АВТОМАТИЗИРОВАННЫЙ КОНТРОЛЬ ДЛЯ ВЫЯВЛЕНИЯ ИНОРОДНЫХ МАТЕРИАЛОВ, ТРЕЩИН И ИНЫХ АНОМАЛИЙ ПОВЕРХНОСТИ

РОССИЙСКАЯ ФЕДЕРАЦИЯ (19) RU (11) (13) 2018 123 561 A (51) МПК G01N 21/88 (2006.01) ФЕДЕРАЛЬНАЯ СЛУЖБА ПО ИНТЕЛЛЕКТУАЛЬНОЙ СОБСТВЕННОСТИ (12) ЗАЯВКА НА ИЗОБРЕТЕНИЕ (21)(22) Заявка: 2018123561, 28.06.2018 (71) Заявитель(и): ЗЕ БОИНГ КОМПАНИ (US) Приоритет(ы): (30) Конвенционный приоритет: (72) Автор(ы): САФАИ Мортеза (US) 16.08.2017 US 15/678,670 Адрес для переписки: 190000, г. Санкт-Петербург, БОКС-1125 Стр.: 1 A 2 0 1 8 1 2 3 5 6 1 R U A (57) Формула изобретения 1. Способ контроля заготовки, включающий: излучение структурированного света 120 на первую часть заготовки 104 с использованием источника 118 освещения, при этом первая часть заготовки 130 отражает указанный структурированный свет; формирование изображения структурированного света, отраженного от первой части заготовки, с использованием камеры 116 обратной связи для создания первых выходных данных; формирование изображения второй части заготовки 132, которая не освещена указанным источником освещения, с использованием камеры 114 съемки фона для создания вторых выходных данных; сравнение первых выходных данных со вторыми выходными данными и изменение структурированного света 120, излучаемого источником 118 освещения, путем изменения одного или более из интенсивности, тона, насыщенности и цвета структурированного света на основании результата сравнения первых выходных данных со вторыми выходными данными, что увеличивает контраст одного или более дефектов, находящихся в первой части заготовки. 2. Способ по п. 1, согласно которому источник 118 освещения содержит по меньшей мере один миллион органических светодиодов, а изменение структурированного света, излучаемого источником освещения, включает управление интенсивностью каждого из указанных светодиодов в отдельности. 3. Способ по п. 2, согласно которому каждый органический светодиод выполнен с возможностью обеспечения освещенности по меньшей мере 1000 люкс. 4. Способ по п. 1, дополнительно включающий отображение данных, полученных из первых выходных данных от ...

Behälterinspektionsvorrichtung zur Inspektion von Behältern

Behälterinspektionsvorrichtung (10) zur Inspektion von Behältern (2), mitmindestens einer Leuchte (11 bis 15) zum Beleuchten von Behältern (2) zu einem vorbestimmten Inspektionszeitpunkt zum Inspizieren der Behälter (2), undeiner elektrischen Leitung zum Anschluss der mindestens einen Leuchte (11 bis 15) an eine elektrische Energieversorgung (30) und an ein Bussystem (6), so dass die elektrische Leitung sowohl zum Versorgen der mindestens einen Leuchte (11 bis 15) mit elektrischer Energie als auch zur Verbindung mit einem Echtzeit-Datennetzwerk dient.

Beleuchtungseinrichtung für eine Kamera oder einen optischen Sensor

Beleuchtungseinrichtung (8), aufweisend- erste Leuchtdiodenchips (H11, H21, H31, H41, H51 .... H161), die um eine Mittelachse (M) herum entlang einer virtuellen Außenlinie (A1) einer ersten geometrischen Figur angeordnet sind,- zweite Leuchtdiodenchips (H12, H 22, H 32, H42, H52 .... H162), die um die Mittelachse (M) herum entlang einer virtuellen Außenlinie (A2) einer zweiten geometrischen Figur (A2) angeordnet sind,- dritte Leuchtdiodenchips (H13, H23, H33, H43, H53 ... H163), die um die Mittelachse (M) herum entlang einer virtuellen Außenlinie (A3) einer dritten geometrischen Figur angeordnet sind, wobei jeder der Leuchtdiodenchips an einer Anschlusstelle (3) auf dem Leuchtdiodenchip mit einem Bonddraht (4) verbunden ist, wobei sich die Anschlusstelle (3) in einem Randbereich (6) des Leuchtdiodenchips befindet,wobei die Leuchtdiodenchips in mehreren Gruppen (G1, G2, G3, G4 ...G16) derart gruppiert sind, dass eine Gruppe (G1) jeweils einen der ersten Leuchtdiodenchips (H11), einen der ...

A method of manufacturing a prophylaxis article

Die Erfindung betrifft ein Verfahren zum Herstellen eines Prophylaxeartikels, insbesondere eines Handschuhs, aus einem (carboxylierten) Dienkautschuk, nach dem auf eine Form zumindest eine Schicht aus einem (carboxylierten) Dienlatex aufgebracht wird, und der (carboxylierte) Dienlatex mit einem Vernetzungsmittel vernetzt wird, das auf anorganischen und/oder organischen Partikeln unter Bildung von modifizierten Partikel immobilisiert wird und die modifizierten Partikel dem (carboxylierten) Dienlatex zugesetzt werden.

Free-form surfaces with switchable light source inspection

Die Erfindung betrifft eine Vorrichtung (1) zur Inspektion freigeformter Oberflächen eines Objektes (5), wobei zumindest ein Beleuchtungselement (3), mit welchem eine Oberfläche des Objektes (5) beleuchtbar ist, zumindest eine Kamera (8), mit welcher Oberflächenreflexionen des Objektes (5) abbildbar sind, und ein Inspektionsraum (2) vorgesehen sind, wobei das zumindest eine Beleuchtungselement (3) zur Erzeugung von Mustern (4) ausgebildet ist, wobei das Beleuchtungselement (3) pixelweise ansteuerbar ist. Des Weiteren betrifft die Erfindung eine Verwendung einer solchen Vorrichtung (1) zur Inspektion freigeformter Oberflächen eines Objektes (5). Ferner betrifft die Erfindung ein Verfahren zur Inspektion freigeformter Oberflächen eines Objektes (5), wobei eine Oberfläche des Objektes (5) mit zumindest einem Beleuchtungselement (3) beleuchtet wird, wobei ein Muster (4) auf die Oberfläche projiziert wird und Oberflächenreflexionen mittels zumindest einer Kamera (8) aufgenommen werden. Erfindungsgemäß ...

Apparatus for detecting objects in a material flow

Vorrichtung zum Detektieren von Objekten (9) in einem Materialstrom, umfassend zumindest - eine Lichtquelle (4,5) zum Aussenden von Licht in einem ersten Sende-Wellenlängenbereich und in einem zweiten Sende- Wellenlängenbereich, der vom ersten Sende-Wellenlängenbereich unterschiedlich ist, auf den Materialstrom, - einen ersten Detektor (1) zum Detektieren von Reflexionslicht, Fluoreszenzlicht oder Transmissionslicht der Objekte, hervorgerufen durch Licht im ersten Sende- Wellenlängenbereich, in einem ersten Detektions- Wellenlängenbereich, - einen zweiten Detektor (2) zum Detektieren von Reflexionslicht, Fluoreszenzlicht oder Transmissionslicht der Objekte, hervorgerufen durch Licht im zweiten Sende- Wellenlängenbereich, in einem zweiten Detektions- Wellenlängenbereich, dadurch gekennzeichnet, - dass der erste Detektor (1) mit der Lichtquelle (4) zwecks Steuerung der Lichtintensität des ersten Sende- Wellenlängenbereichs verbunden ist, und/oder der zweite Detektor (2) mit der Lichtquelle ...

Video inspection system employing multiple spectrum led illumination

Lighting Device For Inspection And Lighting Method For Inspection

In order to provide a lighting device for inspection and lighting method for inspection that, with use of inspection light, make it possible for a difference between a defect and a normal part, such as contrast, to appear, the lighting device for inspection is provided with: a surface light source 1 that emits the inspection light; a lens 2 that is provided on a light axis LX of the inspection light emitted from the surface light source 1, and between an inspection object W and the surface light source 1; and a first diaphragm 31 that is provided between the surface light source 1 and the lens 2, or between the lens 2 and the inspection object W, wherein: positions of the surface light source 1 and the lens 2 with respect to the inspection object W are set such that an image plane IM on which the surface light source 1 is imaged is present near the inspection object W; and a position of the first diaphragm 31 with respect to the lens 2 is set such that the central axis of an irradiation ...

Surface defect detection system and method

광 조사 위치의 가변이 가능한 표면 검사 장치

... 본 발명은 광 조사 위치의 가변이 가능한 표면 검사 장치를 제공한다. 본 발명의 광 조사 위치의 가변이 가능한 표면 검사 장치는 본체부와; 상기 본체부의 중앙에 배치되며, 검사 대상물로 수평 방향을 따라 제 1광 조사 위치가 가변되는 제 1검사광을 제공하는 주 광원부와; 상기 본체부에 회전 가능하게 설치되어, 상기 검사 대상물로 회전 위치에 따라 제 2광 조사 위치가 가변되는 제 2검사광을 조사하는 보조 광원부; 및 상기 검사 대상물의 종류에 따라 상기 주 광원부와 상기 보조 광원부를 설정된 조명 위치로 이동시켜 상기 주 광원부와 상기 보조 광원부를 구동시키는 제어부를 포함하고, 설정된 상기 조명 위치는 상기 제 1광 조사 위치와 상기 제 2광 조사 위치를 포함한다. 이에 따라, 본 발명은 서로 다른 조명을 회전 및 수평이동하여 조명 위치를 가변시킴으로써, 검사 대상물을 더 정확하게 검사하도록 할 수 있다.

Illumination System and Metrology System

Disclosed is an illumination system for a metrology apparatus and a metrology apparatus comprising such an illumination system. The illumination system comprises an illumination source; and a linear variable filter arrangement configured to filter a radiation beam from said illumination source and comprising one or more linear variable filters. The illumination system is operable to enable selective control of a wavelength characteristic of the radiation beam subsequent to it being filtered by the linear variable filter arrangement. 119-. (canceled)20. An illumination system for a metrology apparatus comprising:an illumination source; anda linear variable filter arrangement configured to filter a radiation beam from the illumination source and comprising one or more linear variable filters;wherein the illumination system is operable to enable selective control of a wavelength characteristic of the radiation beam subsequent to it being filtered by the linear variable filter arrangement.21. The illumination system of claim 20 , wherein:the linear variable filter arrangement comprises a pair of linear variable filters in series; andthe pair of linear variable filters comprising a short wavelength pass linear variable filter and a long wavelength path linear variable filter which together provide a band pass linear variable filter.22. The illumination system of claim 21 , wherein the short wavelength pass linear variable filter and the long wavelength path linear variable filter are configured for relative movement between the short wavelength pass linear variable filter and the long wavelength path linear variable filter enabling selection of a pass band of the band pass linear variable filter.23. The illumination system of claim 21 , wherein the wavelength characteristic of the radiation beam comprises a central wavelength of a pass band of the band pass linear variable filter.24. The illumination system of claim 23 , wherein the short wavelength pass linear variable ...

Method and apparatus for determining illumination intensity for inspection, and method and apparatus for optical inspection

The present disclosure relates to a method and apparatus for determining an illumination intensity for inspection, and an method and apparatus optical inspection. The method for determining an illumination intensity for inspection comprises: acquiring images of a sample to be inspected taken by each of at least one imaging element at a plurality of illumination intensities; calculating, for each imaging element, a gray standard deviation of each of the images acquired at the plurality of illumination intensities; and determining the illumination intensity of each imaging element for inspection according to the gray standard deviation. The inspection accuracy may be improved by using the illumination intensity determined by the method provided in the present disclosure to inspect an object to be inspected.

TRANSPARENT MATERIAL INSPECTION SYSTEM

A system for the inspection of the optical quality of a part, object or product having a portion comprising transparent material such as ophthalmologic lenses, protective eyewear, visors, eyewear shield and the like is provided. A liquid crystal display (LCD) screen emits variable patterns of light through the transparent part under inspection to a charged coupled device (CCD) camera that captures the image and transmits the image data to an image processing module. The processed image data are then transmitted to an analysis module which then generally measures the dimensions of the part, the transparency, the colour and the optical strength. The analysis module also advantageously detects and measures the presence of dots, stains, scratches, optical distortions, fingerprints, cloudiness and other optical artefacts and/or defects in the transparent material. Accordingly, the patterns emitted by the LCD screen are designed to measure the optical specifications and highlight potential optical ...

LIGHT AND METHOD FOR OPERATING A LIGHT

A light, in particular for testing workpiece surfaces using a fluorescent marking device, which light has at least two lighting elements that emit electromagnetic radiation with different wavelength ranges. The intensity with which the lighting element irradiates can be adjusted separately for at least one of the lighting elements. Expediently, the light is configured to increase or reduce the intensity of at least one of the lighting elements and at the same time to keep the intensity of at least one other of the lighting elements constant, or to reduce it or increase it in the opposite way to the first-mentioned lighting element. The light is configured to adjust the intensity at such a speed that the human eye can adapt to a change in the intensity during the adjustment without adverse effects on the person's sight. 115-. (canceled)16. A luminaire for testing workpiece surfaces , comprising: at least two illuminants that emit electromagnetic radiation in different wavelength ranges , wherein an intensity with which each illuminant radiates is adjustable for at least one of the illuminants.17. The luminaire according to claim 16 , wherein the luminaire is configured to increase or to reduce the intensity of at least one first of the illuminants and simultaneously keep constant the intensity of at least one other of the illuminants or to reduce or increase the intensity oppositely to the first illuminant.18. The luminaire according to claim 16 , wherein the luminaire is configured so that a speed at which the intensity is adjusted is dependent on the intensity with which the respective illuminant radiates.19. The luminaire according to claim 18 , wherein at comparatively low intensity the speed is lower than at comparatively high intensity.20. The luminaire according to claim 16 , wherein the luminaire is configured for adjusting the intensity at a speed so that a human eye can adapt to a change in the intensity during the adjustment without impairment of visual ...

Fаst vаriаblе аnglе оf inсidеnсе illuminаtiоn fоr а mасhinе visiоn inspесtiоn sуstеm

А fаst vаriаblе аnglе оf inсidеnсе illuminаtiоn соnfigurаtiоn fоr а mасhinе visiоn inspесtiоn sуstеm, inсluding: а light sоurсе thаt dirесts а bеаm аlоng а first оptiсаl pаth pоrtiоn; а bеаm stееring аrrаngеmеnt thаt rесеivеs thе bеаm аnd stееrs it аlоng а sесоnd оptiсаl pаth pоrtiоn; аnd а bеаm dеflесting аrrаngеmеnt inсluding а plurаlitу оf surfасе pоrtiоns аrrаngеd аt rеspесtivе аnglеs оf inсidеnсе tо rесеivе thе bеаm аnd dеflесt it аlоng а third оptiсаl pаth pоrtiоn tо а fiеld оf viеw. Тhе bеаm stееring аrrаngеmеnt inсludеs diffеrеnt surfасеs thаt prоvidе еithеr nаrrоw оr widе divеrgеnсе оf thе bеаm tоwаrd thе dеflесting аrrаngеmеnt. Тhе illuminаtiоn соnfigurаtiоn аllоws fоr fаst аdjustmеnt оf nоt оnlу thе illuminаtiоn аnglе оf inсidеnсе but аlsо thе rаngе оf аnglеs (nаrrоw оr widе) аbоut thе nоminаl аnglе. Тhе illuminаtiоn соnfigurаtiоn is pаrtiсulаrlу suitаblе fоr usе with light prоvidеd bу а high-intеnsitу rеmоtе light sоurсе.

Fаst vаriаblе аnglе оf inсidеnсе illuminаtiоn fоr а mасhinе visiоn inspесtiоn sуstеm

А fаst vаriаblе аnglе оf inсidеnсе illuminаtiоn соnfigurаtiоn fоr а mасhinе visiоn inspесtiоn sуstеm, inсluding: а light sоurсе thаt dirесts а bеаm аlоng а first оptiсаl pаth pоrtiоn; а bеаm stееring аrrаngеmеnt thаt rесеivеs thе bеаm аnd stееrs it аlоng а sесоnd оptiсаl pаth pоrtiоn; аnd а bеаm dеflесting аrrаngеmеnt inсluding а plurаlitу оf surfасе pоrtiоns аrrаngеd аt rеspесtivе аnglеs оf inсidеnсе tо rесеivе thе bеаm аnd dеflесt it аlоng а third оptiсаl pаth pоrtiоn tо а fiеld оf viеw. Тhе bеаm stееring аrrаngеmеnt inсludеs diffеrеnt surfасеs thаt prоvidе еithеr nаrrоw оr widе divеrgеnсе оf thе bеаm tоwаrd thе dеflесting аrrаngеmеnt. Тhе illuminаtiоn соnfigurаtiоn аllоws fоr fаst аdjustmеnt оf nоt оnlу thе illuminаtiоn аnglе оf inсidеnсе but аlsо thе rаngе оf аnglеs (nаrrоw оr widе) аbоut thе nоminаl аnglе. Тhе illuminаtiоn соnfigurаtiоn is pаrtiсulаrlу suitаblе fоr usе with light prоvidеd bу а high-intеnsitу rеmоtе light sоurсе.

Container inspection machine with man-machine interface for identifying and defining back lights

A container inspecting machine is provided with a man-machine screen interface (17) which can be switched (25,26) to one of a plurality of different back lights (28,30) or patterns so that an operator can define any one of these back lights (28,30) on the man-machine screen interface (17) as a desired back light (28,30) for inspecting a transparent container.

БОКОВОЙ ВЕРХНИЙ ФОНАРЬ

Verfahren bei der Vorbereitung von Proben zum Mikroskopieren und Vorrichtung zum Überprüfen der Eindeckqualität von Proben

Verfahren bei der Vorbereitung von Proben zum Mikroskopieren, auf die ein Deckglas aufgebracht ist, wobei das Verfahren in einem Eindeckautomaten durchgeführt wird und die Eindeckqualität automatisch und wenigstens teilweise optisch bei Dunkelfeldbeleuchtung überprüft wird, dadurch gekennzeichnet, dass keine fehlerhaft eingedeckte Probe in einem nachfolgenden Mikroskopierprozess mikroskopiert wird.

Zweidimensionales Beleuchtungssystem

Die vorliegende Erfindung betrifft ein Beleuchtungssystem (10) zum Ausleuchten eines definierten Beleuchtungsgebietes (11), insbesondere eines Beobachtungsgebiets oder eines Kamerasichtfeldes. Dazu ist eine langgestreckte Lichtquelle (13) vorgesehen, wobei die Lichtquelle (13) vorzugsweise aus einer Vielzahl Punktlichtquellen, insbesondere Leuchtdioden (14), zusammengesetzt ist. Wenigstens ein Reflektor ist zum Reflektieren des Lichts der Lichtquelle (13) zum Ausleuchten des Beleuchtungsgebietes (11) vorgesehen. Das Beleuchtungssystem (10) zeichnet sich dadurch aus, dass zum Reflektieren in unterschiedliche Raumrichtungen unterschiedliche Reflektoren vorgesehen sind.

Examination of coverslip on microscope slide

A method of preparing samples (1) for microscopic examination to which a coverslip (1; fig 2) is applied, comprises the step of checking coverslipping quality automatically and at least in part optically with dark field illumination. Ideally, microscopic images in bright field and dark field illumination are generated and these images are compared and evaluated. The coverslip is analysed for damage such as fractures or scratches, air present in the coverslipping medium which forms the coverslip, air bubbles present between the coverslip and sample, and surface irregularities of the coverslip. An apparatus for checking the quality of a coverslip comprising an optical imaging apparatus that operates automatically and at least with the dark field illumination. Ideally the apparatus comprises means to illuminate the coverslip to generate a bright field image and a dark field image. The apparatus may comprise means to read a sample specific code which is present on the slide or coverslip.

Overhead sidelight

Abstract The invention relates to a method for illuminating a wood fibre web for deviation detection. The method comprises turning on LEDs of an overhead sidelight that are side-directed towards a first edge of the web (108) for illuminating a first half of width of the web, capturing an image of the first half, turning off the LEDs, turning on LEDs of the overhead sidelight that are side directed towards a second edge of the web for illuminating a second half of width of the web, capturing an image of the second half, and turning off the LEDs. The invention also relates to an overhead sidelight, a machine vision system, and a lighting system. Fig. 4 102 102 102 12 102 10210 410FIG. 10a 14 FIG. b 100 102 102 102 102 102 102 FIG.1c 115 ...

