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Небесная энциклопедия

Космические корабли и станции, автоматические КА и методы их проектирования, бортовые комплексы управления, системы и средства жизнеобеспечения, особенности технологии производства ракетно-космических систем

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Мониторинг СМИ

Мониторинг СМИ и социальных сетей. Сканирование интернета, новостных сайтов, специализированных контентных площадок на базе мессенджеров. Гибкие настройки фильтров и первоначальных источников.

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Форма поиска

Поддерживает ввод нескольких поисковых фраз (по одной на строку). При поиске обеспечивает поддержку морфологии русского и английского языка
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Применить Всего найдено 4710. Отображено 100.
29-03-2012 дата публикации

Apparatus for high-throughput suspension measurements

Номер: US20120073972A1
Автор: Fraser Mcneil Watson
Принадлежит: Malvern Instruments Ltd

A high-throughput optical suspension characterization instrument is disclosed, which can include hydraulically separate and at least partially transparent sample containers. A selection mechanism is operative to selectively direct light from a light source ( 12 ) through different ones of the sample containers along an optical axis, and an off-axis scattering detector ( 38,24 ) is responsive to scattered light from the light source after it has interacted with a sample. Phase analysis light scattering is used to determine the electrophoretic mobility and zeta potential of samples. A second instrument is disclosed, wherein all sample containers are illuminated simultaneously. Transmitted light is collected by a camera. The electrophoretic mobility and hydrodynamic size of the samples may be determined.

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12-07-2012 дата публикации

Fiber optic probes utilizing grin lenses for spatially precise optical spectroscopy

Номер: US20120176613A1
Принадлежит: Marple Eric T, Urmey Kirk D

The invention provides improved fiber optic probe assemblies which utilize a configuration of gradient index (GRIN) lenses to deliver light to a focal point and collect light for analysis from the same focal point. Also provided are methods for manufacturing the probe assemblies and related methods of spatially precise spectroscopy using the probe assemblies.

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02-08-2012 дата публикации

Optical Sensor for Rapid Determination of Particulate Concentration

Номер: US20120194800A1
Автор: Martin P. Debreczeny
Принадлежит: BugLab LLC

This invention provides methods and devices to measure particle suspension concentrations through the side wall of a container. Particle back-scatter readings are taken at light wavelengths that do not travel far through the medium. Detected scatter is related to actual particle concentration or standard O.D. values. The methods and devices allow particle concentration readings through containers not normally intended for use in such assays.

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27-09-2012 дата публикации

System for and Method of Performing Multi-Technique Imaging

Номер: US20120241596A1
Принадлежит: PURDUE RESEARCH FOUNDATION

A system for and method of performing multi-technique imaging are disclosed. Such multi-technique imaging system includes a surface for supporting a specimen and at least two illumination sources for producing light radiation. The system also includes a plurality of reflective and refractive devices arranged to direct at least part of the light radiation from each of the at least two illumination sources to the surface such that the at least part of the light radiation from each of the at least two illumination sources illuminates substantially the same area on the surface. The system also includes a sensor configured to receive light radiation from the at least two illumination sources reflected by the specimen and/or that pass by the specimen. The system also includes a power source configured to power the at least two illumination sources and the sensor.

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08-11-2012 дата публикации

Systems and methods for endoscopic angle-resolved low coherence interferometry

Номер: US20120281224A1
Автор: Adam Wax, John W. Pyhtila
Принадлежит: Duke University

Fourier domain a/LCI (faLCI) system and method which enables in vivo data acquisition at rapid rates using a single scan. Angle-resolved and depth resolved spectra information is obtained with one scan. The reference arm can remain fixed with respect to the sample due to only one scan required. A reference signal and a reflected sample signal are cross-correlated and dispersed at a multitude of reflected angles off of the sample, thereby representing reflections from a multitude of points on the sample at the same time in parallel. Information about all depths of the sample at each of the multitude of different points on the sample can be obtained with one scan on the order of approximately 40 milliseconds. From the spatial, cross-correlated reference signal, structural (size) information can also be obtained using techniques that allow size information of scatterers to be obtained from angle-resolved data.

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15-11-2012 дата публикации

Automatic dilution for multiple angle light scattering (mals) instrument

Номер: US20120287435A1
Принадлежит: JMAR LLC

A method for detecting and identifying a particle in a liquid, the system comprises controlling the provisioning of a water sample using a computer controlled metering pump; mixing the water sample with particle free filtered water to provide a diluted water sample when required; at the end of a measurement interval, determining a Total Counts Per Minute (TCPM) for the diluted water sample; determining an additional counts per minute from the sample (SCPM) for the diluted water sample; if the SCPM is greater then a Lower Optimum count Rate (LOCR) and less than a Upper Optimum Count Rate (UOCR), then setting a dilution ratio (DR); and correcting an events classification based on the DR.

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25-04-2013 дата публикации

Cell monitoring by means of scattered light measurement

Номер: US20130102067A1
Принадлежит: SIEMENS AG

A device for monitoring test cells has at least one receiving unit for the test cells and a first measuring unit for cell measurement. With a second measuring unit, which has a light source and a scattered light detector, cell monitoring can be carried out during the cell measurement. For this purpose the receiving unit has an at least partially light-permeable substrate and is arranged between the light source and scattered light detector such that at least a part of the light generated by the light source shines on the receiving unit, is scattered on the test cells and, after leaving the receiving unit through the substrate, impinges on the scattered light detector.

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02-05-2013 дата публикации

Automatic analysis device

Номер: US20130108509A1
Принадлежит: Hitachi High Technologies Corp

Disclosed is an automatic analysis device including light detectors that detect scattered light, whereby highly reliable analysis results can be obtained by reduction of the effect of noise components. Highly reliable concentration analysis with little effect from noise components can be achieved by calculating the correlation between scattered light detected by a plurality of light detectors before calculating concentration, and by performing concentration analysis using scattered light with high correlation.

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30-05-2013 дата публикации

Scattered radiation fire detector and method for the automatic detection of a fire situation

Номер: US20130135607A1
Принадлежит: APPARATEBAU GAUTING GmbH

The invention relates in particular to a scattered radiation fire detector ( 1 ) having radiation sources ( 2, 3 ) of different wavelengths and a scattered radiation sensor ( 4 ), which are arranged and formed so that their optical axes ( 9, 10 ) are directed at a common centre of a scattering volume ( 5 ). A sensor unit is furthermore formed in order to register forward scattering I 1 (λ 1,fwd ) of a first radiation source ( 2 ), forward scattering I 2 (λ 2,fwd ) of a second radiation source ( 3 ) and backward scattering I 3 (λ 1,bwd ) of a further first radiation source ( 2 ), to calculate scattered radiation intensity quotients Q 1 =I 1 (λ 1,fwd )/I 2 (λ 2,fwd ), Q 2 =I 1 (λ 1,fwd )/I 3 (λ 1,bwd ) and Q 3 =I 2 (λ 2,fwd )/I 3 (λ 1,bwd ) and in order to use them for the decision regarding the existence of a fire situation.

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22-08-2013 дата публикации

Cell analyzer, cell processing apparatus, specimen preparing apparatus

Номер: US20130217110A1
Принадлежит: Sysmex Corp

The present invention provides a cell analyzer which comprises: a cell dispersion unit which causes aggregated cells in a biological specimen to be dispersed, through a shearing force applying process of applying a shearing force to the aggregated cells and an ultrasonic dispersion process of dispersing the aggregated cells, by using ultrasonic waves; a detection unit which detects characteristics information reflecting properties of the cells in the biological specimen on which the shearing force applying process and the ultrasonic dispersion process have been performed; and an analysis unit which analyzes the cells in the biological specimen, based on a detection result from the detection unit.

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14-11-2013 дата публикации

Scattering light source multi-wavelength photometer

Номер: US20130301051A1
Принадлежит: Individual

The present invention relates to a scattering light source photometer. In particular, the present invention relates to a portable, low cost, multi-wavelength photometer and methods for its use.

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05-01-2017 дата публикации

OPTICAL SENSOR HAVING FIDUCIARY MARKS DETECTED BY BACKSCATTERED LIGHT

Номер: US20170003219A1
Автор: Westbrook Paul S.
Принадлежит: OFS FITEL, LLC

An optical fiber having at least one fiduciary mark is provided. The at least one fiduciary mark is located at one or more axial positions along the optical fiber. The at least one fiduciary mark is configured to produce at least one change in a backscattering signal in the optical fiber. The at least one change in a backscattering signal may be an abrupt change in the backscattering signal. The abrupt change in the backscattering signal occurs over a length of the optical fiber that is of the order of or less than a spatial resolution of an interrogation system employed to detect the backscattering signal. 1. A distributed sensor comprising an optical fiber having at least one fiduciary mark , the at least one fiduciary mark located at one or more axial positions along the optical fiber , the at least one fiduciary mark configured to produce at least one change in a backscattering signal in the optical fiber.2. The distributed sensor of claim 1 , wherein the backscattering signal is a Rayleigh backscattering signal.3. The distributed sensor of claim 1 , wherein the at least one fiduciary mark is placed in the fiber during the fiber manufacturing.4. The distributed sensor of claim 1 , wherein the at least one change is an abrupt change in the backscattering signal.5. The distributed sensor of claim 1 , wherein the at least one change in the backscattering signal occurs over a length of the optical fiber that is of the order of or less than a spatial resolution of an interrogation system employed to detect the backscattering signal.6. The distributed sensor of claim 1 , wherein the at least one change in the backscattering signal occurs over a length of the optical fiber that is of the order of or less than a length measurement accuracy in the optical fiber.7. The distributed sensor of claim 1 , wherein the at least one fiduciary mark is located at a known axial position along the optical fiber.8. The distributed sensor of claim 1 , wherein the at least one change in ...

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05-01-2017 дата публикации

DYNAMIC LIGHT SCATTERING BASED MICRORHEOLOGY OF COMPLEX FLUIDS WITH IMPROVED SINGLE-SCATTERING MODE DETECTION

Номер: US20170003220A1
Принадлежит:

A fluid characterization measuring instrument is disclosed that comprises a sample vessel for a bulk complex sample fluid having a capacity that is substantially larger than a domain size of the complex sample fluid and that is sufficiently large to cause bulk scattering effects to substantially exceed surface effects for the complex fluid sample, a coherent light source positioned to illuminate the bulk complex sample fluid in the sample vessel and a first fibre having a first end positioned to receive backscattered light from the sample after it has interacted with the sample. The first fibre can also be positioned close enough to an optical axis of the coherent light source and to the sample vessel to substantially decrease a contribution of multiply scattered light in the backscattered light. The instrument can further comprise a first photon-counting detector positioned to receive the backscattered light from a second end of the fibre, correlation logic responsive to the first photon-counting detector and single-scattering fluid property analysis logic responsive to the correlation logic and operative to derive at least one fluid property for the sample fluid. 115-. (canceled)16. A fluid characterization measuring instrument , comprising:a capillary tube for a sample fluid,a plurality of probe particles for the sample fluid,a coherent light source positioned to illuminate the sample fluid and probe particles in the capillary tube,a photon-counting detector positioned to receive scattered light from the capillary tube, andfluid property analysis logic responsive to the detector and operative to derive at least one fluid property for the sample fluid.17. The instrument of further including an optical fiber between the capillary tube and the photon-counting detector.18. The instrument of wherein the optical fiber has a first end positioned to receive backscattered light from the sample after it has interacted with the sample.19. The instrument of wherein the ...

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05-01-2017 дата публикации

System and methods for estimation of mechanical properties and size of light-scattering particles in materials

Номер: US20170003271A1
Принадлежит: General Hospital Corp

System and method for determining a viscoelastic modulus of a sample with the use of optical data and an average size of light-scattering particles, of such sample, that has been derived from the optical data in reliance of angular dependence of a radiant flux profile determined from laser speckles formed by the sample and, in required, on a refractive index mismatch between light-scattering particles and sample medium hosting such particles. The determination is optionally carried out by taking into account at least one of absorption coefficient and reduced scattering coefficient of the sample, which are also determined from the same optical data. Laser speckle may be formed for different combinations of polarization states of sample-illuminating light and detected light and/or different wavelengths to account for polydisperse nature of the sample.

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04-01-2018 дата публикации

SPECKLE IMAGING DEVICE, SPECKLE IMAGING SYSTEM, AND SPECKLE IMAGING METHOD

Номер: US20180003557A1
Принадлежит:

Provided is a highly accurate imaging technology that utilizes the speckle interference. The present technology provides a speckle imaging device including: an irradiation condition setting unit that sets an irradiation condition for coherent light with which an imaging object is irradiated; an imaging unit that captures scattered light obtained from the imaging object irradiated with the coherent light; an image generation unit that generates a speckle-enhanced image from a captured image captured by the imaging unit; and a leveling processing unit that generates a leveled speckle image from speckle-enhanced images corresponding to two or more different irradiation conditions. 1. A speckle imaging device comprising:an irradiation condition setting unit that sets an irradiation condition for coherent light with which an imaging object is irradiated;an imaging unit that captures scattered light obtained from the imaging object irradiated with the coherent light;an image generation unit that generates a speckle-enhanced image from a captured image captured by the imaging unit; anda leveling processing unit that generates a leveled speckle image from speckle-enhanced images corresponding to two or more different irradiation conditions.2. The speckle imaging device according to claim 1 , whereinthe speckle-enhanced image is an image mapped with a speckle contrast.3. The speckle imaging device according to claim 1 , whereinthe irradiation condition is an irradiation angle and/or an irradiation position.4. The speckle imaging device according to claim 1 , further comprising an analysis unit that analyzes a state of the imaging object on the basis of the leveled speckle image.5. The speckle imaging device according to claim 1 , whereinthe imaging object includes fluid.6. The speckle imaging device according to claim 4 , whereinthe imaging object includes fluid, anda flow velocity of the fluid is analyzed in the analysis unit.7. The speckle imaging device according to claim ...

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04-01-2018 дата публикации

Particulate matter detector

Номер: US20180003612A1
Принадлежит: Honeywell International Inc

Devices and methods for detecting particulate matter are described herein. One device includes a laser, a reflector, an ellipsoidal reflector, and a detector, wherein the laser is configured to emit a beam, the reflector is configured to reflect the beam toward the ellipsoidal reflector, and the ellipsoidal reflector has a first focal region located on a path of the reflected beam, and a second focal region located at a surface of the detector.

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02-01-2020 дата публикации

Apparatus to measure multiple signals from a liquid sample

Номер: US20200003663A1
Принадлежит: Wyatt Technology LLC

One or more homogenizing elements are employed in a flow through, multi-detector optical measurement system. The homogenizing elements correct for problems common to multi-detector flow-through systems such as peak tailing and non-uniform sample profile within the measurement cell. The homogenizing elements include coiled inlet tubing, a flow distributor near the inlet of the cell, and a flow distributor at the outlet of the cell. This homogenization of the sample mimics plug flow within the measurement cell and enables each detector to view the same sample composition in each individual corresponding viewed sample volume. This system is particularly beneficial when performing multiangle light scattering (MALS) measurements of narrow chromatographic peaks such as those produced by ultra-high pressure liquid chromatography (UHPLC).

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11-01-2018 дата публикации

Systems and methods for endoscopic angle-resolved low coherence interferometry

Номер: US20180008147A1
Автор: Adam Wax, John W. Pyhtila
Принадлежит: Duke University

A method of assessing tissue health comprises the steps of obtaining depth-resolved spectra of a selected area of in vivo tissue, and assessing the health of the selected area based on the depth-resolved structural information of the scatterers. Obtaining depth-resolved spectra of the selected area comprises directing a sample beam towards the selected area at an angle, and receiving an angle-resolved scattered sample beam. The angle-resolved scattered sample beam is cross-correlated with the reference beam to produce an angle-resolved cross-correlated signal about the selected area, which is spectrally dispersed to yield an angle-resolved, spectrally-resolved cross-correlation profile having depth-resolved information about the selected area. The angle-resolved, spectrally-resolved cross-correlation profile is processed to obtain depth-resolved information about scatterers in the selected area.

