МНОГОКАНАЛЬНАЯ РЕГИСТРАЦИЯ

FIELD: physics. SUBSTANCE: detecting apparatus detects a first part of a beam of charged particles and generates a first output signal based on intensity of the detected first part of the beam of charged particles. The detecting apparatus detects a second part of the beam of charged particles which has traversed a longer trajectory section through a mass-spectrometer than the first part of the beam of charged particles, and generates a second output signal based on the detected second part of the beam of charged particles. A controller controls parameters of the beam of charged particles and (or) detecting apparatus based on the first output signal of the detecting apparatus, so as to control the second output signal of the detecting apparatus. EFFECT: high mass resolution. 51 cl, 3 dwg РОССИЙСКАЯ ФЕДЕРАЦИЯ (19) RU (11) 2 451 363 (13) C2 (51) МПК H01J 49/00 (2006.01) ФЕДЕРАЛЬНАЯ СЛУЖБА ПО ИНТЕЛЛЕКТУАЛЬНОЙ СОБСТВЕННОСТИ (12) ОПИСАНИЕ ИЗОБРЕТЕНИЯ К ПАТЕНТУ (21)(22) Заявка: 2009118806/07, 17.10.2007 (24) Дата начала отсчета срока действия патента: 17.10.2007 (73) Патентообладатель(и): ТЕРМО ФИШЕР САЙЕНТИФИК (БРЕМЕН) ГМБХ (DE) R U Приоритет(ы): (30) Конвенционный приоритет: 20.10.2006 GB 0620963.9 (72) Автор(ы): МАКАРОВ Александр Алексеевич (DE) (43) Дата публикации заявки: 27.11.2010 Бюл. № 33 2 4 5 1 3 6 3 (45) Опубликовано: 20.05.2012 Бюл. № 14 (56) Список документов, цитированных в отчете о поиске: WO 92/21140 A, 26.11.1992. RU 2190459 C2, 10.10.2002. US 2006020400 A1, 26.01.2006. GB 2390935 A, 21.01.2004. WO 02/097856 A, 05.12.2002. 2 4 5 1 3 6 3 R U (86) Заявка PCT: EP 2007/008985 (17.10.2007) C 2 C 2 (85) Дата начала рассмотрения заявки PCT на национальной фазе: 20.05.2009 (87) Публикация заявки РСТ: WO 2008/046594 (24.04.2008) Адрес для переписки: 105064, Москва, а/я 88, "Патентные поверенные Квашнин, Сапельников и партнеры", пат.пов. В.П.Квашнину, рег.№ 4 (54) МНОГОКАНАЛЬНАЯ РЕГИСТРАЦИЯ (57) Реферат: Масс-спектрометр и способ массспектрометрии, в которых ...

Mass analyser and method of mass analysis

Ion guide array

An ion guide array is disclosed comprising a first ion guide section 1 and a second-ion guide section 2 and optionally further ion guide sections. Each ion guide section 1,2 may comprise a plurality of electrodes having an aperture through which ions are transmitted in use. A transfer section is arranged at the exit of the first ion guide section 1 and ions are transmitted radially from the first ion guide section 1 into the second ion guide section 2. The electrodes 1 b, 2b in the transfer section may have a radial aperture enabling_ions to be transmitted radially from the first ion guide section 1 to the second ion guide section 2. The ions are transferred at an angle measured with respect to said first axis wherein the angle is greater than 60°.

Mass spectrometer

An ion mirror, an ion mirror assembly and an ion trap

TIME-OF-FLIGHT MASS SPECTROMETER

... 1405180 Mass spectrometers MAX-PLANCKGES ZUR FORDERUNG DER WISSENSCHAFTEN CV 26 July 1972 [27 July 1971] 34932/72 Heading H1D In a time-of-flight mass spectrometer having a flight path between an entrance plane 16 and an exit plane 18 comprising a straight part and a curved part produced by either magnetic or (as shown) electric deflection, which parts are so dimensioned that the travel time dispersions of ions in the two parts cancel out, the flight path is also symmetrical about a centre point 20, and parameters of the deflecting field are so selected that a stigmatic image is produced at the exit plane 18. In the spectrometer shown the centre point 20 lies on an intermediate image plane 21. Ions from a pulsed source 10 pass to a detector 14 through a sector condenser 12, the radius ro and sect or angle # of which are selected to produce the stigmatic image. In alternative embodiments (Figs. 2, 3, not shown) utilizing magnetic deflection, the intermediate image plane occurs in the straight ...

Time of flight mass analyser with spatial focussing

Dual mode mass spectrometer

Method of selecting ions

Time of flight mass analyser with spatial focussing

A time of flight mass analyser is disclosed comprising: a first pulsed ion accelerator 30 for accelerating an ion packet 42a in a first (Y-) dimension towards an ion detector 36 so that the ion packet spatially converges in the first dimension as it travels towards the detector; and a pulsed orthogonal accelerator 32 for accelerating the ion packet 42b in a second, orthogonal (X-) dimension into one of one or more ion mirrors 34. The ion detector is arranged to receive ions at a position where the ion packet 42c is smaller in the Y-dimension than when it was pulsed out of the first accelerator, and is preferably arranged at the focal point in the Y-direction of the accelerated ions. The TOF mass analyser may be a planar multi-reflecting TOF mass analyser (Fig. 4).

ELECTRIC SECTOR TIME-OF-FLIGHT TANDEM MASS SPECTROMETER

Electric sector time-of-flight mass spectrometer with adjustable ion optical elements

The invention provides apparatus and methods for performing time-of-flight (TOF) mass spectrometry. A TOF mass spectrometer of the present invention comprises one or more ion focusing electric sectors. At least one of the S electric sectors is associated with an ion optical element. The ion optical elements comprise at least one adjustable electrode, such that the adjustable electrode is able to modify the potential experienced by an ion entering or exiting the electric sector with which it is associated.

TIME-OF-FLIGHT MASS SPECTROMETER

Provided is a time-of-flight mass spectrometer including: a loop-orbit defining electrode (21) including an outer electrode (211) and inner electrode (212) located on the outside and inside of a loop orbit, respectively; an ion inlet (22); an ion outlet (23) provided in either the outer or inner electrode; a loop-flight voltage applier (28) configured to apply loop-flight voltages to the outer and inner electrodes, respectively; a set of deflecting electrodes (24) facing each other across a section of an n-th loop orbit, where n is a predetermined number, the deflecting electrodes including a first portion (241) which faces the n-th loop orbit and a second portion (242) which includes other portions; and a voltage applier (29) configured to apply deflecting voltages to the first portion so as to reverse the drifting direction of the ions flying in the n-th loop orbit, and a voltage to the second portion so as to create the loop-flight electric field.

Mass spectrometry method and devcie for implementing same

The invention relates to an electronic analytical technique for determining the composition and structure of substances and, more specifically, to the field of analyzers comprising at least one mass spectrometer, and can be used in medicine, biology, the oil and gas industry, metallurgy, power engineering, geochemistry, hydrology and ecology. The technical result is that of increasing the resolving power of the mass spectrometer and the sensitivity, accuracy and speed with which the composition and structure of substances are measured, while at the same time increasing the functional capabilities and reducing the geometric dimensions and the mass of substance analyzers. In the mass spectrometry method, an ion flux is generated and controlled using a single-flux, off-axis method; in parallel, using a multi-flux method; using a three-dimensional field with a middle meridian surface, including a reflecting three-dimensional type and a reflecting two-zone type, or using multiple reflection ...

Mass spectrometer

Ion guide array

An ion guide array is disclosed comprising a first ion guide section 1 and a second ion guide section 2 and optionally further ion guide sections. Each ion guide section 1,2 may comprise a plurality of electrodes having an aperture through which ions are transmitted in use. A transfer section is arranged at the exit of the first ion guide section 1 and ions are transmitted radially from the first ion guide section 1 into the second ion guide section 2. The electrodes 1 b,2b in the transfer section may have a radial aperture enabling ions to be transmitted radially from the first ion guide section 1 to the second ion guide section 2.

Mass analyser having extended flight path

ELECTRIC SECTOR TIME-OF-FLIGHT MASS SPECTROMETER WITH ADJUSTABLE ION OPTICAL ELEMENTS

The invention provides apparatus and methods for performing time-of-flight (TOF) mass spectrometry (200). A TOF mass spectrometer of the present invention comprises one or more ion focusing electric sectors (250, 350, 450 , and 550). . At least one of the electric sectors is associated with an ion optical element (266, 267). The ion optical elements (266, 267) comprise at least one adjustable electrode (260, 261), such that the adjustable electrod e (260, 261)is able to modify the potential experienced by an ion entering (70 ) or exiting (72) the electric sector (250, 350, 450, or 550) with which it is associated.

MASS SPECTROMETER

A mass spectrometer is disclosed comprising an ion guide (1) or ion mobil ity spectrometer having helical, toroidal, part- toroidal, hemitoroidal, sem itoroidal or spiral ion guiding region (4). The ion guide (1) may comprise a tube made from a leaky dielectric wherein an RF voltage is applied to outer electrodes in order to confine ions radially within the ion guide (1). A DC voltage is applied to a resistive inner layer in order to urge ions along t he ion guide (1). Alternatively, the ion guide may comprise a plurality of e lectrodes each having an aperture through which ions are transmitted.

MASS SPECTROMETER

A multi-turn Time of Flight mass analyser comprising a first electric sector, a second electric sector, one or more detector plates and a Fourier Transform analysis means. The second electric sector is arranged orthogonal to the first electric sector. Ions passing the one or more detector plates cause charge to be induced on to the one or more detector plates. The Fourier Transform analysis means determines the time of flight of ions per cycle or orbit of the mass analyser.

TIME-OF-FLIGHT MASS SPECTROMETER

ELECTRIC SECTOR TIME-OF-FLIGHT MASS SPECTROMETER WITH ADJUSTABLE ION OPTICAL ELEMENTS

The invention provides apparatus and methods for performing time-of-flight (TOF) mass spectrometry. A TOF mass spectrometer of the present invention comprises one or more ion focusing electric sectors. At least one of the electric sectors is associated with an ion optical element. The ion optical elements comprise at least one adjustable electrode, such that the adjustable electrode is able to modify the potential experienced by an ion entering or exiting the electric sector with which it is associated.

ELECTRIC SECTOR TIME-OF-FLIGHT MASS SPECTROMETER WITH ADJUSTABLE ION OPTICAL ELEMENTS

The invention provides apparatus and methods for performing time-of-flight (TOF) mass spectrometry (200). A TOF mass spectrometer of the present invention comprises one or more ion focusing electric sectors (250, 350, 450, and 550). . At least one of the electric sectors is associated with an ion optical element (266, 267). The ion optical elements (266, 267) comprise at least one adjustable electrode (260, 261), such that the adjustable electrode (260, 261)is able to modify the potential experienced by an ion entering (70) or exiting (72) the electric sector (250, 350, 450, or 550) with which it is associated.

СПОСОБ МАСС- СПЕКТРОМЕТРИИ И УСТРОЙСТВО ДЛЯ ЕГО ОСУЩЕСТВЛЕНИЯ

The invention relates to an electronic analytical technique for determining the composition and structure of substances and, more specifically, to the field of analyzers comprising at least one mass spectrometer, and can be used in medicine, biology, the oil and gas industry, metallurgy, power engineering, geochemistry, hydrology and ecology. The technical result is that of increasing the resolving power of the mass spectrometer and the sensitivity, accuracy and speed with which the composition and structure of substances are measured, while at the same time increasing the functional capabilities and reducing the geometric dimensions and the mass of substance analyzers. In the mass spectrometry method, an ion flux is generated and controlled using a single-flux, off-axis method; in parallel, using a multi-flux method; using a three-dimensional field with a middle meridian surface, including a reflecting three-dimensional type and a reflecting two-zone type, or using multiple reflection arrays. Embodiments of devices for implementing the method are proposed, as are principle ion optical systems which make it possible to produce different types of mass spectrometers with lower material consumption and smaller geometric dimensions.

Flight time based mass microscope system for ultra high-speed multi mode mass analysis

The present invention aims to provide a time-of-flight based mass microscope system for an ultra-high speed multi-mode mass analysis, for using a laser beam or an ion beam simultaneously to enable both a low molecular weight analysis such as for drugs/metabolome/lipids/peptides and a high molecular weight analysis such as for genes/proteins, without being limited by the molecular weight of the object being analyzed, and for significantly increasing the measuring speed by using a microscope method instead of a microprobe method.

Particle analyzer apparatus and method

A time-of-flight analyzer, such as a secondary ion surface analyzer, and method are disclosed wherein a beam of charged particles is created, magnified, directed along a path to a detector, detected and the time of flight measured. An emission lens is positioned on the path to produce the magnification and an additional lens can be provided along the path to produce variable magnification. A field aperture along the path limits the size of the image and a contrast diaphragm limits the lateral ion velocity. Two or more, preferably three, particle steering analyzers are sequentially positioned along the path from the emission lens to the detector with each of the three analyzers steering the particles through substantially 90 degrees.

TIME OF FLIGHT MASS SPECTROMETER

【課題】 周回軌道又は往復軌道を有する構成において質量精度を向上させる。 【解決手段】 同一質量数のイオンについて、周回軌道Ａを周回する周回数を飛行制御部５により変化させ、イオン検出器３による検出信号により飛行時間をそれぞれ測定する。周回数を変えたときの飛行時間の差は、イオンの運動エネルギーのばらつき、イオン出射系や測定系での時間的変動などの誤差要因が除去され、周回数の差に依存したものとなる。そこで、データ処理部６では、その飛行時間の差に基づいてイオン速度を算出し、その速度から質量数を算出する。それによって、質量数の算出精度が向上する。 【選択図】 図１

Identification of samples using a multi pass or multi reflection time of flight mass spectrometer

Mass spectrometry detector system and method of detection

Multi-channel detection

A mass spectrometer and method of mass spectrometry wherein charged particles in a beam undergo multiple changes of direction. A detection arrangement detects a first portion of the charged particle beam, and provides a first output based upon the intensity of the detected first portion of the charged particle beam. The detection arrangement detects a second portion of the charged particle beam that has travelled a greater path length through the mass spectrometer than the first portion of the charged particle beam, and provides a second output based upon the detected second portion of the charged particle beam. A controller adjusts the parameters of the charged particle beam and/or the detection arrangement, based upon the first output of the detection arrangement, so as to adjust the second output of the detection arrangement.

Orthogonal acceleration coaxial cylinder time of flight mass analyser

A TOF mass spectrometer with figure-of-eight flight path

A time-of-flight mass spectrometer comprising two cylindrical capacitors which each form a curved ion path, having the shape of a circular arc with an arc angle of (360/ ! 2){, between an inner plate 22/24 and an outer plate 21/23. A linear flight path region enclosed by an electrically conductive housing 25, is positioned between the cylindrical capacitors, wherein the capacitors and linear flight path region form a figure of eight flight path. Means are provided for generating a deflecting potential on the capacitor plates, and for generating a potential on said housing 25 which is different from the mid-potential between the capacitors. The linear ion beam paths between the cylindrical capacitors are extended virtually by a change in potential so as to cause a time focusing with respect to an initial energy spread.

