ГЕНЕРАТОР ИЗЛУЧЕНИЯ ЭНЕРГИИ С ОДНОПОЛЮСНЫМ КАСКАДНЫМ УМНОЖИТЕЛЕМ НАПРЯЖЕНИЯ

... 1. Инструмент для геофизического исследования скважин, который содержит:корпус скважинного прибора;генератор излучения, помещенный в указанный корпус скважинного прибора, который содержиткорпус генератора,мишень, помещенную в указанный корпус генератора,источник заряженных частиц, помещенный в указанный корпус генератора, чтобы направлять заряженные частицы к указанной мишени, ипо меньшей мере, один источник напряжения, подключенный к указанному источнику заряженных частиц, причем, по меньшей мере, один указанный источник напряжения содержиткаскадный умножитель напряжения, который содержит множество каскадов умножения напряжения, соединенных в однополюсной конфигурации, ипо меньшей мере, одну нагрузочную катушку, подключенную, по меньшей мере, в одном промежуточном положении указанного умножителя напряжения; ипо меньшей мере, один приемник излучения, находящийся в корпусе указанного скважинного прибора.2. Инструмент для геофизического исследования по п.1, отличающийся тем, что, по меньшей ...

APPARATUS FOR ACCURATELY AND RAPIDLY MOVING A SOURCE BETWEEN A WORKING POSITION AND A FOLD-BACK POSITION

X-ray fluorescence inspection apparatus and method

Energy radiation generator with bi-polar voltage ladder

A well-logging tool may include a sonde housing, and a radiation generator carried by the sonde housing. The radiation generator may include a generator housing, a target carried by the generator housing, a charged particle source carried by the generator housing to direct charged particles at the target, and at least one voltage source coupled to the charged particle source. The at least one voltage source may include a voltage ladder comprising a plurality of voltage multiplication stages coupled in a bi-polar configuration, and at least one loading coil coupled at at least one intermediate position along the voltage ladder. The well-logging tool may further include at least one radiation detector carried by the sonde housing.

ГЕНЕРАТОР ИЗЛУЧЕНИЯ С ДВУХПОЛЮСНЫМ КАСКАДНЫМ УМНОЖИТЕЛЕМ НАПРЯЖЕНИЯ

Использование: для геофизического исследования скважин. Сущность изобретения заключается в том, что прибор для геофизического исследования скважин может состоять из устройства для крепления генератора в скважинном приборе и генератора излучения, находящегося в устройстве для крепления генератора в скважинном приборе. Генератор излучения может состоять из корпуса генератора, мишени, находящейся в корпусе генератора, источника заряженных частиц, который находится в корпусе генератора, направляющем заряженные частицы к мишени, и по меньшей мере одного источника напряжения, подключенного к источнику заряженных частиц. По меньшей мере один источник напряжения может состоять из каскадного умножителя напряжения, состоящего из множества каскадов умножения напряжения, соединенных в двухполюсной конфигурации, и по меньшей мере одной нагрузочной катушки, подключенной по меньшей мере в одном промежуточном положении умножителя напряжения. Прибор для геофизического исследования скважин может также содержать ...

ГЕНЕРАТОР ИЗЛУЧЕНИЯ С ДВУХПОЛЮСНЫМ КАСКАДНЫМ УМНОЖИТЕЛЕМ НАПРЯЖЕНИЯ

... 1. Инструмент для геофизического исследования скважин, который содержит:корпус скважинного прибора;генератор излучения, помещенный в указанный корпус скважинного прибора, содержащийкорпус генератора,мишень, помещенную в указанный корпус генератора,источник заряженных частиц, помещенный в указанный корпус генератора, чтобы направлять заряженные частицы к указанной мишени, ипо меньшей мере, один источник напряжения, подключенный к указанному источнику заряженных частиц, причем, по меньшей мере, один указанный источник напряжения содержиткаскадный умножитель напряжения, содержащий множество каскадов умножения напряжения, соединенных в двухполюсной конфигурации, ипо меньшей мере, одну нагрузочную катушку, подключенную, по меньшей мере, в одном промежуточном положении указанного умножителя напряжения; ипо меньшей мере, один приемник излучения, находящийся в корпусе указанного скважинного прибора.2. Инструмент для геофизического исследования по п. 1, отличающийся тем, что указанные каскады умножения ...

Röntgenanalysevorrichtung

Die vorliegende Erfindung betrifft eine Röntgenanalysevorrichtung zum Detektieren, mit Hilfe eines Röntgenstrahldetektors, von Röntgenstrahlen, die von einer Probe abgegeben werden, wenn die Probe mit Röntgenstrahlen bestrahlt wird, wobei die Röntgenanalysevorrichtung austauschbare Komponenten umfasst. Die Röntgenanalysevorrichtung umfasst Schilder, die an den austauschbaren Komponenten angebracht sind und Symbole umfassen, welche die Arten von austauschbaren Komponenten anzeigen, eine Kamera zum Fotografieren der austauschbaren Komponenten und der Schilder, und eine CPU und Bilderkennungssoftware zum Spezifizieren der Arten von austauschbaren Komponenten durch Berechnung auf der Grundlage der Symbole in den Schildern.

ENERGY RADIATION GENERATOR WITH BI-POLAR VOLTAGE LADDER

A well-logging tool may include a sonde housing, and a radiation generator carried by the sonde housing. The radiation generator may include a generator housing, a target carried by the generator housing, a charged particle source carried by the generator housing to direct charged particles at the target, and at least one voltage source coupled to the charged particle source. The at least one voltage source may include a voltage ladder comprising a plurality of voltage multiplication stages coupled in a bi-polar configuration, and at least one loading coil coupled at at least one intermediate position along the voltage ladder. The well-logging tool may further include at least one radiation detector carried by the sonde housing.

ESPECIALLY A PROFILED RAPIDLY AND PRECISELY A SOURCE BETWEEN A WORKING POSITION AND A RETRACTED POSITION.

COMPOSITE STRUCTURE BONDLINE INSPECTION

SHIELDING STRATEGY FOR MITIGATION OF STRAY FIELD FOR PERMANENT MAGNET ARRAY

The present disclosure provides an inspection system and a method of stray field mitigation. The system includes an array of electron beam columns, a first permanent magnet array, and a plurality of shielding plates. The array of electron beam columns each includes an electron source configured to emit electrons toward a stage. The first permanent magnet array is configured to condense the electrons from each electron source into an array of electron beams. The first permanent magnet array is arranged at a first end of the array of electron beam columns. The plurality of shielding plates extend across the array electron beam columns downstream of the first permanent magnet array in a direction of electron emission. The array of electron beams pass through a plurality of apertures in each of the plurality of shielding plates, which reduces stray magnetic field in a radial direction of the array of electron beams.

RADIATION IMAGING APPARATUS

A radiation imaging apparatus includes a radiation detector configured to detect radiation and convert the detected radiation into an electrical signal relating to a radiation image, a support base having a rectangular shape and supporting the radiation detector, and a housing accommodating the radiation detector and the support base, wherein the support base includes a plurality of protrusions extending from each side of an outer edge in the rectangular shape toward an inner wall of the housing, and wherein, at an end of a first protrusion located at a corner in the rectangular shape among the plurality of protrusions, a distance to the inner wall of the housing is shorter than at an end of a second protrusion located at a position other than the corner.

X-RAY SCANNING SYSTEM AND METHOD

Systems and methods for scanning an item utilizing an X-ray scanner in order to facilitate a determination of whether the X-ray radiation penetrated through the entirety of the scanned item. Various embodiments comprise a conveying mechanism, an X-ray emitter, a detector, and an X-ray penetration grid (XPG). The XPG may comprise a radiopaque grid that may serve as a reference for determining whether radiation passes through the scanned item, the grid oriented such that the grid members are neither parallel nor perpendicular to the direction of travel. Such orientation may minimize or eliminate "ghosted" radiation signals included in a visual display of the radiation received by the detector. A scanned item may be oriented with the XPG such that radiation emitted by the X-ray emitter that passes through a portion of the scanned item must also pass through the XPG before being received by the detector.

Order exploration for apparatus of spectroscopy

RADIATION SOURCE SYSTEM AND NONDESTRUCTIVE INSPECTION SYSTEM HAVING THE SAME

X-ray scanning system and method

Systems and methods are provided for scanning an item utilizing an X-ray scanner in order to facilitate a determination of whether the X-ray radiation penetrated through the entirety of the scanned item. Various embodiments comprise a conveying mechanism, an X-ray emitter, a detector, and an X-ray penetration grid (XPG). The XPG may comprise a radiopaque grid that may serve as a reference for determining whether radiation passes through the scanned item, the grid oriented such that the grid members are neither parallel nor perpendicular to the direction of travel. Such orientation may minimize or eliminate “ghosted” radiation signals included in a visual display of the radiation received by the detector. A scanned item may be oriented with the XPG such that radiation emitted by the X-ray emitter that passes through a portion of the scanned item must also pass through the XPG before being received by the detector.

PROTECTION DEVICE FOR AN AREA DETECTOR

A protection device (100) and a method for protecting an area detector (200) against collision with an object (10). The protection device (100) is designed to be mountable on the area detector (200) and includes a mounting frame (120) configured to be mounted on the area detector (200) to be protected, wherein the mounting frame (120) is designed to at least partially cover a perimeter rim surface of the area detector (200) to be protected; a first sensor unit arranged on the mounting frame (120) and a light curtain (147, 148) configured to detect and signal a potential collision of the object (10) is provided at an inner area of the area detector (200) surrounded by the mounting frame. A second sensor unit is arranged on the mounting frame (120) and included at least one sensor configured to detect and signal a potential collision of the object (10) at a perimeter rim area of the area detector (200). Further provided is an X-ray detector system and X-ray analysis system including the protection ...

ГЕНЕРАТОР ИЗЛУЧЕНИЯ ЭНЕРГИИ С ОДНОПОЛЮСНЫМ КАСКАДНЫМ УМНОЖИТЕЛЕМ НАПРЯЖЕНИЯ

Использование: для геофизического исследования скважин. Сущность изобретения заключается в том, что прибор для геофизического исследования скважин может состоять из устройства для крепления генератора в скважинном приборе и генератора излучения, находящегося в устройстве для крепления генератора в скважинном приборе. Генератор излучения может состоять из корпуса генератора, мишени, находящейся в корпусе генератора, источника заряженных частиц, который находится в корпусе генератора, направляющем заряженные частицы к мишени, и, по меньшей мере, одного источника напряжения, подключенного к источнику заряженных частиц. По меньшей мере, один источник напряжения может состоять из каскадного умножителя напряжения, состоящего из множества каскадов умножения напряжения, соединенных в однополюсной конфигурации, и по меньшей мере, одной нагрузочной катушки, подключенной, по меньшей мере, в одном промежуточном положении умножителя напряжения. Прибор для геофизического исследования скважин может также ...

X-RAY SCANNING SYSTEM AND METHOD

Systems and methods for scanning an item utilizing an X-ray scanner in order to facilitate a determination of whether the X-ray radiation penetrated through the entirety of the scanned item. Various embodiments comprise a conveying mechanism, an X-ray emitter, a detector, and an X-ray penetration grid (XPG). The XPG may comprise a radiopaque grid that may serve as a reference for determining whether radiation passes through the scanned item, the grid oriented such that the grid members are neither parallel nor perpendicular to the direction of travel. Such orientation may minimize or eliminate "ghosted" radiation signals included in a visual display of the radiation received by the detector. A scanned item may be oriented with the XPG such that radiation emitted by the X-ray emitter that passes through a portion of the scanned item must also pass through the XPG before being received by the detector.

RADIATION IMAGING APPARATUS WITH IMPROVED IMPACT RESISTANCE

A radiation imaging apparatus includes an internal unit having a radiation detector arranged to convert a radiation that is passed through a subject into electric signals. A base plate is arranged to support the radiation detector. A case having a rectangular parallelepiped shape is arranged to accommodate the internal unit. A fitting member is interposed between an inner wall of the case and an end portion of the internal unit, and fitted to the inner wall of the case and the end portion of the internal unit in a planar view as seen from an incident direction of the radiation.

Radiation detector

A radiation detector includes an image generator and a case. The image generator generates a radiograph according to received radiation. The case stores the image generator and includes a first component and a second component screwed to the first component. The second component is movable with respect to the first component in a direction along a seat surface of a screw by a screw hole of the second component being formed such that a diameter is larger than a diameter of a shaft of the screw but smaller than a diameter of a head of the screw. A loosening torque that acts, in a direction to loosen the screw, on the screw when the seat surface receives a frictional force from the second component is smaller than a loosening start torque that is the loosening torque of when the screw starts to loosen.

Facility and method for molecular structure determination

The invention relates to a facility and a method for molecular structure determination. Said facility comprises a first X-ray source (15a,...,15j) capable of emitting a pulsed coherent X-ray beam (17a,...,17j) along a first emission direction (19a,...,19j) and a plurality of first measurement stations (23a,...,23j;25a,...,25j;27a,...,27j) aligned consecutively along the first emission direction. Each of said first measurement stations comprises a sample injector device for injecting a sample beam of a liquid into an interaction region, a focusing unit for focusing an X-ray beam and a detector being sensitive to X-rays emerging from said interaction region. The detector is arranged around said first emission direction and comprises a central opening aligned with said emission direction. The method uses said facility with the following steps: emitting a coherent X-ray beam pulse using said first X-ray source; triggering said injector devices to inject sample beams of liquid into said interaction ...

Facility and method for molecular structure determination

Vehicle mounted security inspection system

A vehicle mounted security inspection system, comprising: a mobile chassis (10); a first compartment (20), the first compartment (20) being disposed on the mobile chassis (10), an article security inspection device (40) being disposed within the first compartment (20), and the article security inspection device (40) being configured to perform security inspections on articles; and a second compartment (30), the second compartment (30) being disposed on the mobile chassis (10), and a human body security inspection device (50) being disposed within the second compartment (30), and the human body security inspection device (50) being configured to perform security inspections on the human body. The second compartment (30) is movably connected to the first compartment (20), so that in a first state, the second compartment (30) is located at one end of the first compartment (20) in the longitudinal direction of the mobile chassis (10), and in a second state, the second compartment (30) is located ...

Apparatus for accurately and rapidly moving a radioactive source to and from a working position

Apparatus for rapidly moving within approximately 1 second and in an accurate manner, a radioactive or neutron source (6) between a working position and a non-working position, particularly in an enclosure (8) containing fissile material for carrying out an analysis thereof by activation, has a spirally wound cable (2) at whose end the source (6) is fixed in a source holder. A motor means (12) drives a gear wheel (18) against which the cable is held by pressure rollers (20) made from a flexible material and distributed over a portion of the periphery of the gear wheel (18). Cable guides (22) adopting the profile of the gear wheel (18) are placed between each of the pressure rollers (20). The arrangement prevents the formation of loops on the cable during the rapid displacement of the source. The storage modes of the spirally wound cable can be linear or in drum form. ...

downhole logging tool, radiation, electronic print a radiation

X-ray scanning system and method

Systems and methods are provided for scanning an item utilizing an X-ray scanner in order to facilitate a determination of whether the X-ray radiation penetrated through the entirety of the scanned item. Various embodiments comprise a conveying mechanism, an X-ray emitter, a detector, and an X-ray penetration grid (XPG). The XPG may comprise a radiopaque grid that may serve as a reference for determining whether radiation passes through the scanned item, the grid oriented such that the grid members are neither parallel nor perpendicular to the direction of travel. Such orientation may minimize or eliminate “ghosted” radiation signals included in a visual display of the radiation received by the detector. A scanned item may be oriented with the XPG such that radiation emitted by the X-ray emitter that passes through a portion of the scanned item must also pass through the XPG before being received by the detector.

ENERGY RADIATION GENERATOR WITH UNI-POLAR VOLTAGE LADDER

A well-logging tool may include a sonde housing and a radiation generator carried by the sonde housing. The radiation generator may include a generator housing, a target carried by the generator housing, a charged particle source carried by the generator housing to direct charged particles at the target, and at least one voltage source coupled to the charged particle source. The at least one voltage source may include a voltage ladder comprising a plurality of voltage multiplication stages coupled in a uni-polar configuration, and at least one loading coil coupled at at least one intermediate position along the voltage ladder. The well-logging tool may further include at least one radiation detector carried by the sonde housing.

Device to convey quickly and with precision a source enters a position of work and uneposition of fold

Dispositif pour véhiculer rapidement, dans une durée de l'ordre de 1 seconde, et avec précision, une source (6), radioactive ou neutronique, entre une position de travail et une position de repli, en particulier dans une enceinte (8) contenant de la matière fissile pour effectuer une analyse de celle-ci par activation, comportant un câble spiralé (2) à l'extrémité duquel est fixée la source (6) dans un porte source, des moyens moteurs (12) entraînant des moyens d'embrayage du câble avec une roue dentée (18) de pas adapté aux spires du câble et un magasin de stockage (10) du câble dans la position de repli de la source, caractérisé d'une part, en ce que les moyens d'entraînement (16) du câble sont constitués de galets presseurs (20) en un matériau souple, répartis sur une portion de la périphérie de la roue dentée (18), des guides-câbles (22), épousant le profil de la roue dentée (18) et des galets presseurs (20), placés entre chacun de ceux-ci, pour éviter, lors du déplacement rapide de ...

SMALL ANGLE LIGHT SCATTERING ANALYSIS SYSTEM

The present invention relates to a light scattering analysis system which is proper to measure a fine structure of a sample. The present invention provides a small angle light scattering analysis system comprising: an output unit which emits an X-ray beam; a stage unit on which a sample is placed; a detecting unit which detects a scattered beam; a first beam path which guides a path of the X-ray beam between the output unit and the stage unit, blocking the X-ray beam from being emitted outside; a second beam path which blocks the scattered beam from being emitted outside between the stage unit and the detecting unit; a base unit including a rail portion which can be attached and removed from the base unit such that positions of the output unit, the first beam path, the stage unit, the second beam path, and the detecting unit are arranged in a longitudinal direction in a straight line; a sensing line arranged on the rail unit including a plurality of sensors; a terminal unit coupled with ...

조립 및 구조 특성이 향상된 엑스레이 장치

... 본 발명은 조립 및 구조 특성이 향상된 엑스레이 검사 장치에 관한 것이고, 구체적으로 간단한 구조로 만들어지면서 조립이 용이해지는 것에 의하여 제조와 유지 보수의 편의성이 향상된 조립 및 구조 특성이 향상된 엑스레이 장치에 관한 것이다. 조립 및 구조 특성이 향상된 엑스레이 장치는 밀폐 공간을 형성하는 검사 하우징(111); 검사 하우징(111)의 측면에 분리된 구획으로 배치되는 작동 케이스(14); 검사 하우징(111)을 관통하는 구조로 배치되는 컨베이어 유닛(13); 검사 하우징(111)의 입구 및 출구 영역에 배치되는 차폐 유닛(17); 및 검사 하우징(111)이 고정되는 고정 프레임(12)을 포함하고, 상기 검사 하우징(111) 및 작동 케이스(14)는 고정 프레임(12)과 독립된 프로파일 프레임에 고정된다.

RADIOGRAPHIC INSPECTION APPARATUS AND RADIOGRAPHIC INSPECTION SYSTEM HAVING SAME

According to the present invention, a radiographic inspection apparatus comprises: a plurality of radiographic inspection equipment installed in a predetermined space required for radiographic inspection to emit radiation by operation of a user; at least one shielding body provided to be spaced from the radiographic inspection equipment installed for radiographic inspection to protect a user from radiation; a shielding determination unit detecting that the user is located in a protective position from radiation by the shielding body; and a server remotely controlling the radiographic inspection equipment when detecting protection of the user by the shielding body by means of the shielding determination unit. COPYRIGHT KIPO 2016 (14,C1,C2) Operation unit (20,A1,A2) Shielding body (30,B1,B2) Shielding determination unit (40) Server ...

X-ray inspection apparatus and method

An X-ray product inspection apparatus 200 and a method of controlling the X-ray product inspection apparatus, the apparatus 200 comprising an X-ray generator 210 comprising an aperture 212 for outputting an X-ray beam, and a shutter apparatus arranged across the aperture 212. The shutter apparatus comprises a moveable shutter plate 220 having a barrier portion 222 of X-ray attenuating material configured to substantially block the X-ray beam; and an actuator mechanism 230 configured to move the shutter plate 220 between a closed position in which the barrier portion 222 is disposed across the aperture 212 to substantially block the X-ray beam and an open position in which the barrier portion 222 is offset from the aperture 212 to enable at least partial emission of the X-ray beam.

Röntgenvorrichtung

Röntgenvorrichtung, umfassend einen C-Bogen mit einem daran drehbar gelagerten Strahlungsdetektor, der über ein motorisches Antriebsmittel drehbar ist, wobei die Drehachse senkrecht auf der Detektorfläche steht, dadurch gekennzeichnet, dass das Antriebsmittel ein Torquemotor (9) umfassend einen Stator (11) und einen Rotor (15) ist, wobei der Strahlungsdetektor (4) mit dem Rotor (15) gekoppelt ist.

X-ray analysis apparatus

Apparatus for accurately and rapidly moving a source between a working position and a retracted position

System and method for monochromatic x-ray gas excitation bond inspection

A system and method for determining the strength of a bond joining a composite structure is provided. The system includes a gas gun produces a short gas pulse directed normal to a surface of the composite structure and that creates a compression wave through the composite structure; a monochromatic x-ray system produces a monochromatic x-ray that is incident at an angle to the surface and that passes through the composite structure; a scintillator screen receives transmitted x-rays that pass through the composite structure; a mirror receives and magnifies radiation emitted from the scintillator screen; a detector receives the radiation from the scintillator screen; an electronic processor configured to process the radiation detected by the detector; and a synchronization controller configured to synchronize operation of the gas gun, the monochromatic x-ray system, and the detector.

X-ray scanning system and method

Systems and methods are provided for scanning an item utilizing an X-ray scanner in order to facilitate a determination of whether the X-ray radiation penetrated through the entirety of the scanned item. Various embodiments comprise a conveying mechanism, an X-ray emitter, a detector, and an X-ray penetration grid (XPG). The XPG may comprise a radiopaque grid that may serve as a reference for determining whether radiation passes through the scanned item, the grid oriented such that the grid members are neither parallel nor perpendicular to the direction of travel. Such orientation may minimize or eliminate “ghosted” radiation signals included in a visual display of the radiation received by the detector. A scanned item may be oriented with the XPG such that radiation emitted by the X-ray emitter that passes through a portion of the scanned item must also pass through the XPG before being received by the detector.

X-ray analysis apparatus

An x-ray analysis apparatus 1 for detecting, using an x-ray detector, x-rays given off by a sample when the sample is irradiated with x-rays, includes replaceable components. The apparatus comprises indicators such as labels attached to the replaceable components and including symbols indicating the types of replaceable components, a camera 16 for photographing the replaceable components and the indicators, and CPU and image recognition software for specifying the types of replaceable components by calculations based on the image of the indicator. The position of the replaceable components in the apparatus may also be determined from the camera images.

