КАЛИБРОВКА СИСТЕМЫ ОБНАРУЖЕНИЯ ИЗНОСА

Изобретение относится к ремням или тросам с покрытием, используемым, например, в лифтовых системах, используемых для подвешивания лифта и/или приведения его в действие. Способ обнаружения износа ремня или троса с покрытием, включающий измерение первоначального электрического сопротивления одного (одной) или большего количества кордов, прядей или проволок ремня или троса с покрытием. Первоначальное электрическое сопротивление калибруют путем повторения измерения первоначального электрического сопротивления и внесения совокупности значений измеренных первоначальных электрических сопротивления в базу данных. Определяют истинное значение первоначального электрического сопротивления из совокупности внесенных значений первоначального электрического сопротивления и сравнивают последующие измеренные значения электрического сопротивления указанного одного (одной) или большего количества кордов, прядей или проволок ремня или троса с покрытием с истинным значением первоначального сопротивления. Изобретение ...

АВТОМАТИЧЕСКИЙ ВОЛЬТМЕТР-КАЛИБРАТОР МОДУЛЬНОЙ ИЗМЕРИТЕЛЬНОЙ СИСТЕМЫ

Полезная модель относится к измерительной технике, в частности к калибровке измерительных модулей конфигурируемой модульной системы для комплексной автоматизированной проверки полупроводниковых приборов. Технический результат заключается в достижении совокупности следующих свойств устройства: высокая точность формирования и измерения напряжения; обеспечение диапазона измерения по напряжению до 2000 В; высокая помехозащищенность; высокая скорость переключения коммутатора; обеспечение универсальности при работе в составе многоканальной измерительной системы.

Стенд для проверки импульсного электромагнитного штепсельного реле железнодорожной автоматики

Полезная модель относится к устройствам для проверки состояния и контроля работоспособности электронных компонентов устройств железнодорожной автоматики и может быть применена в отрасли железнодорожного транспорта. Сущность полезной модели заключается в стенде для проверки импульсного электромагнитного штепсельного реле железнодорожной автоматики, содержащем корпус, внутри которого установлен блок управления с трансформаторами, а на передней панели установлены контрольные приборы и элемент выбора режима измерения, при этом элемент выбора режима выполнен с возможностью активации режима измерения длительности мостового перемыкания контактов ртутьсодержащего геркона и проверки всех характеристик упомянутого реле, а блок управления обеспечивает подключение контактов ртутного геркона упомянутого реле к контрольному прибору, обеспечивающему измерение времени мостового контакта реле. Технический результат, на достижение которого направлена полезная модель, заключается в обеспечении возможности ...

Мобильный стенд для диагностики электромагнитного штепсельного реле железнодорожной автоматики

Полезная модель относится к проверке состояния и контролю работоспособности электронных компонентов устройств железнодорожной автоматики и может быть применена в отрасли транспорта. Сущность полезной модели заключается в мобильном стенде для диагностики электромагнитного штепсельного реле железнодорожной автоматики, с корпусом и крышкой, при этом в корпусе выполнена ниша для размещения блока для подключения электромагнитного штепсельного реле железнодорожной автоматики, а корпус содержит выдвижной механизм для этого блока. Технический результат, на достижение которого направлена полезная модель, заключается в повышении компактности и обеспечении транспортабельности стенда для диагностики электромагнитного штепсельного реле железнодорожной автоматики с сопутствующим снижением риска повреждения компонентов стенда. 8 з.п. ф-лы, 3 ил.

АВТОМАТИЧЕСКИЙ КАЛИБРАТОР КАНАЛОВ ИЗМЕРЕНИЯ СИГНАЛОВ ДАТЧИКОВ ИЗМЕРИТЕЛЬНЫХ СИСТЕМ

Изобретение относится к измерительной технике и предназначено для проведения в автоматическом режиме метрологической поверки и калибровки каналов измерения сигналов датчиков быстродействующих информационно-измерительных систем. Сущность: устройство содержит устройство управления и имитаторы сигналов тензорезистора и мостовых тензорезисторных датчиков, выполненные с возможностью поочередного подключения к устройству управления. Имитаторы сигналов датчиков автоматического калибратора выполнены по схеме резисторного моста или цепи последовательно соединенных резисторов и формируют необходимое количество ступеней сигналов датчиков с различными диапазонами измерения и номинальными сопротивлениями датчиков. Технический результат: расширение функциональных возможностей автоматического калибратора, повышение точности определения коэффициентов функции преобразования. 2 ил.

ИМИТАТОР СИГНАЛОВ МОСТОВЫХ ТЕНЗОРЕЗИСТОРНЫХ ДАТЧИКОВ

Изобретение относится к измерительной технике и предназначено для имитации сигналов мостовых тензорезисторных датчиков при проведении метрологических исследований и калибровке быстродействующих измерительных систем в автоматическом режиме. Сущность заявленного решения заключается в том, что имитатор сигналов мостовых тензорезисторных датчиков, содержащий два коммутатора, выходы которых являются измерительными выходами имитатора, и резисторный мост, состоящий из двух параллельно соединенных цепей последовательно соединенных резисторов, первый и последний из которых в каждой цепи являются базовыми резисторами, которые своими выводами соединены с вводами питания моста, а остальные резисторы цепи являются дополнительными, при этом первая цепь включает четное количество m-1 дополнительных резисторов с равными сопротивлениями, а вторая цепь включает четное количество n-1 дополнительных резисторов с равными сопротивлениями, m выводов первой цепи между базовыми сопротивлениями соединены с соответствующими ...

Устройство для измерения комплексных коэффициентов передачи и отражения четырехполюсников СВЧ

Изобретение относится к области радиоизмерений. Устройство для измерения комплексных коэффициентов передачи и отражения четырехполюсников СВЧ содержит преобразователь СВЧ и двухканальный приемник промежуточной частоты. В состав преобразователя СВЧ входят первый направленный ответвитель, второй направленный ответвитель, испытуемый четырехполюсник СВЧ, третий направленный ответвитель, четвертый направленный ответвитель, первый переключатель, второй переключатель, первый смеситель СВЧ, второй смеситель СВЧ, третий смеситель СВЧ, третий переключатель, четвертый смеситель СВЧ, четырехплечий делитель вторых испытательных СВЧ-сигналов, двухчастотный синтезатор когерентных испытательных СВЧ-сигналов. При этом в состав двухканального приемника промежуточной частоты входят четвертый переключатель, дополнительный генератор, равноплечий делитель, пятый переключатель, шестой переключатель, седьмой переключатель, восьмой переключатель, девятый переключатель, переменный аттенюатор, блок управления, первый ...

СПОСОБ ОПРЕДЕЛЕНИЯ БЫСТРОДЕЙСТВИЯ СИСТЕМ АВТОМАТИЧЕСКОГО УПРАВЛЕНИЯ

Изобретение относится к области автоматизированных систем управления технологическими процессами (далее - АСУ ТП) и используется на производственных объектах для диагностики систем автоматического управления. Задачей изобретения является повышение надежности работы систем автоматического управления. Поставленная задача решается, а технический результат достигается тем, что в системах автоматического управления, содержащих контроллер, модули входных сигналов, модули выходных сигналов устанавливают дополнительный контроллер с портами ввода-вывода, входы (порты) которого соединяют с выходами модуля выходных дискретных сигналов, а выходы (порты) с входами модуля входных дискретных сигналов контроллера системы, один из портов вывода дополнительного контроллера соединяют с портом ввода, изменяют алгоритм работы контроллера таким образом, чтобы при получении логического сигнала от дополнительного контроллера реализовать программный перенос сигнала с входа модуля входных сигналов на выход модуля ...

СПОСОБ ОПРЕДЕЛЕНИЯ БЫСТРОДЕЙСТВИЯ СИСТЕМ АВТОМАТИЧЕСКОГО УПРАВЛЕНИЯ

Изобретение относится к области автоматизированных систем управления технологическими процессами (АСУ ТП), в частности для диагностики систем автоматического управления (САУ). Задачей полезной модели является повышение надежности работы систем автоматического управления. Поставленная задача решается, а технический результат достигается тем, что в системах автоматического управления, содержащих контроллер, модули входных сигналов (сигналов с датчиков), модули выходных сигналов (сигналы управления исполнительными механизмами) и частотные модули (преобразователи частоты), путем установки электрического проводника (перемычки) соединяют между собой один резервный выход модуля выходных дискретных сигналов, один резервный вход модуля входных дискретных сигналов и один резервный вход частотного модуля, изменяют алгоритм работы контроллера таким образом, что с резервного выхода модуля выходных сигналов подается логическая единица на резервный вход модуля входных сигналов, при обнаружении единицы ...

АВТОМАТИЧЕСКИЙ КАЛИБРАТОР МНОГОКАНАЛЬНОЙ ИЗМЕРИТЕЛЬНОЙ СИСТЕМЫ

Изобретение относится к измерительной технике и предназначено для проведения в автоматическом режиме метрологической поверки и аттестации каналов измерения сигналов тензорезисторных и терморезисторных датчиков быстродействующих измерительных систем, в которых измерительные и управляющие устройства соединены соответствующими магистралями с коммутаторами датчиков. Предлагается автоматический калибратор многоканальной измерительной системы, содержащий устройство управления калибратора, формирователь сигналов с выходами для каждой ступени сигнала и коммутатор калибратора, аналогичный коммутатору датчиков поверяемой системы, при этом выход каждой ступени формирователя сигналов подключен к соответствующему входу коммутатора калибратора, измерительный выход которого соединен с каждым измерительным входом коммутатора датчиков поверяемой системы, отличающийся тем, что устройство управления калибратора содержит двоичный счетчик ступеней, выходы которого соединены с управляющими входами номера точки ...

КАЛИБРОВКА СИСТЕМЫ ОБНАРУЖЕНИЯ ИЗНОСА

... 1. Способ обнаружения износа ремня или троса с покрытием, согласно которому:- измеряют значение первоначального электрического сопротивления одного (одной) или большего количества кордов, прядей или проволок ремня или троса с покрытием,- калибруют значение первоначального электрического сопротивления путем: повторения измерения значения первоначального электрического сопротивления,- внесения совокупности измеренных значений первоначальных электрических сопротивлений в базу данных и- определения истинного значения первоначального сопротивления из внесенной совокупности значений первоначальных электрических сопротивлений, и- сравнивают последующие измеренные значения электрического сопротивления указанного одного (одной) или большего количества кордов, прядей или проволок ремня или троса с покрытием с истинным значением первоначального сопротивления.2. Способ по п. 1, согласно которому истинное значение первоначального сопротивления определяют путем вычисления среднего значения совокупности ...

СПОСОБ КАЛИБРОВКИ И ПОВЕРКИ ИЗМЕРИТЕЛЕЙ ДЕФЕКТНОСТИ ИЗОЛЯЦИИ ОБМОТОЧНЫХ ПРОВОДОВ

Изобретение может быть использовано при калибровке и поверке измерителей дефектности изоляции обмоточных проводов. Способ заключается в том, что размещают отрезок изолированного провода на поверхности диэлектрического цилиндрического диска, концы указанного отрезка провода выводят на боковую поверхность указанного диска и электрически соединяют с металлической осью, на которой закреплен диск, создают в изоляции провода один дефект в виде точечного прокола изоляции до жилы провода, к поверхности упомянутого провода прижимают подпружиненный металлический дискообразный электрод-датчик дефектов, на ось которого подают высокое постоянное напряжение, приводят диэлектрический диск во вращение, измеряют скорость перемещения провода и многократно протягивают упомянутый дефектный участок изоляции провода через электрод-датчик дефектов, и при каждом прохождении дефектного участка изоляции провода через электрод-датчик дефектов, снимают с него осциллографом сигналы импульсов дефекта, с использованием ...

САМОИДЕНТИФИЦИРУЮЩИЙСЯ ПЛОСКИЙ КАЛИБРОВОЧНЫЙ ОБЪЕКТ ДЛЯ ИЗМЕРИТЕЛЬНЫХ СРЕДСТВ ОПТИЧЕСКОГО ДИАПАЗОНА

Изобретение относится к области оптических измерений. Технический результат заключается в расширении арсенала средств. Самоидентифицирующийся плоский калибровочный объект для измерительных средств оптического диапазона, инвариантный к операции масштабирования, состоящий из находящейся в центре объекта квадратной области распознавания, разделенной двумя диагоналями на четыре треугольника, два черного и два белого цвета, расположенных поочередно, отличающийся тем, что область распознавания предназначена для определения координат центра калибровочного объекта для определения размера маркера и границы области кодирования, состоящей из двух полос, расположенных напротив двух полос области ограничения относительно квадрата области распознавания, и разделенных на квадратные зоны черного и белого цвета, предназначенных для кодирования двоичным кодом идентификатора-номера данного калибровочного объекта, и использующегося для автоматического декодирования идентификатора калибровочного объекта. 3 ...

