Method for Producing a Grating and Phase Contrast X-Ray System

A method is described for producing a grating, in particular an absorption grating, having a grating constant of less than 100 μm, by using a solution of superparamagnetic colloidal nanocrystal clusters (CNCs), a solvent liquid and a photocurable resin, with the following steps:—alignment of the CNCs in the solution by an external magnetic field,—exposure of the solution, so that the resin is cured and grating structures of an intended grating constant are formed, and—removal of the magnetic field.

X-ray computed tomography apparatus, radiation detector, and method of manufacturing radiation detector

An X-ray CT apparatus according to an embodiment includes an X-ray detector and a collimator unit. The X-ray detector detects X-rays that have passed through a subject. The collimator unit eliminates scattered radiation from X-rays that are incident on the X-ray detector. The collimator unit includes a plurality of collimator modules, a supporter, and a fixing unit. The plurality of collimator modules each includes a plurality of first collimator plates arranged in a grid along a channel direction and a slice direction that are orthogonal to each other. The supporter supports the collimator modules such that the collimator modules are aligned in a plurality of straight lines along the channel direction and in a plurality of straight lines along the slice direction. The fixing unit is provided to the supporter and fixes positions of the collimator modules in the channel direction and the slice direction.

Radiographic apparatus and radiographic system

A radiographic apparatus for obtaining a radiological phase contrast image, the radiographic apparatus includes: a radiation source, a first grating, a second grating, a scanning unit, and a radiological image detector. The radiation source includes a radiation tube, a driving power supply unit, and a radiation source control unit. The radiation irradiated from the radiation tube is controlled so that a remaining output after the feeding of the power to the radiation tube by the driving power supply unit is stopped becomes substantially zero, and the scanning unit performs a relative displacement operation after the radiation irradiated to the first grating is effectively cut off by the radiation source control unit.

Imaging apparatus and imaging method

An imaging apparatus includes a diffraction grating configured to produce an interference pattern by diffracting diverging light from a light source, an absorption grating configured to block part of the interference pattern, a detector configured to detect light transmitted through the absorption grating, and a moving unit configured to move the diffraction grating and the absorption grating. The moving unit causes relative movement of the interference pattern and the absorption grating by moving the diffraction grating and the absorption grating such that the diffraction grating and the absorption grating are not moved relative to each other.

Analyzing method of phase information, analyzing program of the phase information, storage medium, and x-ray imaging apparatus

An analyzing method for deriving phase information by analyzing a periodic pattern of moiré comprises steps of: subjecting at least a part of the periodic pattern of moiré to a windowed Fourier transform by a window function; calculating analytically, based on the moiré subjected to the windowed Fourier transform, information of a first spectrum carrying the phase information, and information of a second spectrum superimposed on the information of the first spectrum; and separating the information of the first spectrum from the information of the second spectrum, to derive the phase information.

Differential phase contrast x-ray imaging system and components

A differential phase contrast X-ray imaging system includes an X-ray illumination system, a beam splitter arranged in an optical path of the X-ray illumination system, and a detection system arranged in an optical path to detect X-rays after passing through the beam splitter.

Radiographic phase-contrast imaging apparatus

A radiographic phase-contrast imaging apparatus obtains a phase-contrast image using two gratings including the first grating and the second grating. The first and second gratings are adapted to form a moire pattern when a periodic pattern image formed by the first grating is superimposed on the second grating. Based on the moire pattern detected by the radiographic image detector, image signals of the fringe images, which correspond to pixel groups located at different positions with respect to a predetermined direction, are obtained by obtaining image signals of pixels of each pixel group, which includes pixels arranged at predetermined intervals in the predetermined direction, as the image signal of each fringe image, where the predetermined direction is a direction parallel to or intersecting a period direction of the moire pattern other than a direction orthogonal to the period direction. Then, a phase-contrast image is generated based on the obtained fringe images.

Method for Manufacturing Metal Lattice, Metal Lattice Manufactured by the Method, and X-ray Imaging Device using the Metal Lattice

According to a method for manufacturing a metal grating structure of the present invention, in filling a concave portion formed in a silicon substrate ( 30 ), for instance, a slit groove (SD) with metal by an electroforming method, an insulating layer ( 34 ) is formed in advance on an inner surface of the slit groove (SD) as an example of the concave portion by a thermal oxidation method. Accordingly, the metal grating structure manufacturing method is advantageous in finely forming metal parts of the grating structure. A metal grating structure of the present invention is manufactured by the above manufacturing method, and an X-ray imaging device of the present invention is incorporated with the metal grating structure.

Differential phase-contrast imaging with focussing deflection structure plates

The present invention relates to X-ray differential phase-contrast imaging, in particular to a deflection device for X-ray differential phase-contrast imaging. In order to provide differential phase-contrast imaging with improved dose efficiency, a deflection device ( 28 ) for X-ray differential phase-contrast imaging is provided, comprising a deflection structure ( 41 ) with a first plurality ( 44 ) of first areas ( 46 ), and a second plurality ( 48 ) of second areas ( 50 ). The first areas are provided to change the phase and/or amplitude of an X-ray radiation; and wherein the second areas are X-ray transparent. The first and second areas are arranged periodically such that, in the cross section, the deflection structure is provided with a profile arranged such that the second areas are provided in form of groove-like recesses ( 54 ) formed between first areas provided as projections ( 56 ). The adjacent projections form respective side surfaces ( 58 ) partly enclosing the respective recess arranged in between. The side surfaces of each recess have a varying distance ( 60 ) across the depth ( 62 ) of the recess.

IMAGING DEVICE, IMAGING METHOD, AND IMAGING SYSTEM

The present invention discloses an imaging device, an imaging method, and an imaging system, belonging to the field of sample image data acquisition and imaging technology. The imaging device includes: a charged particle source, a convergence system, a scanning control system, a detection module, and a spectral analysis module disposed below the detection module, where the detection module includes a plurality of pixelated detector units; and the detection module is provided with a hole thereon. The diffraction pattern is obtained by using the detection module, and the spectral analysis module performs spectral analysis on a charged particle beam passing through the hole, so as to obtain the diffraction pattern and spectral signal simultaneously by one scanning. The imaging method of the present invention is based on a hollow ptychography method, which enables toper form imaging on the diffraction pattern obtained through the detection module, with good imaging effects. 1. An imaging device , comprising:{'b': '1', 'a charged particle source (), configured to emit a charged particle;'}{'b': '2', 'a convergence system (), configured to constrain and converge a charged particle beam;'}{'b': '3', 'a scanning control system (), configured to control scanning of the charged particle beam on a sample;'}{'b': '4', 'a sample ();'}{'b': '5', 'a detection module (), configured to receive the charged particle and detect the signal strength of the charged particle; and'}{'b': 6', '5, 'a spectral analysis module () disposed below the detection module (), configured to analyze spectroscopic characteristics of the charged particle, wherein'}{'b': 5', '7', '5', '8, 'the detection module () comprises a plurality of pixelated detector units () and the detection module () is provided with a hole () thereon.'}28. The imaging device according to claim 1 , wherein the hole () is of claim 1 , but not limited to claim 1 , a circular claim 1 , square claim 1 , or annular shape.35. The ...

Source grating, interferometer, and object information acquisition system

A source grating includes a first sub-source grating, where first transmitting portions which transmit X-rays, and first shielding portions which shield X-rays, are alternately arranged in a first direction; and a second sub-source grating, where second transmitting portions which transmit X-rays, and second shielding portions which shield X-rays, are alternately arranged in a second direction orthogonal to the first direction. The first sub-source grating is curved so that two positions in the curve align in the first direction. The second sub-source grating is curved so that two positions in the curve align in the second direction.

X-ray phase imaging apparatus and method of detecting defect of material containing fibers

This X-ray phase imaging apparatus is provided with a control unit that acquires information on a defect of a material based on a dark field image of the material.

ON-AXIS, ANGLED, ROTATOR FOR X-RAY IRRADIATION

An on-axis, angled, rotator device is disclosed. The rotator device may include a container containing a slot for receiving a sample. An angle of the slot may be configured to be between 0 and 180 degrees relative to a perpendicular irradiation plane of a radiation device. The rotator device may include a cup positioned within an opening of the container. Additionally, the rotator device may include a driveshaft configured to transmit torque to cause the cup to be rotated when the cup is positioned within the opening. When the sample resides within the slot and the driveshaft transmits the torque to the cup, the cup may cause the sample to rotate about a center axis of the sample. The angle of the slot containing the sample and the rotation of the sample about the center axis may facilitate uniform radiation exposure to the sample when the radiation device emits radiation. 1. A rotator device , comprising:a container containing a slot for receiving a sample, wherein an angle of the slot of the container is between 0 and 180 degrees relative to a perpendicular irradiation plane of a radiation device;a cup configured to be positioned within an opening of the container and configured to contact the sample when the sample is contained in the slot; and wherein, when the sample resides within the slot and the driveshaft transmits the torque to the cup, the cup causes the sample to rotate about a center axis of the sample, and', 'wherein the angle of the slot containing the sample and the rotation of the sample about the center axis facilitate uniform radiation exposure to the sample when the radiation device emits radiation., 'a driveshaft configured to transmit torque to cause the cup to be rotated when the cup is positioned within the opening of the container,'}2. The rotator device of claim 1 , wherein the cup is configured to contact the sample via an o-ring positioned on the cup claim 1 , an object claim 1 , or a combination thereof.3. The rotator device of claim 1 , ...

DETECTOR ARRANGEMENT FOR AN X-RAY PHASE CONTRAST SYSTEM AND METHOD FOR X-RAY CONTRAST IMAGING

The present invention relates to a detector arrangement for an X-ray phase contrast system (), the detector arrangement () comprising: a scintillator (); an optical grating (); and a detector (); wherein the optical grating () is arranged between the scintillator () and the detector (); wherein the scintillator () converts X-ray radiation () into optical radiation (); wherein the IN optical grating () is configured to be an analyzer grating being adapted to a phase-grating () of an X-ray phase contrast system (); wherein the optical path between the optical grating () and the scintillator () is free of focussing elements for optical radiation. The present invention further relates to a method () for performing X-ray phase contrast imaging with a detector arrangement () mentioned above. The invention avoids the use of an X-ray absorption grating as G2 grating in an X-ray phase contrast interferometer system. 1. A detector arrangement for an X-ray phase contrast system , the detector arrangement comprising:a scintillator configured to convert X-ray radiation into optical radiation;an optical grating configured to be an analyzer grating which is adapted to a phase-grating of an X-ray phase contrast system; anda detector configured to detect the optical radiation, wherein the optical grating is located between the scintillator and the detector, andwherein an optical path between the optical grating and the scintillator is free of focussing focusing elements for the optical radiation.2. The detector arrangement according to claim 1 , wherein the optical grating is configured to be electronically adjustable.3. The detector arrangement according to claim 12 , further comprising wherein an LCD pixel array configured to provide claim 12 , the optical grating; and wherein claim 12 , preferably claim 12 , the LCD pixel array is configured to provide a stepping of the optical grating.4. The detector arrangement according to claim 3 , further comprising; and the scintillator; ...

MOBILE GRATING-DETECTOR ARRANGEMENT

A mobile grating-detector arrangement has an X-ray detector and at least one grating. The grating-detector arrangement is configured to record an interferometric X-ray image of at least one body part of a patient in a patient bed in operation. In addition, an X-ray system with such a grating-detector arrangement and its use for X-ray interferometric imaging is described. 1. A mobile grating-detector configuration , comprising:an X-ray detector; andat least one grating configured to record an interferometric X-ray image of at least one body part of a patient in a patient bed in operation.2. The grating-detector configuration according to claim 1 , wherein:the grating-detector configuration is to be positioned between a flat, folded position and an unfolded position; andsaid at least one grating is one of a plurality of gratings and at least some of said gratings are disposed at defined intervals in the unfolded position.3. The grating-detector configuration according to claim 2 , wherein said gratings include a first grating and a second grating claim 2 , said first grating claim 2 , said second grating and said X-ray detector are disposed in parallel at least in the unfolded position.4. The grating-detector configuration according to claim 1 , further comprising a trolley connected to said X-ray detector and said at least one grating claim 1 , with an aid of said trolley claim 1 , said X-ray detector and said at least one grating can be positioned in relation to the patient.5. The grating-detector configuration according to claim 4 , further comprising a supporting plate for the patient.6. The grating-detector configuration according to claim 5 , wherein said supporting plate has markers to position said supporting plate in relation to an X-ray source.7. The grating-detector configuration according to claim 5 , wherein said supporting plate is connected to said trolley.8. An X-ray system claim 5 , comprising:a mobile grating-detector configuration having an X-ray ...

Radiological image capturing apparatus and radiological image capturing system

There is described a radiological image capturing apparatus, which makes it possible to obtain a good X ray image in which contrast of the peripheral portions are emphasized by employing the Talbot interferometer method and the Talbot-Lau interferometer method. The apparatus is provided with an X-ray tube, a multi-slit member, a first diffraction grating, a second diffraction grating and an X-ray detector. The second diffraction grating contacts the X-ray detector. A distance L between the multi-slit element and the first diffraction grating is set to be not less than 0.5 m, a distance Z 1 between the first diffraction grating and the second diffraction grating is set to be not less than 0.05 m, and a slit interval distance d 0 of the multi-slit element is set to be not less than 2 μm. With the settings, the abovementioned good X-ray image can be obtained by using the Talbot-Lau interferometer system.

Inspection Apparatus, Inspection Method and Manufacturing Method

A product structure ( 407, 330 ′) is formed with defects ( 360 - 366 ). A spot (S) of EUV radiation which is at least partially coherent is provided on the product structure ( 604 ) to capture at least one diffraction pattern ( 606 ) formed by the radiation after scattering by the product structure. Reference data ( 612 ) describes a nominal product structure. At least one synthetic image ( 616 ) of the product structure is calculated from the captured image data. Data from the synthetic image is compared with the reference data to identify defects ( 660 - 666 ) in the product structure. In one embodiment, a plurality of diffraction patterns are obtained using a series overlapping spots (S( 1 )-S(N)), and the synthetic image is calculated using the diffraction patterns and knowledge of the relative displacement. The EUV radiation may have wavelengths in the range 5 to 50 nm, close to dimensions of the structures of interest.

