiation device for subjecting the circuit to a proton bombardment and a mask with a variable thickness provided between a bombardment access region on the integrated circuit and an established zone of the integrated circuit.

Method for testing a software application

To test a software application, a method submits an electronic board including a component implementing an application to a laser radiation generated in test equipment. The component is excited with laser pulses having very short durations distributed during complex operational phases of the component for running the application, and the reaction of the component and the application are observed.

METHOD FOR TESTING A SOFTWARE APPLICATION

To test a software application, a method submits an electronic board including a component implementing an application to a laser radiation generated in test equipment. The component is excited with laser pulses having very short durations distributed during complex operational phases of the component for running the application, and the reaction of the component and the application are observed.

METHOD FOR DETERMINING THE SENSITIVITY OF ELECTRONIC COMPONENTS TO PARTICLES

METHOD OF CHARACTERIZING THE SENSITIVITY OF ELECTRONIC COMPONENTS TO DESTRUCTIVE MECHANISMS

METHOD AND DEVICE FOR CHARACTERIZING SENSITIVITY TO ENERGY INTERACTIONS IN AN ELECTRONIC COMPONENT

INTEGRATED CIRCUIT TEST DEVICE AND METHOD FOR IMPLEMENTING THE SAME

DEVICE FOR DETECTING PARTICLES OF A RADIATIVE ENVIRONMENT

L'invention concerne un dispositif de détection (10 ; 50 ; 60) de particules comprenant : - au moins deux capteurs matriciels (11 ; 52 ; 61) plans agencées dans des plans différents, lesdits capteurs matriciels comportant chacun une matrice (13 ; 54) à au moins deux dimensions de cellules dont l'état est susceptible d'être modifié lorsqu'il est traversé par une particule ; - et des moyens de traitement (18 ; 58 ; 64) des données délivrées par lesdits capteurs matriciels. Lesdits moyens de traitement effectuant des opérations d'analyse (80) des données délivrées par lesdits capteurs matriciels, par coïncidence spatiale et temporelle entre les cellules d'au moins deux capteurs matriciels pour déterminer un type, une trajectoire et un niveau d'énergie d'une particule (21 ; 31 ; 57) incidente ayant traversée au moins deux desdits capteurs matriciels et ayant été à l'origine d'un dépôt de charges dans au moins une cellule d'au moins un capteur matriciel. The invention relates to a particle detection device (10; 50; 60) comprising: - at least two matrix sensors (11; 52; 61) arranged in different planes, said matrix sensors each comprising a matrix (13; ) at least two dimensions of cells whose state is likely to be changed when traversed by a particle; and processing means (18; 58; 64) of data delivered by said matrix sensors. Said processing means performing analysis operations (80) of the data delivered by said matrix sensors, by spatial and temporal coincidence between the cells of at least two matrix sensors to determine a type, a trajectory and a power level. an incident particle (21; 31; 57) having traversed at least two of said matrix sensors and having caused charge deposition in at least one cell of at least one matrix sensor.

METHOD FOR CHARACTERIZING THE CONDITIONS FOR USING AN ELECTRONIC COMPONENT FOR LIMITING ITS SENSITIVITY TO ENERGY INTERACTIONS

METHOD FOR TESTING A SOFTWARE APPLICATION

Pour tester une application logicielle, on soumet une carte électronique (16) portant un composant (1) mettant en oeuvre une application à un rayonnement laser (15) produit par une installation (17) de test. On excite le composant avec des impulsions laser de très courtes durées réparties pendant des phases complexes de fonctionnement du composant pour réaliser l'application et on observe la réaction du composant et de l'application. To test a software application, an electronic card (16) carrying a component (1) implementing an application to laser radiation (15) produced by a test installation (17) is submitted. The component is excited with laser pulses of very short durations distributed during complex phases of operation of the component to carry out the application and the reaction of the component and the application is observed.

