System for defect indication detection

Methods, apparatus and computer-readable media for detecting potential defects in a part are disclosed. A potential defect may be automatically detected in a part, and may be reported to an operator in various ways so that the operator may review the defect and take appropriate action.

Systems and methods for automatic defect recognition

An image inspection computing device is provided. The device includes a memory device and at least one processor. The at least one processor is configured to receive at least one sample image of a first component, wherein the at least one sample image of the first component does not include defects, store, in the memory, the at least one sample image, and receive an input image of a second component. The at least one processor is also configured to generate an encoded array based on the input image of the second component, perform a stochastic data sampling process on the encoded array, generate a decoded array, and generate a reconstructed image of the second component, derived from the stochastic data sampling process and the decoded array. The at least one processor is further configured to produce a residual image, and identify defects in the second component.

METHOD FOR DEFECT INDICATION DETECTION

Methods, apparatus and computer-readable media for detecting potential defects in a part are disclosed. A potential defect may be automatically detected in a part, and may be reported to an operator in various ways so that the operator may review the defect and take appropriate action. 1. A volumetric computed tomography (VCT)-based method for providing notification of a potential defect in a composite part , comprising:{'b': '102', 'obtaining () VCT scan data representing a three-dimensional (3D) volume of the composite part;'}{'b': '220', 'normalizing () the 3D volume against a generated background of the composite part that includes beam hardening and/or scattering artifacts;'}{'b': '222', 'detecting () an indication of the potential defect in the normalized 3D volume; and'}{'b': '112', 'outputting () information about the indication.'}2806. The VCT-based method of claim 1 , wherein the outputting comprises rendering claim 1 , on a display () claim 1 , a 3D image of the composite part that includes the indication.3224. The VCT-based method of claim 1 , further comprising determining () a boundary of the detected indication based at least in part on a computer-aided design (CAD) model claim 1 , wherein the information about the indication includes information about the boundary.4. The VCT-based method of claim 3 , further comprising:{'b': '222', 'identifying () a seed voxel of the indication; and'}{'b': 620', '720, 'performing (, ) region growing around the seed voxel.'}5400. The VCT-based method of claim 4 , wherein the CAD model is a ply model () of the composite part claim 4 , and growth of the region around the seed voxel is constrained by the ply model.6610. The VCT-based method of claim 1 , further comprising denoising () the normalized 3D volume using an adaptive bilateral filter.7606. The VCT-based method of claim 1 , further comprising denoising () the normalized 3D volume using a non-local means filter.8. The VCT-based method of claim 1 , further ...

METHOD FOR INSPECTING COMPONENTS USING COMPUTED TOMOGRAPHY

A method of inspecting a component using computed tomography is described, the method comprising the steps of: (a) providing a computed tomography (CT) scanner; (b) providing a target component; (c) reviewing the geometry of the component; (d) estimating the best component orientation; (e) orienting the component; (f) scanning the component with the CT scanner; (g) loading CT scan data into 3D image software; (h) registering the best CT scan data; (i) determining acceptable and unacceptable regions of CT scan data; (j) determining additional component orientations; (k) repeating steps (e) through (i) until all regions of CT scan data for the component are acceptable; and (l) creating a merged volume of acceptable CT scan data. 1. A method of inspecting a component using computed tomography , the method comprising the steps of;(a) providing a computed tomography (CT) scanner;(b) providing a target component;(c) reviewing the geometry of the component;(d) estimating the best component orientation;(e) orienting the component;(f) scanning the component with the CT scanner;(g) loading CT scan data into 3D image software;(h) registering the best CT scan data;(i) determining acceptable and unacceptable regions of CT scan data;(j) determining additional component orientations;(k) repeating steps (e) through (i) until all regions of CT scan data for the component are acceptable; and(l) creating a merged volume of acceptable CT scan data.2. The method of claim 1 , further comprising the step (m) of programming software to scan additional components.3. The method of claim 2 , wherein the additional components have the same configuration.4. The method of claim 1 , wherein step (e) includes fixturing the component.5. The method of claim 1 , wherein step (d) is accomplished minimizing long X-Ray path lengths through the solid area of the component.6. The method of claim 1 , wherein step (h) is accomplished using the 3D image software.7. The method of claim 1 , wherein step (k) is ...

Method for defect indication detection

Methods, apparatus and computer-readable media for detecting potential defects in a part are disclosed. A potential defect may be automatically detected in a part, and may be reported to an operator in various ways so that the operator may review the defect and take appropriate action.

Method for defect indication detection

Methods, apparatus and computer-readable media for detecting potential defects in a part are disclosed. A potential defect may be automatically detected in a part, and may be reported to an operator in various ways so that the operator may review the defect and take appropriate action.

Method for defect indication detection

Methods, apparatus and computer-readable media for detecting potential defects in a part are disclosed. A potential defect may be automatically detected in a part, and may be reported to an operator in various ways so that the operator may review the defect and take appropriate action.

Systems and methods for automatic defect recognition

An image inspection computing device (104) is provided. The device (104) includes a memory device (310,410) and at least one processor (305,405). The at least one processor (305,405) is configured to receive at least one sample image of a first component (202), wherein the at least one sample image (202) of the first component (202) does not include defects (258), store, in the memory (310,410), the at least one sample image (202), and receive an input image of a second component (206,252). The at least one processor (305,405) is also configured to generate an encoded array based on the input image of the second component (206,252), perform a stochastic data sampling process on the encoded array, generate a decoded array, and generate a reconstructed image (254) of the second component, derived from the stochastic data sampling process and the decoded array. The at least one processor (305,405) is further configured to produce a residual image (210,256), and identify defects (258) in the second component.

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Method and apparatus for inspecting components

A method for inspecting a component is provided. The method includes generating an image of the component, generating a signal indication mask, and generating a noise mask using a signal within the signal indication mask. The noise mask facilitates reducing a quantity of prospective signals contained in the signal indication mask. The method further includes utilizing the signal indication mask and the generated noise mask to calculate the signal-to-noise ratio of at least one potential flaw indication that may be present in the image.