Stationary ct apparatus

PROCEDURE AND SYSTEM FOR EXAMINING PACKING

Scan imaging system for article safety inspection and imaging method thereof

A scan imaging system for article safety inspection and an imaging method thereof. The scan imaging system comprises: a conveying unit (101), used to move an article (104) along a conveying direction of the conveying unit (101); multiple radiation sources (102), located on one side of the conveying unit (101) and sequentially disposed in a direction perpendicular to a plane in which the conveying unit (101) is located, the multiple radiation sources (102) alternately emitting radiation beams to form a scanning region; a linear detector array (103), located on the other side of the conveying unit (101) and used to detect a first projection image formed after the radiation beams emitted by the multiple radiation sources (102) pass through the article (104) while the article (104) is passing through the scanning region; and an imaging unit, used to obtain, according to the first projection image of the multiple radiation sources (102), a first reconstructed image of the article (104). The ...

X-RAY SCANNING SYSTEM AND METHOD

A scanning system for scanning an object, and a corresponding bracket and method are described. The system has a scanning chamber in which the object to be scanned is received. The system also has a displacement assembly which displaces the object along a path passing at least partially through the scanning chamber. The system also includes a source for emitting electromagnetic (EM) radiation or X-rays against the object within the scanning chamber such that at least some of the EM radiation passes through the object. The source is angled relative to the displacement path at an angle in a range between about 5° to about 8° and about 22° to about 30°. Finally, the system may also have detectors arranged around the scanning chamber which detect the EM radiation which passes through the object. The system, bracket, and method allow for the production of representative three-dimensional views of the object.

X-RAY INSTRUMENT WITH AMBIENT TEMPERATURE DETECTOR

An X-ray analyzer comprises at least one detector configured to detect a secondary X-ray from a test object irradiated by an X-ray source, and provide a corresponding energy signal; a temperature sensor configured to sense a temperature related to the detector; and a signal processor configured to process the energy signal and provide a temperature compensated output for an X-ray event.

WAFER INSPECTION APPARATUS AND WAFER INSPECTION METHOD

The present disclosure provides a wafer inspection technology that involves less degradation of the image quality even when an object to be observed has a variation in height due to warpage, etc. of a wafer. This wafer inspection apparatus obtains an image with less degradation by: adjusting the focal point of an observation optical system to a height measured by a height sensor for measuring wafer surface heights; and further, correcting a switching signal for a CCD line sensor on the basis of stage position data and optical magnification data corresponding to the height so as to make a correction corresponding to the wafer surface height.

Stationary CT apparatus

CT apparatus comprising a scanning passage, a stationary x-ray source with a plurality of focal spots, and a plurality of detector modules.

A stationary CT apparatus comprises: a scanning passage; a stationary x-ray source 7, e.g. a carbon nanotube, arranged around the scanning passage and comprising a plurality of ray emission focal spots 14; and a plurality of stationary detector modules 12 arranged around the scanning passage and disposed opposite the x-ray source 7. The focal spots 14 may be arranged substantially in a straight line shape when viewed in a plane intersecting the scanning passage. The detector modules 12 may have no gaps between them and each module may have a ray receiving surface 121. The detector modules 12 and focal spots 14 may be arranged substantially in the shape of a spatial helix, or arranged in at least one row in a direction in which an object under inspection enters and leaves the scanning passage. A correction device 11 may be provided between the focal spots 14 and the detector modules 12 for controlling doses of ray beams.

Method and system for inspecting packagings

Method and system for inspecting packagings

SHIELDING STRATEGY FOR MITIGATION OF STRAY FIELD FOR PERMANENT MAGNET ARRAY

The present disclosure provides an inspection system and a method of stray field mitigation. The system includes an array of electron beam columns, a first permanent magnet array, and a plurality of shielding plates. The array of electron beam columns each includes an electron source configured to emit electrons toward a stage. The first permanent magnet array is configured to condense the electrons from each electron source into an array of electron beams. The first permanent magnet array is arranged at a first end of the array of electron beam columns. The plurality of shielding plates extend across the array electron beam columns downstream of the first permanent magnet array in a direction of electron emission. The array of electron beams pass through a plurality of apertures in each of the plurality of shielding plates, which reduces stray magnetic field in a radial direction of the array of electron beams.

Inspection apparatus and inspection method

An inspection apparatus for inspecting an inspection target surface arranged on an inspection plane, includes an X-ray generation tube having a target including an X-ray generation portion that generates X-rays by irradiation with an electron beam, and configured to emit X-rays to the inspection plane; and an X-ray detector configured to detect X-rays emitted from a foreign substance existing on the inspection target surface irradiated with the X-rays from the X-ray generation portion and totally reflected by the inspection target surface.

СПОСОБ И СИСТЕМА КОНТРОЛЯ УПАКОВКИ

Изобретение относится к контролю упаковки для жидкого продукта, такого как напитки. Изобретение включает этапы: запуска упаковки в режим вращения, облучения упаковки во время вращения излучением света на заданной длине волны, проведения, по меньшей мере, одной серии из, по меньшей мере, двух последовательных записей, по меньшей мере, части содержимого упаковки во время вращения при помощи устройства для записи изображения, пригодного для записи на заданной длине волны. Технический результат - повышение надежности контроля и упрощение ускоренного контроля упаковки. 2 н. и 7 з.п. ф-лы, 13 ил.

СТАЦИОНАРНОЕ УСТРОЙСТВО КОМПЬЮТЕРНОЙ ТОМОГРАФИИ

FIELD: medicine. SUBSTANCE: invention refers to medical equipment, namely to a computed tomography system. The system comprises a scanning channel, a stationary X-ray emitter surrounding the scanning channel and enclosing a set of focal spots and a set of stationary detector units surrounding the scanning channel and opposite the X-ray emitter. Elongation lines of outer sides of sector radiation beams emitted from two focal spots arranged at one end and the other end of the set of focal spots respectively are intersected in a crossing point, whereas a line generated by connecting the crossing point and the central point of the radiation receiving surface of each of the detector units is perpendicular to the radiation receiving surface of each of the detector units if inspected in a plane intersecting the scanning channel. EFFECT: using the invention enables increasing the data analysis rate. 18 cl, 6 dwg РОССИЙСКАЯ ФЕДЕРАЦИЯ (19) RU (11) (13) 2 566 525 C2 (51) МПК A61B 6/03 (2006.01) G01N 23/203 (2006.01) G01N 23/04 (2006.01) ФЕДЕРАЛЬНАЯ СЛУЖБА ПО ИНТЕЛЛЕКТУАЛЬНОЙ СОБСТВЕННОСТИ (12) ОПИСАНИЕ (21)(22) Заявка: ИЗОБРЕТЕНИЯ К ПАТЕНТУ 2013157871/14, 25.12.2013 (24) Дата начала отсчета срока действия патента: 25.12.2013 Приоритет(ы): (30) Конвенционный приоритет: (43) Дата публикации заявки: 10.09.2015 Бюл. № 25 (73) Патентообладатель(и): НЬЮКТЕК КОМПАНИ ЛИМИТЕД (CN) R U 27.12.2012 CN 201210581446.9 (72) Автор(ы): ЧЖАН Цзиньюй (CN), САН Бинь (CN), ДУАНЬ Чжаньцзюнь (CN), ЧЖАН Ли (CN), ЧЖАО Цзыжань (CN) (45) Опубликовано: 27.10.2015 Бюл. № 30 2 5 6 6 5 2 5 R U (54) СТАЦИОНАРНОЕ УСТРОЙСТВО КОМПЬЮТЕРНОЙ ТОМОГРАФИИ (57) Реферат: Изобретение относится к медицинской излучения, соответственно размещенных на технике, а именно к устройству компьютерной одном конце и другом конце множества томографии. Устройство содержит канал фокальных пятен излучения, пересекаются в точке сканирования, стационарный источник пересечения, и линия, образованная соединением рентгеновского излучения, ...

SCANNING IMAGING SYSTEM FOR SECURITY INSPECTION OF AN OBJECT AND IMAGING METHOD THEREOF

A scan imaging system for article safety inspection and an imaging method thereof. The scan imaging system comprises: a conveying unit (101), used to move an article (104) along a conveying direction of the conveying unit (101); multiple radiation sources (102), located on one side of the conveying unit (101) and sequentially disposed in a direction perpendicular to a plane in which the conveying unit (101) is located, the multiple radiation sources (102) alternately emitting radiation beams to form a scanning region; a linear detector array (103), located on the other side of the conveying unit (101) and used to detect a first projection image formed after the radiation beams emitted by the multiple radiation sources (102) pass through the article (104) while the article (104) is passing through the scanning region; and an imaging unit, used to obtain, according to the first projection image of the multiple radiation sources (102), a first reconstructed image of the article (104). The ...

이동형 엑스레이 시스템

... 본 발명은 이동형 엑스레이 시스템을 개시한다. 본 발명의 일 실시예에 의한 이동형 엑스레이 시스템은, 본체부; 상기 본체부에 유선으로 연결되어 연장 가능하게 결합되고, 피검사체로 엑스레이를 방출하는 엑스레이 소스부; 및 상기 본체부에 유선으로 연결되어 연장 가능하게 결합되고, 상기 본체부에 유선으로 연결되며, 상기 피검사체를 투과한 엑스레이를 인가 받아 영상을 형성하는 디텍터부; 를 포함할 수 있다.

Electron Source, Electron Beam Device, and Method for Manufacturing Electron Source

In a Schottky emitter or a thermal field emitter using a hexaboride single crystal, side emission from portions other than an electron emission portion is reduced. An electron source according to the invention includes: a protrusion (40) configured to emit an electron when an electric field is generated; a shank (41) that supports the protrusion (40) and has a diameter decreasing toward the protrusion (40); and a body (42) that supports the shank (41), in which the protrusion (40), the shank (41), and the body (42) are each made of a hexaboride single crystal, and a part including the shank (41) and the body (42) excluding the protrusion (40) is covered with a material having a work function higher than that of the hexaboride single crystal.

СТАЦИОНАРНОЕ УСТРОЙСТВО КОМПЬЮТЕРНОЙ ТОМОГРАФИИ

... 1. Стационарное устройство компьютерной томографии (КТ), содержащее:канал сканирования;стационарный источник рентгеновского излучения, размещенный вокруг канала сканирования и содержащий множество фокальных пятен излучения; имножество стационарных детекторных модулей, размещенных вокруг канала сканирования и расположенных напротив источника рентгеновского излучения;при этом линии удлинения внешних сторон секториальных пучков излучения, излучаемых из двух фокальных пятен излучения, соответственно, размещенных на одном конце и другом конце множества фокальных пятен излучения, пересекаются в точке пересечения, и линия, образованная соединением точки пересечения с центральной точкой поверхности приема излучения каждого из детекторных модулей, перпендикулярна поверхности приема излучения каждого из детекторных модулей, при наблюдении в плоскости, пересекающей канал сканирования.2. Стационарное устройство КТ по п. 1, в которомпо меньшей мере, некоторые из множества фокальных пятен излучения источника ...

СПОСОБ И СИСТЕМА КОНТРОЛЯ УПАКОВКИ

... 1. Способ контроля упаковки для жидкого продукта, такого как напитки, включающий этапы запуска упаковки в режим вращения, облучения упаковки во время вращения излучением на заданной длине волны, проведения, по меньшей мере, одной серии из, по меньшей мере, двух записей, по меньшей мере, части содержимого упаковки во время вращения при помощи устройства для записи изображения, пригодного для записи на заданной длине волны, отличающийся тем, что упаковку располагают, по существу, в том же самом положении вращения относительно записывающего устройства в течение последовательной записи данной серии. 2. Способ по п.1, в котором последовательные записи серии производятся с интервалом времени заданной продолжительности. 3. Способ по одному или более из предшествующих пунктов, в котором скорость вращения изменяется во время записи серии. 4. Способ по п.1, в котором направление вращения изменяется во время записи серии. 5. Способ по любому одному или более из пп.1-4, в котором множество серий записей ...

X-RAY GENERATION DEVICE AND X-RAY IMAGING SYSTEM

An X-ray generation device includes an electron gun emitting an electron beam, an X-ray generation target including a plurality of target parts generating X-rays in response to incidence of the electron beam from the electron gun, and an irradiation area switching unit switching an area of the X-ray generation target irradiated with the electron beam between a first irradiation area and a second irradiation area. The number of target parts included in the first irradiation area is larger than the number of target parts included in the second irradiation area. An area of the target parts included in the first irradiation area is larger than an area of the target parts included in the second irradiation area.

HIGH-ENERGY X-RAY IMAGING SYSTEM

POLARIZED, ENERGY DISPERSIVE X-RAY FLUORESCENCE SYSTEM AND METHOD

An x-ray fluorescence system and method of fabrication are provided which include a titanium x-ray source, a focusing, doubly-curved lithium fluoride (LiF) crystal optic, and a detector. The titanium x-ray source includes a titanium target on which electrons impinge to generate a diverging x-ray beam with a titanium-based characteristic energy, and the focusing, doubly-curved LiF crystal optic monochromates and focuses the diverging x-ray beam from the titanium x-ray source to provide a monochromated and focused x-ray excitation beam directed to impinge on a sample. The crystal optic and the titanium x-ray source operate at a Bragg angle which facilitates polarization within the x-ray fluorescence system. The detector receives fluorescence from the sample induced by the x-ray excitation beam impinging thereon, with the fluorescence is indicative of a concentration of at least one element in the sample.

Imaging device for generating three dimensional image of object to be examined consisting of multiple projection recordings or images, comprises multiple radiation sources and detector are arranged against each other

The imaging device (200) comprises multiple independently operable radiation sources (6-1,6-2) and a laminar detector (8). The radiation sources and the detector are arranged against each other and together swiveling around a rotation center (C) in an orbital plane. The radiation sources are arranged spaced from each other in the orbital plane such that the different radiation sources are positioned by temporal consecutive swiveling in the same position. An independent claim is included for a method for generating a three dimensional image of an object to be examined consisting of multiple projection recordings or images from different directions.

METHOD AND SYSTEM FOR RECONSTRUCTING 3-DIMENSIONAL IMAGES FROM SPATIALLY AND TEMPORALLY OVERLAPPING X-RAYS

An x-ray imaging system and method for reconstructing three-dimensional images of a region of interest from spatially and temporally overlapping x-rays using novel reconstruction techniques.

METHOD AND SYSTEM FOR INSPECTING PACKAGINGS

IMAGE ACQUISITION DEVICE, IMAGE ACQUISITION METHOD, AND IMAGE CORRECTION PROGRAM

Provided are an image acquisition device and an image acquisition method that allow the internal and external contours of a measured object to be acquired with a high level of precision. An image acquisition device 1 is provided with: a first X-ray source 10, which radiates X-rays having a first focal point size; a first detector 20, which detects X-rays radiating from the first X-ray source 10 that have passed through a measured object O; a first image generation means 30, which generates a first X-ray CT image on the basis of the X-rays detected by the first detector 20; a second X-ray source 40, which radiates X-rays having a second focal point size, which is smaller than the first focal point size; a second detector 50, which detects X-rays radiating from the second X-ray source that have passed through the measured object O; a second image generation means 60, which generates a second X-ray CT image on the basis of the X-rays detected by the second detector 50; and an image correction ...

METHOD AND SYSTEM FOR INSPECTING PACKAGINGS

Method and system for reconstructing 3-dimensional images from spatially and temporally overlapping x-rays

An x-ray imaging system and method for reconstructing three-dimensional images of a region of interest from spatially and temporally overlapping x-rays using novel reconstruction techniques.

Method and system for inspecting bottles

The present invention relates to a method for inspecting packagings for a liquid product, such as drinks, including: setting a packaging into rotation, irradiating the packaging during the rotation with a radiation of a predetermined wavelength, making at least one series of at least two recordings of at least a part of the content of the packaging during the rotation, with an image recording device suitable for making recordings at the predetermined wavelength.

METHOD OF EVALUATING PRIMARY OPTICAL SYSTEM OF ELECTRON BEAM OBSERVATION DEVICE, EVALUATION DEVICE USED THEREFOR, AND METHOD OF MANUFACTURING SAME

Provided is a method of evaluating a deviation of a trajectory of a primary electron beam in a primary optical system in an electron beam observation device including the primary optical system that irradiates a sample with the primary electron beam including a plurality of primary electrons and a secondary optical system that detects, by a detector, a secondary electron beam including a plurality of secondary electrons emitted from the sample irradiated with the primary electron beam.

Method and system for reconstructing 3-dimensional images from spatially and temporally overlapping x-rays

An x-ray imaging system and method for reconstructing three-dimensional images of a region of interest from spatially and temporally overlapping x-rays using novel reconstruction techniques.

RAPID ORE ANALYSIS TO ENABLE BULK SORTING USING GAMMA-ACTIVATION ANALYSIS

Abstract An apparatus for bulk ore sorting using gamma activation analysis is disclosed. The apparatus includes a conveyor system that includes one or more conveyor belts, surrounded by one or more radiation shields, to transport ore material along a transport path. A pulsed X-ray radiation source is configured to irradiate ore material at an irradiation region and one or more detectors are configured to detect a gamma radiation output from irradiated ore material at a detection region. The transport path has a bend, located between the irradiation region and the detection region, and about a vertical axis, of at least 45 degrees. The one or more detectors are configured to detect a radiation output from the irradiated ore material at times between X-ray pulses of the pulsed X-ray radiation source irradiating the ore material. Date Recue/Date Received 2020-12-17 ...

Device, system and method for X-ray diffraction analysis of an electrode of an electrochemical cell, at operating temperature and under current

A device keeps an electrochemical cell under current and at operating temperature during an X-ray beam diffraction analysis of a first electrode, the cell comprising a solid electrolyte interposed between the electrodes. The device comprises: first and second interconnectors having contact faces contacting the electrodes, which allow a gas flow and exchange between the interconnectors and the electrodes. The contact face of the first interconnector allows an X-ray beam to pass to the first electrode. A thermal and atmospheric containment chamber has an inner cavity housing a stack formed from the cell between the interconnectors and a cover closing the cavity, provided with a window allowing X-rays to pass through, the first interconnector being intended to be arranged facing the cover. The contact face of each interconnector is a slotted element; slotted portions of the slotted element are uniformly arranged and form 30% to 80% of the element's surface area.

Waferuntersuchungseinrichtung und Waferuntersuchungsverfahren

Die vorliegende Offenbarung schafft eine Waferuntersuchungstechnologie, die weniger Verschlechterung der Bildqualität beinhaltet, selbst wenn ein zu beobachtendes Objekt eine Variation in der Höhe aufgrund von Verwerfung usw. eines Wafers aufweist. Diese Waferuntersuchungseinrichtung erhält ein Bild mit weniger Verschlechterung durch: Einstellen des Brennpunkts eines optischen Beobachtungssystems auf eine Höhe, die durch einen Höhensensor zum Messen von Waferoberflächenhöhen gemessen wird; und ferner Korrigieren eines Schaltzeitsignals für einen CCD-Zeilensensor auf der Basis von Tischpositionsdaten und Daten der optischen Vergrößerung, die der Höhe entsprechen, um eine Korrektur durchzuführen, die der Waferoberflächenhöhe entspricht (siehe Fig. 1).

Method and system for reconstructing 3-dimensional images from spatially and temporally overlapping x-rays

An x-ray imaging system and method for reconstructing three-dimensional images of a region of interest from spatially and temporally overlapping x-rays using novel reconstruction techniques are provided. The x-ray imaging system may include a detector to generate a signal in response to x-rays incident upon the detector, wherein the signal indicates the intensity of the x-rays incident upon a pixel of the detector, a plurality of x-ray sources arranged to emit x-rays such that said x-rays pass through a region of interest (ROI) and spatially and temporally overlap at the pixel of the detector, and a processing unit to receive the signal indicating the intensity of x-rays incident upon the pixel of the detector and generate an estimate of the intensity attributable to each of the two or more x-rays overlapping at the pixel of the detector.

