СИСТЕМА ИЗМЕРЕНИЯ ГАЗА

Изобретение относится к системам и способам обнаружения и измерения газов в образце, а более конкретно к системам абсорбционной спектроскопии и способам количественного определения редких веществ (например, сероводорода) в образце газа, например в образце природного газа. Заявленная спектроскопическая система для измерения следового уровня и/или ультраследового уровня содержания сероводорода в образце природного газа содержит: лазер для генерации выходного пучка в совокупности из одного или более дискретных или непрерывных диапазонов длин волн при частоте сканирования от примерно 0,1 Гц до примерно 1000 Гц в указанной совокупности из одной или более дискретных или непрерывных диапазонов длин волн; передающую оптику для направления и/или формирования выходного пучка от лазера к образцу природного газа; оптический детектор для приема света из образца природного газа и выработки детекторного сигнала, соответствующего принятому свету; и процессор вычислительного устройства и запоминающее устройство ...

ИЗМЕРИТЕЛЬНОЕ УСТРОЙСТВО ДЛЯ ИЗМЕРЕНИЯ ПАРАМЕТРОВ СФОКУСИРОВАННОГО ЛАЗЕРНОГО ПУЧКА

Изобретение относится к области оптических измерений. Устройство содержит линзовую систему увеличения, образованную двумя линзами (10, 12), установленными последовательно, с совпадающими фокусами на траектории лазерного пучка, а также камеру (74), расположенную за этими линзами в фокусе последней линзы (12). Камера содержит электронный датчик (14) изображения, генерирующий электронное изображение лазерного пучка, сечение которого увеличено посредством линз. Положение линз (10, 12) вместе с камерой (74) может юстироваться вдоль траектории пучка относительно базовой точки (46) измерительного устройства с целью локализации фокальной перетяжки лазерного пучка и определения диаметрального профиля лазерного пучка. Измерительное устройство дополнительно содержит адаптер (42), охватывающий траекторию пучка и служащий для прикрепления измерительного устройства к лазерной системе, генерирующей лазерный пучок. Адаптер (42) образует опорную поверхность (46) для лазерной системы, которая выступает по ...

Способ определения деградации фитооблучателя на основе квазимонохроматических светодиодов и система для его осуществления

Изобретение относится к области измерительной техники и касается способа определения деградации фитооблучателя на основе квазимонохроматических светодиодов. Способ заключается в том, фитоблучатели на основе светодиодов с синими и красными кристаллами одновременно в течение выбранного периода времени подвергают воздействию током. При этом фитооблучатели разделяют на три группы. Через первую группу пропускают ток, плотность которого меньше номинальной плотности тока, через вторую группу пропускают ток, равный номинальной величине, через третью группу пропускают ток, плотность которого выше номинальной плотности тока. С выбранной периодичностью фитооблучатели помещают в фотометрический шар, в котором выделяют нужный спектральный состав с помощью светофильтров красного и синего цвета. Измеряют последовательно общий спад светового потока с фильтрами и без фильтров. На основании полученных данных определяют степень деградации фитооблучателя. Технический результат заключается в обеспечении возможности ...

ГИБКИЙ НЕЛИНЕЙНЫЙ ЛАЗЕРНЫЙ СКАНИРУЮЩИЙ МИКРОСКОП ДЛЯ НЕИНВАЗИВНОГО ТРЕХМЕРНОГО ДЕТЕКТИРОВАНИЯ

... 1. Гибкий нелинейный лазерный сканирующий микроскоп для неинвазивного трехмерного детектирования, содержащий по меньшей мере один источник излучения, который формирует возбуждающий луч для инициирования вторичного излучения, эмитируемого атомами и молекулами, гибкую передающую оптику для передачи излучения к измерительной головке с фокусирующей оптикой, с помощью которой излучение фокусируется на объекте измерения и эмитированное вторичное излучение возвращается и направляется на по меньшей мере одну детекторную систему,отличающийся тем, что- измерительная головка (4) соединена с по меньшей мере одним источником (1; 71; 74) излучения, свободно позиционируемым в пространстве с возможностью наклона и поворота и гибким образом, так что микроскопия может выполняться вертикально, инверсно, а также под любыми пространственными углами,- по меньшей мере одно управляемое откидное зеркало (2) для отклонения и ориентации по меньшей мере одного возбуждающего луча (11; 12) импульсного лазерного излучения ...

СИСТЕМА ИЗМЕРЕНИЯ ГАЗА

ОПТИЧЕСКОЕ УСТРОЙСТВО, СТЕНД ДЛЯ ОПТИЧЕСКОГО ТЕСТИРОВАНИЯ И СПОСОБ ОПТИЧЕСКОГО ТЕСТИРОВАНИЯ

... 1. Оптическая система, отличающаяся тем, что содержит:- устройство (106) генерирования плоской световой волны, называемой коллимированной световой волной (OL), и- устройство (114) отклонения коллимированной световой волны для выдачи световой волны, называемой тестовой световой волной (OL), при этом устройство (114) отклонения имеет регулируемое фокусное расстояние.2. Оптическая система по п. 1, в которой фокусное расстояние устройства (114) отклонения является регулируемым, в частности до бесконечности.3. Оптическая система по п. 2, в которой фокусное расстояние является регулируемым в интервале от бесконечности до заранее определенного значения.4. Оптическая система по п. 3, в которой заранее определенное значение является отрицательным.5. Оптическая система по п. 3, в которой заранее определенное значение является положительным.6. Оптическая система по п. 1, в которой устройство отклонения содержит:- первую оптическую линзу (202), предназначенную для приема коллимированной световой волны ...

Integrated sensor and focus adjuster for high power laser - determines focusing error using quadrant detector and sends corrective control signals to piezoelectric or magnetostrictive actuators

The partially transparent reflecting plate is provided with cooling ducts. A pressure proof stable shaped housing is formed by a baseplate (11), a housing body (10), a ring shaped flexible element designed in the manner of a spring bellows and a reflecting plate (13). A quadrant detector (14) with a preconnected light chopper (15), as well as two or more adjusting elements (16) are arranged at the outer edge of the baseplate (11) for the correction of the direction are mounted on the base and fixing plate (11). The correction elements (16) react on the top end of the pressure proof housing across the ring shaped flexible element (12) onto the edge of the reflecting plate (13). A holographic optical pattern (13a) in the form of a rotation symemtrical Fresnel lens is applied on the rear side of the reflecting plate (13). The four quadrant detector (14) is assigned an electronic unit (14a), which determines the angular deviation amount of the laser beam (20) and delivers a correction control ...

Vorrichtung und Verfahren zum Messen von Abmessungen eines Abtastlichtpunktes

Optical power controlling apparatus for confocal laser scanning microscope, has control unit controlling high-frequency source as function of measured power so as to achieve selectable level of optical power

The apparatus has a detector (39) receiving a detection light that is lead along a detection beam path from a sample. An acousto-optical unit (13) is disposed in the illumination beam path and driven by a high-frequency source (57). A measuring device (55) measures an optical power. A control unit (53) controls the high-frequency source as a function of the measured power so as to achieve a selectable level of the power. An independent claim is also included for a method of controlling an optical power in a confocal laser scanning microscope.

Optical fibre coupling for transmission of laser light - has sensors incorporated in coupling cuff detecting transmitted light level

The optical fibre coupling incorporates a sensor (21,22) in the propagation path of the laser light detecting a physical parameter representing the light intensity, fed to a transducer circuit providing a corresp. electrical signal. The sensor and the associated signal transducer are contained within a hermetically sealed housing (10) acting as a coupling cuff with the electrical output signal obtained via a lead passed through the housing wall. The electrical signal is fed to an electronic measuring circuit (26) for regulation of the light output of the laser source. USE - For centralised power laser supply system.

Optische Sensoranordnung

Die Erfindung betrifft eine optische Sensoranordnung umfassend einen Sensor zur Detektion von elektromagnetischen Wellen und eine dem Sensor zugeordnete Apertur, wobei zur Detektion der durch die Apertur einfallenden elektromagnetischen Wellen mindestens zwei hintereinander angeordnete Sensoren vorhanden sind.

Meßeinrichtung für Strahlparameter der Bearbeitungsstrahlung einer Vorrichtung zur fotorefraktiven Korrektur von Fehlsichtigkeiten sowie Vorrichtung zur fotorefraktiven Korrektur von Fehlsichtigkeiten

Zur Vermessung der Strahlparameter der Behandlungsstrahlung (2) einer Vorrichtung (1) zur fotorefraktiven Korrektur von Fehlsichtigkeiten ist eine Meßeinrichtung vorgesehen. Diese umfaßt ein in dem Behandlungsbereich anstelle der zu behandelnden Augenhornhaut angeordneten und mit der Behandlungsstrahlung (2) beaufschlagbaren und bei Beaufschlagung mit Behandlungsstrahlung (2) Meßstrahlung (13) emittierendes Medium (11). Ferner weist die Meßeinrichtung eine Abbildungsoptik (22) auf, die den Beaufschlagungsbereich auf einen positionsempfindlichen Strahlungssensor (23) abbildet. Dieser erfaßt die Intensitätsverteilung der Meßstrahlung (13) über deren Querschnitt. Die Vorrichtung (1) weist zusätzlich eine Nachführvorrichtung (5 bis 9) zum kontinuierlichen Nachführen des Behandlungsstrahls (2) in der Behandlungsebene (10) auf, die mit einer eine Recheneinheit aufweisenden Steuereinrichtung (18) zusammenarbeitet. Der positionsempfindliche Strahlungssensor (23) steht mit der Steuereinrichtung ...

Wellenlängenmesser und zugehöriges Verfahren

Allgemein werden ein Wellenlängenmesser, ein zugehöriges Verfahren und ein zugehöriges System beschrieben. Bei einem Beispiel weist eine Vorrichtung Folgendes auf: eine Fotodiode zum Empfangen eines optischen Signals und zum Erzeugen eines Fotostroms beim Empfangen des optischen Signals, wobei die Fotodiode eine Absorptionskante hat, die im Wesentlichen auf ein Band von Wellenlängen ausgerichtet ist, wobei sich die Absorptionskante zu längeren Wellenlängen hin verschiebt, wenn eine Sperrvorspannung an die Fotodiode angelegt wird; und mit der Fotodiode verbundene Steuerelektronik zum Anlegen mindestens einer ersten Sperrvorspannung und einer zweiten Sperrvorspannung an die Fotodiode, wobei ein Verhältnis eines ersten Messwerts des Fotostroms bei der ersten Sperrvorspannung zu einem zweiten Messwert des Fotostroms bei der zweiten Sperrvorspannung Informationen zu der Wellenlänge des optischen Signals liefert.

Characterization of laser beam; involves using beam-shaping optical element to divide beam into sub-beams for detection using sensor with spatial resolution

The beam is divided by an optical element into sub-beams, whose intensities are detected using a sensor with spatial resolution. The phase distribution of the total radiation is determined from the single-beam direction distribution of the sub-beams. The aperture only lets through one sub-beam, and the beam cross-section is sequentially scanned. The optical element does not shape the beam and may be an aperture or pin diaphragm. The sensor may be a CCD camera or a pyro-camera detector. The detector may alternatively be a positive sensitive device (PSD), a four-quadrant detector or a line detector.

Detecting coherent point-source radiation

Detector apparatus for detecting paint source radiation such as a targetting laser includes a diffraction grating (11) having a period such that the incidence of coherent point-source radiation upon it produces a number of spaced self-images of the grating behind it. A Moiré grating (12) is placed to coincide with one of these self-images and a detector array (13 - 16) is placed behind the Moiré grating to detect the resulting interference fringes. ...

Optimisation of the laser operating point in a laser absorption spectrometer

An operating value of a first laser parameter of a laser device in a laser absorption spectrometer is optimised. The wavelength of laser device emitted light is adjusted by the first or a second laser parameter. The laser absorption spectrometer 100 comprises a lightintensity detector 120 measuring the laser light intensity from the laser device 110. For each of multiple values of the first laser parameter 112: the light intensity detector measures light intensity obtained across a range of second laser parameter values 114, and an extremum in the light intensity measure and a peak position for the extremum are identified. A range of first laser parameter values is identified within the values of the first laser parameter forwhich there is a continuous trend in changes to the identified peak position with changes to the first laser parameter. The first laser parameter operating value is set to be within the identified range. The laser parameters may comprise the laser diode temperature ...

Determining light distribution of vehicle light

A radiation characteristic, for example a light distribution, of a vehicle light, in particular a headlight, is determined by reference to a parameter based on the lights position, the illumination geometry or human perception of the illumination geometry. Illumination intensity is determined at at least a first point, preferably a plurality of first points on a straight line, in an illuminated area 1, and at each of a plurality of second points in an area 2 surrounding the device. A light distribution 3 is calculated, for example by taking symmetry into account, based on the determined intensity values, and output to at least one interface. Intensity at the second points may be determined by interpolating intensity values determined at the or each first point. The distribution can be compared with an ideal predetermined distribution and used to adjust the light during manufacture, for example to meet legal requirements.

CMOS wavefront sensors

A Complementary Metal Oxide Semiconductor (CMOS) wavefront sensor 2 has an array of photodiodes 6 formed on a substrate 10, which may be doped silicon. A passivation layer 14, eg. a nitride layer in a backend stack 12 of the CMOS sensor, is on the substrate 10 and has a binary lens 8 formed in it. The lens 8 focuses incident light 16 onto the sensor element 6. The light intensity on each photodiode 6 depends on the incident angle of the light beam 16. The binary lens 8 may be etched into the passivation layer 14 to create a pattern formed from two materials with different refractive indices, one of which may be air. The pattern may be concentric rings (fig 3b) or squares (fig 4).

STEREOLITHOGRAFI CAD/CAM DATENKONVERSION

PROCEDURE FOR CORRECTING THE OUTPUT SIGNAL OF A FROM SEVERAL ELEMENTS EXISTENCES OF INFRARED RADIATION-SENSITIVE SENSOR

LASER BEAM ANALYZER

Method and apparatus for detecting a laser

A laser detector apparatus (1) is provided, where a pixel array (3) is arranged behind a lens arrangement (4) such that distant objects (9) (in general, those at infinity) are out of focus at the pixel array. The image from the pixel array is evaluated by a computer processor (6) to detect such out of focus images which will be of a known size and shape (generally circular spots of known width). This can enable distant laser threats to be readily distinguished from nearby bright objects (10), whilst also protecting the pixel array from powerful laser sources (because the laser energy is not focussed to a point, on the pixel array it is less likely to damage the pixel array). It can also enable the wavelength of the laser to be accurately determined from the ratio of colours in the image of the laser spot, because it will typically not be a saturated image. The apparatus and method are particularly suitable for identifying and distinguishing laser sources across a wide range of brightnesses ...

Method and device for calibrating a light source of a medical device

The invention relates to a method for calibrating a light source (104) of a medical device (102). The light source (104) can be connected to at least one light-guiding fiber (112) such that electromagnetic radiation generated by the light source (104) with a defined light output is at least partly coupled into the light-guiding fiber (112). The medical device (102) is connected to at least one calibration port (108), said calibration port (108) having sensor means for ascertaining a spatial emission characteristic of a light-guiding fiber (112) introduced into the calibration port (108). The method has the steps of connecting the light-guiding fiber (112) to the light source (104); inserting a positioning device (110) for the light-guiding fiber (112) into the calibration port (108), wherein the positioning device (110) has a receiving channel for receiving the light-guiding fiber (112) and at least one emission opening, and the at least one emission opening allows the transmission of a ...

Very narrow band, two chamber, high rep rate gas discharge laser system

METHOD AND APPARATUS FOR MONITORING THE POWER OF A MULTI-WAVELENGTH OPTICAL SIGNAL

OPTICAL BEAM ANALYZER

... 16 A system for analyzing the characteristics of a light beam is disclosed. Functionally, the system includes an optical system for collecting the light beam to be analyzed. An array of light-sensitive elements is positioned at the focal plane of the optical system. A digital system sequentially samples the output signals of the light sensors and processes the resulting data to generate signals indicative of the characteristics of the light beam.

METHOD AND APPARATUS FOR DETECTING PULSED RADIATION

A method of detecting pulsed radiation comprising the steps of irradiating at least a portion of an array of sensor elements with pulsed radiation (71); addressing the array using a rolling shutter operation (72); reading the array to obtain a radiation image (73); and then applying a pulse detection operation (74) to the radiation image. The rolling shutter operation (72) is configured to address each element line of the array for a predetermined integration period. The predetermined integration period being calculated using an integration period function, itself a function of an anticipated pulse repetition interval of the pulsed radiation. The method and apparatus for the same enable low cost camera arrays to be used for pulse detection and for wider application in the field of low cost communications.

METHOD FOR CALIBRATING A ROTATABLE AND PIVOTABLE PIECE OF TECHNICAL STAGE EQUIPMENT

Method for calibrating a spotlight (1) to absolute angular coordinates, which spotlight (1) can be rotated about a pan axis (7) by inputting pan values and can be pivoted about a tilting axis (8) by inputting tilting values, wherein the spotlight generates an illuminated, preferably ellipsoidal region (5) on an underlying surface (3) by means of a directional light cone (4), wherein a light sensor (2) is positioned on the underlying surface (3), the illuminated region (5) is moved over the underlying surface (3) by rotating and pivoting the spotlight (1), the light sensor (2) detects the edges of the illuminated region (5), and a mapping rule of the pan values and/or of the tilting values of the headlight (1) onto the angular coordinates of the spotlight (1) is determined by rotating and/or pivoting the spotlight (1) and detecting the illuminated region (5) again.

DETECTOR OF ELECTROMAGNETIC RADIATION

A detector of electromagnetic radiation (RL) is described. The detector comprises: -an oriented polycrystalline layer (2) of thermoelectric material, -a substrate (1) superimposed on the top surface of the oriented polycrystalline layer so that the back surface (10) is in contact with the oriented polycrystalline layer, -first and second electrodes spaced the one from the other and in electrical contact with the oriented polycrystalline layer. The substrate comprises at least one ceramic layer and the oriented polycrystalline layer has a crystal orientation at an angle comprised between 30 degrees and 5 degrees relative to a normal to the top surface of the substrate.

METHOD AND APPARATUS FOR TRANSDERMAL IN VIVO MEASUREMENT BY RAMAN SPECTROSCOPY

The use of a transdermal Raman spectrum to measure glucose or other substance concentration can give an inaccurate result if the Raman signals originate at a wrong skin depth. To predict whether a spectrum of Raman signals received transdermally in a confocal detector apparatus and having at least one component expected to have an intensity representing the concentration of glucose or another skin component at a point of origin of said Raman signals below the surface of the skin will accurately represent said concentration, peaks in the spectrum at 883/4cm-1 and 894cm-1 are measured to determine whether the Raman signals originate primarily within the stratum corneum so that the spectrum will be less likely to represent said concentration accurately or originate primarily below the stratum corneum so that the spectrum will be more likely to represent said concentration accurately.

PROCESS FOR TESTING A LASER DEVICE

The invention relates to a method for testing a laser device (10) which is designed to provide focused, pulsed laser radiation, the focus position (18) of which can be varied both in and perpendicular to the direction of propagation of the laser radiation. The laser device comprises a contact element (30) which is transparent to the laser radiation and has a bearing surface (34) on which an object to be treated is placed. In the course of the method, a test object (36) which is transparent to laser radiation in at least one treatment area is placed against the bearing surface of the contact element. Laser radiation is then directed inside the test object that rests on the bearing surface, and the focus position is moved in accordance with a predefined test pattern in order to produce permanent treatment structures in the test object.

PORTABLE DEVICE FOR ANALYSING A PLURALITY OF WIDELY SPACED LASER BEAMS

A system and method for performing field measurement and testing of a plurality of widely spaced laser beams used in visual warning technology (VWT). VWT uses a combination of widely spaced laser beams, to warn civilians from approaching too close to military security areas. The widely spaced laser beams are displaced using rhomboidal prisms. Each rhomboidal prism receives a corresponding laser beam and displaces it toward a collecting lens. The lens focuses the displaced beams received thereon onto an imaging sensor for testing. Beam shutters may be used for selectively blocking one or more beams in order to test the beams separately and in different combinations.

RADIATION BEAM POSITION SENSOR

An apparatus for detecting the position of a primary beam of electromagnetic radiation, the apparatus including a leaky mirror for reflecting the primary beam and for extracting from the primary beam a secondary team and a position sensitive detector for detecting the spatial position of the secondary beam, wherein the leaky mirror comprises a material which has a transmissivity of less than 0.2 for the radiation of the primary beam and the position sensitive detector is arranged in the path of the secondary beam after transmission by the leaky mirror, the position of the secondary beam providing a measure of the position of the primary beam.

SYSTEM AND METHOD FOR DISCRIMINATING BETWEEN DIRECT AND REFLECTED ELECTROMAGNETIC ENERGY

An energy beam threat discrimination system (110) adapted for use with laser beam energy (134). The system (110) includes a first detector (114) for detecting a first laser signal. A second detector (112) detects a coherent laser signal. A timer circuit (124, 126) establishes a time interval between the detection of the first laser signal and the detection of the coherent laser signal and provides an output (130) in response thereto. A control circuit (128, 130) determines, based on the output (130), if the first laser signal and/or the second laser signal is threatening. In a specific embodiment, the first detector (114) provides an event detection flag (118) as an output in response to the detection of a first laser signal. The first detector (114) includes a high sensitivity laser light detector (142), a preamplifier (144), and an analog threshold circuit (146). The coherent detector (112) provides a coherent detection flag (116) as an output in response to the detection of the coherent ...

SYSTEM AND METHOD FOR DISCRIMINATING BETWEEN DIRECT AND REFLECTED ELECTROMAGNETIC ENERGY

An energy beam threat dis- crimination system (110) adapted for use with laser beam energy (134). The system (110) includes a first detector (114) for detecting a first laser signal. A second detec- tor (112) detects a coherent laser signal. A timer circuit (124, 126) establishes a time interval between the detection of the first laser sig- nal and the detection of the coher- ent laser signal and provides an output (130) in response thereto. A control circuit (128, 130) deter- mines, based on the output (130), if the first laser signal and/or the second laser signal is threatening. In a specific embodiment, the first detector (114) provides an event detection flag (118) as an output in response to the detection of a first laser signal. The first detector (114) includes a high sensitivity laser light detector (142), a pre-amplifie r (144), and an analog threshold circuit (146). The coherent detector (112) provides a coherent detection flag (116) as an output in response to the detection ...

Arrangement for measuring laser beam parameters has mirror with sensitive layer(s) applied to mirror substrate or in mirror coating, connected to evaluation circuit

The arrangement has a mirror with a mirror substrate (1) and layers of mirror coating at which the laser beam is reflected and to which sensors are attached. At least one sensitive layer (3,6) is applied to the mirror substrate or within the mirror coating and is connected to an evaluation circuit.

Verwendung eines Peltierelements als Hochleistungsstrahlungssensor und Hochleistungsstrahlungssensor.