Способ контроля характеристики преобразования феррозонда

Предложенное изобретение относится к области магнитных измерений, в частности к производственному контролю характеристики преобразования феррозондом магнитного поля (МП) Земли. Способ контроля характеристики преобразования феррозонда включает подключение источника возбуждения к обмотке возбуждения феррозонда, подключение измерительного устройства к сигнальной обмотке феррозонда, размещение феррозонда в магнитном экране, подключение источника постоянного тока к сигнальной обмотке, установку ряда величин постоянного тока в сигнальной обмотке феррозонда и измерение ряда напряжений второй гармоники в выходном сигнале феррозонда измерительным устройством. При этом ряд величин постоянного тока i ограничивают тремя значениями i∈(i, i= 0, i) с j = 1, 2, 3, значение тока iустанавливают близким к предельному значению рабочего диапазона феррозонда, контролируя напряжение U(i) второй гармоники в выходном сигнале феррозонда, устанавливают значение тока iтакой величины, при котором напряжение U(i) измерительного ...

Калибровочная плата

Полезная модель, предназначенная для зондовых измерений S-параметров интегральных СВЧ-устройств, относится к средствам измерений на сверхвысоких частотах в микроэлектронном производстве. Калибровочная плата содержит симметричные контактные площадки вида SG-SG и GS-GS, группы элементов SOLT, реализующих следующие режимы: Короткое Замыкание (Short), Холостой Ход (Open), Согласованная Нагрузка 50 Ом (Load), Перемычка (Thru), площадку для планаризации зондов. Плата дополнительно содержит группы элементов SOLT для несимметричных контактных площадок вида GS-SG и SG-GS, группы элементов SOLT всех видов SG-SG, GS-GS, GS-SG, SG-GS расположены относительно друг друга таким образом, чтобы минимизировать перемещение зондов на этапе калибровки, и дополнительно введены элементы Thru для несимметричных контактных площадок вида GS-SG, SG-GS в количестве, достаточном для равномерного использования всех 4-х групп элементов калибровки SOLT. Технический результат состоит в оптимизации процедуры SOLT-калибровки ...

Способ компенсации температурных погрешностей в формирователе ступеней приращения сопротивления имитатора сигналов тензорезистора и формирователь ступеней приращения сопротивления имитатора сигналов тензорезистора для его осуществления

Изобретения относятся к измерительной технике и предназначены для компенсации температурных погрешностей в формирователе ступеней приращения сопротивления при изменении температуры окружающей среды относительно 20 °С в пределах рабочего диапазона температур быстродействующих измерительных систем, в которых применяется этот формирователь для метрологической поверки и калибровки. Техническим результатом при реализации заявленной группы изобретений является уменьшение до заданной величины температурных погрешностей за счет уменьшения ТКС опорного резистора и цепей из m-1 и n-1 резисторов, предназначенных для формирования ступеней приращения сопротивлений в формирователе ступеней приращения сопротивления, при изменении температуры окружающей среды в заданном диапазоне. 2 н.п. ф-лы, 3 ил., 3 табл.

GERÄT UND VERFAHREN ZUR EICHUNG UND VALIDIERUNG VON HOCHLEISTUNGS-STROMVERSORGUNGEN FÜR TESTGERÄTE

Battery system has multiple interconnected batteries, where monitoring electronics of batteries have units for checking plausibility to execute mutual plausibility check of current values determined by current measuring unit of batteries

The battery system (20) has multiple batteries (21,22), which are connected with each other, where the monitoring electronics of the batteries have units for checking plausibility. The plausibility checking units are arranged to execute a mutual plausibility check of a current value (I-1) determined by a current measuring unit of the former battery and of another current value (I-2) determined by the current measuring unit of the latter battery. Independent claims are included for the following: (1) a method for checking the plausibility of battery current measurements; and (2) a motor vehicle with a drive train.

Gerät, Verfahren, Programm und Speichermedium für Fehlerfaktormessung und Output-Messgerät und Input-Messgerät, die mit dem Gerät für Fehlerfaktormessung ausgestattet sind

Fehlerfaktormessgerät (40), das in einem Signalsystem, umfassend [1] eine erste Signalerzeugungseinheit (1), die eine erste Signalquelle (10), welche ein erstes Signal erzeugt, und einen ersten Ausgabeanschluss (19), der das erste Signal ausgibt, umfasst, [2] eine zweite Signalerzeugungseinheit (2), die eine zweite Signalquelle umfasst, die ein zweites Signal erzeugt, und einen zweiten Ausgabeanschluss (29), der das zweite Signal ausgibt und [3] ein Verbindungswerkzeug (30), das den ersten Ausgabeanschluss (19) und den zweiten Ausgabeanschluss (29) miteinander verbindet, einen Fehlerfaktor in der zweiten Signalerzeugungseinheit (2) misst basierend auf einem Messergebnis des ersten Signals und einem Messergebnis des zweiten Signals, umfassend: eine Messeinheit (42) für die Charakteristik eines Verbindungswerkzeugs (30), die eine Charakteristik des Verbindungswerkzeugs (30) misst basierend auf dem Messergebnis des ersten Signals und dem Messergebnis des zweiten Signals; eine Messeinheit ( ...

Stromsensoranordnung

Stromsensoranordnung mit einem magnetischen Modul, das ein zu einem ihm zugeführten, zu messenden Strom proportionales, potentialfreies Signal erzeugt und mit einem mit dem magnetischen Modul elektrisch gekoppelten Elektronikmodul zur Auswertung des potentialfreien Signals vom magnetischen Modul und Erzeugen einer zum messenden Strom proportionalen analogen Ausgangsspannung aus dem potentialfreien Signal, wobei das Elektronikmodul einen Referenzspannungseingang zur Einprägung einer Referenzspannung von außen oder einen Referenzspannungsausgang zum Herausführen der Referenzspannung nach außen oder beides, Referenzspannungseingang und Referenzspannungsausgang, aufweist, das Elektronikmodul bei Auftreten mindestens einer Fehlfunktion mindestens ein Fehlersignal erzeugt und das mindestens eine Fehlersignal der Referenzspannung am Referenzspannungseingang oder Referenzspannungsausgang oder an beiden überlagert wird.

Zweispannungsbatterie mit Stromsensoren und Kalibrierverfahren hierfür

Die Erfindung betrifft eine Zweispannungsbatterie für ein Fahrzeug umfassend eine Mehrzahl von Batteriezellen, wobei jeweils eine Gruppe von Batteriezellen zu einem Batteriezellblock verbunden ist, und umfassend eine Batterieelektronik mit einer Mehrzahl von Leistungsschaltelementen zum seriellen und/oder parallelen Verbinden jedenfalls einzelner Batteriezellblöcke, wobei in einer ersten Verbindungsanordnung der Batteriezellblöcke eine erste Spannung und wobei in einer zweiten Verbindungsanordnung der Batteriezellblöcke eine zweite Spannung bereitgestellt ist, dadurch gekennzeichnet, dass wenigstens einzelnen Batteriezellblöcken ein Blockstromsensor mit einem Messwiderstand zugeordnet ist, welcher ausgebildet ist zum Messen eines Blockstroms durch den einen zugeordneten Batteriezellblock.

Verfahren zum Feststellen von Einbau- und/oder Kalibrierungsfehlern einer Mehrzahl von Signalauskopplungseinheiten eines oder mehreren Teilentladungsmesssysteme

Verfahren zur Kalibrierung eines vektoriellen Netzwerkkanalysators

Vorrichtung und Verfahren zur Zustandserfassung einer HF-Spule an oder in einer Magnetresonanzvorrichtung

Die Erfindung betrifft eine Vorrichtung und ein Verfahren zur Zustandserfassung einer HF-Spule an oder in einer Magnetresonanzvorrichtung, wobei die Vorrichtung an eine HF-Spule anordbar ist und eine Zustandserfassungseinheit umfasst, wobei die Zustandseinheit ausgebildet ist, einen Zustand einer HF-Spule zu erfassen und ein zustandsabhängiges Ausgabesignal zu erzeugen.

Gleichstrom-Gleichstrom-Wandler

Der DC/DC-Wandler ist mit einem Ausfalldetektor versehen, der einen Ausfall in einem ersten Ausgangsseiten-Spannungssensor, einem zweiten Ausgangsseiten-Spannungssensor oder/und einem Eingangsseiten-Spannungssensor detektiert, basierend auf entsprechenden Detektionswerten des Eingangsseiten-Spannungssensors, des ersten Ausgangsseiten-Spannungssensors, des zweiten Ausgangsseiten-Spannungssensors und eines Gleichstromquellen-Spannungssensors.

Method and circuit for fault recognition in resistor measuring bridges

A method and a circuit for fault recognition in resistor measuring bridges (1, 2, 3, 4) is proposed. In this case one pole (5) of the measuring bridge (1, 2, 3, 4) is connected to earth via a resistor (12) at uniform or non-uniform time intervals. A fault in the measuring bridge (1, 2, 3 ,4) is inferred from the jump in the bridge voltage (UB) which is then produced. ...

Messvorrichtung mit einem sicheren Messkanal

Die Erfindung betrifft eine Messvorrichtung (1) mit wenigstens zwei Messkanälen (2a, 2b), jeder Messkanal (2a, 2b) umfassend einen A/D-Wandler (4a, 4bnen digitalen Spannungswert, und eine Logikeinheit (5a, 5b), die mit dem A/D-Wandler (4a, 4b) verbunden ist, um den digitalen Spannungswert zu empfangen, wobei wenigstens ein Messkanal (2a, 2b) als sicherer Messkanal (2a, 2b) mit einem Multiplexer (3a, 3b) ausgeführt ist, wobei mit dem Multiplexer (3a, 3b) die analoge Spannung zwischen einer Messspannung (UMess1, UMess2) und einer Referenzspannung (URef1, URef2) umschaltbar ist, und die Logikeinheit (5a, 5b) wenigstens eines anderen Messkanals (2a, 2b) als Referenzerzeuger ausgeführt ist, um die Referenzspannung (URef1, URef2) bereitzustellen und den Multiplexer (3a, 3b) zwischen der Messspannung (UMess1, UMess2) und der Referenzspannung (URef1, URef2) umzuschalten.

Sensing of objects

Automatic calibration of a network analyzer

Voltage sensor

A sensor arrangement for checking whether a conductor (not shown) is live comprises a sensor (20) for sensing the presence of a voltage and means IC1b for inhibiting output at an LED (1) if the sensed voltage is below a predetermined voltage. A relaxation oscillator IC1C provides test signals to the sensor 20 to test the operation of the arrangement. ...

Determining the transmission function of a measurement apparatus e.g. a spectrum analyser

For the determination of the transmission function of a measurement apparatus, in particular of a spectrum analyser, a calibration signal, modulated in such a way that a flat spectrum arises within the useful frequency bandwidth, is fed into the input of the measurement apparatus; in a computer, the modulation signal is calculated from the digitised output signal of the measurement apparatus, and the desired transmission function is then calculated therefrom according to absolute value and phase.

High frequency circuit analyser

High frequency circuit analyser

An analyser includes an active load pull circuit 1 connected to a device under test (DUT) 6. The DUT may be a high power transistor for example. The circuit 1 contains a filter 8 and a signal modifier 9. The signal modifier 9 alters the phase and magnitude of an input signal bout from the device under test 6 before the signal is fed back to the DUT as input aout. The signal modifier therefore allows unwanted positive feedback or signal resonances to be avoided by changing the gain of the circuit 1. The analyser then logs the signals at the ports of the DUT, allowing the DUT to be analysed.

Atomic force microscope (AFM) cantilever calibration

A micro-machined capacitive atomic force microscope (AFM) cantilever calibration device has a platform for landing the AFM cantilever tip and one or more supporting legs to provide sprung resistance to the platform. A capacitive sensor measures the combined spring constant of the one or more supporting legs with respect to displacement perpendicular to the platform surface. A method of determining the spring constant of a structure (such as the landing platform of the calibration device) is also disclosed, along with an AFM cantilever having a capacitive sensor to determine the spring constant of the cantilever.

Image enhancement for resistivity features in oil-based mud image

Detecting sensor error

An apparatus 200b and method is disclosed for detecting sensor error, in a system measuring e.g. angle of rotation in, for example, a power steering system. Two channels comprising respective magnetic sensing elements 102a-b, for instance anisotropic magneto-resistance (AMR) sensors, are fed into a third channel (shown but not labelled), in addition to all three channels being fed into processor 210, which computes expected third channel data, detecting sensor error based at least partly on a comparison of expected with actual third channel data. The sensing elements may be oriented at different respective non-zero angles with the first such angle possibly 45 degrees. The angle may be computed using an arctan function and channels may further comprise amplifiers A1-A3 and sampling circuits S1-S3. Each sensing element of the first and second channels may comprise a full bridge circuit, outputs being given from half-bridges of the respective full bridge circuits.

Apparatus and method for estimating absolute axes' orientations for a magnetic detection system

A system for determining an orientation of a nitrogen vacancy (NV) diamond material is disclosed. The system includes the NV diamond material having a plurality of NV centers, a magnetic field generator that generates a magnetic field, a radio frequency (RF) excitation source that provides RF excitation, an optical excitation source that provides optical excitation, an optical detector that receives an optical signal emitted by the NV diamond material, and a controller. The controller controls the magnetic field generator to generate a control magnetic field and controls the magnetic field generator to successively generate calibration magnetic fields. The controller successively receives light detection signals from the optical detector, stores measurement values based on the successively received light detection signals, and calculates an orientation of the NV diamond material based on the stored measurement values.

