23-06-2023 дата публикации
Номер: CN116300349A
Принадлежит:
The invention relates to the field of semiconductor manufacturing, and discloses an alignment method for back photoetching of a SiC power device and the SiC power device, which utilizes the transparent characteristic of a SiC wafer and uses a front mark for alignment in back photoetching. A specific lightproof film layer or a film layer with obvious color difference is deposited on the surface of a wafer in front photoetching, due to the characteristics of the film layer, a mark required by alignment can be obtained after etching, probe light with a proper wave band can be selected in back photoetching, a stronger alignment signal can be obtained when the mark is scanned, a signal difference is formed between the mark and other areas, and the alignment accuracy is improved. The position of the front mark can be obtained through the signal difference, the aim of aligning with the front mark is achieved, and the alignment precision is improved after alignment of multiple positions.
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