VERFAHREN UND SYSTEM ZUM UNTERSUCHEN VON VERPACKUNGEN

화상 취득 장치 및 화상 취득 방법, 그리고 화상 보정 프로그램

... 측정 대상물의 내외측 윤곽을 높은 정밀도로 취득할 수 있는 화상 취득 장치 및 화상 취득 방법을 제공한다. 화상 취득 장치(1)는, 제1 초점 사이즈를 갖는 X선을 조사하는 제1 X선원(10)과, 제1 X선원(10)으로부터 조사되어 측정 대상물 O를 투과한 X선을 검출하는 제1 검출기(20)와, 제1 검출기(20)에서 검출한 X선에 기초하여 제1 X선 CT 화상을 생성하는 제1 화상 생성 수단(30)과, 제1 초점 사이즈보다도 작은 제2 초점 사이즈를 갖는 X선을 조사하는 제2 X선원(40)과, 제2 X선원으로부터 조사되어 측정 대상물 O를 투과한 X선을 검출하는 제2 검출기(50)와, 제2 검출기(50)에서 검출한 X선에 기초하여 제2 X선 CT 화상을 생성하는 제2 화상 생성 수단(60)과, 제1 화상 생성 수단(30)에서 생성한 제1 X선 CT 화상을, 제2 화상 생성 수단(60)에서 생성한 제2 X선 CT 화상에 기초하여 보정하는 화상 보정 수단(70)을 구비한다.

Image acquisition device, image acquisition method, and image correction program

Provided are an image acquisition device and an image acquisition method capable of acquiring the internal and external contours of a measured object with a high degree of accuracy. An image acquisition device 1 includes: a first X-ray source 10 that applies X-rays having a first focal point size; a first detector 20 that detects X-rays applied from the first X-ray source 10 and having passed through a measured object O; a first image generation means 30 that generates a first X-ray CT image on the basis of the X-rays detected by the first detector 20; a second X-ray source 40 that applies X-rays having a second focal point size smaller than the first focal point size; a second detector 50 that detects X-rays applied from the second X-ray source and having passed through the measured object O; a second image generation means 60 that generates a second X-ray CT image on the basis of the X-rays detected by the second detector 50; and an image correction means 70 that corrects the first X-ray ...

METHOD AND SYSTEM FOR RECONSTRUCTING 3-DIMENSIONAL IMAGES FROM SPATIALLY AND TEMPORALLY OVERLAPPING X-RAYS

An x-ray imaging system and method for reconstructing three-dimensional images of a region of interest from spatially and temporally overlapping x-rays using novel reconstruction techniques are provided. The x-ray imaging system may include a detector to generate a signal in response to x-rays incident upon the detector, wherein the signal indicates the intensity of the x-rays incident upon a pixel of the detector, a plurality of x-ray sources arranged to emit x-rays such that said x-rays pass through a region of interest (ROI) and spatially and temporally overlap at the pixel of the detector, and a processing unit to receive the signal indicating the intensity of x-rays incident upon the pixel of the detector and generate an estimate of the intensity attributable to each of the two or more x-rays overlapping at the pixel of the detector. 1. An x-ray imaging system , comprising:a detector arranged to generate a signal in response to x-rays incident upon the detector, wherein the signal indicates the intensity of the x-rays incident upon a pixel of the detector;a plurality of x-ray sources, wherein at least two of the plurality of x-ray sources are arranged to emit x-rays such that said x-rays pass through a region of interest (ROI) and spatially and temporally overlap at the pixel of the detector; anda processing unit arranged to receive the signal indicating the intensity of x-rays incident upon the pixel of the detector and generate an estimate of the intensity attributable to each of the two or more x-rays overlapping at the pixel of the detector.2. The system of claim 1 , wherein the processing unit is further arranged to generate a three-dimensional representation of the ROI using one or more estimates of the intensity attributable to each of the two or more x-rays overlapping at the pixel of the detector.3. The system of claim 2 , further comprising a display operably coupled to the processing unit claim 2 , wherein the display is arranged to display one or ...

Scan imaging system for article safety inspection and imaging method thereof

A scan imaging system for article safety inspection and an imaging method thereof. The scan imaging system comprises: a conveying unit (101), used to move an article (104) along a conveying direction of the conveying unit (101); multiple radiation sources (102), located on one side of the conveying unit (101) and sequentially disposed in a direction perpendicular to a plane in which the conveying unit (101) is located, the multiple radiation sources (102) alternately emitting radiation beams to form a scanning region; a linear detector array (103), located on the other side of the conveying unit (101) and used to detect a first projection image formed after the radiation beams emitted by the multiple radiation sources (102) pass through the article (104) while the article (104) is passing through the scanning region; and an imaging unit, used to obtain, according to the first projection image of the multiple radiation sources (102), a first reconstructed image of the article (104). The ...

Rapid ore analysis to enable bulk sorting using gamma-activation analysis

Abstract An apparatus for bulk ore sorting using gamma activation analysis is disclosed. The apparatus includes a conveyor system that includes one or more conveyor belts, surrounded by one or more radiation shields, to transport ore material along a transport path. A pulsed X-ray radiation source is configured to irradiate ore material at an irradiation region and one or more detectors are configured to detect a gamma radiation output from irradiated ore material at a detection region. The transport path has a bend, located between the irradiation region and the detection region, and about a vertical axis, of at least 45 degrees. The one or more detectors are configured to detect a radiation output from the irradiated ore material at times between X-ray pulses of the pulsed X-ray radiation source irradiating the ore material. z 201 a 900 - 501 201 b Figure 3c ...

Thin Film Damage Detection Function and Charged Particle Beam Device

A risk of breakage of a sample holder can be reduced and a biochemical sample or a liquid sample can be observed easily and with a high observation throughput. A sample holder 101 holding a sample includes: a sample chamber including a first insulating thin film 110 and a second insulating thin film 111 that sandwich and hold the sample 200 in a liquid or gel form and face each other, a vacuum partition wall inside which the sample chamber holding the sample is fixed in a state in which the thin film is exposed to a surrounding atmosphere, and whose internal space is kept at a degree of vacuum at least lower than that of the sample room at the time of observation of the sample, a detection electrode 820 disposed to face the second insulating thin film in a state in which the sample chamber is fixed to the vacuum partition wall, and a signal detection unit 50 connected to the detection electrode. Before the surrounding atmosphere of the sample holder is evacuated from an atmospheric pressure ...

INSPECTION APPARATUS AND INSPECTION METHOD

An inspection apparatus for inspecting an inspection target surface arranged on an inspection plane, includes an X-ray generation tube having a target including an X-ray generation portion that generates X-rays by irradiation with an electron beam, and configured to emit X-rays to the inspection plane; and an X-ray detector configured to detect X-rays emitted from a foreign substance existing on the inspection target surface irradiated with the X-rays from the X-ray generation portion and totally reflected by the inspection target surface.

CHARGED PARTICLE BEAM DEVICE

A charged particle beam device according to the present invention changes a signal amount of emitted charged particles by irradiating the sample with light due to irradiation under a plurality of light irradiation conditions, and determines at least any one of a material of the sample or a shape of the sample according to the changed signal amount. 1. A charged particle beam device that irradiates a sample with a charged particle beam , the device comprising:a charged particle source that irradiates the sample with primary charged particles;a light source that emits light applied to the sample;a detector that detects secondary charged particles generated from the sample by irradiating the sample with the primary charged particles;a calculation unit that analyzes the sample by using the secondary charged particles detected by the detector;a light irradiation control system that is capable of setting at least one or more of a condition in which the light source applies the light, a first light irradiation condition, and a second light irradiation condition;a detection unit that detects the secondary charged particles emitted from the sample by the charged particle beam; andan image processing unit that forms a secondary charged particle image based on a detection signal of the secondary charged particles,whereinthe light source applies the light under the first light irradiation condition and the second light irradiation condition,the light source detects a change in a signal amount of the secondary charged particles detected by the detector between the first light irradiation condition and the second light irradiation condition by irradiating the sample with the light, andthe calculation unit determines at least any one of a material of the sample or a shape of the sample according to the changed signal amount.2. The charged particle beam device according to claim 1 , whereinthe calculation unit determines a feature of the sample from the secondary charged particle ...

Shielding strategy for mitigation of stray field for permanent magnet array

The present disclosure provides an inspection system and a method of stray field mitigation. The system includes an array of electron beam columns, a first permanent magnet array, and a plurality of shielding plates. The array of electron beam columns each includes an electron source configured to emit electrons toward a stage. The first permanent magnet array is configured to condense the electrons from each electron source into an array of electron beams. The first permanent magnet array is arranged at a first end of the array of electron beam columns. The plurality of shielding plates extend across the array electron beam columns downstream of the first permanent magnet array in a direction of electron emission. The array of electron beams pass through a plurality of apertures in each of the plurality of shielding plates, which reduces stray magnetic field in a radial direction of the array of electron beams.

SCINTILLATOR AND CHARGED PARTICLE RADIATION APPARATUS

The present invention provides: a scintillator which is reduced in the intensity of the afterglow, while having increased luminous intensity; and a charged particle radiation apparatus. A scintillator according to the present invention is characterized in that: a base material, a buffer layer, a light emitting part and a first conductive layer are sequentially stacked in this order; the light emitting part contains one or more elements that are selected from the group consisting of Ga, Zn, In, Al, Cd, Mg, Ca and Sr; and a second conductive layer is provided between the base material and the light emitting part.

METHOD AND SYSTEM FOR RECONSTRUCTING 3-DIMENSIONAL IMAGES FROM SPATIALLY AND TEMPORALLY OVERLAPPING X-RAYS

An x-ray imaging system and method for reconstructing three-dimensional images of a region of interest from spatially and temporally overlapping x-rays using novel reconstruction techniques. 1. An x-ray imaging system , comprising:a detector capable of generating a signal in response to x-rays incident upon the detector, wherein the signal indicates the intensity of the x-rays incident upon a pixel of the detector,a plurality of x-ray sources, wherein at least two of the plurality of x-ray sources are capable of emitting x-rays such that said x-rays pass through a region of interest (ROI) and spatially and temporally overlap at the pixel of the detector; anda processing unit capable of receiving the signal indicating the intensity of x-rays incident upon the pixel of the detector and generating an estimate of the intensity attributable to each of the two or more x-rays overlapping at the pixel of the detector.2. The system of claim 1 , wherein the processing unit is further capable of generating a three-dimensional representation of the ROI using one or more estimates of the intensity attributable to each of the two or more x-rays overlapping at the pixel of the detector.3. The system of claim 3 , further comprising a display operably coupled to the processing unit claim 3 , wherein the display is capable of displaying one or more two-dimensional views of the three-dimensional representation of the ROI.4. The system of claim 1 , wherein the plurality of x-ray sources comprises two or more emitter elements of a distributed source array.5. The system of claim 1 , wherein the processing unit is further capable of voxelizing the ROI into a plurality of three-dimensional claim 1 , non-overlapping voxels; estimating an attenuation coefficient attributable to each said voxel claim 1 , and re-voxelizing the ROI into a plurality of three-dimensional claim 1 , non-overlapping voxels based on the estimated attenuation coefficients attributable to each said voxel.6. The system ...

VERFAHREN UND SYSTEM ZUM UNTERSUCHEN VON VERPACKUNGEN

Non-destructive inspection system comprising neutron radiation source and neutron radiation method

A non-destructive inspection system 1 includes a neutron radiation source 3 capable of emitting neutrons N, and a neutron detector 14 capable of detecting neutrons Nb produced via an inspection object 6a among neutrons N emitted from the neutron radiation source 3. The neutron radiation source 3 includes a linear accelerator 11 capable of emitting charged particles P accelerated; a first magnet section 12 including magnets 12a and 12b facing each other, the magnets 12a and 12b being capable of deflecting the charged particles P in a direction substantially perpendicular to a direction of emission of the charged particles P from the linear accelerator 11; and a target section 13 capable of producing neutrons N by being irradiated with the charged particles P that have passed through the first magnet section 12.

MOVABLE X-RAY SYSTEM

Disclosed in the present invention is a movable X-ray system. According to an embodiment of the present invention, the movable X-ray system comprises: a main body unit; an X-ray source unit connected to the main body unit by a wire and coupled to be extendible, for discharging X-ray with an objected to be detected; and a detector unit connected to the main body unit by a wire and coupled to be extendible, for receiving the X-ray penetrated through the object to be detected and forming an image. COPYRIGHT KIPO 2017 ...

método para inspecionar embalagens para um produto lìquido e sistema para sua realização

Radiation inspection system and radiation inspection method

The present disclosure discloses a radiation inspection system and a radiation inspection method. The radiation inspection system comprises a radiation source and a beam modulating device. The beam modulating device comprises a first collimating structure disposed at a beam exit side of the radiation source and a second collimating structure disposed at a beam exit side of the first collimating structure. The second collimating structure is movable relative to the first collimating structure to change a relative position of the first collimating port of the first collimating structure with the second collimating port of the second collimating structure, and the beam modulating device is shifted between a first operational state in which the beam modulating device modulates an initial beam into a fan beam, and a second operational state in which the beam modulating device modulates the initial beam into a pencil beam variable in position.

INSPECTION APPARATUS AND INSPECTION METHOD

An inspection apparatus for inspecting an inspection target object, includes an X-ray generation tube having a target including an X-ray generation portion that generates X-rays by irradiation with an electron beam, and configured to emit X-rays to the inspection target object, and a plurality of X-ray detectors, wherein each of the plurality of X-ray detectors detects X-rays emitted from a foreign substance existing on an inspection target surface of the inspection target object irradiated with the X-rays from the X-ray generation portion and totally reflected by the inspection target surface.

METHOD AND APPARATUS FOR PORTABLE NEUTRON INTERROGATION

A portable neutron generating system for SNM inspection that includes charge storage device configured to store a high voltage electrical charge and a controller to selectively electrically connect the charge to a plasma generator. The plasma generator is configured to generate a plasma, which in turn generates neutrons, in response to the electrical charge being provided to the plasma generator. A high voltage switch is located between the charge storage device and the plasma generator and is configured to electrically discharge the high voltage charge on the charge storage device to the plasma generator. The plasma generator is removably attachable to the portable neutron generating system such that it may be easily removed from the portable neutron generating system when the gas inside the plasma generator is at end of life and a refreshed plasma generator easily connected to the portable neutron generating system.

Stationäre CT-Vorrichtung

Stationäre CT-Vorrichtung, die Folgendes umfasst: eine Abtastpassage; eine stationäre Röntgenstrahlenquelle, die um die Abtastpassage herum eingerichtet ist und mehrere Strahlenemissionsbrennflecke umfasst; und mehrere stationäre Detektormodule, die um die Abtastpassage herum eingerichtet sind und der Röntgenstrahlenquelle gegenüberliegend angeordnet sind.

FIXED CT DEVICE

A fixed CT device (10) comprises a scan channel (4); fixed carbon-nano X-ray sources (7) arranged along the scan channel (4), the X-ray sources (7) comprising multiple ray emission points (71); and multiple fixed detector modules (12) arranged around the scan channel (4) and opposite to the X-ray sources (7), viewed from the plane intersecting the scan channel (4), at least some of the multiple detector modules (12) being arranged to be approximately L-shaped or inverted-U-shaped. With the design of the optimized carbon-nano X-ray sources and detector modules, a CT without a rotating frame is constructed, so that identification of peculiar matters in the to-be-detected object is implemented, thereby being applicable to safety check of luggage.

Rapid ore analysis to enable bulk sorting using gamma-activation analysis

An apparatus for bulk ore sorting using gamma activation analysis is disclosed. The apparatus includes a conveyor system that includes one or more conveyor belts, surrounded by one or more radiation shields, to transport ore material along a transport path. A pulsed X-ray radiation source is configured to irradiate ore material at an irradiation region and one or more detectors are configured to detect a gamma radiation output from irradiated ore material at a detection region. The transport path has a bend, located between the irradiation region and the detection region, and about a vertical axis, of at least 45 degrees. The one or more detectors are configured to detect a radiation output from the irradiated ore material at times between X-ray pulses of the pulsed X-ray radiation source irradiating the ore material.

RAPID ORE ANALYSIS TO ENABLE BULK SORTING USING GAMMA-ACTIVATION ANALYSIS

An apparatus for bulk ore sorting using gamma activation analysis is disclosed. The apparatus includes a conveyor system that includes one or more conveyor belts, surrounded by one or more radiation shields, to transport ore material along a transport path. A pulsed X-ray radiation source is configured to irradiate ore material at an irradiation region and one or more detectors are configured to detect a gamma radiation output from irradiated ore material at a detection region. The transport path has a bend, located between the irradiation region and the detection region, and about a vertical axis, of at least 45 degrees. The one or more detectors are configured to detect a radiation output from the irradiated ore material at times between X-ray pulses of the pulsed X-ray radiation source irradiating the ore material.

X-RAY SCANNING SYSTEM AND METHOD

A scanning system for scanning an object, and a corresponding bracket and method are described. The system has a scanning chamber in which the object to be scanned is received. The system also has a displacement assembly which displaces the object along a displacement path passing at least partially through the scanning chamber. The system also includes a source for emitting electromagnetic (EM) radiation or X-rays against the object within the scanning chamber such that at least some of the EM radiation passes through the object. The source is angled relative to the displacement path at an angle in a range between about 5° to about 8° and about 22° to about 30°. Finally, the system may also have detectors arranged around the scanning chamber which detect the EM radiation which passes through the object. The system, bracket, and method allow for the production of representative three-dimensional views of the object.

Scanning imaging system for security inspection of an object and imaging method thereof

The disclosure provides a scanning imaging system for security inspection of an object and an imaging method thereof, the system comprising: a conveying unit configured for bringing the object to move along a conveying direction; a plurality of radiographic sources at one side of the conveying unit, being arranged successively in a direction vertical to a plane, in which the conveying unit is located, and configured for alternately emitting ray beams to form a scanning area; a linear detector array at the other side of the conveying unit, being configured for detecting first projection images, which are formed after the ray beams emitted by the plurality of radiographic sources penetrate through the object, in the process of the object passing through the scanning area; an imaging unit configured for obtaining a first reconstructed image of the object based on the first projection images of the plurality of radiographic sources.

IMAGING SYSTEMS AND METHODS OF OPERATING THE SAME

Disclosed herein is a method of operating an imaging system which comprises (A) an image sensor comprising (a) a top surface, (b) M physically separate active areas on the top surface, and (c) a dead zone on the top surface and between the M active areas, and (B) a radiation source system which comprises an electron bombardment target, the method comprising: for i=1, . . . , N, sequentially causing emission of X-ray photons (i) from a radiation position (i) by causing electrons to bombard a target surface of the electron bombardment target at the radiation position (i); and for i=1, . . . , N, in response to the emission of the X-ray photons (i), capturing M images (i) of portions (i) of a same object, respectively in the M active areas, resulting in M×N images, wherein each point of the object is captured in at least one image of the M×N images.

METHODS AND APPARATUS FOR RADIOGRAPHIC SOURCE EXPOSURE

Disclosed example radiographic source exposure devices include: a radiographic source capsule having a radionuclide; a radiographic shield; a channel within the radiographic shield, the channel having a first end and a second end; and a replaceable tube configured to guide a radiographic source capsule between a stored position and an exposed position in which at least a portion of the radiographic source capsule is exposed to an exterior of the radiographic shield.

X-RAY GENERATOR OUTPUT REGULATION

The techniques and device provided herein relate to regulating a source generator in an X-ray based equipment. In particular, an X-ray system is provided that comprises an X-ray generator and a reference detector system that regulates the output of the X-ray generator. The reference detector system comprises a direct channel that allows at least a portion of the photons to directly reach the detector crystal and a plurality of fluorescent channels, such that photon flux entering the reference detector from the fluorescent channels is negligibly impacted by variations of beam spots, shapes and/or positions.