Detecting sensor error

Magnetometer

Sensing motor current

CAPACITANCE MEASURING CIRCUIT

Sensing of objects

ELECTRICAL CIRCUIT ARRANGEMENTS FOR GENERATING MODULATION

... 1533984 Calibrating measuring instruments RACAL DANA INSTRUMENTS Ltd 7 Jan 1976 [29 April 1975 3 July 1975] 17659/75 and 27972/75 Heading G1U A modulation generating signal includes means for selectively providing an A. M. or F. M. modulated carrier signal, with a calibration means for selectively providing a time varying modulating signal or a fixed modulating signal. The arrangement shown provides a signal having precisely determined levels of frequency or amplitude modulation, for feeding to modulation measuring apparatus (e.g. as disclosed in Specification 1509913) for calibration. For amplitude modulation, the switches 15, 26 and 65 are set as shown. Oscillator 10 is set to a required modulating frequency by switch 12 and the switch 20 set to feed the negative peak signal via attenuator 21 (set at OdB) to the modulating input of amplitude modulator 66. Voltage controlled oscillator 28 is set by control 30 to produce a 0.6MHz signal which is converted in a phase-lock loop 42, 44, 46 ...

Resistive sensor based data acquisition using low distortion analog front-end and digital gain error correction

A data acquisition system (DAS) 20 for processing an input signal from a resistive sensor 15 includes: a sensor signal path 43 that digitizes the input signal, wherein an input impedance of the sensor signal path attenuates the input signal; and a gain error corrector 45 to apply a correction factor to the digitized input signal to compensate for a loading effect to the resistive sensor. The sensor signal path may include an inverting amplifier that provides low distortion for the input signal and e.g. a delta-sigma, SAR, pipelined, or auxiliary ADC. A sensor characterization path 42 digitizes the sensor resistance which the gain error corrector uses, along with the inverting amplifier input impedance, to calculate the gain error correction factor. Temperature drift may be accounted for. The resistive sensor may be a Hall sensor.

VERFAHREN UND VORRICHTUNG ZUM LOKALISIEREN VON MÖGLICHERWEISE FEHLERHAFTEN STIFTEN IN EINEM PRÜFADAPTER SOWIE STIFTZIEHWERKZEUG

CALIBRATION ADAPTER

AUTOMATIC TEST EQUIPMENT SELF CHECK

PROCEDURE AND DEVICE FOR EXAMINING BASES IN THE CIRCUIT

DIAGNOSTIC PROCEDURE OF A MALFUNCTIONING WITH EQUIPMENT TO THE RECOGNITION OF ABNORMAL TENSION, SECONDARY BATTERY SYSTEM AND HYBRID VEHICLE

Apparatus for calibrating a battery simulator

Die vorliegende Erfindung betrifft eine Vorrichtung (1) zum Kalibrieren eines Batteriesimulators (2) mit einem Eingang (10) und einem Ausgang (12), wobei zwischen Eingang (10) und Ausgang (12) ein Strompfad (14) mit einer Vorrichtung (18) zum Messen der Stromstärke und mit zumindest einem Kondensator (16) vorgesehen ist. Weiters kann ein Spannungspfad (15) zwischen Eingang (10) und Ausgang (12) mit einer Vorrichtung (19) zum Messung der Spannung und/oder ein Stromwandler (20), in dessen Sekundärstrom die Vorrichtung (18) zum Messen der Stromstärke geschaltet ist, vorgesehen sein. Wenn ein Batteriesimulator (2) an die Vorrichtung (1) angeschlossen wird, kann dieser den Kondensator (16) laden und anschließend der Kondensator (16) den Batteriesimulator (2) laden, während die Stromstärke und Spannung gemessen werden und anhand dessen die internen Messgeräte (32, 34) des Batteriesimulators (2) kalibriert werden.

SYSTEM AND PROCEDURE FOR THE TEST MOUNTING PLATE CHARACTERISATION

DATA OPTIMIZATION PROCEDURE FOR PROBE MAP ANALYSIS AND FRICTION MARK ANALYSIS

Application of electrochemical impedance spectroscopy in sensor systems, devices, and related methods

A diagnostic Electrochemical Impedance Spectroscopy (EIS) procedure is applied to measure values of impedance-related parameters for one or more sensing electrodes. The parameters may include real impedance, imaginary impedance, impedance magnitude, and/or phase angle. The measured values of the impedance-related parameters are then used in performing sensor diagnostics, calculating a highly-reliable fused sensor glucose value based on signals from a plurality of redundant sensing electrodes, calibrating sensors, detecting interferents within close proximity of one or more sensing electrodes, and testing surface area characteristics of electroplated electrodes. Advantageously, impedance-related parameters can be defined that are substantially glucose-independent over specific ranges of frequencies. An Application Specific Integrated Circuit (ASIC) enables implementation of the ElS-based diagnostics, fusion algorithms, and other processes based on measurement of ElS-based parameters.

Validation of electric power system monitoring systems

The present disclosure provides systems and methods for validating electric power delivery monitoring systems, including, but not limited to, current transformers (CTs) and voltage potential transformers (PTs). According to various embodiments, a first IED monitors a portion of an electric power delivery system via one or more CTs and/or PTs. A second IED monitors the portion of the electric power delivery system via one or more additional CTs and/or PTs. Each IED may generate an event report, containing measurement data, associated with each respective measurement equipment. A validation module may compare the event reports in order to validate that the lEDs and/or the underlying measurement equipment are functioning correctly. According to various embodiments, the validation module may be configured to align the event reports from two lEDs using an event trigger common to both lEDs.

Method and device for non-invasive root phenotyping

The present disclosure provides for an electronic sensor for detecting a root of a plant in soil, the electronic sensor that includes a first conductor plate configured to be disposed in soil, a switch, a power supply, and signal extractor. The switch is electrically coupled to the first conductor plate and is configured to switch between a first mode and a second mode. The power supply is electrically coupled to the switch and is configured to provide an electrical charge to the first conductor plate in the first mode of the switch. The signal extractor is electrically coupled to the switch and is configured to extract a signal response at the first conductor plate in the second mode of the switch. The present disclosure further provides a second conductor plate configured to be disposed in soil adjacent to and substantially parallel to the first conductor plate. The second conductor plate is electrically coupled to ground.

Method and apparatus for testing a capacitive sensor

HALL EFFECT DEVICE TEST CIRCUIT

METHOD AND APPARATUS FOR JUDGING THE CALIBRATION OF VOLTAGE ATTENUATION PROBES

... : This invention relates to a method and apparatus for judging the calibration of a voltage attenuation probe. A square-wave signal is applied to the probe to be judged. A reference level is adjusted to be within a selected range of a peak level of the output signal of the probe. The reference level is compared with the output signal from the probe at a plurality of points along a portion of the output signal to provide a comparison result. A juding takes place as to whether or not a duty factor of the comparison result is equal to a known duty factor of the square-wave signal. The duty factor of the comparison result is computed according to the number of points at which the probe output signal is greater in magnitude than the reference level. The probe is judged to be calibrated when the duty factors of the comparison result and the square-wave signal are equal to one another.

HALL EFFECT DEVICE TEST CIRCUIT

HALL EFFECT DEVICE TEST CIRCUIT A Hall effect device test circuit which detects Hall effect device operate and release point failures. A magnetic field circuit, an analog to-digital conversion circuit, a storage circuit, a comparison circuit and a visual indicator circuit are included. The magnetic field circuit causes the Hall effect device under test to switch between its operate and release states. The analog-to-digital conversion circuit provides a digital value, representative of the intensity of the magnetic field existing at the time of switching. These digital values are then stored in the storage circuit. The comparison circuit compares the stored switching values to predetermined thresholds and causes an appropriate visual pass/fail visual signal to be provided.

GROUND FAULT DETECTOR

An apparatus includes an interruption circuit in a power delivery path, and a fault detection circuit configured to provide a fault signal to selectively cause the interruption circuit to interrupt power delivery, wherein the fault detection circuit includes a fault detection integrated circuit and a sensing coil configured to sense a differential current between a phase conductive path and a neutral conductive path in the power delivery path. A processor is configured to selectively control a fault simulation circuit to simulate a fault in the power delivery path, detect a response of the fault detection circuit to the simulated fault, and determine if the response of the fault detection circuit is an expected response. The processor provides an override signal to the interruption circuit to prevent the interruption circuit from receiving a fault signal from the fault detection circuit during, and for a predetermined time after, the simulated fault.

SENSOR DEVICE FOR CONNECTION TO A MEASUREMENT CONNECTION OF A CAPACITIVELY CONTROLLED BUSHING

The invention relates to a sensor device (2) for connection to a measurement connection of a capacitively controlled feedthrough. An adapter (5) can be connected to the measuring connection and a fastening device. A sensor housing (8) can be connected to the fastening device by means of the adapter (5).

BUILT-IN TESTING OF AN ARC FAULT/TRANSIENT DETECTOR

The present invention relates to built-in testing of detectors for the detection of electrical arc faults or transients, where the detector is integrated into or electrically coupled to an electrical power supply system.

APPLICATION OF ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY IN SENSOR SYSTEMS, DEVICES, AND RELATED METHODS

A diagnostic Electrochemical Impedance Spectroscopy (EIS) procedure is applied to measure values of impedance-related parameters for one or more sensing electrodes. The parameters may include real impedance, imaginary impedance, impedance magnitude, and/or phase angle. The measured values of the impedance-related parameters are then used in performing sensor diagnostics, calculating a highly-reliable fused sensor glucose value based on signals from a plurality of redundant sensing electrodes, calibrating sensors, detecting interferents within close proximity of one or more sensing electrodes, and testing surface area characteristics of electroplated electrodes. Advantageously, impedance-related parameters can be defined that are substantially glucose-independent over specific ranges of frequencies. An Application Specific Integrated Circuit (ASIC) enables implementation of the ElS-based diagnostics, fusion algorithms, and other processes based on measurement of ElS-based parameters.

RADIATOR CALIBRATION

A method for calibrating a magnetic field generator (40) including fixing one or more magnetic field sensors (20, 22, 24) to a probe (26) in known positions and orientations and selecting one or more known locations in the vicinity of the magnetic field generator. The magnetic field generator (40) is driven so as to generate a magnetic field. The probe (26) is moved in a predetermined, known orientation to each of the one or more locations, and signals are received from the one or more sensors at each of the one or more locations. The signals are processed to measure the amplitude and direction of the magnetic field, at the respective positions of the one or more sensors and to determine calibration factors relating to the amplitude and direction of the magnetic field in the vicinity of the magnetic field generator.

Uberwachungs- und Auswerteschaltung für Kontaktmessinstrumente

Switching configuration for evaluation and for the test of a capacitive sensor.

measuring bridge arrangement with improved error detection.

Die Erfindung betrifft eine Messbrückenanordnung (100), enthaltend eine Messbrücke (101) mit zumindest einer ersten Halbbrücke mit einem ersten Messanschluss (+UD), und einer zweiten Halbbrücke mit einem zweiten Messanschluss (UD), einen Referenzspannungsteiler (102) mit zumindest einem ersten und einem zweiten Prüfanschluss, einen Differenzverstärker (104) mit zumindest einem ersten und einem zweiten Verstärkereingang und zumindest einem Verstärkerausgang (Vout) und einer Spannungsverstärkung und einem Ausgangsspannungsarbeitsbereich. Der erste Verstärkereingang ist mit einem ersten Kondensator (C1) und der zweite Verstärkereingang mit einem zweiten Kondensator (C2) beschaltet und die Verstärkereingänge sind wahlweise mit den Messanschlüssen oder den Prüfanschlüssen verbindbar. Die Erfindung betrifft weiterhin ein Verfahren zur Fehlererkennung in einer Messbrückenanordnung.

Inductive element e.g. transformer has measuring device equipped with measuring unit that detects measuring signals at measuring winding and determines absolute value of magnetic flux density of main core

The inductive element has a main core (1) with one main winding (2) for generating a magnetic field in the main core. A measuring device comprises a measuring core (3) with a measuring winding (4) for generating a magnetic field in the measuring core. The magnetic fields generated by the main and measuring coils are made to overlap in the partial area of the cores (1,3). The measuring device is equipped with a measuring unit (7) that detects measuring signals at the measuring winding and determines the absolute value of the magnetic flux density of the main core. An independent claim is included for method for measuring magnetic flux density in inductive element.

Apparatus for measuring the flux density in the magnetic circuit of center frequency- high-power transformers.

Ein induktives Element mit einer Messvorrichtung zum Bestimmen der magnetischen Flussdichte oder einer magnetischen Sättigung im induktiven Element weist einen Hauptkern (1) mit mindestens einer Hauptwicklung (2) zum Erzeugen eines Magnetfeldes im Hauptkern (1) auf. Dabei weist die Messvorrichtung einen vom Hauptkern (1) verschiedenen Messkern (3) mit einer Messwicklung (4) zum Erzeugen eines Magnetfeldes im Messkern (3) auf. Ein von der Hauptwicklung (2) erzeugter Hauptfluss und ein von der Messwicklung (4) erzeugter Messfluss überlagern sich in mindestens einem Teilbereich der beiden Kerne (1, 3). Die Messvorrichtung zur Messung der magnetischen Flussdichte im Hauptkern (1) weist eine Messeinheit (7) auf, welche dazu ausgebildet ist, die Messwicklung (4) zu speisen und Messsignale an der Messwicklung (4) zu erfassen und daraus einen Absolutwert der magnetischen Flussdichte des Hauptflusses zu bestimmen und/oder ein Signal zur Detektion einer Sättigung zu entnehmen.

