Настройки

Укажите год
-

Небесная энциклопедия

Космические корабли и станции, автоматические КА и методы их проектирования, бортовые комплексы управления, системы и средства жизнеобеспечения, особенности технологии производства ракетно-космических систем

Подробнее
-

Мониторинг СМИ

Мониторинг СМИ и социальных сетей. Сканирование интернета, новостных сайтов, специализированных контентных площадок на базе мессенджеров. Гибкие настройки фильтров и первоначальных источников.

Подробнее

Форма поиска

Поддерживает ввод нескольких поисковых фраз (по одной на строку). При поиске обеспечивает поддержку морфологии русского и английского языка
Ведите корректный номера.
Ведите корректный номера.
Ведите корректный номера.
Ведите корректный номера.
Укажите год
Укажите год

Применить Всего найдено 8. Отображено 8.
20-02-2014 дата публикации

SYSTEM FOR MEASURING MATERIAL LEVELS USING CAPACITANCE AND TIME DOMAIN REFLECTOMETRY SENSORS

Номер: US20140049274A1
Автор: Hafer Kevin G.
Принадлежит: AMETEK, INC.

An apparatus and system for measuring levels of two or more materials maintained within a storage tank using a combination of both a capacitance sensor and a time domain reflectometry (“TDR”) waveguide sensor is disclosed. The apparatus includes a combined circuit for the capacitance sensor and TDR sensor that creates a separation between the return signal from the capacitance sensor and the TDR sensor. The need for the return signal separation is due to the generation of false reflection signals from the capacitance circuitry. In a preferred embodiment, the separation in time is created by moving the capacitance false reflections further in time than the true signal returns. An alternative preferred embodiment would delay the true TDR signals passed the capacitance false reflections. Another alternative preferred embodiment would provide a substantially matched impedance of the capacitance circuit to the TDR circuit, to substantially eliminate the false reflections. 1. An apparatus for measuring two or more levels of materials stored in a tank or vessel , comprising:a capacitance sensor and first related circuitry; anda time domain reflectometry (“TDR”) sensor and second related circuitry;wherein a separation in time between a return signal from the capacitance sensor and a return signal from the TDR sensor is created using the first and the second related circuitry.2. The apparatus for measuring two or more levels of materials stored in a tank or vessel claim 1 , as described in claim 1 , wherein the separation in time between a return signal from the capacitance sensor and a return signal from the TDR sensor is created using only the first related circuitry.3. The apparatus for measuring two or more levels of materials stored in a tank or vessel claim 1 , as described in claim 1 , wherein the separation in time between a return signal from the capacitance sensor and a return signal from the TDR sensor is created using only the second related circuitry.4. The ...

Подробнее
24-12-2009 дата публикации

Measurement Systems Having Seals With Pressure Relief

Номер: US20090315278A1
Принадлежит: Ametek Inc

Embodiments of systems include primary and secondary seals, and pressure-relief devices that are configured and positioned so that the secondary seals can have maximum rated capacities substantially less than those of the primary seals.

Подробнее
03-06-2010 дата публикации

Apparatus for high precision measurement of varied surface and material levels

Номер: CA2744871A1
Принадлежит: Ametek Inc

An apparatus and method for measuring the level of a wide range of varied surfaces or materials housed within vessels, and for detecting contact with a solid surface within the vessel is disclosed. A high precision radio frequency admittance measuring system, using capacitance to measure levels of process materials, coupled with detection element to sense contact of the detection element with a solid surface, such as a floating roof. An active element and ground element in coaxial relationship provides means for measuring the level of process materials including water, oil, kerosene, jet fuel, gasoline. Along with detecting the level of a solid surface within the vessel such as a floating roof. One preferred application of the inventive apparatus is to provide vessel or tank overfill protection. The apparatus detection element is capable of sensing level and non-level solid surfaces.

