Intelligent exploration device for mine environment and use method

The invention relates to the technical field of mine exploration, and particularly discloses an intelligent exploration device for a mine environment and a use method.The intelligent exploration device comprises an exploration vehicle, a swing exploration arm rod is hinged to the top of the exploration vehicle, and an exploration confirmation assembly used for exploring the stability of different areas of a top plate is arranged on the outer side of the swing exploration arm rod; a measuring point stabilizing assembly is arranged above the survey confirmation assembly and comprises a storage box for storing concrete and four discharge pipes; the local stability is surveyed at the top plate area position according to the acting force applied by the four subarea surveying discs, so that the position of the measuring nail is confirmed, the nailing acting force is applied to the measuring nail after the area stability of the top plate is surveyed, and the measuring nail is located in the top ...

Data classification analyzing method and device for chip failure

The invention provides data classification analyzing method and device for chip failure. The method comprises the following steps of: confirming the size and type of a chip; confirming a chip failure mode; scanning the chip and storing the information of a failure site in the chip as primary data in a database; converting a primary data format into a uniform standard data format; analyzing and classifying the standard data; and displaying a classifying result. Compared with the prior art, the data classification analyzing method and device for chip failure confirm the size and the type of thechip and the chip failure mode and respectively calculate and combine transverse and longitudinal failure sites by adopting a one-dimensional clustering algorithm, thereby greatly reducing statistical operand, improving the performance of a system and being applied to analyze a high-capacity storage product.

Method and system for judging mask defects

The invention relates to a method for judging mask defects, which comprises providing a mask with graphs and different wafers, and transferring the graphs of the mask to different wafers; acquiring the graphs of the wafers, and judging whether the wafers have defects or not and judging the positions at which the defects are positioned on the wafers; providing a position threshold value, comparingthe positions of the defects positioned on different wafers, and if the position difference of defects positioned on different wafers is less than the position threshold value, determining that the defects are positioned in the same area; and providing a preset value, if the number of the wafers in which the defects within the same area are positioned exceeds the preset value, determining that the defects occur on the corresponding position of the mask. The invention also provides a system for judging the mask defects, which realizes the function of judging the defects of the mask on line so as ...

Underground water manual observation channel drilling equipment

The invention discloses underground water manual observation channel drilling equipment, and relates to the technical field of underground water observation, the underground water manual observation channel drilling equipment comprises a port base, belt wheel supporting legs are fixedly mounted at the four corners of the bottom end of the port base, a top frame is fixedly mounted on the port base, and the underground water manual observation channel drilling equipment further comprises a reaming and drilling assembly, a protection cylinder and a bearing assembly; the chambering and drilling assembly comprises a multi-stage hydraulic rod arranged above the top frame, the end of the multi-stage hydraulic rod is connected with an abutting unit, the chambering and drilling assembly further comprises an expansion cylinder arranged below the abutting unit, and a drill rod coaxially arranged is fixedly installed at the bottom end of the expansion cylinder; the protective cylinder is used for protecting ...

Underground water in-situ remediation treatment device

The invention relates to the technical field of underground water in-situ remediation and treatment, and discloses an underground water in-situ remediation and treatment device which comprises a material injection barrel penetrating through the ground surface, the bottom of the material injection barrel is arranged on an underground water layer, a box body is arranged on one side of the material injection barrel, a water pump is arranged between the material injection barrel and the box body, and a water inlet pipe communicated with the box body is arranged on one side of the water pump. A plurality of vertical plates used for sealing through holes are fixedly installed at the lower end of a circular ring in a material injection barrel, sealing mechanisms used for sealing the through holes are arranged in the vertical plates in a penetrating mode, a threaded rod is rotationally connected to the upper end of a connecting ring, a push ring is slidably connected into the connecting ring, and ...

Method and system for detecting defects in manufacture of integrated circuit

The invention relates to a method and a system for detecting deflects in the manufacture of an integrated circuit. In one embodiment, the invention provides a method for detecting one or more sources possibly causing manufacturing deflects of the integrated circuit. The method comprises a step of providing a plurality of semiconductor substrates, a step of using a plurality of processing devices to process the plurality of semiconductor substrates in a plurality of processing steps, a step of providing a data base including the data related to the processing of the plurality of semiconductor substrates, a step of detecting a plurality of semiconductor chips after the processing of the plurality of semiconductor substrates, a step of detecting at least one defective feature related to the plurality of processed semiconductor substrates and a step of detecting a processing step collection, for example, the processing step collection is possibly related to the defective feature.

