INSTRUMENT DOCKING APPARATUS, SYSTEMS, AND METHODS

INSTRUMENT DOCKING APPARATUS, SYSTEMS, AND METHODS

RELATED APPLICATIONS

[0001] This application claims priority to U.S. Provisional Application Serial Number 61/760,287 entitled "INSTRUMENT DOCKING APPARATUS, SYSTEMS, AND METHODS" filed on February 4, 2013, the disclosure of which is hereby incorporated by reference in its entirety herein.

FIELD

[0002] The present invention relates generally to apparatus, systems, and methods adapted for installation of instruments .

BACKGROUND

[0003] In automated medical specimen diagnostic instruments (clinical analyzers and immunoassay instruments) , biological liquids may be provided to one or more instruments for testing. A single instrument may interface with one or more additional instruments to form an instrument system or cluster. Sometimes, one or more instruments may be arranged in a defined position relative to a track mechanism, for example. In other embodiments, a central instrument may be positioned in a cluster of instruments and includes a robot adapted to transfer or items (e.g., sample containers, sample trays, cuvettes, or the like) to other instruments or otherwise position items relative to the other instruments. As part of the setup of such an instrument system, an operator carefully and precisely positions the various instruments and possibly locks them in place by actuating wheel locks. This is especially true of the instrument including the robot that transfers items, as this will enable the instrument to correctly locate and/or accomplish transfer of items between the various instruments. In certain instrument clusters, the central instrument may include the robot that functions to transfer or position items.

[0004] If the central instrument (e.g., a robotic instrument) needs to be moved for maintenance, cleaning, calibration, or for another reason, the entire laborious sequence of repositioning the central instrument in the proper proximity relative to the other instruments in the instrument cluster must be performed again. This takes additional time which leads to system downtime and loss of productivity.

[0005] Accordingly, as recognized by the inventors, apparatus, systems, and methods that may improve instrument positioning are desired.

SUMMARY

[0006] According to a first aspect, an instrument docking apparatus is provided. The instrument docking apparatus includes a docking base, a guide track, a guide pin configured to ride in the guide track, one or more capture members, each capture member having a capture recess, and one or more alignment pins operable to be received in the capture recess.

According to another aspect, an instrument docking system is provided. The instrument docking system includes an instrument, a docking base, a guide track, a guide pin configured to ride in the guide track, one or more capture members, each capture member having a capture recess, and one or more alignment pins operable to be received in the capture recess to position the instrument along the guide track.

[0008] According to yet another aspect, a method of aligning an instrument is provided. The method includes providing a guide track, providing a guide pin configured to ride in the guide track, moving an instrument to cause the guide pin to ride in a guide track, and capturing one or more alignment pins in one or more capture members to position the instrument in a defined orientation along the guide track.

[0009] Still other aspects, features, and advantages of the present invention may be readily apparent from the following detailed description by illustrating a number of example embodiments and implementations, including the best mode contemplated for carrying out the present invention. The present invention may also be capable of other and different embodiments, and its several details may be modified in various respects, all without departing from the scope of the present invention. Accordingly, the drawings and descriptions are to be regarded as illustrative in nature, and not as restrictive. The drawings are not necessarily drawn to scale. The invention is to cover all modifications, equivalents, and alternatives falling within the scope of the invention.

BRIEF DESCRIPTION OF THE DRAWINGS

[0010] The invention will be better understood

by referring to the detailed description taken in

conjunction with the following drawings.

[0011] FIG. 1 illustrates a perspective view

diagram of a portion of an instrument docking

apparatus according to embodiments.

[0012] FIG. 2A illustrates a partial perspective

view diagram of components of an instrument docking

apparatus according to embodiments.

[0013] FIG. 2B illustrates a partial cross- sectional view diagram of a guide pin attachment

according to embodiments.

[0014] FIG. 3 illustrates a partial perspective

underside view diagram of alignment pins and guide pin coupled to a structure of an instrument according to embodiments .

[0015] FIG. 4 illustrates a partial perspective view diagram of components of an instrument docking apparatus according to embodiments.

[0016] FIG. 5 illustrates a partial exploded view diagram of components and attachment of a guide track to a docking base according to embodiments.

[0017] FIG. 6 illustrates a partial exploded view diagram of components of, and attachment of, a capture member to a docking base according to embodiments .

[0018] FIGs. 7A-7B illustrates perspective views illustrating docking of the instrument with the instrument docking apparatus according to embodiments.

[0019] FIGs. 8A-8C illustrates various views of a spring-loaded and lockable alignment pin mechanism according to embodiments.

[0020] FIG. 9 illustrates an isometric view illustrating an instrument docking apparatus positioning a first instrument in a defined orientation relative to several other instruments in an instrument cluster according to embodiments.