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27-01-2022 дата публикации

SINGLE-SHOT MUELLER MATRIX POLARIMETER

Номер: US20220026347A1
Автор: BOOTH Martin, He Chao
Принадлежит:

A single-shot Mueller matrix polarimeter (), MMP, comprising: a polarization state generator (), PSG, arranged to receive a source optical field () and provide a probe field () having a plurality of spatial portions, each portion having a different polarization state; a polarization state analyser (), PSA, arranged to receive a modified probe field () resulting from interaction of the probe field generated by the PSG with a sample under investigation, and further arranged to apply, to each of a corresponding plurality of spatial portions of the modified probe field, a plurality of retardances and a plurality of fast axis orientations; and a detector () arranged to detect an output () of the PSA. 1. A single-shot Mueller matrix polarimeter , MMP , comprising:a polarization state generator, PSG, arranged to receive a source optical field and provide a probe field having a plurality of spatial portions, each portion having a different polarization state;a polarization state analyser, PSA, arranged to receive a modified probe field resulting from interaction of the probe field generated by the PSG with a sample under investigation, and further arranged to apply, to each of a corresponding plurality of spatial portions of the modified probe field, a plurality of retardances and a plurality of fast axis orientations; anda detector arranged to detect an output of the PSA.2. The MMP according to claim 1 , wherein the plurality of retardances comprises a plurality of retardances spanning π radians and the plurality of fast axis orientations comprises a plurality of orientations spanning π radians.3. The MMP according to claim 2 , wherein the plurality of retardances comprises a continuum of retardances spanning π radians and the plurality of fast axis orientations comprises a continuum of orientations spanning π radians.4. The MMP according to claim 1 , wherein the PSG is arranged to provide a probe field having four spatial portions claim 1 , each described by a different ...

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12-01-2017 дата публикации

Front Quartersphere Scattered Light Analysis

Номер: US20170010222A1
Принадлежит: KLA-TENCOR CORPORATION

A surface inspection system, as well as related components and methods, are provided. The surface inspection system includes a beam source subsystem, a beam scanning subsystem, a workpiece movement subsystem, an optical collection and detection subsystem, and a processing subsystem. The optical collection and detection system features, in the front quartersphere, a light channel assembly for collecting light reflected from the surface of the workpiece, and a front collector and wing collectors for collecting light scattered from the surface, to greatly improve the measurement capabilities of the system. The light channel assembly has a switchable edge exclusion mask and a reflected light detection system for improved detection of the reflected light. 12-. (canceled)3. An optical collection system for use in a surface inspection system for inspecting a surface of a workpiece , the surface inspection system having an incident beam projected through a back quartersphere and toward a desired location on the surface of the workpiece to impinge thereon to create reflected light , extending along a light channel axis in a front quartersphere , and scattered light , the incident beam and the light channel axis forming an incident plane , the optical collection system comprising:a wing collector positioned to collect a first portion of the scattered light, the wing collector being disposed in the front quartersphere, outside the incident plane, and at a minimum of a bi-directional reflectance distribution function when the incident beam is P polarized; andat least one of the following collection elements: a light channel collector, positioned in the incident plane to simultaneously receive the reflected light, or a front collector disposed in the front quartersphere and positioned to simultaneously collect a second portion of the scattered light.4. An optical collection system as recited in claim 3 , wherein the bi-directional reflectance distribution function has a P- ...

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14-01-2016 дата публикации

OPTICAL MEASURING METHOD AND MANUFACTURING METHOD OF THE ALCOHOL

Номер: US20160011103A1
Принадлежит:

An optical measuring method for measuring a concentration of a fermentation inhibitor included in a biomass-derived fermentation raw material includes acquiring a diffuse reflection spectrum or a transmission spectrum relating to a measurement target which includes the biomass-derived fermentation raw material by radiating near-infrared light to the measurement target and computing the concentration of the fermentation inhibitor based on the diffuse reflection spectrum or the transmission spectrum. 1. An optical measuring method for measuring a concentration of a fermentation inhibitor included in a biomass-derived fermentation raw material , the method comprising:acquiring a diffuse reflection spectrum or a transmission spectrum relating to a measurement target which includes the biomass-derived fermentation raw material by radiating near-infrared light to the measurement target; andcomputing the concentration of the fermentation inhibitor based on the diffuse reflection spectrum or the transmission spectrum.2. The optical measuring method according to claim 1 , wherein the near-infrared light includes light with a wavelength that is included at least in the wavelength range of 1550 nm to 1800 nm.3. The optical measuring method according to claim 1 , whereinthe computing the concentration comprises computing the concentration of the fermentation inhibitor with multivariate analysis.4. The optical measuring method according to claim 1 , wherein the fermentation raw material is a saccharified solution obtained by saccharifying cellulose.5. A manufacturing method of an alcohol claim 1 , the method comprising:{'claim-ref': {'@idref': 'CLM-00001', 'claim 1'}, 'the optical measuring method according to , and'}adjusting, based on the concentration of the fermentation inhibitor, a condition of a pre-treatment step performed before obtaining the fermentation raw material or a fermentation condition of the fermentation raw material.6. The manufacturing method of an alcohol ...

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11-01-2018 дата публикации

APPARATUS AND METHOD FOR MEASURING DUST

Номер: US20180011018A1
Принадлежит: LG ELECTRONICS INC.

Disclosed herein is a dust measuring apparatus and method for measuring a dust concentration in a flow channel. The apparatus includes a flow channel unit for defining a flow channel allowing a fluid containing dust to move therethrough, a light emitter for emitting light into the flow channel, a light detector for detecting light scattered from the dust in the flow channel and converting it to an electrical detection signal, the light detector including a plurality of detectors having different light detection ranges, and a controller for controlling the flow channel unit, the light emitter and the light detector, wherein the controller is configured to receive detection signals from the detectors, compensate for an offset for the received detection signals, and measure a dust concentration based on the compensated detection signals. 1. An apparatus for measuring dust , comprising:a flow channel unit for defining a flow channel allowing a fluid containing dust to move through;a light emitter for emitting light into the flow channel;a light detector for detecting light scattered from the dust in the flow channel and converting the detected light scattered from the dust in the flow channel into an electrical detection signal, the light detector comprising a plurality of detectors having different light detection ranges; anda controller for controlling the flow channel unit, the light emitter and the light detector,wherein the controller is configured to:receive detection signals from the plurality of detectors,compensate for an offset for the received detection signals, andmeasure a dust concentration based on the compensated detection signals.2. The apparatus according to claim 1 , wherein the light detector comprises:a first detector for detecting light scattered within a first detection range in a light emission region of the flow channel; anda second detector for detecting light scattered within a second detection range in the light emission region of the flow ...

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12-01-2017 дата публикации

Atmospheric Channel Characterization System and Method Using Target Image Information

Номер: US20170011499A1
Автор: Colin N. Reinhardt
Принадлежит: US Department of Navy

A system and method involve transmitting, using an optical device, a plurality of optical pulses into an atmospheric propagation channel towards a target object. Using an imaging device, more than one optical signals and an image of the target object are detected from the atmospheric propagation channel. The optical signals are produced by interaction between the transmitted optical pulses and the atmospheric propagation channel and include elastic backscatter return signals, inelastic backscatter return signals, and polarization signals. A processor simultaneously processes the elastic and inelastic backscatter return signals, the polarization signals, and information contained within the image of the target to determine estimates of one or more physical parameters of the atmospheric propagation channel. The processor uses machine learning algorithms to enhance/restore the image of the target, to perform pattern-recognition and classification of the target, and to extract additional atmospheric propagation channel physical characteristics.

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14-01-2021 дата публикации

Optical System for Reference Switching

Номер: US20210010860A1
Принадлежит:

Systems and methods for determining one or more properties of a sample are disclosed. The systems and methods disclosed can be capable of measuring along multiple locations and can reimage and resolve multiple optical paths within the sample. The system can be configured with one-layer or two-layers of optics suitable for a compact system. The optics can be simplified to reduce the number and complexity of the coated optical surfaces, et al. on effects, manufacturing tolerance stack-up problems, and interference-based spectroscopic errors. The size, number, and placement of the optics can enable multiple simultaneous or non-simultaneous measurements at various locations across and within the sample. Moreover, the systems can be configured with an optical spacer window located between the sample and the optics, and methods to account for changes in optical paths due to inclusion of the optical spacer window are disclosed. 124-. (canceled)25. A system for determining properties of a sample , the system comprising:one or more light sources;a detector array; and illumination optics; and', the illumination optics and the first collection optics are formed on one or more surfaces of the first substrate;', 'the illumination optics configured to receive light emitted by the one or more light sources and redirect the light towards the sample; and', 'the first collection optics configured to receive at least a portion of a return of the light and redirect the light towards the detector array; and', 'the detector array configured to detect the light redirected by the first collection optics and generate one or more signals indicative of the properties of the sample., 'first collection optics, wherein], 'a first substrate comprising26. The system of claim 25 , further comprising:second collection optics configured to receive and redirect at least the portion of the return of the light to the first collection optics.27. The system of claim 26 , wherein the second collection ...

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03-02-2022 дата публикации

VESSEL LOCATION ASSISTANCE DEVICE

Номер: US20220031232A1
Принадлежит: NOVOTEC LLC

A vessel location assistance device having a housing with a proximal portion and a distal portion, an infrared light emitter adapted to emit infrared light from the housing to a patient and an infrared light receiver adapted to receive backscattered infrared light intensity reflected from the patient, wherein the received backscattered infrared light intensity is converted to a voltage and when the voltage is within a calibrated range the device indicates the presence of a blood vessel. The device may further include at least one wing with a slot for capturing the blood vessel. 1. A vessel location assistance device comprising:a housing having a proximal portion and a distal portion, said proximal portion and said distal portion spaced apart along a centerline of said housing, said housing having a top portion and a bottom portion;an aperture positioned in said distal portion along said centerline, said aperture penetrating through said top portion and said bottom portion of said housing;at least one light associated with said housing;three infrared light emitters adapted to emit infrared light from said bottom portion of said housing to a patient and three infrared light receivers adapted to receive backscattered infrared light reflected from the patient;said three infrared light emitters and said three infrared light receivers arranged in pairs along equally spaced rows, including a middle row and two remaining rows, each equally spaced row extending perpendicular to said centerline, wherein said middle row of said three rows is aligned with said aperture;said three emitters and three receivers arranged in two columns extending along axes equally spaced and parallel to said centerline;wherein each pair of said three emitters and three receives is serially and repeatedly energized to emit infrared light and detect backscattered infrared light intensity from said patient when said housing is positioned on or near a patient's skin, each of said detection intensities ...

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03-02-2022 дата публикации

FLUID HANDLING DEVICE, FLUID HANDLING SYSTEM AND LIQUID DETECTION METHOD

Номер: US20220034806A1
Автор: SUNAGA Nobuya
Принадлежит:

A fluid handling device includes a channel including a roughened surface that causes irregular reflection of light. A fluid handling system includes the fluid handling device, an irradiation part for irradiating the roughened surface of the channel with light, and a light detection part for detecting light reflected by the roughened surface or light transmitted through the roughened surface after irradiation from the light irradiation part. 1. A fluid handling device comprising:a channel including a roughened surface configured to cause irregular reflection of light.2. The fluid handling device according to claim 1 , wherein the roughened surface has a surface roughness Ra of 0.001 mm to 1 mm3. The fluid handling device according to claim 1 ,wherein the channel includes a detection target region configured to be irradiated with light for detection of transmitted light or reflection light, the detection target region including the roughened surface; andwherein the fluid handling device further includes a light blocking part disposed around the detection target region.4. The fluid handling device according to claim 3 , wherein in plan view of the fluid handling device claim 3 , the light blocking part is disposed at a position that does not overlap the channel5. The fluid handling device according to claim 4 , wherein in plan view of the fluid handling device claim 4 , the light blocking part is disposed also at a position that overlaps a region other than the detection target region of the channel6. The fluid handling device according to claim 1 , further comprising:a liquid storage part disposed in the channel; anda detection target region disposed adjacent to the liquid storage part at the channel and configured to be irradiated with light for detection of transmitted light or reflection light, the detection target region including the roughened surface.7. A fluid handling system comprising:{'claim-ref': {'@idref': 'CLM-00001', 'claim 1'}, 'the fluid handling ...

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16-01-2020 дата публикации

Surgical visualization with proximity tracking features

Номер: US20200015899A1
Принадлежит: Ethicon LLC

A surgical visualization system is disclosed. The surgical visualization system is configured to identify one or more structure(s) and/or determine one or more distances with respect to obscuring tissue and/or the identified structure(s). The surgical visualization system can facilitate avoidance of the identified structure(s) by a surgical device. The surgical visualization system can comprise a first emitter configured to emit a plurality of tissue-penetrating light waves and a second emitter configured to emit structured light onto the surface of tissue. The surgical visualization system can also include an image sensor configured to detect reflected visible light, tissue-penetrating light, and/or structured light. The surgical visualization system can convey information to one or more clinicians regarding the position of one or more hidden identified structures and/or provide one or more proximity indicators.

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19-01-2017 дата публикации

PARTICLE DETECTION DEVICE

Номер: US20170016820A1
Принадлежит: FUJI ELECTRIC CO., LTD.

A particle detection device includes a scattered light detector detecting an intensity of light scattered by a particle irradiated with a laser, an incandescent light detector detecting an intensity of incandescent light from the particle being irradiated with the laser, and a signal processor including: a first peak hold circuit holding a peak in the intensity of the light scattered by the particle; a second peak hold circuit holding a peak in the intensity of the incandescent light from the particle; and a threshold value comparison circuit comparing the peak in the first peak hold circuit to a threshold and, when the peak in the first peak hold circuit exceeds the threshold, outputs a reset signal to the second peak hold circuit immediately thereafter so the peak previously in the second peak hold circuit is reset immediately after the peak in the first peak hold circuit exceeds the threshold. 1. A particle detection device , comprising:a scattered light detector that detects an intensity of light scattered by a particle as a result of being irradiated with a laser beam;an incandescent light detector that detects an intensity of incandescent light generated by said particle as a result of being irradiated with said laser beam; and a first peak hold circuit that holds a peak value in the intensity of the light scattered by said particle detected by the scattered light detector;', 'a second peak hold circuit that holds a peak value in the intensity of the incandescent light generated by said particle detected by the incandescent light detector; and', 'a threshold value comparison circuit that compares the peak value held by the first peak hold circuit to a prescribed threshold value and, when the peak value held by the first peak hold circuit exceeds the prescribed threshold value, outputs a reset signal to the second peak hold circuit immediately thereafter so that the peak value previously held by the second peak hold circuit is reset immediately after the peak ...

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21-01-2016 дата публикации

Apparatus for analyzing phases of multiphase mixtures

Номер: US20160018322A1
Принадлежит: FORMULACTION

The invention relates to an apparatus comprising: a measuring head ( 10 ) having a slot ( 18 ) for receiving a measurement cell ( 26 ) and means ( 28 ) for emitting electromagnetic radiation, and means ( 32, 36 ) for detecting radiation from said emission means ( 28 ) after it has passed through the measurement cell ( 26 ); means ( 16 ) for translatably driving and means ( 12, 14 ) for translatably guiding, allowing the substantially vertical longitudinal movement of the measurement head ( 10 ); at least two recesses ( 44 ) each intended for receiving a measurement cell ( 26 ) and arranged one above the other in a longitudinal direction, the recesses ( 44 ) as well as the driving means ( 16 ) and the guiding means ( 12, 14 ) being configured such that during the translational movement of the measurement head ( 10 ) along the nominal travel thereof each recess is placed inside the slot ( 18 ) of the measurement head ( 10 ).

