СПОСОБ ГРАДУИРОВКИ СПЕКТРОМЕТРА

Изобретение относится к спектрометрии. При осуществлении способа выбирают спектральную схему из записанного спектра компонентов атмосферного воздуха, находящегося в спектрометре, и определяют зависящее от длины волны значение позиции для характеристики, такой как центр указанной спектральной схемы. Это значение сравнивают с эталонным значением, которое может быть получено из спектра, записанного контрольным прибором, и может быть получена формула градуировки. Пики поглощения от диоксида углерода CO2 около 2350 см-1 предпочтительны для выбранной спектральной схемы. Технический результат - изобретение позволяет проводить градуировку одновременно с записью спектра исследуемого образца. 2 н. и 12 з.п. ф-лы, 7 ил.

Verbesserungen an oder bezüglich Spektrometern

Drei-dimensionale Interferometerstruktur mit Abtastung durch Brechungselemente

Verfahren und System zur optischen Spektrumsanalyse mit Korrektur einer ungleichmässigen Abtastrate

Digitales FTIR-Spektrometer

Infrarotspektrometer mit einem Gehäuse, das eine optische Lichtquelle enthält, sowie ein optisches Interferometer zum Aufteilen eines von der Lichtquelle ausgehenden Eingangs-Lichtbündels in zwei Teilbündel und zum Erzeugen eines variablen Gangunterschieds zwischen den beiden Teilbündeln und zum erneuten Zusammenführen der beiden Teilbündel zu einem Ausgangs-Lichtbündel, des weiteren eine Probenposition zur Aufnahme einer Probe, an der diese von dem Ausgangs-Lichtbündel bestrahlt, bzw. durchstrahlt wird und einen optischen Detektor zur Analyse eines von der Probe ausgehenden Detektor-Lichtbündels, mit einer zugeordneten Einrichtung zur Digitalisierung des am Ausgang des Detektors liegenden Detektorsignals sowie mit einer Einrichtung zur Weiterverarbeitung des digitalisierten Detektorsignals, wobei der Detektor und die zugeordnete Einrichtung zum Digitalisieren des Detektorsignals räumlich unmittelbar benachbart angeordnet sind, dadurch gekennzeichnet, dass der Detektor ein Einelementdetektor ...

Fourier transformation IR spectrometer uses vertical-cavity surface-emitting laser diode as reference radiation source for adjustment of movable mirror of interferometer

The spectrometer has an IR measuring radiation source (16) followed by an interferometer (20) a measuring sample (42) and a detector (48). The interferometer has a movable mirror (24) which is adjusted via a control circuit in dependence on the optical path difference between the movable mirror and a stationary mirror (22) of the interferometer, obtained via a reference radiation source (60) and a second detector (66). The reference radiation source is provided by a vertical-cavity surface-emitting laser diode. An Independent claim for an interferometer is also included.

Fourier Spektrometer mit dichroitischen Michelson-Spiegeln für zwei Wellenlängenbänder

Depth resolved measurement and imaging of biological samples using laser scanning microscopy, whereby heterodyne detection and optical modulation is used to allow imaging of deep sample regions

Arrangement of an optical modulator for fast modulation within the interferometer arm of an interferometer arrangement for heterodyne detection. The modulator serves both for switching and or beam attenuation in a laser scanning microscope. The invention also relates to a corresponding method and interferometric measurement arrangement for heterodyne detection.

Abbildendes FTIR-Spektrometer

Die Erfindung betrifft ein abbildendes FTIR-Spektrometer, bei dem Interferometer und Probe und Detektor im Spekttrometergehäuse angeordnet sind und das Licht der Quelle zunächst das Interferomter durchläuft, dann auf die Probe fokussiert wird, die anschließend auf die Oberfläche eines Detektorarrays abgebildet wird. Die Erfindung betrifft auch ein FTIR-Spektrometer mit einem Detektorarray, auf dessen Chip ADCs integriert sind, derart, dass jedem Pixel ein ADC zugeordnet ist.

SPECTROMETERS

... 1421897 Spectrometers BRUKER-PHYSIK AG 3 April 1974 [24 May 1973] 14684/74 Heading G2J A Fourier infrared vacuum spectrometer for examining specimen samples in transmitted and reflected light comprises a light source 8, an introferometer, a sample chamber 4, a reference chamber 5, a detector 31, and electronic evaluation and recording devices (not shown). Mirrors located in the sample and reference chambers permit the rays entering the chambers for examination in reflected light to be focused on the sample and the reference sample respectively, at the same location at which the rays for examination in transmitted light are focused. Further mirrors located in the sample and reference chambers are focused at the respective location to receive light reflected from the sample and reference sample respectively, and to deflect it out of the respective chamber.

OPTICAL PATH LENGTH VARIATION

DOUBLE-BEAM INTERFEROMETER ARRANGEMENT

Method of obtaining an optical FT spectrum

ADJUSTABLE OPTICAL APPARATUS AND SPECTROMETERS

Interferometer maintaining optical relationship between elements

An interferometer (1) for Fourier transform infrared spectroscopy includes a fixed assembly (40) including a housing (41), a beam splitter (4), and a mirror (9) fixedly positioned relative to each other. A movable assembly (22) includes a housing (21), a mirror (8), and a motor coil (25), fixedly positioned relative to each other. A first flat spring (27a) has an opening for providing an unobstructed optical path of radiation therethrough. A first end of the first flat spring is secured to the fixed assembly and a second end of the first flat spring is secured to the movable assembly for providing movement of the movable assembly relative to the fixed assembly via the first flat spring. An optical relationship between the beam splitter, the mirror of the fixed assembly, and the mirror of the movable assembly is maintained independent of a distance between the movable assembly and the fixed assembly.

Interferometer maintaining optical relationship between elements

Improved digital signal processing for a ft-ir spectrometer using multiple modulations

Interferometric gas detector

Selective modulation interferometric detector, intended for specifically detecting and/or identifying at least one gas in a gaseous mixture, especially with the aim of carrying out analysis and/or proportioning operations, the assembly E consists of a first strip L1 of interferometric quality having plane and parallel faces, of thickness e and index n introducing a displacement DELTA =2ne adapted to the gas to be analyzed, this strip L1 supplying on the detector a brilliant fringe, and a second strip L2 made of the same material as the first strip L1 which is slightly prismatic and supplying on the detector average illumination.

Method and apparatus for analyzing particle-containing gaseous suspensions

The method and apparatus permit analyses, by optical means, of properties of gaseous suspensions of particles, by measuring radiation that is emitted, transmitted or scattered by the particles. Determinations of composition, size, temperature and spectral emittance can be performed either in-situ or by sampling, and Fourier-transform infrared spectrometric techniques are most effectively used. Apparatus specifically adapted for performing radiation scattering analyses, and for collecting radiation from different sources, are provided.

Optical-interference analysis

INTERFEROMETER

POLARIZATION INTERFEROMETER

... 1347760 Measuring optical dichroism CARY INSTRUMENTS 21 June 1971 [22 June 1970] 28934/71 Heading G1A The variation of linear or circular dichroism of a sample with wavelength is measured by Fourier spectroscopy. Light from a broadband source of light 10 is collimated at 11 and polarized linearly (28) by device 26. The light is then passed through a Mach-Zehnder interferometer comprising beam splitter 30 and two mirror systems 38, 35, the first of which is movable with respect to the second. The intention is to produce in the recombined beam two components 43, 49 whose polarization directions are orthogonal and which do not fluctuate in intensity. The effect of motion of mirror system 38 is progressively to retard in phase the component 49 with respect to the other and produce an alteration in the effective polarization of the combined beam through the repeated cycle from left circularly polarized (LCP) 101 through right circularly polarized (RCP) 105 and back to 101, Fig.4. This provides ...

INTERFEROMETER

ANORDNUNG ZUM AUFBAU EINES MINIATURISIERTEN FOURIER-TRANSFORM-INTERFEROMETERS FÜR OPTISCHE STRAHLUNG NACH DEM MICHELSON- BZW. EINEM DARAUS ABGELEITETEN PRINZIP

DEVICE FOR THE COLLECTION OR PRODUCTION OF OPTICAL SIGNALS

SCANNING INTERFEROMETER

VERFAHREN UND VORRICHTUNG ZUR AUFNAHME EINES INTERFEROGRAMMS VON INFRAROTLICHT

SYSTEM, PROCEDURE AND DEVICE FOR A MICRO-MANUFACTURED INTERFEROMETER WITH OPTICAL BEAM SPLITTER

PROCEDURE AND USE OF A DEVICE FOR THE ACTIVE SUBSTANCE SEARCH

FAST PHARMACEUTICAL IDENTIFIZIERUNGSUND TEST SYSTEM

FTIR-SPEKTROMETER MIT DIODENLASER

PROCEDURE AND DEVICE FOR THE ADMISSION OF A INTERFEROGRAMMS OF INFRA-RED LIGHT

POLARIZATION INTERFEROMETER.

INTERFEROMETER AS WELL AS PROCEDURE FOR THE COMPENSATION OF THE DISPERSION AND/OR FOR THE INCREASE OF THE SPECTRAL DISSOLUTION OF A SUCH INTERFEROMETER

INTERFEROMETER AND FOURIER SPECTROMETER

АNОRDNUNG ZUМ АUFВАU ЕINЕS МINIАТURISIЕRТЕN FОURIЕR-ТRАNSFОRМ-INТЕRFЕRОМЕТЕRS FÜR ОРТISСНЕ SТRАНLUNG NАСН DЕМ МIСНЕLSОN- ВZW. ЕINЕМ DАRАUS АВGЕLЕIТЕТЕN РRINZIР

АNОRDNUNG ZUМ АUFВАU ЕINЕS МINIАТURISIЕRТЕN FОURIЕR-ТRАNSFОRМ-INТЕRFЕRОМЕТЕRS FÜR ОРТISСНЕ SТRАНLUNG NАСН DЕМ МIСНЕLSОN- ВZW. ЕINЕМ DАRАUS АВGЕLЕIТЕТЕN РRINZIР

DEVICE FOR THE COLLECTION OR PRODUCTION OF OPTICAL SIGNALS

АNОRDNUNG ZUМ АUFВАU ЕINЕS МINIАТURISIЕRТЕN FОURIЕR-ТRАNSFОRМ-INТЕRFЕRОМЕТЕRS FÜR ОРТISСНЕ SТRАНLUNG NАСН DЕМ МIСНЕLSОN- ВZW. ЕINЕМ DАRАUS АВGЕLЕIТЕТЕN РRINZIР

DEVICE FOR THE COLLECTION OR PRODUCTION OF OPTICAL SIGNALS

DEVICE FOR THE COLLECTION OR PRODUCTION OF OPTICAL SIGNALS

АNОRDNUNG ZUМ АUFВАU ЕINЕS МINIАТURISIЕRТЕN FОURIЕR-ТRАNSFОRМ-INТЕRFЕRОМЕТЕRS FÜR ОРТISСНЕ SТRАНLUNG NАСН DЕМ МIСНЕLSОN- ВZW. ЕINЕМ DАRАUS АВGЕLЕIТЕТЕN РRINZIР

DEVICE FOR THE COLLECTION OR PRODUCTION OF OPTICAL SIGNALS

АNОRDNUNG ZUМ АUFВАU ЕINЕS МINIАТURISIЕRТЕN FОURIЕR-ТRАNSFОRМ-INТЕRFЕRОМЕТЕRS FÜR ОРТISСНЕ SТRАНLUNG NАСН DЕМ МIСНЕLSОN- ВZW. ЕINЕМ DАRАUS АВGЕLЕIТЕТЕN РRINZIР

DEVICE FOR THE COLLECTION OR PRODUCTION OF OPTICAL SIGNALS

DEVICE FOR THE COLLECTION OR PRODUCTION OF OPTICAL SIGNALS

DEVICE FOR THE COLLECTION OR PRODUCTION OF OPTICAL SIGNALS

DEVICE FOR THE COLLECTION OR PRODUCTION OF OPTICAL SIGNALS

DEVICE FOR THE COLLECTION OR PRODUCTION OF OPTICAL SIGNALS

АNОRDNUNG ZUМ АUFВАU ЕINЕS МINIАТURISIЕRТЕN FОURIЕR-ТRАNSFОRМ-INТЕRFЕRОМЕТЕRS FÜR ОРТISСНЕ SТRАНLUNG NАСН DЕМ МIСНЕLSОN- ВZW. ЕINЕМ DАRАUS АВGЕLЕIТЕТЕN РRINZIР

DEVICE FOR THE COLLECTION OR PRODUCTION OF OPTICAL SIGNALS

АNОRDNUNG ZUМ АUFВАU ЕINЕS МINIАТURISIЕRТЕN FОURIЕR-ТRАNSFОRМ-INТЕRFЕRОМЕТЕRS FÜR ОРТISСНЕ SТRАНLUNG NАСН DЕМ МIСНЕLSОN- ВZW. ЕINЕМ DАRАUS АВGЕLЕIТЕТЕN РRINZIР

DEVICE FOR THE COLLECTION OR PRODUCTION OF OPTICAL SIGNALS

АNОRDNUNG ZUМ АUFВАU ЕINЕS МINIАТURISIЕRТЕN FОURIЕR-ТRАNSFОRМ-INТЕRFЕRОМЕТЕRS FÜR ОРТISСНЕ SТRАНLUNG NАСН DЕМ МIСНЕLSОN- ВZW. ЕINЕМ DАRАUS АВGЕLЕIТЕТЕN РRINZIР

АNОRDNUNG ZUМ АUFВАU ЕINЕS МINIАТURISIЕRТЕN FОURIЕR-ТRАNSFОRМ-INТЕRFЕRОМЕТЕRS FÜR ОРТISСНЕ SТRАНLUNG NАСН DЕМ МIСНЕLSОN- ВZW. ЕINЕМ DАRАUS АВGЕLЕIТЕТЕN РRINZIР

Interferometer spectrometer with reduced alignment sensitivity

PROCESSING SYSTEM FOR REMOTE CHEMICAL IDENTIFICATION

Miniaturized holographic fourier transform spectrometer with digital aberration correction

INTERFEROMETER

Methods of differentiating metastatic and non-metastatic tumors

Interferometer having a micromirror

Spectrometers

AN IMAGING SYSTEM

An imaging system is provided where radiation from object space (2) is incident on an array of detector elements (8) via an interferometer (3), the interferometer (3) being scanned such that the output of each pixel comprises an interferogram B generated from the radiation received from a corresponding region of object space (2), enabling image data to be generated in dependence on the output of the pixels, which image data is derived from the spectral radiance associated with each pixel.

METHOD OF MEASURING MULTICOMPONENT CONSTITUENCY OF GAS EMISSION FLOW

A method is disclosed of making an on-line gas analysis of a multicomponent gas emission flow by (a) continuously sequestering a sample flow from the gas emission flow, which sample flow has been filtered to substantially eliminate solid or liquid particles, diluted to lower its dew point to below room temperature, and changed in either temperature and/or pressure to be substantially the same in temperature and pressure as that of gases used to create reference transmission frequency spectral data deployed in step (d); (b) continuously irradiating the sample flow with an electromagnetic radiation beam while modulating the amplitude of infrared frequencies in the audio frequency range of the beam, either prior to or immediately subsequent to irradiation of the sample flow, to produce electromagnetic signals having discernible amplitude variations resulting from spectral interference patterns; (c) detecting and collecting the signals at a sufficiently high rate to substantially completely ...

MULTIPLEX INTERFEROMETER

INTERFERENCE SPECTROSCOPY

RETRO-INTERFEROMETER HAVING ACTIVE READJUSTMENT

The present invention relates to an interferometer assembly (1), comprising an input for useful light (3), a beam splitter (8), two reflectors (15, 16) for establishing two interferometer arms (13, 14), a drive (24) for moving at least one of the retroreflectors (15, 16) in order to modify an optical path difference between the interferometer arms (13, 14), a reference light source (5) for coherent reference light, an output for useful light (21), and a reference light detector (19), said interferometer assembly being characterised in that the reference light detector (19) comprises at least three detector faces (19a-19d), the detector faces of a first pair of detector faces (19a, 19b) being lined up in a first direction (ER) and the detector faces of a second pair of detector faces (19a, 19c) being lined up in a second direction (ZR), and the first direction (ER), the second direction (ZR) and a central propagation direction of the reference light (17) on the reference light detector ( ...

FOURIER TRANSFORM MULTI-CHANNEL SPECTRAL IMAGER

L'invention concerne un spectro-imageur(100), le dispositif comprenant: -un photo détecteur (120) comprenant une pluralité de sites photosensibles affleurant une surface photosensible (121), -une lentille collimatrice (110) comprenant un plan focal intermédiaire (130), -un réseau d'interféromètres à deux ondes majoritaires (140), comprenant chacun un cavité délimitée par deux faces, -un réseau de microlentilles (150) agencées dans un plan parallèle à la surface photosensible (121), Chaque microlentille étant appariée à un interféromètre pour former une paire optique, comprenant un plan focal image coïncidant avec la surface photosensible (121), et étant en regard d'une section de la surface photosensible (121).

DETECTOR OF FOURIER TRANSFORM INFRARED SPECTROMETER

Method and System for Photodetector Signal Correction

METHOD AND APPARATUS FOR MEASURING GAS CONCENTRATIONS AND ISOTOPE RATIOS IN GASES

This invention provides a method of determining a trace gas concentration in a gas sample utilising Fourier Transform Infra-Red Spectroscopy, said method comprising the following steps (i) to (iii) of: (i) synthetically calibrating a spectrometer by the steps of: (a) calculating a theoretical spectral response function for a series of candidate chemical substances; (b) convolving said theoretical spectral response function with a spectrometer instrument response function corresponding to said spectrometer device so as to produce an expected response function for said series of candidate chemical substances; and (c) utilising said expected response function as the calibration of said spectrometer device in the subsequent measurement of chemical substances; (ii) determining a spectral window within which to fit a calculated spectral trace to an experimental spectral trace by the steps of: (a) choosing a series of candidate windows; (b) determining the likely error measure associated with ...

Interféromètre d'analyse

Appareil pour calculer la transformée de Fourier d'une fonction et utilisation de cet appareil

Spectromètre pour l'étude d'une source émettant des radiations dans l'infrarouge lointain

Interféromètre d'exploration pour l'analyse d'une lumière de composition spectrale inconnue

Colour measurement and/or recognition device has transmitter module whose emitted light is focused onto specimen, receiver module receiving light from specimen

The device has a transmitter module (1) whose emitted light is focused onto the specimen (2) and a receiver module (3) contg. at least one light receiver (33) arranged so that light from the specimen can be received by the receiver. A reference receiver module is used to regulate the power of the light sources (10,1-10.3) or for computer compensation of digital colour measurement values. An Independent claim is also included for an arrangement in a colour measurement and/or detection device and for a method of colour measurement and/or recognition.