METHOD FOR MANUFACTURING MICROSTRUCTURE

A method is provided for producing a microstructure. The method includes the first step of forming a supporting layer on a base substrate including a silicon substrate provided with recessed sections at a first surface thereof and a metal structure filling the recessed sections so as to come in contact with the metal structure at the first surface, the second step of forming a structure including the metal structure and the supporting layer by selectively etching the silicon substrate to expose at least the surface of the metal structure opposite the surface in contact with the supporting layer from the silicon substrate, and the third step of selectively etching the supporting layer of the metal structure. 1. A method for producing a microstructure , comprising:the first step of forming a supporting layer on a base substrate including a silicon substrate provided with recessed sections at a first surface thereof and a metal structure filling the recessed sections so as to come in contact with the metal structure at the first surface;the second step of forming a structure including the metal structure and the supporting layer by selectively etching the silicon substrate to expose at least the surface of the metal structure opposite the surface in contact with the supporting layer from the surface of the silicon substrate; andthe third step of selectively etching the supporting layer of the structure formed in the second step.2. The method according to claim 1 , wherein the etching performed in the second step is wet etching using an etchant claim 1 , and the etching performed in the third step is dry etching or wet etching using an etchant less foamable than the etchant used in the second step.3. The method according to claim 1 , wherein the etching on the silicon substrate in the second step is performed from a second surface of the silicon substrate opposite the first surface.4. The method according to claim 1 , wherein the etching on the supporting layer in the ...

DIFFRACTION GRATING FOR X-RAY PHASE CONTRAST AND/OR DARK-FIELD IMAGING

The present invention relates to a grating for X-ray phase contrast and/or dark-field imaging. It is described to form a photo-resist layer on a surface of a substrate. The photo-resist layer is illuminated with radiation using a mask representing a desired grating structure. The photo-resist layer is etched to remove parts of the photo-resist layer, to leave a plurality of trenches that are laterally spaced from one across the surface of the substrate. A plurality of material layers are formed on the surface of the substrate. Each layer is formed in a trench. A material layer comprises a plurality of materials, wherein the plurality of materials are formed one on top of the other in a direction perpendicular to the surface of the substrate. The plurality of materials comprises at least one material that has a k-edge absorption energy that is higher than the k-edge absorption energy of Gold and the plurality of materials comprises Gold. 1. A diffraction grating for X-ray phase contrast and/or dark-field imaging , the grating comprising:a substrate; anda plurality of material layers formed on a surface of the substrate and laterally spaced from each other across the surface of the substrate;wherein a material layer of the plurality of material layers comprises a plurality of materials formed one on top of another in a direction perpendicular to the surface of the substrate;wherein the plurality of materials comprises at least one material that has a k-edge absorption energy that is higher than the k-edge absorption energy of Gold and comprises Gold; andwherein a thickness of Gold in the material layer of the plurality of material layers is less than approximately 30% of a total thickness of the material layer.2. The grating according to claim 1 , wherein a material of the at least one material that has a k-edge absorption energy that is higher than the k-edge absorption energy of Gold is Lead.3. The grating according to any of claim 1 , wherein a material of the at ...

PHASE CONTRAST X-RAY INTERFEROMETRY

A phase contrast X-ray imaging system includes: an illumination source adapted to illuminate a region of interest; a diffraction grating adapted to receive illumination from the illuminated region of interest, the diffraction grating comprising a spatial structure having a first periodicity superimposed with a second periodicity that is different from the first periodicity; and a detector adapted to detect illumination passing through the diffraction grating, wherein the spatial structure is defined by varying height and/or pitch, and wherein the spatial structure imparts a first phase dependence based on the first periodicity and an additional phase dependence based on the second periodicity on the illumination passing through the diffraction grating. 1. A method for performing phase contrast X-ray imaging , comprising:illuminating a region of interest;imparting a first phase dependence and a second phase dependence to the received illumination using a single diffraction grating; anddetecting the illumination imparted with the first and second phase dependence.2. The method for performing phase contrast X-ray imaging according to claim 1 , further comprising:displaying an image of the region of interest using the detected illumination.3. A grating for performing phase contrast X-ray imaging claim 1 , comprising:a support structure; anda plurality of grating elements arranged to receive an X-ray beam therethrough,wherein the grating is adapted to change the phase of the X-ray beam in a quadratic or spherical-cap form.4. The grating for performing phase contrast X-ray imaging according to claim 3 , wherein the plurality of grating elements has a varying pitch that imparts a phase dependence on illumination passing through the grating.5. The grating for performing phase contrast X-ray imaging according to claim 3 , wherein the plurality of grating elements has a varying pitch and a varying height claim 3 , wherein the varying pitch and the varying height impart a ...

SYSTEM, METHOD AND COMPUTER PROGRAM FOR ACQUIRING PHASE IMAGING DATA OF AN OBJECT

The invention relates to a control module for controlling an x-ray system () during the acquisition of step images for phase imaging. The control module comprises a step image quantity providing unit () for providing a step image quantity, a detector dose providing unit () for providing a target detector dose, an applied detector dose determination unit () for determining an applied detector dose absorbed by a part of the detector () during the acquisition of a step image, and a step image acquisition control unit () for controlling the x-ray imaging system () during the acquisition of each step image based on the applied detector dose, the target detector dose and the step image quantity. The control module allows to control the x-ray imaging system such that the target detector dose is not exceeded while at the same time ensuring a sufficient quality of the step images.

Distributed, field emission-based x-ray source for phase contrast imaging

An x-ray source for use in Phase Contrast Imaging is disclosed. In particular, the x-ray source includes a cathode array of individually controlled field-emission electron guns. The field emission guns include very small diameter tips capable of producing a narrow beam of electrons. Beams emitted from the cathode array are accelerated through an acceleration cavity and are directed to a transmission type anode, impinging on the anode to create a small spot size, typically less than five micrometers. The individually controllable electron guns can be selectively activated in patterns, which can be advantageously used in Phase Contrast Imaging.

Structure and method for manufacturing the same

A method for manufacturing a structure by using a silicon mold, in which disturbances in arrangement due to charges are reduced, can be provided. The method for manufacturing a structure includes the steps of forming a recessed portion in a silicon substrate, cleaning, drying, or conveying the silicon substrate while charges of a plurality of portions sandwiched between the recessed portion are removed, and filling a metal into the recessed portion of the silicon substrate subjected to the cleaning, drying, or conveying.

System and method for phase-contrast x-ray imaging

A differential phase contrast X-ray imaging system includes an X-ray illumination system, a beam splitter arranged in a radiation path of the X-ray illumination system, and a detection system arranged in a radiation path to detect X-rays after passing through the beam splitter.

Phase contrast imaging computed tomography scanner

A grating based differential phase contrast imaging (DPCI) apparatus and acquisition technique whereby the system generates horizontal moire fringes on a detector of the DPCI system by tilting at least one of the G1 and G2 gratings, and capturing images of an object including moving the object in a direction perpendicular to the lines of the moire fringes.

X-RAY APPARATUS AND X-RAY MEASUREMENT METHOD

The invention provides an X-ray apparatus and an X-ray measurement method that can increase sensitivity to a positional shift of an X-ray as compared with related art. 1. An X-ray apparatus , comprising:a detector configured to receive a plurality of X-ray beams being discretely incident thereon and detect intensities of the X-ray beams, have passed through a detection object, the detector including a plurality of pixels; anda plurality of absorbing elements each being arranged at a boundary of two pixels from among the plurality of pixels included in the detector and configured to absorb part of the X-ray forming the X-ray beams,wherein the detector is so arranged that irradiation by each of the X-ray beams is provided over the two pixels of the detector.2. The X-ray apparatus according to claim 1 , whereinthe two pixels each have a region that is not provided with the absorbing element, andthe detector is so arranged that each of the X-ray beams the region not provided with the absorbing element in each of the two pixels.3. The X-ray apparatus according to claim 1 , wherein respective centers of the absorbing elements are arranged at respective centers of the intensities of the X-ray beams.4. The X-ray apparatus according to claim 1 , further comprising an arithmetic unit configured to acquire phase information of the detection object by using the intensity of the X-ray of the X-ray beam detected at the two pixels of the detector.5. The X-ray detector according to claim 4 , wherein the arithmetic unit acquires a position change amount of the X-ray beam by using intensity ratios of the X-ray beam detected at the two pixels.6. The X-ray apparatus according to claim 1 , wherein each of the absorbing elements is rectangular.7. The X-ray apparatus according to claim 1 , wherein each of the absorbing elements is cylindrical.8. The X-ray apparatus according to any of claim 1 , wherein each of the absorbing elements is conical.9. The X-ray apparatus according to claim 6 , ...

Monochromatic attenuation contrast image generation by using phase contrast ct

The present invention relates to a method and apparatus for X-ray phase contrast imaging. The method comprises the following steps: from the measured phase gradient and overall attenuation information, an electron density is computed; the contribution p C of the Compton scattering to the overall attenuation is estimated from the electron density; the contribution p p of the photo-electric absorption to the overall attenuation is estimated from the overall attenuation and the contribution p C ; the values p C and p p are used to reconstruct a Compton image and a photo-electric image; by linear combination of these two images, a monochromatic image at a desired energy is obtained.

APPARATUS FOR X-RAY IMAGING AN OBJECT

The present invention relates to an apparatus () for imaging an object. It is described to position () an X-ray detector relative to at least one X-ray source such that at least a part of a region between the at least one X-ray source and the X-ray detector is an examination region for accommodating an object. In a first mode of operation, with the at least one X-ray source a first focal spot is produced (), such that at least some first X-rays produced at the first focal spot pass through a first grating of an interferometer arrangement, the first grating positioned at a first position, and such that the at least some first X-rays pass through a second grating of the interferometer arrangement, the second grating positioned at a second position. In the first mode of operation, the at least some first X-rays are detected () with the X-ray detector at a detector position. In a second mode of operation, with the at least one X-ray source a second focal spot is produced (), such that at least some second X-rays produced at the second focal spot avoid the first grating at the first position. In the second mode of operation, the at least some second X-rays are detected () with the X-ray detector at the detector position. 1. An apparatus for X-ray imaging an object , comprising:at least one X-ray source;an X-ray interferometer arrangement;an X-ray detector;wherein the X-ray detector is configured to be positioned relative to the at least one X-ray source, such that at least a part of a region between the at least one X-ray source and the X-ray detector is an examination region for accommodating the object;wherein the X-ray interferometer arrangement comprises a first grating and a second grating;wherein in a first mode of operation the at least one X-ray source is configured to produce a first focal spot, and the at least one X-ray source is configured to produce X-rays, such that at least some first X-rays produced at the first focal spot pass through the first grating ...

X-RAY DEVICE AND X-RAY MEASUREMENT METHOD

The present invention provides an X-ray device and an X-ray measurement method which can acquire a scattering contrast image of an object. 1. An X-ray device comprising:a detector including a first pixel and a second pixel different from the first pixel, which are configured to detect intensity of an X-ray beam passing through an object;an attenuation element configured to attenuate an X-ray beam which is a part of the X-ray beam passing through the object and incident on the second pixel; andan arithmetic device configured to acquire information of the object including scattering information of the object from detection intensity of the X-ray beam detected by the first pixel and detection intensity of the X-ray beam detected by the second pixel,wherein, when the object is not located in an optical path of the X-ray beam, the X-ray beam is irradiated on a boundary between the first pixel and the second pixel, andwherein the attenuation element is configured so that an attenuation rate of X-ray changes according to an incident position in the second pixel.2. The X-ray device according to claim 1 , wherein the arithmetic device calculates the information of the object on the basis of an index that can determine a difference between an amount of change of detection intensity of the first pixel and an amount of change of detection intensity of the second pixel.3. The X-ray device according to claim 2 , wherein the index is based on a difference between the detection intensity of the first pixel and the detection intensity of the second pixel or a ratio between the detection intensity of the first pixel and the detection intensity of the second pixel.4. The X-ray device according to claim 2 , wherein the index is acquired from the detection intensity of the first pixel obtained by not locating the object in the optical path of the X-ray beam and the detection intensity of the second pixel obtained by not locating the object in the optical path of the X-ray beam.5. The X- ...

X-ray imaging system

An X-ray imaging system includes: an X-ray Talbot imaging device that has an object table, an X-ray source, a plurality of gratings, and an X-ray detector, and irradiates the X-ray detector with an X-ray from the X-ray source through an object and the plurality of gratings to acquire a moiré image necessary for generation of a reconstructed image of the object; and a tester that is installed on the object table, holds the object, and loads a tensile load or a compressive load on the object, wherein the X-ray Talbot imaging device includes a hardware processor that causes a series of imaging to be performed to acquire the moiré image, the tester includes: a base part; and a chuck, and an operation of the chuck is automatically controllable by the hardware processor in conjunction with the X-ray Talbot imaging device.

Devices Processed Using X-Rays

Objects undergoing processing by a high resolution x-ray microscope with a high flux x-ray source that allows high speed metrology or inspection of objects such as integrated circuits (ICs), printed circuit boards (PCBs), and other IC packaging technologies. The object to be investigated is illuminated by collimated, high-flux x-rays from an extended source having a designated x-ray spectrum. The system also comprises a stage to control the position and orientation of the object; a scintillator that absorbs x-rays and emits visible photons positioned in very close proximity to (or in contact with) the object; an optical imaging system that forms a highly magnified, high-resolution image of the photons emitted by the scintillator; and a detector such as a CCD array to convert the image to electronic signals.

