METHOD FOR REDUCING IMAGE ARTIFACTS

The invention relates to a method for reducing image artifacts in images of a sample captured by scanning, wherein intensity values of at least two detection regions, denoted as pixels (Px), are captured along respectively one row (j) in a first scanning direction. A reconstructed image is produced on the basis of the captured intensity values. According to the invention, the intensity values of the reconstructed image are summed along the rows (j) respectively scanned by a certain pixel (Px) and a row sum is formed in each case. A correction value of the pixel (Px) is ascertained on the basis of the row sums formed thus and the correction value is applied to the intensity values, captured by means of the pixel (Px), of the reconstructed image, as a result of which a corrected image is obtained.

Laser scanning microscope

Laser Scanning Microscope with an illumination beam path for illumination of a sample and a detection beam path for wavelength-dependent recording of the light from the sample, whereby filters for selection of the detection wavelengths are provided, characterized in that at least one graduated filter spatially variable in regard to the threshold wavelength between the transmission and reflection is provided in several partial beam paths for the selection of the wavelengths.

Luminescence microscopy

The invention relates to a method for high-resolution luminescence microscopy of a specimen marked with marker molecules, and to a luminescence microscope for performing the method, wherein the marker molecules can be excited to emit luminescence radiation. The method for luminescence microscopy comprises the excitation and imaging of marker molecules and the transmission of a trigger time and a position of the specimen. An optical recording device images the marker molecules in a capture area and transmits data from the imaging to an image capture circuit. The recording device transmits a time for the imaging to a signal former as a trigger time; the trigger time is then transmitted to a data recorder. The data recorder generates a position of the specimen at the trigger time and transmits said position to the image capture circuit, which links the position of the specimen in the depth direction to the data of the imaging of a frame such that a three-dimensional tomographic image of the specimen can be created.

Light microscope and microscopy method

An optical microscope having a sample plane for positioning a sample, and a light source for emitting illumination light, includes optical imaging means for guiding the illumination light into the sample plane. A detector device having a plurality of detector elements for detecting sample light coming from the sample. Adjacent detector elements are at a distance from one another which is smaller than an Airy-Disk produced by a point of the sample plane on the detector device. A scanning device has at least a first and a second optical arrangement simultaneously movable in a common direction for producing an illumination scanning movement and a detection scanning movement, which are opposite to one another. Sample regions spaced apart from one another can be examined simultaneously, such that both a beam path of the sample light from the sample plane to the detector device and a beam path of the illumination light from the light source to the sample plane run via the first optical arrangement and only one of these two beam paths runs via the second optical arrangement.

Calibration device and laser scanning microscope with such a calibration device

A calibration device for managing a variety of performance tests and/or calibration tasks in a laser scanning microscope. The calibration device, which has focusing optics and a test structure arranged in the focal plane of the focusing optics, with structural elements detectable in reflected and/or transmitted light aligned to each other in a common mounting, can be switched into the microscope beam path in a laser scanning microscope, so that the pupil of the focusing optics coincides with the objective pupil of the laser scanning microscope or lies in a plane conjugated to it.

Arrangement for the evaluation of fluorescence-based detection reactions

Arrangement for the evaluation of fluorescence-based detection reactions in transparent specimen vessels, wherein the excitation and imaging of the fluorescence is carried out through the vessel bottom, and the specimens are introduced from above, wherein an adjustable cover is provided which closes the top of the specimen vessels and which has at least one opening for introducing specimens and which is positioned above the specimen vessels provided for filling only during the filling process and/or is opened only during the filling process.

LASER SCANNING MICROSCOPE HAVING AN ILLUMINATION ARRAY

The invention relates to a laser scanning microscope (LSM), consisting of at least one light source, from which an illumination beam path in the direction of a sample originates, at least one detection beam path for passing sample light, preferably fluorescence light, onto a detector arrangement, it main colour separator for separating the illumination and detection beam paths, a microlens array for generating a light source grid composed of at least two light sources, a scanner for generating a relative movement between the illumination light and the sample in at least one direction, and a microscope objective, wherein the lens array is arranged in at common part of illumination and detection beam paths.

Detector arrangement having increased sensitivity

To increase the sensitivity of detector arrangements, it is known that light deflection elements in the form of a line arrays having spherical elements may be used to focus incident light onto light-sensitive regions of the detector. Manufacturing such line arrays is complex and cost intensive, especially in small lot numbers. The increased sensitivity of the detector array can be achieved easily and inexpensively by using a novel light deflection element. The detector arrangement therefore has a light deflection element having light entrance surfaces, deflecting incident light by refraction onto light-sensitive regions of the detector. Light entrance surfaces of the light deflection element are inclined with respect to one another and are designed as planar surfaces. The detector arrangement is suitable in particular for detection of light emanating from a specimen in a microscope, preferably in a laser-scanning microscope.

Laser scanning microscope

Laser Scanning Microscope with an illumination beam path for illumination of a sample and a detection beam path for wavelength-dependent recording of the light from the sample, whereby filters for selection of the detection wavelengths are provided, characterized in that at least one graduated filter spatially variable in regard to the threshold wavelength between the transmission and reflection is provided in several partial beam paths for the selection of the wavelengths.

High-resolution confocal microscope

A method for the high-resolution scanning microscopy of a specimen where the specimen is illuminated with illuminating radiation such that the illuminating radiation is focused to a diffraction-limited illuminating spot at a point in or on the specimen. The point is projected in a diffraction-limited manner in a diffraction image onto a flat panel detector having pixels. The flat panel detector, owing to the pixels thereof, have a spatial resolution which resolves a diffraction structure of the diffraction image. The point is shifted relative to the specimen into different scanning positions by an increment which is smaller than the diameter of the illuminating spot and a 3D image is generated. The pixels of the flat panel detector are divided into groups. A pre-calculated raw image is calculated for each group and are unfolded three-dimensionally to generate the image of the specimen.

Method for accelerated high-resolution scanning microscopy

In a method for high-resolution scanning microscopy of a sample, provision is made of focusing of illumination radiation into an illumination spot in or on the sample and stimulating the emission of detection radiation at a sample spot that coincides with the illumination spot. The sample spot is imaged into an image that is static on a spatially resolving surface detector having pixels of a size that spatially resolve the image, wherein the imaging has a an optical imaging resolution limit. The entire sample is captured by performing a scanning movement of the illumination spot and of the coinciding sample spot over the sample in a scanning operation. An image of the sample having a resolution that is increased beyond the optical imaging resolution limit of the imaging is produced from the data of the pixels for each scanning position.