BUCKY TRAY AND X-RAY IMAGING DEVICE

The present invention provides an X-ray device having an X-ray detection device, comprising: the X-ray detection device; a storage unit storing the X-ray detection device; and a bucky tray stored and discharged from the storage unit. The bucky tray comprises: a base unit; and a first plate where the X-ray detection device is able to be mounted on one surface, disposed to be rotated with respect to the base unit. The present invention provides the X-ray imaging device, controlling an arrangement position of the X-ray detection device inside the bucky tray. COPYRIGHT KIPO 2017 ...

DEVICE FOR NON DESTRUCTIVE TESTING

X-RAY APPARATUS HAVING IMPROVED ASSEMBLY AND STRUCTURAL CHARACTERISTICS

The present invention relates to an X-ray inspection apparatus having improved assembly and structural characteristics and, more specifically, relates to an X-ray apparatus having improved assembly and structural characteristics with an improved convenience of manufacturing and maintenance by being made in a simple structure and being easily assembled. The X-ray apparatus having improved assembly and structural characteristics comprises: an inspection housing (111) formed with a sealed space; an operating case (14) arranged in a separate section on a lateral surface of the inspection housing (111); a conveyor unit (13) arranged to penetrate the inspection housing (111); a shielding unit (17) arranged on an inlet and outlet area of the inspection housing (111); and a fixing frame (12) having the inspection housing fixated thereto, wherein the inspection housing (111) and the operating case (14) are fixated to a profile frame independent from the fixing frame (12). COPYRIGHT KIPO 2017 ...

RADIATION DETECTOR MODULE WITH INSULATING SHIELD

A radiation detector module includes a frame, a module circuit board connected to the frame, detector units that each include radiation sensors disposed above the frame and electrically connected to the module circuit board, and an optically and infrared radiation opaque, X-ray transparent, electrically insulating detector shield covering a top surface and at least one side surface of the radiation sensors.

Fluorescent X-ray analysis apparatus

There is provided a fluorescent X-ray analysis apparatus in which a detection lower limit is improved, and it is possible to quantify a trace aimed element having been contained not only in a sample whose main component is a heavy element but also in a sample whose main component is a light element. The fluorescent X-ray analysis apparatus possesses a sample base supporting the sample, an X-ray source irradiating a primary X-ray with a predetermined irradiation position being made a center, and a detector disposed toward the irradiation position and detecting a fluorescent X-ray generated from the sample. The sample base has a detachable sample holding tool fixing the sample while being approached to the X-ray source and the detector, and a measurement is possible by selectively disposing the sample in any one of a 1st inspection position in which an irradiated face is coincided with the irradiation position, or a 2nd inspection position in which the sample is fixed to the sample holding ...

X-RAY INSPECTION APPARATUS HAVING IMPROVED EFFICIENCY IN INSPECTION AND X-RAY INSPECTION METHOD

The present invention relates to an x-ray inspection apparatus having an improved efficiency in inspection and an x-ray inspection method therefor and, more specifically, to an x-ray inspection apparatus and a method therefor. The apparatus allows inspection of a plurality of components at once and at the same time and makes movement and inspection of components related to time, thereby improving inspection efficiency. The x-ray inspection method comprises: a step of determining a location of at least one object under inspection in an inspection area and determining a displaying method of a detected image accordingly; a step of determining a processing method of an x-ray detected image of the object under inspection; and a step of determining a relative relationship between a movement of the object under inspection and an inspection time of the detected image. COPYRIGHT KIPO 2016 (11) Setting (12) Control (13) Injection (14) Detection (151) Memory (152) Image ...

SINGLE PIECE DROPLET GENERATION AND INJECTION DEVICE FOR SERIAL CRYSTALLOGRAPHY

A single-piece hybrid droplet generator and nozzle component for serial crystallography. The single-piece hybrid droplet generator component including an internally-formed droplet-generation channel, an internally-formed sample channel, a nozzle, and a pair of electrode chambers. The droplet-generation channel extends from a first fluid inlet opening to the nozzle. The sample channel extends from a second fluid inlet opening to the droplet-generation channel and joins the droplet-generation channel at a junction. The nozzle is configured to eject a stream of segmented aqueous droplets in a carrier fluid from the droplet-generation channel through a nozzle opening of the single-piece component. The pair of electrode chambers are positioned adjacent to the droplet-generation channel near the junction between the droplet-generation channel and the sample channel. The timing of sample droplets in the stream of fluid ejected through the nozzle is controlled by applying a triggering signal to ...

Thin Film Damage Detection Function and Charged Particle Beam Device

A risk of breakage of a sample holder can be reduced and a biochemical sample or a liquid sample can be observed easily and with a high observation throughput. A sample holder 101 holding a sample includes: a sample chamber including a first insulating thin film 110 and a second insulating thin film 111 that sandwich and hold the sample 200 in a liquid or gel form and face each other, a vacuum partition wall inside which the sample chamber holding the sample is fixed in a state in which the thin film is exposed to a surrounding atmosphere, and whose internal space is kept at a degree of vacuum at least lower than that of the sample room at the time of observation of the sample, a detection electrode 820 disposed to face the second insulating thin film in a state in which the sample chamber is fixed to the vacuum partition wall, and a signal detection unit 50 connected to the detection electrode. Before the surrounding atmosphere of the sample holder is evacuated from an atmospheric pressure ...

Neutron ghost imager

X-RAY IMAGE ACQUISITION APPARATUS USING GRID-BASED X-RAY INTERFERENCE AND PHASE DIFFERENCE

According to the present invention, an X-ray image acquisition apparatus using a grid-based X-ray interference and phase difference includes: an X-ray generator (120); a detector (140) having a digital sensor for detecting an X-ray generated from the X-ray generator (120) and transmitted through a specimen (10), and installed to be movable such that the specimen is able to be sectionally filmed; and a grid module (150) disposed between the X-ray generator (120) and the detector (140), wherein the grid module (150) includes an intensity grating (160) and a phase grating (170), wherein the phase grid (170) generates a density difference by using a phase difference obtained by adjusting an angle in a tilting manner. Accordingly, the present invention is able to stably acquire an image in accordance with a phase difference. COPYRIGHT KIPO 2017 ...

X-ray device

An X-ray device includes a C-bracket having a radiation detector rotatably mounted on the C-bracket. The radiation detector may be rotated by a motor drive. The axis of rotation is perpendicular to the detector surface. The motor drive is a torque motor that includes a stator and a rotor. The radiation detector is coupled to the rotor.

Fluorescent X-ray analysis apparatus

There is provided a fluorescent X-ray analysis apparatus in which a detection lower limit is improved, and it is possible to quantify a trace aimed element having been contained not only in a sample whose main component is a heavy element but also in a sample whose main component is a light element. The fluorescent X-ray analysis apparatus possesses a sample base supporting the sample, an X-ray source irradiating a primary X-ray with a predetermined irradiation position being made a center, and a detector disposed toward the irradiation position and detecting a fluorescent X-ray generated from the sample. The sample base has a detachable sample holding tool fixing the sample while being approached to the X-ray source and the detector, and a measurement is possible by selectively disposing the sample in any one of a 1st inspection position in which an irradiated face is coincided with the irradiation position, or a 2nd inspection position in which the sample is fixed to the sample holding ...

Röntgenvorrichtung

Röntgenvorrichtung, umfassend einen C-Bogen mit einem daran drehbar gelagerten Strahlungsdetektor, der über ein motorisches Antriebsmittel drehbar ist, wobei die Drehachse senkrecht auf der Detektorfläche steht, dadurch gekennzeichnet, dass das Antriebsmittel ein Torquemotor (9) umfassend einen Stator (11) und einen Rotor (15) ist, wobei der Strahlungsdetektor (4) mit dem Rotor (15) gekoppelt ist.

RADIATION INSPECTION DEVICE BASED ON IMAGE

The present invention relates to a radiation inspection device based on an image. The radiation inspection device based on the image is to perform nondestructive inspection of a welding unit of a water wall boiler pipe of a thermoelectric power plant based on the image. The radiation inspection device based on the image comprises: a radiation unit, a detection unit, a photographing unit, and a control unit. The radiation unit is installed in one side of the water wall boiler pipe of the thermoelectric power plant requiring the nondestructive inspection to vertically move and be detached. The radiation unit radiates radiation to a welding unit of the water wall boiler pipe. The detection unit is installed in the other side of the water wall boiler pipe on an opposite side of the radiation unit based on the water wall boiler pipe to vertically move and be detached. The detection unit detects radiation radiated from a radiation radiating unit. The photographing unit is installed in the radiation ...

Energy Radiation Generator With Uni-Polar Voltage Ladder

A well-logging tool may include a sonde housing and a radiation generator carried by the sonde housing. The radiation generator may include a generator housing, a target carried by the generator housing, a charged particle source carried by the generator housing to direct charged particles at the target, and at least one voltage source coupled to the charged particle source. The at least one voltage source may include a voltage ladder comprising a plurality of voltage multiplication stages coupled in a uni-polar configuration, and at least one loading coil coupled at at least one intermediate position along the voltage ladder. The well-logging tool may further include at least one radiation detector carried by the sonde housing.

Non-destructive assessment of corn rootworm damage

The present embodiments generally relate to methods of non-destructively imaging plant root damage by insect root herbivores and evaluating the efficacy of insecticidal materials associated with the roots of plants against the insect root herbivores, useful for automated high throughput bioassays.

Shielding strategy for mitigation of stray field for permanent magnet array

The present disclosure provides an inspection system and a method of stray field mitigation. The system includes an array of electron beam columns, a first permanent magnet array, and a plurality of shielding plates. The array of electron beam columns each includes an electron source configured to emit electrons toward a stage. The first permanent magnet array is configured to condense the electrons from each electron source into an array of electron beams. The first permanent magnet array is arranged at a first end of the array of electron beam columns. The plurality of shielding plates extend across the array electron beam columns downstream of the first permanent magnet array in a direction of electron emission. The array of electron beams pass through a plurality of apertures in each of the plurality of shielding plates, which reduces stray magnetic field in a radial direction of the array of electron beams.

POSITIONING DEVICE OF COLLIMATOR FOR NONDESTRUCTIVE INSPECTION

Provided is a positioning device of a collimator for nondestructive inspection. The present invention is stably supported on a fixed holder in which a collimator is received to be fixed and stably irradiates laser beams from a radiation irradiating focus of the collimator in a radiation irradiating direction to precisely control the radiation irradiating focus; thereby performing the high quality nondestructive inspection. The positioning device of a collimator for nondestructive inspection is mounted on the fixed holder receiving the collimator for nondestructive inspection and having a radiation irradiating part to irradiate radiation emitted from the collimator and irradiates the laser beams from the focus position of the radiation irradiating part toward an inspected portion. The positioning device of a collimator for nondestructive inspection comprises: a fixing unit fixed in a part of the fixed holder; and a laser beam irradiation unit fixed on the fixing unit to irradiate the laser ...

X-ray computed tomography apparatus with scanner function

An X-ray computed tomography apparatus with a scanner function includes a vertical frame, a patient support arm provided below the vertical frame, a horizontal support arm extending horizontally from a top portion of the vertical frame, a rotary arm drive unit provided at an end of the horizontal support arm, a horizontal rotation arm provided horizontally below the rotary arm drive unit to rotate 360 degrees, a general CT imaging X-ray source provided at one end of the horizontal rotation arm, and an X-ray detector provided at the other end of the horizontal rotation arm to face the general CT imaging X-ray source. A micro CT imaging X-ray source is provided on the vertical frame, a rotary table for seating and rotating an object to be imaged is provided above the patient support arm, and the X-ray detector is composed of a common X-ray detector.

IMAGING TYPE X-RAY MICROSCOPE

An imaging type X-ray microscope capable of enlarging a numerical aperture even with high energy X-rays and acquiring a magnified image with sufficient intensity even in a laboratory. The imaging type X-ray microscope comprises an X-ray irradiation unit having a microfocal and high-power X-ray source and a condenser mirror for focusing and irradiating the emitted X-rays toward a sample, a sample holding unit for holding the sample, a reflecting mirror type X-ray lens unit for imaging X-rays transmitted through the sample, and an imaging unit for acquiring the imaged X-ray image, wherein each mirror constituting the condenser mirror and the reflecting mirror type X-ray lens unit has a reflecting surface formed with a multilayer film having a high reflectivity in X-rays of a specific wavelength.

Sliding locking type metal detector

HIGH-RESOLUTION COMPUTED TOMOGRAPHY

... x-선 이미징 시스템은 방사선 검출기의 검출기 픽셀의 배향 방향에 평행한 제 1 병진 이동 축 또는 제 2 병진 이동 축을 따라 상이한 검출기 위치에서 일련의 라디오그래프를 획득할 수 있다. 상이한 검출기 위치는 각각 제 1 병진 이동 축 또는 제 2 병진 이동 축을 따라 방사선 검출기의 선형 크기보다 작은 거리만큼 분리될 수 있다. 라디오그래프는 획득된 라디오그래프보다 더 미세한 해상도를 갖는 라디오그래프를 형성하도록 어셈블링되거나, 일련의 라디오그래프에서의 각 라디오그래프보다 더 큰 라디오그래프로 어셈블링될 수 있다.

STRUCTURE FOR WELDING INSPECTION USING RADIATION

The present invention relates to a structure for welding inspection using radiation, comprising: an inspecting room in which an empty space is formed, wherein a top of the inspecting room is opened, and the empty space separated into a first measuring room and a second measuring room; entrances, through which people enter to the measuring rooms, wherein the entrances are formed in the first measuring room and the second measuring room, respectively; and a closing means located on a top of the inspecting room and selectively closing the top of any one of the first measuring room or the second measuring room to seal an inside of the selected measuring room. In this regards, after the inspecting room is separated into the first measuring room and the second measuring room, the top of one of the measuring rooms is opened and the top of an other measuring room is closed to seal an inside thereof by means of the closing means; thus workers can easily transfer materials to be inspected to the ...

RADIATION PHOSPHOR ANALYZING SYSTEM

The present invention relates to a radiation phosphor analyzing system. The radiation phosphor analyzing system comprises: a radiation irradiator; a stage arranged in front of the radiation irradiator, having phosphor arranged thereon to be used as an analysis target; an image sensor which faces the radiation irradiator while having a stage there-between; at least one of a first radiation dosimeter arranged on a side of the phosphor to measure an amount of radiation irradiated from the phosphor and a second radiation dosimeter arranged on a side of the image sensor to measure the amount of radiation passing through the phosphor; a radiation transmitting plate which blocks visible light, allowing radiation to pass therethrough and an optical sensor selectively arranged between the image sensor and the stage in accordance with characteristic analysis items related to the phosphor; and an analysis computer which receives corresponding detection information from each of the first and second ...

Apparatus Having I Improved Efficiency in X-Ray Inspection and Method For the Same

ELECTRON SPECTROMETER

The electron spectrometer includes an excitation part 100 irradiating a sample with an energy beam, an orbiting part 10 causing electrons emitted from the sample irradiated with the energy beam to orbit, and a detection part 120 detecting the electrons released from the orbiting part 10, in which the orbiting part 10 includes a plurality of pairs of electrodes, the plurality of pairs of electrodes cause the electrons to orbit when an applied voltage is controlled, a part of the plurality of pairs of electrodes are pairs of electrodes to catch which catch the electrons into the orbiting part 10 when an applied voltage is controlled, and a part of the plurality of pairs of electrodes are pairs of electrodes to release which release the electrons from the orbiting part 10 when an applied voltage is controlled.

X-RAY FLUOROSCOPE

X-RAY IMAGING APPARATUS

Provided are an X-ray detecting device and an X-ray imaging apparatus including the same, comprising: an X-ray detecting device; an accommodation unit configured to accommodate the X-ray detecting device; and bucky tray configured to be accommodated and discharged from the accommodation unit. The bucky tray comprises: a base; and a first plate of which one surface has the X-ray detecting device mounted thereon which is configured to rotate with respect to the base. COPYRIGHT KIPO 2016 ...

EXPLOSIVE CHECKING SYSTEM AND METHOD FOR OPERATING SAME

The present invention relates to an explosive checking system, and a method for operating the same. The present invention comprises: a camera capturing an explosive; an imager (an image detector) storing information of the explosive captured by the camera; and a user device having a computer or a tablet PC wirelessly connected to the camera or/and the imager. Therefore, the present invention can rapidly check contents of the explosive and processes the explosive. COPYRIGHT KIPO 2017 ...

X-RAY SCANNING SYSTEM AND METHOD

Systems and methods are provided for scanning an item utilizing an X-ray scanner in order to facilitate a determination of whether the X-ray radiation penetrated through the entirety of the scanned item. Various embodiments comprise a conveying mechanism, an X-ray emitter, a detector, and an X-ray penetration grid (XPG). The XPG may comprise a radiopaque grid that may serve as a reference for determining whether radiation passes through the scanned item, the grid oriented such that the grid members are neither parallel nor perpendicular to the direction of travel. Such orientation may minimize or eliminate “ghosted” radiation signals included in a visual display of the radiation received by the detector. A scanned item may be oriented with the XPG such that radiation emitted by the X-ray emitter that passes through a portion of the scanned item must also pass through the XPG before being received by the detector.

엑스선 촬영 장치

... 엑스선 검출 장치, 엑스선 검출 장치를 수납할 수 있는 수납부, 및 수납부에 수납 및 배출되는 버키 트레이를 포함하며, 버키 트레이는 베이스부, 및 베이스부에 대해 회전 가능하도록 배치되고, 일 면에 상기 엑스선 검출 장치가 탑재될 수 있는 제1 플레이트를 구비하는 엑스선 검출 장치 및 이를 포함하는 엑스선 장치를 제공한다.

SWITCH DEVICE, X-RAY IMAGING APPARATUS HAVING SAME, AND ELECTRONIC DEVICE

The present invention provides a switch device which easily operates a switch through an operation part by installing the operation part in a bracket formed by an elastic material through double injection. The switch device according to an embodiment of the present invention, which generates a signal with respect to the control of an electronic device, comprises: a switch which is formed in a printed circuit board to be tilted; an operation part which is connected to the switch; a bracket in which the operation part is installed to be rotated; and a support part which is formed by an elastic material in the bracket and supports one side of the operation part. COPYRIGHT KIPO 2016 ...

FLUORESCENT X-RAY ANALYZER

The objective of the present invention is to provide an X-ray analyzer which can improve visibility of a measurement position of a specimen placed on a specimen stage without being large-scaled, and can facilitate easy specimen access. The fluorescent X-ray analyzer comprises: the specimen stage having a placement plane where a specimen can be installed; an X-ray source (3) which is arranged just above an irradiation position (P) irradiating a first X-ray (X1) as to the specimen, and irradiates the first X-ray as to the specimen; a detector (4) detecting a fluorescent X-ray generated from the specimen irradiated with the first X-ray; and a shielding container (5) accommodating the specimen stage, the X-ray source and the detector at least. The shielding container comprises a specimen room part (6) accommodating the specimen stage, and a door part (7) capable of opening and closing at least a front half part of an upper part of the specimen room part. The X-ray source and the detector are ...

고해상도 컴퓨터 단층 촬영

... x-선 이미징 시스템은 방사선 검출기의 검출기 픽셀의 배향 방향에 평행한 제 1 병진 이동 축 또는 제 2 병진 이동 축을 따라 상이한 검출기 위치에서 일련의 라디오그래프를 획득할 수 있다. 상이한 검출기 위치는 각각 제 1 병진 이동 축 또는 제 2 병진 이동 축을 따라 방사선 검출기의 선형 크기보다 작은 거리만큼 분리될 수 있다. 라디오그래프는 획득된 라디오그래프보다 더 미세한 해상도를 갖는 라디오그래프를 형성하도록 어셈블링되거나, 일련의 라디오그래프에서의 각 라디오그래프보다 더 큰 라디오그래프로 어셈블링될 수 있다.

Fluorescent X-ray analysis apparatus

There is provided a fluorescent X-ray analysis apparatus in which a detection lower limit is improved, and it is possible to quantify a trace aimed element having been contained not only in a sample whose main component is a heavy element but also in a sample whose main component is a light element. The fluorescent X-ray analysis apparatus possesses a sample base supporting the sample, an X-ray source irradiating a primary X-ray with a predetermined irradiation position being made a center, and a detector disposed toward the irradiation position and detecting a fluorescent X-ray generated from the sample. The sample base has a detachable sample holding tool fixing the sample while being approached to the X-ray source and the detector, and a measurement is possible by selectively disposing the sample in any one of a 1st inspection position in which an irradiated face is coincided with the irradiation position, or a 2nd inspection position in which the sample is fixed to the sample holding ...

X-ray scanning system and method

Systems and methods are provided for scanning an item utilizing an X-ray scanner in order to facilitate a determination of whether the X-ray radiation penetrated through the entirety of the scanned item. Various embodiments comprise a conveying mechanism, an X-ray emitter, a detector, and an X-ray penetration grid (XPG). The XPG may comprise a radiopaque grid that may serve as a reference for determining whether radiation passes through the scanned item, the grid oriented such that the grid members are neither parallel nor perpendicular to the direction of travel. Such orientation may minimize or eliminate “ghosted” radiation signals included in a visual display of the radiation received by the detector. A scanned item may be oriented with the XPG such that radiation emitted by the X-ray emitter that passes through a portion of the scanned item must also pass through the XPG before being received by the detector.

X-RAY FLUOROSCOPE

An X-ray fluoroscope for performing tilt tracking and rotation tracking with high accuracy and with simple operation in observation work without inputting the distance from the surface of the table to the observation point of the fluoroscopy object and without performing previous calibration operation for determining the distance. An X-ray fluoroscope has a tracking function of moving the table (2) by determining an amount of movement of the table (2) necessary for tilt or rotation tracking by computation using the distance h which is the total of the distance d from the surface of the table (2) to the observation point (V) and the distance z from the surface of the table (2) to the X-ray focus (1a). As the initial value of the distance h, a prescribed value or a given input value is used, and the observation point (V) is specified on the screen after the tracking. Thus, by using the variation of the observation point (V) caused by the tracking, the distance h is updated, thereby improving ...

SAMPLE SUPPORT PLATE FOR X-RAY ANALYSIS AND FLUORESCENT X-RAY ANALYSIS DEVICE

The present invention provides a sample support plate for X-ray analysis and a fluorescent X-ray analysis device, capable of suppressing a mistake and improving workability of measuring a sample in fluorescent X-ray analysis. The sample support plate (1) for X-ray analysis to which a sample S is fixed when analysis is performed by the fluorescent X-ray analysis device includes the sample and a plate-shaped main body (2) supporting the sample and having a cord indicating unit (3) encoding information on the sample and indicating the same. The fluorescent X-ray analysis device includes: an X-ray pipe unit radiating a first X-ray onto the sample; a detector detecting a fluorescent X-ray generated from the sample where the first X-ray is radiated; a sample support in which the sample support plate for X-ray analysis is installed; a photographing unit photographing the cord indicating unit; and a cord processing unit decoding the information of the cord indicating unit encoded by the cord indicating ...