Apparatus for measuring the flux density in the magnetic circuit of center frequency- high-power transformers.

Ein induktives Element mit einer Messvorrichtung zum Bestimmen der magnetischen Flussdichte oder einer magnetischen Sättigung im induktiven Element weist einen Hauptkern (1) mit mindestens einer Hauptwicklung (2) zum Erzeugen eines Magnetfeldes im Hauptkern (1) auf. Dabei weist die Messvorrichtung einen vom Hauptkern (1) verschiedenen Messkern (3) mit einer Messwicklung (4) zum Erzeugen eines Magnetfeldes im Messkern (3) auf. Ein von der Hauptwicklung (2) erzeugter Hauptfluss und ein von der Messwicklung (4) erzeugter Messfluss überlagern sich in mindestens einem Teilbereich der beiden Kerne (1, 3). Die Messvorrichtung zur Messung der magnetischen Flussdichte im Hauptkern (1) weist eine Messeinheit (7) auf, welche dazu ausgebildet ist, die Messwicklung (4) zu speisen und Messsignale an der Messwicklung (4) zu erfassen und daraus einen Absolutwert der magnetischen Flussdichte des Hauptflusses zu bestimmen und/oder ein Signal zur Detektion einer Sättigung zu entnehmen.

Measuring instrument, Messfühlerr for the same and procedures for the production that and/or the same.

PROBE ATTENUATOR FOR REDUCED INPUT CAPACITANCE

Testing system and method for output precision of traveling wave protection testing device

Local experiment air gap discharging model and processing method thereof

Battery pack

The invention provides a battery pack, capable of determining the failure using a very simple circuit structure in high safety without a circuit special for failure determination. The battery pack is provided with an analog front-end 2 that detects battery 1 voltage, and a micro-controller 3 connected to the analog front-end 2 that accepts analog voltage signals from the analog front-end 2 as input. The micro-controller 3 switches voltage signals input from the analog front-end 2 to determine failure of the analog front-end 2 or the micro-controller 3.

Integrative point inspection device of insulation withstand voltage and ground impedance tester

Oscilloscope and image processing method thereof

Method for correcting measurement error and device for measuring electronic component characteristics

Insulation resistance measurement circuit having self-est function without generating leakage current

Apparatus and method for electromechanical testing and validation of probe cards

DEVICE FOR MEASURING AN ELECTRIC FIELD AT CONDUCTIVE MEDIUM AND METHOD FOR CALIBRATING THE DEVICE

L'invention concerne un dispositif (200) de mesure d'un champ électrique en milieu conducteur, comprenant : deux électrodes (105a, 105b) séparées par un volume (103) d'un mileu isolant ; un dispositif de mesure de courant (107) ; un dispositif de mesure de tension (201) ; et un commutateur (203) permettant de connecter alternativement le dispositif de mesure de courant (107) et le dispositif de mesure de tension (201) entre les électrodes (105a, 105b).

METHOD FOR DETECTING A DEFECTIVE MEASURING AN ELECTRICAL VARIABLE EXTENSIVELY

METHOD FOR DETERMINING THE ACCURACY OF AT LEAST ONE MEASURING DEVICE

APPARATUS OF TEST OF the CONTROLLERS Of INSULATION OF Electrical communications

Il s'agit d'un appareil de test du bon fonctionnement des contrôleurs d'isolement raccordés sur les réseaux électriques sous tension fonctionnant selon le schéma I T (réseau isolé de la terre). Il est destiné à être raccordé entre le réseau de protection et un point quelconque du réseau électrique sous tension concerné afin de provoquer un défaut d'isolement apte à activer l'alarme du contrôleur d'isolement testé. Suivant l'invention il est constitué, entre autres, de résistances de test de puissances nominales moindres que celles qu'elles devraient posséder pour subir sans dommage les tests sous la tension nominale de l'appareil de test. Il peut être constitué également d'un sélecteur et d'un organe de pontage des résistances de test dont les organes de puissance sont de tensions nominales inférieures à la tension nominale de l'appareil de test et qui fonctionnent sans danger pour les matériels, le réseau électrique ou l'utilisateur grâce à des modes particuliers de mise en oeuvre des ...

Balancing method of a measuring device mounted on a motor vehicle

Acceptance checker for Foucault current appts - simulates operation of appts and measures winding currents

PROCESS AND DEVICE OF MEASUREMENT Of a MAGNETIC FIELD AND TEMPERATURE Of a TRANSDUCER MAGNETO-RESISTIF

Ce procédé de mesure d'un premier champ magnétique et de la température d'un transducteur magnéto-résistif comporte: - la génération (96), en même temps que le premier champ magnétique, d'un second champ magnétique dont les caractéristiques sont connues, ce second champ magnétique se combinant au premier champ magnétique pour former un champ magnétique résultant qui est mesuré par le transducteur magnéto-résistif, - l'extraction (102), dans le signal de mesure produit, de la composante de ce signal qui est fonction uniquement du seul second champ magnétique, en utilisant les caractéristiques connues du second champ magnétique, et - l'établissement (104) de la température du transducteur magnéto-résistif à partir de la composante extraite ...

A METHOD FOR DETERMINING VIA A SENSOR FOR MEASURING A PHYSICAL FIELD VECTOR SUBSTANTIALLY CONTINUOUS

Procédé de détermination d'un biais (bM,bA) d'un capteur de mesure (M, A) d'un champ physique vectoriel sensiblement continu dans un repère de référence (E), ledit capteur (M, A) étant lié en mouvement à un repère (S), mobile dans le repère de référence (E), le procédé comprenant les étapes suivantes consistant à : - estimer une valeur de biais dans le repère mobile (S), - corriger la mesure du capteur (M, A) de ladite valeur estimée de biais dans le repère mobile (S), - transformer ladite mesure corrigée du repère mobile (S) dans le repère de référence (E), à partir d'un opérateur (R-1SE(t)) de changement de repère en rotation entre le repère mobile (S) et le repère de référence (E), et - former un critère représentatif d'une variation de ladite mesure corrigée transformée.

셀프 테스트를 구비하는 자기장 센서들

... 시스템은 자성 타겟 및 자기장 센서를 포함한다. 상기 자기장 센서는 출력 노드, 상기 자성 타겟에 의해 생성되는 자기장을 검출하는 회로 및 프로세서를 포함한다. 상기 프로세서는 신호를 상기 검출된 자기장을 나타내는 상기 출력 노드 상으로 전송하고, 상기 전송된 신호가 외부 소스에 의해 인터럽트되는 지를 검출하며, 상기 신호가 인터럽트될 경우에 상기 장치의 셀프-테스트를 시작하도록 구성될 수 있다. 상응하는 방법들 및 장치들도 개시된다.

APPARATUS FOR MEASURING ISOLATION RESISTANCE HAVING MALFUNCTION SELF -DIAGNOSING FUNCTION AND MALFUNCTION SELF-DIAGNOSING METHOD USING THE SAME

Portable Current Transformer Excitation And Core Characteristics Tester

APPARATUS FOR CONTROLLING MOTOR METHOD THEREOF

METHOD FOR CONTROLLING PROBE TIP SENDING IN SEMICONDUCTOR TEST SYSTEM AND SANDING CONTROL APPARATUS

PURPOSE: A method for controlling probe tip sending in semiconductor test system and the sanding control apparatus are provided to enhance the throughput of semiconductor device by removing abnormal contact elements in an electrical die sorting process. CONSTITUTION: A measuring process is performed to measure resistant values of all pads of a chip probed under a wafer level and to store the measured resistant values(S92). A continuous fail counting value and a cumulative fail counting value are increased if the maximum resistant value of the stored resistant values is more than a reference value of a contact resistance(S93,S94,S95). An automatic sensing command is generated and a probe tip is sent automatically if the continuous fail counting value or the cumulative fail counting value is more than the reference value(S96,S98). © KIPO 2004 ...

APPARATUS AND METHOD FOR DIAGNOSING CURRENT SENSOR

Method of measuring and assessing a probe card with an inspection device

Short-circuit probe card, wafer test system, and fault detection method for the wafer test system

The present invention provides a short-circuit probe card including: a substrate having an upper surface and a lower surface; a plurality of first contacts formed on the upper surface; and a plurality of second contacts formed on the lower surface and connected to the plurality of first contacts, wherein the plurality of first contacts and the plurality of second contacts are all grounded.

Electrostatic encoder

This invention is related to an electrostatic encoder for detecting angles of rotation of a rotor with a high precision according to changes of electrostatic capacity disposed between electrodes of stator (41) and rotor (42). In the electrostatic encoder of the subject invention, detection electrodes (44 to 44d) and transfer electrodes (45a to 45d) which are provided in the stator (41), are alternately disposed in a circumferential direction. By way of alternate disposition of the transfer electrodes and the detection electrodes, detection signals (A phase, B phase) being amplitude modulated according to rotations of rotor (42) and having 90 DEG phase difference can be output from adjacent detection electrodes. The detection signals are amplitude modulated to generate modulated signals (V1, V2). A resolver-to-digital (RD) conversion process is applied to the modulated signals to calculate rotation angles of a rotor. Owing to alternate disposition of the transfer electrodes and the detection ...

Имитатор сигналов мостовых тензорезисторных датчиков для автоматической калибровки измерительной системы

Полезная модель относится к измерительной технике и предназначена для проведения в автоматическом режиме метрологической поверки и калибровки каналов измерения сигналов мостовых тензорезисторных датчиков быстродействующих измерительных систем, в которых управляющие входы коммутаторов датчиков подсоединены к магистрали управления, а измерительные выходы - к измерительной магистрали.Предлагается имитатор сигналов мостовых тензорезисторных датчиков для автоматической калибровки измерительной системы, содержащий два коммутатора с управляющими входами ключевых элементов и резисторный мост, в котором сопротивления плеч равны номинальному сопротивлению плеч тензорезисторов мостового датчика калибруемой системы, между каждой парой резисторов, образующих плечи моста, к которым подведено электропитание в диагонали питания моста, включены цепочки из последовательно соединенных резисторов, при этом одна цепочка состоит из m-1 резисторов и имеет m выводов, которые соединены с соответствующими входами ключей ключевых элементов первого коммутатора, вторая цепочка состоит из n-1 резисторов и имеет n выводов, которые соединены с соответствующими входами ключей ключевых элементов второго коммутатора, выходы ключей в первом и втором коммутаторе соединены между собой и образуют измерительную диагональ моста, на выходе которой может быть сформировано до m×n ступеней сигналов моста, при этом выходы диагонали питания и измерительной диагонали резисторного моста образуют выход имитатора сигналов мостовых тензорезисторных датчиков, при проведении калибровки системы этот выход соединен измерительными входами коммутаторов датчиков системы, имитатор сигналов мостовых тензорезисторных датчиков дополнительно содержит устройство управления, в котором выходы, представляющие выходы логических схем ИЛИ- ИЛИm и ИЛИm- ИЛИmn, соединены с управляющими входами ключевых элементов соответственно первого и второго коммутаторов, входы схем ИЛИ- ИЛИm и ИЛИm- ИЛИmn, соединены с k из k+1 выходов дешифратора ...

Voltage source for calibrating a fast transient voltage measurement system and calibration method

The present disclosure discloses a voltage source for calibrating a fast transient voltage measurement system, comprising a DC high voltage power supply, a discharging gap, a high voltage conductor and an earthing conductor, wherein the high voltage conductor and the earthing conductor are high voltage insulated from each other and form a traveling wave line with constant wave impedance; the DC high voltage power supply is connected between the ends of the high voltage conductor and the earthing conductor; the discharging gap is connected between ends of the high voltage conductor and the earthing conductor; the discharging gap is broken down when the charging voltage on the high voltage conductor is risen to a certain amplitude. The present disclosure also provides a method for calibrating a fast transient voltage measurement system: the high voltage conductor is insulated from the earthing conductor, and is open circuit at one end and at the other end connected with the earthing conductor via the discharging gap, the high voltage breaks down the discharging gap, applying a high voltage between the high voltage conductor and the earthing conductor, a very fast transient high voltage is produced on the high voltage conductor and its waveform can be determined by theoretical calculation, the very fast transient high voltage with known waveform is used as the calibration voltage for calibrating the measurement system. This reaches the purpose of simplifying the structure of voltage source for calibrating the fast transient voltage measurement system as well as the calibration method.

Image Enhancement for Resistivity Features in Oil-Based Mud Image

Resistivity images obtained by an imaging device in a borehole having oil-based mud may be of poor quality due to standoff variations, leakage currents and random noise. By processing the data using steps including median filtering, entropy equalization and bandpass filtering, the image quality can be considerably improved.