Подробнее
19-02-2008 дата публикации

High efficiency power supply for a two-wire loop powered device

Номер: CA2347890C
Принадлежит: Ametek Inc

A process control device is disclosed. The process control device comprises a measuring circuit (102) and a power regulator circuit (100). The measuring circuit (102) is coupled to the power regulator (100), and produces a control signal indicative of a measured value. The power regulator circuit (100) redirects a portion of the available power from the power regulator circuit (100) in proportion to the control signal produced by the measuring circuit (102) such that it does not limit available power to the measuring circuit (102). The process control device also may comprise a power control circuit (101) coupled to the measuring circuit (102). The power control circuit (101) redirects an amount of available power from the power regulator circuit (100) in proportion to the control signal. The process control device also comprises two or more conductors (106, 107) that are in electrical communication with the power regulator circuit (100) and the power control circuit (101). These conductors (106, 107) deliver the available power to the power regulator circuit (100) and the power control circuit (101), as well as receiving a first electric signal from the power regulator circuit (100) and a second electric signal from the power control circuit (101).

Подробнее
23-01-2002 дата публикации

High efficiency power supply for a two-wire loop powered device

Номер: EP1147463A4
Принадлежит: Drexelbrook Controls Inc

A process control device is disclosed. The process control device comprises a measuring circuit (102) and a power regulator circuit (100). The measuring circuit (102) is coupled to the power regulator (100), and produces a control signal indicative of a measured value. The power regulator circuit (100) redirects a portion of the available power from the power regulator circuit (100) in proportion to the control signal produced by the measuring circuit (102) such that it does not limit available power to the measuring circuit (102). The process control device also may comprise a power control circuit (101) coupled to the measuring circuit (102). The power control circuit (101) redirects an amount of available power from the power regulator circuit (100) in proportion to the control signal. The process control device also comprises two or more conductors (106, 107) that are in electrical communication with the power regulator circuit (100) and the power control circuit (101). These conductors (106, 107) deliver the available power to the power regulator circuit (100) and the power control circuit (101), as well as receiving a first electric signal from the power regulator circuit (100) and a second electric signal from the power control circuit (101).

Подробнее
28-02-2013 дата публикации

System for measuring material levels using capacitance and time domain reflectometry sensors

Номер: WO2012149521A3
Автор: Kevin G. Hafer
Принадлежит: AMETEK, INC.

An apparatus and system for measuring levels of two or more materials maintained within a storage tank using a combination of both a capacitance sensor and a time domain reflectometry ("TDR") waveguide sensor is disclosed. The apparatus includes a combined circuit for the capacitance sensor and TDR sensor that creates a separation between the return signal from the capacitance sensor and the TDR sensor. The need for the return signal separation is due to the generation of false reflection signals from the capacitance circuitry. In a preferred embodiment, the separation in time is created by moving the capacitance false reflections further in time than the true signal returns. An alternative preferred embodiment would delay the true TDR signals passed the capacitance false reflections. Another alternative preferred embodiment would provide a substantially matched impedance of the capacitance circuit to the TDR circuit, to substantially eliminate the false reflections.

Подробнее
05-03-2014 дата публикации

System for measuring material levels using capacitance and time domain reflectometry sensors

Номер: EP2702371A2
Автор: Kevin G. Hafer
Принадлежит: Ametek Inc

An apparatus and system for measuring levels of two or more materials maintained within a storage tank using a combination of both a capacitance sensor and a time domain reflectometry ("TDR") waveguide sensor is disclosed. The apparatus includes a combined circuit for the capacitance sensor and TDR sensor that creates a separation between the return signal from the capacitance sensor and the TDR sensor. The need for the return signal separation is due to the generation of false reflection signals from the capacitance circuitry. In a preferred embodiment, the separation in time is created by moving the capacitance false reflections further in time than the true signal returns. An alternative preferred embodiment would delay the true TDR signals passed the capacitance false reflections. Another alternative preferred embodiment would provide a substantially matched impedance of the capacitance circuit to the TDR circuit, to substantially eliminate the false reflections.

Подробнее
28-04-2004 дата публикации

Discrete level measurement device with automatic threshold setting.

Номер: EP1412711A1
Автор: Kevin G. Hafer
Принадлежит: Ametek Inc

A system and method are provided for automatically setting a thr eshold for a point level device without having a user select whether a point level element is covered or uncovered. A first and second value are measured from a point level element. Whether the point level element is covered or uncovered is determined based on whether the second measured value has increased or decreased with respect to the first measured value. A threshold value is determined based on at least one of the first and second measured values.

Подробнее