X-ray fluoroscopic apparatus

An X-ray fluoroscopic apparatus is provided, for which it is unnecessary to input the distance extending from a table surface to the observation point of a fluoroscopic object, and it is also unnecessary to perform beforehand a calibration operation used for calculating out the distance, then an inclination tracking or a rotation tracking can be performed by means of a simple operation within an observation operation. An X-ray fluoroscopic apparatus has a tracking function, which can find out the movement amount of a table 2 necessary for performing an inclination tracking or a rotation tracking and then let the table 2 be moved by means of a calculation using the summed distance of the distance d, which extends from the surface of the table 2 to the observation point V, and the distance z that extends from the surface of the table 2 to the X-ray focus 1a. In the X-ray fluoroscopic apparatus described above, a specified value or any input value is used as an initial value of the distance ...

X-RAY ANALYSIS APPARATUS

An X-ray analysis apparatus for detecting, using an X-ray detector, X-rays given off by a sample when the sample is irradiated with X-rays, the X-ray analysis apparatus having replaceable components. The X-ray analysis apparatus comprises labels attached to the replaceable components and including symbols indicating the types of replaceable components, a camera for photographing the replaceable components and the labels, and CPU and image recognition software for specifying the types of replaceable components by calculation based on the symbols in the labels.

X-ray analysis apparatus

An X-ray analysis apparatus for detecting, using an X-ray detector, X-rays given off by a sample when the sample is irradiated with X-rays, the X-ray analysis apparatus having replaceable components. The X-ray analysis apparatus comprises labels attached to the replaceable components and including symbols indicating the types of replaceable components, a camera for photographing the replaceable components and the labels, and CPU and image recognition software for specifying the types of replaceable components by calculation based on the symbols in the labels.

X-ray examination device

A device for examining a sample by X-radiation having a radiation generation system for generating primary radiation, a first goniometer arm on which the radiation generation system is mounted and which is pivotable about a goniometer axis, a detection system configured to detect secondary radiation emanating from the sample, a second goniometer arm on which the detection system is mounted and which is pivotable about the goniometer axis, and an evacuable sample chamber within which the sample is arrangeable in a sample region encompassing a portion of the goniometer axis, the sample chamber being delimited by a sample chamber wall which has a transmission region which is transmissive to the primary radiation and is vacuum-tight, in order to allow the primary radiation to penetrate into the sample chamber and to impinge on the sample region at different angles of incidence.

APPARATUS FOR FIXING POSITION OF FILM FOR NON-DESTRUCTIVE INSPECTION

The present invention provides an apparatus for fixing a position of a film for non-destructive inspection, and to allow a film to accurately and effectively come in contact with and be fixated to a surface of a non-destructive inspection target. An apparatus for fixing a film attached to a welding portion of a tube body for non-destructive inspection by a radiographic method comprises: a vertical member which has a clamp on an upper end thereof, and configured to have a flexible length; a support member provided under the vertical member, supporting the vertical member; a horizontal member detachably fixated to the clamp, configured to have a flexible length, and has a ball seat on the front thereof; and a cover member which has a ball head coupled to the ball seat on a rear end thereof, and comes in close contact and is fixated to the welding portion of the tube body while covering the film in accordance with an elongation of the horizontal member, wherein each of the vertical member ...

DEVICE TO ANALYZE ACTIVATION

The present invention relates to a device to analyze activation. More specifically, the device comprises: a loader on which a sample fed to a nuclear reactor is seated; a receiver to accommodate a sample discharged from the nuclear reactor; a diverter connected with a common pipe serving as a pathway to supply or withdraw the sample to or from the nuclear reactor, a sample supply pipe connected with the loader, and a sample withdrawing pipe connected with the receiver, adjusting the opening and closing of the sample supply pipe and the common pipe and the opening and closing of the sample withdrawing pipe and the common pipe; a movement detection sensor disposed in the common pipe, and sensing a supply of the sample to the nuclear reactor; and a sound sensing unit disposed in the common pipe, and sensing an arrival of the sample to a neutron irradiation pipe disposed in the nuclear reactor by sound. An initialization time of neutron irradiation time with respect to the sample in neutron ...

APPARATUS FOR AUTOMATICALLY AND CONTINUOUSLY INSPECTING BATTERY

The present invention relates to an apparatus for automatically and continuously inspecting a battery, and more specifically, to an apparatus for automatically and continuously inspecting a battery, which can continuously inspect a battery in different directions and automatically performs an inspection process. The apparatus for automatically and continuously inspecting a battery comprises: a first conveyor module (11) transferring a battery to an inspection area; a battery alignment module (15) moving the battery transferred by the first conveyor module (11) to the inspection area; an inspection module (16) comprising a pair of x-ray tubes (161, 162) which can apply x-rays to the battery in different directions on the inspection area; a second conveyor module (12) transferring a battery regarded as a defective battery in an inspection process using the inspection module (16); and a third conveyor module (13) transferring a battery regarded as a normal battery in an inspection process ...

RADIOGRAPHIC INSPECTION APPARATUS AND RADIOGRAPHIC INSPECTION SYSTEM HAVING SAME

The present invention relates to a radiographic inspection apparatus. The radiographic inspection apparatus comprises: a main body which has a path where a radioactive material is moved; a control part which controls a drawing in/out of the radioactive material by moving the radioactive material along the path; a remote control part which remotely controls the control part; and a shielding body which protects a user from radiation, wherein the remote control part controls the movement of the radioactive material by controlling the control part in accordance with the coupling to the shielding body. COPYRIGHT KIPO 2016 ...

X-RAY FLUOROSCOPE

An X-ray fluoroscope for performing tilt tracking and rotation tracking with high accuracy and with simple operation in observation work without inputting the distance from the surface of the table to the observation point of the fluoroscopy object and without performing previous calibration operation for determining the distance. An X-ray fluoroscope has a tracking function of moving the table (2) by determining an amount of movement of the table (2) necessary for tilt or rotation tracking by computation using the distance h which is the total of the distance d from the surface of the table (2) to the observation point (V) and the distance z from the surface of the table (2) to the X-ray focus (1a). As the initial value of the distance h, a prescribed value or a given input value is used, and the observation point (V) is specified on the screen after the tracking. Thus, by using the variation of the observation point (V) caused by the tracking, the distance h is updated, thereby improving ...

SINGLE PIECE DROPLET GENERATION AND INJECTION DEVICE FOR SERIAL CRYSTALLOGRAPHY

A single-piece hybrid droplet generator and nozzle component for serial crystallography. The single-piece hybrid droplet generator component including an internally-formed droplet-generation channel, an internally-formed sample channel, a nozzle, and a pair of electrode chambers. The droplet-generation channel extends from a first fluid inlet opening to the nozzle. The sample channel extends from a second fluid inlet opening to the droplet-generation channel and joins the droplet-generation channel at a junction. The nozzle is configured to eject a stream of segmented aqueous droplets in a carrier fluid from the droplet-generation channel through a nozzle opening of the single-piece component. The pair of electrode chambers are positioned adjacent to the droplet-generation channel near the junction between the droplet-generation channel and the sample channel. The timing of sample droplets in the stream of fluid ejected through the nozzle is controlled by applying a triggering signal to ...

SYSTEM AND METHOD FOR MONOCHROMATIC X-RAY GAS EXCITATION BOND INSPECTION

A system and method for determining the strength of a bond joining a composite structure is provided. The system includes a gas gun produces a short gas pulse directed normal to a surface of the composite structure and that creates a compression wave through the composite structure; a monochromatic x-ray system produces a monochromatic x-ray that is incident at an angle to the surface and that passes through the composite structure; a scintillator screen receives transmitted x-rays that pass through the composite structure; a mirror receives and magnifies radiation emitted from the scintillator screen; a detector receives the radiation from the scintillator screen; an electronic processor configured to process the radiation detected by the detector; and a synchronization controller configured to synchronize operation of the gas gun, the monochromatic x-ray system, and the detector.

Apparatus Having I Improved Efficiency in X-Ray Inspection and Method For the Same

Spiral spring inner insertion type metal detector

BEAM STOPPER APPARATUS

The present invention relates to an optical measurement area and, more specifically, relates to a beam stopper apparatus which aligns a beam stopper in an accurate position when a beam is aligned. The present invention comprises: one or more beam stoppers arranged on a beam path; a wire connected to both sides of the beam stoppers; a drive part which adjusts a horizontal position of the beam stoppers by providing tension to the wire; and a support part which functions as a guide to vertically transfer the drive part, wherein the drive part adjusts the horizontal position of the selected beam stopper by winding the wire after a vertical position of the selected beam stopper is adjusted, thereby aligning the direction of the beam. COPYRIGHT KIPO 2016 ...

Defect reviewing method and device

To review minute defects that were buried in roughness scattered light with an observation device provided with a dark-field microscope, a scanning electron microscope (SEM), and a control unit, the present invention configures the dark-field microscope by installing a filter for blocking a portion of the scattered light, an imaging lens for focusing the scattered light that has passed through the filter, and a detector for dividing the image of the scattered light focused by the imaging lens into the polarization directions converted by a wavelength plate and detecting the resulting images, and the control has a calculation unit for determining the position of a defect candidate detected by another inspection device using the plurality of images separated into polarization directions and detected by the detector.

COMPOSITE STRUCTURE BONDLINE INSPECTION

An X-ray inspection system is presented. The X-ray inspection system comprises an X-ray source, an X-ray scintillator, a light detector, a first objective lens, and a second objective lens. The first objective lens is positioned between the X-ray scintillator and the light detector. The second objective lens is positioned between the first objective lens and the light detector. 1. An X-ray inspection system comprising:an X-ray source;an X-ray scintillator;a light detector;a first objective lens positioned between the X-ray scintillator and the light detector; anda second objective lens positioned between the first objective lens and the light detector.2. The X-ray inspection system of claim 1 , wherein the first objective lens is positioned such that the first objective lens is a first distance from the X-ray scintillator.3. The X-ray inspection system of claim 2 , wherein the first distance is selected such that the first objective lens provides magnification.4. The X-ray inspection system of claim 1 , wherein the light detector comprises one of a charge-coupled device (CCD) image detector or a complementary metal-oxide-semiconductor (CMOS) image detector.5. The X-ray inspection system of further comprising:an X-ray source housing, wherein the X-ray source is positioned within the X-ray source housing; anda detector housing, wherein the X-ray scintillator, the light detector, the first objective lens, and the second objective lens are positioned within the detector housing.6. The X-ray inspection system of further comprising:a magnetic alignment system, wherein a first component of the magnetic alignment system is connected to the X-ray source housing, and wherein a second component of the magnetic alignment system is connected to the detector housing.7. The X-ray inspection system of claim 1 , wherein the first objective lens has an anti-reflective coating configured to selectively block light having wavelengths of light emitted by the X-ray scintillator.8. The X- ...

downhole logging tool, radiation, electronic print a radiation

With bipolar voltage ladder of energy radiation generator

X fluorescent x-ray analyzer

X-ray inspection apparatus

An X-ray inspection apparatus includes: an X-ray irradiation unit; a transport unit; an X-ray detection unit; and an X-ray shielding door. An inclined portion that is inclined downward from the one side toward the other side in the width direction when seen in the transport direction in the closed state is formed in at least a part of an inner surface of the X-ray shielding door. In the closed state, a lower end portion of the inclined portion in the vertical direction is located closer to the other side of the width direction than a position of an end portion of the transport unit on the one side of the width direction.

Computer tomographic workpiece measuring device

A marine device has a floating buoy containing electronics, a submerged payload containing electrical devices and electronics, a power source and a mooring line. At least a part of the power source is submerged and electrically connected to at least one of the submerged payload and the floating buoy, and the mooring line extends between the buoy and at least one of the power source submerged part, the submerged payload and a submerged anchor having a mass allowing it to stay under the water surface.

Method for calibrating at least one detector array formed by a plurality of detectors

In a method for calibrating at least one detector array formed by a plurality of detectors that is exposed to a high-energy, fan-shaped expanding radiation emanating from an approximately point-like energy source, serving the penetration of a material for measuring physical properties due to the absorption capacity of the material, it is provided that at least two in each case homogeneously formed calibration bodies whose gradually differing absorption is designed in a way that the absorption capacity of the one calibration body is lower and the one of the other calibration body is higher than the absorbance capacity of the material to be measured.

Protection device for x-ray instrumentation

An accessory, method, and system is provided for protecting the lower chamber of X-ray spectroscopic instrumentation during analysis, the instrumentation including an upper chamber, a lower chamber, and a dividing plate, the lower chamber including an X-ray detector and an excitation source, the accessory including: a frame with a centrally-located aperture extending from one side of the frame to an opposite side of the frame; an adhesive layer disposed on each side of the frame; a thin film of polymeric material disposed on one side of the frame; and a removably attached release sheet on the adhesive layer disposed on the opposite side of the frame, where the accessory is disposed on a surface of the dividing plate to protect the lower chamber of the instrumentation from damage.

Portable x-ray system and remote control

Disclosed is a system for X-Ray examination of a target, which includes uprange controller means, a scintillator for sensing actually radiation sent, and a dosimeter for placing behind said target, for determining proper exposure of an image plate.

X-ray analysis apparatus

An X-ray analysis apparatus having a function for enabling a plurality of measurement methods to be implemented, the X-ray analysis apparatus having: a measurement system capable of implementing a plurality of measurement methods; measurement software for implementing, in a selective manner, each of the measurement methods; a material evaluation table for storing information relating to a material that may be measured, and a name of an evaluation performed on the material; an input device for inputting the information relating to the material; a wizard program for performing computation for selecting the name of an evaluation on the basis of the information relating to the material inputted using the input device; and a wizard program for selecting a corresponding measurement method on the basis of the selected name of the evaluation.

Integrated, portable sample analysis system and method

An integrated, portable sample analysis system and method. A viscometer subsystem receives a first portion of a sample. A spectrometer subsystem receives a second portion of the sample. A syringe pump subsystem receives a third portion of the sample and is configured to urge the third portion of the sample through a filter which collects particles in the sample thereon. An x-ray analysis subsystem is configured to x-ray the particles. The x-ray analysis subsystem also receives a fourth portion of the sample in order to determine the composition of any dissolved material in the sample. A processing subsystem provides a report concerning the sample and its viscosity, physical properties, particulate count and size distribution, and the composition of particulate and dissolved elements in the sample.

Radiation imaging apparatus and control method thereof, and radiation imaging system

An FPD detects an X-ray image of an object. The FPD includes a plurality of pixels arranged in its image capturing field. Each pixel receives X-rays emitted from an X-ray source, and outputs a pixel value in accordance with an X-ray dose applied thereto. A pixel determiner determines a minimum-value pixel out of the pixels based on the pixel values of the pixels. The minimum-value pixel is a pixel whose pixel value is the lowest. The pixel determiner sets the minimum-value pixel as an exposure control pixel. A comparator compares a first integrated value, which is an integrated value of the pixel values of the minimum-value pixel, with a predetermined first threshold value. The comparator performs X-ray emission control such that, when the first integrated value has reached the first threshold value, the X-ray source stops emitting the X-rays.

Customizable software platform for x-ray imaging equipment

The invention provides a software platform to customize the software programming needed to operate industrial X-ray imaging systems. Industrial X-ray systems require systems software for managing and controlling internal machine operation and exposing X-ray imaging and image processing capabilities. The various end users require different software programs to operate the equipment. The invention provides for a single software platform for developing a custom software program for the targeted end use. The customizing can be done without the need for software engineers. End-users can select from a stored list of software components that relate to the desired functional, workflow and graphical user interface requirements. Software components are provided that provide for the necessary linkages to create a customized application that is operable via a graphical user interface.

Flex plate with removable inserts and cover

Technologies are described for methods and systems effective for flex plates. The flex plates may comprise a base plate. The base plate may include walls that define an insert location opening in the base plate. The insert location opening in the base plate may be in communication with a securement area. The flex plates may comprise an insert. The insert may include a reservoir region and a crystallization region separated by a wall including channels. The reservoir region and the crystallization region may include a backing. The insert may further include securement tabs. The securement tabs may be configured to secure the insert to the base plate at the securement area.

SYSTEM AND METHOD FOR QUANTIFYING X-RAY BACKSCATTER SYSTEM PERFORMANCE

A system for quantifying x-ray backscatter system performance is disclosed. The system includes one or more x-ray backscatter detectors, an x-ray tube, a support, and a plurality of rods mounted on the support and arranged in groups. Each group of rods includes at least two rods having the same width. The system also includes a user interface configured to connect to the x-ray backscatter detectors to receive a backscatter signal from the x-ray backscatter detectors associated with the x-ray tube, where the user interface plots a modulation transfer function representing x-ray backscatter for each rod of the plurality of rods from x-rays transmitted by the x-ray tube. 1. A system for quantifying x-ray backscatter system performance , the system including one or more x-ray backscatter detectors and an x-ray tube , the system comprising:a support;a plurality of rods mounted on the support and arranged in groups, wherein each group of rods include at least two rods having the same width; anda user interface configured to connect to the x-ray backscatter detectors to receive a backscatter signal from the x-ray backscatter detectors associated with the x-ray tube, wherein the user interface plots a modulation transfer function representing x-ray backscatter for each rod of the plurality of rods from x-rays transmitted by the x-ray tube.2. The system of claim 1 , further comprising a storage in communication with the user interface claim 1 , wherein a reference modulation transfer function plot representing initial readings representing reference settings of the system are kept in the storage.3. The system of claim 2 , wherein the user interface includes a display claim 2 , and wherein a plot representing the modulation transfer function and the reference modulation transfer function plot are both shown upon the display.4. The system of claim 1 , wherein the user interface is configured to display a backscatter image based on the backscatter signal from the x-ray ...

Shutter Assembly for X-Ray Detection

An embodiment of a shutter assembly is described that comprises a support structure with a number of stations and operatively coupled to a motor configured to translate each of the stations to a position in front of a detector, wherein a first station comprises a first aperture, a first charged particle filter, and a first window; and a second station comprises a second aperture larger than the first aperture, a second charged particle filter, and a second window thinner than the first window. 1. A shutter assembly , comprising: a first station comprises a first aperture, a first charged particle filter, and a first window; and', 'a second station comprises a second aperture larger than the first aperture, a second charged particle filter, and a second window thinner than the first window., 'a support structure comprising a plurality of stations and operatively coupled to a motor configured to translate each of the stations to a position in front of a detector, wherein2. The shutter assembly of claim 1 , wherein:the support structure comprises six stations.3. The shutter assembly of claim 1 , wherein:the support structure comprises two embodiments of the first station.4. The shutter assembly of claim 3 , wherein:the support structure comprises two embodiments of the second station.5. The shutter assembly of claim 1 , wherein:the second window constructed with a different material from the first window.6. The shutter assembly of claim 5 , wherein:the first window is configured with a material that comprises beryllium.7. The shutter assembly of claim 5 , wherein:the second window is configured with a polymer material.8. The shutter assembly of claim 7 , wherein:{'sub': 3', '4, 'the polymer material comprises SiN.'}9. The shutter assembly of claim 1 , wherein:the support structure is substantially circular in one plane, wherein the stations are circumferentially arranged on the plane.10. The shutter assembly of claim 1 , wherein:the motor comprises a vacuum safe ...

WELL PLATE

The present invention includes an apparatus for preparing samples for measurement by x-ray fluorescence spectrometry. The apparatus comprises a plate having one or more holes passing through the plate. The holes are covered by a film on one side of the plate. The holes are less than 500 micrometers across in one dimension where the film covers the holes. The film is translucent to x-rays. The present invention also includes an apparatus for preparing samples for measurement by x-ray fluorescence spectrometry. The apparatus comprises a plate having one or more holes passing through the plate. The holes are covered on one side of the plate by a detachable cover forming a water-tight seal against the plate. The cover is substantially free of the elements osmium, yttrium, iridium, phosphorus, zirconium, platinum, gold, niobium, mercury, thallium, molybdenum, sulfur, lead, bismuth, technetium, ruthenium, chlorine, rhodium, palladium, argon, silver, and thorium. The holes are less than about 500 micrometers across in one dimension where the cover covers the holes. The present invention also includes a method for preparing samples for measurement by x-ray fluorescence spectrometry. The method comprises providing a solution of with less than 10 micromolar solute and a volume of between about 2 microliters and about 2 milliliters. The solution is concentrated and analyzed using x-ray fluorescence spectrometry. 1. An apparatus for preparing one or more samples for measurement by x-ray fluorescence spectrometry , comprising a plate having at least one hole penetrating said plate; a film covering said hole , said film being at least 5% translucent to 2 ,300 eV X-rays oriented normal to said film; and said hole being less than about 500 micrometers in at least one dimension parallel to said film at the location where said hole adjoins said film.2. The apparatus of claim 1 , wherein said hole has an included angle of less than about 45 degrees.3. The apparatus of claim 2 , ...

Preparation of samples for XRF using flux and platinum crucible

A method of of preparing samples for XRF using a flux and a platinum crucible includes forming the flux into a free-standing crucible liner. This may be achieved by mixing lithium borate particles with a liquid to form a paste; placing the lithium borate paste onto the inner surface of a mould; and after drying removing from the mould and firing the lithium borate paste to dry the lithium borate to form a free-standing crucible liner. The liner may be placed within a platinum crucible and then a sample placed in the liner. The temperature of the crucible is raised to a sufficient temperature that any oxidation reaction takes place before taking the temperature above the melting temperature of the flux to melt the crucible liner and dissolve the sample into the flux. The crucible can then be cooled and XRF measurements made on the sample.

X-RAY INSPECTION APPARATUS FOR INSPECTING SEMICONDUCTOR WAFERS

An x-ray inspection system includes a cabinet including an x-ray source, a sample support supporting a sample to be inspected, and an x-ray detector. The system further includes an air mover configured to force air into the cabinet through an air inlet in the cabinet above the sample support. The air mover and cabinet are configured to force air through the cabinet from the air inlet past the sample support to an air outlet in the cabinet below the sample support. The cabinet may be constructed to provide an x-ray shield. The x-ray inspection system can be used in a clean room environment to inspect items such as semiconductor wafers. 1. An x-ray inspection system , comprising:a cabinet comprising an x-ray source, a sample support supporting a sample to be inspected, and an x-ray detector; andan air mover configured to force air into the cabinet through an air inlet in the cabinet above the sample support,wherein the air mover and cabinet are configured to force air through the cabinet from the air inlet past the sample support to an air outlet in the cabinet below the sample support.2. The x-ray inspection system according to claim 1 , wherein the cabinet prevents x-rays from the x-ray source from escaping from the cabinet.3. The x-ray inspection system according to claim 1 , wherein the air mover is positioned above the sample support within the cabinet.4. The x-ray inspection system according claim 1 , wherein the air mover comprises an x-ray shield arranged to prevent the escape of the x-rays from the cabinet through the air mover.5. The x-ray inspection system according claim 1 , further comprising a HEPA or ULPA air filter claim 1 , the air filter being located above the sample support.6. The x-ray inspection system according to claim 5 , wherein the air filter is positioned between the air mover and the sample support.7. The x-ray inspection system according to claim 5 , wherein the air filter is coupled to the air mover.8. The x-ray inspection system ...