HOLOGRAPHIC X-RAY DETECTION

An apparatus for X-ray imaging is provided. An X-ray source provides an X-ray along an X-ray beam path. A holographic medium is along the X-ray beam path. An X-ray phase grating is between the X-ray source and the holographic medium along the X-ray beam path. A readout beam source provides a readout beam along a readout beam path. A readout detector is along the readout beam path, wherein the holographic medium is along the readout beam path. 1. An apparatus , comprising:an X-ray source for providing an X-ray along an X-ray beam path;a holographic medium along the X-ray beam path;an X-ray phase grating between the X-ray source and the holographic medium along the X-ray beam path;a readout beam source for providing a readout beam along a readout beam path; anda readout detector along the readout beam path, wherein the holographic medium is along the readout beam path.2. The apparatus claim 1 , as recited in claim 1 , further comprising an erasure beam source providing an erasure beam along an erasure beam path claim 1 , wherein the holographic medium is along the erasure beam path.3. The apparatus claim 2 , as recited in claim 2 , wherein the erasure beam source is a UV light source.4. The apparatus claim 1 , as recited in claim 1 , further comprising an object support for supporting an object along the X-ray beam path between the X-ray phase grating and the holographic medium.5. The apparatus claim 1 , as recited in claim 1 , wherein the readout beam source is an optical light source and wherein the readout detector is a camera or photodiode array.6. The apparatus claim 1 , as recited in claim 1 , wherein the holographic medium is a photorefractive medium.7. The apparatus claim 1 , as recited in claim 1 , further comprising a controller electrically connected to the X-ray source claim 1 , the readout beam source claim 1 , and the readout detector claim 1 , wherein the controller comprises computer readable media claim 1 , comprising:computer readable code for ...

SOURCE GRATING FOR X-RAY IMAGING

A source grating structure (G) for interferometric X-ray imaging cable of generating a non-uniform intensity profile behind a surface (S) of the grating structure when exposed to X-ray radiation. 1. A source grating structure for interferometric X-ray imaging having a non-uniform duty cycle profile.2. The grating structure of claim 1 , said duty cycle profile having at least one local maximum away from an edge of said surface.3. A grating structure for interferometric X-ray imaging claim 1 , comprising a set of absorbing elements arranged in a periodic pattern to form said surface claim 1 , said set including at least two absorbing elements claim 1 , one proximal and one distal to said edge claim 1 , wherein a material density of the proximal absorbing element is higher than the material density of the distal proximal element.4. A grating structure for interferometric X-ray imaging claim 1 , comprising a set of absorbing elements arranged in a periodic pattern to form said surface claim 1 , said set including at least two absorbing elements claim 1 , one proximal and one distal to said edge claim 1 , the at least one proximal absorbing element having a greater depth perpendicular to said surface than the depth of the distant proximal element.5. (canceled)6. (canceled)7. The grating structure of claim 1 , wherein the grating is configured to compensate claim 1 , in a at least one direction claim 1 , a Heel effect.8. (canceled)9. An imaging system comprising:an X-ray source;an X-ray sensitive detector;an examination region between the X-ray source and the X-ray sensitive detector for receiving an object to be imaged;{'claim-ref': {'@idref': 'CLM-00001', 'claim 1'}, 'a source grating structure of arranged between the X-ray source and the object when said object resides in said imaging region.'}10. The imaging system of claim 9 , said imaging system being a rotational one claim 9 , in particular claim 9 , a computed tomography imaging system. The invention relates to a ...

X-RAY DETECTOR FOR PHASE CONTRAST AND/OR DARK-FIELD IMAGING

The present invention relates to X-ray imaging. In order to reduce X-ray dose exposure during X-ray image acquisition, an X-ray detector is provided that is suitable for phase contrast and/or dark-field imaging. The X-ray detector comprises a scintillator layer () and a photodiode layer (). The scintillator layer is configured to convert incident X- ray radiation () modulated by a phase grating structure () into light to be detected by the photodiode layer. The scintillator layer comprises an array of scintillator channels () periodically arranged with a pitch () forming an analyzer grating structure. The scintillator layer and the photodiode layer form a first detector layer () comprising a matrix of pixels (). Each pixel comprises an array of photodiodes (), each photodiode forming a sub-pixel (). Adjacent sub-pixels during operation receive signals having mutually shifted phases. The sub-pixels that during operation receive signals having mutually identical phase form a phase group per pixel. The signals received by the sub-pixels within the same phase group per pixel during operation are combined to provide one phase group signal (). The phase group signals of different phase groups during operation are obtained in one image acquisition. In an example, the pitch of the scintillator channels is detuned by applying a correcting factor c to a fringe period (P) of a periodic interference pattern () created by the phase grating structure, wherein 0 Подробнее

X-ray interferometric imaging system

An x-ray interferometric imaging system in which the x-ray source comprises a target having a plurality of structured coherent sub-sources of x-rays embedded in a thermally conducting substrate. The system additionally comprises a beam-splitting grating G 1 that establishes a Talbot interference pattern, which may be a π phase-shifting grating, and an x-ray detector to convert two-dimensional x-ray intensities into electronic signals. The system may also comprise a second analyzer grating G 2 that may be placed in front of the detector to form additional interference fringes, a means to translate the second grating G 2 relative to the detector. The system may additionally comprise an antiscattering grid to reduce signals from scattered x-rays. Various configurations of dark-field and bright-field detectors are also disclosed.

Microstructure, and imaging apparatus having the microstructure

A microstructure includes a substrate, and a grating provided in the substrate and made of metal. The grating is provided with a plurality of holes. The plurality of holes are arranged in a first direction. In a plane containing the first direction, the maximum value of the distance between the center of gravity of a grating region composed of the grating and the plurality of holes and the outer edge of the grating region is less than 1.39 times the minimum value of the distance between the center of gravity of the grating region and the outer edge of the grating region.

Phase Contrast X-Ray Imaging Device and Phase Grating Therefor

A phase grating for a phase contrast X-ray imaging device has a transverse surface which is to be aligned substantially transversely with respect to a radiation incidence direction and which is spanned by an x-axis and a y-axis perpendicular thereto. The phase grating is formed from a multiplicity of grating webs composed of a basic material, which are arranged alternately with optically denser interspaces. The grating webs subdivide the transverse surface into grating strips which are in each case elongated in the y-direction and which are lined up parallel alongside one another in the x-direction. The phase grating has in each grating strip along a z-axis, which is perpendicular to the transverse plane, a homogeneous total thickness of the basic material which always differs between adjacent grating strips. At least one grating web extends within the transverse surface over a plurality of grating strips. 110-. (canceled)11. A phase grating for a phase contrast X-ray imaging , the phase grating comprising:a transverse surface to be aligned substantially transversely with respect to a radiation incidence direction, said transverse surface being spanned by an x-axis and a y-axis perpendicular to said x-axis;a multiplicity of grating webs composed of a basic material and alternately arranged with optically denser interspaces, said grating webs dividing said transverse surface into grating strips that are in each case elongated in a y-direction of said y-axis and that are lined up parallel alongside one another in an x-direction of said x-axis;at least one of said grating webs extending within said transverse surface across a plurality of said grating strips; andthe phase grating, at each said grating strip along a z-axis that extends perpendicularly to said transverse surface, having a homogeneous total thickness of said basic material that differs between mutually adjacent said grating strips; and12. The phase grating according to claim 11 , wherein said grating webs ...

OMNIDIRECTIONAL SCATTERING- AND BIDIRECTIONAL PHASE-SENSITIVITY WITH SINGLE SHOT GRATING INTERFEROMETRY

X-ray scattering imaging can provide complementary information about the unresolved microstructures of a sample. The scattering signal can be accessed with various methods based on coherent illumination, which span from self-imaging to speckle scanning. The directional sensitivity of the existing methods is limited to a few directions on the imaging plane and it requires the scanning of the optical components, or the rotation of either the sample or the imaging setup, if the full range of possible scattering directions is desired. A new arrangement is provided that allows the simultaneous acquisition of the scattering images in all possible directions in a single shot. This is achieved by a specialized phase grating and a device for recording the generated interference fringe with sufficient spatial resolution. The technique decouples the sample dark-field signal with the sample orientation, which can be crucial for medical and industrial applications. 111-. (canceled)12. A configuration for obtaining quantitative x-ray images from a sample , the configuration comprising:an X-ray source outputting x-rays;a position-sensitive detector with spatially modulated detection sensitivity having a number of individual pixels;a recorder for recording the x-ray images of said position-sensitive detector;a processor for evaluating intensities in a single shot image for obtaining characteristics of the sample including absorption, differential phase contrast and directional, small-angle scattering contrast, for specified regions of the pixels;an optional absorption grating in front of, or embedded into said X-ray source; and i) a 2D periodic structure composed of unit cells, said unit cells being circular gratings, a period of said unit cells is P and that of said circular gratings is p, wherein periodic structures in a circular grating generate a considerable X-ray phase shift difference, which is of π/2 or odd multiples thereof, hereinafter referred to as π/2 shift; or π or π+ ...

Talbot effect based nearfield diffraction for spectral filtering

The invention relates to a grating arrangement and a method for spectral filtering of an X-ray beam (B), the grating arrangement comprising: a dispersive element ( 10 ) comprising a prism configured to diffract the X-ray beam (B) into a first beam component (BC 1 ) comprising a first direction (D 1 ) and a second beam component comprising (BC 2 ) a second direction (D 2 ), tilted with respect to the first direction; a first grating ( 20 ) configured to generate a first diffraction pattern (DP 1 ) of the first beam component (BC 1 ) and a second diffraction pattern (DP 2 ) of the second beam component (BC 2 ), the second diffraction pattern (DP 2 ) shifted with respect to the first diffraction patter (DP 1 ); and a second grating ( 30 ) comprising at least one opening ( 31 ) which is aligned along a line (d) from a maximum (MA) to a minimum (MI) of intensity of the first diffraction pattern (DP 1 ) or of the second diffraction pattern (DP 2 ).

X-RAY INTERFEROMETRIC IMAGING SYSTEM

An x-ray interferometric imaging system in which the x-ray source comprises a target having a plurality of structured coherent sub-sources of x-rays embedded in a thermally conducting substrate. The structures may be microstructures with lateral dimensions measured on the order of microns, and in some embodiments, the structures are arranged in a regular array. 1. (canceled)2. An x-ray imaging system comprising:an x-ray source configured to generate and emit x-rays in a periodic spatial pattern;a beam-splitting grating comprising a plurality of structures configured to diffract, for a predetermined x-ray wavelength, at least some of the x-rays impinging the beam-splitting grating, the plurality of structures arranged in a two-dimensional periodic array;a stage configured to hold an object to be imaged; andan x-ray detector comprising a two-dimensional array of x-ray detecting elements, the x-ray detector positioned to detect x-rays diffracted by the beam-splitting grating and perturbed by the object to be imaged.3. The system of claim 1 , wherein the plurality of structures comprises a grid that is periodic in two orthogonal directions.4. The system of claim 1 , wherein the structures of the beam-splitting grating are configured to apply a phase shift of approximately r radians to x-rays having the predetermined x-ray wavelength.52. The system of claim 1 , wherein the structures of the beam-splitting grating are configured to apply a phase shift of approximately n/ radians to x-rays having the predetermined x-ray wavelength.6. The system of claim 1 , wherein the object is positioned between the beam-splitting grating and the x-ray detector.7. The system of claim 1 , wherein the object is positioned between the x-ray source and the beam-splitting grating.8. The system of claim 1 , wherein the x-ray source comprises an electron beam emitter and a target claim 1 , the target comprising a substrate comprising a first material and a plurality of discrete structures ...

Phase Contrast X-Ray Tomography Device

The invention relates to a phase contrast x-ray tomography device, comprising an electron gun () having a downstream deflector coil (). The x-ray beam () is guided by the deflector coil () on a circular path over a target (), which is marginally tilted towards a plane positioned vertically on the device axis. The x-ray beam () generated at focal spot F of the electron beam () crosses an object () and arrives at a detector line () via a phase grating () and an amplitude grating () 1. A phase contrast x-ray tomography device comprising:an x-ray light source, which has at least one electron beam deflectable in a vacuum vessel and moving on a present path over a target at least partially surrounding an examination region, in order to generate on the target at least one focal spot emitting x-ray light,an x-ray-light detection unit, which comprises a stationary x-ray light phase measuring device over which the x-ray light is swept upon its movement, andan evaluating device, which is supplied with the output signals of the phase measuring device and is designed to calculate from these signals an object image obtained by phase contrast.2. A phase contrast x-ray tomography device according to claim 1 , wherein the electron beam is modulated in its intensity.3. A phase contrast x-ray tomography device according to claim 2 , wherein the electron beam is switched on and off path-dependently.4. A phase contrast x-ray tomography device according to claim 1 , wherein the electron beam is moved intermittently claim 1 , preferably by equal increments.5. A phase contrast x-ray tomography device according to claim 1 , wherein the radial position of the electron beam is varied claim 1 , preferably in dependence on the size of a region to be irradiated.6. A phase contrast x-ray tomography device according to claim 1 , wherein the target is at least partially rotationally symmetrical claim 1 , it preferably having the shape of a truncated cone claim 1 , or a part of such claim 1 , which ...

X-ray imaging apparatus

An X-ray imaging apparatus comprises a grating configured to form an interference pattern by diffracting X-rays from an X-ray source, a amplitude grating configured to partly shield X-rays forming the interference pattern, and an X-ray detector configured to detect an intensity distribution of X-rays from the amplitude grating. The amplitude grating is comprised of a central area and a peripheral area and the peripheral area shows an X-ray transmittance higher than the central area relative to X-rays perpendicularly entering the amplitude grating.

Method for producing a microstructure component, microstructure component and x-ray device

In a method for producing a microstructure component, which is used in particular as an x-ray phase contrast grating in an x-ray device, a material absorbing x-rays is poured into a mold able at least to be deformed about one bending axis, which is formed by a silicon substrate and which has a plurality of cutouts running in a direction of the thickness of the silicon substrate with dimensions in the micrometer range. The mold into which the material is poured is heated up to a working temperature value lying above the room temperature and below a melting temperature value of the material which is poured into it and is formed into a final contour as per specifications.