Wafer probe station capable of actively controlling tilt of chuck and controlling method thereof

The wafer probe station includes: a plurality of the pressure sensors; a tilt correction unit which is constructed with a plurality of actuators, a plurality of displacement sensors which are disposed at positions adjacent to the corresponding actuators and a microcomputer; and a control unit which allows the wafer to be come in contact with the probe card by lifting up a Z-axis stage by a predetermined overdriving amount, extracts the pressure values of the installation positions from the pressure sensors, calculates driving amounts of the actuators of the tilt correction unit by using the pressure values so that a uniform load is applied to the chuck, calculates X and Y directional displacement values w occurring according to a change in a tilt of the chuck, lifts down the Z-axis stage, and after that, corrects an eccentric load of the chuck by driving the actuators of the tilt correction unit according to the driving amounts, and controls movement of the XY-axis stage by using the X and Y directional displacement values w. Accordingly, it is possible to accurately sense an eccentric load occurring at the time of performing the overdriving, and it is possible to rapidly and accurately perform initial setting for the eccentric load by adjusting a tilt of the chuck, so that it is possible to reduce a read time of a testing process.

High frequency measurement apparatus and calibration method for high frequency measurement apparatus

A method for calibrating voltage and current detected by a high frequency measurement apparatus is provided. By the method, a basic calibration parameter for a wide impedance range but with low accuracy and quadrant-specific calibration parameters for highly accurate calibration are calculated. This calculation is performed based, on values obtained by measuring three reference loads and true values of the reference loads. A first calibration unit of the apparatus calibrates the detected voltage and current by using the basic calibration parameter. A quadrant determining unit of the apparatus determines in which quadrant an impedance calculated from the calibrated voltage and current lies. A second calibration unit of the apparatus further calibrates the voltage and current by using a quadrant-specific calibration parameter corresponding to the determination result input from the quadrant determining unit.

Lock in thermal laser stimulation through one side of the device while acquiring lock-in thermal emission images on the opposite side

Controlled amount of heat is injected into a stacked die using a light beam, and the propagated heat is measuring with LIT camera from the other side of the die. The thermal image obtained can be characterized so that it can be used to calibrate the phase shift from a given stack layer, or can be used to identify defects in the stacked die. The process can be repeated for each die in the stack to generate a reference for future testing. The thermal image can be investigated to detect faults, such as voids in vias, e.g., TSV.

Electronic device with flexible data and power interface

Electronic modules with small and flexible interfaces are disclosed. One example electronic module includes a power supply terminal configured to receive power for the electronic module and circuitry configured to carry out various functions. The functions carried out by the electronic module circuitry include simultaneously receiving both of the following via the power supply terminal: a power signal for carrying out a mission mode operation of the electronic module, and a data signal.

Transmission device and method of testing transmission characteristic of dut

There is provided a transmission device. The transmission device includes: an adapter device ( 11 ) including: a first surface having a plurality of first terminals ( 21 ) thereon; and a second surface opposite to the first surface and having a plurality of second terminals ( 22 ) thereon, wherein a pitch between the adjacent second terminals is different from a pitch between the adjacent first terminals, a plurality of signal lines each electrically connecting a corresponding one of the first terminals and a corresponding one of the second terminals; and a signal compensation device ( 12 ) connected to the adapter device through the signal lines and configured to compensate for a transmission loss of a signal path between the corresponding first terminal and the corresponding second terminal such that the transmission loss is set to a given value.

Load regulation circuit and load regulation device employing the same

A load regulation circuit used for calibrating a voltage drop tester includes a voltage control switch, a first resistor group, a power control switch and a second resistor group electrically connected to the first resistor group through the power control switch. When the voltage control switch is switched on to different positions, the first resistor group provides different loads and load voltages for the voltage drop tester. When the power control switch is turned on or off, the first resistor group and the second resistor group provide corresponding loads and load powers for the voltage drop tester to calibrate and correct operating parameter of the voltage drop tester. The load regulation circuit can simulate and replace different electronic device to calibrate the voltage drop tester.

System and method for measuring near field information of device under test

A system and method for measuring near field information of a device under test (DUT) uses a reference probe and a measurement probe that are configured to sense a field. A probe calibration factor is used to determine corresponding field values for signals from the measurement probe at sampling locations about the DUT. The probe calibration factor is derived from measured signals about a conductive trace using a probe and simulated field information for the conductive trace when subjected to a simulated reference signal.

Probe card and method for testing magnetic sensors

A probe card and method are provided for testing magnetic sensors at the wafer level. The probe card has one or more probe tips having a first pair of solenoid coils in parallel configuration on first opposed sides of each probe tip to supply a magnetic field in a first (X) direction, a second pair of solenoid coils in parallel configuration on second opposed sides of each probe tip to supply a magnetic field in a second (Y) direction orthogonal to the first direction, and an optional third solenoid coil enclosing or inscribing the first and second pair to supply a magnetic field in a third direction (Z) orthogonal to both the first and second directions. The first pair, second pair, and third coil are each symmetrical with a point on the probe tip array, the point being aligned with and positioned close to a magnetic sensor during test.

Probe Calibration Device and Calibration Method

A calibration device applied for a test apparatus with at least a first probe and a second probe, the calibration device comprising: a first testing region and a second testing region, the first testing region and the second testing region divides into n×n sensing units respectively, the first testing region for generating n×n average electricity corresponding to a contact degree of the first probe contacted with the calibration device, and the second testing region for generating another n×n average electricity corresponding to a contact degree of the second probe contacted with the calibration device, and the pitch is the distance between the center of the first testing region to the center of the second testing region that is the same as that of the center of the first probe to the center of the second probe.

Circuit breaker and method for checking a rogowski converter in a circuit breaker

A circuit breaker is disclosed. A Rogowski converter is checked for wire breakage by applying the Rogowski converter with a voltage which is output by a digital/analog converter in response to a digital signal. The digital signal is dependent on the switch rated current of the circuit breaker.

APPARATUSES AND SYSTEMS FOR DENSITY GAUGE CALIBRATION and REFERENCE EMULATION

Apparatuses and systems for emulating electrical characteristics of a material having a known dielectric constant or property are disclosed for standardizing and calibrating of electromagnetic devices. The emulator apparatus can include an electrically non-conductive layer having a dielectric constant less than the material dielectric constant and an electrically conductive layer adjacent the non-conductive layer. Artificial dielectrics for emulating the dielectric constant of a material are also disclosed including a substrate matrix having a dielectric constant less than the material dielectric constant and an additive combined with the substrate, the additive having a dielectric constant higher than the material dielectric constant. Artificial dielectrics may simulate the frequency response of a material relating to a specific property.

NON-CONTACT CURRENT AND VOLTAGE SENSING CLAMP

A clamping current and voltage sensor provides an isolated and convenient technique for measuring current passing through a conductor such as an AC branch circuit wire, as well as providing an indication of an electrostatic potential on the wire, which can be used to indicate the phase of the voltage on the wire, and optionally a magnitude of the voltage. The device includes a body formed from two handle portions that contain the current and voltage sensors within an aperture at the distal end, which may be a ferrite cylinder with a hall effect sensor disposed in a gap along the circumference to measure current, or alternatively a winding provided through the cylinder along its axis and a capacitive plate or wire disposed adjacent to, or within, the ferrite cylinder to provide the indication of the voltage. When the handles are compressed the aperture is opened to permit insertion of a wire for measurement. 1. A sensor for sensing an electric potential on a wire of a power distribution system and a current passing through the wire , the sensor comprising:a sensor clamp body including a pair of handles disposed at a proximal end thereof and a hinge mechanism coupling the pair of handles, so that compressing the pair of handles opens an aperture at a distal end of the sensor clamp body for receiving the wire, and wherein the hinge mechanism includes a restoring spring to close the aperture around the wire when the pair of handles is released;a current-sensing device disposed within the sensor clamp body for providing a first output indicative of the current passing through the wire; anda voltage-sensing device integrated in the sensor clamp body for providing a second output indicative of the electric potential on the wire, wherein the voltage-sensing device and the current-sensing device do not make electrical contact with the wire.2. The sensor of claim 1 , wherein the voltage-sensing device comprises at least one metal cylinder portion disposed within the aperture ...

Characterization and correction of voltage probe, current probe and cable

Responses of voltage and current probes are characterized or corrected. A voltage probe method includes measuring output of the voltage probe and a first output of a through, in response to an input signal applied to the through, with the voltage probe connected, measuring a second output of the through with the voltage probe disconnected, and characterizing the response of the voltage probe using the output of the voltage probe and the first and/or second outputs. A current probe method includes measuring output current of the current probe and first output current of a through, in response to an input signal applied to the through with the current probe connected in series, measuring second output current of the through with the current probe disconnected, and characterizing the response of the current probe using the output current of the current probe and the first and/or second output currents of the through.

Transmitter calibration system

Systems and methods are provided for calibrating a transmitter system. A directional coupler is configured to provide a first signal representative of a forward power of an RF signal and a second signal representative of a reflected power of the RF signal. A splitting assembly is configured to generate respective third and fourth signals, each representative of the forward power, from the first signal. A switching assembly is configured to select between the second signal and the third signal. A system control is configured to determine an associated power of each of the fourth signal and a signal provided by the switching assembly.

AUTONOMOUSLY CALIBRATED MAGNETIC FIELD SENSOR

Magnetic field sensor including a magnetic field sensing circuit () comprising a reference magnetic field generator () and a magnetic field sensing cell (), and a signal processing circuit () connected to the output of the magnetic field sensing cell and comprising a demodulator circuit and a gain correction feedback circuit () for correcting error fluctuations in the transfer characteristic of the magnetic field sensor. The sensor further comprises a reference current generator () configured to generate a reference current I ref, the reference current generator connected to the magnetic field sensing circuit () configured for generating the reference magnetic field B ref and to the gain correction feedback circuit configured for providing a reference signal (y) to which an output signal of the demodulator circuit may be compared. 112-. (canceled)13. Magnetic field sensor including a magnetic field sensing circuit comprising a reference magnetic field generator and a magnetic field sensing cell , and a signal processing circuit connected to the output of the magnetic field sensing cell and comprising a gain correction feedback circuit for correcting fluctuations in the transfer characteristic of the magnetic field sensor , characterized in that the sensor further comprises a reference current generator configured to generate a reference current I , the reference current generator connected to the magnetic field sensing circuit configured for generating the reference magnetic field Band to the gain correction feedback circuit configured for providing a reference signal yto which an output signal of the demodulator circuit may be compared.14. Sensor according to claim 13 , wherein the reference current generator is connected to a reference coil of the reference magnetic field generator via a current mirror circuit configured to copy the reference current Iand to generate a second reference current Ithat drives the coil to generate the reference magnetic field B.15. ...

Determining propagation delay

Techniques for obtaining a propagation delay through first and second transmission lines having substantially equal propagation delays may include: providing a first signal to the first transmission line; providing a second signal to the second transmission line; detecting an incident edge of the first signal on the first transmission line; detecting a reflected edge of the second signal on the second transmission line; and determining the propagation delay based on times of detection of the incident edge and detection of the reflected edge.

Determining on-chip voltage and temperature

A method, in one embodiment, can include modeling and calibrating two types of sensors that are part of a semiconductor device. In addition, the method can include determining a temperature and voltage based on data received from the two sensors.

SYSTEM AND METHOD FOR MONITORING ELECTRICAL POWER USAGE IN AN ELECTRICAL POWER INFRASTRUCTURE OF A BUILDING

Some embodiments can concern a method of using an electrical sensor device. The method can include: determining a first current measurement of a first current in an electrical power infrastructure and a first phase angle measurement of the first current; determining that a first load is coupled to the electrical power infrastructure; while the first load is coupled to the electrical power infrastructure, determining a second current measurement of a second current in the electrical power infrastructure and a second phase angle measurement of the second current; and using a Kalman filter to determine one or more first calibration coefficients for the electrical sensor device at least in part using the first current measurement, the second current measurement, the first phase angle, and the second phase angle. Other embodiments are disclosed. 1. A method of using a power consumption measurement device , the power consumption measurement device is mechanically coupled to a surface of a circuit breaker box , the circuit breaker box is overlying at least part of one or more main electrical supply conductors for an electrical power infrastructure of a structure , the method comprising:determining at least two first current sensor readings from the one or more main electrical supply conductors using at least one sensor in the power consumption measurement device; 'applying a Kalman filter using at least the at least two first current sensor readings to determine one or more first calibration coefficients for the power consumption measurement device;', 'calibrating the power consumption measurement device using at least in part the at least two first current sensor readings, wherein calibrating the power consumption measurement device comprisesafter determining the at least two first current sensor readings, electrically coupling a first calibration load to the electrical power infrastructure;while the first calibration load remains electrically coupled to the electrical ...

SENSOR AUTO-CALIBRATION

Aspects of the disclosure relate to computing technologies. In particular, aspects of the disclosure relate to mobile computing device technologies, such as systems, methods, apparatuses, and computer-readable media for scheduling an execution of a task, such as a non-real time, non-latency sensitive background task on a computing device. In one implementation, the technique includes detecting a first state of a device, wherein the first state of the device is associated with a first power level and a first task, wherein the first power level is at least partially based on power consumption of a first task, determining that the first power level associated with the first state is above a threshold, and in response to determining that the first power level associated with the first state is above the threshold, and scheduling an execution of a second task on the device, wherein the second task is associated with automatically collecting of calibration data using at least one sensor. 1. A method for scheduling an execution of a task on a device , the method comprising:detecting a first state of the device, wherein the first state of the device is associated with a first power level, and wherein the first power level is at least partially based on power consumption of a first task;determining that the first power level associated with the first state is above a threshold or that a battery coupled to the device is charging; andin response to determining that the first power level associated with the first state is above the threshold or that the battery coupled to the device is charging, scheduling an execution of a second task on the device, wherein the second task is associated with automatically collecting of calibration data using at least one sensor.2. The method of claim 1 , wherein determining that the first power level associated with the first state is above the threshold comprises determining that the first state is one of a plurality of states associated with ...

