ELECTRON MICROSCOPE SAMPLE HOLDER FOR FORMING A GAS OR LIQUID CELL WITH TWO SEMICONDUCTOR DEVICES

A novel sample holder for specimen support devices for insertion in electron microscopes. The novel sample holder of the invention allows for the introduction of gases or liquids to specimens for in situ imaging, as well as electrical contacts for electrochemical or thermal experiments.

ELECTRON MICROSCOPE SAMPLE HOLDER FOR FORMING A GAS OR LIQUID CELL WITH TWO SEMICONDUCTOR DEVICES

A novel sample holder for specimen support devices for insertion in electron microscopes. The novel sample holder of the invention allows for the introduction of gases or liquids to specimens for in situ imaging, as well as electrical contacts for electrochemical or thermal experiments.

Method for forming an electrical connection to a sample support in an electron microscope holder

An electrical connector for use in electron microscopy sample holders. The electrical connector provides electrical contacts to the sample support devices which are positioned in the sample holders for electrical, temperature and/or electrochemical control.

Electron microscope sample holder for forming a gas or liquid cell with two semiconductor devices

A novel sample holder for specimen support devices for insertion in electron microscopes. The novel sample holder of the invention allows for the introduction of gases or liquids to specimens for in situ imaging, as well as electrical contacts for electrochemical or thermal experiments.

SPECIMEN HOLDER USED FOR MOUNTING SAMPLES IN ELECTRON MICROSCOPES

A novel specimen holder for specimen support devices for insertion in electron microscopes. The novel specimen holder of the invention provides mechanical support for specimen support devices and as well as electrical contacts to the specimens or specimen support devices. 1. An electron microscope specimen holder comprising a body , a clipping means , and at least one guide mechanism , wherein the clipping means comprise an article of manufacture having a top surface , a bottom surface , a first end , a securing means , a second end , and at least one electrical contact integrated on and/or in the bottom surface of the article , wherein the securing means comprise a locking screw.27.-. (canceled)8. The specimen holder of claim 1 , wherein the at least one electrical contact extends from the second end of the article claim 1 , terminates at the second end of the article claim 1 , or terminates before the second end of the article.914.-. (canceled)15. The specimen holder of claim 1 , wherein a specimen support device is inserted between the bottom surface of the second end of the article and a top surface of the body by turning the locking screw in a direction such that the article is raised relative to the body.16. The specimen holder of claim 1 , wherein the article is lowered by turning the locking screw in the opposite direction such that at least one electrical lead of a specimen support device substantially contacts at least one electrical contact of the article.17. The specimen holder of claim 1 , wherein the at least one electrical contact of the clip extends from the clip to a barrel claim 1 , from the barrel to an end claim 1 , and onto an electrical connector.18. The specimen holder of claim 1 , wherein the specimen holder is inserted into an electron microscope.19. The specimen holder of claim 1 , further comprising a specimen support device mechanically secured between the clipping means and the body.20. The specimen holder of claim 19 , wherein the ...

Specimen holder used for mounting samples in electron microscopes

A novel specimen holder for specimen support devices for insertion in electron microscopes. The novel specimen holder of the invention provides mechanical support for specimen support devices and as well as electrical contacts to the specimens or specimen support devices.