SCANNING IMAGING SYSTEM FOR SECURITY INSPECTION OF AN OBJECT AND IMAGING METHOD THEREOF

The disclosure provides a scanning imaging system for security inspection of an object and an imaging method thereof, the system comprising: a conveying unit configured for bringing the object to move along a conveying direction; a plurality of radiographic sources at one side of the conveying unit, being arranged successively in a direction vertical to a plane, in which the conveying unit is located, and configured for alternately emitting ray beams to form a scanning area; a linear detector array at the other side of the conveying unit, being configured for detecting first projection images, which are formed after the ray beams emitted by the plurality of radiographic sources penetrate through the object, in the process of the object passing through the scanning area; an imaging unit configured for obtaining a first reconstructed image of the object based on the first projection images of the plurality of radiographic sources.

Detection system for X-ray inspection of an object

A detection system serves for X-ray inspection of an object. An imaging optical arrangement serves to image the object in an object plane illuminated by X-rays generated by an X-ray source. The imaging optical arrangement comprises an imaging optics to image a transfer field in a field plane into a detection field in a detection plane. A detection array is arranged at the detection field. An object mount holds the object to be imaged and is movable relative to the X-ray source via an object displacement drive along at least one lateral object displacement direction in the object plane. A shield stop with a transmissive shield stop aperture is arranged in an arrangement plane in a light path and is movable via a shield stop displacement drive in the arrangement plane. A control device has a drive control unit, which is in signal connection with the shield stop displacement drive and with the object displacement drive for synchronizing a movement of the shield stop displacement drive and ...

Controlling process parameters by means of radiographic online determination of material properties when producing metallic strips and sheets

A method and a device for determining the material properties of a polycrystalline, in particular metallic, product during production or quality control of the polycrystalline, in particular metallic, product by means of X-ray diffraction using at least one X-ray source and at least one X-ray detector. In this case, an X-ray generated by the X-ray source is directed onto a surface of the polycrystalline product and the resulting diffraction image of the X-ray is recorded by the X-ray detector. After exiting the X-ray source, the X-ray is passed through an X-ray mirror, wherein the X-ray is both monochromatized and focused, by the X-ray mirror, in the direction of the polycrystalline product and/or the X-ray detector, and then reaches a surface of the metallic product.

Charged particle beam device

The present invention provide a charged particle beam device capable of clearly identifying a material and a shape of a sample surface even though a film thickness of a layer formed on the sample surface is thin and it is difficult to obtain a contrast of an observation image. A charged particle beam device according to the present invention changes a signal amount of emitted charged particles by irradiating the sample with light due to irradiation under a plurality of light irradiation conditions, and determines at least any one of a material of the sample or a shape of the sample according to the changed signal amount.

X-ray generator output regulation

The techniques and device provided herein relate to regulating a source generator in an X-ray based equipment. In particular, an X-ray system is provided that comprises an X-ray generator and a reference detector system that regulates the output of the X-ray generator. The reference detector system comprises a direct channel that allows at least a portion of the photons to directly reach the detector crystal and a plurality of fluorescent channels, such that photon flux entering the reference detector from the fluorescent channels is negligibly impacted by variations of beam spots, shapes and/or positions.

Stationary CT apparatus

A stationary CT apparatus and a method of controlling the same are disclosed. The stationary CT apparatus comprises: a scanning passage; a stationary carbon nanotube X-ray source arranged around the scanning passage and comprising a plurality of ray emission focal spots; and a plurality of stationary detector modules arranged around the scanning passage and disposed opposite the X-ray source. In addition, at least some of the plurality of detector modules are arranged in a substantially L shape or a substantially Π shape when viewed in a plane intersecting the scanning passage. Reconstruction of the CT apparatus without a rotary gantry is achieved and special substances in an object under inspection is identified by optimizing design of the carbon nanotube X-ray source and the detector device. The present invention ensures that the stationary gantry type CT system has a small size and a high accuracy. The present invention is particularly suitable for safety inspection of baggage.

METHOD FOR CORRECTING THE NONLINEARITY ASSOCIATED WITH PHOTON COUNTING DETECTORS OF IMAGING DEVICES

A method for calibrating an imaging device comprising a photon counting detector (PCD), the method comprising: providing (i) an X-ray source configured to emit an X-ray beam, (ii) a first detector array configured to be in alignment with the X-ray beam, wherein the first detector array comprises a plurality of energy integrating detectors (EID) for detecting the X-ray beam emitted by the X-ray source, and (iii) a second detector array configured to be in alignment with the X-ray beam, wherein the second detector array comprises a plurality of photo counting detectors (PCD) for detecting the X-ray beam emitted by the X-ray source; detecting an X-ray beam passed through an object to be scanned with the plurality of energy integrating detectors (EID); recording the X-ray beam passed through the object to be scanned and detected by the plurality of energy integrating detectors (EID) as a first data set; detecting an X-ray beam passed through the object to be scanned with the plurality of photo ...

X-RAY SCANNING SYSTEM AND METHOD

A scanning system for scanning an object, and a corresponding bracket and method are described. The system has a scanning chamber in which the object to be scanned is received. The system also has a displacement assembly which displaces the object along a displacement path passing at least partially through the scanning chamber. The system also includes a source for emitting electromagnetic (EM) radiation or X-rays against the object within the scanning chamber such that at least some of the EM radiation passes through the object. The source is angled relative to the displacement path at an angle in a range between about 5° to about 8° and about 22° to about 30°. Finally, the system may also have detectors arranged around the scanning chamber which detect the EM radiation which passes through the object. The system, bracket, and method allow for the production of representative three-dimensional views of the object. 1. A scanning system for scanning an object comprising:a scanning chamber for receiving the object to be scanned;a displacement assembly for displacing the object along a displacement path passing at least partially through the scanning chamber;a source mountable about the scanning chamber for emitting electromagnetic radiation against the object in the scanning chamber at an angle in a range between about 5° to about 8° and about 22° to about 30° relative to the displacement path so that the electromagnetic radiation impacts and passes through the object as it is displaced through the scanning chamber along the displacement path; anda plurality of detectors mounted at least partially about the scanning chamber, each detector configured for detecting the electromagnetic radiation passed through the object, thereby scanning the object.2. A scanning system according to claim 1 , wherein the displacement path is horizontal.3. A scanning system according to claim 1 , wherein the source is inclined at an angle relative to the displacement path in a range ...

SYSTEM AND METHOD FOR ELECTRON CRYOMICROSCOPY

A system and corresponding method for electron cryomicroscopy, comprising: a field-emission gun for generating an electron beam, the field-emission gun being energized, in use, to generate a 80 keV to 120 keV electron beam which is emitted into a vacuum enclosure and towards a specimen holder; the vacuum enclosure containing, at least in part: an objective lens for focusing an image of the specimen, the objective lens being disposed in the path of the electron beam and having a chromatic aberration coefficient, Cc, selected to achieve a resolution value better than a desired amount; the specimen holder for holding a specimen, the specimen holder being disposed in the path of the electron beam; a cryostage for cooling a specimen; a cryo-shield for surrounding a specimen and reducing an ice contamination rate of the specimen; and a direct electron detector comprising an array of pixels, each pixel capable of detecting an incident electron that has passed through a sample and struck the pixel ...

X-ray generator and x-ray imaging device

This X-ray generator is provided with an X-ray generation unit, a housing case housing the X-ray generation unit, and an insulating component disposed between the inner surface of the housing case and at least a part of the X-ray generation unit. The insulating component includes a first insulating member and a second insulating member. The first insulating member includes a first portion having a first surface and a second portion having a second surface. A level difference is formed by the first surface and the second surface. The second portion is thinner than the first portion. The second surface forms the level difference with the first surface, and the second portion is thinner than the first portion. An adhesion surface of the second insulating member and the second surface of the first insulating member are bonded together by means of an adhesive material. The second surface has better flatness than the flatness of the first surface.

Wafer inspection apparatus and wafer inspection method

The present disclosure provides a wafer inspection technology that involves less degradation of the image quality even when an object to be observed has a variation in height due to warpage, etc. of a wafer. This wafer inspection apparatus obtains an image with less degradation by: adjusting the focal point of an observation optical system to a height measured by a height sensor for measuring wafer surface heights; and further, correcting a switching signal for a CCD line sensor on the basis of stage position data and optical magnification data corresponding to the height so as to make a correction corresponding to the wafer surface height.

TWO-STEP MATERIAL DECOMPOSITION CALIBRATION METHOD FOR A FULL SIZE PHOTON COUNTING COMPUTED TOMOGRAPHY SYSTEM

A method and a system for providing calibration for a photon counting detector forward model for material decomposition. The flux independent weighted bin response function is estimated using the expectation maximization method, and then used to estimate the pileup correction terms at each tube voltage setting for each detector pixel.

NONDESTRUCTIVE INSPECTING SYSTEM, NEUTRON RADIATION SOURCE, AND NEUTRON RADIATION METHOD

A non-destructive inspection system 1 includes a neutron radiation source 3 capable of emitting neutrons N, and a neutron detector 14 capable of detecting neutrons Nb produced via an inspection object 6a among neutrons N emitted from the neutron radiation source 3. The neutron radiation source 3 includes a linear accelerator 11 capable of emitting charged particles P accelerated; a first magnet section 12 including magnets 12a and 12b facing each other, the magnets 12a and 12b being capable of deflecting the charged particles P in a direction substantially perpendicular to a direction of emission of the charged particles P from the linear accelerator 11; and a target section 13 capable of producing neutrons N by being irradiated with the charged particles P that have passed through the first magnet section 12.

STATIONARY CT APPARATUS

A stationary CT apparatus and a method of controlling the same. The stationary CT apparatus includes: a scanning passage; a stationary carbon nanotube X-ray source arranged around the scanning passage and comprising a plurality of ray emission focal spots; and a plurality of stationary detector modules arranged around the scanning passage and disposed opposite the X-ray source. At least some of the plurality of detector modules are arranged in a substantially L shape or a substantially Π shape when viewed in a plane intersecting the scanning passage. Reconstruction of the CT apparatus without a rotary gantry is achieved and special substances in an object under inspection is identified by optimizing design of the carbon nanotube X-ray source and the detector device. The invention ensures that the stationary gantry type CT system has a small size and a high accuracy and is particularly suitable for safety inspection of baggage.

METHOD AND APPARATUS FOR SCHOTTKY TFE INSPECTION

The present disclosure is related to a Schottky thermal field (TFE) source for emitting an electron beam. Electron optics can adjust a shape of the electron beam before the electron beam impacts a scintillator screen. Thereafter, the scintillator screen generates an emission image in the form of light. An emission image can be adjusted and captured by a camera sensor in a camera at a desired magnification to create a final image of the Schottky TFE source's tip. The final image can be displayed and analyzed to for defects.

ARRAYED X-RAY SOURCE AND X-RAY IMAGING APPARATUS

An arrayed X-ray source and an X-ray imaging apparatus are described. An example X-ray source includes a housing and X-ray generators located in the housing. The X-ray generators are arranged in an array. The X-ray generators are provided separately from each other and configured to emit X-rays independently of each other.

CONTROLLING THE PROCESS PARAMETERS BY MEANS OF RADIOGRAPHIC ONLINE DETERMINATION OF MATERIAL PROPERTIES WHEN PRODUCING METALLIC STRIPS AND SHEETS

A method and a device for determining the material properties of a polycrystalline, in particular metallic, product during production or quality control of the polycrystalline, in particular metallic, product by means of X-ray diffraction using at least one X-ray source and at least one X-ray detector. In this case, an X-ray generated by the X-ray source is directed onto a surface of the polycrystalline product and the resulting diffraction image of the X-ray is recorded by the X-ray detector. After exiting the X-ray source, the X-ray is passed through an X-ray mirror, wherein the X-ray is both monochromatized and focused, by the X-ray mirror, in the direction of the polycrystalline product and/or the X-ray detector, and then reaches a surface of the metallic product. 134-. (canceled)35. A method for determining the material properties of a polycrystalline , in particular metallic product during production or quality control of the polycrystalline , in particular metallic , product by means of X-ray diffraction using at least one X-ray source and at least one X-ray detector , wherein an X-ray generated by the X-ray source is directed onto a surface of the polycrystalline product by means of an X-ray mirror and the resulting diffraction image of the X-ray is recorded by the X-ray detector , whereinthe X-ray mirror is rotationally symmetrical and comprises a mirror surface on its inner circumferential surface, wherein the X-ray is passed through the X-ray mirror after exiting the X-ray source, wherein the X-ray experiences a Bragg's reflection on the mirror surface of the X-ray mirror and is both monochromatized and focused, by the X-ray mirror, in the direction of the polycrystalline product and/or the X-ray detector,and then reaches a surface of the metallic product, wherein the X-ray detector is designed in the form of a surface detector.36. The method according to claim 35 , wherein the mirror surface of the X-ray mirror is spherically curved or cylindrical with ...

X-ray instrument with ambient temperature detector

An X-ray analyzer comprises at least one detector configured to detect a secondary X-ray from a test object irradiated by an X-ray source, and provide a corresponding energy signal; a temperature sensor configured to sense a temperature related to the detector; and a signal processor configured to process the energy signal and provide a temperature compensated output for an X-ray event.

DETECTION SYSTEM FOR X-RAY INSPECTION OF AN OBJECT

A detection system serves for X-ray inspection of an object. An imaging optical arrangement serves to image the object in an object plane illuminated by X-rays generated by an X-ray source. The imaging optical arrangement comprises an imaging optics to image a transfer field in a field plane into a detection field in a detection plane. A detection array is arranged at the detection field. An object mount holds the object to be imaged and is movable relative to the light source via an object displacement drive along at least one lateral object displacement direction in the object plane. A shield stop with a transmissive shield stop aperture is arranged in an arrangement plane in a light path and is movable via a shield stop displacement drive in the arrangement plane. A control device has a drive control unit, which is in signal connection with the shield stop displacement drive and with the object displacement drive for synchronizing a movement of the shield stop displacement drive and ...

Inspection apparatus and inspection method

An inspection apparatus for inspecting an inspection target object, includes an X-ray generation tube having a target including an X-ray generation portion that generates X-rays by irradiation with an electron beam, and configured to emit X-rays to the inspection target object, and a plurality of X-ray detectors, wherein each of the plurality of X-ray detectors detects X-rays emitted from a foreign substance existing on an inspection target surface of the inspection target object irradiated with the X-rays from the X-ray generation portion and totally reflected by the inspection target surface.

SYSTEM AND METHOD FOR INSPECTING DEFECTS OF STRUCTURE BY USING X-RAY

A defect inspection system includes an X-ray generator that generates X-ray to be irradiated to a structure, and an X-ray detector that detects the X-ray generated by the X-ray generator and transmitted through the structure. In particular, the X-ray generator is configured to be moved by a first transporting means, and the X-ray detector is configured to be moved by a second transporting means. The system further includes a control unit configured to control and operate the first transporting means and the second transporting means.

METHOD AND SYSTEM FOR RECONSTRUCTING 3-DIMENSIONAL IMAGES FROM SPATIALLY AND TEMPORALLY OVERLAPPING X-RAYS

IMAGE ACQUISITION DEVICE, IMAGE ACQUISITION METHOD, AND IMAGE CORRECTION PROGRAM

Provided are an image acquisition device and an image acquisition method capable of acquiring the internal and external contours of a measured object with a high degree of accuracy. An image acquisition device includes: a first X-ray source that applies X-rays having a first focal point size; a first detector that detects X-rays applied from the first X-ray source and having passed through a measured object O; a first image generation means that generates a first X-ray CT image on the basis of the X-rays detected by the first detector ; a second X-ray source that applies X-rays having a second focal point size smaller than the first focal point size; a second detector that detects X-rays applied from the second X-ray source and having passed through the measured object O; a second image generation means that generates a second X-ray CT image on the basis of the X-rays detected by the second detector ; and an image correction means that corrects the first X-ray CT image generated by the first image generation means on the basis of the second X-ray CT image generated by the second image generation means 1. An image acquisition device comprising:a first X-ray source that applies X-rays having a first focal point size;a first detector that detects X-rays applied from the first X-ray source and having passed through a measured object;a first image generation means that generates a first X-ray CT image, based on the X-rays detected by the first detector;a second X-ray source that applies X-rays having a second focal point size smaller than the first focal point size;a second detector that detects the X-rays applied from the second X-ray source and having passed through the measured object;a second image generation means that generates a second X-ray CT image, based on the X-rays detected by the second detector; andan image correction means that corrects the first X-ray CT image generated by the first image generation means, based on the second X-ray CT image generated by ...

MULTI-ELECTRON BEAM INSPECTION APPARATUS AND ADJUSTMENT METHOD FOR THE SAME

According to the present invention, a desired one of multiple beams can be aligned with a small-diameter aperture quickly. A multi-electron beam inspection apparatus includes a beam selection aperture substrate including a first passage hole that passes all the multiple electron beams, a second passage hole through which one of the multiple electron beams is able to pass, a first slit, and a second slit not parallel to the first slit, an aperture moving unit moving the beam selection aperture substrate, a first detector detecting a current of a beam having passed through the first slit and a current of a beam having passed through the second slit, of the multiple electron beams, and a second detector detecting multiple secondary electron beams including reflected electrons, discharged from a substrate, due to application of the multiple electron beams, having passed through the first passage hole, to the substrate. The substrate is inspected based on an output signal from the second detector ...

Method and apparatus for Schottky TFE inspection

The present disclosure is related to a Schottky thermal field (TFE) source for emitting an electron beam. Electron optics can adjust a shape of the electron beam before the electron beam impacts a scintillator screen. Thereafter, the scintillator screen generates an emission image in the form of light. An emission image can be adjusted and captured by a camera sensor in a camera at a desired magnification to create a final image of the Schottky TFE source's tip. The final image can be displayed and analyzed to for defects.

METHOD AND SYSTEM FOR RECONSTRUCTING 3-DIMENSIONAL IMAGES FROM SPATIALLY AND TEMPORALLY OVERLAPPING X-RAYS

Fixed type CT apparatus

The invention discloses a fixed type CT apparatus and a control realization method. The fixed type CT apparatus comprises a scanning channel, a fixed type carbon nanometer X gamma ray source arranged around the scanning channel, and fixed multiple detector modules arranged around the scanning channel, wherein the X gamma ray source comprises multiple ray emission points, the multiple detector modules and the X gamma ray source are arranged to be opposite to each other, and when observed in a plane crossed with the scanning channel, at least some of the multiple detector modules are arranged to be substantially L-shaped or inserted-U shaped. According to the invention, through optimized design of a carbon nanometer gamma ray source and a detector apparatus, the CT reconstruction of a non-rotary frame is finished, and identification of a specific substance in a detected object is realized. The fixed type CT apparatus ensures the small dimension and high precision of a fixed frame CT system ...

AN ENERGY DISPERSIVE X-RAY DIFFRACTION ANALYSER HAVING AN IMPROVED REFLECTION GEOMETRY

An on-line energy dispersive X-ray diffraction (EDXRD) analyser for mineralogical analysis of material in a process stream or a sample is disclosed. The analyser includes a collimated X-ray source to produce a diverging beam of polychromatic X-rays, and an energy resolving X-ray detector, and a substantially X-ray transparent member having the form of a solid of revolution which is circularly symmetric about a central axis between the collimated X-ray source and the energy resolving X-ray detector, an outer surface of the X-ray transparent member positionable adjacent the material to be analysed. A primary beam collimator is disposed adjacent to or within the substantially X-ray transparent member to substantially prevent direct transmission of polychromatic X-rays emitted from the source to the detector. The analyser is configured such that the diverging beam of polychromatic X-rays are directed towards the substantially X-ray transparent member, and where the energy resolving X-ray detector collects a portion of the beam of X-rays diffracted by the material and outputs a signal containing energy information of the collected, diffracted X-rays. 1. An on-line energy dispersive X-ray diffraction (EDXRD) analyser for mineralogical analysis of material in a process stream or a sample , the EDXRD analyser comprising:a collimated X-ray source to produce a diverging beam of polychromatic X-rays;an energy resolving X-ray detector;a substantially X-ray transparent member having the form of a solid of revolution which is circularly symmetric about a central axis between the collimated X-ray source and the energy resolving X-ray detector, an outer surface of the X-ray transparent member positionable adjacent the material to be analysed; anda primary beam collimator disposed adjacent to or within the substantially X-ray transparent member, and configured to substantially prevent direct transmission of polychromatic X-rays emitted from the source to the detector;where the ...