Es wird die Verwendung eines Peltierelements (P) als Hochleistungsstrahlungssensor für elektromagnetische Strahlung mit Wellenlängen bis zu 20µm mit Strahlungsleistungen grösser 100 Watt, vorgeschlagen, wobei eine elektrische Spannung am Peltierelement (P) je nach durch die Strahlung induziertem Wärmefluss in Querrichtung (Q) des Peltierelementes (P) gemessen wird, wobei das Peltierelement (P) eine thermisch aktive Lage aus alternierend angeordneten ersten Thermosäulen (1) umfassend ein erstes Material (A) und zweiten Thermosäulen (2) umfassend ein zweites Material (B) aufweist und die Thermosäulen (1, 2) halbleiterfrei ausgeführt sind.

Sensor/regulation element assembly for regulating the beam of high-power lasers

L'invention concerne un ensemble capteur - élément de réglage pour le réglage du faisceau de lasers de forte puissance pour l'usinage des matériaux, sur le trajet duquel il est placé, qui permet en tant qu'organe unique, de détecter et de corriger simultanément les erreurs angulaires et les erreurs de focalisation des faisceaux de lasers de forte puissance.

DEVICE FOR THE CHARACTERIZATION OF A LASER EMISSION SPECTRAL

PROCESS AND DEVICE OF DETERMINATION OF the DISTRIBUTION Of INTENSITY AND PHASE IN VARIOUS PLANS OF CUT Of a Laser beam

L'invention concerne un procédé itératif de détermination de la répartition d'intensité et de phase dans un plan comportant : - la mesure de l'intensité Ii, i=1... N, du faisceau, dans N plans, N ≥ 3, dont le plan dans lequel on veut déterminer la répartition d'intensité et de phase, - le choix, pour le plan i=1, d'une matrice de phase eiφ1 de départ et le calcul d'une matrice d'amplitude complexe, par produit de la matrice de phase eiφ1 avec la matrice d'amplitude A1 correspondante, - pour chaque plan j>1 : * détermination d'une matrice complexe propagée B'j à partir de la matrice mesurée d'amplitude A j-1 du plan j-1 et de la matrice de phase eiφj-1 du plan j-1, * extraction, de B'j, d'une matrice de phase du plan j, - itération du procédé jusqu'à convergence, avec j=1 lorsque j-1=N.

MINIATURE SPECTROMETER EMBARKS IN A MOTOR VEHICLE HAS DETECTING OF MEASUREMENT AND DETECTOR OF REFERS SINGLE

METHOD AND DEVICE FOR VISUALIZATION OF TERAHERTZ ELECTROMAGNETIC RADIATION

Quantum effciency measuring instrument and method for photovoltaic detectors on individual laser pulses

WIRELESS CHARGING AND AUTONOMOUS DRIVING ELECTRIC WHEELCHAIR SYSTEM

The present invention relates to a wireless charging and autonomous driving electric wheelchair, which aids the movement or lift of a user in a wheelchair, having difficulty in walking or unable to walk, and notifies a fall, a bowl movement, and urination. The wireless charging and autonomous driving electric wheelchair comprises: a plurality of RFID articles configured by having an RFID tag attached or inserted thereto, wherein the RFID tag includes height information of an article, a name and usage of an article to which the RFID tag is attached or inserted, and information of a position where the article having the RFID tag attached or inserted thereto is disposed; an electric wheelchair wirelessly charged to be movable, communicating with the RFID articles, and linked to the RFID articles; and a power transmission module providing power to the electric wheelchair wirelessly. Accordingly, the wirelessly charging and autonomous driving electric wheelchair aids the movement or lift of ...

METHODS AND APPARATUS FOR BEAM DENSITY MEASUREMENT IN TWO DIMENSIONS

A beam density measurement system includes a shield, a beam sensor, and an actuator. The beam sensor is positioned downstream from the shield in a direction of travel of a beam. The beam sensor is configured to sense an intensity of the beam, and the beam sensor has a long dimension and a short dimension. The actuator translates the shield relative to the beam sensor, wherein the shield blocks at least a portion of the beam from the beam sensor as the shield is translated relative to the beam sensor, and wherein measured values of the intensity associated with changes in a position of the shield relative to the beam sensor are representative of a beam density distribution of the beam in a first direction defined by the long dimension of the beam sensor. © KIPO & WIPO 2009 ...

NUTRIENT SUPPLY CONTROL SYSTEM BASED ON WATER CONTENT OF PLANT GROWING MEDIUM AND WEIGHT OF PLANT

The present invention relates to a nutrient supply control system based on the water content of a plant growing medium and the weight of plants. The present invention comprises: a measuring device for transmitting the measurement information of each sensor, which includes a first water flow sensor for measuring the supplied amount of nutrient injected from a medium, in which plants were bedded, a medium water content percentage sensor for measuring the water content of the medium, a weight sensor for measuring the weight of the medium, in which plants are bedded, and a second water flow sensor for measuring the amount of nutrient discharged from the medium; and a control device for calculating the amount of nutrient absorbed by plants according to measurement information from the measuring device and calculating the weight of the plants to adjust the composition, injection time, injection speed and amount of nutrients supplied to the medium. By doing so, it is possible to automatically ...

OPTICAL POSITION DETECTION APPARATUS

Disclosed is an optical position detection apparatus. According to an embodiment of the present invention, the optical position detection apparatus comprises: a first optical fiber receiving a laser pulse; a photodetector detecting a laser pulse, received by the first optical fiber, to output the laser pulse as an electrical signal; and a controller calculating the position of the laser pulse based on the electrical signal. COPYRIGHT KIPO 2018 (100) Optical position detection apparatus (200) Base station ...

OPTICAL SENSOR

The present invention provides an optical sensor which is ultra-high sensitive, can realize simultaneous multiple various real-time detection, and is suitable for miniaturization and lightweight. The optical sensor comprises a sensing part which is provided in a laser cavity and senses characteristic change induced by light traveling the inside of an optical fiber by change of an external physical quantity. COPYRIGHT KIPO 2018 ...

예측성 교정 스케줄링 장치 및 방법

... 광원 내의 광학 디바이스에 관련된 교정을 스케줄링하기 위한 방법이 수행된다. 이러한 방법은 교정 장치 및 예측 제어기를 포함하는 교정 시스템에 의하여 수행될 수 있다. 이러한 방법은, 광학 디바이스가 교정되고 있는 동안에 상기 광학 디바이스와 연관된 속성을 수신하는 단계; 적어도 상기 광학 디바이스 속성에 기반하여 현재 열화 메트릭을 계산하는 단계 - 상기 열화 메트릭은 상기 광학 디바이스의 거동을 모델링함 -; 상기 현재 열화 메트릭에 기반하여 상기 광학 디바이스의 열화가 언제 임계를 초과할지를 추정하는 단계; 및 광학 디바이스 열화의 추정에 적어도 부분적으로 기반하여 상기 광학 디바이스의 교정을 스케줄링하는 단계를 포함한다.

Methods and apparatus for predicting performance of a measurement method, measurement method and apparatus

Method of picking up sectional image of laser light

A knife edge (30) is disposed at a height corresponding to a section on which a sectional image (light intensity distribution) is picked up in such a manner as to intercept a part of the section of the laser light (20). The knife edge (30) is irradiated with the laser light (20), and the sectional image of the laser light is enlarged with an image forming optics (40), and is picked up by a CCD (50). While picking up the sectional image in this manner, focusing of the image forming optics (40) is performed in such a manner that a gradient of light intensity in a boundary portion of shading by the knife edge (30) has a steepness which is not less than a preset target value. Next, the knife edge (30) is retracted from the optical path of the laser light, the laser light is allowed to enter the CCD (50) via the image forming optics (40), and the sectional image of the laser light is picked up.

Optimisation of the beam distribution of a radiation source

The invention relates to a radiation source (10), comprising: a. an illuminant (12); b. a first optical element (14); c. a sensor (15, 16, 17), whereby the sensor (15, 16, 17) is designed appropriately and is connected to the first optical element (14) appropriately such that the sensor (15, 16, 17) can be used to determine a change of a parameter of the first optical element (14) over time, whereby the parameter affects an optical property of the radiation source (10). Moreover, the invention relates to a method for the producing a product involving the provision of a radiation source (10) according to the invention as well as to a use of the radiation source (10) to increase the efficiency of conversions or changes of state of educts to products.

DEVICE AND METHOD FOR DETECTING LASER RADIATION

The invention relates to a device (1) for detecting laser radiation (45), comprising at least one light inlet (51) and at least one photoelectric transducer (5), which is designed to convert electromagnetic radiation (46) entering through the light inlet (51) into an electrical signal, wherein a modulator (4) is arranged in the beam path between the light inlet (51) and the photoelectric transducer (5), which modulator is designed to modulate laser radiation at a specifiable modulation frequency. The invention further relates to a corresponding method.

APPARATUS FOR FOCUS BEAM ANALYSIS OF HIGH POWER LASERS

An in-line laser beam waist analyzer system includes an optical prism that picks off a portion of a second surface reflection from either a laser processing focus lens or a protective debris shield for the processing lens and directs that focused light to a pixelated detector. This provides real time monitoring of the focused laser beam while it is processing material by welding, cutting, drilling, scribing or marking, without disrupting the process.

DEVICE FOR ANALYZING THE BEAM PROFILE OF A LASER BEAM

The invention relates to a device (6) for analyzing the beam profile of a laser beam (3), comprising: a mounting plate (7); a plurality of first temperature-sensitive measuring elements (9a to 9g), in particular diodes, which are attached at a plurality of measurement points to a first side of the mounting plate (7) in a preferably matrix-like arrangement; and a plurality of second temperature-sensitive measuring elements (11a to 11g), in particular diodes, which are attached to a second side of the mounting plate (7) in a further preferably matrix-like arrangement, wherein one of the first measuring elements (9a to 9g) is in each case arranged to lie opposite one of the second measuring elements (11a to 11g) and is thermally coupled thereto via tracks (12a to 12g, 13a to 13g) running through the mounting plate (7). The invention furthermore relates to a laser processing machine with such a device (6) and an associated method for analyzing the beam profile of a laser beam (3).

CARBON NANOTUBE NANOMETROLOGY, PURIFICATION, AND SEPARATION

The present invention provides systems and methods for quantifying, purifying and separating fullerenes, such as single wall carbon nanotubes (SWNTs). The purification/separation combination provides nearly 100% carbonaceous impurity-free SWNT content from a given impure sample and provides a desired chirality and diameter from a given non-separated sample. Nanometrological validation of the success of purification and separation uses a pyroelectric detector and Raman spectroscopy in a single system, thus providing a critical aspect for the nanomanufacturing environment. The purification/separation and nanometrological validations may be performed in a feedback loop to provide a satisfactorily refined sample and optimized purification/separation settings.

OPTICAL SYSTEM FOR ATTENUATING AND IMAGING AN OPTICAL BEAM FOR A SUBSEQUENT INTENSITY MEASUREMENT

An optical system for attenuating and imaging an optical beam for a subsequent intensity measurement of said optical beam comprises an input aperture for the optical beam, a collimating optical element for collimating the optical beam propagating divergently from the input aperture, an attenuating optical arrangement for attenuating the intensity of the optical beam propagating from the collimating optical element, the attenuating optical arrangement being arranged to modify the optical beam such that a beam portion with an intensity lower than the intensity of the optical beam is generated, the attenuating optical arrangement being insensitive to a polarization state of the optical beam, and a detector for measuring the intensity of the beam portion propagating from the attenuating optical arrangement.

METHOD AND DEVICE FOR DETERMINING A CHARACTERISTIC OF A BEAM, BY MEANS OF A ROTATING DISC, IN PARTICULAR IN A LASER PROCESSING MACHINE

A method is indicated for measuring a characteristic of a beam (A, A1.. A3) by means of a disc (3, 3a..3f ), which is rotatably mounted in a device (1) for determining this characteristic in a beam course of the beam (A, A1.. A3) in front of a sensor (6) for measuring an intensity of the beam (A, A1.. A3). For this, the disc (3, 3a..3f) is impermeable to the beam or at least weakens the beam and comprises at least one elongated region (B1.. B7) which is permeable to the beam or at least has higher permeability to the beam compared with the remainder of the disc (3, 3a..3e). By means of this device, an intensity impulse of the part of the beam (A, A1.. A3) impinging on the sensor (6) on rotation of the disc (3, 3a..3e) is detected. The sought characteristic is then determined by application of reconstruction- or modelling methods suitable for inverse problems on the detected intensity impulse. Furthermore, a device (1) and a disc (3, 3a..3f) are indicated for carrying out the method.

APPARATUS FOR MEASURING PROPERTIES OF A LASER EMISSION

Apparatus for measuring the numerical aperture of an optical fiber in the infrared region. The optical fiber (8) is appropriately mounted in accordance with conventional testing standards. Infrared energy is transmitted through the optical fiber (8). At a predetermined distance from the end of the optical fiber, a conversion screen (10) can be provided for transforming the emitted infrared energy into a lesser wavelength of energy. The energy distribution can be recorded with a detector compatible with the lesser wavelength energy whereby the numerical aperture can be computed from the recorded data.

MONITOR FOR AN OPTICAL FIBRE AND MULTI-GUIDE OPTICAL FIBRE CIRCUITS AND METHODS OF MAKING THEM

A monitor for monitoring the optical signal parameters in an optical fibre comprises a fibre (1) having an access region (9) of reduced cladding sufficient to allow access to the evanescent field of the optical fibre (1) and an optical element (11, 15) mounted adjacent to the access region (9) to obtain access to the evanescent field so as to enable use to be made of data therein.

Optical surveillance systems and methods

Systems and methods presented herein provide for optical surveillance using modulated lasers, or other forms of light, and optical detection. In one embodiment, an optical surveillance system includes a light source, such as a laser or light emitting diode, and a signal generator operable to modulate the light source. The system also includes a detector operable to detect the modulated light source and a processor communicatively coupled to the detector to distinguish the modulated light source from other detected light based on the modulating waveform of the modulated light source. The processor is also operable to determine a presence of an object between the laser and the detector based on an obscuration of the laser pulses on the detector.

Gas discharge laser light source beam delivery unit

A beam delivery unit and method of delivering a laser beam from a lasr light source for excimer or molecular fluorine gas discharge laser systems in the DUV and smaller wavelengths is disclosed, which may comprise: a beam delivery enclosure defining an output laser light pulse beam delivery path from an output of a gas discharge laser to an input of a working apparatus employing the light contained in the output laser light pulse beam; a purge mechanism operatively connected to the beam delivery enclosure; an in-situ beam parameter monitor and adjustment mechanism within the enclosure, comprising a retractable beam redirecting optic; a beam analysis mechanism external to the enclosure; and, a retraction mechanism within the enclosure and operable from outside the enclosure and operative to move the retractable beam redirecting optic from a retracted position out of the beam path to an operative position in the beam path. The BDU may also include a beam attenuator unit contained within the ...

Illumination apparatus, image production apparatus, and illumination light profile controlling method

An illumination apparatus and an image production apparatus including a plurality of laser beams are disclosed wherein a variation of the intensity distribution caused by a secular change or the like can be compensated to obtain illumination light having a high degree of uniformity even if some laser beam exhibits a drop in intensity or misses. The illumination apparatus includes a light source section including a laser light source, an optical system into which a plurality of laser beams are introduced, and a detection section for directly or indirectly detecting a light intensity distribution on a focal plane of the optical system. The illumination apparatus further includes an adjustment section for varying the light intensity distribution on the focal plane based on the detection information of the detection section.

Radiation detecting device and radiation detecting method

A radiation detecting device having a wavelength converter for converting radiation into photoelectrically convertible light and a plurality of pixels arranged in the form of a matrix which pixel comprises a sensor element for converting the light into an electric signal and a thin film transistor (TFT) for transfer connected to the sensor element to successively transfer a signal from the pixel, the detecting device comprises a means for turning on the TFT to be turned on first among the TFTs for transfer after the delay of at least (nx1), wherein 1 is a time constant of a characteristic of the wavelength converter, and n is ln(SN) in which SN is a desired signal to noise ratio, after the irradiation is stopped, thereby transferring a signal stored in its corresponding pixel.

Apparatus and Methods for Locating Source of and Analyzing Electromagnetic Radiation

Detectors and methods for gathering, detecting and analyzing electromagnetic radiation are disclosed. A radiation detector includes one or more positive lenses to direct radiation to mirrors or to a photodetector. Coordinates of directed radiation are measured and interpreted to determine the angle of arrival. A color filter mosaic may be present to determine wavelengths of detected radiation. Temporal characteristics of the radiation may be measured.

System and method for measuring and controlling an energy of an ultra-short pulse of a laser beam

A system for measuring the energy of an ultra-short pulse in a laser beam includes a half-wave plate for orienting the polarization of the beam. A polarizing beam splitter is used to reflect a portion of each pulse of the beam and a remainder of the beam is transmitted toward a target. Energy in the reflected portion is measured by a laser energy meter ("LEM") to determine the energy in the remainder of the beam. An output signal from the LEM is used to obtain an error signal that can then be used to rotate the half-wave plate to control the energy level in the remainder of the beam. In an alternate embodiment, a fixed-ratio beam splitter and a second LEM are used to measure and control the energy in the remainder of the laser beam.

Extreme ultraviolet light generating apparatus

An extreme ultraviolet light generating apparatus moves a generation position of extreme ultraviolet light based on an instruction from an external device and includes a chamber in which a target fed therein is irradiated with laser light so that the extreme ultraviolet light is generated from the target; a target feeder configured to output and feed the target into the chamber; a condensing mirror configured to condense the laser light on the target fed into the chamber; a stage configured to regulate a position of the target feeder; a manipulator configured to regulate a position of the condensing mirror; and a control unit configured to be able to control at least one of the stage, the manipulator, and a radiation timing of the laser light to the target, in a feedforward method, when the generation position is moved during generation of the extreme ultraviolet light.

Extending the lifetime of a Deep UV laser in a Wafer Inspection tool

Disclosed herein is a method and apparatus for automatic correction of beam waist position drift in real time, using wafer inspection data taken during normal tool operation. Also disclosed herein is an improved laser astigmatism corrector for use either internal or external to the laser.

METHOD FOR ADJUSTING STATUS OF PARTICLE BEAMS FOR PATTERNING A SUBSTRATE AND SYSTEM USING THE SAME

This invention provides a system capable of adjusting status of one or a plurality of particle beams, the system includes a plurality of particle detectors, an estimating unit and a controller, wherein one or a plurality of particle beams are projected to a substrate. The particle detectors detect the one or the plurality of particle beams reflected from the substrate to generate one or a plurality of detector signals in response thereto. The estimating unit estimates status information of the one or the plurality of particle beams by executing a mathematical method according to the one or the plurality of detector signals. The controller adjusts or corrects status of the one or the plurality of particle beams corresponding to the substrate according to the estimated status information of the one or the plurality of particle beams. The substrate is made pattern progressively in a sequence according to a desired pattern.

OPTICAL DEVICE, ELECTRICAL DEVICE AND PASSIVE OPTICAL COMPONENT

An optical device includes an active optical component including an optical area, an encapsulant covering the active optical component, and a passive optical component adhered to the encapsulant above the active optical component. The passive optical component has an optical axis, and the optical axis is substantially aligned with a center of the optical area.

Adjusting intensity of laser beam during laser operation on a semiconductor device

Among other things, a system and method for adjusting the intensity of a laser beam applied to a semiconductor device are provided for herein. A sensor is configured to measure the intensity of a laser beam reflected from the semiconductor device. Based upon the reflection intensity, an intensity of the laser beam that is applied to the semiconductor device is adjusted, such as to alter an annealing operation performed on the semiconductor device, for example.

APPARATUS AND METHODS FOR THREE-DIMENSIONAL SENSING

A three-dimensional (3D) sensing apparatus together with a projector subassembly is provided. The 3D sensing apparatus includes two cameras, which may be configured to capture ultraviolet and/or near-infrared light. The 3D sensing apparatus may also contain an optical filter and one or more computing processors that signal a simultaneous capture using the two cameras and processing the captured images into depth. The projector subassembly of the 3D sensing apparatus includes a laser diode, one or optical elements, and a photodiode that are useable to enable 3D capture.

Coarse spectrometer with a grating

A quasi-monochromatic light beam carrier for a particular telecommunication channel is likely to experience drift because of age, temperature, or other factors, and may cause the centroid wavelength of the carrier to shift. Temperature adjustments by wavelength lockers to compensate for drift on one channel may affect the performance of other channels. Embodiments of the present invention couple a quasi-monochromatic light beam through a substrate-based grating, diffract the light beam from the edge of the substrate to free space, and detect the light beam from free space at a position detector to determine the centroid wavelength based on a position of the light beam incident on the detector. The diffracted light beam may be reflected within the substrate a number of times prior to exiting the substrate towards the detector.

Bolometric Device with Receiving Cavity for Measuring the Power of a Beam of High Frequency Microwaves and Process for Coating the Internal Surface of Said Cavity

The present invention describes a bolometric device with receiving cavity for measuring a beam of high frequency microwaves, comprising a hollow body ( 1 ) with receiving cavity ( 50 ) having an opening ( 2 ) for the entrance of said beam of high frequency microwaves in said receiving cavity ( 50 ), a diverging mirror ( 3 ) located in the lower part of said cavity ( 50 ) for reflecting said beam of microwaves on an absorbent coating material ( 4 ) applied on the internal surface ( 5 ) of the hollow body ( 1 ), a cooling circuit ( 7 ) for transferring the thermal energy accumulated on the absorbent coating material ( 4 ) and a circuit ( 6 ) for measuring the power of the beam of high frequency microwaves entering the hollow body ( 1 ). Said absorbent coating material ( 4 ) consists of boron carbide. In addition a procedure is described for coating with an absorbent material the internal surface ( 5 ) of a hollow body ( 1 ) being part of the aforementioned device for measuring a beam of high ...

Laser Measurement Apparatus Having a Removable and Replaceable Beam Dump

The present application discloses an apparatus configured to measure characteristics of high power beams of laser energy used in material processing. In one embodiment, the apparatus includes a housing having a first compartment and a second compartment separated from each other to reduce the transfer of thermal energy between them. Optical modules having optical sensors configured to measure characteristics of the high power beam are mounted in the first compartment. An optical window operative to allow a significant portion of the beam to propagate therethrough is mounted in an intermediate housing member separating the first and second compartments. A removable and replaceable beam dump configured to absorb most of the high power beam is positioned in the second compartment. The removability/replaceability of the beam dump enables operation of the apparatus without active cooling of the beam dump assembly, simplifying the apparatus and protecting the optical sensors in the first compartment ...

ILLUMINATING SYSTEM

An illumination system includes a light source device (12) configured by an excitation light source (16), an optical fiber (18), and a wavelength conversion unit (20) that are connected in order, and an operation check device (14) for checking a normal operation of the light source device. The illumination system further includes a connector (40) for directly and physically connecting the operation check device to a light signal emitting end (32) which has the wavelength converter in the light source device, a light amount detector (28) for detecting a light signal (O) emitted from the light signal emitting end when the light signal emitting end and the operation check device are connected by the connector, and an operation determiner (22) having a determination circuit for determining the operations of the excitation light source, the optical fiber, and the wavelength conversion unit by a detection result in the light amount detector.

