НОВЫЙ СПОСОБ ПОЛУЧЕНИЯ ТЕРИФЛУНОМИДА

Изобретение относится к способу получения (4-трифторметилфенил)-амида (Z)-2-циано-3-гидроксибут-2-еноевой кислоты формулы I (терифлуномида). Способ включает стадии a)-d). На стадии a) осуществляют превращение 5-метилизоксазол-4-карбоновой кислоты формулы V в 5-метилизоксазол-4-карбонилхлорид формулы IV с помощью хлорирующего агента. На стадии b) осуществляют реакцию соединения формулы IV с 4-(трифторметил)анилином формулы III в двухфазной среде в присутствии неорганического основания с получением N-(4'-трифторметилфенил)-5-метилизоксазол-4-карбоксамида формулы II. На стадии c) осуществляют реакцию соединения формулы II с водным гидроксидом натрия в смеси растворителей с получением (4-трифторметилфенил)-амида (Z)-2-циано-3-гидроксибут-2-еноевой кислоты формулы I, причем N-(4'-трифторметилфенил)-5-метилизоксазол-4-карбоксамид формулы II не выделяют. На стадии d) возможно осуществляют очистку соединения формулы I от смеси растворителей с получением чистого кристаллического соединения формулы ...

УСТРОЙСТВО-РЕШЕТКА ДЛЯ УСТРОЙСТВА РЕНТГЕНОВСКОЙ ВИЗУАЛИЗАЦИИ

Mesoporous materials

X-ray interferometer for phase contrast imaging

The present invention relates to an interferometer for x-rays, in particular hard x-rays, for obtaining quantitative x-ray images from an object, comprising: a) an x-ray source, preferably a standard polly chromatic x-ray source, b) a diffractive beam splitter grating other than a Bragg crystal, preferably in transmission geometry, c) a position-sensitive detector with spatially modulated detection sensitivity having a number of individual pixels; d) means for recording the images of the detector in a phase- stepping approach; and e) means for evaluating the intensities for each pixel in a series of images in order to identify the characteristic of the object for each individual pixel as an absorption dominated pixel and/or an differential phase contrast dominated pixel and/or an x-ray scattering dominated pixel.

Thiotriazole compound and its use in parasitic protozoal infections

The present invention relates to a compound of Formula (I) or tautomers thereof having pharmacological activity, processes for its preparation, pharmaceutical compositions and their use in the treatment of certain parasitic certain parasitic protozoal infections such as malaria, in particular infection by ...

CATALYST FOR HYDROGENATING AROMATIC HYDROCARBONS, AND HYDROGENATION TREATMENT METHOD IN WHICH SAME IS USED

Provided is a hydrogenation catalyst that supports a reduced amount of metal and is exceptional in regard to stability and suppressing side reactions. A catalyst for hydrogenating an aromatic hydrocarbon compound into an aliphatic cyclic hydrocarbon compound, wherein a metal in group 10 of the periodic table represented by nickel is supported on a composite carrier comprising at least alumina and titania. The composite carrier preferably includes at least that in which a substrate comprising alumina is coated with titania, and the metal in group 10 of the periodic table is preferably subjected to a preliminary hydrogen reduction treatment. If the metal in group 10 of the periodic table is nickel, the nickel is preferably contained at an amount of 5-35% by mass in terms of nickel oxide in relation to the catalyst as a whole. The substrate comprises a porous structure in which, e.g., a plurality of needle-like bodies or columnar bodies are intertwined in three dimensions.

CRYSTALLINE FORM OF THE COMPOUND (S)-3-{4-[5-(2-CYCLOPENTYL-6-METHOXY-PYRIDIN-4-YL)-[1,2,4]OXADIAZOL-3-YL]-2-ETHYL-6-METHYL-PHENOXY}-PROPANE-1,2-DIOL

The present invention relates to a crystalline form of the compound (S)-3-{4-[5-(2-cyclopentyl-6-methoxy-pyridin-4-yl)-[1,2,4]oxadiazol-3-yl]-2-ethyl-6-methyl-phenoxy}-propane-1,2-diol.

CRYSTALLINE FORM OF THE COMPOUND (S)-3-{4-[5-(2-CYCLOPENTYL-6-METHOXY-PYRIDIN-4-YL)-[1,2,4]OXADIAZOL-3-YL]-2-ETHYL-6-METHYL-PHENOXY}-PROPANE-1,2-DIOL

Abstract The present invention relates to a crystalline form of the compound (S)-3-{445-(2-cyclopentyl-6-methoxy-pyridin-4-yl)41,2 ,4]oxadiazol-3-yl]-2-ethyl-6-m ethyl-phenoxyy propane-1 ,2-diol characterized by the presence of peaks in the X-ray powder diffraction diagram at the following angles of refraction 20: 5.4 , 8.5 , and 10.8 Date Recue/Date Received 2020-09-29 ...

Röntgenstrahlenmikroskop

CRYSTALLINE FORM OF THE COMPOUND (S)-3-{4-[5-(2-CYCLOPENTYL-6-METHOXY-PYRIDIN-4-YL)-[1,2,4]OXADIAZOL-3-YL]-2-ETHYL-6-METHYL-PHENOXY}-PROPANE-1,2-DIOL

CRYSTALLINE FORM OF COMPOUND (S-) - 3 - {4 - [5 - (2 - CYCLOPENTYL - 6 - METHOXYPYRIDINE - 4 - YL) - [1, 2.4] OXADIAZOL - 3 - YL] - 2 - ETHYL - 6 - METHYLPHENOXY} PROPANE - 1, 2 - DIOL

POLYMORPHS TRIAZOLONOVOGO COMPOUNDS, INHIBITING PGES-AND-1

Method, system, and light source for penetrating radiation imaging

The present invention relates to method, system, and light source for penetrating radiation imaging, especially for X-ray imaging. The present invention provides a system for X-ray phase contrast and high resolution imaging. The system comprises: an X-ray source including a plurality of X-ray micro sources; an X-ray detector for receiving X-ray passing through the imaged object; and a computer for receiving the raw imaging data from the X-ray detector as well as for computing the raw imaging data to obtain a clear image of the imaged object.

DETECTOR ARRANGEMENT AND X-RAY TOMOGRAPHY DEVICE FOR PERFORMING PHASE-CONTRAST MEASUREMENTS AND METHOD FOR PERFORMING A PHASE-CONTRAST MEASUREMENT

The invention relates to a detector arrangement (1) for performing phase-contrast measurements, comprising at least two transducer layers (2,3) arranged one behind the other, wherein at least the first transducer layer (2) arranged in the radiation direction (8) comprises alternate sensitive areas (9) having a high absorptance for the conversion of incident radiation quanta into signals and less sensitive areas (10) having a lower absorptance in comparison thereto. Phase-contrast images can be produced in this way within a shorter recording time, using a lower X-ray dose, with the same image quality in comparison to a grid-based measurement of a produced interference pattern using a lower X-ray dose. Furthermore, a quickly detected sequence of signals enables movement artifacts to be corrected in the reconstructed image and/or changes of the scanning geometry to be recognized and corrected. The invention further relates to a corresponding X-ray tomography device (15) and a method for performing ...

X-RAY IMAGING APPARATUS

An X-ray imaging apparatus which takes an image of an object to be detected, comprises: a first grating to form a periodic bright-dark pattern by a Talbot effect, based on an X-ray from an X-ray source; a second grating, disposed at a position where the bright-dark pattern is formed, to block a part of the bright-dark pattern; a detector to detect an X-ray intensity distribution of the X-ray which passed through the second grating; and a calculator to calculate phase information of the X-ray based on the detected X-ray intensity distribution, wherein the second grating includes a first region having a first blocking pattern and a second region having a second blocking pattern, and a direction in which the first blocking pattern blocks a bright section of the bright-dark pattern is different from a direction in which the second blocking pattern blocks the bright section of the bright-dark pattern.

Chemical compounds

The specification relates to compounds of Formula (I): and pharmaceutically acceptable salts thereof, to processes and intermediates used for their preparation, pharmaceutical compositions containing them and their use in the treatment of cell proliferative disorders.

PHASE CONTRAST IMAGING APPARATUS

An x-ray imaging system includes an x-ray source, an x-ray detector including a plurality of detector strips arranged in a first direction of the x-ray detector. Each detector strip includes a plurality of detector pixels arranged in a second direction of the x-ray detector. A phase grating and a plurality of analyzer gratings including grating slits are disposed between the x-ray source and detectors. The x-ray source and the x-ray detector are adapted to perform a scanning movement in relation to an object in the first direction, in order to scan the object. Each of the plurality of analyzer gratings is arranged in association with a respective detector strip with the grating slits arranged in the second direction. The grating slits of the analyzer gratings of the detector strips are offset relative to each other in the second direction.

УСТРОЙСТВО-РЕШЕТКА ДЛЯ УСТРОЙСТВА РЕНТГЕНОВСКОЙ ВИЗУАЛИЗАЦИИ

Изобретение относится к устройству-решетке (1) для устройства рентгеновской визуализации, интерферометрическому блоку (2), системе (3) рентгеновской визуализации, способу рентгеновской визуализации, и элементу компьютерной программы для управления таким устройством, и машиночитаемому носителю, хранящему такой элемент компьютерной программы. Устройство-решетка (1) для устройства рентгеновской визуализации содержит конструкцию (10) решетки и конструкцию (20) привода. Конструкция (10) решетки содержит множество сегментов (11) решетки. Конструкция (20) привода выполнена с возможностью перемещения упомянутого множества сегментов (11) решетки с, по меньшей мере, вращательной составляющей между первым положением и вторым положением. В первом положении сегменты (11) решетки размещены на пути рентгеновского пучка (30) так, чтобы сегменты (11) решетки воздействовали на участки рентгеновского пучка (30). Во втором положении сегменты (11) решетки размещены вне участков пути рентгеновского пучка (30 ...

УСТРОЙСТВО ФОРМИРОВАНИЯ ИЗОБРАЖЕНИЙ МЕТОДОМ ФАЗОВОГО КОНТРАСТА

Изобретение относится к медицинской технике, а именно к рентгенографическим средствам формирования изображения методом фазового контраста. Система содержит рентгеновский источник, детектор с множеством детектирующих полосок, расположенных в первом направлении детектора, при этом каждая детектирующая полоска содержит множество пикселей, расположенных во втором направлении детектора, фазовую дифракционную решетку, множество дифракционных решеток анализаторов, содержащих щели. Рентгеновский источник и детектор выполнены с возможностью сканирующего перемещения относительно объекта в первом направлении. Дифракционные решетки анализатора расположены между рентгеновским источником и детектором, и каждая из множества дифракционных решеток анализатора расположена в связи с соответствующей детектирующей полоской, с щелями дифракционных решеток, расположенными во втором направлении. Щели дифракционных решеток детектирующих полосок смещены одна относительно другой во втором направлении. Использование ...

РЕЖУЩИЙ ИНСТРУМЕНТ С CVD-ПОКРЫТИЕМ СО СЛОЕМ k-Al2O3 ТЕКСТУРЫ { 0 0 1}

Изобретение относится к режущему инструменту с полученным химическим осаждением из паровой фазы (CVD) покрытием. Упомянутый режущий инструмент содержит подложку из цементированного карбида, или кермета, или керамики, или cBN и покрытие, которое содержит по меньшей мере один слой κ-AlOтолщиной 1-20 мкм, в котором полученная дифрагированным рентгеновским излучением χ-сканограмма распределения интенсивности по оси χ по углу сканирования от -80° до 80° по отражению от кристаллографической плоскости (0 0 6) упомянутого слоя κ-AlOимеет наибольший пик интенсивности дифракции с центром 0° и полную ширину на половине максимума (FWHM), составляющую <25°. Обеспечивается режущий инструмент с покрытием со слоем κ-AlO, который имеет улучшенные режущие свойства при токарной обработке, фрезеровке и/или сверлении, а также улучшенную стойкость к язвенному износу при токарной обработке и фрезеровке стали. 13 з.п. ф-лы, 7 ил., 11 табл., 4 пр.

Polymorphs of a PGES-1 inhibiting triazolone compound

The present application relates to solid state forms of a triazolone compound which exhibit mPGES-1 enzyme inhibition activity, specifically ...

PREPARATION METHOD OF CRYSTALLINE FORM A OF PCI-3276

A preparation method of a PCI-32765 crystal form A. The preparation method comprises the following steps: 1) dissolving free alkali solid of PCI-32765 into a positive solvent; 2) adding a solution in the step 1) in an anti solvent dropwise, stirring after dropwise adding is completed, and adding a crystal seed of the PCI-32765 crystal form A, or adding the solution in the step 1) in suspension liquid containing the crystal seed of the PCI-32765 crystal form A; 3) controlling a solution system obtained in the step 2) to continuously stir, and ageing to obtain crystal magma; and 4) filtering, washing and drying the crystal magma to obtain powder of the PCI-32765 crystal form A. The preparation method has the characteristics of simpleness in process operation, stable and controllable process, high yield, environmental protection, good impurity removing capacity and suitability for industrial production. In addition, the prepared crystal form A can be stably stored, and the hygroscopicity and ...

X-RAY STRESS MEASURING APPARATUS

An X-ray stress measuring apparatus, for measuring stress on a sample, comprises: a pair of X-ray generating means (10, 11, 10' , 11' ) for irradiating X-ray beams, determining an angle defined between the X-ray beams, mutually, at an arbitrary fixed angle, on a plane inclining by an angle desired with respect to a surface of the sample to be measured stress thereon; an X-ray sensor portion (29) for detecting plural numbers of Debye rings (C, C' ) , which are generated by incident X-ray beams from said pair of X-ray generating means; and a battery (410) for supplying necessary electricity to each of parts of the apparatus, wherein said X-ray sensor portion is made up with only one (1) piece of a 2-dimensional X-ray detector (20) or a 1-dimensional X-ray detector (20' ) , and is disposed in a position where the plural numbers of Debye rings generated by the incident X-ray beams from the at least one pair of X-ray generating means are adjacent to each other, or intersect with each other, ...

비파괴 검사 장치

... 본 발명은, 이동하는 피검체에 대하여 정밀한 비파괴 검사를 행할 수 있는 기술을 제공하는 것이다. 방사선원(1)은 격자 G0 내지 G2를 향해서 방사선을 방사한다. 각 격자 G0 내지 G2는, 복수의 격자 부재를 구비한다. 방사선 검출기(3)는 복수의 격자 부재로 회절된 방사선을 검출한다. 복수의 격자 부재는, 제1 내지 제3 부분 영역(71 내지 73)을 통과한 방사선에 의해 각각 형성되는 무아레 모양 화상이, 무아레 모양 화상 상호 간의 위상차를 갖도록, 미리 정해진 위상차를 갖고 배치되어 있다.

2-(3-에탄술포닐피리딘-2-일)-5-(트리플루오로메탄술포닐)벤즈옥사졸의 결정

... 2-(3-에탄술포닐피리딘-2-일)-5-(트리플루오로메탄술포닐)벤즈옥사졸의, Cu-Kα 선을 이용한 분말 X-선 회절에 있어서 2θ = 14.0 ± 0.2°, 14.3 ± 0.2°, 16.5 ± 0.2°, 16.9 ± 0.2°, 17.6 ± 0.2°, 18.8 ± 0.2°, 19.9 ± 0.2°, 및 22.3 ± 0.2°에서 회절 피크를 갖는 2형 결정은 안정한 결정이다.

X-RAY IMAGING DEVICE AND X-RAY IMAGING METHOD

Desulfurization catalyst for hydrocarbon oils, its preparation, and use thereof

Disclosed is a desulfurization catalyst for hydrocarbon oils, comprising a support and at least one metal promoter selected from the group consisting of cobalt, nickel, iron and manganese, the support comprising at least one metal oxide selected from the group consisting of oxides of Group IIB, Group VB and Group VIB metals and a refractory inorganic oxide, wherein the support further comprises at least about 5% by weight of vanadium carbide, based on the total weight of the desulfurization catalyst for hydrocarbon oils. The desulfurization catalyst for hydrocarbon oils shows a good stability, a high desulfurization activity, an excellent abrasion resistance, and a long service life. Also disclosed is a process for preparing the desulfurization catalyst for hydrocarbon oils, and use of the catalyst in the desulfurization of sulfur-containing hydrocarbon oils.

Preparation method of crystalline form a of PCI-32765

A preparation method of PCI-32765 crystalline form A, which comprises the following steps: 1) dissolving free base of PCI-32765 in a good solvent; 2) the solution prepared by Step 1) is dropwise added into an anti-solvent, stirred and added seed crystal of PCI-32765 Form A; Or the solution prepared by Step 1) is dropwise added into the suspension containing seed crystal of PCI-32765 Form A; 3) solution obtained by step 2) is continuously stirred and aged until crystal transformation is completed, then the crystal slurry is obtained; 4) crystal slurry in step 3) is filtered, washed, and dried to obtain the powder of PCI-32765 Form A. The preparation method of crystalline Form A provided by the present disclosure is a simple process and can be easily controlled, scaled up stably and conducted reliably. The process has high yield, good impurity removing capacity and is environmentally friendly. In addition, Form A provided by the present disclosure can be stably stored, and the hygroscopicity ...

X-ray Phase Imaging Apparatus

This X-ray phase imaging apparatus () includes a controller () that generates a dark field image (Iv) with respect to each of a plurality of relative positions between a subject (S) and an imaging grating (G) changed by an adjustment mechanism () to acquire a contrast of a region of interest (ROI) in the dark field image (Iv), and controls the adjustment mechanism () to adjust a relative position between the subject (S) and the imaging grating (G) based on the acquired contrast. 1. An X-ray phase imaging apparatus comprising:an X-ray source that radiates X-rays to a subject;an imaging grating that generates a grating image by transmitting the X-rays radiated to the subject from the X-ray source;a detector that detects the X-rays that have been transmitted through the imaging grating;an adjustment mechanism that changes and adjusts a relative position between the subject and the imaging grating; anda controller that generates a dark field image representing a change in X-ray sharpness between a case in which the subject is present and a case in which the subject is not present based on signals of the X-rays detected by the detector with respect to each of a plurality of relative positions between the subject and the imaging grating changed by the adjustment mechanism to acquire a contrast of a region of interest in the dark field image, and controls the adjustment mechanism to adjust the relative position between the subject and the imaging grating based on the acquired contrast.2. The X-ray phase imaging apparatus according to claim 1 , wherein the controller controls the adjustment mechanism to adjust the relative position between the subject and the imaging grating so as to correspond to the dark field image in which the contrast of the region of interest is relatively high.3. The X-ray phase imaging apparatus according to claim 1 , wherein the controller causes a position of the region of interest to follow a change in the relative position between the subject ...

Omnidirectional scattering- and bidirectional phase-sensitivity with single shot grating interferometry

X-ray scattering imaging can provide complementary information about the unresolved microstructures of a sample. The scattering signal can be accessed with various methods based on coherent illumination, which span from self-imaging to speckle scanning. The directional sensitivity of the existing methods is limited to a few directions on the imaging plane and it requires the scanning of the optical components, or the rotation of either the sample or the imaging setup, if the full range of possible scattering directions is desired. A new arrangement is provided that allows the simultaneous acquisition of the scattering images in all possible directions in a single shot. This is achieved by a specialized phase grating and a device for recording the generated interference fringe with sufficient spatial resolution. The technique decouples the sample dark-field signal with the sample orientation, which can be crucial for medical and industrial applications.

X-RAY IMAGING

УСТРОЙСТВО ФОРМИРОВАНИЯ РЕНТГЕНОВСКИХ ИЗОБРАЖЕНИЙ И СПОСОБ ФОРМИРОВАНИЯ РЕНТГЕНОВСКИХ ИЗОБРАЖЕНИЙ

Использование: для формирования рентгеновских изображений. Сущность изобретения заключается в том, что устройство формирования рентгеновских изображений согласно настоящему изобретению включает фазовую решетку 130, поглощательную решетку 150, детектор 170 и арифметический блок 180. Арифметический блок 180 выполняет этап преобразования Фурье выполнения преобразования Фурье для распределения интенсивности Муара, полученного детектором, и получения спектра пространственных частот. Также арифметический блок 180 выполняет этап восстановления фазы отделения спектра, соответствующего несущей частоте, от спектра пространственных частот, полученного на этапе преобразования Фурье, выполнения обратного преобразования Фурье для отделенного спектра, и получения дифференциального фазового изображения. Технический результат: обеспечение возможности получения дифференциального фазового изображения или фазового изображения объекта посредством по меньшей мере одной операции формирования изображений. 11 з.п ...

КАТАЛИЗАТОР ГИДРИРОВАНИЯ АРОМАТИЧЕСКИХ УГЛЕВОДОРОДОВ И ИСПОЛЬЗУЮЩИЙ ЕГО СПОСОБ ОБРАБОТКИ ПУТЕМ ГИДРИРОВАНИЯ

Изобретение относится к катализатору гидрирования, который гидрирует ароматическое углеводородное соединение в алициклическое углеводородное соединение, и в котором металл группы 10 нанесен на композиционный носитель, включающий, по меньшей мере, оксид алюминия и диоксид титана, где содержание металла группы 10 составляет 5-35% масс. относительно общей массы композиционного носителя и соединения металла группы 10 в пересчете на его оксид, и где композиционный носитель включает, по меньшей мере, подложку из оксида алюминия, покрытого диоксидом титана, и повторяющееся расстояние в плоскости кристаллической решетки диоксида титана на поверхности подложки составляет 50 Å или менее. Также раскрыт способ гидрообработки с использованием указанного катализатора гидрирования для гидрирования ароматического углеводорода в алициклическое углеводородное соединение. Технический результат – создание катализатора гидрирования ароматического углеводородного соединения в алициклическое углеводородное соединение ...

ФОРМИРОВАНИЕ ДИФФЕРЕНЦИАЛЬНЫХ ФАЗОВО-КОНТРАСТНЫХ ИЗОБРАЖЕНИЙ

... 1. Дифракционная решетка (14, 15) для формирования рентгеновских дифференциальных фазово-контрастных изображений, содержащая первую подобласть (23) с- по меньшей мере, одним участком (24) первой решеточной структуры (26); и- по меньшей мере, одним участком (28) второй решеточной структуры (30);при этом первая решеточная структура содержит множество полос (34) и промежутков (36) с первой решеточной ориентацией G(37), которые расположены периодически; при этом полосы расположены так, что они изменяют фазу и/или амплитуду рентгеновского излучения и при этом промежутки являются прозрачными для рентгеновских лучей;при этом вторая решеточная структура содержит множество полос (40) и промежутков (42) со второй решеточной ориентацией G(44), которые расположены периодически; при этом полосы расположены так, что они изменяют фазу и/или амплитуду рентгеновского излучения и при этом промежутки являются прозрачными для рентгеновских лучей; ипри этом первая решеточная ориентация Gотличается от второй ...

ПОРОШКОВЫЕ КОМПОЗИЦИИ КОМПЛЕКСА МЕТАЛЛА И КИСЛОТЫ С ВЫСОКИМ СОДЕРЖАНИЕМ СЕРАОРГАНИЧЕСКИХ СОЕДИНЕНИЙ И СПОСОБ ИХ ПОЛУЧЕНИЯ

УСТРОЙСТВО ФОРМИРОВАНИЯ ИЗОБРАЖЕНИЙ МЕТОДОМ ФАЗОВОГО КОНТРАСТА

... 1. Рентгенографическая система (101), содержащая:рентгеновский источник (104);рентгеновский детектор (105), содержащий множество детектирующих полосок (105a), расположенных в первом направлении рентгеновского детектора (105), при этом каждая детектирующая полоска (105a) дополнительно содержит множество пикселей (105p) детектора (105), расположенных во втором направлении рентгеновского детектора (105);фазовую дифракционную решетку (161); имножество дифракционных решеток (162) анализаторов, содержащих щели дифракционных решеток;отличающаяся тем, чторентгеновский источник (104) и рентгеновский детектор (105) выполнены с возможностью выполнения сканирующего перемещения относительно объекта (108) в первом направлении, чтобы сканировать объект;причем дифракционные решетки (162) анализаторов расположены между рентгеновским источником (104) и рентгеновским детектором (105), причем каждая из множества дифракционных решеток (162) анализаторов расположена в связи с соответствующей детектирующей полоской ...

Phasenkontrast-Röntgen-Tomographiegerät

Ein Phasenkonstrast-Röntgen-Tomographiegerät hat eine Elektronenkanone (44) mit nachgeordneter Ablenkspule (52). Der Röntgenstrahl (56) wird durch die Ablenkspule (54) auf einer kreisförmigen Bahn über ein Target (58) geführt, welches geringfügig gegenüber einer senkrecht auf der Geräteachse stehenden Ebene geneigt ist. Der beim Brennfleck F des Elektronenstrahls (56) erzeugte Röntgenstrahl (62) durchquert ein Objekt (70) und gelangt über ein Phasengitter (64) und ein Amplitudengitter (66) auf eine Detektorzeile (68).