CURRENT MEASUREMENT

The present invention relates to current measurement apparatus. The current measurement apparatus comprises first and second measurement devices with each of the first and second measurement devices being operative to measure current in a respective one of a live conductor and a neutral conductor substantially simultaneously. The current measurement apparatus is operative to make plural different determinations in dependence on the substantially simultaneous current measurements. 1. Current measurement apparatus comprising first and second measurement devices , each of the first and second measurement devices being operative to measure current in a respective one of a live conductor and a neutral conductor substantially simultaneously , the current measurement apparatus being operative to make plural different determinations in dependence on the substantially simultaneous current measurements.2. Current measurement apparatus according to in which at least one of the plural different determinations comprises a measurement relating to operation of an electrical circuit comprising the live and neutral conductors.3. Current measurement apparatus according to in which at least one of the plural different determinations comprises a decision relating to operation of an electrical circuit comprising the live and neutral conductors.4. Current measurement apparatus according to in which the decision comprises determining a fault condition claim 3 , the current measurement apparatus further comprising a circuit breaker which is operative to break at least one of the live and neutral conductors in dependence on the decision.5. Current measurement apparatus according to operative to perform calibration in respect of measurement paths associated with the first and second measurement devices claim 4 , the current measurement apparatus being further operative to delay operation of the circuit breaker to reconnect at least one of the live and neutral conductors until completion of ...

COIL COMPRISING A WINDING COMPRISING A MULTI-AXIAL CABLE

The present invention relates to a coil comprising a winding (). The winding comprises a multi-axial cable with one shielding layer connected to ground. 1. A coil comprising a winding , wherein said winding comprises a multi-axial cable with one shielding layer connected to ground.2. The coil of claim 1 , wherein said multi-axial cable is coaxial.3. The coil of claim 1 , wherein said multi-axial cable is triaxial.4. The coil of claim 1 , wherein said coil is an excitation coil in a coil system for susceptometry.5. The coil of claim 1 , wherein said coil is a detection coil in a coil system for susceptometry.6. The coil of for operation in a frequency to 100 MHz claim 1 , at least 10 MHz.7. The coil of claim 3 , wherein a second shielding layer is connected to a current source voltage.8. The coil of claim 1 , wherein one or several shielding layers of said multi-axial cable is divided in several sections claim 1 , with each section directly connected to the ground.9. A device for detecting a dynamic magnetic response or changes in a dynamic magnetic response of a magnetic material or at least one magnetic particle in a carrier fluid claim 1 , said detection comprising measuring said magnetic particle's characteristic magnetic relaxation in said carrier fluid under influence of an external magnetic field claim 1 , said device comprising means for generating said magnetic field claim 1 , at least two substantially identical detection coils connected in a gradiometer coupling to detection electronics for measuring the induced voltage that is dependent on the dynamic magnetic properties of a sample in the detection coils claim 1 , characterized in that said excitation coil and and/or detection coils comprise a winding and said winding comprises a multi-axial cable with at least one shielding layer connected to ground.10. The device of claim 9 , wherein said multi axial cable is coaxial.11. The device of claim 9 , wherein said multi-axial cable is triaxial.12. The device ...

Circuits and Methods for Generating a Self-Test of a Magnetic Field Sensor

A magnetic field sensor includes built in self-test circuits that allow a self-test of most of, or all of, the circuitry of the magnetic field sensor, including self-test of a magnetic field sensing element used within the magnetic field sensor, while the magnetic field sensor is functioning in normal operation.

Methods and apparatus for continuous ground fault self-test

Methods and apparatus for continuous ground fault self-test are disclosed. An example ground fault detection device includes a sense coil to detect current in a line conductor and a neutral conductor, the sense coil comprising a winding influenced by a current difference between the line conductor and the neutral conductor. The example ground fault detection device also includes a current bypass to facilitate a continuous current imbalance detected by the sense coil, and a ground fault detector circuit to detect at least one of the continuous current imbalance in the sense coil or a ground fault current imbalance.

Sensor arrangement and method of using the same

A sensor arrangement and method that may be used with a variety of different energy storage devices, including battery packs found in hybrid vehicles, battery electric vehicles, and other types of vehicles. An exemplary sensor arrangement includes a number of sensor units, a controller, and several connections, wherein two or more sensor units are coupled to each node of the battery pack and are coupled to the controller over different connections. An exemplary method is divided into two aspects: an error detection aspect and an error resolution aspect. Because the sensor arrangement provides multiple sensor readings for each node being evaluated, the method can enable the sensor arrangement to continue operating accurately and with redundancy even if it experiences a loss of one or more sensor units.

SEMICONDUCTOR DEVICE

A previously calibrated 01 alternating data signal from the driver of an output circuit is input to an input circuit. The voltage amplitude of the input signal is measured. The measured voltage amplitude is compared with the output amplitude of a driver, and an error is stored in a memory as a correction value. A phase and the amount of jitter are measured by using a clock with a specified phase and a specified amount of jitter. The measured phase and amount of jitter are compared with a specified phase and a specified amount of jitter, and an error is stored in a memory as a correction value. In a test, the amplitude and amount of jitter of an input signal from an alien IC are measured, and the measured amplitude and amount of jitter are corrected by a correction value stored in the memory. 1. A semiconductor device into which a testing device is integrated , the semiconductor device comprising:a calibration unit integrated into the semiconductor device and configured to calibrate an element of the testing device; anda memory integrated into the semiconductor device and configured to store a correction value for a deviation from a reference value of a characteristic of the element obtained as a result of the calibration,whereina result of a test performed by the testing device of the semiconductor device is corrected by the correction value stored in the memory to determine whether the corrected result meets standards.2. The semiconductor device according to claim 1 , further comprising:a driver configured to output a signal at a specified frequency; andan input circuit configured to receive an output from the driver as an input,wherein an input amplitude detector integrated into the semiconductor device and configured to branch and receive an input to the input circuit and to detect a voltage amplitude of a received signal,', 'a phase detection circuit integrated into the semiconductor device and configured to branch and receive an output from a receiver of the ...

TEST STATION FOR WIRELESS DEVICES AND METHODS FOR CALIBRATION THEREOF

A test station for wireless devices and methods for calibration thereof. The test station includes a signal generator, a calibrator, a scanner having receiving and transmitting antennas, a signal analyzer, and a computer. Under the direction of the computer, the signal generator generates a calibration signal in accordance with a programmable calibration signal script. The calibrator may be used to emulate either a wireless device in transmit mode by transmitting the calibration signal to the scanner for analysis by the signal analyzer, or a wireless device in receive mode by receiving the calibration signal from the scanner for analysis by the signal analyzer. The behavior of the test station is calibrated by correlating signal parameters of the calibration signal as specified by the calibration signal script and as measured at the signal analyzer. 1. A method for calibrating a test station for testing a wireless device in transmit mode , the test station comprising a receiving antenna , a calibrator with a calibrator antenna , a signal generator , and a signal analyzer , the method comprising the steps of:(a) providing a signal path comprising a conducted path from the signal generator to the calibrator antenna, a wireless path from the calibrator antenna to the receiving antenna, and a conducted path from the receiving antenna to the signal analyzer;(b) providing a calibration signal script encoding for a calibration signal having a target transmit power level at the calibrator antenna;(c) using the signal generator to generate the calibration signal through the signal path;(d) using the signal analyzer to measure the power level of the calibration signal; and(e) correlating the target transmit power level of the calibration signal to the measured power level of the calibration signal.2. The method of wherein the calibration signal script additionally specifies one or more of the following parameters of the calibration signal: frequency; modulation and data rate; ...

GAIN-CORRECTED MEASUREMENTS

A method to obtain gain-corrected measurements. A measurement tool having one or more arrays is provided, wherein the arrays include two co-located triaxial transmitters and two co-located triaxial receivers. Measurements are obtained using the transmitters and the receivers. Impedance matrices are formed from the obtained measurements and the impedance matrices are combined to provide gain-corrected measurements. The apparatus may alternatively be a while-drilling logging tool having one or more arrays, wherein each array comprises a transmitter, a receiver, and a buck, and wherein the signal received by the receiver is subtracted from the signal received by the buck or vice versa. A slotted shield may be incorporated into either embodiment of the tool. The slots may form one or more island elements. A material is disposed in the slots. The islands and shield body have complementary tapered sides that confine the islands within the shield body. 1. A method to obtain gain-corrected measurements , comprising:providing a measurement tool having one or more arrays, wherein the arrays comprise two co-located triaxial transmitters and two co-located triaxial receivers;obtaining measurements using the two co-located triaxial transmitters and the two co-located triaxial receivers;forming impedance matrices from the obtained measurements; andcombining the impedance matrices to provide gain-corrected measurements.2. The method of claim 1 , wherein the measurement tool comprises a downhole logging tool claim 1 , and the providing further comprises disposing the downhole logging tool on a wireline claim 1 , a drill string claim 1 , or a wired drill pipe.3. The method of claim 1 , wherein the receivers are located between the transmitters and the distance from one of the transmitters to one of the receivers is substantially equal to the distance from the other transmitter to the other receiver.4. The method of claim 1 , wherein the transmitters are located between the receivers ...

INTELLIGENT ELECTRONIC DEVICE WITH CONSTANT CALIBRATION CAPABILITIES FOR HIGH ACCURACY MEASUREMENTS

An intelligent electronic device with constant calibration capabilities for high accuracy measurements and method thereof are provided. 1. An intelligent electronic device comprisingat least one sensor configured to measure at least one parameter of an electrical distribution system and output a signal indicative of the measured at least one parameter;a reference source configured to provide at least three reference voltage signals, each of the at least three reference signals having a different predetermined value;at least one switch configured to receive the output signal of the at least one sensor and the at least three reference voltage signals and to selectively output the received signals;at least one analog-to-digital converter configured to receive the switched signals and convert the switched signals to digital signals; andat least one processing device configured to calibrate the output signal of the at least one sensor based on the at least three reference voltage signals,wherein the at least one switch is configured to sequentially sample one sample from each of the output signal of the at least one sensor and the at least three reference voltage signals continuously during a normal operating mode.2. An intelligent electronic device comprisingat least one sensor configured to measure at least one parameter of an electrical distribution system and output a signal indicative of the measured at least one parameter;a reference source configured to provide at least three reference voltage signals, each of the at least three reference signals having a different predetermined value;at least one analog-to-digital converter including a plurality of channels to receive along a separate channel each of the at least one sensor and the at least three reference signals; andat least one processing device configured to calibrate the output signal of the at least one sensor based on the at least three reference voltage signals,wherein the at least one analog-to-digital ...

Analysis Apparatus, Analysis Method and Analysis System

Provided is an analysis apparatus capable of acquiring a measurement result with high reliability that includes: a signal detection unit; a measuring unit; a first temperature detection unit; a second temperature detection unit; and a calculation unit. 1. An analysis apparatus comprising:a signal detection unit to continuously detect signal values detected from a first sample;a measuring unit to measure numerical value information on a specified substance in a second sample;a first temperature detection unit to capture a first temperature value defined as temperature information on the first sample;a second temperature detection unit to capture a second temperature value defined as temperature information on the second sample; anda calculation unit to calibrate to the numerical value information on the specified substance in the first sample from the signal value by referring to the numerical value information on the specified substance in the second sample in accordance with the first temperature value and the second temperature value.2. The analysis apparatus according to claim 1 , wherein the calculation unit claim 1 , when a value calculated from the first temperature value and the second temperature value is equal to or smaller than a predetermined threshold value claim 1 , calibrates to the numerical value information on the specified substance in the first sample from the signal value by referring to the numerical value information on the specified substance in the second sample.3. The analysis apparatus according to claim 1 , wherein the calculation unit changes the first temperature value when a value calculated from the first temperature value and the second temperature value exceeds a predetermined threshold value claim 1 , corrects the signal value detected from the first sample on the basis of the post-changed first temperature value when a value calculated from the post-changed first temperature value and the second temperature value is equal to or ...

SYSTEM AND METHOD FOR INTERPRETING A SIGNAL FROM A TRANSDUCER

The sensor system includes a transducer having an output and a microcontroller in communication with the output of the transducer. Generally, the transducer is a Hall effect device which is capable of measuring a magnetic field. The transducer outputs a transducer signal to the microcontroller. The transducer signal has a generally non-linear range. The microcontroller receives the non-linear transducer signal and is configured to output a signal based on the transducer signal that has been modified to have a linear range, as opposed to the non-linear range of the transducer signal. 1. A sensor system comprising:a first transducer having a first transducer output, the first transducer being configured to measure a parameter and output a first transducer signal to the first transducer output, the first transducer signal based on the parameter measured by the first transducer, the first transducer signal having a non-linear range; anda microcontroller in communication with the first transducer output and having a microcontroller output, the microcontroller being configured to output a signal based on the first transducer signal, wherein the signal has a linear range.2. The sensor system of claim 1 , wherein the first transducer is a Hall effect device and wherein the parameter to be measured is a magnetic field.3. The sensor system of claim 1 , wherein the microcontroller further comprises an analog to digital converter claim 1 , the analog to digital converter being configured to convert the first transducer signal to a digital transducer value.4. The sensor system of claim 3 , wherein the microcontroller is further configured to filter the digital transducer value using a filter.5. The sensor system of claim 4 , wherein the filter is at least one of a median value filter and an infinite impulse response low-pass filter.6. The sensor system of claim 4 , wherein the microcontroller is further configured to linearize the digital transducer value to create a linearized ...