DETERMINATION AND MONITORING OF LASER ENERGY

INSTRUMENT FOR MEASURING THE POWER OF OPTICAL RADIATION, IN PARTICULAR LASER RADIATION

The invention concerns an instrument for measuring the power of optical radiation (9), in particular laser radiation, the instrument having a tubular housing, holding several radiation-absorbing elements (3), plus a temperature sensor (4) with which the temperature increase produced by the absorded radiation is measured, this temperature increase being taken as a measure for determinig the radiant power. The aim of the invention is to design an instrument of this kind which is simple in construction and can be used to measure high radiant powers in the multi-kilowatt range without the need for water cooling. This aim is achieved by virtue of the fact that the radiation-absorbing elements are made up of several net-, honeycomb- or grid-type structures (3) which are fitted in the housing so that they are located at intervals from each other and at right angles to the direction of the radiation entering the housing. The housing is fitted with a fan (2) which draws air through the structures ...

Stereolithographic supports

LASER OUTPUT MEASURING DEVICE

PURPOSE: The force that the vapor gas evolved in laser beam receiving face forces liquid face is measured by using liquid of high absorptivity on the laser beam receiving face, whereby the output of high output laser is measured. COPYRIGHT: (C)1977,JPO&Japio ...

EVALUATING DEVICE FOR OPTICAL MEMBER

PURPOSE: To grasp a spot image as a numeral quantitatively and to perform high-accuracy adjusting operation and accurate inspection by picking up the spot image by a TV camera through a lens and calculating the numeral corresponding to the area of the spot image. CONSTITUTION: A beam for inspection generated by a beam irradiating device 11 (e.g. He-Ne laser generating device) is incident on a microscope objective 14 through a beam expander 12, a reflecting member 13, and objectives 1 and 2. The spot image of the beam for inspection which is detected by the lens 14 is picked up by the TV camera 15 and projected on a TV monitor 16. Then, part of the video signal 20 of the TV camera 15 which is higher than a reference voltage is extracted by a gate circuit 21 and the time of the extracted signal is integrated by a counter 22. An area display device 23 is connected to the counter 22 and the integrated value is displayed. This display value corresponds to the area of the spot image of the beam ...

ДАТЧИК НАПРАВЛЕННОСТИ СВЕТА

Изобретение относится к области оптического приборостроения и касается датчика направленности света. Датчик направленности света содержит фотоприемное устройство, состоящее из множества фоточувствительных элементов. На фотоприемном устройстве расположена матрица светопоглощающих структур. Светопоглощающие структуры имеют варьирующиеся структурные характеристики. Варьирующиеся структурные характеристики достигаются посредством формирования каждой отдельной структуры последовательности так, что она дает возможность восприятия света в пределах различных интервалов углов относительно матрицы. При этом, каждая из светопоглощающих структур включает разное количество фоточувствительных элементов. Технический результат заключается в уменьшении размеров и повышении надежности устройства. 3 н. и 12 з.п. ф-лы, 13 ил., 1 табл.

Thermoelectric detector used to detect radiation - comprises active surface made of thin layer of crystalline solid body

Thermoelectric detector (I) comprises an active surface made of a thin layer of a crystalline solid body with anisotropic thermoforce. The surface normal of the layer does not coincide with one of the main anisotropic directions. Pref. a high temp. superconductor is used as thermoelectrical anisotropic material. The superconductor is RBa2Cu3O7-d (R is rare earth) and the direction of the main anisotropic axes occurs by epitaxial growth on a substrate crystal, cut in such a way that its (100) surfaces appear at an angle alpha greater than 0 from the substrate surface. A corresp. angle between the surface normal of the layer and the crystallographic c-axis of the layer results. USE/ADVANTAGE - (I) can be used to detect continuous or pulsed radiation.

Vorrichtung zur Messung einer Leistungsdichteverteilung einer Strahlungsquelle

Die Erfindung betrifft eine Vorrichtung (1) zur Messung einer Leistungsdichteverteilung einer Strahlungsquelle (11), wobei die Vorrichtung die folgenden Merkmale aufweist: eine Strahlungsquelle, die ausgebildet ist, einen Lichtstrahl (L) in eine Strahlungsrichtung (SR) auszusenden; ein der Strahlungsquelle in Strahlungsrichtung nachgeordnetes Substrat (2) mit einer Ausdehnung in eine x-Richtung und eine y-Richtung, wobei das Substrat einen ersten Bereich (3) und zumindest einen weiteren zweiten Bereich (4) aufweist und der erste Bereich eine diffraktive Struktur (5) umfasst, die ausgebildet ist, den auf das Substrat auftreffenden Lichtstrahl in eine nullte Beugungsordnung (6) und zumindest eine erste Beugungsordnung (7) zu trennen; und eine dem Substrat in Strahlungsrichtung nachgeordnete Detektoreinheit (8), die ausgebildet ist, die Intensität der durch das Substrat transmittierten ersten Beugungsordnung zu messen und daraus eine Leistungsdichteverteilung abzuleiten.

Process for determining the focus position of a laser beam in relation to the workpiece surface e.g. in welding comprises comparing a characteristic of a luminescent plate formed on the surface by the laser beam with a reference value

Process for determining the focus position (24) of a laser beam (10) in relation to the workpiece surface (11) comprises comparing a characteristic of a luminescent plate formed on the solid body surface by the laser beam with a reference value.

Flexibles nichtlineares Laserscanning-Mikroskop zur nicht-invasiven dreidimensionalen Detektion

Flexibles nichtlineares Laserscanning-Mikroskop zur nicht-invasiven dreidimensionalen Detektion, enthaltend mindestens eine Strahlungsquelle, die einen Anregungsstrahl zur Auslösung einer von Atomen und Molekülen emittierten Sekundärstrahlung erzeugt, eine flexible Übertragungsoptik zur Übertragung der Strahlung zu einem Messkopf mit einer Fokussieroptik, mit der die Strahlung in ein Messobjekt fokussiert und die emittierte Sekundärstrahlung zurückgeführt und auf mindestens ein Detektorsystem gerichtet ist, wobei der Messkopf frei im Raum schwenkbar, drehbar und flexibel positionierbar mit der mindestens einen Strahlungsquelle verbunden ist, sodass Mikroskopie unter beliebigen Raumwinkeln ausführbar ist, dadurch gekennzeichnet, dass mindestens ein steuerbarer Kippspiegel (2) zur Umlenkung und Ausrichtung wenigstens eines Anregungsstrahls (11; 12) gepulster Laserstrahlung der mindestens einen Strahlungsquelle derart angeordnet ist, um den wenigstens einen Anregungsstrahl (11; 12) durch die ...

Verfahren und Vorrichtung zur Kalibration einer Lichtquelle einer medizinischen Vorrichtung

Die Erfindung betrifft ein Verfahren zur Kalibration einer Lichtquelle (104) einer medizinischen Vorrichtung (102), wobei die Lichtquelle (104) mit wenigstens einer lichtleitenden Faser (112) so verbindbar ist, dass von der Lichtquelle (104) erzeugte elektromagnetische Strahlung einer definierten Lichtleistung in die lichtleitende Faser (112) zumindest teilweise eingekoppelt wird. Die medizinische Vorrichtung (102) ist mit wenigstens einem Kalibrationsport (108) verbunden, wobei der Kalibrationsport (108) Sensormittel zur Ermittlung einer räumlichen Abstrahlcharakteristik einer in den Kalibrationsport (108) eingeführten lichtleitenden Faser (112) aufweist. Das Verfahren weist dabei das Verbinden der lichtleitenden Faser (112) mit der Lichtquelle (104), das Einsetzen einer Positioniervorrichtung (110) für die lichtleitende Faser (112) in den Kalibrationsport (108), wobei die Positioniervorrichtung (110) einen Aufnahmekanal zur Aufnahme der lichtleitenden Faser (112) sowie wenigstens eine ...

INTENSITAETSMESSEINRICHTUNG

Einrichtung und Verfahren zur Erkennung von Laserstrahlung

Die Erfindung betrifft eine Einrichtung (1) zur Erkennung von Laserstrahlung (45) mit zumindest einem Lichteintritt (51) und zumindest einem photoelektrischen Wandler (5), welcher dazu eingerichtet ist, durch den Lichteintritt (51) eintreffende elektromagnetische Strahlung (46) in ein elektrisches Signal zu wandeln, wobei im Strahlengang zwischen dem Lichteintritt (51) und dem photoelektrischen Wandler (5) ein Modulator (4) angeordnet ist, welcher dazu eingerichtet ist, Laserstrahlung mit einer vorgebbaren Modulationsfrequenz zu modulieren. Weiterhin betrifft die Erfindung ein entsprechendes Verfahren.

Transparente Mess-Sonde für Strahl-Abtastung

Die Erfindung betrifft eine Mess-Sonde zur Abtastung von Lichtstrahlen 10 oder Laserstrahlen. Die Mess-Sonde ist geeignet zur Abtastung von Laserstrahlen mit sehr hoher Leistung und zur Bestimmung von geometrischen Parametern eines Lichtstrahls 10 mit hoher Ortsauflösung. Dazu wird eine Vorrichtung vorgeschlagen, die einen Körper 20, einen Sonden-Bereich 30 und einen Detektor 40 umfasst. Der Körper 20 besteht aus einem optisch transparenten Material und hat eine Lichtstrahl-Eintrittsfläche 22, eine Lichtstrahl-Austrittsfläche 23 und eine Detektionslicht-Austrittsfläche 25. Die Lichtstrahl-Eintrittsfläche 22 und die Lichtstrahl-Austrittsfläche 23 sind im Wesentlichen glatt und poliert. Der Körper 20 beinhaltet den Sonden-Bereich 30, der eine lichtablenkende Strukturierung aufweist. Der Detektor 40 ist ausgebildet, wenigstens einen Teil des vom Sonden-Bereich 30 aus dem Lichtstrahl 10 abgelenkten Strahl-Anteils 15 zu erfassen. Der Körper 20 und der Lichtstrahl 10 sind in zwei verschiedenen ...

VORRICHTUNG UND VERFAHREN ZUR BESTIMMUNG EINER WELLENLÄNGE EINER STRAHLUNG

Die Erfindung betrifft eine Vorrichtung und ein Verfahren zur Bestimmung einer Wellenlänge einer Strahlung.

Apparatus and method for profiling a beam of a light emitting semiconductor device

Profiling a beam of a light emitting semiconductor device comprising a light emitting semiconductor device 102 with an active region 108 formed on a substrate 104 and configured to generate light when a suitable electrical current is applied to contacts on an upper surface of the device. The device further has a light emitting surface 110 defined by a lower surface of the substrate opposite the contacts. A transmission medium 112 comprising a first surface 114 is in contact with at least part of the light emitting surface of the semiconductor device and a diffusion surface 116 is opposite the first surface, and configured to diffuse light emitted from the micro-LED. The beam may be profiled with a beam profiler and may also use a power meter. The diffusion surface may be configured to diffuse light in a substantially Lambertian profile. The transmission medium may comprise either glass or sapphire.

A photon detector and a photon detection method

A clutch mechanism

... 1,038,927. Positive clutches. INTERNATIONAL BUSINESS MACHINES CORPORATION. July 23, 1965 [Aug. 21, 1964], No. 31443/65. Headings F2C and F2L. A clutch device comprises a continuously rotating toothed drive wheel 18 which can be coupled to a disc 20 secured to the driven shaft 12 by means of primary and secondary clutch members 22, 24, of which the secondary member 24 is arranged to be effective at least during the period of disengagement of the primary member 22. The clutch members are in the form of pawls 22, 24 carrying single teeth 32, 40 engageable with wheel 18, member 22 having an end pivot 26 and member 24 an intermediate pivot 34, the ends of the pawls being connected by a spring 46 whereby teeth 32, 40 are normally biased into and out of engagement with wheel 18 respectively. The end of pawl 22 adjacent its pivot 26 has a projection 54 engageable with a shoulder 52 on a trip member 48 loaded by a spring 56 which may be overridden by a magnet armature 48a, the trip being actuated ...

Monitoring a laser beam

Monitoring a laser beam (1) by means of a partially reflective mirror (3) which divides the beam (1) into a low intensity transmitted beam (5) and a high intensity reflected beam (4) having similar intensity distributions over their cross-sections and sensing the intensity distribution over a cross-section of the low intensity beam (5) by means of a thermal imaging camera (6) to produce a display representative of the intensity distribution of the intensity beam (4) on an oscilloscope 7. The intensity distribution of the laser beam (1) and/or the position of the beam (1) can thus be monitored.

Omnidirectional Sun Position Sensing Device

A method is provided to track the sun. An omnidirectional sensor is used for acquiring sun's position. The sensor can track sun's position in an omnidirectional way. A controller is also provided to control the tracking. When the sun shines strongly, the sensor is controlled to track the sun's position. When the sun does not shine strongly, the tracking is stopped. Thus, the cost for tracking the sun's position is reduced and accuracy of the tracking is enhanced.

Signs-of-deterioration detector for semiconductor laser

A signs-of-deterioration detector for a semiconductor laser includes a first light receiving section that acquires first information relating to an optical output of the semiconductor laser and a second light receiving section that acquires second information relating to an intensity distribution of the emission pattern below the lasing threshold of the semiconductor laser. The detector also includes a holding section that holds the first information and the second information at a predetermined time point T 1 . The detector further includes a deciding section that decides the presence or absence of signs of rapid decrease of the optical output of the semiconductor laser by comparing the first information and the second information at at least one time point Tn (T 1 <Tn), with those at the time point T 1.

OPTICAL SURVEILLANCE SYSTEMS AND METHODS

Systems and methods presented herein provide for optical surveillance using modulated lasers, or other forms of light, and optical detection. In one embodiment, an optical surveillance system includes a light source, such as a laser or light emitting diode, and a signal generator operable to modulate the light source. The system also includes a detector operable to detect the modulated light source and a processor communicatively coupled to the detector to distinguish the modulated light source from other detected light based on the modulating waveform of the modulated light source. The processor is also operable to determine a presence of an object between the laser and the detector based on an obscuration of the laser pulses on the detector. 1. An optical surveillance system , comprising:a light source;a signal generator operable to modulate the light source;a detector operable to detect the modulated light source; anda processor communicatively coupled to the detector and operable to distinguish the modulated light source from other detected light based on the modulating waveform of the modulated light source, wherein the processor is further operable to determine a presence of an object between the laser and the detector based on an obscuration of the light source on the detector.2. The optical surveillance system of claim 1 , wherein:the light source is a laser operable to fire laser pulses; andthe signal generator is operable to modulate the pulse repetition frequency of the laser pulses.3. The optical surveillance system of claim 1 , further including:an optical element operable to fan the light.4. The optical surveillance system of claim 1 , wherein:the processor is further operable to determine a location of the object in a fence plane established between the light source and the detector.5. The optical surveillance system of claim 5 , wherein:the processor is further operable to determine a size of the object in the fence plane based on the location of the ...

OPTICAL CONTROL SENSOR SYSTEM

A optical control sensor system includes a driver controlling an operation of a light source coupled to an end of an optical fiber, an orthogonal signal generator, generating a set of different orthogonal signals controlling the driver, a terminal sensor coupled to another end of the optical fiber selecting a predetermined set of input orthogonal signals for converting them into component combinations, constituting output signals, and directing the output signals back to the optical fiber, a device coupled to the light sources and to the first end of the optical fiber for extracting output signals that have passed through a return path in the optical fiber, a detector converting optical output signals into electrical signals, and a selector and a decoder connected to the orthogonal signal generator indicating a current state of the optical control sensor system based on an analysis of the selected combinations of components in the output signals. 1. An optical control sensor system comprising:a light source for emitting light;an orthogonal signal generator, generating a set of different orthogonal signals; anda driver for switching frequencies of the set of different orthogonal signals and modulating an intensity of the light.2. The optical control sensor system of claim 1 , further comprising:a optical fiber receiving the light of the light source at a first end thereof;a terminal sensor coupled to a second end of the optical fiber, the terminal sensor selecting a predetermined set of the different orthogonal signals for converting them into component combinations, constituting output signals, and directing the output signals to the second end of the optical fiber;a device coupled to the light sources and to the first end of the optical fiber for extracting the output signals that have passed through a return path in the optical fiber;a detector converting the output signals into a plurality of electrical signals; anda selector and a decoder connected to the ...

METHOD AND DEVICE FOR DETERMINING A RADIATION CHARACTERISTIC FOR AN ILLUMINATION DEVICE OF A VEHICLE

A method for determining a radiation characteristic for a vehicle illumination device to be produced from possible radiation characteristics based on a parameter is provided. The parameter is selected from an illumination geometry that can be generated by the device in a surroundings of the device, a device position, and a person-related type of perception. The method includes determining a first value of a light intensity that can be generated for a first point located within an illuminatable area based on the parameter. A second value of the light intensity that can be generated by the illumination device is determined for second points based on the first value. The second points are arranged in the surroundings of the illumination device. A light distribution that can be generated by the illumination device is determined based on the first and second values and the light distribution is outputted to an interface. 1. A method for determining a radiation characteristic for an illumination device of a vehicle to be produced from a plurality of possible radiation characteristics based on at least one parameter , wherein the at least one parameter is selected from a group consisting of an illumination geometry that can be generated by the illumination device in a surroundings of the illumination device , a position of the illumination device on the vehicle , and a person-related type of perception of a generated illumination geometry , wherein the method comprises the steps of:determining a first value of a light intensity that can be generated for at least one first point located within an illuminable area that can be illuminated by the illumination device, based on the at least one parameter;determining a second value of the light intensity that can be generated by the illumination device for each point of a plurality of second points, based on the first value of the light intensity, wherein the plurality of second points is arranged in the surroundings of the ...

RESONATOR CONTROL APPARATUS

According to one embodiment, a resonator control apparatus includes: a first light source that outputs resonance light λ; a second light source that outputs first control light λ; a third light source that outputs second control light λof a visible wavelength region or a near-infrared wavelength region; a pair of high reflective mirrors whose resonator length is set to ()×−(wavelength of the resonance light λ×integer); a photodetector that monitors transmitted light from the mirror pair; an integrator that captures and integrates two signals detected by the photodetector; a resonator length control unit that controls the resonator length of the mirror pair; and a driver that applies, to the resonator length control unit, a voltage that is calculated by capturing an output signal from the integrator in such a way as to maximize transmittance detected by the photodetector. 1. A resonator control apparatus , comprising:{'sub': '0', 'a first light source that outputs resonance light λof a middle-infrared wavelength region or a THz wavelength region;'}{'sub': '1', 'a second light source that outputs first control light λof a visible wavelength region or a near-infrared wavelength region;'}{'sub': '2', 'a third light source that outputs second control light λof a visible wavelength region or a near-infrared wavelength region;'}{'sub': '0', 'a pair of high reflective mirrors whose resonator length is set to (½)×−(wavelength of the resonance light λ×integer);'}{'sub': 1', '2, 'a photodetector that monitors transmitted light of the first control light λand second control light λtransmitted from the mirror pair;'}an integrator that captures and integrates two signals detected by the photodetector;a resonator length control unit that controls the resonator length of the mirror pair; anda driver that applies, to the resonator length control unit, a voltage that is calculated by capturing an output signal from the integrator and performing a feedback operation in such a way as ...

DYNAMIC FIELD MONITORING SYSTEM IN INTENSITY MODULATED RADIOTHERAPY BEAMS

Systems and method for monitoring an actual shape of a radiation therapy beam. The radiation therapy beam passes through a scintillation sheet. A light field emitted by the scintillation sheet is captured by a camera. Image data captured by the camera is processed to generate a processed image of the actual shape of the radiation therapy beam. The processed image of the actual shape of the radiation therapy beam may be compared to a programmed shape of the radiation therapy beam. 1. A method for monitoring an actual shape of a radiation beam during a modulated radiotherapy session , the method comprising:applying, by a treatment machine, the radiation beam to a scintillation sheet;capturing, by a camera, an image of a scintillating light field on the scintillation sheet;transmitting the image to a processing circuit;performing, by the processing circuit, image processing on the image; andgenerating a processed image of the actual shape of the radiation beam.2. The method of wherein the image processing comprises:correcting, by the processing circuit, a shape of the image transmitted by the camera;correcting, by the processing circuit, an intensity of the image transmitted by the camera; andperforming, by the processing circuit, an image segmentation of the image transmitted by the camera.3. The method of further comprising generating display data configured to display the processed image on a user interface.4. The method of claim 3 , wherein displaying processed image on the user interface is done in substantially real time providing a continuous image of the radiation beam shape.5. The method of further comprising generating display data configured to display a programmed shape of the radiation beam on the user interface.6. The method of further comprising:comparing the processed image of the actual shape and the programmed shape of the radiation beam;calculating a discrepancy between the processed image of the actual shape and the programmed shape of the radiation ...

LIGHT DISTRIBUTION CHARACTERISTIC MEASUREMENT APPARATUS AND LIGHT DISTRIBUTION CHARACTERISTIC MEASUREMENT METHOD

A light distribution characteristic measurement apparatus for measuring the light distribution characteristic of a light source is provided. The apparatus includes a plurality of detectors arranged so that they have a predetermined relative relationship with each other. One detector has a detection range at least partially overlapping a detection range of another detector adjacent to the former detector. The apparatus further includes a drive unit that drives a plurality of detectors as one unit to update a positional relationship of the plurality of detectors relative to the light source, and a calculation unit that calculates the light distribution characteristic of the light source by performing a process depending on at least one of a relative relationship between a plurality of detectors and overlapping of respective detection ranges thereof, based on respective results of detection that have been acquired by the plurality of detectors at the same timing. 1. A light distribution characteristic measurement apparatus for measuring a light distribution characteristic of a light source , comprising:a plurality of detectors arranged so that said detectors have a predetermined relative relationship with each other, one detector having a detection range at least partially overlapping a detection range of another detector adjacent to said one detector;a drive unit configured to drive said plurality of detectors as one unit to update a positional relationship of said plurality of detectors relative to said light source; anda calculation unit configured to calculate the light distribution characteristic of said light source by performing a process depending on at least one of the relative relationship between said plurality of detectors and overlapping of respective detection ranges of said plurality of detectors, based on respective results of detection that have been acquired by said plurality of detectors at the same timing.2. The light distribution characteristic ...

Method for measuring light intensity distribution

A method for measuring intensity distribution of light includes a step of providing a carbon nanotube array having a top surface. The carbon nanotube array is located in an inert gas environment or a vacuum environment. A light source irradiates the top surface of the carbon nanotube array, to make the carbon nanotube array radiate a radiation light. An imaging element images the radiation light, to obtain an intensity distribution of the light source.