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18-01-2018 дата публикации

ILLUMINATION SYSTEM FOR RECOGNIZING MATERIAL AND METHOD OF RECOGNIZING MATERIAL USING THE SAME

Номер: US20180017486A1
Автор: SER Jang-Il
Принадлежит:

An illumination system for recognizing material includes a measurement stage, a light-providing part, a light-receiving part, and a processing part. The measurement stage is upwardly open and the measurement target is located on the measurement stage. The light-providing part includes a plurality of illumination sections providing incident lights to the measurement target, and provides multi-directional incident lights to the measurement target from multiple upper directions at which the measurement stage is open. The light-receiving part receives single-directional reflection lights reflected by the measurement target according to the multi-directional incident lights provided by the light-providing part. The processing part acquires a multi-directional intensity distribution of multi-directional reflection lights reflected by the measurement target according to a single-directional incident light from the single-directional reflection lights reflected by the measurement target according to the multi-directional incident lights, and determines material of the measurement target from the multi-directional intensity distribution of reflection lights. Thus, material of an object may be easily and accurately known at a low cost. 1. An illumination system for recognizing material comprising:a measurement stage that is upwardly open and on which the measurement target is located;a light-providing part including a plurality of illumination sections providing incident lights to the measurement target, and providing multi-directional incident lights to the measurement target from multiple upper directions at which the measurement stage is open;a light-receiving part receiving single-directional reflection lights reflected by the measurement target according to the multi-directional incident lights provided by the light-providing part; anda processing part acquiring a multi-directional intensity distribution of multi-directional reflection lights reflected by the measurement ...

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18-01-2018 дата публикации

OPTICAL INSPECTION SYSTEM AND METHOD INCLUDING ACCOUNTING FOR VARIATIONS OF OPTICAL PATH LENGTH WITHIN A SAMPLE

Номер: US20180017491A1
Принадлежит:

An illuminator/collector assembly can deliver incident light to a sample and collect return light returning from the sample. A sensor can measure ray intensities as a function of ray position and ray angle for the collected return light. A ray selector can select a first subset of rays from the collected return light at the sensor that meet a first selection criterion. In some examples, the ray selector can aggregate ray intensities into bins, each bin corresponding to rays in the collected return light that traverse within the sample an estimated optical path length within a respective range of optical path lengths. A characterizer can determine a physical property of the sample, such as absorptivity, based on the ray intensities, ray positions, and ray angles for the first subset of rays. Accounting for variations in optical path length traversed within the sample can improve accuracy. 1. An optical inspection system for optically characterizing a sample , comprising:an illuminator/collector assembly configured to deliver incident light to the sample and collect return light returning from the sample to form collected return light;a sensor that measures ray intensities as a function of ray position and ray angle for the collected return light;a ray selector configured to select a first subset of rays from the collected return light at the sensor that meet a first selection criterion; anda computer including a characterizer configured to determine a physical property of the sample based on the ray intensities, ray positions, and ray angles for the first subset of rays.2. The optical inspection system of claim 1 , wherein the first selection criterion comprises a first range of estimated path lengths traversed within the sample claim 1 , a first range of path length distributions traversed within the sample claim 1 , or a first range of estimated ray penetration depths traversed within the sample.3. The optical inspection system of claim 1 , wherein the ray selector ...

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17-01-2019 дата публикации

METHOD AND APPARATUS FOR MEASURING GEL PARTICLE

Номер: US20190017915A1
Автор: Obata Toru, Ukon Juichiro
Принадлежит: PROJECT KBF CO., LTD.

Provided is a gel particle measuring apparatus for detecting scattered light generated by light irradiation at a production start time point of a gel particle, and performing measurement promptly and accurately while suppressing attenuation of the scattered light in a solvent in which the phenomenon occurs. The gel particle measuring apparatus includes: a sample cell () configured to accommodate a sample (S) and a solution containing a reagent (R); a stirrer () configured to continuously stir a mixed solution (W) in the sample cell (); a light source () configured to irradiate the mixed solution (W) in the sample cell () with coherent irradiation light (Bm); a backscattered light detector () configured to detect, out of light scattered in the mixed solution (W) in the sample cell (), a backscattered light component returning toward the light source (); a light path adjuster () configured to adjust an incident portion surface of the sample cell () so that a detection light path (ST) of, out of the light scattered in the mixed solution (W) in the sample cell (), light traveling toward the backscattered light detector () is different from a reflection light path (DT) of reflection light (Bm) reflected from a surface of the sample cell (); and a measurement device () configured to determine at least a production start time point of the gel particle (G) in the mixed solution (W) based on a detection output of the backscattered light detector (). 1. A gel particle measuring method for measuring a gel particle produced from a target substance in a sample through a gelation reaction ,the method using:a sample cell, which has, in at least part thereof, an incident portion through which light enters, and is configured to accommodate the sample containing the target substance to be measured and a solution containing a reagent for causing gelation of the target substance;a stirrer configured to continuously stir a mixed solution including the sample and the reagent in the ...

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17-01-2019 дата публикации

Sensor with remote focusing path for detecting remotely located reflective material

Номер: US20190017933A1
Принадлежит:

A reflective materials sensor for detecting remotely located reflective material. The reflective materials sensor includes a transparent window with two window surfaces, an amount of reflective material that is remotely located away from one window surface. An operating parameters sensor located adjacent to the transparent window, a radiation detector located away from the other window surface; and two spaced apart radiation emitters located on either side of the radiation detector, and away from the second window surface. Each radiation emitter is configured to emit radiation along one axis through the transparent window towards the reflective material and towards a common focal point. The radiation detector is located to receive reflected radiation from the reflective material along another axis. The first axis of the radiation emitters is angled towards the other axis of the reflected radiation. 1. A reflective materials sensor for detecting remotely located reflective material , the reflective materials sensor comprising:a transparent window having first and second window surfaces, an amount of reflective material being remotely located away from the first window surface;a sensor located adjacent to the transparent window or away therefrom;a radiation detector located away from the second window surface;first and second spaced apart radiation emitters located on either side of the radiation detector, and away from the second window surface, each radiation emitter being configured to emit radiation along a first axis through the transparent window towards the reflective material and towards a common focal point, the radiation detector being located to receive reflected radiation from the reflective material through the transparent window along a second axis, the first axes of the radiation emitters being angled towards the second axis of the reflected radiation; anda lens in the reflective material to radiation detector path to focus the reflected radiation on ...

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21-01-2021 дата публикации

Reference Switch Architectures for Noncontact Sensing of Substances

Номер: US20210018432A1
Принадлежит:

This relates to systems and methods for measuring a concentration and type of substance in a sample at a sampling interface. The systems can include a light source, optics, one or more modulators, a reference, a detector, and a controller. The systems and methods disclosed can be capable of accounting for drift originating from the light source, one or more optics, and the detector by sharing one or more components between different measurement light paths. Additionally, the systems can be capable of differentiating between different types of drift and eliminating erroneous measurements due to stray light with the placement of one or more modulators between the light source and the sample or reference. Furthermore, the systems can be capable of detecting the substance along various locations and depths within the sample by mapping a detector pixel and a microoptics to the location and depth in the sample. 120-. (canceled)21. A system for taking a measurement , comprising:a light source configured to output light to a sample;a first output region located at an interface of the system and configured to receive a first light from a first location within the sample;a second output region located at the interface of the system and configured to receive a second light from a second location within the sample;a detector; and first optics configured to receive the first light from the first output region and direct the first light from the first output region to the detector; and', 'second optics configured to receive the second light from the second output region and direct the second light from the second output region to the detector., 'an optics unit, comprising22. The system of claim 21 , further comprising a reference claim 21 , wherein:the light comprises is output to the sample and to the reference; and receive the second light from the reference; and', 'direct the second light to the detector., 'the optics unit further comprises third optics configured to23. The ...

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21-01-2021 дата публикации

SYSTEM AND METHOD TO STANDARDIZE WHITENESS CALIBRATION AND MEASUREMENT

Номер: US20210018435A1
Принадлежит:

By way of overview and introduction, various embodiments of the apparatus, systems and methods described herein are directed improved approaches to aligning and standardizing different total spectral radiance factor shapes measured with different instruments. Furthermore, in one or more configurations and approaches, the disclosure presented herein is directed to obtaining a whiteness calibration value for use in sample measurements without the need of UV filter adjustments. 1. A method for providing a device independent total spectral radiance factor of a sample , the method comprising:obtaining, using a light measurement instrument, a first measurement of the sample under at least one illuminant that excludes UV spectral radiance;obtaining, using a light measurement instrument, a second measurement of the sample under at least one illuminant that provides a UV excited spectral radiance;obtaining a compensation value for the UV excited spectral radiance measurement;accessing a standard illumination profile from a pre-defined list of standard illuminant profiles;calculating, as an updated second measurement value, the quotient of the product of the compensation value and the second measurement value divided by the accessed standard illumination profile;determining the total spectral radiance factor value for the sample by using the first and updated second measurement value; andoutputting the total spectral radiance factor value.4. The method of claim 3 , wherein the measurement device used to acquire the RSRF and FSRF values is the same measurement device used to acquire the first and second measurements.5. The method of claim 1 , wherein the standard illumination profile is selected from one of a group of CIE standard illuminants.6. The method of claim 5 , wherein the CIE illuminants include C claim 5 , D50 claim 5 , D55 claim 5 , D65 claim 5 , and D75.7. The method of claim 1 , wherein the one of the at least one illuminant is configured to produce light that ...

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21-01-2021 дата публикации

IMAGING APPARATUS AND IMAGING METHOD

Номер: US20210018745A1
Автор: HUANG Chenhui
Принадлежит: NEC Corporation

An imaging apparatus according to an aspect of the present disclosure includes: a waveguide that transmits light emitted from a light source; a detector that detects power of a speckle pattern generated by the light passing through the waveguide and applied to an object; at least one memory storing a set of instructions; and at least one processor configured to execute the set of instructions to reconstruct an image of the object based on the power obtained by making the light enter the waveguide under different conditions. 1. An imaging apparatus comprising:a waveguide that transmits light emitted from a light source;a detector that detects power of a speckle pattern generated by the light passing through the waveguide and applied to an object;at least one memory storing a set of instructions; andat least one processor configured to execute the set of instructions toreconstruct an image of the object based on the power obtained by making the light enter the waveguide under different conditions.2. The imaging apparatus according to claim 1 , further comprisinga modulator that changes the conditions under which the light enters the waveguide.3. The imaging apparatus according to claim 2 , whereinthe modulator changes the conditions by changing an incident angle of the light on the waveguide.4. The imaging apparatus according to claim 2 , whereinthe modulator changes the conditions by changing a wavefront of the light.5. The imaging apparatus according to claim 1 , whereinthe waveguide is a multimode waveguide.6. The imaging apparatus according to claim 1 , whereinthe at least one processor is configured to execute the set of instructions toreconstruct the image based on an alternating direction method of multipliers (ADMM) algorithm.7. The imaging apparatus according to claim 6 , whereinthe at least one processor is configured to execute the set of instructions toreconstruct the image based on the ADMM algorithm by using a transformation matrix obtained for the ...

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28-01-2016 дата публикации

Method of Determining Dose, Inspection Apparatus, Patterning Device, Substrate and Device Manufacturing Method

Номер: US20160026096A1
Принадлежит: ASML Netherlands B.V.

A method of determining exposure dose of a lithographic apparatus used in a lithographic process on a substrate, the method comprising the steps: (a) receiving a substrate comprising first and second structures produced using the lithographic process; (b) detecting scattered radiation while illuminating the first structure with radiation to obtain a first scatterometer signal; (c) detecting scattered radiation while illuminating the second structure with radiation to obtain a second scatterometer signal; (d) using the first and second scatterometer signals to determine an exposure dose value used to produce said first and second structures wherein the first structure has a first periodic characteristic with spatial characteristics and yet at least another second periodic characteristic with spatial characteristics designed to be affected by the exposure dose and the second structure has a first periodic characteristic with spatial characteristics and yet at least another second periodic characteristic with spatial characteristics designed to be affected by the exposure dose wherein the exposure dose affects the exposure dose affected spatial characteristics of the first and second structures in a different manner. 1. A method of determining an exposure dose value of a lithographic apparatus used in a lithographic process on a substrate , the method comprising:detecting radiation scattered from first and second structures on the substrate while illuminating the first and second structures;generating first and second scatterometer signals based on the scattered radiation detected from the first and second structures, respectively; anddetermining, based on the first and second scatterometer signals, the exposure dose value used to produce the first and second structures.2. The method of claim 1 , further comprising: a first periodic characteristic, and', 'a second periodic characteristic different from the first periodic characteristic;', 'producing the second ...

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25-01-2018 дата публикации

Hand-Held Measurement Device for Capturing the Visual Impression of a Measurement Object

Номер: US20180024005A1
Принадлежит:

A hand-held measurement device for appearance analyses includes a measurement array which comprises a number of illumination means for applying illumination light to a measurement field in at least three illumination directions and a number of pick-up means for capturing the measurement light in at least one observation direction. The illumination directions and the observation directions lie in a common system plane. At least one pick-up means is embodied to spectrally gauge the measurement light in a locally integral way, and at least one imaging pick-up means is embodied to gauge the measurement light in terms of colour in a locally resolved way. The spectral pick-up means and the locally resolving pick-up means are arranged such that they receive the measurement light reflected by the measurement field under the same observation conditions and in particular from the same observation direction. 131-. (canceled)32. A method of accurately capturing a color digital image of a surface of a measurement object , comprising:a. providing a plurality of light sources in a common plane and oriented to provide at least three illumination directions in relation to a direction normal to the surface;b. providing a spectrometer oriented in at least one observation direction in relation to the direction normal to the surface, the observation direction also lying in the common plane, the spectrometer configured to provide spectral information;c. providing a digital color camera, the digital color camera configured to provide color image data;d. providing a beam splitter in the at least one observation direction beam path, wherein the beam splitter divides a common beam path, and directs a portion of the common beam path onto the spectrometer and another portion out of the common plane and onto the color camera, and wherein the beam splitter is arranged such that it is rotated about the common beam path and out of the system plane by essentially 45′ such that the measurement light ...

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25-01-2018 дата публикации

IMAGING DEVICE AND METHOD

Номер: US20180024343A1
Принадлежит:

Disclosed is an imaging device including a light source arranged so as to generate an optical signal, an optical support coupled to the light source and arranged so as to project a luminous excitation signal with a substantially constant light intensity, from the light source to a body to be observed during the use of the device, and an asynchronous camera coupled to the optical support and designed so as to generate a signal including, for each pixel of a first pixel matrix, a signal sequence representing asynchronous events corresponding to variations of the light backscattered by the body to be observed for the pixel. 110-. (canceled)11. An imaging device comprising:at least one light source arranged so as to generate an optical signal;an optical support coupled to the light source and arranged so as to project a luminous excitation signal with a substantially constant light intensity from the light source to a body to be observed when using the device; anda first asynchronous camera coupled to the optical support and designed so as to generate a signal comprising, for each pixel of a first pixel array, a signal sequence representing asynchronous events corresponding to variations in the light backscattered by the body to be observed for the pixel.12. The device according to claim 11 , comprising a second asynchronous camera coupled to the optical support and designed so as to generate a signal comprising claim 11 , for each pixel of a second pixel array claim 11 , a signal sequence representing asynchronous events corresponding to variations in the light backscattered by the body to be observed for the pixel claim 11 , and wherein a first optical filter is arranged so as to filter the backscattered light captured by the first asynchronous camera.13. The device according to claim 12 , wherein a second optical filter is arranged so as to filter the backscattered light captured by the second asynchronous camera.14. The device according to claim 13 , comprising a ...