INTERFEROMETER, AS WELL AS SPECTROMETER WITH SUCH.

Ein Interferometer zur Erzeugung eines Interferenzmusters umfasst eine Lamellargittereinheit (5) mit Reflexionsflächen zur Reflexion des Lichts, eine Lichtaussendeeinheit (1) zum Aussenden des Lichts auf die Lamellargittereinheit (5) und eine Lichtempfangseinheit (2) zum Empfang des von der Lamellargittereinheit (5) reflektierten Lichts. Die Lichtaussendeeinheit (1) umfasst eine Vielzahl einzelner Lichtleiter (110), welche in mindestens einer Lichtleiterreihe (11) angeordnet sind und das Licht als Strahlenbündel auf die Lamellargittereinheit (5) senden. Das Strahlenbündel kann unmittelbar auf die Lamellargittereinheit (5) gerichtet sein. Das erfindungsgemässe Interferometer und das dieses Interferometer verwendende Spektrometer ermöglichen die Auswertung von relativ viel Licht und weisen somit eine erhöhte Sensitivität auf.

SPECTROMETRIC INSTRUMENT

SELF CALIBRATION FOR MIRROR POSITIONING IN OPTICAL MEMS INTERFEROMETERS

Spectral imaging of deep tissue

CONTROL DEVICE MOVING WITHOUT VIBRATION OF AN OPTICAL ELEMENT IN AN INTERFEROMETER COMPRISING THE STELLAR INTERFEROMETER AND STAR

INTERFEROMETRIC DEVICE

Improvements brought to interferential spectrometry and their applications

Dispositif de commande en déplacement sans vibrations d'un élément optique dans un interféromètre stellaire et interféromètre stellaire le comportant

Un chariot 1 se déplace le long d'une voie 4 et porte, par une liaison flexible 7, un châssis 6 sur lequel est fixée une charge utile 2 comportant un élément optique, un actionneur linéaire 8 contrôlant la liaison 7 de façon à corriger les imperfections du déplacement de la charge 2. Un accéléromètre piézo-électrique 21 délivre un signal 22 filtré pour commander l'actionneur linéaire 8 de façon à éliminer l'effet des vibrations du chariot 1 sur la charge 2. Il y a deux boucles d'asservissement indépendantes pour la commande du chariot, d'une part, et pour la commande du châssis d'autre part Application à la commande de la partie mobile d'une ligne à retard optique 11, ou d'un télescope, d'un interféromètre stellaire.

INTERFEROMETRIC SYSTEM OF SELECTION OF SPECTRAL COMPONENTS DEFAISCEAU OPTICAL

L'invention concerne un système interférométrique (2) de sélection de composantes spectrales d'un faisceau optique incident en fonction de leur longueur d'onde, comprenant - des moyens de transformation (42) du faisceau optique incident en deux faisceaux démultiplexés spatialement; - des moyens de déphasage (43) d'au moins un des faisceaux démultiplexés spatialement, le déphasage s'appliquant spatialement de sorte à produire deux faisceaux dits déphasés, au moins une de leurs composantes étant déphasée en fonction de sa longueur d'onde; - des moyens de recombinaison (44, 42) des faisceaux déphasés adaptés à produire un premier et un second faisceaux de sortie, chacun des faisceaux de sortie étant multiplexé en longueur d'onde et comprenant des composantes des faisceaux déphasés, sélectionnées en fonction respectivement d'un premier et d'un second déphasage.

Additional appts. for an interference spectrometer - giving interference fringes specific to gases under investigation, e.g. sulphur dioxide in pollutant gases

PROCESS Of CALIBRATION OF SPECTRAL RADIOMETERS

L'invention concerne un procédé d'étalonnage de radiomètres spectraux.Pour ce procédé on utilise au moins trois spectres mesurés de corps noirs rayonnants placés à des températures constantes différentes, et on détermine (2) les fonctions d'appareil, à savoir la sensibilité spectrale du spectromètre et le rayonnement spectral propre de l'appareil, non pas en tant que variables indépendantes, mais en tant que fonctions des températures de rayonnement indéterminées des corps noirs rayonnants, et pour obtenir les températures désirées on utilise un calcul de compensation gaussien non linéaire et itératif (3, 4, 5) avec un calcul de nouvelles températures et fonctions d'appareil.Application à l'étalonnage de radiomètres spectraux et en particulier de spectromètres de Fourier.

METHODS AND APPARATUS FOR eXECUTION OF FOURIER-SPECTROSCOPY

IMPROVEMENTS IN OR RELATING TO HYPERSPECTRAL IMAGING

Described herein is a hyperspectral imaging system (500) in which a polarising beam splitter (510), a Wollaston prism (520), an optical system (530), and a plane mirror (540) are arranged on an optical axis (550) of the imaging system (500). An imaging detector (560) is provided on which radiation is focussed by an imaging lens (570). The Wollaston prism (520) is imaged on itself by the optical system (530) and the plane mirror (540) so that translation of the Wollaston prism (520) in a direction parallel to a virtual split plane of the prism effectively provides an optical path length difference that is the same for all points in the object field.

FOURIER TRANSFORM MICRO SPECTROMETER BASED ON SPATIALLY-SHIFTED INTERFEROGRAM BURSTS

A spectrometer with improved resolution includes a spectral domain modulator having a periodic response in the spectral domain to modulate a wideband source spectrum and cause one or more shifted bursts in the interferogram.

DIFFRACTION-GRATING-BASED COMMON-PATH INTERFEROMETER FOR IMAGING FOURIER-TRANSFORM SPECTROSCOPY

An interferometer employing a 4f optical imaging system, through which both reference and sample beams are propagated, between diffraction gratings configured as input and output beam-splitting / beam-combining components. A Fourier-transform spectrometer utilizing the same and a microscope as an input optical sub-system. The interferometer includes a variable-phase-delay optical element in a Fourier plane of the imaging spectrometer defined between lens elements of the 4f optical system. In a special case, an additional 4f optical imaging system is used at the output of the interferometer, through which interferograms are registered at the detector. Light output collected by the detector has the same optical path difference between reference and sample beams at any point across field-of-view. A method for performing imaging spectrometry and forming images of an object under the microscope.

FOURIER SPECTROMETER WITH A MODULAR MIRROR, INTEGRATED ON A SUBSTRATE AND SENSOR FOR SCANNING STANDING WAVES AND METHOD FOR THE PRODUCTION THEREOF

The invention relates to a Fourier spectrometer (1), for determining spectral information of an incident optical input signal (2) and a method for producing such a Fourier spectrometer. The aim of said invention is to allow the accurate production of a small-sized and compact Fourier spectrometer, by means of which, in particular, both 1D and 2D spectrometer arrays may be produced. Said aim is achieved, whereby a Fourier spectrometer is provided, said spectrometer comprising a support layer (4) which is transparent to the optical input signal, a sensor (2), for producing an electrical output signal, which is placed on the support layer and is at least partially transparent to the optical input signal, a reflective layer (3), placed on the sensor side opposite to the support layer, for reflecting the incident optical input signal (2) and producing an optically standing wave from the incident input signal and reflected input signal as well as a cavity (7), located between the sensor and reflective ...

DUAL-COMB SPECTROSCOPY

A gain switched dual comb spectroscopy device for spectroscopically detecting a sample substance, comprising a first slave laser light source configured to generate a first frequency comb having a first comb free spectral range, and a second slave laser light source configured to generate a second frequency comb having a second comb free spectral range which is different from the first comb free spectral range. A master laser light source is configured to inject seed light in to both slave laser light sources therewith to injection lock the generation of both the first and the second frequency combs. A photodetector part is arranged to combine the first and the second frequency combs and to detect a beat signal the spectrum of which comprises a third frequency comb including beat tones produced by interference between the combined first and second frequency combs. The device comprises a sample detection area configured for receiving the sample for detection and for directing at least one of the first and the second frequency comb to the photodetector part via the sample detection area. 1. A dual comb spectroscopy device for spectroscopically detecting a sample substance , comprising:a first slave laser light source configured to generate a first optical output, the optical spectrum of which comprises a first frequency comb having a first comb free spectral range;a second slave laser light source configured to generate a second optical output, the optical spectrum of which comprises a second frequency comb having a second comb free spectral range which is different from the first comb free spectral range;a master laser light source configured to inject seed light in to both the first slave laser light source and the second slave laser light source therewith to injection lock said generation of both the first optical output and the second optical output;a photodetector part arranged to combine the first optical output and the second optical output and to detect a beat ...

Method of obtaining information

PCT No. PCT/DK95/00492 Sec. 371 Date May 13, 1997 Sec. 102(e) Date May 13, 1997 PCT Filed Dec. 7, 1995 PCT Pub. No. WO96/18089 PCT Pub. Date Jun. 13, 1996A method is suggested for obtaining information on the electromagnetic spectrum of a sample, the method comprising (a) generating a plurality of substantially identical signals, (b) determining the shape of a first number of the signals by performing a first number of scans of a first range of signal width, (c) determining the shape of a second number of the signals by performing a second number of scans of a second range of signal width, the second range being comprised by the first range and comprising a portion of the first range in which the signals have maximum absolute amplitude, (d) combining data from the first number of scans and the second number of scans so as to obtain data corresponding to the shape of the signals, and (e) performing a mathematical transformation of the combined data so as to obtain the information on the ...

Moving reflector driving part of a Michelson inteferometer

PCT No. PCT/JP91/00506 Sec. 371 Date Dec. 17, 1991 Sec. 102(e) Date Dec. 17, 1991 PCT Filed Apr. 7, 1991 PCT Pub. No. WO91/16606 PCT Pub. Date Oct. 31, 1991.Reference light is incident to a Michelson interferometer, in which is obtained a reference interference electric signal which undergoes a sinusoidal variation in accordance with interference of reference light as a movable reflector (14) moves. A direction control signal indicating the direction in which to move the movable reflector (14) is applied from a control circuit (21) to a two-phase signal generator (32B), which derives, from the reference interference electric signal, two-phase signals either one of which leads the other by a phase angle of 90 DEG in accordance with the specified direction. The two-phase signals are fed back to a servo drive circuit (19) and a movement control signal is also applied from the control circuit (21) to the servo drive circuit (19) to control the movement of the movable reflector (14). Thus, the ...

Dispersed fourier transform spectrometer

A dispersing Fourier Transform interferometer (DFTS) includes a Fourier Transform Spectrometer having an input for receiving a source light and an output, and a dispersive element having an input coupled to the Fourier Transform Spectrometer output and an output for providing the resulting multiple narrowband interferogram outputs of different wavelengths representative of the source light input. A processor applies a sparse sampling algorithm for determining the best fit between a set of model interferograms and the set of data interferograms. The model interferogram is inferred as specified at a discrete set of lags, a difference is determined between the model interferogram and the data interferogram, and an optimization method determines the model interferogram best matched to the data interferogram. The DFTS interferometer improves the sensitivity of a standard FTS by including a dispersive element, increasing the SNR by a factor of (Rg)<1/2 >as compared to the FTS, where Rg is the ...

Apparatus, systems, and methods for Talbot spectrometers

A non-paraxial Talbot spectrometer includes a transmission grating to receive incident light. The grating period of the transmission grating is comparable to the wavelength of interest so as to allow the Talbot spectrometer to operate outside the paraxial limit. Light transmitted through the transmission grating forms periodic Talbot images. A tilted detector is employed to simultaneously sample the Talbot images at various distances along a direction perpendicular to the grating. Spectral information of the incident light can be calculated by taking Fourier transform of the measured Talbot images or by comparing the measured Talbot images with a library of intensity patterns acquired with light sources having known wavelengths.

Planar lightwave fourier-transform spectrometer measurement including phase shifting for error correction

A transform spectrometer measurement apparatus and method for a planar waveguide circuit (PLC). The spectrometer typically includes an input optical signal waveguide carrying an input optical signal; a plurality of couplers, each connected to the input optical signal waveguide, and each including a coupler output for carrying a coupled optical signal related to the input optical signal; and an array of interleaved, waveguide Mach-Zehnder interferometers (MZI), each having at least one input MZI waveguide, each MZI input waveguide receiving a coupled optical signal from a respective coupler output. A phase shifting circuit is applied to at least one arm of the MZIs to induce an active phase shift on the arm to thereby measure phase error in the MZIs. Light output from the MZIs is measured under intrinsic phase error conditions and after an active phase shift by the phase shifting circuit.

High speed spectrometer

A system for measuring quantum efficiency in a sample photovoltaic cell may include a Fourier transform infrared spectrometer. One or more light source for illuminating the photovoltaic cell in a wavelength range of interest are provided.

Preparing samples for optical measurement

We disclose an apparatus comprising: a hand-portable optical analysis unit including an optical interface; and a device configured to receive and releasably engage the hand-portable optical analysis unit. The device comprises: a housing; a sample unit in the housing; and a resilient member configured to bias the sample unit and the hand-portable analysis unit towards each other when the hand-portable optical analysis unit is received in the device to compress a sample disposed between the sample unit and the optical interface of the optical analysis unit. Methods of analyzing samples are also disclosed.

Imaging apparatus for diagnosis and control method thereof

An imaging apparatus for diagnosis is connected with a probe including a transmitting and receiving unit transmitting a light transmitted from a light source continuously to the inside of a body cavity and concurrently, receiving a reflected light continuously from the inside of the body cavity, and generates a tomographic image inside the body cavity based on the obtained reflected light by obtaining the reflected light from the transmitting and receiving unit while rotating the transmitting and receiving unit. The apparatus comprises: a mechanism for extracting intensity of the reflected light obtained by a phenomenon that the light transmitted to the transmitting and receiving unit is reflected at the transmitting and receiving unit; and a mechanism for judging whether or not the extracted intensity of each reflected light at each rotary angle of the transmitting and receiving unit lies in a range of a predetermined variation width.

Systems and methods for endoscopic angle-resolved low coherence interferometry

Fourier domain a/LCI (faLCI) system and method which enables in vivo data acquisition at rapid rates using a single scan. Angle-resolved and depth resolved spectra information is obtained with one scan. The reference arm can remain fixed with respect to the sample due to only one scan required. A reference signal and a reflected sample signal are cross-correlated and dispersed at a multitude of reflected angles off of the sample, thereby representing reflections from a multitude of points on the sample at the same time in parallel. Information about all depths of the sample at each of the multitude of different points on the sample can be obtained with one scan on the order of approximately 40 milliseconds. From the spatial, cross-correlated reference signal, structural (size) information can also be obtained using techniques that allow size information of scatterers to be obtained from angle-resolved data.

Electric field spectrum measurement device and object measurement device

Every depth of the measurement object measures energy structural information, refractive index, transmittance, reflectance other than property information of (as for the resolution several microns), e.g., space information at the same time. A spectrum measurement device receives a reference wave propagating in a reference path and a measurement wave propagating in a measurement path having a start point same as a start point of the reference path, and derives a spectrum of the measurement wave. The space information of the measuring object, energy structural information, refractive index, transmittance, a reflective index using spectrum measurement device are derived.

Sample gas analyzing device and computer program for the same

The present invention is intended to make reduction of interference influence and reduction of a measurement error compatible in a quantitative analysis of one or more measurement target components and to provide a analyzing device ( 100 ) that quantitatively analyzes one or more measurement target components in a sample using a spectral spectrum obtained by irradiating light to the sample, wherein the analyzing device is adapted to switch the library data between a first generation condition in a period of a predetermined time lapse after starting the sample gas generation and a second generation condition after the predetermined time lapse, wherein under the first generation condition, a plurality of measurement target components are quantitatively analyzed using the first library data obtained by compensating interference influence of measurement extra-target components; and under the second generation condition, the quantitative analysis of a plurality of measurement target components is performed using second library data obtained without compensating interference influence of the measurement extra-target components.

Method of correcting tilt in spectroscope

In a rough adjustment step before spectroscopic analysis, a moving mirror is moved (# 1 ), the outputs of division elements when the interfering light of reflected light off the moving mirror and reflected light off a fixed mirror is received by a four-division sensor are totalized and variations in the contrast of the interfering light are detected (# 12 ), and, based on the variations in the contrast, the amount of relative tilt of the two reflected light beams is detected (# 13 ), and the initial tilt error is corrected (# 14 ). In a fine adjustment step before the spectroscopic analysis, based on a phase difference between the outputs of the division elements when the interfering light is received by the four-division sensor, the relative tilt amount of and the tilt direction of the two reflected light beams are detected, and the initial tilt error is corrected.

Electrically-augmented damping

Provided herein are devices, systems, and methods for electrically-augmented damping of an actuator and associated devices. In particular, electrically-augmented damping derived from measurement of voltage across an actuator and current flowing through an actuator is provided.

COMB-BASED SPECTROSCOPY WITH SYNCHRONOUS SAMPLING FOR REAL-TIME AVERAGING

A method of comb-based spectroscopy for measuring a CW source at time-bandwidth limited resolution by using frequency combs with a high degree of mutual coherence (<1 radian phase noise). 1. A method of comb-based spectroscopy for measuring a CW source at time-bandwidth limited resolution by using frequency combs with a high degree of mutual coherence (<1 radian phase noise) comprising:generating a first comb that transmits a first pulse train that is optically combined with a CW source;detecting the overlap of each pulse of the first comb with the CW source in a first photodetector;digitizing a photodetector response from the first photodetector for each pulse of the first pulse train;generating a second comb that is optically coherent with the first comb, said second comb transmits a second pulse train that has a pulse period that differs by ΔT and a pulse repetition frequency that differs by Δfr from the first pulse train, and is separately combined with the CW source;detecting the overlap of each pulse of the second comb with the CW source in a second photodetector;digitizing a photodetector response from the second photodetector for each pulse of the second pulse train;multiplying the digitized samples from the first comb times the digitized samples of the second comb over a time (1/Δfr) to generate a data point record of length (fr/Δfr) where fr is the repetition rate;rescaling the point separation for the data record there between to be ΔT; andFourier transforming the product of the digitized samples to yield a wideband spectrum of the CW source at a resolution given by the comb repetition rate and an ambiguity given by 1/(2ΔT) to provide an absolute frequency of the CW source with respect to a CW reference laser to which the respective first comb and the second are locked.2. The method as recited in claim 1 , further comprising:generating a third comb by splitting comb 2 into two parts and frequency-shifting one part to create a third comb with the same ...