Co-crystals of a Bruton's tyrosine kinase inhibitor

Disclosed are co-crystals of the Bruton's tyrosine kinase (Btk) inhibitor 1-((R)-3-(4-amino-3-(4-phenoxyphenyl)-1H-pyrazolo[3,4-d]pyrimidin-1-yl)piperidin-1-yl)prop-2-en-1-one, including crystalline forms, and pharmaceutically acceptable salts thereof. Also disclosed are pharmaceutical compositions that include the co-crystals, as well as methods of using co-crystals, alone or in combination with other therapeutic agents, for the treatment of autoimmune diseases or conditions, heteroimmune diseases or conditions, cancer, including lymphoma, and inflammatory diseases or conditions.

Preparation method of PCI-32765 crystal form A

A preparation method of a PCI-32765 crystal form A. The preparation method comprises the following steps: 1) dissolving free alkali solid of PCI-32765 into a positive solvent; 2) adding a solution in the step 1) in an anti solvent dropwise, stirring after dropwise adding is completed, and adding a crystal seed of the PCI-32765 crystal form A, or adding the solution in the step 1) in suspension liquid containing the crystal seed of the PCI-32765 crystal form A; 3) controlling a solution system obtained in the step 2) to continuously stir, and ageing to obtain crystal magma; and 4) filtering, washing and drying the crystal magma to obtain powder of the PCI-32765 crystal form A. The preparation method has the characteristics of simpleness in process operation, stable and controllable process, high yield, environmental protection, good impurity removing capacity and suitability for industrial production. In addition, the prepared crystal form A can be stably stored, and the hygroscopicity and ...

DIFFERENTIAL PHASE CONTRAST X-RAY IMAGING SYSTEM AND COMPONENTS

A differential phase contrast X-ray imaging system includes an X-ray illumination system, a beam splitter arranged in an optical path of the X-ray illumination system, and a detection system arranged in an optical path to detect X-rays after passing through the beam splitter.

X-RAY INTERFEROMETER FOR PHASE CONTRAST IMAGING

An interferometer for x-rays, in particular hard x-rays, for obtaining quantitative x-ray images from an object, includes: a) an x-ray source, preferably a standard polychromatic x-ray source, b) a diffractive beam splitter grating other than a Bragg crystal, preferably in transmission geometry, c) a position-sensitive detector with spatially modulated detection sensitivity having a number of individual pixels; d) means for recording the images of the detector in a phase-stepping approach; and e) means for evaluating the intensities for each pixel in a series of images in order to identify the characteristic of the object for each individual pixel as an absorption dominated pixel and/or an differential phase contrast dominated pixel and/or an x-ray scattering dominated pixel.

X-ray microscope

X-RAY DARK-FIELD IMAGING SYSTEM AND METHOD

An X-ray imaging system includes an X-ray source, two absorption gratings G1 and G2, an X-ray detector, a controller and a data processing unit. An X-ray imaging method, in which a detected object is X-ray dark-field CT imaged by utilizing the X-ray imaging system, includes that the X-ray is emitted toward the detected object; one of said two absorption gratings G1 and G2 is driven to perform phase step movement in the range of at least one period; the detector receives the X-ray and transforms it into the electric signal during each phase step process; the X-ray light intensity at each pixel on the detector is represented as a light intensity curve after at least one period of phase step; the secondary moment of the scattering angle distribution of each pixel is calculated and acquired according to the contrast between the light intensity curve at each pixel on the detector and the light intensity curve obtained in the absence of the detected object; and the object is imaged at different ...

Talbot imaging apparatus

A Talbot imaging apparatus includes a radiation source, a plurality of gratings, a capturing control unit, a radiation detector, a setting unit and an irradiation control unit. The radiation source irradiates radiation. The capturing control unit relatively shifts the plurality of gratings and performs control of capturing a plurality of Moire images of a subject to generate a reconstructed image. The radiation detector acquires a captured Moire image. The setting unit sets a capturing condition for capturing a second and further Moire images by making a capturing result of a first Moire image be a reference, or sets a capturing condition for the plurality of Moire images by making another Moire image captured before capturing the plurality of Moire images be a reference. The irradiation control unit controls irradiation of radiation from the radiation source based on the capturing condition set by the setting unit.

A SYSTEM AND METHOD FOR DIFFRACTION-BASED STRUCTURE DETERMINATION WITH SIMULTANEOUS PROCESSING MODULES

ПОРОШКОВЫЕ КОМПОЗИЦИИ КОМПЛЕКСА МЕТАЛЛА И КИСЛОТЫ С ВЫСОКИМ СОДЕРЖАНИЕМ СЕРАОРГАНИЧЕСКИХ СОЕДИНЕНИЙ И СПОСОБ ИХ ПОЛУЧЕНИЯ

Предложена частица для применения в кормах для животных, содержащая: ядро, состоящее в основном из соли следующей формулы (I): (A)M, в которой Aозначает анион, выбранный из группы, состоящей из 2-гидрокси-4-метилтиобутаноата, метионината и цистеината, M означает двухвалентный кальций, причем n равно 2, и слой, содержащий соединение B, выбранное из 2-гидрокси-4-метилтиобутановой кислоты (HMTBA) ее солей, их комплексов и их смесей, причем указанный слой покрывает указанное ядро и массовая доля указанного соединения B в процентах составляет, в расчете на соль формулы (I) в ядре, от примерно 10% до примерно 40%, причем указанное соединение B не находится или находится не только в виде соли формулы (I) и причем содержание сераорганических соединений (TOS) в указанной частице превышает 87 мас.%, в частности выше 88, 89 или 90 мас.%, в расчете на полную массу указанной частицы. Также предложена порошковая композиция для применения в кормах для животных, состоящая из или содержащая частицы, которые ...

Катализатор для обессеривания жидких нефтепродуктов, его получение и применение

Раскрыт катализатор для обессеривания жидких нефтепродуктов, содержащий носитель и по меньшей мере один металлический промотор, выбранный из группы, состоящей из кобальта, никеля, железа и марганца, причем носитель содержит по меньшей мере один оксид металла, выбранный из группы, состоящей из оксидов группы IIB, группы VB и группы VIB металлов, и огнеупорный неорганический оксид, в котором носитель дополнительно содержит по меньшей мере около 5 мас.% карбида ванадия, в пересчете на общую массу катализатора, используемого для обессеривания нефтепродуктов. Катализатор для обессеривания жидких нефтепродуктов демонстрирует хорошую стабильность, высокую активность при обессеривании, отличную стойкость к истиранию и длительный срок службы. Также раскрыт способ получения катализатора для обессеривания жидких нефтепродуктов и использование катализатора при обессеривании серосодержащих нефтепродуктов. 4 н. и 15 з.п. ф-лы, 2 ил., 4 табл., 19 пр.

X-RAY IMAGING SYSTEM AND IMAGING METHOD

CRYSTALLINE FORM OF LORLATINIB FREE BASE

This invention relates to a crystalline form of (10R)-7-amino-12-fluoro-2,10,16-trimethyl-15-oxo-10,15,16,17-tetrahydro-2H-8,4-(metheno)pyrazolo[4,3-h][2,5,11]benzoxadiazacyclo-tetradecine-3-carbonitrile (lorlatinib) free base (Form 7). This invention also relates to pharmaceutical compositions comprising Form 7.

SOLVATED FORMS OF A BRUTON'S TYROSINE KINASE INHIBITOR

Described herein are solvates of the Bruton's tyrosine kinase (Btk) inhibitor l-((R)-3-(4-amino- 3 -(4-phenoxyphenyl)- lH-pyrazolo[3,4-d]pyrimidin- 1 -yl)piperidin- 1 -yl)prop-2-en- 1 -one, including crystalline forms, and pharmaceutically acceptable salts thereof. Also disclosed are pharmaceutical compositions that include the solvates, as well as methods of using the solvates, alone or in combination with other therapeutic agents, for the treatment of autoimmune diseases or conditions, heteroimmune diseases or conditions, cancer, including lymphoma, and inflammatory diseases or conditions.

CATALYST FOR HYDROGENATING AROMATIC HYDROCARBONS, AND HYDROGENATION TREATMENT METHOD IN WHICH SAME IS USED

Provided is a hydrogenation catalyst that supports a reduced amount of metal and is exceptional in regard to stability and suppressing side reactions. A catalyst for hydrogenating an aromatic hydrocarbon compound into an aliphatic cyclic hydrocarbon compound, wherein a metal in group 10 of the periodic table represented by nickel is supported on a composite carrier comprising at least alumina and titania. The composite carrier preferably includes at least that in which a substrate comprising alumina is coated with titania, and the metal in group 10 of the periodic table is preferably subjected to a preliminary hydrogen reduction treatment. If the metal in group 10 of the periodic table is nickel, the nickel is preferably contained at an amount of 5-35% by mass in terms of nickel oxide in relation to the catalyst as a whole. The substrate comprises a porous structure in which, e.g., a plurality of needle-like bodies or columnar bodies are intertwined in three dimensions.

DIFFERENTIAL PHASE CONTRAST X-RAY IMAGING SYSTEM AND COMPONENTS

A differential phase contrast X-ray imaging system includes an X-ray illumination system, a beam splitter arranged in an optical path of the X-ray illumination system, and a detection system arranged in an optical path to detect X-rays after passing through the beam splitter.

Correction in slit-scanning phase contrast imaging

SOLVATED FORMS OF A BRUTON'S TYROSINE KINASE INHIBITOR

Cathode active material for lithium secondary battery, manufacturing method therefor, and lithium secondary battery including same

Combined in-situ detection system and method for component and structure of energy storage material

방사선 화상 생성 장치

... 강도 분포 화상(10)의 제1 관심 영역(101)에 있어서의 제1 ROI 화소값과, 제2 관심 영역(102)에 있어서의 제2 ROI 화소값을 취득한다. 제1 및 제2 관심 영역 중 한쪽은, 다른 쪽에 대하여, 강도 분포 화상 중 강도 변조의 주기에 있어서, π/2의 위상차로 되는 위치 또는 그 근방에 설정되고 있다. 계속해서, 제1 및 제2 ROI 화소값을, 강도 분포 화상마다 플롯하여 얻어지는 타원 궤적을 결정한다. 계속해서, 타원 궤적을 소정 각도마다 분할하여 얻어지는 적어도 k개의 각도 영역에 대응하는 강도 분포 화상을 사용하여, k매의 각도 영역 화상을 취득한다. 계속해서, k매의 각도 영역 화상을 사용하여, 방사선 화상을 생성한다. 여기에서 k는 3 이상의 정수이다.

CVD COATED CUTTING TOOL WITH TEXTURED k-Al2O3 LAYER

The present disclosure relates to a coated cutting tool having a substrate and a coating, wherein the coating includes at least one layer of κ-AlOwith a thickness of 1-20 μm deposited by chemical vapour deposition (CVD). A χ-scan from −80° to 80° over the (0 0 6) reflection of the κ-AlOlayer shows the strongest peak centered around 0° and the full width half maximum (FWHM) of the peak is <25°. 1. A coated cutting tool comprising a substrate and a coating , wherein the coating comprises at least one layer of κ-AlOwith a thickness of 1-20 μm deposited by chemical vapor deposition , wherein a χ-scan from −80° to 80° over a (0 0 6) reflection of said κ-AlOlayer shows the strongest peak centered around 0° and wherein a FWHM of said peak is <25°.2. The coated cutting tool in accordance with claim 1 , wherein the strongest peak from the κ-AlOlayer in an X-ray diffractogram from 15° to 140° is a (0 0 2) reflection.3. The coated cutting tool in accordance with claim 2 , wherein the second strongest peak from the κ-AlOlayer in an X-ray diffractogram from 15° to 140° is a (0 0 4) reflection.4. The coated cutting tool in accordance with claim 3 , wherein the third strongest peak from the κ-AlOlayer in an X-ray diffractogram from 15° to 140° is the (0 0 6) reflection.5. The coated cutting tool in accordance with claim 1 , wherein an average thickness of the κ-AlOlayer is 2-10 μm.6. The coated cutting tool in accordance with claim 1 , wherein the coating further comprises an α-AlOlayer.7. The coated cutting tool in accordance with claim 6 , wherein said α-AlOlayer is located between said κ-AlOlayer and the substrate.8. The coated cutting tool in accordance with claim 1 , wherein the thickness of said α-AlOlayer is 0.5-2 μm or 0.7-1 μm.9. The coated cutting tool in accordance with claim 1 , wherein the coating further comprises one or more layers of TiN claim 1 , TiCN claim 1 , TiC claim 1 , TiCO claim 1 , TiAlCO and TiCNO.10. The coated cutting tool in accordance with claim 1 , ...

IDENTIFYING SWEET SPOTS IN UNCONVENTIONAL HYDROCARBON RESERVOIRS

Techniques for identifying sweet spots in unconventional hydrocarbon reservoirs are described. A rock sample is obtained from an unconventional hydrocarbon reservoir. The rock sample is evaluated using multiple rock sample evaluation techniques. A Young's modulus and a Poisson's ratio are determined for the rock sample. Geo-mechanical properties of the rock sample are determined based on results of evaluating the rock sample using the multiple rock sample evaluation techniques, the Young's modulus and the Poisson's ratio. One or more sweet spots for production in the unconventional hydrocarbon reservoir are identified based, in part, on the geo-mechanical properties of the rock sample ...

Differential phase contrast X-ray imaging system and components

A differential phase contrast X-ray imaging system includes an X-ray illumination system, a beam splitter arranged in an optical path of the X-ray illumination system, and a detection system arranged in an optical path to detect X-rays after passing through the beam splitter.

位相画像を再構成する方法、コンピュータプログラム、位相画像を再構成する演算装置

ФОРМИРОВАНИЕ ДИФФЕРЕНЦИАЛЬНЫХ ФАЗОВО-КОНТРАСТНЫХ ИЗОБРАЖЕНИЙ

Использование: для формирования дифференциальных фазово-контрастных изображений. Сущность изобретения заключается в том, что дифракционная решетка для формирования рентгеновских дифференциальных фазово-контрастных изображений снабжена первой подобластью, содержащей по меньшей мере один участок первой решеточной структуры и по меньшей мере один участок второй решеточной структуры. Первая решеточная структура содержит множество полос и промежутков с первой решеточной ориентацией G, которые расположены периодически, при этом полосы расположены так, что они изменяют фазу и/или амплитуду рентгеновского излучения, и при этом промежутки являются прозрачными для рентгеновских лучей. Вторая решеточная структура содержит множество полос и промежутков со второй решеточной ориентацией G, которые расположены периодически, при этом полосы расположены так, что они изменяют фазу и/или амплитуду рентгеновского излучения, и при этом промежутки являются прозрачными для рентгеновских лучей. Первая решеточная ...

НОВЫЙ СПОСОБ ПОЛУЧЕНИЯ ТЕРИФЛУНОМИДА

УСТРОЙСТВО ФОРМИРОВАНИЯ РЕНТГЕНОВСКИХ ИЗОБРАЖЕНИЙ И СПОСОБ ФОРМИРОВАНИЯ РЕНТГЕНОВСКИХ ИЗОБРАЖЕНИЙ

... 1. Устройство формирования рентгеновских изображений для формирования изображения объекта, содержащее:фазовую решетку, которая пропускает рентгеновские лучи из источника рентгеновского излучения для формирования распределения интенсивности интерференции посредством эффекта Талбота;поглощательную решетку, которая частично заслоняет распределение интенсивности интерференции, сформированное фазовой решеткой, для формирования муара;детектор, который обнаруживает распределение интенсивности муара, сформированного поглощательной решеткой; иарифметический блок, который вычисляет дифференциальное фазовое изображение объекта путем выполнения преобразования Фурье для распределения интенсивности муара, обнаруженного детектором.2. Устройство формирования рентгеновских изображений по п.1,в котором фазовая решетка включает в себя участки опережения по фазе и участки отставания по фазе,в котором участки опережения по фазе и участки отставания по фазе расположены двумерно,в котором поглощательная решетка ...

СПОСОБ ПОЛУЧЕНИЯ ИЗОБРАЖЕНИЯ ОБЪЕКТА С ПОМОЩЬЮ ПРОНИКАЮЩЕГО ИЗЛУЧЕНИЯ И УСТРОЙСТВО ДЛЯ ЕГО ОСУЩЕСТВЛЕНИЯ

Изобретение относится к способу неразрушающего контроля объектов с помощью проникающего излучения путем получения изображения объекта 2 на детекторе 5, передаваемого потоком проникающего излучения с высоким пространственным разрешением за счет фокусирования излучения с использованием угловой селективности интерференционного отражения излучения под углами Брегга от регулярной системы рассеивающих поверхностей. При этом передача изображения возможна с изменением масштаба по одному или двум направлениям за счет использования асимметричного отражения от кристаллических плоскостей.

ЮСТИРОВКА РАССТОЯНИЯ ОТ РЕШЕТКИ ИСТОЧНИКА ДО ФАЗОВОЙ РЕШЕТКИ ДЛЯ ФАЗОВОЙ НАСТРОЙКИ В НЕСКОЛЬКО ПОРЯДКОВ ПРИ ДИФФЕРЕНЦИАЛЬНОЙ ФАЗОВО-КОНТРАСТНОЙ ВИЗУАЛИЗАЦИИ

... 1. Система (10) рентгеновской визуализации для дифференциальной фазово-контрастной визуализации, включающая в себя- дифференциальную фазово-контрастную установку (12) c:- источником (14) рентгеновского излучения и детектором (16) рентгеновского излучения;- компоновку (18) решеток, содержащую решетку (20) источника, фазовую решетку (22) и решетку (24) анализатора, в которой решетка источника расположена между источником рентгеновского излучения и фазовой решеткой, а решетка анализатора расположена между фазовой решеткой и детектором; и- компоновку передвижения для относительного передвижения между исследуемым объектом и, по меньшей мере, одной из решеток узла решеток;- блок (32) обработки; и- компоновку (34) перемещения для перемещения решетки источника;в которой фазовая решетка, решетка анализатора и детектор предоставляются в виде неподвижно закрепленного блока (36) интерферометра, в котором фазовая решетка и решетка анализатора установлены параллельно друг другу;в которой решетка источника ...

Vorrichtung und Röntgenphasenkontrastbildgebungseinrichtung mit einem gebogenen Interferenzgitter sowie Verfahren zur Biegung eines Interferenzgitters für eine interferometrische Röntgenbildgebung

Die Erfindung gibt eine Vorrichtung (1) für eine interferometrische Röntgenbildgebung mit einem Interferenzgitter (2) und einer rahmenartigen Halteeinrichtung (3) an, wobei das Interferenzgitter (2) blattfederartig biegbar ausgebildet ist und in gegenüberliegenden Lagerungsmitteln (4) der Halteeinrichtung (3) derart angeordnet ist, dass das Interferenzgitter (2) eindimensional konkav oder eindimensional konvex gekrümmt ist. Dadurch kann das Interferenzgitter (2) einfach und reversibel gekrümmt werden. Die Erfindung gibt auch eine Röntgenphasenkontrastbildgebungseinrichtung und ein Verfahren zur Biegung eines Interferenzgitters für eine interferometrische Röntgenbildgebung an.

X-ray imaging

Crystalline form of lorlatinib free base

This invention relates to acrystalline form of (10 ...

THIOTRIAZOLE COMPOUND AND ITS USE IN PARASITIC PROTOZOAL INFECTIONS

The present invention relates to a compound of Formula (I) or tautomers thereof having pharmacological activity, processes for its preparation, pharmaceutical compositions and their use in the treatment of certain parasitic certain parasitic protozoal infections such as malaria, in particular infection by Plasmodium falciparum. (R)-2-((3-(3,5-dichloropyridin-4-yl)-1H-1,2,4-triazol-5-yl)thio)-1-(1H-indol-3-yl)propan-1-one ...

POLYMORPHS OF A PGES-1 INHIBITING TRIAZOLONE COMPOUND

The present application relates to solid state forms of a triazolone compound which exhibit mPGES-1 enzyme inhibition activity, specifically N-(4-chloro-3-(5-oxo-1-(4-(trifluoromethyl)phenyl)-4,5-dihydro-1H-1,2,4-triazol-3-yl)benzyl) pivalamide (Compound of formula II), and process for preparation thereof.

CVD coated cutting tool with {0 0 1} textured-Ai2O3 layer

POWDER COMPOSITIONS OF A COMPLEX BETWEEN AN ACID AND A METAL WITH A HIGH CONTENT OF ORGANIC SULFUR COMPOUNDS AND METHOD FOR PREPARING SAME

POWDER COMPOSITIONS OF A COMPLEX BETWEEN AN ACID AND A METAL HIGH ORGANIC SULFUR COMPOUNDS AND PROCESS FOR THEIR PREPARATION

La présente invention a pour objet des compositions pulvérulentes d'un complexe entre un acide et un métal, à haute teneur en composés organiques soufrés, et leur procédé de préparation.

X-RAY IMAGING APPARATUS AND CONTROL METHOD FOR THE SAME

ЮСТИРОВКА РАССТОЯНИЯ ОТ РЕШЕТКИ ИСТОЧНИКА ДО ФАЗОВОЙ РЕШЕТКИ ДЛЯ ФАЗОВОЙ НАСТРОЙКИ В НЕСКОЛЬКО ПОРЯДКОВ ПРИ ДИФФЕРЕНЦИАЛЬНОЙ ФАЗОВО-КОНТРАСТНОЙ ВИЗУАЛИЗАЦИИ

Группа изобретений относится к медицинской технике, а именно к средствам рентгеновской визуализации для дифференциальной фазово-контрастной визуализации. Система включает дифференциальную фазово-контрастную установку с источником рентгеновского излучения и детектором, компоновку решеток, содержащую решетку источника, фазовую решетку и решетку анализатора, в которой решетка источника расположена между источником рентгеновского излучения и фазовой решеткой, а решетка анализатора расположена между фазовой решеткой и детектором, и компоновку передвижения для относительного передвижения между исследуемым объектом и по меньшей мере одной из решеток, блок обработки и компоновку перемещения решетки источника. Фазовая решетка, решетка анализатора и детектор предоставлены в виде неподвижно закрепленного блока интерферометра, при этом фазовая решетка и решетка анализатора установлены параллельно друг другу. Решетка источника разъюстирована относительно блока интерферометра так, что в плоскости детектора ...

Кристаллическая форма свободного основания лорлатиниба

СОЕДИНЕНИЕ ТИОТРИАЗОЛА И ЕГО ПРИМЕНЕНИЯ ПРИ ЛЕЧЕНИИ ПАРАЗИТАРНЫХ ПРОТОЗОЙНЫХ ИНФЕКЦИЙ

Катализатор для обессеривания жидких нефтепродуктов, его получение и применение

Measurement method of layer thickness for thin film stacks

Measurement method of layer thickness for thin film stacks

A novel process for the preparation of teriflunomide

The present invention provides a process for the preparation of Teriflunomide (Formula-I). The present invention describes the synthesis of Teriflunomide without isolating the intermediate Leflunomide. Teriflunomide is prepared from 5-Methyl isoxazole-4-carboxylic acid by converting to its acid chloride and coupling with 4-trifluoromethyl aniline to obtain Leflunomide (which is not isolated) followed by ring opening reaction using aq. Sodium Hydroxide to form Teriflunomide. In other words, the process is telescoped from 5- methylisoxazole-4-carbonyl chloride.

Catalyst for hydrogenating aromatic hydrocarbons, and hydrogenation treatment method in which same is used

Provided is a hydrogenation catalyst that supports a reduced amount of metal and is exceptional in regard to stability and suppressing side reactions. A catalyst for hydrogenating an aromatic hydrocarbon compound into an aliphatic cyclic hydrocarbon compound, wherein a metal in group 10 of the periodic table represented by nickel is supported on a composite carrier comprising at least alumina and titania. The composite carrier preferably includes at least that in which a substrate comprising alumina is coated with titania, and the metal in group 10 of the periodic table is preferably subjected to a preliminary hydrogen reduction treatment. If the metal in group 10 of the periodic table is nickel, the nickel is preferably contained at an amount of 5-35% by mass in terms of nickel oxide in relation to the catalyst as a whole. The substrate comprises a porous structure in which, e.g., a plurality of needle-like bodies or columnar bodies are intertwined in three dimensions.

X-ray interferometer for phase contrast imaging

By using the phase contrast CT monochrome attenuation contrast Image generation

화합물 (S)-3-｛4-[5-(2-시클로펜틸-6-메톡시-피리딘-4-일)-[1,2,4]옥사디아졸-3-일]-2-에틸-6-메틸-페녹시｝-프로판-1,2-디올의 결정형

... 본 발명은 화합물 (S)-3-{4-[5-(2-시클로펜틸-6-메톡시-피리딘-4-일)-[1,2,4]옥사디아졸-3-일]-2-에틸-6-메틸-페녹시}-프로판-1,2-디올의 결정형에 관한 것이다.