Illumination system

An illumination system includes a light source device configured by an excitation light source, a light guiding member and a wavelength converter that are connected in order, and an operation check device. The system further includes: a connector configured to directly and physically connect the operation check device to a light signal emitting end which includes the wavelength converter; a detector configured to detect a light signal emitted from the light signal emitting end when the light signal emitting end and the operation check device are connected by the connector; and an operation determiner configured to determine the operations of the excitation light source, the light guiding member, and the wavelength converter by a detection result in the detector.

Method of Determining a Focal Point or Beam Profile of a Laser Beam in a Working Field

In a method for determining the focal point or the beam profile of a laser beam, which can be deflected in the x and y directions by a scanner optic or an x-y-movement unit and can be displaced in the z direction by a focusing optic or a z-movement unit, at a plurality of measurement points in the two-dimensional working field or three-dimensional working space of the laser beam. An aperture diaphragm, followed by a detector, is arranged at each measurement point. At each measurement point, for x-y-focal point or beam profile measurements, the laser beam is moved by the scanner optic or the x-y-movement unit in an x-y-grid over the measurement aperture in the aperture diaphragm, and, at each grid point, the laser power is measured by the detector, the scanner axis of the scanner optic or the x-y-movement unit being stationary. For z-focal point measurements, the laser beam is displaced by the focusing optic or the z-movement unit in the z direction within the measurement aperture in the aperture diaphragm. The laser power is measured by the detector at each grid point. The focal point and/or the beam profile of the laser beam is then determined at each measurement point from the measurement values. 1. A method of determining a property of a laser beam , wherein the property comprises at least one of an x-y-focal point or a beam profile , the method comprising:moving the laser beam to each of a plurality of measurement points in a working area;at each measurement point, adjusting a position of the laser beam to each of a plurality of grid points of an x-y-grid across a measurement aperture defined in an aperture diaphragm;detecting, with the laser beam positioned at each grid point, a power value of the laser beam using a detector arranged behind the aperture diaphragm; anddetermining, at each measurement point, the property of the laser beam from the detected power values.2. The method of claim 1 , wherein moving the laser beam comprises deflecting the laser beam in ...

METHOD AND APPARATUS FOR ASSESSING A QUALITY OF A HEADLIGHT

In a method of assessing a quality of a headlight of a motor vehicle during travel or operation on a shake bench facility, operation of the headlight is monitored by a camera. A camera image or a chronological sequence of camera images is evaluated as a function of at least one predefined criterion, such as, e.g., a brightness distribution. 1. A method of assessing a quality of a headlight of a motor vehicle during travel or operation on a shake bench facility , comprising:monitoring the headlight using a camera; andevaluating a camera image or a chronological sequence of camera images as a function of at least one predefined criterion.2. The method of claim 1 , wherein the at least one predefined criterion is a brightness distribution.3. The method of claim 1 , wherein the at least one predefined criterion is a change in time of a brightness or brightness distribution.4. The method of claim 2 , further comprising subdividing each camera image into a predefined number of subimages claim 2 , and determining a brightness of the subimages claim 2 , for ascertaining the brightness distribution.5. The method of claim 4 , further comprising determining for a chronological sequence of the subimages for each subimage a minimum claim 4 , mean value claim 4 , and maximum of the brightness for a predefined time period.6. The method of claim 1 , wherein the at least one predefined criterion is a location of a light-dark boundary of the headlight.7. Apparatus for assessing a quality of a headlight of a motor vehicle during travel or operation on a shake bench facility claim 1 , comprising:a light box secured to the motor vehicle at a location to ensure a radiation of the headlight into the light box;a camera accommodated in the light box; anda computer for evaluating image data captured by the camera.8. The apparatus of claim 7 , wherein the camera and the computer are connected by wireless communication for transmission of image data captured by the camera to the computer.9. ...

Sensors, Systems and Methods for Position Sensing

Various systems and methods for estimating the position of a radiation source in three-dimensional space, together with sensors for use in such systems are described. In some embodiments, the systems include a plurality of radiation sensors. The three-dimensional position of the radiation source is estimated relative to each sensor using an aperture that casts shadows on a radiation detector as a function of the incident angle of the incoming radiation. In some embodiments, the ratio of a reference radiation intensity to a measured radiation intensity is used to estimate direction of the radiation source relative to the sensor. When the angular position of the radiation source is estimated relative to two sensors, the position of the radiation source in three dimensions can be triangulated based on the known relative positions of the two sensors. 115.-. (canceled)16. A system for estimating the position of a radiation source in three dimensional space , the system comprising: a first reference radiation detector for providing a first reference radiation intensity signal corresponding to an intensity of radiation incident on the first reference radiation detector;', 'a first direction radiation detector for providing a first direction radiation intensity signal corresponding to an intensity of radiation incident on the first direction radiation detector;', 'a second direction radiation detector for providing a second direction radiation intensity signal corresponding to an intensity of radiation incident on the second direction radiation detector; and', 'a first radiation stop for partially blocking radiation from reaching the first and second direction radiation detectors; and, 'a first radiation sensor for receiving radiation from the radiation source and for providing a first incident angle pair corresponding to the direction of the radiation source relative to the first radiation sensor, wherein the first radiation sensor includes a second reference radiation ...

LIGHT DISTRIBUTION CHARACTERISTIC MEASUREMENT APPARATUS AND LIGHT DISTRIBUTION CHARACTERISTIC MEASUREMENT METHOD

A light distribution characteristic measurement apparatus includes: a detecting unit for detecting light from a light source; a mirror for reflecting the light from the light source to direct the light to the detecting unit; a movement mechanism for moving the detecting unit and the mirror relatively to the light source; a rotation mechanism for rotating the mirror while maintaining an optical path length from the light source to the detecting unit; and a processor adapted to calculate the light distribution characteristic of the light source, based on a plurality of measurement results that are detected by the detecting unit under a condition that the detecting unit and the mirror are arranged at a plurality of measurement positions relative to the light source and the mirror is oriented at different rotational angles for each measurement position. 1. A light distribution characteristic measurement apparatus for measuring a light distribution characteristic of a light source , comprising:a detecting unit for detecting light from the light source;a mirror for reflecting the light from the light source to direct the light to the detecting unit;a movement mechanism for moving the detecting unit and the mirror relatively to the light source;a rotation mechanism for rotating the mirror while maintaining an optical path length from the light source to the detecting unit; anda processor adapted to calculate the light distribution characteristic of the light source, based on a plurality of measurement results that are detected by the detecting unit under a condition that the detecting unit and the mirror are arranged at a plurality of measurement positions relative to the light source and the mirror is oriented at different rotational angles for each measurement position.2. The light distribution characteristic measurement apparatus according to claim 1 , wherein the rotation mechanism is adapted to control the rotational angle of the mirror in such a manner that a field ...

WAVE FRONT ABERRATION METROLOGY OF OPTICS OF EUV MASK INSPECTION SYSTEM

Disclosed is test structure for measuring wave-front aberration of an extreme ultraviolet (EUV) inspection system. The test structure includes a substrate formed from a material having substantially no reflectivity for EUV light and a multilayer (ML) stack portion, such as a pillar, formed on the substrate and comprising a plurality of alternating pairs of layers having different refractive indexes so as to reflect EUV light. The pairs have a count equal to or less than 15. 1. A test structure for measuring wave-front aberration of an extreme ultraviolet (EUV) inspection system , comprising:a substrate formed from a material having substantially no reflectivity for EUV light; anda multilayer (ML) stack portion formed on the substrate and comprising a plurality of alternating pairs of layers having different refractive indexes so as to reflect EUV light, wherein the ML stack portion is arranged on the substrate to expose a portion of the substrate.2. The test structure of claim 1 , wherein each pair comprises (i) a molybdenum (Mo) layer and a silicon (Si) layer claim 1 , (ii) a Ru layer and a Si layer claim 1 , or (iii) a Mo layer and a Si layer interfaced with a carbon (C) based barrier layer.3. The test structure of claim 1 , further comprising a capping layer over the ML stack portion formed from a material that prevents oxidation of the ML stack portion and is substantially transparent claim 1 , wherein the capping layer is comprised of Ru claim 1 , diamond-like carbon (DLC) claim 1 , Si or platinum (Pt).4. The test structure of claim 1 , wherein the alternating pairs of layers of the ML stack portion are non-periodic and each alternating pair has a thickness that is optimized so that EUV light diffracted from the test structure substantially fills an entrance pupil area of the inspection system and/or has an optimized peak reflectivity.5. The test structure of claim 1 , wherein a count of the pairs is equal to or less than ten.6. The test structure of claim 1 , ...

Monitoring Incident Beam Position in a Wafer Inspection System

Methods, systems, and structures for monitoring incident beam position in a wafer inspection system are provided. One structure includes a feature formed in a chuck configured to support a wafer during inspection by the wafer inspection system. The chuck rotates the wafer in a theta direction and simultaneously translates the wafer in a radial direction during the inspection. An axis through the center of the feature is aligned with a radius of the chuck such that a position of the axis relative to an incident beam of the wafer inspection system indicates changes in the incident beam position in the theta direction. 1. A structure configured for monitoring incident beam position in a wafer inspection system , comprising:a chuck configured to support a wafer during inspection by the wafer inspection system, wherein the chuck rotates the wafer in a theta direction and simultaneously translates the wafer in a radial direction during the inspection; anda feature formed in the chuck, wherein an axis through the center of the feature is aligned with a radius of the chuck such that a position of the axis relative to an incident beam of the wafer inspection system indicates changes in the incident beam position in the theta direction.2. The structure of claim 1 , wherein a width of the feature varies along the radius of the chuck such that the width measured using the incident beam indicates changes in the incident beam position in the radial direction.3. The structure of claim 1 , wherein one or more sides of the feature are not parallel or perpendicular to the radius of the chuck such that a width of the feature measured using the incident beam indicates changes in the incident beam position in the radial direction.4. The structure of claim 1 , wherein the feature forms an opening in the chuck.5. The structure of claim 1 , wherein the feature forms a triangular opening in the chuck.6. The structure of claim 1 , wherein the feature comprises a material formed in an opening ...

DEVICE FOR SAMPLING A LARGE, HIGH-ENERGY LASER BEAM COMBINED WITH A COMPRESSOR

A device for the sampling of a pulsed laser beam of high energy typically greater than 1 J, and of large size, having a diameter typically greater than 1 cm, combined with a compressor, comprises, upstream of the compressor: a sample-taking device provided with a sampling diopter capable of transmitting T% of the pulsed laser beam, T being greater than 90, and of reflecting (1-T)% of the pulsed laser beam, the reflected beam being called sampled beam, an afocal capable of reducing the size of the sampled beam, the compressor having a determined useful aperture, a device for reinjecting the reduced sampled beam into this useful aperture. 1. A device for sampling a high-energy and large diameter pulsed laser beam , intended to be combined with a compressor , comprising , upstream of the compressor:a sample-taking device provided with a sampling diopter capable of transmitting T% of the pulsed laser beam, T being greater than 90, and of reflecting (1-T)% of the pulsed laser beam, the reflected beam being called sampled beam,an afocal capable of reducing the size of the sampled beam,the compressor having a determined useful aperture, a device for reinjecting the reduced sampled beam into this useful aperture.247. The sampling device as claimed in claim 1 , comprising claim 1 , on the path of the sampled beam claim 1 , an optical path compensator () claim 1 , capable of increasing the optical path of this sampled beam.3. The sampling device as claimed in claim 2 , wherein the compensator is situated downstream of the compressor.4. The sampling device as claimed in claim 1 , wherein the pulsed laser beam has an energy greater than 1 J and a diameter greater than 1 cm.5. A device for analyzing a high-energy and large diameter pulsed laser beam from a compressor claim 1 , which comprises a sampling device as claimed in and intended to be combined with said compressor claim 1 , and a device for measuring the sampled and compressed beam.6. An equipment item for laser ...

CAMERA TESTING USING REVERSE PROJECTION

A computer-implemented method for testing a modulation transfer function or spatial frequency response of an imaging system includes, on a computing device, generating a plurality of accumulation cells running along an accumulation line. A boundary delineation divides a first segment of a digital test image captured by the imaging system from a second segment, and the plurality of accumulation cells collectively comprise a one-dimensional accumulation array. For each of the accumulation cells, a projection ray is generated that extends through the accumulation cell and through the digital test image Each accumulation cell is loaded with an accumulated pixel value based on pixel values sampled from each of a plurality of sampling locations along the projection ray. The modulation transfer function or spatial frequency response of the imaging system is derived from the one-dimensional accumulation array. 1. A computer-implemented method for computing a modulation transfer function or spatial frequency response of an imaging system , the method comprising:on a computing device, receiving a digital test image captured via the imaging system, the digital test image having a plurality of pixels;determining a region of interest in the digital test image;fitting a boundary delineation to a boundary between a first segment and a second segment of the region of interest;generating a plurality of accumulation cells running along an accumulation line, the plurality of accumulation cells collectively comprising a one-dimensional accumulation array;loading each accumulation cell of the one-dimensional accumulation array with an accumulated pixel value, the accumulated pixel value being based on pixel values sampled from each of a plurality of sampling locations along a projection ray extending through the accumulation cell and through the region of interest; andderiving the modulation transfer function or the spatial frequency response of the imaging system from the one- ...

METHOD AND DEVICE FOR DETECTING A FOCAL POSITION OF A LASER BEAM

A method and a device for detecting a focal position of a laser beam, particularly a machining laser beam in a laser machining head, includes an optical element which is arranged in the laser beam converging toward the focal point and which is designed to outcouple a reflection from the laser beam path, and a sensor arrangement which is designed to detect beam characteristics of said laser beam in the region of the focal point in the laser extension direction, and which measures the outcoupled reflection of the laser beam at at least two locations that are offset to one another in the extension direction, in order to determine the current focal position. 1. A device for detecting a focal position of a laser beam , in particular a machining laser beam in a laser machining head , comprising:an optical element arranged in said laser beam converging towards a focus for decoupling at least one back reflection from the laser beam path; anda sensor arrangement for detecting beam properties of said laser beam in the region of said focus along the direction of propagation, said sensor arrangement measuring the decoupled reflection of said laser beam at at least two locations offset from each other along the direction of propagation for determining the current focal position.2. The device according to claim 1 , wherein said sensor arrangement includes at least one spatially resolving detector.3. The device according to claim 2 , wherein said spatially resolving detector is arranged to be displaceable along a beam propagation direction of the back reflection.4. The device according to claim 2 , wherein the back reflection decoupled from the laser beam path can be directed onto said spatially resolving detector by means of a deflection element arranged to be displaceable along the beam propagation direction of the back reflection.5. The device according to claim 2 , wherein said spatially resolving detector is arranged to be inclined with respect to the beam propagation ...

WAVEFRONT CURVATURE SENSOR INVOLVING TEMPORAL SAMPLING OF THE IMAGE INTENSITY DISTRIBUTION

The present invention relates to a system and method for reconstruction of temporal wavefront changes for use in an optical system comprising: measuring the distribution function of the light intensity, e.g. the two-dimensional distribution function of the light intensity, in at least two different images taken at different times, wherein said images are taken in at least one optical plane, e.g. the same optical plane, of the optical system. 1. A method for reconstruction of temporal wavefront changes for use in an optical system , the method comprising:measuring a distribution function of light intensity in at least two different images captured at different times, wherein the at least two different images are captured in at least one optical plane.2. The method of claim 1 , further comprising:identifying at least one image of the at least two different images as an intra-time image and at least another image of the at least two different images as an extra-time image, wherein said identifying is carried out based on that the intra-time image is captured at a time before the extra-time image is captured.3. The method of claim 2 , further comprising applying a wavefront phase retrieval algorithm to the intra-time image and the extra-time image for reconstructing temporal wavefront changes that occurred between the times at which the intra-time image and the extra-time image were captured.4. The method of claim 2 , further comprising selecting or deriving the at least two different images from a series of images captured at different times.5. The method of claim 4 , wherein at least one image from the at least two different images is derived from a combination of selected images from the series of images claim 4 , wherein the at least one image from the at least two different images is computationally calculated.6. The method of claim 1 , wherein the step of measuring the distribution function of the light intensity in the at least two different images captured at ...

LASER BEAM MACHINE

A laser beam machine has a control unit. The control unit transmits an output signal for starting an output of the laser beam at a first time point and stopping the output of the laser beam at a second time point which is later than the first time point, to the laser oscillator. The control unit receives a detection signal indicating first detection intensity which is greater than first preset intensity from the light detector, at a third time point which is later than the second time point. The control unit transmits a drive signal for controlling the emission unit to be driven, to the emission unit, at a fourth time point equal to or later than the third time point. The control unit transmits a warning signal at a fifth time point equal to or later than the third time point. 1. A laser beam machine comprising:a laser oscillator that outputs laser beam;a spectroscope on which the laser beam is entered, and that emits the laser beam after splitting the laser beam into machining laser beam and measurement laser beam;a light detector on which the measurement laser beam is entered, and that transmits a detection signal indicating intensity of the measurement laser beam;an emission unit on which the machining laser beam is entered, and that emits the machining laser beam to a workpiece; anda control unit that is connected to the laser oscillator, the light detector, and the emission unit,wherein the control unit transmits an output signal for starting an output of the laser beam at a first time point and stopping the output of the laser beam at a second time point which is later than the first time point, to the laser oscillator,wherein the control unit receives the detection signal indicating first detection intensity which is greater than first preset intensity, from the light detector, at a third time point which is later than the second time point,wherein the control unit transmits a drive signal for controlling the emission unit to be driven, to the emission unit, ...

Laser patterning apparatus for three-dimensional object

A laser patterning apparatus for a three-dimensional object includes a laser generator, a beam expander configured to adjust a size of a laser beam generated by the laser generator, a dynamic focusing module configured to adjust a z-axis focus position of the laser beam passing through the beam expander, a scan head configured to adjust x- and y-axis focus position of the laser beam passing through the beam expander, a shape recognizer configured to recognize a shape of a three-dimensional object, and a controller configured to extract x-, y-, and z-axis data of the three-dimensional object and to control the scan head and the dynamic focusing module, in order to pattern the three-dimensional object with the laser beam.

Calibration of photoelectromagnetic sensor in a laser source

In a laser-produced plasma (LPP) extreme ultraviolet (EUV) system, laser pulses are used to produce EUV light. To determine the energy of individual laser pulses, a photoelectromagnetic (PEM) detector is calibrated to a power meter using a calibration coefficient. When measuring a unitary laser beam comprising pulses of a single wavelength, the calibration coefficient is calculated based on a burst of the pulses. A combined laser beam has main pulses of a first wavelength alternating with pre-pulses pulses of a second wavelength. To calculate the energy of the main pulses in the combined laser beam, the calibration coefficient calculated for a unitary laser beam of the main pulses is used. To calculate the energy of the pre-pulses in the combined laser beam, a new calibration coefficient is calculated. When the calculated energy values drift beyond a pre-defined threshold, the calibration coefficients are recalculated.

Sensor

A sensor is disclosed that can include a light component in support of a first light source operable to direct a first beam of light, and a second light source operable to direct a second beam of light. The sensor can also include an imaging device positioned proximate the light component and operable to directly receive the first beam of light and the second beam of light and convert these into electric signals. The imaging device and the light component can be movable relative to one another. The sensor can further include a light location module configured to receive the electric signals and determine locations of the first beam of light and the second beam of light on the imaging device. In addition, the sensor can include a position module configured to determine a relative position of the imaging device and the light component based on the locations of the first beam of light and the second beam of light on the imaging device.

Measuring Device for Measuring an Illumination Property

A measuring device ( 40 ) for measuring an illumination property of an illumination system ( 12 ), which is configured for two-dimensional irradiation of a substrate ( 24 ) arranged in an illumination plane ( 21 ) with illumination radiation ( 20 ). Two differing measurement beam paths ( 52, 54 ) are formed in the measuring device, each arranged to guide the illumination radiation emitted by the illumination system onto a spatially resolving intensity detector ( 42 ) of the measuring device. A first ( 52 ) of the measurement beam paths is arranged to measure an intensity distribution in the illumination plane and the second ( 54 ) of the measurement beam paths is arranged to measure an intensity distribution in a pupil of the illumination system. The measuring device also includes an imaging optical unit ( 44 ) arranged in the first measurement beam path ( 52 ) such that the illumination radiation guided in the first measurement beam path passes through the imaging optical unit.

CROSS-TALK EFFECT IN A LASER DIODE ARRAY

An electric cross-talk, ECT, effect of laser-diode array is measured by capturing a first image of a first laser spot of a first laser diode with a second laser diode being turned off () and a second image of a second laser spot of the first laser diode while switching on the second laser diode (). A spot-energy ratio is determined () by processing the images, and an ECT-coupling coefficient on the first laser diode is calculated () by switching the second laser diode. Compensating for the ECT effect includes determining a signal for predicting the ECT effect on the first laser diode by switching the second laser diode, and generating a driving signal based on a desired current profile and the ECT-prediction signal. 1. A method for measuring an electric cross-talk (ECT) effect in a laser diode array , wherein the laser diode array comprises a plurality of laser diodes including a first laser diode and a second laser diode;comprising:capturing, by an image sensor, a first image of a first laser spot of the first laser diode with the second laser diode being turned off;capturing, by the image sensor, a second image of a second laser spot of the first laser diode while switching on the second laser diode;determining, by image processing of the first image and the second image, a ratio of laser spot energy of the first laser spot and the second laser spot; andcalculating, based on the determined ratio of laser spot energy, an ECT coupling coefficient associated with the ECT effect on the first laser diode by switching the second laser diode.2. The method according to claim 1 , wherein calculating the ECT coupling coefficient is further based on a laser modulation current of the first laser diode claim 1 , a laser modulation current of the second laser diode and a laser off current of the second laser diode.3. The method according to claim 1 , wherein capturing a first image claim 1 , capturing a second image claim 1 , determining a ratio of laser spot energy and ...

MEASUREMENT SYSTEM AND MEASUREMENT METHOD

A measurement method of receiving an emission light output from an optical semiconductor element on an incident end surface of an optical probe, shifts a relative position between the optical semiconductor element and the optical probe on a plane surface intersecting with an optical axis of the emission light, measures an incident intensity of the emission light at several positions, and obtains an incident intensity pattern showing a relationship between a change in the relative position and the respective incident intensities. 1. A measurement method of receiving , on an incident end surface of an optical probe , an emission light output from an optical semiconductor element , the method comprising:setting a gap between the optical semiconductor element and the incident end surface to a predetermined working distance;shifting a relative position between the optical semiconductor element and the optical probe on a plane surface intersecting with an optical axis of the emission light to measure an incident intensity of the emission light at several positions; andobtaining an incident intensity pattern showing a relationship between a change in the relative position and the respective incident intensities.2. The measurement method according to claim 1 , wherein the working distance is set such that the incident intensity pattern includes a flat part in which a variation of peak values of the incident intensities falls in a predetermined range.3. The measurement method according to claim 2 , further comprising calculating an average of the incident intensities included in the flat part.4. The measurement method according to claim 3 , wherein the average of the incident intensities adjacent to the optical axis of the emission light is calculated.5. The measurement method according to claim 1 , further comprising calculating a radiation angle of the emission light in accordance with the incident intensity pattern.6. The measurement method according to claim 1 , further ...