Fourier transform spectrometer and fourier transform spectroscopic method

A Fourier transform spectrometer (Da) of the invention extracts, in generating an integrated interferogram obtained by integrating a plurality of interferograms, an output of an interferometer ( 11 a ) within a predetermined range according to positioning information of a center burst in an interferogram measured at a time before measurement of an interferogram at the present time.

Microelectromechanical system (mems) and (mem) optical interferometer for hyper-spectral imaging and analysis

A microelectromechanical system (MEMS) ( 10 ), and a microelectromechanical (MEM) optical interferometer ( 18 ), for hyper-spectral imaging and analysis. System ( 10 ) includes matrix configured collimating micro lens ( 16 ), for receiving and collimating electromagnetic radiation ( 60 ) emitted by objects ( 12 ) in a scene or sample ( 14 ); microelectromechanical optical interferometer ( 18 ), for forming divided collimated object emission beam ( 72 ) having an optical path difference, and for generating an interference image exiting optical interferometer ( 18 ); matrix configured focusing micro lens ( 20 ); micro detector ( 22 ), for detecting and recording generated interference images; and micro central programming and signal processing unit ( 24 ). Applicable for on-line (e.g., real time or near-real time) or off-line hyper-spectral imaging and analyzing, on a miniaturized or ‘micro’ (sub-centimeter [1 cm (10 mm) or less], or sub-millimeter) scale, essentially any types or kinds of biological, physical, or/and chemical, (i.e., biophysicochemical) objects.

FOURIER TRANSFORM INFRARED SPECTROMETER

A Fourier transform infrared spectrophotometer that is free from an effect of interference condition change resulting from an accessory being mounted and has a high measurement accuracy is provided. A Fourier transform infrared spectrophotometer according to the present invention is a Fourier transform infrared spectrophotometer including a common base on which a sample chamber and an interference optical system are mounted, where an accessory can be detachably in the sample chamber, the Fourier transform infrared spectrophotometer including: accessory information reading means for reading accessory information provided to the accessory when the accessory is mounted in the sample chamber and setting condition changing means (controller ) for changing a setting condition for the interference optical system based on the accessory information read by the accessory information reading means the setting condition varying depending on, e.g., a difference in weight between respective accessories 1. A Fourier transform infrared spectrophotometer including a common base on which a sample chamber and an interference optical system are mounted , where an accessory can be detachably installed in the sample chamber , the Fourier transform infrared spectrophotometer comprising:a) accessory information reading means for reading accessory information provided to the accessory and representing a type of the accessory when the accessory is mounted in the sample chamber; andb) setting condition changing means for changing a setting condition for the interference optical system depending on the accessory based on the accessory information read by the accessory information reading means.2. The Fourier transform infrared spectrophotometer according to claim 1 , wherein the setting condition is a parameter for adjusting a direction of a fixed minor relative to a moving mirror in the interference optical system in which infrared light is divided into two light beams claim 1 , one of the ...

Wavemeter

Method and apparatus for determining the wavelength of a light beam are provided. An input light beam is received, and light from the input light beam is distributed to multiple channels. At a first pair of interferometer cavities that has a first free spectral range, two of the multiple channels of light are received. The intensity of light reflected from the first pair of cavities is measured, and a first estimate of the wavelength or optical frequency of the input light beam is determined based on measurements of interference signals from the first pair of cavities and an initial estimate of the wavelength or optical frequency. At a second pair of cavities that has a second free spectral range smaller than the first free spectral range, another two of the multiple channels of light are received. The intensity of light from the second pair of cavities is measured, and a second estimate of the wavelength or optical frequency of the input light beam is determined based on the first estimate and measurements of interference signals from the second pair of cavities, in which the second estimate is more accurate than the first estimate.

Real Time Birefringent Imaging Spectrometer Based on Differential Structure

A real-time birefringent imaging spectrometer based on differential structure is provided. A polarization beam splitter to add an imaging branch is set. Meanwhile, the structure alters the conventional optical structure to the differential structure by setting another polarization beam splitter. Taking the difference between these two interferogram obtained by two branches of differential structure as the final interferogram and performing the required post-processing calculations produces the spectrum at each pixel. Common-mode error is intensively restrained due to the differential structure, and 50% of the optical loss is avoided because of casting off the analyzer; a high spatial resolution, high spectral resolution image is acquired by combining the high spatial resolution, colorful image with the low spatial resolution, high spectral resolution image.

ANALYSIS TARGET REGION SETTING APPARATUS

Provided is an analysis target region setting apparatus that can accurately set an analysis target region, based on an observation image of a sample obtained with an optical microscope and the like irrespective of texture on the sample surface when the analysis target region is set therein. The analysis target region setting apparatus according to the present invention divides the observation image into a plurality of sub-regions based on pixel information on each pixel constituting the observation image. Subsequently, consolidation information on each sub-region is calculated, and two adjacent sub-regions themselves are consolidated based on the consolidation information. According to this, it is possible to divide the observation image into sub-regions having similar pixel information with a disregard of noise attributed to the shape of a surface and the like. A user designates one sub-region from among the sub-regions finally obtained, as the analysis target region. 1. An analysis target region setting apparatus configured to set an analysis target region that is a region analyzed by an analyzer in an observation region of a sample; comprising:a pixel information acquisition means configured to acquire pixel information on each pixel constituting the observation region;a sub-region forming means configured to classify each pixel in accordance with the pixel information and form one sub-region or plural sub-regions composed of pixels that belong to a same classification and are adjacent to each other;a consolidation information calculating means configured to obtain a characteristic value regarding a part or whole of pixels in each sub-region as consolidation information; anda region consolidating means configured to consolidate the sub-region with one sub-region adjacent to the sub-region based on the consolidation information,wherein the region consolidating means is configured to consolidate two adjacent sub-regions based on the number of pixels in each sub- ...

MIRROR BEARING FOR AN INTERFEROMETER

Aspects of the present disclosure are directed to a mirror bearing for an interferometer. An example mirror bearing includes a stationary mounting member and a mobile mirror assembly configured for slidable movement relative to the mounting member along its longitudinal axis. The mounting member is configured for rigid attachment to an interferometer body. A bore extends through the mounting member along its longitudinal axis. A drive coil receiving area of the mounting member is configured to hold a drive coil coupled thereto. The mobile mirror assembly includes a tube configured to receive, at one end of the tube, an end of the mounting member. The mobile mirror assembly also includes a mirror coupled to the opposite end of the tube. A drive magnet is disposed within the tube and is configured to be received within the bore of the mounting member when the mirror bearing is in an assembled configuration. 1. A mirror bearing for an interferometer , the mirror bearing comprising: a bore extending through the mounting member along a longitudinal axis of the mounting member, and', 'a drive coil receiving area configured to hold, in a fixed position, a drive coil coupled to the mounting member at the drive coil receiving area; and, 'a mounting member configured for rigid coupling to the interferometer at a first end of the mounting member and comprising a tube configured to receive, through a first end of the tube, a second end of the mounting member disposed opposite the first end of the mounting member,', 'a mirror coupled to a second end of the tube opposite the first end of the tube, and', 'a drive magnet disposed within the tube wherein the drive magnet is configured to be received through the second end of the mounting member and disposed within the bore of the mounting member., 'a mobile mirror assembly configured for slidable movement relative to the mounting member along the longitudinal axis and comprising2. The mirror bearing of claim 1 , wherein a first ...

ADAPTATION OF FIELD USE SPECTROSCOPY EQUIPMENT

A spectrometer configurable for field analyses of chemical properties of a material is provided. The spectrometer includes: at least one sensor adapted for providing Fourier transform infrared spectroscopy (FTIR) surveillance and at least another sensor for providing Raman spectroscopy surveillance. The spectrometer can be provided with a user accessible instruction set for modifying a sampling configuration of the spectrometer. A method of determining the most likely composition of a sample by at least two technologies using the spectrometer is also provided. 1. A spectrometer configurable for field analyses of chemical properties of a material , the spectrometer comprising:a hand-held instrument comprising at least one sensor adapted for providing Fourier transform infrared spectroscopy (FTIR) surveillance and at least another sensor for providing Raman spectroscopy surveillance.2. The spectrometer of claim 1 , further including a user accessible instruction set for modifying a sampling configuration of the spectrometer.3. The spectrometer of claim 1 , further including a plurality of user accessible response profiles claim 1 , each response profile providing an instruction set for modifying a sampling configuration of the spectrometer.4. A method of determining the most likely composition of a sample by at least two technologies using a spectrometer claim 1 , the method comprising:a. obtaining data from the sample by a first technology using the spectrometer, wherein the data comprises a first representation of a measured spectrum obtained by the first technology;b. determining a precision state of the first representation of the measured spectrum;c. providing a first set of library candidates and, for each library candidate, providing data representing each library candidate, wherein the data comprises a representation of a library spectrum obtained by the first technology;d. selecting a first subset of library candidates by determining a first representation of ...

PHOTODETECTOR OUTPUT CORRECTION METHOD USED FOR SPECTROSCOPIC ANALYZER

The present invention is adapted to make light beams emitted from a light source enter a photodetector both when interposing an optical element having known characteristics and when not interposing the optical element, and acquire a first output value and a second output value that are the output values of the photodetector with respect to each of light beams that respectively have predetermined multiple wavenumbers and are included in the incident light beams, and obtain an arithmetic expression for calculating intensity of incident light beams from an output value of the photodetector, using parameters that are a ratio between the first output value and the second output value at each of the predetermined wavenumbers and the wavenumber transmission or reflection characteristic of the optical element. 1. A photodetector output correction method used for a spectroscopic analyzer or a spectroscope comprising: a light source , a spectroscopic part that disperses light beams emitted from the light source , and a photodetector for measuring intensity of light beams exiting from the spectroscopic part , wherein the photodetector is adapted such that a relationship between incident light intensity and an output value is substantially linear within a predetermined range , the photodetector output correction method comprising:making the light beams emitted from the light source enter the photodetector interposing an optical element having a known wavenumber transmission characteristic or a known wavenumber reflection characteristic so as to make intensity of the light beams fall within the range, and acquiring a first output value as an output value of the photodetector with respect to each of light beams that have predetermined multiple wavenumbers and are included in the incident light beams;making the light beams emitted from the light source enter the photodetector without interposing the optical element, and acquiring a second output value as an output value of the ...

Photodetection apparatus including optical filter and optical detector

In one aspect, an apparatus includes a first light source that applies first light having a first wavelength as a center wavelength to an object, a second light source that applies second light having a second wavelength as a center wavelength longer than the first wavelength to the object, an optical filter that includes first and second regions and that transmits third light produced by the first and second light each passed through or reflected by the object, first and second optical detectors that determine first and second amounts, respectively, of the third light passed through the first and second regions. The transmission ranges of spectral transmission curves of the first and second regions are located between the first wavelength and the second wavelength. The spectral transmission curve of the first region has a width at half maximum different from that of the spectral transmission curve of the second region.

OPTICAL PARAMETRIC WAVEFORM SYNTHESIZER AND METHOD FOR SYNTHESIZING OPTICAL WAVEFORMS

Parametric optical waveform synthesizer () creating optical waveforms () includes: pump source device (); seed source device (); optical parametric amplifier device () having master channel (A) with at least one optical parametric amplifier unit (A, A), and having at least one slave channel (B, C), with at least one optical parametric amplifier unit (B, B, C, C); beam combiner device (), detector devices (), and control system (), which is configured for orthogonal control of seed source device () and optical parametric amplifier device (). 1. An optical parametric waveform synthesizer being configured for creating optical waveforms , comprisinga pump source device being arranged for creating at least one sequence of pump pulses,a seed source device being arranged for creating a sequence of master seed pulses and at least one sequence of slave seed pulses, (a) a master channel with at least one optical parametric amplifier unit being arranged for creating a sequence of master channel laser pulses by non-linear optical interactions using one of the at least one sequence of pump pulses and the sequence of master seed pulses, and', '(b) at least one slave channel with at least one optical parametric amplifier unit being arranged for creating at least one sequence of slave channel laser pulses by non-linear optical interactions using one of the at least one sequence of pump pulses and the at least one sequence of slave seed pulses, wherein, 'an optical parametric amplifier device having'}the master channel and the at least one slave channel are configured such that the sequence of master channel laser pulses and the at least one sequence of slave channel laser pulses have different spectral intensity characteristics,a beam combiner device being arranged for coherently combining the master channel laser pulses and the slave channel laser pulses, thus synthesizing the optical waveforms to be obtained,detector devices being arranged for sensing a relative arrival time ...

SPECTROMETER AND SPECTRUM MEASUREMENT METHOD UTILIZING SAME

Present invention provides a spectrometer including a first unit spectral filter configured to absorb or reflect light in a part of a wavelength band of a light spectrum of an incident target, a second unit spectral filter configured to absorb or reflect light in a wavelength band different from the part of the wavelength band, a first light detector configured to detect a first light spectrum passing through the first unit spectral filter, a second light detector configured to detect a second light spectrum passing through the second unit spectral filter, and a processing unit configured to perform a function of restoring a light spectrum of the target incident from spectra of light detected from the first light detector and the second light detector. 1. A spectrometer comprising:a first unit spectral filter configured to absorb or reflect light in a part of a wavelength band of a light spectrum of an incident target;a second unit spectral filter configured to absorb or reflect light in a wavelength band different from the part of the wavelength band;a first light detector configured to detect a first light spectrum passing through the first unit spectral filter;a second light detector configured to detect a second light spectrum passing through the second unit spectral filter; anda processing unit configured to perform a function of restoring a light spectrum of the target incident from spectra of light detected from the first light detector and the second light detector.2. The spectrometer of claim 1 , wherein the first unit spectral filter and the second unit spectral filter comprise periodically arranged metal patterns with a predetermined shape3. The spectrometer of claim 2 , wherein the metal patterns of the first unit spectral filter and the metal patterns of the second unit spectral filter have different periods.4. The spectrometer of claim 2 , wherein the first light detector and the second light detector comprise some light detection pixels of a CMOS ...

High-resolution integrated-optics-based spectrometer

A high-resolution single-chip spectrometer is disclosed. Embodiments of the present invention are analogous to Fourier-transform spectrometers; however, embodiments of the present invention have no moving parts. An illustrative embodiment is a spectrometer having a nested plurality of Mach-Zehnder interferometers (MZIs), where all MZIs share at least one surface-waveguide section in each of its sample and reference arms. The light signals in the sample and reference arms are tapped at a series of discrete locations along their length via electro-optically-controlled directional couplers, which are separated by uniform-length waveguide portions in each arm, but where the uniform lengths are different in the sample and reference arms providing a different path-length difference for the arms of each MZI. The tapped light from the sample and reference arms is recombined at a low-loss beam combiner to generate a distribution of optical power as a function of time-delay difference in the arms.

MINIATURIZED FOURIER-TRANSFORM RAMAN SPECTROMETER SYSTEMS AND METHODS

State-of-the-art portable Raman spectrometers use discrete free-space optical components that must be aligned well and that don't tolerate vibrations well. Conversely, the inventive spectrometers are made with monolithic photonic integration to fabricate some or all optical components on one or more planar substrates. Photonic integration enables dense integration of components, eliminates manual alignment and individual component assembly, and yields superior mechanical stability and resistance to shock or vibration. These features make inventive spectrometers especially suitable for use in high-performance portable or wearable sensors. They also yield significant performance advantages, including a large (e.g., 10,000-fold) increase in Raman scattering efficiency resulting from on-chip interaction of the tightly localized optical mode and the analyte and a large enhancement in spectral resolution and sensitivity resulting from the integration of an on-chip Fourier-transform spectrometer. 1. A system , comprising:a light source to emit a probe beam;a probe waveguide, in optical communication with the light source, to receive the probe beam and cause at least a portion of the probe beam to interact with a sample, the interaction between the probe beam and the sample generating a Raman signal;a filter, in optical communication with the sample, to transmit the Raman signal and block the probe beam;a Fourier transform spectrometer, in optical communication with the filter, to generate a sequence of interference patterns representing a spectrum of the Raman signal; anda single-element detector, in optical communication with the Fourier transform spectrometer, to detect each of the interference patterns in the sequence of interference patterns generated by the Fourier transform spectrometer.2. The system of claim 1 , wherein the probe waveguide comprises an optical fiber.3. The system of claim 1 , wherein the probe waveguide is integrated in or on a substrate and ...

Optical module

An optical module includes an actuator that includes a movable part to be moved along a predetermined direction; a first interference optical system that includes a first movable mirror, a first stationary mirror, and a first beam splitter; and a second interference optical system that includes a second movable mirror, a second stationary mirror, and a second beam splitter. The first interference optical system is adapted so that first light reciprocates m times (m is a natural number) between the first beam splitter and the first movable mirror along the predetermined direction. The second interference optical system is adapted so that second light reciprocates n times (n is a natural number greater than m) between the second beam splitter and the second movable mirror along the predetermined direction.

FILTER DEVICE AND MEASURING APPARATUS

A filter device through which a fluid containing a target substance and a coarse substance larger than the target substance is passed to selectively collect the target substance from the fluid. The filter device includes a prefilter that removes the coarse substance and a collection filter that collects the target substance. The prefilter and the collection filter are arranged in series such that the fluid passes through the prefilter and then through the collection filter. The prefilter includes a cavity arrangement structure having a pair of opposing main surfaces and a plurality of cavities extending through both main surfaces. 1. A filter device through which a fluid containing a target substance and a coarse substance larger than the target substance can be passed to selectively collect the target substance from the fluid , the filter device comprising:a prefilter constructed to remove the coarse substance from the fluid; anda collection filter constructed to collect the target substance from the fluid,the prefilter and the collection filter being arranged in series such that the fluid passes through the prefilter and then through the collection filter,the prefilter comprising a cavity arrangement structure having a pair of opposing main surfaces and a plurality of cavities extending through the pair of opposing main surfaces.2. The filter device according to claim 1 , wherein a percentage of an open area of the cavities to an area of each main surface of the prefilter including the cavities is 3% to 80%.3. The filter device according to claim 2 , wherein the cavities have an aspect ratio T/D of less than 3 claim 2 , where T is a thickness of the cavity arrangement structure claim 2 , and D is an opening size of the cavities.4. The filter device according to claim 1 , wherein a percentage of an open area of the cavities to an area of each main surface of the prefilter including the cavities is 10% to 60%.5. The filter device according to claim 4 , wherein the ...

