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Небесная энциклопедия

Космические корабли и станции, автоматические КА и методы их проектирования, бортовые комплексы управления, системы и средства жизнеобеспечения, особенности технологии производства ракетно-космических систем

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Мониторинг СМИ

Мониторинг СМИ и социальных сетей. Сканирование интернета, новостных сайтов, специализированных контентных площадок на базе мессенджеров. Гибкие настройки фильтров и первоначальных источников.

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Форма поиска

Поддерживает ввод нескольких поисковых фраз (по одной на строку). При поиске обеспечивает поддержку морфологии русского и английского языка
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Применить Всего найдено 10. Отображено 8.
30-06-2016 дата публикации

Sample holder for an atomic force microscope

Номер: US20160187375A1
Принадлежит: UNIVERSITAET BASEL

The present invention relates to sample holders for holding a sample, particularly for an atomic force microscope. Such a sample holder comprising a sample dish ( 1 ) comprising a bottom ( 2 ), and an opening ( 3 ) arranged in said bottom ( 2 ) for receiving and holding the sample ( 15 ). Furthermore the present invention relates to a sample holder system and to a method for transferring an e.g. biological sample ( 15 ) from a biopsy tool ( 18 ) to a sample holder.

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24-12-2015 дата публикации

METHOD AND DEVICE FOR CONTROLLING A SCANNING PROBE MICROSCOPE

Номер: US20150369838A1
Принадлежит: Universitat Basel

The present invention relates to a method for controlling a scanning probe microscope having a probe () with a tip () for interacting with a sample (), and a nanoscanner () for retaining the sample () or the probe (), comprising the steps of monitoring the extension of the piezo element () along a first direction (R) along which the tip () is moved towards the sample (), and adjusting the level of the probe () along the first direction (R) by means of an additional actuator (), when the nanoscanner () exhibits an extension below or above a threshold value. The invention further relates to a device () for controlling a scanning probe microscope. 12214142. A method for controlling a scanning probe microscope having a probe () with a tip () for interacting with a sample () , and a nanoscanner () for retaining said sample () or said probe () , comprising the steps of:{'b': 1', '21', '4, 'monitoring the extension of said nanoscanner () along a first direction (R), along which said tip () is moved towards said sample (), and'}{'b': 2', '3', '1, 'adjusting a level of said probe () along said first direction (R) by means of an additional actuator (), when said nanoscanner () exhibits an extension below or above a threshold value, and'}further comprising the steps of:a) measuring a force curve on said sample, wherein said force curve comprises an approaching curve and a retracting curve,b) detecting an optimal baseline part of said force curve,c) optionally detecting a contact point of said force curve, {'b': 3', '32, 'additional actuator () and at least a second additional actuator () the lateral position of said probe, or'}, 'd) comparing said approaching curve and/or said retracting curve with said'}{'b': 2', '4', '53', '2', '2', '53, 'an angle (α), wherein said angle (α) is monitored between a second direction (R) and the normal (N) of a surface of said sample () at a point () of said surface, wherein said probe () is moving along said second direction (R) towards said ...

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19-06-2014 дата публикации

Method and device for controlling a scanning probe microscope

Номер: WO2014090971A1
Принадлежит: Universitat Basel

The present invention relates to a method for controlling a scanning probe microscope having a probe (2) with a tip (21) for interacting with a sample (4), and a nanoscanner (1) for retaining the sample (4) or the probe (2), comprising the steps of monitoring the extension of the piezo element (1)along a first direction (R) along which the tip (21) is moved towards the sample (4), and adjusting the level of the probe (2) along the first direction (R) by means of an additional actuator (3), when the nanoscanner (1) exhibits an extension below or above a threshold value. The invention further relates to a device (100) for controlling a scanning probe microscope.

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22-11-2016 дата публикации

Method and device for controlling a scanning probe microscope

Номер: US9500670B2
Принадлежит: UNIVERSITAET BASEL

The present invention relates to a method for controlling a scanning probe microscope having a probe ( 2 ) with a tip ( 21 ) for interacting with a sample ( 4 ), and a nanoscanner ( 1 ) for retaining the sample ( 4 ) or the probe ( 2 ), comprising the steps of monitoring the extension of the piezo element ( 1 ) along a first direction (R) along which the tip ( 21 ) is moved towards the sample ( 4 ), and adjusting the level of the probe ( 2 ) along the first direction (R) by means of an additional actuator ( 3 ), when the nanoscanner ( 1 ) exhibits an extension below or above a threshold value. The invention further relates to a device ( 100 ) for controlling a scanning probe microscope.

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03-04-2024 дата публикации

Method and device for controlling a scanning probe microscope

Номер: EP2932277B1
Принадлежит: UNIVERSITAET BASEL

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08-01-2015 дата публикации

Sample holder for an atomic force microscope

Номер: WO2015001119A1
Принадлежит: Universitat Basel

The present invention relates to sample holders for holding a sample, particularly for an atomic force microscope. Such a sample holder comprising a sample dish (1) comprising a bottom (2), and an opening (3) arranged in said bottom (2) for receiving and holding the sample (15). Furthermore the present invention relates to a sample holder system and to a method for transferring an e.g. biological sample (15) from a biopsy tool (18) to a sample holder.

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29-08-2017 дата публикации

Sample holder for an atomic force microscope

Номер: US09746493B2
Принадлежит: UNIVERSITAET BASEL

The present invention relates to sample holders for holding a sample, particularly for an atomic force microscope. Such a sample holder comprising a sample dish ( 1 ) comprising a bottom ( 2 ), and an opening ( 3 ) arranged in said bottom ( 2 ) for receiving and holding the sample ( 15 ). Furthermore the present invention relates to a sample holder system and to a method for transferring an e.g. biological sample ( 15 ) from a biopsy tool ( 18 ) to a sample holder.

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04-09-2024 дата публикации

Sample holder for an atomic force microscope

Номер: EP2821796B1
Принадлежит: UNIVERSITAET BASEL

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