Multi-stage remediation equipment for underground water pollution treatment

The invention relates to the technical field of underground water remediation, and discloses multi-stage remediation equipment for underground water pollution treatment, the multi-stage remediation equipment comprises a pumping well, a recharge well, a water pump, a water pipe and a multi-stage filter, a cover plate is arranged on the upper surface of the recharge well, and an air pump, a motor and a sealed water injection mechanism are fixedly connected to the upper surface of the cover plate; the driving end of the motor is fixedly connected with a rotating shaft, one end of the rotating shaft is sleeved with a transmission assembly, the exhaust end of the air pump communicates with an exhaust pipe, and one end of the exhaust pipe penetrates through the cover plate and extends into the recharge well. According to the device, the air pump is arranged to be matched with the motor for use, so that the motor can drive the air pump to operate, then the air pump injects air into the recharge ...

Inclination angle measuring device for hydrogeological survey

The invention relates to the technical field of hydrogeological exploration, in particular to a dip angle measuring device for hydrogeological survey, which comprises two end supports, two guide rods fixed between the two end supports, and a sliding frame slidably connected to the outer sides of the two guide rods, and further comprises a base, the angle amplification measurement mechanism is arranged at one end of the inner side of the sliding frame; and the flatness measuring mechanism is arranged at the other end of the inner side of the sliding frame. According to the invention, through the angle amplification measuring mechanism, when a large-angle slope surface is measured, the angle value can be read more quickly through the long pointer, and when a small-angle slope surface is measured, the rotation angle of the short pointer can be amplified by multiple times, so that the angle value can be observed by naked eyes, the reading error is reduced, and the measuring accuracy is improved ...

Data classification analyzing method and device for chip failure

Intelligent observation equipment for hydrological dynamics and use method

The invention relates to the technical field of hydrological observation, and particularly discloses an intelligent observation device for hydrological dynamics and a use method, the intelligent observation device comprises an embedded holding clamping rod, an observation data collection module and an electronic water level measurement module; according to a current water channel, an electronic water level measuring module drives and controls an edge flow blocking baffle to adjust the longitudinal partition width, then an electric control lifting driving piece drives and controls a corner cutting overflowing base to rapidly complete weir crest height adjustment, self-adaptive regulation and control are completed, space limitation caused by manual distance adjustment is reduced, and after water flows through the corner cutting overflowing base, the water flow is blocked and flows through the corner cutting overflowing base, and the weir crest height is adjusted. Water level flow data used ...

Water sample storage device for groundwater exploration

The invention discloses a water sample storage device for groundwater exploration, and relates to the technical field of groundwater exploration, the water sample storage device comprises a supporting plate, a storage box is fixedly mounted on the supporting plate, an inner supporting block is fixedly mounted in the storage box, the water sample storage device further comprises a plurality of water storage assemblies and a plurality of locking assemblies, each water storage assembly comprises a water storage bottle, and the locking assemblies are fixedly mounted on the supporting plate. A threaded wall groove is formed in the upper end of the inner circumferential wall of the water storage bottle, a through hole abutting block is connected into the threaded wall groove through threads, and a cavity pipe fixedly communicates with the through hole abutting block. After the water storage bottle is filled with water samples, due to the fact that the water samples filled every time cannot be ...

Wafer quality control method

The invention discloses a wafer quality control method. The relation between acceptable test parameter and yield as well as time can be acquired according to the acceptable test parameters and the yields of various wafers measured at different time. If both the acceptable test parameter and the yield drift as time goes by and the correlative probability of the time is less than a first set value, the tendency of the yield as the acceptable parameter drifts can be obtained according to the acceptable parameter and the yield. The correlative coefficients of the yield and the acceptable parameter can be obtained according the tendency of the yield along with the drift of the acceptable parameter. If the correlative coefficients of the yield and the acceptable parameter are equal to or greater than a second set value, the acceptable parameter is a doubtful parameter correlative to the ineffectiveness of the wafer. If the correlative coefficients of the yield and the acceptable parameter are ...

Wafer quality analysis method and device

The invention discloses a method for analyzing the quality of a wafer. The method is as follows: a failure distribution pattern of the wafer is determined through the following judgments and then the quality of the wafer is analyzed according to the failure distribution pattern of the wafer: firstly, judgment is made whether the good product ratio of a whole box of wafers is lower than a set value and whether the result under a test item is within a set range; secondly, judgment is made whether the failure crystal grain distribution condition of the whole box of the wafers under the test item belongs to a known failure distribution pattern; thirdly, judgment is made whether a determined retention pattern of the whole box of the wafers occurs during the process of failure crystal grain distribution of the whole box of the wafers under the test item; fourthly, judgment is made whether a determined retention pattern of a single wafer occurs during the process of failure crystal grain distribution ...