MINIATURIZED FOURIER-TRANSFORM RAMAN SPECTROMETER SYSTEMS AND METHODS

State-of-the-art portable Raman spectrometers use discrete free-space optical components that must be aligned well and that don't tolerate vibrations well. Conversely, the inventive spectrometers are made with monolithic photonic integration to fabricate some or all optical components on one or more planar substrates. Photonic integration enables dense integration of components, eliminates manual alignment and individual component assembly, and yields superior mechanical stability and resistance to shock or vibration. These features make inventive spectrometers especially suitable for use in high-performance portable or wearable sensors. They also yield significant performance advantages, including a large (e.g., 10,000-fold) increase in Raman scattering efficiency resulting from on-chip interaction of the tightly localized optical mode and the analyte and a large enhancement in spectral resolution and sensitivity resulting from the integration of an on-chip Fourier-transform spectrometer. 1. A system , comprising:a light source to emit a probe beam;a probe waveguide, in optical communication with the light source, to receive the probe beam and cause at least a portion of the probe beam to interact with a sample, the interaction between the probe beam and the sample generating a Raman signal;a filter, in optical communication with the sample, to transmit the Raman signal and block the probe beam; a beam splitter to split the Raman signal into a first portion and a second portion;', a first optical switch switchable between a first state and a second state;', {'sub': '1', 'a first reference waveguide having a first optical path length Lto receive the first portion of the Raman signal when the first optical switch is in the first state; and'}, {'sub': 2', '1, 'a first variable waveguide having a second optical path length L, different than the first optical path length L, to receive the first portion of the Raman signal when the first optical switch is in the second ...

Integrated one-piece polarizing interferometer and snapshot spectro-polarimeter applying same

An integrated one-piece polarizing interferometer includes a polarization beam splitter for separating incident complex waves, a first mirror attached to a first surface of the polarization beam splitter, for reflecting a first polarization transmitted through the polarization beam splitter to the polarization beam splitter, and a second mirror attached to a second surface of the polarization beam splitter, for reflecting a second polarization transmitted through the polarization beam splitter to the polarization beam splitter. Accordingly, it is possible to measure dynamic spectroscopic polarization phenomenon with extremely high robustness disturbances due to an external vibration and the like by using the integrated one-piece polarizing interferometer, thereby improving measurement repeatability and accuracy of measurement.

INFRARED MICROSCOPE WITH ADJUSTABLE CONNECTION OPTICAL SYSTEM

An infrared microscope includes an illumination optical system which guides infrared red to an analysis position on a sample; a connection optical system which guides infrared light, supplied from an infrared spectrophotometer, to said illumination optical system; a visible light source unit which outputs visible light to a region including said analysis position on the sample; an image acquisition unit which inputs visible light from the region including said analysis position on the sample to a detection surface and acquires a visible light image; and a detection unit which detects infrared light from said analysis position on the sample. The connection optical system can be positionally adjusted, and said image acquisition unit is capable of acquiring an infrared light image by inputting infrared light to a detection surface. 1. An infrared microscope system , comprising: a connection optical system which guides infrared light, supplied from an infrared spectrophotometer, to said illumination optical system;', 'a visible light source unit which outputs visible light to a region including said analysis position on the sample;', 'an image acquisition unit which inputs visible light from the region including said analysis position on the sample to a detection surface and acquires a visible light image; and', 'a detection unit which detects infrared light from said analysis position on the sample; and, 'an illumination optical system which guides infrared light to an analysis position on a sample;'}the infrared spectrophotometer, whereinsaid connection optical system is configured to be positionally adjusted, andsaid image acquisition unit is configured to acquire an infrared light image by inputting infrared light to a detection surface.2. The infrared microscope system as set forth in claim 1 , wherein said connection optical system comprises a first plane mirror claim 1 , a second plane mirror claim 1 , and an adjustment mechanism which rotationally moves said ...

THz Continuous Wave Thickness Profile Measurements Software Algorithms

A mathematical extended bandwidth algorithm method (MEB) is used for acquiring real-time thickness profile measurements of a multi-layer sample of unknown layer thicknesses each above about 10 μm. A statistical based thickness profile algorithm method (SBTP) is used for acquiring real-time thickness profile measurements of a multi-layer sample of unknown layer thicknesses each above about 1 μm. 1. A mathematical extended bandwidth algorithm method (MEB) for acquiring real-time thickness profile measurements of a multi-layer sample of unknown layer thicknesses each above about 10 μm , comprising the steps of:(a) collecting continuous wave (CW) spectral data of the sample;(b) applying a gain-correction to the CW spectral data to normalize the standing-wave pattern;(c) fitting the gain-corrected spectral data to an a priori mathematical model using best-fit parameters as an initial guess;(d) performing a Fourier transform (FT) the resulting extended bandwidth spectrum from step (c) to a time domain to yield a pulse train; and(e) analyzing the timing differences of the resultant pulse train in step (d) to extract a thickness profile of the sample.2. The MEB method of claim 1 , additionally comprising the step of:(f) repeat steps (c) through (e) using the measurements in step (e) for step (b).3. A statistical based thickness profile algorithm method (SBTP) for acquiring real-time thickness profile measurements of a multi-layer sample of unknown layer thicknesses each above about 1 μm claim 1 , comprising the steps of:(a) compiling a library of noiseless terahertz (THz) spectra for various known thickness profiles (TP);(b) add simulated system noise to a TP spectrum and apply an estimation maximization algorithm to determine which noiseless TP the noisy TP most closely matches;(c) repeat step (b) at least 100 times and create a histogram of the TPs returned by the estimation maximization algorithm. This histogram is the statistical fingerprint for the current TP;(d) ...

ANGLE ADJUSTMENT MECHANISM AND FOURIER TRANSFORM INFRARED SPECTROPHOTOMETER EQUIPPED WITH THE SAME

A typical configuration of the angle adjustment mechanism according to the present invention is provided with a parabolic mirror, a housing accommodating a parabolic mirror, a screw including a head arranged outside the housing and a shaft engaged with the parabolic mirror through a hole formed in the housing, and a base portion in contact with both the housing and the parabolic mirror. A force is applied to an engaging portion of the parabolic mirror in a direction approaching the housing and a force is applied to a portion of the parabolic mirror in contact with the base portion in a direction away from the housing. The angle of the parabolic mirror with respect to the housing changes in accordance with the change in the length of a portion where the shaft and the parabolic mirror engage. 1. An angle adjustment mechanism comprising:a parabolic mirror;a housing in which the parabolic mirror is accommodated;a screw provided with a head arranged outside the housing and a shaft engaged with an engaging portion of the parabolic mirror through a hole formed in the housing; anda base portion which is in contact with both the housing and the parabolic mirror,wherein a force is applied to the engaging portion of the parabolic mirror in a direction approaching the housing and a force is applied to a portion of the parabolic mirror in contact with the base portion in a direction away from the housing, and an angle of the parabolic mirror with respect to the housing changes in accordance with a change in a length of a portion where the shaft and the parabolic mirror engage.2. A Fourier transform infrared spectrophotometer equipped with the angle adjustment mechanism as recited in claim 1 ,wherein the housing accommodates an optical interference system configuring a Fourier transform infrared spectrophotometer and a dehumidification mechanism for dehumidifying an inside of the housing, andwherein the optical interference system includes the parabolic mirror and a beam splitter ...

INTERFEROMETER AND SPECTROMETER INCLUDING SAME

An optical path of measurement light emitted from a measurement light source is overlaid by a beam combiner on an optical path of reference light emitted from a reference light source. The measurement light emitted from the measurement light source includes light in the sensitivity wavelength range (S) of a measurement light detector and light in the sensitivity wavelength range (S) of a reference light detector. An interferometer includes a wavelength separation filter that cuts light in at least a part of the sensitivity wavelength range (S) of the reference light detector, of light included in the wavelength range of the measurement light. 1. An interferometer comprising:a measurement light source that emits measurement light;a measurement light detector that detects the measurement light;a reference light source that emits, as reference light, laser light whose wavelength is shorter than a sensitivity wavelength range of the measurement light detector;a reference light detector that detects the reference light;a beam combiner that overlays an optical path of the measurement light and an optical path of the reference light;a first beam splitter that separates, into two light beams, each of the measurement light and the reference light entering through the beam combiner;a first reflective member that is arranged on an optical path of one of the two light beams separated by the first beam splitter and that reflects and makes each of the measurement light and the reference light enter the first beam splitter again;a second reflective member that is arranged on an optical path of the other of the two light beams separated by the first beam splitter and that reflects and makes each of the measurement light and the reference light enter the first beam splitter again; anda second beam splitter that separates, into two light beams, light which is subjected to interference in the first beam splitter and emitted by the first beam splitter, and that guides the light beams ...

FOURIER TRANSFORM TYPE SPECTROPHOTOMETER

A Fourier transform type spectrophotometer capable of stably controlling a speed of a moving mirror comprises a movable unit to which a moving mirror is fixed, outside-force-applying means configured to apply external force larger than movement resistance of the movable unit to the movable unit, a driving source configured to apply positive or negative driving force along the moving direction of the movable unit to the movable unit, a speed measurement unit configured to measure the speed of the movable unit, and a driving force control unit configured to control the driving force of the driving source so that the movable unit is moved in a predetermined manner based on the, wherein a rate of fluctuation of the driving force is suppressed by operating in a state in which the driving force of the driving source is high due to the external force to thereby stabilize the control. 1. A Fourier transform type spectrophotometer comprising:a) a movable unit to which a moving mirror is fixed;b) outside-force-applying means for always applying external force larger than movement resistance of the movable unit to the movable unit;c) a driving source configured to apply positive or negative driving force along a moving direction of the movable unit to the movable unit;d) a speed measurement unit configured to measure a moving speed of the movable unit; ande) a driving force control unit configured to control the driving force of the driving source so that the movable unit is moved in a predetermined manner based on a moving speed.2. The Fourier transform type spectrophotometer as recited in claim 1 ,wherein gravity is used as the outside-force-applying means.3. The Fourier transform type spectrophotometer as recited in claim 1 ,wherein the outside-force-applying means is an elastic member urging the movable unit.4. A Fourier transform type spectrophotometer claim 1 , comprising:a) a movable unit to which a moving mirror is fixed, the movable unit being movable on a guide;b) ...

Object movement control device and fourier transform infrared spectrophotometer

Feedback control of an object which moves back and forth in a straight line along a linear guide is performed through PID control. A parameter adjustment unit which determines the control parameters to be used for PID control performs feedback control and determines the optimal value of control parameters by means of an evaluation function based on the error between the measured value of the current velocity and the target velocity, for the control parameters of maximum reverse voltage and at least one from among proportional coefficient (C P ), differential coefficient C D ), integral coefficient C I ), and frictional coefficient (C F ).

Linear-Motion Stage

A linear-motion stage that is angularly or radially symmetric or asymmetric, or monolithic may be used as the moving mechanism in a Fourier transform spectrometer. In embodiments, a linear-motion stage includes a base; a first multiple-arm linkage extending from the base to a first carriage attachment piece; and a second multiple-arm linkage extending from the first carriage attachment piece to the base. The first multiple-arm linkage constrains a motion of the first carriage attachment piece to motion in a first plane and the second multiple-arm linkage constrains the first carriage attachment piece to motion in a second plane, the first and second planes intersecting at a plane intersection line. The first and second multiple-arm linkages constrain the motion of the first carriage attachment piece along a carriage motion line. 1. A linear-motion stage comprising:a base;a first multiple-arm linkage extending from the base to a first carriage attachment piece;a second multiple-arm linkage extending from the first carriage attachment piece to the base;wherein:the first multiple-arm linkage constrains a motion of the first carriage attachment piece to motion in a first plane and the second multiple-arm linkage constrains the first carriage attachment piece to motion in a second plane, the first and second planes intersecting at a plane intersection line;the first and second multiple-arm linkages constrain the motion of the first carriage attachment piece along a carriage motion line, the carriage motion line being parallel to the plane intersection line; andthe first and second multiple-arm linkages are arranged angularly asymmetric with respect to a plane transverse to the plane intersection line.2. The linear-motion stage of claim 1 , wherein the first and second multiple-arm linkages are arranged radially asymmetric about the carriage motion line.3. The linear-motion stage of claim 1 , wherein the first carriage attachment piece is fully balanced such that a center ...

Semiconductor substrate measuring apparatus, semiconductor substrate processing apparatus and semiconductor device manufacturing method using the same

A semiconductor substrate processing apparatus includes a transfer chamber disposed between process chambers performing processing of a semiconductor substrate, a transfer robot disposed inside the transfer chamber to load the semiconductor substrate into the process chamber and unload the semiconductor substrate whose processing has been performed in the process chamber, an optical assembly irradiates irradiation light having multiple wavelengths onto the semiconductor substrate, the optical assembly splitting measurement light reflected from a surface of the semiconductor substrate into first and second measurement light and collecting interference light caused by first reflected light and second reflected light, a light detector detecting the interference light and converting the interference light into an electric signal to produce an interference signal, and a controller extracting spectrum information for each wavelength of the measurement light from the interference signal and calculating distribution information of a film formed on the semiconductor substrate.

APPARATUS, SYSTEMS, AND METHODS FOR TALBOT SPECTROMETERS

A non-paraxial Talbot spectrometer includes a transmission grating to receive incident light. The grating period of the transmission grating is comparable to the wavelength of interest so as to allow the Talbot spectrometer to operate outside the paraxial limit. Light transmitted through the transmission grating forms periodic Talbot images. A tilted detector is employed to simultaneously sample the Talbot images at various distances along a direction perpendicular to the grating. Spectral information of the incident light can be calculated by taking Fourier transform of the measured Talbot images or by comparing the measured Talbot images with a library of intensity patterns acquired with light sources having known wavelengths. 1. A spectrometer comprising:a grating to diffract incident radiation so as to form a plurality of Talbot images via the non-paraxial Talbot effect at intervals along a direction perpendicular to the grating, the grating having a grating period d about 1 to about 3 times larger than a wavelength λ of the incident radiation; anda detector array, disposed at an angle with respect to the grating, to detect at least a portion of the plurality of Talbot images.2. The spectrometer of claim 1 , wherein the grating period d is about 0.8 μm to about 4 μm.3. The spectrometer of claim 1 , wherein the detector array has a proximal end and a distal end claim 1 , the proximal end being less than 1 mm away from the grating and the distal end being less than 10 mm away from the grating.4. The spectrometer of claim 1 , wherein the detector array has a projected length at least three times greater than a Talbot length defined by the plurality of Talbot images along the direction perpendicular to the grating.5. The spectrometer of claim 1 , wherein the angle is about 10 degrees to about 40 degrees.6. The spectrometer of claim 1 , further comprising:a processor, operably coupled to the detector, to estimate the wavelength based at least in part on the at least ...

DIFFUSE REFLECTANCE INFRARED FOURIER TRANSFORM SPECTROSCOPY

Diffuse reflectance spectroscopy apparatus for use in analysing a sample comprising a sample receiving location for receiving a sample for analysis; an illumination arrangement for directing light towards a received sample; a detector for detecting light reflected by a received sample; and collection optics for directing light reflected by a received sample towards the detector. The illumination arrangement further comprises an interferometer and a half beam block which is disposed substantially at a focus in the optical path for blocking light which exits the interferometer, passes said focus, and is reflected from re-entering the interferometer. A half beam block may be disposed in the optical path between the interferometer and the light source for blocking light that exits the interferometer back towards the light source and is reflected by the light source from re-entering the interferometer and/or a half beam block may be disposed in the optical path on the opposite side of the interferometer than the light source. 1. Diffuse reflectance spectroscopy apparatus for use in analysing a sample comprising:a sample receiving location for receiving a sample for analysis;an illumination arrangement for directing light from a light source towards a received sample;a detector for detecting light reflected by a received sample; andcollection optics for directing light reflected by a received sample towards the detector, wherein the illumination arrangement comprises an interferometer and a half beam block disposed substantially at a focus in the optical path between the interferometer and the light source for blocking light that exits the interferometer back towards the light source and is reflected by the light source from re-entering the interferometer.2. (canceled)3. (canceled)4. Diffuse reflectance spectroscopy apparatus according to in which the illumination arrangement comprises a second half beam block claim 1 , which is disposed in the optical path on the ...

SYSTEMS AND METHODS FOR IMPLICIT CHEMICAL RESOLUTION OF VACUUM GAS OILS AND FIT QUALITY DETERMINATION

Systems and methods for implicit chemical resolution of vacuum gas oils and fit quality determination are disclosed. The systems and methods include utilizing an FT-IR spectrum of an unknown VGO composition, and a database of FT-IR spectra of known VGO compositions, to determine a model of composition for the unknown VGO composition. Additionally, the fit quality for the model of composition is determined by performing a partial least squares analysis on specific spectral regions of interest in the FT-IR spectrum of the unknown VGO composition. 1. A method for estimating a composition for a vacuum gas oil (VGO) composition , comprising:representing a FT-IR spectrum of a first VGO composition as a first weighted combination of FT-IR spectra from a database of FT-IR spectra;generating a model of composition for the first VGO composition based on the first weighted combination of FT-IR spectra;determining a first partial representation of the FT-IR spectrum of the first VGO composition as a second weighted combination of FT-IR spectra from the database of FT-IR spectra, the first partial representation being determined by partial least squares analysis, wherein the first partial representation corresponds to one or more spectral regions associated with a first compositional class, and wherein the first partial representation comprises a first leverage value and a first residual value;determining a second partial representation of the FT-IR spectrum of the first VGO composition as a third weighted combination of FT-IR spectra from the database of FT-IR spectra, the second partial representation being determined by partial least squares analysis, wherein the second partial representation corresponds to one or more spectral regions associated with a second compositional class, and wherein the second partial representation comprises a second leverage value and a second residual value;calculating a combined leverage value based on at least the first leverage value and the ...

FOURIER TRANSFORM SPECTROSCOPE

A Fourier transform spectroscope having a control interferometer capable of facilitating optical axis adjustment and miniaturization by reducing the number of optical elements. Using a first reflection mirror provided with a reflection surface configured to reflect measurement light emitted from a measurement light source toward a beam splitter and a first through-hole extending along an optical axis direction of the measurement light reflected on the reflection surface and a laser light source holding portion configured to hold a laser light source such that laser light emitted from the laser light source is incident to the beam splitter through the first through-hole, optical axes of the measurement light and the laser light are aligned with each other. 13-. (canceled)4. A Fourier transform spectroscope comprising:a main interferometer provided with a measurement light source, a beam splitter, a movable mirror, and a fixed mirror to generate interference light of measurement light;a laser light source;a control interferometer provided with the beam splitter, the movable mirror, and the fixed mirror to generate laser interference light; a reflection surface configured to reflect measurement light emitted from the measurement light source toward the beam splitter, and', 'a first through-hole extending along an optical axis of the measurement light reflected on the reflection surface;, 'a) a first reflection mirror having'}b) a laser light source holding portion configured to hold the laser light source such that laser light emitted from the laser light source is incident to the beam splitter through the first through-hole; andc) an interferometer chamber having airtightness,wherein the beam splitter, the movable mirror, and the fixed mirror are provided in the interferometer chamber, andthe laser light source is provided outside of the interferometer chamber.5. A Fourier transform spectroscope comprising:a main interferometer provided with a measurement light source ...