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24-01-2019 дата публикации

Forward scatter in particulate matter sensor

Номер: US20190025180A1
Принадлежит: Honeywell International Inc

Embodiments relate generally to systems and methods for detecting particulate matter in the air. A particulate matter sensor may comprise an airflow channel; a light source configured to pass light through the airflow channel; an airflow generator configured to generate airflow into the airflow channel; a waveguide configured to direct light from the light source after it passes through the airflow channel and scatters off of particulate matter within the airflow channel; a photodiode configured to receive light scattered by the waveguide; and a computing device coupled to the photodiode having a processor and a memory storing instructions which, when executed by the processor, determines a mass concentration of particles in the airflow channel based on an output of the photodiode.

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24-01-2019 дата публикации

NDIR Glucose Detection in Liquids

Номер: US20190025207A1
Принадлежит: Airware Inc

For determining concentration of targeted molecules MG in a liquid sample admixed with interfering molecules MJ which overlap their absorption band, a special NDIR sampling and calibration technique is employed. Besides the signal source, a reference and one or more interference sources are added. The selection of the wavelength for the interference sources enables its measured transmittance value to be used for deciding the validity of the calibration curve for molecules MG in the liquid sample. This value can further be used to adjust the calibration curve via a parameter linking the transmittances measured at the signal and interference wavelength channels in order to assure its validity.

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24-01-2019 дата публикации

DEVICE FOR IMAGING 1-D NANOMATERIALS

Номер: US20190025216A1
Принадлежит:

A device for imaging one dimension nanomaterials is provided. The device includes an optical microscope with a liquid immersion objective, a laser device, and a spectrometer. The laser device is configured to provide an incident light beam with a continuous spectrum. The spectrometer is configured to obtain spectral information of the one dimensional nanomaterials. 1. A device for imaging one dimensional nanomaterials , comprising:an optical microscope with a liquid immersion objective;a laser device configured to provide an incident light beam with a continuous spectrum; anda spectrometer configured to obtain spectral information of the one dimensional nanomaterials.2. The device of claim 1 , further comprising a container comprising a side wall and a bottom wall claim 1 , the side wall and the bottom wall together define a chamber for containing the one dimensional nanomaterials and a liquid.3. The device of claim 2 , wherein an angle between the side wall and the bottom wall is in a range from 45 degrees to 90 degrees.4. The device of claim 3 , wherein the angle between the side wall and the bottom wall is 75 degrees.5. The device of claim 2 , wherein the incident light beam emitted from the laser device is perpendicular to the side wall.6. The device of claim 2 , wherein the side wall comprises a planar quartz window.7. The device of claim 2 , wherein the one dimensional nanomaterials is located on the bottom wall.8. The device of claim 1 , wherein the device further comprises a filter configured to filter out infrared light of the incident light beam claim 1 , and the filter is located in an optical path of the incident light beam.9. The device of claim 1 , further comprising a focusing lens configured to increase intensity of the incident light beam claim 1 , and the focusing lens is located in an optical path of the incident light beam.10. The device of claim 1 , further comprising a camera connected to the optical microscope.11. The device of claim 1 , ...

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24-01-2019 дата публикации

A METHOD OF AND APPARATUSES FOR ASSESSING FAT IN DAIRY PROCESSING

Номер: US20190025272A1
Автор: Jarvis Ian
Принадлежит:

A method of and apparatus () are described for assessing fat in whey in the making of a dairy product in accordance with a dairy product recipe. The method comprises the steps of: a. using one or more optical sensors () to sense at least one stream () of whey separated from curd in dairy product making apparatus () and generate one or more signals indicative of the degree of occlusion of the stream () of whey; b. converting or processing one or more said signals as a measure of the specific mass of fat lost from curd in a dairy product making plant () in the stream of whey; c. assessing whether the value of specific mass of fat lost obtained in Step b lies within or outside a predetermined fat loss range; and d. if the said value of specific mass of fat lost is outside the predetermined range, adjusting the recipe so that the value of specific mass of fat lost lies within the predetermined range. 1. A method of assessing fat in whey in the making of a dairy product in accordance with a dairy product recipe , the method comprising the steps of:a. using one or more optical sensors to sense at least one stream of whey separated from curd in dairy product making apparatus and generate one or more signals indicative of the degree of occlusion of the stream of whey;b. converting or processing one or more said signals as a measure of the specific mass of fat lost from curd in a dairy product-making plant into the stream of whey;c. assessing whether the value of specific mass of fat lost obtained in Step b lies within or outside a predetermined fat loss range; andd. if the said value of specific mass of fat lost is outside the predetermined range, adjusting the recipe so that the value of specific mass of fat lost lies within the predetermined range.2. A method according to wherein the dairy product is cheese or yogurt.3. A method according to wherein the dairy product is butter.4. A method according to including the steps of:e. using a plurality of optical sensors to sense ...

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23-01-2020 дата публикации

Method and apparatus for determining particle characteristics utilizing a plurality of beam splitting functions and correction of scattered light

Номер: US20200025665A1
Автор: Michael Trainer
Принадлежит: Individual

Apparatus and methods for determining information about at least one particle by measuring light scattered from the particles. Scattered light is combined with light from a light source to produce an optical interference signal utilizing a plurality of beam splitting functions. Scattered light signals are corrected for signal components which are not derived from particle scatter.

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24-01-2019 дата публикации

System for object authenticity detection including a reference image acquisition module and a user module and methods therefor

Номер: US20190026581A1
Автор: Ilya Leizerson
Принадлежит: Elbit Systems Land and C4I Ltd

A system for determining the authenticity of an object including a reference-image acquisition module for acquiring a reference-image. The reference-image acquisition module includes a light-source, an imager including an imaging-sensor, and a database coupled with the imager for storing the reference-image. The light-source directs circumferential-light toward an authentication-region on the object. The circumferential-light is at least one of collimated and telecentric. The circumferential-light impinges on the authentication-region from a plurality of different azimuthal directions and at a predetermined oblique angle relative to the normal of a plane defined by said object. A portion of the circumferential-light is reflected from the authentication-region toward a specular reflection region and another portion is scattered from the authentication-region. The imager is focused on the authentication-region and acquires a reference-image. The reference-image is a focused image of the scattered light. The reference-image includes image features related to surface features scattering phenomena of the authentication-region.

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28-01-2021 дата публикации

Defect inspection apparatus and defect inspection method

Номер: US20210025829A1
Принадлежит: Hitachi High Tech Corp

A defect inspection apparatus includes: an illumination unit configured to illuminate an inspection object region of a sample with light emitted from a light source; a detection unit configured to detect scattered light in a plurality of directions, which is generated from the inspection object region; a photoelectric conversion unit configured to convert the scattered light detected by the detection unit into an electrical signal; and a signal processing unit configured to process the electrical signal converted by the photoelectric conversion unit to detect a defect in the sample. The detection unit includes a lens array configured to divide an image to form a plurality of images on the photoelectric conversion unit. The signal processing unit is configured to synthesize electrical signals corresponding to the plurality of formed images to detect a defect in the sample.

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04-02-2016 дата публикации

METHOD AND APPARATUS TO DETECT DEFECTS IN TRANSPARENT SOLIDS

Номер: US20160033421A1
Принадлежит: Zeta Instruments, Inc.

A method and apparatus to measure specular reflection intensity, specular reflection angle, near specular scattered radiation, and large angle scattered radiation and determine the location and type of defect present in a first and a second transparent solid that have abutting surfaces. The types of defects include a top surface particle, an interface particle, a bottom surface particle, an interface bubble, a top surface pit, and a stain. The four measurements are conducted at multiple locations along the surface of the transparent solid and the measured information is stored in a memory device. The difference between an event peak and a local average of measurements for each type of measurement is used to detect changes in the measurements. Information stored in the memory device is processed to generate a work piece defect mapping indicating the type of defect and the defect location of each defect found. 1. A method , comprising:(a) directing a scanning beam to a first location on a first surface of a first transparent solid, wherein a second surface of the first transparent solid abuts a first surface of a second transparent solid;(b) at the first location, measuring: (i) specular reflection intensity, (ii) Near Specular Scattered Radiation (NSSR) intensity, (iii) Large Angle Scattered Radiation (LASR) intensity, and (iv) Specular Reflection Angle, wherein (i) through (iv) result from irradiation by the scanning beam; and(c) storing coordinate values of the first location, and measurements (i) through (iv) in a memory.2. The method of claim 1 , further comprising:(d) repeating steps (a) through (c) at a plurality of locations on the first surface of the first transparent solid;(e) determining if a defect is present at each location; and(f) determining a type of defect when a defect is present, wherein the type of defect is selected from the group consisting of: (1) a top surface particle, (2) an interface particle, (3) a bottom surface particle, (4) an ...

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01-02-2018 дата публикации

NON-LINEAR FREQUENCY SCAN OPTICAL FREQUENCY-DOMAIN REFLECTOMETRY

Номер: US20180031471A1
Принадлежит:

A system () for fiber-optic reflectometry includes an optical source (), a beat detection module (A, B) and a processor (). The optical source is configured to generate a non-linearly-scanning optical interrogation signal having an instantaneous optical frequency that is a non-linear function of time. The beat detection module is configured to transmit the optical interrogation signal into an optical fiber (), to receive from the optical fiber an optical backscattering signal in response to the optical interrogation signal, and to mix the optical backscattering signal with a reference replica of the optical interrogation signal, so as to produce a beat signal. The processor is configured (i) to hold a predefined function that is indicative of an expected phase of the beat signal resulting from the non-linearly-scanning optical interrogation signal as a function of position along the optical fiber and time, (ii) to estimate a backscattering profile of the optical fiber by applying the predefined function to the beat signal, and (iii) to sense one or more events affecting the optical fiber by analyzing the backscattering profile. 1. A system for fiber-optic reflectometry , the system comprising:an optical source, which is configured to generate a non-linearly-scanning optical interrogation signal having an instantaneous optical frequency that is a non-linear function of time;a beat detection module, which is configured to transmit the optical interrogation signal into an optical fiber, to receive from the optical fiber an optical backscattering signal in response to the optical interrogation signal, and to mix the optical backscattering signal with a reference replica of the optical interrogation signal, so as to produce a beat signal; anda processor, which is configured (i) to hold a predefined function that is indicative of an expected phase of the beat signal resulting from the non-linearly-scanning optical interrogation signal as a function of position along the ...

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05-02-2015 дата публикации

Method for Measuring the Scattered Light of Particles in a Medium

Номер: US20150036121A1
Принадлежит: BOEHRINGER INGELHEIM MICROPARTS GMBH

The invention relates to a method for measuring the scattered light (L) of particles (P, PK) in a measuring medium (F), wherein a measuring container () is supplied with the measuring medium (F) and incident light (L) is shone through the measuring medium (F) at least in some regions over a certain path length () and in a certain direction and the light (L) scattered from the incident light (L) is measured within a certain angle range (α). 121181214151118. Method for measuring the scattered light (L) of particles (P , PK) in a measuring medium (F) , wherein a measuring container ( , ) is supplied with the measuring medium (F) and incident light (L) is shone through the measuring medium (F) at least in some regions over a certain path length (I) and in a certain direction (S) and the light (L) scattered from the incident light (L) is measured ( , ) within a certain angle range (α) , characterised in that the incident light (L) is guided parallel to a longitudinal axis (S) of the measuring container ( , ).21118. Method according to claim 1 , characterised in that the incident light (L) is guided along the axis of symmetry (S) of the measuring container ( claim 1 , ).321. Method according to claim 1 , characterised in that the scattered light (L) is measured at an angle (α) of about 90° to the incident light (L).42334. Method according to claim 1 , characterised in that the scattered light (L) is focused ( claim 1 , L) before a measurement ().53213. Method according to claim 4 , characterised in that an optical device () with an aperture (A) is used to focus the scattered light (L) claim 4 , the aperture being smaller than the path length (I) of the incident light (L) through the measuring medium (F) and the aperture (A) of the optical device () being aligned so that it (A) is located substantially centrally along said path length (I).6118. Method according to claim 1 , characterised in that a rotationally symmetrical measuring container is used as the measuring ...

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05-02-2015 дата публикации

Metrology Systems and Methods

Номер: US20150036142A1
Принадлежит:

Various metrology systems and methods are provided. One metrology system includes a light source configured to produce a diffraction-limited light beam, an apodizer configured to shape the light beam in the entrance pupil of illumination optics, and optical elements configured to direct the diffraction-limited light beam from the apodizer to an illumination spot on a grating target on a wafer and to collect scattered light from the grating target. The metrology system further includes a field stop and a detector configured to detect the scattered light that passes through the field stop. In addition, the metrology system includes a computer system configured to determine a characteristic of the grating target using output of the detector. 1. A metrology system , comprising:a light source configured to produce a diffraction-limited light beam;an apodizer configured to shape the light beam in an entrance pupil of illumination optics;a micromirror array device configured to direct the light beam from the light source to only certain portions of the entrance pupil;optical elements configured to direct the diffraction-limited light beam from the apodizer to a spot on a wafer and to collect scattered light from the spot;a field stop configured to reject a portion of the collected scattered light;a detector configured to detect scattered light that passes through the field stop and to generate output responsive to the detected scattered light such that the wafer is measured by the metrology system using scatterometry; anda computer system configured to determine a characteristic of the wafer using the output.2. The system of claim 1 , wherein the micromirror array device is a reflective micromirror array device.3. The system of claim 1 , wherein the micromirror array device is a diffractive micromirror array device.4. The system of claim 1 , wherein the light source is a supercontinuum laser.5. The system of claim 1 , wherein the micromirror array device is further ...

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31-01-2019 дата публикации

MEASURING APPARATUS AND MEASURING METHOD

Номер: US20190033070A1
Автор: MURAKAMI Miyuki
Принадлежит: OLYMPUS CORPORATION

A measuring apparatus includes: a light source device that projects light or light of which intensity is periodically modulated onto a measurement object; a light receiver that receives backscattered light of light projected by the light source device from the measurement object; and a processor comprising hardware, the processor being configured to: measure TOF information of the light projected by the light source device and the backscattered light received by the light receiver; acquire distances from a surface of the measurement object to the light source device and the light receiver; and calculate an internal propagation distance in the measurement object according to the measured TOF information and the acquired distances. 1. A measuring apparatus comprising:a light source device that is arranged with respect to a measurement object with a gas layer or a vacuum layer interposed between the light source device and the measurement object and that projects pulsed light or light of which intensity is periodically modulated onto the measurement object;a light receiver that is arranged with respect to the measurement object with the gas layer or the vacuum layer interposed between the light source device and the measurement object and that receives backscattered light of light projected by the light source device from the measurement object; and measure TOF information of the light projected by the light source device and the backscattered light received by the light receiver;', 'acquire distances from a surface of the measurement object to the light source device and the light receiver; and', 'calculate an internal propagation distance in the measurement object according to the measured TOF information and the acquired distances., 'a processor comprising hardware, the processor being configured to2. The measuring apparatus according to claim 1 , wherein the processor is further configured to calculate light intensity of the light received by the light receiver ...

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30-01-2020 дата публикации

METHOD OF ESTIMATING OPTICAL PHYSICAL PROPERTY VALUE DISTRIBUTION, COMPUTER-READABLE RECORDING MEDIUM AND OPTICAL PHYSICAL PROPERTY VALUE DISTRIBUTION ESTIMATING APPARATUS

Номер: US20200033262A1
Принадлежит: OLYMPUS CORPORATION

A method of estimating an optical physical property value distribution includes: first estimating including reading a first measured value obtained by measuring isotropic backscattering light of light that is applied to a measurement subject, from a storage and estimating a first optical physical property value distribution that is an optical physical property value distribution in the measurement subject, by an inverse analysis arithmetic operation; and second estimating including reading a second measured value obtained by measuring more anisotropic backscattering light of light that is applied to the measurement subject than the backscattering light corresponding to the first measured value, from a storage and estimating a second optical physical property value distribution that is an optical physical property value distribution in the measurement subject, by an inverse analysis arithmetic operation using at least part of the first optical physical property value distribution as an initial value. 1. A method of estimating an optical physical property value distribution that is performed by an optical physical property value distribution estimating apparatus configured to estimate an optical physical property value distribution in a measurement subject , the method comprising:first estimating including reading a first measured value obtained by measuring isotropic backscattering light of light that is applied to the measurement subject, from a storage and estimating a first optical physical property value distribution that is an optical physical property value distribution in the measurement subject, by an inverse analysis arithmetic operation; andsecond estimating including reading a second measured value obtained by measuring more anisotropic backscattering light of light that is applied to the measurement subject than the backscattering light corresponding to the first measured value, from a storage and estimating a second optical physical property value ...