MICROSCOPE, MORE PARTICULARLY FLUORESCENCE MICROSCOPE, DICHROIC BEAM SPLITTER AND USE THEREOF

The invention relates to a microscope, more particularly to a fluorescence microscope, for the structured illumination microscopy, comprising a microscope light path having an optical axis, including a beam splitter for coupling illumination light into the microscope light path, including an illumination pattern unit disposed, in particular, in the microscope light path for the purpose of generating an illuminated pattern on, or in, a sample to be examined, comprising a rotary device for the purpose of effecting relative rotation about the optical axis between the illumination pattern and the sample to be examined. The microscope is characterized in that a rotary polarizing device is provided for the purpose of rotating a polarization of the illumination light, that the angular positions of the rotary device and of the rotary polarizing device are inflexibly coupled to each other, that in order to reduce polarization effects during relative rotation between the illumination pattern and the beam splitter, a beam splitter is used which reflects and/or transmits the incident illumination light while substantially maintaining the polarization state, and/or that in order to reduce polarization effects while effecting relative rotation between the illumination pattern and the beam splitter, a beam splitter is positioned in the optical path such that the angle of incidence of the illumination light relative to a surface normal vector of the beam splitter is less than 45 degrees. The invention also relates to a dichroic beam splitter and to the use thereof in a fluorescence microscope. 1. A microscope{'b': 36', '38', '10', '12', '30', '36, 'comprising a microscope light path () having an optical axis () including a beam splitter (, ) for coupling illumination light () into said microscope light path (),'}{'b': 52', '18', '52', '18, 'including an illumination pattern unit for the purpose of at least one of generating an illuminated pattern () on a sample () to be examined ...

Laser scanning microscope

A Laser Scanning Microscope with an illumination radiation distribution, which is guided over a sample for scanning and in which an image of the sample is taken from the sample radiation generated and detected during the scanning, wherein the sample is sampled with an imaging rate of x images per second, wherein in a mode for the adjustment of the device parameters, the imaging rate is reduced with uniform sampling speed. preferably for sparing the sample the exposure, to a fraction X/Y of X, Y>1.

Light microscope and microscopy method

A light microscope having a sample plane for positioning a sample, and a light source for emitting illumination light, includes optical imaging means for guiding the illumination light into the sample plane. A detector device having a plurality of detector elements for detecting sample light coming from the sample. Adjacent detector elements are at a distance from one another which is smaller than an Airy-Disk produced by a point of the sample plane on the detector device. A scanning device has at least a first and a second optical arrangement simultaneously movable in a common direction for producing an illumination scanning movement and a detection scanning movement, which are opposite to one another. Sample regions spaced apart from one another can be examined simultaneously, such that both a beam path of the sample light from the sample plane to the detector device and a beam path of the illumination light from the light source to the sample plane run via the first optical arrangement and only one of these two beam paths runs via the second optical arrangement. Sample light can be imaged in a non-inverting manner and with an imaging scale of less than one. The invention is additionally directed to a corresponding microscopy method.

Spectral analysis unit with a diffraction grating

A spectral analytical unit for acting on a parallel light bundle having different wavelengths. The spectral analytical unit includes a diffraction grating on which the light bundle falls, the diffraction grating splitting the different wavelengths through diffraction in first spectral directions defining a light bundle diffraction order 1 without recycle, and the diffraction grating bending the light bundle in second directions defining a light bundle diffraction order 0 without recycle, a detector line made up of a plurality of elements, optics for focusing the split light bundle diffraction order 1 without recycle on the detector line, evaluation electronics connected to the detector line for obtaining data related to a created spectrum, and a deflecting device wherein the diffraction order 0 light bundle without recycle meets on the deflecting device which is so directed and positioned that this light bundle falls on the diffraction grating thereby creating a reflected diffraction order ...

Spectral analytical unit with a diffraction grating

A spectral analytical unit for acting on a parallel light bundle having different wavelengths. The spectral analytical unit includes a diffraction grating on which the light bundle falls, the diffraction grating splitting the different wavelengths through diffraction in first spectral directions defining a light bundle diffraction order 1 without recycle, and the diffraction grating bending the light bundle in second directions defining a light bundle diffraction order 0 without recycle, a detector line made up of a plurality of elements, optics for focusing the split light bundle diffraction order 1 without recycle on the detector line, evaluation electronics connected to the detector line for obtaining data related to a created spectrum, and a deflecting device wherein the diffraction order 0 light bundle without recycle meets on the deflecting device which is so directed and positioned that this light bundle falls on the diffraction grating thereby creating a reflected diffraction order ...

Multi-color scanning microscope

The invention relates to a multi-color scanning microscope comprising at least one first light source for emitting a first excitation beam comprising first excitation light having a first wavelength and a second light source for emitting a second excitation beam comprising second excitation light having a second wavelength, which differs from the first wavelength, comprising coupling-in means for coupling the first excitation beam and/or the second excitation beam into an excitation beam path, comprising optical means for guiding the first excitation beam and the second excitation beam to a sample and for guiding detection light emitted by the sample in a detection beam path to a detection unit, wherein the optical means comprise at least the following components: at least one first main color splitter for separating the first excitation light and/or the second excitation light, on the one hand, from the detection light emitted by the sample, on the other hand, a scanner for scanning the ...

Climatic cabinet

A climatic cabinet for receiving objects, preferably microtiter plates, which contains a preferably rotatable object receptacle in the interior. The object receptacle is vertically adjustable for changing its position relative to an input and output door. The object receptacle is adjustable in a raised position with respect to its position relative to the input and output door.

MICROSCOPE

A microscope including an illumination device providing a light sheet illuminating a sample region, said sheet having a planar extension along an illumination axis of an illumination beam path and a transverse axis lying normal to the illumination axis. A detection device detects light emitted from the sample region on a detection axis the illumination axis and detection axis as well as the transverse axis and the detection axis being oriented relative each other at an angle unequal zero. The detection device has a detection lens system arranged in the detection beam path and splitting means for splitting the detection beam path into two beam sub-paths. A dichroic beam splitter in the infinity region of the surface detectors is about 3 mm thick. Wobble plate(s) disposed orthogonal to each other relative to the detection axis arranged in one of the two beam sub-paths so measured values can be automatically superimposed.