LASER SCANNER

A laser scanner includes: a light source; a scanning mirror that scans laser light emitted from the light source, toward a target object by oscillating about axis C; a photodetector that generates a photodetection signal upon receiving the laser light reflected from the target object; a controller that controls emission of the laser light by the light source, and that performs sampling on the photodetection signal; and a detector that detects an amount of displacement of the scanning mirror, and calculates a resonant frequency of the scanning mirror based on the amount of displacement detected. The controller determines a time at which the laser light is emitted from the light source and a time at which sampling is performed on the photodetection signal, based on the resonant frequency calculated.

VERIFICATION OF LASER PROJECTOR SAFETY SYSTEM OPERATION

In a general aspect, a method can include receiving a first projection pattern, where the first projection pattern is configured to violate a first parameter of a safety system of a laser projection system. The method can also include displaying the first projection pattern with the laser projection system and verifying proper implementation of the first parameter by the safety system based on visual appearance of the displayed first projection pattern. The method can further include receiving a second projection pattern, where the second projection pattern is configured to violate a second parameter of the safety system of the laser projection system and the second parameter is different than the first parameter. The method can further include displaying the second projection pattern with the laser projection system and verifying proper implementation of the second parameter by the safety system based on visual appearance of the displayed second projection pattern.

METHOD AND APPARATUS FOR MEASURING THE SHAPE OF A WAVE-FRONT OF AN OPTICAL RADIATION FIELD

Method for measuring shape of wavefront of optical radiation field generated by radiation source, includes: (a) setting diaphragm positions in pinhole diaphragm having diaphragm opening movable transversely to radiation source's optical axis, wherein a partial beam from radiation field passes through diaphragm opening at each diaphragm position and is imaged on optical sensor by imaging optics device; (b) recording lateral positions of partial beam relative to optical axis of imaging optics device, wherein lateral positions each with one of the diaphragm positions of pinhole diaphragm are recorded by optical sensor, and determining the shape of wavefront from recorded lateral positions of partial beam, wherein beam incidence range of the partial beam which is invariable for all diaphragm positions is set on imaging optics device with a pentaprism arrangement including at least first pentaprism and positioned between pinhole diaphragm and imaging optics device. A wavefront shape measuring device is also described.

Lithography optics adjustment and monitoring

Methods and apparatus for processing an image of a beam generated by an optical system to extract information indicative of an extent of damage to optical elements in the optical system. Also disclosed is a beam image and analysis tool capable of acquiring an image of a beam at any one of a number of locations.

Apparatus and Method of Power Measurement for Pulsed Terahertz Quantum-Cascade Laser

The present invention provides a power measurement apparatus and method for a pulsed terahertz quantum-cascade laser (THz QCL). The apparatus includes a light source part, a light path part, and a detection part. Terahertz light emitted by a THz QCL reaches a terahertz quantum-well photodetector (THz QWP) through the measurement apparatus, and is absorbed to generate a corresponding current signal. A signal processing circuit extracts a voltage signal from the current signal, amplifies the voltage signal, and inputs the amplified voltage signal to an oscilloscope for reading and displaying. According to a responsivity of the THz QWP at a lasing frequency of the laser, the measurement of the output power of the pulsed THz QCL is acquired. The present invention avoids integration estimation when a thermal detector is used to measure output power of a THz QCL in a pulse operating mode, and can directly acquire the power value of a pulsed output from the laser according to the amplitude of the detector responding to the pulsed terahertz light.

HEAD-UP DISPLAY DEVICE FOR VEHICLE AND SELF-CHECKING METHOD THEREFOR

A head-up display device and a self-checking method therefor are provided, which are able to suppress the direct output of a laser beam to outside. A reflecting means reflects an image generated by a scanning means and projects the image outside of a case, and an angle-adjusting means adjusts the reflecting means to a desired angle. After the ignition switch of the vehicle is turned on, a light-emitting means outputs a scanning laser beam, and the value of the current flowing to the light-emitting means is detected, or a first light intensity, which is the light intensity of the scanning laser beam, is detected. For a period extending at least from the output of the scanning laser beam by the light-emitting means to the establishment of a predetermined condition, the angle-adjusting means is controlled such that the reflecting means is set to a non-visible position at which the scanning laser beam is reflected inside the case. 1. A head-up display device for a vehicle which projects an image from a light transmission portion , the head-up display device comprising:a housing which has the light transmission portion;light emitting means for outputting laser light,scanning means for scanning the laser light from the light emitting means to generate the image;reflection means for reflecting the image generated by the scanning means to project the image outside the housing;angle adjustment means for adjusting the reflection means at a desired angle;test laser light output means for causing the light emitting means to output test laser light based on test laser light output data recorded in the recording means in advance after a start switch of the vehicle is turned on;light source state detection means for detecting a current value in the light emitting means or first light intensity, which is light intensity of the test laser light, when the light emitting means emits the test laser light; andinvisible position holding means for controlling the angle adjustment means ...

Systems, Devices, and Methods for Calibration of Beam Profilers

Embodiments generally describe systems, devices, and methods for focusing and calibrating beam profilers. A test object is provided that may include an internal housing rotatable within an external housing. The internal housing may house a light source, a collimator, a filter, and/or a diffuser. A plate may be mounted to the internal housing and may include a plurality of markings. In some embodiments, to focus a beam profiler, the test object may be positioned adjacent the converter plate of a beam profiler. Marker images may be captured and a focus quality may be assessed therefrom. A position of the converter, objective, and/or camera of the beam profiler may be adjusted based on the focus quality. To calibrate, images of the markings in several rotational positions may be captured and used for calibration. The markings may be rotated to several positions by rotating the internal housing relative to the external housing. 1. A focusing or geometric calibration test object for a beam profiler comprising:an external housing;an internal housing rotatably mounted within the external housing and rotatable relative to the external housing about an internal housing axis;a light source housed within the internal housing;a plate coupled with the internal housing and transverse to the internal housing axis; anda plurality of markings on the plate.2. The test object of claim 1 , further comprising a light diffuser housed in the internal housing and positioned between the light source and the plate claim 1 , the diffuser configured to evenly disperse light from the light source across the markings on the plate.3. The test object of claim 1 , wherein the light source is configured to output light in a broad spectral range and wherein the test object further comprises a bandpass filter housed in the internal housing and positioned between the light source and the plate claim 1 , the bandpass filter configured to selectively transmit light from the light source in a particular ...

SAFETY CHECKING APPARATUS, BEAM IRRADIATION SYSTEM, AND SAFETY CHECKING METHOD

A safety checking apparatus is provided with a determining section and a result data control section. The determining section determines a safety level of an asset to an incident beam according to an irradiation beam based on the irradiation direction of the irradiation beam and a position or area of the asset. The result data control section carries out a notification to the asset according to the safety level determined by the determining section. Thus, the safety level is determined to a person and a thing one in a region out of a path of the beam. 1. A safety checking apparatus comprising:a determining section configured to determine a safety level of an asset for an incident beam related to an irradiation beam based on a position or area where the asset is located and an irradiation direction of the irradiation beam; anda result data control section configured to transmit a notice to the asset based on a determination result of the safety level by the determining section.2. The safety checking apparatus according to claim 1 , wherein the determining section determines the safety level of the asset based on whether an incident direction of the incident beam to the asset is from a direction in a weak region of the asset.3. The safety checking apparatus according to claim 1 , wherein the determining section determines the safety level of the asset by comparing an energy density of the incident beam to the asset and a reference energy density registered as a determination condition.4. The safety checking apparatus according to claim 3 , wherein the determining section calculates the energy density of the incident beam based on the position or area where the asset is located claim 3 , the irradiation direction of the irradiation beam claim 3 , and an output power of the irradiation beam.5. The safety checking apparatus according to claim 3 , wherein the determining section calculates the energy density of the incident beam to the asset based on the position or area ...

METHOD AND APPARATUS FOR MONITORING BEAM PROFILE AND POWER

A system and a method for monitoring a beam in an inspection system are provided. The system includes an image sensor configured to collect a sequence of images of a beam spot of a beam formed on a surface, each image of the sequence of images having been collected at a different exposure time of the image sensor, and a controller configured to combine the sequence of images to obtain a beam profile of the beam. 1. A system for monitoring a beam in an inspection system , comprising:an image sensor that includes circuitry to collect a sequence of images of a beam spot of a beam formed on a surface, each image of the sequence of images having been collected at a different exposure time of the image sensor; anda controller having one or more processors and a memory, the controller configured to combine the sequence of images to obtain a beam profile of the beam.2. The system of claim 1 , wherein the controller is further configured to adjust an image of the sequence of images by using a grey level magnification factor associated with the image.3. The system of claim 2 , wherein the controller is further configured to adjust the image by multiplying a grey level of each pixel in the image that contains useful information by the grey level magnification factor associated with the image.4. The system of claim 2 , wherein the controller is configured to determine the grey level magnification factor associated with the image based on an exposure time at which the image is collected.5. The system of claim 2 , wherein the controller is configured to determine the grey level magnification factor associated with the image based on a comparison of grey levels of pixels in the sequence of images.6. The system of claim 5 , wherein the image is a first selected image of the sequence of images claim 5 , and the controller is configured to determine the grey level magnification factor associated with the first selected image based on:a comparison of the first selected image with a ...

METHOD FOR ADDITIVELY MANUFACTURING OF THREE-DIMENSIONAL OBJECTS

Apparatus () for additively producing three-dimensional objects () by successive layer-by-layer selective exposure and, accompanying this, successive layer-by-layer selective solidification of construction material layers made of a construction material () that can be solidified by means of an energy beam (), including an exposure device () which is configured to produce an energy beam () for successive layer-by-layer selective exposure and, accompanying this, successive layer-by-layer selective solidification of construction material layers made of a construction material () that can be solidified by means of the energy beam (), a measuring device () that is assignable or assigned to the exposure device () and configured to measure the power of the energy beam () that is produced by the exposure device (), wherein the measuring device () comprises a measuring element () that comprises an energy beam input face (), and at least an energy beam widening device (). 11234. Apparatus () for additively producing three-dimensional objects () by successive layer-by-layer selective exposure and , accompanying this , successive layer-by-layer selective solidification of construction material layers made of a construction material () that can be solidified by means of an energy beam () , comprising:{'b': 6', '4', '3', '4, 'an exposure device () which is configured to produce an energy beam () for successive layer-by-layer selective exposure and, accompanying this, successive layer-by-layer selective solidification of construction material layers made of a construction material () that can be solidified by means of the energy beam (),'}{'b': 13', '6', '4', '6', '13', '15', '16, 'a measuring device () that is assignable or assigned to the exposure device (), said measuring device being configured to measure the power, in particular the power density, of the energy beam () that is produced by the exposure device (), wherein the measuring device () comprises a measuring element () ...

Methods and apparatuses for aligning and diagnosing a laser beam

Methods and apparatuses for aligning and diagnosing the laser beam traversing an optical train in a highly space-efficient, lower cost and/or retrofit-friendly manner are disclosed. The optical components of the optical train are mounted such that one or more optical components can direct their exit laser beam to partially or wholly scan across one or more downstream sensors. Correlation data between physical disposition of optical components and the points of impact data and/or beam quality data are employed to, among others, align and/or diagnose the laser beam and/or localize failure sites and/or optimize maintenance schedule.

Beam Power Measurement with Widening

The invention relates to a method and an apparatus for the direct and precise measurement of the power and/or energy of a laser beam, which make a measurement possible even in areas close to the focus of a laser beam, A device is proposed for this purpose that contains a radiation sensor, an expansion device, and a support mount. The radiation sensor has a receiving surface and is configured for the generation of an electrical signal, which is dependent on the power of the laser beam or the energy of the laser beam, The expansion device and the radiation sensor are positioned on the support mount at a distance from one another. The expansion device is configured in such a way as to increase the angle range of the laser beam. The laser beam propagates to the radiation sensor with an increased angle range. A diameter of the laser beam propagated on the receiving surface is greater than a diameter of the laser beam in the area of the expansion device. The receiving surface of the radiation sensor encloses at least 90% of the cross-section surface of the laser beam propagated. 123-. (canceled)24. Apparatus for the measurement of the power and/or of the energy of a laser beam , comprising a radiation sensor , an expansion device , and a support mount , wherein the radiation sensor has a receiving surface and is configured for the generation of an electrical signal , which is dependent on the power of the laser beam or the energy of the laser beam , wherein the expansion device and the radiation sensor are positioned at a distance from one another on the support mount for the formation of a propagating laser beam between the expansion device and the radiation sensor , wherein the expansion device is configured in such a way as to increase the angle range of the laser beam , wherein a diameter of the laser beam propagated on the receiving surface is greater than a diameter of the laser beam in the area of the expansion device , and wherein the receiving surface of the ...

Rapid Beam Measuring in Several Planes

The invention relates to a method and an apparatus for the direct determination of spatial dimensions of a light beam with high precision and short measuring period, which are also suitable for the measuring of laser beams with high power in the range of the beam focus. For this purpose, an apparatus is proposed that includes a beam scanner (), at least one light sensor (), a movement device () for the execution of a relative movement between the light beam () and the beam scanner (), and a device () for the signal recording of a temporally variable signal of the light sensor (). The beam scanner () comprises at least one scanning body () with at least three sampling areas (), which extends along sampling lines. The sampling areas () are configured for the extraction of linear or strip-shaped light samples from a cross-section () of the light beam (). Several scanning surfaces () are defined by the sampling lines of the sampling areas (), each spanned by a movement vector () of the relative movement. At least three scanning surfaces () have a non-zero distance from one another in the direction of the axis of the light beam. The light sensor () is configured for the detection of at least a portion of the sampled light extracted by the sampling areas () from the cross-section () of the light beam (). 131-. (canceled)33. Apparatus according to claim 32 , wherein the sampling areas are positioned at a surface of the scanning body or inside the scanning body.34. Apparatus according to claim 32 , wherein the range of the relative movement claim 32 , which is executable by means of the movement device for the relative movement between the light beam and the beam scanner claim 32 , is at least three times the transverse distance between proximate sampling areas.35. Apparatus according to claim 32 , wherein the sampling areas have an extent transversely to the sampling lines that is claim 32 , at most claim 32 , half the smallest beam diameter of the light beam to be scanned ...

Systems and methods for measuring high-intensity light beams

Systems and methods for measuring an intensity characteristic of a light beam are disclosed. The methods include directing the light beam into a prism assembly that includes a thin prism sandwiched by two transparent plates, and reflecting a portion of the light beam by total-internal-reflection surface to an integrating sphere while transmitting the remaining portion of the light beam through the two transparent plates to a beam dump. The method also includes detecting light captured by the integrating sphere and determining the intensity characteristic from the detected light.

DEVICE FOR THE DIAGNOSIS OF OPTOELECTRONIC SYSTEMS AND ASSOCIATED METHOD

A method for measuring parameters of one or more optical beams emitted by an optoelectronic system, and an associated device. The measurement method includes a calculation of a position of an attachment area of a movement system on which an optical device is attached, such that an alignment axis of the attachment zone coincides with an expected emission axis of the optical beam. The calculation is carried out based on characteristic data of the optoelectronic system. The method includes positioning the attachment area relative to the optoelectronic system, in the calculated position, and a measurement of one or more parameters of the optical beam by the optical device. 1. A method for measuring parameters of an optical beam emitted by an optoelectronic system , said method comprising:calculating a position and a direction of an attachment zone of a movement system on which an optical device is attached, such that an alignment axis of the attachment zone coincides with an expected emission axis of the optical beam, the calculation being carried out based on data relating to a direction of emission of the beam emitted by the optoelectronic system;positioning the attachment zone, with respect to the optoelectronic system, in the calculated position; andmeasuring one or more parameters of the optical beam by the optical device.2. The method according to claim 1 , comprising:determining, by a processing unit, based on at least one of the following measured parameter or parameters:a spatial positioning of a vector representative of the optical beam,spectral characteristics of the optical beam,temporal characteristics of the optical beam,a polarization rate of the optical beam,a gaussian propagation property of the optical beam,characteristics associated with the phase of the optical beam,a wave front of the optical beam,an efficiency of the optoelectronic system, andan optical power of the optical beam.3. The method according to claim 1 , comprising:acquiring a first ...

APPARATUS AND METHOD FOR BEAM DIAGNOSIS ON LASER PROCESSING OPTICS

Apparatus for determining geometrical parameters of a laser beam includes an optical system, a device for output coupling radiation, a beam diagnostic device, and a reflector element. The optical system focuses the laser beam into a processing region. The device for output coupling radiation couples out radiation that runs through the optical system in a direction opposite to a direction of the laser beam. The reflector element has a first surface which is partially reflecting and curved, where the curvature is equal to a mean curvature of a wave front of the laser beam in a positioning region of the reflector element. 1. An apparatus for determining geometrical parameters of a laser beam , comprising:an optical system configured to focus the laser beam into a processing region,a device for output coupling of radiation that travels in a direction opposite to a direction of travel of the laser beam through the optical system,a beam diagnostic device, anda first reflector element with a first surface,wherein the first reflector element is placeable in a positioning region between the optical system and the processing region,wherein the first surface of the first reflector element is partially reflecting and is curved,wherein a curvature of the first surface is equal to a mean curvature of a wave front of a focused laser beam in the positioning region of the first reflector element, andwherein the focused laser beam is focused by the optical system.2. The apparatus according to claim 1 , wherein the first surface of the first reflector element is set concentrically to the wave front of the focused laser beam.3. The apparatus according to claim 1 , wherein a center of curvature of the first surface of the first reflector element is set to a target position of a laser beam focus of the focused laser beam.4. The apparatus according to claim 1 , further comprising a positioning apparatus claim 1 , wherein the first reflector element is coupled to the positioning apparatus ...

Analyseur Spatial de Faisceau Laser a Reglage Automatique

An analyzer of the spatial intensity distribution of a laser beam focused or transmitted by an optical fiber comprises: a shaping lens; a device for taking a partial sample of the beam; a heat sink; a photodiode; an imaging lens to form images of the plane on an image sensor; a motorization of the shaping lens to translate along the optical axis; a motorization of the imaging lens to translate in a plane perpendicular to the optical axis; a motorization of the image sensor to translate along the optical axis; an electronic unit controlling each motorization; an electronic unit synchronizing the image sensor, connected to the photodiode to synchronize image capture with the laser pulses or in the pulses; an electronic unit adjusting the aperture and/or gain of the image sensor; and a software interface parameterizing and piloting the electronic control units, equipped with an image processing unit. 2. A method for analyzing the spatial intensity distribution of a laser beam by means of an analyzer as claimed in claim 1 , comprising:measuring, by the photodiode and the software interface, the period separating two pulses and the average length of these pulses,triggering image capture by the sensor with the synchronizing electronic unit as a function of this period and this length, andmeasuring the spatial intensity distribution of the one or more captured images.3. The analyzing method as claimed in claim 1 , wherein image capture is triggered at a chosen moment during the length of the pulse.4. The analyzing method as claimed in claim 2 , further comprising calibrating the photodiode in absolute energy relative to the heat sink. The field of the invention is that of the laser-beam analyzers used to analyze the spatial intensity distribution Iz(x,y) or energy distribution Ez(x, y) of a focused pulsed laser beam. With these systems the image of a laser beam is formed and analyzed in a plane (x, y) perpendicular to the axis of its optical path after focusing.These ...

Mirror Array

A mirror array, at least some of the mirrors of the array comprising a reflective surface and an arm which extends from a surface opposite to the reflective surface, wherein the mirror array further comprises a support structure provided with a plurality of sensing apparatuses, the sensing apparatuses being configured to measure gaps between the sensing apparatuses and the arms which extend from the mirrors. 1. A mirror array , at least some of the mirrors of the array comprising a reflective surface and a mirror arm which extends from a surface opposite to the reflective surface , wherein the mirror array further comprises a support structure provided with a plurality of sensing apparatuses , the sensing apparatuses being configured to measure gaps between the sensing apparatuses and the mirror arms which extend from the mirrors.2. The mirror array of claim 1 , wherein the sensing apparatuses are configured to measure gaps between the sensing apparatuses and ends of the mirror arms.3. The mirror array of claim 2 , wherein a magnet and inductive material are provided at the end of at least some of the mirror arms.4. The mirror array of claim 3 , wherein at least some of the sensing apparatuses comprise a plurality of eddy current sensors.5. A system comprising the mirror array of and further comprising a processor configured to receive the measured gaps between the sensing apparatuses and the associated mirror arms when EUV radiation is incident upon the mirror array claim 1 , the processor further being configured to compare the measured gaps with gaps previously measured when EUV radiation is not incident upon the mirror array to provide gap change measurements.6. The system of claim 5 , wherein the processor is configured to compare gap change measurements with previously obtained gap change measurements.7. The system of claim 5 , wherein the processor is configured to determine a power of radiation incident upon the mirrors using a known relationship between the ...

SYSTEMS AND METHODS FOR USING A MEMS PROJECTOR TO DETERMINE AN ORIENTATION OF A PHOTOSENSOR OF AN HMD OR ANOTHER CONTROLLER

A method for determining an orientation of a photosensor of a controller with respect to a projector is described. The method includes generating, by a beam generator of the projector, a beam. The method further includes modifying a direction of travel of the beam using a micro-electro-mechanical systems (MEMS) mirror that moves in a pattern, detecting the beam, calculating a time at which the beam is detected, and determining based on the pattern and the time an orientation of the beam to determine the orientation of the photosensor. 1. A method for determining an orientation of a photosensor with respect to a projector , comprising:generating, by a beam generator of a projector, a beam;modifying a direction of travel of the beam using a micro-electro-mechanical systems (MEMS) mirror that moves in a pattern;detecting, by a photosensor, the beam;calculating a time of hit at which the beam is detected; anddetermining based on the pattern and the time of hit an orientation of the photosensor with respect to the projector.2. The method of claim 1 , wherein the pattern is a Lissajous pattern or a raster scan pattern.3. The method of claim 1 , wherein the beam is a laser beam.4. The method of claim 1 , wherein determining based on the pattern and the time of hit the orientation of the photosensor includes:calculating based on a time of start of the pattern, a frequency of the MEMS mirror along a first axis of the MEMS mirror, and a frequency of the MEMS mirror along a second axis of the MEMS mirror, and the time of hit, a location of the beam within the pattern; anddetermining based on the location of the beam within the pattern, an angle of the beam with respect to a first axis of the projector, a second axis of the projector, and a third axis of the projector.5. The method of claim 4 , further comprising synchronizing a clock signal generated by a controller that detects the beam with a clock signal generated by the projector claim 4 , wherein the time of start is ...