ELECTRON MICROSCOPE SAMPLE HOLDER FOR FORMING A GAS OR LIQUID CELL WITH TWO SEMICONDUCTOR DEVICES

A novel sample holder for specimen support devices for insertion in electron microscopes. The novel sample holder of the invention allows for the introduction of gases or liquids to specimens for in situ imaging, as well as electrical contacts for electrochemical or thermal experiments. 1. A sample holder for an electron microscope , said sample holder comprising a sample holder body and a sample holder lid , wherein the sample holder body comprises at least one pocket having a pocket bottom and pocket walls for the positioning of two microelectronic devices therein , and the sample lid has a top side and a bottom side.2. The sample holder of claim 1 , wherein the holder body and the holder lid have an electron beam hole for passage of an electron beam through the sample holder.3. The sample holder of claim 1 , wherein the holder body comprises at least one component selected from the group consisting of:(a) at least one electrical contact;(b) at least one inlet supply line;(c) at least one outlet supply line;(d) at least one sealing means;(e) securing means for securing the lid to the holder; and(f) combinations thereof.4. The sample holder of claim 1 , wherein the holder lid comprises at least one component selected from the group consisting of:(a) at least one sealing means;(b) securing means for securing the lid to the holder; and(c) combinations thereof.5. The sample holder of claim 1 , wherein the sealing means comprises an o-ring.6. The sample holder of claim 1 , wherein the securing means comprise screws.7. The sample holder of claim 1 , wherein the sealing means of the holder body are positioned at the pocket bottom in proximity to the electron beam hole.8. The sample holder of claim 1 , wherein at least one sealing means of the lid are positioned on the bottom side of the lid in proximity of the electron beam hole.9. The sample holder of claim 1 , further comprising two microelectronic devices in the pocket of the holder body.10. The sample holder of claim ...

Sample holder providing interface to semiconductor device with high density connections

A novel specimen holder for specimen support specimen support devices for insertion in electron microscopes is provided. The novel specimen holder of the invention provides mechanical support for specimen support devices and as well as electrical contacts to the specimens or specimen support devices.

ELECTRON MICROSCOPE SAMPLE HOLDER FOR FORMING A GAS OR LIQUID CELL WITH TWO SEMICONDUCTOR DEVICES

A novel sample holder for specimen support devices for insertion in electron microscopes. The novel sample holder of the invention allows for the introduction of gases or liquids to specimens for in situ imaging, as well as electrical contacts for electrochemical or thermal experiments. 122.-. (canceled)23. A sample holder for an electron microscope , said sample holder comprising a sample holder body and a sample holder lid , wherein the sample holder body comprises a deep pocket having a deep pocket bottom and deep pocket walls for the positioning of a first microelectronic device therein and a shallow pocket having a shallow pocket bottom and shallow pocket walls for the positioning of a second microelectronic device therein ,wherein the first microelectronic device comprises a first top surface and a first bottom surface,wherein the first top surface comprises at least one first electrical contact and the first bottom surface is positioned in the deep pocket bottom, and the second microelectronic device comprises a second top surface and a second bottom surface, wherein the second top surface comprises at least one second electrical contact and the second top surface is positioned in the shallow pocket bottom such that at least one electrical connection is made between the first electrical contact and the second electrical contact.24. The sample holder of claim 23 , wherein the shallow pocket fully encloses the deep pocket.25. The sample holder of claim 23 , wherein at least one shallow pocket electrical contact is positioned on the shallow pocket bottom.26. The sample holder of claim 25 , wherein at least one additional electrical connection is made between the at least one shallow pocket electrical contact and the at least one second electrical contact.27. The sample holder of claim 23 , wherein the first microelectronic device is a thermal device or an electrical biasing device.28. The sample holder of claim 23 , wherein the second microelectronic device is a ...