A multi-turn time-of-flight mass analyzer comprising perpendicular electric sectors

A multiturn time of flight mass (TOF) spectrometer is disclosed comprising a first electric sector 5 and a second electric sector 8. The second electric sector 8 is arranged orthogonal to the first electric sector 5. Ions may make multiple loops, orbits or circuits of the mass analyser before being detected and mass analysed, enabling a high resolution mass analyser to be provided. According to another embodiment (see Figure 3) the mass analyzer may have an open-loop geometry wherein the first electric sector is elongated and further electric sectors are arranged in a staggered manner along the length of the first electric sector. The first and second electric sectors 5 and 8 may be sub-divided into a plurality of electric sector segments.

Compact very high resolution time-of-flight mass spectrometer

De-convolution of overlapping ion mobility spectrometer or separator data

Patent GB1302195A

1302195 Mass spectrometers SHELL INTERNATIONALE RESEARCH MAATSCHAPPIJ NV 14 Sept 1970 [15 Sept 1969] 45282/69 Heading H1D In a time-of-flight mass spectrometer ions travel from a source 1 to a collector 6 along paths 2, 3, 4, 5 that are partly straight and partly helical, the helical part being brought about by an electrostatic field between two coaxial cylinder electrodes of which one surrounds the other, the straight part 2, 3 or parts of the path entering into and/or starting from the space between the cylinder electrodes at a certain angle with the axis of these electrodes and without a radial component, and the length of a geometrical (and not necessarily orbital) helix about the said axis, which length is defined by the said angle and the length of the cylinder electrodes, being of the same order of magnitude as the straight path length. The combination of straight and helical paths produces time focusing i.e. reduction or elimination of differences in time-of-flight between ions of the same kind having relatively small differences in velocity. The said length of helix may be between 0À25 and 4 times the straight path length but is preferably approximately equal thereto. If, in addition, the helical path comprises two approximately equal parts with opposite senses of rotation, further improvement in time focusing is obtained, since the time-of-flight of an ion is rendered independent of small changes in the orbital radius. The cylinder electrodes are preferably arranged and provided with diaphragms, as described in Specification 1,302,194. An output signal from the collecting detector 6 is passed to an indicating and/or recording instrument 7.

Ion guide array

Mass analyser, mass spectrometer and associated methods

Mass spectrometry detector system and method of detection

Dual mode mass spectrometer

Improvements relating to Time-of-Flight mass analysers

A time-of-flight (TOF) mass spectrometer 30 has first and second electrodes (51a, 61a) defining part of an ion flight path therebetween. The first and/or second electrodes are thermally coupled with an inner surface of a vacuum chamber 20. One or more supports 120 that permits relative movement is arranged between the inner surface of the vacuum chamber and the first and/or second electrodes for reducing stress and friction on the components. A multi-reflection TOF mass analyser is disclosed wherein one or more connectors (160, 170) is connected between the first and second electrodes. The length and material of the connector and the positions of connection points are selected to compensate for the shifts in mass to charge ratio per Kelvin change in temperature in the electrodes caused by thermal expansion or contraction. An apparatus for out-gassing to remove contamination from surfaces within a vacuum chamber (e.g. bake out) is also disclosed, comprising a heater, one or more cooling ...

MASS SPECTROMETRY DETECTOR SYSTEM AND METHOD OF DETECTION

Methods and analyzers useful for time of flight mass spectrometry are provided. A method of determining properties of ions within a time of flight or electrostatic trap mass analyzer comprises the steps of: injecting ions into the mass analyzer; causing the ions to follow a portion of a main flight path within the mass analyzer, the main flight path comprising multiple changes of direction; applying a beam deflection to deflect at least some of the ions from the main flight path so that they impinge upon a detection surface located within the mass analyzer, the detection surface comprising part of an active field-sustaining electrode of the mass analyzer; measuring a quantity representative of the charge arriving at the detection surface caused by the impinging ions; determining, from the deflection applied, properties of a trajectory upon which the ions were travelling immediately prior to deflection, and/or determining, from the quantity measured, a value representative of the number ...

MULTI-CHANNEL DETECTION

A mass spectrometer and method of mass spectrometry wherein charged particles in a beam undergo multiple changes of direction. A detection arrangement detects a first portion of the charged particle beam, and provides a first output based upon the intensity of the detected first portion of the charged particle beam. The detection arrangement detects a second portion of the charged particle beam that has travelled a greater path length through the mass spectrometer than the first portion of the charged particle beam, and provides a second output based upon the detected second portion of the charged particle beam. A controller adjusts the parameters of the charged particle beam and/or the detection arrangement, based upon the first output of the detection arrangement, so as to adjust the second output of the detection arrangement.

MASS SPECTROMETRY AND MASS SPECTROMETRY SYSTEM

Measurement is performed in a no-passing mode in which orbiting on orbit is not allowed to obtain a flight time spectrum in which passing of ions with different mass does not occur (S1, S2). From information including flight time etc. of peak appearing in the flight time spectrum (S3), the orbit count and flight time in an orbiting mode are predicted, and on the basis of the prediction, a segment is set which has a duration taking into account widening of duration of the peak on the flight time spectrum in the orbiting mode. The orbit count in one segment is the same whereby it is possible to determine the orbit count and mass of each peak uniquely when a plurality of segments are not overlapped. Therefore, determination is performed for overlap of segment set on the flight time spectrum in the orbiting mode in which a prescribed condition is supposed to find a condition that does not generate overlap for fixing segment (S4 to S6). Accordingly, switching timing of an emitting switch that ...

Tandem Time-of-Flight Mass Spectrometer

A tandem time-of-flight (TOF) mass spectrometer is offered whose first mass analyzer is a TOF mass spectrometer having a flight distance smaller than the flight distance sufficient to impart a desired mass resolution to the first mass analyzer. When a mass spectrum is measured with the first mass analyzer, a reflectron field is activated. When precursor ions are selected by the first mass analyzer, the reflectron field is deactivated to permit ions to pass through without being reflected.

SYSTEM AND METHODOLOGY FOR EXPRESSING ION PATH IN A TIME-OF-FLIGHT MASS SPECTROMETER

A system for expressing an ion path in a time-of-flight (TOF) mass spectrometer. The present invention uses two successive curved sectors, with the second one reversed, to form S-shaped configuration such that an output ion beam is parallel to an input ion beam, such that the ions makes two identical but opposed turns, and such that the geometry of the entire system folds into a very compact volume. Geometry of a TOF mass spectrometer system in accordance with embodiments of the present invention further includes straight drift regions positioned before and after the S-shaped configuration and, optionally, a short straight region positioned between the two curved sectors with total length equal to about the length of the central arc of both curved sectors.

MASS SPECTROMETER

An ion optical system to form a loop orbit is provided to sufficiently ensure required performance such as ion transmission efficiency while making it easy to design the system by alleviating a space-focusing condition. The loop orbit of the ion optical system is realized so as to satisfy (t|x)=(t|alpha)=(t|delta)=0 as the time-focusing condition and to satisfy -2<(x|x)+(alpha|alpha)<2, and -2<(y|y)+(beta|beta)<2 as the space-focusing condition. (x|x) and other similar terms are constants determined by the elements indicated in the parenthesis in a general expression format of the ion optical system. The conditions are substantially alleviated as opposed to the conventional space-focusing condition where each of (x|x), (alpha|alpha), (y|y) and (beta|beta) needs to be ±1. Thus, the parameters to decide the shape of electrodes by which the ion optical system is configured have higher degree of freedom.

МНОГОКАНАЛЬНАЯ РЕГИСТРАЦИЯ

... 1. Масс-спектрометр, содержащий ! систему электродов для вынуждения заряженных частиц в пучке подвергаться множественным изменениям направления; ! регистрирующую установку, выполненную с возможностью регистрации первой части пучка заряженных частиц, который проходит по первому отрезку траектории через масс-спектрометр, и обеспечения первого выходного сигнала на основе интенсивности зарегистрированной первой части пучка заряженных частиц, при этом регистрирующая установка дополнительно выполнена с возможностью регистрации второй части пучка заряженных частиц, которая проходит по второму отрезку траектории через масс-спектрометр, причем второй отрезок траектории превышает первый отрезок траектории, и обеспечения второго выходного сигнала на основе зарегистрированной второй части пучка заряженных частиц; и ! контроллер, выполненный с возможностью регулировки параметров пучка заряженных частиц и(или) регистрирующей установки, на основе первого выходного сигнала регистрирующей установки, чтобы ...

Ion guide array

A ion mobility spectrometer is disclosed comprising an ion guide array having first and second ion guide sections 1 and 2 and optionally further ion guide sections. Each ion guide section 1,2 comprise a plurality of electrodes having an aperture through which a first and second plurality of ions are transmitted in use. A transfer section is arranged between first and second ion guide sections 1 and 2 and ions are transmitted radially therebetween. The electrodes 1b, 2b in the transfer section may have a radial aperture enabling ions to be transmitted radially therebetween. First and second transient DC voltages means are used to apply first and second transient voltages/waveforms to at least some of the electrodes of the first and second ion guide sections in order to propel at least some of the first or second plurality of ions along at least 5%, 10%, 15%, 20%, 25%, 30%, 35%, 40%, 45%, 50%, 55%, 60%, 65%, 70%, 75%, 80%, 85%, 90%, 95% or 100% of the length of the first and second ion guide ...

Orthogonal acceleration coaxial cylinder time of flight mass analyser

A time of flight (TOF) mass analyzer is disclosed comprising an annular ion guide having a longitudinal axis and comprising a first annular ion guide section and a second annular ion guide section. Ions are introduced into the first annular ion guide section so that the ions form stable circular orbits therein about the longitudinal axis. The ions are then orthogonally accelerated in a first axial direction into the second annular ion guide section in such a manner that time of flight dispersion of the ions occurs only in the longitudinal direction and ions are spatially focused to an isochronous plane which is substantially perpendicular to said longitudinal axis. An axial DC potential is also maintained along at least a portion of the second annular ion guide section so that the ions are reflected back through the ion guide, the ions undergoing multiple axial passes through the second annular ion guide section before being detected by an ion detector located at said isochronous plane.

Mass spectrometer

Ion guide array with radial transmission

An ion guide array is disclosed comprising a first ion guide section 1 and a second ion guide section 2 and optionally further ion guide sections. Each ion guide section 1,2 may comprise a plurality of electrodes having an aperture through which ions are transmitted in use or a multipole arrangement or other know ion restricting means. A transfer section is arranged at the exit of the first ion guide section 1 and ions are transmitted radially from the first ion guide section 1 into the second ion guide section 2. The electrodes 1 b,2b in the transfer section may have a radial aperture enabling ions to be transmitted radially from the first ion guide section 1 to the second ion guide section 2.

Mass Spectrometer

Mass spectrometry method and devcie for implementing same

Method and apparatus for identification of samples field of the invention

Multi-functional ion mobility separator

An ion mobility separator comprises a plurality of closed-loop ion guides (1a, 1b, 1c…) that are interconnected, e.g. using one or more interconnecting ion guides 3, such that ions can travel between and around the closed loop ion guides. The interconnecting ion guide may intersect each closed-loop ion guide at a respective transfer region 4. Each transfer region may be controlled to (i) divert ions received from an interconnecting ion guide to travel around the closed-loop ion guide; (ii) divert ions out from the closed-loop ion guide and along an interconnecting ion guide, or (iii) allow ions received from an interconnecting ion guide to pass through without being diverted around the closed-loop ion guide. Each transfer region may operate in different modes at different times, such that different ions have different paths through the separator. Ions may be separated according to their mobilities and/or fragmented or reacted when they travel around the closed loop ion guides. A mass spectrometer ...

Ion entry/exit device

ION GUIDANCE ARRAY

ION GUIDE ARRAY

An ion guide array is disclosed comprising a first ion guide section (1) and a second ion guide section (2) and optionally further ion guide sections. Each ion guide section (1, 2) may comprise a plurality of electrodes having an aperture through which ions are transmitted in use. A transfer section is arranged at the exit of the first ion guide section (1) and ions are transmitted radially from the first ion guide section (1) into the second ion guide section (2). The electrodes (1b, 2b) in the transfer section may have a radial aperture enabling ions to be transmitted radially from the first ion guide section (1) to the second ion guide section (2).

MASS SPECTROMETRY DETECTOR SYSTEM AND METHOD OF DETECTION

Methods and analyzers useful for time of flight mass spectrometry are provided. A method of determining properties of ions within a time of flight or electrostatic trap mass analyzer comprises the steps of: injecting ions into the mass analyzer; causing the ions to follow a portion of a main flight path within the mass analyzer, the main flight path comprising multiple changes of direction; applying a beam deflection to deflect at least some of the ions from the main flight path so that they impinge upon a detection surface located within the mass analyzer, the detection surface comprising part of an active field-sustaining electrode of the mass analyzer; measuring a quantity representative of the charge arriving at the detection surface caused by the impinging ions; determining, from the deflection applied, properties of a trajectory upon which the ions were travelling immediately prior to deflection, and/or determining, from the quantity measured, a value representative of the number ...

TIME-OF-FLIGHT MASS SPECTROMETER

APPARATUS AND METHODS FOR ANALYZING IONS

An apparatus (10) for separating Ions based on ion mobility includes a conduit (12) defining a closed path. The conduit is configured such that a uniform electric field is produced about the closed path upon application of a voltage causing ions within the conduit (12) to move about the closed path and to separate the ions based upon ion mobility. A method of separating a plurality of ions is also disclosed.

Electric sector time-of-flight mass spectrometer with adjustable ion optical elements

The invention provides apparatus and methods for performing time-of-flight (TOF) mass spectrometry. A TOF mass spectrometer of the present invention comprises one or more ion focusing electric sectors. At least one of the S electric sectors is associated with an ion optical element. The ion optical elements comprise at least one adjustable electrode, such that the adjustable electrode is able to modify the potential experienced by an ion entering or exiting the electric sector with which it is associated.

Time of flight mass spectrometer

The present invention relates to a time of flight mass spectrometer (TOFMS) having a flight space in which ions to be analyzed repeatedly fly in a loop orbit or reciprocal path. In an example of the present invention, the TOFMS carries out two rounds of measurement for one sample under two conditions differing in the effective flight distance of the ions to create two flight time spectrums. The data processor of the TOFMS compares the central points of the peaks in the two spectrums to identify peaks that have resulted from the same kind of ion (Step S 3 ). If any peak is found to be unidentifiable (“No” in Step S 4 ), the data processor examines the similarity of the peak shapes (e.g. half-value width) to identify peaks that have resulted from the same kind of ion (Step S 5 ). After the correspondence of all the peaks have been determined, the data processor calculates the approximate mass to charge ratio of each ion from the difference in flight time (Step S 6 ) and determines the number of turns of the ion based on the approximation (Step S 7 ). Finally, it calculates the exact mass to charge ratio, using the number of turns and the flight time (Step S 8 ). Thus, even if the sample contains many components and the spectrums accordingly have many peaks mixed together, the TOFMS can identify all the peaks.