INSPECTING DEVICE OF the QUALITY Of a SURFACE

Le dispositif de contrôle de surface par déflectométrie comprend notamment : - un afficheur (2) conçu pour générer un réseau de franges alternant des bandes claires et obscures, et - au moins un capteur (3) conçu pour faire l'acquisition de l'image réfléchie par la surface à contrôler (5). Selon l'invention, le dispositif comprend, en outre, un moyen réfléchissant positionné par rapport à la surface à contrôler (5) de façon à diriger l'image réfléchie par la surface à contrôler (5) vers le capteur (3), le ou les capteur(s) (3) étant positionné(s) à proximité de l'afficheur (2).

LIGHTING DEVICE AND LIGHTING METHOD FOR COMPUTER VISION

L'invention se rapporte à un dispositif d'éclairage (106) pour vision industrielle, comprenant une pluralité de sources lumineuses pour éclairer une zone d'intérêt (110), un capteur optique (122) pour capter la lumière émise par la pluralité de sources lumineuses et réfléchie par au moins deux parties distinctes (1101 - 1105) de la zone d'intérêt (110), un module de comparaison de l'intensité lumineuse de la lumière réfléchie par les au moins deux parties distinctes (1101 - 1105) de la zone d'intérêt (110), et captée par le capteur optique (122), et un module de modification de la configuration des sources lumineuses en fonction de la comparaison des intensités lumineuses réfléchies par les au moins deux parties distinctes (1101 - 1105).

System and method for illumination energy management in surface inspection

Method and device for optical yarn quality monitoring

The invention relates to a method and apparatus for monitoring yarn quality in the textile industry. Textile yarn is checked for quality to meet the required criteria such as diameter evenness and unwanted foreign fiber presence. The invention utilizes an artificial light illuminating the yarn, focusing element, diffraction element and the image sensor for capturing of focused diffracted rays from illuminated yarn image. The presence of foreign fibres in yarn and yarn diameter is determined by processing of captured image.

METHOD AND DEVICE FOR OPTICALLY ANALYSING FRUIT OR VEGETABLES AND DEVICE FOR AUTOMATIC SORTING

Disclosed is a method and a device for optically analysing fruit or vegetables. Different light sources are adapted to apply light radiation in different wavelength ranges selectively to each object according to a predetermined illumination sequence, and images are produced by at least one colour camera sensitive to infrared, the exposure of which is controlled in synchronism with the illumination sequence so as to produce a plurality of images in different wavelength ranges, including at least one image in a visible range and at least one image in an infrared range.

Fаst vаriаblе аnglе оf inсidеnсе illuminаtiоn fоr а mасhinе visiоn inspесtiоn sуstеm

А fаst vаriаblе аnglе оf inсidеnсе illuminаtiоn соnfigurаtiоn fоr а mасhinе visiоn inspесtiоn sуstеm, inсluding: а light sоurсе thаt dirесts а bеаm аlоng а first оptiсаl pаth pоrtiоn; а bеаm stееring аrrаngеmеnt thаt rесеivеs thе bеаm аnd stееrs it аlоng а sесоnd оptiсаl pаth pоrtiоn; аnd а bеаm dеflесting аrrаngеmеnt inсluding а plurаlitу оf surfасе pоrtiоns аrrаngеd аt rеspесtivе аnglеs оf inсidеnсе tо rесеivе thе bеаm аnd dеflесt it аlоng а third оptiсаl pаth pоrtiоn tо а fiеld оf viеw. Тhе bеаm stееring аrrаngеmеnt inсludеs diffеrеnt surfасеs thаt prоvidе еithеr nаrrоw оr widе divеrgеnсе оf thе bеаm tоwаrd thе dеflесting аrrаngеmеnt. Тhе illuminаtiоn соnfigurаtiоn аllоws fоr fаst аdjustmеnt оf nоt оnlу thе illuminаtiоn аnglе оf inсidеnсе but аlsо thе rаngе оf аnglеs (nаrrоw оr widе) аbоut thе nоminаl аnglе. Тhе illuminаtiоn соnfigurаtiоn is pаrtiсulаrlу suitаblе fоr usе with light prоvidеd bу а high-intеnsitу rеmоtе light sоurсе.

Device for testing surface quality

Ce dispositif de contrôle de surface par déflectométrie comprend : - un afficheur (2) conçu pour générer sur sa face dite avant un réseau de franges alternant des bandes claires et obscures - au moins un capteur (3) conçu pour faire l'acquisition de l'image réfléchie par la surface à contrôler (5) positionné sur la face avant de l'afficheur et à la périphérie de ce dernier, et - un moyen réfléchissant positionné par rapport à la surface à contrôler (5) de façon à diriger l'image réfléchie par la surface à contrôler (5) vers le capteur (3), l'afficheur étant orienté par rapport à la surface à contrôler selon un angle tel que l'afficheur est vu par le capteur sous une incidence normale.

Crop particle discrimination methods and apparatus

A method of discriminating between kernel and chaff particles, in crop, using a crop viewing apparatus that includes: a) an image-capturing device (10) that is capable of capturing one or more images of crop in the crop viewing apparatus, the image capturing device being operatively connected to a processing device for processing one or more resulting images; b) one or more lamps (23) for illuminating crop in the crop viewing apparatus, the or each said lamp being capable of illuminating the crop in a range of illumination levels up to a maximal level equal to or above a reflectivity saturation level at which increasing illumination causes no further reflectivity change ; and c) one or more control devices for controlling the level of illumination provided by each said lamp, the method comprising the steps of d) operating at least one said control device to cause illumination of crop in the crop viewing apparatus at more level less than the said reflectivity saturation level so as to enhance ...

СПОСОБ И УСТРОЙСТВО ОПТИЧЕСКОГО АНАЛИЗА ФРУКТОВ ИЛИ ОВОЩЕЙ И УСТРОЙСТВО ДЛЯ АВТОМАТИЧЕСКОЙ СОРТИРОВКИ

FIELD: optical analysis. SUBSTANCE: invention relates to a method and an apparatus for optical analysis of fruits or vegetables. Various light sources (7a, 7b) are configured to supply light emission in various spectral ranges selectively to each object in accordance with the predetermined illumination sequence, and images are generated by means of at least one colour camera (4) sensitive to infrared emission. The exposure of the camera is controlled synchronously with said illumination sequence so as to obtain a series of images in various spectral ranges including at least one image in the visible range and at least one image in the infrared range. EFFECT: development of a method and apparatus intended for optical analysis of fruits or vegetables by image generation in various spectral ranges, highly productive and significantly simpler and less expensive to learn, use and maintain. 15 cl, 8 dwg РОССИЙСКАЯ ФЕДЕРАЦИЯ (19) RU (11) (13) 2 750 086 C2 (51) МПК G01N 21/35 (2014.01) G01N 21/17 (2006.01) B07C 5/342 (2006.01) ФЕДЕРАЛЬНАЯ СЛУЖБА ПО ИНТЕЛЛЕКТУАЛЬНОЙ СОБСТВЕННОСТИ (12) ОПИСАНИЕ ИЗОБРЕТЕНИЯ К ПАТЕНТУ (52) СПК G01N 21/35 (2021.02); G01N 21/17 (2021.02); B07C 5/342 (2021.02) (21)(22) Заявка: 2019129450, 30.01.2018 (24) Дата начала отсчета срока действия патента: (73) Патентообладатель(и): МАФ АГРОБОТИК (FR) Дата регистрации: 22.06.2021 Приоритет(ы): (30) Конвенционный приоритет: 01.03.2017 FR 17.51683 (43) Дата публикации заявки: 01.04.2021 Бюл. № 10 (45) Опубликовано: 22.06.2021 Бюл. № 18 (85) Дата начала рассмотрения заявки PCT на национальной фазе: 01.10.2019 2 7 5 0 0 8 6 (56) Список документов, цитированных в отчете о поиске: WO 2015063299 A1, 07.05. 2015. WO 2015074008 A1, 21.05. 2015. RU 2494375 C2, 27.09.2013. RU 2544876 C1, 20.03.2015. CN 2733343 Y, 12.10.2005. R U 30.01.2018 (72) Автор(ы): БЛАНК, Филипп (FR) FR 2018/050212 (30.01.2018) C 2 C 2 (86) Заявка PCT: (87) Публикация заявки PCT: R U 2 7 5 0 0 8 6 WO 2018/158514 (07.09.2018) Адрес для переписки ...

Kontrollvorrichtung für die Oberflächenqualität

Oberflächen-Kontrollvorrichtung durch Deflektometrie, dadurch gekennzeichnet, dass sie umfasst: eine Anzeigeeinrichtung (2), die ausgebildet ist, um auf ihrer Vorderseite ein Netzwerk aus Streifen zu erzeugen, bei dem sich helle und dunkle Bänder abwechseln, mindestens einen Sensor (3), der ausgebildet ist, um das von der zu kontrollierenden Oberfläche (5) reflektierte Bilds zu erfassen, der auf der Vorderseite der Anzeigeeinrichtung und auf dem Umfang derselben positioniert ist, und ein Reflexionsmittel, das im Verhältnis zu der zu kontrollierenden Oberfläche (5) derart positioniert ist, dass das von der zu kontrollierenden Oberfläche (5) reflektierte Bild zum Sensor (3) geschickt wird, wobei die Anzeigeeinrichtung im Verhältnis zu der zu kontrollierenden Oberfläche gemäß einem Winkel ausgerichtet ist, dass die Anzeigeeinrichtung vom Sensor unter einem normalen Einfall gesehen wird.

ENGINEERED LIGHTING SYSTEM FOR TDI INSPECTION

APPARATUS AND METHOD FOR INSPECTION OF A FILM ON A SUBSTRATE

Methods of and apparatus for inspecting composite layers of a first material formed on a second material are provided including providing an illumination source, illuminating at least a portion of the composite at the layer, receiving light reflected from the sample, determining a spectral response from the received light, and comparing the received spectral response to an expected spectral response.

ENGINEERED LIGHTING SYSTEM FOR TDI INSPECTION

A device for surveying object in material flows

LIGHTING DEVICE FOR INSPECTION AND LIGHTING METHOD FOR INSPECTION

To provide a lighting device for inspection and lighting method for inspection with which it is possible for differences such as differences in brightness to appear between defects and normal parts by means of inspection light, this lighting device is provided with: a planar light source (1) that radiates inspection light; a lens (2) that is on an optical axis (LX) of the inspection light radiated by the planar light source (1) and is provided between work (W) to be inspected and the planar light source (1); and a first aperture (31) provided between the planar light source (1) and the lens (2) or between the lens (2) and the work (W) to be inspected. The positions of the planar light source (1) and lens (2) relative to the work (W) to be inspected are set such that the imaging plane (IM) to which the light source (1) is focused is in the vicinity of the work (W) to be inspected. The position of the first aperture (31) relative to the lens is set such that the central axis of a solid angle ...

METHOD FOR PRODUCING A PROPHYLACTIC ARTICLE

The invention relates to a method for the manufacture of a prophylactic article, especially of a glove, from a (carboxylated) diene rubber, according to which a layer of a (carboxylated) diene latex is applied on a former and the (carboxylated) diene latex is cross-linked with a cross-linking agent, which is immobilized on inorganic and/or organic particles with formation of modified particles, and the modified particles are added to the (carboxylated) diene latex.

Fаst vаriаblе аnglе оf inсidеnсе illuminаtiоn fоr а mасhinе visiоn inspесtiоn sуstеm

А fаst vаriаblе аnglе оf inсidеnсе illuminаtiоn соnfigurаtiоn fоr а mасhinе visiоn inspесtiоn sуstеm, inсluding: а light sоurсе thаt dirесts а bеаm аlоng а first оptiсаl pаth pоrtiоn; а bеаm stееring аrrаngеmеnt thаt rесеivеs thе bеаm аnd stееrs it аlоng а sесоnd оptiсаl pаth pоrtiоn; аnd а bеаm dеflесting аrrаngеmеnt inсluding а plurаlitу оf surfасе pоrtiоns аrrаngеd аt rеspесtivе аnglеs оf inсidеnсе tо rесеivе thе bеаm аnd dеflесt it аlоng а third оptiсаl pаth pоrtiоn tо а fiеld оf viеw. Тhе bеаm stееring аrrаngеmеnt inсludеs diffеrеnt surfасеs thаt prоvidе еithеr nаrrоw оr widе divеrgеnсе оf thе bеаm tоwаrd thе dеflесting аrrаngеmеnt. Тhе illuminаtiоn соnfigurаtiоn аllоws fоr fаst аdjustmеnt оf nоt оnlу thе illuminаtiоn аnglе оf inсidеnсе but аlsо thе rаngе оf аnglеs (nаrrоw оr widе) аbоut thе nоminаl аnglе. Тhе illuminаtiоn соnfigurаtiоn is pаrtiсulаrlу suitаblе fоr usе with light prоvidеd bу а high-intеnsitу rеmоtе light sоurсе.

Fаst vаriаblе аnglе оf inсidеnсе illuminаtiоn fоr а mасhinе visiоn inspесtiоn sуstеm

А fаst vаriаblе аnglе оf inсidеnсе illuminаtiоn соnfigurаtiоn fоr а mасhinе visiоn inspесtiоn sуstеm, inсluding: а light sоurсе thаt dirесts а bеаm аlоng а first оptiсаl pаth pоrtiоn; а bеаm stееring аrrаngеmеnt thаt rесеivеs thе bеаm аnd stееrs it аlоng а sесоnd оptiсаl pаth pоrtiоn; аnd а bеаm dеflесting аrrаngеmеnt inсluding а plurаlitу оf surfасе pоrtiоns аrrаngеd аt rеspесtivе аnglеs оf inсidеnсе tо rесеivе thе bеаm аnd dеflесt it аlоng а third оptiсаl pаth pоrtiоn tо а fiеld оf viеw. Тhе bеаm stееring аrrаngеmеnt inсludеs diffеrеnt surfасеs thаt prоvidе еithеr nаrrоw оr widе divеrgеnсе оf thе bеаm tоwаrd thе dеflесting аrrаngеmеnt. Тhе illuminаtiоn соnfigurаtiоn аllоws fоr fаst аdjustmеnt оf nоt оnlу thе illuminаtiоn аnglе оf inсidеnсе but аlsо thе rаngе оf аnglеs (nаrrоw оr widе) аbоut thе nоminаl аnglе. Тhе illuminаtiоn соnfigurаtiоn is pаrtiсulаrlу suitаblе fоr usе with light prоvidеd bу а high-intеnsitу rеmоtе light sоurсе.

Anordnung und Verfahren zur Inspektion von bewegten plattenförmigen Objekten

Gezeigt ist eine Anordnung und ein Verfahren zur Inspektion von relativ zu einer Kameravorrichtung in einer Bewegungsrichtung durch wenigstens zwei Beobachtungsbereiche hindurch bewegten plattenförmigen Objekten, wobei in einem Erfassungszustand entlang eines, schräg entgegen der Bewegungsrichtung verlaufenden Beobachtungsbereichs streifenförmige Bilder aufgenommen werden, wobei in einem weiteren Erfassungszustand entlang eines weiteren Beobachtungsbereichs streifenförmige Bilder aufgenommen werden, und wobei jeweils die in den einzelnen Erfassungszuständen aufgenommenen streifenförmigen Bilder zu einem zweidimensionalen Bild zusammengesetzt werden.

Vorrichtung zur Druckbildkontrolle

Die Erfindung betrifft eine Vorrichtung (4) zur Druckbildkontrolle mit einer Kamera (2) zur Aufnahme einer Fläche eines Druckerzeugnisses, welches relativ zur Vorrichtung (1) bewegbar ist, und einer ersten Beleuchtungseinheit (3) eines ersten Typs zur Beleuchtung eines ersten Teilbereichs (4) des von der Kamera erfassbaren Bereichs (9), und einer Auswerteeinheit (5) zur Verarbeitung der von der Kamera (2) erfassten Bildinformationen. Sie ist erfindungsgemäß gekennzeichnet durch eine zweite Beleuchtungseinheit (6; 16) eines zweiten Typs, der sich vom ersten Typ unterscheidet, zur Beleuchtung eines zweiten Teilbereichs (7) des von der Kamera (2) erfassbaren Bereichs (9).

Prüfsystem und Prüfverfahren

Ein Prüfsystem einer Ausführungsform enthält: eine planare Beleuchtungseinheit, die Intensitäten des Lichts auf periodische Weise zeitlich und räumlich ändert; einen Zeitkorrelationsbildgenerator, der mit einer Zeitkorrelationskamera oder mit einem Bilderfassungssystem, das eine äquivalente Operation wie die Zeitkorrelationskamera ausführt, ein Zeitkorrelationsbild erzeugt; und einen Berechnungsprozessor, der aus dem Zeitkorrelationsbild eine Charakteristik berechnet, wobei die Charakteristik einer Verteilung von Normalenvektoren auf eine Prüfzieloberfläche entspricht und zum Detektieren einer Anomalie auf der Grundlage einer Differenz gegenüber einem Umgebungsbereich und/oder einer Differenz gegenüber einer Referenzoberfläche dient.

Container inspection apparatus and container inspection method for inspecting containers

Es sind eine Behälterinspektionsvorrichtung (10) und ein Behälterinspektionsverfahren zur Inspektion von Behältern (2) bereitgestellt. Die Behälterinspektionsvorrichtung (10) umfasst mindestens eine Leuchte (11 bis 15) zum Beleuchten von Behältern (2) zu einem vorbestimmten Inspektionszeitpunkt zum Inspizieren der Behälter (2), und eine elektrische Leitung zum Anschluss der mindestens einen Leuchte (11 bis 15) an eine elektrische Energieversorgung und an ein Bussystem (6), so dass die elektrische Leitung sowohl zum Versorgen der mindestens einen Leuchte (11 bis 15) mit elektrischer Energie als auch zur Verbindung mit einem Echtzeit-Datennetzwerk dient.

Container inspection device and container inspection method for inspecting containers

Es sind eine Behälterinspektionsvorrichtung (10) und ein Behälterinspektionsverfahren zur Inspektion von Behältern (2) bereitgestellt. Die Behälterinspektionsvorrichtung (10) umfasst mindestens eine Leuchte (11 bis 15) zum Beleuchten von Behältern (2) zu einem vorbestimmten Inspektionszeitpunkt zum Inspizieren der Behälter (2), und eine elektrische Leitung zum Anschluss der mindestens einen Leuchte (11 bis 15) an eine elektrische Energieversorgung und an ein Bussystem (6), so dass die elektrische Leitung sowohl zum Versorgen der mindestens einen Leuchte (11 bis 15) mit elektrischer Energie als auch zur Verbindung mit einem Echtzeit-Datennetzwerk dient.

INSERTED LIGHTING DEVICE FUR PRUFUNG WITH RUN TIME INTEGRATION

A method of manufacturing a prophylaxis article

Die Erfindung betrifft ein Verfahren zum Herstellen eines Prophylaxeartikels, insbesondere eines Handschuhs, aus einem Dienkautschuk, nach dem auf eine Form zumindest eine Schicht aus einem Dienlatex aufgebracht wird, und der Dienlatex mit einem Vernetzungsmittel thermisch vernetzt wird, das ausgewählt wird aus einer Gruppe bestehend aus mehrfachfunktionellen Epoxiden, mehrfachfunktionellen Silanen, mehrfachfunktionellen Siloxanen, mehrfachfunktionellen Thiolen, sowie Mischungen daraus, und auf anorganischen und/oder organischen Partikeln unter Bildung von modifizierten Partikel immobilisiert wird und die modifizierten Partikel dem Dienlatex zugesetzt werden. Die Vernetzung wird bei einer Temperatur zwischen 90 °C und 140 °C durchgeführt.

Free-form surfaces with switchable light source inspection

Die Erfindung betrifft eine Vorrichtung (1) zur Inspektion freigeformter Oberflächen eines Objektes (5), wobei zumindest ein Beleuchtungselement (3), mit welchem eine Oberfläche des Objektes (5) beleuchtbar ist, zumindest eine Kamera (8), mit welcher Oberflächenreflexionen des Objektes (5) abbildbar sind, und ein Inspektionsraum (2) vorgesehen sind, wobei das zumindest eine Beleuchtungselement (3) zur Erzeugung von Mustern (4) ausgebildet ist, wobei das Beleuchtungselement (3) pixelweise ansteuerbar ist. Des Weiteren betrifft die Erfindung eine Verwendung einer solchen Vorrichtung (1) zur Inspektion freigeformter Oberflächen eines Objektes (5). Ferner betrifft die Erfindung ein Verfahren zur Inspektion freigeformter Oberflächen eines Objektes (5), wobei eine Oberfläche des Objektes (5) mit zumindest einem Beleuchtungselement (3) beleuchtet wird, wobei ein Muster (4) auf die Oberfläche projiziert wird und Oberflächenreflexionen mittels zumindest einer Kamera (8) aufgenommen werden. Erfindungsgemäß ...