Microscope having light sheet illumination of a sample region

A microscope including an illumination device providing a light sheet illuminating a sample region, said sheet having a planar extension along an illumination axis of an illumination beam path and a transverse axis lying normal to the illumination axis. A detection device detects light emitted from the sample region on a detection axis the illumination axis and detection axis as well as the transverse axis and the detection axis being oriented relative each other at an angle unequal zero. The detection device has a detection lens system arranged in the detection beam path and splitting means for splitting the detection beam path into two beam sub-paths. A dichroic beam splitter in the infinity region of the surface detectors is about 3 mm thick. Wobble plate(s) disposed orthogonal to each other relative to the detection axis arranged in one of the two beam sub-paths so measured values can be automatically superimposed.

Method for reducing image artifacts

The invention relates to a method for reducing image artifacts in images of a sample captured by scanning, wherein intensity values of at least two detection regions, denoted as pixels (Pxn), are captured along respectively one row (j) in a first scanning direction. A reconstructed image is produced on the basis of the captured intensity values. According to the invention, the intensity values of the reconstructed image are summed along the rows (j) respectively scanned by a certain pixel (Pxn) and a row sum is formed in each case. A correction value of the pixel (Pxn) is ascertained on the basis of the row sums formed thus and the correction value is applied to the intensity values, captured by means of the pixel (Pxn), of the reconstructed image, as a result of which a corrected image is obtained.

DETECTOR ARRANGEMENT HAVING INCREASED SENSITIVITY

To increase the sensitivity of detector arrangements, it is known that light deflection elements in the form of a line arrays having spherical elements may be used to focus incident light onto light-sensitive regions of the detector. Manufacturing such line arrays is complex and cost intensive, especially in small lot numbers. The increased sensitivity of the detector array can be achieved easily and inexpensively by using a novel light deflection element. The detector arrangement therefore has a light deflection element having light entrance surfaces, deflecting incident light by refraction onto light-sensitive regions of the detector. Light entrance surfaces of the light deflection element are inclined with respect to one another and are designed as planar surfaces. The detector arrangement is suitable in particular for detection of light emanating from a specimen in a microscope, preferably in a laser-scanning microscope.

Beam Splitter Assembly, Method for the Dimensioning Thereof and Microscope

Disclosed is a beam splitter assembly for being arranged in a non-collimated part of a beam path of a microscope with a first plate, which is tilted with respect to an optical axis by a tilting angle, and with a second plate, which is tilted with respect to the optical axis by a tilting angle, wherein the first plate and/or the second plate serve(s) for coupling radiation in and/or out. The beam splitter assembly can include a wedge angle of the first plate, a wedge angle of the second plate and the tilting angle of the second plate, which are coordinated with one another in such a way that an astigmatism on the optical axis and a linear field dependence of the astigmatism in an object field are corrected. Also disclosed are a method for dimensioning a beam splitter assembly and a microscope.

Multi-Color Scanning Microscope

The invention relates to a multi-color scanning microscope comprising at least one first light source for emitting a first excitation beam comprising first excitation light having a first wavelength and a second light source for emitting a second excitation beam comprising second excitation light having a second wavelength, which differs from the first wavelength, comprising coupling-in means for coupling the first excitation beam and/or the second excitation beam into an excitation beam path, comprising optical means for guiding the first excitation beam and the second excitation beam to a sample and for guiding detection light emitted by the sample in a detection beam path to a detection unit, wherein the optical means comprise at least the following components: at least one first main color splitter for separating the first excitation light and/or the second excitation light, on the one hand, from the detection light emitted by the sample, on the other hand, a scanner for scanning the sample with at least the first excitation light and the second excitation light, a microscope objective for focusing the first excitation light and the second excitation light onto or into the sample and for guiding the detection light emitted by the sample in the direction of the detection unit, and comprising the detector unit for detecting the detection light emitted by the sample. The microscope is characterized in that the coupling-in means and at least parts of the optical means are designed and arranged in such a way that the first excitation beam having the first wavelength is guided onto a first sample location and the second excitation beam having the second wavelength is guided onto a second sample location, which differs from the first sample location, and in that the detector unit comprises a first detector for detecting the light emitted by the first sample location and a second detector for detecting the light emitted by the second sample location. 2. Multi-color ...

Calibration device and laser scanning microscope with such a calibration device

A calibration device for managing a variety of performance tests and/or calibration tasks in a laser scanning microscope. The calibration device, which has focusing optics and a test structure arranged in the focal plane of the focusing optics, with structural elements detectable in reflected and/or transmitted light aligned to each other in a common mounting, can be switched into the microscope beam path in a laser scanning microscope, so that the pupil of the focusing optics coincides with the objective pupil of the laser scanning microscope or lies in a plane conjugated to it.

Luminescence microscopy

The invention relates to a method for high-resolution luminescence microscopy of a specimen marked with marker molecules, and to a luminescence microscope for performing the method, wherein the marker molecules can be excited to emit luminescence radiation. The method for luminescence microscopy comprises the excitation and imaging of marker molecules and the transmission of a trigger time and a position of the specimen. An optical recording device images the marker molecules in a capture area and transmits data from the imaging to an image capture circuit. The recording device transmits a time for the imaging to a signal former as a trigger time; the trigger time is then transmitted to a data recorder. The data recorder generates a position of the specimen at the trigger time and transmits said position to the image capture circuit, which links the position of the specimen in the depth direction to the data of the imaging of a frame such that a three-dimensional tomographic image of the specimen can be created.