[0021] FIG. 10 illustrates a top view illustrating an instrument docking apparatus positioning a first instrument relative to several other instruments of an instrument cluster according to embodiments.

[0022] FIG. 11 illustrates a cross-sectioned side view illustrating a portion of an instrument docking apparatus according to embodiments. [ 0023] FIG. 12 illustrates a method of aligning

an instrument according to embodiments.

DETAILED DESCRIPTION

[ 0024 ] Embodiments of the present invention provide instrument docking apparatus, systems, and methods adapted and operational to align (e.g., orient) and secure an instrument in a defined spatial relationship, such as in a defined position and orientation on a floor and/or in a defined position and orientation to one or more other instruments in an instrument cluster.

[ 0025] Embodiments of the invention are beneficial to the healthcare industry, saving time and money on instrument installations, and will provide less down time when any portion of a system (e.g., a robotic instrument thereof) needs preventive maintenance or servicing, thereby providing relatively improved value.

[ 0026] As discussed above, the previously-installed position of any medical or other instrument (e.g., clinical analyzer, a track module, a robotic-based integration module, or the like) may interface with other analytical instruments or mechanisms, and cannot utilizing existing methods be repeatedly and easily realigned to a preset location after being moved from that specified location. In order to realign and reconfigure the instrument back to a pre-set position had been heretofore a time-consuming task for a field service engineer. Embodiments of the invention, as will be apparent from the following, provide easier access to the robotic instrument for servicing without extensive mechanical disassembly of hardware. Furthermore, one or more embodiments allow repositioning of the robotic instrument without time- consuming positional reconfiguration previously required. These and other aspects and features of embodiments of the invention will be described with reference to FIGs. 1- 12 herein.

[0028] Now referring to FIGs. 1-6 and 11, a first embodiment of an instrument docking apparatus 100 is shown. Instrument docking apparatus 100 includes a docking base 102, a guide track 104, a guide pin 106 (FIGs. 2A, 2B and 3) configured to ride in the guide track 104, one or more capture members 108, each capture member 108 having a capture recess 110. The instrument docking apparatus 100 includes one or more alignment pins 111 (FIGs. 3, 8 and 11), which may be spring- loaded and operable to be received in the capture recess 110. The alignment pins 111 and the guide pin 106 may be attached to a structure of a robotic instrument 124, such as to a cabinet or frame thereof.

[0029] The docking base 102 may be a planar plate configured to couple to a floor, such as a thin sheet made of metal (e.g., aluminum sheet) and may have a thickness of between about 1.5 mm to about 2.5 mm, for example. Other thicknesses and materials may be used. Docking base 102 may include a generally rectangular shape, and may include a cutout 102C. Docking base 102 may be secured to or adhered to the floor by any suitable means, such as using a double-sided adhesive foam tape. In other embodiments, docking base 102 may be secured by mechanical fasteners (e.g., bolts or the like) to the floor. The docking base 102 can be positioned on any flat surface in a lab, e.g., tile floor or cement floor, for example, at a desired location.

[0030] Guide track 104 may also be made from metal sheet, which may include track sides 104A, 104B that may be bent to form the channel 104C that is adapted to receive the guide pin 106 therein. Guide track 104 may include a base portion 104D, and the track sides 104A, 104B may be secured thereto, such as by welding. The base portion 104D of the guide track 104 is coupled to the docking base 102, and may be secured to the docking base 102, such as with fasteners or the like. A position of guide track 104 that accepts the guide pin 106 may be adjustable, such that fine instrument position adjustments may be made. For example, as best shown in partial exploded view of FIG. 5, the base portion 104D may include slots 104S allowing a position of the guide track 104 to be adjusted relative to the docking base 102. Fasteners 104F may include bolts and nuts, welded studs and nuts, or welded nuts and bolts, self-clinching studs, such as PEM® self-clinching studs available from Pennengineering of Danboro, PA, or the like. Other fastening means may be used.

[0031] Guide track 104 may be about 80 cm long and the channel 104C may be about 3 cm wide along a majority of its length and about 2 cm wide at a narrowed portion 120 at an end portion having a width labeled "X". Track sides 104A, 104B may be about 6.3 cm high. Guide track 104 may include a first horizontally open end 118 configured to receive the guide pin 106 as the instrument 124 is wheeled into place (See FIG. 7A- 7B) onto the docking base 102. Guide track 104 may comprise an enlarged entry at the first horizontally open end 118 adapted to aid in funneling the pin 106 into the channel 104C. Other track dimensions and shapes may be used.