X-RAY DETECTOR AND X-RAY CT APPARATUS

An X-ray detector according to a present embodiment includes: an optical sensor array configured to generate an electric signal by receiving X-rays; a substrate including at least an element that performs A/D conversion on the electric signal; a first support plate configured to hold a separator for removing scattered radiation; and a second support plate that is formed of a material being higher in thermal conductivity than the first support plate and is provided in contact with the substrate at least in part. 1. An X-ray detector comprising:an optical sensor array configured to generate an electric signal by receiving X-rays;a substrate including at least an element that performs A/D conversion on the electric signal;a first support plate configured to hold a separator for removing scattered radiation; anda second support plate that is formed of a material being higher in thermal conductivity than the first support plate and is provided in contact with the substrate at least in part.2. The X-ray detector according to claim 1 ,wherein the second support plate is disposed outside the first support plate in such a manner that a bottom surface of the second support plate is in contact with the substrate.3. The X-ray detector according to claim 1 ,wherein the second support plate is provided in contact with a holding container for accommodating the substrate and is configured to diffuse heat generated in the substrate to the holding container.4. The X-ray detector according to claim 2 ,wherein the second support plate is provided in contact with a holding container for accommodating the substrate and is configured to diffuse heat generated in the substrate to the holding container.5. The X-ray detector according to claim 3 ,wherein the holding container includes a heat sink that increases surface area in contact with outside air.6. The X-ray detector according to claim 4 ,wherein the holding container includes a heat sink that increases surface area in contact with ...

SPECIMEN RADIOGRAPHY SYSTEM COMPRISING CABINET AND A SPECIMEN DRAWER POSITIONABLE BY A CONTROLLER IN THE CABINET

A specimen radiography system may include a controller and a cabinet. The cabinet may include an x-ray source, an x-ray detector, and a specimen drawer disposed between the x-ray source and the x-ray detector. The specimen drawer may be automatically positionable along a vertical axis between the x-ray source and the x-ray detector. 117.-. (canceled)18. A specimen radiography system comprising: an x-ray source defining a focal point;', 'an x-ray detector defining an image plane, wherein the x-ray source and the x-ray detector are aligned relative to one another about a vertical axis;', 'a specimen drawer configured to support a tissue specimen; and', 'a door allowing access through an opening of the cabinet for the specimen drawer, wherein the specimen drawer is at least partially movable through the opening when the door is open, and wherein the specimen drawer is selectively positionable along the vertical axis within the cabinet and between the focal point and the image plane; and, 'a cabinet comprisinga controller operably coupled to the x-ray source and the x-ray detector and configured to image the tissue specimen, wherein the position of the specimen drawer along the vertical axis defines a magnification of the image of the tissue specimen.19. The specimen radiography system of claim 18 , wherein the x-ray source is positioned above the x-ray detector in the cabinet.20. The specimen radiography system of claim 18 , wherein the controller is operably coupled to the specimen drawer such that the position of the specimen drawer along the vertical axis is at least partially automatically controlled.21. The specimen radiography system of claim 18 , wherein a central vertical axis of the specimen drawer is aligned with the focal point of the x-ray source.22. The specimen radiography system of claim 18 , wherein the magnification positions of the specimen drawer are pre-defined.23. The specimen radiography system of claim 18 , wherein the cabinet is supported on ...

CHARACTERISATION OF AMPORPHOUS CONTENT OF COMPLEX FORMULATIONS BASED ON NON-NEGATIVE MATRIX FACTORISATION

Chemical components in a mixture are analysed using scattering data representing the results of a diffraction experiment performed on the mixture. Using non-negative matrix factorisation or another optimisation technique, the scattering data is deconvolved into non-negative basis components that represent contributions to the scattering data from each chemical component and fitting coefficients are derived in respect of the basis components that represent the proportions of chemical components in the mixture. 1. A method of analysing chemical components in at least one mixture thereof from scattering data representing the results of a diffraction experiment performed on the at least one mixture , the method comprising deconvolving the scattering data into non-negative basis components that represent contributions to the scattering data from each chemical component and deriving fitting coefficients in respect of the basis components that represent the proportions of chemical components in the mixture.2. A method according to claim 1 , wherein the step of deconvolving the scattering data into non-negative basis components and deriving fitting coefficients in respect of the basis components is performed using an optimisation technique that optimises the fit of the basis components and the fitting coefficients to the scattering data.3. A method according to claim 2 , wherein the optimisation technique comprises non-negative matrix factorisation.4. A method according to claim 3 , wherein the non-negative matrix factorisation is performed using a Metropolis Monte Carlo technique to avoid local minima.5. A method according to claim 2 , wherein the step of deconvolving the scattering data into non-negative basis components and deriving fitting coefficients in respect of the basis components is performed applying a constraint on any of the basis components claim 2 , the fitting coefficients claim 2 , or a relationship therebetween.6. A method according to claim 2 , wherein ...

UNIVERSAL COMPUTERIZED TOMOGRAPHY FIXTURE SYSTEM WITH A MULTI-SCAN ROBOTIC POSITIONING APPARATUS

A fixture and a method for using a fixture in a computerized tomography (“CT”) scan system of an electronic device are disclosed. The fixture is designed to reduce attenuation of radiation passing through the fixture to improve the CT imaging, particularly the imaging of one or more components in the electronic device. For example, the fixture may include a support column having a first support wall and a second support wall that define a space in the support column. Also, the support column may be offset with respect to a base portion of the fixture such that a component scanned in the CT scan system is positioned along a center of rotation of the fixture. Alternatively, or in combination, the fixture may be secured to a motorized device that actuates the fixture in two dimensions to align the component along the center of rotation. 1. A fixture suitable for exposure to a radiation source to perform a computerized tomography scan to a component of a device , the fixture comprising:a base portion designed to secure with a rotary device to actuate the base portion about a center of rotation of the base portion;a support column extending from the base portion and actuated in accordance with the base portion, the support column comprising an internal support structure that minimizes an attenuation of radiation from the radiation source passing through support column; andwherein the support column is offset with respect to the base portion to allow the component to align with the center of rotation.2. The fixture of claim 1 , further comprising an adhesive feature to secure the device with the support column claim 1 , and wherein the adhesive feature is a reusable adhesive feature.3. The fixture of claim 2 , wherein the internal support structure comprises a first support wall and a second support wall intersecting the first support wall claim 2 , and wherein the first support wall and the second support wall are enclosed by the support column.4. The fixture of claim 3 ...

MEASUREMENT DEVICE FOR CORRECTING PARASITIC MOVEMENTS IN AN X-RAY TOMOGRAPH

The invention concerns a device for measuring parasitic movements in a sample () to be analysed in an X-ray tomography apparatus, the device comprising: a source () emitting an X-ray beam () to a detector (), the sample, carried by a support (), being traversed by the beam; and a sight () carrying at least three balls () that are opaque to X-rays, the sight being attached to said support such that, on the detector, images () of the balls are around an image () of the sample, the shape and the materials of the sight being chosen such that the positions of the balls relative to the support are insensitive to temperature variations. 1. A device for measuring the parasitic movements of a sample to be analyzed in an X-ray tomography apparatus , the device comprising:a source emitting an X-ray beam towards a detector, the sample, carried by a support, being crossed by the beam; anda sight supporting at least three balls opaque to X rays, the sight being attached to said support so that, on the detector, images of the balls are around an image of the sample, the shape and the materials of the sight being selected so that the positions of the balls relative to the support are insensitive to temperature variations.2. The device of claim 1 , wherein the sight comprises:a rectangular frame made of a first material;four rods made of the first material, each rod being rigidly attached to one of the corners of the frame and being directed towards the inside of the frame;an arm rigidly attached to the median portion of a post of the frame to attach the sight to said support; andfour balls, each of which is attached to the end of one of the rods via a ring made of a second material having a thermal expansion coefficient greater than that of the first material.3. The device of claim 2 , wherein the arm is a bar made of the first material.4. The device of claim 2 , wherein the arm comprises claim 2 , aligned along a same axis:an upper tube having an end attached to said median ...

IMAGING SYSTEM CALIBRATION

A system includes determination of a first sub-matrix of a projection matrix which describes a geometrical relationship between points of a three-dimensional coordinate system of the imaging system and points of a two-dimensional coordinate system of an image detector, determination of a second sub-matrix of the projection matrix, where the first and second sub-matrixes comprise a decomposition of the projection matrix, conversion of a first point of the two-dimensional coordinate system to a first point of the three-dimensional coordinate system based on the first and second sub-matrixes, determination of an updated first sub-matrix of an updated projection matrix, where the updated projection matrix describes a second geometrical relationship between points of the three-dimensional coordinate system and points of the two-dimensional coordinate system, and conversion of a second point of the two-dimensional coordinate system to a second point of the three-dimensional coordinate system based on the updated first and second sub-matrixes. 124.-. (canceled)25. An imaging system comprising:an imaging source configured to emit radiation; and a geometrical relationship between points of a three-dimensional (3D) coordinate system and points of a two-dimensional (2D) coordinate system of the imaging system is described by a projection matrix, and', 'the projection matrix includes a first sub-matrix and a second sub-matrix, and each calibration of the projection matrix includes calibrating at least one of the first sub-matrix and the second sub-matrix., 'an image detector configured to receive at least a portion of the radiation and generate imaging data based on the received radiation, wherein'}26. The imaging system of claim 25 , wherein the first sub-matrix is associated with the image detector and the second sub-matrix is associated with the imaging source.27. The imaging system of claim 25 , wherein the first sub-matrix is calibrated at a first frequency claim 25 , the ...

X-RAY SCANNING SYSTEM AND METHOD

Systems and methods are provided for scanning an item utilizing an X-ray scanner in order to facilitate a determination of whether the X-ray radiation penetrated through the entirety of the scanned item. Various embodiments comprise a conveying mechanism, an X-ray emitter, a detector, and an X-ray penetration grid (XPG). The XPG may comprise a radiopaque grid that may serve as a reference for determining whether radiation passes through the scanned item, the grid oriented such that the grid members are neither parallel nor perpendicular to the direction of travel. Such orientation may minimize or eliminate “ghosted” radiation signals included in a visual display of the radiation received by the detector. A scanned item may be oriented with the XPG such that radiation emitted by the X-ray emitter that passes through a portion of the scanned item must also pass through the XPG before being received by the detector. 1. An X-ray detector system for determining the contents of an item , the system comprising:an X-ray emitter configured for emitting X-ray radiation;a detector comprising a receiving surface, the detector configured to receive the X-ray radiation and to generate one or more intensity signals indicative of an intensity of the received X-ray radiation at each of a plurality of locations on the receiving surface; at least one side oriented in a first primary direction;', 'a first plurality of parallel grid members each having a first end and a second end; and', 'a second plurality of parallel grid members each having a first end and a second end;', the first end and the second end of each of the first plurality of parallel grid members intersect the at least one side at an angle such that the first plurality of parallel grid members are neither parallel nor perpendicular to the at least one side; and', 'the first end and the second end of each of the second plurality of parallel grid members intersect the at least one side at an angle such that the second ...

X-RAY SINGLE-PIXEL CAMERA BASED ON X-RAY COMPUTATIONAL CORRELATED IMAGING

An X-ray single-pixel camera based on X-ray computational correlated imaging, which belongs to the technical research fields of X-ray computational correlated imaging and X-ray single-pixel imaging. The X-ray single-pixel camera includes: an X-ray modulation system (), an X-ray modulation control system (), an X-ray single-pixel detector (), a main control system unit (), a time synchronization system () and a computational imaging system (). The main control system unit () controls each module through software; the time synchronization system () controls synchronization of each module for automatic collection; and the computational imaging system () is configured to perform a second-order correlated computation or a compressed sensing computation or a deep learning computation on the signals collected by the X-ray single-pixel detector () and a preset modulation matrix, so as to obtain an image of an object under test. The X-ray single-pixel camera based on X-ray computational correlated imaging, provided by the present invention, realizes single-pixel imaging, greatly reduces the sampling number while ensuring the imaging quality, and reduces the X-ray radiation dose in an imaging process. 1. An X-ray single-pixel camera based on X-ray computational correlated imaging , characterized by comprising: an X-ray modulation system , an X-ray modulation control system , an X-ray single-pixel detector , a main control system unit , a time synchronization system and a computational imaging system , whereinthe X-ray modulation system is configured to modulate X-rays; the X-ray modulation control system is configured to control the X-ray modulation system; the X-ray single-pixel detector is configured to collect signals; the main control system unit controls each module through software; the time synchronization system controls synchronization of each module for automatic collection; and the computational imaging system is configured to perform a second-order correlated ...

X-RAY INSPECTION APPARATUS

An x-ray inspection system including a cabinet containing an x-ray source, a sample support for supporting a sample to be inspected, and an x-ray detector; an air mover configured to force air into the cabinet through an air inlet above the sample support, where the air mover and cabinet are configured to force air through the cabinet from the air inlet past the sample support to an air outlet in the cabinet below the sample support, and an assembly for positioning the sample support relative to the x-ray source and x-ray detector. The sample support includes an upper surface extending in a horizontal plane and the sample positioning assembly includes a vertical positioning mechanism for moving the sample support in a vertical direction, orthogonal to the horizontal plane, and a first horizontal positioning mechanism for moving the sample support and vertical positioning mechanism in a first horizontal direction. 1. An x-ray inspection system , comprising:a cabinet, the cabinet containing an x-ray source, a sample support for supporting a sample to be inspected, and an x-ray detector;an air mover configured to force air into the cabinet through an air inlet in the cabinet above the sample support, wherein the air mover and cabinet are configured to force air through the cabinet from the air inlet past the sample support to an air outlet in the cabinet below the sample support; anda sample support positioning assembly for positioning the sample support relative to the x-ray source and x-ray detector, wherein the sample support comprises an upper surface extending in a horizontal plane and wherein the sample positioning assembly comprises a vertical positioning mechanism for moving the sample support in a vertical direction, orthogonal to the horizontal plane, and a first horizontal positioning mechanism for moving both the sample support and the vertical positioning mechanism in a first horizontal direction.2. The x-ray inspection system of claim 1 , wherein the ...

Quantum Mechanical/X-Ray Crystallography Diagnostic for Proteins

The invention is a diagnostic which overlays quantum mechanical analysis to x-ray crystallography data from one or more proteins to assess and identify the real world conformation, protonation and solvent effects of one or more moieties in said protein. This “overlay” occurs by scoring and identifying the protomer/tautomer states of the moieties using quantum mechanical analysis. The diagnostic results of the present invention accurately identify protein-ligand binding, rendered as an output to a user of a computer in which the x-ray crystallography data is analysed with semi-empirical Hamiltonian quantum mechanics and 1. A diagnostic method for identifying a tautomeric state of at least one protein by a) subjecting said protein to x-ray crystallography to generate x-ray data; b) downloading to a computer said x-ray data; c) analyzing said x-ray data with quantum mechanical refinement comprising a semi-empirical Hamiltonian; and d) rendering as an output to a user of said computer the diagnostic assessment of the tautomeric state of at least one moeity of said protein.2. A diagnostic method for identifying conformational , protonation , or solvent effect information from a protein of interest , comprising the steps of: a) selecting a protein sample; b) imaging said protein by x-ray crystallography and downloading data generated thereby to at least one computer; c) applying WashMoleculeMOE Scientific Vector Language (SVL) to said data to generate a set of all or reasonably all possible protomer/tautomer state elements of said protein by executing WashMoleculeMOE SVL a plurality of times; d) subjecting each of said elements to quantum mechanical analysis , using a semi-empirical Hamiltonian , to generate an empirical score for each element; e) algorithmically selecting the element which represents the true protomer/tautomer state of at least one moiety in said protein by calculating a real-space difference density Z to give a final ZDD metric and choosing the highest ...

SUBSTANCE IDENTIFICATION DEVICE AND METHOD FOR EXTRACTING STATISTICAL FEATURE BASED ON CLUSTER ANALYSIS

The present disclosure provides a substance identification device and a substance identification method. The substance identification device comprises: a classifier establishing unit configured to establish a classifier based on scattering density values reconstructed for a plurality of known sample materials, wherein the classifier comprises a plurality of feature regions corresponding to a plurality of characteristic parameters for the plurality of known sample materials, respectively; and an identification unit for a material to be tested, configured to match the characteristic parameter of the material to be tested with the classifier, and to identify a type of the material to be tested by obtaining a feature region corresponding to the characteristic parameter of the material to be tested. 1. A substance identification device , comprising:a classifier establishing unit configured to establish a classifier based on scattering density values reconstructed for a plurality of known sample materials, wherein the classifier comprises a plurality of feature regions corresponding to a plurality of characteristic parameters for the plurality of known sample materials, respectively; andan identification unit for a material to be tested, configured to match the characteristic parameter of the material to be tested with the plurality of feature regions by using the classifier, to determine a feature region corresponding to the characteristic parameter of the material to be tested from the plurality of feature regions, and to identify a type of the material to be tested based on the feature region corresponding to the characteristic parameter of the material to be tested.2. The substance identification device of claim 1 , wherein the classifier establishing unit comprises:a noise reduction processing module configured to perform a noise reduction process on the scattering density values reconstructed for each of the plurality of known sample materials.3. The substance ...

X-ray inspection device

An X-ray inspection apparatus includes an X-ray source that radiates X-rays to a product, an X-ray detection unit that detects X-rays penetrating the product, and an uninterruptible power supply that supplies electric power during an electric power failure. The uninterruptible power supply is not electrically connected to the X-ray source.

Sorting materials using pattern recognition, such as upgrading nickel laterite ores through electromagnetic sensor-based methods

A system and method of sorting mineral streams, for example laterite mineral ores, into appropriately classified valuable and waste streams for maximum recovery of value from the mineral stream, e.g., a stream of minerals includes receiving response data indicating reflected, absorbed or backscattered energy from a mineral sample exposed to a sensor, where the mineral sample is irradiated with electromagnetic energy. The system determines spectral characteristics of the mineral sample by performing spectral analysis on the response data of the mineral sample and identifies a composition of the mineral sample by comparing the spectral characteristics of the mineral sample to previously developed spectral characteristics of samples of known composition. The system then generates a sort decision for the mineral sample based on the comparison, where the sort decision is used in diverting the mineral sample to a desired destination e.g. pyrometallurgical treatment stages, or to a waste stream.

X-RAY FLUORESCENCE ANALYZER

A system and method for processing X-ray fluorescence data in a hand-held X-ray Fluorescence (XRF) analyzer are provided. The X-ray fluorescence (XRF) analyzer includes a radiation source assembly including a first centerline axis and configured to direct an X-ray beam to impinge on a sample to be tested. The XRF analyzer also includes a radiation detector assembly including a second centerline axis configured to sense X-ray fluorescence (XRF) emitted from the sample in response to the X-ray beam. The XRF analyzer further includes a processor configured to determine a property of the sample to be tested from the emitted XRF, and a proximity sensor configured to continuously measure a distance between the XRF analyzer and the sample to be tested, the distance being at least one of displayed to a user and used by the processor to determine the property. 1. An X-ray fluorescence (XRF) analyzer comprising:a radiation source assembly comprising a first centerline axis and configured to direct an X-ray beam to impinge on a sample to be tested;a radiation detector assembly comprising a second centerline axis configured to sense X-ray fluorescence (XRF) emitted from the sample in response to the X-ray beam;a processor configured to determine a property of the sample to be tested from the emitted XRF; anda proximity sensor configured to continuously measure a distance between said XRF analyzer and said sample to be tested, the distance being at least one of displayed to a user and used by the processor to determine the property.2. The XRF analyzer of claim 1 , further comprising a plurality of proximity sensors claim 1 , said processor configured to determine a positional orientation of the XRF analyzer with respect to the sample to be tested using the plurality of proximity sensors.3. The XRF analyzer of claim 1 , wherein the first centerline axis and the second centerline axis are offset laterally by a first angle.4. The XRF analyzer of claim 3 , wherein the first angle is ...

X-RAY COMPUTED TOMOGRAPHY APPARATUS WITH SCANNER FUNCTION

An X-ray computed tomography apparatus with a scanner function includes a vertical frame, a patient support arm provided below the vertical frame, a horizontal support arm extending horizontally from a top portion of the vertical frame, a rotary arm drive unit provided at an end of the horizontal support arm, a horizontal rotation arm provided horizontally below the rotary arm drive unit to rotate 360 degrees, a general CT imaging X-ray source provided at one end of the horizontal rotation arm, and an X-ray detector provided at the other end of the horizontal rotation arm to face the general CT imaging X-ray source. A micro CT imaging X-ray source is provided on the vertical frame, a rotary table for seating and rotating an object to be imaged is provided above the patient support arm, and the X-ray detector is composed of a common X-ray detector. 1. An X-ray computed tomography apparatus with a scanner function , comprising:a vertical frame;a patient support arm provided below the vertical frame;a horizontal support arm extending horizontally from a top portion of the vertical frame;a rotary arm drive unit provided at an end of the horizontal support arm;a horizontal rotation arm provided horizontally below the rotary arm drive unit to rotate 360 degrees;a general CT imaging X-ray source provided at one end of the horizontal rotation arm; andan X-ray detector provided at the other end of the horizontal rotation arm to face the general CT imaging X-ray source,wherein a micro CT imaging X-ray source is further provided on the vertical frame, a rotary table for seating and rotating an object to be imaged is further provided above the patient support arm, and the X-ray detector is composed of a common X-ray detector capable of being rotated by an X-ray detector drive unit, so that the apparatus can perform both a micro CT imaging operation and a general CT imaging operation.2. The apparatus according to claim 1 , wherein a rotary table drive unit for rotating the ...