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24-02-2022 дата публикации

SPECKLE-BASED IMAGE DISTORTION CORRECTION FOR LASER SCANNING MICROSCOPY

Номер: US20220054013A1
Принадлежит:

A method of correcting distortion of an image, including: analyzing, by a processor, an image segment of the image to identify a speckle artifact, the image segment being obtained from a scanning imaging device; determining, by the processor, an aspect ratio of a shape of the speckle artifact; determining, by the processor, a correction factor for the shape of the speckle artifact based on the aspect ratio; and adjusting, by the processor, a dimension of the image segment based on the correction factor. 1. A method of correcting distortion of an image , comprising:{'claim-text': 'the image segment being obtained from a scanning imaging device;', '#text': 'analyzing, by a processor, an image segment of the image to identify a speckle artifact,'}determining, by the processor, an aspect ratio of a shape of the speckle artifact;determining, by the processor, a correction factor for the shape of the speckle artifact based on the aspect ratio; andadjusting, by the processor, a dimension of the image segment based on the correction factor.2. The method of claim 1 , wherein determining the correction factor for the shape of the speckle artifact based on the aspect ratio further comprises:determining the correction factor based on a polynomial function which relates the aspect ratio to the correction factor.3. The method of claim 1 , wherein the image is obtained from at least one of a rotational scanning device or a linear scanning device.4. The method of claim 3 , wherein the image segment is derived by dividing the image into a plurality of strips claim 3 ,{'claim-text': 'wherein the image segment comprises one of the plurality of substrips.', '#text': 'wherein each of the plurality of strips is subdivided into a plurality of substrips,'}5. The method of claim 4 , wherein the image is generated by rotational scanning of the sample claim 4 ,wherein each of the plurality of strips corresponds to data collected in a rotational scanning direction of the sample.6. The method ...

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09-02-2017 дата публикации

APPARATUS AND METHOD FOR CUSTOMIZED HAIR-COLORING

Номер: US20170038297A1
Принадлежит: Coloright Ltd.

An apparatus and method for customized hair-coloring is disclosed. In some embodiments the method comprises: a. performing a plurality of light-scattering measurements upon a sample of hair such that for each light-scattering measurement, the sample of hair is illuminated from a different respective direction; b. comparing the results of the light-scattering measurements; c. in accordance with results of the comparing, computing an initial damage-state of hair of the sample by comparing the results of the light-scattering measurements; d. obtaining an initial color-state of the hair of the sample; and e. computing a hair-coloring composition that is predicted to transform the hair sample from the initial color-state to a target color-state such that in response to a determining of a greater (lesser) extent of initial damage, a concentration of artificial- colorant(s) within the computed coloring composition is reduced (increased). 1. A hair coloring method comprising:a. performing a plurality of light-scattering measurements upon a sample of hair such that for each light-scattering measurement, the sample of hair is illuminated from a different respective direction;b. comparing the results of the light-scattering measurements;c. in accordance with results of the comparing, computing an initial damage-state of hair of the sample by comparing the results of the light-scattering measurements;d. obtaining an initial color-state of the hair of the sample; ande. computing a hair-coloring composition that is predicted to transform the hair sample from the initial color-state to a target color-state such that in response to a determining of a greater (lesser) extent of initial damage, a concentration of artificial-colorant(s) within the computed coloring composition is reduced (increased).2. The method of wherein:i. the hair-coloring composition comprises first and second artificial-colorants;ii. the rate of absorbance by hair-shafts of the first artificial-colorant ...

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08-02-2018 дата публикации

THERMAL COMPENSATION

Номер: US20180038782A1
Принадлежит: Malvern Instruments Limited

Method of characterizing particles suspended in a fluid dispersant by light diffraction, comprising: obtaining measurement data from a detector element, the detector element being arranged to measure the intensity of scattered light; identifying a measurement contribution arising from light scattered by inhomogeneities in the dispersant; processing the measurement data to remove or separate the measurement contribution arising from light scattered by inhomogeneities in the dispersant; calculating a particle size distribution from the processed measurement. The detector element is one of a plurality of detector elements from which the measurement data is obtained. The detector elements are arranged to measure the intensity of scattered light at a plurality of scattering angles, the plurality of scattering angles distributed over a plurality of angles about an illumination axis. Identifying a measurement contribution arising from light scattered by inhomogeneities in the dispersant comprises identifying measured scattered light that is asymmetric about the illumination axis. 2. (canceled)3. The method of claim 1 , wherein at least some of the plurality of scattering angles are alternately arranged between a first and second radial location about the illumination axis with increasing scattering angle.4. The method of claim 3 , wherein the first and second radial location about the scattering axis are separated by at least 90 degrees about the illumination axis.5. The method of claim 1 , wherein at least some of the detector elements are arranged with their centroids in a logarithmic series of scattering angles.6. The method of claim 1 , wherein obtaining a measurement comprises obtaining a time history of the intensity of scattered light from the detector element or the detector elements.7. The method of claim 6 , wherein identifying a measurement contribution arising from light scattered by inhomogeneities in the dispersant comprises identifying peaks in the ...

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08-02-2018 дата публикации

IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD, IMAGE CAPTURING DEVICE AND STORAGE MEDIUM

Номер: US20180038789A1
Автор: Itoh Yasuhiro
Принадлежит:

An attempt is made to suppress the processing load while securing real-time properties of the image processing to improve visual recognizability of a captured image whose visual recognizability has been reduced by the influence of fine particle components. An image processing apparatus including: an extraction unit configured to extract an atmospheric light component from a captured image including an influence of fine particles in the atmosphere; and a removal processing unit configured to generate an image from the captured image, in which the influence of fine particles has been removed, based on the extracted atmospheric light component, and the extraction unit performs the extraction based on data of the captured image and data of an exposure value at the time of photographing the captured image. 1. An image processing apparatus comprising:an extraction unit configured to extract an atmospheric light component from a captured image including an influence of fine particles in the atmosphere; anda removal processing unit configured to generate an image from the captured image, in which the influence of fine particles has been removed, based on the extracted atmospheric light component, whereinthe extraction unit performs the extraction based on data of the captured image and data of an exposure value at the time of photographing the captured image.2. The image processing apparatus according to claim 1 , whereinthe captured image is an image represented in an RGB color space, a unit configured to determine a predetermined threshold value for a luminance value based on the exposure value; and', 'a unit configured to convert an RGB value of a pixel in the captured image into a luminance value and to determine, by robust estimation processing, a pixel to estimate atmospheric light from pixels having the luminance value larger than or equal to the threshold value, and, 'the extraction unit hasthe extraction unit estimates atmospheric light based on a pixel value of ...

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12-02-2015 дата публикации

Front Quartersphere Scattered Light Analysis

Номер: US20150042993A1
Принадлежит: KLA-TENCOR CORPORATION

A surface inspection system, as well as related components and methods, are provided. The surface inspection system includes a beam source subsystem, a beam scanning subsystem, a workpiece movement subsystem, an optical collection and detection subsystem, and a processing subsystem. The optical collection and detection system features, in the front quartersphere, a light channel assembly for collecting light reflected from the surface of the workpiece, and a front collector and wing collectors for collecting light scattered from the surface, to greatly improve the measurement capabilities of the system. The light channel assembly has a switchable edge exclusion mask and a reflected light detection system for improved detection of the reflected light. 12-. (canceled)3. An optical collection system for use in a surface inspection system for inspecting a surface of a workpiece , the surface inspection system having an incident beam projected through a back quartersphere and toward a desired location on the surface of the workpiece to impinge thereon to create reflected light , extending along a light channel axis in a front quartersphere , and scattered light , the incident beam and the light channel axis forming an incident plane , the optical collection system comprising:a wing collector positioned to collect a first portion of the scattered light, the wing collector being disposed in the front quartersphere, outside the incident plane, and at a minimum of a bi-directional reflectance distribution function when the incident beam is P polarized; andat least one of the following collection elements: a light channel collector, positioned in the incident plane to simultaneously receive the reflected light, or a front collector disposed in the front quartersphere and positioned to simultaneously collect a second portion of the scattered light.4. An optical collection system as recited in claim 3 , wherein the bi-directional reflectance distribution function has a P- ...

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06-02-2020 дата публикации

OPTICAL FLOW ANALYSIS METHOD AND DETECTION DEVICE

Номер: US20200037896A1
Принадлежит:

A method of optical flow analysis and a detection device using the analysis method is shown. Examples shown include imaging using a fluid mechanic approach to visualizing flow, for example, in organic tissue. Example shown use apparent displacement in laser speckle patterns. 1. A method of imaging a flowing media , comprising:capturing a first laser speckle image of a region;capturing a second laser speckle image of the region, at a time different from the first laser speckle image of the region; andapplying a fluid mechanic algorithm to the laser speckle data in both the first laser speckle image and the second laser speckle image to provide contrast in regions of flowing media.2. The method of claim 1 , wherein providing contrast in regions of flowing media includes providing contrast in regions of flowing blood.3. The method of claim 2 , wherein providing contrast in regions of flowing media includes providing contrast in regions that include multiple blood vessels networks within the region.4. The method of claim 1 , wherein applying a fluid mechanic algorithm includes applying a pulsatile flow algorithm.5. The method of claim 1 , wherein applying a fluid mechanic algorithm includes applying a pulsatile flow algorithm in an elastic tube.6. The method of claim 1 , further including calculating a quantitative value of flow in the flowing media.7. An imaging device claim 1 , comprising:at least one processor;a laser speckle imaging device; capturing a first laser speckle image of a region;', 'capturing a second laser speckle image of the region, at a time different from the first laser speckle image of the region; and', 'applying a fluid mechanic algorithm to the laser speckle data in both the first laser speckle image and the second laser speckle image to provide contrast in regions of flowing media., 'a storage device comprising instructions, which when executed by the at least one processor, configure the at least one processor to operate the laser speckle ...

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07-02-2019 дата публикации

PORTABLE OPTICAL APPARATUS FOR DIFFUSE REFLECTANCE SPECTROSCOPY

Номер: US20190041328A1
Принадлежит: TUBITAK

An optical apparatus for obtaining a reflectance spectrum includes a first means for generating a light, a second means for transferring and receiving the light on a substrate, a third means for collecting a diffusely reflected light, and a fourth means for separating the diffusely reflected light from a specular reflected light to obtain information about a concentration of a chromophore in the substrate. The second means is an optic probe made of Poly(methyl methacrylate) (PMMA) material including an inner rod and an outer rod, the inner rod is nested within the outer rod for collection and for illumination, the inner rod and the outer rod are coaxial, the inner rod is longer than the outer rod, the inner rod is isolated from the outer rod with a semi mirrored isolator, the reflected light is reflected from deep within the substrate by the inner rod. 1. An optical apparatus for obtaining a reflectance spectrum comprising:a) means for generating a proper lightb) means for transferring and receiving said light to the said substrate (tissue, plastic etc.)c) means for collecting the reflected light that is reflected from deep within the substrated) means for separating said diffusely reflected light from specular reflected light to obtain information about chromophores concentration in said substrate223. An optical apparatus according to claim 1 , wherein means for generating a proper light is two white LEDs () with wide flat spectrums preferably from 350 nm to 750 nm wavelengths3. An optical apparatus according to claim 1 , wherein means for transferring said light to the substrate through the outer rod4. An optical apparatus according to wherein claim 1 , means for receiving said light from the substrate through the inner rod5. An optical apparatus according to claim 1 , wherein means for detecting the diffuse reflectance spectrum by a micro spectrometer.6. An optical apparatus according to wherein claim 1 , means for separating said diffusely reflected light from ...

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07-02-2019 дата публикации

Overlay Metrology Using Multiple Parameter Configurations

Номер: US20190041329A1
Принадлежит: KLA Tencor Corp

An overlay metrology system includes an overlay metrology tool configurable to generate overlay signals with a plurality of recipes and further directs an illumination beam to an overlay target and collects radiation emanating from the overlay target in response to the at least a portion of the illumination beam to generate the overlay signal with the particular recipe. The overlay metrology system further acquires two or more overlay signals for a first overlay target using two or more unique recipes, subsequently acquires two or more overlay signals for a second overlay target using the two or more unique recipes, determines candidate overlays for the first and second overlay targets based on the two or more overlay signals for each target, and determines output overlays for the first and second overlay targets based on the two or more candidate overlays for each target.

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16-02-2017 дата публикации

VOLUMETRIC SUBSTRATE SCANNER

Номер: US20170045463A1
Автор: Wenz Holger
Принадлежит: Rudolph Technologies, Inc.

A system for scanning a substrate and specifically a volume of that substrate to identify anomalous structures or defects is herein described. Radiation is focused at locations within the volume of the substrate and measurements of scattered light are made. Scanning of the volume of a substrate may be fairly uniform or over selected regions, favoring those regions of the substrate that are to be involved with subsequent substrate processing steps. 1. A volumetric substrate scanner , comprising:an illuminator outputting radiation having at least one wavelength in the range of approximately 800 nm to 2000 nm;focusing optics that receive the radiation from the illuminator and direct it toward a substrate where the radiation is selectively focused along an optical path intersecting the substrate within the volume of the substrate at a selected focal position;collection optics that collect light scattered from the substrate and direct it to a detector the collection optics including a filter to omit specularly reflected light returned from the substrate, wherein the detector receives scattered light from the substrate and generates a signal that corresponds to a characteristic of the scattered light;a stage for moving the substrate relative to the focal position of the radiation along a path; and,a controller coupled to the illuminator, focusing optics, detector and stage that records the signal output by the detector and a position of the focal position of the radiation within the volume of the substrate based on a selected setting of the focusing optics and a position of the stage.2. The volumetric substrate scanner of wherein the collection optics further comprises an elliptical collector and a turning mirror claim 1 , the turning mirror having an aperture to pass radiation from the illuminator to the substrate that is positioned such that specularly reflected light returned from the substrate passes through the aperture without being reflected by the turning mirror ...

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15-02-2018 дата публикации

Optical element testing methods and systems employing a broadband angle-selective filter

Номер: US20180045602A1
Принадлежит: Halliburton Energy Services Inc

An optical element testing system includes a broadband angle-selective filter arranged along an optical path with an optical element to be tested. The system also includes a electromagnetic radiation transducer that outputs a signal in response to electromagnetic radiation that passes through the broadband angle-selective filter. The system also includes a storage device that stores data corresponding to the signal output from the electromagnetic radiation transducer, wherein the data indicates a property of the optical element in response to a test.

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19-02-2015 дата публикации

Methods and apparatus for coaxial imaging of multiple wavelengths

Номер: US20150051498A1
Автор: Mark Anthony Darty
Принадлежит: Hypermed Imaging Inc

A hyperspectral/multispectral imager comprising a housing is provided. At least one light source is attached to the housing. An objective lens, in an optical communication path comprising originating and terminating ends, is further attached to the housing and causes light to (i) be backscattered by the tissue of a subject at the originating end and then (ii) pass through the objective lens to a beam steering element at the terminating end of the communication path inside the housing. The beam steering element has a plurality of operating modes each of which causes the element to be in optical communication with a different optical detector in a plurality of optical detectors offset from the optical communication path. Each respective detector filter in a plurality of detector filters covers a corresponding optical detector in the plurality of optical detectors thereby filtering light received by the corresponding detector from the beam steering element.

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03-03-2022 дата публикации

COMPACT IN-LINE NON-CONTACT OPTICAL PROPERTY MEASUREMENT SYSTEM

Номер: US20220065779A1
Принадлежит: NDC Technologies Inc.