Method and system for testing chips

The invention provides a method and a system for processing test data of chips. The method comprises the following steps of: testing n chips partitioned from a wafer to obtain n groups of test data, wherein each group of the test data comprises f types of test data; dividing the n groups of the test data into m compression groups, wherein each compression group comprises complete group test data; compressing each type of the test data in each compression group according to a certain functional relation respectively; storing results of the compression; and analyzing the stored test data, wherein m, n and f are natural numbers and n is bigger than m.

Method and system for judging mask defects

The invention relates to a method for judging mask defects, which comprises providing a mask with graphs and different wafers, and transferring the graphs of the mask to different wafers; acquiring the graphs of the wafers, and judging whether the wafers have defects or not and judging the positions at which the defects are positioned on the wafers; providing a position threshold value, comparing the positions of the defects positioned on different wafers, and if the position difference of defects positioned on different wafers is less than the position threshold value, determining that the defects are positioned in the same area; and providing a preset value, if the number of the wafers in which the defects within the same area are positioned exceeds the preset value, determining that the defects occur on the corresponding position of the mask. The invention also provides a system for judging the mask defects, which realizes the function of judging the defects of the mask on line so as ...

Compound preparation for preventing and curing fruit tree disease of rotting fruit tree

The invented compound preparation belongs to the field of agricultural technology. It is composed of the peroxyacetic solution of polygonum aviculare, sal ammoniac, reticulate millettia and sealwort. Said liquid medicine features simple preparation, low cost, no need of scraping bark, decreasing the artificially imposed damage and the effective rate for rot of fruit tree comes up to 99% odd.

Method of determining boundary of wafer test data standard and crystal grain marking method

The invention provides a method of determining a boundary of wafer test data standard and a crystal grain marking method, and relates to the technical field of semiconductors. The method of determining the boundary of wafer test data standard can determine corresponding wafer test data standard boundaries in view of different wafers respectively. The crystal grain marking method comprises steps: S101, the boundary of wafer test data standard is determined, wherein the method of determining the boundary of wafer test data standard is realized by adopting the above method; and S102, crystal grains when the wafer test data falls out of the boundary of the corresponding wafer test data standard are marked to be unqualified products. According to the method of determining the boundary of wafer test data standard, as a dynamic method is adopted to determine the boundary of wafer test data standard, the yield of crystal grains on the wafer can be improved. According to the crystal grain marking ...

Automatic classification method and system for failure information of CIS (contact image sensor)

The invention provides an automatic classification method and system for failure information of a CIS (contact image sensor). The automatic classification method includes the steps: outputting a detection result picture file which is a BMP (bitmap) picture file by the CIS; reading the detection result picture file and extracting the failure information. The specific process includes: switching the BMP picture file into a hexadecimal file; finding the gray value range of failure bits by a hierarchical cluster analysis method according to the characteristic of pixel color jump of normal bits and the failure bits; switching the failure information into a result file in a standard text format; automatically classifying the failure information in the result file according to a user-defined failure mode; displaying an automatic classification result. The problem of difficulty in automatic classification analysis for CIS product image testing results is rapidly solved, and the problems of low ...

Wafer sorting technique

The invention discloses a wafer sorting technique. In the sorting technique, a batch of known wafers are provided; the known wafers are the wafers with WAT data and CP data and are divided into good and bad groups; WAT parameters are screened from the WAT data of the known wafers; the screened WAT parameters are subject to orthogonal analysis to obtain principal components which are selected; an unknown wafer is provided; the unknown wafer is one wafer which is provided with WAT data and not provided with CP data; the unknown wafer is represented by using the selected principal components; the good group and the bad group are respectively represented by using the selected principal components; the unknown wafer, the good group and the bad group which are respectively represented by the selected principal components are substituted into a discriminatory analysis formula so as to calculate the distances from the unknown wafer to the good and bad groups; and the unknown wafer is sorted to ...

Rock-soil layer drilling device for hydrogeological survey

The invention relates to the technical field of soil drilling equipment, in particular to a rock-soil layer drilling device for hydrogeological survey, which comprises a bottom plate, a support is fixedly mounted on the front side of the top of the bottom plate, and movable frames are movably connected to two sides of the support in a sleeving manner. By arranging a movable head, a driving motor, a movable disc, a connecting rope and a through opening, the movable head does not move upwards due to the fact that a middle cavity is filled with high-pressure gas, and at the moment, along with rotation of a sampling drill bit body, the movable head and a bottom block, the sampling drill bit can go deep into deep soil from rock soil on the surface; then an operator can start operation of a driving motor, a rotating shaft can drive a lead screw to rotate, at the moment, a movable disc can move downwards in an outer cavity under the limiting effect of a vertical rod, and at the moment, high-pressure ...