DISPERSION MEASURING DEVICE, PULSE LIGHT SOURCE, DISPERSION MEASURING METHOD, AND DISPERSION COMPENSATING METHOD

A dispersion measurement apparatus includes a pulse forming unit, a correlation optical system, a photodetection unit, and an operation unit. The pulse forming unit forms a light pulse train including a plurality of light pulses having time differences and center wavelengths different from each other from a measurement target light pulse output from a pulsed laser light source. The correlation optical system receives the light pulse train output from the pulse forming unit and outputs correlation light including a cross-correlation or an autocorrelation of the light pulse train. The photodetection unit detects a temporal waveform of the correlation light output from the correlation optical system. The operation unit estimates a wavelength dispersion amount of the pulsed laser light source based on a feature value of the temporal waveform of the correlation light. 1: A dispersion measurement apparatus comprising:a pulse forming unit configured to form a light pulse train including a plurality of second light pulses having time differences and center wavelengths different from each other from a first light pulse output from a measurement object;a correlation optical system configured to receive the light pulse train output from the pulse forming unit and output correlation light including a cross-correlation or an autocorrelation of the light pulse train;a photodetector configured to detect a temporal waveform of the correlation light; anda processor configured to estimate a wavelength dispersion amount of the measurement object based on a feature value of the temporal waveform.2: A dispersion measurement apparatus comprising:a pulse forming unit configured to form a light pulse train including a plurality of second light pulses having time differences and center wavelengths different from each other from a first light pulse output from a light source;a correlation optical system configured to receive the light pulse train output from the pulse forming unit and passed ...

Interferometric Device and Corresponding Spectrometer

An interferometric device: includes a separator, for separating a collimated beam (F) into first (F) and second (F) incident beams; at least one transducer; and a transparent optical system, including at least three planar diopters (D D D). The the transducer is based on plasmon resonance and in contact with the diopter (D); the diopter (D) has a network of nanostructures; the optical system and the separator being configured such that the beam (F) and the beam (F) undergo total internal reflection on the diopter (D) and on the diopter (D), respectively, prior to interfering on the diopter (D) by total internal reflection and to forming an interferogram in which the central fringe is located at a convergence point (ZOPD). 111-. (canceled)12. An interferometric device comprising:a splitter configured to split a collimated incident light beam into a first incident beam and a second incident beam;a transparent optical block comprising a set of at least three plane faces, andat least one transducer configured to carry out a transduction based on surface plasmon resonance and in contact with a first face;wherein a second face carries a network of nanostructures at the level of which the first incident beam and the second incident beam are liable to interfere and then to form an interferogram which central fringe is situated at a defined convergence point;the optical block and the splitter being configured so that the first incident beam undergoes at least one total internal reflection on the first face and the second incident beam undergoes at least one total internal reflection on a third face before they interfere on the second face under total internal reflection;the interferometric device further comprising a computer configured to simultaneously compute the spectral distribution of the amplitude and the relative phase of the incident light beam that has interacted with at least one transducer by the first incident beam or by the second incident beam.13. The device ...

Sagnac Fourier Spectrometer (SAFOS)

A technique and device to determine the spectrum of electromagnetic radiation in a certain range of wavelengths comprising: splitting said radiation into more than one beam; let these beams counter-propagate in a Sagnac-type ring interferometer; and imprinting a wavelength-dependent angular tilt onto the wavefront of each beam by at least one dispersive element which preferably is a transmission grating or grism; and re-combining the multiple beams on a detector that exhibits spatial resolution and can therefore resolve the fringes formed by interference; and perform the mathematical operations to determine the spectrum of said radiation from the obtained interferogram, wherein the dispersive element is mounted on a stage providing linear and/or rotational movement.

SPECTRAL MEASUREMENT METHOD, SPECTRAL MEASUREMENT SYSTEM, AND BROADBAND PULSED LIGHT SOURCE UNIT

A new spectral measurement technique is provided which enables measurement even if the light to be measured exists for a very short period. In one embodiment, a broadband pulsed light wave whose wavelength shifts temporally and continuously in a pulse interferes with a light wave to be measured. The intensity at each wavelength of the light wave to be measured is obtained using a Fourier transform of the output signal from a detector that has detected the intensity of the wave resulting from the interference. A laser beam from a laser source is converted to a supercontinuum wave by a nonlinear optical element, and a pulse extension element extends pulses of the supercontinuum wave, thus generating the broadband pulsed light wave. 1. A spectral measurement system , comprisinga broadband pulsed light source unit for emitting broadband pulsed light where each wavelength is in one-to-one correlation with each elapsed time in a pulse as a result of temporal shift of wavelength,an element disposed at a position to interfere a light wave to be measured with a wave of the broadband pulsed light from the broadband light source unit, the light wave to be measured being emitted from an object not irradiated with broadband pulsed light,a detector for detecting the intensity of a wave resultant from the interference by the element, anda processing unit for obtaining the spectral intensity of the light wave to be measured on the basis of an output signal from by the detector.2. The spectral measurement system as claimed in the claim 1 , wherein the broadband pulsed light source unit is capable of emitting the broadband pulsed light where the temporal shift of wavelength is continuous in the pulse.3. The spectral measurement system as claimed in the claim 1 , wherein the broadband pulsed light source unit has a laser source claim 1 , and a nonlinear optical element for causing a nonlinear optical effect on a laser beam from the laser source to emit a supercontinuum as the ...

OPTICAL MEASUREMENT APPARATUS AND RECORDING MEDIUM

An optical measurement apparatus includes: a moving mirror that changes an optical path length of one of two beams generated by splitting light subject to measurement; a drive mechanism that causes the moving mirror to reciprocate a predetermined distance in linear motion; a measured light receiver that detects intensity of light generated by superimposing the two beams; and a computation processor that sets a plurality of measurement ranges within the predetermined distance and calculates a measurement value based on a change in the light intensity detected by the measured light receiver for each of the measurement ranges. 1. An optical measurement apparatus comprising:a moving mirror that changes an optical path length of one of two beams generated by splitting light subject to measurement;a drive mechanism that causes the moving mirror to reciprocate a predetermined distance in linear motion;a measured light receiver that detects intensity of light generated by superimposing the two beams; anda computation processor that sets a plurality of measurement ranges within the predetermined distance and calculates a measurement value based on a change in the light intensity detected by the measured light receiver for each of the measurement ranges.2. The optical measurement apparatus according to claim 1 , whereinthe computation processor sets the number of the measurement ranges based on a setting by an operator.3. The optical measurement apparatus according to claim 1 , whereinthe computation processor sets the plurality of measurement ranges that have different start timings and partially overlap each other.4. A non-transitory computer-readable recording medium recording a control program causing an optical measurement apparatus to execute claim 1 , wherein the optical measurement apparatus comprises: a moving mirror that changes an optical path length of one of two beams generated by splitting light subject to measurement; a drive mechanism that causes the moving ...

TWO-DIMENSIONAL SPECTROSCOPY SYSTEM AND TWO-DIMENSIONAL SPECTROSCOPIC ANALYSIS METHOD

A two-dimensional (2D) spectroscopy system and a 2D spectroscopic analysis method are disclosed. The 2D spectroscopy system includes: a light transmission delayer configured for forming a plurality of first light pulses from first light pulse and causing a relative time delay therebetween; a response pulse wave generator configured for generating a plurality of response pulse waves responds and having a relative time delay, and for irradiating the plurality of response pulse waves on the sample; an optical readout pulse array generator configured for forming an optical readout pulse array by splitting the second light pulse into a plurality of regions having different time delays and spatially discriminated from one another; and a reader configured for reading out by overlapping the optical readout pulse array with a signal generated from the sample. 1. A two-dimensional (2D) spectroscopy system comprising:a pulsed light source;a beam splitter configured to split light pulse provided from the pulsed light source into first light pulse and second light pulse;a light transmission delayer configured to form a plurality of first light pulses from the first light pulse and to cause a first relative time delay with respect to the plurality of first light pulses;a response pulse wave generator configured to generate a plurality of response pulse waves having a wavelength range to which a sample to be analyzed responds and having a second relative time delay by using the plurality of first light pulses sequentially inputted from the light transmission delayer, and to irradiate the plurality of response pulse waves upon the sample;an optical readout pulse array generator configured to form an optical readout pulse array by splitting the second light pulse into a plurality of regions which have different respective time delays and which are spatially discriminated from one another;a reader configured to read out a signal by overlapping the optical readout pulse array with a ...

INTERFEROMETER, SPECTROPHOTOMETER USING INTERFEROMETER AND CONTROL METHOD FOR INTERFEROMETER

The present invention provides an interferometer and the like, that is capable of ensuring the speed stability of the movable mirror while achieving the speed up of the reciprocal movement of the moving mirror and suppressing the increment of the maximum instantaneous thrust force required for the turning back as much as possible. The interferometer includes a moving mirror, a movement mechanism for reciprocating the moving mirror, a movement control part for controlling the movement mechanism and allowing the moving mirror to be reciprocated at a constant speed, and a measurement part for measuring a position of the moving mirror. The movement control part is adapted to receive target position data indicating a target position of the moving mirror, and control the movement mechanism to bring the measurement position of the moving mirror measured by the measurement part close to the target position indicated by the target position data. 1. An interferometer comprising:a moving mirror;a movement mechanism for reciprocating the moving mirror;a movement control part for controlling the movement mechanism and allowing the moving mirror to be reciprocated at a constant speed; anda measurement part for measuring a position of the moving mirror, wherein the movement control part is adapted to receive target position data indicating a target position of the moving mirror and control the movement mechanism so as to bring the measurement position of the moving mirror measured by the measurement part close to the target position indicated by the target position data, and wherein a time-varying waveform of the target position indicated by the target position data is formed into a trapezoidal waveform by horizontally cutting apex portions of the triangular waveform, or is further formed into a smooth wave by rounding away the corner points of the trapezoidal waveform.2. The interferometer according to claim 1 , wherein the movement control part includes a target position data ...

APPARATUS AND TECHNIQUES FOR FOURIER TRANSFORM MILLIMETER-WAVE SPECTROSCOPY

Examples herein include apparatus and techniques that can be used to perform rotational spectroscopy on gas-phase samples. Such techniques can include using a spectrometer providing frequency synthesis and pulse modulation to provide excitation (e.g., pump or probe pulses) of a gas-phase sample at mm-wave frequencies. Synthesis of such mm-wave frequencies can include use of a frequency multiplier, such as an active multiplier chain (AMC). A free induction decay (FID) elicited by the excitation or other time-domain information can be obtained from the sample, such as down-converted and digitized. A frequency domain representation of the digitized information, such as a Fourier transformed representation, can be used to provide a rotational spectrum. 1. A method , comprising:exciting a gaseous sample using a first pulsed excitation and a second pulsed excitation each including energy in a mm-wave range of frequencies, the first pulsed excitation and the second pulsed excitation spaced apart in time by a specified duration that is varied between respective measurement cycles, and the first and second pulsed excitations generated at least in part using a frequency multiplier to provide the mm-wave range of frequencies;obtaining respective time-domain representations elicited from the gaseous sample in response to the first and second pulsed excitations corresponding to the respective measurement cycles;determining a collisional relaxation time constant using the respective time-domain representations of the response; andestimating a molecular mass of a species included in the gaseous sample at least in part using the determined collisional relaxation time constant.2. The method of claim 1 , wherein the estimating the molecular mass of the species included in the gaseous sample does not require foreknowledge of the molecular carrier.3. The method of claim 1 , wherein frequencies of the first and second excitations are different.4. The method of claim 1 , wherein the ...

Monolithic Assembly of Reflective Spatial Heterodyne Spectrometer

Novel monolithic cyclical reflective spatial heterodyne spectrometers (CRSHS) are presented. Monolithic CRSHS in accordance with the invention have a single frame wherein a flat mirror, roof mirror, and symmetric grating are affixed. The invention contains only fixed parts; the flat mirror, roof mirror, and symmetric grating do not move in relation to the frame. Compared to conventional CRSHS known in the art, the present invention enables much smaller and lighter CRSHS, requires less time and skill for maintenance, and is a better economic option. The disclosed invention may include fixed field-widening optical elements or a fiber-fed assembly.

SPECTROMETER AND METHOD OF SPECTROSCOPY

A spectrometer includes a beam splitter that receives incident light rays and splits each of the incident light rays into first and second spatially displaced, linearly polarized light rays that respectively have first and second polarization directions orthogonal to each other; an optical member that receives the split incident light rays from the beam splitter and optically converts the split incident light rays into a plurality of light beams that are respectively guided to mutually differing locations so as to generate interference fringes in the respective locations, each of the plurality of light beams including a component of the first linearly polarized light rays and a component of the second linearly polarized light rays; and a detector that detects the interference fringes respectively generated by the plurality of light beams. 1. A spectrometer , comprising:a beam splitter that receives incident light rays and splits each of the incident light rays into first and second spatially displaced, linearly polarized light rays that respectively have first and second polarization directions orthogonal to each other;an optical member that receives said split incident light rays from the beam splitter and optically converts said split incident light rays into a plurality of light beams that are respectively guided to mutually differing locations so as to generate interference fringes in the respective locations, each of the plurality of light beams including a component of the first linearly polarized light rays and a component of the second linearly polarized light rays; anda detector that detects the interference fringes respectively generated by the plurality of light beams.2. The spectrometer according to claim 1 ,wherein the optical member is a plurality of lenses each having a focal point, andwherein the plurality of light beams respectively exit from mutually differing lenses of the plurality of lenses.3. The spectrometer according to claim 1 , a first lens ...

Fourier Transform Infrared Spectrophotometer

A Fourier transform infrared spectrophotometer includes a main interferometer, a control interferometer, an infrared detector, a control light detector, a waveplate, and a support member. The waveplate is disposed on an optical path of a control light beam and between a fixed mirror or a moving mirror and a beam splitter. The support member supports the waveplate. An outer perimeter of the waveplate includes a supported region supported by the support member and a released region spaced apart from the support member. 1. A Fourier transform infrared spectrophotometer comprising:a main interferometer including an infrared light source that emits an infrared light beam, a beam splitter, a fixed mirror, and a moving mirror;a control interferometer including a control light source that emits a control light beam, the beam splitter, the fixed mirror, and the moving mirror;an infrared detector that detects an infrared interference light beam that is generated by the main interferometer and passes through a sample or is reflected by the sample;a control light detector that detects a control interference light beam generated by the control interferometer;a waveplate disposed on an optical path of the control light beam and between the fixed mirror or the moving mirror and the beam splitter; anda support member that supports the waveplate, a supported region supported by the support member, and', 'a released region spaced apart from the support member., 'wherein an outer perimeter of the waveplate includes'}2. The Fourier transform infrared spectrophotometer according to claim 1 , wherein the released region of the outer perimeter of the waveplate is not less than a third of a length of the outer perimeter of the waveplate.3. The Fourier transform infrared spectrophotometer according to claim 1 , wherein the support member supports only one side of the outer perimeter of the waveplate.4. The Fourier transform infrared spectrophotometer according to claim 1 , further ...

Mirror unit and optical module

A mirror unit 2 includes a mirror device 20 including a base 21 and a movable mirror 22, an optical function member 13, and a fixed mirror 16 that is disposed on a side opposite to the mirror device 20 with respect to the optical function member 13. The optical function member 13 is provided with a light transmitting portion 14 that constitutes a part of an optical path between the beam splitter unit 3 and the fixed mirror 16. The light transmitting portion 14 is a portion that corrects an optical path difference that occurs between an optical path between the beam splitter unit 3 and the movable mirror 22 and the optical path between the beam splitter unit 3 and the fixed mirror 16. The second surface 21b of the base 21 and the third surface 13a of the optical function member 13 are joined to each other.

COMB RESOLVED FOURIER TRANSFORM SPECTROSCOPY

Systems and methods for high resolution and high sensitivity spectroscopy are disclosed. High resolution can be obtained in conjunction with comb sources via comb resolved spectroscopy. For example, Fourier transform spectroscopy with a scan range larger than a cavity round trip time of the comb sources can be used to obtain comb resolution, where it may be useful to match the comb lines of the source with the sampling points of the Fourier transform spectrometer. High sensitivity can be obtained using multiple passes through a gas cell, cavity enhanced spectroscopy, cavity ring-down spectroscopy, or photo-acoustic spectroscopy. Fiber or solid-state lasers as well as semiconductor or quantum cascade based lasers can be used as comb injection sources. These sources can also be combined with nonlinear frequency broadening techniques via supercontinuum generation, DFG, OPOs or OPAs. 1) An optical spectroscopy system for the detection of comb resolved spectra comprising:a comb source comprising individual comb lines with a comb spacing Δf; anda Fourier transform spectrometer with a scan range such that c/Δf less than approximately the scan range,where c is the velocity of light and where spectral sampling points of said Fourier transform spectrometer are selected to match at least some of the individual comb lines of said comb source.2) An optical spectroscopy system for the detection of comb resolved spectra comprising:a comb source comprising individual comb lines with a comb spacing Δf;a scanning Fourier transform spectrometer with a scan range greater than approximately c/Δf; anda photo-acoustic gas cell or photo-acoustic detection system. The present application claims the benefit of priority to U.S. Provisional Patent Application No. 62/086,417, filed Dec. 2, 2014, titled “COMB RESOLVED FOURIER TRANSFORM SPECTROSCOPY,” which is hereby incorporated by reference herein in its entirety.The present disclosure relates to high resolution Fourier Transform Spectroscopy. ...