Two-step material decomposition calibration method for a full size photon counting computed tomography system

A method and a system for providing calibration for a photon counting detector forward model for material decomposition. The flux independent weighted bin response function is estimated using the expectation maximization method, and then used to estimate the pileup correction terms at each tube voltage setting for each detector pixel.

X-RAY GENERATION APPARATUS AND X-RAY IMAGING APPARATUS

An X-ray generation apparatus includes an X-ray generation unit, a storage container configured to store the X-ray generation unit, and an insulating component arranged between an inner surface of the storage container and at least a part of the X-ray generation unit. The insulating component includes a first insulating member and a second insulating member, the first insulating member includes a first portion having a first surface, and a second portion having a second surface, a step difference is formed by the first surface and the second surface, and the second portion has a thickness smaller than that of the first portion, an adhesive surface of the second insulating member and the second surface of the first insulating member are connected by an adhesive material, and a flatness of the second surface is better than a flatness of the first surface. 1. An X-ray generation apparatus comprising:an X-ray generation unit;a storage container configured to store the X-ray generation unit; andan insulating component arranged between an inner surface of the storage container and at least a part of the X-ray generation unit,wherein the insulating component includes a first insulating member and a second insulating member, the first insulating member includes a first portion having a first surface, and a second portion having a second surface, a step difference is formed by the first surface and the second surface, and the second portion has a thickness smaller than that of the first portion,an adhesive surface of the second insulating member and the second surface of the first insulating member are connected by an adhesive material, anda flatness of the second surface is better than a flatness of the first surface.2. The X-ray generation apparatus according to claim 1 , wherein a flatness of the adhesive surface is better than the flatness of the first surface.3. The X-ray generation apparatus according to claim 1 , wherein the first insulating member includes a third ...

X-ray generation apparatus and X-ray imaging apparatus

An X-ray generation apparatus includes an X-ray generation unit, a storage container configured to store the X-ray generation unit, and an insulating component arranged between an inner surface of the storage container and at least a part of the X-ray generation unit. The insulating component includes a first insulating member and a second insulating member, the first insulating member includes a first portion having a first surface, and a second portion having a second surface, a step difference is formed by the first surface and the second surface, and the second portion has a thickness smaller than that of the first portion, an adhesive surface of the second insulating member and the second surface of the first insulating member are connected by an adhesive material, and a flatness of the second surface is better than a flatness of the first surface.

System and method for inspecting defects of structure by using X-ray

A defect inspection system includes an X-ray generator that generates X-ray to be irradiated to a structure, and an X-ray detector that detects the X-ray generated by the X-ray generator and transmitted through the structure. In particular, the X-ray generator is configured to be moved by a first transporting means, and the X-ray detector is configured to be moved by a second transporting means. The system further includes a control unit configured to control and operate the first transporting means and the second transporting means.

RADIATION INSPECTION SYSTEM AND RADIATION INSPECTION METHOD

The present disclosure discloses a radiation inspection system and a radiation inspection method. The radiation inspection system comprises a radiation source and a beam modulating device. The beam modulating device comprises a first collimating structure disposed at a beam exit side of the radiation source and a second collimating structure disposed at a beam exit side of the first collimating structure. The second collimating structure is movable relative to the first collimating structure to change a relative position of the first collimating port of the first collimating structure with the second collimating port of the second collimating structure, and the beam modulating device is shifted between a first operational state in which the beam modulating device modulates an initial beam into a fan beam, and a second operational state in which the beam modulating device modulates the initial beam into a pencil beam variable in position.

Stationary CT apparatus

A stationary CT apparatus and a method of controlling the same. The stationary CT apparatus includes: a scanning passage; a stationary carbon nanotube X-ray source arranged around the scanning passage and comprising a plurality of ray emission focal spots; and a plurality of stationary detector modules arranged around the scanning passage and disposed opposite the X-ray source. At least some of the plurality of detector modules are arranged in a substantially L shape or a substantially Π shape when viewed in a plane intersecting the scanning passage. Reconstruction of the CT apparatus without a rotary gantry is achieved and special substances in an object under inspection is identified by optimizing design of the carbon nanotube X-ray source and the detector device. The invention ensures that the stationary gantry type CT system has a small size and a high accuracy and is particularly suitable for safety inspection of baggage.

Battery Module Comprising Metal Particle-Dispersed Thermal Conductive Resin and Method and System for Inspecting Same

The present invention relates to a battery module comprising a particulate metal-dispersed thermal conductive resin, and a method and a system for inspecting same. The present invention can effectively inspect the degree of dispersion in the resin in a nondestructive manner and can detect a defect.

Energy-dispersive X-ray diffraction analyser comprising a substantially X-ray transparent member having an improved reflection geometry

An on-line energy dispersive X-ray diffraction (EDXRD) analyser for mineralogical analysis of material in a process stream or a sample is disclosed. The analyser includes a collimated X-ray source to produce a diverging beam of polychromatic X-rays, and an energy resolving X-ray detector, and a substantially X-ray transparent member having the form of a solid of revolution which is circularly symmetric about a central axis between the collimated X-ray source and the energy resolving X-ray detector, an outer surface of the X-ray transparent member positionable adjacent the material to be analysed. A primary beam collimator is disposed adjacent to or within the substantially X-ray transparent member to substantially prevent direct transmission of polychromatic X-rays emitted from the source to the detector. The analyser is configured such that the diverging beam of polychromatic X-rays are directed towards the substantially X-ray transparent member, and where the energy resolving X-ray detector ...

Solid material characterization with x-ray spectra in both transmission and fluoresence modes

Methods are disclosed utilizing synchrotron X-ray microscopy including x-ray fluorescence and x-ray absorption spectra to probe elemental distribution and elemental speciation within a material, and particularly a solid that may have one or more elements distributed on a solid substrate. Representative materials are relatively homogeneous in composition on the macroscale but relatively heterogeneous on the microscale. The analysis of such materials, particularly on a macroscale at which their heterogeneous nature can be observed, provides valuable insights into the relationships or correlations between localized concentrations of elements and/or their species, and concentrations of other components of the materials. Sample preparation methods, involving the use of a reinforcing agent, which are advantageously used in such methods are also disclosed.

Differential phase contrast x-ray imaging system and components

A differential phase contrast X-ray imaging system includes an X-ray illumination system, a beam splitter arranged in an optical path of the X-ray illumination system, and a detection system arranged in an optical path to detect X-rays after passing through the beam splitter.

Method and apparatus for correcting artifacts during generation of x-ray images, in particular computed tomography, or radiography by means of temporal modulation of primary radiation

Artifacts caused by scattered radiation when generating X-ray images of objects are corrected using a temporally alterable modulation of the primary radiation. A respective set of originally amplitude-modulated modulation projections of the object is generated and a respective scattered image allocated to the respective modulation projections is calculated. The method is particularly suitable for fast CT scans.

Conveyor system and measuring device for determining water content of a construction material

A system is provided. The system includes a conveyor apparatus configured for conveying a material and a water content measurement system positioned about the conveyor apparatus for determining water content in the material. A dimension characteristic measurement system for detecting one or more dimension characteristics of the material is provided and a computer device is configured to manipulate data received from the water content measurement system and the dimension characteristic measurement system to determine a water content of the material.

TALBOT-LAU X-RAY SOURCE AND INTERFEROMETRIC SYSTEM

An x-ray source and an x-ray interferometry system utilizing the x-ray source are provided. The x-ray source includes a target that includes a substrate and a plurality of structures. The substrate includes a thermally conductive first material and a first surface. The plurality of structures is on or embedded in at least a portion of the first surface. The structures are separate from one another and are in thermal communication with the substrate. The structures include at least one second material different from the first material, the at least one second material configured to generate x-rays upon irradiation by electrons having energies in an energy range of 0.5 keV to 160 keV. The x-ray source further includes an electron source configured to generate the electrons and to direct the electrons to impinge the target and to irradiate at least some of the structures along a direction that is at a non-zero angle relative to a surface normal of the portion of the first surface. The x-ray source further includes at least one optical element positioned such that at least some of the x-rays are transmitted through the first material and to or through the at least one optical element. 1. An x-ray source comprising: a substrate comprising a thermally conductive first material and a first surface; and', 'a plurality of structures on or embedded in at least a portion of the first surface, the structures separate from one another and in thermal communication with the substrate, the structures comprising at least one second material different from the first material, the at least one second material configured to generate x-rays upon irradiation by electrons having energies in an energy range of 0.5 keV to 160 keV; and, 'a target comprisingan electron source configured to generate the electrons and to direct the electrons to impinge the target and irradiate at least some of the structures along a direction that is at a non-zero angle relative to a surface normal of the ...

Multi-radiation unit and radiation imaging system including the unit

A multi-radiation unit includes: a multi-radiation tube which has a plurality of electron sources, a plurality of targets and an intermediate electrode having openings through which electrons emitted from the electron sources pass; a selection circuit that allows electrons to be emitted from a selected electron source selected from the plurality of electron sources; an intermediate electrode potential defining unit that defines a potential of the intermediate electrode; a storage unit that stores, for each of the plurality of electron sources, an electrostatic control condition of the intermediate electrode for obtaining a predetermined irradiated state of a target corresponding to the selected electron source; and a changing unit that changes, when electrons are emitted from the selected electron source, the electrostatic control condition of the intermediate electrode based on the electrostatic control condition stored in the storage unit for the selected electron source.

SYSTEM AND METHOD FOR X-RAY ABSORPTION SPECTROSCOPY USING A CRYSTAL ANALYZER AND A PLURALITY OF DETECTOR ELEMENTS

A fluorescence mode x-ray absorption spectroscopy apparatus includes an electron bombardment source of x-rays, a crystal analyzer, the source and the crystal analyzer defining a Rowland circle having a Rowland circle radius (R), a detector, and at least one stage configured to position a sample at a focal point of the Rowland circle with the detector facing the sample. 1. A fluorescence mode x-ray absorption spectroscopy apparatus comprising:a source of x-rays comprising at least one target configured to generate x-rays upon bombardment by electrons;a crystal analyzer, the source and the crystal analyzer defining a Rowland circle having a Rowland circle radius (R);a detector; andat least one stage configured to position a sample at a focal point of the Rowland circle with the detector facing the sample.2. The fluorescence mode x-ray absorption spectroscopy apparatus of claim 1 , wherein the crystal analyzer is positioned on the Rowland circle in a tangential plane claim 1 , the crystal analyzer comprising crystal planes curved along at least one direction within at least the tangential plane with a radius of curvature substantially equal to twice the Rowland circle radius (2R) claim 1 , the crystal planes configured to receive x-rays and to disperse the received x-rays according to Bragg's law claim 1 , the detector comprising a spatially resolving detector configured to receive at least a portion of the dispersed x-rays.3. The fluorescence mode x-ray absorption spectroscopy apparatus of claim 2 , wherein the spatially resolving detector comprises a plurality of x-ray detection elements having a tunable first x-ray energy and/or a tunable second x-ray energy claim 2 , the plurality of x-ray detection elements configured to measure received dispersed x-rays having x-ray energies below the first x-ray energy while suppressing measurements of the received dispersed x-rays above the first x-ray energy and/or to measure the received dispersed x-rays having x-ray energies ...

MULTIPLEXING X-RAY FLUORESCENCE SYSTEM AND METHOD

A multiplexing x-ray fluorescence (MXRF) system and method are provided. The system can include a simple detector that counts x-rays with time resolution. A time-variable applied radiation source is used. The MXRF applied radiation source can produce an excitation spectrum with a peak average energy that grows with time and then recycles. Elemental identification can be achieved by time-correlating x-ray counts detected by the detector, with the time-variable applied radiation field. The system and method provide design flexibility for both commercial and NASA applications. 1. An x-ray fluorescence detection system comprising:a first source of ionizing radiation that, when activated, provides low energy x-rays directed toward a sampling area;a second source of ionizing radiation that, when activated, produces high energy x-rays directed toward the sampling area, the high energy x-rays being of higher energy than the low energy x-rays;{'sub': 1', '2, 'a control unit configured to control activation of the first source and of the second source, alternately and intermittently, so that the first source is activated during a time interval Twhile the second source is not activated, and so that the second source is activated during a time interval Twhile the first source is not activated; and'}a detector spaced away from the sampling area and configured to detect characteristic x-rays produced by a sample in the sampling area upon excitation of atoms in the sample, caused by one or both of the low energy x-rays and the high energy x-rays.2. The x-ray fluorescence detection system of claim 1 , further comprising a processor claim 1 , wherein the processor is configured to correlate a level of detection of the characteristic x-rays with the time intervals Tand T.3. The x-ray fluorescence detection system of claim 2 , wherein the control unit comprises the processor.4. The x-ray fluorescence detection system of claim 1 , further comprising a plurality of additional sources of ...

SERIAL SYNCHROTRON CRYSTALLOGRAPHY SAMPLE HOLDING SYSTEM

A fixed target sample holder for serial synchrotron crystallography comprising a goniometer compatible base, a carrier, a sample holding insert which can be placed into the carrier. The sample holding insert comprising fiducials and windows, wherein each of the windows are respectively configured to accept a sample. The windows can also have holes and texture within each window. Additionally, a sample loading workstation for loading crystals into the sample holder and the removal of excess liquid from the sample, comprising a humidity-controlled chamber, a sample support within the chamber, a capture to place the goniometer-compatible base, and a channel in communication with the chamber that allows for the flow of humidified air into the chamber. 115-. (canceled)16. A fixed target sample holder for serial synchrotron crystallography at both room temperature and cryogenic temperature , comprising:a magnetic metal base sized and shaped to be compatible with a goniometer;a flat rigid carrier sheet attached to the base and centered on its axis, the carrier sheet forming at least one aperture;an X-ray transparent polymer sample support film comprising a pattern of regions of at least two thicknesses, that spans and is sealed to at least one aperture of the carrier;a set of fiducials on thick portions of the sample support film to define a coordinate system on the film; anda set of thin regions on the sample support film that act as transparent windows for examining samples;wherein each of the thin windows of the sample support film are configured to accept a sample containing one or more crystals in a liquid.17. The apparatus of claim 16 , where the carrier sheet has a width of less than 8 millimeters and preferably 2.5 millimeters claim 16 , and a length of approximately 18 mm.18. The apparatus of claim 16 , where the carrier sheet has a thickness between 25 and 500 micrometers.19. The apparatus of claim 16 , where the carrier sheet has a thickness of 50 to 500 ...

SCANNING IMAGING SYSTEM FOR SECURITY INSPECTION OF AN OBJECT AND IMAGING METHOD THEREOF

The disclosure provides a scanning imaging system for security inspection of an object and an imaging method thereof, the system comprising: a conveying unit configured for bringing the object to move along a conveying direction; a plurality of radiographic sources at one side of the conveying unit, being arranged successively in a direction vertical to a plane, in which the conveying unit is located, and configured for alternately emitting ray beams to form a scanning area; a linear detector array at the other side of the conveying unit, being configured for detecting first projection images, which are formed after the ray beams emitted by the plurality of radiographic sources penetrate through the object, in the process of the object passing through the scanning area; an imaging unit configured for obtaining a first reconstructed image of the object based on the first projection images of the plurality of radiographic sources. 1. A scanning imaging system for security inspection of an object , comprising:a conveying unit configured for bringing the object to move along a conveying direction of the conveying unit;a plurality of radiographic sources at one side of the conveying unit, the plurality of radiographic sources being arranged successively in a direction vertical to a plane, in which the conveying unit is located, and configured for alternately emitting ray beams to form a scanning area;a linear detector array at the other side of the conveying unit, the linear detector array being configured for detecting first projection images, which are formed after the ray beams emitted by the plurality of radiographic sources penetrate through the object, in the process of the object passing through the scanning area; andan imaging unit configured for obtaining a first reconstructed image of the object based on the first projection images of the plurality of radiographic sources.2. The scanning imaging system of claim 1 , wherein the plurality of radiographic sources ...

DETECTION OF ITEMS IN AN OBJECT

This disclosure relates to a system and method for detecting an item having at least one symmetry property inside an inspection object based on at least one transmission image. The method includes the steps: (a) detection of edges of individual items contained in the transmission image in order to produce an edge image; and (b) detection of the item by determining a symmetry line that can be associated with an item with at least one symmetry property contained in the transmission image based on pairs of edge picture elements of the edge image that are positioned symmetrically to each other relative to the symmetry line; and in step (b), in determining the symmetry line in the edge image, the only edge picture elements that are taken into account are those for which the symmetry line lies in an item contained in the transmission image, to which item the edge belongs. 1. A method for detecting an item inside an inspection object the method comprising:detecting edges of items contained in a transmission image of an inspection object in order to produce an edge image; anddetecting an item having at least one symmetry property by determining a symmetry line of the items contained in the transmission image, the symmetry line determined by detecting pairs of edge picture elements of the edge image that are positioned symmetrically to each other relative to the symmetry line that is to be determined, wherein, in the determining a symmetry line in the edge image, the only edge picture elements that are taken into account are those for which the symmetry line in the transmission image lies in the image region of the item to which the edge picture elements belong; andproducing an output classification associated with the item detected.2. The method according to claim 1 , further comprising: determining at least one feature descriptor for at least one image region in the vicinity of a selected edge picture element in the transmission image; andcomparing the at least one feature ...

Method of detecting polymorphs using synchrotron radiation

A method of detecting polymorphs using X-ray produced by a synchrotron source is described. In particular, the method allows to detect particular polymorphs present in small amounts in mixtures of polymorphic compounds present in a prevailing amount. The method offers a powerful resolution of mixtures of polymorph and finds application particularly in the pharmaceutical field.

MECHANICAL INTEGRITY TEST SYSTEM AND METHOD OF USING SAME

A system for more accurate mechanical integrity testing of a borehole and cavity has a mechanical integrity testing tool suspended by a wireline from surface to a test depth. Distributed temperature and acoustic sensing systems respectively record distributed temperature and noise measurements along the wireline. First and second pressure sensors measure uphole and downhole pressures. The mechanical integrity testing tool has an interface detection device, which can have an Iridium-192 gamma ray source having a shorter half-life relative to conventional sources. The interface level, distributed temperature measurements, and uphole and downhole pressure measurements can be used to calculate the volume and/or mass of test fluid that has leaked out of the borehole and/or cavity over the test period. The acoustic sensing system can be used to detect and confirm the presence of a leak. The temperature and/or acoustic sensing systems can be used to identify the location of the leak. 1. A system for conducting mechanical integrity testing of a borehole and underground cavity having a test fluid/brine interface therein , comprising:a wireline having at least a conductor, a first optical fiber, and a second optical fiber extending from surface through the borehole to about a test depth adjacent the interface;a control system operatively connected to the conductor and the first and second optical fibers at a surface end of the wireline and configured to emit at least a first laser beam through the first optical fiber and analyze the at least first laser beam to measure and record temperatures at a first plurality of axial segments along the first optical fiber, and emit at least a second laser beam through the second optical fiber and analyze the at least second laser beam to measure and record noise readings at a second plurality of axial segments along the second optical fiber;a first pressure sensor operatively connected to the control system and configured to detect an ...

ESTIMATING MULTI-ENERGY DATA IN A RADIATION IMAGING MODALITY

Multi-energy imaging is afforded with a single detector array by generating a first data set, indicative of a first radiation energy spectrum, using a first set of cells of the array, and by generating a second data set, indicative of a second radiation energy spectrum, using a second set of cells of the array (e.g., where substantially more cells are in the first set than the second). The first data set is comprised of measured data from the first set of cells and estimated data that would have been yielded from the second set of cells had the second set been configured to detect the first energy spectrum. The second data set is comprised of measured data yielded from the second set of cells and estimated data that would have been yielded from the first set of cells had the first set been configured to detect the second energy spectrum. 1. A method to estimate multi-energy data , comprising data indicative of a first radiation energy spectrum and data indicative of a second radiation energy spectrum , in a radiation imaging modality comprising a detector array comprised of a plurality of detector cells , a first set of the detector cells configured to detect the first radiation energy spectrum and a second set of the detector cells configured to detect the second radiation energy spectrum , the method comprising:generating a partial first data set using data yielded from the first set of detector cells, the partial first data set excluding data yielded from the second set of detector cells;generating a partial second data set using data yielded from the second set of detector cells, the partial second data set excluding data yielded from the first set of detector cells;estimating the data excluded from the partial first data set based upon the partial first data set to generate a complete first data set indicative of the first radiation energy spectrum; andestimating the data excluded from the partial second data set based upon the partial second data set and the ...