Compound type soil and underground water circulating treatment device

The invention discloses a composite type soil and underground water circulation treatment device, and relates to the technical field of soil and underground water treatment, the composite type soil and underground water circulation treatment device comprises a base platform, a pretreatment tank and a sedimentation tank are fixedly mounted at the top of the base platform, and the sedimentation tank is of an inverted bucket-shaped structure as a whole; the impurity removal assembly is used for discharging filtered impurities and comprises a first rotary column and a second rotary column, the first rotary column and the second rotary column are rotationally installed in the pretreatment tank and the sedimentation tank correspondingly, and the circumferential outer walls of the first rotary column and the second rotary column are fixedly connected with a first auger sheet and a second auger sheet correspondingly; the diameters of the auger sheet I and the auger sheet II are respectively matched ...

Wafer quality control method

The invention discloses a wafer quality control method. The relation between acceptable test parameter and yield as well as time can be acquired according to the acceptable test parameters and the yields of various wafers measured at different time. If both the acceptable test parameter and the yield drift as time goes by and the correlative probability of the time is less than a first set value,the tendency of the yield as the acceptable parameter drifts can be obtained according to the acceptable parameter and the yield. The correlative coefficients of the yield and the acceptable parameter can be obtained according the tendency of the yield along with the drift of the acceptable parameter. If the correlative coefficients of the yield and the acceptable parameter are equal to or greater than a second set value, the acceptable parameter is a doubtful parameter correlative to the ineffectiveness of the wafer. If the correlative coefficients of the yield and the acceptable parameter are ...

Method and system for detecting defects in manufacture of integrated circuit

The invention relates to a method and a system for detecting deflects in the manufacture of an integrated circuit. In one embodiment, the invention provides a method for detecting one or more sources possibly causing manufacturing deflects of the integrated circuit. The method comprises a step of providing a plurality of semiconductor substrates, a step of using a plurality of processing devices to process the plurality of semiconductor substrates in a plurality of processing steps, a step of providing a data base including the data related to the processing of the plurality of semiconductor substrates, a step of detecting a plurality of semiconductor chips after the processing of the plurality of semiconductor substrates, a step of detecting at least one defective feature related to the plurality of processed semiconductor substrates and a step of detecting a processing step collection, for example, the processing step collection is possibly related to the defective feature.

Soil drilling equipment for geological exploration

The invention relates to the technical field of soil drilling equipment, in particular to geological exploration soil drilling equipment which comprises a moving assembly, the moving assembly comprises a first moving plate, a shell is fixed to the top of the first moving plate, and a second servo motor is fixed in the shell; a round hole is formed in the top of the first moving plate, a rotating cylinder is rotationally installed on the top of the first moving plate through a bearing, a rotating rod assembly is arranged in the rotating cylinder, a transmission assembly is arranged between the second servo motor and the rotating cylinder and comprises a rotating shaft, and one end of the rotating shaft is coaxially fixed to an output shaft of the second servo motor; the transmission assembly further comprises two speed change discs. The two speed change discs each comprise a rotating disc, and the two rotating discs are coaxially fixed to the rotating shaft and the rotating cylinder correspondingly ...

Compound preparation for preventing and treating rotting and disease of fruit tree

Limit value determination method for wafer test parameters

The invention provides a limit value determination method for wafer test parameters, which combines yield test parameters and acceptable test parameters, and divides the acceptable test parameters into two types: one type is relevant to the yield test parameters, while the other type is irrelevant to the yield test parameter; and for the acceptable test parameters which are relevant to the yield test parameters, according to the influence degree difference of different acceptable test parameters on the yield, the limit value rang of the acceptable test parameters is defined so as to improve the accuracy of alarming, reduce the mistaken report and leakage report, save the labor force and time and save the cost.

Integrated hydrogeological survey drilling tool with water taking function

The invention discloses an integrated hydrogeological survey drilling tool with a water taking function, and relates to the technical field of survey drilling tools, the integrated hydrogeological survey drilling tool comprises a bottom plate, the top of the bottom plate is provided with a sliding plate, the top of the sliding plate is fixedly connected with a motor, and the output end of the motor is connected with a driving shaft through a coupler. Through arrangement of the water taking unit, a motor is reversely started, so that a driving shaft drives a fixed shaft, a hollow rotating column and rotating fan blades to rotate through a ratchet wheel and a clamping block, meanwhile, the driving shaft can drive a threaded block to move upwards, the threaded block moves to drive a fixed rod, a connecting rod and a baffle to move upwards, and a water inlet hole is opened; according to the underground water sampling device, underground water enters the movable cavity through the water inlet ...