METHOD FOR PRODUCING A MICROSTRUCTURE COMPONENT, MICROSTRUCTURE COMPONENT AND X-RAY DEVICE

A method for producing a microstructure component, a microstructure component and an x-ray device are disclosed. In the method, a plurality of punctiform injection structures are inserted in a grid in a first substrate direction and a second substrate direction, standing at right angles thereto, into a first surface of a wafer-like silicon substrate. The injection structures are lengthened into drilled holes in the depth direction of the silicon substrate in a first etching step. A second surface of the silicon substrate is then at least partly removed for rear-side opening of the drilled holes in a second etching step and in a third etching step, an etching medium acting anisotropically is poured alternately through the drilled holes from both surfaces of the silicon substrate, so that drilled holes arranged next to one another in the first substrate direction connect to form a column running in the first substrate direction. 1. A method for producing a microstructure component , comprising:inserting a plurality of punctiform injection structures in a grid in a first substrate direction and inserting a second substrate direction, standing at right angles to the first substrate direction, into a first surface of a wafer-like silicon substrate;lengthening, in a first etching step, the punctiform injection structures into drilled holes in a depth direction of the silicon substrate;at least partly removing, in a second etching step, a second surface of the silicon substrate, lying opposite the first surface, for rear-side opening of the drilled holes; andpouring in a third etching step, an etching medium, effective anisotropically, alternately through the drilled holes from both surfaces of the silicon substrate, so that drilled holes arranged next to one another in the first substrate direction connect to form a column running in the first substrate direction.2. The method of claim 1 , wherein the punctiform injection structures in the second substrate direction are ...

FOCUSSING OF GRATINGS FOR DIFFERENTIAL PHASE CONTRAST IMAGING BY MEANS OF ELECTRO-MECHANIC TRANSDUCER FOILS

A grating assembly (GAi) for use in phase contrast imaging applications in an X-ray imager (IM). The assembly (GAi) includes an electrostrictive layer coupled to the grating structure (Gi) of the assembly (GAi). Via said coupling, ridges (RG) of the gratings structure can be deformed into alignment with the focal spot (FS) of the X-ray source (XR) of the imager (IM). This allows reducing X-radiation shadowing effects. 1. A grating assembly , comprising:a grating structure configured to modify X-ray radiation; anda layer of electrostrictive material coupled to a first face of said grating structure, wherein at least a part of the grating structure is deformable upon application of a voltage across the layer of electrostrictive material, wherein the first face of the grating structure and an opposing face of the electrostrictive layer are structured so as to interlock with each other.2. The grating assembly as per claim 1 , wherein the grating structure has a plurality of ridges claim 1 , and the deformation causes said plurality of ridges to at least partly align towards a focus region or a focus point located outside said grating assembly.3. The grating assembly as per claim 2 , wherein said plurality of ridges has respective tip portions that form said first face of the grating structure.4. (canceled)5. The grating assembly as per claim 1 , wherein the grating structure is arranged in an articulated manner with respect to at least one of the ridges.6. The grating assembly as per claim 1 , further comprising a stiffening element coupled to a second face of said grating structure distal from said layer of electrostrictive material.7. The grating assembly as per claim 1 , further comprising a further stiffening element coupled to the layer of electrostrictive material so as to sandwich the layer of electrostrictive material between said further stiffening element and said grating structure.8. The grating assembly claim 6 , as per claim 6 , wherein the second face of ...

Phase retrieval for scanning differential phase contrast systems

A phase contrast imaging apparatus (MA) and related image processing method. The imaging apparatus includes a movable arm (AR) that carries a detector (D) and one or more interferometric gratings (G 0, G 1, G 2 ). The imaging apparatus includes a rigidizer (RGD) to control the rigidity of at least the arm (AR) or a mounting (GM) for the gratings (G 0, G 1, G 2 ). This allows controlling a drift of a Moiré pattern as detected in a sequence of readouts. A phase of the so controlled Moiré pattern can be used to calibrate the imaging apparatus by using the image processing method.

Phantom device, dark field imaging system and method for acquiring a dark field image

The present invention relates to phantom device for a dark field imaging system. Although dark field imaging is known to be sensitive to changes in the micro-structure of the tissue of a human subject that may be caused during a disease progression, there may be a need to quantify information provided by an image of the human subject. A detector signal component representing the dark field image may be altered by changes of the X-ray spectrum which passes tissue of the human subject comprising micro-structures. This may be caused due to an attenuation of the X-ray radiation previously provided by an X-ray source, wherein the attenuation may be caused by tissue of the human subject, which covers said micro-structure comprising tissue. In order to provide information in clinical practice regarding the influence of attenuation to the X-ray radiation before it passes the micro-structure issue of the human subject, the phantom device for dark field imaging is proposed. The phantom device comprises a main body, wherein the main body comprises a plurality of reference parts. Each of the reference parts comprises an attenuation part and a de-coherence part. The attenuation part and the de-coherence part of the same reference part are stacked on top of each other. As a result, the different reference parts may imitate different portions of the human subject extending along a propagation direction of an X-ray radiation, which is propagated from an X-ray source of the dark field imaging system towards the corresponding X-ray detector. Thus, if the phantom device is scanned simultaneously or subsequently with the human subject, a dark field image may be acquired, which represents the human subject as well as the phantom device. From the image parts of the dark field image caused by the phantom device, a clinician may assess and classify the corresponding parts of the image, which relates to the human subject, for instance to the portions of the lung. The present invention ...

X-ray phase contrast imaging system

An X-ray phase contrast imaging system includes an X-ray source, a detector, a plurality of gratings including a first grating and a second grating, and a grating positional displacement acquisition section configured to obtain a positional displacement of the grating based on a Fourier transform image obtained by Fourier transforming an interference fringe image detected by the detector.

Analyzing grid for phase contrast imaging and/or dark-field imaging

The invention relates to an analyzing grid for phase contrast imaging and/or dark-field imaging, a detector arrangement for phase contrast imaging and/or dark-field imaging comprising such analyzing grid, an X-ray imaging system comprising such detector arrangement, a method for manufacturing such analyzing grid, a computer program element for controlling such analyzing grid or detector arrangement for performing such method and a computer readable medium having stored such computer program element. The analyzing grid comprises a number of X-ray converting gratings. The X-ray converting gratings are configured to convert incident X-ray radiation into light or charge. The number of X-ray converting gratings comprises at least a first X-ray converting grating and a second X-ray converting grating. Further, the X-ray converting gratings each comprise an array of grating bars, wherein the grating bars within each X-ray converting grating are arranged mutually displaced from each other in a direction perpendicular to the incident X-ray radiation by a specific displacement pitch. Further, the grating bars of the first X-ray converting grating are arranged mutually displaced from the grating bars of the second X-ray converting grating in the direction perpendicular to the incident X-ray radiation by the displacement pitch divided by the number of X-ray converting gratings.

SOURCE-DETECTOR ARRANGEMENT

The invention relates to a source-detector arrangement () of an X-ray apparatus () for grating based phase contrast computed tomography. The source-detector arrangement comprises an X-ray source () adapted for rotational movement around a rotation axis (R) relative to an object () and adapted for emittance of an X-ray beam of coherent or quasi-coherent radiation in a line pattern (); and an X-ray detection system () including a first grating element () and a second grating element () and a detector element (); wherein the line pattern of the radiation and a grating direction of the grating elements are arranged orthogonal to the rotation axis; and wherein the first grating element has a first grating pitch varied dependent on a cone angle (β) of the X-ray beam and/or the second grating element has a second grating pitch varied dependent on the cone angle of the X-ray beam. 1. Source-detector arrangement of an X-ray apparatus for grating based phase contrast computed tomography , comprising:an X-ray source adapted for rotational movement around a rotation axis relative to an object and adapted for emittance of an X-ray beam of coherent or quasi-coherent radiation in a line pattern; andan X-ray detection system including a first grating element and a second grating element and a detector element; wherein the line pattern of the radiation and a grating direction of the grating elements are arranged orthogonal to the rotation axis; and wherein the first grating element has a first grating pitch varied dependent on a cone angle (β) of the X-ray beam and/or the second grating element has a second grating pitch varied dependent on the cone angle of the X-ray beam.2. Source-detector arrangement according to claim 1 , wherein the X-ray source comprises a source grating element with a grating direction arranged orthogonal to the rotation axis.3. Source-detector arrangement according to claim 1 , wherein the X-ray source includes an anode to emit the coherent or quasi-coherent ...

Systems and Methods For X-Ray Phase Contrast Imaging Using Arrays Of X-Ray Focusing Elements

Systems and methods for performing x-ray phase-contrast imaging using a conventional x-ray source and detector are provided. An array of x-ray focusing elements it provided and used to focus x-ray onto a pattern of multiple different focal spots. When an object is introduced into the beam path, the focal spots will be displaced based on the x-rays being refracted by the object. A refraction angle map is produced and used to generate a phase contrast image, such as an image that indicates the electron density distribution in the object. Multi-spectral imaging can be achieved by utilizing the chromatic aberration of the array of x-ray focusing elements and sweeping the detector through different focal planes associated with different x-ray energy levels or sweeping the peak voltage of the x-ray source for a fixed object-to-detector distance. 1. A method for x-ray phase contrast imaging using an x-ray imaging system , the steps of the method comprising: an x-ray source;', 'an x-ray detector; and', 'an array of x-ray focusing elements positioned between the x-ray source and the x-ray detector and configured to focus x-rays incident on the array of x-ray focusing elements onto a pattern of focal spots on the x-ray detector;, 'a) acquiring an image of an object using an x-ray imaging system that compriseswherein the acquired image is indicative of a displacement of the focal spots based on a refraction of the x-rays by the object;b) providing a calibration image that depicts the pattern of focal spots defined by the array of x-ray focusing elements;c) producing a refraction angle map that indicates a refraction angle associated with each focal spot, the refraction angle map being based on the displacement of the focal spots measured using the acquired image and the calibration image; andd) repeating step c) while changing a relative angle between the x-ray imaging system and the object to obtain refraction angle maps for varying angles of illumination of x-rays onto the ...

X-RAY TALBOT INTERFEROMETER AND X-RAY TALBOT INTERFEROMETER SYSTEM

The present invention relates to an X-ray Talbot interferometer including a source grating including a plurality of X-ray transmitting portions, configured to allow some of X-rays from an X-ray source to pass therethrough; a beam splitter grating having a periodic structure, configured to diffract X-rays from the X-ray transmitting portions by using the periodic structure to form an interference pattern; and an X-ray detector configured to detect X-rays from the beam splitter grating. The beam splitter grating diffracts an X-ray from each of the plurality of X-ray transmitting portions to form interference patterns each corresponding to one of the plurality of X-ray transmitting portions. The plurality of X-ray transmitting portions are arranged so that the interference patterns, each corresponding to one of the plurality of X-ray transmitting portions, are superimposed on one another to enhance a specific spatial frequency component in a sideband generated by modulation of the interference patterns. 1. An X-ray Talbot interferometer comprising:a source grating including a plurality of X-ray transmitting portions, configured to allow some of X-rays from an X-ray source to pass therethrough;a beam splitter grating having a periodic structure, configured to diffract X-rays from the X-ray transmitting portions by using the periodic structure to form an interference pattern; andan X-ray detector configured to detect X-rays from the beam splitter grating,wherein the beam splitter grating diffracts an X-ray from each of the plurality of X-ray transmitting portions by using the periodic structure to form interference patterns each corresponding to one of the plurality of X-ray transmitting portions,wherein the plurality of X-ray transmitting portions are arranged so that the interference patterns, each corresponding to one of the plurality of X-ray transmitting portions, are superimposed on one another to enhance a specific spatial frequency component, andwherein the ...

Apparatus for movably suspending an x-ray grid, arrangement with an x-ray grid and method for operating an x-ray grid

An apparatus for movably suspending an x-ray grid. The apparatus has a carrier module, in or on which the x-ray grid is arranged, and a linkage. The linkage is configured to rotate the carrier module about an axis which is vertical to the x-ray grid and/or to translate the carrier module in the plane of the x-ray grid. An x-ray arrangement has an x-ray emitter, an x-ray detector and one or more apparatus for suspending the x-ray grid between the emitter and detector. The apparatus provides for play-free kinematics which is more cost-effective than the use of known precision drives.

Multiple x-ray beam tube

The present invention relates to the generation of multiple X-ray beams ( 26 ). In order to provide a facilitated X-ray source with the capability of increased tube power for providing coherent radiation, for example in differential phase contrast imaging (DPCI), a multiple X-ray beam X-ray source ( 10 ) is provided with an anode structure ( 12 ) and a cathode structure ( 14 ). The anode structure comprises a plurality of liquid metal jets ( 16 ) providing a plurality of focal lines ( 18 ). The cathode structure provides an electron beam structure ( 20 ) that provides a sub e-beam ( 22 ) to each liquid metal jet. The liquid metal jets are each hit by the sub e-beam along an electron-impinging portion ( 24 ) of the circumferential surface that is smaller than half of the circumference.

Grating structure for x-ray imaging

The present invention relates to a grating in X-ray imaging. In order to provide a grating with a facilitated stabilization, a grating ( 10 ) for X-ray imaging is provided that comprises a grating structure ( 12 ) with a first plurality of bar members ( 14 ) and a second plurality of gaps ( 16 ). A fixation structure ( 18 ) is arranged between the bar members to stabilize the grating bar members. The bar members are extending in a length direction ( 20 ) and in a height direction ( 22 ). The bar members are also spaced from each other by one of the gaps in a direction transverse to the height direction. The gaps are arranged in a gap direction parallel to the length direction. The fixation structure comprises a plurality of bridging web members ( 24 ) that are provided between adjacent bar members. Further, the web members are longitudinal web members that are extending in the gap direction and that are provided in an inclined manner in relation to the height direction. The inclination is provided in the gap direction.