HIGH THROUGHPUT 3D X-RAY IMAGING SYSTEM USING A TRANSMISSION X-RAY SOURCE

A three-dimensional x-ray imaging system includes at least one detector and an x-ray source including an x-ray transmissive vacuum window. The x-ray source is configured to produce diverging x-rays emerging from the vacuum window and propagating along an x-ray propagation axis extending through a region of interest of an object to the at least one detector. The diverging x-rays have propagation paths within an angular divergence angle greater than 1 degree centered on the x-ray propagation axis. The system further includes at least one sample motion stage configured to rotate the object about a rotation axis. The system further includes a sample mount configured to hold the object and comprises a first portion in the propagation paths of at least some of the diverging x-rays and having an x-ray transmission greater than 30% for x-rays having energies greater than 50% of a maximum x-ray energy of an x-ray spectrum of the diverging x-rays. 1. A three-dimensional x-ray imaging system configured to generate a transmission image of a region of interest in an object , the system comprising:at least one position-sensitive x-ray detector comprising at least one active element;an x-ray source comprising an x-ray transmissive vacuum window having an outer surface, the x-ray source configured to produce diverging x-rays, at least some of the diverging x-rays emerging from the vacuum window and propagating along an x-ray propagation axis extending from the x-ray source, through the region of interest of the object, to the at least one active element of the at least one position-sensitive x-ray detector, the diverging x-rays having propagation paths within an angular divergence angle greater than 1 degree centered on the x-ray propagation axis, the x-ray propagation axis at a first angle with respect to the outer surface of the vacuum window, the first angle in a range of 3 degrees to 45 degrees;at least one sample motion stage configured to rotate the object about a rotation ...

SCINTILLATION ARRAY APPARATUS AND METHOD OF USE THEREOF

A scintillation material is longitudinally packaged in a circumferentially surrounding sheath, where the sheath has a lower index of refraction than the scintillation material, to form a scintillation optic or scintillation fiber optic. The scintillation material yields secondary photons upon passage of a charged particle beam, such as a positively charged residual particle beam having transmitted through a sample. The internally generated secondary photons within the sheath are guided to a detector element by the difference in index of refraction. Multiple scintillation optics are assembled to form a two-dimensional scintillation array coupled to a two-dimensional detector array, such as for use in determination of state of the residual charged particle beam, determination of an exit point of the particle beam from the sample, path of the treatment beam, and/or tomographic imaging. 1. A method for tomographic imaging of a tumor of a patient with positively charged particles , comprising the steps of: a longitudinal length of a first scintillation material comprising a first index of refraction; and', 'a cladding circumferentially enclosing said longitudinal length of said first scintillation material, said cladding comprising a second index of refraction, said second index of refraction less than said first index of refraction; and, 'transporting the positively charged particles along a beam transport line from an accelerator, through the tumor, and to a plurality of scintillation optics, a z-axis defined along a non-scattered positively charged particle path, of the positively charged particles, from the tumor to said plurality of scintillation optics, each scintillation optic of said plurality of scintillation optics comprisingdetecting secondary photons emitted from said first scintillation material, resultant from energy transfer from the positively charged particles, with a two-dimensional detector array optically coupled to a two-dimensional matrix of said ...

Radiographic imaging apparatus and method of controlling the same

Provided are a radiographic imaging apparatus and a method of controlling the same. The radiographic imaging apparatus includes a radiographic source configured to emit radiographic rays in a discontinuous eigen energy spectrum, a radiographic detector configured to receive the radiographic rays, convert the received radiographic rays into electrical signals, and count the number of photons having energy that exceeds a threshold energy, and a controller configured to adjust the threshold energy by comparing an energy spectrum of the detected radiographic rays with the eigen energy spectrum of the emitted radiographic rays from the radiographic source.

DIFFERENTIAL PHASE CONTRAST X-RAY IMAGING SYSTEM AND COMPONENTS

A differential phase contrast X-ray imaging system includes an X-ray illumination system, a beam splitter arranged in an optical path of the X-ray illumination system, and a detection system arranged in an optical path to detect X-rays after passing through the beam splitter. 118.-. (canceled)19. A method for X-ray illumination , comprising:providing a poly-energetic X-ray beam for illuminating an object to be imaged;reflecting a first portion of said poly-energetic X-ray beam, the first portion comprising X-rays that have energies less than a lower pass-band energy;transmitting a second portion of said poly-energetic X-ray beamattenuating said first portion of said poly-energetic X-ray beam;reflecting a third portion of said second portion of said poly-energetic X-ray beam, said third portion comprising X-rays that have energies less than an upper pass-band energy;attenuating a fourth portion of said second portion of said poly-energetic X-ray beam, the fourth portion comprising X-rays that are not reflected; andproviding said third portion of said second portion of said poly-energetic X-ray beam to illuminate said object to be imaged, wherein said third portion comprises X-rays having energies between said upper pass-band energy and said lower pass-band energy.20. The method according to claim 19 , wherein said reflecting said firstportion of said poly-energetic X-ray beam and said transmitting said second portion of said poly-energetic X-ray beam further comprises:directing said poly-energetic X-ray beam to be incident upon a membrane X-ray mirror comprising a reflecting layer that comprises a high-Z material on a support layer that comprises a low-Z material,wherein Z is an atomic number,wherein said high-Z material includes atomic elements with Z at least 42, andwherein said low-Z material includes atomic elements with Z less than 14. This application is a continuation of U.S. application Ser. No. 13/493,392, filed Jun. 11, 2012 which claims priority to U.S. ...

DUAL-ENERGY MICROFOCUS RADIOGRAPHIC IMAGING METHOD FOR MEAT INSPECTION

A system and method for foreign object detection in meat processing is provided. The system and method combine microfocus X-ray tubes with dual energy X-rays to detect foreign objects in meat products. A dual energy image processing algorithm analyzes the dual energy X-rays passed through the meat product to identify the foreign object present therein. An alarm or other notification is then generated in response to the detection of a foreign object. 1. A system for foreign object detection in poultry processing , comprising:a first microfocus X-ray tube outputting a first X-ray energy;a second microfocus X-ray tube outputting a second X-ray energy, the second X-ray energy differing from the first X-ray energy;at least one radiation detector positioned opposite the first and second microfocus X-ray tubes to receive dual energy X-rays emitted by the first and second microfocus X-ray tubes through an associated poultry product; receive an output from the at least one radiation detector of the dual energy X-rays through the associated poultry product,', 'determine, in accordance with a dual energy algorithm, a presence of at least two different foreign objects in the associated poultry product, and', 'generate an alarm responsive to determining the presence of the foreign object in the associated poultry product; and, 'an image processing system including a processor in communication with memory, the memory storing instructions which are executed by the processor causing the processor toan object identifier module in communication with the processor, wherein for each foreign object present in the associated poultry product, the object identifier module identifies a type of foreign object detected in the associated poultry product as bone, cartilage, metal, or plastic in accordance with the dual energy algorithm.2. The system for foreign object detection in poultry processing of claim 1 , further comprising an X-ray controller in communication with the processor claim 1 ...

System and method for colorizing a radiograph from cabinet x-ray systems

A cabinet X-ray image system for obtaining X-ray images and colorized or grey scale density X-ray images of a specimen includes a sampling chamber for containing the specimen, a display, an X-ray system including, an X-ray source, a photon counting X-ray detector, and a specimen platform, and a controller configured to selectively energize the X-ray source, control the photon counting X-ray detector to collect a projection X-ray image of the specimen when the X-ray source is energized, determine the density of different areas of the specimen from data collected from the photon counting X-ray detector of the projection X-ray image, create a density X-ray image of the specimen wherein different areas of the specimen are indicated as a density or range of densities based on the determined density of different areas of the specimen, and selectively display the density X-ray image of the specimen on the display.

SYSTEM WITH A SPATIALLY EXPANSIVE X-RAY SOURCE FOR X-RAY IMAGING

Disclosed herein is a system, comprising: a first X-ray source comprising a plurality of X-ray generators configured to respectively emit a plurality of X-rays toward an object; and a first X-ray detector configured to detect images of the object formed respectively by the plurality of X-rays from the first X-ray source. 1. A system , comprising:a first X-ray source comprising a plurality of X-ray generators configured to respectively emit a plurality of X-rays toward an object; anda first X-ray detector configured to detect images of the object formed respectively by the plurality of X-rays from the first X-ray source.2. The system of claim 1 , further comprising a computer system configured to reconstruct a three-dimensional structure of the object based on the images.3. The system of claim 1 , wherein the plurality of X-ray generators are configured to emit X-rays at different times.4. The system of claim 1 , wherein the plurality of X-ray generators are arranged in a row or in a grid.5. The system of claim 4 , wherein the grid is selected from a group consisting of a rectangular array claim 4 , a hexagonal array claim 4 , a pentagon array claim 4 , and a honeycomb array.6. The system of claim 1 , wherein the plurality of X-rays have different spatial distributions.7. The system of claim 1 , wherein each of the plurality of X-ray generators comprises:a cathode in a recess of a first substrate;a counter electrode on a sidewall of the recess, configured to cause field emission of electrons from the cathode; anda metal anode configured to receive the electrons emitted from the cathode and to emit X-ray from impact by the electrons on the metal anode.8. The system of claim 7 , wherein the cathode comprises a plurality of carbon nanotubes.9. The system of claim 7 , wherein the counter electrode is a continuous ring or dotted ring around the sidewall.10. The system of claim 7 , further comprising a shield electrode between the counter electrode and the metal anode ...

Multi source backscattering

An x-ray source for a backscatter imager can include a first electron beam (e-beam) emitter for emitting a first e-beam and at least a second e-beam emitter for emitting at least a second e-beam. The first and second e-beam emitters can be powered by a at least one power supply, and can be configured to direct the first e-beam and the second e-beam toward an anode. An interaction of the anode with the first and second e-beams produces x-rays. The x-ray source is configured to output an amount of x-rays equivalent to a conventional x-ray source that includes a single e-beam emitter. However, because the x-ray source uses at least two e-beam emitters and a single anode, the power source required to power the e-beam emitters can operate at a lower wattage than a conventional power source powering the single e-beam emitter. The x-ray source is thus lighter in weight and outputs less radiation than conventional systems with a comparable x-ray output.

DUAL-ENERGY DETECTION APPARATUS, SYSTEM AND METHOD

The present application relates to a dual-energy detection method, system and apparatus. The apparatus includes: a first pixel detector array proximal to a ray source, configured to detect ray source photons having relatively low energy; and a second pixel detector array distal from the ray source, configured to detect ray source photons having relatively high energy; wherein the first pixel detector array includes a plurality of rows of first pixel detectors, the first pixel detector including a first sensitive medium, a first photosensitive device, a first incidence plane, and a first window; the second pixel detector array includes a single row of second pixel detectors, the second pixel detector including a second sensitive medium, a second photosensitive device, a second incidence plane, and a second window; and each of the second pixel detectors has the same pixel area as corresponding plurality of first pixel detectors thereof. 1. A dual-energy detection apparatus , comprising:a first pixel detector array proximal to a ray source, configured to detect ray source photons having relatively low energy; anda second pixel detector array distal from the ray source, configured to detect the ray source photons having relatively high energy which have passed through the first pixel detector array;wherein the first pixel detector array comprises a plurality of rows of first pixel detectors, the first pixel detector comprising a first sensitive medium, a first photosensitive device, a first incidence plane for incidence of the ray source, and a first window coupled to the first photosensitive device, the first incidence plane facing towards the ray source;the second pixel detector array comprises a single row of second pixel detectors, the second pixel detector comprising a second sensitive medium, a second photosensitive device, a second incidence plane for incidence of the ray source, and a second window coupled to the second photosensitive device; andeach of the ...

Devices having an electron emitting structure

Controlling total emission current of an electron emitting construct in an x-ray emitting device by providing a cathode, providing multiple active areas each active area having a gated cone electron source, including multiple emitter tips arranged in an array, a gate electrode, and a gate interconnect lead connected to the gate electrode, providing an x-ray emitting construct comprising an anode, the anode being an x-ray target, situating the x-ray emitting construct facing the active areas face each other, selecting a set of active areas, and activating selected active areas by conductively connecting a voltage source to their associated the gate electrode interconnect lead.

MATERIAL IDENTIFICATION METHOD

A method for identifying a material contained in a sample. The sample is subjected to irradiation via ionizing electromagnetic radiation, for example X-rays. The sample is inserted between a source emitting the radiation and a spectrometric detector configured to acquire a spectrum of the radiation transmitted by the sample. The spectrum is subject to different treatment operations to enable classification of the material. The steps are, consecutively: reducing dimensionality, followed by projecting along the predefined projection vectors. Projection makes it possible to establish classification parameters, on the basis of which classification is established. 113-. (canceled)14: A method for classifying a material comprising:i) irradiating a sample comprising the material using an electromagnetic ionizing radiation as incident radiation, produced by an irradiation source;ii) detecting a radiation transmitted by the sample by a spectrometric detector, the sample being disposed between the irradiation source and the spectrometric detector, and acquiring a transmission spectrum of the radiation thus detected, the transmission spectrum being representative of an energy distribution of the radiation transmitted, the transmission spectrum comprising a number of channels, and representing a quantity of photons detected per channel, each channel corresponding to an energy range;iii) determining a set of parameters from the transmission spectrum, the set of parameters forming the coordinates of a vector of parameters, the vector of parameters representing the transmission spectrum, in an input space, the number of parameters of the set of parameters being strictly less than the number of channels of the transmission spectrum;iv) projecting the vector of parameters according to at least one projection vector, to obtain at least one projected datum, each projected datum resulting from the projection of the vector of parameters according to a projection vector;v) classifying ...

X-RAY GENERATION DEVICE AND X-RAY IMAGE CAPTURE SYSTEM

An X-ray generation device includes a cathode including an electron source generating an electron beam, an anode including a target to transmit an X-ray generated by collision of the electron beam, and a convergence electrode converging the electron beam toward the target. The target has a first region having a locally small thickness and a second region having a larger thickness than the first region. The X-ray generation device further includes a deflection unit to switch an incident position of the electron beam between the first region and the second region. The deflection unit has an adjustment mode to adjust an X-ray focal spot diameter and an X-ray generation mode to generate an X-ray, the electron beam is caused to enter the first region in the adjustment mode, and the electron beam is caused to enter the second region in the X-ray generation mode. 1. An X-ray generation device comprising: a cathode including an electron source that generates an electron beam; an anode including a transmission type target configured to transmit , in an incident direction of the electron beam , an X-ray generated by collision of the electron beam; and a convergence electrode that converges the electron beam toward the transmission type target ,wherein the transmission type target has a first region having a locally small thickness and a second region having a larger thickness than the first region,wherein the X-ray generation device further comprises an electron beam deflection unit configured to switch an incident position of the electron beam to the transmission type target between the first region and the second region, andwherein the electron beam deflection unit has an adjustment mode to adjust an X-ray focal spot diameter and an X-ray generation mode to generate an X-ray, the electron beam is caused to enter the first region in the adjustment mode, and the electron beam is caused to enter the second region in the X-ray generation mode.2. The X-ray generation device ...

SYSTEMS AND METHODS FOR ASSAYING AN ELUATE OF A RADIONUCLIDE GENERATOR

A system for assaying an eluate includes a radiation detection device, a fluid handling system, and a connection interface. The radiation detection device includes a collection reservoir, and is adapted to measure a radioactive content of a sample within the collection reservoir. The fluid handling system includes a fluid supply line, a suction line, and a fluid discharge line, each connected to the collection reservoir. The connection interface connects a radionuclide generator to the collection reservoir via the fluid handling system. The fluid handling system is configured to generate a negative pressure within the collection reservoir via the suction line such that an eluate from the radionuclide generator is supplied to the collection reservoir via the fluid supply line. 1. A system for assaying an eluate , the system comprising:a radiation detection device including a collection reservoir, the radiation detection device adapted to measure a radioactive content of a sample within the collection reservoir;a fluid handling system for delivering fluid to the collection reservoir, the fluid handling system including a fluid supply line, a suction line, and a fluid discharge line, each line connected to the collection reservoir; anda connection interface for connecting a radionuclide generator to the collection reservoir via the fluid handling system;wherein the fluid handling system is configured to generate a negative pressure within the collection reservoir via the suction line such that an eluate from the radionuclide generator is supplied to the collection reservoir via the fluid supply line.2. The system of claim 1 , wherein the fluid discharge line extends into the collection reservoir and adjacent a lower surface of the collection reservoir for removing fluid from the collection reservoir.3. The system of claim 1 , wherein the suction line includes an inlet positioned within the collection reservoir and above a liquid reference line within the collection ...

Debris Protection System For Reflective Optic Utilizing Gas Flow

The present disclosure is directed to a system for protecting a reflective optic and/or any other surface in a plasma-based illumination system from debris by actively flowing gas against the debris flow direction. According to various embodiments, a vacuum chamber is configured to contain a target material, wherein a laser or discharge produced plasma is generated in response to an excitation of the target material. One or more outlets within the chamber are configured to receive gas flowing from a fluidically coupled gas source and further configured to actively flow the gas towards a source of debris and away from the reflective optic or any other protected surface at a controlled flow rate.

METHODS OF EXTENDING A RANGE FOR ASSIGNING ATTRIBUTES TO AN OBJECT IN AN IMAGE

There is provided a method for assigning an attribute to x-ray attenuation including the steps of acquiring first and second reference material equivalent path length information associated with a first range of dual-energy x-ray attenuation information, acquiring second and third reference material equivalent path length information associated with a second range of dual-energy x-ray attenuation information, and, joining the first the first dual-energy x-ray attenuation information range with the second dual-energy x-ray attenuation information range using coefficients representing dual-energy x-ray attenuation information of the second reference material to define a third dual-energy x-ray attenuation information range upon which may be imposed dual-energy x-ray attenuation values within the third dual-energy x-ray attenuation information range to determine corresponding first reference material equivalent path lengths and third reference material equivalent path lengths. 1. A method for assigning an attribute to x-ray attenuation comprising:acquiring first and second reference material equivalent path length information associated with a first range of dual-energy x-ray attenuation information;acquiring second and third reference material equivalent path length information associated with a second range of dual-energy x-ray attenuation information; and,joining the first the first dual-energy x-ray attenuation information range with the second dual-energy x-ray attenuation information range using coefficients representing dual-energy x-ray attenuation information of the second reference material to define a third dual-energy x-ray attenuation information range upon which may be imposed dual-energy x-ray attenuation values within the third dual-energy x-ray attenuation information range to determine corresponding first reference material equivalent path lengths and third reference material equivalent path lengths.2. The method as in claim 1 , wherein the step of ...

X-RAY INSPECTION DEVICE

Provided is a highly reliable X-ray inspection device having two line sensors, in which accurate inspection results can be obtained even when there is displacement of the mounting position of the line sensors. The X-ray inspection device is provided with a conveyor unit for conveying an article, an X-ray emitter, a first line sensor, a second line sensor, a detection unit, and a corrected-image generation unit. The X-ray emitter emits X-rays to the article conveyed by the conveyor unit. The first line sensor detects, in a low energy band, X-rays that have passed through the article. The second line sensor detects, in a high energy band, X-rays that have passed through the article. The detection unit detects positional displacement of the second line sensor with respect to the first line sensor in horizontal direction and vertical direction. 1. An X-ray inspection device comprising:a conveying means configured to convey an article;an X-ray source configured to emit X-rays to the article conveyed by the conveying means;a first line sensor configured to detect, in a first energy band, X-rays that have passed through the article;a second line sensor configured to detect, in a second energy band being different from the first energy band, X-rays that have passed through the article;a detection unit configured to detect positional displacement of the second line sensor with respect to the first line sensor at least one direction of horizontal direction and vertical direction; anda corrected-image generation unit configured to generate, based on the detection results of the detection unit, a corrected second X-ray image by correcting a second X-ray image of the article obtained based on the detection results of the second line sensor.2. The X-ray inspection device according to claim 1 , whereinthe second line sensor is arranged below the first line sensor, and the second energy band is higher than the first energy band in energy.3. The X-ray inspection device according to ...