[0032] The guide pin 106 may be adapted to be coupled (e.g., attachable) to the instrument 124. Guide pin 106 may be welded to the instrument structure 124C (cabinet or frame) in some embodiments. Optionally, as shown in FIGs. 2A and 2B, guide pin 106 may include threads 106T on one end and a flange 106F and may be bolted to the bottom of the instrument structure 124C, such as by a nut 106N. Guide pin 106 may be a suitably rigid material, such as steel, and may be about 44 mm long and 19 mm in diameter, for example. Other suitable materials and pin sizes may be used. Guide pin 106 may include other shapes.

[0033] In some embodiments, the horizontally narrowed portion 120 of the channel 104C at a second end 122 spaced from the first horizontally open end 118 has a smaller crosswise dimension (designed as "X" in FIG. 5) as compared to the rest of the channel 104C. In one embodiment, a gap between the sides of the guide pin 106 and the channel-side surfaces of sides 104A, 104B at the narrowed portion 120 having cross- dimension "X" may have a gap of less than about 0.75 mm, for example. This helps maintain good alignment as the instrument 124 is moved into position on the instrument docking apparatus 100. However, any sufficient precision for the installation in which the instrument docking apparatus 100 is used may be provided. In some embodiments, a bumper stop 126 may be provided at the second end 122 of the guide track 104. Bumper stop 126 may couple to an end flange 104E of the bottom portion 104D by bumper fasteners 121 received in captured nuts on the end flange 104E. The bumper stop 126 may be contacted by the guide pin 106 to halt the excursion of the instrument 124 as it is pushed onto the instrument docking apparatus 100.

[0034] Instrument docking apparatus 100 includes one or more capture members 108, each of which may comprise an adjustable capture disc 112. In the depicted embodiment, the one or more capture members 108 includes two capture discs 112. Each capture member 108 may include a capture recess 110

(e.g., a hole or aperture) that is configured and adapted to accept an alignment pin 111 (See FIGs. 3, 4, 8, and 11) . The alignment pins 111 may be configured to couple to the instrument 124, and may be part of a pin actuating assembly which may be spring-loaded.

[0035] As shown in FIGs. 8A-8C, the one or more alignment pins 111 may be part of a pin actuation mechanism that may be spring loaded relative to a body 111B to enable easy retraction of the alignment pins 111. Body 111B may be coupled to the instrument 124, such as to the instrument structure 124C (e.g., cabinet or frame) by fasteners. Rotation of the lever 111L by the installer is used to raise and lower the alignment pins 111. In the lowered position, the alignment pins 111 are locked in place, but can be retracted by rotation of the lever 111L. Other suitable mechanisms for raising, lowering, and locking the alignment pins 111 may be used. As shown in FIGs. 1, 4 and 11, first alignment pin 111 is receivable in a first capture recess 110 of a first capture disc 112, and a second alignment pin 111 is receivable in a second capture recess 110 of a second capture disc 112. The alignment pins 111 may be lockable in the depicted embodiment.

[0036] In the illustrated embodiment of FIG. 1, a first one of the one or more capture members 108 may be positioned on a first side 114A of the guide track 104, and a second one of the one or more capture members 108 may be positioned on a second side 114B of the guide track 104 opposite the first side 114A. Both capture members 108 may be positioned on the end of the instrument docking apparatus 100 where the first horizontally opened end 118 is located. However, in other embodiments, both capture members 108 may be being positioned on one side of the guide track 104, or on opposite sides but on opposite ends of the docking base 102. Other orientations of the capture members 108 may be used.

[0037] As best shown in FIG. 4 and partial exploded view of FIG. 6, the one or more capture members 108 may comprise one or more capture discs 112 that are coupled to the docking base 102, as shown. In the depicted embodiment, the capture discs 112 are coupled and attached to the docking base 102 by a riser 630. Riser 630 may be made of a bent steel sheet that is coupled to the docking base 102 by suitable fasteners. Fasteners may be PEM studs 631F and nuts 631N. Riser 630 may include a registering hole 635. Registering hole 635 may include a suitable size that allows for some lateral adjustment of the capture disc 112 in an x-y plane and/or relative pivoting (rotation) of the capture disc 112 relative to the docking base 102. Pivot fastener 634 coupled to registry member 632 provides for a pivot 116 (FIG. 1) .

[0038] Adjustment is provided by the operation of sliding and/or pivoting of the capture disc 112 on an upper surface 630S of the riser 630. Upper surface 630S may be generally planar in some embodiments. Sliding may occur by pushing the instrument 124 in the X direction, Y direction, or combinations thereof. The one or more capture members 108 may comprise discs 112 having a pivot 116 central to the disc 112 and wherein the capture recess 110 is offset from the pivot 116. Once positioned in a desired orientation via sliding and/or pivoting, the capture disc 112 may be locked to the riser 630 by tightening pivot fastener 634. This draws the registry member 632 into engaged contact with the underside of the riser 630, and the disc 112 into engaged contact with the upper surface 630S. Registry member 632 may also comprise a disc. In this manner, the alignment pins 111 may be re^¬ inserted after removal thereby positioning the instrument 124 on the docking base 102.