DEVICE AND METHOD FOR ANODIZED OXIDATION OF AN ANODE ELEMENT FOR A CURVED X-RAY GRATING, SYSTEM FOR PRODUCING A CURVED X-RAY GRATING AND CURVED X-RAY GRATING

The present invention relates to a device for anodized oxidation of an anode element for a curved X-ray grating, the device () comprising: an anode element (); a cathode element (); an electrolytic medium (); a conductor element (); and a carrier element (); wherein the anode element () comprises a first side () and a second side (), wherein the second side () faces opposite to the first side (); wherein the carrier element () comprises a curved surface section () that extends along a curvature around a center of curvature (); wherein the carrier element () is configured to receive the second side () of the anode element () for attaching the conductor element () to the first side () of the anode element (); wherein the curved surface section () is configured to receive the conductor element () after detaching the second side () of the anode element () from the carrier element (); wherein the electrolytic medium () is configured to connect the anode element () and the cathode element (); wherein the cathode element () in conjunction with the anode element () and the electrolyte medium () is configured to generate at least one group of electric field lines () that define a plane (), wherein at least a straight extrapolation () of the group of electric field lines intersect the center of curvature, wherein the generation of the at least one group of electric field lines () results in an anodized oxidation of the anode element () on the curved surface section (). The invention provides a device () that avoids the risk of damaging the grating structures and getting a low yield. 1. A device for anodized oxidation of an anode element for a curved X-ray grating , the device comprising:an anode element;a cathode element;an electrolytic medium;a conductor element; anda carrier element;wherein the anode element comprises a first side and a second side, wherein the second side faces opposite to the first side;wherein the carrier element comprises a curved surface section that ...

DEVICE AND METHOD FOR PHASE STEPPING IN PHASE CONTRAST IMAGE ACQUISITION

The present invention relates to a device for phase stepping in phase contrast image acquisition, the device () comprising: a mobile grating (); a guiding element (); a restoring element (); and a locking element (); wherein the guiding element () is configured to guide the mobile grating () between a first position () and a second position (); wherein the restoring element () is configured to apply a force to the mobile grating (); wherein the force is directed from the first position () to the second position (); and wherein the locking element () is configured to releasably lock the mobile grating () in the first position (). In an example, during the motion of the mobile grating () back to equilibrium, a decoder () for the position of the mobile grating () along the guiding element () may trigger at least four measurement frames over a period of at least 2*Pi. The invention provides a device () for phase stepping in phase contrast image acquisition which provides a fast image acquisition without a significant delay and which reduces positional inaccuracies and which avoids back-lash. 1. A device for phase stepping in phase contrast image acquisition , the device comprising:a mobile grating;a guiding element configured to guide the mobile grating between a first position and a second position;a restoring element configured to apply a force to the mobile grating, the force being directed from the first position to the second position; anda locking element configured to releasably lock the mobile grating in the first position.2. The device according to claim 1 , further comprising:a position decoder configured to detect a position of the mobile grating along the guiding element and emit a trigger signal for a detector if the mobile grating passes predefined positions along the guiding element.3. The device according to claim 1 , wherein the mobile grating is configured to perform a continuous movement between the first position and the second position.4. The device ...

METHOD FOR PRODUCING A SCATTERED BEAM COLLIMATOR, SCATTERED BEAM COLLIMATOR AND X-RAY DEVICE WITH SCATTERED BEAM COLLIMATOR

A method is for producing a scattered beam collimator starting from a lower side and extending in a build-up direction as far as an upper side, and having a large number of X-ray absorbing partitions, and in which pass-through channels for unscattered X-ray radiation are embodied between the partitions. A lithographic process is used, by which the partitions of the scattered beam collimator are formed from a photoresist into which an X-ray absorbing material is mixed. 1. A method for producing a scattered beam collimator starting from a relatively lower side of the scattered beam collimator and extending in a build-up direction as far as a relatively upper side of the scattered beam collimator , the scattered beam collimator including a number of X-ray absorbing partitions , pass-through channels for unscattered X-ray radiation being embodied between the partitions , the method comprising:forming the number of X-ray absorbing partitions of the scattered beam collimator, using a lithographic process, from a photoresist into which an X-ray absorbing material is mixed.2. The method of claim 1 , wherein in a course of the lithographic process claim 1 , a layer of the photoresist is exposed and wherein claim 1 , following the layer of the photoresist being exposed claim 1 , the layer is at least one of rinsed and bathed in a solvent to form the pass-through channels.3. The method of claim 2 , wherein a layer of the photoresist has a thickness with a value in the range of 200 μm to 800 μm.4. The method of claim 1 , wherein the photoresist has an epoxy resin as the base resin.5. The method of claim 1 , wherein a metal is mixed into the photoresist as an X-ray absorbing material.6. The method of claim 1 , wherein X-ray absorbing material is mixed into the photoresist in a form of pellets.7. The method of claim 1 , wherein X-ray absorbing material is mixed into the photoresist such that a volumetric proportion of the X-ray absorbing material makes up at least approximately ...

Apparatus and method to obtain phase contrast x-ray images

An apparatus (2) for generating a phase contrast x-ray image (4) comprising in an optical path (6) as seen in the direction of the light flow: a) an incoherent x-ray source (8); b) a first beam splitter grating (12) for splitting the light beams (14) of said x-ray source (8); c) a second beam recombiner grating (20) for recombining the splitted beams (16, 18) in a recombination distance from the second beam recombiner grating (20); d) an optional third analyzer grating (22) in order to offer an adsorption lines grating matching the interference lines downstream of said second beam recombiner grating (20) in an analyzer plane (a); e) an image detector (30) disposed downstream of the analyzer plane (a); and f) a means for introducing a sample (24) into said optical path (6) upstream or downstream of the second beam recombiner grating (20).

Interferometer for quantitative phase contrast imaging and tomography with an incoherent polychromatic x-ray source

An x-ray interferometer arrangement is disclosed comprising only one phase grating (G1) and one amplitude grating (G2). This interferometer can be used to obtain phase contrast images with a standard x-ray tube. Additionall, the new type of interferometer may use a source consisting of an array of individual sub-sources. Each of the sub-sources is individually coherent but mutually incoherent to the other sub-sources. The array of sub-sources may be generated by placing an array of slits, i.e. an additional amplitude grating (G0) close to the source. Such an arrangement makes it possible to use this type of interferometer with a source that provides no spatial or temporal coherence. The setup can therefore be used with larger sources placed at shorter distance of the detector resulting in higher flux densities and thus shorter exposure times. This is of special importance for tomography which requires to acquire images of an object under many (hundreds) viewing angles.

Multidirectional phase-contrast x-ray visualization

FIELD: physics. SUBSTANCE: system includes an X-ray source, a detection circuit and a grating circuit. The detection circuit comprises, at least, eight linearly parallel units located in the first direction extending linearly in the perpendicular direction. The X-ray source, the detection circuit and the grating circuit are adapted to effect the object movement to the scanning direction, wherein the scanning direction is parallel to the first direction. The grating circuit comprises a phase grating structure mounted between the source and the detector, and an analyzer grating structure mounted between the phase grating structure and the detection circuit. The phase grating structure and the analyzer grating structure have a set of the corresponding linear gratings. The first parts of the phase gratings and the analyzer gratings have slits in the first direction, the second parts of the phase gratings and the analyzer gratings have slits in the second direction, different from the first one. At least, four adjacent lines of the linear detector units are connected to the first phase gratings and the analyzer gratings, and, at least, four adjacent lines of the linear detector blocks are connected to the second phase gratings and the analyzer gratings, and remain fixed relative to each other and to the detection circuit for moving the gratings. The method is carried out through the system. The computer-readable medium stores instructions for controlling the system by the method. EFFECT: using the invention allows to expand the technical means range for X-ray phase-contrast object visualization. 12 cl, 13 dwg 2624513 С 2 ко РОССИЙСКАЯ ФЕДЕРАЦИЯ (19) (11) ха а в з г (13) За 5 (51) МПК ФЕДЕРАЛЬНАЯ СЛУЖБА ПО ИНТЕЛЛЕКТУАЛЬНОЙ СОБСТВЕННОСТИ Аб1В 6/00 (2006.01) С21К 1/00 (2006.01) (12) ОПИСАНИЕ ИЗОБРЕТЕНИЯ К ПАТЕНТУ (21)(22) Заявка: 2014134452, 22.01.2013 (24) Дата начала отсчета срока действия патента: 22.01.2013 Дата регистрации: 04.07.2017 Приоритет(ы): (30) Конвенционный ...

Inspection device, inspection method and manufacturing method

제품 구조체(407, 330')는 결함(360-366)을 가지고 형성된다. 적어도 부분 간섭성인 EUV 방사선의 스폿(S)이 제품 구조체(604) 상에 제공되어 상기 제품 구조체에 의해 산란된 후에 방사선에 의해 형성되는 적어도 하나의 회절 패턴(606)을 캡쳐한다. 레퍼런스 데이터(612)는 공칭 제품 구조체를 기술한다. 제품 구조체의 적어도 하나의 합성 이미지(616)가 캡쳐된 이미지 데이터로부터 계산된다. 합성 이미지로부터의 데이터가 레퍼런스 데이터와 비교되어 제품 구조체 내의 결함(660-666)을 식별한다. 일 실시예에서, 복수 개의 회절 패턴이 직렬 중첩 스폿(S(1)-S(N))을 사용하여 획득되고, 합성 이미지는 회절 패턴 및 상대 변위에 대한 지식을 사용하여 계산된다. EUV 방사선은 관심 대상 구조체의 치수에 가까운, 5 내지 50 nm의 범위에 속하는 파장을 가질 수 있다. The product structures 407 and 330 'are formed with defects 360-366. A spot S of at least partially coherent EUV radiation is provided on a product structure 604 to capture at least one diffraction pattern 606 formed by radiation after being scattered by the product structure. Reference data 612 describes a nominal product structure. At least one composite image 616 of the product structure is calculated from the captured image data. Data from the composite image is compared to reference data to identify defects 660-666 within the product structure. In one embodiment, a plurality of diffraction patterns are obtained using serial overlapping spots (S (1) -S (N)), and the composite image is calculated using knowledge of the diffraction pattern and relative displacement. EUV radiation can have a wavelength in the range of 5 to 50 nm, close to the dimensions of the structure of interest.

Method for manufacturing grid for radiographic imaging

Inspection apparatus, inspection method, and manufacturing method

一种产品结构(407、330’)形成有缺陷(360至366)。在所述产品结构(604)上提供至少部分地相干的EUV辐射的光斑(S)，以捕获由所述辐射在被所述产品结构散射之后形成的至少一个衍射图案(606)。参考数据(612)描述名义产品结构。从所捕获的图像数据计算所述产品结构的至少一个合成图像(616)。比较来自所述合成图像的数据与所述参考数据以识别所述产品结构中的缺陷(660至666)。在一个实施例中，使用一系列重叠光斑(S(1)至S(N))来获得多个衍射图案，且使用所述衍射图案和相对移位的知识来计算所述合成图像。所述EUV辐射可具有在5nm至50nm的范围内的波长，接近于所述感兴趣结构的尺寸。

For phase-contrast and/or the X-ray detector of dark-field imaging

本发明涉及X射线成像。为了减少X射线图像采集期间的X射线剂量曝光，提供了适于相位对比和/或暗场成像的X射线探测器。所述X射线探测器包括闪烁体层(12)和光电二极管层(14)。闪烁体层被配置为将由相位光栅结构(18)调制的入射X射线辐射(16)转换为要由光电二极管层探测的光。闪烁体层包括周期性地布置有间距(22)的闪烁体通道(20)的阵列以形成分析器光栅结构。闪烁体层和光电二极管层形成包括像素(26)的矩阵的第一探测器层(24)。每个像素包括光电二极管(28)的阵列，每个光电二极管形成子像素(30)。操作期间邻近子像素接收具有相互移位的相位的信号。在操作期间接收具有相互相同的相位的信号的子像素形成每像素的相位组。在操作期间由每像素的相同相位组内的子像素接收的信号被组合以提供一个相位组信号(32)。在一个图像采集中获得操作期间的不同相位组的相位组信号。在范例中，通过将校正因子c应用于由相位光栅结构创建的周期性干涉图样(35)的条纹周期(P 条纹 )来使闪烁体通道的间距失谐，其中，0<c<2。

Phase contrast cone-beam ct imaging

A cone beam CT imaging system incorporates the phase contrast in-line method, in which the phase coefficient rather than only the attenuation coefficient is used to reconstruct the image. Starting from the interference formula of in-line holography, the terms in the interference formula can be approximately expressed as a line integral that is the requirement for all CBCT algorithms. So, the CBCT reconstruction algorithms, such as the FDK algorithm, can be applied for the in-line holographic projections.

Focus detector arrangement for generating phase-contrast x-ray images and method for this

The invention relates to a focus detector arrangement of an X-ray apparatus (1) for generating projective or tomographic phase-contrast images of an examination object (7, P), wherein a bundle of coherent X-rays (Si) is generated by an anode (12) that has areas (13) of different radiation emission arranged in strips and extending parallel to the grid lines of the phase grid (G1) of the focus detector arrangement. In addition, the invention also relates to a method for generating projective or tomographic X-ray phase-contrast images of an examination object with the aid of such a focus detector arrangement, wherein a bundle of coherent radiation is generated by an anode (12) that has areas (13) of different radiation emission arranged in strips and extending parallel to the grid lines of the phase grid (G1).