METHODS FOR 2-COLOR RADIOGRAPHY WITH LASER-COMPTON X-RAY SOURCES

High-contrast, subtraction, x-ray images of an object are produced via scanned illumination by a laser-Compton x-ray source. The spectral-angle correlation of the laser-Compton scattering process and a specially designed aperture and/or detector are utilized to produce/record a narrow beam of x-rays whose spectral content consists of an on-axis region of high-energy x-rays surrounded by a region of slightly lower-energy x-rays. The end point energy of the laser-Compton source is set so that the high-energy x-ray region contains photons that are above the k-shell absorption edge (k-edge) of a specific contrast agent or specific material within the object to be imaged while the outer region consists of photons whose energy is below the k-edge of the same contrast agent or specific material. Scanning the illumination and of the object by this beam will simultaneously record and map the above edge and below k-edge absorption response of the object. 1. A method , comprising:providing an x-ray beam that includes a first beam region having an energy that is greater than the k-shell absorption edge of a test element and wherein said x-ray beam further includes a second beam region having an energy that is less than the k-shell absorption edge of said test element;directing said x-ray beam onto a first location on an object;detecting first energy of said first beam region and second energy of said second beam after portions of each have transmitted through said first location;calculating the difference between said first energy and said second energy pattern; anddisplaying said difference.2. The method of claim 1 , further comprising producing said x-ray beam with a laser-Compton x-ray source.3. The method of claim 1 , wherein the step of displaying said difference comprises displaying said difference either as data or an image.4. The method of claim 1 , further comprising repeating the steps of a plurality of times at different locations.5. The method of claim 1 , further ...

METHOD AND APPARATUS FOR PROCESSING PHOTON-COUNTING X-RAY DETECTION DATA AND X-RAY APPARATUS

A higher accuracy beam hardening correction with a low calculation load is performed with objects whose elements have a wider range of effective atomic numbers Z, thereby contributing to presentation of more quantitative X-ray images. Of two or more X-ray energy bins, two X-ray bins are selected to normalize X-ray attenuation amount μt in those bins such that one or more normalized X-ray attenuation amounts are obtained at each pixel areas. From reference information indicating a theoretical relationship of correspondence between the normalized X-ray attenuation amounts and effective atomic numbers of elements, one ore more effective atomic numbers are estimated every pixel area. Among the one or more effective atomic numbers (Z, Z) and an effective atomic number (Zm) preset for the beam hardening correction, two or more atomic numbers are subjected to their equality determination. 2. The processing method of claim 1 , whereinthe X-ray energy bins are previously set and three or more in number, andthe normalization step obtains the two or more normalized X-ray attention amounts in a state where combinations of the two X-ray energy bins selected from the X-ray energy bins are different.3. The processing method of claim 2 , whereinthe estimation step obtains two or more effective atomic numbers from the two or more normalized X-ray attenuation amounts obtained by the normalization step; andthe equality determining step makes comparison between two or more effective atomic numbers consisting of i) the two or more effective atomic numbers obtained by the estimation step and ii) the effective atomic number preset for the correction step.4. The processing method of claim 1 , whereinthe equality determining step includesa calculation step calculating a difference between two numbers selected among atomic numbers consisting of i) the one or more effective atomic number estimated by the estimating step and ii) the effective atomic number preset for the correction step; anda ...

TALBOT X-RAY MICROSCOPE

Systems for x-ray microscopy using an array of micro-beams having a micro- or nano-scale beam intensity profile to provide selective illumination of micro- or nano-scale regions of an object. An array detector is positioned such that each pixel of the detector only detects x-rays corresponding to a single micro-or nano-beam. This allows the signal arising from each x-ray detector pixel to be identified with the specific, limited micro- or nano-scale region illuminated, allowing sampled transmission image of the object at a micro- or nano-scale to be generated while using a detector with pixels having a larger size and scale. Detectors with higher quantum efficiency may therefore be used, since the lateral resolution is provided solely by the dimensions of the micro- or nano-beams. The micro- or nano-scale beams may be generated using a arrayed x-ray source and a set of Talbot interference fringes. 1. An x-ray microscope system comprising: an x-ray source,', 'and a beam-splitting grating,', 'wherein said x-ray illumination beam generating system produces a plurality of x-ray micro-beams through the Talbot effect, having a depth-of-focus, an axis of propagation and a predetermined intensity profile normal to said axis for a predetermined x-ray energy,, 'an x-ray illumination beam generating system comprising,'}a means to position an object to be examined relative to said plurality of micro-beams; andat least one x-ray pixel array detector for detecting x-rays resulting from the interaction of said plurality of x-ray micro-beams with said object,said detector aligned within said depth-of-focus of the said micro-beams such that the x-rays detected by any given pixel of the detector correspond to the transmitted x-rays through the object to be examined from primarily one micro-beam.2. The x-ray microscope system of claim 1 , wherein the beam-splitting grating is a pi or pi/2 phase-shifting grating at said predetermined x-ray energy.3. The x-ray microscope system of claim ...

Apparatus and method for inspecting moving target

An apparatus and method for quick imaging and inspection of a moving target. The apparatus comprises a passage, a scanning and imaging device ( 106 ), a first position sensor ( 101 ), a second position sensor ( 103 ), and a control unit ( 105 ). The control unit ( 105 ) powers on an electron induction accelerator in the scanning and imaging device ( 106 ) to make the electron induction accelerator enter a standby state when the control unit ( 105 ) receives from the first position sensor ( 101 ) a detection signal indicating that a moving target ( 100 ) enters the passage, and controls a beam emitting time point and a beam emitting mode of the electron induction accelerator to correspondingly inspect different parts of the moving target ( 100 ) when the second position sensor ( 103 ) detects that different sections pass through a radiation scanning area. The driver and passengers do not need to get off when a traveling vehicle is inspected, the apparatus controls the accelerator to emit ray beams with corresponding energy to perform scanning when the moving target passes through the scanning area, flexible scanning is realized, and inspection time is reduced.

ELECTRON GUN, X-RAY GENERATION APPARATUS, AND X-RAY IMAGING APPARATUS

An electron gun includes a cathode including an electron emitting portion, an extraction electrode for extracting electrons emitted from the electron emitting portion, and a focusing electrode for focusing the electrons extracted by the extraction electrode. The focusing electrode includes an outside electrode having a tubular shape, and an inside electrode arranged inside the outside electrode. The inside electrode defines a first space having a columnar shape, and includes a first surface on a side of the cathode, and a second surface on an opposite side of the first surface. An inside surface of the outside electrode and the second surface of the inside electrode define a second space. The inside electrode includes an electron passage hole, and a communicating portion which makes the first space and the second space communicate with each other. 1. An electron gun comprising a cathode including an electron emitting portion , an extraction electrode configured to extract electrons emitted from the electron emitting portion , and a focusing electrode configured to focus the electrons extracted by the extraction electrode , whereinthe focusing electrode includes an outside electrode having a tubular shape, and an inside electrode arranged inside the outside electrode, the inside electrode defines a first space having a columnar shape, and includes a first surface on a side of the cathode, and a second surface on an opposite side of the first surface, and an inside surface of the outside electrode and the second surface of the inside electrode define a second space, andthe inside electrode includes an electron passage hole through which the electrons pass, and a communicating portion configured to make the first space and the second space communicate with each other.2. The electron gun according to claim 1 , wherein the outside electrode surrounds the communicating portion.3. The electron gun according to claim 1 , wherein the inside electrode includes a plate portion ...

PORTABLE NEUTRON IMAGING BASED NON-DESTRUCTIVE EVALUATION

Various examples are provided for portable neutron imaging. In one example, a portable neutron-imaging system is described. A compact neutron source assembly can comprise an ion-beam bombardment source generating an isotropic source of monoenergetic neutrons. The neutron-imaging system does not include a moderator or collimator. Instead, the emission source and image-capture apparatus are placed in close proximity to an object to be imaged. Quality images were obtained with short exposure times of less than 20 seconds. 1. A neutron imaging system , comprising:a neutron source assembly including a neutron emission source housed in a chamber; andan imaging surface located a distance from the neutron emission source at which an image-capture apparatus can be placed, where there is no neutron moderator and no collimator located between the neutron emission source and the imaging surface.2. The neutron imaging system of claim 1 , wherein the distance is not more than 210 cm.3. The neutron imaging system of claim 1 , wherein the distance is between 4.5 cm and 100 cm.4. The neutron imaging system of claim 3 , wherein a distance between an object to be imaged by the neutron imaging system and the imaging surface is not more than 6 cm.5. The neutron imaging system of claim 1 , wherein a weight of the neutron source assembly is not more than 90 pounds.6. The neutron imaging system of claim 1 , further comprising a high voltage supply connected to the neutron source assembly claim 1 , wherein the neutron emission source is an ion-bombardment source.7. The neutron imaging system of claim 1 , wherein the neutron emission source generates neutrons predominantly having energies of approximately 2.45 MeV.8. The neutron imaging system of claim 7 , wherein at least 95% of the generated neutrons have energies between 2.4 MeV and 2.5 MeV.9. The neutron imaging system of claim 1 , further comprising a moveable boom on which the neutron source assembly is mounted.10. The neutron imaging ...

DUAL-BEAM MULTIPHASE FLUID ANALYSIS SYSTEMS AND METHODS

A method for analyzing flow of a multiphase fluid through a flowmeter is provided. In one embodiment, the method includes transmitting two beams of electromagnetic radiation along different paths through a multiphase fluid and detecting the two transmitted beams with detectors. The method also includes determining a gas fraction and a water-in-liquid ratio of the multiphase fluid. The gas fraction is determined based on the detected first beam of electromagnetic radiation and the water-in-liquid ratio of the multiphase fluid is determined based on the detected second beam of electromagnetic radiation. Additional systems, devices, and methods are also disclosed. 1. A method comprising:receiving a multiphase fluid within a bore of a conduit; transmitting a first beam of electromagnetic radiation through the multiphase fluid along a first beam path through the bore; and', 'transmitting a second beam of electromagnetic radiation through the multiphase fluid along a second beam path within the bore that is different from the first beam path, wherein the first beam has a length within the bore along the first beam path greater than a length of the second beam within the bore along the second beam path;, 'passing electromagnetic radiation with multiple energy levels through the multiphase fluid within the bore of the conduit, wherein passing the electromagnetic radiation through the multiphase fluid within the bore of the conduit includesdetecting the first beam of electromagnetic radiation transmitted through the multiphase fluid at a first detector;detecting the second beam of electromagnetic radiation transmitted through the multiphase fluid at a second detector; anddetermining a gas fraction and a water-in-liquid ratio of the multiphase fluid within the bore, wherein determining the gas fraction is based on the detected first beam of electromagnetic radiation and determining the water-in-liquid ratio of the multiphase fluid is based on the detected second beam of ...

Calculation system and calculation method

There is provided a calculating system that can calculate only a gradation image of only a measurement target in monitoring large-scale facility using a transmission imaging on the basis of a cosmic ray. In addition to a gradation image on the basis of a flight track of the cosmic ray, a gradation image of the density length on the basis of structure information of a structural object which is not a measurement target is made and used to correct the gradation image on the basis of the flight track of the cosmic ray.

RADIATION IMAGING APPARATUS, RADIATION IMAGING METHOD, CT APPARATUS, AND STORAGE MEDIUM

A radiation imaging apparatus includes: a detection unit configured to obtain measurement information based on a detection result of radiation irradiated based on a constant tube voltage; an obtaining unit configured to obtain second measurement information of the radiation based on a moment of the measurement information obtained by detecting the radiation multiple times; an energy determination unit configured to determine a plurality of energies for approximating an energy distribution of the radiation; and a calculation unit configured to calculate photon counts corresponding to the plurality of energies based on the second measurement information.

METHOD FOR PERFORMING MATERIAL DECOMPOSITION USING A DUAL-ENERGY X-RAY CT AND CORRESPONDING DUAL-ENERGY X-RAY CT APPARATUS

Methods and system for decomposing a high-energy dual-energy X-ray CT material are disclosed. In the method, two types of effect such as Compton effect and electron pairing effect which dominates are reserved and the influence of the other effect such a photoelectric effect is removed so as to improve the accuracy of the material decomposition. The unique advantage of the present disclosure is to effectively remove the error of the calculated atomic number Z due to directly selecting two effects during processes of material decomposition in the conventional dual-energy CT method. This may greatly improve the accuracy of dual-energy CT identification of the material, and it is important to improve the conventional dual-use CT imaging system applications, such as clinical therapy, security inspection, industrial non-destructive testing, customs anti-smuggling and other fields. 1. A method for performing material decomposition using a dual-energy X-ray CT , the dual-energy X-ray CT performing a dual-energy X-ray scanning on an object to be inspected to obtain a high energy projection data and a low energy projection data , the method comprising steps of:performing a dual-energy base material decomposition with respect to the high-energy projection data and the low-energy projection data, so as to obtain base material decomposition coefficients;calculating atomic number distribution and electron density distribution for the object to be inspected, with the base material decomposition coefficients as initial values;calculating a mass attenuation coefficient corresponding to the photoelectric effect according to the atomic number distribution and electron density distribution;correcting the high energy projection data and the low energy projection data utilizing the mass attenuation coefficient corresponding to the photoelectric effect to remove a portion of the high energy projection data and the low energy projection data corresponding to the photoelectric effect; ...

Method, device and system for inspecting moving object based on cosmic rays

The present disclosure relates to a method, a device and a system for inspecting a moving object based on cosmic rays, pertaining to the field of radiation imaging and safety inspection techniques. The method includes: detecting whether a speed of the inspected moving object is within a preset range; recording a motion trajectory of the moving object with a monitoring device; acquiring information about charged particles in the cosmic rays with a position sensitive detector, the information about charged particles including track information of the charged particles; determining the moving object by matching positions of the motion trajectory and the track information; reconstructing the track of the charged particles according to the information about the charged particles; and recognizing the material inside the moving object based on the track reconstruction.

Subsea Computed Tomography system with flat panel detectors

A Computed Tomography (CT) system can be deployed by subsea vehicles such as remotely operated vehicles (ROVs) or by divers to perform CT inspections on a subsea structure. In embodiments, a marinized signal source and a marinized flat panel signal detector are positioned at a structure to be inspected subsea and possibly repositioned at different angles about the structure to acquire a series of 2D radiographic images which are then fed to a reconstruction algorithm that produces a 3D reconstructed volume of the structure being inspected. 1. A subsea computed tomography tool , comprising:a. a housing configured for use subsea;b. a marinized signal source disposed at a first predetermined position at least partially within the housing;c. a marinized flat panel signal detector, comprising a digital detector array, disposed proximate the marinized signal source;d. a rotator operatively connected to the marinized signal source and the marinized flat panel digital detector, the rotator adapted to rotate the marinized signal source and the marinized flat panel digital detector about a structure to be inspected;e. a controller operatively in communication with and the marinized signal source, the marinized digital flat panel detector, and the rotator; i. reconstruction software operatively resident in the computer and operatively in communication with the marinized signal source and the marinized digital flat panel detector;', 'ii. a predetermined set of predefined slice data for a predetermined structure; and', 'iii. visualization software operatively resident in the computer and operatively able to access the predetermined set of predefined slice data for the given structure., 'f. a computer operatively in communication with the marinized signal source, the marinized digital flat panel detector, and the rotator, the computer comprising2. The subsea computed tomography tool of claim 1 , wherein the marinized flat panel signal detector is further disposed at least ...

RADIATION-PHASE-CONTRAST IMAGING DEVICE

An X-ray phase-contrast imaging device capable of easily performing imaging of an object using X-rays of plural energies is provided. The disclosed exemplary configuration includes an X-ray source of a dual energy output type, and an FPD having a high energy X-ray detection surface and a low energy X-ray detection surface so that two types of imaging, imaging by high energy X-ray and imaging by low energy X-ray, can be performed. By imaging so as to scan the object while changing the relative position of the imaging system and the object, two types of imaging can be completed at once. 1. A radiation phase-contrast imaging device comprising:a radiation source configured to irradiate high energy radiation and low energy radiation;a grading in which an absorber absorbing radiation and extending in one direction is arranged in a direction perpendicular to the one direction, the absorber generating Talbot interference when the radiation transmits therethrough;a detection unit including a high energy radiation detection surface configured to detect a self-image of the grating related to the high energy radiation and a low energy radiation detection surface configured to detect a self-image of the grating related to the low energy radiation; anda position changing unit configured to change a relative position of an imaging system and an object so that a projection of the object moves on the detection surface while keeping a positional relationship of the radiation source, the grating, and the detection unit, the imaging system being configured by the radiation source, the grating, and the detection unit.2. The radiation phase-contrast imaging device as recited in claim 1 ,wherein a distance from the high energy radiation detection surface of the detection unit to the grating and a distance from the low energy radiation detection surface to the grating are different from each other.3. The radiation phase-contrast imaging device as recited in claim 1 ,wherein the position ...

CONVEYOR SYSTEM AND MEASURING DEVICE FOR DETERMINING WATER CONTENT OF A CONSTRUCTION MATERIAL

A system is provided. The system includes a conveyor apparatus configured for conveying a material and a water content measurement system positioned about the conveyor apparatus for determining water content in the material. A dimension characteristic measurement system for detecting one or more dimension characteristics of the material is provided and a computer device is configured to manipulate data received from the water content measurement system and the dimension characteristic measurement system to determine a water content of the material. 1. A system comprising:a conveyor apparatus configured for conveying a material;a water content measurement system positioned about the conveyor apparatus for detecting water content in the material;a dimension characteristic measurement system for detecting one or more dimension characteristics of the material; anda computer device configured to manipulate data received from the water content measurement system and the dimension characteristic measurement system to determine a water content of the material.2. The system according to claim 1 , wherein the water content measurement system and the dimension characteristic measurement system are spaced-apart about the conveyor apparatus to eliminate cross-talk therebetween.3. The system according to claim 1 , wherein the water content measurement system comprises a neutron source spaced-apart from one side of the conveyor apparatus and neutron detector spaced-apart from an opposing side of the conveyor.4. The system according to claim 3 , wherein the neutron source is Cf-252 and the neutron detector is an He-3 neutron detector.5. The system according to claim 1 , wherein the dimension characteristic measurement system is configured to determine one of a height and mass thickness of the material.6. The system according to claim 1 , wherein the dimension characteristic measurement system comprises a gamma-ray source spaced-apart from one side of the conveyor apparatus and a ...

X-RAY INSPECTION DEVICE AND METHOD FOR DETERMINING DEGREE OF CONSUMPTION OF TARGET OF X-RAY TUBE IN X-RAY INSPECTION DEVICE

An X-ray inspection device comprises: an X-ray tube configured to cause an electron beam to collide with a target, thereby generating an X-ray; an X-ray detector configured to detect the X-ray having been output from the X-ray tube and having been transmitted through an inspection target object; a measurement section configured to detect the X-ray output from the X-ray tube for a predetermined period by the X-ray detector to detect an X-ray amount in the predetermined period, thereby measuring a maximum value Imax and a minimum value Imin of the X-ray amount in the predetermined period; and a calculation section configured to calculate an X-ray amount fluctuation rate by using the maximum value Imax and the minimum value Imin of the X-ray amount measured by the measurement section. 1. An X-ray inspection device comprising:an X-ray tube configured to cause an electron beam to collide with a target, thereby generating an X-ray;an X-ray detector configured to detect the X-ray having been output from the X-ray tube and having been transmitted through an inspection target object;a measurement section configured to detect the X-ray output from the X-ray tube for a predetermined period by the X-ray detector to detect an X-ray amount in the predetermined period, thereby measuring a maximum value Imax and a minimum value Imin of the X-ray amount in the predetermined period; anda calculation section configured to calculate an X-ray amount fluctuation rate by using the maximum value Imax and the minimum value Imin of the X-ray amount measured by the measurement section.2. The X-ray inspection device according to claim 1 , further comprising:a fluctuation rate display section configured to display the X-ray amount fluctuation rate calculated by the calculation section.3. The X-ray inspection device according to claim 1 , further comprising:a determination section configured to determine that the target is consumed when the X-ray amount fluctuation rate calculated by the ...