Instrument and method for tandem time-of-flight mass spectrometry

A novel instrument and method for TOF/TOF mass spectrometry is offered. A spiral trajectory time-of-flight mass spectrometer satisfies the spatial focusing conditions for the direction of flight and a direction orthogonal to the direction of flight whenever ions make a turn in the spiral trajectory. An ion gate for selecting precursor ions is placed in the spiral trajectory of the spiral trajectory time-of-flight mass spectrometer. Electric sectors are placed downstream of the ion gate.

Mass spectrometer

In the mass spectrometer of the present invention, a flight space is provided before the mass analyzer, and the flight space includes a loop orbit on which ions fly repeatedly. While ions fly on the loop orbit repeatedly, ion selecting electrodes placed on the loop orbit selects object ions having a specific mass to charge ratio in such a manner that, for a limited time period when the object ions are flying through the ion selecting electrodes, an appropriate voltage is applied to the ion selecting electrodes to make them continue to fly on the loop orbit, but otherwise to make or let other ions deflect from the loop orbit. If ions having various mass to charge ratios are introduced in the loop orbit almost at the same time, the object ions having the same mass to charge ratio continue to fly on the loop orbit in a band, but ions having mass to charge ratios different from that are separated from the object ions while flying on the loop orbit repeatedly. Even if the difference in the mass ...

Ion guide within pulsed converters

Elongation of orthogonal accelerators is assisted by ion spatial transverse confinement within novel confinement means, formed by spatial alternation of electrostatic quadrupolar field (22). Contrary to prior art RF confinement means, the static means provide mass independent confinement and may be readily switched. Spatial confinement defines ion beam (29) position, prevents surfaces charging, assists forming wedge and bend fields, and allows axial fields in the region of pulsed ion extraction, this way improving the ion beam admission at higher energies and the spatial focusing of ion packets in multi-reflecting, multi-turn and singly reflecting TOF MS or electrostatic traps.

COMPACT LASER ION SOURCE APPARATUS AND METHOD

An apparatus for and a method of analyzing a sample. A laser section may include a laser arranged to direct a laser beam in a first direction towards the sample. The laser beam ablating and ionizing at least a portion of the sample to generate ions. An ion source section may include a sample holder for holding the sample. At least one component is arranged to apply an electric field for extracting at least a portion of the ions to form an ion beam traveling in a second direction. A time-of-flight section may include a detector arranged to receive the ion beam.

Atmosphärendruck-Ionenquellen-Schnittstelle

Eine Schnittstelle ist vorgesehen, um Ionen in einem Trägergas von einer Atmosphärendruck-Ionenquelle an einem Spektrometer zu empfangen. Das Spektrometer ist konfiguriert, um die empfangenen Ionen bei einem niedrigeren Druck zu analysieren. Die Schnittstelle umfasst: eine Schnittstellenvakuumkammer, die eine nachgeschaltete Öffnung aufweist; eine Trägeranordnung, die eine Axialbohrung definiert, die so angeordnet ist, dass sich ein entfernbares Kapillarröhrchen durch diese erstreckt, wobei Ionen von der Atmosphärendruck-Ionenquelle durch das Kapillarröhrchen empfangen und in Richtung der nachgeschalteten Öffnung gelenkt werden; und einen Strahlstörer, der nachgeschaltet von der Axialbohrung positioniert und konfiguriert ist, um den Gasfluss zwischen der Axialbohrung und der nachgeschalteten Öffnung nur dann zu unterbrechen, wenn das Kapillarröhrchen nicht vollständig durch die Axialbohrung eingeführt ist.

Mass spectrometer

Orthogonal acceleration coaxial cylinder time of flight mass analyser

A time of flight (TOF) mass analyzer is disclosed comprising an annular ion guide having a longitudinal axis and comprising a first annular ion guide section and a second annular ion guide section. Ions are introduced into the first annular ion guide section so that the ions form substantially stable circular orbits within the first annular ion guide section about the longitudinal axis. The ions are then orthogonally accelerated from the first annular ion guide section into the second annular ion guide section, preferably in such a manner that time of flight dispersion of the ions occurs only in a longitudinal direction and ions are spatially focused to an isochronous plane which is substantially perpendicular to said longitudinal axis. An ion detector is disposed within the annular ion guide and has an ion detecting surface arranged in a plane which is substantially perpendicular to the longitudinal axis, preferably at said isochronous plane.

Mass spectrometer

Multi-functional ion mobility separator

Orthogonal acceleration coaxial cylinder time of flight mass analyser

A METHOD OF MASS-SPECTROMETRY AND A DEVICE FOR ITS REALIZATION

The invention relates to an electronic analytical technique for determining the composition and structure of substances and, more specifically, to the field of analyzers comprising at least one mass spectrometer, and can be used in medicine, biology, the oil and gas industry, metallurgy, power engineering, geochemistry, hydrology and ecology. The technical result is that of increasing the resolving power of the mass spectrometer and the sensitivity, accuracy and speed with which the composition and structure of substances are measured, while at the same time increasing the functional capabilities and reducing the geometric dimensions and the mass of substance analyzers. In the mass spectrometry method, an ion flux is generated and controlled using a single-flux, off-axis method; in parallel, using a multi-flux method; using a three-dimensional field with a middle meridian surface, including a reflecting three-dimensional type and a reflecting two-zone type, or using multiple reflection ...

MASS SPECTROMETER

A multi-turn Time of Plight mass analyser is disclosed comprising a first electric sector (5) and a second electric sector (8). The second electric sector (8) is arranged orthogonal to the first electric sector (5). Ions may make multiple loops or circuits of the mass analyser before being detected and mass analysed enabling a high resolution mass analyser to be provided. According to another embodiment the mass analyser may have an open-loop geometry wherein the first electric sector is elongated and further electric sectors are arranged in a staggered manner along the length of the first electric sector. The first and second electric sectors (5,8) may be sub-divided into a plurality of electric sector segments.

MASS SPECTROMETER

APPARATUS AND METHODS FOR ANALYZING IONS

An apparatus (10) for separating Ions based on ion mobility includes a conduit (12) defining a closed path. The conduit is configured such that a uniform electric field is produced about the closed path upon application of a voltage causing ions within the conduit (12) to move about the closed path and to separate the ions based upon ion mobility. A method of separating a plurality of ions is also disclosed.

Mass analyser and method of mass analysis

An electrostatic ion trap for mass analysis includes a first array of electrodes and a second array of electrodes, spaced from the first array of electrode. The first and second arrays of electrodes may be planar arrays formed by parallel strip electrodes or by concentric, circular or part-circular electrically conductive rings. The electrodes of the arrays are supplied with substantially the same pattern of voltage whereby the distribution of electrical potential in the space between the arrays is such as to reflect ions isochronously in a flight direction causing them to undergo periodic, oscillatory motion in the space, focused substantially mid-way between the arrays. Amplifier circuitry is used to detect image current having frequency components related to the mass-to-charge ratio of ions undergoing the periodic, oscillatory motion.

Electric sector time-of-flight mass spectrometer with adjustable ion optical elements

The invention provides apparatus and methods for performing time-of-flight (TOF) mass spectrometry. A TOF mass spectrometer of the present invention comprises one or more ion focusing electric sectors. At least one of the electric sectors is associated with an ion optical element. The ion optical elements comprise at least one adjustable electrode, such that the adjustable electrode is able to modify the potential experienced by an ion entering or exiting the electric sector with which it is associated.

TIME-OF-FLIGHT TYPE MASS SPECTROMETER

【課題】 出射軌道の飛行距離を変化させて２回の測定を行っても、試料成分が多数ある場合には飛行時間スペクトル上でピークが混在して同一種イオン由来のピークの判別が困難になる。 【解決手段】 データ処理部では、分析条件を変えて実行した２回の測定による飛行時間スペクトル上のピークの中心時間を比較して同一種イオン由来のピークを探す（Ｓ３）。その処理で判別不能なピークが存在した場合には（Ｓ４でＮ）、今度はピーク形状（例えばピーク半値幅）の類似性により同一種イオン由来のピークを探す（Ｓ５）。そして、全てのピークの対応関係が明確になったならば、飛行時間の差から各イオンの質量数を概算し（Ｓ６）、その概算値により周回軌道の周回数を確定する（Ｓ７）。その後に、周回数と飛行時間とから正確な質量数を求める（Ｓ８）。 【選択図】 図７

Tandem time-of-flight mass spectrometer for quantitative and qualitative analysis of traces of compounds and also for structural analysis of sample ions, comprises detector for detecting ions

The tandem time-of-flight mass spectrometer comprises a time-of-flight mass spectrometer (TOF-MS) with a spiral flight path and another reflectron-type TOF-MS for analyzing masses of the fragmented ions. A detector (20) is provided for detecting the ions, which passes through the latter TOF-MS. The former TOF-MS with each circulation of the ions on the spiral flight path satisfies spatial focusing conditions concerning a flight direction and a level standing perpendicularly to the flight direction. An ion gate (16) is arranged on the spiral flight path of the former TOF-MS. An independent claim is also included for a method for tandem time-of-flight mass spectrometry.

Method of selecting ions

Atmospheric pressure ion source interface

METHOD AND APPARATUS FOR IDENTIFICATION OF SAMPLES

A multi reflection time of flight (MRTOF) mass spectrometer (12) And method for identifying a sample is disclosed. Sample ions are generated at an ion source (15). The MRTOF is a closed mirror arrangement with first and second opposed ion mirrors (20, 20) on an axis of reflection (XX). The MRTOF (12) also includes a bidirectional ion deflector (50) on that axis (XX). The deflector (50) deflects ions onto the reflection axis as a short pulse at time to where they oscillate multiple times, separating in time of flight according to ion m/z. At a later time t, ions travelling in both directions along the axis (XX) are ejected out of the MRTOF (12) by the bidirectional deflector (50) to an ion detector arrangement (55). The separation of ions in time of flight allows a fingerprint of a biological sample to be produced by the detector arrangement (55) without the need to assign a mass to each peak. Comparison with a library of fingerprints permits identification.

Compact very high resolution time-of flight mass spectrometer

The invention relates to a compact time-of-flight mass spectrometer which enables very accurate mass determinations. The invention consists of a method of producing a high resolution by means of a long flight path, where the ion beam repeatedly sweeps a figure of eight in two opposed cylindrical capacitors, each of 254.56°, and the linear ion beam paths between the cylindrical capacitors are extended virtually by a change in potential so as to cause a time focusing with respect to an initial energy spread.

Multiturn time-of-flight mass spectrometer and method for producing the same

To compensate for the distortion of the loop-flight electric field with a higher level of accuracy, a multiturn time-of-flight mass spectrometer 1 includes: a main electrode 21 configured to generate, within a predetermined loop-flight space, a loop-flight electric field which is an electric field that makes an ion fly in a loop orbit multiple times, the main electrode having an opening 24 or 25 through which ions are introduced into or extracted from the loop-flight space; a compensating-electrode attachment part 23 made of an insulating material and fixed to the main electrode; and a compensating electrode 22 configured to compensate for a distortion of the loop-flight electric field which occurs in the vicinity of the opening, the compensating electrode being fixed to the compensating-electrode attachment part directly or via a substrate 221 and located in the vicinity of the opening.

Mass spectrometry method and device for implementing same

Method for separating ions according to a physicochemical property

An ion mirror, an ion mirror assembly and an ion trap

An ion mirror 10 for use in a time of flight mass spectrometer 100 comprises a first 5 electrode 20 for producing a quadratic field along a first axis 80, and a second electrode 30 for producing a quadratic field along a second axis 90, the axes 80, 90 being orthogonal. Alternatively, a series of discrete parallel plane electrodes may be used to generate the necessary hyperbolic field. Ions incident on a slit in a grounded entrance plate are reflected by the potential field and exit either through another slit or the same slit (figure 3). An alternating voltage is applied to the electrodes that increase the path length of ions in the reflector and thereby increases the resolution of the spectrometer without increasing its size. An ion trap comprising magnetic field confinement arrangement at either end of a quadropole electrode arrangement is also disclosed (figures 11-13).

Mass spectrometer

Ion entry/exit device

A multi-turn time-of-flight mass analyser comprising perpendicular electric sectors

A multiturn closed loop time of flight (TOF) mass spectrometer is disclosed comprising a first electric sector 5 and a second electric sector 8. The second electric sector 8 is arranged orthogonal to the first electric sector 5. In addition, ion optical devices 7, 9, 12, 13 provide focusing in a first (y) direction, while ion optical devices 6, 10, 11, 14 provide focusing in a second orthogonal (x) direction. Ions may make multiple loops, orbits or circuits of the mass analyzer before being detected, enabling a high resolution mass analyser to be provided. According to another embodiment (see Figure 3) the mass analyzer may have an open-loop geometry wherein the first electric sector is elongated and further electric sectors are arranged in a staggered manner along the length of the first electric sector.

Multi-channel detection

Orthogonal acceleration coaxial cylinder time of flight mass analyser

Time of flight mass analyser with spatial focussing

MASS SPECTROMETER

A multi-turn Time of Flight mass analyser comprising a first electric sector, a second electric sector, one or more detector plates and a Fourier Transform analysis means. The second electric sector is arranged orthogonal to the first electric sector. Ions passing the one or more detector plates cause charge to be induced on to the one or more detector plates. The Fourier Transform analysis means determines the time of flight of ions per cycle or orbit of the mass analyser.

Multi-Channel Detection

A mass spectrometer and method of mass spectrometry wherein charged particles in a beam undergo multiple changes of direction. A detection arrangement detects a first portion of the charged particle beam, and provides a first output based upon the intensity of the detected first portion of the charged particle beam. The detection arrangement detects a second portion of the charged particle beam that has traveled a greater path length through the mass spectrometer than the first portion of the charged particle beam, and provides a second output based upon the detected second portion of the charged particle beam. A controller adjusts the parameters of the charged particle beam and/or the detection arrangement, based upon the first output of the detection arrangement, so as to adjust the second output of the detection arrangement.

Method of mass-spectrometry and a device for its realization

The present invention relates to the analytical electronics used to identify compositions and structures of substances, in particular, to the analyzers comprising at least one mass-spectrometer (MS) and may be applied in such fields as medicine, biology, gas and oil industry, metallurgy, energy, geochemistry, hydrology, ecology. Technical result provides the increase in MS resolution, gain in sensitivity, precision and measurement rates of substances compositions and structures concurrently with enhancement of analyzer functional capabilities, downsizing and mass reduction. In claimed invention the ion flux generation and its guiding are performed in off-axis single-flow mode; parallel multi-stage mode; through use of three-dimensional field with mean meridian surface including without limitation three-dimensional reflecting and dual-zoned reflecting modes or by method of multi-reflection arrays. Devices to implement the claimed method are embodied. Proposed schematic ion optical diagrams allow developing different MS types notable for their minimized material intensity and geometrical dimensions.