OPTICAL LOCKER

There is described an interferometer for use in an optical locker. The interferometer comprises at least two transparent materials having different thermal path length sensitivities. The interferometer is configured such that an input beam is split by the interferometer into first and second intermediate beams, which recombine to form an output beam, the first and second intermediate beams travelling along respective first and second intermediate beam paths which do not overlap. At least one of the intermediate beam paths passes through at least two of the transparent materials. A length of each intermediate beam path which passes through each transparent material is selected such that an optical path difference between the first and second intermediate beam path is substantially independent of temperature. 1. An interferometer for use in an optical locker , the interferometer comprising at least two transparent materials having different thermal path length sensitivities , wherein:the interferometer is configured such that an input beam is split by the interferometer into first and second intermediate beams, which recombine to form an output beam, the first and second intermediate beams travelling along respective first and second intermediate beam paths which do not overlap;at least one of the intermediate beam paths passes through at least two of the transparent materials;and a length of each intermediate beam path which passes through each transparent material is selected such that an optical path difference between the first and second intermediate beam path is substantially independent of temperature.3. An interferometer according to claim 1 , wherein the variation of the optical path difference with temperature is less than 0.5 GHz/° C.4. An interferometer according to any preceding claim claim 1 , wherein the interferometer is one of a Michelson interferometer or a Mach-Zehnder interferometer.5. A Michelson interferometer for use in an optical locker claim 1 ...

HOUSING SYSTEM FOR MICHELSON INTERFEROMETER

The present invention relates to a housing of a Michelson interferometer that may facilitate optical alignment of a plurality of optical components by applying a two-part structured housing to the Michelson interferometer. The present invention may provide a Michelson interferometer housing system including a first housing including a first surface on which a fixed mirror is installed, a second surface perpendicular to the first surface, and a first diagonal surface on which a beam splitter assembly to which light is incident from the outside is installed, the first diagonal surface being formed at 45 degrees with respect to the second surface; and a second housing including a third surface on which a movable mirror is installed, a fourth surface perpendicular to the third surface, and a second diagonal surface corresponding to the first diagonal surface, wherein the first and second housings are combined such that the first and second diagonal surfaces face each other to allow the light entering from the outside to be divided through the beam splitter assembly and incident to the fixed mirror and the movable mirror. 1. A Michelson interferometer housing system comprising:a first housing including a first surface on which a fixed mirror is installed, a second surface perpendicular to the first surface, and a first diagonal surface on which a beam splitter assembly to which light is incident from the outside is installed, the first diagonal surface being formed at 45 degrees with respect to the second surface; anda second housing including a third surface on which a movable mirror is installed, a fourth surface perpendicular to the third surface, and a second diagonal surface corresponding to the first diagonal surface, whereinthe first and second housings are combined such that the first and second diagonal surfaces face each other to allow the light entering from the outside to be divided through the beam splitter assembly and incident to the fixed mirror and the ...

Fourier-transform hyperspectral imaging system

A Fourier-transform hyperspectral imaging system may include an optical imaging system configured to produce an image of an object, and an adjustable birefringent common-path interferometer module comprising a movable birefringent element and configured to produce interfering replicas of an input radiation which are delayed from each other by a phase delay adjustable by the moving birefringent element. The interferometer module may be configured to produce collinear replicas for entering optical rays parallel to said optical axis. The hyperspectral imaging system further comprises a two-dimensional light detector configured to receive the replicas and provide digital images of the object depending on said adjustable phase delay. The system also includes an analysis device configured to perform a Fourier Transform of the digital images to obtain a hyperspectral representation of the object.

OPTICAL CYTOMETRY

The present invention provides optical systems and methods for determining a characteristic of a cell, such as cell type, cellular response to a biochemical event, biological state and the like. The methods typically involve using interferometry to observe membrane properties in a cell and then use this information to determine one or more characteristics of a cell. The methods of the invention are useful for applications such as drug screening as well as diagnostic techniques. 110-. (canceled)11: A method for observing changes in mammalian cell mass using an interference microscope , the method comprising:(a) placing a mammalian cell in an observation chamber of the interference microscope, wherein the observation chamber is adapted to form aqueous environments;(b) using phase shifting interferometry to observe phase images of the mammalian cell in a first environment;(c) altering the first environment to form a second environment;(d) using phase shifting interferometry to observe phase images of the mammalian cell in the second environment;(e) comparing the phase images observed in (b) with the phase images observed in (d) so as to observe changes in the cell mass of the mammalian cell,so that changes in mammalian cell mass are observed.12: A system for obtaining an image of a cell comprising:(a) microscope capable of measuring a feature of interest in a sample;(b) a detector operatively coupled to the microscope;(c) a sample assembly comprising an observation chamber adapted to contain the cell;(d) a reference assembly comprising:a first optical window;a first housing element adapted to hold the first optical window;a second optical window;a second housing element adapted to hold the second optical window; anda plurality of spacer elements disposable between the first optical window and the second optical window and adapted to separate the first and second optical windows to a defined distance.13: The system of claim 12 , wherein the system further comprises at ...

ROTARY FOURIER TRANSFORM INTERFEROMETER SPECTROMETER INCLUDING A MULTI-FACETED OPTICAL ELEMENT

This disclosure provides an optical interferometer including a multi-faceted optical element that is rotated to introduce an optical path length difference between two different optical paths in the interferometer. The multi-faceted optical element can be configured to be rotated about an axis such that the optical path length difference between the first and second optical paths varies between a first value and a second value several times during one complete rotation of the optical element. The multi-faceted optical element can be rotationally symmetric having n-fold rotational symmetry. The two different optical paths can be non-coplanar with respect to each other and the multi-faceted optical element can be disposed in one of the optical paths or both the optical paths. 1. An optical interferometric device comprising:a first optical path comprising a first reflector;a second optical path comprising a second reflector; anda multi-faceted optical element disposed in the first optical path, the multi-faceted optical element configured to be rotatable about a rotational axis and including a top surface, a bottom surface and a plurality of facets between the top and the bottom, the facets including a plurality of edges, each edge having a spatial extent,wherein the multi-faceted optical element has a refractive index characteristic such that an optical path length difference is introduced between electromagnetic radiation propagating along the first optical path and electromagnetic radiation propagating along the second optical path, the optical path length difference increasing from a first value to a second value greater than the first value, andwherein the number of the facets of the multi-faceted optical element is n such that the optical path length difference increases from the first value to the second value at least n times during one rotation of the multi-faceted optical element.235.-. (canceled) This application is a continuation of U.S. application Ser. No ...

FOURIER TRANSFORM SPECTROPHOTOMETER

In an infrared spectrophotometer, a plurality of rolling elements are provided between a movable portion and the holding portion. While no external force is applied from a spring, a play space is generated between the movable portion, the holding portion, and each rolling element. In the infrared spectrophotometer, when the movable mirror and the movable portion are slid, an external force directed downward is applied to the movable portion by the spring, thereby preventing each rolling element from moving between the movable portion and the holding portion. Accordingly, when the movable mirror and the movable portion are slid, it is possible to suppress rattling of the movable portion and the holding portion while leaving a fine gap between the movable portion, the holding portion, and each rolling element. This makes it possible to easily control the moving speeds of the movable mirror and the movable portion and to suppress rattling of the movable mirror and the movable portion. 1. A Fourier transform spectrophotometer comprising:a movable portion to which a movable mirror is attached;a holding portion configured to slidably hold the movable portion;a rolling element provided between the movable portion and the holding portion so as to have a play space with respect to the movable portion and the holding portion while no external force is applied, the rolling element being configured to roll when the movable portion slides with respect to the holding portion; andan external force applying portion configured to prevent the rolling element from moving between the movable portion and the holding portion by applying an external force to at least one of the movable portion and the holding portion in a direction intersecting with a sliding direction of the movable portion.2. The Fourier transform spectrophotometer according to claim 1 , whereinthe movable portion is slidable from a standby position along the sliding direction, andthe external force applying portion ...

INFRARED SPECTROPHOTOMETER AND METHOD OF STORING WINDOW MEMBER

A housing has a partition wall constituting a wall surface of a sample chamber, and an interferometer chamber accommodating an optical component is formed on an opposite side to the sample chamber with respect to the partition wall. A window member is attachable to and detachable from an opening formed in the partition wall, and transmits light between the sample chamber and the interferometer chamber. The lid member is attachable to and detachable from the window member, and internally has a moisture absorbent accommodating space for accommodating a moisture absorbent. The lid member engages with the window member attached to the opening from a side of the sample chamber, so that the side of the sample chamber of the window member is covered with the lid member, and the moisture absorbent accommodating space is set in a substantially airtight state. 1. An infrared spectrophotometer that irradiates a sample in a sample chamber with infrared light and detects light from the sample with a detector , the infrared spectrophotometer comprising:a housing having a partition wall constituting a wall surface of the sample chamber, with an interferometer chamber in which an optical component is disposed being formed on an opposite side to the sample chamber with respect to the partition wall;a window member that is attachable to and detachable from an opening formed in the partition wall and transmits light between the sample chamber and the interferometer chamber; anda lid member attachable to and detachable from the window member and having a space formed internally,wherein the lid member engages with the window member attached to the opening from a side of the sample chamber so that the side of the sample chamber of the window member is covered with the lid member to set the space in a substantially airtight state.2. The infrared spectrophotometer according to claim 1 , wherein the space is a moisture absorbent accommodating space for storing a moisture absorbent.3. The ...

PHOTO-THERMAL INTERFEROMETER

A photo-thermal interferometer for measuring the light absorption of an aerosol or gas comprises a first laser source emitting a laser beam and a beam splitter adapted to divide the laser beam into a probe beam and a reference beam. The interferometer further comprises first optical elements which are adapted to direct the probe beam such that it passes through the aerosol and interferes with the reference beam thereafter thereby causing interference patterns. A detector detects the interference patterns. The interferometer further comprises a second laser source configured to emit a pump beam for transferring energy to the aerosol. Second optical elements are adapted to direct the pump beam such that it overlaps with the probe beam at least partially in the aerosol or gas. At least one of the second optical elements modifying the pump beam is an axicon. 1. A photo-thermal interferometer for measuring the light absorption of an aerosol or gas , comprisinga first laser source emitting a laser beam,a beam splitter adapted to divide the laser beam into a probe beam and a reference beam,at least one first optical element which is adapted to direct the probe beam such that it passes through the aerosol or gas and interferes with the reference beam thereafter thereby causing interference patterns,a detector for detecting the interference patterns,a second laser source configured to emit a pump beam for transferring energy to the aerosol or gas andsecond optical elements adapted to direct the pump beam such that it overlaps with the probe beam at least partially in the aerosol or gas,characterized in that at least one of the second optical elements modifying the pump beam is an axicon.2. A photo-thermal interferometer according to claim 1 , characterized in that the axicon is arranged to modify the pump beam such that it is imaged into a longitudinally extended focal line on an optical axis of the axicon and claim 1 , that the axicon is positioned such that the pump beam ...

TERAHERTZ TIME-DOMAIN SPECTROSCOPIC ELLIPSOMETRY SYSTEM

A terahertz time-domain spectroscopic ellipsometry system includes a sample stage, a terahertz emitter configured to provide pulses of terahertz radiation with preselected polarization components to illuminate a sample on the sample stage along an incident direction, and a coherent terahertz detection system arranged to coherently detect pulses of terahertz radiation from the terahertz emitter along an emerging direction after at least one of reflecting from or passing through the sample. The sample stage is rotatable to vary a relative angle between the incident direction and the emerging direction, and the coherent terahertz detection system substantially maintains alignment for amplitude and polarization detection as the relative angle is varied. 1. A terahertz time-domain spectroscopic ellipsometry system , comprising:a sample stage;a terahertz emitter configured to provide pulses of terahertz radiation with preselected polarization components to illuminate a sample on said sample stage along an incident direction; anda coherent terahertz detection system arranged to coherently detect pulses of terahertz radiation from said terahertz emitter along an emerging direction after at least one of reflecting from or passing through said sample,wherein said sample stage is rotatable to vary a relative angle between said incident direction and said emerging direction, andwherein said coherent terahertz detection system substantially maintains alignment for amplitude and polarization detection as said relative angle is varied.2. A terahertz time-domain spectroscopic ellipsometry system according to claim 1 , wherein said coherent terahertz detection system comprises a terahertz detector.3. A terahertz time-domain spectroscopic ellipsometry system according to claim 2 , wherein said terahertz emitter and said terahertz detector are substantially identical photoconductive dipole antennas.4. A terahertz time-domain spectroscopic ellipsometry system according to claim 2 , ...

INTERFERENCE SPECTROPHOTOMETER

An interference spectrophotometer including a movable mirror unit having a movable mirror capable of reciprocating movement; a stationary mirror; an infrared light source unit which emits an infrared light; a beam splitter; an interference light detection unit which detects light intensity information of light transmitted or reflected by a sample; a movable mirror velocity information detection unit which detects movable mirror velocity information for movable mirror; and a control unit which acquires the light intensity information and movable mirror velocity information and computes the absorption or transmission spectrum of the sample; wherein the interference spectrophotometer further comprises a storage unit which stores a target movable mirror velocity range, and control unit does not employ light intensity information obtained when the movable mirror velocity of movable mirror was outside the target movable mirror velocity range for computing the absorption or transmission spectrum of the sample. 1. An interference spectrophotometer comprising:a movable mirror unit having a movable mirror capable of reciprocating movement;a stationary mirror;an infrared light source unit which emits an infrared light;a beam splitter which receives infrared light from said infrared light source unit, splits it into two toward said fixed mirror and movable mirror, receives the infrared light which is reflected back from said stationary mirror and the infrared light which is reflected back from the movable mirror, and combines them into interference light;an interference light detection unit in which a sample is placed and which detects light intensity information of interference light transmitted or reflected by said sample;a movable mirror velocity information detection unit which detects movable mirror velocity information for said movable mirror; anda control unit which acquires said light intensity information and movable mirror velocity information and computes the ...

Spectral-domain interferometric method and system for characterizing terahertz radiation

A method and system based on spectral domain interferometry for detecting intense THz electric field, allowing the use of thick crystal for spectroscopic purposes, in order to makes long temporal scans for increased spectral resolutions, and overcoming the limitation of over-rotation for presently available high power THz sources. Using this method and system the phase difference of approximately 8898π can be measured, which is 18000 times higher than the phase difference measured by electro-optic sampling (π/2).

DUAL SPECTROSCOPIC SYSTEM AND METHOD FOR GAS SAMPLE ANALYSIS

A system. The system includes a first beam path configured to transmit a first light beam having a first optical wavelength and a second beam path configured to transmit a second light beam having a second optical wavelength distinct from the first optical wavelength. A first beam splitter disposed at an intersection of the first beam path and the second beam path. The first beam splitter is configured to superimpose the first and second light beams to form a third light beam, the third light beam impinging on a first window of a sample cell. The sample cell defines an interior volume and is configured to transfer the third light beam from the first window to a second window along a light path within the interior volume. The light path comprises a plurality of segments. The third light beam undergoes at least one reflection at an end of each segment, wherein the light path passes through a gas sample disposed within the interior volume. 1. A system comprising:a first beam path configured to transmit a first light beam having a first optical wavelength,a second beam path configured to transmit a second light beam having a second optical wavelength distinct from the first optical wavelength; the third light beam undergoes at least one reflection at an end of each segment; and', 'the light path passes through a gas sample disposed within the interior volume., 'the sample cell defines an interior volume and is configured to transfer the third light beam from the first window to a second window along a light path within the interior volume, the light path comprising a plurality of segments; wherein, 'a first beam splitter disposed at an intersection of the first beam path and the second beam path, wherein, the first beam splitter is configured to superimpose the first and second light beams to form a third light beam, the third light beam impinging on a first window of a sample cell; wherein2. The system of wherein the gas sample comprises a flare vent gas sample.3. The ...

Flexure Mechanisms

A flexure mechanism may be constructed by joining a first, second, and third material together, wherein the first and second materials are non-flexure materials and the third material is a flexure material that does not have a flexure motion-defining feature. Then, after the joining step, forming a flexure-motion defining feature into the third material. Each of the components of flexure mechanism may first be machined individually and the components may then be joined or assembled in any order. Significant tolerance stack-up may occur during the individual machining operations and joining assembly of the individual components. However, these tolerance issues, miss-alignments or other flaws in the overall assembly may be eliminated in the forming of the flexure-motion defining features as part of flexure mechanism.

FOURIER TRANSFORM SPECTROSCOPY METHOD, SPECTROSCOPIC DEVICE, AND SPECTROSCOPIC MEASUREMENT PROGRAM THAT IMPROVE SPECTRAL RESOLUTION AND SPECTRAL ACCURACY

Provided is a Fourier transform spectroscopy method that removes restrictions on spectral resolution and spectral accuracy in Fourier transform spectroscopy for observing a cyclic repeating phenomenon, that realizes, theoretically, infinitesimal spectral resolution accuracy. After accurately and sufficiently stabilizing the repetition period of a phenomenon, a temporal waveform is acquired by making a repetition period and a time width for observing the temporal waveform of a phenomenon strictly conform, and by performing a Fourier transform, acquired is a discrete separation spectrum in which the inverse number of the observation time window size T is made a frequency data gap. Measurement is repeated while causing the repetition period to change, and the gap of the discrete separation spectrum is supplemented. Thereby, in a case of an observation target in which the existence time of a phenomenon is longer than the repetition period, the spectral resolution of the obtained discrete separation spectrum becomes infinitesimal. 114-. (canceled)15. A Fourier transform spectroscopy method including a Fourier transform frequency analysis method , for observing a periodical and repetitive phenomenon , the method comprising:acquiring a temporal waveform by matching a repetition period of a phenomenon with an observation time window size T for observing a temporal waveform of a phenomenon;obtaining a discrete distribution spectrum with a frequency interval equal to a reciprocal of said observation time window size T, by a Fourier transform of an acquired time waveform; and{'sub': n', 'n, 'holding the formula f=n/T true for each plot of said discrete distribution spectrum, with fas a frequency of each plot and integer n as an order of plot;'}wherein the temporal waveform is acquired by observing a phenomenon within a time window size shorter than said repetition period, introducing null data for the acquired temporal waveform data to be matched to the repetition period and ...

HIGH-SPEED FOURIER-TRANSFORM SPECTROSCOPY APPARATUS AND SPECTROSCOPY METHOD

In a Fourier-transform spectroscopy apparatus, a scanning mirror is arranged on a light path of scanning light. The scanning mirror delays or advances the scanning light with respect to reference light according to the rotational angle of the scanning mirror from its initial position. A spectroscopic spectrum generating unit generates an interferogram based on the intensity of the detection target light obtained from the detection target, and Fourier transforms the interferogram thus generated. The spectroscopic spectrum generating unit corrects the nonlinearity of the group delay between an envelope of the reference light and an envelope of the scanning light, and corrects the nonlinearity of the phase shift between the respective envelopes. 1. A Fourier-transform spectroscopy apparatus comprising:an interferometer comprising a beam splitter structured to split light emitted from a light source into reference light and scanning light, a first arm structured to reflect the reference light by a first mirror such that it is re-input to the beam splitter, and a second arm structured to reflect the scanning light by a second mirror such that it is re-input to the beam splitter, wherein the interferometer is structured to combine the reference light and the scanning light re-input to the beam splitter so as to generate an interference wave; anda spectroscopic spectrum generating unit structured to generate an interferogram based on an intensity of detection light obtained from a detection target after either light emitted from the light source or the interference wave thus combined is irradiated to the detection target, and to apply a Fourier transform to the interferogram,wherein the second arm is configured such that a scanning mirror is arranged on a light path of the scanning light between the beam splitter and the second mirror so as to delay or advance the scanning light with respect to the reference light according to a rotational angle of the scanning mirror,and ...