X-ray system and method for tomosynthesis scanning

Röntgensystem (2) zur Tomosyntheseabtastung eines Objekts (6) enthält eine Röntgenstrahlung (20) zur Durchstrahlung des Objekts (6) aussendenden, während der Tomosyntheseabtastung relativ zum Objekt (6) verschenkbaren Röntgenquelle (8), und einen während der Tomosyntheseabtastung relativ zum Objekt (6) im Wesentlichen ortsfesten 2-D-Röntgendetektor (10) zum Empfang der Röntgenstrahlung (20), wobei die Röntgenquelle (8) mindestens zwei, bezüglich ihrer Strahlrichtungen (22a, b) zum Objekt (6) hin nebeneinander angeordnete, unabhängig voneinander auslösbare Strahlquellen (18a, b) aufweist. Bei einem Verfahren zur Tomosyntheseabtastung eines Objekts (6) wird - Röntgenstrahlung (20) zur Durchstrahlung des Objekts (6) von einer Röntgenquelle (8) ausgesandt, wobei die Röntgenquelle (8) während der Tomosyntheseabtastung relativ zum Objekt (6) verschwenkt, - die Röntgenstrahlung (20) von einem während der Tomosyntheseabtastung bezüglich der Röntgenquelle (8) im wesentlichen ortsfesten 2-D-Röntgendetektor (10) empfangen, wobei die Röntgenstrahlung (20) von mindestens zwei, bezüglich ihrer Strahlrichtungen (22a, b) zum Objekt (6) hin nebeneinander angeordneten, unabhängig voneinander auslösbaren Strahlquellen (18a, b) in der Röntgenquelle (8) ausgesandt wird. X-ray system (2) for tomosynthesis scanning of an object (6) contains X-ray radiation (20) for irradiating the object (6), x-ray source (8) which can be given away during tomosynthesis scanning relative to the object (6), and a tomosynthesis scan relative to the object (6). 6) substantially stationary 2-D X-ray detector (10) for receiving the X-radiation (20), wherein the X-ray source (8) at least two, with respect to their beam directions (22a, b) to the object (6) arranged side by side, independently triggerable Beam sources (18a, b). In a method for tomosynthesis scanning of an object (6), X-radiation (20) for irradiating the object (6) is emitted by an X-ray source (8), wherein the X-ray source (8) pivots relative to ...

Apparatus and Method for X-ray Fluorescence Analysis

This application relates to apparatus and method for x-ray fluorescence analysis. There is provided an X-ray fluorescence analysis apparatus for analysing a sample, The X-ray fluorescence analysis apparatus comprises an X-ray source, a measurement chamber for holding the sample in air, and an X-ray detector. The X-ray source is arranged to irradiate the sample with a primary X-ray beam, to cause the sample to fluoresce. The X-ray detector is arranged to detect characteristic X-rays emitted by the sample and to determine a measured X-ray intensity associated with the characteristic X-rays. An X-ray filter, which transmits the primary X-ray beam, is arranged between the X-ray source and the sample. The X-ray source comprises an anode of material having an atomic number that is less than 25. The X-ray fluorescence analysis apparatus further comprises a sensor arrangement configured to sense air pressure and air temperature. A processor receives the measured X-ray intensity. The processor also receives air pressure data and air temperature data from the sensor arrangement. The processor is configured to carry out a compensation calculation for adjusting the measured X-ray intensity using the air pressure data and the air temperature data.

DEVICE AND METHOD FOR MEASURING SHORT-WAVELENGTH CHARACTERISTIC X-RAY DIFFRACTION BASED ON ARRAY DETECTION

A device for measuring short-wavelength characteristic X-ray diffraction based on array detection, and a measurement and analysis method based on the device are provided. An array detector of the device only detects and receives a diffraction ray which is diffracted by a material of a to-be-measured part inside a sample and passes through a through hole of a receiving collimator, and rays passing through a positioning hole. The to-be-measured part inside the sample is placed at the center of the diffractometer circle of the device. The method is performed with the device. With the present disclosure, a diffraction pattern of a part inside the sample with a centimeter thickness, i.e. Debye rings, can be rapidly and non-destructively measured, thereby rapidly and non-destructively measuring and analyzing crystal structures, and its crystal structural change of the part inside the sample, such as phase, texture, and stress. 1. A device for measuring short-wavelength characteristic X-ray diffraction based on array detection , comprising an X-ray irradiation system , a sample table and an X-ray detection system , wherein{'b': 2', '1, 'the X-ray irradiation system comprises a radiation source and an incident collimator (), the radiation source comprises a heavy metal target X-ray tube () with an atomic number greater than 55, a high-voltage power supply with a power supply voltage greater than 160 kv, and a controller;'}{'b': 2', '7', '7, 'X-rays emitted by the X-ray irradiation system pass through the incident collimator () to form an incident X-ray beam (), and the incident X-ray beam () irradiates a to-be-measured part inside a sample fixed on the sample table;'}the X-ray detection system is configured to perform fixed-point measurement on intensity and distribution of a short-wavelength characteristic X-ray diffracted by the to-be-measured part inside the sample;{'b': 4', '5', '4, 'the X-ray detection system comprises a receiving collimator () and an array detector () ...

碳同位素分析装置和碳同位素分析方法

碳同位素分析仪1包括：二氧化碳同位素生成器40，其包括由碳同位素生成包含二氧化碳同位素的气体的燃烧单元和二氧化碳同位素纯化单元；分光仪10，其包括具有一对反射镜12的光学共振器11和测定透过光学共振器11的光的强度的光检测器15；和光发生器20，其包括光源23、传输来自光源23的光束的第一光纤21、用于波长转换的第二光纤22和非线性光学晶体25，第二光纤22在一点处与第一光纤21分开，并在分歧点下游的结合点处与第一光纤21相结合，非线性光学晶体25基于透过光学晶体25的多束具有不同频率的光束之间的频率差产生具有二氧化碳同位素的吸收波长的光。碳同位素分析仪1是可以分析同位素 14 C的简便设备。

Density measurement with gamma backscattering

Measurement of density with application of reverse scattering of gamma-radiation

FIELD: physics. ^ SUBSTANCE: device comprises one source of gamma-radiation located next to reservoir, one detector of gamma radiation located next to reservoir, in which one detector of gamma-radiation is configured to detect gamma radiation from one source of gamma radiation scattered in reverse direction by fluid medium; and converter for transformation of detected gamma radiation scattered in reverse direction into density value. Method includes: location of gamma radiation source next to reservoir; location of gamma radiation detector next to reservoir; detection of gamma radiation from source of gamma radiation scattered in reverse direction with fluid medium, by detector of gamma radiation; detection of fluid medium density on the basis of gamma radiation intensity scattered in reverse direction and perceived by detector of gamma radiation. ^ EFFECT: efficient detection of fluid medium density variances in different sectors of reservoir. ^ 19 cl, 12 dwg, 2 tbl РОССИЙСКАЯ ФЕДЕРАЦИЯ (19) RU (11) 2 386 946 (13) C2 (51) МПК G01N 9/00 (2006.01) ФЕДЕРАЛЬНАЯ СЛУЖБА ПО ИНТЕЛЛЕКТУАЛЬНОЙ СОБСТВЕННОСТИ, ПАТЕНТАМ И ТОВАРНЫМ ЗНАКАМ (12) ОПИСАНИЕ ИЗОБРЕТЕНИЯ К ПАТЕНТУ (21), (22) Заявка: 2007141885/28, 12.11.2007 (24) Дата начала отсчета срока действия патента: 12.11.2007 (73) Патентообладатель(и): ТЕРМО ФИШЕР САЙЕНТИФИК ИНК. (US) (43) Дата публикации заявки: 20.05.2009 2 3 8 6 9 4 6 (45) Опубликовано: 20.04.2010 Бюл. № 11 (56) Список документов, цитированных в отчете о поиске: WO 03/073938 A1, 12.09.2003. US 5003980 A, 02.04.1991. SU 381984 A1, 01.01.1973. RU 34015 U1, 20.11.2003. 2 3 8 6 9 4 6 R U (54) ИЗМЕРЕНИЕ ПЛОТНОСТИ С ИСПОЛЬЗОВАНИЕМ ОБРАТНОГО РАССЕЯНИЯ ГАММАИЗЛУЧЕНИЯ направлении, в величину плотности. Способ включает: размещение источника гаммаизлучения рядом с резервуаром; размещение детектора гамма-излучения рядом с резервуаром; обнаружение гамма-излучения от источника гамма-излучения, рассеянного в обратном направлении текучей средой, детектором гамма-излучения; ...

利用伽玛背散射的密度测量

本发明公开了一种测量容器中的流体的密度的系统，包括：容器，流体容纳在容器中；至少一个位于容器附近的伽玛射线源；多个位于容器附近的伽玛射线检测器，多个伽玛射线检测器围绕容器彼此沿圆周地定位，配置用于检测由流体背散射的来自至少一个伽玛射线源的伽玛射线；以及用于将所检测到的伽玛射线背散射转换为密度值的转换器。本发明还公开了一种确定容器中的流体性质的方法，包括步骤：将伽玛射线源定位到容器附近；将多个伽玛射线检测器定位到容器附近，以使多个伽玛射线检测器围绕容器彼此沿圆周地定位；以多个伽玛检测器检测被流体背散射的来自伽玛射线源的伽玛射线；基于由多个伽玛射线检测器接收到的背散射伽玛射线的强度确定流体的密度。

炭素同位体分析装置および炭素同位体分析方法

Density measurement by gamma backscattering

Protective screen for x-ray installation

FIELD: physics.SUBSTANCE: invention relates to a protective screen for an X-ray apparatus. There is an X-ray source; a protective X-ray attenuation shield comprising an elongated cavity for receiving an X-ray source and a sample holding portion; protective shield attenuating neutron radiation; and a shield which attenuates gamma-radiation. In the protective screen for the X-ray installation, the protective neutron damping protector adjoins and substantially surrounds the X-ray attenuation shield, and the protective screen attenuating gamma-radiation adjoins and substantially surrounds the protective shield attenuating neutron radiation. In some embodiments, a pull-out device is provided for loading specimens into an elongated cavity, which consists of adjoining blocks of material, where each corresponding unit has thickness and composition which, in fact, coincides with the thickness and composition of the protective X-ray attenuation screen, the neutron-damaging protective shield, and the gamma-radiation attenuation shield.EFFECT: high radiation safety when using an X-ray apparatus for gamma-activation analysis.20 cl, 3 dwg РОССИЙСКАЯ ФЕДЕРАЦИЯ (19) RU (11) (13) 2 730 600 C1 (51) МПК G21F 3/00 (2006.01) ФЕДЕРАЛЬНАЯ СЛУЖБА ПО ИНТЕЛЛЕКТУАЛЬНОЙ СОБСТВЕННОСТИ (12) ОПИСАНИЕ ИЗОБРЕТЕНИЯ К ПАТЕНТУ (52) СПК G21F 3/00 (2020.02) (21)(22) Заявка: 2019144448, 23.06.2017 (24) Дата начала отсчета срока действия патента: (73) Патентообладатель(и): КРИСОС КОРПОРЕЙШЕН ЛИМИТЕД (AU) Дата регистрации: 24.08.2020 (45) Опубликовано: 24.08.2020 Бюл. № 24 (85) Дата начала рассмотрения заявки PCT на национальной фазе: 23.01.2020 (86) Заявка PCT: AU 2017/050643 (23.06.2017) 2 7 3 0 6 0 0 (56) Список документов, цитированных в отчете о поиске: US 20120046867 A1, 23.02.2012. US 20170072223 A1, 16.03.2017. US 6630683 B2, 07.10.2003. US 7312466 B2, 25.12.2007. RU 2561989 C1, 10.09.2015. RU 2473100 C2, 20.01.2013. RU 121143 U1, 20.10.2012. Приоритет(ы): (22) Дата подачи заявки: 23.06.2017 R U 23 ...

The method, apparatus and system of check object based on cosmic ray

本申请涉及基于宇宙射线的检查对象的方法、装置及系统，属于辐射成像及安全检查技术领域。该方法包括：利用监控设备记录受检查对象的运动轨迹；利用位置灵敏探测器获取所述宇宙射线中的带电粒子信息，所述带电粒子信息包括带电粒子径迹信息；将所述运动轨迹和所述径迹信息进行位置符合，确定所述对象；根据所述带电粒子信息进行所述带电粒子的径迹重建；根据所述径迹重建，识别所述运动对象内部的材料。本公开通过宇宙射线，针对行走运动中的人的进行检查，可以检测人体携带的核材料、毒品及爆炸物等危险品。

Method of determining the origin of mushrooms produced in inoculated medium

The present invention relates to a method for determining the origin of shiitake mushrooms produced in a complete medium such as sawdust block. In the case of using the determination method of the present invention, the origin of shiitake mushrooms produced in the complete medium can be clearly and conveniently determined according to the indices of the isotopes δ^13C, δ^15N, δ^18O and δ^34S, thereby capable of informing the exact origin of shiitake mushrooms to consumers by judging the exact origin of shiitake mushrooms that are produced on the complete medium such as sawdust blocks and sold on the market. The present invention includes a step of measuring each of the stable isotope ratios of carbon, nitrogen, sulfur, and oxygen in a mushroom sample.

Method and device for correcting artifacts in X-ray image generation, in particular computed tomography, or radiography by temporal modulation of the primary radiation

Verfahren und Vorrichtung zur Korrektur von Artefakten bei einer Rontgenbilderzeugung, insbesondere Computertomographie, oder einer Radiographie mittels zeitlicher Modulation der Primärstrahlung Gemaß der vorliegenden Erfindung werden ein Verfahren und eine Vorrichtung zur Erstellung von Rontgenbildern von Objekten derart bereitgestellt, dass infolge Streustrahlung bewirkte Artefakte korrigiert werden. Dazu wird eine zeitlich veranderliche Modulation der Primärstrahlung ausgeführt, wobei jeweils ein Satz ursprünglicher amplitudenmodulierter Modulationsprojektionen des Objekts erzeugt und jeweils ein den jeweiligen Modulationsprojektion zugeordnetes Streubild berechnet wird. Die Erfindung eignet sich insbesondere für schnelle CT-Scans. Method and device for correcting artefacts in X-ray imaging, in particular computed tomography, or radiography by means of temporal modulation of the primary radiation. For this purpose, a modulation of the primary radiation that changes over time is carried out, a set of original amplitude-modulated modulation projections of the object being generated and a scatter pattern associated with the respective modulation projection being calculated. The invention is particularly suitable for fast CT scans.

Method and Apparatus for Measuring the Density, the Component, and the Composition of Materials by Using Dual Radiation

본 발명은 방사선을 이용한 물질의 밀도, 두께 및 성분비를 측정하는 기술에 해당하며, 본 발명의 사용으로 인하여 측정대상 물질의 기하학적인 구조, 성분, 두께 및 기타 주변환경의 지배를 받는 '축적인자(B)'에 대한 정보 및 시료의 성분을 모른다고 하더라도 시료의 밀도 측정이 가능하게 되었으며, 또한 측정대상의 물질이 혼합물인 경우에는 그 혼합비까지 비교적 정확하게 유추할 수 있게 되었다. The present invention corresponds to a technique for measuring the density, thickness, and component ratio of a substance using radiation, and due to the use of the present invention, the 'accumulator' is subject to the geometric structure, composition, thickness, and other environmental conditions of the substance to be measured. Even if the information about B) 'and the composition of the sample are not known, the density of the sample can be measured, and in the case where the substance to be measured is a mixture, the mixing ratio can be inferred relatively accurately. 밀도, 성분, 조성, 방사선, 산란, 축적인자 Density, composition, composition, radiation, scattering, accumulation

Scintillation array apparatus and method of use thereof

A scintillation material is longitudinally packaged in a circumferentially surrounding sheath, where the sheath has a lower index of refraction than the scintillation material, to form a scintillation optic or scintillation fiber optic. The scintillation material yields secondary photons upon passage of a charged particle beam, such as a positively charged residual particle beam having transmitted through a sample. The internally generated secondary photons within the sheath are guided to a detector element by the difference in index of refraction. Multiple scintillation optics are assembled to form a two-dimensional scintillation array coupled to a two-dimensional detector array, such as for use in determination of state of the residual charged particle beam, determination of an exit point of the particle beam from the sample, path of the treatment beam, and/or tomographic imaging.

X-ray source assembly having enhanced output stability, and fluid stream analysis applications thereof

An x-ray source assembly and method of operation are provided having enhanced output stability. The assembly includes an anode having a source spot upon which electrons impinge and a control system for controlling position of the anode source spot relative to an output structure. The control system can maintain the anode source spot location relative to the output structure notwithstanding a change in one or more operating conditions of the x-ray source assembly. One aspect of the disclosed invention is most amenable to the analysis of sulfur in petroleum-based fuels.

Radiation transmission image apparatus using CMOS sensors

본 발명은 X선 및 감마선을 CMOS 센서를 이용한 방사선 투과 영상장치에 관한 것으로서 더욱 상세하게는 X선 및 감마선의 동위원소를 이용하여 스캔 리니어 센서에 의해 스캔 촬영된 시편의 영상을 분석하여 평가할 수 있는 방사선 투과 영상장치에 관한 것이다. The present invention relates to a radiographic imaging apparatus using a CMOS sensor for X-rays and gamma rays, and more particularly, to analyze and evaluate an image of a specimen photographed by a scan linear sensor using isotopes of X-rays and gamma rays. The present invention relates to a radiographic imaging apparatus. 본 발명에 의하면, 감마선의 선원(25)을 안내하는 가이드 튜브(10); 상기 가이드 튜브(10)로부터 제공된 선원(25)의 예정된 조사 방향 이외 감마선 조사 방향의 선량을 차폐하는 콜리메이터(20); 상기 선원(25)의 에너지 대역에 따라 콜리메이터(20)와의 수직 거리 차를 조절하여 테스트 시편(35)을 스캔 촬영하는 스캔 리니어 센서(30); 및 상기 스캔 리니어 센서(30)로부터 스캔 촬영된 테스트 시편(35)의 영상데이터를 분석하여 평가하는 컴퓨터(40)를 포함하는 것을 특징으로 하는 CMOS 센서를 이용한 방사선 투과 영상장치를 제시한다. 이때, 상기 감마선의 선원(25)은 셀레늄(Se-75), 세슘(Cs-137), 이리듐(Ir-192), 코발트(Co-60) 중 선택되는 어느 하나이며, 상기 스캔 리니어 센서(30)의 조절된 수직 거리 차에 따라 스캔 속도가 연동되어 조절되는 것을 특징으로 한다. According to the present invention, the guide tube 10 for guiding the source 25 of the gamma ray; A collimator 20 for shielding a dose in a gamma ray irradiation direction other than a predetermined irradiation direction of the source 25 provided from the guide tube 10; A scan linear sensor 30 configured to scan a test specimen 35 by adjusting a vertical distance difference from the collimator 20 according to the energy band of the source 25; And a computer 40 for analyzing and evaluating image data of the test specimen 35 scanned from the scan linear sensor 30. In this case, the source 25 of the gamma ray is any one selected from selenium (Se-75), cesium (Cs-137), iridium (Ir-192), and cobalt (Co-60), and the scan linear sensor 30 The scan speed is linked to be adjusted according to the adjusted vertical distance difference. 평판, DR, 동위원소, 스캔, 콜리메이터, 스캔 리니어 센서, 시편 Flatbed, DR, Isotope, Scan, Collimator, Scan Linear Sensor, Specimen

Carbon isotope analysis device and carbon isotope analysis method

碳同位素分析仪1包括：二氧化碳同位素生成器40，其包括由碳同位素生成包含二氧化碳同位素的气体的燃烧单元和二氧化碳同位素纯化单元；分光仪10，其包括具有一对反射镜12的光学共振器11和测定透过光学共振器11的光的强度的光检测器15；和光发生器20，其包括光源23、传输来自光源23的光束的第一光纤21、用于波长转换的第二光纤22和非线性光学晶体25，第二光纤22在一点处与第一光纤21分开，并在分歧点下游的结合点处与第一光纤21相结合，非线性光学晶体25基于透过光学晶体25的多束具有不同频率的光束之间的频率差产生具有二氧化碳同位素的吸收波长的光。碳同位素分析仪1是可以分析同位素 14 C的简便设备。

Electron gun, X-ray generator, and X-ray imaging device

電子銃は、電子放出部を有するカソードと、前記電子放出部から放出された電子を引き出す引出電極と、前記引出電極によって引き出された電子を収束させる収束電極とを備える。前記収束電極は、管形状を有する外側電極と、前記外側電極の内側に配置された内側電極とを含み、前記内側電極は、柱状の第１空間を規定し、前記カソードの側の第１面と前記第１面の反対側の第２面とを有し、前記外側電極の内側面および前記内側電極の前記第２面は、第２空間を規定する。前記内側電極は、電子を通過させる電子通過孔と、前記第１空間と前記第２空間とを連通させる連通部とを有する。 The electron gun includes a cathode having an electron emission portion, an extraction electrode for extracting electrons emitted from the electron emission portion, and a convergence electrode for converging the electrons extracted by the extraction electrode. The converging electrode includes an outer electrode having a tubular shape and an inner electrode disposed inside the outer electrode, the inner electrode defining a columnar first space, and a first surface on the cathode side. And a second surface opposite to the first surface, and the inner surface of the outer electrode and the second surface of the inner electrode define a second space. The inner electrode includes an electron passage hole that allows electrons to pass therethrough and a communication portion that allows the first space and the second space to communicate with each other.