Light Microscope and Microscopy Method

An optical microscope having a sample plane for positioning a sample, and a light source for emitting illumination light, includes optical imaging means for guiding the illumination light into the sample plane. A detector device having a plurality of detector elements for detecting sample light coming from the sample. Adjacent detector elements are at a distance from one another which is smaller than an Airy-Disk produced by a point of the sample plane on the detector device. A scanning device has at least a first and a second optical arrangement simultaneously movable in a common direction for producing an illumination scanning movement and a detection scanning movement, which are opposite to one another. Sample regions spaced apart from one another can be examined simultaneously, such that both a beam path of the sample light from the sample plane to the detector device and a beam path of the illumination light from the light source to the sample plane run via the first optical arrangement and only one of these two beam paths runs via the second optical arrangement. 1. An optical microscope comprising a sample plane in which a sample to be examined is positionable , a light source for emitting illumination light , optical imaging means for guiding the illumination light into the sample plane , and a detector device having a plurality of detector elements for the purpose of detecting sample light coming from the sample , wherein adjacent detector elements are at a distance from one another which is smaller than an Airy disk produced by a point of the sample plane on the detector device , a scanning device having at least one first and one second optical arrangements , said optical arrangements being simultaneously movable in a common direction for the purpose of producing an illumination scanning movement and a detection scanning movement , said illumination and said detection scanning movements being opposite to one another , wherein the illumination scanning ...

Method for Accelerated High-Resolution Scanning Microscopy

In a method for high-resolution scanning microscopy of a sample, provision is made of focusing of illumination radiation into an illumination spot in or on the sample and stimulating the emission of detection radiation at a sample spot that coincides with the illumination spot. The sample spot is imaged into an image that is static on a spatially resolving surface detector having pixels of a size that spatially resolve the image, wherein the imaging has a resolution limit. The entire sample is captured by performing a scanning movement of the illumination spot and of the coinciding sample spot over the sample in a scanning operation. An image of the sample having a resolution that is increased beyond the resolution limit of the imaging is produced from the data of the pixels for each scanning position. Here, a reassignment step is performed, in which data of a plurality of pixels of the surface detector, which are spaced apart in the first spatial direction, are combined for each scanning position. Furthermore, an unmixing step is performed, in which the thus produced temporary data sets are corrected with respect to the spatial variation of the point spread function that is assigned to the respectively combined pixels. 1. A method for high-resolution scanning microscopy of a sample , comprising the steps of:a) focusing illumination radiation into an illumination spot in or on the sample and stimulating the emission of detection radiation to a sample spot which coincides with the illumination spot, wherein the illumination spot and consequently also the sample spot are not diffraction-limited in at least one first spatial direction,b) imaging the sample spot into an image that is static on a spatially resolving surface detector comprising pixels of a size that spatially resolve the image, wherein the optical imaging has a resolution limit and a point spread function which varies locally for the pixels,c) performing a scanning movement of the illumination spot and of ...

LIGHT MICROSCOPE AND MICROSCOPY METHOD

A light microscope having a sample plane for positioning a sample, and a light source for emitting illumination light, includes optical imaging means for guiding the illumination light into the sample plane. A detector device having a plurality of detector elements for detecting sample light coming from the sample. Adjacent detector elements are at a distance from one another which is smaller than an Airy-Disk produced by a point of the sample plane on the detector device. A scanning device has at least a first and a second optical arrangement simultaneously movable in a common direction for producing an illumination scanning movement and a detection scanning movement, which are opposite to one another. Sample regions spaced apart from one another can be examined simultaneously, such that both a beam path of the sample light from the sample plane to the detector device and a beam path of the illumination light from the light source to the sample plane run via the first optical arrangement and only one of these two beam paths runs via the second optical arrangement. Sample light can be imaged in a non-inverting manner and with an imaging scale of less than one. The invention is additionally directed to a corresponding microscopy method. 1. A light microscope comprising a sample plane in which a sample to be examined is positionable , a light source for emitting illumination light , optical imaging means for guiding the illumination light into the sample plane , and a detector device having a plurality of detector elements for the purpose of detecting sample light coming from the sample , wherein adjacent detector elements are at a distance from one another which is smaller than an Airy disk produced by a point of the sample plane on the detector device , a scanning device having at least one first and one second optical arrangements , said optical arrangements being movable simultaneously in a common direction for the purpose of producing an illumination scanning ...

METHOD AND OPTICAL ARRANGEMENT FOR ASCERTAINING A RESULTANT POWER OF RADIATION IN A SAMPLE PLANE

A method and an optical arrangement for ascertaining a resultant power of radiation in a sample plane () of an optical arrangement. In a step A, a current configuration of optical elements in a beam path of the optical arrangement is captured. In a step B, radiation is provided and directed into the sample plane () along the beam path. At least one measured value of the power of the radiation in the sample plane () is captured as resultant power in step C and the measured values in respect of the respectively current configuration are stored in a step D. Steps A to D are repeated for at least one further current configuration. 1. Method for ascertaining a resultant power of radiation in a sample plane of an optical arrangement , comprising:(A) capturing a current configuration of optical elements in a beam path of the optical arrangement;(B) providing radiation and directing the radiation along the beam path into the sample plane;(C) capturing at least one measured value of the power of the radiation in the sample plane as resultant power;(D) storing the measured value in relation to the current configuration; and(E) repeating steps A to D for at least one further current configuration.2. Method according to claim 1 , wherein a relationship between the resultant power and an output power of the radiation is ascertained on the basis of the stored measured values and said relationship is stored assigned to the at least one configuration.3. Method according to claim 1 , wherein a desired resultant power in the sample plane of a configuration to be used is selected and an output power of the radiation is set by means of appropriately generated control commands on the basis of the stored measured values or on the basis of the relationship claim 1 , by virtue of a radiation source of the radiation and/or an attenuator disposed in the beam path being driven in such a way that the selected desired resultant power is brought about in the sample plane.4. Method according to ...