Method for marking and visualizing an implant by an X-ray phase-contrast tomography examination and an implant

Die Erfindung betrifft ein Verfahren zur Markierung und Visualisierung eines Implantats durch eine Röntgen-Phasenkontrast-Tomographieuntersuchung und ein Implantat (20, 21, 22), wobei vorgeschlagen wird, Implantate (20, 21, 22) mit möglichst eindeutigen spezifischen Eigenschaften bezüglich der durch sie erzeugten Phasenverschiebung (Deltaphi<SUB>V1</SUB>, Deltaphi<SUB>V2</SUB>) bei einer Phasenkontrast-Tomographieuntersuchung zu verwenden, wobei diese spezifischen Eigenschaften durch die typische selbst erzeugte spezifische Phasenverschiebung (Deltaphi<SUB>V1</SUB>, Deltaphi<SUB>V2</SUB>), durch typische Unterschiede der spezifischen Phasenverschiebungswerte $I1 oder durch typische räumliche Strukturen aus Materialien mit wohl definierten Phasenverschiebungswerten (Deltaphi<SUB>V1</SUB>, Deltaphi<SUB>V2</SUB>) bestehen kann. The invention relates to a method for marking and visualizing an implant by means of an X-ray phase-contrast tomography examination and an implant (20, 21, 22), wherein it is proposed implants (20, 21, 22) with as unique as possible specific properties with respect to them phase shift (Deltaphi <SUB> V1 </ SUB>, Deltaphi <SUB> V2 </ SUB>) used in a phase-contrast tomography study, these specific properties being due to the typical self-generated specific phase shift (deltaphi <SUB> V1 </ SUB>, Deltaphi <SUB> V2 </ SUB>), by typical differences in the specific phase shift values $ I1 or by typical spatial structures of materials with well defined phase shift values (deltaphi <SUB> V1 </ SUB>, deltaphi <SUB> V2 < / SUB>).

X-ray diffraction grating and X-ray Talbot interferometer

X-ray imaging apparatus and method of X-ray imaging

一种尺寸减小的X射线成像装置和方法，能够获得考虑被检物的X射线吸收效果的微分相位图像或相位图像。X射线在空间上被分离，并且，使用其中X射线的透过量根据X射线穿过被检物时的位移而连续变化的第一衰减元件。通过使用第一衰减元件和第二衰减元件来计算透过率，第二衰减元件关于X射线的透过量在X射线的位移方向上的变化量或变化特性与第一衰减元件不同。使用透过率来计算被检物的微分相位图像等。

X-ray absorption grating

Die Erfindung betrifft ein Röntgenabsorptionsgitter (1) hergestellt durch ein Lithographieverfahren für die Verwendung in einem Phasenkontrast-CT-System, bestehend aus mindestens zwei in Strahlungsrichtung übereinander angeordneten Einzelgitter (1.1.-1.4), wobei jedes Einzelgitter über eine Gitterfläche (4) verfügt, welche als Gitterstruktur eine Vielzahl von abwechselnd auftretenden Gitterstegen und Gitterspalten aufweist, wobei jedes Einzelgitter (1.1.-1.4) einen Bereich (6) außerhalb der Gitterfläche (= Außenbereich) aufweist und der Außenbereich (6) der mindestens zwei Einzelgitter (1.1.-1.4) zumindest an zwei Stellen zueinander korrespondierende Verzahnungsstrukturen (2, 3) aufweist, die bei der Herstellung der Gitterstruktur miterzeugt werden, und wobei die Verzahnungsstrukturen (2, 3) eine relativ zur Gitterstruktur definierte Position derart aufweisen, dass bei einem Aufeinanderfügen der Einzelgitter (1.1.-1.4) durch ineinander greifen der Verzahnungsstrukturen (2, 3) aufeinander liegender Einzelgitter (1.1.-1.4) eine definierte Ausrichtung der Einzelgitter stattfindet. The invention relates to an X-ray absorption grating (1) produced by a lithography method for use in a phase-contrast CT system, comprising at least two individual gratings (1.1.-1.4) arranged one above the other in the direction of radiation, each grating having a grating surface (4). which has as a lattice structure a plurality of alternately occurring lattice webs and lattice columns, wherein each lattice (1.1.-1.4) has a region (6) outside the lattice surface (= outer region) and the outer region (6) of the at least two individual lattices (1.1.-1.4 ) has at least two points to each other corresponding toothing structures (2, 3), which are co-produced in the production of the lattice structure, and wherein the toothed structures (2, 3) have a relative to the lattice structure defined position such that in a superposition of the individual lattice (1.1 . 1.4) by meshing of the toothing ...

Phase contrast x-ray imaging device and refracting grid therefor

X-ray imaging system with detector containing pixels

FIELD: instrument making. SUBSTANCE: invention relates to X-ray engineering. Image forming system (100) for generation of X-ray images comprises at least one X-ray source, preferably an array of X-ray sources (101a-101d) and X-ray detector (103) with an array of sensitive pixels (103a-103e). Collimator (102) is arranged between X-ray source and detector such that two openings (P) of collimator (102) allow passage of X-rays towards two adjacent pixels (103a-103e) while region between said pixels is substantially shielded. Said shielding of usually insensitive regions between pixels reduces unnecessary X-ray exposure. EFFECT: increased intensity of X-rays using a plurality of small X-ray sources (101a-101d). 15 cl, 3 dwg РОССИЙСКАЯ ФЕДЕРАЦИЯ (19) RU (11) (13) 2 589 720 C2 (51) МПК G21K 1/02 (2006.01) ФЕДЕРАЛЬНАЯ СЛУЖБА ПО ИНТЕЛЛЕКТУАЛЬНОЙ СОБСТВЕННОСТИ (12) ОПИСАНИЕ (21)(22) Заявка: ИЗОБРЕТЕНИЯ К ПАТЕНТУ 2013115301/07, 30.08.2011 (24) Дата начала отсчета срока действия патента: 30.08.2011 (72) Автор(ы): ЭНГЕЛЬ Клаус Юрген (NL), ФОГТМАЙЕР Гереон (NL) 06.09.2010 EP 10175358.0 (43) Дата публикации заявки: 20.10.2014 Бюл. № 29 R U (73) Патентообладатель(и): КОНИНКЛЕЙКЕ ФИЛИПС ЭЛЕКТРОНИКС Н.В. (NL) Приоритет(ы): (30) Конвенционный приоритет: (45) Опубликовано: 10.07.2016 Бюл. № 19 (85) Дата начала рассмотрения заявки PCT на национальной фазе: 08.04.2013 2 5 8 9 7 2 0 (56) Список документов, цитированных в отчете о поиске: US 2007133749A1, 14.06.2007. US 5802137A, 01.09.1998. US 2001048732 A1, 06.12.2001 . WO 9512884 A1,11.05.1995. ЕР 2197251А1, 16.06.2010. . (86) Заявка PCT: 2 5 8 9 7 2 0 R U C 2 C 2 IB 2011/053784 (30.08.2011) (87) Публикация заявки PCT: WO 2012/032435 (15.03.2012) Адрес для переписки: 129090, Москва, ул. Б. Спасская, 25, строение 3, ООО "Юридическая фирма Городисский и Партнеры" (54) СИСТЕМА ФОРМИРОВАНИЯ РЕНТГЕНОВСКОГО ИЗОБРАЖЕНИЯ С ДЕТЕКТОРОМ, СОДЕРЖАЩИМ ПИКСЕЛИ (57) Реферат: Изобретение относится к области допускают проход рентгеновских лучей в ...

Grating device for x-ray visualization device

FIELD: medicine. SUBSTANCE: invention relates to grating device (1) for an X-ray imaging device, interferometric unit (2), X-ray imaging system (3), X-ray imaging method, and an element of a computer program for controlling such a device, and a computer-readable medium storing such an element of the computer program. Grating device (1) for the X-ray imaging device contains grating structure (10) and drive structure (20). Grating structure (10) contains a plurality of grating segments (11). Drive structure (20) is configured to move said plurality of grating segments (11) with at least the rotational component between the first position and the second position. In the first position, grating segments (11) are placed in the path of x-ray beam (30) so that grating segments (11) act on the parts of x-ray beam (30). In the second position, grating segments (11) are placed outside the paths of x-ray beam (30) so that the segments of grating (11) do not affect the parts of x-ray beam (30). EFFECT: technical result is the choice to use differential phase-contrast imaging and/or dark field imaging in addition to or not in addition to the usual attenuation visualization, providing the flexibility for the clinician between phase-contrast and/or dark field examination and normal examination. 12 cl, 5 dwg РОССИЙСКАЯ ФЕДЕРАЦИЯ (19) RU (11) (13) 2 674 650 C2 (51) МПК G21K 1/10 (2006.01) ФЕДЕРАЛЬНАЯ СЛУЖБА ПО ИНТЕЛЛЕКТУАЛЬНОЙ СОБСТВЕННОСТИ (12) ОПИСАНИЕ ИЗОБРЕТЕНИЯ К ПАТЕНТУ (52) СПК G21K 1/10 (2006.01) (21)(22) Заявка: 2017106750, 20.07.2015 (24) Дата начала отсчета срока действия патента: Дата регистрации: (73) Патентообладатель(и): КОНИНКЛЕЙКЕ ФИЛИПС Н.В. (NL) 12.12.2018 (56) Список документов, цитированных в отчете о поиске: US 2010220832 A1, 09.02.2010. US 05.08.2014 EP 14179793.6 (43) Дата публикации заявки: 06.09.2018 Бюл. № 2010119041 A1, 13.05.2010. US 2010061511 A1, 11.03.2010. RU 2452385 C2, 10.06.2012. 25 (45) Опубликовано: 12.12.2018 Бюл. № 35 (86) Заявка PCT: C 2 C 2 ...

Patent RU2017106750A3

7 ВУ” 2017106750” АЗ Дата публикации: 11.10.2018 Форма № 18 ИЗ,ПМ-2011 Федеральная служба по интеллектуальной собственности Федеральное государственное бюджетное учреждение ж 5 «Федеральный институт промышленной собственности» (ФИПС) ОТЧЕТ О ПОИСКЕ 1. . ИДЕНТИФИКАЦИЯ ЗАЯВКИ Регистрационный номер Дата подачи 2017106750/07(011731) 20.07.2015 РСТ/ЕР2015/066554 20.07.2015 Приоритет установлен по дате: [ ] подачи заявки [ ] поступления дополнительных материалов от к ранее поданной заявке № [ ] приоритета по первоначальной заявке № из которой данная заявка выделена [ ] подачи первоначальной заявки № из которой данная заявка выделена [ ] подачи ранее поданной заявки № [Х] подачи первой(ых) заявки(ок) в государстве-участнике Парижской конвенции (31) Номер первой(ых) заявки(ок) (32) Дата подачи первой(ых) заявки(ок) (33) Код страны 1. 14179793.6 05.08.2014 ЕР* Название изобретения (полезной модели): [Х] - как заявлено; [ ] - уточненное (см. Примечания) УСТРОЙСТВО-РЕШЕТКА ДЛЯ УСТРОЙСТВА РЕНТГЕНОВСКОЙ ВИЗУАЛИЗАЦИИ Заявитель: КОНИНКЛЕЙКЕ ФИЛИПС Н.В., МГ. 2. ЕДИНСТВО ИЗОБРЕТЕНИЯ [Х] соблюдено [ ] не соблюдено. Пояснения: см. Примечания 3. ФОРМУЛА ИЗОБРЕТЕНИЯ: [Х] приняты во внимание все пункты (см. Примечания) [ ] приняты во внимание следующие пункты: [ ] принята во внимание измененная формула изобретения (см. Примечания) 4. КЛАССИФИКАЦИЯ ОБЪЕКТА ИЗОБРЕТЕНИЯ (ПОЛЕЗНОЙ МОДЕЛИ) (Указываются индексы МПК и индикатор текущей версии) С21К 1/10 (2006.01) 5. ОБЛАСТЬ ПОИСКА 5.1 Проверенный минимум документации РСТ (указывается индексами МПК) О21К 1/10 (2006.0101 5.2 Другая проверенная документация в той мере, в какой она включена в поисковые подборки: 5.3 Электронные базы данных, использованные при поиске (название базы, и если, возможно, поисковые термины): О\У/Р1, Езрасепе, Соозе Раб, ]-Р]а Раф К-РОМ, ЮМРВГ5, РАТЕМТ5СОРЕ, РабзеагсВ, КОРТО, 5ГРО, ОРТО 6. ДОКУМЕНТЫ, ОТНОСЯЩИЕСЯ К ПРЕДМЕТУ ПОИСКА Кате- Наименование документа с указанием (где необходимо) частей, Относится к гория* ...

Differential phase-contrast imaging with increased dynamic range

FIELD: medical equipment. SUBSTANCE: invention relates to the means of X-ray differential phase-contrast imaging. In order to improve information obtained form phase-contrast images, analyzer grating (34) for X-ray differential phase-contrast imaging is supplied by absorption structure (48). Absorption structure comprises a first plurality (50) of first areas (52) with first X-ray attenuation and a second plurality (54) of second areas (56) with second X-ray attenuation. Wherein the second X-ray attenuation is smaller than the first X-ray attenuation, and the first and second areas are arranged periodically in an alternating manner. Third plurality (58) of third areas (60) is provided with a third X-ray attenuation, which lies in a range from the second X-ray attenuation to the first X-ray attenuation, wherein every second of the first or second areas is replaced by one of the third areas. EFFECT: technical result is a quality increase of x-ray differential phase-contrast images. 11 cl, 24 dwg РОССИЙСКАЯ ФЕДЕРАЦИЯ (19) RU (11) (13) 2 596 805 C2 (51) МПК G21K 1/06 (2006.01) ФЕДЕРАЛЬНАЯ СЛУЖБА ПО ИНТЕЛЛЕКТУАЛЬНОЙ СОБСТВЕННОСТИ (12) ОПИСАНИЕ (21)(22) Заявка: ИЗОБРЕТЕНИЯ К ПАТЕНТУ 2013141214/07, 02.02.2012 (24) Дата начала отсчета срока действия патента: 02.02.2012 (72) Автор(ы): КЕЛЕР Томас (NL), РЕССЛ Эвальд (NL) (73) Патентообладатель(и): КОНИНКЛЕЙКЕ ФИЛИПС Н.В. (NL) Приоритет(ы): (30) Конвенционный приоритет: (43) Дата публикации заявки: 20.03.2015 Бюл. № 8 R U 07.02.2011 EP 11153480.6 (45) Опубликовано: 10.09.2016 Бюл. № 25 (85) Дата начала рассмотрения заявки PCT на национальной фазе: 09.09.2013 (86) Заявка PCT: 2 5 9 6 8 0 5 (56) Список документов, цитированных в отчете о поиске: DE 102006037281 A1, 09.08.2007. WO 2009113726 A2, 17.09.2009. WO 2010134012 A1, 25.11.2010. RU 2298852 C1, 10.05.2007. 2 5 9 6 8 0 5 R U (87) Публикация заявки PCT: WO 2012/107862 (16.08.2012) Адрес для переписки: 129090, Москва, ул. Б. Спасская, 25, строение 3, ООО "Юридическая фирма ...