An inspection apparatus for crystal jewelry

This invention discloses an inspection apparatus for crystal jewelry, including an inspection rod 11, wherein an observation cavity 12 is arranged in the inspection rod 11 with an opening to a first side, wherein a handle 19 is fixedly connected with a bottom end surface of the observation cavity 12, and a bottom end inner wall of the observation cavity 12 is provided with a switching device 901, and an inner wall of a second side of the observation cavity 12 is provided with an open groove 47 mounted on a top end of the switching device 901, and an optical concentrating device 902 slidably connected with the open groove 47 is arranged in the observation cavity 12. This apparatus is simple in structure, which can be observed rorarably under the concentrating lighting to do an adequate inspection of the interior and external quality of the crystal jewelry.

Apparatus for inspecting substrate

Apparatus for inspecting a flat substrate for existence of defect including a base part in an upper part of a body, an inspection stage mounted on the base part, having one end to be rotatable around a rotation shaft for detachably placing a substrate to be inspected thereon, a turning means for turning the inspection stage to a required angle, and a back light unit for directing a light to the substrate to be inspected on the inspection stage from a rear side of the inspection stage, thereby permitting more accurate defect verification in making macro and micro observations by detachably attaching a back light unit just rear of the inspection stage the substrate is placed thereon for directing a bright light to entire surface of the substrate to be inspected.

ILLUMINATING AND OPTICAL APPARATUS FOR INSPECTING SOLDERING OF PRINTED CIRCUIT BOARD

L'appareil optique à éclairage de la présente invention est conçu pour l'examen des soudures des cartes à circuits imprimés. Il comporte notamment un premier élément qui constitue un plan horizontal en son sommet et un plan incliné sur son côté. Un premier organe d'éclairage est disposé sur le plan supérieur de l'élément fixe de façon à éclairer la pièce en cours d'examen fixée sur la carte à circuits imprimés. Un second organe d'éclairage est disposé sur le plan incliné de l'élément fixe de façon à éclairer la pièce en cours d'examen et donner ainsi une image dont l'ombre est inversée par rapport à celle donnée par le premier organe d'éclairage. Un organe de commande permet de régler la luminosité du premier et du second organe d'éclairage, et de commander la marche ou l'arrêt. Enfin, un organe optique disposé sur la partie supérieure de l'élément fixe permet de photographier en plan large ou resserré les pièces en cours d'examen éclairées par le premier et le second organe d'éclairage ...

INSPECTION SYSTEM AND METHOD

A method and system for illuminating a target such as a device under test. Light is projected from a light source to a light controller having a plurality of pixels. The pixels are controlled to establish first and second illumination characteristics and, the target is illuminated with the first and second illumination characteristics from the light controller.

SUPER RESOLUTION INSPECTION SYSTEM

The disclosure is directed to a system and method for inspecting a sample by illuminating the sample at a plurality of different angles and independently processing the resulting image streams. Illumination is directed through a plurality of pupil apertures to a plurality of respective field apertures so that the sample is imaged by portions of illumination directed at different angles. The corresponding portions of light reflected, scattered, or radiated from the surface of the sample are independently processed. Information associated with the independently processed portions of illumination is utilized to determine a location of at least one defect of the sample. Independently processing multiple image streams associated with different illumination angles allows for retention of frequency content that would otherwise be lost by averaging information from multiple imaging angles.

Systems and/or devices for camera-based inspections

Certain exemplary embodiments can provide a system comprising: a diffuser defining a camera lens hole in a top portion of said diffuser, said diffuser adapted to receive at least one set of low angle lights; and a plurality of lights mounted on said diffuser in proximity to said camera lens hole.

PINHOLE OR HOLE DETECTION DEVICE AND METHOD

A detection device and a detection method for detecting a hole or a pinhole present in a material are provided. The detection device includes: an illumination unit irradiating light at one side of the material; a light receiving unit acquiring an image of the material at the other side of the material to output a detection signal; a detection unit determining whether or not the hole or the pinhole is present in the material using the detection signal; and an illumination control unit dividing the illumination unit into a plurality of regions and controlling the illumination unit to irradiate light having different intensities of illumination for each of the plurality of regions.

IMAGE PROCESSING SYSTEM, IMAGE PROCESSING DEVICE AND IMAGE PROCESSING PROGRAM

An image processing system, an image processing device and an image processing method that can improve performance of an image measurement are provided. A control device controls a light emission portion in a manner that each of plural types of partial regions set on a light emission surface emits light, and controls a camera to image an object in synchronization with light emission of each of the plural types of partial regions. The control device performs an image measurement of the object based on reflection profile information which is generated based on a plurality of input images, and the reflection profile information shows a relationship between positions within the light emission surface and degrees of light reflected at attention sites of the object and incident to the camera with respect to light irradiated from the position to the object.

INSPECTION DEVICE AND INSPECTION METHOD

An inspection device includes an image acquisition unit configured to acquire images obtained by imaging, under at least two illumination conditions with different brightness, solder normally printed on a substrate, and an image processing unit configured to specify a shape of the solder based on a difference in brightness between the images acquired by the image acquisition unit, and generate, based on the shape of the solder, inspection data used for inspecting a state of the solder printed on the substrate.

Swivel-head camera e.g. for inspecting pipelines, uses grouped lamps arranged on separate segment

A swivel-head camera for inspection of confined spaces, such as pipelines, has an objective lens (10) and a number of group-controlled lamps (12,14) arranged around the objective lens (10). The grouped lamps are arranged at any one time on a separate segment.

Kalibriersystem und Inspektionsanlage

In einem Kalibriersystem (12) für eine optische Inspektionsanlage (2) mit Lichtquelle (4), Streukörper (6), Inspektionsraum für ein Versuchsobjekt (8), und Kamera (10), die ein IST-Kamerabild (24) des beleuchteten Versuchsobjekts (8) erzeugt, ist die Lichtquelle (4) ein Projektor oder Lichtquelle (4) und Streukörper (6) sind zusammen ein Display, und das Kalibriersystem (12) enthält einen Projektoranschluss (14) für ein Projektorbildes (20), einen Kameraanschluss (16) für ein IST-Kamerabild (24), und eine Kalibriereinheit (18) zur Ermittlung des Projektorbildes (20) in einem Kalibrierbetrieb derart, dass das IST-Kamerabild (24) dem SOLL-Kamerabild (26) entspricht. Eine oben genannte Inspektionsanlage (2) enthält ein erfindungsgemäßes Kalibriersystem (12).

Vorrichtung zum optischen Inspizieren einer zumindest teilweise glänzenden Oberfläche an einem Gegenstand

Eine Vorrichtung zum optischen Inspizieren einer zumindest teilweise glänzenden Oberfläche an einem Gegenstand besitzt einen ersten und zumindest einen zweiten Querträger (12, 14), die jeweils einen weitgehend kreissegmentförmigen Ausschnitt (32) bilden. Die Querträger (12, 14) sind in einem Längsabstand (D) zueinander angeordnet, der eine Längsrichtung (17) definiert. Die beiden Querträger (12, 14) werden mit einer Anzahl von Längsträgern (16) in dem Längsabstand (D) gehalten. Die Längsträger (16) sind in einem definierten Radialabstand (38) zu den kreissegmentförmigen Ausschnitten (32) angeordnet. Die Querträger (12, 14) halten eine lichtdurchlässige Mattscheibe (34), die einen tunnelförmigen Inspektionsraum (36) bildet. Außerhalb des tunnelförmigen Inspektionsraums (36) sind hinter der Mattscheibe eine Vielzahl von Lichtquellen (48) angeordnet, die einzeln oder in kleinen Gruppen ansteuerbar sind, um variable Hell-Dunkel-Muster (90) auf der Mattscheibe (34) zu erzeugen. Zumindest eine ...

Printed and dyed product detection system based on color-changing LED technology

AUTOMATIC LIGHTING CONTROL METHOD FOR OPTICAL INSPECTION AND OPTICAL INSPECTION APPARATUS THEREOF

The present invention provides an automatic lighting control method for optical inspection and an optical inspection apparatus thereof which stabilize inspection quality of a circuit board. The automatic lighting control method for optical inspection automatically adjusts an emitting light source between various types of circuit boards to be measured by an optical inspection apparatus, and comprises: a step (S100) of capturing image data of a circuit board to be measured after changing a type; a lighting area setting step (S200) of setting at least one lighting area including at least two among a metal type, a character type, and a solder mask type and corresponding types based on the image data; a step (S300) of obtaining a degree of a difference in corresponding brightness based on brightness values of the image data between any two captured types of lighting areas; and a step (S400) of remembering an emitting light adjustment setup and using the emitting light adjustment setup when inspecting ...

Light source apparatus and light quantity monitor using the same

A light source apparatus (1) is provided with a light quantity monitor (M) and a light quantity controller (7). The light quantity monitor (M) is used to detect the quantity of the light projected on an object when the light from the lamp (4) is condensed and outputted from the output opening (6) to project, directly or indirectly, onto an object. The light quantity controller (7) feedbacks and controls the projected light quantity according to the detected light quantity. The light quantity monitor (M) includes a light guide rod(8) as a light route for guiding the light from the reflector 5 to the outgoing port (6), and a light sensor (9) for detecting the leaking light quantity from the peripheral surface (8a) of the guide rod (8). Therefore, the irradiated light quantity can be correctly detected and maintained constant even when the irradiated light quantify varies due to the change of lamp light quantity or the light distribution pattern.

METHOD AND DEVICE FOR OPTICAL YARN QUALITY MONITORING

The invention relates to a method and apparatus for monitoring yarn quality in the textile industry. Textile yarn is checked for quality to meet the required criteria such as diameter evenness and unwanted foreign fiber presence. The invention utilizes an artificial light illuminating the yarn, focusing element, diffraction element and the image sensor for capturing of focused diffracted rays from illuminated yarn image. The presence of foreign fibres in yarn and yarn diameter is determined by processing of captured image. 1. An yarn quality monitoring device , comprising:a primary light source for illuminating the yarn;an image sensor illuminated by light from primary light source light reflected from the yarn and propagating along an optical path to the image sensor, the image sensor for capturing an image data;a focusing element in the optical path between yarn and image sensor, for focusing the reflected light on the image sensor;a diffraction element in the optical path between yarn and image sensor, for diffraction of primary light source light reflected from the yarn; anda controller for processing the image data to obtain color analysis of yarn and yarn diameter.2. The device of claim 1 , wherein the diffraction element is a diffraction grating.3. The device of claim 1 , additionally comprising:a secondary light source emitting light, the light propagation defining an optical path; anda diffuser proximate to the secondary light source for diffusing the emitted light, diffused light illuminates image sensor over optical path through focusing element and diffraction element, yarn placed as an obstacle in the optical path create yarn contour image on the image sensor used by the controller for yarn diameter processing.4. The device of claim 3 , wherein the primary light source and the secondary light source emit light at different wavelengths claim 3 , and the device further includes an optical filter at least partially covering the image sensor for blocking ...

Fаst vаriаblе аnglе оf inсidеnсе illuminаtiоn fоr а mасhinе visiоn inspесtiоn sуstеm

А fаst vаriаblе аnglе оf inсidеnсе illuminаtiоn соnfigurаtiоn fоr а mасhinе visiоn inspесtiоn sуstеm, inсluding: а light sоurсе thаt dirесts а bеаm аlоng а first оptiсаl pаth pоrtiоn; а bеаm stееring аrrаngеmеnt thаt rесеivеs thе bеаm аnd stееrs it аlоng а sесоnd оptiсаl pаth pоrtiоn; аnd а bеаm dеflесting аrrаngеmеnt inсluding а plurаlitу оf surfасе pоrtiоns аrrаngеd аt rеspесtivе аnglеs оf inсidеnсе tо rесеivе thе bеаm аnd dеflесt it аlоng а third оptiсаl pаth pоrtiоn tо а fiеld оf viеw. Тhе bеаm stееring аrrаngеmеnt inсludеs diffеrеnt surfасеs thаt prоvidе еithеr nаrrоw оr widе divеrgеnсе оf thе bеаm tоwаrd thе dеflесting аrrаngеmеnt. Тhе illuminаtiоn соnfigurаtiоn аllоws fоr fаst аdjustmеnt оf nоt оnlу thе illuminаtiоn аnglе оf inсidеnсе but аlsо thе rаngе оf аnglеs (nаrrоw оr widе) аbоut thе nоminаl аnglе. Тhе illuminаtiоn соnfigurаtiоn is pаrtiсulаrlу suitаblе fоr usе with light prоvidеd bу а high-intеnsitу rеmоtе light sоurсе.

TWO-DIMENSIONAL ILLUMINATION SYSTEM

СПОСОБ И УСТРОЙСТВО ОПТИЧЕСКОГО АНАЛИЗА ФРУКТОВ ИЛИ ОВОЩЕЙ И УСТРОЙСТВО ДЛЯ АВТОМАТИЧЕСКОЙ СОРТИРОВКИ

TRANSPARENT MATERIAL INSPECTION SYSTEM

A system for the inspection of the optical quality of a part, object or product having a portion comprising transparent material such as ophthalmologic lenses, protective eyewear, visors, eyewear shield and the like is provided. A liquid crystal display (LCD) screen emits variable patterns of light through the transparent part under inspection to a charged coupled device (CCD) camera that captures the image and transmits the image data to an image processing module. The processed image data are then transmitted to an analysis module which then generally measures the dimensions of the part, the transparency, the colour and the optical strength. The analysis module also advantageously detects and measures the presence of dots, stains, scratches, optical distortions, fingerprints, cloudiness and other optical artefacts and/or defects in the transparent material. Accordingly, the patterns emitted by the LCD screen are designed to measure the optical specifications and highlight potential optical ...

FRUIT OR VEGETABLE OPTICAL ANALYSIS METHOD AND DEVICE AND AUTOMATIC SORTING DEVICE

L'invention concerne un procédé et un dispositif d'analyse optique de fruits ou légumes. Différentes sources (7a, 7b) lumineuses sont adaptées pour appliquer sélectivement sur chaque objet des rayonnements lumineux dans différents domaines de longueur d'onde, selon une séquence d'éclairage prédéterminée, et des images sont réalisées par au moins une caméra (4) couleur sensible aux infrarouges dont l'exposition est commandée en synchronisme avec ladite séquence d'éclairage de façon à réaliser une pluralité d'images dans différents domaines de longueur d'onde, dont au moins une image dans un domaine visible et au moins une image dans un domaine infrarouge.

Illuminating and optical apparatus for inspecting soldering of printed circuit board

System and method for illumination energy management in surface inspection

Inspection System and Method for Obtaining an Adjusted Light Intensity Image

An inspection system for obtaining an adjusted light intensity image includes a light source, an image capturing device and a controller. A field of view of the image capturing device is adjusted within an illumination area of the light source. A plurality of light emitting units of the light source are turned on in sequence. The image capturing device captures a calibration image when each of the light emitting units is turned on to obtain a plurality of the calibration images. The controller adjusts the light emitting intensities of the light emitting units respectively according to the light intensity distributions of the calibration images to obtain a specific intensity distribution of an inspection image in the field of view and compensate a vignette effect of the image capturing device.

APPARATUS AND METHOD FOR INSPECTION OF A FILM ON A SUBSTRATE

Methods of and apparatus for inspecting composite layers of a first material formed on a second material are provided including providing an illumination source, illuminating at least a portion of the composite at the layer, receiving light reflected from the sample, determining a spectral response from the received light, and comparing the received spectral response to an expected spectral response. 1. (canceled)2. (canceled)3. (canceled)4. (canceled)5. (canceled)6. (canceled)7. (canceled)8. (canceled)9. (canceled)10. (canceled)11. (canceled)12. (canceled)13. (canceled)14. (canceled)15. (canceled)16. (canceled)17. (canceled)18. (canceled)19. (canceled)20. (canceled)21. (canceled)22. (canceled)23. (canceled)24. (canceled)25. (canceled)26. (canceled)27. (canceled)28. (canceled)29. (canceled)30. A method of inspecting an oxide layer comprising:determining a reference spectrum of light reflected from a surface of a first sample of a first material having an oxide film thereon over a wavelength range encompassed by the reflected light, wherein the first sample does not include a predetermined defect;selecting an illumination source that outputs light encompassing at least part of the wavelength range;illuminating at least a portion of a second sample of a second material having an oxide layer with the light from the selected illumination source, wherein the light reflected from the first material and light from the selected illumination source reflected from the second material have respective spectral responses over the wavelength range that have a predetermined relationship;receiving the light output from the illumination source that has reflected from the second sample, including the oxide layer of the second sample;acquiring a measurement spectrum from the light received at the receiving step over at least part of the wavelength range that is encompassed by the light output from the illumination source;comparing at least one characteristic of the measurement ...

Fast variable angle of incidence illumination for a machine vision inspection system

A fast variable angle of incidence illumination configuration for a machine vision inspection system, including: a light source that directs a beam along a first optical path portion; a beam steering arrangement that receives the beam and steers it along a second optical path portion; and a beam deflecting arrangement including a plurality of surface portions arranged at respective angles of incidence to receive the beam and deflect it along a third optical path portion to a field of view. The beam steering arrangement includes different surfaces that provide either narrow or wide divergence of the beam toward the deflecting arrangement. The illumination configuration allows for fast adjustment of not only the illumination angle of incidence but also the range of angles (narrow or wide) about the nominal angle. The illumination configuration is particularly suitable for use with light provided by a high-intensity remote light source.

Apparatus for checking the coverslipping quality of samples for microscopic examination

The invention relates to a method in the preparation of samples for microscopic examination onto which a coverslip is applied. The method is notable for the fact that the coverslipping quality is checked automatically and at least partly optically. The invention further relates to an apparatus for carrying out the method, and to an apparatus for checking the coverslipping quality of samples onto which a coverslip is applied.

検査用照明装置及び検査用照明方法

Method and equipment for checking coverslipping and staining quality of coverslipped samples

APPARATUS AND METHOD FOR CHARACTERIZING DEFECTS IN A TRANSPARENT SUBSTRATE

An apparatus (10) and method for detecting defects in a transparent substrate (12) by simultaneously using a combination of bright field and dark field light sources for illuminating the substrate. The apparatus is capable of detecting both inclusions and surface defects simultaneously while the substrate is in motion, simplifying the characterization of substrates in a manufacturing setting. © KIPO & WIPO 2009 ...

Método y dispositivo para el análisis óptico de frutas u hortalizas y dispositivo de clasificación automática.

UN MÉTODO Y UN DISPOSITIVO PARA EL ANÁLISIS ÓPTICO DE FRUTAS U HORTALIZAS. SE ADAPTAN DIFERENTES FUENTES DE LUZ (7A, 7B) PARA APLICAR SELECTIVAMENTE A CADA OBJETO RAYOS DE LUZ EN DIFERENTES DOMINIOS DE LONGITUD DE ONDA, DE ACUERDO CON UNA SECUENCIA DE ILUMINACIÓN PREDETERMINADA, Y LAS IMÁGENES SON OBTENIDAS MEDIANTE AL MENOS UNA CÁMARA (4) A COLOR SENSIBLE A LOS RAYOS INFRARROJOS, DONDE LA EXPOSICIÓN SE CONTROLA EN SINCRONISMO CON DICHA SECUENCIA DE ILUMINACIÓN PARA OBTENER UNA PLURALIDAD DE IMÁGENES EN DIVERSOS INTERVALOS DE LONGITUD DE ONDA, QUE INCLUYEN AL MENOS UNA IMAGEN EN UN DOMINIO VISIBLE Y AL MENOS UNA IMAGEN EN UN DOMINIO INFRARROJO.

APPARATUS AND METHOD FOR CHARACTERIZING DEFECTS IN A TRANSPARENT SUBSTRATE

An apparatus (10) and method for detecting defects in a transparent substrate (12) by simultaneously using a combination of bright field and dark field light sources for illuminating the substrate. The apparatus is capable of detecting both inclusions and surface defects simultaneously while the substrate is in motion, simplifying the characterization of substrates in a manufacturing setting.