Multi-Color scanning microscope

Die Erfindung betrifft ein Mehrfarben-Scanning-Mikroskop mit mindestens einer ersten Lichtquelle zum Aussenden eines ersten Anregungsstrahlbündels mit erstem Anregungslicht einer ersten Wellenlänge und einer zweiten Lichtquelle zum Aussenden eines zweiten Anregungsstrahlbündels mit zweitem Anregungslicht einer zweiten Wellenlänge, die von der ersten Wellenlänge verschieden ist, mit Einkoppelmitteln zum Einkoppeln des ersten Anregungsstrahlbündels und/oder des zweiten Anregungsstrahlbündels in einen Anregungsstrahlengang, mit Optikmitteln zum Leiten des ersten Anregungsstrahlbündels und des zweiten Anregungsstrahlbündels zu einer Probe und zum Leiten von von der Probe abgestrahltem Detektionslicht in einem Detektionsstrahlengang zu einer Detektionseinheit, wobei die Optikmittel mindestens folgende Bestandteile aufweisen: mindestens einen ersten Hauptfarbteiler zum Trennen des ersten Anregungslichts und/oder des zweiten Anregungslichts einerseits von dem von der Probe abgestrahlten Detektionslicht andererseits, einen Scanner zum Abrastern der Probe mit mindestens dem ersten Anregungslicht und dem zweiten Anregungslicht, ein Mikroskopobjektiv zum Fokussieren des ersten Anregungslichts und des zweiten Anregungslichts auf oder in die Probe und zum Leiten des von der Probe abgestrahlten Detektionslichts in Richtung der Detektoreinheit und mit der Detektoreinheit zum Nachweisen des von der Probe abgestrahlten Detektionslichts. Das Mikroskop ist dadurch gekennzeichnet, dass die Einkoppelmittel und mindestens Teile der Optikmittel dergestalt eingerichtet und angeordnet sind, dass das erste Anregungsstrahlbündel mit der ersten Wellenlänge auf einen ersten Probenort und das zweite Anregungsstrahlbündel mit der zweiten Wellenlänge auf einen zweiten Probenort geleitet wird, der von dem ersten Probenort verschieden ist, und dass die Detektoreinheit zum Nachweisen des von dem ersten Probenort abgestrahlten Lichts einen ersten Detektor und zum Nachweisen des von dem zweiten ...

Optical arrangement for spectral selection, as well as device and microscope

Die Erfindung betrifft eine Optische Anordnung (A) zur spektralen Selektion, mit mindestens einem um eine Drehachse (2) gesteuert schwenkbaren Drehspiegel (1), einem Verlaufsfilter (3) mit einem in einer Längsausdehnung des Verlaufsfilters (3) ausgebildeten Filterverlauf (FG) und einem als sphärischer Spiegel ausgebildeten Hohlspiegel (4). Die Drehachse (2) verläuft in Richtung der Z-Achse (Z) eines kartesischen Koordinatensystems.Erfindungsgemäß ist der Verlaufsfilter (3) in einem Strahlweg zwischen dem mindestens einem Drehspiegel (1) und dem Hohlspiegel (4) angeordnet und der Filterverlauf (FG) in einer Y-Z-Ebene (YZ) quer zum Verlauf des Strahlwegs ausgerichtet und der Drehspiegel (1, 1.n) ist zum Zentrum (C) des Hohlspiegels (4) versetzt angeordnet, so dass ein auf den Drehspiegel (1, 1.n) einfallender Lichtstrahl (6) auf einen Abschnitt des Verlaufsfilters (3) in einer X-Z-Ebene (XZ) reflektiert ist und ein durch den Verlaufsfilter (3) hindurchtretender Anteil des reflektierten Lichtstrahls (7, 7.n) auf den Hohlspiegel (4) trifft und durch dessen Wirkung wieder in derselben X-Z-Ebene zurückgeworfen wird. The invention relates to an optical arrangement (A) for spectral selection, with at least one pivotable about a rotational axis (2) rotatable mirror (1), a gradient filter (3) with a longitudinal extension of the gradient filter (3) formed filter profile (FG) and a concave mirror (4) designed as a spherical mirror. The rotational axis (2) runs in the direction of the Z-axis (Z) of a Cartesian coordinate system. According to the invention, the gradient filter (3) is arranged in a beam path between the at least one rotary mirror (1) and the concave mirror (4) and the filter course (FG). aligned in a YZ plane (YZ) transverse to the course of the beam path and the rotating mirror (1, 1.n) is arranged offset to the center (C) of the concave mirror (4), so that on the rotating mirror (1, 1.n ) incident light beam (6) on a portion of the gradient filter (3) in an XZ ...

Method for accelerated, high-resolution scanning microscopy

Bei einem Verfahren zur hochauflösenden Scanning-Mikroskopie einer Probe (P) ist das Bündeln von Beleuchtungsstrahlung zu einem Beleuchtungsfleck in oder auf der Probe (P) und Stimulieren der Abgabe von Detektionsstrahlung an einem zum Beleuchtungsfleck koinzidenten Probenfleck (14) vorgesehen. Der Probenfleck (14) wird in ein Bild (17) abgebildet, das auf einem ortsauflösenden Flächendetektor (18) ruht, der Pixel (32) mit einer Größe aufweist, die das Bild (17) örtlich auflösen, wobei die Abbildung eine Auflösungsgrenze hat. Die Probe (P) wird insgesamt durch rasterndes Verschieben des Beleuchtungsflecks und des koinzidenten Probenflecks (14) über die Probe (P) in einem Scanvorgang erfasst. Aus den Daten der Pixel (32) für jede Scanposition wird ein Bild der Probe (P) erzeugt, das eine Auflösung aufweist, die über die Auflösungsgrenze der Abbildung gesteigert ist. Dabei wird ein Umverteilungsschritt ausgeführt, in dem für jede Scanposition Daten mehrerer Pixel (32) des Flächendetektors (18), die in der ersten Raumrichtung (x) beabstandet sind, zusammengefasst werden. Weiter wird ein Entmischungsschritt ausgeführt, in dem die derart erzeugten temporären Datensätze hinsichtlich der örtlichen Variation der Punktbildverwaschungsfunktion, die den jeweils zusammengefassten Pixel zugeordnet ist, korrigiert werden. In a method of high-resolution scanning microscopy of a sample (P), the bundling of illumination radiation to an illumination spot in or on the sample (P) and stimulating the delivery of detection radiation to a sample spot (14) coincident to the illumination spot is provided. The sample spot (14) is imaged into an image (17) resting on a spatially resolving area detector (18) having pixels (32) sized to spatially resolve the image (17), the image having a resolution limit. Overall, the sample (P) is scanned by scanning the illumination spot and the coincident sample spot (14) over the sample (P) in a scanning manner. From the data of the pixels (32) for each ...