Disclosed herein are compact, on line, real-time, non-contact optical property measurement systems and methods thereof capable of measuring optical quality such as haze, clarity, luminance of a film during the film manufacturing process. More specifically, the optical property measurement system can move in the transverse direction along the film while the film is on the line, thereby measuring the optical property of the film in real time at various locations on the film in both the transverse and machine direction.

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14-02-2019 дата публикации

Hand-Held Measurement Device for Capturing the Visual Impression of a Measurement Object

Номер: US20190049304A1
Принадлежит:

A hand-held measurement device for appearance analyses includes a measurement array which comprises a number of illumination means for applying illumination light to a measurement field in at least three illumination directions and a number of pick-up means for capturing the measurement light in at least one observation direction. The illumination directions and the observation directions lie in a common system plane. At least one pick-up means is embodied to spectrally gauge the measurement light in a locally integral way, and at least one imaging pick-up means is embodied to gauge the measurement light in terms of colour in a locally resolved way. The spectral pick-up means and the locally resolving pick-up means are arranged such that they receive the measurement light reflected by the measurement field under the same observation conditions and in particular from the same observation direction. 131-. (cancel)32. A method of obtaining an image dataset of a surface of a measurement object using a measurement device having a plurality of illumination directions of a measurement spot and an observation direction of the measurement spot in relation to a direction normal to the surface and lying in a common plane , a plurality of light sources oriented in the plurality of illumination directions , an observation direction beam path oriented in the observation direction , a spectrometer configured to acquire and provide spectral information of the measurement spot on the surface of the measurement object , a digital color camera configured to acquire and provide color image data of the surface of the measurement object including the measurement spot , a beam splitter in the at least one observation direction beam path , wherein the beam splitter divides a common beam path , and directs a portion of the common beam path onto the spectrometer and another portion out of the common plane and onto the color camera; and an electronic controller configured to control the light ...

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14-02-2019 дата публикации

Laser speckle micro-rheology in characterization of biomechanical properties of tissues

Номер: US20190049354A1
Принадлежит: General Hospital Corp

Laser speckle microrheology is used to determine a mechanical property of a biological tissue, namely, an elastic modulus. Speckle frames may be acquired by illuminating a coherent light and capturing back-scattered rays in parallel and cross-polarized states with respect to illumination. The speckle frames may be analyzed temporally to obtain diffuse reflectance profiles (DRPs) for the parallel-polarized and cross-polarized states. A scattering characteristic of particles in the biological tissue may be determined based on the DRPs, and a displacement characteristic may be determined based at least in part on a speckle intensity autocorrelation function and the scattering characteristic. A size characteristic of scattering particles may be determined based on the DRP for the parallel polarization state. The mechanical property may be calculated using the displacement and size characteristics.

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14-02-2019 дата публикации

Calibration insert, and mount of the same

Номер: US20190049363A1

The present disclosure relates to a calibration insert for the adjustment, calibration, and/or implementation of a function test of an optical sensor that is designed to measure at least one measurand in a medium by means of light, the calibration insert including: an inlet cross-section through which light enters into the calibration insert; an outlet cross-section through which light exits from the calibration insert; and at least one blocking element that is arranged between the inlet cross-section and the outlet cross-section, wherein the blocking element does not entirely let through the light, independently of its wavelength, from the inlet cross-section to the outlet cross-section. Instead, the blocking element partially absorbs, reflects, or scatters the light, wherein the ratio of the intensity of the light at the outlet cross-section to the intensity of the light at the inlet cross-section corresponds to a value of the measurand.

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14-02-2019 дата публикации

Optical fiber inspecting device, optical fiber manufacturing apparatus, method for inspecting optical fiber, and method for manufacturing optical fiber

Номер: US20190049372A1
Принадлежит: Sumitomo Electric Industries Ltd

An optical fiber inspecting device is disclosed. The optical fiber inspecting device includes a first light-emitting unit that irradiates an optical fiber with a first light beam, the optical fiber including a glass fiber and a coating resin and moving in an axial direction, and a first light-receiving unit that receives scattered light resulting from the first light beam scattered in the optical fiber, and converts the scattered light to an electrical signal. An optical axis of the first light-receiving unit passes through an irradiation position where the first light beam strikes the optical fiber, and the first light beam and the optical axis of the first light-receiving unit diagonally intersect each other, thereby preventing the first light beam from directly entering the first light-receiving unit.

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14-02-2019 дата публикации

On-Device Metrology Using Target Decomposition

Номер: US20190049602A1
Принадлежит:

Methods and systems for more efficient X-Ray scatterometry measurements of on-device structures are presented herein. X-Ray scatterometry measurements of one or more structures over a measurement area includes a decomposition of the one or more structures into a plurality of sub-structures, a decomposition of the measurement area into a plurality of sub-areas, or both. The decomposed structures, measurement areas, or both, are independently simulated. The scattering contributions of each of the independently simulated decomposed structures are combined to simulate the actual scattering of the measured structures within the measurement area. In a further aspect, measured intensities and modelled intensities including one or more incidental structures are employed to perform measurement of structures of interest. In other further aspects, measurement decomposition is employed to train a measurement model and to optimize a measurement recipe for a particular measurement application. 1. An x-ray scatterometry based metrology system comprising:an x-ray illumination source configured to provide an amount of x-ray illumination light directed to one or more structures disposed on a semiconductor wafer within a measurement area;a detector configured to detect an amount of x-ray light reflected from or transmitted through the semiconductor wafer in response to the amount of x-ray illumination light and generate a plurality of output signals indicative of a measured scattering response from the one or more structures; and decompose the one or more structures into a plurality of sub-structures, the measurement area into a plurality of sub-areas, or both;', 'generate a structural model associated with each of the plurality of sub-structures, each of the plurality of sub-areas, or both;', 'generate a simulated scattering response associated with each of the structural models, independently;', 'combine each of the simulated scattering responses to generate a combined, simulated ...

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10-03-2022 дата публикации

METROLOGY METHOD

Номер: US20220075276A1
Принадлежит: ASML Netherlands B.V.

A method provides the steps of receiving an image from a metrology tool, determining individual units of said image and discriminating the units which provide accurate metrology values. The images are obtained by measuring the metrology target at multiple wavelengths. The discrimination between the units, when these units are pixels in said image, is based on calculating a degree of similarity between said units. 18-. (canceled)9. A method comprising:receiving an image from a metrology tool,determining individual units of the image; anddiscriminating the units which provide accurate metrology values.10. The method of claim 9 , wherein the determining individual units comprises determining individual pixels.11. The method of claim 9 , wherein individual units of the image are pixels claim 9 , and the discriminating the units is based on comparing intensity values of each pixel with the intensity values of other pixels.12. The method of claim 9 , wherein the image is obtained by measuring a metrology target with multiple wavelengths and recording a scattered radiation from the metrology target.13. The method of claim 10 , wherein discriminating the units is based on finding linear dependence between measured intensities for each pixel at multiple wavelengths.14. The method claim 9 , wherein the image from the metrology tool is the image obtained for a positive biased metrology target or the image obtained for a negative biased metrology target.15. The method according of claim 9 , wherein the image is measured in a pre-lithography step.16. A method of selecting a region of interest in an image comprising:measuring the image of a metrology target by illuminating the metrology target with radiation;determining individual units of the image;discriminating the individual units of the image; andselecting pixels that form the region of interest, wherein the selected pixels have a degree of similarity as determined in the discriminating step.17. The method of claim 16 , ...

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03-03-2016 дата публикации

OPTICAL OBSERVATION APPARATUS AND OPTICAL OBSERVATION METHOD

Номер: US20160061724A1
Автор: MIKI Yutaka
Принадлежит:

Optical observation apparatus includes: light source emitting broadband light; image fiber with first and second end faces, wherein end faces of plural cores are two-dimensionally arrayed in first and second end faces; imaging optical system provided on first end face side of image fiber, causing light from first end face to be imaged on imaging plane; and axial aberration optical system provided on second end face side of image fiber, having an axial chromatic aberration on optical axis, and causing light from second end face toward object to be observed to be converged. Image fiber takes light from light source from first end face, and transmits light to second end face, and takes light, reflected and scattered by a surface of object, converged by axial aberration optical system, and focused for each plural core on second end face, from second end face and transmits light to first end face. 1. An optical observation apparatus comprising:a light source emitting broadband light;an image fiber with a first end face and a second end face, in which end faces of a plurality of cores are two-dimensionally arrayed in the first end face and the second end face;an imaging optical system provided on the first end face side of the image fiber, and causing light emitted from the first end face to be imaged on an imaging plane; andan axial aberration optical system provided on the second end face side of the image fiber, having an axial chromatic aberration on an optical axis, and causing light emitted from the second end face toward an object to be observed to be converged,wherein the image fiber takes the light emitted from the light source from the first end face, and transmits the light to the second end face, and takes the light, which is reflected and scattered by a surface of the object to be observed, converged by the axial aberration optical system, and focused for each of the plurality of cores on the second end face, from the second end face and transmits the light ...

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03-03-2016 дата публикации

Method and device for imaging 1-d nanomaterials

Номер: US20160061734A1

A method for imaging one dimension nanomaterials is provided. Firstly, one dimension nanomaterials sample, an optical microscope with a liquid immersion objective and a liquid are provided. Secondly, the one dimensional nanomaterials sample is immersed in the liquid. Thirdly, the one dimensional nanomaterials sample is illuminated by an incident beam to generate resonance Rayleigh scattering. Forthly, the liquid immersion objective is immersed into the liquid to get a resonance Rayleigh scattering (RRS) image of the one dimensional nanomaterials sample. Fifthly, spectra of the one dimensional nanomaterials sample are measured to obtain chirality of the one dimensional nanomaterials sample.

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01-03-2018 дата публикации

METHOD FOR DETECTION OF THE CONTAMINATION OF A SAMPLE CUVETTE OF A NEPHELOMETRIC TURBIDIMETER

Номер: US20180059016A1
Принадлежит: HACH LANGE GMBH

A method for detecting a contamination of a cuvette of a turbidimeter. The turbidimeter includes a light source which emits a light beam directed to a cuvette, a scattering light detector, and a diffuser with a body and an actuator. The actuator moves the body between a parking position and a test position where the body is between the measurement light source and the cuvette, thereby interferes with the light beam, and generates a diffuse test light entering the cuvette. The method includes activating the actuator to move the body from the parking position into the test position, activating the light source, measuring a test light intensity received by the scattering light detector, comparing the test light intensity measured with a reference light intensity, and generating a contamination signal if a difference between a reference light intensity and the test light intensity measured exceeds a first threshold value. 1. A method for detecting a contamination of a sample cuvette of a nephelometric turbidimeter after a contamination test is requested , a measurement light source configured to emit an axial parallel light beam directed to a sample cuvette;', 'a scattering light detector arranged to receive a scattered light from the sample cuvette; and', 'a diffuser comprising a diffuser body and a diffuser actuator, the diffuser actuator being configured to move the diffuser body between a parking position in which the diffuser body does not interfere with the axial parallel light beam and a test position where the diffuser body is arranged between the measurement light source and the sample cuvette so that the diffuser body interferes with the axial parallel light beam and generates a diffuse test light entering the sample cuvette,, 'the nephelometric turbidimeter comprising activating the diffuser actuator to move the diffuser body from the parking position into the test position;', 'activating the measurement light source;', 'measuring a test light intensity ...

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01-03-2018 дата публикации

AUTHENTICATION STRUCTURE AND AUTHENTICATION METHOD USING THE SAME

Номер: US20180059018A1
Автор: LEE Jaesoong
Принадлежит: SAMSUNG ELECTRONICS CO., LTD.

An authentication structure and an authenticating method using the same are provided. The authentication structure includes a plurality of input couplers that generate surface plasmons by being selectively coupled to lights because the plurality of input couplers are different in terms of at least one of a geometric structure and an arrangement, and an output coupler that outputs a speckle pattern based on the surface plasmons. 1. An authentication structure comprising:a first input coupler oriented in a first direction and configured to generate first surface plasmons from first light having first light characteristics from among incident light;a second input coupler oriented in a second direction different from the first direction and configured to generate second surface plasmons from second light having second light characteristics from among the incident light; andan output coupler spaced apart from the first and second input couplers and configured to output a speckle pattern based on at least one of the first and second surface plasmons.2. The authentication structure of claim 1 , wherein a polarization of the first light is different from a polarization of the second light claim 1 , a wavelength of the first light is different from a wavelength of the second light claim 1 , or the polarization and the wavelength of the first light are different from the polarization and the wavelength of the second light.3. The authentication structure of claim 1 , wherein an included angle between the first direction and the second direction is less than 180°.4. The authentication structure of claim 3 , wherein the first direction and the second direction intersect at 90°.5. The authentication structure of claim 1 , wherein the first input coupler and the second input coupler are spaced apart from each other.6. The authentication structure of claim 5 , wherein the first input coupler and the second input coupler partially overlap each other.7. The authentication structure ...

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02-03-2017 дата публикации

OPTICAL ACCELEROMETER

Номер: US20170059606A1
Принадлежит:

The invention relates to an optical accelerometer, comprising a seismic mass, equipped with a mobile reflective surface, according to a rotating axis, an emitting optical fiber, coupled with a light source, intended to emit a light beam, through one of its edges, in the direction of the reflective surface, and a receiving optical fiber, coupled with an optical detector, intended to receive, through one of its edges-, the light beam sent back by the reflective surface. The arrangement of the ensemble is such that a rotating movement of the reflective surface leads to a deflection of the light beam and a variation in the light intensity received by the receiving fiber. According to the invention, a convergent lens is interposed, on the optical path of the light beam, between the optical fibers and the seismic mass. 112-. (canceled)13. An optical accelerometer , comprising:a seismic mass equipped with a mobile reflective surface according to a rotating axis;an emitting optical fiber coupled to a light source and configured to emit a light beam through one of its edges in the direction of the mobile reflective surface;a receiving optical fibre coupled with an optical detector configured to receive through one of its edges the light beam sent back by the reflective surface; anda convergent lens interposed on an optical path of the light beam between the emitting and receiving optical fibres and the said seismic mass;wherein a rotating movement of the reflective surface causes a deflection of the light beam and a variation in the light intensity received by the receiving fiber.14. The accelerometer according to claim 13 , wherein the lens is an optical axis AA of focal distance F of object focal plane Fo and in that the edges respectively of emitting fiber and receiving fiber are located in the object focal plane Fo.15. The accelerometer according to claim 13 , wherein the lens is of image focal plane Fi and the seismic mass is flat and defines a plane P coinciding with ...

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04-03-2021 дата публикации

MULTI-ANGLE DYNAMIC LIGHT SCATTERING

Номер: US20210063295A1
Принадлежит: Malvern Panalytical Limited

A method of determining particle size distribution from multi-angle dynamic light scattering data, comprising: obtaining a series of measured correlation functions g(θ) at scattering angles θ; and solving an equation comprising 2. The method of claim 1 , wherein the linear solver is NNLS claim 1 , and/or the non-linear solver is selected from Nelder-Mead simplex claim 1 , Levenberg-Marquardt and Gauss-Newton.3. The method of claim 1 , wherein the initial estimates for the scaling factors αto αare estimated by extrapolation of a correlation function to a zero-delay time (τ=0).4. The method of claim 1 , wherein the predefined exit tolerance is:a convergence criterion based the preceding residual, orthe predefined exit tolerance is an absolute residual threshold.5. The method of claim 1 , further comprising repeating the steps a) to e) for a different non-linear solver claim 1 , to determine which non-linear solver provides the smallest residual.6. The method of claim 1 , further comprising measuring a time history of scattered light intensity at each respective scattering angle claim 1 , θ claim 1 , and determining the correlation functions g(θ) for each scattering angle.8. The method of claim 7 , wherein the dynamic light scattering data is multi-angle data claim 7 , and each measurement time corresponds with a different measurement angle θ; or wherein the dynamic light scattering data is of single angle type claim 7 , and each measurement time i corresponds with the same measurement angle θ.9. (canceled)10. The method of claim 7 , wherein the computed noise contribution is based on the expected instrument response to a large particle in a scattering volume of the instrument; wherein the large particle is assumed to be at least 3 microns in diameter claim 7 , or at least 10 microns in diameter.12. The method of claim 7 , further comprising sequentially measuring a time history of scattered light intensity at each respective scattering angle claim 7 , θ claim 7 , and ...