X-RAY IMAGING DEVICE AND X-RAY IMAGING METHOD

Integrated thermal process for semi-crystalline pitch production, asphaltene removal, and crude oil residue reforming

주기적 구조의 측정과 특성화 및 분석을 위한 X-선 방법

... 주기적 공간 패턴의 X-선 조명을 사용하여 주기적 피검체에 대한 정보를 수집한다. 간섭성 또는 부분 간섭성을 갖는 X-선 광원과 빔 분할 격자의 상호 작용을 이용하여 구조화된 조명을 생성하고 주기적 구조를 갖는 탈봇 간섭 패턴을 생성한다. 그리고, 측정 대상인 주기적 구조의 피검체를 구조화된 조명에 배치하고 다중 조명 지점으로부터의 신호의 앙상블을 분석하여 피검체와 그 구조의 다양한 특성을 결정한다. 본 발명의 방법을 사용하여 X-선 흡수/투과, 소각 X-선 산란, X-선 형광, X-선 반사, X-선 회절에 응용이 모두 가능하다.

Radiographic image generating device

A device that uses a grating to carry out high sensitivity radiographic image shooting using the wave nature of x-rays or the like can shoot a sample that moves relative to a device. A pixel value computation section determines, using a plurality of intensity distribution images of a sample that moves in a direction that traverses the path of radiation, whether or not a point (p, q) on the sample belongs in a region (Ak) on each intensity distribution image. Further, the pixel value computation section obtains a sum pixel value (Jk) for each region (Ak) by summing pixel values on the each intensity distribution image for point (p, q) that belongs to each region (Ak). An image computation section creates a required radiographic image using the sum pixel values (Jk) of the region (Ak).

Measurement method of layer thickness for thin film stacks

Provided is a thin film stack inspection method capable of accurately measuring and inspecting layer thicknesses of thin film stacks. An X-ray having a long coherence length is used as an incident X-ray and the X-ray specular-reflected from a sample placed on a goniometer is partially bent by a prism. The X-ray bent by the prism and the X-ray going straight are made to interfere with each other to obtain interference patterns. Though being thin film stacks, the sample has a portion having no thin film and thus an exposed substrate. The X-ray not bent by the prism includes an X-ray specular-reflected from the exposed substrate. By changing the incident angle from 0.01° to 1°, the interference patterns of the specular-reflected X-ray are measured. Thus, layer thicknesses are measured using a change in a phase of the X-ray reflected from a film stack interface.

Röntgenstrahlabbildungsgerät und Röntgenstrahlabbildungsverfahren

Es werden ein Röntgenstrahlabbildungsgerät und ein Röntgenstrahlabbildungsverfahren bereitgestellt, die ein Differenzialphasenbild oder ein Phasenbild eines Gegenstands durch zumindest einen einzelnen Abbildungsbetrieb erhalten können. Das Röntgenstrahlabbildungsgerät gemäß der vorliegenden Erfindung umfasst ein Phasengitter (130), ein Absorptionsgitter (150), eine Erfassungseinrichtung (170) und eine arithmetische Einheit (180). Die arithmetische Einheit (180) führt einen Fourier-Transformationsschritt zum Ausführen einer Fourier-Transformation für eine Intensitätsverteilung eines Moiré-Musters, die durch die Erfassungseinrichtung erhalten wird, und zum Erhalten eines Ortsfrequenzspektrums aus. Ebenso führt die arithmetische Einheit (180) einen Phasenwiedergewinnungsschritt zum Trennen eines Spektrums, das einer Trägerfrequenz entspricht, von einem Ortsfrequenzspektrum, das in dem Fourier-Transformationsschritt erhalten wird, zum Ausführen einer inversen Fourier-Transformation für das ...

X-RAY STRESS MEASURING APPARATUS

An X-ray stress measuring device for measuring the stress of a sample is provided with: a pair of X-ray generating means (10, 11, 10', 11') for emitting X-ray beams, the angle formed by both of the beams forming an arbitrary fixed angle in a plane inclined at a desired angle relative to the surface of the sample to be measured; an X-ray sensor unit (20) for detecting a plurality of Debye rings (C, C') generated by the incident X-ray beams from the pair of X-ray generating means; and a battery (410) for supplying the necessary power to each part of the device. Furthermore, the X-ray sensor unit comprises only a single two-dimensional (area) X-ray detector (20) or a one-dimensional (linear) X-ray detector (20'), the plurality of Debye rings generated by the incident X-ray beams (X-ray, X'-ray) from at least one pair of X-ray generating means are disposed in adjacent or intersecting positions, and the plurality of Debye rings caused by the X-ray, X'-ray are detected in common.

CO-CRYSTALS OF A BRUTON'S TYROSINE KINASE INHIBITOR

Disclosed are co-crystals of the Bruton's tyrosine kinase (Btk) inhibitor 1-((R)-3-(4-amino-3-(4-phenoxyphenyl)-1H-pyrazolo[3,4-d]pyrimidin-1-yl)piperidin-1-yl)prop-2-en-1-one, including crystalline forms, and pharmaceutically acceptable salts thereof. Also disclosed are pharmaceutical compositions that include the co-crystals, as well as methods of using co-crystals, alone or in combination with other therapeutic agents, for the treatment of autoimmune diseases or conditions, heteroimmune diseases or conditions, cancer, including lymphoma, and inflammatory diseases or conditions.

Differential phase contrast x-ray imaging system and components

A differential phase contrast X-ray imaging system includes an X-ray illumination system, a beam splitter arranged in an optical path of the X-ray illumination system, and a detection system arranged in an optical path to detect X-rays after passing through the beam splitter.

X-RAY SOURCE, X-RAY IMAGING APPARATUS, AND X-RAY COMPUTED TOMOGRAPHY IMAGING SYSTEM

An X-ray imaging apparatus includes: an X-ray source including an electron source and a target, the target having a plurality of projections, each having an emitting surface; a diffraction grating configured to diffract X rays emitted from the X-ray source; and a detector configured to detect the X rays diffracted by the diffraction grating. Electron beams output from the electron source are incident on the emitting surfaces so that X rays are emitted from the emitting surfaces and are output to the diffraction grating. The X rays emitted from the emitting surfaces are diffracted by the diffraction grating so as to form a plurality of interference patterns. The projections are arranged such that bright portions of the interference patterns overlap each other and such that dark portions thereof overlap each other. Distances from the emitting surfaces to the diffraction grating are equal to each other. 1. An X-ray imaging apparatus comprising:an X-ray source including an electron source and a target, the target having a plurality of projections, each of the plurality of projections having an emitting surface;a diffraction grating configured to diffract X rays emitted from the X-ray source; anda detector configured to detect the X rays diffracted by the diffraction grating,wherein electron beams output from the electron source are incident on the emitting surfaces of the plurality of projections so that X rays are emitted from the emitting surfaces and are output to the diffraction grating, the X rays emitted from the emitting surfaces are diffracted by the diffraction grating so as to form a plurality of interference patterns, the plurality of projections are arranged such that bright portions of the plurality of interference patterns overlap each other and such that dark portions of the plurality of interference patterns overlap each other, and distances from the plurality of emitting surfaces to the diffraction grating are equal to each other.2. The X-ray imaging ...

IMAGING APPARATUS

An imaging apparatus includes a light source unit; a diffraction grating diffracting light from the light source unit; and a detector detecting light from the diffraction grating, wherein the light source unit includes first light-emitting parts emitting light forming a first interference pattern by being diffracted at the diffraction grating, and second light-emitting parts emitting light forming a second interference pattern by being diffracted at the diffraction grating, wherein the first and the second light-emitting parts are disposed so that at least part of the first and second interference pattern overlap and the positions of light regions in the first interference pattern differ from the positions of light regions in the second interference pattern, and wherein a combined pattern is formed by the first interference pattern and the second interference pattern. 1. An imaging apparatus comprising:a light source unit;a diffraction grating configured to diffract light from the light source unit; anda detector configured to detect light from the diffraction grating, first light-emitting parts configured to emit light forming a first interference pattern by being diffracted at the diffraction grating, and', 'second light-emitting parts configured to emit light forming a second interference pattern by being diffracted at the diffraction grating,, 'wherein the light source unit includes'}wherein the first light-emitting parts and the second light-emitting parts are disposed so that at least part of the first interference pattern and at least part of the second interference pattern overlap and the positions of light regions in the first interference pattern differ from the positions of light regions in the second interference pattern, andwherein a combined pattern is formed by the first interference pattern and the second interference.2. The imaging apparatus according to claim 1 , wherein claim 1 ,the first interference pattern and the second interference pattern ...

DIFFERENTIAL PHASE-CONTRAST IMAGING

The present invention relates to differential phase-contrast imaging, in particular to a structure of a diffraction grating, e.g. an analyzer grating and a phase grating, for X-ray differential phase-contrast imaging. In order to provide enhanced phase-gradient based image data, a diffraction grating () for X-ray differential phase-contrast imaging, is provided with a first sub-area () comprising at least one portion () of a first grating structure () and at least one portion () of a second grating structure (). The first grating structure comprises a plurality of bars () and gaps () with a first grating orientation G(), being arranged periodically, wherein the bars are arranged such that they change the phase and/or amplitude of an X-ray radiation and wherein the gaps are X-ray transparent. The second grating structure comprises a plurality of bars () and gaps () with a second grating orientation G(), being arranged periodically, wherein the bars are arranged such that they change the phase and/or amplitude of an X-ray radiation and wherein the gaps are X-ray transparent. The first grating orientation Got is different than the second grating orientation G. Thus, phase-gradient based image information can be acquired for different directions without the necessity to rotate or pivot any of the respective gratings between the acquisition steps, for example. 1141523. A diffraction grating ( , ) for X-ray differential phase-contrast imaging , comprising a first sub-area () with{'b': 24', '26, 'at least one portion () of a first grating structure (); and'}{'b': 28', '30, 'at least one portion () of a second grating structure ();'}{'b': 34', '36', '37, 'sub': 'O1', 'wherein the first grating structure comprises a plurality of bars () and gaps () with a first grating orientation G(), being arranged periodically; wherein the bars are arranged such that they change the phase and/or amplitude of an X-ray radiation and wherein the gaps are X-ray transparent;'}{'b': 40', '42', ...

ANALYSIS METHOD, RADIATION IMAGING APPARATUS USING ANALYSIS METHOD, AND ANALYSIS PROGRAM FOR EXECUTING ANALYSIS METHOD

An analysis method for use in a radiation imaging apparatus employing intensity information of interference fringes of radiation rays that have passed through a detected object includes the steps of generating first phase information of the detected object wrapped into a range of 2π from the intensity information of the interference fringes; generating information on an absorption intensity gradient of the detected object from the intensity information of the interference fringes; generating a weighting function on the basis of an absolute value of a gradient in the information on the absorption intensity gradient; and generating second phase information by unwrapping the first phase information by using the weighting function. 1. A method for acquiring information of a detected object from intensity information of interference fringes of radiation rays that have passed through the detected object , the method comprising the steps of:obtaining first phase information of the detected object wrapped into a range of 2π from the intensity information of the interference fringes;obtaining information on an absorption intensity gradient of the detected object from the intensity information of the interference fringes;generating a weighting function on the basis of the information on the absorption intensity gradient; andobtaining second phase information by unwrapping the first phase information by using the weighting function.2. The information-acquiring method according to claim 1 , wherein the step of obtaining the second phase information includes a step of performing a least-squares method.3. The information-acquiring method according to claim 1 , wherein the step of obtaining the first phase information includes a step of performing a Fourier transform on the intensity information of the interference fringes.4. The information-acquiring method according to claim 1 , wherein the step of obtaining the information on the absorption intensity gradient includes a step of ...

IMAGING DEVICE, IMAGING METHOD, AND IMAGING SYSTEM

The present invention discloses an imaging device, an imaging method, and an imaging system, belonging to the field of sample image data acquisition and imaging technology. The imaging device includes: a charged particle source, a convergence system, a scanning control system, a detection module, and a spectral analysis module disposed below the detection module, where the detection module includes a plurality of pixelated detector units; and the detection module is provided with a hole thereon. The diffraction pattern is obtained by using the detection module, and the spectral analysis module performs spectral analysis on a charged particle beam passing through the hole, so as to obtain the diffraction pattern and spectral signal simultaneously by one scanning. The imaging method of the present invention is based on a hollow ptychography method, which enables toper form imaging on the diffraction pattern obtained through the detection module, with good imaging effects. 1. An imaging device , comprising:{'b': '1', 'a charged particle source (), configured to emit a charged particle;'}{'b': '2', 'a convergence system (), configured to constrain and converge a charged particle beam;'}{'b': '3', 'a scanning control system (), configured to control scanning of the charged particle beam on a sample;'}{'b': '4', 'a sample ();'}{'b': '5', 'a detection module (), configured to receive the charged particle and detect the signal strength of the charged particle; and'}{'b': 6', '5, 'a spectral analysis module () disposed below the detection module (), configured to analyze spectroscopic characteristics of the charged particle, wherein'}{'b': 5', '7', '5', '8, 'the detection module () comprises a plurality of pixelated detector units () and the detection module () is provided with a hole () thereon.'}28. The imaging device according to claim 1 , wherein the hole () is of claim 1 , but not limited to claim 1 , a circular claim 1 , square claim 1 , or annular shape.35. The ...

IRON-BASED OXIDE MAGNETIC PARTICLE POWDER, METHOD FOR PRODUCING SAME, COATING MATERIAL, AND MAGNETIC RECORDING MEDIUM

An iron-based oxide magnetic particle powder has a narrow particle size distribution a small content of fine particles that do not contribute to magnetic recording characteristics, and a narrow coercive force distribution, to enhance magnetic recording medium density. Neutralizing an aqueous solution containing a trivalent iron ion and an ion of the metal substituting a part of the Fe sites by adding an alkali to make pH of 1.5 or more and 2.5 or less, adding a hydroxycarboxylic acid, and further neutralizing by adding an alkali to make pH of 8.0 or more and 9.0 or less are performed at 5° C. or more and 25° C. or less. A formed iron oxyhydroxide precipitate containing the substituting metal element is rinsed with water, then coated with silicon oxide, and then heated thereby providing e-type iron-based oxide magnetic particle powder. The rinsed precipitate may be subjected to a hydrothermal treatment. 1. An iron-based oxide magnetic particle powder comprising ε-FeOhaving an average particle diameter measured with a transmission electron microscope of 10 nm or more and 30 nm or less , a part of Fe sites of which is substituted by another metal element , the iron-based oxide magnetic particle powder having a value of I/Idefined below of 0.7 or less and a value of α/εdefined below of 0.1 or less ,{'sub': H', 'L, 'sup': '2', 'wherein Irepresents an intensity of a peak present on a high magnetic field side in a differential B-H curve obtained by numerical differential of a B-H curve obtained by measuring under conditions of an applied magnetic field of 1,035 kA/m (13 kOe), an M measurement range of 0.005 A·m(5 emu), a step bit of 80 bit, a time constant of 0.03 sec, and a wait time of 0.1 sec; and Irepresents an intensity of an intercept of an ordinate at zero magnetic field in the differential B-H curve, and'}{'sub': s', 's, 'αrepresents a maximum value of a diffraction intensity except for background in X-ray diffractometry at 2θ of 27.2° or more and 29.7° or less; ...

WAVE INTERFERENCE SYSTEMS AND METHODS FOR MEASURING OBJECTS AND WAVES

A method of measuring an object is disclosed. In one step, a first interference pattern of interference waves is created. In another step, first measurement information is measured by measuring the scattering of the first interference pattern off the object, the transmission of the first interference pattern through the object, or the transmission of the first interference pattern around the object. In yet another step, a second interference pattern of interfered waves is created having a different shape or different scale than the first interference pattern. In another step, second measurement information is measured by measuring the scattering of the second interference pattern off the object, the transmission of the second interference pattern through the object, or the transmission of the second interference pattern around the object. In still another step, measurements of the object are determined using knowledge about shape of the first and second interference patterns and the first and second measurement information. 1. A method of measuring an object comprising:creating a first interference pattern of interfered waves;measuring the scattering of the first interference pattern off the object, the transmission of the first interference pattern through the object, or the transmission of the first interference pattern around the object as first measurement information;creating a second interference pattern of interfered waves having a different shape or different scale than the first interference pattern;measuring the scattering of the second interference pattern off the object, the transmission of the second interference pattern through the object, or the transmission of the second interference pattern around the object as second measurement information; anddetermining measurements of the object using knowledge about shape of the first and second interference patterns and the first and second measurement information.2. The method of further comprising ...

Source grating, interferometer, and object information acquisition system

A source grating includes a first sub-source grating, where first transmitting portions which transmit X-rays, and first shielding portions which shield X-rays, are alternately arranged in a first direction; and a second sub-source grating, where second transmitting portions which transmit X-rays, and second shielding portions which shield X-rays, are alternately arranged in a second direction orthogonal to the first direction. The first sub-source grating is curved so that two positions in the curve align in the first direction. The second sub-source grating is curved so that two positions in the curve align in the second direction.

CHEMICAL COMPOUNDS

The specification relates to compounds of Formula (I): 2. A compound of Formula (I) claim 1 , or a pharmaceutically acceptable salt thereof claim 1 , as claimed in claim 1 , wherein Q is O.6. A compound according to selected from the group consisting of:3,3-difluoro-N-(2-(4-((1R,3R)-2-isobutyl-3-methyl-2,3,4,9-tetrahydro-1H-pyrido[3,4-b]indol-1-yl)phenoxy)ethyl)propan-1-amine;3-fluoro-N-(2-(4-((1R,3R)-2-isobutyl-3-methyl-2,3,4,9-tetrahydro-1H-pyrido[3,4-b]indol-1-yl)phenoxy)ethyl)propan-1-amine;N-(2-(3,5-difluoro-4-((1R,3R)-2-(2-fluoro-2-methylpropyl)-3-methyl-2,3,4,9-tetrahydro-1H-pyrido[3,4-b]indol-1-yl)phenoxy)ethyl)-3,3-difluoropropan-1-amine;N-(2-(3,5-difluoro-4-((1R,3R)-2-(2-fluoro-2-methylpropyl)-3-methyl-2,3,4,9-tetrahydro-1H-pyrido[3,4-b]indol-1-yl)phenoxy)ethyl)-3-fluoropropan-1-amine;N-(2-(3,5-difluoro-4-((1R,3R)-2-((3-fluorooxetan-3-yl)methyl)-3-methyl-2,3,4,9-tetrahydro-1H-pyrido[3,4-b]indol-1-yl)phenoxy)ethyl)-3-fluoropropan-1-amine;N-(2-(3,5-difluoro-4-((1R,3R)-2-((1-fluorocyclopropyl)methyl)-3-methyl-2,3,4,9-tetrahydro-1H-pyrido[3,4-b]indol-1-yl)phenoxy)ethyl)-3-fluoropropan-1-amine;3-fluoro-N-(2-((5-((1R,3R)-2-((3-fluorooxetan-3-yl)methyl)-3-methyl-2,3,4,9-tetrahydro-1H-pyrido[3,4-b]indol-1-yl)-4-methoxypyridin-2-yl)oxy)ethyl)propan-1-amine;3-fluoro-N-(2-(4-((1R,3R)-2-((3-fluorooxetan-3-yl)methyl)-3-methyl-2,3,4,9-tetrahydro-1H-pyrido[3,4-b]indol-1-yl)-3-methoxyphenoxy)ethyl)propan-1-amine;{'sup': 1', '2, 'N-(3,5-difluoro-4-((1R,3R)-2-((1-fluorocyclopropyl)methyl)-3-methyl-2,3,4,9-tetrahydro-1H-pyrido[3,4-b]indol-1-yl)phenyl)-N-(3-fluoropropyl)ethane-1,2-diamine;'}3-((1R,3R)-1-(2,6-difluoro-4-(2-((3-fluoropropyl)amino)ethoxy)phenyl)-3-methyl-1,3,4,9-tetrahydro-2H-pyrido[3,4-b]indol-2-yl)-2,2-difluoropropan-1-ol;3-fluoro-N-(2-(4-((1R,3R)-2-((1-fluorocyclopropyl)methyl)-3-methyl-2,3,4,9-tetrahydro-1H-pyrido[3,4-b]indol-1-yl)-3-methoxyphenoxy)ethyl)propan-1-amine;N-(2-(4-((1R,3R)-2-(2,2-difluoropropyl)-3-methyl-2,3,4,9-tetrahydro-1H-pyrido[3,4-b]indol- ...

X-ray phase imaging apparatus and method of detecting defect of material containing fibers

This X-ray phase imaging apparatus is provided with a control unit that acquires information on a defect of a material based on a dark field image of the material.

CRYSTALLINE FORM OF THE COMPOUND (S)-3-{4-[5-(2-CYCLOPENTYL-6-METHOXY-PYRIDIN-4-YL)-[1,2,4]OXADIAZOL-3-YL]-2-ETHYL-6-METHYL-PHENOXY}-PROPANE-1,2-DIOL

The present invention relates to a crystalline form of the compound (S)-3-{4-[5-(2-cyclopentyl-6-methoxy-pyridin-4-yl)-[1,2,4]oxadiazol-3-yl]-2-ethyl-6-methyl-phenoxy}-propane-1,2-diol. 117-. (canceled)18. A method of treating multiple sclerosis comprising administering a pharmaceutically active amount of a crystalline form of the compound (S)-3-{4-[5-(2-cyclopentyl-6-methoxy-pyridin-4-yl)-[1 ,2 ,4]oxadiazol-3-yl]-2-ethyl-6-methyl-phenoxy}-propane-1 ,2-diol to a subject in need thereof , wherein the crystalline form is characterized by the presence of peaks in the X-ray powder diffraction diagram at the following angles of refraction 2θ: 5.4° , 8.5° , and 10.8°.19. The method according to claim 18 , wherein the crystalline form of the compound is characterized by the presence of peaks in the X-ray powder diffraction diagram at the following angles of refraction 2θ: 4.2° claim 18 , 5.4° claim 18 , 8.0° claim 18 , 8.5° claim 18 , and 10.8°.20. The method according to claim 18 , wherein the crystalline form of the compound is characterized by the presence of peaks in the X-ray powder diffraction diagram at the following angles of refraction 2θ: 4.2° claim 18 , 5.4° claim 18 , 8.0° claim 18 , 8.5° claim 18 , 10.8° claim 18 , 12.7° claim 18 , 14.4° claim 18 , 17.7° claim 18 , 20.4° claim 18 , and 21.3°.21. The method according to claim 18 , wherein the crystalline form of the compound has a melting point of about 79° C. as determined by differential scanning calorimetry.22. The method according to claim 19 , wherein the crystalline form of the compound has a melting point of about 79° C. as determined by differential scanning calorimetry.23. The method according to claim 20 , wherein the crystalline form of the compound has a melting point of about 79° C. as determined by differential scanning calorimetry.24. The method of treating multiple sclerosis comprising administering a pharmaceutical composition to a subject in need thereof; wherein the pharmaceutical composition ...

THERAPEUTICALLY ACTIVE COMPOUNDS AND THEIR METHODS OF USE

Provided are crystalline forms of 2-Methyl-1-[(4-[6-(trifluoromethyl) pyridin-2-yl]-6-{[2-(trifluoromethyl)pyridin-4-yl]amino}-1,3,5-triazin-2-yl)amino]propan-2-ol mesylate useful for treating cancer and methods of treating cancer, comprising administering to a subject in need thereof said compound. 1. An isolated crystalline form of 2 methyl-1-[(4-[6-(trifluoromethyl)pyridin-2-yl]-6-{[2-(trifluoromethyl)pyridin-4-yl]amino}-1 ,3 ,5-triazin-2-yl)amino]propan-2-ol mesylate , characterized by an X-ray powder diffraction pattern substantially similar to or .2. A method of treating an advanced hematologic malignancy selected from acute myelogenous leukemia (AML) claim 1 , myelodysplastic syndrome (MDS) claim 1 , chronic myelomonocytic leukemia (CMML) claim 1 , myeloid sarcoma claim 1 , multiple myeloma claim 1 , and lymphoma claim 1 , each characterized by the presence of a mutant allele of IDH2 claim 1 , comprising administering to a subject in need thereof a therapeutically effective dose of a crystalline form of .3. A method of treating an advanced hematologic malignancy selected from acute myelogenous leukemia (AML) claim 1 , myelodysplastic syndrome (MDS) claim 1 , chronic myelomonocytic leukemia (CMML) claim 1 , myeloid sarcoma claim 1 , multiple myeloma claim 1 , and lymphoma claim 1 , each characterized by the presence of a mutant allele of IDH2 claim 1 , comprising administering to subject in need thereof a pharmaceutical composition comprising a therapeutically effective dose of a crystalline form of and one or more pharmaceutically acceptable carrier(s).4. A method of treating an advanced hematologic malignancy selected from acute myelogenous leukemia (AML) claim 1 , myelodysplastic syndrome (MDS) claim 1 , chronic myelomonocytic leukemia (CMML) claim 1 , myeloid sarcoma claim 1 , multiple myeloma claim 1 , and lymphoma claim 1 , each characterized by the presence of a mutant allele of IDH2 claim 1 , comprising administering to a subject in need thereof a ...