X-ray imaging apparatus and X-ray imaging method

High resolution x-ray imaging of very small objects

A sample cell (10) for use in x-ray imaging, including structure (11) defining a chamber for a sample (12) and, mounted to said structure, a body (20) of a substance excitable by an appropriate incident beam (5) to generate x-ray radiation (6), the cell being arranged so that, in use, at least a portion of the x-ray radiation traverses said chamber (12) to irradiate the sample (7) therein and thereafter exits the structure for detection (35).

Apparatus and method to obtain phase contrast x-ray images

Apparatus and method to obtain phase contrast x-ray images

An apparatus (2) for generating a phase contrast x-ray image (4) comprising in an optical path (6) as seen in the direction of the light flow: a) an incoherent x-ray source (8); b) a first beam splitter grating (12) for splitting the light beams (14) of said x-ray source (8); c) a second beam recombiner grating (20) for recombining the splitted beams (16, 18) in a recombination distance from the second beam recombiner grating (20); d) an optional third analyzer grating (22) in order to offer an adsorption lines grating matching the interference lines downstream of said second beam recombiner grating (20) in an analyzer plane (a); e) an image detector (30) disposed downstream of the analyzer plane (a); and f) a means for introducing a sample (24) into said optical path (6) upstream or downstream of the second beam recombiner grating (20). This apparatus is significantly improved insofar as virtually no longitudinal coherence is required and simultaneously spatially incoherent x-rays (i.e. radiation stemming from a relatively large source placed at a relatively short distance) can be used. This properties means that this set-up now is perfectly suited for use with a standard x-ray tube, opening this technique to a wide spread of medical and/or commercial applications.

Differential phase-contrast imaging with focussing deflection structure plates

The present invention relates to X-ray differential phase-contrast imaging, in particular to a deflection device for X-ray differential phase-contrast imaging. In order to provide differential phase-contrast imaging with improved dose efficiency, a deflection device (28) for X-ray differential phase-contrast imaging is provided, comprising a deflection structure (41) with a first plurality (44) of first areas (46), and a second plurality (48) of second areas (50). The first areas are provided to change the phase and/or amplitude of an X- ray radiation; and wherein the second areas are X-ray transparent. The first and second areas are arranged periodically such that, in the cross section, the deflection structure is provided with a profile arranged such that the second areas are provided in form of groove-like recesses (54) formed between first areas provided as projections (56). The adjacent projections form respective side surfaces (58)partly enclosing the respective recess arranged in between. The side surfaces of each recess have a varying distance (60) across the depth (62) of the recess.

Differential phase-contrast imaging with increased dynamic range

The present invention relates to X-ray differential phase-contrast imaging. In order to enhance the information acquired by phase-contrast imaging, an analyzer grating (34) for X-ray differential phase-contrast imaging is provided with an absorption structure (48). The latter comprises a first plurality (50) of first areas (52) with a first X-ray attenuation, and a second plurality (54) of second areas (56) with a second X-ray attenuation. The second X-ray attenuation is smaller than the first X-ray attenuation, and the first and second areas are arranged periodically in an alternating manner. A third plurality (58) of third areas (60) is provided with a third X-ray attenuation, which lies in a range from the second X-ray attenuation to the first X-ray attenuation, wherein every second of the first or second areas is replaced by one of the third areas.

X-ray detector for phase contrast imaging

The invention relates to an X-ray detector ( 30 ) that comprises an array of sensitive elements (P i−1,b , P ia , P ib , P i+1,a , P i+1,b ) and at least two analyzer gratings (G 2a , G 2b ) disposed with different phase and/or periodicity in front of two different sensitive elements. Preferably, the sensitive elements are organized in macro-pixels (II i ) of e.g. four adjacent sensitive elements, where analyzer gratings with mutually different phases are disposed in front said sensitive elements. The detector ( 30 ) can particularly be applied in an X-ray device ( 100 ) for generating phase contrast images because it allows to sample an intensity pattern (I) generated by such a device simultaneously at different positions.

Grating for phase-contrast imaging

The invention relates to gratings for X-ray differential phase-contrast imaging, a focus detector arrangement and X-ray system for generating phase-contrast images of an object and a method of phase-contrast imaging for examining an object of interest. In order to provide gratings with a high aspect ratio but low costs, a grating for X-ray differential phase-contrast imaging is proposed, comprising a first sub-grating ( 112 ), and at least a second sub-grating ( 114; 116; 118 ), wherein the sub-gratings each comprise a body structure ( 120 ) with bars ( 122 ) and gaps ( 124 ) being arranged periodically with a pitch (a), wherein the sub-gratings ( 112; 114; 116; 118 ) are arranged consecutively in the direction of the X-ray beam, and wherein the sub-gratings ( 112; 114; 116; 118 ) are positioned displaced to each other perpendicularly to the X-ray beam.

Focus / detector system of an X-ray apparatus, X-ray system and method for producing phase-contrast images

Fokus/Detektor-System (2, 3) einer Röntgenapparatur zur Erzeugung projektiver oder tomographischer Phasenkontrastaufnahmen eines Untersuchungsobjektes (7), mindestens bestehend aus: 1.1. einer Strahlenquelle mit einem Fokus (F1) und einem fokusseitigen Quellengitter (G0), welches im Strahlengang zwischen Fokus (F1) und Untersuchungsobjekt (7) angeordnet ist und ein Feld von strahlweise kohärenten Röntgenstrahlen (Si) erzeugt, 1.2. einer Gitter/Detektor-Anordnung mit einem in Strahlrichtung nach dem Untersuchungsobjekt (7) angeordneten Phasengitter (G1) mit parallel zum Quellengitter (G0) angeordneten Gitterlinien zur Erzeugung eines Interferenzmusters und einem Detektor (D1) mit einer Vielzahl von flächig angeordneten Detektorelementen (Ei) zur Messung der Strahlungsintensität hinter dem Phasengitter (G1), 1.3. wobei die einzelnen Detektorelemente (Ei) jeweils aus einer Vielzahl von länglichen Detektionsstreifen (DSx) gebildet werden, die parallel zu den Gitterlinien des Phasengitters (G1) ausgerichtet sind und die eine Breite aufweisen, welche die direkte Detektion von Röntgeninterferenzerscheinungen hinter dem Phasengitter (G1) ermöglicht, 1.4. wobei die Gitter/Detektor-Anordnung derart ausgebildet und angeordnet ist, dass sie den folgenden geometrischen Bedingungen genügt: p2 = k × pDS p0 = p2 × ld , p1 = 2 × p₀ × p₂p₀ + p₂h1 = λ2(n – 1) ,wobei gilt: po = Gitterperiode des Quellengitters G0, p1 = Gitterperiode des Phasengitters G1, p2 = große Periode der Detekionsstreifen Ds, ... Focus / detector system (2, 3) of an X-ray apparatus for producing projective or tomographic phase-contrast images of an examination subject (7), at least consisting of: 1.1. a radiation source with a focus (F1) and a focus-side source grating (G0), which is arranged in the beam path between focus (F1) and examination object (7) and generates a field of beamwise coherent X-rays (Si), 1.2. a grating / detector arrangement with a phase grating (G1) arranged in the beam direction after the ...

Method and measuring arrangement for the non-destructive analysis of an examination object with X-radiation

Verfahren zur zerstörungsfreien Analyse eines Untersuchungsobjektes (5) mit mindestens den folgenden Verfahrensschritten: 1.1. es wird durch eine Röntgenstrahlungsquelle (10, 9) Röntgenstrahlung (1) mit einem bestimmten Energiespektrum erzeugt, wobei als Strahlungsquelle eine Röntgenröhre mit mindestens einem im Strahlengang nach dem Fokus angeordnetem Absorptionsgitter (= Quellengitter) zur Erzeugung eines Feldes quasi-kohärenter Röntgenstrahlen mit einer bestimmten Strahlungsenergie verwendet wird, 1.2. es wird mit Hilfe mindestens eines weiteren durchstrahlten röntgenoptischen Gitters (2) im Strahlengang der Röntgenstrahlung (1) von der Röntgenstrahlungsquelle (10, 9) aus gesehen hinter dem weiteren röntgenoptischen Gitter (2) ein Röntgenstehwellenfeld (4) dieser Röntgenstrahlung erzeugt, wobei das Röntgenstehwellenfeld (4) in seiner flächigen Ausdehnung im Wesentlichen der flächigen Ausdehnung des erzeugenden weiteren röntgenoptischen Gitters (2) entspricht, und das Röntgenstehwellenfeld (4) zumindest teilweise im Untersuchungsobjekt (5) positioniert wird, und 1.3. es wird die durch das Röntgenstehwellenfeld (4) im Untersuchungsobjekt (5) angeregte Strahlung (6) in Abhängigkeit mindestens einer Relativposition zwischen dem Untersuchungsobjekt (5) und dem Röntgenstehwellenfeld (4) durch mindestens einen außerhalb des Strahlenganges positionierten Detektor (7) gemessen, wobei aus dem Messergebnis der vom Röntgenstehwellenfeld (4) angeregten Strahlung (6) auf eine Materialverteilung (5.x) im Untersuchungsobjekt (5) rückgeschlossen wird, 1.4. es wird die durch das Röntgenstehwellenfeld (4) im Untersuchungsobjekt (5) angeregte Strahlung (6) in Abhängigkeit der Relativposition von Röntgenstehwellenfeld (4) und Untersuchungsobjekt (5) dreidimensional ausgemessen Method for non-destructive analysis of an object under examination (5) with at least the following method steps: 1.1. It is generated by an X-ray source (10, 9) X-ray radiation (1) with a specific energy ...

Focus-detector system on X-ray equipment for generating projective or tomographic X-ray phase-contrast exposures of an object under examination uses an anode with areas arranged in strips

A bundled electron beam (BEB) (14) is controlled regarding its excursion in its direction by two pairs of plate electrodes (17.1,17.2;18.1,18.2) that operate vertically to each other. The BEB can use appropriate control of these plate electrodes to scan an anode (16) like scanning a TV picture line by line with a desirable gap and, as a result, can generate desired X-rays. Independent claims are also included for the following: (1) An X-ray system for generating projective phase-contrast exposures; (2) A method for generating projective or tomographic X-ray phase-contrast exposures of an object under examination with the help of a focus-detector system.

X-ray radiographic grating of a focus-detector arrangement of an X-ray apparatus for generating projective or tomographic phase-contrast images of an examination subject

Die Erfindung betrifft ein röntgenoptisches Durchstrahlungsgitter (G<SUB>x</SUB>) einer Fokus-Detektor-Anordnung (F, D) einer Röntgenapparatur (1) zur Erzeugung projektiver oder tomographischer Phasenkontrastaufnahmen von einem Untersuchungsobjekt (7, P), mit einer Vielzahl von periodisch auf mindestens einer Oberfläche mindestens eines Wafers angeordneten Gitterstegen (S) und Gitterlücken (L), wobei das röntgenoptische Durchstrahlungsgitter (G<SUB>x</SUB>) aus mindestens zwei in Strahlungsrichtung unmittelbar hintereinander angeordneten Teilgittern (G<SUB>x1</SUB>, G<SUB>x2</SUB>) zusammengesetzt ist. The invention relates to an X-ray optical transmission grating (G <SUB> x </ SUB>) of a focus-detector arrangement (F, D) of an X-ray apparatus (1) for producing projective or tomographic phase-contrast images of an examination subject (7, P), with a A plurality of grid bars (S) and grid gaps (L) arranged periodically on at least one surface of at least one wafer, wherein the X-ray optical transmission grid (G <SUB> x </ SUB>) comprises at least two partial gratings (G <SUB> x1 </ SUB>, G <SUB> x2 </ SUB>).

Focus / detector system of an X-ray apparatus for producing phase contrast recordings, X-ray system with such a focus / detector system and associated storage medium and method

Fokus/Detektor-System eines CT-Systems zur Erzeugung projektiver oder tomographischer Phasenkontrastaufnahmen, aufweisend: 1.1. eine Strahlenquelle (2) mit einem Fokus (F1) und einem fokusseitigen Quellengitter (G0), welches im Strahlengang angeordnet ist und ein Feld von strahlweise kohärenten Röntgenstrahlen (Si) erzeugt, 1.2. eine Gitter/Detektoranordnung mit einem Phasengitter (G1), wobei zwischen dem fokusseitigen Quellengitter (G0) und der Gitter/Detektoranordnung ein abzutastendes Untersuchungsobjekt (7) angeordnet ist, die Gitter/Detektoranordnung parallel zum Quellengitter (G0) angeordnete Gitterlinien zur Erzeugung eines Interferenzmusters und einen Detektor (D1) mit einer Vielzahl von flächig angeordneten Detektorelementen (Ei) zur Messung der ortsabhängigen Strahlungsintensität hinter dem Phasengitter (G1) aufweist, 1.3. wobei die Detektorelemente (Ei) aus einer Vielzahl von länglichen Szintillationsstreifen (SSi) gebildet werden, die parallel zu den Gitterlinien des Phasengitters (G1) ausgerichtet sind, und eine kleine Periode (pSS) aufweisen, deren ganzzahliges Vielfaches der mittleren großen Periode (p2) des Interferenzmusters entspricht, die vom Phasengitter (G1) gebildet wird, und 1.4. innerhalb jeder großen Periode (p2) mindestens zwei Szintillationsstreifen (SSi, SSi+1, SSi+2) aus unterschiedlichem Szintillationsmaterial, die Licht unterschiedlicher Frequenz (λ1, λ2, λ3) erzeugen, angeordnet sind und deren Reihenfolge über das Detektorelement (Ei) gleich bleibt. Focus / detector system of a CT system for producing projective or tomographic phase-contrast images, comprising: 1.1. a radiation source (2) having a focus (F1) and a focus-side source grating (G0), which is arranged in the beam path and generates a field of beamwise coherent X-rays (Si), 1.2. a grating / detector arrangement with a phase grating (G1), wherein between the focus side source grating (G0) and the grating / detector arrangement a scanned object (7) is arranged, the grid / ...