INDUSTRIAL X-RAY WORKPIECE MEASURING SYSTEM AND METHOD FOR OPERATING SAME

The invention relates to an industrial X-ray workpiece measuring system comprising an X-ray source (), which is arranged in an X-ray protective housing () and has an X-ray focal spot (), workpiece carrier means, which are arranged in the X-ray protective housing, for accommodating a non-medical workpiece () to be examined, and X-ray detector means () which are provided on and/or in the X-ray protective housing, are designed to detect an X-ray beam from the X-ray source, which X-ray beam penetrates the workpiece held on the workpiece carrier means, and downstream of which X-ray detector means electronic evaluating means can be connected. 1. An industrial X-ray workpiece measuring system , comprising{'b': ['4', '2', '3', '5'], '#text': 'an X-ray source () disposed in an X-ray protection housing () and having an X-ray focal spot (), workpiece support means for holding a non-medical workpiece () to be examined, the workpiece support means being disposed in the X-ray protection housing, and'}{'b': ['10', '10', '10'], 'i': ['a,', 'b,', 'c'], '#text': 'X-ray detector means () provided on and/or in the X-ray protection housing and configured to detect an X-ray of the X-ray source radiographing a workpiece held on the workpiece support means,'}downstream of which electronic evaluation means can be disposed,{'b': ['20', '18'], '#text': 'the X-ray detector means comprising scintillator means () for converting incident X-rays into visible light on a light exit surface ()'}{'b': '28', '#text': 'and optical detector means () disposed optically downstream thereof and comprising a plurality of image pixels in a physical pixel density disposed adjacent to each other at regular intervals and forming a common sensor incidence surface,'}the image pixels detecting the visible light produced by the scintillator means for electronic evaluation at an effective pixel density,whereina first scintillator module realizing the scintillator means is configured to be interchangeable with a second ...

FULL-VIEW-FIELD QUANTITATIVE STATISTICAL DISTRIBUTION REPRESENTATION METHOD FOR MICROSTRUCTURES of y' PHASES IN METAL MATERIAL

The present invention discloses, a full-view-field quantitative statistical distribution representation method for microstructures of γ′ phases in a metal material, comprising the following steps: step a: labeling γ′ phases, cloud clutters and γ matrixes by Labelme, and then making standard feature training samples; step b: building a deep learning-based feature recognition and extraction model by means of BDU-Net; step e: collecting γ′ feature maps in the metal material to be detected; step d: automatically recognizing and extracting the γ′ phases; and step e: performing in-situ quantitative statistical distribution representation on the γ phases in the full view field within a large range. The full-view-field quantitative statistical distribution representation method for microstructures of γ′ phases in a metal material provided by the present invention realizes automatic, high-speed and high-quality recognition and extraction of features of γ phases in the metal material 1. A full-view-field quantitative statistical distribution representation method for microstructures of γ′ phases in a metal material , comprising the following steps:a) performing metallographic sample preparation, polishing and chemical etching on standard metal material samples with the same material as a metal material to be detected, randomly sampling and shooting the processed standard metal material samples by a scanning electron microscope at high magnification, and building a γ′-phase feature map data set; labeling γ′ phases, cloud clutters and γ matrixes by Labelme, and then making standard feature training samples;b) optimizing a deep learning-based image segmentation network U-Net, building a feature recognition and extraction network BDU-Net, performing data augmentation on the standard feature training samples, dividing the augmented data into a training set and a validation set, training with the training set, taking the MPA of the validation set as a judgment condition of training ...

OPERATION GUIDE SYSTEM FOR X-RAY ANALYSIS, OPERATION GUIDE METHOD THEREFOR, AND OPERATION GUIDE PROGRAM THEREFOR

Provided is an operation guide system for an X-ray analysis, including: a sample information acquisition portion for acquiring sample information on a sample to be measured for a predetermined analysis purpose with an X-ray measuring unit; a measurement condition acquisition portion for acquiring a plurality of measurement conditions different from one another; a virtual result acquisition portion for subjecting the sample information to simulations respectively based on the plurality of measurement conditions, to thereby acquire a plurality of virtual measurement results of measurements for the predetermined analysis purpose; and a comparison result output portion for outputting, as comparison results, at least two virtual measurement results among the plurality of virtual measurement results and at least two of the plurality of measurement conditions respectively corresponding to the at least two virtual measurement results. 1. An operation guide system for an X-ray analysis , comprising acquire sample information on a sample to be measured for a predetermined analysis purpose with an X-ray measuring unit;', 'acquire a plurality of measurement conditions different from one another;', 'subject the sample information to simulations respectively based on the plurality of measurement conditions, to thereby acquire a plurality of virtual measurement results of measurements for the predetermined analysis purpose; and', 'output, as comparison results, at least two virtual measurement results among the plurality of virtual measurement results and at least two of the plurality of measurement conditions respectively corresponding to the at least two virtual measurement results., 'at least one microprocessor configured to2. The operation guide system for an X-ray analysis according to claim 1 , the at least one microprocessor further configured to:conduct evaluations of the plurality of virtual measurement results; andselect the at least two virtual measurement results based ...

METHOD AND SYSTEM FOR RECONSTRUCTING 3-DIMENSIONAL IMAGES FROM SPATIALLY AND TEMPORALLY OVERLAPPING X-RAYS

An x-ray imaging system and method for reconstructing three-dimensional images of a region of interest from spatially and temporally overlapping x-rays using novel reconstruction techniques. 1. An x-ray imaging system , comprising:a detector capable of generating a signal in response to x-rays incident upon the detector, wherein the signal indicates the intensity of the x-rays incident upon a pixel of the detector,a plurality of x-ray sources, wherein at least two of the plurality of x-ray sources are capable of emitting x-rays such that said x-rays pass through a region of interest (ROI) and spatially and temporally overlap at the pixel of the detector; anda processing unit capable of receiving the signal indicating the intensity of x-rays incident upon the pixel of the detector and generating an estimate of the intensity attributable to each of the two or more x-rays overlapping at the pixel of the detector.2. The system of claim 1 , wherein the processing unit is further capable of generating a three-dimensional representation of the ROI using one or more estimates of the intensity attributable to each of the two or more x-rays overlapping at the pixel of the detector.3. The system of claim 3 , further comprising a display operably coupled to the processing unit claim 3 , wherein the display is capable of displaying one or more two-dimensional views of the three-dimensional representation of the ROI.4. The system of claim 1 , wherein the plurality of x-ray sources comprises two or more emitter elements of a distributed source array.5. The system of claim 1 , wherein the processing unit is further capable of voxelizing the ROI into a plurality of three-dimensional claim 1 , non-overlapping voxels; estimating an attenuation coefficient attributable to each said voxel claim 1 , and re-voxelizing the ROI into a plurality of three-dimensional claim 1 , non-overlapping voxels based on the estimated attenuation coefficients attributable to each said voxel.6. The system ...

METHODS AND APPARATUSES FOR RECONSTRUCTING INCIDENT ENERGY SPECTRUM FOR A DETECTOR

A method and apparatus for reconstructing an incident energy spectrum for a detector are disclosed. In this method, an object to be inspected is illuminated with rays, and then rays transmitted through the object to be inspected are received by the detector to convert the received rays into data of a detected energy spectrum. The incident energy spectrum for the detector is reconstructed based on the data of the energy spectrum using a statistical iterative algorithm with a pre-established detector response function. With the above solution of the embodiments, the incident energy spectrum for the detector can be more accurately acquired, thereby reducing a distortion of the incident energy spectrum caused by the detector. 1. A method for reconstructing an incident energy spectrum for a detector , comprising steps of:illuminating an object to be inspected with rays;receiving, by the detector, rays transmitted through the object to be inspected to acquire data of a detected energy spectrum; andreconstructing the incident energy spectrum for the detector based on the data of the energy spectrum using a statistical iterative algorithm with a detector response function.2. The method according to claim 1 , wherein before the reconstructing step claim 1 , the method further comprises:calibrating parameters of the detector response function by collecting energy spectrums of X-ray fluorescence generated by different target materials in a plurality of energy segments.3. The method according to claim 2 , wherein the detector response function comprises a Gaussian peak portion and a baseline portion which is a function of the Gaussian peak portion.4. The method according to claim 3 , wherein the detector response function is weighted using a weighting parameter which is fitted using a quadratic function and depends on energy of the detected energy spectrum.5. The method according to claim 2 , wherein the detector response function further comprises a characteristic peak portion ...

X-RAY INSPECTION DEVICE

An X-ray inspection apparatus with is configured to suppress the incidence of anomalies in inspection results caused by the X-ray inspection apparatus being used while an unsuitable setting is in effect. The X-ray inspection apparatus is provided with an inspection unit, a setting unit a storage unit, an assessment unit, and a notification unit. The inspection unit inspects an article using detection data obtained by detecting X-rays with which the article has been irradiated. The setting unit sets a setting value used in inspection of the article by the inspection unit. The storage unit stores a detection value based on the detection data. The assessment unit assesses on the basis of the detection value stored in the storage unit, whether or not the setting value set by the setting unit is suitable. When the assessment unit has assessed that the setting value is not suitable, the notification unit issues a notification to indicate that the setting value is not suitable. 1. An X-ray inspection apparatus comprising:an inspection unit configured to inspect an article using detection data obtained by detecting X-rays with which the article has been irradiated;a setting unit for setting a setting value used in inspection of the article by the inspection unit;a storage unit to store a detection value based on the detection data;an assessment unit to determine, on the basis of the detection value stored in the storage unit, whether or not the setting value set by the setting unit is suitable; anda notification unit to issue a notification to indicate that the setting value is not suitable when the assessment unit has determined that the setting value is not suitable.2. The X-ray inspection apparatus according to claim 1 , whereinthe assessment unit acquires a permissible range of the setting value on the basis of the detection value stored in the storage unit and determines whether or not the setting value set by the setting unit is not suitable when the setting value is ...

X-RAY IMAGING APPARATUS

An X-ray imaging apparatus capable of covering outer peripheral portions of a fixed supporting column and a moving supporting column by a cover even when an SID is set to be large in a configuration in which an imaging system is rotated about an axis extending in a horizontal direction. The supporting column mechanism is provided with a fixed supporting column , a moving supporting column movable relative to the fixed supporting column , and a moving mechanism for moving the moving supporting column . A fixed cover is arranged at the outer peripheral portion of the fixed supporting column . Further, at the outer peripheral portion of the moving supporting column , a moving cover which moves together with the moving supporting column is arranged. An intermediate cover movable in the same direction as the moving cover is arranged between the fixed cover and the moving cover . Between the fixed supporting column and the moving cover , a constant force spring as an energizing member for energizing the intermediate cover to the side of the fixed cover is arranged. 1. An X-ray imaging apparatus comprising:an imaging system including an X-ray tube supported by a support mechanism and an X-ray detector for detecting X-rays emitted from the X-ray tube and passed through a subject;a top board arranged between the X-ray tube and the X-ray detector and capable of placing the subject on a surface;an X-ray tube moving mechanism configured to change a distance between the X-ray tube and the top board by moving the X-ray tube supported by the support mechanism; anda rotation mechanism configured to rotate the imaging system and the top board in synchronization with each other about an axis extending in a horizontal direction,wherein the support mechanism includes:a fixed supporting column;a moving supporting column movable with respect to the fixed supporting column;a fixed cover that covers the fixed supporting column;a moving cover that covers the moving supporting column and ...

SAMPLE HOLDING DEVICE FOR X-RAY ANALYSIS

A sample holder () filled with a sample is held in a base member (), and an airtight member () is mounted on the base member () so as to cover the surroundings of the sample holder (), thereby forming a sample holding structure in a closed space. The airtight member () includes a fitting portion () which is configured to be fitted and mounted in a mounting portion (). 1. A sample holding device for X-ray analysis comprising:a sample holder having a sample filling portion for filling a sample;a base member for holding the sample holder; andan airtight member configured to be freely detachably mounted on the base member so as to cover surroundings of the sample holder held by the base member, wherein the base member has a mounting portion for mounting the airtight member thereon, the airtight member has a fitting portion configured to be fitted and mounted in the mounting portion, and a locking mechanism is provided to the mounting portion and the fitting portion so as to prevent the airtight member from coming off the base member through engagement in a step of fitting the fitting portion into the mounting portion.2. The sample holding device for X-ray analysis according to claim 1 , wherein the airtight member includes a block-shaped main body portion having a hollow portion therein claim 1 , and the fitting portion formed so as to protrude from a lower surface of the main body portion claim 1 ,wherein a lower end surface of the fitting portion is opened and communicates with the hollow portion in the main body portion,wherein an X-ray transmission window is formed by cutting out the main body portion, and an X-ray window material is formed around the X-ray transmission window so as to cover the X-ray transmission window, andwherein an operating portion for enabling an operator to perform a fitting operation while gripping the operating portion is formed in a surface region of the main body portion where the X-ray transmission window is not formed.3. The sample ...

Assessment of focal spot characteristics

Use of a reference detector to characterize an X-ray emission focal spot is disclosed. In certain embodiments, the reference detector may contain one or more openings or apertures that may be used to acquire localized X-ray intensity information used to derive the focal spot characteristics. In certain embodiments, the reference detector is on the source-side of the imaged volume.

Medical X-Ray Imaging Systems And Methods

A detector system for an x-ray imaging device includes a detector chassis, a plurality of sub-assemblies mounted to the detector chassis and within an interior housing of the chassis, the sub-assemblies defining a detector surface, where each sub-assembly includes a thermally-conductive support mounted to the detector chassis, a detector module having an array of x-ray sensitive detector elements mounted to a first surface of the support, an electronics board mounted to a second surface of the support opposite the first surface, at least one electrical connector that connects the detector module to the electronics board, where the electronics board provides power to the detector module and receives digital x-ray image data from the detector module via the at least one electrical connector. Further embodiments include x-ray imaging systems, external beam radiation treatment systems having an integrated x-ray imaging system, and methods therefor.

CIRCULAR X-RAY TUBE AND AN X-RAY INSTRUMENT COMPRISING THE CIRCULAR X-RAY TUBE

The circular X-ray tube for the irradiation of the object () by X-radiation comprising the circular body () and at least two friction elements that rub together whereby forming a triboluminescent source of X-radiation. The one friction element comprises at least one circumferential element () arranged on the external circumferential side of the circular body () of the X-ray tube and the other friction element comprises at least one pressure element () that is pressed against the circumferential element (), where the pressure element () is adapted for dragging upon the circumferential element (), and/or at least one circumferential element () is adapted for pulling through under the pressure element (). The X-ray instrument utilizes the circular X-ray tube and the imaging detectors () of ionizing radiation. 11232434334. The circular X-ray tube for the irradiation of the object () by X-radiation generated during the triboluminescence effect comprising the circular body () and at least two friction elements rubbing against one another that form the triboluminescent source of X-radiation characterized in that one of the friction elements comprises at least one circumferential element () arranged at the external circumferential side of the circular body () of the X-ray tube , and the other friction element comprises at least one pressure element () that is pressed against the circumferential element () , where the pressure element () is adapted for dragging upon the circumferential element () , and/or at least one circumferential element () is adapted for pulling through under the pressure element ().2255. The circular X-ray tube according to characterized in that the circular body () is fitted with at least one shield () of ionizing radiation claim 1 , where the shield () is equipped with at least one opening for the unshielded passage of X-radiation.3525. The circular X-ray tube according to characterized in that the position of the opening in the shield () with regard ...

EX-CORE NUCLEAR INSTRUMENTATION DEVICE

A detector signal processing circuit is composed of a current/voltage converting unit which converts the current value, which is converted by a neutron detector, to a voltage value which corresponds to the current value; a variable gain amplifying unit which includes an operating amplifier, in which a D/A converter is added, and amplifies the voltage value which is converted by the current/voltage converting unit; a regulation control means which regulates a gain of the D/A converter; and a comparator which automatically compares an output voltage, which is amplified by the variable gain amplifying unit, in accordance with a reference value which is previously set, so as to output the output voltage to the regulation control means. 16-. (canceled)7. An ex-core nuclear instrumentation device comprising:a neutron detector for measuring a neutron beam at the outside of a nuclear reactor vessel and converting the neutron beam to a current value; and a current/voltage converting unit which converts the current value converted by the neutron detector to a voltage value corresponding to the current value;', 'a variable gain amplifying unit having an operating amplifier, in which a D/A converter is included, and amplifying the voltage value converted by the current/voltage converting unit;', 'a regulation controller which regulates a gain of the D/A converter; and', 'a comparator for comparing an output voltage amplified by the variable gain amplifying unit with a reference value previously set, and outputting its output voltage to the regulation controller., 'an ex-core nuclear instrumentation board for computing and processing the current value from the neutron detector by using a detector signal processing circuit so as to output a state of the neutron beam when a nuclear reactor is operated; wherein the detector signal processing circuit includes8. An ex-core nuclear instrumentation device according to claim 7 , the detector signal processing circuit including:the ...

SYSTEMS AND METHODS FOR MULTIVARIATE ANALYISIS USING MULTI-SUBSYSTEM DATA

Systems and methods for analyzing an unknown sample are disclosed. The system includes at least one subsystem to obtain molecular information about the sample and at least one other subsystem to obtain elemental information about the sample. The system also includes a data collection component to collect and combine the information from the subsystems to create combined analytical information and a multivariate model that relates known attributes to information previously generated with at least two analytical systems that are the same types of systems as the at least two analytical subsystems. A prediction engine applies the multivariate model to the combined analytical information to produce predictions of attributes in the unknown sample. 1. A system for analyzing an unknown sample , the system comprising:at least two subsystems including at least one subsystem to obtain molecular information about the sample and at least one other subsystem to obtain elemental information about the sample, so each of the at least two subsystems provides at least some different information about the sample than the other;a data collection component to collect and combine the information from the subsystems to create combined analytical information;a multivariate model that relates known attributes to information previously generated with at least two analytical systems that are the same types of systems as the at least two subsystems; anda prediction engine that applies the multivariate model to the combined analytical information to produce predictions of attributes in the unknown sample.2. The system of claim 1 , wherein the at least two subsystems are integrated within a single housing.3. The system of claim 1 , wherein the at least two subsystems are discrete and separately operable units.4. The system of claim 1 , including a network connectivity component to couple the multivariate model with a remote multivariate database.5. The system of claim 1 , wherein the attributes ...

Portable Apparatus for Liquid Chemical Characterization

An apparatus or method determines a salinity or metal content a liquid sample by scanning the liquid sample using a PXRF spectrometer, receiving a PXRF spectra from the PXRF spectrometer, baseline correcting and smoothing the received PXRF spectra, extracting a Kα emission line of one or more elements from the baseline corrected and smoothed PXRF spectra using only one beam from the PXRF spectrometer, determining the salinity or the metal content of the liquid sample using the one or more processors and a predictive model that relates the Kα emission line of the one or more elements to the salinity or the metal content of the liquid sample, and providing the salinity or the metal content of the liquid sample to the one or more input/output interfaces. 1. A computerized method for determining a salinity of a liquid sample comprising:providing a x-ray fluorescence (PXRF) spectrometer, a probe connected to the PXRF spectrometer, one or more processors communicably coupled to the PXRF spectrometer, and one or more input/output interfaces communicably coupled to the one or more processors;scanning the liquid sample using the PXRF spectrometer;receiving a PXRF spectra from the PXRF spectrometer;baseline correcting and smoothing the received PXRF spectra;extracting a Kα emission line of one or more elements from the baseline corrected and smoothed PXRF spectra using only one beam from the PXRF spectrometer;determining the salinity of the liquid sample using the one or more processors and a predictive model that relates the Kα emission line of the one or more elements to the salinity of the liquid sample; andproviding the salinity of the liquid sample to the one or more input/output interfaces.2. The method as recited in claim 1 , further comprising selecting the one or more element from a list of elements detectable by the PXRF spectrometer.3. The method as recited in claim 2 , wherein the selected elements are one or more of Cl claim 2 , K and Ca.4. The method as recited ...

XRF Analyzer Activation Switch

The invention includes various electronic devices for avoiding or minimizing XRF analyzer user fatigue. In one embodiment, the XRF analyzer can include a finger sensor for activating an XRF analysis. In another embodiment, the XRF analyzer can include a finger tap switch for activating the XRF analysis. In another embodiment, the XRF analyzer can include a microphone for activating the XRF analysis by receipt of a verbal command. Additional benefits of some embodiments include improving XRF analysis safety and avoiding XRF analyzer theft.

Specimen Conditioning and Imaging System

A conditioning system includes a sample chamber capable of receiving a specimen as well as first and second specimen-holding fixtures positioned within the sample chamber and configured to apply mechanical stimulation to a specimen held by the fixtures. The system has at least one port capable of providing a fluid to the sample chamber. The chamber is sized and shaped so that it can be inserted into an imaging device which can record images of a specimen held by the fixtures.

SYSTEMS AND METHODS FOR PERFORMING BACKSCATTER THREE DIMENSIONAL IMAGING FROM ONE SIDE OF A STRUCTURE

An imaging system for generating three dimensional image data using X-ray backscattering from one side of a structure is provided. The imaging system includes at least one X-ray source, at least one rotating collimator coupled to the at least one X-ray source, an X-ray detector, and a controller coupled to the at least one X-ray source, the at least one rotating collimator and the X-ray detector. The controller is configured to emit X-rays from the at least one X-ray source through the at least one rotating collimator towards the one side of the structure. Additionally, the controller is configured to detect backscattered X-rays from the one side of the structure, using the X-ray detector, at a plurality of depths within the structure. Additionally, the controller is configured to generate three dimensional image data of the structure based on the detected backscattered X-rays. 1. An imaging system for generating three dimensional image data using X-ray backscattering from one side of a structure , said imaging system comprising:at least one X-ray source;at least one rotating collimator coupled to the at least one X-ray source;an X-ray detector; anda controller coupled to said at least one X-ray source, said rotating collimator, and said X-ray detector, said controller is configured to:emit X-rays from said at least one X-ray source through said at least one rotating collimator towards the one side of the structure;detect backscattered X-rays from the one side of the structure, using said X-ray detector, at a plurality of depths within the structure; andgenerate three dimensional image data of the structure based on the detected backscattered X-rays.2. The imaging system of claim 1 , wherein said at least one X-ray source includes a first X-ray source and a second X-ray source claim 1 , said at least one rotating collimator includes a first rotating collimator coupled to said first X-ray source and a second rotating collimator coupled to said second X-ray source ...

DIFFRACTION DEVICE AND METHOD FOR NON-DESTRUCTIVE TESTING OF INTERNAL CRYSTAL ORIENTATION UNIFORMITY OF WORKPIECE

A diffraction device and a method for non-destructive testing of internal crystal orientation uniformity of a workpiece. The diffraction device comprises: an X-ray irradiation system used for irradiating X-ray to a measuring part of a measured sample (); an X-ray detection system used for detecting a plurality of diffraction X-rays formed by diffracting the X-ray with a plurality of parts of the measured sample (), to measure X-ray diffraction intensity distribution of the measured sample (). The detected X-ray is short-wavelength feature X-ray, and the X-ray detection system is an array detection system (). The method comprises steps of selecting the short-wavelength feature X-ray, performing texture analysis on the measured sample (), and determining a diffraction vector Q to be measured; and obtaining the X-ray diffraction intensity of the corresponding part of the measured sample (). The method can rapidly and non-destructively test the internal crystal orientation uniformity of a centimeter-thick workpiece in its entire thickness direction, and implement online testing and characterization of the internal crystal orientation uniformity of the centimeter-thick workpiece in the entire thickness direction of its movement trajectory. 1. A diffraction apparatus , comprising:an X-ray irradiation system for irradiating an X-ray to a measured part of a sample under testing, andan X-ray detection system for simultaneously detecting a plurality of diffracted X-rays formed by diffraction of a plurality of parts of the sample under testing, to measure an X-ray diffraction intensity distribution of the sample under testing,wherein the detected diffracted X-rays are short-wavelength characteristic X-rays, and the X-ray detection system is an array detection system.2656. The diffraction apparatus according to claim 1 , wherein the array detection system comprises a receiving array collimator () claim 1 , and an array detector () that matches the receiving array collimator () ...

METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS

A monitoring system and method are provided for determining at least one property of an integrated circuit (IC) comprising a multi-layer structure formed by at least a layer on top of an underlayer. The monitoring system receives measured data comprising data indicative of optical measurements performed on the IC, data indicative of x-ray photoelectron spectroscopy (XPS) measurements performed on the IC and data indicative of x-ray fluorescence spectroscopy (XRF) measurements performed on the IC. An optical data analyzer module analyzes the data indicative of the optical measurements and generates geometrical data indicative of one or more geometrical parameters of the multi-layer structure formed by at least the layer on top of the underlayer. An XPS data analyzer module analyzes the data indicative of the XPS measurements and generates geometrical and material related data indicative of geometrical and material composition parameters for said layer and data indicative of material composition of the underlayer. An XRF data analyzer module analyzes the data indicative of the XRF measurements and generates data indicative of amount of a predetermined material composition in the multi-layer structure. A data interpretation module generates combined data received from analyzer modules and processes the combined data and determines the at least one property of at least one layer of the multi-layer structure. 1. A monitoring system for determining at least one property of an integrated circuit (IC), the system comprising a computer system comprising data input and output utilities, a memory utility, and a data processor and analyzer utility. This application is a continuation-in-part of PCT Application No. PCT/US2016/060147, filed Nov. 2, 2016, which claims priority benefit from U.S. Provisional Application No. 62/249,845, filed on Nov. 2, 2015, the disclosures of each of which being hereby incorporated herein by reference in their entirety.The invention generally ...

Method and Installation for Determining an Improved Mineralogical Composition of a Rock Sample

The disclosure relates to determining a mineralogical composition of a geological sample, comprising estimating mineralogical and elemental compositions of the sample using measurements. The method also predicts an elemental composition from the mineralogical composition, and corrects the measured mineralogical composition, by: 1. Method for determining a mineralogical composition of a sample of a geological formation , comprising:Collecting at least a rock sample originated from the formation,estimating a measured mineralogical composition of the sample based on a first measurement, wherein the mineralogical composition is indicative of relative amounts of a set of predetermined minerals in the sample,Estimating a measured elemental composition of the sample based on a second measurement, wherein the elemental composition is indicative of relative amounts of predetermined chemical elements in the sample,Based on a mineralogy break-down model, estimating an initial predicted elemental composition of the sample from the mineralogical composition, adjusting an amount of at least a mineral within a family of minerals while the total amount of the minerals of the family is kept constant,', 'correcting a total amount of at least a family of minerals within a system comprising at least two families of minerals while the relative amounts of each of the mineral within the family is kept constant', 'adding an amount of at least an additional mineral distinct from the predetermined minerals while the relative amount of each of the predetermined minerals within the set of predetermined minerals, is kept constant,, 'Correcting the measured mineralogical composition of the sample to obtain a corrected mineralogical composition and a corresponding corrected predicted elemental composition based on the model, wherein the correction comprises at least one of the followingdetermining an indicator relative to the match of the predicted elemental composition and the measured elemental ...

Analyzer Communication

An analysis system can include an analysis tool , such as an XRF analyzer, a LIBS spectrometer, an XRD analyzer, or Raman spectroscopy equipment which can communicate wirelessly with other devices. The system can also include remote-processor software configured to be loaded onto a handheld electronic device and/or remote-computer software configured to be loaded onto a remote-computer . The analysis tool can include a microphone and/or an output device to allow a user to communicate conveniently with the analysis tool 1. A tool , the tool being a LIBS spectrometer , an XRD analyzer , or Raman spectroscopy equipment , the tool comprising:a housing;an x-ray source and an x-ray detector attached to the housing, the x-ray source being located and oriented to emit x-rays towards a sample and the x-ray detector being located and oriented to receive fluoresced x-rays emitted from the sample; andan electronic-processor, attached to the housing, and configured to: obtain an initial signal from a user; wirelessly-transmit the initial signal to a remote-processor; receive a wirelessly-transmitted return signal from the remote-processor, the return signal based on the initial signal; and operate the tool based on the return signal.2. An analysis system comprising the tool of claim 1 , the analysis system further comprising the remote-processor claim 1 , the remote-processor configured to wirelessly receive the initial signal claim 1 , select a program from a library of programs stored on the remote-processor for operation of the tool claim 1 , and wirelessly transmit the return signal claim 1 , the return signal including the program.3. The analysis system of claim 2 , wherein the remote-processor is attached to a handheld electronic device that is physically separate from and independently movable from the tool.4. The analysis system of claim 2 , wherein the remote-processor is configured to receive a signal transmitted wirelessly from a remote-computer to modify the library. ...

ENERGY RADIATION GENERATOR WITH BI-POLAR VOLTAGE LADDER

A well-logging tool may include a sonde housing, and a radiation generator carried by the sonde housing. The radiation generator may include a generator housing, a target carried by the generator housing, a charged particle source carried by the generator housing to direct charged particles at the target, and at least one voltage source coupled to the charged particle source. The at least one voltage source may include a voltage ladder comprising a plurality of voltage multiplication stages coupled in a bi-polar configuration, and at least one loading coil coupled at at least one intermediate position along the voltage ladder. The well-logging tool may further include at least one radiation detector carried by the sonde housing. 1. A well-logging tool comprising:a sonde housing; a generator housing,', 'a target carried by said generator housing,', 'a charged particle source carried by said generator housing to direct charged particles at said target, and', a voltage ladder comprising a plurality of voltage multiplication stages with a voltage rating, and', 'at least one loading coil coupled at at least one intermediate position along said voltage ladder;', 'wherein said at least one voltage source has an operating frequency and a voltage efficiency, wherein said operating frequency is adjusted to optimize the voltage efficiency within the voltage rating of the multiplication stages; and, 'at least one voltage source coupled to said charged particle source, said at least one voltage source comprising'}], 'a radiation generator carried by said sonde housing and comprising'}at least one radiation detector carried by said sonde housing.2. The well-logging tool of wherein said at least one loading coil comprises a plurality thereof spaced apart at respective intermediate positions along said voltage ladder.3. The well-logging tool of wherein one of said loading coils is coupled at an intermediate position defined by two-fifths N claim 2 , where N is a number of said ...

System and method for multi-axis imaging of specimens

A specimen holding and positioning apparatus operable to substantially non-movably maintain a specimen (e.g., an excised tissue specimen) in a fixed or stable orientation with respect to the apparatus during imaging operations (e.g., x-ray imaging), transport (e.g., from a surgery room to a pathologist's laboratory), and the like for use in facilitating accurate detection and diagnosis of cancers and/or other abnormalities of the specimen.

Systems and methods for determining rotation angles

The present disclosure relates to systems and methods for determining rotation angles. The systems may perform the methods to: obtain a rotation speed of a radioactive scanning source in a CT scanner; obtain a plurality of original projection acquisition times corresponding to a plurality of projection samples, the plurality of projection samples being associated with rotation of the radioactive scanning source; determine a plurality of original rotation angles corresponding to the plurality of projection samples based on the plurality of original projection acquisition times and the rotation speed of the radioactive scanning source; and determine a plurality of modified rotation angles corresponding to the plurality of projection samples by modifying the plurality of original rotation angles.

A SYSTEM AND A METHOD FOR COMPOSITIONAL ANALYSIS

A system () for producing analysis data indicative of presence of one or more predetermined components in a sample () is presented. The system includes source equipment () for directing a particle stream () towards the sample (), detector equipment () for measuring a distribution of particles scattered from the sample () as a function of a scattering angle (θ), and processing equipment () for producing the analysis data based on the measured distribution of the scattered particles and on reference information indicative of an effect of the one or more predetermined components on the distribution of the scattered particles. The scattering angle related to each scattered particle is an angle between an arrival direction of the particle stream and a trajectory () of the scattered particle. The system utilizes different directional properties of scattering related to different isotopes, different chemical substances, and different isomers. 2. (canceled)3. A system according to claim 1 , wherein the processing equipment is configured to use one of the following for seeking the simulation model composition with which the predetermined criterion is fulfilled: a Generative Adversial Deep Neural network claim 1 , a Non-negative Matrix Factorization claim 1 , a Genetic Algorithm.4. A system according to claim 1 , wherein the source equipment is configured to direct towards the sample at least one of: a neutron stream claim 1 , an alpha particle stream claim 1 , a beta particle stream claim 1 , a proton stream.5. A system according to claim 1 , wherein the source equipment is further configured to direct towards the sample at least one of: gamma photons claim 1 , X-ray photons.6. A system according to claim 1 , wherein the detector equipment is configured to detect energies of the scattered particles and the processing equipment is configured to use claim 1 , when producing the analysis data claim 1 , the measured energies of the scattered particles and information indicative ...

Gantry image guided radiotherapy system and related treatment delivery methods

Systems, methods, and related computer program products for image-guided radiation treatment (IGRT) are described. Provided according to one preferred embodiment is an IGRT apparatus including a barrel-style rotatable gantry structure that provides high mechanical stability, versatility in radiation delivery, and versatility in target tracking. Methods for treatment radiation delivery using the IGRT apparatus include conical non-coplanar rotational arc therapy and cono-helical non-coplanar rotational arc therapy. A radiation treatment head (MV source) and a treatment guidance imaging system including a kV imaging source are mounted to and rotatable with a common barrel-style rotatable gantry structure, or alternatively the MV and kV sources are mounted to separate barrel-style rotatable gantry structures independently rotatable around a common axis of rotation. Methods for intra-fraction target tracking in a gantry-style IGRT system based on comparisons between a pre-acquired planning image and intrafraction x-ray tomosynthesis images and/or intrafraction cone beam CT (CBCT) images are also described.

X-RAY IMAGING APPARATUS

The present disclosure relates to an X-ray imaging apparatus. The X-ray imaging apparatus includes a first column connected to a main body, a second column connected to the first column and provided to be movable relative to the first column, an arm connected to the second column and slidably provided along the second column, and a weight compensator provided to compensate for the weight of the second column and the arm, wherein the weight compensator, the second column and the arm are connected by a wire, and the second column is provided with an elastic member connected to the arm and providing an elastic force such that the arm is moved by a uniform force regardless of the position of the second column. 1. An X-ray imaging apparatus comprising:a first column connected to a main body;a second column connected to the first column and provided to be movable relative to the first column;an arm connected to the second column and slidably provided along the second column; anda weight compensator provided to compensate for the weight of the second column and the arm,wherein the weight compensator, the second column and the arm are connected by a wire, and the second column is provided with an elastic member connected to the arm and providing an elastic force such that the arm is moved by a uniform force regardless of the position of the second column.2. The X-ray imaging apparatus according to claim 1 , whereinthe wire connecting the weight compensator, the second column and the arm is provided in a single unit.3. The X-ray imaging apparatus according to claim 1 , whereinthe elastic member is a static-load elastic member.4. The X-ray imaging apparatus according to claim 1 , whereinthe elastic member is a static-torque elastic member.5. The X-ray imaging apparatus according to claim 1 , whereinthe weight compensator includes a spring balancer to which the wire is connected and that is provided to compensate for the weight of the second column and the arm.6. The X-ray ...

GANTRY IMAGE GUIDED RADIOTHERAPY SYSTEM AND RELATED TREATMENT DELIVERY METHODS

A radiation treatment apparatus, comprising a gantry structure comprising a beam member extending between first and second ends of the gantry structure. The radiation treatment apparatus also includes a radiation treatment head movably mounted to the beam member in a manner that allows (i) translation of the radiation treatment head along the beam member between the first and second ends, and (ii) gimballing of the radiation treatment head relative to the beam member, the gimballing comprising pivotable movement in at least one independent pivot direction defined with respect to the beam member. The radiation treatment apparatus also includes a patient couch operative coupled with the radiation treatment head in manner to provide movement of the patient couch relative to the radiation treatment head. 1. A radiation treatment apparatus , comprising:a gantry structure; anda radiation treatment head movably mounted to the gantry structure to allow gimballing of the radiation treatment head relative to the gantry structure, the gimballing comprising pivotable movement in at least one independent pivot direction defined with respect to the gantry structure; anda patient couch operatively coupled with the radiation treatment head to provide movement of the patient couch relative to the radiation treatment head.2. The radiation treatment apparatus of claim 1 , wherein the radiation treatment head has pivotable movement in a maximum angle range greater than +/−30 degrees.3. The radiation treatment apparatus of claim 2 , wherein the patient couch and the radiation treatment head are movable to provide non-coplanar radiation treatment of a tissue volume.4. The radiation treatment apparatus of claim 3 , further comprising a controller operatively coupled with the patient couch and the radiation treatment head claim 3 , where to provide non-coplanar radiation treatment of a tissue volume the controller configured to control movement of the patient couch and gimbaling of the ...

MULTI-AXIS SPECIMEN IMAGING DEVICE WITH EMBEDDED ORIENTATION MARKERS

A specimen holding and positioning apparatus operable to substantially non-movably maintain a specimen (e.g., an excised tissue specimen) in a fixed or stable orientation with respect to the apparatus during imaging operations (e.g., x-ray imaging), transport (e.g., from a surgery room to a pathologist's laboratory), and the like for use in facilitating accurate detection and diagnosis of cancers and/or other abnormalities of the specimen. 1. An apparatus for positionably retaining a tissue specimen for imaging , comprising:a first positioning member comprising a portion thereof that is at least partially elastically deformable, wherein the first positioning member includes a body and an opening extending partially into the body for receipt of the tissue specimen, wherein the elastically deformable portion of the first positioning member includes an inner surface of the body that delimits a bottom of the opening, wherein the first positioning member includes a first orientation marker embedded within the body of the first positioning member, and wherein the first orientation marker is less radiolucent than is the body of the first positioning member;a second positioning member comprising a portion thereof that is at least partially elastically deformable, wherein the second positioning member includes a body, wherein the elastically deformable portion of the second positioning member is a bottom surface of the body, wherein the elastically deformable portion of the second positioning member is receivable in the opening of the first positioning member, wherein the first and second positioning members are fixably positionable to allow the portions of the first and second positioning members to retain a tissue specimen therebetween within a specimen support volume of the apparatus, wherein first and second orthogonal axes of the apparatus extend through the specimen support volume, and wherein a reference plane extends between the portions of the first and second ...

POSITIONING OF X-RAY IMAGING SYSTEM USING AN OPTICAL CAMERA

In an embodiment, a method of navigational calibration for an x-ray inspection system including an optical camera is provided. The method employs a novel two-dimensional calibration phantom. The calibration phantom can be employed to validate a navigational calibration between positions within camera images and an x-ray beam axis. The calibration phantom can be further employed to identify and compensate for incorrect navigational calibration. 1. A method of navigational calibration for an x-ray inspection system , comprising: a plurality of polygons of different sizes, wherein a first polygon of the plurality of polygons is inset and centered within a second polygon of the plurality of polygons;', 'a center mark at a center of the calibration phantom; and', 'a vertex mark at a vertex of one of the plurality of polygons;', 'wherein a physical location of the vertex mark is offset from a physical location of the center mark by a predetermined first offset distance in a first direction and a predetermined second offset distance in a second direction, and wherein the first and second directions lie in the plane of the first surface and are orthogonal to one another;, 'mounting a calibration phantom on a moveable stage, wherein a first surface of the calibration phantom is generally planar and includes an optically visible pattern illustrated thereon, the pattern includinggenerating a graphical user interface (GUI) including a sequence of images of a field of view of an optical video camera and a crosshair overlaid upon the sequence of images;outputting the GUI for display;moving the moveable stage to a first location, wherein the calibration phantom is within the field of view of the video camera such that the crosshair center is aligned with the center mark within the GUI;determining a calibration ratio defined as a physical distance per pixel within the sequence of images when the moveable stage is at the first location;receiving the physical location of the vertex ...

System, Kit, and Method for X-Ray Imaging with Removably Attachable Detector Assembly

An x-ray imaging system, and a corresponding kit and method, includes a movable x-ray imager that includes a first backscatter x-ray detector assembly. The system also includes a second backscatter x-ray detector assembly that is removably attachable with the movable x-ray imager. The movable x-ray imager and the second backscatter x-ray detector include complementary attachment features configured to secure, removably, the second backscatter x-ray detector assembly with the movable x-ray imager to form an attached arrangement having the second and first backscatter x-ray detectors fixedly oriented with respect to each other. The second backscatter x-ray detector assembly forms an outer loop defining an inner opening at which the movable x-ray imager is configured to be received for attachment of the second backscatter x-ray detector assembly with the movable x-ray imager to form the attached arrangement. 1. An x-ray imaging system comprising:a movable x-ray imager including a first backscatter x-ray detector assembly; anda second backscatter x-ray detector assembly that is removably attachable with the movable x-ray imager,the movable x-ray imager and the second backscatter x-ray detector assembly including complementary attachment features configured to secure, removably, the second backscatter x-ray detector assembly with the movable x-ray imager to form an attached arrangement having the second and first backscatter x-ray detector assemblies fixedly oriented with respect to each other,wherein the second backscatter x-ray detector assembly forms an outer loop defining an inner opening at which the movable x-ray imager is configured to be received for attachment of the second backscatter x-ray detector assembly with the movable x-ray imager to form the attached arrangement.2. The x-ray imaging system of claim 1 , wherein the movable x-ray imager is configured to be handheld during operation.3. The x-ray imaging system of claim 1 , further comprising a robotic arm ...

TEST PATTERN AND METHOD FOR CALIBRATING AN X-RAY IMAGING DEVICE

A test pattern geometrically calibrates an x-ray imaging device to generate three-dimensional images of an object by reconstruction based on two-dimensional projections of the object, the calibrating test pattern comprising a volume support with markers having a radiological absorbance providing contrast to the volume support, the markers distributed in a three-dimensional pattern, in subsets substantially in parallel respective straight lines wherein sequences of cross-ratios are constructed from the respective subsets of markers. Each sequence of cross-ratios comprises a single cross-ratio for each quadruplet of markers in which quadruplet the markers are ordered depending on rank number of respective markers along the straight line they are aligned in a predefined first direction, the order being common to all cross-ratios. When a subset of markers comprises at least five markers, the order of the cross-ratios in the respective sequences of cross-ratios is defined by a rule common to all sequences of cross-ratios. 1. A calibrating test pattern intended to geometrically calibrate an x-ray imaging device intended to generate three-dimensional images of an object by reconstruction based on two-dimensional projections of said object , the calibrating test pattern comprising a volume support equipped with markers having a radiological absorbance providing contrast with respect to the volume support , the markers being distributed in a three-dimensional pattern , wherein the markers are distributed in subsets of markers distributed in substantially parallel respective straight lines so that sequences of cross-ratios may be constructed from the respective subsets of markers , each sequence of cross-ratios comprising a single cross-ratio for each quadruplet of markers , wherein quadruplet the markers are ordered in an order depending on the rank number of the respective markers along the straight line on which they are aligned in a predefined first direction , said order ...

METHOD AND APPARATUS FOR INSPECTING A SUBSTRATE

A method and apparatus for inspection and review of defects is disclosed wherein data gathering is improved. In one embodiment, multiple or segmented detectors are used in a particle beam system. 141-. (canceled)42. A method of inspecting or reviewing a substrate , comprising:a. exposing at least a portion of said substrate, thereby causing said substrate to emit charged particles;b. detecting said charged particles with a first detector element;c. detecting said charged particles with a second detector element; andd. combining signals from said first detector element and said second detector element, such that topographical data concerning said substrate is enhanced.43. The method of claim 42 , wherein said signals are subtracted from one another.44. The method of claim 43 , wherein material contrast is suppressed.45. The method of claim 42 , wherein said signals are in analog form when combined.46. The method of claim 42 , wherein said signals are digitized before being combined.47. The method of claim 42 , wherein said signals are summed.48. The method of claim 42 , wherein said signal combination is controlled to create a predetermined mix of topographic and material contrast.49. A system for inspecting or reviewing a substrate claim 42 , comprising:an incident beam that exposes at least a portion of said substrate, thereby causing said substrate to emit charged particles;a first detector element for detecting said charged particles to obtain first signal;a second detector element for detecting said charged particles to obtain second signal; anda device that combines the first and second signals to generate a combined signal,wherein the first and second signals are combined such that topographical data concerning the substrate is enhanced in the combined signal.50. The system of claim 49 , further comprising:a digitizer for digitizing the combined signal to generate combined digital data; anda computer that receives the combined digital data.51. The system of ...

Xrf analyzer rotational filter

An XRF analyzer can include a rotatable filter structure to separately position at least two different x-ray source modification regions between an x-ray source and a focal point and at least two different x-ray detector modification regions between an x-ray detector and the focal point. An XRF analyzer can include a rotatable source filter wheel between an x-ray source and a focal point and a rotatable detector filter wheel between an x-ray detector and the focal point. The source filter wheel can include multiple x-ray source modification regions. The detector filter wheel can include multiple x-ray detector modification regions. A gear wheel can mesh with a gear on the source filter wheel and with a gear on the detector filter wheel and can cause the source filter wheel and the detector filter wheel to rotate together.

ENHANCED CHEMICAL CHARACTERIZATION OF SOLID MATRICES USING X-RAY FLUORESCENCE AND OPTICAL COLOR REFLECTANCE

An apparatus or method determines a content of the one or more elements of a solid matrix by scanning the solid matrix using a PXRF spectrometer and a color sensor, receiving a PXRF spectra from the PXRF spectrometer and a numerical color data from the color sensor, extracting a value for each of the one or more elements the PXRF spectra, determining the content of the one or more elements of the solid matrix using one or more processors and a predictive model that relates the value of each of the one or more elements and the numerical color data to the content of the one or more elements of the solid matrix, and providing the content of the one or more elements of the solid matrix to one or more input/output interfaces. 1. A computerized method for determining a content of one or more elements within a solid matrix comprising:providing a x-ray fluorescence (PXRF) spectrometer, a probe connected to the PXRF spectrometer, a color sensor, one or more processors communicably coupled to the PXRF spectrometer and the color sensor, and one or more input/output interfaces communicably coupled to the one or more processors;scanning the solid matrix using the PXRF spectrometer and the color sensor;receiving a PXRF spectra from the PXRF spectrometer and a numerical color data from the color sensor;extracting a value for each of the one or more elements from the PXRF spectra;determining the content of the one or more elements within the solid matrix using the one or more processors and a predictive model that relates the value for each of the one or more elements and the numerical color data to the content of each of the one or more elements within the solid matrix; andproviding the content of the one or more elements within the solid matrix to the one or more input/output interfaces.2. The method as recited in claim 1 , wherein the solid matrix comprises coal claim 1 , soil or a combination thereof.3. The method as recited in claim 1 , wherein the one or more elements ...

