27-09-2018 дата публикации
Номер: US20180277456A1
Принадлежит:
To divide a semiconductor wafer by stealth dicing, a test pad in a cutting region and an alignment target are collectively arranged along one side in a width direction of the cutting region, and a laser beam for forming a modified region is irradiated to a position away in plane from the test pad and the alignment target Am. In this manner, defects in cutting shape in a cutting process of a semiconductor wafer using stealth dicing can be reduced or prevented. 1. A semiconductor device comprising a wiring board and a semiconductor chip mounted on the wiring board ,wherein the semiconductor chip has a region at own outer periphery where a test pad is arranged.2. The semiconductor device according to claim 1 ,wherein the semiconductor device has a structure in which a plurality of the semiconductor chips are stacked.3. The semiconductor device according to claim 1 ,wherein a wiring layer on a main surface of the semiconductor chip has a low-dielectric-constant film in a method of manufacturing the semiconductor device. This application is a divisional application of Ser. No. 15/378,420, filed Dec. 14, 2016, which is a continuation of U.S. patent application Ser. No. 14/699,660, filed Apr. 29, 2015, now abandoned, which is a continuation of U.S. patent application Ser. No. 14/285,943, filed May 23, 2014, now U.S. Pat. No. 9,070,560, which is a continuation of U.S. patent application Ser. No. 13/310,170, filed Dec. 2, 2011, now U.S. Pat. No. 8,772,135, which is a continuation of U.S. patent application Ser. No. 13/017,747, filed Jan. 31, 2011, now U.S. Pat. No. 8,084,334, which is a continuation of U.S. patent application Ser. No. 12/092,850, filed May 7, 2008, now U.S. Pat. No. 7,892,949, which is a 371 of PCT Application No. PCT/JP2006/322358, filed Nov. 9, 2006, which claims priority to PCT Application No. PCT/JP2005/020615, filed Nov. 10, 2005. The contents of these applications are hereby incorporated by reference into this application.The present invention relates ...
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