[0039] As shown in FIG. 6, a second capture recess 610 may be provided in the disc 112. Second capture recess 610 allows a different instrument type to be assembled to the instrument docking apparatus 100 (e.g., a second type or model of robotic instrument having a different cabinet or frame height) .

[0040] As is shown in FIGs. 9 and 10, the instrument docking apparatus 100 may be used to position the instrument

124 in a defined position relative to one or more additional instruments (e.g., a second instrument 940 adjacent to a first side of the instrument 124, a third instrument 945 adjacent to a back side of the instrument 124, and/or a fourth instrument 950) adjacent to a second side of the instrument 124 from the first side, thereby forming an instrument cluster 900. In the depicted embodiment, the instrument docking apparatus 100 and the instrument 124 make up an instrument system or assembly.

[0041] In more detail, the use of the instrument docking apparatus 100 for exactly positioning an instrument 124 on a floor will now be described. After positioning the docking base 102 of the instrument docking apparatus 100 on the lab floor, the instrument 124 is rolled onto the docking base 102 with the guide pin 106 residing and sliding within the guide track 104. Once the instrument 124 is rolled onto the docking base 102, the weight of the instrument 124 along with the tape adhesion or other fastening means may keep the docking base 102 from moving. After some minor positional adjustment to align the instrument 124 with the desired location on the docking base 102, the alignment pins 111 are lowered into the capture recesses 110 of the capture discs 112 coupled to the docking base 102. The adjustable guide track 104 is tightened to the docking base 102 with the guide pin 106 located in narrowed portion 120 (e.g., an accurate channel slot) at the second end 122 of the guide track 104. The capture discs 112 are tightened to the riser 630 to prevent further movement of the instrument 124. Other analytical instruments can then be moved to one or more (e.g., three sides) of the instrument

(e.g., robotic instrument) and configured to accept bio-fluid

(e.g., blood samples) for testing therein.

For servicing (e.g., maintenance or cleaning), the alignment pins 111 attached on the instrument structure 124C can be lifted and removed from the capture recesses 110. The instrument 124 can then be rolled off from the docking base 102 of the instrument docking apparatus 100 (FIG. 7A) , and serviced. Once servicing is completed, the instrument 124 may be rolled back onto the docking base 102 with the guide pin 106 following the channel 104C and re-locked into position (FIG. 7B) by lowering the alignment pins 111 into the capture recesses without the need for reconfiguration (e.g., readjusting the positioning) as in the prior art. Accordingly, an instrument 124, such as robotic instrument that moves articles (e.g., sample tubes or cuvettes) to and from one or more surrounding instruments can be removed and reinstalled and be precisely and rapidly positioned again relative to the other instruments.

According to another aspect, a method of aligning an instrument 124 is provided. The method 1200 includes, as shown in FIG. 12, providing a guide track (e.g., guide track 104 of the instrument docking apparatus 100 - FIG. 1) in 1202, and providing a guide pin (e.g., guide pin 106 coupled to the instrument structure 124C - FIG. 3) configured to ride in the guide track in 1204. The method 1200 includes moving an instrument (e.g., instrument 124 which may include wheels) to cause the guide pin (e.g., guide pin 106) to ride in, and be constrained by) the guide track (e.g., guide track 104) in 1206 (See FIG. 7A illustrating the guide pin 106 just entering into the guide track 104), and capturing (See FIGs. 4 and 11) one or more alignment pins (e.g., alignment pins 111) in one or more capture members (e.g., capture members 108) to position the instrument (e.g., instrument 124) in a defined orientation along the guide track (e.g., guide track 104) in 1208. The capturing may be provided by lowering the alignment pins 111 into capture recesses 110 in one or more capture discs 112. In the captured position shown in FIG. 7B, the guide pin 106 may be registered in the narrowed portion 120 of the guide track 104. The instrument docking apparatus 100 allows for removal and reinstallation of the instrument 124 with exact repositioning.

[0044] Having shown the preferred embodiments, those skilled in the art will realize many variations are possible that will still be within the scope of the claimed invention. For example, the guide track 104 may be mounted to the instrument 124, and the guide pin 106 may be mounted to the docking base 102. Optionally, the capture members 108 may be coupled to the instrument 124 and the retractable alignment pins 111 may be coupled to the docking base 102. Therefore, it is the intention to limit the invention only as indicated by the scope of the claims.