Method for manufacturing optical interferometer

A method of manufacturing an optical interferometer includes a first step of forming a first semiconductor portion for a beam splitter and a second semiconductor portion for a movable mirror on a main surface of a support substrate and a first insulating layer formed on the main surface, a second step of disposing a first wall portion between a first side surface of the first semiconductor portion and a second side surface in the second semiconductor portion, and a third step of forming a mirror surface in the second semiconductor portion by forming a first metal film on the second side surface using a shadow mask. In the third step, the first side surface is masked by the mask portion and the first wall portion and the first metal film is formed in a state in which the second side portion is exposed from an opening portion.

OPTICAL INTERFEROMETER

An optical interferometer includes a branching-combining unit, a first optical system, a second optical system, and a drive unit, which can be MEMS-based components. The branching-combining unit includes a branching surface, an incident surface, an output surface, and a combining surface on an interface between the interior and the exterior of a transparent member. The branching-combining unit, on the branching surface, partially reflects incident light and outputs as first branched light, and transmits the rest of the incident light into the interior as second branched light. The branching-combining unit, on the combining surface, outputs the first branched light to the outside, reflects the second branched light, and combines the light beams to be output to the outside as combined light. 1. An optical interferometer comprising a branching-combining unit; a first optical system; a second optical system; and a drive unit , which are MEMS-based components , whereinthe branching-combining unit includes a branching surface, an incident surface, an output surface, and a combining surface on an interface between the interior and the exterior of a transparent member,the branching surface and the combining surface are provided separately,the branching surface partially reflects incident light entering from the outside and outputs as first branched light, and transmits the rest of the incident light into the interior as second branched light,the incident surface transmits the first branched light entering from the branching surface via the first optical system into the interior,the output surface outputs the second branched light reaching from the branching surface through the interior to the outside,the combining surface outputs the first branched light reaching from the incident surface through the interior to the outside, reflects the second branched light entering from the output surface via the second optical system, and combines the first branched light and the second ...

Configurable combination spectrometer and polarizer

A multimode configurable imaging spectropolarimeter in which the polarimetry function can be activated and deactivated on demand.

METHOD FOR SETTING ANALYSIS TARGET REGION BY EXTRACTING, FROM AN OBSERVED IMAGE DIVISIONAL AREAS HAVING A VALUE OF IMAGE CHARACTERISTIC QUANTITY WITHIN A VALUE RANGE

A method for setting, within an observed image of a sample, an analysis target region that is a region on which an analysis is to be performed by an analyzer, the method including displaying the observed image of the sample on the display, dividing the observed image into a plurality of divisional areas, calculating a predetermined image characteristic quantity in each of the plurality of divisional areas, designating at least two of the divisional areas of the observed image displayed on the display, calculating a distribution of the values of the image characteristic quantity of the designated divisional areas, determining a value range of the image characteristic quantity for the divisional areas to be extracted as the analysis target region, based on the calculated distribution, and extracting from the observed image each of the plurality of divisional areas having a value of the image characteristic quantity within the value range. 1. A method for setting , within an observed image of a sample , an analysis target region that is a region on which an analysis is to be performed by an analyzer , the method including the steps of:displaying the observed image of the sample on the display;dividing the observed image into a plurality of divisional areascalculating a predetermined image characteristic quantity in each divisional area of the plurality of divisional areas;designating at least two of the divisional areas of the observed image displayed on the display;calculating a distribution of the values of the image characteristic quantity of the designated divisional areasdetermining a value range of the image characteristic quantity for the divisional areas to be extracted as the analysis target region, based on the calculated distribution;extracting from the observed image each divisional area of the plurality of divisional areas having a value of the image characteristic quantity within the value range; anddisplaying the observed image on the display with the ...

DEVICE AND METHOD FOR CHARACTERIZATION OF A LIGHT BEAM

A method for characterizing a light beam includes separating the light beam by a separator optic into first and second sub-beams; propagating the first and second sub-beams over first and second optics, respectively, said first and second optics being respectively arranged so that the sub-beams on leaving the optics are separated by a time delay τ; recombining the sub-beams so that they spatially interfere and form a two-dimensional interference pattern; measuring the frequency spectrum of at least part of the interference pattern; calculating the Fourier transform in the time domain of at least one spatial point of the frequency spectrum, the Fourier transform in the time domain having a time central peak and first and second time side peaks; calculating the Fourier transform in the frequency domain for one of the side peaks; calculating the spectral amplitude A(ω) and the spatial-spectral phase φ(x,y,ω) for the Fourier transform in the frequency domain. 1. A method for characterization of a light beam comprising:separating the light beam by means of a separator optic into a first sub-beam and a second sub-beam, the first sub-beam taking a first optical path and the second sub-beam taking a second optical path;propagating the first sub-beam over a first optic and the second sub-beam over a second optic, the first sub-beam having a non-homogeneous electromagnetic field over an entire surface of the first optic, said first and second optics being, thanks to a controller, respectively arranged in the first and second optical paths so that the first sub-beam on leaving the first optic, corresponding to a reference beam and the second sub-beam on leaving the second optic, corresponding to a characterized beam are separated by a time delay τ;recombining the reference beam and the characterized beam by means of a recombiner optic in such a way that the reference and characterized beams spatially interfere and form a two-dimensional interference pattern, the two- ...

Lasers Based On Optical Ring-Resonators

An apparatus includes a laser that includes an optical gain medium and first and second optical ring-resonators. The optical gain medium and the optical ring-resonators are serially optically connected together to form one or more segments of an optical cavity of the laser. One of the optical ring-resonators has a Mach-Zehnder interferometer forming an internal optical waveguide segment of the one of the optical ring-resonators.

ROOM-TEMPERATURE QUANTUM NOISE LIMITED SPECTROMETRY AND METHODS OF THE SAME

According to one embodiment, a heterodyne detection system for detecting light, includes: a first input aperture configured to receive first light from a scene input; a second input aperture configured to receive second light from a local oscillator input; a broadband local oscillator configured to provide the second light to the second input aperture; a dispersive element configured to disperse the first light and the second light; and a final condensing lens coupled to a detector. The final condensing lens is configured to concentrate incident light from a primary condensing lens onto the detector. The detector is configured to sense a frequency difference between the first light and the second light; and the final condensing lens comprises a plasmonic condensing lens. Methods for forming a plasmonic condensing lens to enable room temperature quantum noise limited spectrometry are also disclosed. 1. A heterodyne detection system for detecting light , comprising:a first input aperture configured to receive first light from a scene input;a second input aperture configured to receive second light from a local oscillator input;a broadband local oscillator configured to provide the second light to the second input aperture;a dispersive element configured to disperse the first light and the second light; anda final condensing lens coupled to a detector;wherein the final condensing lens is configured to concentrate incident light from a primary condensing lens onto the detector;wherein the detector is detector configured to sense a frequency difference between the first light and the second light; andwherein the final condensing lens comprises a plasmonic condensing lens.2. The heterodyne detection system as recited in claim 1 , wherein the detector is an infrared detector.3. The heterodyne detection system as recited in claim 1 , wherein the detector is a square-law detector.4. The heterodyne detection system as recited in claim 1 , wherein the detector comprises a type ...

Inteferometric Sensor Basid on Slab Waveguide

The present invention provides a sensor having, one or more optical slab waveguides having one or more target regions. The target regions may interact with gas molecules or trap, entrain or capture one or more targets of interest. The optical slab waveguides are adapted to receive one or more input optical beams from one or more light sources to create a plurality of propagating optical waves in optical slab waveguide. The propagating optical waves interact with said one or more target regions to create an optical output wavefront that may be in the form of a diffraction pattern. The target regions may be functionalized with an antibody, polymer, cell, tissue, or biological material. 1. A sensor comprising:an optical slab waveguide having one or more target regions, said target regions trap one or more targets of interest;said optical slab waveguide adapted to receive one or more input optical beams from one or more light sources;a plurality of propagating optical waves created in said optical slab waveguide; andsaid propagating optical waves interact with said one or more target regions to create an optical output wavefront.2. The sensor of wherein said one or more target regions are functionalized with an antibody claim 1 , polymer claim 1 , cell claim 1 , tissue claim 1 , or biological material.3. The sensor of wherein said plurality of propagating optical waves are modified by said one or more target regions to create an optical output wavefront that forms a diffraction pattern.4. (canceled)5. (canceled)6. (canceled)7. (canceled)8. (canceled)9. The sensor of wherein said optical source is not a tunable claim 1 , narrow linewidth optical source.10. The sensor of wherein said sensors includes a plurality of optical slab waveguides.11. The sensor of further including one or more optical manipulators that transform said optical wavefront prior to conversion into an electronic signal by one or more photodetector arrays.12. (canceled)13. The sensor of wherein said ...

DEVICES AND SYSTEMS FOR IMPROVED COLLECTION EFFICIENCY AND RESOLUTION OF WAVELENGTH DISPERSIVE SPECTROMETRY

A device for the collection of X-rays includes at least one multi-reflection reflector cone. The multi-reflection reflector cone has a focal axis. A first portion of the multi-reflection reflector cone is oriented at a first angle to the focal axis, and a second portion of the multi-reflection reflector cone is oriented at a second angle to the focal axis. 1. A device for the collection of X-rays , the device comprising:at least one multi-reflection reflector cone with a focal axis, the at least one multi-reflection reflector cone having a surface with a first portion oriented at a first angle to the focal axis and a second portion oriented at a second angle to the focal axis.2. The device of claim 1 , the first portion being a first angled surface and the second portion being a second angled surface with a discontinuity therebetween.3. The device of claim 1 , at least a portion of the multi-reflection reflector cone being curved in longitudinal profile.4. The device of claim 1 , at least a portion of the multi-reflection reflector cone being parabolic in longitudinal profile.5. The device of claim 1 , at least a portion of the multi-reflection reflector cone being hyperbolic in longitudinal profile.6. The device of claim 1 , the multi-reflection reflector cone having a focal length of less than 25 millimeters.7. The device of claim 1 , further comprising a polycapillary optical element coaxial with the at least one multi-reflection reflector cone.8. The device of claim 7 , the polycapillary optical element and the multi-reflection reflector cone having the same focal point.9. The device of claim 7 , the polycapillary optical element and the multi-reflection reflector cone having different focal points.10. The device of claim 7 , the multi-reflection reflector cone and the polycapillary optical element transmitting X-rays in parallel paths at a rear of the multi-reflection reflector cone and polycapillary optical element.11. The device of claim 1 , the multi- ...

Measuring path delay through a liquid-crystal variable retarder at non-uniform retardance intervals

A voltage is applied to a liquid-crystal variable retarder that monotonically changes a retardance and changes a first derivative with respect to time of the retardance of the liquid-crystal variable retarder over a time period. An interferogram of light passing through the liquid-crystal variable retarder is measured during the time period.

Mirror Alignment in Optical Scientific Instruments

A mirror assembly has one or more axes of motion and includes a mirror that is movable and forms an acute angle with a plane orthogonal to its axis of motion. The mirror assembly may include a first reflective mirror surface in the incoming optical path that is movable and forms an acute angle with a plane orthogonal to its axis of motion, and a second reflective mirror surface in the outgoing optical path that is movable and forms an acute angle with a plane orthogonal to its axis of motion and is moveable in a linear translation to scan the mirror in the interferometer in a way to generate a normal interferogram. 1. A mirror assembly for precise control of a light beam , comprising:a first mount including a first axis of rotation;a first mirror coupled to the first mount that includes a reflective surface having a surface plane that is nearly perpendicular to a plane of the first axis of rotation; anda light source configured to aim a beam at the reflective surface, wherein rotation of the first mount translates the beam over a first controllable distance on a target surface.2. The mirror assembly of claim 1 , wherein:the controllable distance is provided by an amount of tilt of the reflected beam.3. The mirror assembly of claim 2 , wherein:the amount of tilt of the reflected light beam comprises a range of approximately 0.001 to approximately 5 degrees of tilt.4. The mirror assembly of claim 1 , wherein:the reflective surface is substantially planar.5. The mirror assembly of claim 1 , wherein:the controllable distance comprises movement of the light beam in an X axis or a Y axis on the target surface.6. The mirror assembly of claim 1 , wherein:the controllable distance comprises movement of the light beam over a distance from approximately 0.1 mm to approximately 50 mm on the target surface with a target distance of approximately 300 mm from the first mirror surface.7. The mirror assembly of claim 1 , wherein:the rotation of the first mount comprises ...

OPTICAL IMAGING SYSTEM

An optical imaging system () for in-vivo retinal imaging, the system () comprising: 135-. (canceled)36. An in-vivo retinal imaging system comprising:an optical source for generating incoherent light in a plurality of wavelength bands;an optical imaging sub-system configured to split light from said optical source into a plurality of beams, to introduce a path difference between said beams of light, and recombine those beams to form interference fringes that are imaged on a subject; andan image capture device configured to capture light from the subject being imaged, and to form an image of said subject.37. An in-vivo retinal imaging system according to claim 36 , wherein said optical source is configured to generate separate incoherent red claim 36 , green and blue beams of light.38. An in-vivo retinal imaging system according to claim 37 , wherein said optical source comprises one or more light emitting elements configured to generate red light claim 37 , one or more light emitting elements configured to generate green light claim 37 , and one or more light emitting elements configured to generate blue light.39. An in-vivo retinal imaging system according to claim 38 , wherein said optical source comprises a plurality of light emitting diodes each configured to generate red light claim 38 , a plurality of light emitting diodes each configured to generate green light claim 38 , and a plurality of light emitting diodes each configured to generate blue light.40. An in-vivo retinal imaging system according to claim 36 , further comprising a diffuser operable to diffuse light from said optical source claim 36 , and thereby generate diffuse incoherent light for illuminating said optical sub-system.41. An in-vivo retinal imaging system according to claim 36 , wherein said optical imaging subsystem comprises a Michelson interferometer having a first branch claim 36 , a second branch and a beamsplitter for directing incident light to each of said branches.42. An in-vivo ...

RESIN IDENTIFICATION DEVICE

A resin identification device capable of measuring samples having various shapes is provided. The resin identification device includes a Fourier transform infrared spectrophotometer (FTIR), and sample placing plates and having an opening The FTIR includes: an infrared light source section irradiating a sample S with infrared light; an infrared light detection section detecting light intensity information of the infrared light reflected from the sample S; and a control section obtaining the light intensity information. By replacement of the sample S in a predetermined position so as to block off the opening the infrared light source section irradiates infrared light on a lower surface of the sample S, and the infrared light detection section detects the light intensity information of the infrared light reflected by the lower surface of the sample S. 1. A resin identification device comprising:an infrared spectrophotometer comprising: an infrared light source section, irradiating infrared light to a sample being a resin; an infrared light detection section, detecting light intensity information of the infrared light reflected from the sample; and a control section, obtaining the light intensity information; anda sample placing plate provided with an opening, whereinby replacement of the sample in a predetermined position so as to block off the opening, the infrared light source section irradiates the infrared light to a lower surface of the sample, and the infrared light detection section detects the light intensity information of the infrared light reflected by the lower surface of the sample.2. The resin identification device according to claim 1 , wherein the infrared light source section has a condensing mirror claim 1 , and irradiates the infrared light from the condensing mirror to a measurement point on the lower surface of the sample; andthe infrared light detection section has a condensing mirror, and collects the infrared light reflected by the measurement ...

METHOD AND DEVICE FOR DIFFERENTIAL OPTICAL PHASE MODULATION IN QUANTUM KEY DISTRIBUTION SYSTEM

A transmitting apparatus in a quantum key distribution system, includes: an optical interferometer to receive a single-photon pulse inputted from a light source and to provide two optical paths with a predetermined path difference, the two optical paths used for the single-photon pulse to pass through the optical interferometer; and an optical phase modulator to perform a temporal differential phase modulation of the single-photon pulse which has passed through the optical interferometer, wherein the single-photon pulse, after passing through the optical interferometer, has a probability distribution divided into two separate regions in time domain. 1. A transmitting apparatus in a quantum key distribution system , the apparatus comprising: receive a single-photon pulse inputted from a light source and', 'provide two optical paths with a predetermined path difference the two optical paths used for the single-photon pulse to pass through the optical interferometer; and, 'an optical interferometer configured to'}an optical phase modulator configured to perform a temporal differential phase modulation of the single-photon pulse which has passed through the optical interferometer,wherein the single-photon pulse, after passing through the optical interferometer, has a probability distribution divided into two separate regions in time domain.2. The apparatus of claim 1 , wherein the optical phase modulator is configured so that the single-photon pulse has a predetermined phase difference or φbetween when the single-photon pulse passes through a shorter path of the two optical paths and when the single-photon pulse passes through a longer path of the two optical paths.3. The apparatus of claim 2 , wherein the optical phase modulator is configured so that the single-photon pulse is phase-shifted by −φ/2 when passing through one of the two optical paths and is phase-shifted by φ/2 when passing through the other of the two optical paths.4. The apparatus of claim 3 , wherein ...