CO-CRYSTALS OF A BRUTON'S TYROSINE KINASE INHIBITOR

Disclosed are co-crystals of the Bruton's tyrosine kinase (Btk) inhibitor 1-((R)-3-(4-amino-3-(4-phenoxyphenyl)-1H-pyrazolo[3,4-d]pyrimidin-1-yl)piperidin-1-yl)prop-2-en-1-one, including crystalline forms, and pharmaceutically acceptable salts thereof. Also disclosed are pharmaceutical compositions that include the co-crystals, as well as methods of using co-crystals, alone or in combination with other therapeutic agents, for the treatment of autoimmune diseases or conditions, heteroimmune diseases or conditions, cancer, including lymphoma, and inflammatory diseases or conditions. 1. A co-crystal of 1-((R)-3-(4-amino-3-(4-phenoxyphenyl)-1H-pyrazolo[3 ,4-d]pyrimidin-1-yl)piperidin-1-yl)prop-2-en-1-one and a coformer , wherein the coformer is benzoic acid , succinic acid , 3-hydroxybenzoic acid , 4-aminobenzoic acid , salicylic acid , sorbic acid , fumaric acid , 4-hydroxybenzoic acid , sulfamic acid , or a combination thereof.2. (canceled)4. (canceled)5. The co-crystal of claim 3 , wherein the co-crystal has an XRPD pattern comprising at least two peaks selected from about 9.0° 2-Theta claim 3 , about 12.1° 2-Theta claim 3 , about 18.2° 2-Theta claim 3 , about 21.2° 2-Theta claim 3 , about 22.9° 2-Theta claim 3 , and about 27.9° 2-Theta.68-. (canceled)9. The co-crystal of claim 3 , wherein the DSC thermogram has an endotherm with a peak at about 134° C.1012-. (canceled)13. The co-crystal of claim 1 , wherein the coformer is succinic acid that has at least one of the following properties:{'figref': {'@idref': 'DRAWINGS', 'FIG. 3'}, '(a) an X-ray powder diffraction (XRPD) pattern substantially the same as shown in ;'}(b) an XRPD pattern comprising at least two, at least four, at least six, at least eight, or ten peaks selected from about 17.3° 2-Theta, about 18.0° 2-Theta, about 18.3° 2-Theta, about 20.1° 2-Theta, about 20.3° 2-Theta, about 21.6° 2-Theta, about 21.8° 2-Theta, about 23.2° 2-Theta, about 24.2° 2-Theta, and about 26.2° 2-Theta;(c) substantially the same ...

X-RAY TALBOT INTERFEROMETER

An X-ray Talbot interferometer includes a source grating having a plurality of X-ray transmitting portions to transmit some X-rays from an X-ray source, a beam splitter grating configured to diffract the X-rays from the X-ray transmitting portions with a periodic structure to form interference patterns, an analyzer grating configured to block parts of the interference patterns, and a detector configured to detect X-rays from the analyzer grating. The X-ray transmitting portions of the source grating are arranged to form a periodic pattern in which spatial frequency components contained in a sideband resulting from modulation caused by the presence of an object are enhanced by superimposing the interference patterns corresponding to the respective X-ray transmitting portions. In the absence of any object, the positional relation between the periodic pattern and the grating pattern of the analyzer grating is substantially the same over the entire imaging field. 1. An X-ray Talbot interferometer comprising:a source grating having a plurality of X-ray transmitting portions to transmit some X-rays from an X-ray source;a beam splitter grating configured to diffract the X-rays from the X-ray transmitting portions with a periodic structure to form interference patterns;an analyzer grating configured to block parts of the interference patterns; anda detector configured to detect X-rays from the analyzer grating,wherein the beam splitter grating forms the interference patterns corresponding to the respective X-ray transmitting portions by diffracting X-rays from each of the X-ray transmitting portions with the periodic structure;the X-ray transmitting portions are arranged to form a periodic pattern in which specific spatial frequency components are enhanced by superimposing the interference patterns corresponding to the respective X-ray transmitting portions;the specific spatial frequency components are spatial frequency components contained in a sideband produced when ...

X-ray imaging system and image processing device

An X-ray imaging system includes an X-ray imaging device and an image processing device including a reconstruction unit and an estimation unit. The X-ray imaging device uses a Talbot or Talbot-Lau interferometer including gratings disposed in a line. The X-ray imaging device obtains sets of moire fringe images by fringe scanning multiple times between which arrangement of the gratings is changed. In the fringe scanning, one of the gratings is moved relatively to the remaining grating. The reconstruction unit generates, on the basis of the sets, a reconstructed image which is a differential phase image, an X-ray absorption image and/or a small-angle scattering image. The estimation unit estimates, on the basis of the reconstructed image, a relative position of the moved grating from a reference position of the grating at each imaging in the fringe scanning.

Radiological image capturing apparatus and radiological image capturing system

There is described a radiological image capturing apparatus, which makes it possible to obtain a good X ray image in which contrast of the peripheral portions are emphasized by employing the Talbot interferometer method and the Talbot-Lau interferometer method. The apparatus is provided with an X-ray tube, a multi-slit member, a first diffraction grating, a second diffraction grating and an X-ray detector. The second diffraction grating contacts the X-ray detector. A distance L between the multi-slit element and the first diffraction grating is set to be not less than 0.5 m, a distance Z 1 between the first diffraction grating and the second diffraction grating is set to be not less than 0.05 m, and a slit interval distance d 0 of the multi-slit element is set to be not less than 2 μm. With the settings, the abovementioned good X-ray image can be obtained by using the Talbot-Lau interferometer system.

TALBOT-LAU X-RAY SOURCE AND INTERFEROMETRIC SYSTEM

An x-ray source and an x-ray interferometry system utilizing the x-ray source are provided. The x-ray source includes a target that includes a substrate and a plurality of structures. The substrate includes a thermally conductive first material and a first surface. The plurality of structures is on or embedded in at least a portion of the first surface. The structures are separate from one another and are in thermal communication with the substrate. The structures include at least one second material different from the first material, the at least one second material configured to generate x-rays upon irradiation by electrons having energies in an energy range of 0.5 keV to 160 keV. The x-ray source further includes an electron source configured to generate the electrons and to direct the electrons to impinge the target and to irradiate at least some of the structures along a direction that is at a non-zero angle relative to a surface normal of the portion of the first surface. The x-ray source further includes at least one optical element positioned such that at least some of the x-rays are transmitted through the first material and to or through the at least one optical element. 1. An x-ray source comprising: a substrate comprising a thermally conductive first material and a first surface; and', 'a plurality of structures on or embedded in at least a portion of the first surface, the structures separate from one another and in thermal communication with the substrate, the structures comprising at least one second material different from the first material, the at least one second material configured to generate x-rays upon irradiation by electrons having energies in an energy range of 0.5 keV to 160 keV; and, 'a target comprisingan electron source configured to generate the electrons and to direct the electrons to impinge the target and irradiate at least some of the structures along a direction that is at a non-zero angle relative to a surface normal of the ...

Enantiomerically enriched, polycrystalline molecular sieves

This disclosure describes enantiomerically enriched chiral molecular sieves and methods of making and using the same. In some embodiments, the molecular sieves are silicates or germanosilicates of STW topology.

X-ray imaging apparatus and x-ray imaging system

An X-ray imaging apparatus includes an optical device configured to form a periodic pattern using X-rays radiated from an X-ray source, an alignment mark of the optical device, a first detector, a second detector, and a movement unit configured to change at least either a position of the optical device or an angle of the optical device on the basis of a result of detection performed by the second detector. The first detector detects X-rays that have passed through the optical device and a subject, and the second detector detects X-rays that have passed through the alignment mark. The movement unit includes a movement instruction section that instructs the optical device to move on the basis of the result of the detection performed by the second detector and movement sections that move the optical device on the basis of the instruction issued by the movement instruction section.

Crystal-water-free calcium dibutyryladenosine cyclophosphate crystal form and preparation method and application thereof

Disclosed are a crystallization water-free calcium dibutyryladenosine cyclophosphate crystal form, and a preparation method and a use thereof. In an X-ray powder diffraction pattern using Cu-Kα as a source of radiation, the crystallization water-free calcium dibutyryladenosine cyclophosphate crystal form has characteristic peaks at positions where diffraction angles 2θ are equal to 12.3°±0.2°, 17.6°±0.2°, 21.4°±0.2°, 24.7°±0.2°, 25.3°±0.2° and 27.8°±0.2°. The crystallization water-free calcium dibutyryladenosine cyclophosphate crystal form of the present invention has a high purity, and good stability; the preparation method is simple and convenient, has good reproducibility, and is easy to industrially popularize and apply.

APPARATUS AND METHOD FOR X-RAY PHASE CONTRAST IMAGING

An x-ray phase contrast imaging apparatus and method of operating the same. The apparatus passes x-rays generated by an x-ray source through, in succession, a source grating, an object of interest, a phase grating, and an analyzer grating. The x-ray source, the source grating, the phase grating, and the analyzer grating move as a single entity relative to an object of interest. The phase grating and the analyzer grating remain in fixed relative location and fixed relative orientation with respect to one another. The detected x-rays are converted to a time sequence of electrical signals. In some cases, the apparatus is controlled, and the electrical signals are analyzed by, by a general purpose programmable computer provided with instructions recorded on a machine readable medium. One or more x-ray phase contrast images of the object of interest are generated, and can be recorded or displayed. 1. An x-ray phase contrast imaging apparatus , comprising:an x-ray source configured to provide x-ray illumination at an exit port thereof;a source grating configured to receive said x-ray illumination at a source grating entrance port and configured to provide a plurality of x-ray beams at a source grating exit port;{'b': '1', 'a phase grating having a plurality of phase grating elements, said phase grating situated at a distance from said source grating, said phase grating configured to receive x-rays at a phase grating entrance port and to provide x-rays at a phase grating exit port;'}a analyzer grating having a plurality of analyzer grating elements, said analyzer grating situated at a distance d from said phase grating, said phase grating and said analyzer grating having a fixed location and a fixed orientation relative to each other, said analyzer grating configured to receive x-rays at a analyzer grating entrance port and to provide x-rays at a analyzer grating exit port;said x-ray source, said source grating, said phase grating, and said analyzer grating configured to ...

Phase Contrast Imaging Using Patterned Illumination/Detector and Phase Mask

A modified phase shifting mask is used to improve performance over traditional Zernike phase contrast imaging. The configurations can lead to an improved imaging methodology potentially with reduced artifacts and more than one order of magnitude gain in photon efficiency, in some examples. Moreover, it can be used to yield a direct representation of the sample's phase contrast information without the need for additional specialized post-acquisition image analysis. The approach can be applied to both wide-field and scanning configurations by using a phase mask including a pattern of phase elements and an illumination mask, having a pattern of holes, for example, that corresponds to a pattern of the phase mask. 1. A phase contrast imaging system , comprising:a radiation source for generating radiation;a detector for detecting the radiation after transmission through a sample;a patterned phase mask for phase shifting a portion of the radiation detected by the detector; andan illumination mask having a pattern that corresponds to a pattern of the phase mask.2. The imaging system as claimed in claim 1 , wherein the imaging system is a scanning x-ray microscope in which the illumination mask is located between the sample and the detector or implemented in an operation of the detector.3. The imaging system as claimed in claim 2 , further comprising an objective lens that focuses the radiation after transmission through the phase mask onto the sample.4. The imaging system as claimed in claim 2 , wherein the detector is a spatially resolved pixelated detector and the illumination mask is implemented by summing responses of pixels to form the pattern of the illumination mask.5. The imaging system as claimed in claim 2 , wherein the detector comprises a single element detector and the illumination mask is an opaque detector mask over the single element detector.6. An imaging system as claimed in claim 2 , wherein the phase mask is located between the sample and the radiation ...

X-RAY DIFFRACTION APPARATUS

An X-ray diffraction apparatus including an X-ray detector that is configured to detect diffracted X-rays diffracted from a sample when a surface of the sample is irradiated with X-rays, a counter arm which rotates around a rotation center axis set within the surface of the sample while the X-ray detector is installed on the counter arm, and a plate-like X-ray shielding member that is installed on the counter arm and rotated together with the X-ray detector. 1. An X-ray diffraction apparatus comprising:an X-ray detector that is configured to detect diffracted X-rays diffracted from a sample when a surface of the sample is irradiated with X-rays;a counter arm that is configured to rotate around a rotation center axis set within the surface of the sample while the X-ray detector is installed on the counter arm; anda plate-like X-ray shielding member that is configured to be installed on the counter arm and rotated together with the X-ray detector.2. The X-ray diffraction apparatus according to claim 1 , wherein the counter arm is configured to rotationally scan the X-ray detector to a high angle side where an inclination angle of the X-ray detector with respect to the surface of the sample increases while a position within a plane flush with the surface of the sample is set as an origin of scanning on a low angle side claim 1 , and the X-ray shielding member is arranged on a high angle side with respect to diffracted X-rays that are diffracted from the sample and incident to the X-ray detector.3. The X-ray diffraction apparatus according to claim 2 , wherein the X-ray shielding member regulates claim 2 , by a distal end thereof claim 2 , a boundary of the high angle side through which the diffracted X-rays are transmissible claim 2 , and is arranged so that a surface portion thereof is inclined with respect to a straight line connecting the distal end of the X-ray shielding member and the center of an X-ray irradiation region on the surface of the sample claim 2 , ...

Performing Planarization Process Controls in Semiconductor Fabrication

A planarization process is performed to a wafer. In various embodiments, the planarization process may include a chemical mechanical polishing (CMP) process. A byproduct generated by the planarization process is collected and analyzed. Based on the analysis, one or more process controls are performed for the planarization process. In some embodiments, the process controls include but are not limited to process endpoint detection or halting the planarization process based on detecting an error associated with the planarization process.

Radiation Phase Contrast Imaging Device

[PROBLEM TO BE SOLVED] To provide a radiation phase contrast imaging device having a small device configuration [SOLVING MEANS] The present invention focused on the findings that the distance between the phase grating 5 and the FPD 4 does not need to be the Talbot distance. The distance between the phase grating 5 and the FPD 4 can be more freely set. However, a self-image cannot be detected unless the self-image is sufficiently magnified with respect to the phase grating 5. The degree on how much the self-image is magnified on the FPD 4 with respect to the original phase grating 5 is determined by a magnification ratio X 2/ X 1. Therefore, in the present invention, the magnification ratio is set to be the same as the magnification ratio in a conventional configuration. With this, even if the distance X 2 between the radiation source 3 and the FPD 4 is reduced, a situation in which the self-image cannot be detected by the FPD 4 due to the excessively small size thereof does not occur.

X-RAY IMAGING APPARATUS

An X-ray imaging apparatus includes: a plurality of gratings; a detector which detects X-rays that have been emitted from an X-ray generator and have been transmitted through the plurality of gratings; a first support member which supports the plurality of gratings and the detector; a second support member which supports the X-ray generator and the first support member; and a first vibration-proof member which is disposed between the first support member and the second support member. A natural frequency of the first vibration-proof member in respect of at least vibration in a direction perpendicular to the optical axis of the X-rays is lower than 2times the frequency of vibration generated by the X-ray generator. 1. An X-ray imaging apparatus , comprising:a plurality of gratings;a detector which detects X-rays that have been emitted from an X-ray generator and have been transmitted through the plurality of gratings;a first support member which supports the plurality of gratings and the detector;a second support member which supports the X-ray generator and the first support member; anda first vibration-proof member which is disposed between the first support member and the second support member, wherein{'sup': '−1/2', 'a natural frequency of the first vibration-proof member in respect of at least vibration in a direction perpendicular to the optical axis of the X-rays is lower than 2times the frequency of vibration generated by the X-ray generator.'}2. The X-ray imaging apparatus according to claim 1 , whereinthe second support member is installed on a third support member via a second vibration-proof member; anda natural frequency of the second vibration-proof member in respect of at least vibration in a direction perpendicular to the optical axis of the X-rays is lower than the natural frequency of the first vibration-proof member.3. The X-ray imaging apparatus according to claim 1 , wherein a third vibration-proof member for suppressing vibration in a different ...

MESOPOROUS MATERIALS

The invention relates to the field of mesoporous materials and in particular to mesoporous rare earth oxides and a method of their synthesis. 1. A method of making a mesoporous rare earth oxide material , the method comprising;at a reduced pressure, contacting a mesoporous template with a precursor solution that comprises a rare earth metal salt or neutral complex of a rare earth metal, so as to impregnate the mesoporous template;calcining the impregnated mesoporous template to form a rare earth oxide material in situ; andremoving the mesoporous template from the calcined material.2. A method according to claim 1 , comprising contacting the mesoporous template with a non-aqueous precursor solution so as to impregnate the mesoporous template3. A method according to claim 2 , wherein the precursor solution comprises ethanol as a solvent.4. A method according to any preceding claim claim 2 , wherein the precursor solution comprises cerium.5. A method according to any preceding claim claim 2 , wherein the precursor solution is a saturated solution claim 2 , optionally comprising more than 20 wt % of precursor salt.6. A method according to any preceding claim claim 2 , comprising calcining at more than one temperature.7. A method according to claim 6 , comprising calcination at a first temperature for a first period of time and at a higher second temperature for a second period of time.8. A method according to any preceding claim claim 6 , comprising chemically removing the mesoporous template claim 6 , by treating with a chemical capable of eroding or digesting the template.9. A method according to claim 8 , wherein the mesoporous template is a silicate material claim 8 , the method comprising treatment with aqueous alkali metal hydroxide at room temperature.10. A method according to claim 9 , wherein the aqueous alkali metal hydroxide is NaOH(aq) and has a concentration of between around 1-3 M.11. A method according to any preceding claim claim 9 , wherein the method ...

PULVERULENT COMPOSITIONS OF A COMPLEX BETWEEN AN ACID AND A METAL HAVING A HIGH ORGANOSULFUR COMPOUND CONTENT AND METHOD FOR PREPARING SAME

Disclosed are pulverulent compositions of a complex between an acid and a metal, having a high organosulfur compound content, and method for preparing same. 1. A particle comprising: {'br': None, 'sup': −', 'n+, 'sub': 'n', '(A)M\u2003\u2003(I)'}, 'a core consisting essentially of a salt of formula (I) below [{'sup': '−', 'Arepresents an anion chosen from the group consisting of 2-hydroxy-4-methylthiobutanoate, methioniate and cysteinate,'}, 'M represents a divalent or trivalent metal,', 'n being equal to 2 when said metal is divalent and to 3 when said metal is trivalent, and, 'in which said layer coating said core,', 'the weight percentage of said compound B relative to the salt of formula (I) of the core being from approximately 10% to approximately 50%,', 'said compound B not being, or not only being, in the form of a salt of formula (I),', 'the organosulfur compound content (TOS) of said particle being greater than 87% by weight, in particular greater than 88%, 89% or 90% by weight, relative to the total weight of said particle., 'a layer comprising a compound B chosen from the group consisting of 2-hydroxy-4-methylthiobutanoic acid (HMTBA), methionine, cysteine, mixtures thereof, salts thereof and complexes thereof,'}2. A particle according to claim 1 , wherein said compound B is in the:free form, chosen from 2-hydroxy-4-methylthiobutanoic acid (HMTBA), methionine and cysteine, and/orform of salt of said formula (I), and/or{'sub': '4', 'claim-text': said compound B not being, or not only being, in the form of a salt of formula (I),', 'said compound B being in particular in the:, 'form of a complex of formula (A)M (II) in which A and M are as defined'}free form,form of the complex of formula (II),form of a mixture of the free form and of the complex of formula (II),form of a mixture of the free form and of the salt of formula (I),form of a mixture of the salt of formula (I) and of the complex of formula (II), orform of a mixture of the free form, of the salt of ...

PREPARATION METHOD OF PCI-32765 CRYSTAL FORM A

A preparation method of PCI-32765 crystalline form A, which comprises the following steps: 1) dissolving free base of PCI-32765 in a good solvent; 2) the solution prepared by Step 1) is dropwise added into an anti-solvent, stirred and added seed crystal of PCI-32765 Form A; Or the solution prepared by Step 1) is dropwise added into the suspension containing seed crystal of PCI-32765 Form A; 3) solution obtained by step 2) is continuously stirred and aged until crystal transformation is completed, then the crystal slurry is obtained; 4) crystal slurry in step 3) is filtered, washed, and dried to obtain the powder of PCI-32765 Form A. The preparation method of crystalline Form A provided by the present disclosure is a simple process and can be easily controlled, scaled up stably and conducted reliably. The process has high yield, good impurity removing capacity and is environmentally friendly. In addition, Form A provided by the present disclosure can be stably stored, and the hygroscopicity and solubility of Form A meet the requirements for medicinal use. 1. A preparation method of PCI-32765 crystalline Form A wherein the preparation method comprises the following steps:1) preparing a PCI-32765 free base solution by dissolving the free base solid of PCI-32765 in a solvent;2) adding dropwise the solution prepared by step 1) into an anti-solvent, then stirring the mixture at a temperature of 0˜20° C. and adding seed crystals of PCI-32765 Form A; or adding dropwise the solution prepared by step 1) into a suspension containing seed crystals of PCI-32765 Form A at a temperature of 0˜20° C.;3) continuously stirring the solution obtained by step 2) and aging the solution until a crystal slurry is obtained;4) filtering, washing and drying the f crystal slurry to obtain a powder of PCI-32765 crystalline Form A..2. The preparation method according to claim 1 , wherein the solvent is methanol or a mixed solvent containing methanol.3. The preparation method according to claim 2 ...

X-RAY IMAGING SYSTEM

An X-ray imaging system includes: a micro X-ray source array formation part configured to form a micro X-ray source array by partially shielding an X-ray emitted from an X-ray source; and an X-ray detector configured to detect an X-ray transmitted through a test object. The micro X-ray source array formation part includes a plurality of gratings disposed between the X-ray source and the X-ray detector. A ratio of X-rays transmitted through all of the plurality of gratings to X-rays generated from the X-ray source varies depending on a position of an X-ray generating point on the X-ray source, and the micro X-ray source array formation part forms a micro X-ray source array of a pattern in accordance with the variation of the ratio of the transmitted X-rays. 1. An X-ray imaging system comprising:a micro X-ray source array formation part configured to form a micro X-ray source array by partially shielding an X-ray emitted from an X-ray source; andan X-ray detector configured to detect an X-ray transmitted through a test object,wherein the micro X-ray source array formation part includes a plurality of gratings disposed between the X-ray source and the X-ray detector, a ratio of X-rays transmitted through all of the plurality of gratings to X-rays generated from the X-ray source varies depending on a position of an X-ray generating point on the X-ray source, and the micro X-ray source array formation part forms a micro X-ray source array of a pattern in accordance with the variation of the ratio of the transmitted X-rays.2. The X-ray imaging system according to claim 1 , wherein the micro X-ray source array formation part is configured such that the ratio of the transmitted X-rays periodically varies depending on a position of an X-ray generating point on the X-ray source claim 1 , and is configured to form a micro X-ray source array of a pattern corresponding to the periodical variation of the ratio of the transmitted X-rays.3. An X-ray imaging system comprising:a ...

AGENT FOR ADSORPTION OF RUTHENIUM FROM AQUEOUS SOLUTION AND METHOD FOR ADSORPTION OF RUTHENIUM FROM AQUEOUS SOLUTION

An adsorbent is provided to adsorb ruthenium from aqueous solution for recovery and/or reuse or removal of said ruthenium, and a method for purifying, for example, sea water and/or water containing sodium ions, magnesium ions, calcium ions, chlorine ions or other ions, polluted with a radioactive element, using said adsorbent. 1. A ruthenium adsorbent for adsorbing ruthenium from an aqueous solution thereof , said ruthenium adsorbent comprising manganese oxides as a primary component , provided that manganese oxides consisting of ε-MnOand/or γ-MnOare excluded from the manganese oxides.2. The ruthenium adsorbent according to claim 1 , wherein the aqueous solution comprises ruthenium in the form of a ruthenium cation claim 1 , and/or a ruthenium complex ion and/or a ruthenate ion.3. The ruthenium adsorbent according to claim 1 , wherein the manganese oxides have an amorphous structure and/or a layered structure and/or a tunnel structure.4. The ruthenium adsorbent according to claim 3 , wherein claim 3 , in the case that the manganese oxides have a tunnel structure claim 3 , the adsorbent comprises oxides of manganese having at least two linked MnOoctahedrons forming each horizontal and vertical side of the tunnel structure.5. The ruthenium adsorbent according to claim 1 , wherein the manganese oxides have an amorphous structure and/or α-MnOand/or δ-MnO.6. The ruthenium adsorbent according to claim 1 , wherein the manganese oxides have an amorphous structure and/or α-MnO claim 1 , and the aqueous solution comprises ruthenium in the form of a ruthenium cation.7. The ruthenium adsorbent according to claim 1 , wherein a content of manganese calculated as manganese dioxide is 50 parts by weight or more claim 1 , based on 100 parts by weight of the adsorbent.8. The ruthenium adsorbent according to claim 1 , further comprising at least one additional transition metal element other than manganese.9. The ruthenium adsorbent according to claim 8 , wherein the at least one ...