INTEGRATED CIRCUIT TEST DEVICE AND METHOD FOR IMPLEMENTING THE SAME

L'invention a pour objet un dispositif 1 de test de circuit intégré 2 comportant - une platine 3 pour recevoir le circuit intégré 2 et le soumettre au test, - la platine 3 comportant des circuits 4 pour alimenter et faire fonctionner le circuit intégré 2 et des circuits 5 pour mesurer le fonctionnement du circuit intégré 2 pendant le test, - un dispositif d'irradiation 6 pour soumettre le circuit 2 à un bombardement de protons 7, caractérisé en ce qu'il comporte un masque 8 d'épaisseur variable interposé entre une région d'accès 9 du bombardement sur le circuit intégré 2 et une zone implantée 10 du circuit intégré 2. The subject of the invention is an integrated circuit test device 1 comprising: a plate 3 for receiving the integrated circuit 2 and subjecting it to the test; the plate 3 comprising circuits 4 for supplying and operating the integrated circuit 2 and circuits 5 for measuring the operation of the integrated circuit 2 during the test, - an irradiation device 6 for subjecting the circuit 2 to a proton bombardment 7, characterized in that it comprises a mask 8 of variable thickness interposed between an access region 9 of the bombardment on the integrated circuit 2 and an implanted zone 10 of the integrated circuit 2.

ELECTRIC GENERATOR EXCITED BY COSMIC RADIATION.

On réalise un générateur électrique sensible aux rayonnements ionisants en montant une diode en inverse en parallèle entre une pile de polarisation inverse et un transformateur d'impulsions ou seulement avec un transformateur d'impulsions. On montre qu'on peut créer un générateur utilisable à l'intérieur d'un véhicule spatial ou atmosphérique en exploitant les rayonnements cosmiques ou dans un environnement contenant des rayonnements ionisants comme par exemple, dans le domaine nucléaire ou médical, de préférence directement monté sur la carte d'un circuit imprimé qui reçoit un capteur déporté. An ionizing radiation sensitive electrical generator is provided by mounting a reverse diode in parallel between a reverse bias cell and a pulse transformer or only with a pulse transformer. It is shown that it is possible to create a generator that can be used inside a space or atmospheric vehicle by exploiting cosmic radiation or in an environment containing ionizing radiation, for example in the nuclear or medical field, preferably directly mounted on the printed circuit board that receives a remote sensor.

METHOD FOR CHARACTERIZING THE SENSITIVITY OF AN ELECTRONIC COMPONENT SUBJECT TO IRRADIATION CONDITIONS

L'invention vise un procédé de sélection d'un équipement électronique comprenant au moins un composant électronique (101), ledit équipement électronique étant potentiellement soumis à des conditions d'irradiation listées dans un cahier des charges prédéterminé, le procédé comportant une phase de caractérisation d'un paramètre de sensibilité du composant électronique (101) à ces conditions d'irradiation, cette phase comprenant : - une étape 210 d'irradiation du composant électronique (101) par une source de rayonnements ionisants (100) aux caractéristiques et à la géométrie d'irradiation connues, - une étape 220 de mesure d'un ensemble de valeurs de fonctionnement du composant électronique (101) lors de cette étape d'irradiation, ledit procédé étant caractérisé en ce que : - l'étape d'irradiation comporte des mesures de sensibilité du composant électronique (101) pour un nombre de conditions d'irradiation inférieur à l'ensemble des conditions listées dans le cahier des charges, - le procédé comporte en outre une étape 240 d'extrapolation des résultats mesurés aux autres conditions d'irradiation du cahier des charges. The invention relates to a method of selecting an electronic equipment comprising at least one electronic component (101), said electronic equipment being potentially subjected to the irradiation conditions listed in a predetermined specification, the method comprising a characterization phase from a sensitivity parameter of the electronic component (101) to these irradiation conditions, this phase comprising: a step 210 of irradiating the electronic component (101) by a source of ionizing radiation (100) with the characteristics and the known irradiation geometry, a step 220 for measuring a set of operating values of the electronic component (101) during this irradiation step, said method being characterized in that: the irradiation step comprises sensitivity measurements of the electronic ...