VIDEO INSPECTION SYSTEM EMPLOYING MULTIPLE SPECTRUM LED ILLUMINATION

An engineered lighting system for high speed video inspection includes an array of light emitting diodes (10) including light emitting diodes for use in time delay integration (TDI) inspection of web materials (38). The light emitting diodes (10) of the array are selectively controllable to accomplish sequential illumination and carefully controllable imaging of a specified section (42) of a continuously moving specimen or specimens. LEDs with different wavelength light output, or multi-wavelength light LEDs are utilized for rapid and reliable inspection of surfaces with varying color or contour or detect characteristics. The system also includes an array of optional backlighting elements (26) to aid in illumination of semi-opaque specimens to accomplish inspection thereof.

GRAIN QUALITY LEVEL DISCRIMINATION DEVICE

An object of the present invention is to improve the quality level discrimination accuracy of the grain G by a grain quality level discrimination device. The device includes an optical unit that emits light to the grain G, receives reflected and/or transmitted light from the grain G by a photosensor, and obtains information for discrimination of the quality level of the grain G from the upper and lower surface side of the grain G, and a quality level discrimination unit that discriminates the quality level of the grain G on the basis of the information. The information on the upper and lower surface sides can be acquired by one optical unit at the same time so that the divergence therebetween due to the displacement or variation of the attitude of the grain G can be avoided. The reference plate for the correction of the information is placed outside of the moving path of the grain G to prevent it from soiling or damaging. Thus the deterioration of information can be avoided. Further, a reference plate especially for the information to be obtained from the side surface of the grain G may be provided for enhancing the accuracy of the side surface information. Thus the quality level discrimination accuracy can be improved further. 1. A grain quality level discrimination device comprising:an optical unit having a plurality of light sources adapted to emit light to a grain and a photosensor adapted to receive reflected and/or transmitted light from the grain; anda quality level discrimination unit configured to discriminate quality level of the grain on the basis of the light received by the photosensor, a particular light source configured to emit particular light from one surface side of the grain is included in the light sources, the particular light having a predetermined wavelength necessary for identifying a planar shape of the grain,', 'the photosensor includes a first light receiving area configured to receive reflected and/or transmitted light from the other ...

Device for the examination of optical properties of surfaces

A device for examining the optical properties of surfaces includes at least one first radiation device which emits radiation to a surface to be examined at a first predetermined spatial angle; at least one first detector device for capturing the radiation emitted to and reflected back from the surface, wherein the first detector device, allowing a local resolution of detected radiation, is positioned at least at a second predetermined spatial angle relative to the surface; and at least one further radiation device or second detector device emitting radiation to the surface to be examined at a third predetermined spatial angle or detecting radiation emitted to and reflected back from the surface.

OPTICAL DETECTING DEVICE AND CALIBRATING METHOD

An optical detecting device includes an image capturing device and a processor. The processor is coupled to a light source and an image capturing device. The processor is configured to adjust a light intensity of the light source for irradiating a correction object in order that a gray value of at least one image block, captured by the image capturing device, of the correction object matches a target correction value, and record a target light intensity while the target light intensity matches the target correction value; control the light source to irradiate light on a testing object with the target light intensity, and control the image capturing device to capture a testing object image of the testing object; and calculate ratios of a target gray value to the gray value of a plurality of pixels of the testing object image to obtain a mapping table. 1. A optical detecting device , comprising:an image capturing device; and adjust a light intensity of the light source for irradiating a correction object in order that a gray value of at least one image block, captured by the image capturing device, of the correction object matches a target correction value, and record a target light intensity while the target light intensity matches the target correction value;', 'control the light source to irradiate light on a testing object with the target light intensity, and control the image capturing device to capture a testing object image of the testing object; and', 'calculate ratios of a target gray value to the gray value of a plurality of pixels of the testing object image to obtain a mapping table., 'a processor coupled to a light source and the image capturing device, wherein the processor is configured to2. The optical detecting device of claim 1 , wherein the image capturing device is further configured to capture a flat region of the testing object to obtain a region image claim 1 , and the processor is configured to copy the region image and splice a plurality of ...

Fаst vаriаblе аnglе оf inсidеnсе illuminаtiоn fоr а mасhinе visiоn inspесtiоn sуstеm

А fаst vаriаblе аnglе оf inсidеnсе illuminаtiоn соnfigurаtiоn fоr а mасhinе visiоn inspесtiоn sуstеm, inсluding: а light sоurсе thаt dirесts а bеаm аlоng а first оptiсаl pаth pоrtiоn; а bеаm stееring аrrаngеmеnt thаt rесеivеs thе bеаm аnd stееrs it аlоng а sесоnd оptiсаl pаth pоrtiоn; аnd а bеаm dеflесting аrrаngеmеnt inсluding а plurаlitу оf surfасе pоrtiоns аrrаngеd аt rеspесtivе аnglеs оf inсidеnсе tо rесеivе thе bеаm аnd dеflесt it аlоng а third оptiсаl pаth pоrtiоn tо а fiеld оf viеw. Тhе bеаm stееring аrrаngеmеnt inсludеs diffеrеnt surfасеs thаt prоvidе еithеr nаrrоw оr widе divеrgеnсе оf thе bеаm tоwаrd thе dеflесting аrrаngеmеnt. Тhе illuminаtiоn соnfigurаtiоn аllоws fоr fаst аdjustmеnt оf nоt оnlу thе illuminаtiоn аnglе оf inсidеnсе but аlsо thе rаngе оf аnglеs (nаrrоw оr widе) аbоut thе nоminаl аnglе. Тhе illuminаtiоn соnfigurаtiоn is pаrtiсulаrlу suitаblе fоr usе with light prоvidеd bу а high-intеnsitу rеmоtе light sоurсе.

Fаst vаriаblе аnglе оf inсidеnсе illuminаtiоn fоr а mасhinе visiоn inspесtiоn sуstеm

А fаst vаriаblе аnglе оf inсidеnсе illuminаtiоn соnfigurаtiоn fоr а mасhinе visiоn inspесtiоn sуstеm, inсluding: а light sоurсе thаt dirесts а bеаm аlоng а first оptiсаl pаth pоrtiоn; а bеаm stееring аrrаngеmеnt thаt rесеivеs thе bеаm аnd stееrs it аlоng а sесоnd оptiсаl pаth pоrtiоn; аnd а bеаm dеflесting аrrаngеmеnt inсluding а plurаlitу оf surfасе pоrtiоns аrrаngеd аt rеspесtivе аnglеs оf inсidеnсе tо rесеivе thе bеаm аnd dеflесt it аlоng а third оptiсаl pаth pоrtiоn tо а fiеld оf viеw. Тhе bеаm stееring аrrаngеmеnt inсludеs diffеrеnt surfасеs thаt prоvidе еithеr nаrrоw оr widе divеrgеnсе оf thе bеаm tоwаrd thе dеflесting аrrаngеmеnt. Тhе illuminаtiоn соnfigurаtiоn аllоws fоr fаst аdjustmеnt оf nоt оnlу thе illuminаtiоn аnglе оf inсidеnсе but аlsо thе rаngе оf аnglеs (nаrrоw оr widе) аbоut thе nоminаl аnglе. Тhе illuminаtiоn соnfigurаtiоn is pаrtiсulаrlу suitаblе fоr usе with light prоvidеd bу а high-intеnsitу rеmоtе light sоurсе.

INSPECTION DEVICE OF OPTICAL SURFACE CHARACTERISTICS AND INSPECTION METHOD USING IT

PROBLEM TO BE SOLVED: To resolve even the change caused in surface coating at the time of inspection of optical surface characteristics when observation is performed by slightly changing a solid angle. SOLUTION: This inspection device for optical surface characteristics is equipped with at least one first irradiator for irradiating an inspection surface with light at a given first solid angle, at least one first detector for catching the light reflected from the irradiated inspection surface to be returned therefrom and resolving a position to detect the light and at least one further irradiator or a second detector arranged with respect to the inspection surface at a given solid angle and irradiating the inspection surface with light at a given third solid angle or detecting the light thrown on the inspection surface to be reflected and returned therefrom. COPYRIGHT: (C)2006,JPO&NCIPI ...

Adaptives Verfahren für eine Lichtquelle

Ein Verfahren umfasst ein Auswählen eines Kandidatenbildeigenschaftsdatensatzes und eines entsprechenden Kandidatenlichtquellenparametersatzes, ein Erhalten mehrerer angepasster Lichtquellenparametersätze auf der Basis des Kandidatenlichtquellenparametersatzes, ein Projizieren von Licht auf einen Artikel und Aufnehmen von Bildern nacheinander in mehreren Projektionsmodi gemäß den angepassten Lichtquellenparametersätzen, ein Erhalten mehrerer angepasster Bildeigenschaftsdatensätze jeweils aus den Bildern, die in einem Projektionsmodus aufgenommen werden, und ein Auswählen eines Zielbildeigenschaftsdatensatzes aus den angepassten Bildeigenschaftsdatensätzen und eines entsprechenden Ziellichtquellenparametersatzes.

INSPECTING DEVICE OF the QUALITY Of a SURFACE

APPARATUS AND METHOD FOR CHARACTERIZING DEFECTS IN A TRANSPARENT SUBSTRATE

기판을 조명하기 위해 명시야와 암시야 광원의 조합을 동시에 사용함으로써 투명 기판(12)의 결함을 검출하기 위한 장치(10) 및 방법. 상기 장치는 제조 설정에 있어 기판의 특성을 단순화하여, 상기 기판이 동작중일 동안 내부 함유물과 표면 결함 모두를 동시에 검출할 수 있다. Apparatus (10) and method for detecting defects in a transparent substrate (12) by simultaneously using a combination of brightfield and darkfield light sources to illuminate the substrate. The device simplifies the characteristics of the substrate in a manufacturing setup, allowing simultaneous detection of both internal inclusions and surface defects while the substrate is in operation. 이미징 시스템, 라인 스캐닝, 암시야, 명시야, 내부 함유물, 표면 결함 Imaging System, Line Scanning, Dark Field, Bright Field, Internal Inclusions, Surface Defects

IMAGE CAPTURING DEVICE, DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD

The embodiment of the present invention provides an image capturing device which includes a Faraday rotator capable of minimally suppressing an influence on an element arranged around the Faraday rotator. Light from a light source (1001) is illuminated to a mask (1006) through a polarizing beam splitter (1002). The light reflected on the mask (1006) is induced to a sensor (1007) through the polarizing beam splitter (1002). The image of the pattern of the mask (1006) is captured by the sensor (1007). The Faraday rotator (1004) is arranged between the polarizing beam splitter (1002) and the mask (1006). The Faraday rotator (1004) is arranged away from the polarizing beam splitter (1002) to form a Faraday rotation angle in the polarizing beam splitter between -0.5 and 0.5 degrees. COPYRIGHT KIPO 2016 ...

Method and device for optically analysing fruit or vegetables and device for automatic sorting

Method for characterizing defects in a transparent substrate

Fаst vаriаblе аnglе оf inсidеnсе illuminаtiоn fоr а mасhinе visiоn inspесtiоn sуstеm

А fаst vаriаblе аnglе оf inсidеnсе illuminаtiоn соnfigurаtiоn fоr а mасhinе visiоn inspесtiоn sуstеm, inсluding: а light sоurсе thаt dirесts а bеаm аlоng а first оptiсаl pаth pоrtiоn; а bеаm stееring аrrаngеmеnt thаt rесеivеs thе bеаm аnd stееrs it аlоng а sесоnd оptiсаl pаth pоrtiоn; аnd а bеаm dеflесting аrrаngеmеnt inсluding а plurаlitу оf surfасе pоrtiоns аrrаngеd аt rеspесtivе аnglеs оf inсidеnсе tо rесеivе thе bеаm аnd dеflесt it аlоng а third оptiсаl pаth pоrtiоn tо а fiеld оf viеw. Тhе bеаm stееring аrrаngеmеnt inсludеs diffеrеnt surfасеs thаt prоvidе еithеr nаrrоw оr widе divеrgеnсе оf thе bеаm tоwаrd thе dеflесting аrrаngеmеnt. Тhе illuminаtiоn соnfigurаtiоn аllоws fоr fаst аdjustmеnt оf nоt оnlу thе illuminаtiоn аnglе оf inсidеnсе but аlsо thе rаngе оf аnglеs (nаrrоw оr widе) аbоut thе nоminаl аnglе. Тhе illuminаtiоn соnfigurаtiоn is pаrtiсulаrlу suitаblе fоr usе with light prоvidеd bу а high-intеnsitу rеmоtе light sоurсе.

Fаst vаriаblе аnglе оf inсidеnсе illuminаtiоn fоr а mасhinе visiоn inspесtiоn sуstеm

А fаst vаriаblе аnglе оf inсidеnсе illuminаtiоn соnfigurаtiоn fоr а mасhinе visiоn inspесtiоn sуstеm, inсluding: а light sоurсе thаt dirесts а bеаm аlоng а first оptiсаl pаth pоrtiоn; а bеаm stееring аrrаngеmеnt thаt rесеivеs thе bеаm аnd stееrs it аlоng а sесоnd оptiсаl pаth pоrtiоn; аnd а bеаm dеflесting аrrаngеmеnt inсluding а plurаlitу оf surfасе pоrtiоns аrrаngеd аt rеspесtivе аnglеs оf inсidеnсе tо rесеivе thе bеаm аnd dеflесt it аlоng а third оptiсаl pаth pоrtiоn tо а fiеld оf viеw. Тhе bеаm stееring аrrаngеmеnt inсludеs diffеrеnt surfасеs thаt prоvidе еithеr nаrrоw оr widе divеrgеnсе оf thе bеаm tоwаrd thе dеflесting аrrаngеmеnt. Тhе illuminаtiоn соnfigurаtiоn аllоws fоr fаst аdjustmеnt оf nоt оnlу thе illuminаtiоn аnglе оf inсidеnсе but аlsо thе rаngе оf аnglеs (nаrrоw оr widе) аbоut thе nоminаl аnglе. Тhе illuminаtiоn соnfigurаtiоn is pаrtiсulаrlу suitаblе fоr usе with light prоvidеd bу а high-intеnsitу rеmоtе light sоurсе.

Fаst vаriаblе аnglе оf inсidеnсе illuminаtiоn fоr а mасhinе visiоn inspесtiоn sуstеm

А fаst vаriаblе аnglе оf inсidеnсе illuminаtiоn соnfigurаtiоn fоr а mасhinе visiоn inspесtiоn sуstеm, inсluding: а light sоurсе thаt dirесts а bеаm аlоng а first оptiсаl pаth pоrtiоn; а bеаm stееring аrrаngеmеnt thаt rесеivеs thе bеаm аnd stееrs it аlоng а sесоnd оptiсаl pаth pоrtiоn; аnd а bеаm dеflесting аrrаngеmеnt inсluding а plurаlitу оf surfасе pоrtiоns аrrаngеd аt rеspесtivе аnglеs оf inсidеnсе tо rесеivе thе bеаm аnd dеflесt it аlоng а third оptiсаl pаth pоrtiоn tо а fiеld оf viеw. Тhе bеаm stееring аrrаngеmеnt inсludеs diffеrеnt surfасеs thаt prоvidе еithеr nаrrоw оr widе divеrgеnсе оf thе bеаm tоwаrd thе dеflесting аrrаngеmеnt. Тhе illuminаtiоn соnfigurаtiоn аllоws fоr fаst аdjustmеnt оf nоt оnlу thе illuminаtiоn аnglе оf inсidеnсе but аlsо thе rаngе оf аnglеs (nаrrоw оr widе) аbоut thе nоminаl аnglе. Тhе illuminаtiоn соnfigurаtiоn is pаrtiсulаrlу suitаblе fоr usе with light prоvidеd bу а high-intеnsitу rеmоtе light sоurсе.

Aufrechterhaltung eines stabilen optischen Ausgangs eines Festkörperbeleuchtungssystems

Es wird ein Verfahren zum Aufrechterhalten eines gewünschten optischen Ausgangs in einer Festkörperbeleuchtungseinrichtung offenbart, wobei die Einrichtung dafür konfiguriert ist, mehrere Leuchtdioden (LEDs) unterzubringen und das Licht von den LEDs zu kombinieren, um einen einzigen optischen Ausgang zu erzeugen. Das Verfahren umfasst das Prüfen der LEDs, bevor diese zu der Einrichtung hinzugefügt werden. Das Prüfen ergibt charakterisierende Informationen, die beschreiben, wie sich eine oder mehrere optische Eigenschaften (z.B. optische Leistung und/oder Spitzenwellenlänge) der geprüften LED mit der Temperatur ändern. Diese charakterisierenden Informationen werden in einem computerbasierten Speicher der Einrichtung gespeichert, und die geprüfte LED wird zu der Einrichtung hinzugefügt (an dieser angeschlossen). Dann messen Temperatursensoren während des Betriebs eine Temperatur, die mit jeder jeweiligen LED in der Einrichtung assoziiert ist, und der elektrische Strom zu einer oder mehreren ...

Capturing method for images with different view-angles and capturing system using the same

A capturing method for a plurality of images with different view-angles and a capturing system using the same are provided. The capturing method for the images with different view-angles includes the following steps. An appearance image of an object is captured by an image capturing unit at a capturing angle. A light reflection area of the appearance image is detected by a detecting unit, and a dimension characteristic of the light reflection area is analyzed by the same. Whether the dimension characteristic of the light reflection area is larger than a first predetermined value is determined. If the dimension characteristic of the light reflection area is larger than the first predetermined value, then the capturing angle is adjusted within a first adjusting range. After the step of adjusting the capturing angle within a first adjusting range is performed, the step of capturing the appearance image is performed again.

Super resolution inspection system

The disclosure is directed to a system and method for inspecting a sample by illuminating the sample at a plurality of different angles and independently processing the resulting image streams. Illumination is directed through a plurality of pupil apertures to a plurality of respective field apertures so that the sample is imaged by portions of illumination directed at different angles. The corresponding portions of light reflected, scattered, or radiated from the surface of the sample are independently processed. Information associated with the independently processed portions of illumination is utilized to determine a location of at least one defect of the sample. Independently processing multiple image streams associated with different illumination angles allows for retention of frequency content that would otherwise be lost by averaging information from multiple imaging angles.

ILLUMINATION DEVICE, ILLUMINATION METHOD AND IMAGING APPARATUS

In order to provide an illumination technique capable of illuminating an object in a plurality of illumination modes with a reduced size and at low cost, an illumination device comprises: a light emitter including first light emitting elements and second light emitting elements configured to emit light toward the object; an optical system including a first optical element configured to change a light distribution of light emitted from the first light emitting elements to a first light distribution, the optical system introducing light emitted from the second light emitting elements with a second light distribution different from the first light distribution to the object; and an illumination controller configured to mutually independently control the light emission of the first light emitting elements and the second light emitting elements. 1. An illumination device for illuminating an object , comprising:a light emitter including first light emitting elements and second light emitting elements configured to emit light toward the object;an optical system including a first optical element configured to change a light distribution of light emitted from the first light emitting elements to a first light distribution, the optical system introducing light emitted from the second light emitting elements with a second light distribution different from the first light distribution to the object; andan illumination controller configured to mutually independently control the light emission of the first light emitting elements and the second light emitting elements.2. The illumination device according to claim 1 , wherein:the first light emitting elements and the second light emitting elements emit ht having the second light distribution; andthe optical system introduces the light emitted from the second light emitting elements to the object with the second light distribution kept.3. The illumination device according to claim 1 , wherein:the optical system includes a second ...

Surface Defect Inspection With Large Particle Monitoring And Laser Power Control

Methods and systems for reducing illumination intensity while scanning over large particles are presented herein. A surface inspection system determines the presence of a large particle in the inspection path of a primary measurement spot using a separate leading measurement spot. The inspection system reduces the incident illumination power while the large particle is within the primary measurement spot. The primary measurement spot and the leading measurement spot are separately imaged by a common imaging collection objective onto one or more detectors. The imaging based collection design spatially separates the image of the leading measurement spot from the image of the primary measurement spot at one or more wafer image planes. Light detected from the leading measurement spot is analyzed to determine a reduced power time interval when the optical power of the primary illumination beam and the leading illumination beam are reduced. 1. A surface inspection system comprising:an illumination source configured to generate a beam of illumination light;a beam splitting element configured to split the beam of illumination light into a leading illumination beam and a primary illumination beam;an illumination objective configured to project the leading illumination beam and the primary illumination beam onto a surface of a wafer at a leading measurement spot and a primary measurement spot, respectively;an imaging objective configured to image an amount of light scattered from the leading measurement spot and image an amount of light scattered from the primary measurement spot to separate locations at a wafer image plane of the imaging objective;a collection beam splitter configured to split the imaged amount of light scattered from the leading measurement spot and the imaged amount of light scattered from the primary measurement spot between a main measurement channel directed toward an imaging detector and a laser power management (LPM) channel directed toward one or ...