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04-03-2021 дата публикации

Optical device, optical module and microscope for scanning large samples

Номер: US20210063714A1
Принадлежит: Leica Microsystems CMS GmbH

An optical device for illuminating a sample located in a sample volume with illumination light and for detecting scattered and/or fluorescent light from the sample includes an optical illumination assembly, an optical detection assembly and at least one attachment element. The optical illumination assembly is configured to transmit the illumination light along an illumination path into the sample volume. The optical detection assembly is configured to collect and relay the scattered and/or fluorescent light from the sample volume along a detection path. At least portions of the illumination path and/or of the detection path extend in the at least one attachment element.

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03-03-2016 дата публикации

Optical Method for Characterising a Diffractive Surface and Apparatus for Implementing Such a Method

Номер: US20160063733A1

An optical method for characterizing a diffractive surface having a crystal grain structure, including the steps of: a) successively illuminating said surface with a plurality of light beams (Fi) having propagation directions inclined by a same angle Θ; relative to the normal to the surface and of which the projections on the surface form azimuth angles φ{umlaut over (ι)} that are different relative to a reference direction; b) acquiring an image of the surface corresponding to each of the light beams; and c) digitally processing images to obtain at least one item of information on at least one property of the surface chosen from: the grain structure, texture and level of ordering thereof. An optical head (TO) and apparatus for implementing such a method. 1. A method for characterizing a diffracting surface having a grain structure , comprising the steps:{'sub': i', 'i', 'i, 'sup': j', 'j, 'a) illuminating in succession said surface with N>1 light beams (F) having propagation directions inclined at the same angle θto the normal to the surface and the projections of which onto the surface make different azimuthal angles φto a reference direction;'}b) acquiring an image of said surface in correspondence with each of said light beams in a given acquisition direction; andc) digitally processing said images to obtain at least one piece of information on at least one property of said surface, chosen from: its grain structure, its texture and its degree of order;{'sub': 'i', 'sup': 'j', 'wherein said step c) comprises determining, for each point of said surface corresponding to a pixel of said images, an average azimuthal angle of a range of azimuthal angles φfor which said point appears bright when it is observed in said acquisition direction.'}2. The method as claimed in claim 1 , in which said step c) comprises claim 1 , for each point of said surface corresponding to a pixel of said images claim 1 , substeps comprising:c1) constructing a binary vector containing N ...

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28-02-2019 дата публикации

HYPERSPECTRAL TECHNOLOGY FOR ASSESSING AND TREATING DIABETIC FOOT AND TISSUE DISEASE

Номер: US20190059787A1
Принадлежит:

This invention relates generally to an index map comprising both pressure and perfusion information from a diabetic patient foot for the purpose of treatment. The index map may also be a map of perfusion and/or metabolism of the tissue (reflecting oxygen delivery and oxygen extraction, obtained by thermal imaging, hyperspectral imaging, or duplex ultrasound, MRA, CT or laser Doppler imaging. This information aids treatment in prevention of diabetic foot ulceration and amputation and in treatment of tissue compromise to prevent tissue loss in other body regions. 157-. (canceled)58. A method for designing a prosthetic or orthotic device for treatment of a tissue of a subject , the method comprising:(A) obtaining a gradient map of the tissue of the subject, wherein the gradient map comprises information about tissue oxygenation, tissue oxygen extraction, tissue metabolism, or tissue perfusion of the tissue;(B) determining a pressure or stress applied to the tissue;(C) identifying one or more areas of the tissue that are at risk for disease formation or disease progression based on the gradient map, or the pressure or stress applied to the tissue; and(D) designing the prosthetic or orthotic device to redistribute the pressure or stress across the tissue, wherein the redistribution of the pressure or stress across the tissue reduces the pressure or the stress applied to the one or more identified areas of the tissue that are at risk for disease formation or disease progression.59. The method of claim 58 , wherein the gradient map of the tissue of the subject is a hyperspectral image.60. The method of claim 58 , wherein the gradient map of the tissue of the subject is paired with a spatial map of the pressure or stress applied to the tissue to form a composite image claim 58 , wherein the identifying of the one or more areas of the tissue that are at risk for disease formation or disease progression is based on the composite image.61. The method of claim 58 , wherein the ...

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22-05-2014 дата публикации

Automatic analysis device

Номер: US20140140890A1
Принадлежит: Hitachi High Technologies Corp

The automatic analysis device measures time sequential data on a scattered light amount as reaction process data, and quantitatively determines the concentration of an analyte from a change in light amount. The automatic analysis device has a function of selecting reaction process data to be used for quantitative determination from the reaction process data obtained by measurement using a plurality of light receivers at different angles. As a result of using this function, data is selected from the reaction process data obtained by measurement using the plurality of light receivers at different angles in accordance with the concentration of the analyte and whether the priority is given to high sensitivity in the case where sensitivity is prioritized or a dynamic range, and the result of the quantitative determination is displayed.

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17-03-2022 дата публикации

APPARATUS, DEVICES AND METHODS FOR OBTAINING OMNIDIRECTIONAL VIEWING BY A CATHETER

Номер: US20220079448A1
Принадлежит:

An apparatus for obtaining information regarding a biological structure(s) can include, for example a light guiding arrangement which can include a fiber through which an electromagnetic radiation(s) can be propagated, where the electromagnetic radiation can be provided to or from the structure. An at least partially reflective arrangement can have multiple surfaces, where the reflecting arrangement can be situated with respect to the optical arrangement such that the surfaces thereof each can receive a(s) beam of the electromagnetic radiations instantaneously, and a receiving arrangement(s) which can be configured to receive the reflected radiation from the surfaces which include speckle patterns. 120.-. (canceled)21. A catheter system for obtaining information regarding at least one biological sample , comprising:at least one fiber through which at least one electromagnetic radiation is propagated to the at least one biological sample;a multi-faceted mirror having multiple surfaces arranged with respect to the at least one fiber to simultaneously receive the at least one electromagnetic radiation at each of the multiple surfaces and deliver reflected radiation that includes speckle patterns; and 'wherein the fiber bundle is further configured to deliver the reflected radiation obtained, via the multiple surfaces of the multi-faceted mirror, from the at least one biological sample at multiple illumination locations to a detector to image the speckle patterns from the at least one biological sample at the multiple illumination locations based on the reflected radiation.', 'a fiber bundle configured to receive, from the multi-faceted mirror, a reflected radiation that includes the speckle patterns from the multiple surfaces of the multi-faceted mirror,'}22. The system of claim 21 , wherein the fiber bundle is further configured to deliver the reflected radiation obtained claim 21 , via the multiple surfaces of the multi-faceted mirror claim 21 , without a rotation of ...

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17-03-2022 дата публикации

Method for determining a visibility

Номер: US20220082703A1
Автор: Günter Anton Fendt
Принадлежит: Conti Temic Microelectronic GmbH

Disclosed is a method for determining a visibility using a sensor unit, in particular a lidar sensor, including having the sensor unit emit a transmission signal, capturing a received signal backscattered by an object, determining the distance from the object using the received signal, and determining the visibility on the basis of the ascertained distance from the object and/or the strength of the received signal.

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28-02-2019 дата публикации

Non-contact and optical measuring automation system for the profile accuracy of disk cams and method thereof

Номер: US20190063908A1
Принадлежит: National Taiwan Ocean University NTOU

A non-contact and optical measuring automation system, configured to electrically connect to a computer to measure the profile accuracy of a disk cam, includes a base, a rotating chuck, a moving stage module and a laser displacement meter. The rotating chuck is disposed for clamping the disk cam. The moving stage module includes a first linear motion stage movable relative to the base in a first direction and a second linear motion stage movable relative to the first linear motion stage in a second direction. The computer is able to control the rotation of the rotating chuck and the movement of the moving stage module, and is able to control a beam emitted from the laser displacement meter projecting onto a profile surface of the disk cam so as to obtain a profile deviation value of the disk cam by using the laser triangulation method.

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12-03-2015 дата публикации

Methods and apparatus to obtain suspended particle information

Номер: US20150070696A1
Принадлежит: University of Notre Dame

An apparatus for obtaining suspended particle information includes an optical array to divide light to a first path and a second path, a platform to orient a first and second container with either the first or second path, and a first and second photodetector to receive at least a direct illuminating component of the light of the first and second path after said light penetrates through the first and second container. A detector interface receives transmission signals from the first and second photodetectors of the direct illuminating component of the light after penetrating through the first and second container and a calculation engine computes the particle information based on a ratio of the received transmission signals.

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28-02-2019 дата публикации

Collection optics system for spectrometer and raman spectral system

Номер: US20190064072A1
Принадлежит: SAMSUNG ELECTRONICS CO LTD

A collection optics system for a spectrometer and a Raman spectral system including the collection optics system is provided. The collection optics system is configured to selectively collect a Raman signal from scattered light output from a target object, the collection optics system includes a non-imaging collection unit configured to collect the Raman signal and output the Raman signal, the non-imaging collection unit including an entrance surface on which the scattered light is incident and an exit surface through which the Raman signal is output, and a Raman filter provided on a portion of the entrance surface of the non-imaging collection unit and configured to block the scattered light including a fluorescence signal. Therefore, the collection optics system may suppress reception of the fluorescence signal of the scattered light and selectively collect the Raman signal.

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28-02-2019 дата публикации

DISTRIBUTED MEASUREMENT OF MINIMUM AND MAXIMUM IN-SITU STRESS IN SUBSTRATES

Номер: US20190064387A1
Принадлежит:

A system for performing distributed measurements of in-situ stress includes an expandable element with at least one fiber optic sensor. The expandable element can be positioned at various depths in a hole in a substrate. A pressurizing device expands (and contracts) the expandable element when the expandable element is inserted in the hole in the substrate to exert pressure on the hole wall. A pressure sensor provides a sensor output indicative of a pressure applied to the hole wall by the expandable element. The fiber optic sensor and an optical interrogator measure strain along a length of the sensor in a continuous, high spatial resolution manner Based on the measured strain and pressure sensor output, the system determines various properties of the substrate such as, minimum principal stress, maximum principal stress, and/or principal stress direction associated with one or more fractures in the substrate, as well as substrate modulus. 1. An apparatus for performing distributed measurements along a hole in a substrate , comprising:an expandable element configured to be inserted into a hole in a substrate;an optical fiber sensor integrated with the expandable element to expand and contract as the expandable element expands and contracts;a fiber optic interrogator to provide light to the optical fiber sensor and to detect reflected light from the optical fiber sensor;a pressurizing device coupled to the expandable element for expanding the expandable device when the expandable element is inserted in the hole in the substrate to exert pressure on a wall of the hole;a pressure sensor to provide a sensor output indicative of a pressure applied to the wall of the hole by the expandable element; control pressure delivered by the pressurizing device to expand the expandable element until one or more fractures are detected as being in an open state in the substrate and to contract the expandable element until the one or more fractures are detected as being in a closed ...

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08-03-2018 дата публикации

POLARIZATION-SELECTIVE SCATTERING ANTENNA ARRAYS BASED POLARIMETER

Номер: US20180066991A1

A polarimeter includes an integrated device with an array of antennas including multiple column pairs. Each column pair has two columns, and each column in each column pair includes multiple antennas. A first column of each column pair in the array scatters a first polarization component of an incident radiation, and a second column of each column pair in the array scatters a second polarization component of the incident radiation. The scattered fields of the column pairs interfere constructively in a direction depending on the polarization of the incident radiation, resulting in maximal intensity at a certain point in space for a specific polarization state. Multiple column pairs in parallel and oriented at angles with respect to each other can be used to scatter different polarization components of the incident radiation directionally to different points in space. Detectors are positioned with respect to the integrated device to detect polarization components. 1. A polarimeter , comprising: the first array comprising a plurality of column pairs,', 'each column pair in the first array comprising two columns,', 'each column in each column pair comprising a plurality of antennas,', 'a first column of each column pair in the first array being configured to scatter a first polarization component of an incident radiation, and', 'a second column of each column pair in the first array being configured to scatter a second polarization component of the incident radiation; and, 'an integrated device comprising a first array of antennasa plurality of detectors, each of the detectors positioned with respect to the integrated device to detect one of a plurality of polarization components corresponding to superpositions of the first polarization component and the second polarization component.2. The polarimeter of claim 1 , wherein a distance between two columns in each column pair is substantially equal.3. The polarimeter of claim 2 , wherein the distance is about (N+n)λ claim ...

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09-03-2017 дата публикации

OPTIC DISTRIBUTION METER

Номер: US20170067824A1
Принадлежит:

The present invention discloses an optic distribution meter that includes a testing system and an imaging system. The testing system includes an arc-shaped brace which has an extended object holder; and a rail base which has a first rail. The imaging system, set at a side of the testing system, includes a screen and an image catcher. With the implementation of the present invention, the rail base is able to rotate or move an object to a test angle with very little light blocking of measurements. Besides, with the first rail supporting the object, the incident angle of the light of a light source to the object remains unchanged when the measuring angle of the imaging system is changed. Thus ensure the accuracy of measurements of the optic distribution meter. 1. An optic distribution meter , comprising: an arc-shaped brace, which includes an object holder extended from a base point on the said arc-shaped brace, the said object holder is used to hold an object; and', 'a rail base, which connects to and supports the arc-shaped brace, the rail base includes a first rail implanted on top of the rail base, a first motor and a second motor connected to the rail base, wherein the first motor controls the rail base to rotate with respect to a first axis, the second motor controls the arc-shaped brace to move along the first rail, and wherein the first axis is the central axis of the rail base; and, 'a testing system, which includes a screen, the optic distribution information scattered from the object is projected to and displayed on a surface of the screen; and', 'an image catcher, which is implemented on a side of the screen to catch and record the optic distribution information displayed on the said surface of the screen., 'an imaging system that equipped on a side of the object holder, the imaging system includes2. The optic distribution meter of claim I , wherein the said image catcher includes a lens unit and an image detector.3. The optic distribution meter of claim 1 ...

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09-03-2017 дата публикации

SUBSTRATE INSPECTION APPARATUS

Номер: US20170067833A1
Автор: AHN JEONGHO, LEE SEONGSIL
Принадлежит: SAMSUNG ELECTRONICS CO., LTD.

A substrate inspection apparatus may include a light source, which is configured to emit an incident light. The substrate inspection apparatus may further include a support, a detector, and a light adjuster. The supporting base configured to support a substrate, the detector configured to detect a defect on the substrate, and the light adjuster configured to allow the incident light to be reflected. The detector may be configured to collect a scattering signal. The scattering signal is generated from an optical interaction between an evanescent wave and the defect on the substrate, and to detect the defect. The evanescent wave may be generated when the incident light is totally and/or substantially reflected by the light adjuster. 1. A substrate inspection apparatus comprising:a light source configured to emit an incident light;a support configured to support a substrate;a detector configured to detect a defect on the substrate based on a generated scattering signal received by the detector; anda light adjuster configured to substantially totally reflect the incident light, the scattering signal is generated based on an optical interaction between an evanescent wave and the defect on the substrate, the evanescent wave is generated when the incident light is reflected by the light adjuster.2. The substrate inspection apparatus of claim 1 , wherein the light adjuster is between the detector and the substrate.3. The substrate inspection apparatus of claim 2 , whereinthe light adjuster and a top surface of the substrate are separated from each other by a distance, andthe evanescent wave is configured to reach the top surface but not pass through the top surface.4. The substrate inspection apparatus of claim 3 , wherein the distance ranges from 150 nm (nanometer) to 300 nm.5. The substrate inspection apparatus of claim 1 , further comprising:a reflection prism; anda moveable base configured to change a position of the reflection prism,wherein the moveable base is ...