DEVICE AND METHOD FOR TESTING AN ELECTRONIC SYSTEM

Dispositif (10) de test d'un équipement électronique (100) comportant : - une platine (105) comportant une alimentation (110) de puissance et un moyen (115) apte à réaliser une mesure de fonctionnement pendant le test, la platine (105) comportant également au moins un encodeur (120, 121, 122) délivrant un signal (125, 126, 127) représentatif d'une distance parcourue par la platine (105), - un moyen (135) d'irradiation en regard de l'équipement électronique (100) et configuré pour le soumette à des radiations (140), dans lequel, le signal (125, 126, 127) est transmis au moyen (135) d'irradiation et en ce que l'émission d'une radiation (140) est déclenchée par la réception d'un signal (125, 126, 127) prédéterminé. L'invention concerne également le procédé (20) de test d'un équipement électronique (100) mis en œuvre au moyen du dispositif (10). Device (10) for testing an electronic equipment (100) comprising: - a plate (105) comprising a power supply (110) and a means (115) able to perform an operating measurement during the test, the platinum ( 105) also comprising at least one encoder (120, 121, 122) delivering a signal (125, 126, 127) representative of a distance traversed by the plate (105), - irradiation means (135) with respect to the electronic equipment (100) and configured to subject it to radiation (140), wherein the signal (125, 126, 127) is transmitted to the irradiation means (135) and the transmission of a radiation (140) is triggered by receiving a predetermined signal (125, 126, 127). The invention also relates to the method (20) for testing an electronic equipment (100) implemented by means of the device (10).

ELECTRIC GENERATOR EXCITED BY COSMIC RADIATION.

METHOD FOR TESTING A SOFTWARE APPLICATION

DEVICE FOR DETECTING PARTICLES OF A RADIATIVE ENVIRONMENT

L'invention concerne un dispositif de détection (10 ; 50 ; 60) de particules comprenant : - au moins deux capteurs matriciels (11 ; 52 ; 61) plans agencées dans des plans différents, lesdits capteurs matriciels comportant chacun une matrice (13 ; 54) à au moins deux dimensions de cellules dont l'état est susceptible d'être modifié lorsqu'il est traversé par une particule ; - et des moyens de traitement (18 ; 58 ; 64) des données délivrées par lesdits capteurs matriciels. Lesdits moyens de traitement effectuant des opérations d'analyse (80) des données délivrées par lesdits capteurs matriciels, en coïncidence spatiale et temporelle entre les cellules d'au moins deux capteurs matriciels pour déterminer un type, une trajectoire et un niveau d'énergie d'une particule (21 ; 31 ; 57) incidente ayant traversée au moins deux desdits capteurs matriciels et ayant été à l'origine d'un dépôt de charges dans au moins une cellule d'au moins un capteur matriciel. The invention relates to a particle detection device (10; 50; 60) comprising: - at least two matrix sensors (11; 52; 61) planes arranged in different planes, said matrix sensors each comprising a matrix (13; 54) ) at least two dimensions of cells the state of which is susceptible to change when traversed by a particle; - And processing means (18; 58; 64) of the data delivered by said matrix sensors. Said processing means performing operations of analyzing (80) the data delivered by said matrix sensors, in spatial and temporal coincidence between the cells of at least two matrix sensors to determine a type, a trajectory and an energy level of 'an incident particle (21; 31; 57) having passed through at least two of said matrix sensors and having been the source of charge deposition in at least one cell of at least one matrix sensor.

METHOD FOR DETECTING CORRECTION OF ERRORS FOR A MEMORY WHOSE STRUCTURE IS DISSYMETRICALLY CONDUCTIVE

Method for characterizing the sensitivity of electronic components to destructive mechanisms

