Automated determination of locations of donor atoms
Опубликовано: 05-01-2022
Автор(ы): Lloyd Christopher Leonard Hollenberg, Muhammad Usman, Yi Zheng WONG
Принадлежит: University of Melbourne
Реферат: This disclosure relates to automatic determination of locations of one or more closely spaced donor atoms implanted into a semiconductor crystal lattice. A processor receives image data generated by a scanning tunnelling microscope (STM). The image data is indicative of a tunnelling current between a scanning tip and the crystal lattice at multiple image locations. The processor applies a trained machine learning model to the image data to determine a classification into one of multiple candidate configurations of the one or more donor atoms. The multiple candidate configurations relate to different locations of the one or more donor atoms in the semiconductor crystal lattice. Based on an output of the trained machine learning model, the processor determines the location of the one or more donor atoms in the semiconductor crystal lattice.
Automated determination of locations of donor atoms
Номер патента: WO2020176926A1. Автор: Lloyd Christopher Leonard Hollenberg,Muhammad Usman,Yi Zheng WONG. Владелец: THE UNIVERSITY OF MELBOURNE. Дата публикации: 2020-09-10.