MASS SPECTROMETER

For a sample containing a target component, a product-ion scan measurement in which the m/z value of a known ion originating from the compound is designated as a precursor ion is performed in a measurement unit () to acquire profile spectrum data. A peak detector () in a data processing unit (A) detects peaks on the profile spectrum. For each detected peak, a product-ion m/z-value acquirer () acquires an m/z value corresponding to the maximum intensity as the m/z value of a product ion. A pseudo MRM measurement data extractor () adopts the m/z value of the precursor ion and that of the product ion as an MRM transition, extracts the maximum intensity of the peak originating from the product ion as the signal intensity value on that MRM transition, and stores these data as pseudo MRM measurement data in a memory section (). Thus, quantitative information which reflects the concentration of the target compound can be obtained by a simple product-ion scan measurement without performing an MRM measurement. 1. A mass spectrometer including a front mass separator and a rear mass separator between which a collision cell for dissociating an ion is located , the mass spectrometer further comprising:a) a product-ion scan measurement execution controller for controlling each of the front mass separator, the rear mass separator and the collision cell so as to acquire a profile spectrum over a predetermined mass-to-charge-ratio range by executing a product-ion scan measurement in which a known ion originating from a target compound in a sample is designated as a precursor ion;b) a peak detector for detecting a peak according to a predetermined criterion on the profile spectrum or on a centroid spectrum derived from the profile spectrum;c) a product-ion mass-to-charge-ratio value determiner for determining a mass-to-charge-ratio value of a product ion to be combined with a mass-to-charge-ratio value of the precursor ion and be treated as an MRM transition, based on one or more ...

MASS ANALYSER

A mass analyser for use in a mass spectrometer, the mass analyser having: a set of sector electrodes spatially arranged to provide an electrostatic field in a 2D reference plane suitable for guiding ions along an orbit in the 2D reference plane, wherein the set of sector electrodes extend along a drift path that is locally orthogonal to the reference plane so that, in use, the set of sector electrodes provide a 3D electrostatic field region; and an injection interface configured to inject ions into the mass analyser via an injection opening such that the ions injected into the mass analyser are guided by the 3D electrostatic field region along a 3D reference trajectory according to which ions perform multiple turns within the mass analyser whilst drifting along the drift path, wherein each turn corresponds to a completed orbit in the 2D reference plane. The injection interface includes at least one injection deflector located within the mass analyser, the at least one injection deflector being configured to deflect ions injected into the mass analyser in the direction of the drift path, wherein the injection interface is preferably configured so that ions guided along the 3D reference trajectory are, after injection into the mass analyser, kept adequately distant from the injection opening such that they are substantially unaffected by electric field distortions around the injection opening. 1. A mass analyser for use in a mass spectrometer , the mass analyser having:a set of sector electrodes spatially arranged to provide an electrostatic field in a 2D reference plane suitable for guiding ions along an orbit in the 2D reference plane, wherein the set of sector electrodes extend along a drift path that is locally orthogonal to the reference plane so that, in use, the set of sector electrodes provide a 3D electrostatic field region; andan injection interface configured to inject ions into the mass analyser via an injection opening such that the ions injected into the ...

AN ION MIRROR, AN ION MIRROR ASSEMBLY AND AN ION TRAP

An ion mirror () for use in a time of flight mass spectrometer () comprises a first conductor () for producing a quadratic field along a first axis (), and a second conductor () for producing a quadratic field along a second axis (), the axes () being orthogonal. 1. An ion mirror comprising:a first means for producing a quadratic field along a first axis;a second means for producing a quadratic field along a second axis, the axes being orthogonal; anda front plate defining an entry aperture for admission of ions, wherein the first means and the second means are arranged to generate a quadratic field along a first axis and a quadratic field along a second axis by application of a first potential at the first means and a second potential at the second means, wherein the first potential and the second potential are concurrently alternately and oppositely biased, thereby to define a plane of zero field in between the first means and the second means, the entry aperture lying in the plane of zero field.2. The ion mirror as claimed in claim 1 , wherein at least one of the first and second means is arranged to produce a hyberbolic electric field.3. The ion mirror as claimed in claim 1 , wherein the front plate includes an exit aperture in the plane of zero field between the first and second means and displaced from the entry aperture.4. The ion mirror as claimed in claim 1 , wherein the first means comprises a series of discrete electrodes.5. The ion mirror as claimed in claim 4 , wherein the series of discrete electrodes comprises a capacitive divider that is configurable to apportion different potentials to different ones of the discrete electrodes in the series of discrete electrodes.6. The ion mirror as claimed in claim 5 , wherein the capacitive divider is arranged such that the capacitance of each of the discrete electrodes increases linearly across the series of discrete electrodes from one discrete electrode to the next.7. The ion mirror as claimed in claim 4 , ...

Orthogonal Acceleration Coaxial Cylinder Time of Flight Mass Analyser

A Time of Flight mass analyser is disclosed comprising an annular ion guide having a longitudinal axis and comprising a first annular ion guide section and a second annular ion guide section. Ions are introduced into the first annular ion guide section so that the ions form substantially stable circular orbits within the first annular ion guide section about the longitudinal axis. An ion detector is disposed within the annular ion guide. Ions are orthogonally accelerated in a first axial direction from the first annular ion guide section into the second annular ion guide section. An axial DC potential is maintained along at least a portion of the second annular ion guide section so that the ions are reflected in a second axial direction which is substantially opposed to the first axial direction. The ions undergo multiple axial passes through the second annular ion guide section before being detected by the ion detector. 1. A Time of Flight mass analyser comprising:an annular ion guide having a longitudinal axis;a first device arranged and adapted to introduce ions into said annular ion guide, wherein an electric field is applied to the annular ion guide so that said ions form substantially stable circular orbits within said annular ion guide about said longitudinal axis;an ion detector disposed within said annular ion guide;a second device arranged and adapted to orthogonally accelerate ions in a first axial direction from said substantially stable circular orbits within said annular ion guide such that ions follow substantially spiral paths as they pass through said annular ion guide; anda third device arranged and adapted to maintain an axial DC potential along at least a portion of said annular ion guide so that said ions are reflected in a second axial direction which is substantially opposed to said first axial direction and so that said ions undergo multiple axial passes through said annular ion guide before being detected by said ion detector.2. (canceled)3. ...

SYSTEM AND METHODOLOGY FOR EXPRESSING ION PATH IN A TIME-OF-FLIGHT MASS SPECTROMETER

A system for expressing an ion path in a time-of-flight (TOF) mass spectrometer. The present invention uses two successive curved sectors, with the second one reversed, to form S-shaped configuration such that an output ion beam is parallel to an input ion beam, such that the ions makes two identical but opposed turns, and such that the geometry of the entire system folds into a very compact volume. Geometry of a TOF mass spectrometer system in accordance with embodiments of the present invention further includes straight drift regions positioned before and after the S-shaped configuration and, optionally, a short straight region positioned between the two curved sectors with total length equal to about the length of the central arc of both curved sectors. 1. A system for expressing an ion path in a time-of-flight mass spectrometer , comprising:a first straight sector defining a first straight ion flight path, said first straight sector having a first sector entrance and a first sector outlet,wherein the first sector entrance is positioned to receive a plurality of ions along the first straight ion flight path;a first electric sector defining a first curved ion flight path, said first electric sector having a first electric sector entrance and a first electric sector outlet,wherein the first electric sector entrance is positioned opposing the first straight sector outlet and to receive the plurality of ions from the first straight sector outlet along the first curved ion flight path; anda second electric sector defining a second curved ion flight path, said second electric sector having a second electric sector entrance and a second electric sector outlet,wherein the second electric sector entrance is positioned opposing the first electric sector outlet and to receive the plurality of ions exiting from the first electric sector outlet along the second curved ion flight path.2. The system according to claim 1 , further comprising:a second straight sector defining a ...

Ion Entry/Exit Device

A method of introducing and ejecting ions from an ion entry/exit device () is disclosed. The ion entry/exit device () has at least two arrays of electrodes (). The device is operated in a first mode wherein DC potentials are successively applied to successive electrodes of at least one of the electrode arrays (() in a first direction such that a potential barrier moves along the at least one array in the first direction and drives ions into and/or out of the device in the first direction. The device is also operated in a second mode, wherein DC potentials are successively applied to successive electrodes of at least one of the electrode arrays () in a second, different direction such that a potential barrier moves along the array in the second direction and drives ions into and/or out of the device in the second direction. The device provides a single, relatively simple device for manipulating ions in multiple directions. For example, the device may be used to load ions into or eject ions from an ion mobility separator in a first direction, and may then be used to cause ions to move through the ion mobility separator in the second direction so as to cause the ions to separate. 127-. (canceled)28. An ion entry/exit device for an ion guide , comprising:at least one array of electrodes, wherein each array of electrodes comprises electrodes arranged in rows and columns; andat least one DC voltage supply;wherein said at least one DC voltage supply is configured to successively apply DC potentials to successive rows of electrodes of the at least one array of electrodes.29. The device of claim 28 , wherein said at least one DC voltage supply is configured to successively apply DC potentials to successive columns of electrodes of the at least one array of electrodes.30. The device of claim 28 , wherein said at least one array of electrodes is at least two arrays of electrodes arranged parallel to each other.31. The device of claim 28 , wherein said at least one DC voltage ...

SYSTEM AND METHODOLOGY FOR EXPRESSING ION PATH IN A TIME-OF-FLIGHT MASS SPECTROMETER

A system for expressing an ion path in a time-of-flight (TOF) mass spectrometer. The present invention uses two successive curved sectors, with the second one reversed, to form S-shaped configuration such that an output ion beam is parallel to an input ion beam, such that the ions makes two identical but opposed turns, and such that the geometry of the entire system folds into a very compact volume. Geometry of a TOF mass spectrometer system in accordance with embodiments of the present invention further includes straight drift regions positioned before and after the S-shaped configuration and, optionally, a short straight region positioned between the two curved sectors with total length equal to about the length of the central arc of both curved sectors. 1. A system for expressing an ion path in a time-of-flight mass spectrometer , comprising:a first straight sector defining a first straight ion flight path, said first straight sector having a first sector entrance and a first sector outlet,wherein the first sector entrance is positioned to receive a plurality of ions along the first straight ion flight path;a first electric sector defining a first curved ion flight path, said first electric sector having a first electric sector entrance and a first electric sector outlet,wherein the first electric sector entrance is positioned opposing the first straight sector outlet and to receive the plurality of ions from the first straight sector outlet along the first curved ion flight path; anda second electric sector defining a second curved ion flight path, said second electric sector having a second electric sector entrance and a second electric sector outlet,wherein the second electric sector entrance is positioned opposing the first electric sector outlet and to receive the plurality of ions exiting from the first electric sector outlet along the second curved ion flight path.20. The system according to claim , further comprising:a second straight sector defining a ...

MULTI-REFLECTING TIME-OF-FLIGHT MASS SPECTROMETERS

A multi-reflecting time of flight mass analyser is disclosed in which the ion flight path is maintained relatively small and the duty cycle is made relatively high. Spatial focussing of the ions in the dimension (z-dimension) in which the mirrors () are elongated can be eliminated whilst maintaining a reasonably high sensitivity and resolution. 1. A multi-reflecting time of flight mass analyser comprising:an ion accelerator;two ion mirrors arranged for reflecting ions in a first dimension (x-dimension) and being elongated in a second dimension (z-dimension); andan ion detector;wherein the ion accelerator is arranged and configured for accelerating ions into a first of the ion mirrors at an angle to the first dimension such that the ions are repeatedly reflected between the ion mirrors in the first dimension (x-dimension) as they travel in the second dimension (z-dimension);wherein the ions are not spatially focussed in the second dimension (z-dimension) as they travel from the ion accelerator to the detector; andwherein the mass analyser has a duty cycle of ≥5%, a resolution of ≥20,000, wherein the distance in the first dimension (x-dimension) between points of reflection in the two ion mirrors is ≤1000 mm; and wherein the mass analyser is configured such that the ions travel a distance in the second dimension (z-dimension) from the ion accelerator to the detector of ≤700 mm.2. The mass analyser of claim 1 , wherein each mirror has at least four electrodes arranged and configured such that the first order time of flight focussing of ions is substantially independent of the position of the ions in the plane orthogonal to the first dimension (y-z plane).3. The mass analyser of or claim 1 , coupled to an ion source for supplying said ions to the ion accelerator claim 1 , wherein the ion source is arranged such that said ion accelerator receives ions from the ion source travelling in the second dimension (z-dimension).4. The mass analyser of any preceding claim claim 1 ...

SYSTEM AND METHODOLOGY FOR EXPRESSING ION PATH IN A TIME-OF-FLIGHT MASS SPECTROMETER

A system for expressing an ion path in a time-of-flight (TOF) mass spectrometer. The present invention uses two successive curved sectors, with the second one reversed, to form S-shaped configuration such that an output ion beam is parallel to an input ion beam, such that the ions makes two identical but opposed turns, and such that the geometry of the entire system folds into a very compact volume. Geometry of a TOF mass spectrometer system in accordance with embodiments of the present invention further includes straight drift regions positioned before and after the S-shaped configuration and, optionally, a short straight region positioned between the two curved sectors with total length equal to about the length of the central arc of both curved sectors. 1. A system for expressing an ion path in a time-of-flight mass spectrometer , comprising:a first straight sector defining a first straight ion flight path, said first straight sector having a first sector entrance and a first sector outlet,wherein the first sector entrance is positioned to receive a plurality of ions along the first straight ion flight path;a first electric sector defining a first curved ion flight path, said first electric sector having a first electric sector entrance and a first electric sector outlet,wherein the first electric sector entrance is positioned opposing the first straight sector outlet and to receive the plurality of ions from the first straight sector outlet along the first curved ion flight path;a second electric sector defining a second curved ion flight path, said second electric sector having a second electric sector entrance and a second electric sector outlet,wherein the second electric sector entrance is positioned opposing the first electric sector outlet and to receive the plurality of ions exiting from the first electric sector outlet along the second curved ion flight path; anda turn-around section,wherein said turn-around section reverses the path of said plurality of ...

Ion Entry/Exit Device

A method of introducing and ejecting ions from an ion entry/exit device () is disclosed. The ion entry/exit device () has at least two arrays of electrodes (). The device is operated in a first mode wherein DC potentials are successively applied to successive electrodes of at least one of the electrode arrays (() in a first direction such that a potential barrier moves along the at least one array in the first direction and drives ions into and/or out of the device in the first direction. The device is also operated in a second mode, wherein DC potentials are successively applied to successive electrodes of at least one of the electrode arrays () in a second, different direction such that a potential barrier moves along the array in the second direction and drives ions into and/or out of the device in the second direction. The device provides a single, relatively simple device for manipulating ions in multiple directions. For example, the device may be used to load ions into or eject ions from an ion mobility separator in a first direction, and may then be used to cause ions to move through the ion mobility separator in the second direction so as to cause the ions to separate. 1. A method of introducing and ejecting ions from an ion mobility separation device , said method comprising:providing an ion entry/exit device having at least two arrays of electrodes;operating the device in a first mode, wherein DC potentials are successively applied to successive electrodes of at least one of the electrode arrays in a first direction such that a potential barrier moves along the at least one array in the first direction and drives ions into and/or out of the device in the first direction; andoperating the device in a second mode, wherein DC potentials are successively applied to successive electrodes of at least one of the electrode arrays in a second, different direction such that a potential barrier moves along the at least one array in the second direction and drives ...