OPTICAL STATE MONITOR WITH AN INDICATOR-SENSOR

In one configuration, an optical state monitor is augmented or comprises one or more indicator-sensors that self-generate different optical profiles (signatures) in response to an item or its environment; wherein wherein the indicator-sensors cooperate with the electromagnetic radiation detectors of the optical state monitor in the detection and determination of the condition(s) of the item or its environment, or of the indicator-sensor and its environment. Of particular interest are indicator-sensors that are thin, flexible, patternable and printable (or otherwise deposited) as films or additive layers to electromagnetic detection layers or other structures of the optical state monitor. 1. An optical state monitor constructed to determine a state of an item or an environment , comprising:one or more electromagnetic indicator-sensors for generating an optical signature responsive to the good or the environment;one or more electromagnetic detectors for detecting electromagnetic radiation from the indicator-sensors, wherein the detected electromagnetic radiation is dependent on the generated optical signature,a memory constructed to store a predefined optical state profile regarding the state of the item or environment;a processor for evaluating the generated electronic signals using the optical state profile to determine the state of the item or the environment;a power source; andwherein the electromagnetic detectors are constructed to detect electromagnetic radiation corresponding to the optical state profile.2. The optical state monitor of claim 1 , wherein the indicator-sensors are the same type.3. The optical state monitor of claim 1 , wherein the indicator-sensors are of different types.4. The optical state monitor of claim 1 , wherein the electromagnetic radiation detectors are the same type.5. The optical state monitor of claim 1 , wherein the electromagnetic radiation detectors are of different types.6. The optical state monitor of claim 1 , further ...

VISUAL INSPECTION APPARATUS

A visual inspection apparatus performing a visual inspection of an electronic component including opposing sides and opposing sides the apparatus including an optical-path adjusting means changing a traveling direction of a light and setting an appearance of the side of the electronic component temporarily stopped at a first inspection point in an image of the side of the electronic component captured by a first imaging means and an optical-path adjusting means setting an appearance of the side of the electronic component temporarily stopped at a second inspection point in an image of the side of the electronic component captured by a second imaging means , thereby performing a visual inspection of the sides 1. A visual inspection apparatus performing a visual inspection of an electronic component including opposing sides A , B and opposing sides C , D , the electronic component being rectangular or square when viewed from above , the apparatus comprising:a rotating body including a plurality of supporting members circularly attached to the rotating body with gaps between the supporting members, the supporting members each holding the electronic component, the rotating body intermittently rotating to temporarily stop the electronic component at one and the other of the first and second inspection points in series, the electronic component held by the supporting member in a way that the sides A, B are along a rotating direction and one of the sides C, D is placed on an upstream side from the other of the sides C, D in the rotating direction;a first imaging means imaging the side A of the electronic component temporarily stopped at the first inspection point;an optical-path adjusting means b changing a traveling direction of a light and setting an appearance of the side B of the electronic component temporarily stopped at the first inspection point in an image of the side A of the electronic component, the image about to be captured by the first imaging means;a second ...

Method of Detecting a Defect of a Substrate and Apparatus for Performing the Same

In a method of detecting a defect of a substrate, a first light having a first intensity may be irradiated to a first region of the substrate through a first aperture. A defect in the first region may be detected using a first reflected light from the first region. A second light having a second intensity may be irradiated to a second region of the substrate through a second aperture. A defect in the second region may be detected using a second reflected light from the second region. Thus, the defects by the regions of the substrate may be accurately detected. 1. A method of detecting a defect of a substrate , the method comprising:irradiating a first light having a first intensity to a first region of the substrate through a first aperture;detecting a defect in the first region based on a first reflected light from the first region;irradiating a second light having a second intensity to a second region of the substrate through a second aperture; anddetecting a defect in the second region based on a second reflected light from the second region.2. The method of claim 1 , further comprising changing the first light into the second light at a time when an inspection region is changed from the first region to the second region.3. The method of claim 2 , further comprising changing the first aperture into the second aperture at the time when the inspection region is changed from the first region to the second region.4. The method of claim 3 , wherein changing the first aperture into the second aperture comprises controlling a spatial light modulator claim 3 , wherein the first and second apertures are defined in the spatial light modulator.5. The method of claim 1 , further comprising changing the first aperture into the second aperture at a time when an inspection region is changed from the first region to the second region.6. The method of claim 1 , further comprising:setting the first light and the first aperture prior to irradiating the first light to the first ...

METHOD AND DEVICE FOR FOCUSING IN AN INSPECTION SYSTEM

An inspection apparatus includes an inspection optical system configured to a direct an inspection beam onto a surface of a substrate, the inspection optical system having an objective, a focus measurement optical system configured to receive a focus measurement beam, redirected by the substrate, from the objective, the focus measurement optical system having a movable reflective element configured to receive the focus measurement beam, and a control system configured to cause movement of the reflective element with a direction component along a beam path of the focus measurement beam and configured to determine whether the substrate surface is in the focus of the objective based on the focus measurement beam. 1. An inspection apparatus comprising:an inspection optical system configured to a direct an inspection beam onto a surface of a substrate, the inspection optical system comprising an objective;a focus measurement optical system configured to receive a focus measurement beam, redirected by the substrate, from the objective, the focus measurement optical system comprising a movable reflective element configured to receive the focus measurement beam; anda control system configured to cause movement of the reflective element with a direction component along a beam path of the focus measurement beam and configured to determine whether the substrate surface is in the focus of the objective based on the focus measurement beam.2. The inspection apparatus of claim 1 , wherein the control system is configured to cause movement of the reflective element to a plurality of different positions along the beam path for use in a focusing operation of an inspection using the inspection beam claim 1 , each of the positions corresponding to a different optical characteristic of the inspection beam.3. The inspection apparatus of claim 2 , wherein the optical characteristic of the inspection beam is wavelength of the inspection beam.4. The inspection apparatus of claim 1 , wherein ...

METHOD AND APPARATUS FOR INSPECTING APPEARANCE OF OBJECT

A method and apparatus for inspecting an object is provided. By way of example, first and second images of the object obtained by using a camera and a lighting unit. The lighting unit and the camera is controlled so as to provide the first image picked up by the camera with a first quantity of light radiated from the lighting unit and the second image picked up by the camera with the second quantity of light radiated from the lighting unit. The first quantity of light is different from the second quantity of light. Differences between pixel values of the first image and pixel values of the second image are calculated. Then, it is determined whether the object has a non-defective appearance or a detective appearance, based on comparison between the differences and reference pixel values corresponding to the differences. 1. An apparatus for inspecting an appearance of an object , comprising:a lighting unit radiating light to an object, the lighting unit being of selectively adjusting an quality of the light to a first light quantity and a second light quantity different from the first light quantity;a camera optically imaging the object;a unit obtaining first and second images of the object using the camera, the obtaining unit controlling the lighting unit and the camera so as to provide the first image picked up by the camera with the first light quantity and the second image picked up by the camera with the second light quantity;a unit calculating differences between pixel values of the first image and pixel values of the second image; anda unit determining whether the object has a non-defective appearance or a detective appearance based on comparison between the differences and reference pixel values corresponding to the differences.2. The apparatus of claim 1 , wherein the reference pixel values are set as difference pixel values between pixel values of a third image and pixel values of a fourth image claim 1 , the third image being picked up by the camera with ...

SYSTEM AND METHOD FOR DECORATION INSPECTION ON TRANSPARENT MEDIA

There is provided a system for inspecting an edge area of a transparent media, the transparent media having a decoration on a surface, the system includes: an illuminator to direct light to the transparent media for inspection, wherein the illuminator directs light to the transparent media at an oblique angle relative to a surface of the transparent media which is opposite the surface with the decoration; an optical element to capture light transmitted through the transparent media; and a sensor to obtain an image from the light captured by the optical element. There is also provided a method for inspecting an edge area of a transparent media, where the transparent media has a decoration on a surface. 1. A system for inspecting an edge area of a transparent media , the transparent media having a decoration on a surface , the system comprising:an illuminator to direct light to the transparent media for inspection, wherein the illuminator directs light to the transparent media at an oblique angle relative to a surface of the transparent media which is opposite the surface with the decoration;an optical element to capture light transmitted through the transparent media; anda sensor to obtain an image from the light captured by the optical element.2. A system according to claim 1 , wherein the edge area of the transparent media has a shaped profile.3. A system according to claim 2 , wherein the shaped profile is selected from a group consisting of curved claim 2 , chamfered claim 2 , or radiused.4. A system according to claim 1 , wherein the illuminator is configurable to vary the intensity of the directed light to uniformly illuminate the edge area of the transparent media.5. A system according to claim 1 , further comprising a polarizer that modifies the polarity of the light from the illuminator.6. A system according to claim 1 , further comprising a formatter that alters the distribution of the light which illuminates the transparent media.7. A system according to ...

Large-Particle Monitoring with Laser Power Control for Defect Inspection

A semiconductor wafer is inspected using a main laser beam and a secondary laser beam. The secondary laser beam leads the main laser beam and has lower power than the main laser beam. Using the secondary laser beam, a particle is detected on the semiconductor wafer having a size that satisfies a threshold. In response to detecting the particle, the power of the main laser beam and the power of the secondary laser beam are reduced. The particle passes through the main laser beam with the main laser beam at reduced power. After the particle has passed through the main laser beam with the main laser beam at the reduced power, the power of the main laser beam and the power of the secondary laser beam are restored in a controlled manner that is slower than a single step. 1. A method , comprising:inspecting a semiconductor wafer using a main laser beam and a secondary laser beam, wherein the secondary laser beam leads the main laser beam and has lower power than the main laser beam;detecting, using the secondary laser beam, a particle on the semiconductor wafer having a size that satisfies a threshold;in response to detecting the particle, reducing the power of the main laser beam and the power of the secondary laser beam, wherein the particle passes through the main laser beam with the main laser beam at reduced power; andafter the particle has passed through the main laser beam with the main laser beam at the reduced power, restoring the power of the main laser beam and the power of the secondary laser beam in a controlled manner that is slower than a single step.2. The method of claim 1 , wherein restoring the power of the main laser beam and the power of the secondary laser beam in the controlled manner comprises restoring the power of the main laser beam and the power of the secondary laser beam in a series of steps.3. The method of claim 2 , wherein the series of steps consists of three to seven steps.4. The method of claim 2 , wherein the series of steps comprises ...

AUTOMATED OPTICAL INSPECTION EQUIPMENT WITH ADJUSTABLE IMAGE CAPTURING COMBINATION AND IMAGE CAPTURING COMBINATION ADJUSTING METHOD

An automated optical inspection (AOI) equipment with adjustable image capturing combination and an image capturing combination adjusting method thereof are provided. The automated optical inspection equipment includes at least one image capturing apparatus, at least one moveable light source and a device-under-test (DUT) movement mechanism. A control circuit moves DUT, selects one light source, and controls the light source to move or rotate. The control circuit is capable of performing the capturing operation by switching multiple image capturing combinations sequentially. Each of the image capturing combinations records the image capturing apparatus, the position and angle of the DUT, the light source and its position and angle relative to DUT. The positions or angles of capturing combinations are different. 1. An automated optical inspection (MO) equipment with adjustable image capturing combination , used for inspecting a device under test (DUT) , wherein the automated optical inspection equipment comprises:a body;at least one image capturing apparatus, disposed on the body;at least one light source movably, disposed on the body; and 'each of the image capturing combinations records positions and angles of the at least one of the image capturing apparatuses and the at least one of the light sources relative to the DUT, and the positions or the angles of the different image capturing combinations are different.', 'a control circuit, connecting to the at least one image capturing apparatus and the at least one light source, controlling and activating the at least one image capturing apparatus, controlling a movement of the at least one light source, sequentially switching each of a plurality of image capturing combinations to perform an image capture operation on the DUT, wherein'}2. The automated optical inspection equipment with the adjustable image capturing combination according to further comprises:a DUT movement mechanism, disposed on the body for the DUT to ...

Arrangement and procedure for the inspection of moving plate-shaped objects

An arrangement for an inspection of plate-shaped objects moving relative to a camera device in a direction of motion through at least two observation areas. The arrangement includes the camera device which includes one single camera which comprises a matrix sensor, and an image processor. In a first detection state, a first observation area running diagonally opposite to the direction of motion is represented on a first image area of the camera device and is recorded as a strip-shaped image. In a second detection state, a second observation area is represented on a second image area of the camera device and is recorded as a strip-shaped image. The image processor merges the strip-shaped images recorded in the first detection state and in the second detection state to form two-dimensional images. All image areas are located on the matrix sensor.

INSPECTION APPARATUS

An inspection apparatus includes an illumination device including an arch-like lighting unit that is provided around an inspection target in a circular arc form and emits light toward the inspection target, imaging devices that capture images of a light reflection surface of the inspection target by which the light emitted from the arch-like lighting unit is reflected, and a determination device that inspects the light reflection surface of the inspection target on the basis of the images captured by the imaging devices. As a result, the inspection apparatus provides an effect of preventing the apparatus from being increased in size. 1. An inspection apparatus comprising:an illumination device including an arch-like lighting unit that is provided around an inspection target in a circular arc form and emits light toward the inspection target;an imaging device configured to capture an image of a light reflection surface of the inspection target by which the light emitted from the arch-like lighting unit is reflected; anda determination device configured to inspect the light reflection surface of the inspection target on the basis of the image captured by the imaging device.2. The inspection apparatus according to claim 1 , further comprising:a rotation driving device that relatively rotates the inspection target and the arch-like lighting unit about a rotating axial line along a line connecting both end portions of the arch-like lighting unit as a rotating center, whereinthe determination device inspects the light reflection surface of the inspection target on the basis of the image captured by the imaging device while relatively rotating the inspection target and the arch-like lighting unit by the rotation driving device.3. The inspection apparatus according to claim 2 , further comprising:a holding surface configured to hold the inspection target in a height direction, whereinat least end portions of the light reflection surface of the inspection target are formed ...

INSPECTION SYSTEM AND INSPECTION METHOD

An inspection system of an embodiment includes: a planar illumination unit that temporally and spatially varies intensities of light in a periodic manner; a time-correlation image generator that generates a time-correlation image with a time-correlation camera or an image capturing system that performs an operation equivalent to that of the time-correlation camera; and a calculation processor that calculates a characteristic from the time-correlation image, the characteristic corresponding to a distribution of normal vectors to an inspection target surface and serving to detect an abnormality based on at least either a difference from a surrounding area or a difference from a reference surface. 1. An inspection system comprising:a planar illumination unit that temporally and spatially varies intensities of light in a periodic manner;a time-correlation image generator that generates a time-correlation image with a time-correlation camera or an image capturing system that performs an operation equivalent to that of the time-correlation camera; anda calculation processor that calculates a characteristic from the time-correlation image, the characteristic corresponding to a distribution of normal vectors to an inspection target surface and serving to detect an abnormality based on at least either a difference from a surrounding area or a difference from a reference surface.2. The inspection system according to claim 1 , whereinthe time-correlation image generator generates a complex time-correlation image, andthe characteristic corresponds to a distribution of phases of the complex time-correlation image.3. The inspection system according to claim 2 , wherein the characteristic is a gradient of the distribution of the phases.4. The inspection system according to claim 3 , wherein the characteristic is a variation in the gradient of the distribution of the phases obtained by applying processing with a phase-only Laplacian to the complex time-correlation image.5. The ...

DEFECT INSPECTION METHOD, LOW LIGHT DETECTING METHOD, AND LOW LIGHT DETECTOR

A defect inspection method includes an illumination light adjustment step of adjusting light emitted from a light source, an illumination intensity distribution control step of forming light flux obtained in the illumination light adjustment step into desired illumination intensity distribution, a sample scanning step of displacing a sample in a direction substantially perpendicular to a longitudinal direction of the illumination intensity distribution, a scattered light detection step of counting the number of photons of scattered light emitted from plural small areas in an area irradiated with illumination light to produce plural scattered light detection signals corresponding to the plural small areas, a defect judgment step of processing the plural scattered light detection signals to judge presence of a defect, a defect dimension judgment step of judging dimensions of the defect in each place in which the defect is judged to be present and a display step of displaying a position on sample surface and the dimensions of the defect in each place in which the defect is judged to be present. 19-. (canceled)10. A defect inspection method comprising:an illumination light adjustment step of adjusting light emitted from a light source to light flux having desired light amount, position, beam diameter and polarization state;an illumination intensity distribution control step of leading the light flux obtained in the illumination light adjustment step to a surface of a sample with a desired incident angle and forming illumination intensity distribution which is long in one direction and short in a direction perpendicular to the one direction on the surface of the sample;a sample scanning step of displacing the sample in a direction substantially perpendicular to a longitudinal direction of the illumination intensity distribution in an illumination light irradiation position on the surface of the sample by the illumination intensity distribution control step;a scattered ...

ADAPTIVE LIGHTING DEVICE FOR OPTICAL INSPECTION

The present disclosure illustrates an adaptive lighting device for optical inspection, which may be assembled with the image capturing device and the lighting module capable of moving and rotating of the lighting device is used to provide a variety of the illumination ranges and the illumination angles for performing an optical inspection. The adaptive lighting device can avoid the separation situation of the flaw and the ghost image of flaw in the inspection image, to achieve the technical effect of raising a correctness rate of the optical inspection effectively. 1. An adaptive lighting device for optical inspection , comprising:a first holder, used to place a testing object;a second holder, disposed on the same side of the testing object;an image capturing device, set on the second holder and aimed at the testing object; and a main body, having a central hole and fixed on the image capturing device;', 'at least one movable part, disposed on the main body respectively, and the at least one movable part being horizontally movable with respect to the main body; and', 'at least one lighting module, pivoted on the at least one movable part respectively, and the at least one lighting module free rotated with respect to the at least one movable part., 'a lighting device, assembled with the image capturing device, and further comprising2. The adaptive lighting device as defined in claim 1 , wherein the at least one movable part is disposed on slide set of the main body respectively claim 1 , to be moved with respect to the main body.3. The adaptive lighting device as defined in claim 1 , wherein the at least one lighting module comprises multiple light-emitting diodes (LEDs) claim 1 , to light the testing object.4. The adaptive lighting device as defined in claim 1 , wherein an angle graduation is marked on the at least one movable part claim 1 , to provide a rotation angle reference to the at least one lighting module.5. The adaptive lighting device as defined in claim ...

CYLINDRICAL BODY SURFACE INSPECTION DEVICE AND CYLINDRICAL BODY SURFACE INSPECTION METHOD

A cylindrical-body surface inspection device includes: a light irradiation unit configured to irradiate the cylindrical body with light; a two-dimensional imaging unit; a scanning-position determination unit configured to determine at a predetermined period, with respect to two-dimensional image data acquired by the two-dimensional imaging unit, a scanning position that is corresponding to a circumferential direction of the cylindrical body; a time-series scanning image generator configured to perform extraction of image data in a second direction perpendicular to the first direction at the scanning position determined by the scanning-position determination unit on a plurality of pieces of the two-dimensional image data acquired by the two-dimensional imaging unit, and generate a time-series scanning image by arranging in chronological order in the first direction each piece of extracted image data of the second direction; and an inspection unit configured to inspect the time-series scanning image to detect a defect. 1. A cylindrical-body surface inspection device for inspecting at an inspection position a surface of a cylindrical body relatively moving in one direction , the cylindrical-body surface inspection device comprising:a light irradiation unit configured to irradiate the cylindrical body with light;a two-dimensional imaging unit arranged at a position to receive reflected light from the surface of the cylindrical body on which light emitted from the light irradiation unit is reflected;a scanning-position determination unit configured to determine at a predetermined period, with respect to two-dimensional image data acquired by the two-dimensional imaging unit, a scanning position that is a scanning position in a first direction of the two-dimensional image data and is corresponding to a circumferential direction of the cylindrical body; perform extraction of image data in a second direction perpendicular to the first direction at the scanning position ...

Device for Inspecting Printed Images

An apparatus for inspecting images is disclosed. In an embodiment an apparatus includes a camera for recording a surface of a printed product, the printed product being movable relative to the apparatus, a first illumination unit of a first type for illuminating a first partial region of a region that is capturable by the camera, a second illumination unit of a second type for illuminating a second partial region of the region that is capturable by the camera, and an evaluation unit for processing image information captured by the camera, wherein the first illumination unit differs from the second illumination unit, and wherein the first illumination unit forms a diffuse illumination source and has an internally illuminated tunnel. 111-. (canceled)12. An apparatus for inspecting printed images comprising:a camera for recording a surface of a printed product, the printed product being movable relative to the apparatus;a first illumination unit of a first type for illuminating a first partial region of a region that is capturable by the camera;a second illumination unit of a second type for illuminating a second partial region of the region that is capturable by the camera; andan evaluation unit for processing image information captured by the camera,wherein the first illumination unit differs from the second illumination unit, andwherein the first illumination unit forms a diffuse illumination source and has an internally illuminated tunnel.13. The apparatus as claimed in claim 12 , wherein the second illumination unit is arranged to illuminate the printed product on a side that faces away from the camera.14. The apparatus as claimed in claim 12 , wherein the second illumination unit is arranged outside the tunnel for illuminating a partial region of the region that is capturable by the camera outside the tunnel.15. The apparatus as claimed in claim 12 , wherein the second illumination unit forms a directional light source.16. The apparatus as claimed in claim 15 , ...