Method and optical arrangement for determining a resulting power of a radiation in a sample plane

Die Erfindung betrifft ein Verfahren zur Ermittlung einer resultierenden Leistung einer Strahlung in einer Probenebene (8) einer optischen Anordnung. In einem Schritt A erfolgt das Erfassen einer aktuellen Konfiguration optischer Elemente in einem Strahlengang der optischen Anordnung. In einem Schritt B wird eine Strahlung bereitgestellt und entlang des Strahlengangs in die Probenebene (8) gerichtet. Das Erfassen mindestens eines Messwerts der Leistung der Strahlung in der Probenebene (8) als resultierende Leistung erfolgt in Schritt C und in einem Schritt D werden die Messwerte in Bezug zur jeweils aktuellen Konfiguration abgespeichert. Die Schritte A bis D werden für wenigstens eine weitere aktuelle Konfiguration wiederholt.Die Erfindung betrifft weiterhin eine optische Anordnung zur Ermittlung einer resultierenden Leistung einer Strahlung in einer Probenebene (8). The invention relates to a method for determining the resulting power of a radiation in a sample plane (8) of an optical arrangement. In a step A, a current configuration of optical elements is recorded in a beam path of the optical arrangement. In a step B, radiation is provided and directed along the beam path into the sample plane (8). The acquisition of at least one measured value of the power of the radiation in the sample plane (8) as the resulting power takes place in step C and in a step D the measured values are stored in relation to the current configuration. Steps A to D are repeated for at least one further current configuration. The invention further relates to an optical arrangement for determining a resulting power of a radiation in a sample plane (8).

Multi-color scanning microscope

The invention relates to a multi-color scanning microscope comprising at least one first light source for emitting a first excitation beam comprising first excitation light having a first wavelength and a second light source for emitting a second excitation beam comprising second excitation light having a second wavelength, which differs from the first wavelength, comprising coupling-in means for coupling the first excitation beam and/or the second excitation beam into an excitation beam path, comprising optical means for guiding the first excitation beam and the second excitation beam to a sample and for guiding detection light emitted by the sample in a detection beam path to a detection unit, wherein the optical means comprise at least the following components: at least one first main color splitter for separating the first excitation light and/or the second excitation light, on the one hand, from the detection light emitted by the sample, on the other hand, a scanner for scanning the sample with at least the first excitation light and the second excitation light, a microscope objective for focusing the first excitation light and the second excitation light onto or into the sample and for guiding the detection light emitted by the sample in the direction of the detection unit, and comprising the detector unit for detecting the detection light emitted by the sample. The microscope is characterized in that the coupling-in means and at least parts of the optical means are designed and arranged in such a way that the first excitation beam having the first wavelength is guided onto a first sample location and the second excitation beam having the second wavelength is guided onto a second sample location, which differs from the first sample location, and in that the detector unit comprises a first detector for detecting the light emitted by the first sample location and a second detector for detecting the light emitted by the second sample location.

Light microscope and microscopy method

Calibrating device and laser scanning microscope with such a calibrating device

Es besteht die Aufgabe, die Vielfalt der Leistungsfähigkeitstest- und/oder Kalibrieraufgaben bei Laser-Scanning-Mikroskopen zeitsparend mit einfachen Mitteln zu bewältigen. The object is to overcome the variety of performance test and / or calibration tasks in laser scanning microscopes time-saving with simple means. Eine Kalibriervorrichtung, die zueinander in einer gemeinsamen Fassung fest ausgerichtet eine Fokussieroptik und eine in der Fokalebene der Fokussieroptik angeordnete Teststruktur mit im Auflicht und/oder im Durchlicht nachweisbaren Strukturelementen aufweist, ist in einem Laser-Scanning-Mikroskop derart in den Mikroskop-Strahlengang einschaltbar, dass die Pupille der Fokussieroptik mit der Objektivpupille des Laser-Scanning-Mikroskops zusammenfällt oder in einer dazu konjugierten Ebene liegt. A calibration device, which has a focusing lens and a test structure arranged in the focal plane of the focusing optics with structural elements detectable in reflected light and / or transmitted light, can be switched into the microscope beam path in a laser scanning microscope, in that the pupil of the focusing optics coincides with the objective pupil of the laser scanning microscope or lies in a plane conjugate thereto.

Calibrating device and laser scanning microscope with such a calibrating device

The device (1) has a focusing lens (3) and a test structure (4) fixedly aligned together in a common holder (2). The test structure is arranged in a focal plane of the focusing lens and comprises structure elements e.g. grating elements, that are traced by reflected light and/or transmitted light. The test structure is exchangeably retained in the holder. A lighting device (7) e.g. LED and halogen lamp, is formed for radiographing the test structure in a direction of the focusing lens, and is retained in the holder. Independent claims are also included for the following: (1) a laser scanning microscope (2) a method for determining and correcting an adjusting condition between an excitation beam course and a detection beam course of a laser scanning microscope.

Removing device for a climatic cabinet, particularly for receiving microtiter plates (mtp)

Disclosed is a removing device for a climatic cabinet, particularly for receiving microtiter plates (MTP), comprising a swiveling arm (3) with at least one catch for the MTP (2), which is mounted on the swiveling arm. Said catch has an upper catching position and a lower position in which the swiveling arm is swiveled underneath the MTP. The catch is preferably swiveled from the lower position to the upper position by actuating a preferably hook-shaped rocker (5) while the swiveling arm is in an inner position, said rocker being rotatably mounted. The bottom part of the hook is directed towards the catch when the swiveling arm is actuated, causing the catch to be swiveled from the lower position to the upper position.

Mirror tower, arrangement with mirror tower and microscope

Die Erfindung betrifft einen Spiegelturm (1) mit einer Drehachse (2) und mit einer Anzahl von aufeinanderfolgend entlang der Drehachse (2) angeordneten Spiegeln (3), wobei jeder der Spiegel (3) um die Drehachse (2) drehbar ist; jeder Spiegel (3) eine Spiegelfläche (4) aufweist, die sich im Wesentlichen parallel zur Drehachse (2) erstreckt und sich benachbart angeordnete Spiegel (3) gegenseitig an einer jeweiligen Spiegelposition (SP) bezüglich der Drehachse (2) halten.