ATMOSPHERIC PRESSURE ION SOURCE INTERFACE

An interface for receiving ions in a carrier gas from an atmospheric pressure ion source at a spectrometer that is configured to analyse the received ions at a lower pressure includes an interface vacuum chamber having a downstream aperture; a support assembly defining an axial bore arranged to allow a removable capillary tube to extend therethrough; ions being received from the atmospheric pressure ion source through the capillary tube and directed towards the downstream aperture; and a jet disruptor, positioned downstream from the axial bore and configured to disrupt gas flow between the axial bore and the downstream aperture only when the capillary tube is not fully inserted through the axial bore. 1. An interface for receiving ions in a carrier gas from an atmospheric pressure ion source at a spectrometer that is configured to analyse the received ions at a lower pressure , the interface comprising:an interface vacuum chamber having a downstream aperture;a support assembly defining an axial bore arranged to allow a removable capillary tube to extend therethrough, ions being received from the atmospheric pressure ion source through the capillary tube and directed towards the downstream aperture; anda jet disruptor positioned downstream from the axial bore and configured to disrupt gas flow between the axial bore and the downstream aperture only when the capillary tube is not fully inserted through the axial bore.2. The interface of claim 1 , wherein the jet disruptor is configured to retract from a position to disrupt gas flow between the axial bore and the downstream aperture when the capillary tube is fully inserted through the axial bore.3. The interface of claim 1 , wherein the jet disruptor is arranged to rest in a position to disrupt gas flow between the axial bore and the downstream aperture and resiliently biased against displacement from the position upon insertion of the capillary tube through the axial bore.4. The interface of claim 1 , wherein the jet ...

TIME OF FLIGHT MASS ANALYSER WITH SPATIAL FOCUSSING

A Time of Flight mass analyser is disclosed comprising: at least one ion mirror (() for reflecting ions; an ion detector () arranged for detecting the reflected ions; a first pulsed ion accelerator () for accelerating an ion packet in a first dimension (Y-dimension) towards the ion detector () so that the ion packet spatially converges in the first dimension as it travels to the detector (); and a pulsed orthogonal accelerator () for orthogonally accelerating the ion packet in a second, orthogonal dimension (X-dimension) into one of said at least one ion mirrors (). 1. A Time of Flight mass analyser comprising:at least one ion mirror for reflecting ions;an ion detector arranged for detecting the reflected ions;a first pulsed ion accelerator for accelerating an ion packet in a first dimension (Y-dimension) towards the ion detector so that the ion packet spatially converges in the first dimension as it travels to the detector; anda pulsed orthogonal accelerator for orthogonally accelerating the ion packet in a second, orthogonal dimension (X-dimension) into one of said at least one ion mirrors.2. The mass analyser of claim 1 , wherein the first ion accelerator is configured to pulse the ion packet out having a first length in the first dimension (Y-dimension) claim 1 , wherein the orthogonal accelerator is configured to pulse the ion packet out having a second length in the first dimension (Y-dimension) claim 1 , and wherein the detector is arranged such that the ion packet has a third length in the first dimension (Y-dimension) when it impacts the detector claim 1 , wherein the third length is shorter than or substantially the same as the first length and/or second length.3. The mass analyser of claim 1 , wherein the first ion accelerator comprises a voltage supply for applying a voltage pulse that accelerates the ion packet in the first dimension (Y-dimension) such that the ion packet is spatially focused in the first dimension to a spatial focal point that is ...

ION GUIDE WITHIN PULSED CONVERTERS

Elongation of orthogonal accelerators is assisted by ion spatial transverse confinement within novel confinement means, formed by spatial alternation of electrostatic quadrupolar field (). Contrary to prior art RF confinement means, the static means provide mass independent confinement and may be readily switched. Spatial confinement defines ion beam () position, prevents surfaces charging, assists forming wedge and bend fields, and allows axial fields in the region of pulsed ion extraction, this way improving the ion beam admission at higher energies and the spatial focusing of ion packets in multi- reflecting, multi-turn and singly reflecting TOF MS or electrostatic traps. 1. A pulsed ion accelerator for a mass spectrometer comprising:an ion guide portion having electrodes arranged to receive ions travelling along a first direction (Z-dimension), including a plurality of DC electrodes spaced along the first direction;DC voltage supplies configured to apply different DC potentials to different ones of said DC electrodes such that when ions travel through the ion guide portion along the first direction they experience an ion confining force, generated by the DC potentials, in at least one dimension (X- or Y-dimension) orthogonal to the first direction; anda pulsed voltage supply configured to apply a pulsed voltage to at least one electrode for pulsing ions in a second direction (X-dimension) substantially orthogonal to the first direction (Z-dimension).2. The pulsed ion accelerator of claim 1 , wherein the ion guide portion comprises a first pair of opposing rows of said DC electrodes on opposing sides of the ion guide portion claim 1 , wherein each row extends in the first direction (Z-dimension) claim 1 , and wherein:(i) the rows are spaced apart in a third direction (Y-dimension) that is orthogonal to the first and second directions by a gap; and/or(ii) the DC voltage supplies are configured to maintain at least some of the adjacent DC electrodes in each row at ...

ION ANALYZER

A microchannel plate (MCP) in an ion detection section multiplies electrons. An anode detects those electrons and produces a current signal. An amplifier converts this signal into a voltage signal. A low-pass filter A acting as a smoothing section is located at the output end of the amplifier A waveform-shaping time adjuster adjusts the time constant of the low-pass filter A beforehand according to the response time of the MCP mass-to-charge ratio of an ion species to be subjected to the measurement, and duration of the spread of the ion species which depends on device-specific parameters. A plurality of peaks which sequentially appear in the detection signal corresponding to one ion species are thereby smoothed into a single broad peak. Thus, the distinguishability between signal waves and noise components is improved. 1. An ion analyzer having an ion detection section for generating a detection signal corresponding an amount of incident ion , the ion analyzer comprising:a) a signal waveform shaping section which is a smoothing circuit for reducing a higher-frequency component of the detection signal; andb) a time constant adjuster for adjusting a time constant of the smoothing circuit according to at least a duration of an ion species of a same mass-to-charge ratio incident on the ion detection section.2. The ion analyzer according to claim 1 , wherein:the time constant adjuster is configured to adjust the time constant of the smoothing circuit according to the duration of the ion species of the same mass-to-charge ratio incident on the ion detection section and an output response time which is a characteristic value of the ion detection section.3. The ion analyzer according to claim 2 , wherein:{'sub': 1', '2', '2', '1, 'sup': 2', '2, 'the time constant adjuster is configured to adjust the time constant of the smoothing circuit to approximately √(Δt+Δt), where Δtis the duration of the ion species of the same mass-to-charge ratio incident on the ion detection ...

Mass analyser, mass spectrometer and associated methods

A mass analyser for use in a mass spectrometer. The mass analyser has a set of electrodes including electrodes arranged to form at least one electrostatic sector, the set of electrodes being spatially arranged to be capable of providing an electrostatic field in a reference plane suitable for guiding ions along a closed orbit in the reference plane, wherein the set of electrodes extend along a drift path that is locally orthogonal to the reference plane and that curves around a reference axis so that, in use, the set of electrodes provide a 3D electrostatic field region. The mass analyser is configured so that, in use, the 3D electrostatic field region provided by the set of electrodes guides ions having different initial coordinates and velocities along a single predetermined 3D reference trajectory that curves around the reference axis.

Method for Separating Ions According to a Physicochemical Property

A method of separating ions according to a physicochemical property is disclosed. The method comprises causing ions to perform a plurality of cycles along or around an ion guiding path such that the ions separate according to said physicochemical property. The ions are ejected from an ion exit region by applying a force to the ions such that only having a physicochemical property value that is either above or below a threshold value are ejected as they pass through the exit region, but ions having a physicochemical property value either below or above said threshold value, respectively, remain within the ion guiding path. The force applied to the ions within the exit region is varied with time such that the physicochemical property value of the ions ejected from the ion guiding region varies with time. 1. A method of separating ions according to a physicochemical property comprising:providing an ion guide having a plurality of electrodes arranged to form an ion guiding path;causing said ions to perform a plurality of cycles along or around said ion guiding path such that said ions separate according to said physicochemical property as they pass along or around said ion guiding path;ejecting ions from an ion exit region of said ion guiding path by applying a force to the ions in said exit region such that only ions in the exit region having a physicochemical property value that is either above or below a threshold value are ejected from the ion guiding path as they pass through said exit region, and ions in said exit region having a physicochemical property value either below or above said threshold value, respectively, remain within the ion guiding path; andvarying said force applied to ions within the exit region with time such that said threshold value varies with time and hence the physicochemical property value of the ions ejected from the ion guiding region varies with time.2. The method of claim 1 , comprising calculating or experimentally determining the ...

MASS ANALYSER HAVING EXTENDED FLIGHT PATH

A time-of-flight or electrostatic trap mass analyzer is disclosed comprising: an ion flight region comprising a plurality of ion-optical elements (-) for guiding ions through the flight region in a deflection (x-y) plane. The ion-optical elements are arranged so as to define a plurality of identical ion-optical cells, wherein the ion-optical elements in each ion-optical cell are arranged and configured so as to generate electric fields for either focusing ions travelling in parallel at an ion entrance location of the cell to a point at an ion exit location of the cell, or for focusing ions diverging from a point at the ion entrance location to travel parallel at the ion exit location. Each ion-optical cell comprises a plurality of electrostatic sectors having different deflection radii for bending the flight path of the ions in the deflection (x-y) plane. The ion-optical elements in each cell are configured to generate electric fields that either (i) have mirror symmetry in the deflection plane about a line in the deflection plane that is perpendicular to a mean ion path through the cell at a point half way along the mean ion path through the cell, or (ii) have point symmetry in the deflection plane about a point in the deflection plane that is half way along the mean ion path through the cell. The ion-optical elements are arranged and configured such that, in the frame of reference of the ions, the ions are guided through the deflection plane in the ion-optical cells along mean flight paths that are of the same shape and length in each ion-optical cell. 1. A time-of-flight or electrostatic trap mass analyzer comprising:an ion flight region comprising a plurality of ion-optical elements for guiding ions through the flight region in a deflection (x-y) plane;wherein said ion-optical elements are arranged so as to define a plurality of identical ion-optical cells;wherein the ion-optical elements in each ion-optical cell are arranged and configured so as to generate ...

TIME-RESOLVED CHEMICAL STUDIES VIA TIME-OF-FLIGHT SECONDARY ION MASS SPECTROMETRY

A method of performing time-of-flight secondary ion mass spectrometry on a sample includes the step of directing a beam of primary ions to the sample, and stimulating the migration of ions within the sample while the beam of primary ions is directed at the sample. The stimulation of the ions is cycled between a stimulation state and a lower stimulation state. Secondary ions emitted from the sample by the beam of primary ions are collected in a time-of-flight mass spectrometer. Time-of-flight secondary ion mass spectrometry is then performed on the secondary ions. A system for performing time-of-flight secondary ion mass spectrometry on a sample is also disclosed. 1. A method of performing time-of-flight secondary ion mass spectrometry on a sample , comprising the steps of:directing a beam of primary ions to the sample;stimulating the migration of ions within the sample while the beam of primary ions is directed at the sample;cycling the stimulation of the ions between a stimulation state and a lower stimulation state;collecting secondary ions emitted from the sample by the beam of primary ions in a time-of-flight mass spectrometer; and,performing time-of-flight secondary ion mass spectrometry on the secondary ions.2. The method of claim 1 , wherein the stimulation of the ions within the sample comprises applying an electric field across the sample.3. The method of claim 1 , wherein the stimulation of the ions within the sample comprises changing the temperature of the sample.4. The method of claim 1 , wherein the stimulation of the ions within the sample comprises irradiating the sample with electromagnetic radiation.5. The method of claim 4 , wherein the electromagnetic radiation comprises a laser beam.6. The method of claim 4 , wherein the electromagnetic radiation comprises broad spectrum white light.7. The method of claim 1 , wherein the stimulation of the ions within the sample comprises the application of mechanical force to the sample.8. The method of claim 1 ...

Dual mode mass spectrometer

Disclosed herein is an ion analysis instrument comprising a Time of Flight (“TOF”) mass analyser comprising a reflectron. The instrument is operable in at least a first mode and a second mode, wherein in said first mode ions are caused to turn around at a first point in the reflectron and wherein in said second mode ions are caused to turn around at a second point in the reflectron such that the distance traveled by ions within the Time of Flight mass analyser is greater in the second mode than the distance traveled by ions within the Time of Flight mass analyser in the first mode. In this way, the operating modes can be selectively optimised for the analysis of ions of different masses.

MASS ANALYSER AND METHOD OF MASS ANALYSIS

An electrostatic ion trap for mass analysis includes a first array of electrodes and a second array of electrodes, spaced from the first array of electrode. The first and second arrays of electrodes may be planar arrays formed by parallel strip electrodes or by concentric, circular or part-circular electrically conductive rings. The electrodes of the arrays are supplied with substantially the same pattern of voltage whereby the distribution of electrical potential in the space between the arrays is such as to reflect ions isochronously in a flight direction causing them to undergo periodic, oscillatory motion in the space, focused substantially mid-way between the arrays. Amplifier circuitry is used to detect image current having frequency components related to the mass-to-charge ratio of ions undergoing the periodic, oscillatory motion. 1. An ion trap for mass analysis comprising:a first array of electrodes and a second array of electrodes, spaced from the first array of electrodes, voltage being supplied, in use, to electrodes of the first and second arrays of electrodes to create an electrostatic field in the space between the electrode arrays,a magnet for superimposing a static magnetic field on said electrostatic field,wherein electrodes of the first array and electrodes of the second array are supplied, in use, with substantially the same pattern of voltage, whereby the distribution of electrical potential in said space is such as to reflect ions isochronously in a flight direction causing them to undergo periodic, oscillatory motion in said space, and said magnetic field is in the direction of said flight direction to assist focusing and stabilization of ion motion substantially mid-way between the first and second arrays of electrodes andwherein at least one electrode of said arrays is connected to amplifier circuitry for detection of image current having frequency components related to the mass-to-charge ratio of ions undergoing said periodic oscillatory ...

