SEMICONDUCTOR COMPONENT WITH TEST-STRUCTURE AND TEST PROCEDURE FOR A SEMICONDUCTOR COMPONENT

MONITORING OF PHYSICAL OPERATING PARAMETERS OF AN INTEGRATED CIRCUIT

SUPPLY VOLTAGE MONITORING

Monitoring physical operating parameters of an integrated circuit

An integrated circuit comprises a plurality of sensing circuits (12), each for detecting whether a respective physical operating parameter is above or below a respective reference value. The integrated circuit contains a serial shift register (11) for shifting digital data signals that represent the respective reference values from a successive approximation update circuit (14) to the sensing circuits (12) and back to the successive approximation update circuit (14). Detection results of the sensing circuits (12) are shifted to the successive approximation update circuit (14) with the digitaldata signals. The successive approximation update circuit (14) is used to form the digital data so that the reference values form successive approximations of the physical operating parameter values during an analog to digital conversion process. In this way the successive approximation update circuit (14) is shared by a plurality of sensing circuits (12).

ÜBERWACHUNG PHYSIKALISCHER BETRIEBSPARAMETER EINER INTEGRIERTEN SCHALTUNG

Monitoring physical operating parameters of an integrated circuit

HALBLEITERBAUELEMENT MIT TESTSTRUKTUR UND TESTVERFAHREN FÜR EIN HALBLEITERBAUELEMENT

MONITORING PHYSICAL OPERATING PARAMETERS OF AN INTEGRATED CIRCUIT

An integrated circuit comprises a plurality of sensing circuits (12), each for detecting whether a respective physical operating parameter is above or below a respective reference value. The integrated circuit contains a serial shift register (11) for shifting digital data signals that represent the respective reference values from a successive approximation update circuit (14) to the sensing circuits (12) and back to the successive approximation update circuit (14). Detection results of the sensing circuits (12) are shifted to the successive approximation update circuit (14) with the digital data signals. The successive approximation update circuit (14) is used to form the digital data so that the reference values form successive approximations of the physical operating parameter values during an analog to digital conversion process. In this way the successive approximation update circuit (14) is shared by a plurality of sensing circuits (12). © KIPO & WIPO 2007 ...

Supply voltage monitoring

An integrated circuit is provided with a distributed supply voltage monitoring system in which a single controller controls a plurality of voltage monitors located in respective modules of the integrated circuit. The controller and each circuit form a successive approximation analogue to digital converter. Such a system enables a small size monitoring circuit to be realised for every module of the integrated circuit.

VERSORGUNGSSPANNUNGSÜBERWACHUNG

Monitoring physical operating parameters of an integrated circuit

An integrated circuit comprises a plurality of sensing circuits ( 12 ), each for detecting whether a respective physical operating parameter is above or below a respective reference value. The integrated circuit contains a serial shift register ( 11 ) for shifting digital data signals that represent the respective reference values from a successive approximation update circuit ( 14 ) to the sensing circuits ( 12 ) and back to the successive approximation update circuit ( 14 ). Detection results of the sensing circuits ( 12 ) are shifted to the successive approximation update circuit ( 14 ) with the digital data signals. The successive approximation update circuit ( 14 ) is used to form the digital data so that the reference values form successive approximations of the physical operating parameter values during an analog to digital conversion process. In this way the successive approximation update circuit ( 14 ) is shared by a plurality of sensing circuits ( 12 ).

Supply voltage monitoring

Semiconductor device with test structure and semiconductor device test method

The invention relates to a semiconductor device comprising a test structure (100) for detecting variations in the structure of the semiconductor device, the test structure (100) comprising a first supply rail (110), a second supply rail (120), a ring oscillator (130) coupled between the first supply rail (110) and second supply rail (120), the ring oscillator (130) having an output (132) for providing a test result signal, and an array (140) of individually controllable transistors (142) coupled in parallel between the first supply rail (110) and the ring oscillator (130). Variations in the current output of the respective transistors (142) in the array (140) lead to variations in the respective output frequencies of the ring oscillator (130). This gives a qualitative indication of the aforementioned structural variations. More accurate results can be obtained by inclusion of a reference current source (160) for calibrating the ring oscillator (130) prior to the measurement of the current ...

Supply Voltage Monitoring

An integrated circuit is provided with a distributed supply voltage monitoring system in which a single controller controls a plurality of voltage monitors located in respective modules of the integrated circuit. The controller and each circuit form a successive approximation analogue to digital converter Such a system enables a small size monitoring circuit to be realized for every module of the integrated circuit.

Monnitoring Physical Operating Parameters Of An Integrated Circuit

An integrated circuit comprises a plurality of sensing circuits ( 12 ), each for detecting whether a respective physical operating parameter is above or below a respective reference value. The integrated circuit contains a serial shift register ( 11 ) for shifting digital data signals that represent the respective reference values from a successive approximation update circuit ( 14 ) to the sensing circuits ( 12 ) and back to the successive approximation update circuit ( 14 ). Detection results of the sensing circuits ( 12 ) are shifted to the successive approximation update circuit ( 14 ) with the digital data signals. The successive approximation update circuit ( 14 ) is used to form the digital data so that the reference values form successive approximations of the physical operating parameter values during an analog to digital conversion process. In this way the successive approximation update circuit ( 14 ) is shared by a plurality of sensing circuits ( 12 ).

Supply voltage monitoring

An integrated circuit is provided with a distributed supply voltage monitoring system in which a single controller controls a plurality of voltage monitors located in respective modules of the integrated circuit. The controller and each circuit form a successive approximation analogue to digital converter Such a system enables a small size monitoring circuit to be realized for every module of the integrated circuit.

Supply Voltage Monitoring

An integrated circuit is provided with a distributed supply voltage monitoring system in which a single controller controls a plurality of voltage monitors located in respective modules of the integrated circuit. The controller and each circuit form a successive approximation analogue to digital converter Such a system enables a small size monitoring circuit to be realized for every module of the integrated circuit.

Halbleiterbauelement mit teststruktur und testverfahren für ein halbleiterbauelement

Überwachung physikalischer betriebsparameter einer integrierten schaltung

Versorgungsspannungsüberwachung

Monitoring physical operating parameters of an integrated circuit

An integrated circuit comprises a plurality of sensing circuits (12), each for detecting whether a respective physical operating parameter is above or below a respective reference value. The integrated circuit contains a serial shift register (11) for shifting digital data signals that represent the respective reference values from a successive approximation update circuit (14) to the sensing circuits (12) and back to the successive approximation update circuit (14). Detection results of the sensing circuits (12) are shifted to the successive approximation update circuit (14) with the digital data signals. The successive approximation update circuit (14) is used to form the digital data so that the reference values form successive approximations of the physical operating parameter values during an analog to digital conversion process. In this way the successive approximation update circuit (14) is shared by a plurality of sensing circuits (12).

Monitoring physical operating parameters of an integrated circuit

An integrated circuit comprises a plurality of sensing circuits (12), each for detecting whether a respective physical operating parameter is above or below a respective reference value. The integrated circuit contains a serial shift register (11) for shifting digital data signals that represent the respective reference values from a successive approximation update circuit (14) to the sensing circuits (12) and back to the successive approximation update circuit (14). Detection results of the sensing circuits (12) are shifted to the successive approximation update circuit (14) with the digital data signals. The successive approximation update circuit (14) is used to form the digital data so that the reference values form successive approximations of the physical operating parameter values during an analog to digital conversion process. In this way the successive approximation update circuit (14) is shared by a plurality of sensing circuits (12).