L'invention a pour objet un procédé de caractérisation de la sensibilité d'un composant électronique vis-à-vis d'un environnement radiatif naturel, dans lequel : on met le composant électronique en service, pour des caractéristiques d'une particule ou d'un faisceau incident données, telles que l'énergie, l'incidence et/ou le parcours, on détermine un domaine de tension SOA au-delà duquel des événements destructifs dudit composant auront lieu, on excite le composant électronique ainsi mis en service avec les caractéristiques de la particule ou du faisceau incident, dans des conditions de fonctionnement proches de la plus grande valeur de tension du domaine de tension SOA déterminé, on détermine une section efficace des événements transitoires amplifiés, cette section efficace correspondant à une estimation des phénomènes destructifs dudit composant, on modifie les caractéristiques de ladite particule ou dudit faisceau, et on réitère l'excitation dudit composant, on détermine la section efficace pour chaque modification de caractéristiques. The invention relates to a method for characterizing the sensitivity of an electronic component vis-à-vis a natural radiative environment, in which: the electronic component is put into service, for characteristics of a particle or d a given incident beam, such as energy, incidence and / or path, a SOA voltage domain is determined beyond which destructive events of said component will take place, the electronic component thus energized is excited with the characteristics of the incident particle or beam, under operating conditions close to the highest voltage value of the determined SOA voltage range, an effective cross-section of the amplified transient events is determined, this cross section corresponding to an estimation of the destructive phenomena of said component, the characteristics of said particle or of said beam are modified, and the excitation of said compound is reiterated. The cross ...

Component provided with an integrated circuit comprising a crytoprocessor and method of installation thereof

Pour protéger un composant en circuit intégré muni d'un crypto- processeur contre les agressions visant à révéler les secrets, on prévoit d'utiliser un composant sensible au déclenchement d'un thyristor parasite (latchup) et/ou déclenchement d'un transistor bipolaire parasite ou de 10 concevoir un circuit ayant cette propriété. Si le composant est agressé, du fait de la présence de ce circuit, il se met immédiatement hors service, empêchant de fait la révélation de ses secrets.

Detection and correction of errors for a memory, the bit states of which have a different resistance to errors

To produce a memory which resists ion or photon attack, a memory structure is chosen whose memory point behaves asymmetrically with regard to these attacks. It is shown that in this case, it is sufficient to have a reference cell for an identical and periodic storage structure in order to be able to correct all the memory cells assailed by an attack. An error correction efficiency of 1/2 is thus obtained, with a simple redundancy, whereas the conventional methods make provision, for the same result, to triple the storage, to obtain a less beneficial efficiency of 1/3.

METHOD AND DEVICE FOR CHARACTERIZING SENSITIVITY TO ENERGY INTERACTIONS IN AN ELECTRONIC COMPONENT

Pour analyser un composant électronique en profondeur, on prévoit de soumettre ce composant à un rayonnement laser focalisé. On montre qu'en modifiant l'altitude du foyer dans le composant, on peut caractériser plus facilement certaines parties internes de ce composant. To analyze an electronic component in depth, it is expected to subject this component to a focused laser radiation. It is shown that by modifying the altitude of the focus in the component, it is easier to characterize certain internal parts of this component.

Method for characterising usage conditions of an electronic component inorder to limit its sensitivity to energy interactions

Procédé de caractérisation des conditions d'utilisation d'un composant électronique permettant de limiter sa sensibilité aux interactions énergétiques. On mesure le comportement d'un composant soumis à un rayonnement laser pulsé. On détermine pour quelles valeurs de polarisation, de fréquence et de température(ou autres conditions d'utilisation), ce composant y est sensible en détectant un défaut transitoire ou permanent de fonctionnement du composant. Si nécessaire, on empêche que les courants parasites produits ne détruisent, au moment de ces tests, le composant testé. On en déduit une susceptibilité du composant aux interactions énergétiques et les conditions préférables de fonctionnement de ce composant.

METHOD OF CHARACTERIZING THE SENSITIVITY OF ELECTRONIC COMPONENTS TO DESTRUCTIVE MECHANISMS

L'invention a pour objet un procédé de caractérisation de la sensibilité d'un composant électronique vis-à-vis d'un environnement radiatif naturel, dans lequel : - on met le composant électronique en service, - pour des caractéristiques d'une particule ou d'un faisceau incident données, telles que l'énergie, l'incidence et/ou le parcours, on détermine un domaine de tension SOA au-delà duquel des événements destructifs dudit composant auront lieu, - on excite le composant électronique ainsi mis en service avec les caractéristiques de la particule ou du faisceau incident, dans des conditions de fonctionnement proches de la plus grande valeur de tension du domaine de tension SOA déterminé, - on détermine une section efficace des évènements transitoires amplifiés, cette section efficace correspondant à une estimation des phénomènes destructifs dudit composant, - on modifie les caractéristiques de ladite particule ou dudit faisceau, et on réitère l'excitation dudit composant, - on détermine la section efficace pour chaque modification de caractéristiques. The invention relates to a method for characterizing the sensitivity of an electronic component vis-à-vis a natural radiative environment, in which: - the electronic component is put into service, - for characteristics of a particle or a given incident beam, such as energy, incidence and / or travel, a SOA voltage domain is determined beyond which destructive events of said component will take place, the electronic component thus energized is excited. in operation with the characteristics of the incident particle or beam, under operating conditions close to the highest voltage value of the determined SOA voltage range, - determining an effective cross section of the amplified transient events, this cross section corresponding to a estimation of the destructive phenomena of said component, the characteristics of said particle or of said beam are modified, and the excitation of the it ...