Container inspection device and container inspection method for inspecting containers

A container inspection device and a container inspection method for inspecting containers are provided. The container inspection device comprises at least one light fixture for illuminating containers at a predetermined inspection instant of time for inspecting the containers, and an electrical line for connecting the at least one light fixture to an electrical energy supply and to a bus system, so that the electrical line serves both to supply the at least one light fixture with electrical energy and to connect with a real time data network.

INSPECTION METHOD OF A PHOTOMASK AND AN INSPECTION SYSTEM

In accordance with some embodiments of the present disclosure, an inspection method of a photomask includes performing a first inspection process, unloading the photomask from the inspection system, and performing a second inspection process. In the first inspection process, a common Z calibration map of an objective lens of an optical module with respect to the photomask is generated and stored, and a first image of the photomask is captured by using an image sensor while focusing the objective lens of the optical module based on the common Z calibration map. The photomask is unloaded from the inspection system. In the second inspection process, the photomask is loaded on the inspection system and a second image of the photomask is captured by using an image sensor while focusing an objective lens of an optical module based on the common Z calibration map generated in the first inspection process. 1. An inspection method of a photomask , comprising: loading the photomask on a stage of an inspection system of the first inspection process;', 'generating and storing a common Z calibration map of an objective lens of an optical module of the inspection system of the first inspection process with respect to the photomask; and', 'capturing a first image of the photomask by using an image sensor of the inspection system of the first inspection process while an illuminated light emitted from a light source of the inspection system of the first inspection process scans the photomask by focusing the objective lens of the optical module of the inspection system of the first inspection process based on the common Z calibration map;, 'performing a first inspection process, the first inspection process comprisingunloading the photomask from the stage of the inspection system; and loading the photomask on a stage of an inspection system of the second inspection process; and', 'capturing a second image of the photomask by using an image sensor of the inspection system of the ...

MACRO INSPECTION SYSTEMS, APPARATUS AND METHODS

The disclosed technology relates to an inspection apparatus that includes a stage configured to retain a specimen for inspection, an imaging device having a field of view encompassing at least a portion of the stage to view a specimen retained on the stage, and a plurality of lights disposed on a moveable platform. The inspection apparatus can further include a control module coupled to the imaging device, each of the lights and the moveable platform. The control module is configured to perform operations including: receiving image data from the imaging device, where the image data indicates an illumination landscape of light incident on the specimen; and automatically modifying, based on the image data, an elevation of the moveable platform or an intensity of one or more of the lights to adjust the illumination landscape. Methods and machine-readable media are also contemplated. 1. An inspection apparatus comprising:a stage configured to retain a specimen for inspection;an imaging device having a field of view encompassing at least a portion of the stage to view light reflected by a specimen retained on the stage;a plurality of lights disposed on a moveable platform; and generating a trained prediction model to generate an illumination profile for a specimen based on a training data set comprising a plurality of known specimens and associated features captured by the imaging device;', 'generating, via the trained prediction model, a plurality of desired illumination profiles for a plurality of reference specimens;', 'receiving image data from the imaging device, wherein the image data indicates one or more physical and mechanical properties of a target specimen;', 'selecting a first illumination profile based on the one or more physical and mechanical properties of the target specimen;', 'analyzing the image data to determine whether a target illumination profile of the target specimen is within a threshold value of the first illumination profile, and', ' ...

Lighting apparatus, method for providing lighting system, and road management system

A lighting apparatus that irradiates light on a vehicle is provided. The lighting apparatus includes: a first light source that emits light for illuminating a predetermined area; a memory that stores location information indicating a location of the lighting apparatus; a second light source that outputs, to the predetermined area, a light signal indicating the location information; and a first controller that controls the first light source and the second light source, and modulates the light signal output by the second light source, in accordance with the location information stored in the memory.

METHODS AND SYSTEMS FOR VISUAL INSPECTION

Systems for visually inspecting a surface of an object are provided, which includes a visual inspection head, and a positioning apparatus for controlling a position and/or an orientation of the visual inspection head with respect to the object. The visual inspection head includes a visual inspection module, and an angle controlling module for ensuring a predetermined angle of the visual inspection system with respect to an area to be inspected of the surface of the object. The angle controlling module may include a pointer for projecting a light beam onto the area to be inspected and a camera for determining whether the light beam is reflected substantially perpendicularly. The system is configured to move the visual inspection head relative to the object until the light beam is reflected substantially perpendicularly. Methods for visually inspecting a surface are also provided. 1. A system for visually inspecting a surface of an object comprisinga visual inspection head, and a module for controlling a position and/or an orientation of the visual inspection head with respect to the object,wherein the visual inspection head comprises a visual inspection module, and an angle controlling module for ensuring a predetermined angle of the visual inspection head with respect to an area to be inspected of the surface of the object,the visual inspection module comprising a light for projecting onto the surface and a sensor for determining a reflection of the light from the surface, andthe angle controlling module comprising a pointer for projecting a light beam onto the area to be inspected, a camera for determining whether the light beam is reflected from the area to be inspected substantially perpendicularly,wherein the system is configured to move the visual inspection head relative to the object until the light beam is reflected substantially perpendicularly from the area to be inspected.2. The system according to claim 1 , further comprising a receiving surface for ...

Overhead sidelight

The invention relates to a method for illuminating a wood fibre web for deviation detection. The method comprises turning on LEDs of an overhead sidelight that are side-directed towards a first edge of the web for illuminating a first half of width of the web, capturing an image of the first half, turning off the LEDs, turning on LEDs of the overhead sidelight that are side-directed towards a second edge of the web for illuminating a second half of width of the web, capturing an image of the second half, and turning off the LEDs. The invention also relates to an overhead sidelight, a machine vision system, and a lighting system.

METHOD AND SYSTEM FOR YARN QUALITY MONITORING

There is disclosed a method and an apparatus for monitoring textile yarn quality. Textile yarn is checked for quality to meet the required criteria such as diameter evenness and unwanted foreign fiber presence by utilizing an artificial diffuse light illuminating image sensor, with the yarn placed as an obstacle, into the pathway of the light, the contours of the light being focused for sharp image capture. The yarn diameter is determined by processing of focused yarn image. 1. An yarn quality monitoring device , comprising:a primary light source for emitting light, the light propagation defining an optical path;a diffuser proximate to the first light source for diffusing the emitted light;an image sensor illuminated by the diffused light emitted from the primary light source, for capturing a yarn contour image from illumination of a moving yarn in the optical path;a focusing element in the optical path between the first light source and the image sensor, for focusing the yarn contour image on the image sensor; anda controller in communication with the image sensor for processing the captured yarn contour image, to determine yarn diameter.2. The device of claim 1 , additionally comprising:a secondary light source for illuminating the yarn, the reflected light propagation defining an optical path;a diffraction element in the optical path, between the yarn and the image sensor, the diffraction of secondary light source light reflected from the yarn for interference pattern creation on the image sensor; andthe controller for processing the interference pattern to obtain yarn color analysis.3. The device of claim 2 , wherein the diffraction element is a diffraction grating.4. The device of claim 2 , wherein the primary light source and the secondary light source emit light at different wavelengths claim 2 , and the device further includes an optical filter at least partially covering the image sensor for blocking light reflected from the yarn illuminated by secondary ...

Optically determining the condition of goods

In one embodiment, an optical state monitor includes an a light source detection layer for detecting electromagnetic radiation from an associated good. The optical state monitor uses a processor to evaluate the detected radiation, and make a comparison to a pre-defined optical state profile for the good. By making this comparison, the optical state detector is able to determine a quality for the good. In a particular construction, the optical state detector has an integral light source, and the light detection layer is printed as s thin film device. In this way, a stand-alone self-contained sensor is constructed for determining the good's current quality.

WATER MEASUREMENT APPARATUS

A wafer measurement apparatus for measuring a bonding strength of a bonded wafer includes a wafer holder to hold a bonded wafer into which a blade is inserted and where a crack occurs, a lighting assembly including a light source, a light source controller to select the light source of the lighting assembly for detection of the crack reflected in the bonded wafer, on photographing conditions, a photographing assembly to photograph the bonded wafer by using the photographing conditions corresponding to a wavelength of the light source, on sensitivity of the wavelength of the light source, and a calculator to select one photographing condition, transmit the selected photographing condition, and calculate bonding strength, on a crack distance from a blade edge, extracted from an image of the bonded wafer, to a crack edge. 1. A wafer measurement apparatus , comprising:a wafer holder to hold a bonded wafer into which a blade is inserted and where a crack occurs;a lighting assembly comprising a light source having at least two wavelengths;a light source controller to select the light source of the lighting assembly used for detection of the crack reflected in the bonded wafer, based on photographing conditions;a photographing assembly to photograph the bonded wafer by using the photographing conditions corresponding to a wavelength of the light source, based on sensitivity of the wavelength of the light source; anda calculator to select one photographing condition from among the photographing conditions, transmit the selected photographing condition, and calculate bonding strength, based on a crack distance from a blade edge, extracted from an image of the bonded wafer, to a crack edge.2. The wafer measurement apparatus as claimed in claim 1 , wherein the photographing assembly is to calculate an indicator value corresponding to the photographing conditions in the image of the bonded wafer claim 1 , and the one photographing condition is a photographing condition ...

Apparatus and A Method For Inspecting A Light Transmissible Optical Component

The invention provides an apparatus for inspecting a light transmissible optical component. The apparatus comprises an image capturing module arranged on a first side of a support configured to hold a light transmissible optical component whilst it is being inspected. The apparatus includes an illumination device configured to shape light from a light source and to illuminate a selected portion of a surface of said light transmissible optical component with said shaped light to enable the image capturing module to capture any of a bright field image, a dark field image, or a combined bright field and dark field image of the light transmissible optical component being held by the support. 1. An apparatus for inspecting a light transmissible optical component , comprising:an image capturing module arranged on a first side of a support configured to hold a light transmissible optical component whilst it is being inspected; andan illumination device configured to shape light from a light source and to illuminate a selected portion of a surface of said light transmissible optical component with said shaped light to enable the image capturing module to capture any of a bright field image, a dark field image, or a combined bright field and dark field image of the light transmissible optical component being held by the support.2. The apparatus of claim 1 , wherein the illumination device is further configured to focus said shaped light on said selected portion of the surface of said light transmissible optical component to thereby illuminate said selected portion of the surface of said light transmissible optical component.3. The apparatus of claim 1 , wherein the illumination device is controlled to successively vary a dimension of the shaped light to illuminate said selected portion of the surface of said light transmissible optical component at different incident angles to enable the image capturing module to successively capture any of a bright field image claim 1 , a ...

Illumination Energy Management in Surface Inspection

The disclosure is directed to a system and method of managing illumination energy applied to illuminated portions of a scanned wafer to mitigate illumination-induced damage without unnecessarily compromising SNR of an inspection system. The wafer may be rotated at a selected spin frequency for scanning wafer defects utilizing the inspection system. Illumination energy may be varied over at least one scanned region of the wafer as a function of radial distance of an illuminated portion from the center of the wafer and the selected spin frequency of the wafer. Illumination energy may be further applied constantly over one or more scanned regions of the wafer beyond a selected distance from the center of the wafer.

Method of fabricating a photomask and method of inspecting a photomask

In accordance with some embodiments of the present disclosure, an inspection method of a photomask includes performing a first inspection process, unloading the photomask from the inspection system, and performing a second inspection process. In the first inspection process, a common Z calibration map of an objective lens of an optical module with respect to the photomask is generated and stored, and a first image of the photomask is captured by using an image sensor while focusing the objective lens of the optical module based on the common Z calibration map. The photomask is unloaded from the inspection system. In the second inspection process, the photomask is loaded on the inspection system and a second image of the photomask is captured by using an image sensor while focusing an objective lens of an optical module based on the common Z calibration map generated in the first inspection process.

MACRO INSPECTION SYSTEMS, APPARATUS AND METHODS

The disclosed technology relates to an inspection apparatus that includes a stage configured to retain a specimen for inspection, an imaging device having a field of view encompassing at least a portion of the stage to view a specimen retained on the stage, and a plurality of lights disposed on a moveable platform. The inspection apparatus can further include a control module coupled to the imaging device, each of the lights and the moveable platform. The control module is configured to perform operations including: receiving image data from the imaging device, where the image data indicates an illumination landscape of light incident on the speciment; and automatically modifying, based on the image data, an elevation of the moveable platform or an intensity of one or more of the lights to adjust the illumination landscape. Methods and machine-readable media are also contemplated. 1. An inspection apparatus comprising:a stage configured to retain a specimen for inspection;an imaging device having a field of view encompassing at least a portion of the stage to view light reflected by a specimen retained on the stage;a plurality of lights disposed on a moveable platform; and receiving image data from the imaging device, wherein the image data indicates an illumination landscape of light incident on the specimen; and', 'automatically modifying an elevation of the moveable platform or an intensity of one or more of the plurality of lights to adjust the illumination landscape, based on the image data., 'a control module coupled to the imaging device, each of the lights and the moveable platform, wherein the control module is configured to perform operations comprising2. The inspection apparatus of claim 1 , wherein the control module is further configured to perform operations comprising:automatically adjusting a color of one or more of the plurality of lights to improve the illumination landscape, based on the image data.3. The inspection apparatus of claim 1 , wherein ...

DEVICE AND METHOD FOR CHECKING FOR SURFACE DEFECT, USING IMAGE SENSOR

Proposed are a device and method for checking for a surface defect, using an image sensor. The device can increase accuracy in detecting defects of various types, shapes, or directions, and include: a frame part for providing a transport path of an object to be checked, along the lengthwise direction parallel to the ground surface; a transport part provided on one side of the frame part so as to transport the object to be checked, along the transport path; and an image sensor part provided in the middle of the transport path so as to capture an image of the surface of the object to be checked, from above the transported object to be checked.

LIGHTING DEVICE FOR INSPECTION AND LIGHTING METHOD FOR INSPECTION

In order to make it possible for a difference between a defect and a normal part, such as contrast, to appear, a lighting device for inspection is provided with: a surface light source that emits inspection light; a lens that is provided on a light axis of the inspection light emitted from the surface light source, and between an inspection object and the surface light source; and a first diaphragm that is provided between the lens and the surface light source or the inspection object, wherein: the surface light source and the lens are set such that an image plane on which the surface light source is imaged is present near the inspection object; and the first diaphragm is set such that the central axis of an irradiation solid angle determined by a part of the inspection light is parallel to the light axis. 1. A lighting device for inspection , comprising:a surface light source that emits inspection light;a lens that is provided on a light axis of the inspection light emitted from the surface light source, and between an inspection object and the surface light source; anda first diaphragm that is provided between the surface light source and the lens, or between the lens and the inspection object, wherein:positions of the surface light source and the lens with respect to the inspection object are set such that an image plane on which the surface light source is imaged is present near the inspection object; anda position of the first diaphragm with respect to the lens is set such that a central axis of an irradiation solid angle determined by the inspection light, which is incident on an outer edge part of the image plane, is parallel to the light axis, or is displaced from the light axis and tilted by a predetermined amount.2. The lighting device for inspection according to claim 1 , whereinthe first diaphragm is arranged outside a focal point of the lens such that the central axis of the irradiation solid angle is tilted from an outer edge side toward a center side ...

EXTERIOR INSPECTION DEVICE

Provided is an exterior inspection device capable of performing inspections with an optimum white balance at all times. This exterior inspection device A is equipped with a camera an inspection reference plane and a light source the exterior inspection device further comprising: a calibration reference plate an advance/retraction mechanism for advancing and retracting the calibration reference plate between a calibration position within an image-taking area of the camera and a retracted position retracted therefrom; and a control unit for issuing a white balance adjustment command to the camera when the calibration reference plate is at the calibration position. On an occasion of a non-inspection state in which no exterior inspection is being executed, the control unit issues to the advance/retraction mechanism a drive command for moving the calibration reference plate to the calibration position, an adjustment command for adjusting light quantity of the light source and a white balance adjustment command. Therefore, the white balance adjustment can be fulfilled automatically without involving human work.

Visual inspection device and illumination condition setting method of visual inspection device

A visual inspection device and a method for setting illumination condition thereof are provided to include an illumination part irradiating illumination lights to an inspection object; an imaging part capturing an image of the inspection object; a defect detecting part analyzing the image of the inspection object captured by the imaging part and detecting a defect of the inspection object; an illumination condition setting part setting an illumination condition of the illumination lights irradiated to the inspection object; and an optimum illumination condition deriving part deriving an optimum illumination condition by scoring each of the illumination conditions based on the images captured under plural and different illumination conditions, where the optimum illumination condition is the most suitable illumination condition for detecting the defect of the inspection object by the defect detecting part.

Apparatus, method and computer program product for defect detection in work pieces

An apparatus, a method and a computer program product for defect detection in work pieces is disclosed. At least one light source is provided and the light source generates an illumination light of a wavelength range at which the work piece is transparent. A camera images the light from at least one face of the work piece on a detector of the camera by means of a lens. A stage is used for moving the work piece and for imaging the at least one face of the semiconductor device completely with the camera. The computer program product is disposed on a non-transitory, computer readable medium for defect detection in work pieces. A computer is used to execute the various process steps and to control the various means of the apparatus.

OPTICALLY DETERMINING THE CONDITION OF GOODS

In one embodiment, an optical state monitor includes an a light source detection layer for detecting electromagnetic radiation from an associated good. The optical state monitor uses a processor to evaluate the detected radiation, and make a comparison to a pre-defined optical state profile for the good. By making this comparison, the optical state detector is able to determine a quality for the good. In a particular construction, the optical state detector has an integral light source, and the light detection layer is printed as a thin film device. In this way, a stand-alone self-contained sensor is constructed for determining the good's current quality. 152-. (canceled)53. A system for determining the condition of a good comprising:an external system configured to communicate condition information with an optical state monitor, the optical state monitor comprising:a light detection layer for detecting electromagnetic radiation from the good and for generating electronic signals indicative of the detected electromagnetic radiation;a memory constructed to store an optical state profile regarding the good;a processor for evaluating the generated electronic signals using an optical state profile;a power source; anda wired or wireless interface.54. The system according to claim 53 , wherein the communicated condition information includes information sent by the external system to the optical state monitor to enable the optical state monitor to perform an action using the communicated information.55. The system of claim 54 , wherein the communicated condition information includes the optical state profile claim 54 , an optical measurement protocol claim 54 , a conditional utility profile or an activation signal.56. The system of claim 55 , wherein the optical measurement protocol comprises rules claim 55 , logic claim 55 , algorithms claim 55 , parameters claim 55 , tables claim 55 , data claim 55 , permissions claim 55 , or variables.57. The system of claim 54 , ...

Multi-Stop Illuminator for Video Inspection System with Stepped Aperture Settings

An optical inspection system for capturing images of backlit test objects on a detector at two or more aperture settings includes a telecentric imaging system having a first setting associated with a first size aperture stop and a second setting associated with a second larger size aperture stop. An illumination system includes a substage illuminator incorporating (a) a first set of one or more light sources surrounded by a first barrier that defines a first size aperture stop of the illumination system and (b) a second set of one or more light sources located beyond the first barrier and surrounded by a second barrier that defines a second larger size aperture stop of the illumination system. The first size aperture stop of the illumination system images to the first size aperture stop of the telecentric imaging system at the first setting and the second larger size aperture stop of the illumination system images to the second larger size aperture stop of the telecentric imaging system at the second setting.