Ion Entry/Exit Device

A method of introducing and ejecting ions from an ion entry/exit device () is disclosed. The ion entry/exit device () has at least two arrays of electrodes (). The device is operated in a first mode wherein DC potentials are successively applied to successive electrodes of at least one of the electrode arrays (() in a first direction such that a potential barrier moves along the at least one array in the first direction and drives ions into and/or out of the device in the first direction. The device is also operated in a second mode, wherein DC potentials are successively applied to successive electrodes of at least one of the electrode arrays () in a second, different direction such that a potential barrier moves along the array in the second direction and drives ions into and/or out of the device in the second direction. The device provides a single, relatively simple device for manipulating ions in multiple directions. For example, the device may be used to load ions into or eject ions from an ion mobility separator in a first direction, and may then be used to cause ions to move through the ion mobility separator in the second direction so as to cause the ions to separate. 1. A method of introducing and ejecting ions from an ion mobility separation device , said method comprising:providing an ion entry/exit region having at least two arrays of electrodes; andoperating the ion entry/exit region in a first mode, wherein DC potentials are successively applied to successive electrodes of at least one of the electrode arrays in a first direction such that a potential barrier moves along the at least one array in the first direction and drives ions into and/or out of the region in the first direction.2. The method of claim 1 , wherein said at least two arrays of electrodes are arranged parallel to each other.3. The method of claim 1 , wherein each array of electrodes comprises a plurality of electrodes arranged in rows and columns; andwherein in said first mode said ...

Mass analyser having extended flight path

MASS ANALYSER HAVING EXTENDED FLIGHT PATH A time-of-flight or electrostatic trap mass analyzer is disclosed comprising: an ion flight region comprising a plurality of ion-optical elements (30-35) for guiding ions through the flight region in a deflection (x-y) plane. The ion-optical elements are arranged so as to define a plurality of identical ion-optical cells, wherein the ion-optical elements in each ion- optical cell are arranged and configured so as to generate electric fields for either focusing ions travelling in parallel at an ion entrance location of the cell to a point at an ion exit location of the cell, or for focusing ions diverging from a point at the ion entrance location to travel parallel at the ion exit location. Each ion-optical cell comprises a plurality of electrostatic sectors having different deflection radii for bending the flight path of the ions in the deflection (x-y) plane. The ion-optical elements in each cell are configured to generate electric fields that either (i) have mirror symmetry in the deflection plane about a line in the deflection plane that is perpendicular to a mean ion path through the cell at a point half way along the mean ion path through the cell, or (ii) have point symmetry in the deflection plane about a point in the deflection plane that is half way along the mean ion path through the cell. The ion-optical elements are arranged and configured such that, in the frame of reference of the ions, the ions are guided through the deflection plane in the ion-optical cells along mean flight paths that are of the same shape and length in each ion-optical cell.

MASS SPECTROMETER

A mass spectrometer includes a vacuum container divided into a first chamber containing an ion trap and a second chamber containing a time-of-flight mass spectrometer . The ion trap is held within an ion-trap-holding space surrounded by a wall . In this wall , a cooling-gas discharge port is formed in addition to an introduction-side ion passage port and an ejection-side ion passage port . A cooling gas supplied into an ion-capturing space of the ion trap is discharged from the ion-trap-holding space through the three ports. The provision of the cooling-gas discharge port reduces the amount of cooling gas flowing into the ejection-side ion passage port and interfering with the ejection of ions from the ion trap into the time-of-flight mass spectrometer . Consequently, the detection intensity of the ions is improved. 1. A mass spectrometer , comprising:a vacuum container including a first chamber and a second chamber each of which is configured to be internally evacuated, as well as an opening through which the first chamber and the second chamber communicate with each other;an ion trap including a plurality of electrodes arranged within the first chamber, the ion trap having an ion introduction port for introducing ions into an ion-capturing space which is a space surrounded by the plurality of electrodes and an ion ejection port for ejecting ions from the ion-capturing space;a gas introduction tube for introducing a cooling gas into the ion-capturing space;an ion trap holder located within the first chamber and configured to hold the ion trap within an ion-trap-holding space surrounded by a wall, the ion trap holder having following ports formed in the wall: an introduction-side ion passage port connected to the ion introduction port; an ejection-side ion passage port located between the ion ejection port and the opening; and a cooling-gas discharge port provided apart from the introduction-side ion passage port and the ejection-side ion passage port; anda time-of- ...

Method for serperating ions according to a physiochemical property

质量分析仪、质谱仪和相关方法

一种用于在质谱仪中使用的质量分析仪。质量分析仪具有包括被布置为形成至少一个静电扇区的电极的电极集合，该电极集合在空间上被布置为能够在参考平面中提供适合于沿着参考平面中的闭合轨道引导离子的静电场，其中，电极集合沿着局部垂直于参考平面并且绕参考轴弯曲的漂移路径延伸，使得在使用中，电极集合提供3D静电场区域。质量分析仪被配置为在使用中由电极集合提供的3D静电场区域沿着绕参考轴弯曲的单个预定3D参考轨迹引导具有不同初始坐标和速度的离子。

Time-of-Flight-Based Mass Microscope System for High-Throughput Multi-Mode Mass Analysis

본 발명의 목적은 분석하고자 하는 대상의 분자량에 제한받지 않고 약물/대사체/지질/펩타이드와 같은 저분자량 분석이나 유전자/단백질과 같은 고분자량 분석이 모두 가능하도록 레이저빔 또는 이온빔을 동시에 사용하고, 또한 주사형 방법이 아닌 현미경 방법을 사용함으로써 측정 속도를 비약적으로 증대시키는, 초고속 멀티 모드 질량 분석을 위한 비행시간 기반 질량 현미경 시스템을 제공함에 있다. 본 발명의 초고속 멀티 모드 질량 분석을 위한 비행시간 기반 질량 현미경 시스템은, 시료의 질량화학 분석을 수행하는 질량 현미경 시스템(100)에 있어서, 저분자량 시료 내지 고분자량 시료 모두에 대하여 분석이 가능하도록, 상기 시료 상에 레이저빔, 이온빔, 레이저빔 또는 이온빔 중 선택되는 어느 한 가지를 디포커스(defocus)된 상태로 주사하고, 상기 시료의 이미지를 촬영함과 동시에 레이저빔 또는 이온빔이 주사되었을 때 상기 시료에서 발생되는 이차이온을 비행시간 기반(TOF, time-of-flight)으로 위치를 측정하여 검출함으로써, 현미경 모드(microscope mode)로 상기 시료의 질량 이미징 분석을 수행하는 것을 특징으로 한다. The object of the present invention is to use a laser beam or an ion beam at the same time so as to enable both low molecular weight analysis such as drug / metabolism / lipid / peptide or high molecular weight analysis such as gene / The present invention also provides a flight time-based mass microscope system for ultra-high speed multi-mode mass spectrometry which dramatically increases the measurement speed by using a microscopic method rather than a scanning method. The flight time-based mass microscope system for mass spectrometry of ultra-high speed multi-mode mass spectrometry according to the present invention is characterized in that mass microscopy system (100) for performing mass chemical analysis of a sample is capable of analyzing both low- The method comprising the steps of: deflecting a selected one of a laser beam, an ion beam, a laser beam, and an ion beam onto the sample in a defocused state; and photographing an image of the sample and, when the laser beam or the ion beam is scanned, (TOF), and the mass imaging analysis of the sample is performed in a microscope mode by detecting the position of the secondary ion generated in the time-of-flight (TOF).

Multi-turn time-of-flight mass spectrometer

Multi-reflecting time-of-flight mass spectrometer with isochronous curved ion interface

本发明一般涉及多反射飞行时间质谱仪(MR TOF MS)。为了改进平面MR TOF MS分析仪(11)的质量分辨率，空间同步和弯曲界面(21)可以用于进出MR TOF MS分析仪(11)的离子传送。一个实施例包括在无场空间中具有周期透镜(14)的平面MR TOF MS(11)、用来把离子流动转换成脉冲的线性离子阱(17)及由静电扇区制成的C形同步界面。界面(21)允许绕离子反射镜(12)的边沿和边缘场(13)传送离子而不引入显著时间散布。界面(21)也可以提供离子包的能量滤波。通过使用来自离子阱的延迟离子抽取可以减小离子阱转换器(17)的非相关折返时间，并且过大离子能量在弯曲界面(21)中过滤。

Mass spectrometer

针对包含目标化合物的试样，由测定部(1)执行以源自该化合物的已知离子的m/z值为前体离子的产物离子扫描测定，获取轮廓谱数据。在数据处理部(2A)中，峰检测部(22)在轮廓谱上检测峰，产物离子m/z值获取部(23)针对检测到的每个峰获取最大强度所对应的m/z值来作为产物离子的m/z值。虚拟MRM测定数据提取部(24)将前体离子的m/z值、产物离子的m/z值作为MRM转变，并且提取源自产物离子的峰的最大强度作为MRM转变的信号强度值，将其作为虚拟MRM测定数据而保存到存储部(25)。由此，不执行MRM测定而仅通过产物离子扫描测定就能够得到反映了目标化合物的浓度的定量信息。

Orthogonal acceleration coaxial cylindrical time-of-flight mass spectrometer

Quadruple focusing time of flight mass spectrometer

A quadruple focusing time of flight mass spectrometer is disclosed comprised of a deflection zone including four separate focusing electrode pairs for each sequentially guiding ions through a deflection arc with limited divergence from a central reference plane. The focusing electrode pairs are arranged so that ions exit from the deflection zone in a direction opposite to that of their direction of entrance.

Mass spectrometer

Mass spectrometer

A mass spectrometer is provided in which ions are favorably introduced into a loop orbit or favorably led out from the loop orbit without affecting the motion of the ions flying along the loop orbit. An ion-introduction orbit 5 is set to correspond to the orbit (ejection orbit portion 4 ) of ions after being bent by the sector-shaped electric field E 1 in the loop orbit 4. When ions are introduced, a voltage applied to the electrode unit 11 is put to zero to release the sector-shaped electric field E 1 . Then the ions emitted along the ion-introduction orbit 5 fly straight in the electrode unit 11. The direction and position of the ions coming out from the exit end of the electric field is the same as those ions flying along the loop orbit 4. Therefore, there is no need for placing a deflection electrode for introducing/leading-out ions on the loop orbit.

Multi-pass mass spectrometer with high duty cycle

A multi-pass time-of-flight mass spectrometer is disclosed having an elongated orthogonal accelerator (30). The orthogonal accelerator (30) has electrodes (31) that are transparent to the ions so that ions that are reflected or turned back towards it are able to pass through the orthogonal accelerator (30). The electrodes (31) of the orthogonal accelerator (30) may be pulsed from ground potential in order to avoid the reflected or turned ion packets being defocused. The spectrometer has a high duty cycle and/or space charge capacity of pulsed conversion.

Multi-turn time-of-flight mass spectrometry

Mass spectrometer

A multi-turn Time of Flight mass analyser is disclosed comprising a first electric sector 5 and a second electric sector 8. The second electric sector 8 is arranged orthogonal to the first electric sector 5. Ions may make multiple loops or circuits of the mass analyser before being detected and mass analysed enabling a high resolution mass analyser to be provided. According to another embodiment the mass analyser may have an open-loop geometry wherein the first electric sector is elongated and further electric sectors are arranged in a staggered manner along the length of the first electric sector. The first and second electric sectors 5,8 may be sub-divided into a plurality of electric sector segments.

Time-of-Flight based mass microscope system for ultrahigh-speed multimodal mass analysis

Die Erfindung betrifft ein Flugzeit-basierenden Massenmikroskopsystems für eine Ultrahochgeschwindigkeits-multimodale Massenanalyse, das zeitgleich einen Laserstrahl und einen Ionenstrahl einsetzten kann, um sowohl Analysen im niedermolekularen Molekulargewichtsbereich, wie beispielsweise an Arzneistoffen/Metabolomen/Lipiden/Peptiden als auch Analysen im hochmolekularen Molekulargewichtsbereich, wie beispielsweise an Genen/Proteinen, durchzuführen, ohne dabei durch das Molekulargewicht des zu analysierenden Objekts eingeschränkt zu sein, und das eine deutlich erhöhte Messgeschwindigkeit durch Verwendung eins Mikroskop-Modus anstelle eines Mikrosonden-Modus aufweist. The invention relates to a time-based mass microscope system for an ultra-high-speed multimodal mass analysis, which can simultaneously use a laser beam and an ion beam to carry out analyzes in the low molecular weight range, such as on drugs / metabolomes / lipids / peptides, as well as analyzes in the high molecular weight range, such as for example on genes / proteins, without being restricted by the molecular weight of the object to be analyzed, and which has a significantly increased measuring speed by using a microscope mode instead of a microsensor mode.

Time-of-flight mass spectrometer

An ion mirror, an ion mirror assembly and an ion trap

An ion mirror 10 for use in a time of flight mass spectrometer 100 comprises a first 5 electrode 20 for producing a quadratic field along a first axis 80, and a second electrode 30 for producing a quadratic field along a second axis 90, the axes 80, 90 being orthogonal. Alternatively, a series of discrete parallel plane electrodes may be used to generate the necessary hyperbolic field. Ions incident on a slit in a grounded entrance plate are reflected by the potential field and exit either through another slit or the same slit (figure 3). An alternating voltage is applied to the electrodes that increase the path length of ions in the reflector and thereby increases the resolution of the spectrometer without increasing its size. An ion trap comprising magnetic field confinement arrangement at either end of a quadropole electrode arrangement is also disclosed (figures 11-13).

Mass spectrometry method and apparatus for its execution

Die Erfindung gehört zu der elektronischen analytischen Technik für die Bestimmung der Zusammensetzung und der Struktur von Substanzen, u. a. im Bereich der Analysatoren, die mindestens einen Massenspektometer (MS – Mass Spektrometer) einschließen, und kann in Medizin, in Biologie, Gas- und Ölindustrie, in Metallurgie, Energetik, Geochemie, Hydrologie, Ökologie gebraucht werden. Das technische Ergebnis ist die Vergrößerung der Auflösbarkeit von MS, der Empfindlichkeit, der Genauigkeit und der Geschwindigkeit der Änderung der Zusammensetzung und der Struktur von Substanzen, bei der gleichzeitigen Erweiterung der Funktionalmöglichkeiten, bei der Verminderung der geometrischen Abmessungen und des Gewichtes der Substanzanalysatoren. In der Art und Weise der Massenspektometrie werden die Formierung des Ionenstroms und seine Steuerung mit der einflutigen außeraxialen Methode; mit der parallel-mehrflutigen Methode; mit der Methode der Anwendung des dreidimensionalen Feldes mit der mittleren Meridianoberfläche vollzogen, einschließlich von der widerspiegelnden dreidimensionalen Art und der widerspiegelnden zweizonigen Art oder mit der Methode der Massive der Mehrwiderspiegelung. Es sind die Varianten der Vorrichtungen für die Realisierung der Weise erarbeitet worden. Es sind prinzipielle ionen-optische Schemas vorgestellt worden, die erlauben, die MS verschiedener Arten mit wenigeren Materialaufwendigkeit und geometrischen Abmessungen zu schaffen. The invention belongs to the electronic analytical technique for the determination of the composition and the structure of substances, u. a. in the field of analyzers, which include at least one mass spectrometer (MS - Mass spectrometer), and can be used in medicine, biology, gas and oil industry, metallurgy, energetics, geochemistry, hydrology, ecology. The technical result is the increase in the solubility of MS, the sensitivity, the accuracy and rate of change in the composition and structure of substances, while expanding the ...