Focus / detector system of an X-ray apparatus for producing phase-contrast images

Die Erfindung betrifft ein Fokus/Detektor-System einer Röntgenapparatur zur Erzeugung projektiver oder tomographischer Phasenkontrastaufnahmen eines Untersuchungsobjektes, mindestens bestehend aus: einer Strahlenquelle mit einem Fokus und einem fokusseitigen Quellengitter, welches im Strahlengang zwischen Fokus und Untersuchungsobjekt angeordnet ist, und ein Feld von strahlweise kohärenten Röntgenstrahlen erzeugt, einer Gitter/Detektor-Anordnung mit einem in Strahlrichtung nach dem Untersuchungsobjekt angeordneten Phasengitter mit parallel zum Quellengitter angeordneten Gitterlinien zur Erzeugung eines Interferenzmusters und einem Detektor mit einer Vielzahl von flächig angeordneten Detektorelementen zur Messung der Strahlungsintensität hinter dem Phasengitter, wobei zwischen Phasengitter und Detektor kein Analysengitter angeordnet ist, wobei die einzelnen Detektorelemente jeweils aus einer Vielzahl von länglichen Detektionsstreifen gebildet werden, die parallel zu den Gitterlinien des Phasengitters ausgerichtet sind und gruppenweise verbunden und gegeneinander versetzt angeordnet oder gegeneinander versetzt positionierbar ausgebildet sind. Weiter betrifft die Erfindung ein Röntgen-System oder ein Röntgen-C-Bogen-System sowie ein Verfahren zur Erzeugung projektiver Röntgenaufnahmen von einem Untersuchungsobjekt mit einem erfindungsgemäßen Fokus/Detektor-System.

Focus-detector arrangement with X-ray optical grating for phase contrast measurement

Fokus-Detektor-Anordnung (F1, D1) einer Röntgenapparatur (1) zur Erzeugung projektiver oder tomographischer Phasenkontrastaufnahmen eines Untersuchungsobjektes (7, P), mindestens bestehend aus: 1.1. einer auf einer ersten Seite des Untersuchungsobjektes (7, P) angeordneten Röntgenstrahlenquelle (2) mit einem Fokus (F1) zur Erzeugung eines Strahlenbündels (Si), 1.2. einem auf der gegenüberliegenden zweiten Seite des Untersuchungsobjektes (7, P) im Strahlengang angeordnetem Phasengitter (G1), welches ein Interferenzmuster der Röntgenstrahlung in einem vorbestimmten Energiebereich erzeugt, und 1.3. einem Analyse-Detektor-System (G2, D1), welches zumindest das vom Phasengitter (G1) erzeugte Interferenzmuster bezüglich seiner örtlichen Intensitätsverteilung detektiert, 1.4. wobei zwischen Fokus (F1) und Untersuchungsobjekt (7, P) ein Quellengitter (G0) zur Erzeugung eines Bündels kohärenter Strahlen (5) angeordnet ist und1.5. wobei mindestens ein Gitter (G0, G1, G2) der Fokus-Detektor-Anordnung (F1, D1) zumindest teilweise aus einem makroskopisch homogenen Medium (13) (= Gittermedium) besteht, welches angeregt durch Ultraschall periodische Strukturveränderungen aufweist, die beim Durchtritt des Röntgenstrahlenbündels zu Interferenzerscheinungen führen. Focus-detector arrangement (F1, D1) of an X-ray apparatus (1) for producing projective or tomographic phase-contrast images of an examination subject (7, P), at least consisting of: 1.1. an X-ray source (2) arranged on a first side of the examination object (7, P) with a focus (F1) for generating a beam (Si), 1.2. a phase grating (G1) arranged in the beam path on the opposite second side of the examination subject (7, P), which generates an interference pattern of the X-radiation in a predetermined energy range, and 1.3. an analysis detector system (G2, D1) which detects at least the interference pattern generated by the phase grating (G1) with respect to its local intensity distribution, 1.4. wherein between focus (F1) ...

Focus-detector arrangement of an X-ray apparatus for producing projective or tomographic phase contrast recordings and X-ray system, X-ray C-arm system and X-ray CT system

Fokus-Detektor-Anordnung (F1, D1) einer Röntgenapparatur (1) zur Erzeugung projektiver oder tomographischer Phasenkontrastaufnahmen eines Untersuchungsobjektes (7, P), mindestens bestehend aus: 1.1 einer auf einer ersten Seite des Untersuchungsobjektes (7, P) angeordneten Strahlungsquelle (2) mit einem Fokus (F1) zur Erzeugung eines fächerförmigen oder konusförmigen Strahlenbündels (Si), 1.2 mindestens einem im Strahlengang angeordneten röntgenoptischen Gitter (G0, G1, G2), wobei zumindest ein auf der gegenüberliegenden zweiten Seite des Untersuchungsobjektes (7, P) im Strahlengang angeordnetes Phasengitter (G1) vorliegt, welches ein Interferenzmuster der Röntgenstrahlung, vorzugsweise in einem vorbestimmten Energiebereich, erzeugt, 1.3 einem Analyse-Detektor-System (G2, D1), welches zumindest das vom Phasengitter (G1) erzeugte Interferenzmuster ortsaufgelöst bezüglich seiner Phasenverschiebung detektiert, und 1.4 einem Quellengitter (G0) zur Erzeugung eines Bündels quasi-kohärenter Strahlen, welches zwischen Fokus (F1) und Untersuchungsobjekt (P, 7) angeordnet ist, wobei 1.5 mindestens ein röntgenoptisches Gitter (G0, G1, G2) Stege (14) aufweist, die im Strahlengang des fächerförmigen oder konusförmigen Strahlenbündels (Si) frei von Abschattungen bildenden Überhängen sind, wobei 1.6 das mindestens eine röntgenoptische Gitter (G0, G1, G2) zumindest in einer ersten Schnittebene um den Fokus (F1) gekrümmt ausgebildet ist, und 1.7 die Krümmung des mindestens einen Gitters durch Mittel zur Druckbeaufschlagung auf das Gitter (G0, G1, G2) erreicht wird, ... Focus-detector arrangement (F1, D1) of an X-ray apparatus (1) for generating projective or tomographic phase-contrast images of an examination subject (7, P), at least consisting of: 1.1 a radiation source (2) arranged on a first side of the examination subject (7, P) ) with a focus (F1) for producing a fan-shaped or cone-shaped beam (Si), 1.2 at least one arranged in the beam path X-ray grating (G0, G1, G2), wherein ...

Measuring system with a phase-contrast contrast agent and its use for the non-invasive determination of properties of an examination subject

Mess-System zur nicht-invasiven Bestimmung von Eigenschaften eines Untersuchungsobjektes und/oder von Vorgängen und/oder Zuständen in einem Untersuchungsobjekt durch Bestimmung der relativen Phasenverschiebung mindestens zweier benachbarter kohärenter Röntgenstrahlen, die das Untersuchungsobjekt auf einem definierten Weg durchdringen, mit: 1.1. einer Röntgenquelle, welche mittelbar oder unmittelbar die mindestens zwei zueinander kohärenten Röntgenstrahlen mit einer Wellenlänge λ erzeugt, 1.2. einem Detektorsystem, welches in einem Abstand z1 vom Untersuchungsobjekt angeordnet ist und geeignet ist, die relative Phasenverschiebung Φ der mindestens zwei Röntgenstrahlen zu bestimmen, 1.3. einem Phasenkontrast-Kontrastmittel (Suspension), bestehend aus einer Basisflüssigkeit und einer Vielzahl darin befindlicher Partikel, wobei sich der Brechungsindex der Basisflüssigkeit nB vom Brechungsindex der Partikel nP unterscheidet, und 1.4. dem Untersuchungsobjekt, welches einen zu beobachtenden Raum aufweist, der eine lichte Weite L in Ausbreitungsrichtung der Mess-Strahlen besitzt, wobei 1.5. die Partikel im Phasenkontrast-Kontrastmittel einen mittleren Radius r aufweisen, der die folgenden geometrischen Beziehungen erfüllt:undwobei κ einen Wertebereich von 1% bis 99% annehmen kann und δP beziehungsweise δB dem reellen Dekrement des Brechungsindex nP beziehungsweise nB entspricht, wobei 1.6 die Partikel einen äußeren Mantel und einen Kern, jeweils mit unterschiedlichem Brechungsindex, aufweisen. Measuring system for the non-invasive determination of properties of an examination object and / or of processes and / or conditions in an examination subject by determining the relative phase shift of at least two adjacent coherent X-rays which penetrate the examination subject in a defined way, comprising: 1.1. an X-ray source which directly or indirectly produces the at least two mutually coherent X-rays having a wavelength λ, 1.2. a detector system which is arranged at a distance ...

Phase-contrast X-ray imaging

A stereoscopic phase-contrast X-ray imaging system ( 1 ) comprises a stereoscopic radiation head ( 20 ) having at least one X-ray source ( 30, 31 ) providing a first ( 32 ) and second ( 33 ) X-ray beam in stereoscopic configuration onto an object ( 110 ). At least one detector ( 40, 41 ) detects the beams ( 32, 33 ) having passed through the object ( 110 ) and generates detection data. This data is processed by a phase-contrast stereoscopic reconstruction processor ( 60 ) to generate two 2D phase-contrast images ( 80, 82 ) of the object ( 110 ) collectively forming a stereoscopic image pair or stereo image providing high resolution 3D representation of the object ( 110 ).

X-ray tube i.e. stereographic X-ray tube, for producing e.g. maxillo-dental image, has crystal for producing splitted conical beam to produce meshing network on flat sensor with compactness of rays and adjustable detector-source distance

The tube has continuous refocusing sources for forming a doubled conical scanning beam or a monochromatic crystal (25) for producing splitted conical beams (3, 4) to produce an interference meshing network on a flat sensor with compactness of rays and adjustable detector-source distance. The splitted conical beam is refocused on an object explored with a mirror system. The sources are separated by a distance of 2k cm, where k is an optimization coefficient of detection on the tube. Independent claims are also included for the following: (1) a method for implementing an X-ray tube (2) a method for providing consistency for electromagnetic waves.

Achromatic phase contrast imaging

提供用于检查感兴趣对象的消色差的相衬成像装置，该装置包括具有不同间距的两个不同的相位光栅。因而，成像装置产生关于两个不同的能量的相衬信息。因而，能够使用遍及更宽的能带的相位信息。

X-ray device

An embodiment of the invention relates to an X-ray device, more particularly for phase-contrast imaging in the medical sector. In at least one embodiment, the X-ray device includes an X-ray radiation source, a coherence grid, a phase grid and an X-ray detector from a number of pixels arranged in a matrix, the pixels including a lens grid.

Method for applying and / or introducing and visualizing a marking on and / or in an article

Die Erfindung betrifft ein Verfahren zum Aufbringen und/oder Einbringen sowie Visualisieren einer Kennzeichnung auf und/oder in einem Gegenstand (8), wobei auf und/oder in dem Gegenstand (8) als Kennzeichnung (9) wenigstens eine Schicht (9) mit Mikropartikel (10) aufgebracht und/oder eingebracht wird, wobei eine Visualisierung der Kennzeichnung mittels Durchleuchtung des Gegenstands (8) mit Röntgenstrahlung und Erzeugung eines Röntgen-Phasenkontrastbildgebungs-Dunkelbilds (11) unter Verwendung eines Talbot-Lau-Röntgen-Interferometers (1) erfolgt. The invention relates to a method for applying and / or introducing and visualizing a marking on and / or in an article (8), wherein on and / or in the article (8) as a marking (9) at least one layer (9) with microparticles (10) is applied and / or introduced, whereby a visualization of the marking by means of X-ray transmittance of the article (8) and generation of an X-ray phase contrast imaging dark image (11) using a Talbot-Lau X-ray interferometer (1).

Dual phase grating interferometer for x-ray phase contrast imaging

Since the very first experiments with phase-contrast imaging at synchrotrons, X-ray scientists were quite excited by the potential of this novel approach, as the "holy-grail" of boosting the contrast of soft and radiation sensitive materials under dose-control seemed to be finally at reach. The features of gratings-based interferometry (GI) are well suited for transferring this exciting technology from the exclusive synchrotron's community to a much wider basin of potential users. Particularly for medical applications, the relation between image contrast and dose has triggered tremendous efforts in the development of novel imaging devices. Such systems essentially operate near to the photon-starvation limit to cope with the fundamental dilemma of providing sufficient diagnostic sensitivity and sensibility at an acceptable, as low as reasonably achievable (ALARA) risk for the patient. If a new imaging modality were to be implemented in a clinical environment, it is needless to say that it has to be compliant with the very strict regulatory directives. The present invention proposes a system based exclusively on X-ray phase shifting components, i.e. without the use of an absorption grating, or a mask or a high-resolution detector. The novel approach is applicable at all imaging relevant energies and can be easily scalable to large field of views. The invention solves in one shot most the major limitations so far which were preventing a broad dissemination of phase contrast X-ray imaging on conventional sources.

Interferometer for quantative phase contrast imaging and tomography with an incoherent polychromatic x-ray source

An x-ray interferometer arrangement is disclosed comprising only one phase grating (Gl) and one amplitude grating (G2). This interferometer can be used to obtain phase contrast images with a standard x-ray tube. Additionall, the new type of interferometer may use a source consisting of an array of individual sub-sources. Each of the sub-sources is individually coherent but mutually incoherent to the other sub-sources. The array of sub-sources may be generated by placing an array of slits, i.e. an additional amplitude grating (GO) close to the source. Such an arrangement makes it possible to use this type of interferometer with a source that provides no spatial or temporal coherence. The setup can therefore be used with larger sources placed at shorter distance of the detector resulting in higher flux densities and thus shorter exposure times. This is of special importance for tomography which requires to acquire images of an object under many (hundreds) viewing angles.