SPECIMEN HOLDER USED FOR MOUNTING SAMPLES IN ELECTRON MICROSCOPES

A novel specimen holder for specimen support devices for insertion in electron microscopes. The novel specimen holder of the invention provides mechanical support for specimen support devices and as well as electrical contacts to the specimens or specimen support devices. 1. An electron microscope specimen holder comprising a body , a clipping means , and an interchangeable specimen support device , wherein the specimen support device is mechanically secured between the clipping means and the body and aligned by the at least one guide mechanism , and wherein the specimen support device is selected from the group consisting of a window device and a temperature control device.2. The electron microscope specimen holder of claim 1 , wherein the electron microscope specimen holder further comprises at least one guide mechanism wherein the specimen support device is aligned in the body by the at least one guide mechanism.3. The electron microscope specimen holder of claim 1 , wherein the interchangeable specimen support device comprises a temperature control device.4. The electron microscope specimen holder of claim 3 , wherein the temperature control device is used to control the temperature around a specimen positioned on the specimen control device.5. The electron microscope specimen holder of claim 3 , wherein the temperature control device comprises:(a) a membrane comprising at least one membrane observation region, said membrane having a top side and a bottom side;(b) at least two conductive heat source elements in contact with the top side of the membrane, wherein the at least two heat source elements flank the at least one membrane observation region,wherein the membrane observation region is heatable, and wherein the membrane and the at least two heat source elements are both conductive, ceramic materials.6. The electron microscope specimen holder of claim 5 , wherein the at least two heat source elements are relatively more conductive than the membrane.7. The ...

ELECTRON MICROSCOPE SAMPLE HOLDER FOR FORMING A GAS OR LIQUID CELL WITH TWO SEMICONDUCTOR DEVICES

A novel sample holder for specimen support devices for insertion in electron microscopes. The novel sample holder of the invention allows for the introduction of gases or liquids to specimens for in situ imaging, as well as electrical contacts for electrochemical or thermal experiments. 1. A sample holder for an electron microscope , said sample holder comprising a sample holder body and a sample holder lid , wherein the sample holder body comprises at least one pocket having a pocket bottom and pocket walls for the positioning of two microelectronic devices therein , and the sample lid has a top side and a bottom side , wherein the pocket walls include at least two protrusions for each straight edge of each microelectronic device.2. The sample holder of claim 1 , wherein the sample holder body and the sample holder lid have a hole for passage of an electron beam through the sample holder.3. The sample holder of claim 1 , wherein the sample holder body comprises at least one component selected from the group consisting of:(a) at least one electrical contact;(b) at least one inlet supply line;(c) at least one outlet supply line;(d) at least one sealing means;(e) securing means for securing the sample holder lid to the sample holder body; and(f) combinations of (a)-(e) thereof.4. The sample holder of claim 1 , wherein the holder lid comprises at least one component selected from the group consisting of:(a) at least one sealing means;(b) securing means for securing the sample holder lid to the sample holder body; and(c) combinations of (a) and (b) thereof.5. The sample holder of claim 1 , wherein the sealing means comprises an o-ring.6. The sample holder of claim 3 , wherein the securing means comprise screws.7. The sample holder of claim 1 , wherein a sealing means is positioned at the pocket bottom and surrounds a hole such that a seal is formed around the hole when pressure is applied to a microelectronic device.8. (canceled)9. The sample holder of claim 1 , further ...

MICROSCOPY SUPPORT STRUCTURES

Electron microscope support structures and methods of making and using same. The support structures are generally constructed using semiconductor materials and semiconductor manufacturing processes. The temperature of the support structure may be controlled and/or gases or liquids may be confined in the observation region for reactions and/or imaging. 142.-. (canceled)43. An environmental cell comprising a holder , a window device , and a temperature controlled device , wherein the window device and the temperature controlled device are stacked in a columnar arrangement in the holder and form an observation region where gases and/or liquids can be confined.44. The environmental cell of claim 43 , wherein the temperature controlled device comprises (a) a first membrane comprising at least one membrane observation region claim 43 , and (b) at least one conductive element in contact with the first membrane forming a heatable region of the membrane.45. The environmental cell of claim 44 , wherein the first membrane comprises a semiconductor material selected from the group consisting of silicon nitride claim 44 , silicon carbide claim 44 , boron nitride claim 44 , graphene claim 44 , carbon claim 44 , aluminum nitride claim 44 , silicon dioxide claim 44 , silicon and combinations thereof.46. The environmental cell of claim 44 , wherein the at least one conductive element comprises a semiconductor material such that the at least one conductive element is relatively more conductive than the first membrane.47. The environmental cell of claim 44 , wherein the at least one conductive element comprises a material selected from the group consisting of silicon carbide claim 44 , aluminum nitride claim 44 , boron nitride claim 44 , monocrystalline silicon claim 44 , polycrystalline silicon claim 44 , amorphous silicon claim 44 , other semiconductor materials claim 44 , metals claim 44 , ceramics claim 44 , conducting oxides claim 44 , and combinations thereof.48. The ...