Mass-Analyzing Method and Mass Spectrometer

In a time-of-flight spectrum obtained when the overtaking of ions of different kinds has occurred, mass-to-charge ratios M 1 , M 2 , and M 3 are computed with a predetermined conversion formula by using a plurality of assumed numbers of turns for one peak. Then, the flight times Tf 1 , Tf 2 , and Tf 3 for an overtakingless measurement are computed by using an inverse conversion formula. If peaks respectively corresponding to the flight times Tf 1 , Tf 2 , and Tf 3 for an overtakingless measurement exist on an overtakingless time-of-flight spectrum, their intensities i 1 , i 2 , and i 3 are obtained. Then, the intensity Ia of the original peak is distributed to the mass-to-charge ratios M 1 , M 2 , and M 3 in accordance with the intensity ratio. The same intensity distribution processing is performed for all or selected plural peaks. The intensities assigned to the same mass-to-charge ratio are integrated. A mass spectrum is created for each of a plurality of overtaking time-of-flight spectra obtained by changing the timing of deviation of ions from a loop orbit, and the plurality of mass spectra are displayed in a window of a display unit so that they can be compared. Thereby, the probability of missing an ion due to the ion deviation timing can be reduced.

Multi-reflecting time-of-flight mass spectrometer with isochronous curved ion interface

The present invention relates generally to a multi-reflecting time-of-flight mass spectrometer (MR TOF MS). To improve mass resolving power of a planar MR TOF MS (11), a spatially isochronous and curved interface (21) may be used for ion transfer in and out of the MR TOF analyzer (11). One embodiment comprises a planar MR TOF MS (11) with periodic lenses (14) in the field-free space, a linear ion trap (17) for converting ion flow into pulses and a C-shaped isochronous interface made of electrostatic sectors. The interface (21) allows transferring ions around the edges and fringing fields (13) of the ion mirrors (12) without introducing significant time spread. The interface (21) may also provide energy filtering of ion packets. The non-correlated turn-around time of ion trap converter (17) may be reduced by using a delayed ion extraction from the ion trap and excessive ion energy is filtered in the curved interface (21).

Ion guide array

An ion guide array is disclosed comprising a first ion guide section (1) and a second ion guide section (2) and op-tionally further ion guide sections. Each ion guide section (1, 2) may comprise a plurality of electrodes having an aperture through which ions are transmitted in use. A transfer section is arranged at the exit of the first ion guide section (1) and ions are transmit-ted radially from the first ion guide section (1) into the second ion guide section (2). The electrodes (1b, 2b) in the transfer section may have a radial aperture enabling ions to be transmitted radially from the first ion guide section (1) to the second ion guide sec-tion (2).

Mass spectrometer

A multi-turn Time of Plight mass analyzer is disclosed comprising a first electric sector ( 5 ) and a second electric sector ( 8 ). The second electric sector ( 8 ) is arranged orthogonal to the first electric sector ( 5 ). Ions may make multiple loops or circuits of the mass analyzer before being detected and mass analyzed enabling a high resolution mass analyzer to be provided. According to another embodiment the mass analyzer may have an open-loop geometry wherein the first electric sector is elongated and further electric sectors are arranged in a staggered manner along the length of the first electric sector. The first and second electric sectors ( 5,8 ) may be sub-divided into a plurality of electric sector segments.

Mass spectrometer

A pair of inner electrode (2a) and outer electrode (2b) which forms a fan-shaped electric field for enabling ions to orbit and fly being formed of a general expansion material is attached to a supporting member (13) formed of a general expansion material, and the supporting member (13) is fixed to a base (11) formed of a low-expansion material at a prescribed position (P) further outwardly of the outer electrode (2b). When the supporting member (13) and the electrodes (2a, 2b) are extended with a rise of temperature, the electrodes (2a, 2b) as a whole move inwardly, thereby the distance of one orbiting of orbit is shortened. On the other hand, a space between the inner electrode (2a) and the outer electrode (2b) is widened and the intensity of the fan-shaped electric field becomes low, whereby a flight distance becomes long. Accordingly, by properly selecting a fixing position of the supporting member (13) to the base (11) to offset increase and decrease of flight distance, it is possible to suppress the variation of flight time of ions with the same mass even when variation in temperature occurs.

Time-of-Flight based mass microscope system for ultrahigh-speed multimodal mass analysis

Ein Flugzeit-basierendes Massenmikroskopsystem (100) für eine multimodale Massenanalyse, wobei das Flugzeit-basierende Massenmikroskopsystem zur bildgebenden Massenanalyse einer Probe in einem Mikroskop-Modus betrieben wird, indem eine Probe mit einem Laserstrahl und/oder einem Ionenstrahl bestrahlt wird, wobei der Laser- und der Ionenstrahl defokussiert sind, von der Probe eine fotographische Aufnahme gemacht wird und zeitgleich die Position eines Sekundärions, das durch den Laserstrahl oder den Ionenstrahl zum Zeitpunkt der Bestrahlung der Probe erzeugt wird, basierend auf der Flugzeit (TOF) gemessen und detektiert wird, so dass die Analyse hinsichtlich des Molekulargewichts an jedweder Proben erfolgen kann, an solchen mit niedrigem Molekulargewicht bis hin zu solchen mit hohem Molekulargewicht, wobei das Flugzeit-basierende Massenmikroskopsystem (100) enthält: – einen Lasereingang (110), um eine Probe mit einem Laserstrahl zu bestrahlen; – eine Ionenkanonenbaueinheit (120), um eine Probe mit einem Ionenstrahl zu bestrahlen; – eine Probeneintrittskammer (130), in die die Probe mit einem Probenzuführer (131) eingebracht wird; – einen Probenträger (140), auf den die Probe aufgelegt wird; – einen Probenträgermanipulator (150), mit dem die Position des Probenträgers (140) eingestellt wird; – eine CCD-Kamera (160), um ein Bild der Probe ... A time-based mass microscope system (100) for multimodal mass analysis, wherein the time of flight based mass microscope system for mass imaging analysis of a sample is operated in a microscope mode by irradiating a sample with a laser beam and / or an ion beam, wherein the laser and the ion beam are defocused, a photograph is taken of the sample and at the same time the position of a secondary ion generated by the laser beam or the ion beam at the time of irradiation of the sample is measured and detected based on the time of flight (TOF) molecular weight analysis can be performed on any sample, from low molecular weight to high ...

Orthogonal acceleration coaxial cylinder time of flight mass analyser

A Time of Flight mass analyser is disclosed comprising an annular ion guide having a longitudinal axis and comprising a first annular ion guide section and a second annular ion guide section. Ions are introduced into the first annular ion guide section so that the ions form substantially stable circular orbits within the first annular ion guide section about the longitudinal axis. The ions are then orthogonally accelerated ions from the first annular ion guide section into the second annular ion guide section. An ion detector is disposed within the annular ion guide and has an ion detecting surface arranged in a plane which is substantially perpendicular to the longitudinal axis.

Mass spectrometer

Mass analysis device and mass separation device

An object of the present invention is to provide a mass spectrometer and a mass separator whose design and performance are less restricted by problems arising from the principle of operation, and which have in principle no limitation on the mass-to-charge ratio range to be able to deal with and are each capable of repeatedly analyzing or extracting plural ionic species of different mass-to-charge ratios in a short time. A mass spectrometer ( 10 ) is configured from an ion source ( 1 ), an ion introduction unit ( 2 ), a mass analyzer ( 3 ), an ion detection unit ( 4 ), and the like. Crude ions are introduced into a separation space ( 5 ) at a predetermined acceleration voltage as a pulse synchronized with the phase of a one-dimensional high-frequency electric field. In the separation space ( 5 ), each ion travels in an incident direction by inertia, and besides they are displaced by force received from the one-dimensional high-frequency electric field which acts in the y-direction crossing the incident direction. Ionic species having different mass-to-charge ratios with each other are separated by the difference in displacement magnitude. At this time, the acceleration voltage and the period of the one-dimensional high-frequency electric field are set in order that the measured ionic species may exit from the separation space ( 5 ) having received the action of the electric field for one period.

Orthogonal acceleration coaxial cylinder time of flight mass analyser

A Time of Flight mass analyzer is disclosed comprising an annular ion guide having a longitudinal axis and comprising a first annular ion guide section and a second annular ion guide section. Ions are introduced into the first annular ion guide section so that the ions form substantially stable circular orbits within the first annular ion guide section about the longitudinal axis. The ions are then orthogonally accelerated ions from the first annular ion guide section into the second annular ion guide section. An ion detector is disposed within the annular ion guide and has an ion detecting surface arranged in a plane which is substantially perpendicular to the longitudinal axis.

Mass spectrometer

A multi-turn Time of Plight mass analyzer is disclosed comprising a first electric sector (5) and a second electric sector (8). The second electric sector (8) is arranged orthogonal to the first electric sector (5). Ions may make multiple loops or circuits of the mass analyzer before being detected and mass analyzed enabling a high resolution mass analyzer to be provided. According to another embodiment the mass analyzer may have an open-loop geometry wherein the first electric sector is elongated and further electric sectors are arranged in a staggered manner along the length of the first electric sector. The first and second electric sectors (5,8) may be sub-divided into a plurality of electric sector segments.

Mass spectrometer

Charged particle analyzer

本发明提供一种带电粒子分析装置，在产生用于形成旋转轨道(C)的扇形电场的主电极(11)的外侧电极(11a)上，穿透设置用于从外部沿着扇形电场入射光轴(A)将离子导入旋转轨道(C)的离子入射口(15)，为了修正由于设置了该入射口所带来的扇形电场的散乱，在扇形电场入射光轴(A)的方向上排列了3个电场修正电极(20)。通过分别适当的调整施加于该电场修正电极(20)的直流电压，能够将扇形电场中的等电位线调整至与没有离子入射口(15)时大致相同的程度。由此，可以减少沿着旋转轨道(C)飞行的离子的轨道的偏移，并且可以通过停止对电极(11)、(20)的电压施加，让离子通过离子入射口(15)载入旋转轨道(C)。

Multi-channel detection

A mass spectrometer and method of mass spectrometry wherein charged particles in a beam undergo multiple changes of direction. A detection arrangement detects a first portion of the charged particle beam, and provides a first output based upon the intensity of the detected first portion of the charged particle beam. The detection arrangement detects a second portion of the charged particle beam that has travelled a greater path length through the mass spectrometer than the first portion of the charged particle beam, and provides a second output based upon the detected second portion of the charged particle beam. A controller adjusts the parameters of the charged particle beam and/or the detection arrangement, based upon the first output of the detection arrangement, so as to adjust the second output of the detection arrangement.

Mass analyzer and mass analysis method

一种用于质量分析的静电离子阱包括第一电极阵列和与第一电极阵列分隔开的第二电极阵列。第一和第二电极阵列可以是由平行的带状电极或者由同心的圆形或部分圆形的导电环形成的平面阵列。这些阵列的电极被提供有基本相同的电压模式，由此阵列之间的空间内电位的分布如此以至于在飞行方向等时地反射离子，使得它们在所述空间内经受基本聚焦在阵列之间的中间位置的周期振荡运动。放大器电路用于检测像电流，所述像电流具有与经受周期振荡运动的离子的质荷比有关的频率分量。

Time-of-flight mass spectrometer

Mass spectrometer

本发明提供一种质量分析装置，能够抑制由冷却气体引起的离子检测强度降低。质量分析装置具备：真空容器，具有各自内部被真空排气的第1室、第2室及开口；离子阱，具备配置在第1室内的多个电极，具有将离子导入的离子导入口及将离子释放的离子释放口；气体导入管，将冷却气体导入离子捕捉空间；离子阱保持部，配置在第1室内，将离子阱保持在离子阱保持空间内，在壁上具有导入侧离子通过口、释放侧离子通过口及冷却气体排出口；飞行时间型质量分析器，配置在第2室内，具有从离子释放口通过释放侧离子通过口及开口向第2室内释放的离子进行飞行的飞行空间、及检测在飞行空间飞行的离子的离子检测器。

Ion guide array

An ion guide array is disclosed comprising a first ion guide section and a second ion guide section. Each ion guide section may comprise a plurality of electrodes having an aperture through which ions are transmitted in use. A transfer section is arranged at the exit of the first ion guide section and ions are transmitted radially from the first ion guide section into the second ion guide section. Electrodes in the transfer section may have a radial aperture enabling ions to be transmitted radially from the first ion guide section to the second ion guide section.

The into/out device of ion

本申请公开一种从离子进入/离开装置(4)引入和射出离子的方法。所述离子进入/离开装置(4)具有至少两个电极阵列(20、22)。在第一模式中操作所述装置，其中在第一方向上将DC电势连续施加到所述电极阵列(20、22)中的至少一个的连续电极，以使得电势势垒在所述第一方向上沿着所述至少一个阵列移动，且在所述第一方向上将离子驱动到所述装置中和/或驱动离子到所述装置之外。也在第二模式中操作所述装置，其中在第二不同方向上将DC电势连续施加到所述电极阵列(20、22)中的至少一个的连续电极，以使得电势势垒在所述第二方向上沿着所述阵列移动，且在所述第二方向上将离子驱动到所述装置中和/或驱动离子到所述装置之外。所述装置提供用于在多个方向上操控离子的单个相对简单的装置。举例来说，所述装置可用以在第一方向上将离子载入到离子迁移率分离器中或从离子迁移率分离器射出离子，且接着可用以使得离子在所述第二方向上移动穿过所述离子迁移率分离器，以便使得所述离子分离。

Particle beam mass spectroscopy

본 발명은 입자 빔 질량 분석기를 제공한다. 이 입자 빔 질량 분석기는 가스 유동(gas flow)을 입력받아 가스 유동을 가속하여 입자 빔을 형성하는 공기 역학 렌즈, 열전자를 가속하여 입자 빔을 이온화시키어 하전 입자 빔을 형성하는 전자총, 하전 입자빔을 운동 에너지 대 전하 비(kinetic energy to charge ratio)에 따라 굴절시키는 디플렉터, 및 굴절된 하전 입자 빔에 의한 전류를 측정하는 감지부를 포함한다. 상기 전자총은 입자 빔을 통과시키는 원통 형상의 내부 그물, 상기 내부 그물의 외부에 배치된 원통 형상의 외부 그물, 내부 그물 및 내부 그물의 사이에 배치되어 열전자를 생성하는 필라멘트, 및 외부 그물의 외부에 배치되어 열전자를 구속하는 구속 자기장을 생성하는 자기장 생성부를 포함한다. The present invention provides a particle beam mass spectrometer. The particle beam mass spectrometer is equipped with an aerodynamic lens that receives a gas flow to accelerate the gas flow to form a particle beam, an electron gun to accelerate the hot electrons to ionize the particle beam to form a charged particle beam, and a charged particle beam. A deflector that refracts according to a kinetic energy to charge ratio, and a detector that measures the current by the refracted charged particle beam. The electron gun is arranged between a cylindrical inner net through which a particle beam passes, a cylindrical outer net disposed outside the inner net, an inner net and an inner net to generate hot electrons, and an outer portion of the outer net. And a magnetic field generating portion disposed to generate a confining magnetic field that constrains the hot electrons. 전자총, 나노 파티클, 구속 자기장, 집속 자기장, 필라멘트, 입자 빔 Electron gun, nanoparticle, confining magnetic field, focused magnetic field, filament, particle beam

Bipolar microelectronic device

An apparatus, system, and method are disclosed for modulating electric current. An electron source electrode (202) provides a flow of electrons in a partial vacuum environment (116). An ionizable gas (118) in the partial vacuum environment (116) forms positively charged ion particles in response to impact with the electrons from the electron source electrode (202). Application of a bias voltage differential between a first bias electrode (204) and a second bias electrode (206) in the partial vacuum environment (116) forms an electric field gradient in a path of the flow of electrons. A collector electrode (208) in the partial vacuum environment (116) collects more electrons than ion particles when a collector electrode input voltage (106) is above a threshold, and collects more ion particles than electrons when the collector electrode input voltage (106) is below the threshold.

