24-12-2020 дата публикации
Номер: US20200400744A1
Принадлежит:
Disclosures of the present invention describe an unlimited multiplexing testing system for press type switch, which mainly consists of a main board, a plurality of fixing bases, a test controlling module, a first interface unit, a button punching module, and a host device. Particularly, this novel unlimited multiplexing testing system is able to apply at least one button punching test procedure to a great quantity of mechanical switch components, keyboards or computer mice, thereby completing any one type of standard button punching test, such as life cycle test, loading test or endurance test. On the other hand, this unlimited multiplexing testing system can also be adopted for achieving any one of the foregoing standard button punching tests on the mechanical switch components, keyboards and computer mice, simultaneously. 1. An unlimited multiplexing testing system for press type switch , comprising:a board, being provided a plurality of electrical connection units thereon;a plurality of fixing bases, being disposed on the board; wherein a plurality of objects that are pending to be tested are respectively disposed in the plurality of fixing bases, thereby making the plurality of objects be electrically connected with the plurality of electrical connection units, respectively;a test controlling module, being disposed on the board, and having a first communication unit;a first interface unit, being coupled between the test controlling module and the plurality of electrical connection units thereon;a button punching module, being located over the plurality of fixing bases, and being controlled by the test controlling module; anda host device having a test mode decision unit and a second communication unit;wherein each of the plurality of objects has a key-press portion, and the test mode decision unit being configured for deciding a specific test mode according to a type of the object;wherein the host device transmits a signal of the specific test mode to the test ...
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