microscope

Die Erfindung betrifft ein Mikroskop, umfassend eine Beleuchtungseinrichtung (19), mit der ein Lichtblatt zur Beleuchtung eines Probenbereichs (P) erzeugt wird, welches in Richtung einer Beleuchtungsachse (X) eines Beleuchtungsstrahlenganges und in Richtung einer Querachse (Y), welche quer zur Beleuchtungsachse (X) liegt, annähernd flächig ausgedehnt ist, eine Detektierungseinrichtung (1), mit der Licht detektiert wird, welches entlang einer Detektierungsachse (Z) eines Detektierungsstrahlengangs aus dem Probenbereich (P) abgestrahlt wird, wobei Beleuchtungsachse (X) und Detektierungsachse (Z), sowie Querachse (Y) und Detektierungsachse (Z) in einem von Null verschiedenen Winkel aufeinanderstehen, die Detektierungseinrichtung (1) umfassend ein im Detektierungsstrahlengang angeordnetes Detektierungsobjektiv (2) sowie Aufteilungsmittel zur Aufteilung des Detektierungsstrahlengangs in zwei Teilstrahlengänge (14, 15), wobei in den Teilstrahlengängen (14, 15) jeweils ein ortsauflösender Flächendetektor (4) bzw. (4') angeordnet ist, auf den das zu detektierende Licht abbildbar ist, und die Aufteilungsmittel umfassend mindestens einen dichroitischen Strahlteiler (14, 30). Bei einem solche13) im Strahlengang im Nah-Unendlichen (12) bezüglich der ortsauflösenden Flächendetektoren (4, 4') angeordnet ist und eine Dicke von mindestens 3 mm auf. In jedem der beiden Teilstrahlengänge (14, 15) sind optische Abbildungselemente (5) ... The invention relates to a microscope, comprising a lighting device (19), with which a light sheet for illuminating a sample area (P) is generated, which in the direction of an illumination axis (X) of an illumination beam path and in the direction of a transverse axis (Y), which transverse to the illumination axis (X) is extended, approximately flat, a detecting device (1) with which light is detected, which is emitted along a detection axis (Z) of a detection beam path from the sample area (P), wherein illumination axis (X) and detection ...

Luminescence microscopy

Die Erfindung betrifft ein Verfahren zur hochauflösenden Lumineszenzmikroskopie einer mit Markierungsmolekülen markierten Probe und ein Lumineszenzmikroskop zur Durchführang des Verfahrens, wobei die Markierungsmoleküle zur Abgabe von Lumineszenzstrahlung anregbar sind. Das Verfahren zur Lumineszenzmikroskopie umfasst ein Anregen und Abbilden von Markierungsmolekülen, ein Übertragen eines Auslösezeitpunkts und einer Position der Probe. Ein optisches Aufnahmegerät (1) bildet die Markierungsmoleküle in einem Fangbereich ab und überträgt Daten der Abbildung an eine Bildfangschaltung (2). Das Aufnahmegerät (1) überträgt einen Zeitpunkt der Abbildung an einen Signalformer (3) als Auslösezeitpunkt, im Anschluss wird der Auslösezeitpunkt an einen Datenaufnehmer (4) übertragen. Der Datenaufnehmer (4) generiert eine Position der Probe zum Auslösezeitpunkt und überträgt diese an die Bildfangschaltung (2), welche die Position der Probe in Tiefenrichtung mit den Daten des Abbildens eines Frames verknüpft damit ein drei dimensionales Schichtbild der Probe erstellbar ist.

Kalibriervorrichtung und laser-scanning-mikroskop mit einer derartigen kalibriervorrichtung

Lumineszenzmikroskopie

Die Erfindung betrifft ein Verfahren zur hochauflösenden Lumineszenzmikroskopie einer mit Markierungsmolekülen markierten Probe und ein Lumineszenzmikroskop zur Durchführang des Verfahrens, wobei die Markierungsmoleküle zur Abgabe von Lumineszenzstrahlung anregbar sind. Das Verfahren zur Lumineszenzmikroskopie umfasst ein Anregen und Abbilden von Markierungsmolekülen, ein Übertragen eines Auslösezeitpunkts und einer Position der Probe. Ein optisches Aufnahmegerät (1) bildet die Markierungsmoleküle in einem Fangbereich ab und überträgt Daten der Abbildung an eine Bildfangschaltung (2). Das Aufnahmegerät (1) überträgt einen Zeitpunkt der Abbildung an einen Signalformer (3) als Auslösezeitpunkt, im Anschluss wird der Auslösezeitpunkt an einen Datenaufnehmer (4) übertragen. Der Datenaufnehmer (4) generiert eine Position der Probe zum Auslösezeitpunkt und überträgt diese an die Bildfangschaltung (2), welche die Position der Probe in Tiefenrichtung mit den Daten des Abbildens eines Frames verknüpft damit ein drei dimensionales Schichtbild der Probe erstellbar ist.

Spektralanalytische einheit mit einem beugungsgitter

Spektralanalytische Einheit mit einem Beugungsgitter

Die Erfindung betrifft eine spektralanalytische Einheit mit einem Beugungsgitter, bei der ein paralleles Lichtbündel (10), welches einen Wellenlängenbereich aufweist, auf ein Beugungsgitter (1) einfällt, welches die unterschiedlichen Wellenlängen durch Beugung in erste Richtungen spektral aufspaltet, wobei diese Lichtbündel als Lichtbündel 1.-Beugungsordnung ohne Umlauf (11) bezeichnet werden, und das Beugungsgitter (1) Lichtbündel in eine zweite Richtung lenkt, wobei dieses Lichtbündel als Lichtbündel 0.-Beugungsordnung ohne Umlauf (12) bezeichnet wird, weiterhin Wellenlängenteilbereiche des spektral aufgespalteten Lichtbündels 1.-Beugungsordnung ohne Umlauf (11) durch eine Optik (2) auf eine Detektorzeile (3) fokussierbar sind und eine Auswerteelektronik (9) an die Detektorzeile (8) angeschlossen ist, welche das erzeugte Spektrum als Information gewinnt und darstellt. Die Erfindung ist dadurch gekennzeichnet, dass das Lichtbündel 0.-Beugungsordnung ohne Umlauf (12) auf eine Umlenkeinrichtung (Umlenkspiegel 4, 5, 6) trifft, die so ausgerichtet und positioniert ist, dass dieses Lichtbündel auf das Beugungsgitter (1) einfällt und ein Lichtbündel 1.-Beugungsordnung aus einem ersten Umlauf (13) und ein Lichtbündel 0.-Beugungsordnung aus dem ersten Umlauf (14) erzeugbar sind, wobei das Lichtbündel 1.-Beugungsordnung ohne Umlauf (11) und das Lichtbündel 1.-Beugungsordnung aus dem ersten Umlauf (13) jeweils eines Wellenlängenteilbereiches durch die Optik (2) auf jeweils ein ...