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24-03-2022 дата публикации

Optical property measurement method and optical property calculation apparatus

Номер: US20220091034A1
Автор: Tomoko Sato
Принадлежит: Olympus Corp

An optical property measurement method includes: measuring, by first measurement, optical intensity of backscattering from a measurement target object when light is beamed to the measurement target object; calculating an attenuation coefficient in a depth direction of the measurement target object based on a measurement result of the first measurement; measuring, by second measurement that is different from the first measurement, optical intensity of backscattering from the measurement target object when light is beamed to the measurement target object; and calculating a scattering coefficient and an absorption coefficient in the depth direction of the measurement target object based on a measurement result of the second measurement by using a value of the calculated attenuation coefficient as a limiting condition.

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16-03-2017 дата публикации

EXTENDING THE RANGE OF TURBIDITY MEASUREMENT USING POLARIMETRY

Номер: US20170074780A1
Автор: Baba Justin S.
Принадлежит:

Turbidity measurements are obtained by directing a polarized optical beam to a scattering sample. Scattered portions of the beam are measured in orthogonal polarization states to determine a scattering minimum and a scattering maximum. These values are used to determine a degree of polarization of the scattered portions of the beam, and concentrations of scattering materials or turbidity can be estimated using the degree of polarization. Typically, linear polarizations are used, and scattering is measured along an axis that orthogonal to the direction of propagation of the polarized optical beam. 1. An apparatus , comprising:a light source situated to direct a light flux in a first state of polarization (SOP) along first axis;a sample container situated on the first axis so as to receive the light flux;at least one detector situated along a second axis that is at an angle with respect to the first axis, the detector producing an electrical detection signal in response to a portion of the light flux scattered in the sample container;at least one polarizer situated along the second axis between the sample container and the detector, wherein the at least one polarizer is oriented so as to produce at least a first electrical detection signal and a second electrical detection signal from the photodetector corresponding to different states of polarization of the portion of the scattered light flux; anda processor that produces an estimate of specimen scattering based on the first and second electrical detection signals.2. The apparatus of claim 1 , wherein the first SOP is a linear SOP and the second axis is perpendicular to a polarization direction associated with the linear SOP.3. The apparatus of claim 2 , wherein the first SOP is a linear SOP and the second axis is parallel to a polarization direction associated with the linear SOP.4. The apparatus of claim 1 , wherein the first SOP is a circular SOP.5. The apparatus of claim 1 , further comprising a rotational stage ...

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05-03-2020 дата публикации

Multi-Channel Coherent Detection

Номер: US20200072746A1
Принадлежит:

An optical receiver is provided that includes an array of photoreceivers. Each photoreceiver may be configured to receive a respective portion of a speckle pattern generated by interaction between an object beam and a scattering medium and each photoreceiver may be configured to generate respective electrical detection signals for provision to processing circuitry for summing of the electrical detection signals. A photoreceiver may include a collector, first detector and second detectors, and first and second optical splitters. The photoreceiver may be configured to generate a first electrical detection signal and a second electrical detection signal based on a received portion of the speckle pattern. 1. A system comprising:a light source configured to output light; andan optics assembly configured to receive the light from the light source and output a reference beam and an object beam, the reference beam or the object beam being modulated and the object beam being directed to a scattering medium for interaction with the scattering medium to generate a speckle pattern;processing circuitry;an optical receiver comprising an array of photoreceivers including a first photoreceiver, each photoreceiver within the array of photoreceivers being configured to receive a respective portion of the speckle pattern and generate respective electrical detection signals for provision to the processing circuitry;wherein the processing circuitry is configured to perform a summing operation based on the respective electrical detection signals to generate an output signal for analysis; a collector configured to receive a first portion of the speckle pattern;', 'a first detector and a second detector;', 'a first splitter configured to mix the first portion of the speckle pattern at a first polarization with the reference beam to generate first optical signals for receipt by the first detector, the first detector being configured to generate a first electrical detection signal based on ...

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05-03-2020 дата публикации

Optical flow cell assembly incorporating a replaceable transparent flow cell

Номер: US20200072747A1
Принадлежит: Wyatt Technology LLC

A new liquid flow cell assembly for light scattering measurements is disclosed which utilized a floating manifold system. The assembly operates with minimal stacked tolerances by aligning the cell to the windows within a manifold and independently aligning the cell to the read head directly. This configuration enables the ability to replace the flow cell or the flow cell/manifold assembly within a light scattering instrument without the need to realign the flow through elements with the light scattering illumination source while still maintaining reproducible, quality data. Some embodiments employ wide bore cells which enable the measurement of process analytic technology (PAT) including online monitoring of reactions.

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31-03-2022 дата публикации

OPTICAL DENSITY INSTRUMENT AND SYSTEMS AND METHODS USING THE SAME

Номер: US20220097046A1
Принадлежит:

Instruments, systems, and methods for measuring optical density of microbiological samples are provided. In particular, optical density instruments providing improved safety, efficiency, comfort, and convenience are provided. Such optical density instruments include a handheld portion and a base station. The optical density instruments may be used in systems and methods for measuring optical density of biological samples. 130.-. (canceled)31. An optical density testing apparatus , the apparatus comprising:a housing configured to receive at least a portion of a sample tube;an emitter configured to emit light towards the sample tube;at least one sensor configured to receive the emitted light from the emitter and generate a signal indicative of an intensity of the received light; anda wireless transmitter configured to wirelessly transmit optical density data to a receiving device based upon the signal indicative of the intensity of the received light.32. The optical density testing apparatus according to claim 31 , wherein the wireless transmitter is configured to transmit the optical density data directly to the receiving device.33. The optical density testing apparatus according to claim 31 , wherein the wireless transmitter is configured to transmit the optical density data to the receiving device via a wireless communication network.34. The optical density testing apparatus according to claim 31 , wherein the wireless transmitter is configured to transmit the optical density data to the receiving device in real time.35. The optical density testing apparatus according to claim 31 , wherein the wireless transmitter is configured to wirelessly transmit the optical density data to the receiving device continuously during at least a portion of a testing operation during which the emitted light is received by the at least one sensor.36. The optical density testing apparatus according to claim 35 , wherein the continuous wireless transmission of the optical density data ...

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31-03-2022 дата публикации

METHOD, APPARATUS, AND COMPUTER PROGRAM PRODUCT FOR CONTROLLING COMPONENTS OF A DETECTION DEVICE

Номер: US20220097047A1
Принадлежит:

A method, computer program product, and apparatus are provided for controlling components of a detection device. The device may detect turbidity of liquid with sensors such as a density sensor and/or nephelometric sensor. A light modulation pattern may reduce or eliminate interference in sensor readings. Readings may be performed during off cycles of an illumination light to reduce interference but to provide improved visibility of a tube. Dark and light sensor readings may be performed with an emitter respectively off or on to account for ambient light in subsequent readings. Readings from the density sensor and/or nephelometric sensor may be used to calculate McFarland values. The device may be zeroed based on an emitter level that results in a sensor reading satisfying a predetermined criterion. 124-. (canceled)25. An apparatus for reducing light interference during testing contents of a sample tube , the apparatus comprising:a shell defining one or more cavities for receiving at least a portion of a sample tube;an illumination light for illuminating the sample tube with visible light for a plurality of illumination light activation periods;an emitter configured to emit a source light towards the sample tube; andone or more sensors configured to receive at least a portion of the emitted source light during a plurality of sensor reading periods,wherein the plurality of illumination light activation periods and the plurality of sensor reading periods are configured to be sequenced such that, for at least a period of time, the illumination light and the one or more sensors appear to be simultaneously illuminating the sample tube and receiving at least a portion of the emitted source light, respectively, while the plurality of illumination light activation periods and the plurality of sensor reading periods do not overlap.26. The apparatus of claim 25 , wherein a first sensor reading period of the plurality of sensor reading periods is initiated based at least in ...

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23-03-2017 дата публикации

METHODS AND DEVICES FOR MEASURING PROPERTIES OF COATINGS ON OPTICAL FIBERS

Номер: US20170082535A1
Принадлежит:

A method for measuring a mechanical property of a coating on an optical fiber may include collecting Brillouin frequency shift data of the coating on the optical fiber, and determining the mechanical property of the coating by comparing the collected Brillouin frequency shift data with correlation data that may include a set of collected sample Brillouin frequency shift data and a set of collected sample mechanical property data of a plurality of sample materials. The sample materials may include a substantially identical sample composition including one or more curable polymers, be prepared with varying processing conditions, and have different mechanical property values. The coating on the optical fiber may include a material composition substantially identical to the sample materials composition. The set of collected sample Brillouin frequency shift data may be correlated with the set of collected sample mechanical property data to determine a quantitative relationship therebetween. 1. A method for measuring a mechanical property of a coating on an optical fiber , the method comprising:collecting Brillouin frequency shift data of the coating on the optical fiber; and a set of collected sample Brillouin frequency shift data of a plurality of sample materials; and', each of the sample materials comprises a substantially identical sample composition comprising one or more curable polymers;', 'at least a portion of the sample materials are prepared with varying processing conditions and have different values of the mechanical property;', 'the coating on the optical fiber comprises a material composition that is substantially identical to the sample composition of the sample materials; and', 'the set of collected sample Brillouin frequency shift data is correlated with the set of collected sample mechanical property data to determine a quantitative relationship therebetween., 'a set of collected sample mechanical property data of the plurality of sample materials, ...

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12-03-2020 дата публикации

High throughput method and apparatus for measuring multiple optical properties of a liquid sample

Номер: US20200080939A1
Принадлежит: WYATT TECHNOLOGY CORPORATION

An apparatus for the high throughput measurement of optical properties of liquid samples placed into the wells of a multiwell plate is disclosed. An optical fiber within a fiber bundle containing no corrective optics between the fiber ends and the well plate bottom illuminates the sample in order to induce fluorescence, and multiple fibers collect emission radiation and transmit it to a fluorescence detector such as a spectrometer. Other embodiments involve a light scattering illumination source with detection fibers located in either the same bundle containing the fluorescence monitoring fibers or an independent light scattering detection bundle for the measurement of static and/or dynamic light scattering. Some embodiments of the invention permit the measurement of phase analysis light scattering. Thus the measurement of multiple optical properties of a liquid sample may be made simultaneously or in succession. A method for these measurements is also disclosed. 1. An apparatus comprising: 'wherein the at least one vessel comprises a transparent bottom surface;', 'a multiwell plate comprising at least one vessel configured to contain a suspended liquid sample,'} at least one illumination fiber optically coupled to an excitation radiation source on the system end of the primary optical fiber bundle and positioned to illuminate the suspended liquid sample on the probe end of the primary optical fiber bundle, and', 'a plurality of collection fibers positioned, on the probe end of the primary optical fiber bundle, to collect radiation from the liquid sample illuminated by the at least one illumination fiber and optically coupled, on the system end of the primary optical fiber bundle, to at least one detector;, 'wherein the primary optical fiber bundle comprises'}, 'a primary optical fiber bundle comprising a probe end and a system end,'} 'wherein the translation device is configured to provide relative motion between the probe end of the primary optical fiber bundle ...

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25-03-2021 дата публикации

DEPOSIT DETECTION DEVICE AND DEPOSIT DETECTION METHOD

Номер: US20210088441A1
Принадлежит: DENSO TEN Limited

A deposit detection device according to an embodiment includes a calculation module, a detection module, an interpolation module, and a state management module. The calculation module calculates a region feature amount based on an edge vector of each pixel, for each unit region composed of a predetermined number of pixels included in a captured image. The detection module detects the unit region corresponding to a partial covering location and the unit region corresponding to a diffuse reflection location based on a detection condition and a second detection condition, respectively, the first detection condition and the second detection condition being based on the region feature amount. The interpolation module interpolates the area ratio of the partial covering location reduced due to the diffuse reflection location. The state management module controls state transitions of states related to interpolation of the area ratio, based on increase and decrease of the diffuse reflection location. 1. A deposit detection device comprising:a calculation module configured to calculate a region feature amount based on an edge vector of each pixel, for each unit region composed of a predetermined number of pixels included in a captured image;a detection module configured to detect the unit region corresponding to a partial covering location and the unit region corresponding to a diffuse reflection location based on a first detection condition and a second detection condition, respectively, the first detection condition and the second detection condition being based on the region feature amount;an interpolation module configured to interpolate an area ratio of the partial covering location reduced due to the diffuse reflection location; anda state management module configured to manage state transitions of states related to interpolation of the area ratio, based on increase and decrease of the diffuse reflection location.2. The deposit detection device according to claim 1 , ...

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29-03-2018 дата публикации

TISSUE INSPECTION SYSTEM WITH OPTICAL FIBERS AND CONTINUOUS CALIBRATION

Номер: US20180088044A1
Принадлежит:

A system for tissue inspection is provided, comprising a console () with a light source (), a spectrometer (), an optical switch () and a processing unit. The system further comprises an elongated shaft (), wherein an illumination fiber (), a plug () in front of the illumination fiber (), and a detection fiber () is provided in the elongated shaft (). The illumination fiber () is capable of transmitting light from the light source () to its front surface and is capable of transmitting light being back-reflected from the plug () to the optical switch (). The detection fiber () is capable of transmitting light reflected from tissue in front of the distal end surface of the elongated shaft () to the optical switch (). The optical switch ()) is configured to provide the back-reflected light to the spectrometer () for generating a reference spectrum and to provide the light reflected from the tissue to the spectrometer () for generating a diffuse reflectance spectrum. The processing unit is configured to generate a tissue spectrum by normalizing the diffuse reflectance spectrum with the reference spectrum. 1. A system for tissue inspection , comprising:a light source, a spectrometer, an optical switch and a processing unit,an elongated shaft including a distal end surface,an illumination fiber having a front surface, wherein the illumination fiber is made of a first optical material having a first refractive index and is arranged in the elongated shaft so that the front surface is located inside the elongated shaft and adjacent to the distal end surface of the elongated shaft, wherein the illumination fiber is configured to receive light from the light source,a plug of second optical material with a first surface and a second surface, wherein the plug is arranged in front of the illumination fiber so that the first surface of the plug faces the illumination fiber is optically connected with the illumination fiber, and that the second surface is located adjacent the ...

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29-03-2018 дата публикации

Inspection Device

Номер: US20180088055A1
Принадлежит:

Proposed is an inspection device that is provided with: an illuminating optical unit that irradiates a discretionary region of a sample with light; a control unit that gives instructions to the illuminating optical unit; and at least one detection unit that detects light transmitted from the sample. The illuminating optical unit includes a light source unit that generates light, and an electrooptic element unit to which the light generated by the light source unit is inputted, and on the basis of the instructions given from the control unit, the electrooptic element unit adjusts the light to be in a desired polarization state, said light having been generated by the light source unit, and irradiates the sample with the light. 1. An inspection device comprising:an illuminating optical unit that irradiates a discretionary region of a specimen with light;a control unit that gives instructions to the illuminating optical unit; andat least one detection unit that detects light from the specimen,wherein the illuminating optical unit includes a light source unit that generates light, and an electro-optic device unit to which the light generated by the light source unit is inputted, andwherein on the basis of the instructions from the control unit, the electro-optic device unit adjusts the light to be in a desired polarization state, the light having been generated by the light source unit, and irradiates the specimen with the light.2. The inspection device according to claim 1 ,wherein the electro-optic device unit adjusts a polarization state of the light inputted from the light source according to a voltage instructed from the control unit.3. The inspection device according to claim 2 ,wherein the voltage includes a voltage corresponding to P-polarization and a voltage corresponding to S-polarization.4. The inspection device according to claim 1 ,wherein the electro-optic device unit adjusts a polarization state of the light inputted from the light source according to ...

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