Optical bench apparatus having integrated monitor photodetectors and method for monitoring optical power using same

Optical bench structure provides a platform for integrating optical transmitters, particularly Vertical-Cavity Surface-Emitting Lasers (VCSELs), with monitor photodetectors. A substrate with photodetectors on the front side is aligned with flip-chip bonding bumps so the emission of the transmitters is aligned with the monitor photodetectors and passes through the monitor photodetectors with a portion of the transmitted light absorbed by the monitor photodetectors. The photodetectors have a thin absorption region so the percentage of light absorbed may be relatively small, providing sufficient photocurrent to monitor the transmitted power having a minimal effect on the transmitted power. Microlenses are integrated on the backside of the substrate focus, steer and/or collimate the emitted optical beams from the transmitters. The structure enables photodetectors to be integrated on the optical bench allowing the received optical power to be monitored. The receiver photodetectors are integrated on the optical bench alone and/or in combination with the transmitters.

METHOD FOR OBTAINING PARAMETERS DEFINING A PIXEL BEAM ASSOCIATED WITH A PIXEL OF AN IMAGE SENSOR COMPRISED IN AN OPTICAL DEVICE

A method for obtaining, for at least one pixel of an image sensor comprised in an optical device, parameters defining a pixel beam is described. The method is remarkable in that it includes determining a direction of a chief ray associated with at least one pixel of the image sensor from the features of an optical system associated with the optical device, determining a set of pixels formed in a screen of a display device, the set of pixels comprising at least one pixel close to a point corresponding to an intersection of the chief ray and the screen, and the set of pixels comprising only pixels which are detected by the at least one pixel of the image sensor, when they are illuminated. 1. A method for obtaining , for at least one pixel of an image sensor comprised in an optical device , parameters defining a pixel beam , wherein the method comprises:determining a direction of a chief ray associated with said at least one pixel of said image sensor from the features of an optical system associated with said optical device;determining a set of pixels comprised in a screen of a display device, said set of pixels comprising at least one pixel, close to a point corresponding to an intersection of said chief ray and said screen, and said set of pixels comprising only pixels which are detected by said at least one pixel of said image sensor, when they are illuminated; and wherein said determining said set of pixels comprises:illuminating at least one pixel around said point corresponding to the intersection of said chief ray and said screen;verifying if said at least one illuminated pixel is detected by said at least one pixel of said image sensor;and wherein said method further comprises determining said parameters defining said pixel beam associated with said at least one pixel of said image sensor from a subset of pixels comprised in said set of pixels, said subset of pixels corresponding to a cross section of said pixel beam.2. The method according to claim 1 , ...

Wavelength monitor and optical module

A wavelength monitor monitors wavelengths of laser beams emitted from a laser source and transmitted through a collimating lens. The wavelength monitor comprises an etalon that serves as an optical filter, and an optical detector. The etalon has a transmittance that is periodic with respect to a frequency, and is disposed such that a pair of collimated beams, emitted through a pair of emitting ports of the laser source and then transmitted through the collimating lens, is incident on the optical filter at symmetrically positive and negative angles. The optical detector receives the pair of collimated beams transmitted through the etalon, and detects the intensities of the pair of collimated beams.

Laser Projection System

A laser projection system having built-in safety systems is disclosed. Further disclosed is a method of operating a laser projection system such that safe operation is a factor only of meeting a threshold distance between the laser unit and an audience member. To accomplish safe operation at the threshold distance, the laser projection system is pre-calibrated to operate below maximum permitted exposure levels at the threshold distance. In this manner of operation, laser lighting can be accomplished by non-laser professionals without the complexity, external sensors, and need for calibration at the venue. 1. A system for projecting a laser onto an audience , comprising:a laser source; wherein the monitoring system observes a plurality of output parameters of the laser source;', 'wherein the monitoring system generates an output signal;, 'a monitoring system,'}a calibration interface, wherein the plurality of output parameters of the laser source are pre-calibrated such that a laser beam emitted from the laser source does not to exceed a threshold exposure level at a pre-determined distance from the laser source;a safety system that receives the output signal, wherein the safety system detects a state of operation of the laser beam based on the output signal and attenuates the laser beam in the event the laser beam exceeds the threshold exposure level.2. The system of claim 1 , further comprising:an anti-tampering device operably connected to the calibration interface, wherein the anti-tampering device prevents modification of the plurality of output parameters of the laser source by unauthorized users.3. The system of claim 1 , further comprising:a motorized yoke, wherein the yoke changes an axis of projection of the laser.4. The system of claim 3 , further comprising:a yoke position sensor that generates a yoke output signal, wherein the yoke output signal is transferred to the safety system.5. A method of operating a laser projection system for an audience claim 3 ...

HIGH ENERGY LASER TARGET BOARD APPARATUS

A laser target board apparatus is provided for detecting spatial and temporal intensity distribution of high energy laser beams. The laser target board apparatus may include a panel having a plurality of openings and a plurality of optical rods placed therein. The laser target board apparatus may further have an optic fiber array positioned substantially parallel to and behind the panel and separated from the panel by a predetermined distance. At least one lens is configured to receive photons emitted from a second end of each optic fiber unit of the optic fiber array, and at least one camera is configured to detect the photons. A processor is configured to analyze temporal and spatial distribution of intensity of the received high energy laser beam based on data generated by the at least one camera. 1. A laser target board apparatus for detecting spatial and temporal intensity distribution of high energy laser beams , comprising:a panel having a plurality of openings and a plurality of optical rods placed therein, the panel being made of an energy barrier material capable of remaining mechanically intact at a temperature of at least 1,500 degrees Celsius when receiving a high energy laser beam, the plurality of optical rods configured to allow photons of the received high energy laser beam to be emitted through the plurality of optical rods;an optic fiber array positioned substantially parallel to and behind the panel and separated from the panel by a predetermined distance, the optic fiber array including a plurality of rows of optic fiber units and a plurality of columns of optic fiber units, each optic fiber unit having a tip portion for receiving photons from the plurality of optical rods and a propagation portion having a first end connected to the tip portion and a second end, each optic fiber unit configured to transmit a received photon at the tip portion from the first end of the propagation portion to the second end of the propagation portion;at least one ...

SYSTEMS, METHODS, AND APPARATUSES FOR IN MACHINE PROFILING OF A LASER BEAM

A laser system includes a controller comprising a processor and a non-transitory machine-readable memory, a laser head configured to output a laser beam, a work bed positioned opposite the laser head, and a power meter communicatively coupled to the electronic control unit and integrated within the work bed. The laser system further includes a knife edge plate positioned between the power meter and the laser head, and a machine-readable instruction set stored in the non-transitory machine readable memory that causes the laser system to perform at least the following when executed by the processor: position the laser head at a distance from the power meter, cause the laser head to output the laser beam, translate the laser head across the power meter, receive power signals from the power meter as the laser beam is translated across the power meter, and calculate a spot size based on the power signals. 1. A laser system comprising:an electronic control unit comprising a processor and a non-transitory machine readable memory;a manipulable support communicatively coupled to the electronic control unit such that control signals generated by the electronic control unit control movement of the manipulable support;a laser head configured to output a laser beam;a work bed positioned opposite the laser head such that the laser beam output by the laser head is directed onto the work bed;a power meter communicatively coupled to the electronic control unit and integrated within the work bed;a knife edge plate positioned between the power meter and the laser head, wherein the knife edge plate forms a blocked portion and a transmission portion defined by a knife edge extending across the power meter; and position the laser head at a first distance from the power meter;', 'cause the laser head to output the laser beam;', 'translate the laser head across the power meter, wherein the laser beam is translated from the blocked portion across the knife edge into the transmission portion ...

Light beam measurement device, laser apparatus, and light beam separator

A light beam measurement device includes: a polarization measurement unit including a first measurement beam splitter provided on an optical path of a laser beam and configured to measure a polarization state of the laser beam having been partially reflected by the first measurement beam splitter; a beam profile measurement unit including a second measurement beam splitter provided on the optical path of the laser beam and configured to measure a beam profile of the laser beam having been partially reflected by the second measurement beam splitter; and a laser beam-directional stability measurement unit configured to measure a stability in a traveling direction of the laser beam, while the first measurement beam splitter and the second measurement beam splitter are made of a material containing CaF 2 .

OPTICAL RECEPTACLE AND OPTICAL MODULE PROVIDED WITH SAME

An optical receptacle includes a light dividing surface that divides light from a light-emitting element into monitor light and coupling light to be coupled with an optical transmission body using total reflection. The light dividing surface includes a first curved surface that protrudes to the side opposite to a first surface from a first virtual reference surface having a slope angle of angle α[°] in relation to the first surface on a photoelectric conversion device side of an optical receptacle main body and a second curved surface that is connected to the first curved surface and protrudes to the side opposite to the first surface from a second virtual reference surface having a slope angle of angle β[°] in relation to the first surface, in which α and β satisfy α>β>critical angle. 1. An optical receptacle that is capable of optically coupling a light-emitting element and an optical transmission body in a state in which the optical receptacle is disposed between a photoelectric conversion device and the optical transmission body , the photoelectric conversion device having the light-emitting element and a light-receiving element that receives monitor light for monitoring light emitted from the light-emitting element , said optical receptacle comprising:a first surface on the photoelectric conversion device side of an optical receptacle main body on which the light from the light-emitting element is incident and from which the monitor light directed towards the light-receiving element is emitted;a light dividing surface that is disposed on a second surface of the optical receptacle main body on the side opposite to the first surface so that the light from the light-emitting element that has been incident on the first surface is internally incident on the light dividing surface, and that divides the internally incident light from the light-emitting element into the monitor light and coupling light to be coupled with the optical transmission body using total ...

DEVICE FOR MEASURING A POWER DENSITY DISTRIBUTION OF A RADIATION SOURCE

A device and method for measuring a power density distribution of a radiation source is provided. The device includes a radiation source designed to emit a light beam in a radiation direction; a substrate disposed downstream of the radiation source in the radiation direction and having an extent in an x-direction and a y-direction, the substrate having a first region and at least one further second region, and the first region comprises a diffractive structure designed to separate the light beam impinging on the substrate into a zeroth order of diffraction and at least one first order of diffraction; and a detector unit disposed downstream of the substrate in the radiation direction and designed to measure the intensity of the first order of diffraction transmitted through the substrate and to derive a power density distribution therefrom. 1. A device for measuring a power density distribution of a radiation source , the device comprising:a radiation source adapted to emit a light beam in a radiation direction;a substrate disposed downstream of the radiation source in the radiation direction and having an extent in an x-direction and a y-direction, the substrate having a first region and at least one further second region, the first region comprising a diffractive structure adapted to separate the light beam impinging on the substrate into a zeroth order of diffraction and at least one first order of diffraction; anda detector unit disposed downstream of the substrate in the radiation direction and adapted to measure the intensity of the first order of diffraction transmitted through the substrate and to derive a power density distribution therefrom.2. The device according to claim 1 , wherein the first region is configured such that only one specific portion of the light beam is separated into a zeroth order of diffraction and at least one first order of diffraction claim 1 , and the substrate and/or the radiation source are/is movable and claim 1 , as a result of ...

Sub-micron alignment of a monitoring fiber for optical feedback in an ophthalmic endo-illumination system

An ophthalmic endo-illumination system includes a light source producing a light beam, a beam splitter configured to split the light beam into a first beam provided to a fiber port and a second beam coupled to a monitoring fiber, and an alignment system for aligning the monitoring fiber. The alignment system includes a moveable ferrule housing having the monitoring fiber secured therein and a displacement mechanism for displacing housing in a first direction. The displacement mechanism includes a transfer spring coupled to the housing and a screw actuator having a sloped surface contacting a motion transfer ball such that movement of the screw actuator causes the motion transfer ball to move along the sloped surface, the motion transfer ball contacting the transfer spring such that movement of the motion transfer ball along the sloped surface causes a displacement of the transfer spring, thereby displacing the housing in the first direction.

RADIATION SENSOR APPARATUS

A radiation sensor apparatus for determining a position and/or power of a radiation beam, the radiation sensor apparatus including a chamber to contain a gas, one or more sensors, and a processor. The chamber has a first opening and a second opening such that a radiation beam can enter the chamber through the first opening, propagate through the chamber generally along an axis, and exit the chamber through the second opening. Each of the one or more sensors is arranged to receive and detect radiation emitted from a region of the chamber around the axis. The processor is operable to use the radiation detected by the one or more sensors to determine a position and/or power of the radiation beam. 1. A radiation sensor apparatus for determining a position and/or power of a radiation beam , the radiation sensor apparatus comprising:a chamber configured to contain a gas, the chamber having a first opening and a second opening such that a radiation beam can enter the chamber through the first opening, propagate through the chamber generally along an axis, and exit the chamber through the second opening;one or more sensors, each arranged to receive and detect secondary radiation emitted from the gas in a region of the chamber around the axis; anda processor configured to use the secondary radiation detected by the one or more sensors to determine a position and/or power of the radiation beam.2. The radiation sensor apparatus of claim 1 , wherein the one or more sensors comprise filtering optics arranged to filter out one or more bands of radiation.3. The radiation sensor apparatus of claim 1 , comprising two sensors claim 1 , each sensor being arranged to receive and detect secondary radiation emitted from the region of the chamber around the axis in a different direction.4. The radiation sensor apparatus of claim 3 , wherein the two sensors are arranged to receive and detect secondary radiation emitted from the region of the chamber around the axis in two generally ...

OPTIMIZATION OF THE LASER OPERATING POINT IN A LASER ABSORPTION SPECTROMETER

An operating value of a first laser parameter of a laser device in a laser absorption spectrometer is optimized. The wavelength of laser device emitted light is adjusted by the first or a second laser parameter. The laser absorption spectrometer comprises a light intensity detector measuring the laser light intensity from the laser device. For each of multiple values of the first laser parameter: the light intensity detector measures light intensity obtained across a range of second laser parameter values, and an extremum in the light intensity measure and a peak position for the extremum are identified. A range of first laser parameter values is identified within the values of the first laser parameter for which there is a continuous trend in changes to the identified peak position with changes to the first laser parameter. The first laser parameter operating value is set to be within the identified range. 1. A method for optimizing an operating value of a first laser parameter of a laser device in a laser absorption spectrometer , wherein the wavelength of laser light emitted from the laser device is variable by adjusting either of the first laser parameter and a second laser parameter of the laser device , and wherein the laser absorption spectrometer includes a light intensity detector configured to measure the intensity of laser light received from the laser device , the method comprising: obtaining a measure of light intensity received at the light intensity detector across a range of values of the second laser parameter;', 'identifying an extremum in the measure of light intensity; and', 'identifying a peak position for the extremum;, 'for each of a plurality of values of the first laser parameteridentifying a range of values of the first laser parameter within the plurality of values of the first laser parameter for which there is a continuous trend in changes to the identified peak position with changes to the first laser parameter; andsetting the operating ...

METHOD AND SYSTEM FOR CALIBRATING LASER POWER

Disclosures of the present invention describe a method for calibrating laser power. During a laser power calibration of a laser optics product, reference intensity data and reference power data are adopted for generating a reference trend line with a Rvalue that is equal to 1. As such, real intensity data that have a residual value smaller than a threshold value are adopted for generating a first trend line in combination with real power data. Moreover, the real intensity data that have a residual value greater than the threshold value are utilized for generating a second trend line in combination with corresponding real power data. Consequently, under an assistance of a predict trend line constituted by the first trend line and the second trend line, the laser power calibration is therefore completed after the laser optics product successively emits a laser beam by a few times. 1. A method for calibrating laser power , comprising following steps:(1) letting a laser optics product successively emits a laser light by a plurality of times, so as to receive the laser light by using a light receiving unit;(2) configuring a controlling and processing device to record a plurality of real intensity data and a plurality of real power data in a data storage unit thereof, wherein the respective real intensity data and real power data are measured from the respective laser lights that are emitted by the laser optics product in the respective times;(3) configuring the controlling and processing device to generate a reference trend line based on a plurality of reference intensity data and a plurality of reference power data, wherein the reference trend line has a coefficient of determination that is equal to 1;(4) configuring the controlling and processing device to apply a first linear regression process to the plurality of real intensity data and the plurality of real power data for producing a first linear regression graph, thereby adding the reference trend line in the first ...

MODE CONTROL OF PHOTONIC CRYSTAL FIBER BASED BROADBAND RADIATION SOURCES

A mode control system and method for controlling an output mode of a broadband radiation source including a photonic crystal fiber (PCF). The mode control system includes at least one detection unit configured to measure one or more parameters of radiation emitted from the broadband radiation source to generate measurement data, and a processing unit configured to evaluate mode purity of the radiation emitted from the broadband radiation source, from the measurement data. Based on the evaluation, the mode control system is configured to generate a control signal for optimization of one or more pump coupling conditions of the broadband radiation source. The one or more pump coupling conditions relate to the coupling of a pump laser beam with respect to a fiber core of the photonic crystal fiber. 1. A mode control system , being configured for controlling an output mode of a broadband radiation source comprising a photonic crystal fiber (PCF) , the mode control system comprising:at least one detection unit configured to measure one or more parameters of radiation emitted from the broadband radiation source to generate measurement data; anda processing unit configured to evaluate mode purity of the radiation emitted from the broadband radiation source, from the measurement data;wherein based on the evaluation, the mode control system is configured to generate a control signal for optimization of one or more pump coupling conditions of the broadband radiation source, the one or more pump coupling conditions relating to the coupling of a pump laser beam with respect to a fiber core of the photonic crystal fiber.2. The mode control system of claim 1 , wherein the one or more parameters of the radiation emitted from the broadband radiation source comprises one or more parameters indicative of mode purity of the broadband radiation source.3. The mode control system of claim 1 , wherein the radiation emitted from the broadband radiation source detected by the at least one ...

LASER BEAM PROFILER UNIT AND LASER PROCESSING APPARATUS

A laser beam profiler unit for measuring an intensity distribution of a laser beam oscillated from a laser oscillator includes a magnifying optical system for magnifying a spot diameter of the laser beam oscillated from the laser oscillator and focused by a condensing lens, a first transmission prism for attenuating the laser beam, a second transmission prism for further attenuating a laser beam reflected by the first transmission prism, an image capturing element for detecting the laser beam reflected by the second transmission prism, and an analyzer for analyzing an intensity distribution of a spot of the laser beam from data of the laser beam detected by the image capturing element. 1. A laser beam profiler unit for measuring an intensity distribution of a laser beam oscillated from a laser oscillator incorporated in a laser processing apparatus , comprising:a magnifying optical system for magnifying a spot diameter of the laser beam oscillated from the laser oscillator and focused by a condensing lens;a first transmission prism for attenuating the laser beam;a second transmission prism for further attenuating a laser beam reflected by the first transmission prism;an image capturing element for detecting the laser beam reflected by the second transmission prism; andan analyzer for analyzing an intensity distribution of a spot of the laser beam from data of the laser beam detected by the image capturing element.2. The laser beam profiler unit according to claim 1 , wherein the first transmission prism and the second transmission prism serve as paired transmission prisms claim 1 , one of the paired transmission prisms attenuates P-polarized light of the laser beam at a higher attenuation rate claim 1 , and the other of the paired transmission prisms attenuates S-polarized light of the laser beam at a higher attenuation rate claim 1 , whereby the first transmission prism and the second transmission prism attenuate the P-polarized light and the S-polarized light ...

LASER MACHINING METHOD ADJUSTING FOCUS SHIFT DEPENDING ON TYPE AND LEVEL OF CONTAMINATION OF EXTERNAL OPTICAL SYSTEM BEFORE LASER MACHINING

A laser machining method includes, before laser machining: calculating the amount of focus movement on the basis of a first measurement value measured with the external optical system warmed up and being the amount of energy of a laser beam passing through a small-diameter hole and a first reference value (database D) predetermined depending on the type of contamination of the external optical system in relation to the first measurement value; and compensating the focus position in laser machining on the basis of the calculated amount of focus movement. 1. A laser machining method executed by a laser machining device configured to perform laser machining to a workpiece after measuring an amount of focus movement due to contamination of an optical system to compensate a focus position , the laser machining method comprising , before laser machining:(a) issuing a command to emit a laser beam with a high power to the extent used for laser machining, toward a laser beam elimination part capable of eliminating the laser beam in order to warm up an external optical system configured to guide a laser beam from a laser oscillator to concentrate the laser beam on a surface of a workpiece;(b) after the external optical system is warmed up, issuing a command to adjust a focus position on a surface of a plate disposed in a position different from a position of the laser beam elimination part and having a small-diameter hole and a command to align an optical axis of the laser beam with a center of the small-diameter hole;(c) in a state where the external optical system is warmed up, issuing a command to emit a laser beam with a low power to the extent that the plate is not melted or deformed;(d) in a state where the external optical system is warmed up, measuring an amount of energy of the laser beam passing through the small-diameter hole as a first measurement value;(e) calculating an amount of focus movement on a basis of the first measurement value measured in a state where ...

Cmos wavefront sensors

A Complementary Metal Oxide Semiconductor (CMOS) wavefront sensor including a sensor element having an array of photodiodes and a passivation layer covering the sensor element. The sensor further includes a binary lens formed in the passivation layer and arranged to focus incident light onto the sensor element.

LASER SYSTEM

The laser system may include a plurality of laser apparatuses, a beam delivery device configured to bundle pulse laser beams emitted from respective laser apparatuses of the plurality of laser apparatuses to emit a bundled pulse laser beam, and a beam parameter measuring device provided in an optical path of the bundled pulse laser beam to measure a beam parameter of each one of the pulse laser beams and a beam parameter of the bundled pulse laser beam. 1. A laser system comprising:a plurality of laser apparatuses;a beam delivery device configured to bundle pulse laser beams emitted from respective laser apparatuses of the plurality of laser apparatuses to emit a bundled pulse laser beam; anda beam parameter measuring device provided in an optical path of the bundled pulse laser beam to measure a beam parameter of each one of the pulse laser beams and a beam parameter of the bundled pulse laser beam.2. The laser system according to claim 1 , whereinthe beam parameter measuring device includes a selecting mechanism, the selecting mechanism being configured to select at least one of the pulse laser beams, the beam parameter measuring device being configured to measure the beam parameter of each one of the at least one of the pulse laser beams.3. The laser system according to claim 1 , whereinthe beam parameter measuring device includes an image sensor and a selecting mechanism, the selecting mechanism being configured to select at least one of the pulse laser beams to have the at least one of the pulse laser beams enter the image sensor, the image sensor being configured to measure the beam parameter of each one of the at least one of the pulse laser beams.4. The laser system according to claim 1 , further comprising:beam steering devices provided in respective optical paths between the respective laser apparatuses and the beam parameter measuring device; anda controller configured to control the beam steering devices based on measurement result of the beam parameter ...

Method for estimating illuminance and an electronic device thereof

A method and an electronic device for measuring illuminance are provided. An operating method of the electronic device includes identifying time intervals when a display of the electronic device operates in a deactivated state, and determining illuminance using at least one sensing value measured through an illuminance sensor during the identified time intervals. The illuminance sensor may be disposed under the display.

Light compensating system and method thereof

A light compensating system in accordance with this invention comprises a plurality of light emitting devices, an image capturing device, and a processing device. The processing device is respectively coupled to the plurality of light emitting devices and the image capturing device. Each light emitting device is used for emitting light to illuminate a certain area in space. The image capturing device is used for capturing a first image, which can be defined as a plurality of image blocks. Each image block is affected by the light from at least one corresponding light emitting device. The processing device is used for analyzing a brightness value of at least one of the plurality image block and adjusting at least one light emitting device corresponding to the analyzed image block based on the brightness value.