High-resolution confocal microscope

A method for the high-resolution scanning microscopy of a specimen where the specimen is illuminated with illuminating radiation such that the illuminating radiation is focused to a diffraction-limited illuminating spot at a point in or on the specimen. The point is projected in a diffraction-limited manner in a diffraction image onto a flat panel detector having pixels. The flat panel detector, owing to the pixels thereof, have a spatial resolution which resolves a diffraction structure of the diffraction image. The point is shifted relative to the specimen into different scanning positions by an increment which is smaller than the diameter of the illuminating spot. The flat panel detector is read, and, from the data of the flat panel detector and from the scanning positions assigned to these data, a 3D image of the specimen is generated. The 3D image has a resolution which is greater than a resolution limit of the projection, and the pixels of the flat panel detector are divided into groups which have a central group lying on an optical axis and a further group which surrounds the central group in a ring. A pre-calculated raw image is calculated for each group and the pre-calculated raw images are unfolded three-dimensionally to generate the image of the specimen.

Detektoranordnung mit erhöhter Empfindlichkeit durch Lichtablenkelemente mit einer ebenen Lichteintrittsfläche

Detektoranordnung mit einem Lichteintrittsflächen (305b, 405b, 505b, 805b) aufweisenden Lichtablenkelement (305, 405, 505, 701, 805), welches einfallendes Licht durch Refraktion auf lichtempfindliche Bereiche (304, 404, 504, 604, 804) eines Detektors (302, 402, 502, 602, 802) ablenkt, wobei eine der Lichteintrittsflächen (305b, 405b, 505b, 805b) als ebene Fläche ausgebildet ist, dadurch gekennzeichnet, dass das Lichtablenkelement (305, 405, 505, 701, 805) aus PMMA besteht und auf ein Glassubstrat (703) aufgebracht ist.

Strahlteilerbaugruppe, verfahren zu deren dimensionierung und mikroskop

Die Erfindung betrifft eine Strahlteilerbaugruppe zur Anordnung in einem nichtkollimierten Teil eines Strahlengangs eines Mikroskops mit einer ersten Platte, die gegen eine optische Achse um einen Verkippungswinkel verkippt ist, und mit einer zweiten Platte, die gegen die optische Achse um einen Verkippungswinkel verkippt ist, wobei die erste Platte und/oder die zweite Platte zum Einkoppeln und/oder zum Auskoppeln von Strahlung dienen. Die erfindungsgemäße Strahlteilerbaugruppe ist dadurch gekennzeichnet, dass ein Keilwinkel der ersten Platte, ein Keilwinkel der zweiten Platte und der Verkippungswinkel der zweiten Platte dergestalt aufeinander abgestimmt sind, dass ein Astigmatismus auf der optischen Achse und eine lineare Feldabhängigkeit des Astigmatismus in einem Objektfeld korrigiert sind. Die Erfindung betrifft außerdem ein Verfahren zum Dimensionieren einer Strahlteilerbaugruppe und ein Mikroskop.

レーザ走査型顕微鏡

【課題】連続スキャン・モードでサンプルを撮影するとき、そのサンプルが受ける負荷を軽減すること。 【解決手段】走査しつつサンプル上を案内される照射光分配機能を持ち、走査から生じて検出されるサンプル光から該サンプルの像が撮影されるレーザ走査型顕微鏡であって、該サンプルが毎秒画像Ｘ枚のフレーム率で走査され、機器パラメータ設定モードでは、走査速度が等しい状態で、好ましくはサンプル保護のため、スキャナ１８による走査時のフレーム率を小さくしてＸ，Ｙ＞１の比率Ｘ／Ｙとするレーザ走査型顕微鏡。 【選択図】図１

Verfahren zur beschleunigten, hochauflösenden Scanning-Mikroskopie

Verfahren zur hochauflösenden Scanning-Mikroskopie einer Probe (P), das folgende Schritte aufweist:a) Bündeln von Beleuchtungsstrahlung zu einem Beleuchtungsfleck in oder auf der Probe (P) und Stimulieren der Abgabe von Detektionsstrahlung an einem zum Beleuchtungsfleck koinzidenten Probenfleck (14), wobei der Beleuchtungsfleck und somit auch der Probenfleck (14) in mindestens einer ersten Raumrichtung nicht beugungsbegrenzt sind,b) Abbilden des Probenflecks (14) in ein Bild (17), das auf einem ortsauflösenden Flächendetektor (18) ruht, der Pixel (32) mit einer Größe aufweist, die das Bild (17) örtlich auflösen, wobei die optische Abbildung eine Auflösungsgrenze und eine für die Pixel (32) örtlich variierende Punktbildverwaschungsfunktion hat,c) rasterndes Verschieben des Beleuchtungsflecks und des koinzidenten Probenflecks (14) über die Probe (P) in einem Scanvorgang, wobei Zeilen sich entlang der ersten Raumrichtung erstrecken und ein Abstand benachbarter Zeilen der Ausdehnung des Probenflecks (14) in der ersten Raumrichtung entspricht,d) Auslesen von Daten der Pixel (32) des Flächendetektors (18) während des Scanvorgangs für jede Scanposition,e) Erzeugen eines Bildes der Probe (P), das eine Auflösung aufweist, die über die Auflösungsgrenze der Abbildung gesteigert ist, wobeie1) ein Umverteilungsschritt ausgeführt wird, in dem für jede Scanposition Daten mehrerer Pixel (32) des Flächendetektors (18), die in der ersten Raumrichtung beabstandet sind, zusammengefasst werden, um für jede Scanposition einen temporären Datensatz umfassend Daten zusammengefasster Pixel zu erzeugen,e2) ein Entmischungsschritt ausgeführt wird, in dem die temporären Datensätze hinsichtlich der örtlichen Variation der Punktbildverwaschungsfunktion, die den jeweils zusammengefassten Pixeln zugeordnet ist, korrigiert werden, so dass innerhalb jedes temporären Datensatzes dieselbe Punktbildverwaschungsfunktion gilt,e3) das Bild der Probe (P) aus den derart verarbeiteten Daten der Pixel (32) und ...

Mikroskop