SYSTEM AND METHOD FOR OPTICAL INSPECTION OF AN OBJECT

The present disclosure generally relates to a system for optical inspection of an object, specifically comprising an illumination assembly operated to provide homogeneous illumination of the object, thereby improving the overall accuracy of the optical inspection. The optical vision system also comprises an image sensor configured to capture an image of the object and a control unit in electrical communication with and configured to operate the image sensor and the illumination assembly, wherein the control unit is configured to automatically control the illumination assembly to illuminate the object with a predetermined illumination pattern based on a selected object type. The present disclosure also relates to a corresponding method and to a computer program product. 1. An optical vision system for automated inspection of an object , the system comprising:an image sensor configured to capture an image of the object;a controllable illumination assembly configured to illuminate the object, the illumination assembly comprising a plurality of individually controllable light sources positioned to surround the image sensor, and control the illumination assembly to illuminate the object with a predetermined illumination pattern based on a selected object type;', 'acquire a first image of the object using the image sensor;', 'determine an illumination quality metric based on the first image;', 'determine, if the determination of the illumination quality metric indicates that the illumination quality metric is below a predetermined threshold, an adapted illumination pattern based on the illumination quality metric, and', 'control the illumination assembly to illuminate the object with the adapted illumination pattern., 'a control unit in electrical communication with and configured to operate the image sensor and the illumination assembly, wherein the control unit is configured to automatically2. The optical vision system according to claim 1 , wherein determining the ...

Method and System for Detecting Abnormalities in Coated Substrates

Provided is a system for detecting abnormalities in underlying surface of a coated substrate that includes a housing blocking external sources of light from impinging on the coated substrate; an array of light sources, matched in bandwidth to the transmission spectrum of the coating, arranged to direct light upon the coated substrate; an optical imaging system matched to the wavelength range of the light source array and positioned to collect reflected and scattered light from the substrate and generate an image of the structural features including any abnormalities in the substrate; and an onboard embedded system, providing real-time image processing to correct spatial and temporal variations in the light source array intensity and optical imaging system sensitivity. The optical imaging system includes a focal plane array matched in bandwidth to the transmission spectrum of the coating, and a flat optical window configured to reduce the optical Narcissus effect. 120-. (canceled)21. A system for detecting abnormalities in the underlying surface of a coated substrate , comprising:an optical imaging system;a housing shaped to block external sources of light;a light source array; andan onboard embedded system providing real-time processing.2220. The system of claim , wherein a spectral bandwidth of the optical imaging system is matched to a transmission spectrum of the coating and the optical imaging system is configured to focus on a surface plane of the coated substrate.2320. The system of claim , where the housing is shaped to block external sources of light from impinging on a section of coated substrate under inspection , within a field of view of the optical imaging system.2420. The system of claim , where a spectral bandwidth of the light source array is matched to a transmission spectrum of the coating , arranged about an interior of the housing to direct light upon the coated substrate within a field of view of the optical imaging system.25. The system of ...

Method and System for Detecting Abnormalities in Coated Substrates

Provided is a detection system for detecting abnormalities in a coated substrate having a coating and a substrate, and including a detection device that includes a housing configured to block external sources of light from impinging on the coated substrate, a light source array including a plurality of light sources and configured to be arranged to direct light upon the coated substrate, an optical imaging system configured to capture a video data stream and still images of the coating and an underlying surface of the substrate including structure features comprising any abnormalities in the coated substrate, an on-board embedded system to control the light source array and the optical imaging system and perform real-time processing to correct spatial and temporal variations in intensity of the plurality of light sources of the light source array, and spatial and temporal variations in sensitivity and optical Narcissus effect of the optical imaging system. 1. A detection system for detecting abnormalities in a coated substrate including a coating and a substrate , the detection system including a detection device comprising:a housing configured to block external sources of light from impinging on the coated substrate and comprising:a light source array including a plurality of light sources and configured to be arranged to direct light upon the coated substrate;an optical imaging system configured to capture a video data stream and still images of the coating and an underlying surface of the substrate including structure features comprising any abnormalities in the coated substrate; (i) execute a detection software module locally assessible,', '(ii) control the light source array and the optical imaging system,', '(iii) perform real-time processing to correct spatial and temporal variations in intensity of the plurality of light sources of the light source array, and spatial and temporal variations in sensitivity and optical Narcissus effect of the optical imaging ...

APPARATUS AND METHOD FOR INSPECTION OF A FILM ON A SUBSTRATE

Methods of and apparatus for inspecting composite layers of a first material formed on a second material are provided including providing an illumination source, illuminating at least a portion of the composite at the layer, receiving light reflected from the sample, determining a spectral response from the received light, and comparing the received spectral response to an expected spectral response. 1. A method of inspecting a composite of a layer of a first material formed on a second material that is different from the first material , comprising:providing an illumination source that outputs light encompassing a wavelength range over which an expected spectral response occurs when light of said wavelength range reflects from the composite, where the composite has a said first material layer at a thickness expected in absence of a predetermined defect;illuminating at least a portion of the composite at the first material layer with light from the selected illumination source;receiving the light output from the illumination source that has reflected from the composite;determining a spectral response from the received light; andcomparing the received spectral response to the expected spectral response.2. The method of claim 1 , comprising the step of determining the expected spectral response.3. The method of claim 2 , wherein the step of determining the expected spectral response comprises receiving information identifying the expected spectral response.4. The method of claim 2 , wherein the step of determining the expected spectral response comprises receiving information identifying the second material and identifying an expected thickness of the layer on the second material in absence of the predetermined defect.5. The method of claim 4 , wherein the layer is an oxide layer and wherein the step of receiving information identifying the expected thickness comprises determining a method by which the oxide layer is formed on the second material.6. The method of ...

Multimodality multiplexed illumination for optical inspection systems

一种零件缺陷检测方法及装置

本发明涉及一种零件缺陷检测方法及装置，包括步骤：获取第一偏振图像和第二偏振图像；对第一偏振图像和第二偏振图像分别进行导向滤波处理；以滤波处理后的第一偏振图像或者第二偏振图像中的任意一个子图像作为目标子图像，利用滤波核判断目标子图像是否存在缺陷区域；将目标子图像分别遍历滤波处理后的第一偏振图像和第二偏振图像的全部子图像，得到第一偏振图像对应的第一二值图像和第二偏振图像对应的第二二值图像；将第一二值图像和第二二值图像融合为一张检测结果二值图像。本发明解决了现有的零件缺陷检测方法或系统由于光照问题造成零件缺陷成像对比度不高而造成的漏检的问题，有效提高尤其是微小零件缺陷检测的成功率和准确度。

水果或蔬菜的光学分析方法和装置以及自动分拣装置

本发明涉及一种用于对水果或蔬菜进行光学分析的光学分析方法和光学分析装置。不同光源(7a，7b)适用于根据预确定照明序列在不同波长范围中将光辐射施加到每个物体上，所述图像由至少一个彩色摄像机(4)实施，所述至少一个彩色摄像机对红外线灵敏，并且所述至少一个彩色摄像机的曝光与所述照明序列同步地控制，以便在不同波长范围中实施多个图像，所述多个图像中的至少一个图像在可见光范围中并且至少一个图像在红外线范围中。

Optical inspection apparatus for tilted lighting

The present invention relates to an optical inspection apparatus for tilted irradiation, and more specifically, is designed to allow an illumination light to enter a camera when photographing through a guide main body where the camera is connected and an illumination unit provided at the guide main body and irradiating the illumination light. In particular, the illumination unit is configured to slide so as to solve a problem that a light amount of the incident light is reduced when an irradiation surface, which is the surface to be photographed, is a curved surface, and therefore it is possible to clearly photograph the irradiation surface having a variety of inclined surfaces.

A detection machine for sheet article

本发明涉及片材物件检测技术领域，尤其公开了一种用于片材物件的检测机，包括机架，设置于机架的承载板及相机单元，与相机单元配合使用的控制单元及显示单元；还包括设置于机架的多个光源单元，多个光源单元围绕片材物件设置；光源单元包括支架、转动设置于支架的灯壳、设置于灯壳并用于照射片材物件的发光条；支架设有弧形孔，灯壳具有转动容设在弧形孔内的导向柱；弧形孔彼此远离的两端的内端面分别挡止抵触导向柱；借助灯壳相对支架的转动，调整改变发光条相对片材物件的夹角大小，使得发光条准确照射至片材物件上，使得相机单元拍摄出清晰的图像；借助弧形孔与导向柱的配合，避免灯壳过度转动而使用不良，提升片材物件的检测良率。

Exploded perspective vision testing machine and its detection method

本发明揭示了零件立体视觉检测机及其检测方法，包括转盘，用于承接待检测件并带动待检测件转动；六个拍摄工位，用于采集待检测件的六面图像；控制系统，至少用于根据每个拍摄工位采集的图像判断待检测件是合格件或不合格件；当所述待检测件被判定为不合格件时，其后续运动轨迹所形成的圆环与其初始运动轨迹所形成的圆环在与所述转盘平行的同一平面上的投影同心且不重合。本发明由于采用光学透明材质的转盘，不需要额外增加输送结构使待检测件悬空，避免待检测件上下移动可能出现的损伤，且不需要复杂的输送结构，结构大为简化，并且通过错位装置及下料机构实现分区下料。

Method and device for contactless optical measurement of quality determining parameters of textile surfaces

A multifunctional method for optical determination of numerous quality-determining parameters of textile surfaces with the aid of an identical arrangement of an imaging sensor and an especially designed illumination device is described. The illumination device consists of a multiplicity of point-like light elements, especially semiconductor light-emitting diodes, which are fixed on a spatially curved arrangement which is divided into regions, in such a way that the textile surface is illuminated from different directions and/or in different regions. For the quality characteristic to be measured in each case, the corresponding optimum lighting configuration is electronically determined and this characteristic is determined from the stored images using image-processing methods which are likewise matched.

Illuminating and optical apparatus for inspecting the welding state of printed circuit board

개시된 조명 및 광학 장치는 표면 실장장치에서 기판의 표면에 납땜된 각종 전자 부품들의 장착 및 납땜 상태를 자동으로 검사할 수 있도록 균일하게 조명하고 검사할 전자 부품의 크기에 따라 적절한 시야로 촬영하는 것이다. The disclosed illumination and optics devices are uniformly illuminated and photographed with an appropriate field of view according to the size of the electronic component to be inspected so that the surface mounter can automatically inspect the mounting and soldering status of the various electronic components soldered to the surface of the substrate. 상면이 수평면을 이루고 측면에 경사면을 이루는 고정부재의 상면에 서로 다른 직경 및 동일한 높이를 가지고 복수의 램프가 복수의 링 형상으로 배열된 제 1 조명수단을 설치하여 검사대상 부품을 조명함과 아울러 고정부재의 경사면에 설치되어 서로 다른 직경 및 상이한 높이를 가지고 복수의 램프가 복수의 링 형상으로 배열된 제 2 조명수단을 설치하여 제 1 조명 수단에 의하여 얻어지는 영상에 대하여 음영이 반전된 영상을 얻을 수 있도록 검사대상 부품을 조명하고, 조절수단으로 제 1 및 제 2 조명 수단의 밝기와 전원 단속을 단속하며, 고정부재의 상부에는 광학수단이 설치되어 조절수단에 의해 제 1 및 제 2 조명수단이 선택적으로 조명하는 검사 대상 부품을 대시야 및 소시야로 촬영한다. On the upper surface of the fixing member whose upper surface forms a horizontal plane and an inclined surface on the side, a first lighting means having a plurality of diameters and the same height and having a plurality of lamps arranged in a plurality of ring shapes is installed to illuminate and inspect the component to be inspected. The second lighting means having a different diameter and different height and installed on the inclined surface of the member and having a plurality of lamps arranged in a plurality of ring shapes can be installed to obtain an image in which the shade is inverted with respect to the image obtained by the first lighting means. Illuminate the component to be inspected, and control the brightness and the power interruption of the first and second lighting means with the adjusting means, and optical means are installed on the upper part of the fixing member so that the first and second lighting means are selectively selected by the adjusting means. The part to be inspected illuminated by light is taken with dash and soya.

Nanoprotrusion structure inspection device and nanoprotrusion structure inspection method

Multi-light-source compensation spring defect detection system and detection method

本发明公开了一种多光源补偿弹簧缺陷检测系统及检测方法，其中，所述多光源补偿弹簧缺陷检测系统包括架体、设置于所述架体的转动支撑组件、照明组件和影像设备，所述转动支撑组件彼此平行设置的第一转动辊和第二转动辊，待检测弹簧能够支撑在第一转动辊和第二转动辊之间，所述影像设备位于所述第一转动辊和第二转动辊之间的正上方，所述照明组件包括位于所述影像设备的左侧的从上至下布置的第一光源板、第二光源板和第三光源板以及位于所述影像设备的右侧的从下至上布置的第四光源板、第五光源板和第六光源板。该多光源补偿弹簧缺陷检测系统旨在解决现有技术中触发式弹簧检测设备检测困难、检测效率低的技术问题。

Surface defect acquisition system, surface defect detection method, surface defect detection device and storage medium

本发明公开了表面缺陷采集系统、表面缺陷检测方法、装置及存储介质，用以解决现有技术中存在的不能快速、准确的对高反光产品的表面缺陷进行检测的技术问题。包括：支撑装置、以及分别设置在支撑装置第一侧上方和第二侧上方的可编程光源和图像采集装置，可编程光源用于输出多组明暗条纹相间的面光源；图像采集装置用于同时从不同角度对待检测面进行图像数据采集；控制装置用于控制支撑装置水平移动或绕指定轴转动，使待检测面与水平面平行，并控制可编程光源或支撑装置沿预设方向移动，使多组明暗条纹按设定距离沿预设方向在待检测面移动指定次数，每移动一次控制图像采集装置采集一次待检测面的图像数据，预设方向为明暗条纹交替出现的任一方向。

Top pattern inspection device of light guide plate

본 발명은 본 발명은 상면과 하면에 패턴이 형성되고 상기 상면과 하면 사이에는 투명한 재질이 막을 이루고 있는 도광판과, 상기 도광판의 상면과 직각을 이루는 가상의 수직면의 일측에 설치되는 조명장치와, 상기 수직면의 타측에 상기 조명장치와 대응되도록 구비되는 영상획득부가 구비되며, 상기 조명장치에서 상기 도광판에 조사되는 광은 광원으로부터 멀어질수록 발산하도록 조사되고, 상기 조명장치에서 조사되는 광이 상기 도광판에서 변형되어 상기 영상획득부에 입사되며, 상기 영상획득부에서 획득되는 영상은 도광판의 상면에서 반사되는 광만을 획득하는 것을 특징으로 하는 도광판의 상면 패턴 검사 장치가 제공된다. The present invention is a light guide plate is formed on the upper surface and the lower surface and a transparent material between the upper surface and the lower surface and the lighting device is installed on one side of the virtual vertical surface perpendicular to the upper surface of the light guide plate and the The image acquisition unit is provided on the other side of the vertical surface to correspond to the lighting device, the light irradiated to the light guide plate in the illumination device is irradiated so as to move away from the light source, the light irradiated from the lighting device in the light guide plate The upper surface pattern inspection apparatus of the light guide plate is deformed and incident on the image acquisition unit, and the image acquired by the image acquisition unit acquires only the light reflected from the upper surface of the light guide plate.

It is a kind of can automatic light distribution product image detection method and comparison device

本发明公开了一种可自动配光的产品图像检测方法及比对装置，所述方法包括：采集待测工件的特征信息，所述特征信息包括特征点和轮廓信息；根据所述特征信息，确定待测工件的位置信息，所述位置信息包括待测工件的放置角度和中心坐标信息；获取与所述特征信息对应的机械手的预置工位以及配光方案，根据所述位置信息和预置工位确定机械手的实际工位，所述配光方案包括配光子系统的光源照射距离和角度；至少在所述实际工位采用对应的配光方案采集待测工件的实际图像；将所述实际图像与标准工件的对应标准图像进行比对，生成比对结果。所述装置使用了所述方法。本发明可保证实际图像的获取效率、及图像明亮度和清晰度。

Tunnel lining disease comprehensive detection vehicle

本发明公开了一种隧道衬砌病害综合检测车，包括:里程定位系统，设置于车体的前端，用于判定检测车行进位移和姿态，并生成基于空间位移的触发信号，发送；还用于测定里程数值，并同步传输。表观检测系统，用于检测隧道表面病害；并在接收到里程定位系统发送的触发信号和里程数值时，启动检测隧道一位置的表面病害。雷达探测系统，用于检测隧道的深层病害；并在接收到里程定位系统发送的触发信号和里程数值时，与表观检测系统同步启动，检测隧道同一位置的深层病害。该综合检测车具有自动化程度高、安全、高效、多参数综合检测的功能。

Light and method for operating a light

The invention relates to a light, in particular for testing workpiece surfaces using a fluorescent marking means, which light has at least two lighting means (2, 3) which emit electromagnetic radiation with different wavelength ranges. According to the invention, the light is characterized in that the intensity with which the lighting means (2, 3) irradiates can be adjusted separately for at least one of the lighting means (2, 3). Expediently, the light (1) is configured to increase or reduce the intensity of at least one of the lighting means (2, 3) and at the same time to keep the intensity of at least one other of the lighting means (2, 3) constant, or to reduce it or increase it in the opposite way to the first-mentioned lighting means. In a refinement of the invention, the light (1) is configured to adjust the intensity at such a speed that the human eye can adapt to a change in the intensity during the adjustment without adverse effects on the person's sight.

Photographing device for checking goods

본 발명은 물품을 검사하는 데 사용되는 촬영기에 관한 것이다. 본 발명에 따른 촬영기는, 검사해야 할 검사대상물의 일면에 수직한 방향에 위치한 상태에서 상기 검사대상물의 일면에 있는 검사부분을 촬영하는 카메라; 상기 카메라에 결합되어서 상기 카메라와 함께 이동할 수 있으며, 상기 일면에 수직한 조사각도로 빛을 조사하는 수직 조명; 및 상기 카메라에 결합되어서 상기 카메라와 함께 이동할 수 있으며, 상기 일면에 대하여 상기 일면과 0도보다는 크고 90도보다는 작은 각의 범위 내의 조사각도로 빛을 조사하는 적어도 하나 이상의 경사 조명; 을 포함한다. 본 발명에 따르면, 검사부분에 조사각도를 달리하여 빛을 조사할 수 있기 때문에 물품에 대한 검사가 정확히 이루어질 수 있다.

Nondestructive testing device and method for porous ceramic-based radome

本发明公开了一种多孔陶瓷基天线罩无损检测装置及检测方法，该装置包括：基座、旋转检测系统和光源系统；所述旋转检测系统和光源系统设置于基座上；所述旋转检测系统包括：转台、设置在转台上并能够随转台转动的过渡台组合、设置在转台上的升降台组合、设置在升降台组合上的相机运动控制机构，及与相机运动控制机构相连的检测相机组合；所述相机运动控制机构和检测相机组合在天线罩检测时封闭在待检测天线罩内。本发明利用多孔陶瓷微透光的特性对多孔陶瓷天线罩的裂纹、气孔和划痕等缺陷进行无损检测，检测能力强、效率高，可以满足厚壁多孔陶瓷基天线罩的无损检测，同时检测过程简单，检测结果稳定。

Patent RU2018123561A3

ВУ” 2018123561” АЗ Дата публикации: 28.12.2021 Форма № 18 ИЗПМ-2011 Федеральная служба по интеллектуальной собственности Федеральное государственное бюджетное учреждение ж 5 «Федеральный институт промышленной собственности» (ФИПС) ОТЧЕТ О ПОИСКЕ 1. . ИДЕНТИФИКАЦИЯ ЗАЯВКИ Регистрационный номер Дата подачи 2018123561/28(037319) 28.06.2018 Приоритет установлен по дате: [ ] подачи заявки [ ] поступления дополнительных материалов от к ранее поданной заявке № [ ] приоритета по первоначальной заявке № из которой данная заявка выделена [ ] подачи первоначальной заявки № из которой данная заявка выделена [ ] подачи ранее поданной заявки № [Х] подачи первой(ых) заявки(ок) в государстве-участнике Парижской конвенции (31) Номер первой(ых) заявки(ок) (32) Дата подачи первой(ых) заявки(ок) (33) Код страны 1. 15/678,670 16.08.2017 05 Название изобретения (полезной модели): [Х] - как заявлено; [ ] - уточненное (см. Примечания) АВТОМАТИЗИРОВАННЫЙ КОНТРОЛЬ ДЛЯ ВЫЯВЛЕНИЯ ИНОРОДНЫХ МАТЕРИАЛОВ, ТРЕЩИН И ИНЫХ АНОМАЛИИ ПОВЕРХНОСТИ Заявитель: ЗЕ БОИНГ КОМПАНИ, 05 2. ЕДИНСТВО ИЗОБРЕТЕНИЯ [Х] соблюдено [ ] не соблюдено. Пояснения: см. Примечания 3. ФОРМУЛА ИЗОБРЕТЕНИЯ: [Х] приняты во внимание все пункты (см. Примечания) [ ] приняты во внимание следующие пункты: [ ] принята во внимание измененная формула изобретения (см. Примечания) 4. КЛАССИФИКАЦИЯ ОБЪЕКТА ИЗОБРЕТЕНИЯ (ПОЛЕЗНОЙ МОДЕЛИ) (Указываются индексы МПК и индикатор текущей версии) СОЛМ 21/88 (2006.01) 5. ОБЛАСТЬ ПОИСКА 5.1 Проверенный минимум документации РСТ (указывается индексами МПК) СО1МХ 21100, 21/01-21/958 5.2 Другая проверенная документация в той мере, в какой она включена в поисковые подборки: 5.3 Электронные базы данных, использованные при поиске (название базы, и если, возможно, поисковые термины): ВУРАТЕМТЬЗ, ОУУРТ, Е-ГлЬгагу, ЕАРАТТЪУ, ЕВЗСО, Езрасепе боозе, Соозе Ржепб, /- Р1а(Раё, КТРКЪУ, Гех15Мех15, РАТЕМТЗСОРЕ, Ра еагсв, Оцезце1-ОтЬи, КОРТО, ИЗРТО 6. ДОКУМЕНТЫ, ОТНОСЯЩИЕСЯ К ПРЕДМЕТУ ПОИСКА Кате- Наименование ...