SELF CALIBRATION FOR MIRROR POSITIONING IN OPTICAL MEMS INTERFEROMETERS

A Micro-Electro-Mechanical System (MEMS) apparatus provides for self-calibration of mirror positioning of a moveable mirror of an interferometer. At least one mirror in the MEMS apparatus includes a non-planar surface. The moveable mirror is coupled to a MEMS actuator having a variable capacitance. The MEMS apparatus includes a capacitive sensing circuit for determining the capacitance of the MEMS actuator at multiple reference positions of the moveable mirror corresponding to a center burst and one or more secondary bursts of an interferogram produced by the interferometer based on the non-planar surface. A calibration module uses the actuator capacitances at the reference positions to compensate for any drift in the capacitive sensing circuit. 1. A Micro-Electro-Mechanical System (MEMS) apparatus , comprising: at least one mirror optically coupled to receive and reflect light and configured to produce an interferogram therefrom, a first mirror of the at least one mirror having a non-planar surface; and', 'a MEMS actuator coupled to a moveable mirror of the at least one mirror to produce a displacement thereof, the MEMS actuator having a variable capacitance;, 'a MEMS interferometer includinga memory maintaining a table mapping stored capacitances of the MEMS actuator to respective stored positions of the moveable mirror; sense a first measured capacitance of the MEMS actuator at a first reference position of the moveable mirror corresponding to a center burst of the interferogram produced as a result of movement of the moveable mirror; and', 'sense a second measured capacitance of the MEMS actuator at a second reference position of the moveable mirror corresponding to a secondary burst of the interferogram produced as a result of movement of the moveable mirror and the non-planar surface; and, 'a capacitive sensing circuit coupled to the MEMS actuator, the capacitive sensing circuit configured toa calibration module configured to use the first measured capacitance ...

Miniaturized waveguide imaging spectrometer

A waveguide spectrometer includes at least one substrate layer with at least one waveguide. Each waveguide extends from an inlet face proceeding partly through the substrate layer to a reflecting element. A multiplicity of photo detectors is arranged on a front side of the substrate layer, while the photo detectors are electrically connected to an electronic read out system. The spectrometer can be made lightweight and easier to produce by forming the waveguides as surface waveguides, each showing a longitudinal opening with a width to the front side of the substrate layer between the inlet face and the reflecting element. The photo detectors are in print distributed at the front side on top of the substrate layer at least partly overlapping the longitudinal opening along an overall length of sampled region and the electrical connection of the photo detectors with the electronic read out system is achieved by a multiplicity of printed electrical conductors.

APPARATUS AND METHODS FOR FACIAL RECOGNITION AND VIDEO ANALYTICS TO IDENTIFY INDIVIDUALS IN CONTEXTUAL VIDEO STREAMS

An apparatus includes a memory, a communication interface in communication with the memory and configured to communicate via a network, and a processor in communication with the memory and the communication interface. The processor receives facial image data associated with a user of a client device, registers the facial image data, and stores the facial image data and contextual data associated with the user in a database. The processor also receives video stream data from at least one image capture device in communication with the network, analyzes the video stream data and contextual data associated with the video stream data to define analyzed video data and analyzed contextual data, respectively, and defines a confidence level based on comparing the data associated with the video stream data to the data stored in the database. The processor defines a user-specific contextual video stream when the confidence level satisfies a criterion. 1. A method , comprising:receiving data associated with a first user device;identifying, based on the data, a location of the first user device;receiving at least one image captured by a second user device different from the first user device;identifying a location associated with the at least one image;comparing the location of the first user device to the location associated with the at least one image to determine whether the first user device is within a predetermined distance of the location associated with the at least one image at a time; performing facial recognition on the at least one image to determine a probability that a user associated with the first user device is depicted within the at least one image; and', 'when the probability meets a criterion, automatically sending the at least one image to the first user device; and, 'when the first user device is within the predetermined distance of the location associated with the at least one image 'not performing facial recognition on the at least one image to determine ...

LAB-ON-CHIP NEAR-INFRARED SPECTROMETER FOR LABEL-FREE MOLECULAR ANALYSIS OF A SAMPLE

The present application describes a NIR spectrometer for label-free, rapid, portable and high-precision molecular composition analysis of a sample. The NIR spectrometer is integrated in a lab-on-chip and comprises a broadband NIR source configured to generate NIR light pulses; collimating and focusing objectives; a PDMS chamber mounted on a silicate glass support and designed to be filled with the sample and to receive an NIR light beam from a channel waveguide; the cannel waveguide built in a silicate glass support and configured to transmit the NIR light beam through the sample; an optical spectrum analyser configured to receive the NIR light beam, partially absorbed by the sample, and to measure an output signal intensity of the light beam versus a wavelength of said light beam; optical fibres connecting the components of the NIR spectrometer; and a computing unit. 1. A near-infrared (NIR) spectrometer for label-free molecular analysis of a sample , said NIR spectrometer is integrated in a lab-on-chip and comprises:a) a broadband NIR source configured to generate NIR light pulses;b) a single-mode (SM) optical fibre optically connecting the broadband NIR source with a collimating objective and designed to transmit said NIR light pulses from said NIR source to said collimating objective;c) the collimating objective configured to collimate the NIR light pulses received from the NIR source into a narrow collimated NIR light beam, and directing said narrow collimated NIR light beam to a focusing objective;d) the focusing objective configured to receive the narrow collimated NIR light beam from the collimating objective, to align on-axis the NIR beam and to focus said beam onto a polarisation maintaining optical fibre;e) the polarisation maintaining (PM) optical fibre optically coupled into a channel waveguide of a polydimethylsiloxane (PDMS) chamber, optically connecting the focusing objective with the channel waveguide, and configured to transmit the focused NIR ...

Fast computational phase and timing correction for multiheterodyne spectroscopy

Disclosed herein is an all-digital phase and timing correction procedure for coherent averaging in dual-comb and multiheterodyne spectroscopy—applicable to any dual-comb spectroscopy setup. It can account for large frequency/phase instabilities of the used sources, yielding a significant reduction of the noise pedestal and an increase in signal-to-noise ratio (SNR) of the radio frequency (RF) beat notes. This technique is computationally efficient and can be conveniently implemented either as a post-processing algorithm or in a real-time data acquisition and processing platform without the necessity of adding any additional optical elements to the dual-comb spectroscopy system. By implementing this technique, the performance of any comb- or comb-like-source-based DCS system with a sufficient degree of mutual coherence between the optical modes can be improved in terms of SNR and number of spectroscopically-usable RF beat notes. The described technique is compatible with a DC-centered RF spectrum, where the negative frequencies are folded to the positive domain to double the number of beat notes within the detector bandwidth. The technique enables coherent averaging over extended time-scales even for free-running combs, thus increasing the sensitivity of absorption and dispersion DCS measurements.

OPTICAL COMPUTING DEVICES AND METHODS UTILIZING MULTIPLE INTEGRATED COMPUTATIONAL ELEMENTS IN SEQUENCE

Detection sensitivity of optical computing devices may be improved by utilizing multiple integrated computational elements in combination with one another. Optical computing devices containing multiple integrated computational elements may comprise: two or more integrated computational elements that are identical to one another and optically interact sequentially with incident electromagnetic radiation, such that at least a portion of the photons from the incident electromagnetic radiation optically interacts with each integrated computational element; wherein the sequential optical interaction of the incident electromagnetic radiation with the two or more integrated computational elements increases a detection sensitivity of the optical computing device relative to that obtained when only one of the integrated computational elements is present; and a detector that receives the photons that have optically interacted with each integrated computational element. 1. An optical computing device comprising:two or more integrated computational elements that are identical to one another and optically interact sequentially with incident electromagnetic radiation comprising a plurality of photons, such that at least a portion of the photons from the incident electromagnetic radiation optically interacts with each integrated computational element;wherein the sequential optical interaction of the incident electromagnetic radiation with the two or more integrated computational elements increases a detection sensitivity of the optical computing device relative to that obtained when only one of the integrated computational elements is present; anda detector that receives the photons that have optically interacted with each integrated computational element.2. The optical computing device of claim 1 , wherein the two or more integrated computational elements are disposed in series with one another along a linear optical pathway.3. The optical computing device of claim 2 , wherein ...

Living body determination device, living body determination method, and program

A living body is accurately determined while minimizing increases in the size of a device and increases in the number of components. A living body determination device includes a spectroscopic device 104 that disperses light entering from a pedestal side and outputs the result; a light emission device 101 that emits first light toward the pedestal from a position facing the spectroscopic device 104 with the pedestal therebetween; a light emission device 102 that emits second light toward the pedestal from the spectroscopic device 104 side; an image acquisition device 105 that outputs image information indicating a brightness corresponding to the intensity of the light output by the spectroscopic device 104; and a calculation device 106 that acquires first image information regarding each of the spectra of the first light from the image acquisition device 105, acquires first spectroscopic information on the basis of each of the pieces of first image information, acquires second image information regarding each of the spectra of the second light from the image acquisition device 105, acquires second spectroscopic information on the basis of each of the pieces of second image information, and determines whether or not a measurement target 10a is a living body, based on the first and second spectroscopic information.

OPTICAL LOCKER

There is described an interferometer for use in an optical locker. The interferometer comprises at least two transparent materials having different thermal path length sensitivities. The interferometer is configured such that an input beam is split by the interferometer into first and second intermediate beams, which recombine to form an output beam, the first and second intermediate beams travelling along respective first and second intermediate beam paths which do not overlap. At least one of the intermediate beam paths passes through at least two of the transparent materials. A length of each intermediate beam path which passes through each transparent material is selected such that an optical path difference between the first and second intermediate beam path is substantially independent of temperature. 1. An interferometry assembly for use in an optical locker , the interferometry assembly comprising:an interferometer configured to produce an interference pattern from an input beam, such that an image of the input beam viewed from a detector assembly along a first path is displaced from an image of the input beam viewed from the detector assembly along a second path at least in a direction perpendicular to the input beam, and such that a beam travelling along the first path interferes with a beam travelling along the second path to produce the interference pattern; and 'wherein each of the output signals has a different phase for a relationship between intensity and wavelength.', 'the detector assembly configured to detect intensities of a plurality of regions of the interference pattern, the plurality of regions comprising a plurality of measurement regions and a normalisation region, and to determine a plurality of output signals, each output signal being determined on the basis of an intensity of a respective measurement region and the normalisation region,'}2. The interferometry assembly according to claim 1 , wherein each of the output signals is ...

PHASE STEP DIFFRACTOMETER

A phase step diffractometer is disclosed that utilizes Fresnel diffraction from a 1D step. The main part of the device is a step with two flat parallel mirrors on either side. The phase difference (PD) is changed by varying the light incident angle and the step height. The diffracted lights from the step are caught by a CCD connected to a PC. By varying PD, the visibility of the three central diffraction fringes changes. This permits low uncertainties in the measurements of wavelength, coherence length, coherence width, plate thickness, surface topography and fine displacement of objects. In addition, the device can be used in determination of broad spectral line shapes and optical constants of materials. 1- A phase step diffractometer device comprising:a) a 1D step with variable height comprising a first and second rectangular flat reflective surfaces on either side; wherein said first and second reflective surfaces are mounted on a first and second stand respectively; wherein said first reflective surface comprises a sharp edge on its distal side and said second reflective surface comprises a sharp edge on its proximal side; wherein said distal side and proximal side of said first and second reflective surfaces respectively face each other with a gap as small as possible forming said 1D step; wherein said first reflective surface and first stand are both attached to a micrometer where said micrometer moves up and down adjusting said height of said step in comparison to where said second reflective surface is located and wherein said second reflective surface and its respective second stand tilt with respect to said first reflective surface via three screws attached to said second stand; wherein an angle between said first and second reflective surfaces changes and respective planes of said first and second reflective surfaces are aligned by manipulating (fastening and/or loosening) said three screws; wherein said step device is mounted on a stage of a goniometer ...

Optical arrangement for the compensation of incorrect alignments of a reflector in relation to a light source

An optical arrangement has a light source, which emits a light beam along a first optical axis. A first reflector is provided, and a second reflector reflects light reflected by the first reflector. The first reflector has a transverse offset from the first optical axis to reflect light along a second optical axis which has a parallel offset of two times the transverse offset of the first optical axis. The second reflector reflects the light beam back to the first reflector along a third optical axis having a parallel offset with a fixed amount in a fixed transverse direction in relation to the second optical axis. The light beam is reflected by the first reflector along a fourth optical axis which has a parallel offset in relation to the first optical axis with a fixed amount counter to the fixed transverse direction.

Room-temperature quantum noise limited spectrometry and methods of the same

According to one embodiment, a method of forming a plasmonic condensing lens for room temperature quantum noise limited (QNL) infrared (IR) spectrometry includes: forming a silicon cone on a substrate; coating the silicon cone with a highly reflective material; and modifying the silicon cone using focused ion beam (FIB) modification to permit transmittance of light through the silicon cone.

SEGMENTED CHIRPED-PULSE FOURIER TRANSFORM SPECTROSCOPY

An emission can be obtained from a sample in response to excitation using a specified range of excitation frequencies. Such excitation can include generating a specified chirped waveform and a specified downconversion local oscillator (LO) frequency using a digital-to-analog converter (DAC), upconverting the chirped waveform via mixing the chirped waveform with a specified upconversion LO frequency, frequency multiplying the upconverted chirped waveform to provide a chirped excitation signal for exciting the sample, receiving an emission from sample, the emission elicited at least in part by the chirped excitation signal, and downconverting the received emission via mixing the received emission with a signal based on the specified downconversion LO signal to provide a downconverted emission signal within the bandwidth of an analog-to-digital converter (ADC). The specified chirped waveform can include a first chirped waveform during a first duration, and a second chirped waveform during a second duration. 1generating a specified chirped waveform and a specified downconversion local oscillator (LO) frequency using a digital-to-analog converter (DAC);upconverting the chirped waveform via mixing the chirped waveform with a specified upconversion LO frequency;frequency multiplying the upconverted chirped waveform to provide a chirped excitation signal for exciting the sample;receiving an emission from the sample, the emission elicited at least in part by the chirped excitation signal; anddownconverting the received emission via mixing the received emission with a signal based on the specified downconversion LO signal to provide a downconverted emission signal within the bandwidth of an analog-to-digital converter (ADC);wherein the generating the specified chirped waveform includes generating a first chirped waveform during a first duration, and a second chirped waveform during a second duration, the first and second chirped waveforms including respective bandwidths ...

Standoff Trace Chemical Detection With Active Infrared Spectroscopy

A system and process scans a target area at a distance of 3-30 m for one or more materials. Scanning is performed by a coherent transmit beam aimed with the help of a thermal camera. The active source of the beam is a supercontinuum (SC) laser. The transmitted source beam is modulated by a high-speed Fourier-transform spectrometer prior to interaction with the target. Target reflected source beam is detected by an infrared detector, along with a reference portion of the transmitted source beam, as a series of interferograms; passed through a digitizer for digitizing the interferograms; and processed to producing spectrograms, wherein the spectrograms are indicative of one or more materials on the target.

Interferometer

An interferometer includes a first interferometer arm and a second interferometer arm. A first central beam, originating from a central image point of an image, passes through the first interferometer arm. A second central beam, originating from the central image point, passes through the second interferometer arm. The first central beam and the second central beam are superimposed and generate a k=0 interference at a superposition point. A first light beam perpendicular to the first central beam, originating from an image point of the image, passes through the first interferometer arm. A second light beam perpendicular to the second central beam, originating from the image point, passes through the second interferometer arm. The first light beam and the second light beam overlap at the superposition point. At the superposition point, a wave vector component of the first light beam opposes a wave vector component of the second light beam.

SYSTEM AND METHOD FOR AN INTERFEROMETER RESISTANT TO EXTERNALLY APPLIED FORCES

An embodiment of a ruggedized interferometer is described that comprises a light source that generates a beam of light; a fixed mirror; a moving mirror that travels along a linear path; a beam splitter that directs a first portion of the beam of light to the fixed mirror and a second portion of the beam of light to the moving mirror, wherein the beam splitter recombines the first portion reflected from the fixed mirror and the second portion reflected from the moving mirror; and a servo control that applies a substantial degree of force to the moving mirror at initiation of a turnaround period, wherein the substantial degree of force is sufficient to redirect the moving mirror traveling at a high velocity to an opposite direction of travel on the linear path. 1. A ruggedized interferometer , comprisinga light source that generates a beam of light;a fixed mirror;a moving mirror that travels along a linear path;a beam splitter that directs a first portion of the beam of light to the fixed mirror and a second portion of the beam of light to the moving mirror, wherein the beam splitter recombines the first portion reflected from the fixed mirror and the second portion reflected from the moving mirror; anda servo control that applies a substantial degree of force to the moving mirror at initiation of a turnaround period, wherein the substantial degree of force is sufficient to redirect the moving mirror traveling at a high velocity to an opposite direction of travel on the linear path.2. The ruggedized interferometer of claim 1 , wherein:the initiation of the turnaround period uses an open loop control scheme to apply the substantial degree of force.3. The ruggedized interferometer of claim 1 , wherein:the servo control applies a force to the moving mirror in a steady state mode using a closed loop control scheme.4. The ruggedized interferometer of claim 1 , wherein:the fixed mirror further comprises a dynamic alignment system comprising one or more tuning elements with ...

DIFFUSE REFLECTANCE INFRARED FOURIER TRANSFORM SPECTROSCOPY

Diffuse reflectance spectroscopy apparatus for use in analysing a sample comprising a sample receiving location for receiving a sample for analysis; an illumination arrangement for directing light towards a received sample; a detector for detecting light reflected by a received sample; and collection optics for directing light reflected by a received sample towards the detector. The illumination arrangement further comprises an interferometer and a half beam block which is disposed substantially at a focus in the optical path for blocking light which exits the interferometer, passes said focus, and is reflected from re-entering the interferometer. A half beam block may be disposed in the optical path between the interferometer and the light source for blocking light that exits the interferometer back towards the light source and is reflected by the light source from re-entering the interferometer and/or a half beam block may be disposed in the optical path on the opposite side of the interferometer than the light source. 1. Diffuse reflectance spectroscopy apparatus for use in analysing a sample comprising:a sample receiving location for receiving a sample for analysis;an illumination arrangement for directing light from a light source towards a received sample;a detector for detecting light reflected by a received sample; andcollection optics for directing light reflected by a received sample towards the detector, wherein the illumination arrangement comprises an interferometer and a half beam block disposed substantially at a focus in the optical path between the interferometer and the light source for blocking light that exits the interferometer back towards the light source and is reflected by the light source from re-entering the interferometer.2. (canceled)3. (canceled)4. Diffuse reflectance spectroscopy apparatus according to in which the illumination arrangement comprises a second half beam block claim 1 , which is disposed in the optical path on the ...

Imaging spectropolarimeter using orthogonal polarization pairs

An imaging interferometric transform spectropolarimeter configured to simultaneously collect four polarizations. In one example, an spectropolarimeter includes a dual-beam interferometric transform spectrometer configured to receive electromagnetic radiation from a viewed scene, and including first and second focal plane arrays that are spatially registered with one another, a first polarizer coupled to the first focal plane array and configured to transmit only a first pair of polarizations to the first focal plane array, and a second polarizer coupled to the second focal plane array and configured to transmit only a second pair of polarizations to the second focal plane array, the second pair of polarizations being different than the first pair of polarizations.