MICROSCOPY SUPPORT STRUCTURES

Electron microscope support structures and methods of making and using same. The support structures are generally constructed using semiconductor materials and semiconductor manufacturing processes. The temperature of the support structure may be controlled and/or gases or liquids may be confined in the observation region for reactions and/or imaging. 2. The device of wherein the membrane region comprises one or more holes or one or more dimples therein.3. The device of wherein the at least two heat source elements flank the at least one membrane observation region.4. The device of wherein the at least two heat source elements flank the pressure sense element.5. The device of claim 1 , wherein the membrane and the at least two heat source elements are both conductive claim 1 , ceramic materials.6. The device of wherein the membrane is supported by a frame located on the bottom side of the membrane and positioned around the perimeter of the device.7. The device of claim 1 , wherein the at least two heat source elements are arranged so that current can be forced through the membrane thus allowing Joule heating to occur in the membrane observation region.8. The device of claim 1 , wherein the membrane consists of a first ceramic material having a first conductivity claim 1 , wherein the first ceramic material is silicon carbide claim 1 , boron nitride claim 1 , or aluminum nitride.9. The device support of wherein the at least two heat source elements are relatively more conductive than the membrane.10. The device of wherein the at least two heat source elements comprise material patterned directly on the at least one membrane claim 1 , wherein said material consists of a second ceramic material having a second conductivity claim 1 , wherein the second ceramic material is silicon carbide claim 1 , boron nitride claim 1 , or aluminum nitride.11. The device of claim 1 , wherein at least one metal pad is applied on each heat source element.12. The device of claim 1 , ...

Membrane supports with reinforcement features

A sample support structure with integrated support features and methods of making and using the reinforced membrane. The sample support structures are useful for supporting samples for analysis using microscopic techniques, such as electron microscopy, optical microscopy, x-ray microscopy, UV-VIS spectroscopy and nuclear magnetic resonance (NMR) techniques.

Membrane supports with reinforcement features

A sample support structure with integrated support features and methods of making and using the reinforced membrane. The sample support structures are useful for supporting samples for analysis using microscopic techniques, such as electron microscopy, optical microscopy, x-ray microscopy, UV-VIS spectroscopy and nuclear magnetic resonance (NMR) techniques.

Specimen holder used for mounting samples in electron microscopes

A novel specimen holder for specimen support devices for insertion in electron microscopes. The novel specimen holder of the invention provides mechanical support for specimen support devices and as well as electrical contacts to the specimens or specimen support devices.

Sample support structure and methods

Specimen mount for microscopy

Devices, mounts, stages, interfaces and systems to be developed that allow for in situ manipulation, experimentation and analysis of specimens directly within an electron microscope.

Specimen holder used for mounting

A novel specimen holder for specimen support devices for insertion in electron microscopes. The novel specimen holder of the invention provides mechanical support for specimen support devices and as well as electrical contacts to the specimens or specimen support devices.

Specimen mount for microscopy

Devices, mounts, stages, interfaces and systems to be developed that allow for in situ manipulation, experimentation and analysis of specimens directly within an electron microscope.

Electron microscope sample holder for forming a gas or liquid cell with two semiconductor devices

A novel sample holder for specimen support devices for insertion in electron microscopes. The novel sample holder of the invention allows for the introduction of gases or liquids to specimens for in situ imaging, as well as electrical contacts for electrochemical or thermal experiments.

Microscopy support structures

Electron microscope support structures and methods of making and using same. The support structures are generally constructed using semiconductor materials and semiconductor manufacturing processes. The temperature of the support structure may be controlled and/or gases or liquids may be confined in the observation region for reactions and/or imaging.