Illumination energy management in surface inspection

The disclosure is directed to a system and method of managing illumination energy applied to illuminated portions of a scanned wafer to mitigate illumination-induced damage without unnecessarily compromising SNR of an inspection system. The wafer may be rotated at a selected spin frequency for scanning wafer defects utilizing the inspection system. Illumination energy may be varied over at least one scanned region of the wafer as a function of radial distance of an illuminated portion from the center of the wafer and the selected spin frequency of the wafer. Illumination energy may be further applied constantly over one or more scanned regions of the wafer beyond a selected distance from the center of the wafer.

Illumination energy management in surface inspection

The disclosure is directed to a system and method of managing illumination energy applied to illuminated portions of a scanned wafer to mitigate illumination-induced damage without unnecessarily compromising SNR of an inspection system. The wafer may be rotated at a selected spin frequency for scanning wafer defects utilizing the inspection system. Illumination energy may be varied over at least one scanned region of the wafer as a function of radial distance of an illuminated portion from the center of the wafer and the selected spin frequency of the wafer. Illumination energy may be further applied constantly over one or more scanned regions of the wafer beyond a selected distance from the center of the wafer.

Large particle detection in multi-spot surface scanning inspection system

Container inspection machine

The man-machine screen interface can be switched to one of a plurality of back lights so that an operator can define any one of these back lights on the man-machine screen interface as a desired back light for inspecting a transparent container.

Device and method for transmission inspection of containers comprising at least one light emitting diode light source

D ispositif et procédé d'inspection en transmission de récipients comportant au moins une source de lumière à diode électroluminescente Contenu de l’abrégé. L’invention concerne un dispositif d'inspection en transmission de récipients (2) à paroi en verre comportant au moins une source élémentaire pilotée (5) constituée par une diode électroluminescente (6) à au moins deux pavés (7) juxtaposés émettant des rayonnements lumineux dans des bandes spectrales d’émission différentes qui sont fonction des spectres de transmission de familles de teintes de récipients en verre, chaque bande spectrale d’émission d’un pavé étant limitée à une bande spectrale de transmission (Zt) adaptée à l’inspection en transmission pour au moins une famille de teintes de récipients en verre, en excluant les bandes spectrales d’absorption (Za) pour cette famille de teintes de récipients en verre et en ce que le dispositif comprend un dispositif électronique d'alimentation (15) commandant indépendamment chaque pavé (7) de chaque source élémentaire (3). Figure pour l’abrégé : Fig. 1. Device and method for transmission inspection of containers comprising at least one light emitting diode light source Content of the abstract. The invention relates to a device for the transmission inspection of containers (2) with glass walls comprising at least one driven elementary source (5) consisting of a light-emitting diode (6) with at least two juxtaposed blocks (7) emitting radiation luminous in different emission spectral bands which are a function of the transmission spectra of families of tints of glass containers, each spectral emission band of a block being limited to a spectral transmission band (Zt) adapted to the transmission inspection for at least one family of tints of glass containers, by excluding the spectral absorption bands (Za) for this family of tints of glass containers and in that the device comprises an electronic power supply device (15 ) independently controlling each ...

Method and device for visually inspecting objects to be tested during the production and/or packaging of cigarettes

A method and a device for the optical testing of objects during the production and/or packaging of cigarettes, in particular of cigarette packs and/or blanks for cigarette packs and/or overprints and/or print substrates on or for cigarette packs, with the aid of a suitable testing device. For at least one feature characterizing the test object, in particular in a visual respect, a set of feature-value alternatives for the corresponding feature that are stored in a memory is displayed on a display means. By means of an input device, one of the displayed feature values of the set of feature-value alternatives is selected. The testing device is automatically set up or preset for the subsequent testing operations, in particular an evaluating device and/or an illuminating device and/or a suitable light detector of the testing device, the selection of the feature value influencing the setting up of the testing device.

Device for appearance inspection

본 발명은 LCD 기판 표면의 결함 여부를 검사하기 위한 기판 외관 검사 장치에 관한 것이다. The present invention relates to a substrate appearance inspection apparatus for inspecting the surface of the LCD substrate for defects. 본 발명은, 기판 표면 상의 결함 유무를 검사하기 위하여 기판 표면에 빛을 조사하는 상방 조명계; 상기 상방 조명계의 하측에 기판을 위치시키고 요동시킴으로써 기판의 모든 표면을 검사할 수 있도록 하는 기판 위치계; 로 구성되는 기판 외관 검사 장치에 있어서, 상기 상방 조명계는, 상기 상방 조명계의 외측을 감싸는 보조 프레임에 고정, 결합되되, 상기 보조 프레임은 그 하부 일측 모서리를 중심으로 회동할 수 있으며, 바닥면에 수평되는 방향으로 이동가능하게 마련되는 것을 특징으로 하는 기판 외관 검사 장치를 제공한다. The present invention, the upper illumination system for irradiating light on the surface of the substrate to check for defects on the surface of the substrate; A substrate positioning system that enables inspection of all surfaces of the substrate by placing and rocking the substrate under the upper illumination system; In the apparatus for inspecting the appearance of the substrate, the upper illumination system is fixed and coupled to an auxiliary frame surrounding the outside of the upper illumination system, wherein the auxiliary frame can be rotated about its lower one side corner, and is horizontal to the bottom surface. Provided is a substrate appearance inspection apparatus, which is provided to be movable in a direction. 기판, 기판외관 검사, 상방 조명계, 슬라이딩 방식 Board, board exterior inspection, upward illumination system, sliding method

Optical inspection method and apparatus

Welding seam detection device and method

本发明公开了一种焊缝检测装置和方法，所述装置包括：激光器，用于发射线激光，并使所述线激光垂直入射至待焊接物体的焊缝处，形成激光线；发光装置，所述发光装置设置在所述激光器的一侧，用于发射光束，并使所述光束入射到所述待焊接物体的焊缝处；图像采集器，所述图像采集器设置在所述激光器的另一侧，用于基于第一预设曝光时间采集包含所述激光线的第一图像，基于第二预设曝光时间采集在所述光束的照射下所述焊缝的第二图像。通过本发明，有效的解决了现有焊接技术焊接效率低、准确性差的技术问题，达到了焊缝检测准确、提高焊接效率和精准度、提高焊缝完整性、可靠性、安全性，进而减小资源浪费，节约成本的技术效果。

Systems and methods for metrology with layer-specific illumination spectra

A metrology system includes an image device and a controller. The image device includes a spectrally-tunable illumination device and a detector to generate images of a sample having metrology target elements on two or more sample layers based on radiation emanating from the sample in response to illumination from the spectrally-tunable illumination device. The controller determines layer-specific imaging configurations of the imaging device to image the metrology target elements on the two or more sample layers within a selected image quality tolerance in which each layer-specific imaging configuration includes an illumination spectrum from the spectrally-tunable illumination device. The controller further receives one or more images of the metrology target elements on the two or more sample layers generated using the layer-specific imaging configurations. The controller further provides a metrology measurement based on the one or more images of the metrology target elements on the two or more sample layers.

Lighting device and method for industrial vision

Foreign substance/defect inspection device, image generation device in foreign substance/defect inspection, and foreign substance/defect inspection method

受光素子アレイ（フォトダイオードアレイ）の少なくとも１つの受光素子からなる１画素単位と光源が１対１の対応をし、光源が発光するときのみ、該光源に対応する少なくとも１つの受光素子（１画素単位）で光ビームが検出される。照明光学系は、複数の光源から出射される各光ビームの光軸の間隔を当該複数の光源の配列方向に縮小させて検査対象物へと導く導光手段を含む。

Visual inspection equipment, visual inspection methods and programs

Apparatus and method for characterizing defects in transparent substrates

透明基板（１２）を照明するために明視野光源及び暗視野光源を組み合せて同時に用いることによる、基板の欠陥を検出するための装置（１０）及び方法。装置は基板が移動している間に混入物及び表面欠陥のいずれをも同時に検出することができ、製造環境における基板の特性評価を簡略化することができる。

Optical detection method of diaphragm

本发明涉及锂电池的加工生产技术领域，公开了一种隔膜的光学检测方法，包括以下步骤：S1：提供一种隔膜的光学检测机构，所述隔膜的光学检测机构包括图像获取装置及检测光源，所述检测光源位于待检测的隔膜的正下方，包括第一光源和第二光源，所述图像获取装置位于所述待检测的隔膜的上方；S2：依次驱动所述第一光源和所述第二光源分别向所述待检测的隔膜发射第一光线和第二光线，且所述第一光线与所述第二光线照射于所述待检测的隔膜的相同位置；S3：驱动所述图像获取装置分别获取所述第一光线照射时及所述第二光线照射时所述待检测的隔膜的第一图像和第二图像；S4：根据所述第一图像与所述第二图像，判断所述待检测的隔膜是否存在缺陷。

Optimized standard manual inspection environment for obtaining accurate visible contaminating particle inspection data

A new technology is established by the present invention to assist in the development of more reliable human method for the inspection of pharmaceutical and critical products. The present invention provides the industry with a standardized illumination environment in which the illumination conditions remain constant over extended periods of time. Furthermore, the invention provides the environment in an ergonomic package that is easily adjusted to match physical requirements of individual users without the use of any special tools. The optimized manual inspection environment implements the state of the art control techniques to maintain a constant luminous intensity within an expanded inspection volume. The large inspection volume minimizes the effects of variation in product positions while inspectors perform the operations. The standard environment insures that a constant 550 foot candles is maintained in all manual inspection booths so that inspection results may be compared within the same facility or with facilities located at other sites. A national or international standard for the limiting size of contaminating particles can only be established with the use of standardized manual inspection booth such as presented in this invention.

System and method for selecting defect detection methods for specimen inspection

本发明提供用于选择用于样本检验的缺陷检测方法的方法及系统。一种系统包含经配置用于基于样本上的多边形的特性将关注区域中的所述多边形区分成初始子群组且确定在由检验子系统的检测器针对所述不同初始子群组中的所述多边形产生的输出中的噪声的特性的一或多个计算机子系统。所述计算机子系统还经配置用于通过组合具有所述噪声的所述特性的基本上相同值的所述不同初始子群组的任何两者或更多者而确定所述多边形的最终子群组。另外，所述计算机子系统经配置用于选择用于应用到在所述样本或另一样本的检验期间由所述检验子系统的所述检测器产生的所述输出的第一及第二缺陷检测方法。

Multi-modality multiplexed lighting for optical inspection systems

照明サブシステム及び像感知サブシステムを有し、その照明サブシステムが複数通りの照明モダリティを提供する検査システムであり、対象物のうち少なくとも２個のエリアをそれら複数通りの照明モダリティのうち別々なもので以て同時照明し、その像を像感知サブシステムの単一センサ形成部分により捕捉するシステムである。

Apparatus, method and computer program product for defect detection in work pieces

워크 피스들에서의 결함 검출을 위한 장치, 방법, 및 컴퓨터 프로그램 제품이 개시된다. 적어도 하나의 광원이 제공되고, 광원은 워크 피스가 투명해지는 파장 범위의 조명광을 생성한다. 카메라는 워크 피스의 적어도 하나의 면으로부터의 광을 렌즈에 의해 카메라의 검출기 상에 이미징한다. 워크 피스를 이동시키고 카메라로 반도체 디바이스의 적어도 하나의 면을 완전히 이미징하기 위해 스테이지가 사용된다. 컴퓨터 프로그램 제품은 워크 피스들에서의 결함 검출을 위해 컴퓨터로 판독가능한 비일시적 매체 상에 배치된다. 컴퓨터는 다양한 공정 단계들을 실행하고 장치의 다양한 수단을 제어하는데 사용된다. An apparatus, method, and computer program product for defect detection in workpieces are disclosed. At least one light source is provided, the light source generating illumination light in a wavelength range through which the work piece becomes transparent. The camera images light from at least one side of the work piece by way of a lens onto a detector of the camera. The stage is used to move the workpiece and completely image at least one side of the semiconductor device with a camera. The computer program product is disposed on a non-transitory computer-readable medium for defect detection in work pieces. Computers are used to carry out the various process steps and to control the various means of the apparatus.

Apparatus and method for inspecting transparent cylindrical containers containing milky products, in particular for medical applications

An apparatus (4) for inspecting transparent cylindrical containers (8) comprising a support and/or gripping device for a cylindrical container (8) adapted to support it and to make it rotate about a vertical rotation axis (Y-Y), a video camera (12) directed in such a way as to frame and capture images, in the form of pixels, of a window (16) of a side wall (20) of the cylindrical container (8), a first collimated lighting device (24), oriented so as to illuminate said window (16), a second lighting device (28) collimated and oriented in such a way as to illuminate said window (16), arranged opposite the first lighting device (24), in a symmetrical position with respect to the window (16), a control unit (32) operationally connected to the support and/or gripping device, to the video camera (12) and to said first and second lighting devices (24, 28), and programmed to capture images of said window (16) at constant angular intervals, alternately activating the first and second lighting devices (24, 28), for each angular range, until a complete 360° rotation of the cylindrical container is made (8), processing the images obtained in order to catalog the internal or external position of any contaminant with respect to the side wall (20) of the cylindrical container (8).

Foreign material/defect inspection apparatus, image generating apparatus in foreign material/defect inspection, and foreign material/defect inspection method

수광 소자 어레이(포토다이오드 어레이)의 적어도 하나의 수광 소자로 이루어진 1화소 단위와 광원이 일대일 대응하고, 광원이 발광할 때에만, 상기 광원에 대응하는 적어도 하나의 수광 소자(1화소 단위)에서 광빔이 검출된다. 조명 광학계는, 복수의 광원으로부터 출사되는 각 광빔의 광축의 간격을 상기 복수의 광원의 배열 방향으로 축소시켜 검사 대상물로 유도하는 도광 수단을 포함한다.

Vision inspection method for Vision inspection equipment

본 발명은 패키지 검사시 스크래치 등을 체크하는 표면 검사와 자재 또는 볼의 치수를 측정하는 높이 검사를 동시에 수행하는 비전검사방법에 관한 것이다. The present invention relates to a vision inspection method for simultaneously performing a surface inspection for checking scratches and the like during the package inspection and a height inspection for measuring the dimensions of the material or ball. 본 발명은 자재에 대한 표면 검사 및 높이 검사시 4개의 라이트를 독립적으로 제어하여 밝은 쪽에서는 스크래치 등의 표면 검사를 수행하는 동시에 어두운 쪽을 이용하여 백라이트 방식으로 높이 검사를 수행하는 새로운 형태의 비전검사 시스템을 구현함으로써, 한 공정에서 자재에 대한 4측면의 표면 검사와 높이 검사를 효율적으로 수행할 수 있고, 또 높이 등의 외곽 검사에 대한 정확한 측정값을 얻을 수 있는 비전검사장비의 비전검사방법을 제공한다. According to the present invention, a new type of vision inspection that independently controls four lights during surface inspection and height inspection of a material to perform surface inspection such as scratches on the bright side and at the same time performs a height inspection on the back side using a dark side By implementing the system, it is possible to efficiently perform the surface inspection and height inspection of the four sides of the material in one process, and the vision inspection method of vision inspection equipment to obtain accurate measurement values for the outer inspection such as height. to provide. 반도체, 비전장치, 사이드 비전, 표면 검사, 높이 검사, 백라이트 방식, 탑라이트 방식 Semiconductor, Vision Equipment, Side Vision, Surface Inspection, Height Inspection, Backlighting, Toplighting

A kind of plastic pipe surface defect detection apparatus and its detection method

本发明提供一种塑料管材表面缺陷检测装置及其检测方法，所述塑料管通过所述可拆卸硅胶板的中心圆孔进入所述检测装置内部，所述编码器将所得数据信号反映到所述工控机中，所述工控机再将数据传输到所述显示面板；当所述编码器映射数据输出显示所述塑料管是运动的，此时所述相机以及所述光源同时开始工作，所述相机对经过的塑料管段进行逐段拍摄，直至编码器输出所得数据表示塑料管材停止运动，那么该段塑料管材全部检测完毕，本发明采用视觉检测设备，可以直接检测管材表面的缺陷，全自动运行设备，有效的减少人力财力的支出。

Inspection apparatus and article manufacturing method

一種用於執行物體的檢查的檢查設備包括：照明裝置，其對於物體執行各向異性照明和各向同性照明；成像裝置，其使藉由照明裝置而被照明的物體成像；以及處理器，其基於由成像裝置所獲得的影像來執行檢查的處理。處理器基於由成像裝置在照明裝置分別執行複數個各向異性照明時所獲得的複數個第一影像、以及由成像裝置在照明裝置執行各向同性照明時所獲得的第二影像來產生檢查影像，並且基於檢查影像來執行處理。

Lighting system and measurement system

계측 장치용 조명 시스템 및 이러한 조명 시스템을 포함하는 계측 장치가 개시된다. 조명 시스템은 조명 소스; 및 상기 조명 소스로부터의 방사선 빔을 필터링하도록 구성되고 하나 이상의 선형 가변 필터를 포함하는 선형 가변 필터 배열체를 포함한다. 조명 시스템은 방사선 빔이 선형 가변 필터 배열체에 의해 필터링된 후에 방사선 빔의 파장 특성의 선택적 제어를 가능하게 하도록 동작가능하다. An illumination system for a measurement device and a measurement device including such an illumination system are disclosed. The lighting system is a lighting source; And a linearly variable filter arrangement configured to filter the radiation beam from the illumination source and comprising one or more linearly variable filters. The illumination system is operable to enable selective control of the wavelength characteristics of the radiation beam after the radiation beam has been filtered by a linearly variable filter arrangement.

Lighting device and method for industrial vision

The invention relates to an industrial vision device (106) comprising: - a camera, - a device for processing images captured by the camera, and - a lighting device (108) for industrial vision, comprising: - a plurality of light sources for lighting a zone of interest (110), - an optical sensor for sensing the light emitted by the plurality of light sources and reflected by at least two distinct portions (110 1 – 110 5 ) of the zone of interest (110), - a module for comparing the luminous intensity of the light reflected by the at least two distinct portions (110 1 – 110 5 ) of the zone of interest (110), and sensed by the optical sensor, and - a module for modifying the configuration of the light sources according to the comparison of luminous intensities reflected by the at least two distinct portions (110 1 – 110 5 ) and sensed by the optical sensor, in particular in order that the difference between the compared luminous intensities is less than 20 %, preferably less than 10 %, more preferably less than 5 %.

Method and device for visually inspecting objects to be tested during the production and/or packaging of cigarettes

The invention concerns a method and a device for visually inspecting objects to be tested during the production and/or packaging of cigarettes - test objects -, more particularly cigarette packets (10) and/or blanks (14, 22) for cigarette packets (10) and/or overprints and/or print substrates on or for cigarette packets (10) using a suitable testing device. For at least one feature characterizing the test object (10, 14, 18, 29, 30), more particularly visually, a set of feature value alternatives (31a-c; 32a-b) for the corresponding feature stored in a memory is displayed on a display means such as a screen. An input arrangement, a keyboard or a pointing device, is used to select one of the displayed feature values of the set of feature value alternatives (31a-c; 32a-b). The testing device, more particularly an evaluation arrangement and/or an illumination arrangement (26) and/or a suitable light detector (11) of the testing device, is automatically set-up or pre-configured for the subsequent test cycles, the choice of feature value (31a; 32a) influencing the set-up of the testing device. The test objects (10, 14, 18, 29, 30) are tested using the set-up testing device.