PROBE SYSTEM WITH COMPENSATING NETWORK

A probe system for registering a differential input signal has a first input network, which is supplied with a first component of the differential input signal in order to generate a first intermediate signal, and a second input network which is supplied with a second component of the differential input signal in order to generate a second intermediate signal. A differential amplifier for the amplification of the difference between the intermediate signals (Ip, In) is arranged in the signal flow direction downstream of the input networks. At least one compensation network is used to compensate the influence of the input networks and is arranged at the output end of the differential amplifier or in a feedback path connecting an output to an input of the differential amplifier. 112-. (canceled)13. A probe system for the registration of a differential input signal , comprising:a first input network, which is supplied with a first component of the differential input signal in order to generate a first intermediate signal;a second input network, which is supplied with a second component of the differential input signal in order to generate a second intermediate signal;a differential amplifier arranged downstream of the first and second input networks in the signal-flow direction for the amplification of the difference between the intermediate signals; andat least one compensation network configured to compensate for the influence of the input networks on the components of the differential input signal;wherein the at least one compensation network is arranged at the output end of the differential amplifier, wherein each input network comprises a series circuit of a first resistor and a second resistor and a first capacitor, which is connected in parallel to the second resistor, and wherein each compensation network comprises a series connection of a fourth resistor and a fifth resistor and a second capacitor, which is connected in parallel to the fifth resistor.14. The ...

Detection of a Dielectric Object

A measuring apparatus for detecting a dielectric object comprises a potential probe for determining an electric potential in an electric field, a first capacitance device, a second capacitance device, and a control device configured to supply alternating voltages to the first and the second capacitance devices. The control device is configured to amplify the alternating voltages in opposite directions to one another in order to minimize the magnitude of an AC voltage component, which is clock-synchronous with the alternating voltages, of a voltage which is recorded by means of the potential probe. The dielectric object is detected when a ratio of the alternating voltages does not correspond to a ratio of (i) a first distance of the potential probe from the first capacitance device to (ii) a second distance of the potential probe from the second capacitance device. 1. A measuring device for detecting a dielectric object , comprising:a potential probe configured to determine an electrical potential in an electric field;a first capacitance device;a second capacitance device;a control device configured to supply the first capacitance device and the second capacitance device with alternating voltages,wherein the control device is configured to amplify the alternating voltages in opposite directions to one another in order to minimize the magnitude of an alternating voltage component, which is clock-synchronous with the alternating voltages, of a voltage which is recorded by means of the potential probe, andwherein the control device is further configured to detect the dielectric object when a ratio of the alternating voltages does not correspond to a ratio of (i) a first distance of the potential probe from the first capacitance device to (ii) a second distance of the potential probe from the second capacitance device.2. The measuring device as claimed in claim 1 , wherein each of the first capacitance device and the second capacitance device includes an electrode which ...

Simplified Resistance Based Belt Inspection

A resistance circuit for monitoring a support structure is provided. The resistance circuit may include a first set of resistors disposed at a belt-side and a second set of resistors disposed at a monitor-side. The first set of resistors may be configured to indicate one or more voltages thereacross corresponding to an effective resistance of the support structure. The first set of resistors may include at least one temperature-dependent resistor. The second set of resistors may be configured to indicate one or more voltages thereacross corresponding to an initial effective resistance of the support structure. The second set of resistors may include at least one switched resistor having an adjustable resistance capable of selectively approximating the initial effective resistance. 1. A resistance circuit for monitoring a support structure , comprising:a first set of resistors disposed at a belt-side of the structure and configured to indicate one or more voltages thereacross corresponding to an effective resistance of the support structure, the first set of resistors including at least one temperature-dependent resistor; anda second set of resistors disposed at a monitor-side of the structure and configured to indicate one or more voltages thereacross corresponding to an initial effective resistance of the support structure, the second set of resistors including at least one switched resistor having an adjustable resistance capable of selectively approximating the initial effective resistance.2. The resistance circuit of claim 1 , wherein the first set of resistors is disposed at least partially in parallel relative to the support structure and the temperature-dependent resistor is disposed in series relative to the support structure claim 1 , the temperature-dependent resistor being disposed in series with at least one fixed-resistance resistor claim 1 , the temperature-dependent resistor and the fixed-resistance resistor being configured to approximate a ...

ELECTROSTATIC CAPACITANCE SENSOR AND METHOD FOR DETERMINING FAILURE OF ELECTROSTATIC CAPACITANCE SENSOR

The disclosure has: a detection electrode () that detects an electrostatic capacitance; a shield electrode (); a shield drive circuit () that switches between a first electric potential and a second electric potential to apply the first or second electric potential to the shield electrode; a detection circuit () that outputs a detection signal depending on the electrostatic capacitance detected; and a determination circuit () that obtains a first detection signal and a second detection signal as the basis to determine whether an abnormality of the detection electrode () or the shield electrode is present or absent. The first detection signal depends on the electrostatic capacitance detected when the shield drive means () applies the first electric potential to the shield electrode (). The second detection signal depends on the electrostatic capacitance detected when the shield drive means () applies the second electric potential to the shield electrode. 1. An electrostatic capacitance sensor comprising:a detection electrode that detects an electrostatic capacitance between the detection electrode and an object;a shield electrode that is disposed in vicinity of the detection electrode;a shield drive means that switches between a first electric potential and a second electric potential different from the first electric potential to apply the first or second electric potential to the shield electrode;a detection means that outputs a detection signal depending on the electrostatic capacitance detected by the detection electrode; anda determination means that obtains a first detection signal and a second detection signal from the detection means as a basis to determine whether an abnormality of the detection electrode and/or the shield electrode is present or absent, the first detection signal depending on the electrostatic capacitance detected by the detection electrode when the shield drive means applies the first electric potential to the shield electrode, the second ...

OPERATIONAL STATE DETERMINATION APPARATUS

The invention relates to an operational state determination apparatus () for determining whether a variation in a determined electrical parameter of an electrical network () is caused by a variation in an operational state of an electrical consumer of the electrical network. The electrical network comprises multiple electrical consumers () and a voltage source (), wherein a variation classification unit () determines whether a variation in the determined electrical parameter of the electrical network is caused by a variation in the operational state of an electrical consumer of the network depending on a decision variable which depends on a variation in a measured voltage and a variation in a measured current of the electrical network. This determination can be performed, without directly using the variation in the determined electrical parameter of the electrical network and is therefore less influenced by random voltage fluctuations in the electrical network. 1. An operational state determination apparatus for determining whether a variation in a determined electrical parameter of an electrical network is caused by a variation in an operational state of an electrical consumer of the electrical network , wherein the electrical network comprises multiple electrical consumers and a voltage source , wherein the operational state determination apparatus comprises:a voltage meter for measuring a voltage in the electrical network,a current meter for measuring a current in the electrical network,a decision variable determination unit for determining a decision variable depending on a variation in the measured voltage and a variation in the measured current, wherein the decision variable is indicative of whether a variation in the determined electrical parameter of the electrical network is caused by a variation in the operational state of an electrical consumer,a variation classification unit for determining whether a variation in the determined electrical parameter of ...

DEVICE AND METHOD FOR INDUCTIVE MEASUREMENTS - SELF TEST

A method for nondestructive and noncontact detection of faults in a test piece, with a transmitter coil arrangement with at least one transmitter coil, a receiver coil arrangement with at least one receiver coil for detecting a periodic signal which has a carrier oscillation whose amplitude and/or phase is modulated by a fault in the test piece. A signal processing unit producing a useful signal receiver coil signal, and an evaluation unit evaluating the useful signal for detection of a fault in the test piece. A self-test unit automatically or upon an external request undertakes systematic quantitative checking of signal processing functions of the signal processing unit and/or systematic quantitative checking of the transmitter coil arrangement and/or of the receiver coil arrangement and/or upon external request undertakes calibration of the signal processing unit using a calibration standard which replaces the transmitter coil arrangement and/or of the receiver coil arrangement. 1. A device for detecting electrically conductive particles in a liquid flowing in a pipe segment with a velocity (v) , comprisinga transmitter coil arrangement with at least one transmitter coil for exposing the liquid to a plurality of periodic alternating electromagnetic fields inducing a plurality of eddy currents in the particles;a receiver coil arrangement with at least one receiver coil for detecting a periodic electrical signal, according to the induced eddy currents and which has a carrier oscillation where at least one of an amplitude and a phase is modulated by the particles when the particles travel into an effective width of the receiver coil arrangement;a signal processing unit for producing a useful signal from a receiver coil signal;an evaluation unit for evaluating the useful signal to detect the passage of electrically conductive particles in a pipe segment; anda self-test unit which automatically or upon external request undertakes systematic quantitative checking of at ...

Replaceable coupon for a probing apparatus

The contacts of a probing apparatus are elastically supported on a replaceable coupon and electrically interconnected with conductors on a membrane or a space transformer.

CALIBRATION UNIT FOR A MEASUREMENT DEVICE

A calibration unit for a measurement device for connecting to a connector embodied in a coaxial manner. The calibration unit provides a housing and an inner conductor, whereas the inner conductor () is embodied centered within an aperture of the housing. The calibration unit provides a connecting element, that the connecting element is inserted into the aperture of the housing and hosts the inner conductor and that the connecting element is embodied in an elastic manner and supports the inner conductor in an elastic manner relative to the housing. 1. A calibration unit , comprising:a housing and an inner conductor, wherein the inner conductor is positioned approximately centered within an aperture of the housing; anda connecting element, wherein the connecting element is positioned within the aperture of the housing and hosts the inner conductor,wherein the connecting element is embodied in a manner whereby it supports the inner conductor in a flexible manner relative to the housing, andwherein the calibration unit is configured for a connection with a connector structured in a relatively coaxial form.2. The calibration unit according to claim 1 , wherein the connecting element is embodied in a funnel shape and comprises a plurality contiguous segments.3. The calibration unit according to claim 2 , wherein a first segment of the connecting element is embodied as one or more of a flange or a cowl claim 2 , and is one or more of glued claim 2 , pressed or soldered to the housing in an electrically conductive manner claim 2 , and wherein the housing is electrically conductive or is coated with at least one electrically conductive layer claim 2 , and wherein the connecting element comprises an electrically conductive material.4. The calibration unit according to claim 2 , wherein a second segment of the connecting element comprises an internal diameter claim 2 , which corresponds to an internal diameter of an outer conductor of the connector with which the calibration ...

Signal acquisition system having reduced probe loading of a device under test

A signal acquisition system has a signal acquisition probe having probe tip circuitry coupled to a resistive center conductor signal cable. The resistive center conductor signal cable of the signal acquisition probe is coupled to a compensation system in a signal processing instrument via an input node and input circuitry in the signal processing instrument. The signal acquisition probe and the signal processing instrument have mismatched time constants at the input node with the compensation system providing pole-zero pairs for maintaining flatness over the signal acquisition system frequency bandwidth.

Method for Calibrating a Conductivity Measuring Cell

The invention relates to a method for calibrating a conductivity measuring cell located in a measurement setup for determining conductivity of a liquid medium, especially very pure water, by means of two electrodes of predetermined area arranged in the liquid medium at a predetermined separation relative to one another, supplied with an alternating voltage and having a cell constant, which is predetermined by separation and electrode area and must be calibrated. In order to be able to determine the cell constant independently of calibration standards with predetermined conductivity and/or reference measurement cells, an electrical capacitance of the measuring cell is ascertained by means of an alternating voltage placed on the electrodes in a frequency range between 1 kHz and 1 MHz, following which the cell constant is determined from the ascertained capacitance and the permittivity of the liquid medium contained in the measuring cell. 110-. (canceled)11. A method for calibrating a conductivity measuring cell located in a measurement setup for determining conductivity of a liquid medium , by means of two electrodes of predetermined area arranged in the liquid medium at a predetermined separation relative to one another , comprising the steps of:supplying the electrodes with an alternating voltage and having a cell constant, which is predetermined by separation and electrode area and must be calibrated; ascertaining an electrical capacitance of the measuring cell by means of the alternating voltage placed on the electrodes in a frequency range between 1 kHz and 1 MHz, following which; and{'sub': 'Cell', 'determining the cell constant from a cell capacitance (C), as ascertained from the measured capacitance, and the permittivity of the liquid medium contained in the measuring cell.'}12. The method as claimed in claim 11 , further comprising the step of:{'sub': S', 'R, 'eliminating a disturbance capacitance (C+C) contained in a measured capacitance and caused by the ...