METHOD OF INVESTIGATING THE TEMPERATURE RELIABILITY OF AN ELECTRONIC COMPONENT

Method for testing a software application

In order to test a software application, the method comprises submitting an electronic board (16) including a component (1) implementing an application to a laser radiation (15) generated in test equipment (17). The component is excited with laser pulses having very short durations distributed during complex operational phases of the component for running the application, and the reaction of the component and the application is observed.

Method for testing a software application

Pour tester une application logicielle, on soumet une carte électronique (16) portant un composant (1) mettant en oeuvre une application à un rayonnement laser (15) produit par une installation (17) de test. On excite le composant avec des impulsions laser de très courtes durées réparties pendant des phases complexes de fonctionnement du composant pour réaliser l'application et on observe la réaction du composant et de l'application.

COMPONENT HAVING AN INTEGRATED CIRCUIT COMPRISING A CRYPTO-PROCESSOR AND METHOD OF INSTALLATION

Pour protéger un composant en circuit intégré muni d'un crypto-processeur contre les agressions visant à révéler les secrets, on prévoit d'utiliser un composant sensible au déclenchement d'un thyristor parasite (latchup) et/ou déclenchement d'un transistor bipolaire parasite ou de concevoir un circuit ayant cette propriété. Si le composant est agressé, du fait de la présence de ce circuit, il se met immédiatement hors service, empêchant de fait la révélation de ses secrets. To protect an integrated circuit component equipped with a crypto-processor against attacks intended to reveal the secrets, it is intended to use a sensitive component triggering a parasitic thyristor (latchup) and / or tripping a bipolar transistor parasite or design a circuit with this property. If the component is attacked, because of the presence of this circuit, it immediately goes out of service, preventing the revelation of its secrets.

Verfahren zur charakterisierung der empfindlichkeit einer elektronischen komponente bezüglich energetischer wechselwirkungen

Procede d'etude de la fiabilite en temperature d'un composant electronique

La présente invention se rapporte à un procédé d'analyse de la fiabilité en température d'un composant (10) électronique comportant une puce (12) électronique montée dans un boîtier (11), ladite puce (12) électronique étant composée de plusieurs couches (13-15) de matériaux, caractérisé en ce que le procédé comporte les étapes suivantes : - couplage thermique d'un organe de couplage (25), thermiquement conducteur, avec la puce (12) électronique; - détermination d'une longueur d'onde en fonction des couches (13-15) de matériau à traverser et du taux d'absorption d'une couche de matériau à solliciter; et - mise sous contrainte thermique d'une zone d'intérêt (20) au moyen d'une source laser (32) émettant la longueur d'onde prédéterminée.

Procede d'etude de la fiabilite en temperature d'un composant electronique

La présente invention se rapporte à un procédé d'analyse de la fiabilité en température d'un composant (10) électronique comportant une puce (12) électronique montée dans un boîtier (11), ladite puce (12) électronique étant composée de plusieurs couches (13-15) de matériaux, caractérisé en ce que le procédé comporte les étapes suivantes : - couplage thermique d'un organe de couplage (25), thermiquement conducteur, avec la puce (12) électronique ; - détermination d'une longueur d'onde en fonction des couches (13-15) de matériau à traverser et du taux d'absorption d'une couche de matériau à solliciter ; et - mise sous contrainte thermique d'une zone d'intérêt (20) au moyen d'une source laser (32) émettant la longueur d'onde prédéterminée.