SOLVATED FORMS OF A BRUTON'S TYROSINE KINASE INHIBITOR

Described herein are solvates of the Bruton's tyrosine kinase (Btk) inhibitor 1-((R)-3-(4-amino-3-(4-phenoxyphenyl)-1H-pyrazolo[3,4-d]pyrimidin-1-yl)piperidin-1-yl)prop-2-en-1-one, including crystalline forms, and pharmaceutically acceptable salts thereof. Also disclosed are pharmaceutical compositions that include the solvates, as well as methods of using the solvates, alone or in combination with other therapeutic agents, for the treatment of autoimmune diseases or conditions, heteroimmune diseases or conditions, cancer, including lymphoma, and inflammatory diseases or conditions. 1. A solvate of 1-((R)-3-(4-amino-3-(4-phenoxyphenyl)-1H-pyrazolo[3 ,4-d]pyrimidin-1-yl)piperidin-1-yl)prop-2-en-1-one , wherein 1-((R)-3-(4-amino-3-(4-phenoxyphenyl)-1H-pyrazolo[3 ,4-d]pyrimidin-1-yl)piperidin-1-yl)prop-2-en-1-one is solvated with butyronitrile , 1 ,2-dimethoxyethane , hexafluorobenzene , acetophenone , chlorobenzene , dimethylacetamide , benzyl acetate , or 1 ,1 ,2-trichloroethane , or a mixture thereof.2. The solvate of claim 1 , which is in a crystalline form.3. A crystalline form (Form 1) of a butyronitrile solvate of 1-((R)-3-(4-amino-3-(4-phenoxyphenyl)-1H-pyrazolo[3 claim 1 ,4-d]pyrimidin-1-yl)piperidin-1-yl)prop-2-en-1-one that has at least one of the following properties:{'figref': {'@idref': 'DRAWINGS', 'FIG. 1'}, '(a) an X-ray powder diffraction (XRPD) pattern substantially the same as shown in ;'}(b) an X-ray powder diffraction (XRPD) pattern with at least two, four, six, or all of the characteristic peaks at 5.5±0.1° 2-Theta, 10.9±0.1° 2-Theta, 13.6±0.1° 2-Theta, 14.8±0.1° 2-Theta, 17.3±0.1° 2-Theta, 18.7±0.1° 2-Theta, 20.0±0.1° 2-Theta, and 21.8±0.1° 2-Theta;{'figref': {'@idref': 'DRAWINGS', 'FIG. 2'}, '(c) a DSC thermogram substantially the same as the one set forth in ;'}(d) a DSC thermogram with an endotherm event at between about 100-125° C.;{'figref': {'@idref': 'DRAWINGS', 'FIG. 2'}, '(e) a thermo-gravimetric analysis (TGA) thermogram substantially ...

CO-CRYSTALS OF A BRUTON'S TYROSINE KINASE INHIBITOR

Disclosed are co-crystals of the Bruton's tyrosine kinase (Btk) inhibitor 1-((R)-3-(4-amino-3-(4-phenoxyphenyl)-1H-pyrazolo[3,4-d]pyrimidin-1-yl)piperidin-1-yl)prop-2-en-1-one, including crystalline forms, and pharmaceutically acceptable salts thereof. Also disclosed are pharmaceutical compositions that include the co-crystals, as well as methods of using co-crystals, alone or in combination with other therapeutic agents, for the treatment of autoimmune diseases or conditions, heteroimmune diseases or conditions, cancer, including lymphoma, and inflammatory diseases or conditions. 1. A co-crystal of 1-((R)-3-(4-amino-3-(4-phenoxyphenyl)-1H-pyrazolo[3 ,4-d]pyrimidin-1-yl)piperidin-1-yl)prop-2-en-1-one and a coformer.2. The co-crystal of claim 1 , wherein the coformer is benzoic acid claim 1 , succinic acid claim 1 , 3-hydroxybenzoic acid claim 1 , nicotinamide claim 1 , 4-aminobenzoic acid claim 1 , salicylic acid claim 1 , sorbic acid claim 1 , fumaric acid claim 1 , salicylamide claim 1 , trans-cinnamic acid claim 1 , 4-hydroxybenzoic acid claim 1 , 1-hydroxy-2-naphthoic acid claim 1 , sulfamic acid claim 1 , 1 claim 1 ,5-naphthalene disulfonic acid claim 1 , 2-ethoxybenzamide claim 1 , 4-aminosalicylic acid claim 1 , or stearic acid claim 1 , or a combination thereof.4. The co-crystal of claim 3 , wherein the co-crystal has an X-ray powder diffraction (XRPD) pattern substantially the same as shown in .5. The co-crystal of claim 3 , wherein the co-crystal has an X-ray powder diffraction (XRPD) pattern with characteristic peaks at 9.0±0.1° 2-Theta claim 3 , 12.1±0.1° 2-Theta claim 3 , 18.2±0.1° 2-Theta claim 3 , 21.2±0.1° 2-Theta claim 3 , 22.9±0.1° 2-Theta claim 3 , and 27.9±0.1° 2-Theta.6. The co-crystal of claim 3 , wherein the co-crystal has substantially the same X-ray powder diffraction (XRPD) pattern post-storage at 40° C. and 75% RH for at least a week.7. The co-crystal of claim 3 , wherein the co-crystal has substantially the same X-ray powder diffraction ( ...

X-RAY IMAGING APPARATUS

The X-ray imaging apparatus is provided with a plurality of gratings including an X-ray source and a first grating, a detector, a grating rotation mechanism for rotating a plurality of gratings respectively, and an image processor for generating at least a dark field image. The image processor is configured to generate a dark field image captured by arranging the grating at a plurality of angles in a plane orthogonal to the optical axis direction. 1. An X-ray imaging apparatus comprising:an X-ray source;a plurality of gratings including a first grating for forming a self-image by X-rays irradiated from the X-ray source and a second grating for causing interference with the self-image of the first grating;a detector configured to detect the X-rays irradiated from the X-ray source;a grating rotation mechanism configured to rotate each of the plurality of gratings in a plane orthogonal to an optical axis direction of the X-rays; andan image processor configured to generate at least a dark field image from an intensity distribution of the X-rays detected by the detector,wherein the image processor is configured to generate the dark field image captured by arranging the gratings at a plurality of angles in the plane orthogonal to the optical axis direction.2. The X-ray imaging apparatus as recited in claim 1 , whereinthe grating rotation mechanism is configured to arrange the plurality of gratings in at least any two directions among a vertical direction, a lateral direction, and an oblique direction in the plane orthogonal to the optical axis direction.3. The X-ray imaging apparatus as recited in claim 1 , further comprising:a grating moving mechanism configured to move at least one of the plurality of gratings,wherein the grating moving mechanism is configured to move the at least one of the plurality of gratings together with the grating rotation mechanism after rotating the plurality of gratings.4. The X-ray imaging apparatus as recited in claim 3 , whereinthe ...

CATHODE ACTIVE MATERIALS HAVING IMPROVED PARTICLE MORPHOLOGIES

Mixed-metal oxides and lithiated mixed-metal oxides are disclosed that involve compounds according to, respectively, NiMnCoMeOand LiNiMnCoMeO. In these compounds, Me is selected from B, Na, Mg, Al, Si, K, Ca, Sc, Ti, V, Cr, Fe, Cu, Zn, Ga, Ge, Zr, Nb, Mo, Ru, Ag, In, and combinations thereof; 0≦x≦1; 0≦y≦1; 0≦z≦1; x+y+z>0; 0≦α≦0.5; and x+y+α>0. For the mixed-metal oxides, 1≦β≦5. For the lithiated mixed-metal oxides, −0.1≦γ≦1.0 and 1.9≦β≦3. The mixed-metal oxides and the lithiated mixed-metal oxides include particles having an average density greater than or equal to 90% of an ideal crystalline density. 1. A compound according to Formula (I):{'br': None, 'sub': 2', '1−σ', 'σ', '2, '(v)[MnO].(1−v)[CoAlO]\u2003\u2003(I)'} [{'br': None, '0<σ≦0.05, and'}, {'br': None, '0.01≦v≦0.50.'}], 'wherein'}2. The compound of claim 1 , wherein 0<σ≦0.03.3. The compound of claim 1 , wherein 0<σ≦0.02.4. The compound of claim 1 , wherein 0<σ≦0.01.5. The compound of claim 1 , wherein 0.01≦v<0.10.6. The compound of claim 1 , wherein 0.01≦v<0.05.7. The compound of claim 1 , wherein 0.01≦v<0.05.8. The compound of claim 1 , wherein an amount of Al is at least 900 ppm.9. The compound of claim 1 , wherein an amount of Al is less than or equal to 2000 ppm.10. The compound of claim 1 , wherein an amount of Al is less than or equal to 1500 ppm.11. The compound of claim 1 , wherein an amount of Al is less than or equal to 1000 ppm.12. A compound according to Formula (II):{'br': None, 'sub': 2', '3', 'α', '1−σ', 'σ', '2, '(v) [LiMnO].(1−v)[LiCoAlO]\u2003\u2003(II)'} [{'br': None, '0.95≦α≦0.99,'}, {'br': None, '0<σ≦0.05, and'}, {'br': None, '0.01≦v≦0.50.'}], 'wherein'}13. The compound of claim 12 , wherein 0<σ<0.03.14. The compound of claim 12 , wherein 0<σ<0.02.15. The compound of claim 12 , wherein 0<σ<0.01.16. The compound of claim 12 , wherein 0.01≦v<0.10.17. The compound of claim 12 , wherein 0.01≦v<0.05.18. The compound of claim 12 , wherein 0.01≦v<0.05.19. The compound of claim 12 , wherein an ...

METHOD FOR EXAMINING AN OBJECT USING AN X-RAY RECORDING SYSTEM FOR PHASE CONTRAST IMAGING WITH STOCHASTIC PHASE SCANNING

A method, for examining an object using an X-ray recording system, includes during an X-ray image recording, moving components relative to one another with the lateral displacement by displacement distances. The method includes generating the X-ray image recording during the displacement from n partial images, so that the total exposure time of the X-ray image recording is made up from a sum of partial exposure times. In each of the partial images, the intensity is determined in each pixel. The position of the second component relative to the first component is determined for each recording of the partial images. Finally, the image information is determined from the partial images and the displacements. 1. A method for examining an object with an X-ray recording system for phase contrast imaging including at least one X-ray emitter for generating a quasi-coherent X-ray beam as a first component , an X-ray image detector including pixel elements arranged in a matrix , a diffraction or phase grating arranged between the object and the X-ray image detector , and an analyzer grating associated with the phase grating for generating an intensity pattern or interference pattern , at least two of the X-ray image detector , phase grating and analyzer grating being fixedly connected to one another and form a second component , the method comprising:moving the components, during an X-ray image recording the components, relative to one another with the lateral displacement by displacement distances;generating the X-ray image recording during the displacement from n partial images, such that a total exposure time of the X-ray image recording is made up of a sum of partial exposure times;determining, in each of the partial images, an intensity in each pixel;determining a position of the second component relative to the first component for each recording of the partial images; anddetermining image information from the partial images and the displacements.2. The examination method ...

MATERIAL DIFFERENTIATION WITH PHASE CONTRAST IMAGING

A method and system to determine material composition of an object comprises capturing a series of digital radiographic images of the object using a single exposure energy level. An intensity of the captured images is determined as well as phase shift differences. A difference in material composition of the object may be determined based on a combination of the determined intensity and the modulated phase shifts of the captured images. 1. A method of determining material composition of an object , the method comprising:capturing a series of digital radiographic images of the object using an x-ray beam having a single average energy magnitude;determining an intensity of the captured images of the object;determining a phase shift magnitude that occurred in the object; anddetermining a difference in material composition of the object based on a combination of the determined intensity and the determined phase shift of the captured images.2. The method of claim 1 , wherein the step of capturing comprises using a digital detector claim 1 , the digital detector comprising a plurality of pixels claim 1 , and wherein the steps of determining the intensity and determining the phase shift magnitude are performed for each pixel.3. The method of claim 2 , wherein the step of capturing comprises positioning a plurality of gratings in a path of the x-ray beam and phase stepping only a first one of the gratings into a different position for capturing each of the radiographic images.4. The method of claim 3 , wherein the step of phase stepping comprises repositioning the first one of the gratings an equal distance for each of a plurality of phase steps claim 3 , wherein a total distance of the plurality of phase steps is equal or greater than a pitch magnitude of the first one of the gratings.5. The method of claim 4 , wherein a second one of the gratings comprises a phase grating for generating an interference pattern of the x-ray beam after the x-ray beam has passed through the ...

RADIOGRAPHIC IMAGE GENERATING DEVICE

First ROI pixel values of a first region of interest of a radiographic intensity distribution image , and second ROI pixel values of a second region of interest of the radiographic intensity distribution image , are acquired. One of the first and second regions of interest is set to be at a position, or vicinity thereof, where a phase difference in the intensity modulation period within the radiographic intensity distribution image, with respect to the other region of interest, becomes π/2. Next, an elliptical locus obtained by plotting the first and second ROI pixel values for each radiographic intensity distribution image is determined. k angle region images are then acquired using the radiographic intensity distribution images corresponding to at least k angle regions that have been obtained by dividing the elliptical locus for each given angle. A radiographic image is then generated using the k angle region images. k is an integer of three or more. 1. A device for generating a radiographic image using a radiographic intensity distribution image , comprising:an imaging section,a drive section, and the imaging section comprises a radiation source, a grating section, and an image detection unit;', 'the radiation source is configured to irradiate radiation towards the grating section;', 'the image detection unit is configured to acquire a plurality of radiographic intensity distribution images by detecting radiation that has penetrated the grating section at given time intervals;', 'the grating section has at least one grating that applies a periodic intensity modulation to the radiographic intensity distribution image;', 'the at least one grating has a periodic structure;', 'the drive section is configured to move the at least one grating in a direction that crosses an advancement direction of the radiation;', 'the processing section comprises a region of interest (ROI) pixel value acquisition section, an elliptical locus determination section, an angle region ...

POSITIVE ELECTRODE ACTIVE MATERIAL FOR LITHIUM SECONDARY BATTERY, METHOD FOR PREPARING THE SAME, AND SECONDARY BATTERY INCLUDING THE SAME

The present invention relates to a positive electrode active material for a secondary battery, a method for preparing the same, and a secondary battery including the same, and more particularly to a positive electrode active material for a secondary battery, which includes lithium transition metal oxide particles represented by Formula 1; and lithium metal phosphate nanoparticles disposed on the surface of the lithium transition metal oxide particles and represented by Formula 2, a method for preparing the same, and a lithium secondary battery including the same. 1. A positive electrode active material for a secondary battery , the positive electrode active material comprising:lithium transition metal oxide particles represented by the following Formula 1; and {'br': None, 'sub': (1+a)', '1-b-c', 'b', 'c', '2, 'Li(NiMCo)O\u2003\u2003[Formula 1]'}, 'lithium metal phosphate nanoparticles disposed on a surface of the lithium transition metal oxide particles, the lithium metal phosphate nanoparticles being represented by the following Formula 2 {'br': None, 'sub': 1+x', 'x', '2-x', '4', '3, 'LiM′M″(PO)\u2003\u2003[Formula 2]'}, 'where M is at least one metal selected from the group consisting of Mn, Al, Cu, Fe, Mg, Cr, Sr, V, Sc and Y, 0≦a≦0.2, 0≦b≦1, and 0≦c≦1,'}where M′ is Al, Y, Cr, or Ca, M″ is Ge, Ti, Sn, Hf, Zn, or Zr, and 0≦x≦0.5.2. (canceled)3. The positive electrode active material for a secondary battery of claim 1 , wherein the lithium metal phosphate nanoparticles represented by Formula 2 has a NASICON structure.4. The positive electrode active material for a secondary battery of claim 1 , wherein the lithium metal phosphate nanoparticles represented by Formula 2 comprise at least one selected from the group consisting of LiTi(PO) claim 1 , LiZr(PO) claim 1 , LiAlTi(PO)(0≦x≦0.5) claim 1 , LiAlZr(PO)(0≦x≦0.5) claim 1 , and LiYZr(PO)(0≦x≦0.5).5. (canceled)6. The positive electrode active material for a secondary battery of claim 1 , wherein a lithium ion ...

Non-linear solution for 2D phase shifting

Disclosed is a method of reconstructing a representative detailed phase image from a set of fringe pattern interferogram images of an object. The images are captured by an x-ray interferometer having a crossed diffraction grating. A set of captured fringe pattern interferogram images from the x-ray interferometer are provided, the set comprising no more than eight captured fringe pattern interferogram images. The method determines an estimate of an absorption parameter (a), two-dimensional amplitude modulation parameters (m, m), and two-dimensional phase modulation parameters (ξand ξ) from a closed-form solution using the received set of captured fringe pattern interferogram images, and reconstructs the representative detailed phase image using the parameter estimates. 1. A method of reconstructing a representative detailed phase image from a set of fringe pattern interferogram images of an object captured by an x-ray interferometer having a crossed diffraction grating , said method comprising:providing the set of captured fringe pattern interferogram images from the x-ray interferometer, said set comprising no more than eight captured fringe pattern interferogram images;determining an estimate of an absorption parameter, two-dimensional amplitude modulation parameters, and two-dimensional phase modulation parameters from a closed-form solution using the received set of captured fringe pattern interferogram images; andreconstructing the representative detailed phase image using the parameter estimates.2. The method of claim 1 , further comprising the determining step revising the parameter estimates.3. The method of claim 2 , wherein the parameter estimates for each pixel are revised by generating a simulated set of fringe intensities for that pixel and comparing the simulated set of fringe intensities with the set of captured fringe intensities at that pixel.4. The method of claim 2 , wherein the parameter estimates for each pixel are revised by generating a ...

SYSTEM FOR X-RAY DARK FIELD, PHASE CONTRAST AND ATTENUATION TOMOSYNTHESIS IMAGE ACQUISITION

The present invention relates to a system () for X-ray dark field, phase contrast and attenuation tomosynthesis image acquisition. The system comprises an X-ray source (), an interferometer arrangement (), an X-ray detector (), a control unit (), and an output unit. A first axis is defined extending from a centre of the X-ray source to a centre of the X-ray detector. An examination region is located between the X-ray source and the X-ray. The first axis extends through the examination region, and the examination region is configured to enable location of an objection to be examined. The interferometer arrangement is located between the X-ray source and the X-ray detector. The interferometer arrangement comprises a first grating () and a second grating (). A second axis is defined that is perpendicular to a plane that is defined with respect to a centre of the first grating and/or a centre of the second grating. The control unit is configured to control movement of the X-ray source and/or movement of the X-ray detector to provide a plurality of image acquisition states, wherein the X-ray source and X-ray detector are configured to operate to acquire image data. For each of the plurality of image acquisition states the first axis extends through the examination region at a different angle. The control unit is configured to control movement of the first grating or movement of the second grating in a lateral position direction perpendicular to the second axis. For each of the acquisition states the first grating or second grating is at a different lateral position of a plurality of lateral positions. The output unit is configured to output one or more of: dark field image data, phase contrast image data, and attenuation image data. 1. A system for X-ray dark field , phase contrast and attenuation tomosynthesis image acquisition , the system comprising:an X-ray source;an interferometer arrangement;an X-ray detector;a control unit; and wherein a first axis is defined ...

TEMPERATURE DETERMINATION USING RADIATION DIFFRACTION

A system includes a focusing system, a radiation detector, and a controller. The focusing system is configured to receive an incident radiation beam from a radiation source and focus the incident radiation beam on a portion of a component of a high temperature mechanical system. The incident radiation beam scatters from the portion of the component as a diffracted radiation beam. The focusing system is further configured to focus the diffracted radiation beam from the portion of the component on the radiation detector. The radiation detector is configured to detect a diffraction pattern of the diffracted radiation beam from the portion of the component. The controller is configured to determine a temperature of the portion of the component based on the diffraction pattern. 1. A method , comprising:receiving, by a focusing system, an incident radiation beam from a radiation source;focusing, using the focusing system, the incident radiation beam on a portion of a component of a high temperature mechanical system, wherein the incident radiation beam scatters as a diffracted radiation beam from the portion of the component;focusing, using the focusing system, the diffracted radiation beam from the portion of the component on a radiation detector;detecting, by the radiation detector, a diffraction pattern of the diffracted radiation beam from the portion of the component; anddetermining, by a controller, a temperature of the portion of the component based on the diffraction pattern.2. The method of claim 1 , wherein the portion of the component is a gauge volume of the component defined by the focused incident radiation beam and the focused diffracted radiation beam claim 1 , and the temperature is an average temperature of the gauge volume of the component.3. The method of claim 1 , wherein the focusing system comprises an incidence aperture positioned to intersect the incident radiation beam and a diffraction aperture positioned to intersect the diffracted radiation ...

Desulfurization catalyst for hydrocarbon oils, its preparation, and use thereof

Disclosed is a desulfurization catalyst for hydrocarbon oils, comprising a support and at least one metal promoter selected from the group consisting of cobalt, nickel, iron and manganese, the support comprising at least one metal oxide selected from the group consisting of oxides of Group IIB, Group VB and Group VIB metals and a refractory inorganic oxide, wherein the support further comprises at least about 5% by weight of vanadium carbide, based on the total weight of the desulfurization catalyst for hydrocarbon oils. The desulfurization catalyst for hydrocarbon oils shows a good stability, a high desulfurization activity, an excellent abrasion resistance, and a long service life. Also disclosed is a process for preparing the desulfurization catalyst for hydrocarbon oils, and use of the catalyst in the desulfurization of sulfur-containing hydrocarbon oils. 1. A desulfurization catalyst for hydrocarbon oils , comprising a support and at least one metal promoter selected from the group consisting of cobalt , nickel , iron and manganese , the support comprising at least one metal oxide selected from the group consisting of oxides of Group IIB , Group VB and Group VIB metals and a refractory inorganic oxide , wherein the support further comprises at least about 5% by weight of vanadium carbide , based on the total weight of the desulfurization catalyst for hydrocarbon oils.2. The desulfurization catalyst for hydrocarbon oils according to claim 1 , wherein the desulfurization catalyst is substantially free of silica.3. The desulfurization catalyst for hydrocarbon oils according to claim 1 , wherein the desulfurization catalyst comprises or consists of:1) about 10-80% by weight of the metal oxide;2) about 3-35% by weight of the refractory inorganic oxide;3) about 5-40% by weight of the vanadium carbide; and4) about 5-30% by weight of the metal promoter,based on the total weight of the desulfurization catalyst for hydrocarbon oils.4. The desulfurization catalyst for ...

ALL-SOLID-STATE BATTERY

An all-solid-state battery includes a pair of electrode layers consisting of first and second electrode layers, and a solid-state electrolyte layer positioned between the pair of electrode layers, wherein the first electrode layer contains an electrode active material having an olivine-type crystalline structure, the solid-state electrolyte layer contains a solid-state electrolyte having a NASICON-type crystalline structure, and the solid-state electrolyte layer in the vicinity of the first electrode layer is expressed by a composition formula LiACoM′M″PO. The all-solid-state battery can improve the long-term cycle stability. 2. The all-solid-state battery according to claim 1 , wherein A as mentioned above is Mg.3. The all-solid-state battery according to claim 1 , wherein the electrode active material having an olivine-type crystalline structure is LiCoPO.4. The all-solid-state battery according to claim 2 , wherein the electrode active material having an olivine-type crystalline structure is LiCoPO.5. The all-solid-state battery according to claim 1 , wherein the solid-state electrolyte layer at least in the vicinity of the first electrode layer is constituted by a primary phase having a NASICON-type crystalline structure and secondary phases of crystalline structures different from that of the primary phase claim 1 , and a ratio of X-ray diffraction peak intensities I/(I+I) is 2 to 40% claim 1 , where Iindicates the total sum of the main diffraction peak intensities of the respective secondary phases claim 1 , while Iindicates the main diffraction peak intensity of the primary phase.6. The all-solid-state battery according to claim 2 , wherein the solid-state electrolyte layer at least in the vicinity of the first electrode layer is constituted by a primary phase having a NASICON-type crystalline structure and secondary phases of crystalline structures different from that of the primary phase claim 2 , and a ratio of X-ray diffraction peak intensities I/(I+I) is ...