Failure detection in lighting system

The present invention relates to a method of detecting a failed luminaire and/or light sensor in a lighting system comprising M luminaires and N light sensors. The elements Dof an N×M transfer matrix D expresses how each luminaire l affect a light sensor s with respect to sensed light intensity, wherein s=1, 2, . . . N, and l=1, 2, . . . , M. The method comprises the steps of: setting the intensity of light emitted by the respective luminaires in the lighting system to a first intensity setting according to the respective elements of a first intensity vector I(), determining a first sensor intensity vector E(), setting the intensity of light emitted by the respective luminaires to at least a second intensity setting according to the respective elements of a second intensity vector I(), wherein at least one element of Idiffers from a corresponding element or elements in determining a second sensor intensity vector E(), determining fault detection vectors from a difference between Eand D·Iand between Eand D·I, respectively (), and identifying a failed luminaire and/or light sensor on basis of a difference between corresponding elements of the respective fault detection vectors (). The present invention further relates to a failure detection system for detecting a failed luminaire and/or light sensor. 1. A method of detecting a failed luminaire and/or light sensor in a lighting system comprising M luminaires and N light sensors , wherein the elements Dsl of an N×M transfer matrix D expresses how each luminaire l affect a light sensor s with respect to sensed light intensity , wherein s=1 , 2 , . . . , N , and l=1 , 2 , . . . , M , and wherein each luminaire is controllable with respect to intensity of light emitted by the luminaire and each light sensor is adapted to sense intensity of light , the method comprising the steps of:setting the intensity of light emitted by the respective luminaires in the lighting system to a first intensity setting according to the ...

Laser processing device and method for processing a workpiece

A laser processing device for processing a workpiece is provided, including a laser emitter, a lens module, a driving module, a camera module, and a processing unit. The lens module has a first lens and a second lens, wherein the laser emitter emits a laser beam through the first and second lenses to the workpiece. The driving module drives the first lens to move relative to the second lens. The camera module captures an image of the workpiece. The processing unit is electrically connected to the camera module and the driving module, wherein the camera module transmits an image signal to the processing unit according to the image of the workpiece, and the processing unit transmits a driving signal to the driving module according to the image signal, driving the first lens to move relative to the second lens. A method for processing a workpiece is also provided.

Electronic method for extracting the amplitude and phase of a signal in a synchronous detector and application thereof in interferometric circuits

The invention concerns an electronic method for extracting the amplitude E S and the phase φ S of an electrical signal in a synchronous detector, the signal containing a modulated part I mod of the form I mod ∝E S f(t)*cos(φ S −φ R (t)), where φ R (t) and f(t) are two known temporal modulation functions. The method comprises the following steps: multiplying the signal by two reference signals C(t) and S(t) constructed from φ R (t) and f(t); integrating the resulting signals over a time t int ; determining the amplitude and phase of said signal from the quantities X and Y resulting from the previous integrations. The method is characterised in that: said electrical signal is multiplied by C(t) and S(t) that can be decomposed on the same set of frequencies as those present in I mod . The invention also concerns the application of the above method in interferometric circuits and the use and execution of the above method.

PORTABLE MEASURING UNIT

Portable measuring unit () for performing a measuring process for an apparatus for additively manufacturing of three-dimensional objects by means of successive layerwise selective irradiation and consolidation of layers of a build material which can be consolidated by means of an energy beam, with a holding unit () configured for holding an image detection unit () in a position relative to a sample, wherein the image detection unit () is configured to measure an irradiation pattern of the sample () previously irradiated by the apparatus, wherein the portable measuring unit () is arbitrarily assignable to the or an apparatus. 1123310101. Portable measuring unit () for performing a measuring process for an apparatus for additively manufacturing of three-dimensional objects by means of successive layerwise selective irradiation and consolidation of layers of a build material which can be consolidated by means of an energy beam , with a holding unit () configured for holding an image detection unit () in a position relative to a sample , wherein the image detection unit () is configured to measure an irradiation pattern generated on the sample () by previously irradiating the sample () with the energy beam , wherein the portable measuring unit () is arbitrarily assignable to the or an apparatus.2510. Portable measuring unit according to claim 1 , characterized by a base plate () configured to hold and/or receive the sample () in a defined measuring position.35910. Portable measuring unit according to claim 2 , characterized in that the base plate () comprises a reception () claim 2 , in particular a recess or a groove claim 2 , configured to receive the sample () in a defined measuring position.4567. Portable measuring unit according to claim 2 , characterized in that the base plate () is segmented into at least two separable segments ( claim 2 , ).52. Portable measuring unit according to claim 1 , characterized in that the holding unit () is detachable.613523325. ...

APPARATUS AND METHOD FOR SENSING HIGH PRECISION SIGNAL USING INFRARED LIGHT

A high precision signal sensing system and method using an infrared light is provided. The high precision signal sensing system may receive, from a light emitting device, a plurality of lights including a first light and a second light, may measure intensities of the first light and the second light, and may measure a light emitting intensity of the light emitting device based on an intensity difference between the measured light receiving intensities. 1. A high precision signal sensing system , the system comprising:a receiver to receive a first signal and a second signal emitted from a transmitter; anda measuring device to measure an intensity with respect to the first signal and the second signal and to estimate at least one of a location and direction of a target object comprising the transmitter based on at least one of the measured intensities of the first signal and the second signal and an intensity difference between the measured intensities,wherein the measured intensities of the first signal and the second signal depend on at least one of a receiving direction at the receiver, an emitting direction at the transmitter and a distance between the transmitter and the receiver.2. The system of claim 1 , wherein the measuring device estimates at least one of the location and the direction of the target object by measuring a directional signal based on at least one of the measured intensities and the intensity difference.3. The system of claim 2 , wherein claim 2 , the measuring device measures claim 2 , as the directional signal claim 2 , a signal corresponding to the intensity difference in a directionality where a first intensity or a second intensity is less than the intensity difference claim 2 , the first intensity being measured with respect to the first signal and the second intensity being measured with respect to the second signal.4. The system of claim 2 , wherein the measuring device measures claim 2 , as the directional signal claim 2 , a signal ...

METHOD AND DEVICE FOR QUANTITATIVELY SENSING THE POWER FRACTION OF A RADIATION BACKGROUND OF A PULSED LASER

The present disclosure provides a method and to a device for quantitatively sensing the power fraction of a radiation background of a pulsed laser. The disclosure further relates to the use of a saturable element. The method includes modulating a measurement beam, which is emitted by the laser, by means of a saturable element in accordance with the fluence of the measurement beam, detecting, by means of a modulation beam power detector, the power of the measurement beam modulated by the saturable element, and determining the power fraction of the radiation background of the pulsed laser on the basis of the detected power of the measurement beam modulated by means of the saturable element. 1. A method for quantitatively detecting the power proportion of a radiation background of a pulsed laser , the method comprising:modulating a measurement beam emitted by the laser using a saturable element, wherein the beam is modulated depending on a fluence of the measurement beam;detecting the power of the measurement beam modulated by the saturable element using a modulation beam power detector; anddetermining the power proportion of the radiation background of the pulsed laser based on the detected power.2. The method according to claim 1 , wherein the method comprises claim 1 , prior to modulating the measurement beam claim 1 ,splitting a laser beam emitted by the laser into a reference beam and the measurement beam using a beam splitter, and wherein prior to the determining the power proportion, the method further comprises{'b': '17', 'detecting the power of the reference beam using a reference beam power detector ().'}3. The method according to claim 1 , wherein prior to detecting the power claim 1 , the method further comprises:adjusting the fluence of the measurement beam occurring at the saturable element using a fluence adjusting element such that the saturable element is in an unsaturated state as a consequence of the radiation background of the measurement beam, and ...

METHOD FOR CHECKING THE FUNCTIONALITY OF A MOTOR VEHICLE, AND MOTOR VEHICLE

The invention relates to a method for testing the operability of a motor vehicle () with a headlamp () which comprises a laser () for generating by means of which a converter () for emitting converted light is excited, which is emitted by the headlamp () for generating a predeterminable light distribution () on a surface area () in a surrounding area of the motor vehicle (), wherein the predeterminable light distribution () is set by a control device () of the headlamp (). The object of the invention is to check the condition of the converter (). A test pattern () is set by the control device () as light distribution (). The test pattern () is detected on the surface area () by means of an optical detection device () of the motor vehicle (). The detected test pattern () is compared with at a predetermined reference pattern by an evaluation device () of the motor vehicle (). The invention also relates to a motor vehicle (), which is designed to carry out such a method. 1. A method , comprising:testing headlamp of a motor vehicle in which the headlamp generates light by means of a laser by means of which a converter for emitting converted light is excited, which is dissipated by the headlamp for generating a predeterminable light distribution on a surface area in a surrounding area of the motor vehicle, the predeterminable light distribution is set by a control device of the headlamp,the testing including:setting a test pattern with the control device as light distribution;detecting the test pattern is detected on the surface area by means of an optical detection device of the motor vehicle;comparing the detected test pattern is compared with at least one predetermined reference pattern by an evaluation device of the motor vehicle the reference pattern corresponds to the test pattern generated from an undamaged or damaged headlamp; anddetecting an aging or a crack of the converter by comparing at least one of a brightness and a color by the evaluation device.2. The ...

ADJUSTING AN AMOUNT OF COHERENCE OF A LIGHT BEAM

Techniques for controlling an optical system include accessing a measured value of a property of a particular pulse of a pulsed light beam emitted from the optical system, the property being related to an amount of coherence of the light beam; comparing the measured value of the property of the light beam to a target value of the property; determining whether to generate a control signal based on the comparison; and if a control signal is generated based on the comparison, adjusting the amount of coherence in the light beam by modifying an aspect of the optical system based on the control signal to reduce an amount of coherence of a pulse that is subsequent to the particular pulse. 1. A method of controlling an optical system , the optical system comprising two or more resonator optical elements that define a resonator cavity , the resonator cavity comprising a gain medium between at least two of the two or more resonator optical elements , the method comprising:accessing a measured value of a property of a particular pulse of a pulsed light beam emitted from the optical system, the property being related to an amount of coherence of the light beam;comparing the measured value of the property of the light beam to a target value of the property;determining whether to generate a control signal based on the comparison; andif a control signal is generated based on the comparison, adjusting the amount of coherence in the light beam by modifying an aspect of the resonator cavity based on the control signal to reduce an amount of coherence of a pulse that is subsequent to the particular pulse.2. The method of claim 1 , wherein the property of the light beam comprises a divergence of the light beam.3. The method of claim 1 , wherein the divergence of the light beam is measured outside of the optical system or outside of the resonator cavity.4. The method of claim 1 , wherein the pulse that is subsequent to the particular pulse is a pulse that immediately follows the ...

Method and apparatus for detecting a laser

A laser detector apparatus (1) is provided, where a pixel array (3) is arranged behind a lens arrangement (4) such that distant objects (9) (in general, those at infinity) are out of focus at the pixel array. The image from the pixel array is evaluated by a computer processor (6) to detect such out of focus images which will be of a known size and shape (generally circular spots of known width). This can enable distant laser threats to be readily distinguished from nearby bright objects (10), whilst also protecting the pixel array from powerful laser sources (because the laser energy is not focussed to a point, on the pixel array it is less likely to damage the pixel array). It can also enable the wavelength of the laser to be accurately determined from the ratio of colours in the image of the laser spot, because it will typically not be a saturated image. The apparatus and method are particularly suitable for identifying and distinguishing laser sources across a wide range of brightnesses, and is also suitable for detecting and distinguishing multiple laser sources.

Detection of optical surface of patient interface for ophthalmic laser applications using a non-confocal configuration

An ophthalmic laser system uses a non-confocal configuration to determine a laser beam focus position relative to the patient interface (PI) surface. The system includes a light intensity detector with no confocal lens or pinhole between the detector and the objective lens. When the objective focuses the light to a target focus point inside the PI lens at a particular offset from its distal surface, the light signal at the detector peaks. The offset value is determined by fixed system parameters, and can also be empirically determined by directly measuring the PI lens surface by observing the effect of plasma formation at the glass surface. During ophthalmic procedures, the laser focus is first scanned insider the PI lens, and the target focus point location is determined from the peak of the detector signal. The known offset value is then added to obtain the location of the PI lens surface.

LASER AUTOCOLLIMATOR USING OPTICAL PARASITIC INTERFERENCE

A laser autocollimator assembly that provides an objective, unambiguous, and simple means to achieve precise (for example, arc second or sub arc-second) alignment between the laser autocollimator assembly and a reference surface. The laser autocollimator assembly relies on optical parasitic interference between a reflected beam from the reference surface and the laser beam in the laser cavity that, when alignment is achieved, results in a disruption of the action of the laser, resulting in a reduction in the output power level of the laser beam. By monitoring the power level of the laser beam, for example monitoring the power level of the reflected beam, it can be determined that alignment has been achieved when the power level of the laser beam has been reduced to a minimum level. The power level can be automatically monitored, thereby eliminating the need for user interpretation. 1. A method comprising:a) providing a laser assembly that includes a laser transmitter, a beam splitter and a power detector;b) directing a laser beam from the laser transmitter through the beam splitter onto a reference surface;c) using the power detector, detecting a power level of a return reflected beam resulting from the laser beam impacting on the reference surface;d) adjusting the laser assembly and the reference surface relative to one another to cause the return reflected beam to interfere with the laser beam transmitted from the laser transmitter;e) repeating c) and d) until the power level of the return reflected beam detected by the power detector reaches a minimized power level.2. The method of claim 1 , wherein d) comprises adjusting the laser assembly relative to the reference surface.3. The method of claim 1 , after completing e) claim 1 , automatically adjusting the laser assembly relative to the reference surface so that the detected power level of the return reflected beam is maintained at the minimized power level.4. The method of claim 1 , after completing e) claim 1 ...

MULTI-USE BEAM SAMPLER IN LASER BEAM DELIVERY PATH OF OPHTHALMIC LASER SYSTEM

In a laser beam delivery system for an ophthalmic laser system, a single multi-use beam sampler is employed to form three sampled laser beams, including two for redundant laser energy monitoring and one for laser focal point depth measurement. The beam sampler is a transparent plate with preferably parallel front and back surfaces. The front surface reflects a fraction of the incoming beam to form the first sampled beam toward an energy monitoring detector. The back surface reflects another fraction of the beam to form a second sampled beam exiting backwardly from the front surface toward another energy monitoring detector. An objective lens focuses the transmitted beam onto a target, and collects back reflected or scattered light from the target to form a return beam. The back surface of the beam sampler reflects a fraction of the return beam to form the third sampled beam toward a third detector. 1. An ophthalmic laser system comprising:a beam sampler, comprising a plate made of a transparent material with a front surface and a back surface, wherein the beam sampler is configured to receive a laser beam at the front surface, to form a first sampled beam by reflecting a first fraction of the laser beam by the front surface, to form a second sampled beam by reflecting a second fraction of the laser beam by the back surface, the second sampled beam exiting the front surface, and to transmit a portion of the laser beam out of the back surface;a first light detector and a second light detector respectively disposed to receive and detect the first sampled beam and the second sampled beam, the first and second light detectors being independent of each other;an objective lens, disposed to receive the laser beam transmitted through the beam sampler and to focus the laser beam to a focal point in a target, wherein the objective lens is further configured to receive a laser light reflected or scattered from the target to form a return beam toward the back surface of the beam ...

System to control wavelength and method to control wavelength

A system includes: a splitter to branch an optical signal output by a wavelength-tunable light source into first to third optical signals; a first photodiode to perform an optical electrical conversion of the first optical signal transmitting a first etalon; a second photodiode to perform an optical electrical conversion of the second optical signal transmitting a second etalon, an FSR of the second etalon being identical to that of the first etalon, peak wavelengths of intensity of a transmitted light of the second etalon being different from those of the first etalon; a third photodiode to perform an optical electrical conversion of the third optical signal; and a controller to control the wavelength-tunable light source with use of a coefficient calculated by following formulas (1) or (2), Coefficient=(PD1−A·PD3)/(PD2−B·PD3) (1) and Coefficient=(PD2−B·PD3)/(PD1−A·PD3) (2).

APPARATUS AND METHOD FOR DETERMINING PROPERTIES OF A LASER BEAM

An apparatus for the determination of geometric parameters of a laser beam, such as, for example, the beam diameter or the focus diameter. The apparatus includes a device for the emission of a laser beam into an active region, a detector arrangement, which can be positioned in the active region, a device for the provision of a relative movement between the laser beam and the detector arrangement, and a device for the registration and evaluation of a temporally varying signal of the detector arrangement. The detector arrangement includes at least one light guide, at least two flight-diffusing structures, and at least one light-sensitive sensor. The light guide has a light-emitting surface and a light-conducting region, with an elongated shape. The at least two light-diffusing structures are essentially extended along two different directions. 28014101120. The apparatus according to claim 1 , wherein the device () for the provision of a relative movement is configured to scan a cross-section () of the laser beam ( claim 1 , ) by means of the detector arrangement ().38014101120. The apparatus according to claim 1 , wherein the device () for the provision of a relative movement is configured to scan a cross-section () of the laser beam ( claim 1 , ) by means of the detector arrangement () in two different directions.4. The apparatus according to claim 1 , wherein the relative movement is essentially a circular movement or an elliptical movement.5. The apparatus according to claim 1 , wherein the relative movement is essentially a rotary movement.6. The apparatus according to claim 1 , wherein the relative movement includes a first and a second component and the first component is an at least partly periodic fast movement and the second component is a slow movement in a linearly independent direction of the direction of movement of the first component.7313233. The apparatus according to claim 1 , wherein both the first light-conducting structure () extended in the first ...

Experimental System for Laser Beam Measurement and Steering Control

An experimental system for laser beam measurement and steering control, and relates to the technical field of optical, mechanical and electronic integration experimental systems. It includes: a high-precision optical mirror, a piezoelectric micro-actuator, a vibration exciter, a signal collection subsystem, a laser emitter, a beam splitter mirror, a fast steering mirror, a mechanical vibration isolation air bearing table, an optical vibration isolation air bearing table, a data processing and analyzing subsystem, and data transmission lines and power supply lines between subsystems and components. It uses a deflection angle of the laser beam as a control variation, can not only precisely measure the deflection angle of the laser beam, but also inhibit vibration of the high-precision optical mirror by using the piezoelectric micro-actuator and directly adjust the steering of the emitted laser beam by using the fast steering mirror, thereby improving precision of beam steering control. 1123456789101. An experimental system for laser beam measurement and steering control , characterized by comprising a high-precision optical mirror () , a piezoelectric ceramic micro-actuator () , a vibration exciter () , a signal collection subsystem () , a laser emitter () , a beam splitter mirror () , a fast steering mirror () , a mechanical vibration isolation air bearing table () , an optical vibration isolation air bearing table () , a data processing and analyzing subsystem () , and data transmission lines and power supply lines between subsystems and components , wherein the experimental system for laser beam measurement and steering control can simulate different working environments of the high-precision optical mirror () , precisely measure a laser beam deviation angle , and control a laser beam steering;{'b': 1', '1', '1', '1', '2, 'the high-precision optical mirror () is composed of an optical lens (-) and a lens holder platform (-);'}{'b': 1', '2', '1', '201', '1', '202', ...

Supercontinuum Generation Apparatus and Method

Apparatuses and methods for supercontinuum generation using a laser beam and a plurality of condensed state transparent plates are presented. As an example, plate material to be used for one of the plurality of plates is determined. A thickness of the one of the plurality of plates is also determined. An allowable laser intensity of the laser beam is then determined to be λ/(2nnL), where λ is the central incident wavelength in vacuum, nis the linear refractive index, nis the third-order nonlinear coefficient. A location of a next plate is then determined to be a distance downstream from the one of the plurality of plates where a laser intensity of the laser beam returns to a value of the determined allowable laser intensity. 1. A continuous spectrum generation apparatus , comprising:a laser light source configured to emit a laser beam;a plurality of condensed state transparent plates, disposed in sequence on a transmitting path of the laser beam to successively and sequentially extend a spectral bandwidth of the laser beam, wherein one or more of temporal, spatial and spectral value of a pulse of the laser beam in a forward propagation direction z through a plate number n are determined as a function of z; anda pulse characterization apparatus configured to characterize the pulse of the laser beam.2. The apparatus of wherein a spacing between two of the plurality of plates is determined by where an intensity of the laser beam is λ/(2nnL) claim 1 , where λ is the central incident wavelength in vacuum claim 1 , nis the linear refractive index claim 1 , nis the third-order nonlinear coefficient claim 1 , L is the thickness of the plates.3. The apparatus of wherein spacing between two of the plurality of plates is determined by where an intensity of the laser beam is less than 0.9 times a damage intensity of a generating medium.4. The apparatus of wherein spacing between two of the plurality of plates is determined by where an intensity of the laser beam is less than 0. ...

Detection of optical surface of patient interface for ophthalmic laser applications using a non-confocal configuration

An ophthalmic laser system uses a non-confocal configuration to determine a laser beam focus position relative to the patient interface (PI) surface. The system includes a light intensity detector with no confocal lens or pinhole between the detector and the objective lens. When the objective focuses the light to a target focus point inside the PI lens at a particular offset from its distal surface, the light signal at the detector peaks. The offset value is determined by fixed system parameters, and can also be empirically determined by directly measuring the PI lens surface by observing the effect of plasma formation at the glass surface. During ophthalmic procedures, the laser focus is first scanned insider the PI lens, and the target focus point location is determined from the peak of the detector signal. The known offset value is then added to obtain the location of the PI lens surface.

MINIMIZING GRAZING INCIDENCE REFLECTIONS FOR RELIABLE EUV POWER MEASUREMENTS

A method includes generating light in a light generating chamber, causing a portion of the generated light to pass through a tube having a roughened inner surface, and detecting the portion of the generated light that has passed through the tube using a photodetector. The roughened inner surface of the tube has a surface roughness sufficient to cause grazing incidences of light to be eliminated rather than to be reflected off the roughened inner surface. In one example, the method includes outputting a signal from the photodetector to a controller, with the signal corresponding to the detected portion of the generated light. The light generated in the light generating chamber can be extreme ultraviolet (EUV) light. In tests using roughened and non-roughened protection tubes, the roughened tube was found to minimize or essentially eliminate the contribution to EUV energy from grazing incidence reflections off the inner surface of the tube. 1. A method , comprising:generating light in a light generating chamber;causing a portion of the generated light to pass through a tube having a roughened inner surface;detecting the portion of the generated light that has passed through the tube using a photodetector; andoutputting a signal from the photodetector to a controller, the signal corresponding to the detected portion of the generated light.2. The method of claim 1 , wherein the generating of light in the light generating chamber generates extreme ultraviolet (EUV) light.3. The method of claim 1 , wherein the roughened inner surface of the tube has a surface roughness sufficient to cause grazing incidences of light to be eliminated rather than to be reflected off the roughened inner surface.4. The method of claim 1 , wherein the inner surface of the tube is roughened by bead blasting the inner surface of the tube claim 1 , and threading the bead-blasted inner surface of the tube.5. The method of claim 1 , wherein the roughened inner surface of the tube has a surface ...

