Настройки

Укажите год
-

Небесная энциклопедия

Космические корабли и станции, автоматические КА и методы их проектирования, бортовые комплексы управления, системы и средства жизнеобеспечения, особенности технологии производства ракетно-космических систем

Подробнее
-

Мониторинг СМИ

Мониторинг СМИ и социальных сетей. Сканирование интернета, новостных сайтов, специализированных контентных площадок на базе мессенджеров. Гибкие настройки фильтров и первоначальных источников.

Подробнее

Форма поиска

Поддерживает ввод нескольких поисковых фраз (по одной на строку). При поиске обеспечивает поддержку морфологии русского и английского языка
Ведите корректный номера.
Ведите корректный номера.
Ведите корректный номера.
Ведите корректный номера.
Укажите год
Укажите год

Применить Всего найдено 3. Отображено 3.
03-01-2018 дата публикации

플라스마 장치

Номер: KR0101814013B1
Принадлежит: 삼성디스플레이 주식회사

... 본 발명의 한 실시예에 따른 플라스마 장치는 반응 챔버, 반응 챔버 내의 상부에 위치한 상부 전극, 상부 전극과 마주하는 하부 전극, 하부 전극을 둘러싸며 가장자리에 복수의 관통 구멍을 포함하는 배플 플레이트를 포함하고, 관통 구멍의 경계선은 배플 플레이트의 경계선과 연결되어 배플 플레이트의 가장자리에 오목부를 형성한다.

Подробнее
16-06-2016 дата публикации

THIN FILM TRANSISTOR SUBSTRATE AND METHOD OF MANUFACTURING SAME

Номер: KR1020160069063A
Принадлежит:

A thin film transistor substrate comprises: a gate electrode disposed on a base substrate; an active pattern overlapping the gate electrode; a source electrode disposed on the active pattern and a drain electrode separated from the source electrode; a buffer layer coming in contact with the active pattern and disposed on the source electrode and the drain electrode; a first passivation layer disposed on the buffer layer; and a second passivation layer disposed on the first passivation layer. A hydrogen content contained in the buffer layer is higher than the hydrogen content contained in the first passivation layer and lower than the hydrogen content contained in the second passivation layer. According to the present invention, the buffer layer disposed between a source metal pattern and the first passivation layer is formed by plasma processing using relatively low power. Thus, deterioration of the active pattern and the source metal pattern may be reduced. COPYRIGHT KIPO 2016 ...

Подробнее
17-08-2015 дата публикации

SPUTTERING APPARATUS

Номер: KR1020150092779A
Принадлежит:

A sputtering apparatus includes a chamber, a substrate support part which is arranged in the chamber and supports the substrate, a gas supply flow path which is separated from the substrate to surround the edge of the substrate, and a partition wall part which surrounds the gas supply flow path. The partition wall part includes a first frame and a second frame which are separated on both sides of the gas supply flow path, and a first end part and a second end part which are extended from the first frame and the second frame, respectively. The first end part and the second end part are overlapped with each other by a constant distance. COPYRIGHT KIPO 2015 ...

Подробнее