THERAPEUTICALLY ACTIVE COMPOUNDS AND THEIR METHODS OF USE

Provided are compounds useful for treating cancer and methods of treating cancer, comprising administering to a subject in need thereof a compound described herein. 1. A pharmaceutical composition comprising a crystalline form of 2-methyl-1-[(4-[6-(trifluoromethyl)pyridin-2-yl]-6-{[2-(trifluoromethyl)pyridin-4-yl]amino}-1 ,3 ,5-triazin-2-yl)amino]propan-2-ol mesylate and at least one pharmaceutically acceptable carrier or adjuvant , wherein the crystalline form is characterized by an X-ray powder diffraction pattern substantially similar to .2. The pharmaceutical composition of for oral administration.3. The pharmaceutical composition of claim 2 , wherein the composition is a tablet.4. A pharmaceutical composition comprising a crystalline form of 2-methyl-1-[(4-[6-(trifluoromethyl)pyridin-2-yl]-6-{[2-(trifluoromethyl)pyridin-4-yl]amino}-1 claim 2 ,3 claim 2 ,5-triazin-2-yl)amino]propan-2-ol mesylate and at least one pharmaceutically acceptable carrier or adjuvant claim 2 , wherein the crystalline form is characterized by an X-ray powder diffraction pattern substantially similar to .5. The pharmaceutical composition of for oral administration.6. The pharmaceutical composition of claim 5 , wherein the composition is a tablet.7. A method of treating an advanced hematologic malignancy in a subject claim 1 , wherein the advanced hematologic malignancy is selected from acute myelogenous leukemia claim 1 , myelodysplastic syndrome claim 1 , chronic myelomonocytic leukemia claim 1 , myeloid sarcoma claim 1 , multiple myeloma claim 1 , and lymphoma claim 1 , each characterized by the presence of a mutant allele of IDH2 claim 1 , comprising administering to the subject the pharmaceutical composition of .8. The method of claim 7 , wherein the advanced hematologic malignancy is acute myelogenous leukemia.9. The method of claim 8 , wherein the acute myelogenous leukemia is relapsed or primary refractory.10. A method of treating an advanced hematologic malignancy in a subject ...

CORRECTION IN SLIT-SCANNING PHASE CONTRAST IMAGING

The present invention relates to calibration in X-ray phase contrast imaging. In order to remove the disturbance due to individual gain factors, a calibration filter grating () for a slit-scanning X-ray phase contrast imaging arrangement is provided that comprises a first plurality of filter segments () comprising a filter material () and a second plurality of opening segments (). The filter segments and the opening segments are arranged alternating as a filter pattern (). The filter material is made from a material with structural elements () comprising structural parameters in the micrometer region. The filter grating is movably arranged between an X-ray source grating () and an analyzer grating () of an interferometer unit in a slit-scanning system of a phase contrast imaging arrangement. The slit-scanning system is provided with a pre-collimator () comprising a plurality of bars () and slits (). The filter pattern is aligned with the pre-collimator pattern (). 1. A calibration filter grating for transforming coherent X-ray into incoherent X-ray in a slit-scanning X-ray phase contrast imaging arrangement , comprising:a first plurality of filter segments comprising a filter material; anda second plurality of opening segments;wherein the filter segments and the opening segments are arranged alternating as a filter pattern;wherein the filter material is made from a material with structural elements comprising structural parameters in the micrometer region; andwherein the filter grating is configured to be movably arranged between an X-ray source grating and an analyzer grating of an interferometer unit in a slit-scanning system of a phase contrast imaging arrangement; andwherein the filter pattern is configured to be aligned with a slit pattern of the slit-scanning system.2. Calibration filter grating according to claim 1 , wherein the structural elements are provided in a maximum range of 10 μm.3. Calibration filter grating according to claim 1 , wherein the filter ...

X-RAY DIFFRACTIVE GRATING AND X-RAY TALBOT INTERFEROMETER

An X-ray diffractive grating includes a phase advance portion and a plurality of phase delay portions. The phase advance portion includes a grating material. In each of the phase delay portions, the thickness of the grating material is less than that in the phase advance portion, and the area occupancy of the phase delay portions in the corresponding two-dimensional grating pattern is 15% or more but less than 45%. The phase delay portions are arranged in a hexagonal lattice shape. 1. An X-ray diffractive grating comprising:a phase advance portion; anda plurality of phase delay portions, whereinthe phase advance portion includes a grating material,in each of the phase delay portions, a thickness of the grating material is less than a thickness of the grating material in the phase advance portion, and an area occupancy of the phase delay portions in a two-dimensional grating pattern of the X-ray diffractive grating is 15% or more but less than 45%, andthe phase delay portions are arranged in a hexagonal lattice shape in the two-dimensional grating pattern.2. The X-ray diffractive grating according to claim 1 , whereinthe area occupancy of the phase delay portions in the two-dimensional grating pattern is 30% or more but less than 35%.3. The X-ray diffractive grating according to claim 1 , whereina shape of the phase delay portion in the two-dimensional grating pattern is a circle or a hexagon.4. The X-ray diffractive grating according to claim 1 , whereinthe thickness of the grating material in each of the phase delay portions is 0.5. The X-ray diffractive grating according to claim 1 , whereinthe phase delay portion has another material different from the grating material in a refractive index to an X-ray.6. The X-ray diffractive grating according to claim 5 , whereinthe refractive index to the X-ray of the other material is closer to 1, compared with the refractive index of the grating material.7. The X-ray diffractive grating according to claim 1 , whereinthe X- ...

ROTATIONAL PHASE UNWRAPPING

A phase unwrapping method for image demodulation comprises receiving a plurality of images of a fringe pattern captured by rotating the fringe pattern by a predetermined rotation angle. The method estimates a first wrapped phase value for a portion of a first image of the plurality of images and a second wrapped phase value for a corresponding portion of a second image, and establishes a first plurality of elements associated with the first wrapped phase value. For a candidate element from the first plurality of elements, the method determines a constraining element associated with the candidate element using the second wrapped phase value, where the association is established using the candidate element and the predetermined rotation angle, and unwraps the phase for the portion of at least one of the first and second images using the candidate element based on the determined constraining element. 1. A phase unwrapping method for image demodulation , the method comprising:receiving a plurality of images of a fringe pattern, the images being captured by rotating the fringe pattern by a predetermined rotation angle;estimating a first wrapped phase value for a portion of a first image of the plurality of images and a second wrapped phase value for a corresponding portion of a second image of the plurality of images;establishing a first plurality of elements associated with the first wrapped phase value;for a candidate element from the first plurality of elements associated with the first wrapped phase value, determining a constraining element associated with the candidate element using the second wrapped phase value, wherein the association is established using the candidate element and the predetermined rotation angle; and,unwrapping the phase for the portion of at least one of the first and second images using the candidate element based on the determined constraining element.2. A method according to claim 1 , where the fringe pattern is a two-dimensional fringe ...

CRYSTALLINE FORM OF THE COMPOUND (S)-3-{4-[5-(2-CYCLOPENTYL-6-METHOXY-PYRIDIN-4-YL)-[1,2,4]OXADIAZOL-3-YL]-2-ETHYL-6-METHYL-PHENOXY}-PROPANE-1,2-DIOL

The present invention relates to a crystalline form of the compound (S)-3-{4-[5-(2-cyclopentyl-6-methoxy-pyridin-4-yl)-[1,2,4]oxadiazol-3-yl]-2-ethyl-6-methyl-phenoxy}-propane-1,2-diol. 1. A crystalline form of the compound (S)-3-{4-[5-(2-cyclopentyl-6-methoxy-pyridin-4-yl)-[1 ,2 ,4]oxadiazol-3-yl]-2-ethyl-6-methyl-phenoxy}-propane-1 ,2-diol , characterised by the presence of peaks in the X-ray powder diffraction diagram at the following angles of refraction 2θ: 5.4° , 8.5° , and 10.8°.2. The crystalline form according to claim 1 , characterised by the presence of peaks in the X-ray powder diffraction diagram at the following angles of refraction 2θ: 4.2° claim 1 , 5.4° claim 1 , 8.0° claim 1 , 8.5° claim 1 , and 10.8°.3. The crystalline form according to claim 1 , characterised by the presence of peaks in the X-ray powder diffraction diagram at the following angles of refraction 2θ: 4.2° claim 1 , 5.4° claim 1 , 8.0° claim 1 , 8.5° claim 1 , 10.8° claim 1 , 12.7° claim 1 , 14.4° claim 1 , 17.7° claim 1 , 20.4° claim 1 , and 21.3°.4. The crystalline form according to any one of to claim 1 , which essentially shows the X-ray powder diffraction pattern as depicted in .5. The crystalline form according to any one of to claim 1 , which has a melting point of about 79° C. as determined by differential scanning calorimetry.6. A crystalline form of the compound (S)-3-{4-[5-(2-cyclopentyl-6-methoxy-pyridin-4-yl)-[1 claim 1 ,2 claim 1 ,4]oxadiazol-3-yl]-2-ethyl-6-methyl-phenoxy}-propane-1 claim 1 ,2-diol obtainable by:i) dissolving 20 mg of (S)-3-{4-[5-(2-cyclopentyl-6-methoxy-pyridin-4-yl)-[1,2,4]oxadiazol-3-yl]-2-ethyl-6-methyl-phenoxy}-propane-1,2-diol in amorphous form in 0.1 mL ethyl acetate;ii) adding 0.9 mL n-heptane gradually over 1 h; andiii) letting it standing closed overnight at 20-25° C.; oriv) mixing 25-30 mg of (S)-3-{4-[5-(2-cyclopentyl-6-methoxy-pyridin-4-yl)-[1,2,4]oxadiazol-3-yl]-2-ethyl-6-methyl-phenoxy}-propane-1,2-diol in amorphous form with 5 mL ethyl ...

System and method for phase-contrast x-ray imaging

A differential phase contrast X-ray imaging system includes an X-ray illumination system, a beam splitter arranged in a radiation path of the X-ray illumination system, and a detection system arranged in a radiation path to detect X-rays after passing through the beam splitter.

STRUCTURAL BODY AND X-RAY TALBOT INTERFEROMETER INCLUDING THE STRUCTURAL BODY

A structural body, comprising: a resin layer with a curved surface; a first bonding layer containing a water-soluble polymer; a second bonding layer having a hydrogen-bonding surface; and a gold layer in this order, the first bonding layer being between, and in contact with, the curved surface of the resin layer and the hydrogen-bonding surface of the second bonding layer. 1. A structural body , comprising:a resin layer with a curved surface;a first bonding layer containing a water-soluble polymer;a second bonding layer having a hydrogen-bonding surface; anda gold layer in this order,the first bonding layer being between, and in contact with, the curved surface of the resin layer and the hydrogen-bonding surface of the second bonding layer.2. The structural body according to claim 1 , wherein the gold layer has a plurality of holes.3. The structural body according to claim 2 , wherein the plurality of holes have an aspect ratio of between 7 and 60 inclusive.4. The structural body according to claim 2 , wherein the plurality of holes are disposed at intervals of between 0.5 μm and 10 μm inclusive.5. The structural body according to claim 1 , wherein the gold layer has a plurality of recess portions.6. The structural body according to claim 5 , wherein the plurality of recess portions have an aspect ratio of between 7 and 60 inclusive.7. The structural body according to claim 5 , wherein the plurality of recess portions are disposed at intervals of between 0.5 μm and 10 μm inclusive.8. The structural body according to claim 1 , wherein the hydrogen-bonding surface of the second bonding layer is formed of one from a group comprising: a metal oxide claim 1 , semi-metal oxide claim 1 , a metal nitride and a semi-metal nitride.9. The structural body according to claim 1 , wherein the curved surface is a spherical surface or a cylindrical surface.10. The structural body according to claim 2 , wherein the plurality of holes are arranged in two dimensions claim 2 , and the ...

DIFFERENTIAL PHASE CONTRAST X-RAY IMAGING SYSTEM AND COMPONENTS

A differential phase contrast X-ray imaging system includes an X-ray illumination system, a beam splitter arranged in an optical path of the X-ray illumination system, and a detection system arranged in an optical path to detect X-rays after passing through the beam splitter. 118.-. (canceled)19. A method for X-ray illumination , comprising:providing a poly-energetic X-ray beam for illuminating an object to be imaged;reflecting a first portion of said poly-energetic X-ray beam, the first portion comprising X-rays that have energies less than a lower pass-band energy;transmitting a second portion of said poly-energetic X-ray beamattenuating said first portion of said poly-energetic X-ray beam;reflecting a third portion of said second portion of said poly-energetic X-ray beam, said third portion comprising X-rays that have energies less than an upper pass-band energy;attenuating a fourth portion of said second portion of said poly-energetic X-ray beam, the fourth portion comprising X-rays that are not reflected; andproviding said third portion of said second portion of said poly-energetic X-ray beam to illuminate said object to be imaged, wherein said third portion comprises X-rays having energies between said upper pass-band energy and said lower pass-band energy.20. The method according to claim 19 , wherein said reflecting said firstportion of said poly-energetic X-ray beam and said transmitting said second portion of said poly-energetic X-ray beam further comprises:directing said poly-energetic X-ray beam to be incident upon a membrane X-ray mirror comprising a reflecting layer that comprises a high-Z material on a support layer that comprises a low-Z material,wherein Z is an atomic number,wherein said high-Z material includes atomic elements with Z at least 42, andwherein said low-Z material includes atomic elements with Z less than 14. This application is a continuation of U.S. application Ser. No. 13/493,392, filed Jun. 11, 2012 which claims priority to U.S. ...

X-RAY IMAGING

A method of aligning masks for phase imaging or phase contrast imaging in X-ray apparatus using a pixel-type X-ray detector makes use of non-idealities of all real detectors. A mask may be provided before the sample to generate beams, adjacent to the pixels of the detector or both. The method includes moving the mask into a plurality of translational position increments and identifying the increment for which the intensity has a maximum or minimum. The identified value of the increment may vary over the pixels of the detector. Alignment positions are selected in which steps in a plot of the increment over the area of the detector are minimised and/or aligned with the rows and columns of pixels. 1. A method of aligning at least one mask in an X-ray imaging apparatus in at least one translational and/or rotational direction of the at least one mask , the mask having a plurality of apertures , the method including:{'b': '2', '(a) directing X-rays from a source () in a z-direction through the mask to the X-ray detector orientated perpendicularly to the X-rays, the X-ray detector having pixels arranged in an x-direction and in a perpendicular y-direction;'}(b) for each of a plurality of potential alignment positions in at least one of the translational and/or rotational directions, translating the mask in the x- or y-direction with respect to the X-ray detector to a plurality of translational position increments, identifying for pixels in the detector the translational position increment corresponding to an extremum of the detected intensity profile for that pixel, and hence identifying steps in a predetermined function which separates the regions of the detector that have the same position of the extremum for all pixels in that area;(c) selecting the alignment position in which the steps in the identified translational position increment over the two-dimensional area of the pixel detector are minimised and/or aligned with the x- and y-directions, and(d) moving the mask ...

Computed Tomography Calibration Systems and Methods

According to certain embodiments of the invention, computer hardware and software can perform single or dual-energy decomposition calculations and predict CT values for either single-energy or dual energy CT from basis material decomposition estimates derived using theoretical models. Using that information, the computer hardware and software can (among other things) present one dimensional information from a CT scanner, such as representative pixel value, in two dimensions, such as a line in two dimensional basis material space. 1. A method for execution by a computing device that comprises:a. For a reference material and for each of a first basis material and a second basis material, receiving in a computing device an energy-dependent, mass attenuation coefficient for the material as a function of its elemental composition, molecular composition or elemental and molecular composition;b. Deriving by the computing device a basis material composition of the reference material relative to the first basis material and the second basis material;c. Characterizing by the computing device the response of a CT scanner to the reference material relative to the first basis material and the second basis material at a first energy level by receiving imaging information for the reference material from the CT scanner at the first energy level; extracting at least one reference material CT pixel value representative of the imaged reference material; describing the at least one reference material CT pixel value by a set of one or more equations predicting the at least one reference material CT pixel value as a function of the basis material composition of the reference material and one or more basis material weights and offsets; and solving the set of one or more equations for the basis material weights and offsets;d. From imaging information related to an unknown material received from the CT scanner at the first energy level; extracting by the computing device at least one ...

Metal Lattice Production Method, Metal Lattice, X-Ray Imaging Device, and Intermediate Product for Metal Lattice

Method for manufacturing a metal grating structure, wherein, after a concave part having an insulating layer on an inner surface thereof is formed in a silicon substrate, a portion of the insulating layer formed on a bottom part of the concave part is removed, and the silicon substrate at the bottom part of the concave part is etched to increase the surface area of the bottom part of the concave part as compared with a state before the etching, followed by filling the concave part with metal by an electroforming method. 1. A method for manufacturing a metal grating structure , comprising:a resist layer forming step of forming a resist layer on a principal plane of a silicon substrate;a patterning step of patterning the resist layer, and removing the patterned portion of the resist layer;an etching step of etching the silicon substrate corresponding to the removed portion of the resist layer by a dry etching method, and forming a concave part of a predetermined depth;an insulating layer forming step of forming an insulating layer on an inner surface of the concave part in the silicon substrate;a removing/surface area increasing step of removing a portion of the insulating layer formed on a bottom part of the concave part, and etching the silicon substrate at the bottom part of the concave part to increase a surface area of the bottom part of the concave part as compared with a state before the etching; andan electroforming step of applying a voltage to the silicon substrate to fill the concave part with metal by an electroforming method.2. The method for manufacturing a metal grating structure according to claim 1 , whereinin the removing/surface area increasing step, the surface area of the bottom part of the concave part is increased as compared with the state before the etching by removing the portion of the insulating layer formed on the bottom part of the concave part, and by etching the silicon substrate at the bottom part of the concave part to such an extent ...

Monochromatic attenuation contrast image generation by using phase contrast ct

The present invention relates to a method and apparatus for X-ray phase contrast imaging. The method comprises the following steps: from the measured phase gradient and overall attenuation information, an electron density is computed; the contribution p C of the Compton scattering to the overall attenuation is estimated from the electron density; the contribution p p of the photo-electric absorption to the overall attenuation is estimated from the overall attenuation and the contribution p C ; the values p C and p p are used to reconstruct a Compton image and a photo-electric image; by linear combination of these two images, a monochromatic image at a desired energy is obtained.

MICROSTRUCTURE MANUFACTURING METHOD

A microstructure manufacturing method includes forming a first insulating film on an Si substrate, exposing an Si surface by removing a part of the first insulating film, forming a recessed portion by etching the Si substrate from the exposed Si surface, forming a second insulating film on a sidewall and a bottom of the recessed portion, forming an Si exposed surface by removing at least a part of the second insulating film formed on the bottom of the recessed portion, and filling the recessed portion with a metal from the Si exposed surface by electrolytic plating. 1. An X-ray absorption grating comprising:an Si substrate formed a recessed portion; anda metal filled in the recessed portion via an insulating film,wherein the insulating film is not formed on at least a part of a bottom of the recessed portion, andwherein the metal is in contact with an Si surface of the Si substrate at least on the part.2. An X-ray absorption grating comprising:an Si substrate formed a recessed portion; anda metal filled in the recessed portion via an insulating film,wherein the insulating film is not formed on at least a part of a bottom of the recessed portion, andwherein a metal film is disposed between an Si surface of the Si substrate and the metal at least on the part.3. The X-ray absorption grating according to claim 2 , the metal film includes a metal having a greater ionization tendency than the ionization tendency of the metal.4. The X-ray absorption grating according to claim 2 ,wherein the metal film is conductive to the Si substrate, andwherein the metal film includes a metal different from the metal filled in each of the plurality of recessed portions.5. The X-ray absorption grating according to claim 2 , wherein a length of a region sandwiched by the metal is 0.5 μm to 80 μm.6. The X-ray absorption grating according to claim 1 , wherein an aspect ratio of the metal is 5 to 100.7. The X-ray absorption grating according to claim 2 , wherein an aspect ratio of the metal ...

SYSTEMS AND METHODS FOR IMAGING AND DETERMINING A SIGNATURE OF AN OBJECT

An X-ray CT scanner for imaging an object is provided. The scanner includes an X-ray emitter configured to emit X-ray beams, a detector array including a plurality of detector elements, and a precollimator positioned between the X-ray emitter and the object, the precollimator configured to prevent the emitted X-ray beams from being directly incident on a first subset of the plurality of detector elements, and allow the emitted X-ray beams to be directly incident on a second subset of said plurality of detector elements. A processing device communicatively coupled to the detector array is configured to determine a signature of the object based on a first set of data acquired using the first subset of the plurality of detector elements, and tomographically reconstruct an image of the object based on a second set of data acquired using the second subset of said plurality of detector elements. 1. An X-ray CT scanner for imaging an object , said X-ray CT scanner comprising:an X-ray emitter configured to emit X-ray beams towards the object;a detector array positioned opposite said X-ray emitter and comprising a plurality of detector elements; prevent, using at least one blocking portion, the emitted X-ray beams from being directly incident on a first subset of said plurality of detector elements; and', 'allow the emitted X-ray beams to be directly incident on a second subset of said plurality of detector elements; and, 'a precollimator positioned between said X-ray emitter and the object, said precollimator configured to determine a signature of the object based on a first set of data acquired using said first subset of said plurality of detector elements; and', 'tomographically reconstruct an image of the object based on a second set of data acquired using said second subset of said plurality of detector elements., 'a processing device communicatively coupled to said detector array, said processing device configured to2. An X-ray CT scanner in accordance with claim 1 , ...

Performing planarization process controls in semiconductor fabrication

A planarization process is performed to a wafer. In various embodiments, the planarization process may include a chemical mechanical polishing (CMP) process. A byproduct generated by the planarization process is collected and analyzed. Based on the analysis, one or more process controls are performed for the planarization process. In some embodiments, the process controls include but are not limited to process endpoint detection or halting the planarization process based on detecting an error associated with the planarization process.

COMPOSITION OF MATTER AND STRUCTURE OF ZEOLITE UZM-55 AND USE IN ISOMERIZATION OF AROMATIC MOLECULES

Isomerization processes such as the isomerization of ethylbenzene and xylenes, are catalyzed by the new crystalline aluminosilicate zeolite comprising a novel framework type that has been designated UZM-55. This zeolite is represented by the empirical formula: 4. The process of wherein x is less than 0.02.5. The process of wherein y is less than 0.02.6. The process of wherein r is from about 0.0005 to about 0.08.7. The process of wherein the microporous crystalline zeolite is thermally stable up to a temperature of at least 600° C.8. The process of wherein the microporous crystalline zeolite has an SiO/AlOratio greater than 75.9. The process of wherein the microporous crystalline zeolite has an SiO/AlOratio greater than 150.10. The process of wherein the microporous crystalline zeolite M is selected from the group consisting of lithium claim 1 , potassium claim 1 , rubidium claim 1 , cesium claim 1 , magnesium claim 1 , calcium claim 1 , strontium claim 1 , barium claim 1 , zinc claim 1 , yttrium claim 1 , lanthanum and gadolinium.11. The process of wherein the microporous crystalline zeolite R is 1 claim 1 ,6-bis(N-methylpiperidinium)hexane.12. The process of wherein the microporous crystalline zeolite has a micropore volume of greater than 0.08 mL/g and less than 0.15 mL/g.13. The process of wherein the isomerization conditions include a temperature of about 300° C. to about 450° C.14. The process of wherein the isomerization conditions include a pressure of about 70 psig to about 130 psig.15. The process of wherein the isomerization conditions include a weight hourly space velocity of about 5 hto about 7 h.16. The process of wherein the feed stream also comprises hydrogen and one or more xylenes selected from the group consisting of p-xylene claim 1 , m-xylene claim 1 , o-xylene and combinations thereof.17. The process of wherein the catalyst also comprises a hydrogenation function selected from a noble metal and a base metal claim 1 , and a binder.18. The ...

A novel process for the preparation of teriflunomide

The present invention provides a process for the preparation of Teriflunomide (Formula-I). The present invention describes the synthesis of Teriflunomide without isolating the intermediate Leflunomide. Teriflunomide is prepared from 5-Methyl isoxazole-4-carboxylic acid by converting to its acid chloride and coupling with 4-trifluoromethyl aniline to obtain Leflunomide (which is not isolated) followed by ring opening reaction using aq. Sodium Hydroxide to form Teriflunomide. In other words, the process is telescoped from 5-methylisoxazole-4-carbonyl chloride.

X-ray imaging system

An X-ray imaging system includes: an X-ray Talbot imaging device that has an object table, an X-ray source, a plurality of gratings, and an X-ray detector, and irradiates the X-ray detector with an X-ray from the X-ray source through an object and the plurality of gratings to acquire a moiré image necessary for generation of a reconstructed image of the object; and a tester that is installed on the object table, holds the object, and loads a tensile load or a compressive load on the object, wherein the X-ray Talbot imaging device includes a hardware processor that causes a series of imaging to be performed to acquire the moiré image, the tester includes: a base part; and a chuck, and an operation of the chuck is automatically controllable by the hardware processor in conjunction with the X-ray Talbot imaging device.