Method And Device For Preserving and Imaging Specimens While Retaining Information On The Spatial Orientation Of Specimens With Respect To Reference Objects

An object, such as a tumor from a breast lumpectomy, is placed into an object positioning device that can hold the object without deforming it. Such a device can include a container with a deformable foam, gel, or other material. The object positioning device is moved into an imaging device. Images of the object within the object positioning device are acquired by the imaging device. The acquired images are stored, processed, or output on a display device. Information about the spatial orientation of the object with respect to a reference object is preserved.

RADIOGRAPHIC IMAGING APPARATUS, METHOD OF CONTROLLING THE SAME, RADIOGRAPHIC IMAGING SYSTEM, AND STORAGE MEDIUM

A radiographic imaging apparatus includes a state transition mode selection unit configured to select a state transition mode from among a first state transition mode of changing from a stand-by state to a ready-for-imaging state based on irradiation preparation start information about a radiation generation apparatus and a second state transition mode of changing from the stand-by state to the ready-for-imaging state based on other information excluding the irradiation preparation start information. 1. A radiographic imaging apparatus including an image generation unit configured to generate a radiographic image based on incident radiation , the radiographic imaging apparatus comprising:a reception unit configured to receive irradiation preparation start information about a start of preparation for irradiation with the radiation in a radiation generation apparatus that generates the radiation; anda selection unit configured to select a state transition mode from among a first state transition mode of changing from a stand-by state to a ready-for-imaging state based on the irradiation preparation start information and a second state transition mode of changing from the stand-by state to the ready-for-imaging state based on other information excluding the irradiation preparation start information, the selection unit selecting the state transition mode based on a state transition characteristic in changing from the stand-by state in which power consumption is lower than power consumption in the ready-for-imaging state to the ready-for-imaging state in the radiographic imaging apparatus and a radiation irradiation characteristic in changing to a ready-for-radiation-irradiation state in the radiation generation apparatus.2. The radiographic imaging apparatus according to claim 1 , wherein the state transition characteristic is a characteristic including a ready-for-imaging state transition time in changing from the stand-by state to the ready-for-imaging state.3. The ...

DEFECT REVIEWING METHOD AND DEVICE

To review minute defects that were buried in roughness scattered light with an observation device provided with a dark-field microscope, a scanning electron microscope (SEM), and a control unit, the present invention configures the dark-field microscope by installing a filter for blocking a portion of the scattered light, an imaging lens for focusing the scattered light that has passed through the filter, and a detector for dividing the image of the scattered light focused by the imaging lens into the polarization directions converted by a wavelength plate and detecting the resulting images, and the control has a calculation unit for determining the position of a defect candidate detected by another inspection device using the plurality of images separated into polarization directions and detected by the detector. 120-. (canceled)21. A defect reviewing device comprising:a dark-field microscope that identify a position of a defect on a sample that is detected by another inspection device;a scanning electron microscope (SEM) that reviews the defect on the sample the position of which is identified by the dark-field microscope;a table that carries the sample and is capable of moving between the dark-field microscope and the SEM; anda control unit that controls the dark-field microscope, the SEM, and the table;wherein the dark-field microscope includesan illumination light source that illuminates the sample with illumination light,an objective lens that collects scattered light generated from the sample illuminated with the illumination light from the illumination light source,a wavelength plate that converts the polarization directions of the scattered light from the sample, the scattered light being collected by the objective lens,a filter that blocks part of the scattered light transmitted through the wavelength plate and transmits the remaining portion of the scattered light,an imaging lens that forms an image of the scattered light transmitted through the filter, ...

TILTED-GRATING APPROACH FOR SCANNING-MODE X-RAY GRATING INTERFEROMETRY

Among the existent X-ray phase-contrast modalities, grating interferometry appears as a promising technique for commercial applications, since it is compatible with conventional X-ray tubes. However, since applications such as medical imaging and homeland security demand covering a considerable field of view, the fabrication of challenging and expensive large-area gratings would be needed. A scanning setup is a good solution, because it uses cheaper line detectors instead of large-area 2D detectors and would require smaller gratings. In this setup, the phase-retrieval using the conventional phase-stepping approach would be slow, so having a faster method to record the signals becomes fundamental. To tackle this problem, a scanning-mode grating interferometer configuration is used, in which a grating is tilted to form Moire fringes perpendicular to the grating lines. The sample is then translated along the fringes, so each line detector records a different phase step for each slice of the sample. 110-. (canceled)11. A method to retrieve absorption , differential phase contrast (DPC) and dark field signals from a Moire fringe pattern obtained by detuning a grating interferometer system having an X-ray source , a phase grating , an analyzer grating and a line sensitive detector , which comprises the steps of:tilting one of the phase grating and the analyzer grating; andscanning either a sample or the grating interferometer system along the Moire fringe pattern.12. The method according to claim 11 , which further comprises producing the Moire fringe pattern of a desired period by tilting one of the phase grating and the analyzer grating by a predetermined angle.14. The method according to claim 11 , which further comprises using reference and sample data acquired with the grating interferometer system to retrieve the absorption claim 11 , the DPC and the dark-field signals either by Fourier Component.15. The method according to claim 11 , wherein:the grating ...

DIAGNOSTIC SUPPORT FOR SKINS AND INSPECTION METHOD OF SKIN

A diagnostic support for a skin includes a radio-transparent structure that defines a folding surface of the skin and on which the skin may be stretched and consequently folded, thereby defining folded, mutually superimposed portions spaced apart from each other. The support may be used for radiographic inspection of a folded animal skin. 115-. (canceled)16. A diagnostic support for a skin , comprising:a radio-transparent structure configured to define at least one folding surface of said skin and on which said skin is at least partially stretched and consequently folded, thereby defining folded, mutually superimposed portions of said skin,wherein said radio-transparent structure is configured to position itself between said folded portions, thus spacing them apart from each other.17. The diagnostic support according to claim 16 , wherein said radio-transparent structure is configured to fold said skin claim 16 , thereby defining folded portions that are equally spaced from one another.18. The diagnostic support according to claim 16 , wherein said radio-transparent structure comprises a flexible plate defining said folding surface and configured to roll up on itself claim 16 , thus folding said skin.19. The diagnostic support according to claim 16 , wherein:said radio-transparent structure defines a longitudinal plane and comprises a plurality of sections, each section defining one of said at least one folding surfaces, andsaid sections are mutually alternated on opposite sides with respect to said longitudinal plane and axially spaced from each other.20. The diagnostic support according to claim 16 , wherein said radio-transparent structure comprises a plurality of panels configured to be stacked claim 16 , thereby placing said skin between said panels.21. The diagnostic support according to claim 16 , wherein said radio-transparent structure comprises a first fork comprising first tines and a second fork comprising second tines configured to position themselves ...

Sample inspection device and sample inspection method

The present invention addresses the problem of providing a sample inspection device and a sample inspection method, whereby noise is removed from a detection signal, and a generated electron beam is utilized effectively for inspection. A sample inspection device according to the present invention is provided with a light source for emitting frequency-modulated light, a photocathode for emitting an electron beam in response to receiving the frequency-modulated light, a detector for detecting electrons emitted from a sample irradiated by the electron beam and generating a detection signal, and a signal extractor for extracting a signal having a frequency corresponding to a modulation frequency of the frequency-modulated light from within the detection signal.

Liquid mixture used to test and validate test devices

The invention relates to a liquid mixture to test and validate test devices for inspecting objects or persons, the mixture containing glycerol. The glycerol portion is at least 90% by weight, preferably approximately 99.5% by weight and the remaining portion is water.

Xrf/xrd system with dynamic management of multiple data processing units

Disclosed is a portable non-destructive testing (NDT) instrument system that transmits spectrum data measured from a test material sample to a remotely located computer for computation of the sample's atomic element composition. The atomic element composition is subsequently transmitted back to the portable instrument for display to the operator in real time. The precision and accuracy of the compositional computation is improved by the greater processing power of the high performance remote computer. The operator of the NDT instrument may choose to use the remote computer to perform part or all of the compositional computation.

Systems, apparatuses, and methods for measuring submerged surfaces

The present disclosure provides systems, apparatuses, and methods for measuring submerged surfaces. Embodiments include a measurement apparatus including a main frame, a source positioned outside a pipe and connected to the main frame, and a detector positioned outside the pipe at a location diametrically opposite the source and connected to the main frame. The source may transmit a first amount of radiation. The detector may receive a second amount of radiation, determine a composition of the pipe based on the first and second amounts of radiation, and send at least one measurement signal. A control canister positioned on the main frame or on a remotely operated vehicle (ROV) attached to the apparatus may receive the at least one measurement signal from the detector and convey the at least one measurement signal to software located topside.

MATERIAL TESTING MACHINE AND RADIATION CT DEVICE

A grip portion configured to support a test piece is disposed at a central part of a base, and a plurality of pillars are erected on the base. The disposition and number of the pillars are adjusted so that an X-ray emitted from an X-ray source and transmitting through the test piece transmits through zero or one pillar in an optional image capturing direction. It is possible to avoid a situation in which the attenuation rate of the X-ray largely differs due to difference in an image capturing direction to the test piece. Thus, it is possible to prevent a strong artifact from overlapping a CT image of the test piece in an X-ray CT image. Moreover, a material testing machine is supported by the plurality of pillars to have an accessible state around the test piece. This configuration facilitates handling of the material testing machine. 1. A material testing machine placed on a rotary stage disposed between a radiation source and a radiation detector disposed opposite to each other , the material testing machine comprising:a base;a first member disposed at a center of the base and configured to support a test piece;a second member disposed opposite to the first member across the test piece;a plurality of pillars erected on the base; anda drive mechanism configured to drive at least one of the first member and the second member in a direction in which a load is applied to the test piece,wherein, when radiation CT image capturing is performed while rotating the rotary stage about an axis orthogonal to a surface of the rotary stage, the pillars are erected so that a number of pillars through which radiation emitted from the radiation source, transmitting through the test piece, and detected by the radiation detector transmits before being detected by the radiation detector is one or zero when the test piece is irradiated with radiation in an optional direction.2. The material testing machine according to claim 1 , wherein each of the pillars is erected at a position ...

MINI C-ARM IMAGING SYSTEM WITH STEPLESS COLLIMATION

The disclosure relates to a Mobile Fluoroscopic Device consisting of a Mini-C Arm assembly containing a stepless collimating apparatus which is adjustable using pairs of linear translating, opaque to x-ray plates (). Each pair of plates are operated by a drive mechanism including a motor (), gears (), and racks () making it possible to increase or decrease the cross-sectional area of the x-ray beam relative to the x-ray sensor surface area. 1. A mobile mini C-arm fluoroscopic/radiographic imaging device comprising:a x-ray beam generator;an image receptor;a curved structural support assembly; anda collimating apparatus configured to allow for user-controlled stepless adjustment of the x-ray beam size and shape through a continuous range to optimize the field of view at the image receptor.2. The imaging device of claim 1 , wherein the collimating apparatus comprises a plurality of movable plates coupled to racks configured to facilitate translation along linear rails.3. The imaging device of claim 2 , wherein the collimating apparatus comprises drive gears configured to move the plurality of movable plates with respect to each other.4. The imaging device of claim 2 , wherein the collimating apparatus further comprises idle gears configured to move the plurality of movable plates with respect to each other.5. The image device of claim 3 , further comprising one or more motors configured to drive the drive gears to move the plurality of movable plates with respect to each other.6. The image device of claim 5 , wherein the one or more motors are positioned above the collimating apparatus.7. The image device of any of claim 3 , wherein the plurality of moveable plates comprises a first pair of plates and a second pair of plates claim 3 , wherein rotation of the drive gears results in the first pair of plates moving closer together or farther apart from each other and/or the second pair of plates moving closer together or farther part from each other.8. The image device of ...

MEASURING AND ANALYZING RESIDUAL STRESSES AND THEIR GRADIENTS IN MATERIALS USING HIGH RESOLUTION GRAZING INCIDENCE X-RAY DIFFRACTION

A high resolution grazing incidence X-ray diffraction technique for measuring residual stresses and their gradients as a function of depth in thin film materials on substrates or in bulk materials is disclosed. The technique includes positioning a material relative to an X-ray source and an X-ray detector, performing an Omega scan to determine an Omega offset, setting the incidence angle at a first target incidence angle based on the Omega offset and greater than the critical angle of the material, performing a grazing incidence X-ray diffraction scan, analyzing the results to identify diffraction peaks, selecting a diffraction peak, setting the incidence angle at a second target incidence angle based on the Omega offset and a desired penetration depth, performing two theta scanning on a range of two theta values around the selected diffraction peak, performing refraction correction, and determining residual stress values for the material. 1. A method comprising:performing an Omega scan to determine an Omega offset of an X-ray beam generated by an X-ray source relative to a material with respect to an incidence angle between the X-ray source and the material;setting the incidence angle between the X-ray source and the material at a first target incidence angle, the first target incidence angle based on the Omega offset and greater than the critical angle of the material;performing a grazing incidence X-ray diffraction scan on the material, the grazing incidence X-ray diffraction scan generating first measurement data comprising intensities of X-ray photons at a plurality of two theta angles;analyzing the first measurement data to identify a plurality of diffraction peaks from the material, each diffraction peak having an intensity occurring at a corresponding two theta value;selecting a diffraction peak of the plurality of diffraction peaks based on the analysis of the first measurement data;setting the incidence angle between the X-ray source and the material at a ...

MEASURING AND ANALYZING RESIDUAL STRESSES AND THEIR GRADIENTS IN MATERIALS USING HIGH RESOLUTION GRAZING INCIDENCE X-RAY DIFFRACTION

A high resolution grazing incidence X-ray diffraction technique for measuring residual stresses and their gradients as a function of depth in thin film materials on substrates or in bulk materials is disclosed. The technique includes positioning a material relative to an X-ray source and an X-ray detector, performing an Omega scan to determine an Omega offset, setting the incidence angle at a first target incidence angle based on the Omega offset and greater than the critical angle of the material, performing a grazing incidence X-ray diffraction scan, analyzing the results to identify diffraction peaks, selecting a diffraction peak, setting the incidence angle at a second target incidence angle based on the Omega offset and a desired penetration depth, performing two theta scanning on a range of two theta values around the selected diffraction peak, performing refraction correction, and determining residual stress values for the material. 1. A system comprising:a testing apparatus comprising an X-ray source and an X-ray detector;at least one processor comprising hardware; and perform an Omega scan to determine an Omega offset of an X-ray beam generated by the X-ray source relative to a material with respect to an incidence angle between the X-ray source and the material;', 'set the incidence angle between the X-ray source and the material at a first target incidence angle, the first target incidence angle based on the Omega offset and greater than the critical angle of the material;', 'perform a grazing incidence X-ray diffraction scan on the material, the grazing incidence X-ray diffraction scan generating first measurement data comprising intensities of X-ray photons at a plurality of two theta angles;', 'analyze the first measurement data to identify a plurality of diffraction peaks from the material, each diffraction peak having an intensity occurring at a corresponding two theta value;', 'select a diffraction peak of the plurality of diffraction peaks based on ...

MEASURING AND ANALYZING RESIDUAL STRESSES AND THEIR GRADIENTS IN MATERIALS USING HIGH RESOLUTION GRAZING INCIDENCE X-RAY DIFFRACTION

A high resolution grazing incidence X-ray diffraction technique for measuring residual stresses and their gradients as a function of depth in thin film materials on substrates or in bulk materials is disclosed. The technique includes positioning a material relative to an X-ray source and an X-ray detector, performing an Omega scan to determine an Omega offset, setting the incidence angle at a first target incidence angle based on the Omega offset and greater than the critical angle of the material, performing a grazing incidence X-ray diffraction scan, analyzing the results to identify diffraction peaks, selecting a diffraction peak, setting the incidence angle at a second target incidence angle based on the Omega offset and a desired penetration depth, performing two theta scanning on a range of two theta values around the selected diffraction peak, performing refraction correction, and determining residual stress values for the material. 1. A computer readable medium comprising instructions that , when executed by at least one processor comprising hardware , configure the at least one processor to:receive first measurement data comprising intensities of X-ray photons at a plurality of two theta angles, the first measurement data generated by a performance of a grazing incidence X-ray diffraction scan on a material with an incidence angle between an X-ray source and the material set at a first target incidence angle greater than the critical angle of the material;analyze the first measurement data to identify a plurality of diffraction peaks from the material, each diffraction peak having an intensity occurring at a corresponding two theta value;select a diffraction peak of the plurality of diffraction peaks based on the analysis of the first measurement data;receive second measurement data, the second measurement data generated by a performance of two theta scanning on the material on a range of two theta values around the two theta value of the selected ...

METHOD FOR CALIBRATING AN X-RAY TESTING SYSTEM FOR A TIRE TYPE AND METHOD FOR CHECKING THE POSITION OF CORDS IN A TIRE

A method for calibrating an X-ray inspection system for a tire. The X-ray inspection system includes an X-ray tube, a linear X-ray detector, and a manipulator for the tire. The method includes moving one of the X-ray tube, the linear X-ray detector, and the manipulator along a travel path from a set starting position to a set end position, capturing, at a preset reading rate during the movement of one of the X-ray tube, the linear X-ray detector, and the manipulator, a continuous capture of X-ray radiography images of a cord within the tire, tracking the cord using successive X-ray radiography images, and deducing an absolute position of the cord using a total shift of the cord in the X-ray radiography images between the starting position and the end position and using known geometric data. 1. A method for calibrating an X-ray inspection system for a tire , which includes an X-ray tube , a linear X-ray detector , and a manipulator for the tire , wherein the manipulator is arranged such that the tire is arranged with its tread between the X-ray tube and the X-ray detector , the method comprising:moving one of the X-ray tube, the linear X-ray detector, and the manipulator along a travel path from a set starting position to a set end position;capturing at a preset reading rate during the movement of one of the X-ray tube, the linear X-ray detector, and the manipulator, continuous capture of X-ray radiography images of a cord within the tire;tracking the cord using successive X-ray radiography images; anddeducing the absolute position of the cord using a total shift of the cord in the X-ray radiography images between the starting position and the end position and using known geometric data.2. The according to claim 1 , wherein moving one of the X-ray tube claim 1 , the linear X-ray detector claim 1 , and the manipulator comprises moving the h manipulator.3. The method according to claim 1 , wherein the movement of one of the X-ray tube claim 1 , the linear X-ray ...

METHOD FOR DETERMINING PHYSICAL PROPERTIES OF A SAMPLE

Disclosed is a method for determining physical properties of a test sample using a spectrometric detector with at least three channels, consisting of: performing measurements in each of the channels on the test sample, calculating variables, each formed from a combination of measurements of different channels, and applying a weighting and bias matrix to the variables, enabling the investigated physical properties of the test sample to be determined. 1. A method for determining physical properties of a test sample using a spectrometric detector with at least three channels , consisting of:performing measurements in each of the channels on the test sample, wherein it also consists of:calculating variables, each formed from a combination of measurements of different channels, andapplying a weighting and bias matrix to the variables, enabling the investigated physical properties of the test sample to be determined, the values being able to vary continuously.2. The method according to claim 1 , wherein the variables form a “variable vector” and in that the application of the weighting and bias matrix to the variable vector yields a result vector claim 1 , the components of which are the values of the investigated physical properties.3. The method according to claim 1 , wherein the variables are normalized using a ratio between useful measurements of a radiation attenuated by the sample and empty measurements of the radiation not attenuated by the sample.4. The method according to claim 3 , wherein the variables are normalized using a logarithm of the ratio.5. The method according to claim 1 , additionally consisting of:performing measurements in each of the channels on several calibration samples with different thicknesses and different materials,calculating the variables on each of the calibration samples,during a first calibration step, using a regression method, linking the variables relative to the calibration samples to expected values of the investigated properties ...

APPARATUS AND METHOD FOR INDUCING HIGH-SPEED VARIABLE-TILT WOBBLE MOTIONS

An apparatus and method for inducing high-speed wobble motions to a sample of interest is provided. After the sample is securely attached to a sample mounting block, the sample is variably tilted by using a hexapod stage and simultaneously rotated at a high speed about a rotation axis that is substantially perpendicular to a planar top surface of the hexapod stage. The position of the sample is continuously adjusted during the wobble motion to align a surface center of the sample with a testing center of an X-ray diffractometer. The simultaneous variable tilting and high-speed rotation of the sample induces wobble motions to the sample for randomizing orientations of a sample material's crystallites relative to the source and detector of an X-ray diffractometer. 1. An apparatus for inducing high-speed wobble motions to a sample for identifying and quantifying crystalline phases of a material of the sample by using an X-ray diffractometer , wherein the X-ray diffractometer has a pre-defined testing center , the apparatus comprising:a position adjustment structure disposed on a part of the X-ray diffractometer, wherein the position adjustment structure is configured to adjust the position of the sample with respect to the X-ray diffractometer, such that a surface center of the sample is aligned with the testing center of the X-ray diffractometer in a space defined by a longitudinal axis, a lateral axis and a vertical axis;a hexapod stage disposed on the position adjustment structure, wherein the hexapod stage is configured to tilt the sample;a rotation stage disposed on the hexapod stage, wherein the rotation stage is configured to rotate the sample about a rotation axis that is substantially perpendicular to a planar top surface of the hexapod stage; anda sample mounting block disposed on the rotation stage, wherein the sample mounting block has a top surface on which the sample is securely mounted,wherein the hexapod stage tilts the sample simultaneously with the ...

SAMPLE HOLDER

A sample holder for holding a sample comprising a drill core sample or drill cuttings during X-ray transmission measurements and fluorescence measurements is disclosed. The sample holder comprises a confining structure having an axial direction and being adapted to, during measurement, at least partially enclose the sample and to restrict movement of the sample in a direction intersecting the axial direction. The confining structure comprises at least one region facing away from the axial direction and allowing exciting radiation impinging on, and fluorescent radiation emanating from, the sample during measurement to pass therethrough. An apparatus adapted for receiving such a sample holder is also disclosed, comprising a ray source, an X-ray transmission detector, a fluorescence detector and rotating means for rotating at least one of the sample holder, the X-ray source, the X-ray transmission detector and the fluorescence detector. Further, a system comprising such a sample holder and apparatus is disclosed. 1. A sample holder for holding a sample comprising a drill core sample or drill cuttings during X-ray transmission measurements and fluorescence measurements , comprisinga confining structure having a length direction and being adapted to, during measurement, at least partially enclose the sample and to restrict movement of the sample in a direction intersecting the length direction, said confining structure comprising at least one region facing away from the length direction and allowing exciting radiation impinging on, and fluorescent radiation emanating from, the sample during measurement to pass therethrough, wherein said at least one region comprises at least one hole through the confining structure.2. The sample holder according to claim 1 , wherein the confining structure is rigid.3. The sample holder according to claim 1 , wherein the confining structure comprises a shape conforming to a hollow cylinder.4. The sample holder according to claim 1 , ...