Orthogonal acceleration coaxial cylinder time of flight mass analyser

A Time of Flight mass analyser is disclosed comprising an annular ion guide having a longitudinal axis and comprising a first annular ion guide section and a second annular ion guide section. Ions are introduced into the first annular ion guide section so that the ions form substantially stable circular orbits within the first annular ion guide section about the longitudinal axis. The ions are then orthogonally accelerated ions from the first annular ion guide section into the second annular ion guide section. An ion detector is disposed within the annular ion guide and has an ion detecting surface arranged in a plane which is substantially perpendicular to the longitudinal axis.

Flight time type mass spectrometer

(57)【要約】 【課題】 閉じた軌道に対するイオンの打ち込み法及び 取り出し法を備えた飛行時間型質量分析計を提供する 【解決手段】 複数の扇形電場によって構成された閉軌 道に、イオンを打ち込むための入射軌道とイオンを取り 出すための出射軌道を設けた。また、閉軌道を構成して いる扇形電場の電極部に、イオン入射及びイオン出射の ための孔を設けた。また、入出射軌道を構成している扇 形電場の電極部に、閉軌道を周回中のイオンを通過させ るための孔を設けた。また、閉軌道へのイオン打ち込み の際には、イオン打ち込み用の孔を有する扇形電場の電 極の電位をオフ（ゼロポテンシャル）またはイオン入射 軌道を構成している扇形電場の電極の電位をオンにし、 閉軌道からのイオン取り出しの際には、イオン取り出し 用の孔を有する扇形電場の電極の電位をオフ（ゼロポテ ンシャル）またはイオン出射軌道を構成している扇形電 場の電極の電位をオンにするようにした。

Mass spectrometer and mass separator

動作原理に起因する問題点によって装置の設計や性能が制限されることが少なく、原理上、扱うことのできる質量電荷比範囲に限界がなく、質量電荷比が異なる複数のイオン種を短時間のうちに繰り返し分析あるいは取り出し可能な質量分析装置および質量分離装置を提供する。質量分析装置（１０）をイオン源（１）、イオン導入部（２）、質量分離部（３）、およびイオン検出部（４）などによって構成する。イオン群は一次元高周波電場の位相に同期したパルスとして所定の加速電圧で分離空間（５）へ導入される。分離空間（５）内では、イオンは、入射方向に慣性で飛行するとともに、それに交差する方向（ｙ方向）に作用する一次元高周波電場から受ける力によってｙ方向へ変位する。質量電荷比が互いに異なるイオン種は、変位量の違いによって分離される。この際、被測定イオン種が電場の作用を１周期間受けて分離空間（５）から出射されるように、加速電圧および一次元高周波電場の周期を設定する。

Mass spectrometer

In the mass spectrometer of the present invention, a flight space is provided before the mass analyzer, and the flight space includes a loop orbit on which ions fly repeatedly. While ions fly on the loop orbit repeatedly, ion selecting electrodes placed on the loop orbit selects object ions having a specific mass to charge ratio in such a manner that, for a limited time period when the object ions are flying through the ion selecting electrodes, an appropriate voltage is applied to the ion selecting electrodes to make them continue to fly on the loop orbit, but otherwise to make or let other ions deflect from the loop orbit. If ions having various mass to charge ratios are introduced in the loop orbit almost at the same time, the object ions having the same mass to charge ratio continue to fly on the loop orbit in a band, but ions having mass to charge ratios different from that are separated from the object ions while flying on the loop orbit repeatedly. Even if the difference in the mass to charge ratio is small, the separation becomes large when the number of turns of the flight becomes large. After such a separation is adequately achieved, the ion selecting electrodes can select the object ions with high selectivity, or at high mass resolution. By adding dissociating means, fragment ions originated only from the selected object ions can be analyzed, which enables the identification and structural analysis of the sample at high accuracy.

Mass analyzer of annular cylindrical electric field

本发明涉及一种用于质谱仪的质量分析器，在质谱分析检测方面有多种应用，属于仪器仪表技术领域。本发明物理结构为套在一起的两个圆柱面电极，其轴线重合，两个圆柱面电极之间加一定电压，形成环柱形电场。当带电粒子以一定角度射入环柱形电场时，将会在环柱形电场中做螺旋运动，运动数圈后引入检测器。根据带电粒子入射环柱形电场时的速度特征不同，可形成两种不同的质量分析器，一种是空间分离类型，一种是时间分离类型。两种质量分析器都具有结构简单、体积小巧、制做容易、分离高效的特点。

Particle analyzer apparatus and method

A time-of-flight analyzer, such as a secondary ion surface analyzer, and method are disclosed wherein a beam of charged particles is created, magnified, directed along a path to a detector, detected and the time of flight measured. An emission lens is positioned on the path to produce the magnification and an additional lens can be provided along the path to produce variable magnification. A field aperture along the path limits the size of the image and a contrast diaphragm limits the lateral ion velocity. Two or more, preferably three, particle steering analyzers are sequentially positioned along the path from the emission lens to the detector with each of the three analyzers steering the particles through substantially 90 degrees.

Mass spectrometer

A basic ion optical system ( 2 ) in which the temporal focusing of ions is ensured includes a plurality of sector-shaped electrodes ( 11, 12, 13 , and 14 ), an ion injection slit ( 15 ), and an ion ejection slit ( 16 ), which are placed on the same plane. A plurality of basic ion optical systems ( 2 ) are placed in such a manner as to be mutually separated at predetermined intervals in the direction approximately orthogonal to their planes. The ion ejection slit ( 16 ) of the lower-stage basic ion optical system ( 2 ) and the ion injection slit ( 15 ) of the next-stage basic ion optical system ( 2 ) are connected to each other via another basic ion optical system ( 3 ) in which the temporal focusing of the ions is ensured. Accordingly, the flight distance can be elongated while assuredly achieving the temporal focusing of the ions as an entire ion optical system ( 1 ), and a three-dimensional space can be efficiently utilized to compactify the ion optical system ( 1 ).

Atmospheric pressure ion source interface

大气压离子源接口

提供了一种用于在光谱仪处从大气压离子源接收载气中的离子的接口。所述光谱仪配置成在较低压力下分析所接收的离子。所述接口包含：具有下游孔口的接口真空腔室；限定轴向孔的支撑组件，所述轴向孔布置成允许可移出的毛细管延伸贯穿其中，离子从所述大气压离子源通过所述毛细管被接收并被引向所述下游孔口；以及射流中断器，其位于所述轴向孔下游并且配置成仅当所述毛细管未完全插入贯穿所述轴向孔时才中断所述轴向孔与所述下游孔口之间的气流。

质量分析器和质谱仪

一种质量分析器和质谱仪。该质量分析器具有：在2D参考平面中提供静电场的扇形电极集，其沿着与参考平面局部正交的漂移路径延伸以提供3D静电场区域；以及用于将离子注入质量分析器的注入接口，使得注入离子通过3D静电场区域沿3D参考轨迹导向，根据3D参考轨迹，离子在沿漂移路径漂移的同时转动多圈，各圈与2D参考平面中的已完成轨道相对应。注入接口包括使离子沿漂移路径的方向偏转的注入偏转器，注入接口优选使得沿3D参考轨迹导向的离子在被注入之后与注入口保持足够的距离，使得其基本不受注入口周围电场扭曲的影响。

Mass or mobility spectrometer having high sampling duty cycle

質量分析方法及び質量分析装置

Time of flight mass analyser with spatial focussing

A Time of Flight mass analyser is disclosed comprising: at least one ion mirror 34 for reflecting ions; an ion detector 36 arranged for detecting the reflected ions; a first pulsed ion accelerator 30 for accelerating an ion packet in a first dimension (Y-dimension) towards the ion detector 36 so that the ion packet spatially converges in the first dimension as it travels to the detector 36; and a pulsed orthogonal accelerator 32 for orthogonally accelerating the ion packet in a second, orthogonal dimension (X-dimension) into one of said at least one ion mirrors 34.

Mass spectrometer

An ion optical system to form a loop orbit is provided to sufficiently ensure required performance such as ion transmission efficiency while making it easy to design the system by alleviating a space-focusing condition. The loop orbit of the ion optical system is realized so as to satisfy (t|x)=(t|α)=(t|δ)=0 as the time-focusing condition and to satisfy −2<(x|x)+(α|α)<2, and −2<(y|y)+(β|β)<2 as the space-focusing condition. (x|x) and other similar terms are constants determined by the elements indicated in the parenthesis in a general expression format of the ion optical system. The conditions are substantially alleviated as opposed to the conventional space-focusing condition where each of (x|x), (α|α), (y|y) and (β|β) needs to be ±1. Thus, the parameters to decide the shape of electrodes by which the ion optical system is configured have higher degree of freedom.

Ionenführungsarray

具有高采样占空比的质谱仪

一种多反射飞行时间质谱仪(8)，包括：质量过滤器或质量分离器(6)；离子加速器(14)，该离子加速器用于脉冲离子包；离子镜(10)，该离子镜被布置成接收来自离子加速器(14)的离子并且当离子在第二维度(z维度)上行进时在离子镜(10)之间在第一维度(x维度)上反射离子；第一离子反射器(20)和第二离子反射器(22)，第一离子反射器和第二离子反射器被布置成使得当它们都被激活时，它们在第二维度上来回反射离子；离子检测器(16)，该离子检测器被布置成当离子反射器(20,22)中的第一离子反射器被去激活时接收离子；和控制电路，该控制电路配置为：控制离子加速器(14)以执行第一脉冲序列，第一脉冲序列将第一多个离子包脉冲到离子镜(10)中；控制反射器(20,22)，使得所述多个包中的离子同时由反射器(20,22)在第二维度上来回反射；以及控制能够由质量过滤器或质量分离器(6)传送到离子加速器(14)的质荷比的范围，以及第一反射器(20)被激活和去激活的定时，使得来自所述多个离子包的基本上所有的离子在检测器(16)处被接收之前在第二维度上经历相同次数的反射。

Mass or mobility spectrometer having high sampling duty cycle

Method of selecting ions by ion mobility separation and isolation of ions

A method of selecting ions comprises selecting ions corresponding to a target ion of interest by separating analyte ions according to their ion mobility, isolating first ions of the analyte ions, separating the first ions according to their ion mobility, and isolating second ions of the first ions. Preferably, the separation is accomplished by using a cyclic or closed-loop separator.

質量分析装置

１周の周回軌道は同一の２つの時間収束単位構造（Ｔ１、Ｔ２）により形成される。時間収束単位構造（Ｔ１及びＴ２）は入射側に時間収束点（Ｐ１）、出射側に時間収束点（Ｐ２）を有し、イオンを略円弧形状に飛行させる基本イオン光学要素（１０）の前に長さＬ１の入射側自由飛行空間（１１）、後に長さＬ２の出射側自由飛行空間（１２）を持つ。外部から周回軌道にイオンを導入するために、同一構成の基本イオン光学要素（３０）をその出射端と基本イオン光学要素（１０）の入射端との距離がＬ１’となるように入射側自由空間（１１）中に挿入する。そして、基本イオン光学要素（３０）にイオンを入射する自由飛行空間の長さＬ０を、Ｌ０＝２（Ｌ１＋Ｌ２）−（Ｌ１’＋Ｌ２）で求まる値に設定する。これにより、出発点（Ｐｓ）から出射したイオンは時間収束点（Ｐ２）に達したときに時間収束性が担保される。

Mass analyzer with 3D electrostatic field

A mass analyser for use in a mass spectrometer, the mass analyser having: a set of sector electrodes spatially arranged to provide an electrostatic field in a 2D reference plane suitable for guiding ions along an orbit in the 2D reference plane, wherein the set of sector electrodes extend along a drift path that is locally orthogonal to the reference plane so that, in use, the set of sector electrodes provide a 3D electrostatic field region; and an injection interface configured to inject ions into the mass analyser via an injection opening such that the ions injected into the mass analyser are guided by the 3D electrostatic field region along a 3D reference trajectory according to which ions perform multiple turns within the mass analyser whilst drifting along the drift path, wherein each turn corresponds to a completed orbit in the 2D reference plane. The injection interface includes at least one injection deflector located within the mass analyser, the at least one injection deflector being configured to deflect ions injected into the mass analyser in the direction of the drift path, wherein the injection interface is preferably configured so that ions guided along the 3D reference trajectory are, after injection into the mass analyser, kept adequately distant from the injection opening such that they are substantially unaffected by electric field distortions around the injection opening.

多重反射飛行時間型質量分析計

多重反射飛行時間型質量分析計

【課題】従来、高感度かつ高分解能を維持するために、イオンミラー間においてミラーが延伸されている次元の集束を設ける必要があるとみなされてきた。【解決手段】イオン飛行経路が比較的短く維持され、デューティーサイクルが比較的高くされた、多重反射飛行時間型質量分析計が開示される。適度に高い感度と分解能とを維持しながら、ミラー（３６）が延伸されている次元（ｚ次元）におけるイオンの空間集束をなくすことができる。【選択図】図３

Method of selecting ions by ion mobility separation and isolation of ions

Systems and methods for multistage mass spectrometry utilizing an electrostatic ion trap

Systems and methods are disclosed for ion injection into an electrostatic trap. Various aspects of this disclosure provide a mass spectrometer system including a primary ion path including a plurality of quadrupoles; and a secondary ion path coupled to the primary ion path utilizing turning elements. The secondary ion path may include an electrostatic linear ion trap (ELIT), the ELIT being operable to analyze ions diverted from the primary ion path and return them to the primary ion path. The primary ion path may include a time-of-flight mass analyzer. The secondary ion path may be bi-directional. Ions may travel in a first direction when coupled into the secondary ion path using a first turning element in the primary ion path and may travel in a second direction when coupled into the secondary ion path utilizing a second turning element in the primary ion path. The secondary ion path may include a collision quadrupole.