IMAGING APPARATUS USING TALBOT INTERFERENCE AND ADJUSTING METHOD FOR IMAGING APPARATUS

An imaging apparatus includes a diffraction grating which diffracts electromagnetic waves from an electromagnetic wave source, a shield grating which shields a part of the electromagnetic waves diffracted by the diffraction grating, a detector which detects an intensity distribution of the electromagnetic waves through the shield grating, and an adjusting unit which adjusts the attitude of at least one of the diffraction grating and the shield grating on the basis of the detection result by the detector, wherein the adjusting unit divides the intensity distribution detected by the detector into a plurality of regions and adjusts the attitude of at least one of the diffraction grating and the shield grating on the basis of the intensity distributions of the plurality of regions. 1a diffraction grating which diffracts electromagnetic waves from an electromagnetic wave source;a shield grating which shields a part of the electromagnetic waves diffracted by the diffraction grating;a detector which detects an intensity distribution of the electromagnetic waves through the shield grating; andan adjusting unit which adjusts the attitude of at least one of the diffraction grating and the shield grating on the basis of the detection result by the detector,wherein the adjusting unit:divides the intensity distribution detected by the detector into a plurality of regions; andadjusts the attitude of at least one of the diffraction grating and the shield grating on the basis of the intensity distributions of the plurality of regions.. An imaging apparatus comprising: This application is a Continuation of co-pending U.S. patent application Ser. No. 13/824,974, filed Mar. 18, 2013, which is a U.S. national stage application of International Patent Application No. PCT/JP2011/073773, filed Oct. 11, 2011, which claims foreign priority benefit to Japanese Patent Applications No. 2010-235490, filed Oct. 20, 2010 and No. 2011-172973, filed Aug. 8, 2011. All of the above-listed ...

X-RAY TALBOT INTERFEROMETER AND X-RAY TALBOT IMAGING SYSTEM

An X-ray Talbot interferometer includes a source grating configured to spatially split X-rays emitted from an X-ray source, a diffraction grating configured to form an interference pattern with the X-rays from the source grating, and an X-ray detector configured to detect the X-rays from the diffraction grating. The X-ray Talbot interferometer further includes an angle varying unit configured to vary an angle formed by an optical axis, which is the center of a flux of the X-rays from the X-ray source, and the source grating. The angle varying unit varies the angle formed by the optical axis and the source grating from a first angle to a second angle. The X-ray detector detects the X-rays at least when the optical axis and the source grating form the first angle and when the optical axis and the source grating form the second angle. 1. An X-ray Talbot interferometer , comprising:a source grating configured to spatially split X-rays emitted from an X-ray source;a diffraction grating configured to diffract the X-rays from the source grating to form an interference pattern;an X-ray detector configured to detect the X-rays from the diffraction grating; andan angle varying unit configured to vary an angle formed by an optical axis and at least one periodic direction of the source grating, the optical axis being a center of a flux of the X-rays from the X-ray source.2. The X-ray Talbot interferometer according to claim 1 ,wherein the angle varying unit varies the angle formed by the optical axis and the periodic direction from a first angle to a second angle, andwherein the X-ray detector detects the X-rays at least when the optical axis and the periodic direction form the first angle and when the optical axis and the periodic direction form the second angle.32. The X-ray Talbot interferometer according to claim claim 1 ,wherein the X-rays are incident normally on the source grating at a center of a first area of the source grating when the optical axis and the periodic ...

X-RAY TALBOT INTERFEROMETER AND X-RAY IMAGING SYSTEM INCLUDING TALBOT INTERFEROMETER

An X-ray Talbot interferometer includes a first grating configured to diffract X-rays from an X-ray source and form an interference pattern, a second grating configured to block a portion of X-rays that form the interference pattern, and a detector configured to detect X-rays from the second grating. An inspection object is disposed between the X-ray source and the second grating. The second grating includes a first shield grating portion in which a shield portion and a transmissive portion are arranged periodically at a first period and a second shield grating portion. The first period is expressed as ps×n×Ls/(Ls+Lf), where ps denotes a size of pixels that the detector has, n denotes a positive integer, Ls denotes a distance from the X-ray source to the first shield grating portion, and Lf denotes a distance from the first shield grating portion to the detector. 4. The X-ray Talbot interferometer according to claim 1 , wherein the first shield grating portion is a one-dimensional grating that has a period in a direction of the first period claim 1 , and {'br': None, 'i': '≦n/m≦', '1/31/2.'}, 'in a case where a period of a periodic pattern formed on the detector is m times the size of the pixels and the first period is n times the size of the pixels, an expression below is satisfied'}5. The X-ray Talbot interferometer according to claim 1 , wherein the first shield grating portion is a two-dimensional grating that has periods in an x direction and in a y direction claim 1 , the x and y directions intersecting with each other claim 1 , and{'sub': x', 'y', 'x', 'y, 'claim-text': {'br': None, 'i': n', 'x×n', 'y/mx×m', 'y, 'sub': —', '—', '—, '1/2.5≦√()≦1/2.'}, 'in a case where a period of a periodic pattern formed on the detector in the x direction is mtimes the size of the pixels, a period of the periodic pattern formed on the detector in the y direction is mtimes the size of the pixels, a period of the first shield grating portion in the x direction is ntimes the ...

Process for preparation of cysteamine bitartrate

The present invention provides process for preparation of cysteamine bitartrate comprising reacting cysteamine or its salt with tartaric acid. The present invention further provides crystalline form L1 of cysteamine bitartrate having characteristic diffraction peaks at 10.36, 14.54, 17.23, 18.03, 19.24, 20.76, 21.20, 22.02, 23.37, 23.64, 27.71, 28.28, 29.26, 31.33, 32.84, 33.83, 35.51, 36.74±0.2 degree two theta in an X-ray diffraction pattern and process for preparation thereof. The present invention provides crystalline form L2 of cysteamine bitartrate having characteristic diffraction peaks at 7.4, 10.3, 11.0, 11.4, 14.4, 14.9, 18.6, 19.4, 20.1, 20.8, 21.9, 22.3, 22.5, 23.5±0.2 degree two theta in an X-ray diffraction pattern and process for preparation thereof.

POLYMER ADDITIVE AND A METHOD FOR THE PRODUCTION THEREOF

The invention relates to a compound of formula (I), characterised by the characteristic signals in the X-ray diffraction powder pattern measured with Cu Kalpha radiation (0.154 nm) at a 2-theta angle of 15.0 and 22.7 with a high intensity, and of 5.0, 11.3, 18.9, 20.8, 21.6 and 23.6 with a medium intensity, as well as to a method for producing the compound of formula (I) by reacting at least one isophthalic acid diester of formula (II) where R1 and R2 are the same or different and stand for an aliphatic group, with two equivalents 4-amino-2,2,6,6-tetramethylpiperidine, in the presence of at least one catalyst from the group of metal alcoholates and at a reaction temperature of between 50 and 150° C. 3. The process as claimed in claim 2 , wherein the at least one metal alkoxide is a compound of the formula (VI) and/or (VII){'br': None, 'sup': '13', 'X—OR\u2003\u2003(VI)'}{'br': None, 'sup': 14', '15, 'RO—Y—OR\u2003\u2003(VII)'}wherein{'sup': 14', '15, 'Rand Rare each the same or different and'}{'sup': 13', '14', '15, 'R, Rand Rare aliphatic radicals each having 1 to 20 carbon atoms,'}X is an alkali metal, andY is an alkaline earth metal.4. The process as claimed in claim 2 , wherein the metal alkoxide is sodium methoxide claim 2 , potassium methoxide claim 2 , lithium methoxide claim 2 , sodium ethoxide claim 2 , potassium ethoxide claim 2 , lithium ethoxide claim 2 , sodium n-propoxide claim 2 , potassium n-propoxide claim 2 , sodium isopropoxide claim 2 , potassium isopropoxide claim 2 , sodium butoxide claim 2 , potassium butoxide claim 2 , sodium isobutoxide claim 2 , potassium isobutoxide claim 2 , sodium sec-butoxide claim 2 , potassium sec-butoxide claim 2 , sodium tert-amoxide claim 2 , sodium amoxide claim 2 , potassium amoxide claim 2 , potassium tert-butoxide or a combination thereof.5. The process as claimed in claim 2 , wherein the metal alkoxide is added to the reaction mixture in amounts of 1 to 20 mol % claim 2 , based on isophthalic diester.6. The ...

GRATING DEVICE FOR AN X-RAY IMAGING DEVICE

The invention relates to a grating device () for an X-ray imaging device, an interferometer unit (), an X-ray imaging system, an X-ray imaging method, and a computer program element for controlling such device and a computer readable medium having stored such computer program element. The grating device () for an X-ray imaging device comprises a grating arrangement () and an actuation arrangement. The grating arrangement () comprises a plurality of grating segments (). The actuation arrangement is configured to move the plurality of grating segments () with at least a rotational component between a first position and a second position. In the first position, the grating segments () are arranged in the path of an X-ray beam (), so that the grating segments () influence portions of the X-ray beam (). In the second position, the grating segments () are arranged outside the portions of the path of an X-ray beam (), so that the portions of the X-ray beam () are unaffected by the grating segments (). 2. The grating device according to claim 1 , wherein the actuation arrangement is configured to tilt the grating segments between the first position and the second position.3. The grating device according to claim 1 , wherein the grating arrangement is an analyzer grating arrangement claim 1 , a phase grating arrangement and/or a source grating arrangement.4. The grating device according to claim 1 , wherein the actuation arrangement comprises a plurality of actuation units; and wherein at least one actuation unit comprises a micro-electro-mechanical system.5. The grating device according to claim 1 , further comprising a control unit configured to control the actuation arrangement to move the grating segments simultaneously or independently from each other.7. The interferometer unit according to claim 1 , wherein a grating segment of the grating device is a grating pixel claim 1 , whose size corresponds essentially to a pixel size of the X-ray detector claim 1 , or the ...

HANDLING MISALIGNMENT IN DIFFERENTIAL PHASE CONTRAST IMAGING

The present invention relates to handling misalignment in differential phase contrast imaging. In order to provide an improved handling of misalignment in X-ray imaging systems for differential phase contrast imaging, an X-ray imaging system () for differential phase contrast imaging is provided that comprises a differential phase contrast setup () with an X-ray source (), an X-ray detector (), and a grating arrangement comprising a source grating (), a phase grating () and an analyser grating (). The source grating is arranged between the X-ray source and the phase grating, and the analyser grating is arranged between the phase grating and the detector. Further, the system comprises a processing unit (), and a measurement system () for determining a misalignment of at least one of the gratings. The X-ray source and the source grating are provided as a rigid X-ray source unit (). The phase grating, the analyser grating and the detector are provided as a rigid X-ray detection unit (). The measurement system is an optical measurement system configured to determine a misalignment between the differential phase contrast setup consisting of the X-ray source unit and the X-ray detection unit. Further, the processing unit is configured to provide a correction signal () based on the determined misalignment. 1. An X-ray imaging system for differential phase contrast imaging , comprisinga differential phase contrast setup with:an X-ray source;an X-ray detector; anda grating arrangement comprising a source grating, a phase grating and an analyser grating, wherein the source grating is arranged between the X-ray source and the phase grating, and the analyser grating is arranged between the phase grating and the detector;a processing unit; anda measurement system for determining a misalignment of at least one of the gratings;wherein the X-ray source and the source grating are provided as a rigid X-ray source unit; and wherein the phase grating, the analyser grating and the ...

ITERATIVE RECONSTRUCTION METHOD FOR SPECTRAL, PHASE-CONTRAST IMAGING

A system and related method for X-ray phase contrast imaging. A signal model is fitted to interferometric measurment data. The fitting operation yields a Compton cross section and a photo-electric image. A pro-portionality between the Compton cross section and electron-density is used to achieve a reduction of the number of fitting variables. The Compton image may be taken, up to a constant, as a phase contrast images. 1. A signal processing system comprising:an input port for receiving measurement data detected at an X-ray sensitive detector of an interferometric X-ray imaging system, after passage of an X-ray beam through a sample;a model initializer configured to include said data into a signal model;a model fitting module configured to perform, for a plurality of detector pixels, a fitting operation to fit parameters of said signal model to the measurement data wherein the signal model includes parameters that represent attenuation of the X-ray beam, wherein at least one of the parameters accounts for photo-electric effect absorption and wherein at least one of the parameters accounts for Compton scattering, wherein the Compton scattering parameter is a surrogate for the electron density in said sample, wherein the signal model includes a term that models, as a function of the Compton scattering, a modulation of a phase change induced by the object;an output port configured to output at least some of the fitted parameters as a photo-electric absorption image or a Compton scattering image, respectively.2. The system of claim 1 , wherein the Compton scattering image provides information in relation to the electron density and/or a phase contrast image.3. The system of claim 1 , wherein said term includes a spatial derivative of the Compton scattering parameter.4. The system of claim 1 , including a reconstructor configured to reconstruct for a cross-sectional slice image based on at least some of the fitted parameters.5. The systenn of claim 3 , wherein the ...

APPARATUS INCLUDING A BENT INTERFERENCE GRATING AND METHOD FOR BENDING AN INTERFERENCE GRATING FOR INTERFEROMETRIC X-RAY IMAGING

An apparatus for interferometric x-ray imaging includes an interference grating and a frame-like holding device. The interference grating is bendable like a leaf spring and is arranged in grooves of opposing bearings of the holding device such that the interference grating has one-dimensional concave curvature or one-dimensional convex curvature. 1. An apparatus for interferometric x-ray imaging , the apparatus comprising:an interference grating that is quadrilateral, the interference grating being bendable like a leaf spring; anda holding device that is frame-like and quadrilateral,wherein two opposite side edges of the interference grating are clamped in grooves of two opposing bearings of the holding device, such that the interference grating has one-dimensional concave curvature or one-dimensional convex curvature.2. The apparatus of claim 1 , wherein the two opposing bearings are arranged in a displaceable manner such that the curvature of the interference grating is modifiable.3. The apparatus of claim 1 , wherein a carrier material of the interference grating comprises silicon or a ceramic material.4. The apparatus of claim 1 , wherein the interference grating has a thickness of less than 0.5 mm.5. The apparatus of claim 2 , wherein a carrier material of the interference grating comprises silicon or a ceramic material.6. The apparatus of claim 2 , wherein the interference grating has a thickness of less than 0.5 mm.7. The apparatus of claim 3 , wherein the interference grating has a thickness of less than 0.5 mm.8. An x-ray phase-contrast imaging device comprising:an x-ray emitter;an x-ray detector; and an interference grating that is quadrilateral, the interference grating being bendable like a leaf spring; and', 'a holding device that is frame-like and quadrilateral,, 'an apparatus for interferometric x-ray imaging arranged between the x-ray emitter and the x-ray detector, the apparatus comprisingwherein two opposite side edges of the interference grating ...

HYDROCARBON CONVERSION USING UZM-50

A new aluminosilicate zeolite designated UZM-50, methods of making the zeolite, and its use as a catalyst in hydrocarbon conversion processes are described. This zeolite is represented by the empirical formula: 2. The process of wherein there are no more than three peaks of at least strong intensity in the x-ray diffraction pattern.3. The process of wherein there are no more than two peaks of at least strong intensity in the x-ray diffraction pattern.4. The process of wherein the catalyst has an InterPeak distance of greater than 14.75°2θ and less than 15.25°2θ as determined using Cu x-rays of 1.5418 Å wavelength.5. The process of wherein the catalyst has a Peak 1 FWHM of greater than about 1.25°2θ and less than 2.00°2θ as determined using Cu x-rays of 1.5418 Å wavelength.6. The process of wherein the catalyst has a CI value in a range of 1 to 3.7. The process of wherein x has a value of from 0 to 0.5 claim 1 , and y has a value from 6 to 50.8. The process of wherein the average diameter of the smallest feature observed by SAXS is less than 11 nm.9. The process of wherein the average diameter of the smallest feature observed by SAXS is less than 10 nm.10. The process of wherein the catalyst has a Nmicropore volume of about 0.14 to about 0.2 mL/g.11. The process of wherein the ratio of the Nmesopore volume to total pore volume≥0.88.12. The process of wherein the hydrocarbon conversion process is selected from the group consisting of oligomerization claim 1 , hydrocracking claim 1 , hydroisomerization claim 1 , hydrotreating claim 1 , hydrodenitrogenation claim 1 , hydrodesulfurization claim 1 , naphthene ring opening claim 1 , paraffin isomerization claim 1 , olefin isomerization claim 1 , conversion of an aromatic molecule to another aromatic molecule claim 1 , polyalkylbenzene isomerization claim 1 , di sproportionation of alkylbenzenes claim 1 , aromatic alkylation claim 1 , paraffin alkylation claim 1 , paraffin cracking claim 1 , naphthene cracking claim 1 , ...

APPARATUS AND METHOD FOR X-RAY PHASE CONTRAST IMAGING

An x-ray phase contrast imaging apparatus and method of operating the same. The apparatus passes x-rays generated by an x-ray source through, in succession, a source grating, an object of interest, a phase grating, and an analyzer grating. The x-ray source, the source grating, the phase grating, and the analyzer grating move as a single entity relative to an object of interest. The phase grating and the analyzer grating remain in fixed relative location and fixed relative orientation with respect to one another. The detected x-rays are converted to a time sequence of electrical signals. In some cases, the apparatus is controlled, and the electrical signals are analyzed by, by a general purpose programmable computer provided with instructions recorded on a machine readable medium. One or more x-ray phase contrast images of the object of interest are generated, and can be recorded or displayed. 1. An x-ray phase contrast imaging apparatus , comprising:an x-ray source configured to provide x-ray illumination at an exit port thereof;a source grating configured to receive said x-ray illumination at a source grating entrance port and configured to provide a plurality of x-ray beams at a source grating exit port;a phase grating having a plurality of phase grating elements, said phase grating situated at a distance l from said source grating, said phase grating configured to receive x-rays at a phase grating entrance port and to provide x-rays at a phase grating exit port;an analyzer grating having a plurality of analyzer grating elements, said analyzer grating situated at a distance d from said phase grating, said phase grating and said analyzer grating are disposed such that the locations and orientations of said phase grating and said analyzer grating are fixed relative to each other and do not move relative to each other during operation of the apparatus, said analyzer grating configured to receive x-rays at a analyzer grating entrance port and to provide x-rays at a ...

X-ray interferometric imaging system

An x-ray interferometric imaging system in which the x-ray source comprises a target having a plurality of structured coherent sub-sources of x-rays embedded in a thermally conducting substrate. The system additionally comprises a beam-splitting grating G 1 that establishes a Talbot interference pattern, which may be a π phase-shifting grating, and an x-ray detector to convert two-dimensional x-ray intensities into electronic signals. The system may also comprise a second analyzer grating G 2 that may be placed in front of the detector to form additional interference fringes, a means to translate the second grating G 2 relative to the detector. The system may additionally comprise an antiscattering grid to reduce signals from scattered x-rays. Various configurations of dark-field and bright-field detectors are also disclosed.

LARGE FOV PHASE CONTRAST IMAGING BASED ON DETUNED CONFIGURATION INCLUDING ACQUISITION AND RECONSTRUCTION TECHNIQUES

Embodiments of methods and apparatus are disclosed for obtaining a phase-contrast digital imaging system and methods for same that can include an x-ray source for radiographic imaging; a beam shaping assembly, an x-ray grating interferometer including a phase grating and an analyzer grating; and an x-ray detector; where the source grating, the phase grating, and the analyzer grating are detuned and a plurality of uncorrelated reference images are obtained for use in imaging processing with the detuned system. 120.-. (canceled)21. A method , comprising:providing an x-ray source for radiographic imaging;providing a beam shaping assembly comprising a source grating G0;providing an x-ray grating interferometer comprising a phase grating G1, and an analyzer grating G2;providing an x-ray detector;aligning the source grating G0, the phase grating G1, the analyzer grating G2, and the x-ray detector;offsetting a pitch of the analyzer grating G2 relative to a pitch of an interference pattern produced by the phase grating G1 at a prescribed distance from the phase grating G1 to generate a repeating fringe pattern;repeatedly exposing an object using the x-ray source while simultaneously moving at least the x-ray source and the source grating G0, relative to at least one cycle of the fringe pattern, while holding the object in a stationary position to generate a set of image data; andcapturing a plurality of images of the object by the x-ray detector.22. The method of claim 21 , further comprising simultaneously moving the phase grating G1 claim 21 , the analyzer grating G2 claim 21 , and the x-ray detector together with the x-ray source and the beam shaping assembly.23. The method of further comprising transforming the set of image data to form a transformed image data set where the fringe pattern moves across the stationary object.24. The method of claim 23 , further comprising:transforming a set of reference images equal in number or more to the set of transformed image data ...

DIFFERENTIAL PHASE CONTRAST X-RAY IMAGING SYSTEM AND COMPONENTS

A differential phase contrast X-ray imaging system includes an X-ray illumination system, a beam splitter arranged in an optical path of the X-ray illumination system, and a detection system arranged in an optical path to detect X-rays after passing through the beam splitter. 118.-. (canceled)19. A method for performing differential phase contrast X-ray imaging , comprising:providing an X-ray beam for illuminating an object to be imaged;directing said X-ray beam to be incident upon a beam splitter, wherein said beam splitter comprises a splitter grating arranged to intercept said X-ray beam and provide an interference pattern of X-rays therefrom;arranging said object to be imaged to intercept said interference pattern of X-rays from said beam splitter; anddetecting at least portions of said interference pattern of X-rays after passing through said object to be imaged,wherein said detecting comprises blocking at least portions of said interference pattern of X-rays after passing through said object using an analyzer grating,wherein said analyzer grating has a longitudinal dimension, a lateral dimension that is orthogonal to said longitudinal dimension and a transverse dimension that is orthogonal to said longitudinal and lateral dimensions, said analyzer grating comprising a pattern of optically dense regions each having a longest dimension along said longitudinal dimension and being spaced substantially parallel to each other in said lateral dimension such that there are optically rare regions between adjacent optically dense regions,wherein each optically dense region has a depth in said transverse dimension that is smaller than a length in said longitudinal dimension,wherein said analyzer grating is arranged with said longitudinal dimension at a shallow angle relative to incident X-rays, andwherein said shallow angle is less than 30 degrees.20. The method according to claim 19 , wherein each optically dense region has a depth in said transverse dimension that is ...

Crystalline form of lorlatinib free base

This invention relates to acrystalline form of (10R)-7-amino-12-fluoro-2,10,16-trimethyl-5-oxo-10,15,16,17-tetrahydro-2H-8,4-(metheno)pyrazolo[4,3-h] [2,5,11]benzoxadiazacyclo-tetradecine-3-carbonitrile (lorlatinib) free base (Form 7). This invention also relates to pharmaceutical compositions comprising Form 7, and to methods of using Form 7 and such compositions in the treatment of abnormal cell growth, such as cancer, in a mammal.

Microstructure, and imaging apparatus having the microstructure

A microstructure includes a substrate, and a grating provided in the substrate and made of metal. The grating is provided with a plurality of holes. The plurality of holes are arranged in a first direction. In a plane containing the first direction, the maximum value of the distance between the center of gravity of a grating region composed of the grating and the plurality of holes and the outer edge of the grating region is less than 1.39 times the minimum value of the distance between the center of gravity of the grating region and the outer edge of the grating region.

NON-DESTRUCTIVE INSPECTION DEVICE

An accurate non-destructive inspection of a moving subject is conducted using a radiation source unit that irradiates radioactive rays toward gratings. Each grating includes a plurality of grating members. A radioactive ray detector unit detects the radioactive rays diffracted by the plurality of grating members. The plurality of grating members are arranged with a predetermined phase difference such that moiré pattern images respectively formed by the radioactive rays transmitted through first to third partial areas have a phase difference between the moiré pattern images. 1. A non-destructive inspection device , comprising a radiation source unit , a grating group and a radioactive ray detector unit , wherein:the radiation source unit is configured to irradiate radioactive rays having transmissivity to a subject toward the grating group;the grating group is composed of a plurality of gratings capable of transmitting the radioactive rays irradiated toward the grating group; andeach of the plurality of gratings includes a plurality of grating members arranged at a predetermined period determined for each grating;the radioactive ray detector unit is configured to detect the radioactive rays diffracted by the plurality of grating members;a radioactive ray passage area through which the radioactive rays irradiated from the radiation source unit and reaching the radioactive ray detector unit pass includes at least first to third partial areas;the first to third partial areas are arranged at positions displaced from each other in a direction intersecting with an irradiation direction of the radioactive rays;further, the first to third partial areas are located at such positions that the subject moving relative to the grating group passes in the direction intersecting with the irradiation direction of the radioactive rays; andwhen a part of the grating group located in a space through which each of the radioactive rays to be transmitted through any one of the first to ...