LASER PATTERNING EXAMINING APPARATUS

A laser patterning examining apparatus includes a fixing plate, a rotating plate configured to move vertically with respect to the fixing plate and to rotate, a housing connected to the rotating plate, a laser emission unit over the fixing plate and emits a laser beam, a prism unit on the housing and refracts a first portion of the laser beam received from the laser emission unit and transmits a second portion of the laser beam, and a beam profiler on the housing and analyzes the pattern of the first portion refracted by the prism unit. 1. A laser patterning examining apparatus , comprising:a fixing plate;a rotating plate configured to move vertically with respect to the fixing plate and to rotate;a housing connected to the rotating plate;a laser emission unit installed above the fixing plate and emits a laser beam;a prism unit on the housing, the prism unit refracting a first portion of the laser beam received from the laser emission unit and transmitting a second portion of the laser beam; anda beam profiler on the housing, the beam profiler analyzing the pattern of the first portion refracted by the prism unit.2. The laser patterning examining apparatus of claim 1 , wherein the prism unit is configured to move the housing vertically.3. The laser patterning examining apparatus of claim 2 , wherein the prism unit comprises:a prism; anda prism installation unit on which the prism is installed.4. The laser patterning examining apparatus of claim 3 , wherein the prism unit further comprises a first up-and-down distance adjustment unit coupled to the prism installation unit and moves the prism installation unit perpendicular to the housing.5. The laser patterning examining apparatus of claim 1 , further comprising a mirror unit below the prism unit claim 1 , the mirror unit reflecting the second portion.6. The laser patterning examining apparatus of claim 5 , further comprising a mirror forward-backward movement driving unit connected to the mirror unit and moves the ...

Trasparent Measuring Probe for Beam Scanning

The invention relates to a measuring probe for scanning light beams () or laser beams. The measuring probe is suitable for scanning laser beams with very high power and for determining geometric parameters of a light beam () with high spatial resolution. For this purpose, a device is proposed which comprises a body (), a probe area () and a detector (). The body () is made of an optically transparent material and has a light beam entry surface (), a light beam exit surface () and a detection light exit surface (). The light beam entry surface () and the light beam exit surface () are for the most part smooth and polished. The body () includes the probe area () having light-deflecting structuring. The detector () is designed to detect at least part of the beam portion () deflected from the light beam () by the probe area (). The body () and the light beam () are movable in two different directions of movement () perpendicular to the direction of the axis () of the light beam () relative to each other. The probe area () has a shape whose two-dimensional projection on a surface perpendicular to the axis () of the light beam () approximately the same dimensions in the two different directions of movement () perpendicular to the axis () of the light beam (). 110203040. A device for scanning a light beam () , comprising a body () , a probe area () and a detector () ,{'b': 20', '22', '23', '25', '22', '23', '20', '30, 'wherein the body () consists of an optically transparent material and comprises a light beam entry surface (), a light beam exit surface () and a detection light exit surface () and wherein the light beam entry surface () and the light beam exit surface () are for the most part smooth and polished, wherein the body () includes the probe area (),'}{'b': '30', 'wherein the probe area () has light-deflecting structuring,'}{'b': 40', '30', '15', '10', '20', '10', '51', '52', '11', '10, 'wherein the detector () is configured to detect at least a portion of the by ...

DEVICE AND METHOD OF MEASURING ABSORBED ENERGY-MOMENTUM SYMMETRY

A method and a device for measuring absorbed energy-momentum symmetry in which radiant energy W·sr·m·nmis compared directly against its absorbed impinging momentum kg·m·s−1 in a manner that will provide an experimental basis for asymmetrical anomalies that may or may not exist within a measurable range of the electromagnetic spectrum. 1. A method for measuring absorbed energy-momentum symmetry , in which methoda single source of high intensity radiant energy is split into two beams of equal energy each filtered to any chosen monochromatic wavelength,{'sup': −1', '−2', '−1, 'a first parameter radiant energy measurement of both beams in units of watts per steradian per square-meter per nanometer (W·sr·m·nm) is conducted at the first measuring point is led to a second measuring point,'}each beam of known wavelength and radiant energy impinge the energy absorbing targets of a equal-arm force comparator at the same angle of incidence and the same instant and duration of time causing rotation or angular velocity of the equal-arm force comparator,a second parameter measurement of the resultant angular velocity of the rotating components of the equal-arm force comparator is detected with the aid of an apparatus for measuring the angular velocity of a rotating member is conducted at the second measuring point,an electrical output of the measured angular velocity from the second measuring point is input into a programmable logic controller (PLC) yielding radiant momentum (p) in units of kg·m·s−1 from the known mass and the angular velocity of the rotating components of the equal-arm force comparator in accord with Newton's laws of motion,first and second parameters are recorded by the PLC and output as the first parameter measurement of radiant energy at chosen wavelength directly against the second parameter measurement of the radiant energy's impinging momentum, yielding measurement of absorbed energy-momentum symmetry.2. The method according to claim 1 , in which any ...

METHOD FOR DETERMINING AT LEAST ONE BEAM PROPAGATION PARAMETER OF A LASER BEAM

The invention relates to a method for determining at least one beam propagation parameter (M, w, θ, Z) of a laser beam, comprising: directing the laser beam through a lens arrangement towards a spatially resolving detector, imaging the laser beam at a plurality of different focus positions (F, . . . ) relative to the spatially resolving detector by adjusting a focal length (f, . . . ) of the lens arrangement, and determining the at least one beam propagation parameter (M, w, θ, Z) by evaluating an intensity distribution (l(x,y)) of the laser beam on the spatially resolving detector at the plurality of different focus positions (F, . . . ). The method comprises adjusting the focal length (f, . . . ) of the lens arrangement by arranging lens elements (A, . . . ; B, . . . ) having different focal lengths (f, . . . ; f, . . . ) in a beam path of the laser beam. 1. A method for determining at least one beam propagation parameter of a laser beam , comprising:directing the laser beam through a lens arrangement towards a spatially resolving detector,imaging the laser beam at a plurality of different focus positions relative to the spatially resolving detector adjusting a focal length of the lens arrangement, anddetermining the at least one beam propagation parameter by evaluating an intensity distribution of the laser beam on the spatially resolving detector at the plurality of different focus positions, characterized in that adjusting the focal length of the lens arrangement comprises arranging lens elements having different focal lengths in a beam path of the laser beam.2. The method according to claim 1 , wherein the lens arrangement comprises at least one carrier claim 1 , the carrier comprising a plurality of accommodation spaces claim 1 , each for accommodating at least one lens element and/or at least one attenuation element claim 1 , wherein arranging the lens elements having different focal lengths in the beam path of the laser beam comprises moving at least one ...

METHOD AND DEVICE FOR BEAM ANALYSIS

A method and an apparatus for beam analysis in an optical system are disclosed, wherein a plurality of beam parameters of a beam propagating along an optical axis are ascertained. The method includes: splitting the beam into a plurality of partial beams which have a focus offset in the longitudinal direction in relation to the optical axis; recording a measurement image produced by these partial beams; carrying out a forward simulation of the beam in the optical system on the basis of estimated initial values for the beam parameters in order to obtain a simulated image; and calculating a set of values for the beam parameters on the basis of the comparison between the simulated image and the measurement image. 1. (canceled)2. An apparatus , comprising:a beam-splitting optical arrangement configured to split a beam incident on the beam-splitting optical arrangement along an optical axis into a plurality of partial beams having a focus offset in a longitudinal direction relative the optical axis;a sensor arrangement configured to capture an image of the partial beams; and a) perform a forward simulation of the beam in the optical system based on estimated initial values for beam parameters to obtain a simulated image; and', 'b) calculate a set of values for the beam parameters based on a comparison between the simulated image and the measurement image., 'a controller configured to3. The apparatus of claim 2 , wherein the controller is configured to:c) iteratively perform a) and b), wherein, in each case, the calculated set of values for the beam parameters provide the basis of the forward simulation that following; andd) output the sets of values for the beam parameters ascertained in c).4. The apparatus of claim 3 , wherein c) reduces a number of varied beam parameters.5. The apparatus of claim 3 , wherein the controller is configured to vary an algorithm used during c).6. The apparatus of claim 2 , wherein the apparatus is configured to record a near-field image ...

METHOD OF DETECTING SPOT SHAPE OF PULSED LASER BEAM

A method of detecting a spot shape of a pulsed laser beam, includes applying a pulsed laser beam having a wavelength absorbable by an inspection wafer held on a chuck table continuously to the inspection wafer with a focused point on an upper surface of the inspection wafer thereby to form a plurality of laser spots on the upper surface of the inspection wafer. An image of the laser spots is captured, and profiles of shapes of the laser spots are extracted from the captured image of the laser spots. A degree of similarity between the captured image and the profile of an ideal laser spot shape is calculated and stored in a memory. The shapes of the laser spots are found to be improper if the calculated degree of similarity is lower than a threshold value. 1. A method of detecting a spot shape of a pulsed laser beam , the method comprising:an inspection wafer placing step of placing an inspection wafer on a chuck table;after performing the inspection wafer placing step, a laser spot forming step of applying a pulsed laser beam having a wavelength absorbable by the inspection wafer continuously to the inspection wafer with a focused point on an upper surface of the inspection wafer thereby to form a plurality of laser spots on the upper surface of the inspection wafer with clearances between adjacent ones of the laser spots;after performing the laser spot forming step, an imaging step of capturing an image of the laser spots with imaging means;a calculating step of extracting profiles of shapes of the laser spots from the image of the laser spots captured in the imaging step, and calculating a degree of similarity of the extracted profiles to the profile of an ideal laser spot shape stored in storage means;a properness diagnosing step of deciding that the shapes of the laser spots are improper if the degree of similarity calculated in the calculating step is lower than a threshold value; anda reporting step of reporting that the shapes of the laser spots are improper ...

LASER APPARATUS AND INFORMATION ACQUISITION APPARATUS USING THE SAME

A laser apparatus includes an active medium, a first reflection portion, a second reflection portion, a first laser array including a plurality of semiconductor lasers, a third reflection portion configured to reflect at least part of light emitted from the first laser array and transmitted through the active medium, and a fourth reflection portion configured to transmit at least part of light emitted from the first laser array, and to reflect at least part of light reflected by the third reflection portion and transmitted through the active medium. The fourth reflection portion is disposed across the plurality of semiconductor lasers including respective light-emitting regions of the plurality of semiconductor lasers of the first laser array. 1. A laser apparatus comprising:an active medium;a resonance unit including a first reflection portion and a second reflection portion which are configured to resonate light emitted from the active medium;a first laser array including a plurality of semiconductor lasers configured to emit light for exciting the active medium from a direction different from a resonance direction of the resonance unit;a third reflection portion configured to reflect at least part of light emitted from the first laser array and transmitted through the active medium; anda fourth reflection portion disposed between the active medium and the first laser array and configured to transmit at least part of light emitted from the first laser array, and to reflect at least part of light reflected by the third reflection portion and transmitted through the active medium,wherein the fourth reflection portion is disposed across the plurality of semiconductor lasers including respective light-emitting regions of the plurality of semiconductor lasers of the first laser array.2. The laser apparatus according to claim 1 , wherein the fourth reflection portion constitutes a part of the semiconductor lasers of the first laser array.3. The laser apparatus according ...

DEVICE AND METHOD OF MEASURING ABSORBED ENERGY-MOMENTUM SYMMETRY

A method and a device for measuring absorbed energy-momentum symmetry in which radiant energy W·sr·m·nmis compared directly against its absorbed impinging momentum kg·m·s−1 in a manner that will provide an experimental basis for asymmetrical anomalies that may or may not exist within a measurable range of the electromagnetic spectrum. 112-. (canceled)13. A method for measuring absorbed energy-momentum symmetry , comprising:splitting a single source of high intensity radiant energy into a first beam of energy and a second beam of energy, each beam being filtered to a desired monochromatic wave-length;{'sup': −1', '−1', '−1, 'conducting a first measurement of radiant energy of both beams at a first measuring point, said measurement being performed in units of watts per steradian per square meter per nanometer (W·sr·m·nm);'}providing an equal-arm force comparator device capable of engaging said two beams of energy, and rotating about a point, said comparator device including two targets to engage said two beams of energy such that said first beam impinges against a first target and said second beam impinges against a second target, said first and second beams having a known wavelength and radiant energy, and further said beams impinging against said targets at the same angle of incidence at the same moment and direction in time;conducting a second measurement of any resultant angular velocity of said targets included on said comparator device at a second measuring point to provide a measurement of the radiant energy's impinging momentum;determining an electrical output of the measured angular velocity as conducted as the second measuring point;providing a programmable logic controller including an input device;inputting an electrical output into said programmable logic controller, said input corresponding to the measured angular velocity as determined at the second measuring point and yielding a radiant momentum (p) value in the units of kg·m·s−1; anddetermining a ...

REFRACTIVE INDEX MEASURING DEVICE AND REFRACTIVE INDEX MEASURING METHOD

Provided are a refractive index measuring device and a refractive index measuring method. A detector () detects an intensity of a measuring beam transmitted through the sample. A camera () images a color image of the measuring beam which is dispersed into multiple colors by transmitting through the sample. A scanning processing portion () carries out scanning by changing an angle of receiving the measuring beam transmitted through the sample or an angle of the measuring beam incident on the sample. A wavelength specifying processing portion () specifies, based on the detected intensity of the detector () varying with the scanning by the scanning processing portion () and color information corresponding to a position of the measuring beam incident on the detector () in a color image which is imaged by the camera (), the wavelength corresponding to each peak of the detected intensity. 1. A refractive index measuring device , which irradiates a measuring beam to a sample kept in a V-shaped groove formed on a V-block prism via the V-block prism , thereby detecting the measuring beam transmitted through the sample and measuring a refractive index of the sample , comprising:a detector, which detects an intensity of the measuring beam transmitted through the sample;an imaging part, which images a color image of the measuring beam that is dispersed to multiple colors by transmitting through the sample;a scanning processing portion, which performs scanning by changing an angle of receiving the measuring beam transmitted through the sample or an angle of the measuring beam incident on the sample; anda wavelength specifying processing portion, wherein based on a detected intensity of the detector varying with the scanning of the scanning processing portion, and a color information corresponding to a position of the measuring beam incident on the detector in the color image that is imaged by the imaging part, the wavelength specifying processing portion specifies a wavelength ...

MEASURING DEVICE, MEASURING METHOD, AND PROGRAMS THEREFOR

A technique for identifying a measurement planned position for electromagnetic waves in a three-dimensional space in a simple and easy manner is provided. A position of a measuring unit that is carried by an operator is measured by a position measuring device that is configured to measure a position by laser light. A positional relationship between the measured position and the position of a measurement planned position is displayed on a terminal that is carried by the operator . This display guides the operator , and the operator identifies the measurement planned position and measure illuminance thereat. 1. A measuring device comprising:a controlling unit configured to control displaying of a relationship between a three-dimensional position of a measurement planned position and a three-dimensional position of an electromagnetic wave measuring device, on a display, the measurement planned position being set as a candidate at which electromagnetic waves are measured by the electromagnetic wave measuring device, and the three-dimensional position of the electromagnetic wave measuring device being measured by a position measuring device.2. The measuring device according to claim 1 , wherein the controlling unit controls displaying of a direction and a distance to the measurement planned position.3. The measuring device according to claim 1 , further comprising:a notification controlling unit configured to control displaying of a notice when a distance between the measurement planned position and the three-dimensional position of the electromagnetic wave measuring device is not greater than a predetermined value.4. The measuring device according to claim 1 , further comprising:a point cloud position data obtaining unit configured to obtain point cloud position data of an object that has a generation source of the electromagnetic waves; anda position calculating unit configured to calculate a position of the position measuring device with respect to the object based on ...

OPTICAL WRITING DEVICE, IMAGE FORMING APPARATUS, AND TEMPERATURE CALCULATION METHOD

An optical writing device having; a plurality of light-emitting points; a photodiode configured to output a signal which represents a quantity of incident light from a predetermined light-emitting point selected from the plurality of light-emitting points; and a calculation section for calculating a temperature of the photodiode based on a magnitude of a photodiode dark current included in the signal output from the photodiode while the predetermined light-emitting point is OFF. 1. An optical writing device comprising:a plurality of light-emitting points;a photodiode configured to output a signal which represents a quantity of incident light from a predetermined light-emitting point selected from the plurality of light-emitting points; anda calculation section for calculating a temperature of the photodiode based on a magnitude of a photodiode dark current included in the signal output from the photodiode while the predetermined light-emitting point is OFF.2. The optical writing device according to claim 1 , wherein the calculation section includesan integrating circuit for integrating an output of the photodiode, the integrating circuit including a resettable capacitor,a S/H circuit capable of recording a first output value obtained at a start of integration in the integrating circuit while the predetermined light-emitting point is OFF and a second output value obtained after a predetermined time period has passed since the start of integration in the integrating circuit,a subtracting circuit for subtracting the first output value from the second output value to output a third output value, anda controller configured to determine the magnitude of the photodiode dark current based on the third output value.3. The optical writing device according to claim 2 , whereinthe calculation section further includes an averaging circuit configured to output an average of plural ones of the third output value output from the subtracting circuit, andthe controller accepts the ...

Method for Ground-to-Satellite Laser Calibration System

The present invention comprises an approach for calibrating the sensitivity to polarization, optics degradation, spectral and stray light response functions of instruments on orbit. The concept is based on using an accurate ground-based laser system, Ground-to-Space Laser Calibration (GSLC), transmitting laser light to instrument on orbit during nighttime substantially clear-sky conditions. To minimize atmospheric contribution to the calibration uncertainty the calibration cycles should be performed in short time intervals, and all required measurements are designed to be relative. The calibration cycles involve ground operations with laser beam polarization and wavelength changes. 1. A method of calibrating an optical sensor on board a satellite orbiting the earth , the method comprising:utilizing at least one ground-based laser to generate a first light signal having a first wavelength, and a second light signal having a second wavelength that is not equal to the first wavelength;pointing the optical sensor at the one ground-based laser;aiming the first and second light signals at the satellite whereby at least a portion of the first and second light signals are incident on an optical sensor on the satellite;measuring the response of the optical sensor to the first and second light signals;utilizing a difference between the response of the optical sensor to the first and second light signals to calibrate the optical sensor.2. The method of claim 1 , wherein:the first light signal comprises red light, and the second light signal comprises blue light.3. The method of claim 2 , wherein:the first light signal is generated by a first laser, and the second light signal is generated by a second laser.4. The method of claim 1 , wherein utilizing a difference between the response of the optical sensor further comprises:applying atmospheric correction to improve the accuracy of the optical sensor.5. The method of claim 1 , wherein said first and second light signals are ...

Projection unit and method for controlling the projection unit

A projection unit may include a reflector-lamp arrangement which is designed to emit light during operation, wherein the light radiates toward an aperture, wherein a setting unit is provided, with which a light intensity distribution of the emitted light is adjustable relative to the aperture, wherein the light intensity distribution is adjusted depending on a period of operation of the lamp, and/or a measuring unit is provided, with which at least part of the light intensity distribution is detectable, wherein the light intensity distribution is adjusted relative to the aperture depending on a change in the light intensity distribution.

LASER PROCESSING APPARATUS AND OUTPUT POWER CHECKING METHOD

A laser processing apparatus includes a branching unit configured to branch a laser beam to a first optical path and a second optical path, a condenser configured to condense the branched laser beams on a processing face of a workpiece, an output power measuring unit configured to measure the output power of the laser beam emitted from a laser beam generation unit and having passed through the condenser, and a blocking member positioning mechanism disposed between the condenser and the output power measuring unit and capable of positioning a blocking member between a first laser beam blocking position at which the blocking member blocks only the laser beam of the first optical path from between the branched laser beams and a retracted position at which the blocking member blocks none of the laser beams. 1. A laser processing apparatus , comprising:a holding table configured to hold a workpiece thereon;a laser beam generation unit configured to generate a laser beam to be irradiated upon the workpiece held on the holding table;a branching unit configured to branch the laser beam emitted from the laser beam generation unit at least to a first optical path and a second optical path;a condenser configured to condense the laser beams branched by the branching unit on a processing face of the workpiece;an output power measuring unit configured to measure output power of the laser beam emitted from the laser beam generation unit and having passed through the condenser; andblocking member positioning means disposed between the condenser and the output power measuring unit and capable of positioning a blocking member between a first laser beam blocking position at which the blocking member blocks only the laser beam of the first optical path from between the laser beams branched by the branching unit and a retracted position at which the blocking member blocks none of the laser beams;the branching unit including an adjustment unit configured to adjust output power balance ...

A METHOD AND AN APPARATUS FOR GENERATING DATA REPRESENTATIVE OF A PIXEL BEAM

There are several types of plenoptic devices and camera arrays available on the market, and all these light field acquisition devices have their proprietary file format. However, there is no standard supporting the acquisition and transmission of multi-dimensional information. It is interesting to obtain information related to a correspondence between pixels of a sensor of said optical acquisition system and an object space of said optical acquisition system. Indeed, knowing which portion of the object space of an optical acquisition system a pixel belonging to the sensor of said optical acquisition system is sensing enables the improvement of signal processing operations. The notion of pixel beam, which represents a volume occupied by a set of rays of light in an object space of an optical system of a camera along with a compact format for storing such information is thus introduced. 1. A computer implemented method for generating a set of data representative of a volume in an object space of an optical acquisition system occupied by a set of rays of light that at least one pixel of a sensor of said optical acquisition system can sense through a pupil of said optical acquisition system , said volume being called a pixel beam , comprising:computing a value of a rotation angle, called φ, based on a value of a parameter representative of the pixel beam,computing a rotation of angle φ of a first straight line describing a surface of a hyperboloid of one sheet representing the pixel beam, called first generating ray, around a second straight line being a revolution axis of the hyperboloid, said rotation of angle φ transforming the first generating ray into a second generating ray,generating a set of data representative of the pixel beam comprising parameters representative of the second generating ray, parameters representative of the revolution axis of the hyperboloid and parameters representative of an orientation of the first generating ray relatively to the ...

Method and Apparatus for Determining a Radiation Beam Intensity Profile

Methods and apparatus for determining an intensity profile of a radiation beam. The method comprises providing a diffraction structure, causing relative movement of the diffraction structure relative to the radiation beam from a first position wherein the radiation beam does not irradiate the diffraction structure to a second position wherein the radiation beam irradiates the diffraction structure, measuring, with a radiation detector, diffracted radiation signals produced from diffraction of the radiation beam by the diffraction structure as the diffraction structure transitions from the first position to the second position or vice versa, and determining the intensity profile of the radiation beam based on the measured diffracted radiation signals.