RADIATION IMAGING APPARATUS, RADIATION IMAGING SYSTEM, METHOD OF CONTROLLING RADIATION IMAGING APPARATUS, AND COMPUTER READABLE STORAGE MEDIUM THEREFOR

An imaging control unit in a radiation imaging apparatus causes imaging in a plurality of modes varying in a setting value, and causes standby driving to reduce signals stored in a plurality of pixels during a period in which the plurality of pixels is not irradiated with radiation. The plurality of modes includes a first mode for first imaging using a first setting value and a second mode for second imaging using a second setting value different from the first setting value after the first imaging. The imaging control unit causes the standby driving using a setting value closer to the second setting value than to the first setting value in response to end of the first imaging in causing the second imaging. 1. A radiation imaging apparatus comprising:a radiation imaging unit configured to perform imaging of a radiation image in one frame by performing driving of a plurality of pixels to use signals stored in the plurality of pixels based on radiation irradiating the plurality of pixels arranged in a matrix; andan imaging control unit configured to control the imaging by controlling the driving based on a setting value,wherein the imaging control unit causes the radiation imaging unit to perform the imaging in a plurality of modes varying in the setting value, andwherein the imaging control unit causes the radiation imaging unit to perform standby driving of the plurality of pixels to reduce signals stored in the plurality of pixels during a period in which the plurality of pixels is not irradiated with radiation, the plurality of modes including a first mode in which the radiation imaging unit performs first imaging using a first setting value and a second mode in which the radiation imaging unit performs second imaging using a second setting value different from the first setting value after the first imaging, and the imaging control unit causes the radiation imaging unit to perform the standby driving using the setting value closer to the second setting value than ...

X-RAY MEASUREMENT APPARATUS AND SYSTEM

There is provided an X-ray measurement apparatus (X-ray diffractometer ) constituting a measurement system of X-ray analysis from a plurality of components, the X-ray measurement apparatus comprising an apparatus body directly or indirectly attaching each of target components and each of non-target components; each of the target components (selection slit ) to be attached, the type of the attached target component being recognized by the apparatus body, and each of the non-target components to be attached, the type of the attached non-target component not being recognized by the apparatus body a measurement category; and an indicator (indicator for the selection slit) that indicates whether attachment of each of the target components is appropriate for a measurement category. 1. An X-ray measurement apparatus constituting a measurement system of X-ray analysis from a plurality of components , the X-ray measurement apparatus comprising:an apparatus body directly or indirectly attaching each of target components and each of non-target components;each of the target components to be attached, the type of the attached target component being recognized by the apparatus body;each of the non-target components to be attached, the type of the attached non-target component not being recognized by the apparatus body; andan indicator that indicates whether attachment of each of the target components is appropriate for a measurement category.2. The X-ray measurement apparatus according to claim 1 ,wherein the indicator indicates whether attachment of a base component is appropriate on the apparatus body, the base component being one of the target components directly attached to the apparatus body.3. The X-ray measurement apparatus according to claim 2 ,wherein the indicator indicates whether the attachment of the base component is appropriate on a connector for electrical connection.4. The X-ray measurement apparatus according to claim 1 ,wherein the indicator indicates whether ...

X-ray imaging apparatus

An industrial X-ray imaging apparatus including: an X-ray source; an X-ray detector configured to detect X-rays emitted from the X-ray source; a stage which is disposed between the X-ray source and the X-ray detector and is configured to support a subject; and a shielding chamber configured to accommodate the X-ray source, the X-ray detector, and the stage, in which the shielding chamber includes a door for carrying in and out the subject, and a lock mechanism for prohibiting the door from changing to an open state, and in which the X-ray imaging apparatus further includes an unlocking control unit configured to control unlocking of the lock mechanism based on a leakage dose leaking from the shielding chamber to an outside.

METHOD FOR GENERATING X-RAY IMAGE DATA, X-RAY SYSTEM AND DATA PROCESSING UNIT

A mathematical scattered radiation model with a number of parameters is specified. A test object is scanned with an X-ray system to generate a first raw dataset. The test object is scanned again to generate a second raw dataset, this time with an intermediary X-ray mask having at least one X-ray transparent region and at least one X-ray non-transparent region between the X-ray source and the test object. Parameter values are determined based on the first raw dataset and on the second raw dataset, and the scattered radiation model is calibrated with the parameter values. An examination object is scanned with the X-ray system to generate a third raw dataset and the third raw dataset is processed with the calibrated scattered radiation model to generate a corrected third raw dataset. A set of X-ray image data is generated from the examination object based on the corrected third raw dataset. 1. A method of generating X-ray image data by way of an X-ray system having an X-ray source and an X-ray detector with a number of regularly arranged pixels , the method comprising:specifying a mathematical scattered radiation model with a plurality of parameters;scanning a test object by way of the X-ray system to generate a first raw dataset;inserting an X-ray mask with at least one region that is transparent to X-rays and with at least one region that is non-transparent to X-rays between the X-ray source and the test object, and scanning the test object by way of the X-ray system with the X-ray mask inserted to generate a second raw dataset;using the first raw dataset and the second raw dataset as a basis for determining parameter values for the parameters of the scattered radiation model, and calibrating the scattered radiation model with the parameters;scanning an examination object by way of the X-ray system to generate a third raw dataset;processing the third raw dataset with the calibrated scattered radiation model to generate a corrected third raw dataset; andusing the ...

X-ray fluorescence spectrometer and x-ray fluorescence analyzing method

An X-ray fluorescence spectrometer includes: an X-ray source ( 3 ) to irradiate, with primary X-rays ( 6 ), a sample ( 1 ) that is multiple nanoparticles placed on a substrate ( 10 ); an irradiation angle adjustment unit ( 5 ) to adjust an irradiation angle at which a surface ( 10 a ) of the substrate is irradiated; a detection unit ( 8 ) to measure an intensity of fluorescent X-rays ( 7 ) from the sample ( 1 ); a peak position calculation unit ( 11 ) to generate a sample profile representing change of the intensity of the fluorescent X-rays ( 7 ) against change of the irradiation angle, and to calculate a peak irradiation angle position; a particle diameter calibration curve generation unit ( 21 ) to generate a calibration curve; and a particle diameter calculation unit ( 22 ) to calculate a particle diameter of nanoparticles of an unknown sample ( 1 ) by applying the peak irradiation angle position of the unknown sample ( 1 ) to the calibration curve.

METHOD OF ANALYSING A DRILL CORE SAMPLE

A method of analysing a subterranean drilled core sample is disclosed. The steps followed are: —a) providing a drill core sample taken from a subterranean formation; b) producing high-resolution data of at least a section of the drill core sample and creating a 3D before test skeleton of the sample using that data; c) mimic wellbore operations using reservoir conditions core floods; d) producing high-resolution data of at least a section of the drill core sample and creating a 3D after test skeleton of the sample using that data; e) identifying and/or segregating one or more formation damage mechanisms by subtracting the 3D before test skeleton from the 3D after test skeleton to create a 3D change skeleton which shows all the formation damage mechanisms ; and f) 1) identify one or more individual formation damage mechanisms , by conducting segmentation including performing one or more diagnostic analysis techniques on at least a section of the drill core sample and generating individual or combinations of simulated 3D skeletons; and 2) determining the effect of said formation damage mechanism(s) on a chosen characteristic of interest of said drill core sample 1. A method of analysing a subterranean drilled core sample , comprising:a) providing a drill core sample taken from a subterranean formation;b) producing high-resolution data of at least a section of the drill core sample and creating a 3D before test skeleton of the sample using that data;c) mimic wellbore operations using reservoir conditions core floods;d) producing high-resolution data of at least a section of the drill core sample and creating a 3D after test skeleton of the sample using that data;e) identifying and/or segregating one or more formation damage mechanisms by subtracting the 3D before test skeleton from the 3D after test skeleton to create a 3D change skeleton which shows all the formation damage mechanisms; and '2) determining the effect of said formation damage mechanism(s) on a chosen ...

Calibration Of A Small Angle X-Ray Scatterometry Based Metrology System

Methods and systems for calibrating the location of x-ray beam incidence onto a specimen in an x-ray scatterometry metrology system are described herein. The precise location of incidence of the illumination beam on the surface of the wafer is determined based on occlusion of the illumination beam by two or more occlusion elements. The center of the illumination beam is determined based on measured values of transmitted flux and a model of the interaction of the beam with each occlusion element. The position of the axis of rotation orienting a wafer over a range of angles of incidence is adjusted to align with the surface of wafer and intersect the illumination beam at the measurement location. A precise offset value between the normal angle of incidence of the illumination beam relative to the wafer surface and the zero angle of incidence as measured by the specimen positioning system is determined. 1. A metrology system comprising:an x-ray illumination source configured to generate an x-ray illumination beam;a specimen stage moveable in a first direction orthogonal to an axis of the x-ray illumination beam and a second direction orthogonal to the axis of the x-ray illumination beam;a specimen moveably attached to the specimen stage;a first occlusion element disposed on the specimen stage adjacent to a specimen, the first occlusion element having a central axis co-planar with the surface of the specimen, wherein the specimen stage in a first position locates the first occlusion element in a path of the x-ray illumination beam such that a portion of the x-ray illumination beam is occluded by the first occlusion element;a second occlusion element disposed on the specimen stage adjacent to the specimen, the second occlusion element having a central axis co-planar with the surface of the specimen and aligned in a direction different from the central axis of the first occlusion element, wherein the specimen stage in a second position locates the second occlusion element ...

X-RAY TOMOGRAPHY

An x-ray tomography system which can generate a qualitative 3D image of a region of interest using a an x-ray source, the x-ray source configured to emit x-ray radiation at the region of interest. The x-ray radiation or the x-ray source or the relative position of the x ray source configured to be moved in a two dimensional plane. An x-ray detector including a plurality of detector elements arranged in a two dimensional plane opposite the x-ray source, the x-ray detector configured to detect x-ray radiation after attenuation by the subject and provide an indication of the detected x-rays. And a processor configured to receive the indication of the detected x-rays and resolve the detected x-ray radiation into a three dimensional image. The three dimensional image is qualitative in nature. 191.-. (canceled)92. An x-ray measurement device capable of determining three dimensional x-ray images of a region of interest (ROI) in a subject , the x-ray measurement device comprising:an x-ray source, the x-ray source configured to emit x-ray radiation at the region of interest, wherein a plurality of projection images are acquired at a plurality of x-ray radiation emitting positions, the x-ray source, or the relative position of the x-ray source or x-ray radiation emitting positions, and are configured to be approximately apart by or equivalent to be approximately part by a resolution of the ROI along a z-axis as demanded by an application of the device;an x-ray detector comprising a plurality of detector elements arranged in a two dimensional plane opposite the x-ray source, the x-ray detector configured to detect x-ray radiation after attenuation by the subject and provide an indication of the detected x-rays; anda processor configured to receive the indication of the detected x-rays and resolve the detected x-ray radiation into a three dimensional (3D) image.93. The x-ray measurement device of claim 92 , wherein a relative spatial position of the x-ray source claim 92 , the ...

HIGH THROUGHPUT 3D X-RAY IMAGING SYSTEM USING A TRANSMISSION X-RAY SOURCE

A three-dimensional x-ray imaging system includes at least one detector and an x-ray source including an x-ray transmissive vacuum window. The x-ray source is configured to produce diverging x-rays emerging from the vacuum window and propagating along an x-ray propagation axis extending through a region of interest of an object to the at least one detector. The diverging x-rays have propagation paths within an angular divergence angle greater than 1 degree centered on the x-ray propagation axis. The system further includes at least one sample motion stage configured to rotate the object about a rotation axis. The system further includes a sample mount configured to hold the object and comprises a first portion in the propagation paths of at least some of the diverging x-rays and having an x-ray transmission greater than 30% for x-rays having energies greater than 50% of a maximum x-ray energy of an x-ray spectrum of the diverging x-rays. 1. A three-dimensional x-ray imaging system configured to generate a transmission image of a region of interest in an object , the system comprising:at least one position-sensitive x-ray detector comprising at least one active element;an x-ray source comprising an x-ray transmissive vacuum window having an outer surface, the x-ray source configured to produce diverging x-rays, at least some of the diverging x-rays emerging from the vacuum window and propagating along an x-ray propagation axis extending from the x-ray source, through the region of interest of the object, to the at least one active element of the at least one position-sensitive x-ray detector, the diverging x-rays having propagation paths within an angular divergence angle greater than 1 degree centered on the x-ray propagation axis, the x-ray propagation axis at a first angle with respect to the outer surface of the vacuum window, the first angle in a range of 3 degrees to 45 degrees;at least one sample motion stage configured to rotate the object about a rotation ...

EVALUATING SYSTEM PERFORMANCE WITH SPARSE PRINCIPAL COMPONENT ANALYSIS AND A TEST STATISTIC

A method for evaluating system performance can include comparing a test average of instances of variables of test system variables to a baseline average of a baseline variables. Each of the instances of the variable of the test system variables may be shifted by a shift amount for a subset of the variables. A modified test data set may be generated from the shifted test data set. The modified test data set may be transformed with a sparse principal component analysis into test components. The test components may be compared to baseline components using a Hotelling Tas a test statistic. Performance of the system may be quantified based upon the test statistic. 1. A method for evaluating system performance , the method comprising:collecting test measurements of a calibration standard with a sensor of a system;transforming, automatically with one or more processors, the test measurements into a test data set, wherein the test data set comprises instances of test system variables, and wherein each of the instances of the test system variables corresponds to the test measurements;comparing, automatically with the one or more processors, a test average of the instances of a variable of the test system variables to a baseline average of a baseline variable;determining a shift amount based upon the test average and the baseline average;shifting each of the instances of the variable of the test system variables by the shift amount to generate a modified test data set from the test data set;transforming, automatically with the one or more processors, the modified test data set with a sparse principal component analysis into test components;{'sup': '2', 'comparing, automatically with the one or more processors, the test components to baseline components using a Hotelling Ttest to generate a test statistic; and'}quantifying performance of the system based upon the test statistic.2. The method of claim 1 , comprising selecting the variable of the test system variables claim 1 , ...

Method, system and apparatus for non-destructive testing (ndt) of electrical power line systems

A system for non-destructive testing of an overhead energized electrical component. The system has a base, an X-ray source, an X-ray digital imager, and an imager controller. The system also has a removable electrically conductive flexible shield which is adapted to be operatively coupled to, and to encapsulate, at least the base, the X-ray source, the X-ray digital imager and the imager controller so as to form a shrouded system. In a use position, when the shrouded system is positioned adjacent the energized electrical component so as to non-destructively test the energized electrical component, the shield protects at least the base, the X-ray source, the X-ray digital imager and the imager controller from electric fields around the energized electrical component while allowing signal communication between at least the X-ray source and the energized electrical component.

Evaluating a contact between a wafer and an electrostatic chuck

A method, a non-transitory computer readable medium and a device. The method may include (a) introducing a voltage difference between an absolute value of a negative pole of the electrostatic chuck and an absolute value of a positive pole of the electrostatic chuck, the introducing occurs while the wafer is supported by the electrostatic chuck and is contacted by one or more conductive contact pins of the electrostatic chuck; (b) monitoring, by an electrostatic sensor that comprises a sensing element, a charge at a point of measurement located at a front side of the wafer, at different points of time that follow a start of the introducing of the voltage difference, to provide monitoring results; and (c) determining an electrical parameter of the contact between the wafer and the electrostatic chuck, based on the monitoring results.

X-Ray Seed Imaging System, Cabinet X-Ray Device, and Methods of Evaluating Seeds

A cabinet x-ray device for imaging seeds includes an x-ray source configured to transmit an x-ray beam along a beam path. A seed holder is configured to hold seeds and be selectively positioned in the x-ray device such that the beam path crosses the seed holder and the x-ray beam passes through at least some of the seeds. An x-ray detector is configured to detect the x-ray beam after passing through the seeds such that one or more x-ray images of the seeds can be formed. Self-supporting x-ray shielding can extend circumferentially around the x-ray beam to mitigate x-ray transmission outside the device. A drive mechanism can automatically move the seed holder so that discrete x-ray images of subsets of seeds are taken in an automatic seed imaging operation. Various seed evaluations and seed process evaluations can be made using the device. 1. A cabinet x-ray device for imaging seeds , the cabinet x-ray device comprising:an x-ray source configured to transmit an x-ray beam along a beam path;a seed holder configured to receive a plurality of seeds and be selectively positioned in the cabinet x-ray device such that the beam path crosses the seed holder and the x-ray beam passes through at least some of the seeds received in the seed holder; andan x-ray detector configured to detect the x-ray beam after passing through the seeds such that one or more x-ray images of the seeds can be formed based on the detected x-ray beam.2. The cabinet x-ray device as set forth in claim 1 , wherein the seed holder comprises a plurality of sample wells at spaced apart locations claim 1 , the seed holder being configured to receive a set of the seeds in each of the sample wells.3. The cabinet x-ray device as set forth in claim 2 , wherein the seed holder is movable relative to the x-ray source to a plurality of spaced apart predefined positions claim 2 , wherein at each of the predefined positions claim 2 , the beam path crosses a respective one of the plurality of sample wells such that ...

MEASUREMENT OF SMALL FEATURES USING XRF

A method for X-ray measurement includes, in a calibration phase, scanning a first X-ray beam, having a first beam profile, across a feature of interest on a calibration sample and measuring first X-ray fluorescence (XRF) emitted from the feature and from background areas of the calibration sample surrounding the feature. Responsively to the first XRF and the first beam profile, a relative emission factor is computed. In a test phase, a second X-ray beam, having a second beam profile, different from the first beam profile, is directed to impinge on the feature of interest on a test sample and second XRF emitted from the test sample is measured in response to the second X-ray beam. A property of the feature of interest on the test sample is computed by applying the relative emission factor together with the second beam profile to the measured second XRF. 1. A method for X-ray measurement , comprising:in a calibration phase, scanning a first X-ray beam, having a first beam profile, across a feature of interest on a calibration sample and measuring first X-ray fluorescence (XRF) emitted, in response to the first X-ray beam, from the feature and from background areas of the calibration sample surrounding the feature;computing, responsively to the first XRF and the first beam profile, a relative emission factor indicative of a relation of XRF emission intensities between the feature and the background areas surrounding the feature;in a test phase, directing a second X-ray beam, having a second beam profile, different from the first beam profile, to impinge on the feature of interest on a test sample and measuring second XRF emitted from the test sample in response to the second X-ray beam; andcomputing a property of the feature of interest on the test sample by applying the relative emission factor together with the second beam profile to the measured second XRF.2. The method according to claim 1 , wherein the computed property is selected from a group of properties ...

COORDINATE ALIGNMENT TOOL FOR COORDINATE MEASURING DEVICE AND MEASURING X-RAY CT APPARATUS

A coordinate alignment tool includes a base having at least two ground faces to hold an attitude suitable for measurement by a coordinate measuring device and an attitude suitable for measurement by a measuring X-ray CT apparatus, and a fixer to fixate a measured object to the base; and at least three master balls arranged on the base. 1. A coordinate alignment tool for a measuring X-ray CT apparatus and a coordinate measuring device , comprising: an attitude for measurement by the coordinate measuring device, and', 'an attitude for measurement by the measuring X-ray CT apparatus; and, 'a base having at least two ground faces to hold the base ata fixer configured to fix a measured object to the base.2. The coordinate alignment tool for the measuring X-ray CT apparatus and the coordinate measuring device according to claim 1 , wherein the attitude for measurement by the coordinate measuring device is an attitude which matches a reference plane of the coordinate measuring device and a reference plane of the measured object.3. The coordinate alignment tool for the measuring X-ray CT apparatus and the coordinate measuring device according to claim 1 , wherein the attitude for measurement by the measuring X-ray CT apparatus is an inclined attitude which facilitates obtaining an X-ray transmission image.4. The coordinate alignment tool for the measuring X-ray CT apparatus and the coordinate measuring device according to claim 1 , further comprising at least three master balls arranged on the base.5. The coordinate alignment tool for the measuring X-ray CT apparatus and the coordinate measuring device according to claim 2 , further comprising at least three master balls arranged on the base.6. The coordinate alignment tool for the measuring X-ray CT apparatus and the coordinate measuring device according to claim 3 , further comprising at least three master balls arranged on the base.7. The coordinate alignment tool for the measuring X-ray CT apparatus and the coordinate ...

X-ray inspection apparatus for inspecting semiconductor wafers

An x-ray inspection system includes an x-ray source, a sample support for supporting a sample to be inspected, where the sample support includes a support surface extending in a horizontal plane, an x-ray detector, and a sample support positioning assembly for positioning the sample support relative to the x-ray source or x-ray detector. The sample positioning assembly includes a vertical positioning mechanism for moving the sample support in a vertical direction, orthogonal to the horizontal plane, and a first horizontal positioning mechanism for moving both the sample support and the vertical positioning mechanism in a first horizontal direction. This arrangement allows for accurate movement of the sample to different imaging positions in the horizontal plane and a low power vertical positioning mechanism to be used.

CALIBRATION HARDWARE PHANTOM FOR DIFFERENTIAL PHASE CONTRAST IMAGING

A phantom body (PB) for use in a differential phase contrast imaging apparatus (IM) for calibration of same. The phantom body (PB) allows for simultaneous calibration of three different image signal channels, namely refraction, phase shift and small angle scattering. 1. A phantom body suitable for calibration of a phase contrast imaging system , the system capable of emitting an X-ray beam , the phantom body comprising:at least three mutually distinct parts configured for together causing a plurality of disturbances with respect to the X-ray beam when said X-ray beam passes through the phantom body, said plurality of disturbances including i) a phase shift, ii) an absorption and iii) a de-coherence, wherein any-one of the disturbances i), ii) and iii) is being caused by exactly one part of the at least three mutually distinct parts to a degree larger than other degrees with which said any-one of the disturbances is being caused by the respective two other parts of the at least three mutually distinct parts, and wherein at least one part of the at least three mutually distinct parts comprises at least three distinct sub-parts configured to graduate the respective degree of disturbance caused by said at least one part into three different sub-degrees.2. The phantom body according to claim 1 , wherein at least one part of the at least three mutually distinct parts is formed from one or more cuboids.3. The phantom body according to claim 1 , wherein at least one part of the at least three mutually distinct parts is formed from one or more rotation symmetric solids.4. The phantom body of any one according to claim 1 , wherein the three or more sub-parts of at least one part of the at least three mutually distinct parts are grouped together.5. The phantom body according to claim 1 , wherein the three or more sub-parts of at least one part of the at least three mutually distinct parts are interleaved with one or more sub-parts from at least another one of the two other ...