System and method for using an intensity modulated X-ray source

本发明关注一种具有多个探测器和控制器的X射线扫描系统，其中a)控制器被配置成接收并识别由至少一个探测器探测的最小X射线透射等级，b)控制器将最小X射线透射等级与至少一个预定阈值透射等级进行比较，以及c)基于所述比较，控制器产生调节信号。本发明进一步包括X射线源，其中X射线源接收调节信号并被配置成基于所述调节信号来调节X射线脉冲持续时间。

Device for modulation of energy spectrum, method for recognition of material and device for its realisation, method for images processing

FIELD: physics. ^ SUBSTANCE: device for modulation of energy spectrum comprises the first unit for modulation of energy spectrum intended for modulation of the first beam having the first energy spectrum and second unit for modulation of energy spectrum connected to the first unit for modulation of energy spectrum and intended for modulation of the second beam having the second energy spectrum that differs from the first energy spectrum, moreover, only the first unit for modulation of energy spectrum or only the second unit for modulation of energy spectrum are connected to axis of rotation. ^ EFFECT: increased validity of recognition of object materials having considerable thickness. ^ 26 cl, 6 dwg РОССИЙСКАЯ ФЕДЕРАЦИЯ (19) RU (11) 2 353 921 (13) C2 (51) МПК G01N 23/06 (2006.01) ФЕДЕРАЛЬНАЯ СЛУЖБА ПО ИНТЕЛЛЕКТУАЛЬНОЙ СОБСТВЕННОСТИ, ПАТЕНТАМ И ТОВАРНЫМ ЗНАКАМ (12) ОПИСАНИЕ ИЗОБРЕТЕНИЯ К ПАТЕНТУ (21), (22) Заявка: 2007118429/28, 17.05.2007 (24) Дата начала отсчета срока действия патента: 17.05.2007 (43) Дата публикации заявки: 27.11.2008 2 3 5 3 9 2 1 R U (73) Патентообладатель(и): ТСИНГХУА ЮНИВЕРСИТИ (CN), НАКТЕЧ КОМПАНИ ЛИМИТЕД (CN) Адрес для переписки: 119034, Москва, Пречистенский пер., 14, стр. 1, 4-й этаж, "Гоулингз Интернэшнл Инк.", Ю.В.Дементьевой C 2 C 2 (56) Список документов, цитированных в отчете о поиске: SU 385209 A1, 29.05.1973. RU 2119660 С1, 27.09.1998. WO 2005059594 А1, 30.06.2005. US 6069936 А, 30.05.2000. SU 393654 A1, 10.08.1973. SU 483610 A1, 05.09.1975. RU 95100772 A1, 10.11.1996. US 6683934 B1, 27.01.2004. US 5153439 A, 06.10.1992. US 5479023 A, 26.12.1995. (54) УСТРОЙСТВО МОДУЛЯЦИИ ЭНЕРГЕТИЧЕСКОГО СПЕКТРА, СПОСОБ РАСПОЗНАВАНИЯ МАТЕРИАЛА И УСТРОЙСТВО ДЛЯ ЕГО ОСУЩЕСТВЛЕНИЯ, СПОСОБ ОБРАБОТКИ ИЗОБРАЖЕНИЙ (57) Реферат: Использование: для проверки объектов больших размеров посредством рентгеновского излучения. Сущность: заключается в том, что устройство модуляции энергетического спектра содержит первый узел модуляции энергетического спектра, ...

Radiation-phase-contrast imaging device

An X-ray phase-contrast imaging device capable of easily performing imaging of an object using X-rays of plural energies is provided. The disclosed exemplary configuration includes an X-ray source of a dual energy output type, and an FPD having a high energy X-ray detection surface and a low energy X-ray detection surface so that two types of imaging, imaging by high energy X-ray and imaging by low energy X-ray, can be performed. By imaging so as to scan the object while changing the relative position of the imaging system and the object, two types of imaging can be completed at once.

ENERGY SPECTRUM MODULATION DEVICE, MATERIAL DISCRIMINATION METHOD AND DEVICE, IMAGE PROCESSING METHOD

La présente invention a pour objet un dispositif de modulation de spectre d'énergie, un procédé et un dispositif de discrimination de matériau, et un procédé de traitement d'image, qui peut discriminer le matériau dans des objets de dimensions importante et moyenne, en utilisant des rayonnements X ayant des niveaux d'énergie différents, sont décrits.Ce dispositif (2) comprend une première partie de modulation de spectre d'énergie (202) destinée à moduler un premier rayonnement ayant un premier spectre d'énergie et une seconde partie de modulation de spectre d'énergie (203) couplée à la première partie de modulation de spectre d'énergie et destinée à moduler un second rayonnement ayant un second spectre d'énergie différent du premier. La présente invention peut être utilisée pour une inspection sans ouverture de conteneurs de grande dimension. The subject of the present invention is an energy spectrum modulation device, a material discrimination method and device, and an image processing method, which can discriminate the material in large and medium sized objects, by using X-rays with different energy levels are described.This device (2) comprises a first energy spectrum modulation part (202) for modulating a first radiation having a first energy spectrum and a second energy spectrum modulation part (203) coupled to the first energy spectrum modulation part and for modulating a second radiation having a second energy spectrum different from the first one. The present invention can be used for inspection without opening large containers.

DEVICE FOR NON-DESTRUCTIVE CONTROL OF STRUCTURES BY GAMMAGRAPHY

ENERGY SPECTRUM MODULATION DEVICE, MATERIAL DISCRIMINATION METHOD AND DEVICE, IMAGE PROCESSING METHOD

La présente invention a pour objet un dispositif de modulation de spectre d'énergie, un procédé et un dispositif de discrimination de matériau, et un procédé de traitement d'image, qui peut discriminer le matériau dans des objets de dimensions importante et moyenne, en utilisant des rayonnements X ayant des niveaux d'énergie différents, sont décrits.Ce dispositif (2) comprend une première partie de modulation de spectre d'énergie (202) destinée à moduler un premier rayonnement ayant un premier spectre d'énergie et une seconde partie de modulation de spectre d'énergie (203) couplée à la première partie de modulation de spectre d'énergie et destinée à moduler un second rayonnement ayant un second spectre d'énergie différent du premier. La présente invention peut être utilisée pour une inspection sans ouverture de conteneurs de grande dimension. The present invention relates to an energy spectrum modulation device, a material discrimination method and device, and an image processing method, which can discriminate the material in large and medium-sized objects, by using X-rays having different energy levels are described. This device (2) comprises a first energy spectrum modulating part (202) for modulating a first radiation having a first energy spectrum and a second an energy spectrum modulating part (203) coupled to the first energy spectrum modulating part and for modulating a second radiation having a second energy spectrum different from the first. The present invention can be used for unopened inspection of large containers.

Method and apparatus for sensing the ash content of coal

ABSTRACT OF THE DISCLOSURE The ash content of a coal sample is sensed by bombarding it with primary radiation comprising at least two spectrums of energies (46 KeV and 9-17 KeV) to cause radiative reactions in the coal, sensing the secondary radiation generated by the radiative reactions caused by one of the two spectrums of energies (46 KeV), sensing the secondary radiations at a characteristic fluorescent energy of at least one element (e.g. iron) in the coal sample, the characteristic fluorescent energy being excited by the other of the two spectrums of energies (9-17 KeV), and using the sensed secondary radiations to determine the ash content of the coal.

DEVICE FOR MONITORING THE STATE OF MATERIALS THAT CAN BE SPILLED OR SINKED, THE STATE OF MOLDING SAND REGENERATION FOR EXAMPLE

METHOD AND APPARATUS FOR ANALYZING ORES USING GAMMA RAYS

A.PROCEDE PAR IRRADIATION GAMMA ET ANALYSE DE LA DISPERSION PRODUITE. B.AU MOYEN D'APPAREIL CARACTERISE EN CE QU'IL COMPREND DEUX SOURCES DE RADIATION GAMMA 1A, 1B ET 2A, 2B A NIVEAUX D'ENERGIE DIFFERENTS TELS QUE, DANS L'UNE, L'EFFET COMPTON SOIT PREDOMINANT ET, DANS L'AUTRE, SE PRODUISENT L'EFFET COMPTON ET L'EFFET PHOTOELECTRIQUE, UN DETECTEUR 6 RECEVANT LA RADIATION DISPERSEE PAR LE MORCEAU DE MINERAI 5 ET UN CIRCUIT ELECTRONIQUE ANALYSANT CETTE RADIATION PAR COMPARAISON. C.APPAREIL APPLICABLE AU TRI DE MORCEAUX DE ROCHE EN MINERAIS UTILES ET MORCEAUX STERILES. A. PROCESS BY GAMMA IRRADIATION AND ANALYSIS OF THE DISPERSION PRODUCED. B. BY MEANS OF AN APPARATUS CHARACTERIZED IN THAT IT INCLUDES TWO SOURCES OF RADIATION GAMMA 1A, 1B AND 2A, 2B AT DIFFERENT ENERGY LEVELS SUCH THAT, IN ONE, THE COMPTON EFFECT IS PREDOMINANT AND, IN L OTHER THAN THE COMPTON EFFECT AND THE PHOTOELECTRIC EFFECT OCCUR, A DETECTOR 6 RECEIVING THE RADIATION DISPERSE BY THE ORE PIECE 5 AND AN ELECTRONIC CIRCUIT ANALYZING THIS RADIATION BY COMPARISON. C. APPARATUS APPLICABLE TO SORTING ROCK PIECES INTO USEFUL ORES AND STERILE PIECES.

Patent FR2306446B1

Energy radiation generator with uni-polar voltage ladder

A well-logging tool may include a sonde housing and a radiation generator carried by the sonde housing. The radiation generator may include a generator housing, a target carried by the generator housing, a charged particle source carried by the generator housing to direct charged particles at the target, and at least one voltage source coupled to the charged particle source. The at least one voltage source may include a voltage ladder comprising a plurality of voltage multiplication stages coupled in a uni-polar configuration, and at least one loading coil coupled at at least one intermediate position along the voltage ladder. The well-logging tool may further include at least one radiation detector carried by the sonde housing.

RONTGEN SPECTROMETER

Dans ce spectromètre de Röntgen placé dans un boîtier étanche au vide et muni d'une part d'un système de détection de rayons X en fonction de leur longueur d'onde, et d'autre part d'une source d'électrons servant à irradier un échantillon à examiner et comportant un système de déviation d'électrons, ladite source d'électrons devant engendrer un faisceau d'électrons, ainsi que d'une source de Röntgen pour engendrer un faisceau de Röntgen, la source de Röntgen est formée par une anticathode sur laquelle, en vue d'engendrer le faisceau de Röntgen, le faisceau d'électrons peut être orienté à l'aide du système de déviation d'électrons. Application à l'appareillage radioscopique utilisé en médecine. In this Röntgen spectrometer placed in a vacuum-tight case and fitted on the one hand with an X-ray detection system according to their wavelength, and on the other hand with an electron source serving to irradiating a sample to be examined and comprising an electron deflection system, said electron source having to generate an electron beam, as well as a Röntgen source to generate a Röntgen beam, the Röntgen source is formed by an anticathode on which, in order to generate the Röntgen beam, the electron beam can be oriented using the electron deflection system. Application to the fluoroscopic apparatus used in medicine.

Radioactive sample analyzer

Method and apparatus for determining the potassium content of spaces containing potassium

Dosing method and devices by applying

Neutron irradiation device

Dispositif d’irradiation neutronique, comportant : une source de neutrons;un collimateur (30), disposé face à la source neutrons, délimitant un angle solide d’émission s’étendant autour d’un axe d’émission ; le dispositif étant caractérisé en ce que le collimateur comporte des écrans (31, 33) mobiles et agencés pour se rapprocher ou s’éloigner de l’axe d’émission ; de façon que la position de chaque écran, par rapport à la source de neutrons, permet une modulation spatiale et/ou spectrale du rayonnement neutronique. Figure 1. Neutron irradiation device, comprising: a neutron source; a collimator (30), placed opposite the neutron source, delimiting a solid emission angle extending around an emission axis; the device being characterized in that the collimator comprises screens (31, 33) that are movable and arranged to approach or move away from the emission axis; so that the position of each screen, relative to the neutron source, allows spatial and/or spectral modulation of the neutron radiation. Figure 1.

Measuring protein content of foodstuffs - with portable automatic radiometric recording device

Portable automatic measuring appts. for radiometric determn. of the protein content of foodstuffs is comprised of a radioactive beam source, a neutron filter and a moderator in an upper reservoir, a lower reservoir containing a detector surrounded by screening layers and separated by a moderator layer; and a sample chamber equipped with a feed channel for stepwise insertion of samples, and a recording device for recording the results. Measurement is relatively quick (20-30 mins); no chemical degradation of the sample occurs; the appts. can be used to measure relatively large samples (900-1000 kg); protein content is determined with an accuracy of bettern than 1.5%; appts. operates continuously for up to 24 hours without supervision; unit is portable and can be set up by non skilled personnel.

High aspect ratio x-ray targets and uses of same

An x-ray target, a method of using the x-ray target, and a computer program product with instructions for carrying out a method of using the x-ray target. The x-ray target includes a substrate made from a soft x-ray producing material and a high aspect ratio structure made from a hard x-ray producing material. The hard x-ray producing material is embedded in the substrate, formed on the substrate, cantilevered out from the edge of the substrate, or any combination thereof. The high aspect ratio structure comprises a plurality of high aspect ratio structures arranged in one or more grids or arrays, and the high aspect ratio structures in one of the one or more grids or arrays are arranged to form a Hadamard matrix structure.

Method and apparatus for reconstructing 3D image from spatiotemporal overlapping X-rays

본 발명은 시공간적으로 오버랩하는 X선들로부터 3D 영상을 재구성하는 방법과 장치에 관한 것으로, 디텍터의 화소에 입사하는 x선의 강도를 나타내는 신호를 생성하는 디텍터; 적어도 2개의 x선 소스에서 나온 x선이 ROI를 투과하고 디텍터의 화소에서 시공간적으로 오버랩하도록 배열된 다수의 x선 소스; 및 디텍터의 화소에 입사하는 x선의 강도를 나타내는 신호를 받아, 상기 화소에서 오버랩하는 x선 각각으로 인한 강도 추정치를 생성하는 프로세싱 유닛을 포함한다. The present invention relates to a method and apparatus for reconstructing a 3D image from spatiotemporal overlapping X-rays, comprising: a detector for generating a signal indicating the intensity of X-rays incident on a pixel of the detector; a plurality of x-ray sources arranged such that x-rays from the at least two x-ray sources pass through the ROI and overlap in space and time at the pixels of the detector; and a processing unit that receives a signal indicative of the intensity of x-rays incident on a pixel of the detector and generates an intensity estimate due to each of the x-rays overlapping at the pixel.

Device for sorting ores

Изобретение относитс  к устройствам дл  сортировки руд и позвол ет повысить эффективность сортировкиi .Каждый кусок,исследуемый анализирующим блоком, индивидуально облучаетс . при помощи двух источников гамма-излучени , работаюпщх на разных уровн х энергии. Источники выбираютс  таким образом, что на одном уровне энергии преобладает эффект Комптона, а на другом уровне энергии эффект Комптона и фотоэлектрический эффект конкурируют друг с другом. Последний из эффектов строго зависит от пор дкового номера элемента. Таким образом , посредством детектировани  по меньшей мере одним детектором интенсивности рассеивани  и сравнени  интенсивности рассеивани  друг с другом можно получить пропорцию т желых элементов в одном курсе руды. Но этому показателю осуществл етс  сорти- , ровка руд, 3 ил. О) сд ел см The invention relates to an ore sorting device and makes it possible to increase the sorting efficiency i. Each piece examined by the analyzing unit is individually irradiated. with the help of two gamma-radiation sources operating at different levels of energy. Sources are chosen in such a way that the Compton effect prevails at one energy level, and the Compton effect and the photoelectric effect compete with each other. The last of the effects is strictly dependent on the sequence number of the element. Thus, by detecting with at least one detector the intensity of dispersion and comparing the intensity of dispersion with each other, it is possible to obtain the proportion of heavy elements in one course of ore. But this indicator is sorted, ore, 3 sludge. O) sd ate cm

Computed tomography apparatus comprising lamellae form filter and spring focus x-ray source

Die Erfindung betrifft ein Computertomographiegerät, aufweisen:- eine Röntgenquelle und einen Röntgendetektor, der mit der Röntgenquelle zusammenwirkt, wobei die Röntgenquelle und der Röntgendetektor um eine Rotationsachse, die sich zwischen der Röntgenquelle und dem Röntgendetektor befindet, drehbar angeordnet sind,- einen Lamellenformfilter, der zwischen der Röntgenquelle und der Rotationsachse angeordnet ist, wobei der Lamellenformfilter eine erste Mehrzahl von ersten Lamellen aufweist, welche auf eine erste Fokuslinie fokussiert sind,- wobei die Röntgenquelle dazu ausgebildet ist, Röntgenstrahlung in einem ersten Betriebszustand der Röntgenquelle an einem ersten Fokuspunkt zu erzeugen und in einem zweiten Betriebszustand der Röntgenquelle an einem zweiten Fokuspunkt zu erzeugen. The invention relates to a computed tomography device, comprising: an x-ray source and an x-ray detector which interacts with the x-ray source, the x-ray source and the x-ray detector being arranged so as to be rotatable about an axis of rotation which is located between the x-ray source and the x-ray detector, a lamellar shape filter which is arranged between the x-ray source and the axis of rotation, the lamella shape filter having a first plurality of first lamellae, which are focused on a first focus line, the x-ray source being designed to generate x-ray radiation in a first operating state of the x-ray source at a first focus point and generate in a second operating state of the X-ray source at a second focus point.