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Небесная энциклопедия

Космические корабли и станции, автоматические КА и методы их проектирования, бортовые комплексы управления, системы и средства жизнеобеспечения, особенности технологии производства ракетно-космических систем

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Мониторинг СМИ и социальных сетей. Сканирование интернета, новостных сайтов, специализированных контентных площадок на базе мессенджеров. Гибкие настройки фильтров и первоначальных источников.

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Применить Всего найдено 6. Отображено 5.
26-09-2017 дата публикации

Plasma-assisted atomic layer epitaxy of cubic and hexagonal InN and its alloys with AIN at low temperatures

Номер: US0009773666B2

Described herein is a method for growing indium nitride (InN) materials by growing hexagonal and/or cubic InN using a pulsed growth method at a temperature lower than 300° C. Also described is a material comprising InN in a face-centered cubic lattice crystalline structure having an NaCl type phase.

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19-12-2013 дата публикации

Plasma-Assisted Atomic Layer Epitaxy of Cubic and Hexagonal InN and its alloys with AlN at Low Temperatures

Номер: US20130334666A1
Принадлежит: US Department of Navy

Described herein is a method for growing indium nitride (InN) materials by growing hexagonal and/or cubic InN using a pulsed growth method at a temperature lower than 300° C. Also described is a material comprising InN in a face-centered cubic lattice crystalline structure having an NaCl type phase.

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10-07-2014 дата публикации

REDUCTION OF BASAL PLANE DISLOCATIONS IN EPITAXIAL SiC USING AN IN-SITU ETCH PROCESS

Номер: US20140190399A1

A method of: providing an off-axis silicon carbide substrate, and etching the surface of the substrate with a dry gas, hydrogen, or an inert gas. 1. A method comprising:providing an off-axis silicon carbide substrate; andetching the surface of the substrate with a dry gas, hydrogen, or an inert gas.2. The method of claim 1 , wherein the substrate is a 4H-SiC substrate.3. The method of claim 1 , wherein the substrate is a 6H-SiC substrate4. The method of claim 1 , wherein the substrate is a 0-8° off-axis 4H-SiC substrate.5. The method of claim 1 , wherein the etching is performed with hydrogen.6. The method of claim 1 , wherein the etching is performed with silane.7. The method of claim 1 , wherein the etching is performed with argon.8. The method of claim 1 , wherein the etching is performed at 1450-1800° C.9. The method of claim 1 , wherein the etching is performed at 30-500 mbar of the dry gas.10. The method of claim 1 , wherein the etching is performed for up to 90 minutes.11. The method of claim 1 , further comprising:growing a doped buffer layer on the substrate after the etching.12. The method of claim 11 , wherein the doped buffer layer is doped with N.13. The method of claim 11 , wherein the doped buffer layer is doped with P.14. The method of claim 11 , wherein the doped buffer layer is about 0.5-30 μm thick.15. The method of claim 11 , further comprising:growing an epitaxial silicon carbide layer on the doped buffer layer. This application claims the benefit of U.S. Provisional Application No. 61/787,903, filed on Mar. 15, 2013. This application is a continuation-in-part application of pending U.S. patent application Ser No. 12/860,844, filed on Aug. 20, 2010, which claims the benefit of U.S. Provisional Application No. 61/235,455, filed on Aug. 20, 2009. These applications and all other publications or patent documents cited throughout this application are incorporated herein by reference.The present disclosure is generally related to SiC epitaxial growth ...

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10-07-2014 дата публикации

REDUCTION OF BASAL PLANE DISLOCATIONS IN EPITAXIAL SiC USING AN IN-SITU ETCH PROCESS

Номер: US20140193965A1

A method of: providing an off-axis 4H—SiC substrate, and etching the surface of the substrate with hydrogen or an inert gas. 1. A method comprising:providing an off-axis 4H—SiC substrate; andetching the surface of the substrate with hydrogen or an inert gas.2. The method of claim 1 , wherein the substrate is a 4° off-axis 4H—SiC substrate.3. The method of claim 1 , wherein the etching is performed with hydrogen.4. The method of claim 1 , wherein the etching is performed with argon.5. The method of claim 1 , wherein the etching is performed at 1620-1665° C.6. The method of claim 1 , wherein the etching is performed at 40-130 mbar of the hydrogen or inert gas.7. The method of claim 1 , wherein the etching is performed for 5-90 minutes.8. The method of claim 1 , further comprising:growing a doped buffer layer on the substrate after the etching.9. The method of claim 8 , wherein the doped buffer layer is doped with N.10. The method of claim 8 , wherein the doped buffer layer is about 6.5-8 μm thick.11. The method of claim 8 , further comprising:growing an epitaxial silicon carbide layer on the doped buffer layer. This application claims the benefit of U.S. Provisional Application No. 61/787,903, filed on Mar. 15, 2013. This application is a continuation-in-part application of pending U.S. patent application Ser. No. 12/860,844, filed on Aug. 20, 2010, which claims the benefit of U.S. Provisional Application No. 61/235,455, filed on Aug. 20, 2009. These applications are incorporated herein by reference.The present disclosure is generally related to SiC epitaxial growth.Since the ABB (Asea Brown Boveri, Inc.—Sweden) power company disclosed the forward voltage, V, drift problem that degraded their PiN diodes (Lendenmann et al., 353-356 (2001) 727-730), it has been well established that the Vdrift problem is due to stacking faults that originate from basal plane dislocations (BPDs) and that the only way to overcome this problem is to reduce the BPD density in low-doped ...

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21-05-2015 дата публикации

Epitaxial Growth of Cubic and Hexagonal InN Films and Their Alloys with AlN and GaN

Номер: US20150140789A1
Принадлежит: US Department of Navy

Described herein is a method for growing InN, GaN, and AlN materials, the method comprising alternate growth of GaN and either InN or AlN to obtain a film of In x Ga 1−x N, Al x Ga 1−x N, Al x In 1−x N, or Al x In y Ga 1−(x+y) N

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