OMNIDIRECTIONAL SCATTERING- AND BIDIRECTIONAL PHASE-SENSITIVITY WITH SINGLE SHOT GRATING INTERFEROMETRY

X-ray scattering imaging can provide complementary information about the unresolved microstructures of a sample. The scattering signal can be accessed with various methods based on coherent illumination, which span from self-imaging to speckle scanning. The directional sensitivity of the existing methods is limited to a few directions on the imaging plane and it requires the scanning of the optical components, or the rotation of either the sample or the imaging setup, if the full range of possible scattering directions is desired. A new arrangement is provided that allows the simultaneous acquisition of the scattering images in all possible directions in a single shot. This is achieved by a specialized phase grating and a device for recording the generated interference fringe with sufficient spatial resolution. The technique decouples the sample dark-field signal with the sample orientation, which can be crucial for medical and industrial applications. 111-. (canceled)12. A configuration for obtaining quantitative x-ray images from a sample , the configuration comprising:an X-ray source outputting x-rays;a position-sensitive detector with spatially modulated detection sensitivity having a number of individual pixels;a recorder for recording the x-ray images of said position-sensitive detector;a processor for evaluating intensities in a single shot image for obtaining characteristics of the sample including absorption, differential phase contrast and directional, small-angle scattering contrast, for specified regions of the pixels;an optional absorption grating in front of, or embedded into said X-ray source; and i) a 2D periodic structure composed of unit cells, said unit cells being circular gratings, a period of said unit cells is P and that of said circular gratings is p, wherein periodic structures in a circular grating generate a considerable X-ray phase shift difference, which is of π/2 or odd multiples thereof, hereinafter referred to as π/2 shift; or π or π+ ...

COMPUTATION APPARATUS, PROGRAM, AND IMAGE PICKUP SYSTEM

A computation apparatus that calculates subject information by using subject data, includes a calculation unit that calculates spatial distributions of a first-order phase value and a first-order measurement target value by using the subject data, a calculation unit that calculates an error correction function including the first-order phase value as a variable by using information of the spatial distribution of the first-order measurement target value and the spatial distribution of the first-order phase value, and a calculation unit that calculates information of a spatial distribution of a second-order measurement target value corresponding to a spatial distribution obtained by correcting the spatial distribution of the first-order measurement target value by using the error correction function, the information of the spatial distribution of the first-order phase value, and the information of the spatial distribution of the first-order measurement target value. 1. A computation apparatus that calculates information of a subject by using subject data ,wherein the subject data is information of a periodic pattern formed by light that has been modulated by the subject, the computation apparatus comprising:a calculation unit configured to calculate a spatial distribution of a first-order phase value and a spatial distribution of a first-order measurement target value by using the subject data;a calculation unit configured to calculate an error correction function including the first-order phase value as a variable by using information of the spatial distribution of the first-order measurement target value and the spatial distribution of the first-order phase value; anda calculation unit configured to calculate information of a spatial distribution of a second-order measurement target value corresponding to a spatial distribution obtained by correcting the spatial distribution of the first-order measurement target value by using the error correction function, the ...

COMPUTATION APPARATUS, PROGRAM, AND IMAGE PICKUP SYSTEM

A computation apparatus that calculates information of a subject includes: a calculation unit configured to calculate a spatial distribution of a first first-order phase value, a spatial distribution of a second first-order phase value, and a spatial distribution of a first-order measurement target value, by using the subject data; a calculation unit configured to calculate an error correction function including the first first-order phase value and the second first-order phase value as variables, by using information of the spatial distribution of the first first-order phase value, information of the spatial distribution of the second first-order phase value, and information of the spatial distribution of the first-order measurement target value; and a calculation unit configured to calculate information of a spatial distribution of a second-order measurement target value, corresponding to a spatial distribution obtained by correcting the spatial distribution of the first-order measurement target value. 1. A computation apparatus that calculates information of a subject by using subject data ,wherein the subject data is information of a periodic pattern formed by light that has been modulated by the subject, andwherein the periodic pattern has periods in a first direction and a second direction, the computation apparatus comprising:a calculation unit configured to calculate a spatial distribution of a first first-order phase value corresponding to a phase value of the periodic pattern related to the first direction, a spatial distribution of a second first-order phase value corresponding to a phase value of the periodic pattern related to the second direction, and a spatial distribution of a first-order measurement target value, by using the subject data;a calculation unit configured to calculate an error correction function, including the first first-order phase value and the second first-order phase value as variables, by using information of the spatial ...

X-RAY METHOD FOR THE MEASUREMENT, CHARACTERIZATION, AND ANALYSIS OF PERIODIC STRUCTURES

Periodic spatial patterns of x-ray illumination are used to gather information about periodic objects. The structured illumination may be created using the interaction of a coherent or partially coherent x-ray source with a beam splitting grating to create a Talbot interference pattern with periodic structure. The object having periodic structures to be measured is then placed into the structured illumination, and the ensemble of signals from the multiple illumination spots is analyzed to determine various properties of the object and its structures. Applications to x-ray absorption/transmission, small angle x-ray scattering, x-ray fluorescence, x-ray reflectance, and x-ray diffraction are all possible using the method of the invention. 1. A method for examining an object with periodic structures , comprising 'said Talbot interference pattern to be formed using a source of x-rays and an x-ray beam splitting grating;', 'determining a volume in which a Talbot interference pattern will be formed,'}placing an object having periodic structures into said volume;establishing the Talbot interference pattern;aligning the periodic structures of the object with the anti-nodes of the Talbot interference pattern; anddetecting an x-ray signal resulting from the interaction of the Talbot interference pattern and the periodic structures of the object.2. The method of claim 1 , in whichthe x-ray signal is a signal arising from the transmission of x-rays through the periodic structures.3. The method of claim 1 , in whichthe x-ray signal is a signal arising from one or more phenomena selected from the group consisting of:small angle x-ray scattering, x-ray fluorescence, x-ray reflectivity, and x-ray diffraction.4. The method of claim 1 , in whichthe source of x-rays is a microfocus source.5. The method of claim 1 , in whichthe source of x-rays is an extended source used in conjunction with an absorbing grating comprising periodic apertures.6. The method of claim 1 , in whichthe source ...

METHOD AND APPARATUS FOR X-RAY MICROSCOPY

This disclosure presents systems for x-ray microscopy using an array of micro-beams having a micro- or nano-scale beam intensity profile to provide selective illumination of micro- or nano-scale regions of an object. An array detector is positioned such that each pixel of the detector only detects x-rays corresponding to a single micro- or nano-beam. This allows the signal arising from each x-ray detector pixel to be identified with the specific, limited micro- or nano-scale region illuminated, allowing sampled transmission image of the object at a micro- or nano-scale to be generated while using a detector with pixels having a larger size and scale. Detectors with higher quantum efficiency may therefore be used, since the lateral resolution is provided solely by the dimensions of the micro- or nano-beams. The micro- or nano-scale beams may be generated using an arrayed x-ray source or a set of Talbot interference fringes. 1. A method of examining an object with x-rays , comprising: with each x-ray micro-beam within said predetermined region having an axis passing through said common x-ray source,', 'and additionally having a contrast between the x-ray intensity along the micro-beam axis and the x-ray intensity at a distance equal to ½ of the period of said periodic array of x-ray micro-beams measured perpendicularly from said micro-beam axis of greater than 10%;, 'creating a periodic array of x-ray micro-beams in a predetermined region propagating from a common x-ray source,'}positioning an x-ray pixel array detector system so that the detector's x-ray sensors are within said predetermined region and the detector's pixels are aligned so that each pixel detects x-rays corresponding to no more than one x-ray micro-beam;placing an object before said x-ray array detector and positioning a portion of said object to be examined within said predetermined region;illuminating said portion of said object with said periodic array of x-ray micro-beams; andrecording signals ...

METHOD FOR MANUFACTURING HIGH ASPECT RATIO STRUCTURE, A METHOD FOR MANUFACTURING ULTRASONIC PROBE, HIGH ASPECT RATIO STRUCTURE, AND X-RAY IMAGING APPARATUS

In respective methods for manufacturing a high aspect ratio structure and an ultrasonic probe, a plurality of holes extending in a direction crossing a main surface of a substrate are formed, a plurality of first regions and second regions excluding the first regions from the main surface are periodically defined, and partition walls between the plurality of holes formed in the substrate corresponding to the first regions are removed by etching so that part of each of the partition walls within a predetermined range excluding a bottom portion is left. A high aspect ratio structure and an X-ray imaging apparatus include, over a side wall, a porous member including a plurality of holes extending in a direction crossing a grating surface within a predetermined range excluding a bottom portion in each of a plurality of recesses in a grating. 1. A method for manufacturing a high aspect ratio structure , the method comprising:a hole formation step of forming a plurality of holes extending in a direction crossing a main surface in at least the one main surface of a predetermined substrate;a region definition step of periodically defining, in the main surface where the plurality of holes are formed, a plurality of first regions and a plurality of second regions excluding the plurality of first regions from the main surface; anda partition-wall partially leaving/removing step of immersing the substrate in an etching liquid and thereby removing partition walls between the plurality of holes formed in the substrate corresponding to the first regions so that part of the partition walls within a predetermined range along the direction excluding bottom portions of the plurality of holes are left,wherein the hole formation step includes a partition-wall thinning hole formation step of forming the plurality of holes so that a partition wall thickness between the holes adjacent to each other becomes smaller on the bottom side of the holes than that on the main surface side.2. The ...

Phase Contrast X-Ray Tomography Device

The invention relates to a phase contrast x-ray tomography device, comprising an electron gun () having a downstream deflector coil (). The x-ray beam () is guided by the deflector coil () on a circular path over a target (), which is marginally tilted towards a plane positioned vertically on the device axis. The x-ray beam () generated at focal spot F of the electron beam () crosses an object () and arrives at a detector line () via a phase grating () and an amplitude grating () 1. A phase contrast x-ray tomography device comprising:an x-ray light source, which has at least one electron beam deflectable in a vacuum vessel and moving on a present path over a target at least partially surrounding an examination region, in order to generate on the target at least one focal spot emitting x-ray light,an x-ray-light detection unit, which comprises a stationary x-ray light phase measuring device over which the x-ray light is swept upon its movement, andan evaluating device, which is supplied with the output signals of the phase measuring device and is designed to calculate from these signals an object image obtained by phase contrast.2. A phase contrast x-ray tomography device according to claim 1 , wherein the electron beam is modulated in its intensity.3. A phase contrast x-ray tomography device according to claim 2 , wherein the electron beam is switched on and off path-dependently.4. A phase contrast x-ray tomography device according to claim 1 , wherein the electron beam is moved intermittently claim 1 , preferably by equal increments.5. A phase contrast x-ray tomography device according to claim 1 , wherein the radial position of the electron beam is varied claim 1 , preferably in dependence on the size of a region to be irradiated.6. A phase contrast x-ray tomography device according to claim 1 , wherein the target is at least partially rotationally symmetrical claim 1 , it preferably having the shape of a truncated cone claim 1 , or a part of such claim 1 , which ...

X-ray imaging apparatus

An X-ray imaging apparatus comprises a grating configured to form an interference pattern by diffracting X-rays from an X-ray source, a amplitude grating configured to partly shield X-rays forming the interference pattern, and an X-ray detector configured to detect an intensity distribution of X-rays from the amplitude grating. The amplitude grating is comprised of a central area and a peripheral area and the peripheral area shows an X-ray transmittance higher than the central area relative to X-rays perpendicularly entering the amplitude grating.

RADIATION GRATING DETECTOR AND X-RAY INSPECTION APPARATUS

The radiation grating detector includes a grating portion constituting at least a second grating among a first grating, the second grating, and a third grating, and a detection portion configured to detect an incident radiation transmitted through the grating portion. 1. A radiation grating detector for use in an X-ray inspection apparatus including at least a second grating among a first grating configured to obtain coherence by making incident radiation in a multi-point light source radiation , the second grating configured to generate a grating image of the incident radiation , and a third grating configured to absorb the radiation to shield the radiation at a position where the grating image is generated , the radiation grating detector comprising:a grating portion configuring the at least the second grating among the first grating, the second grating, and the third grating and forming a non-opening portion other than an opening portion through which the radiation transmits; anda detection portion provided at the non-opening portion to detect the incident radiation transmitted through the grating portion.2. The radiation grating detector as recited in claim 1 , whereinthe detection portion includes a plurality of detection elements which corresponds to each pixel and directly or indirectly detects the radiation incident on the non-opening portion to output an electric signal.3. The radiation grating detector as recited in claim 2 , whereinthe detection portion further includes a scintillator that converts the incident radiation into light having a frequency lower than a frequency of the radiation, andthe detection element is configured by a photoelectric conversion element that detects the light having a low frequency converted by the scintillator and outputs an electric signal.4. The radiation grating detector as recited in claim 3 , whereinthe grating portion functions as an absorption grating that absorbs the incident radiation to prevent transmission of the ...

HIGH-ASPECT RATIO STRUCTURE PRODUCTION METHOD, ULTRASONIC PROBE PRODUCTION METHOD USING SAME, AND HIGH-ASPECT RATIO STRUCTURE

A high-aspect ratio structure production method and an ultrasonic probe production method of the present invention include: forming, in a principal surface of a substrate, a plurality of pores each extending in a direction intersecting the principal surface; plugging, among the plurality of pores, one or more pores formed in a first region; and forming a recess in a second region by a wet etching process. A high-aspect ratio structure includes a grating having a plurality of convex portions, wherein each of the plurality of convex portions is provided with a plugging member plugging a plurality of pores formed therein in a thickness direction of the structure.

Carbon monoxide releasing molecules

Disclosed are carbon monoxide releasing complexes comprising a transition metal, at least one carbon monoxide ligand, and a pH responsive ligand that modulates the release of carbon monoxide, compositions comprising such complexes, and methods of using such compounds for treating various diseases and conditions and preserving cells, tissue or organs for transplantation.

RADIATION CAPTURING SYSTEM

A radiation capturing system includes the following. A radiation source, a plurality of gratings, and a radiation detector, are provided aligned in a radiation irradiating axis direction. A Talbot interferometer or a Talbot-Lau interferometer captures a moire fringe image for generating a reconstructed image. A low visibility capturing unit performs capturing of the moire fringe image with visibility of a moire fringe reduced more than in capturing of the moire fringe image for generating the reconstructed image. A generating unit generates an absorptive image based on the moire fringe image captured by the low visibility capturing unit. 1. A radiation capturing system comprising:a radiation source, a plurality of gratings, and a radiation detector, provided aligned in a radiation irradiating axis direction;a Talbot interferometer or a Talbot-Lau interferometer to capture a moire fringe image for generating a reconstructed image;a low visibility capturing unit which performs capturing of the moire fringe image with visibility of a moire fringe reduced more than in capturing of the moire fringe image for generating the reconstructed image; anda generating unit which generates an absorptive image based on the moire fringe image captured by the low visibility capturing unit.2. The radiation capturing system according to claim 1 , wherein the low visibility capturing unit reduces the visibility of the moire fringe by inserting a scatterer in an irradiating field between the radiation source and the radiation detector.3. The radiation capturing system according to claim 2 , further comprising a moving mechanism which inserts the scatterer in the irradiating field or which withdraws the scatterer from the irradiating field.4. The radiation capturing system according to claim 1 , wherein the low visibility capturing unit reduces the visibility of the moire fringe by performing capturing in a state that at least one of the plurality of gratings is moved or rotated with ...

Metal Grating Structure For X-Ray

A metal grating structure for X-ray includes a first silicon part having a plate form or a layer form, and a grating portion, wherein the grating portion includes a plurality of second silicon parts formed on the first silicon part, and a plurality of metal parts interposed between the respective adjacent second silicon parts, each of the plurality of metal parts having a deposition start tip part extending toward an inside of the first silicon part. 1. A metal grating structure for X-ray , comprising:a first silicon part having a plate form or a layer form; anda grating portion, whereinthe grating portion includes a plurality of second silicon parts formed on the first silicon part, and a plurality of metal parts interposed between the respective adjacent second silicon parts, each of the plurality of metal parts having a deposition start tip part extending toward an inside of the first silicon part.2. The metal grating structure for X-ray according to claim 1 , wherein the deposition start tip part includes a concave part having side surfaces claim 1 , one of the side surfaces having a tapered shape.3. The metal grating structure for X-ray according to claim 2 , wherein both of the side surfaces of the concave part have a tapered shape claim 2 , and intersect with each other.4. The metal grating structure for X-ray according to claim 1 , wherein a ratio between a first depth of each of the second silicon parts and a second depth of the deposition start tip part is set to be from 99:1 to 80:20.5. The metal grating structure for X-ray according to claim 1 , wherein the deposition start tip part includes a concave part having side surfaces claim 1 , one of the side surfaces having a curved shape.6. The metal grating structure for X-ray according to claim 1 , wherein the deposition start tip part includes a concave part which has side surfaces both having an outwardly convex spherical shape.7. The metal grating structure for X-ray according to claim 1 , wherein each ...

PREPARING AND ANALYZING SOLID FORM PROPERTIES OF A SUBSTANCE

In a method of analyzing solid form properties of a substance, which including the step of solidifying the substance, the solidified substance is obtained in one of a plurality of wells of a multi-well plate. In the multi-well plate the at least one of the plurality of wells has a bottom made of a thermoplastic polyimide. The method further includes analyzing the solidified substance in the well of the multi-well plate by X-ray diffraction. Thereby, the analysis includes providing X-ray through the solidified substance and a bottom of the well and evaluating the X-ray which passed the solidified substance and the bottom of the well. Such method and multi-well plate provide a durable and cost efficient system allowing a high quality analysis of solid form properties of the substance and an efficient and safe processing of the substance. 1. A multi-well plate comprising a plurality of wells , wherein at least one of the plurality of wells has a bottom made of a thermoplastic polyimide.2. The multi-well plate according to claim 1 , wherein the bottom of the at least one of the plurality of wells has a thickness of about 200 micrometer or less claim 1 , of about 150 micrometer or less claim 1 , of about 100 micrometer or less claim 1 , of about 50 micrometer or less claim 1 , or of about 25 micrometer or less.3. The multi-well plate according to claim 1 , wherein the at least one of the plurality of wells comprises a through hole and a sample micro-vessel having a body with a sidewall portion claim 1 , a bottom portion and a hollow interior limited by the sidewall portion and the bottom portion claim 1 , wherein the sample micro-vessel is made of a thermoplastic polyimide claim 1 , the sample micro-vessel is arranged in the through hole and the bottom portion of the body of the sample micro-vessel is the bottom of the well.4. The multi-well plate according to claim 3 , wherein in the at least one of the plurality of wells the through hole has a structured inner surface ...

X-RAY SHIELD GRATING AND X-RAY TALBOT INTERFEROMETER INCLUDING X-RAY SHIELD GRATING

An X-ray shield grating includes a substrate on which a plurality of recessed portions are arranged, and metal that is arranged in each of the recessed portions. The substrate includes a bent region that is bent in an arrangement direction in which the plurality of recessed portions are arranged. A radius of curvature of the bent region is 200 millimeters or less. In the bent region, a maximum value of a width of a region sandwiched between two adjacent recessed portions of the plurality of recessed portions and a width of the substrate in an end portion of the bent region are less than or equal to three times a minimum value of the width of the region sandwiched between the two adjacent recessed portions. 1. An X-ray shield grating comprising:a substrate on which a plurality of recessed portions are arranged; and metal that is arranged in each of the recessed portions,wherein the substrate includes a bent region that is bent in an arrangement direction in which the plurality of recessed portions are arranged,wherein a radius of curvature of the bent region is 200 millimeters or less, andwherein in the bent region,in a case where a maximum value of a width of a region sandwiched between two adjacent recessed portions of the plurality of recessed portions is less than or equal to three times a minimum value of the width of the region sandwiched between the two adjacent recessed portions, andin a case where a width of the substrate in an end portion of the bent region represents a shortest distance from the end portion to the metal when the end portion is part of the substrate, and represents 0 when the end portion is part of the metal,the width of the substrate in the end portion of the bent region being less than or equal to three times the minimum value.2. The X-ray shield grating according to claim 1 ,wherein in a case where the width of the substrate in the end portion of the bent region represents the shortest distance from the end portion to the metal when the ...

Single X-ray Grating X-ray Differential Phase Contrast Imaging System

Single X-ray grating differential phase contrast (DPC) X-ray imaging is provided by replacing the conventional X-ray source with a photo-emitter X-ray source array (PeXSA), and by replacing the conventional X-ray detector with a photonic-channeled X-ray detector array (PcXDA). These substitutions allow for the elimination of the G and G amplitude X-ray gratings used in conventional DPC X-ray imaging. Equivalent spatial patterns are formed optically in the PeXSA and the PcXDA. The result is DPC imaging that only has a single X-ray grating (i.e., the G X-ray phase grating). 1. Apparatus for performing X-ray differential phase contrast imaging , the apparatus comprising:an X-ray source comprising a photo-emitter X-ray source array;an X-ray detector comprising a photonic-channeled X-ray detector array; andan X-ray phase grating disposed between the X-ray source and the X-ray detector;wherein the apparatus includes no X-ray grating other than the X-ray phase grating.2. The apparatus of claim 1 , wherein the photo-emitter X-ray source array comprises:a light source;a spatial light modulator configured to receive light from the light source and to provide an optical spatially patterned beam;a photocathode configured to receive the optical spatially patterned beam and to provide patterned electron emission having an electron pattern according to the optical spatially patterned beam;electron optics configured to receive the patterned electron emission and to provide an electron image of accelerated electrons according to the electron pattern;an X-ray target disposed to receive the electron image of accelerated electrons and to provide patterned X-ray emission according to the electron image.3. The apparatus of claim 1 , wherein the photonic-channeled X-ray detector array comprises:a scintillator configured to receive X-rays and to provide corresponding optical radiation;an optical subsystem configured to receive the optical radiation and to provide an optical image;an ...

RADIATION IMAGING APPARATUS

A radiation imaging apparatus includes: a beam splitter; a detector that detects radiation passing through the beam splitter and the object; and a processing device that generates image data representing information on an inside of the object on the basis of data obtained with the detector. A first distance which is a distance between the beam splitter and the object can be changed. The processing device has a determination unit that determines the first distance that is to be set when the object is imaged, such that a value of the information on the inside of the object falls within a dynamic range of the image data. 1. A radiation imaging apparatus of imaging an object by using radiation ,the radiation imaging apparatus comprising:a beam splitter;a detector that detects radiation passing through the beam splitter and the object; anda processing device that generates image data representing information on an inside of the object on the basis of data obtained with the detector, whereina first distance which is a distance between the beam splitter and the object can be changed, andthe processing device has a determination unit that determines the first distance that is to be set when the object is imaged, such that a value of the information on the inside of the object falls within a dynamic range of the image data.2. The radiation imaging apparatus according to claim 1 , further comprising:a movement unit configured to move a position of the beam splitter or the object, or positions of both the beam splitter and the object according to the first distance determined by the determination unit.3. The radiation imaging apparatus according to claim 2 , further comprising:a holding unit that holds the object, whereinthe movement unit moves the holding unit.4. The radiation imaging apparatus according to claim 1 , whereinthe determination unit determines the first distance that is to be set when main imaging of the object is performed, by using pre-imaging data on the ...

X-RAY TECHNIQUES USING STRUCTURED ILLUMINATION

This invention discloses a method and apparatus for x-ray techniques using structured x-ray illumination for examining material properties of an object. In particular, an object with one or more regions of interest (ROIs) having a particular shape, size, and pattern may be illuminated with an x-ray beam whose cross sectional beam profile corresponds to the shape, size and pattern of the ROIs, so that the x-rays of the beam primarily interact only with the ROIs. This allows a greater x-ray flux to be used, enhancing the signal from the ROI itself, while reducing unwanted signals from regions not in the ROI, improving signal-to-noise ratios and/or measurement throughput 1. A method for examining an object , comprising:determining one or more regions of interest (ROIs) within the object to be examined;determining shapes, sizes, and patterns for features within the ROIs relative to a predetermined direction;selecting one or more x-ray techniques to examine the object;designating a position for the object;configuring a detector to detect x-rays emerging from the positioned object appropriate to the selected x-ray techniques; 'said beam propagating along said predetermined direction and having a predetermined intensity profile at the position of the object corresponding to at least a portion of the patterns of features of said ROIs;', 'creating a structured x-ray illumination beam,'}further positioning at least a portion of said ROIs relative to the structured x-ray illumination beam;using a detector to detect x-rays resulting from the interaction of the structured x-ray illumination beam and said ROIs within the object; andanalyzing a signal from the detector corresponding to said detected x-rays to determine one or more material properties of the object.2. The method of claim 1 , in whichsaid one or more material properties are selected from the group consisting of:composition, crystallographic structure, chemical state of at least one element, particle size, or ...