DECOLOURING METHOD FOR RICEBRAN WAX AND OTHER NATURAL WAXES

This invention refers to a process of column chromatography. Appropriate fine grain adsorbent is selected and put into an adsorbing column with thermal insulating sleeve. The wax is dissolved in a solvent of saturated hydrocarbon by heating, and then is put into the column. The adsorbing column is maintained at a definite temperature (44-48 deg.c.), and is eluted with said solvent. A white or light coloured wax solution is yielded. The adsorbent may be reused by circulation. Single solvent is easily recovered, and may be reused by a little amount of supplement.

Conversion clamp for testing light-emitting devices

The invention discloses a conversion clamp for testing light-emitting devices. The conversion clamp for testing the light-emitting devices comprises a screw cap (1), a pressing plate (2), limiting plates (3), an electric connection plate (4) and a base (5) which are arranged from top to bottom, wherein the screw cap (1) is in threaded fit with the base (5); an upper light transmitting hole (6) is designed in the screw cap (1), thereby facilitating light intensity test; the pressing plate (2) is used for pressing the light-emitting devices; the limiting plates (3) are used for storing the tested devices; two electrode contact plates (10) are designed in the electric connection plate (4) and are electrically guided and connected with electrodes of the tested light-emitting devices under the pressure; pin leads (12) are led out of the two electrode contact plates (10) so as to be converted into a lead encapsulating manner. According to the conversion clamp for testing light-emitting devices ...

CMOS (Complementary Metal-Oxide-Semiconductor Transistor) image sensor testing device on basis of FPGA (Field Programmable Gate Array) technology

The invention relates to a CMOS (Complementary Metal-Oxide-Semiconductor Transistor) image sensor testing device on the basis of an FPGA (Field Programmable Gate Array) technology, particularly a performance testing platform on the basis of the EMVA1288 testing standard, and belongs to the technical field of testing of an image sensor. The testing device disclosed by the invention is designed on the basis of the EMVA1288 standard, is rigorous in the defining and testing method of performance parameters and is easy to accept and approve by users; the testing device disclosed by the invention has a simple structure and has a convenient and rapid testing process; a temperature control box is added into the device disclosed by the invention and the temperature of a CMOS image sensor chip to be tested can be changed without integrally moving the testing device, so that the high-temperature performance of the CMOS image sensor to be tested is more convenient and rapid to test.

Multi-channel programmable power supply analysis system

The invention relates to a multi-channel programmable power supply analysis system, which comprises a PXI case, a multi-channel power supply board card, a PXI communication board card, a display and controller module, a power supply module and an integrated case, the PXI case provides PXI interfaces for the multi-channel power supply board cards and the PXI communication board cards, and the PXI communication board card and the multi-channel power supply board cards are arranged in the PXI case; the display and controller module provides a human-computer interaction interface, sends an externally input instruction to the multi-channel power supply board card through the PXI communication board card, and further controls various states, parameters and actions of the multi-channel power supply board card; the power supply module supplies power to the display and controller module and the PXI case; the PXI case, the display and controller module and the power supply module are all arranged ...

Decolouring method for ricebran wax and other natural waxes

Ageing convertor for Pill packaged photoelectric devices

The invention discloses an ageing convertor for Pill packaged photoelectric devices. The ageing convertor comprises a compressing plate (1), a limiting plate (2), a middle plate (3) and an electric connecting plate (4), wherein the compressing plate (1), the limiting plate (2), the middle plate (3) and the electric connecting plate (4) are sequentially installed from top to bottom. The whole convertor is designed into four layers including the compressing plate, the limiting plate, the middle plate and the electric connecting plate, the plate on each layer is correspondingly improved, as the tested devices are limited and compressed, an ageing board only suitable for photoelectric devices with pins originally is converted into an ageing board suitable for the Pill packaged photoelectric devices, and the problem of ageing the Pill packaged photoelectric devices is solved. The design of a package converting clamp and the design of the ageing circuit board are integrated, the functions of ...

Complex digital integrated circuit test vector learning generation device

A complex digital integrated circuit test vector learning generation device comprises a vector learning generation module, a communication module, a power module, a learning interface module, a typical application board and an upper computer, an FPGA serves as a core component, and the functions of multi-channel real-time monitoring, clock triggering, data collection and analysis and the like can be achieved through the high concurrency performance of the FPGA. A vector learning generation module is formed by arranging a plurality of FPGAs in parallel, most of current digital integrated circuits can be effectively covered by utilizing the number of digital channels capable of being monitored, input and output characteristics of all periods in a DUT learning process are supervised and collected, the input and output characteristics are converted into test vectors in a specific format, and the whole learning process is ended.

High-precision temperature control testing system for thermal resistance testing

The invention relates to a temperature control testing system for a transistor thermal resistance testing. The temperature control testing system for the transistor thermal resistance testing comprises a force applying unit, a constant-temperature platform, a testing unit, a sensor unit and an information collecting and processing unit, wherein the force applying unit comprises a driving device and a pressure applying device; the driving device drives the pressure applying device to apply required pressure to a tested device; the constant-temperature platform is used for bearing a tested device, and keeping the tested device to be at the temperature condition required for testing; the testing unit is arranged in the constant-temperature platform, and is used for connecting a pin of the tested device with a testing and analyzing device, so that electrical performances of the tested device are tested; the sensor unit is used for detecting the testing temperature and the testing pressure of ...

Pill encapsulation photosensitive device test conversion clamp

The invention discloses a Pill encapsulation photosensitive device test conversion clamp. The Pill encapsulation photosensitive device test conversion clamp comprises a pressing plate (1), a limiting plate (2), an intermediate plate (3) and an electric connection plate (4) which are sequentially arranged from top to bottom, wherein the pressing plate (1), the limiting plate (2), the intermediate plate (3) and the electric connection plate (4) are positioned together by virtue of fit design of positioning holes, positioning bolts, clamping flat gaskets and support plate nuts. According to the pill encapsulation photosensitive device test conversion clamp, four plates are used for limiting and pressing a tested device; a conventional test adapter which is only adaptive to photoelectric devices with pins is integrally converted to a test adapter applied to Pill encapsulation photoelectric devices; the test problem of the pill encapsulation photoelectric devices is solved; the existing special ...

Thermal resistance measuring method for semiconductor device

The invention relates to a thermal resistance measuring method for a semiconductor device. The thermal resistance measuring method includes the following steps that (1) according to the structure of the semiconductor device, a main heat conduction channel is determined, and a constant temperature plane good in contact is arranged on the surface of a shell of the main heat conduction channel; (2) certain power is loaded to the semiconductor device, after the semiconductor device reaches heat balance, it is switched to the situation that measuring power is loaded to the semiconductor device, temperature-sensitive parameters of the semiconductor device are measured in real time to obtain the junction temperature for measuring the semiconductor device, and accordingly a transient thermal response curve of the semiconductor device is obtained; (3) according to the transient thermal response curve, the thermal resistance from a junction of the semiconductor device to the shell is determined.