POTENTIOMETER DEGRADATION EVALUATING METHOD

In a method for evaluating degradation of a potentiometer, a plurality of evaluation items, from minor to major, are established as evaluation items for degradation in performance prior to failure of a potentiometer. The degradation of the potentiometer in performance of the plurality of evaluation items is evaluated in terms of stages, in a specific sequence. 1: A method for evaluating degradation of a potentiometer , comprising:establishing a plurality of evaluation items, from minor to major, as evaluation items for degradation in performance prior to failure of a potentiometer; andevaluating in terms of stages, in a specific sequence, the degradation of performance of the plurality of evaluation items.2: The method for evaluating degradation of a potentiometer as set forth in claim 1 , whereina production of noise is evaluated as an evaluation item for the degradation of performance of the potentiometer, and if acceptable, a loss of linearity between an input and an output is evaluated, and if acceptable, a change in a resistance value is evaluated, and if acceptable, an increase in a rotational torque is evaluated.3: The method for evaluating degradation of a potentiometer as set forth in claim 1 , whereina production of noise is evaluated as an evaluation item for the degradation of performance of the potentiometer, and if acceptable, a loss of linearity between an input and an output is evaluated.4: The method for evaluating degradation of a potentiometer as set forth in claim 1 , whereina loss of linearity between an input and an output is evaluated as an evaluation item for the degradation of performance of the potentiometer, and if acceptable, a change in a resistance value is evaluated.5: The method for evaluating degradation of a potentiometer as set forth in claim 1 , wherein:a change in a resistance value is evaluated as an evaluation item for the degradation of performance of the potentiometer, and if acceptable, a rotational torque is evaluated. This ...

Voltage monitoring apparatus for plural battery

A fail signal indicating overcharge/overdischarge of unit cells detected by voltage detecting ICs ( 21 - 1 ) to ( 21 - n ) is transmitted as a digital signal and an analog signal to a CPU 32. If the analog fail signal and digital fail signal agree with each other, the CPU 32 determines that overcharge or overdischarge is occurring in the unit cells. If the fail signals disagree with each other, it is determined that an error is occurring in data communication in communication lines L 1 to L 3 and the error is informed to an operator with an alarm signal or the like. As a result, overcharge or overdischarge is highly accurately detectable.

Kelvin Sense Probe Calibration

Calibrating automatic test systems for testing electronic components using Kelvin probes is taught. A nominal contact resistance of a Kelvin probe is measured using a test slug to replace an electronic component to be measured on the test system. The measured resistance is stored by the test system and can be used to compensate for a measured value for an electronic component. A test slug can be periodically inserted into the test system to update the contact resistance measure and/or track the contact resistance to measure Kelvin probe wear and/or contamination.

METHODS AND APPARATUS FOR ACCURATE CHARACTERIZATION OF SIGNAL COIL RECEIVER SENSITIVITY IN MAGNETIC RESONANCE IMAGING (MRI)

A method for estimating receiver coil sensitivity in a magnetic resonance (MR) system having a plurality of coils in a coil array including a reference coil, including steps of estimating receiver coil sensitivity in each of the plurality of coils in the coil array of the MR system using one of an electromagnetic field method, a bias field method, and a uniform transmit field method. Each of the plurality of coils in the coil array includes one or more of a surface coil, a volume coil, a set of coil arrays, or an antenna element of a coil array. The method further includes steps of obtaining a reference image using the reference coil; generating a measured sensitivity map using the reference coil; and for each of the plurality of coils of the coil array, calculating a receiver coil sensitivity map. 1. A method for estimating receiver sensitivity in a magnetic resonance (MR) system , the method comprising:acquiring an image SI(x);{'sub': '1', 'sup': 'transmit', "determining a transmission function T(x) comprising using Bloch's equation with an estimated transmit field B;"}generating an estimate of the bias field B(x); andcombining the estimated bias field B(x) and the transmission function T(x) to determine a receiver sensitivity S(x).2. The method of claim 1 , wherein acquiring an image SI(x) comprises acquiring a plurality of signal intensity images using different imaging parameters.3. The method of claim 2 , wherein the estimated transmit field Bis determined byestimating a relative flip angle map using the image SI(x),for the plurality of signal intensity images, each acquired using different imaging parameters, estimating a relative transmit field map,for each nominal flip angle, determining a calibration factor based on a linear relationship between the nominal flip angles and the measured flip angles, andfor each nominal flip angle, calculating an absolute flip angle corresponding to the nominal flip angles.4. The method of claim 3 , wherein determining a ...

METHOD FOR MANUFACTURING SENSOR ELEMENT FOR USE IN GAS SENSOR, INSPECTING ELECTRICAL CHARACTERISTICS OF SENSOR ELEMENT, AND PRE-TREATING SENSOR ELEMENT

To provide a method for manufacturing a sensor element, by which stabilization of an electrode, which is performed prior to inspecting element characteristics, can be performed for a shorter time period and in a more reliable manner than in the conventional. The sensor element includes: an oxygen-ion conductive solid electrolyte layer; a first electrode that is formed on a surface of the oxygen-ion conductive solid electrolyte layer; and a second electrode that is formed in a space provided inside the oxygen-ion conductive solid electrolyte layer, and that is configured to reduce said predetermined gas component. As the pre-treatment, by an external power source. a voltage is applied between the first electrode and the second electrode, to thereby decompose and remove a gas component attached to the second electrode. 1. A method for manufacturing a sensor element for use in a gas sensor that measures a concentration of a predetermined gas component in a measurement gas , said sensor element comprising an electrochemical pumping cell including:an oxygen-ion conductive solid electrolyte layer;a first electrode that is formed on a surface of said oxygen-ion conductive solid electrolyte layer; anda second electrode that is formed in a space provided inside said oxygen-ion conductive solid electrolyte layer,said method comprising the steps of:a) forming, by printing, a wiring pattern of a conductive paste on a green sheet containing, as a main component, ceramic which is an oxygen-ion conductive solid electrolyte, said wiring pattern including portions serving as said first electrode and said second electrode;b) laminating a plurality of green sheets that have been subjected to said step a), and integrating said plurality of green sheets;c) cutting out a plurality of element bodies from a laminated body obtained by said step b);d) baking the element body cut out by said step c);e) heating the element body having been subjected to said step d), in a reducing atmosphere;f) ...

System and Method for Error Correction for CNC Machines

A method of determining a positioning error of a CNC machine is provided and an system thereof. A calibration element is placed within the CNC machine. A first sensor reading is taken of the calibration element. A second sensor reading is taken and the sensor is moved in a manner that the difference between the first and second sensor data decreases until the difference becomes less or equal to a pre-determined threshold value. A positioning error of the tool head is determined based on the movement of the sensor. 1. A method for determining a positioning error of a CNC machine , wherein the CNC machine is equipped with a calibration element , the calibration element being in a first position , the method comprising the steps of:reading first sensor data from at least one sensor while the calibration element is at the first position, the sensor data corresponding to a distance associated with the calibration element;operating the CNC machine to perform a calibration movement while the calibration element remains generally at the first position;reading second sensor data from the at least one sensor while the calibration element is at a second position, the second position denoting the actual position of the calibration element after the calibration movement has been performed;causing the at least one sensor to move so that the difference between the first and second sensor data decreases until the difference becomes less or equal to a pre-determined threshold value; anddetermining a positioning error of the CNC machine based on the movement of the at least one sensor.2. The method according to further comprising:determining, from the first and second sensor data, including the difference thereof, a first compensation direction, in such a way that a movement of the at least one sensor in the first compensation direction decreases the difference between the first and second sensor data; andcausing the at least one sensor to move in the first compensation direction.3. ...

Detector Housing

A duct detector housing includes a housing cover and a housing body defining a midline between the center of a detector and a printed circuit board within said body. Gas inlet and outlets are off axis of the midline to allow water that collects in conventional housing to drain from the housing. A maintenance mode button associated with a duct detector housing cover that is secured to a housing body of the housing provides a preselected time period during which removal of the cover is independent of a cover removal alarm. A printed circuit board within the housing has dedicated terminal blocks providing grouped connections with each of the groups segregated from another. An improved duct detector terminal has a hole in the terminal adapted to receive a test meter probe therethrough to provide an electrical contact between the wire. 1. A process for testing a detector mounted within a duct housing sampling a forced air duct comprising:providing a maintenance mode button associated with a duct detector housing cover being secured to a housing body of the housing and containing the detector therein;activating said maintenance mode button to provide a preselected time period during which removal of said cover is independent of a cover removal alarm;removing said cover;testing the detector; andreplacing said cover.2. The process of further comprising providing a pilot indicator light claim 1 , said pilot indicator light changing activation mode upon said maintenance mode button being depressed.3. The process of further comprising said pilot indicator light operating in a second mode in a warning time period prior to the timed mode expiration.4. The process of further comprising overriding the maintenance mode by depressing said maintenance mode button within a preselected interval of time after the initial depression of said maintenance mode button.5. The process of further comprising returning to a normal mode if a subsequent event fails to occur within a preselected ...

PROCESS AND SYSTEM FOR CALIBRATING A FIRST LOOP FEATURE VALUE ESTIMATION METHOD USING A FIRST LOCALLY MEASURABLE LOOP CHARACTERISTIC AND A FIRST SET OF PARAMETERS

A process for calibrating a first loop feature value estimation method using a first locally measurable loop characteristic and a first set of parameters, includes taking measurements of the first locally measurable loop characteristic for a plurality of loops, and obtaining a reference data set representing reference estimates of the loop feature value. The reference estimates are obtained by performing a calibrated second loop feature value estimation method using a second locally measurable loop characteristic and a second set of parameters. The method further includes determining calibrated parameters so as to minimize a deviation between the reference estimates and estimates obtained by applying the first estimation method to the measurements using the calibrated parameters as the first set of parameters. 1. A calibration process for calibrating a first loop feature value estimation method using a first locally measurable loop characteristic and a first set of parameters , comprising:taking measurements of said first locally measurable loop characteristic for a first plurality of loops;obtaining a reference data set representing reference estimates of said loop feature value, said reference estimates being obtained by performing a calibrated second loop feature value estimation method using a second locally measurable loop characteristic and a second set of parameters; anddetermining calibrated parameters so as to minimize a deviation between said reference estimates and estimates that can be obtained by applying said first loop feature value estimation method to said measurements using said calibrated parameters as said first set of parameters.2. The calibration process according to claim 1 , further comprising obtaining a verification data set representing verification estimates of feature values of said first plurality of loops claim 1 , said verification estimates being obtained by applying said first loop feature value estimation method to said ...

REDUCING BENDING EFFECTS IN TOUCH SENSOR DEVICES

A capacitive image sensor for detecting an input object includes a first substrate and a second substrate. A compressible region is defined between the first substrate and the second substrate. The first substrate is deflectable towards the second substrate. A transmitter electrode, receiver electrode, and bending effect electrode are disposed on the first substrate. The bending effect electrode is disposed between the transmitter electrode and receiver electrode and is configured to reduce a change in resulting signals detected from the receiver electrode caused by deflection of the first substrate towards the second substrate. 1. A capacitive image sensor for detecting an input object , comprising:a first substrate having a first side;a second substrate displaced from the first substrate to define a compressible region between the first substrate and the second substrate, wherein the first substrate is deflectable relative to the second substrate between a first position in which the compressible region has a first thickness and a second position in which the compressible region has a second thickness that is less than the first thickness;a transmitter electrode disposed on the first substrate;a receiver electrode disposed on the first substrate; anda bending effect electrode disposed on the first substrate and disposed between the transmitter electrode and the receiver electrode,wherein when the first substrate is in the first position, a plurality of field lines extends from the transmitter electrode through the compressible region and terminates on the bending effect electrode, and when the first substrate is in the second position, the plurality of field lines extends from the transmitter electrode through the compressible region and terminates on the second substrate.2. The capacitive image sensor of claim 1 , wherein the compressible region is an air gap.3. The capacitive image sensor of claim 1 , wherein the second substrate is a ground plane.4. The ...

REDUCING BENDING EFFECTS IN TOUCH SENSOR DEVICES

A capacitive image sensor for detecting an input object includes a first substrate and a second substrate. A compressible region is defined between the first substrate and the second substrate. The first substrate is deflectable towards the second substrate. A transmitter electrode, receiver electrode, and bending effect electrode are disposed on the first substrate. The bending effect electrode is disposed between the transmitter electrode and receiver electrode and is configured to reduce a change in resulting signals detected from the receiver electrode caused by deflection of the first substrate towards the second substrate. 1. A capacitive image sensor for detecting an input object , comprising:a first substrate having a first side;a second substrate displaced from the first substrate to define a compressible region between the first substrate and the second substrate, wherein the first substrate is deflectable relative to the second substrate between a first position in which the compressible region has a first thickness and a second position in which the compressible region has a second thickness that is less than the first thickness;a transmitter electrode disposed on the first substrate;a receiver electrode disposed on the first substrate; anda bending effect electrode disposed on the first substrate and disposed between the transmitter electrode and the receiver electrode,wherein when the first substrate is in the first position, a plurality of field lines extends from the transmitter electrode through the compressible region and terminates on the bending effect electrode, and when the first substrate is in the second position, the plurality of field lines extends from the transmitter electrode through the compressible region and terminates on the second substrate.2. The capacitive image sensor of claim 1 , wherein the compressible region is an air gap.3. The capacitive image sensor of claim 1 , wherein the second substrate is a ground plane.4. The ...

CURRENT TESTS FOR I/O INTERFACE CONNECTORS

Current tests for I/O interface connectors are described. In one example a test may include applying a forced energy to a first pin of an interface of a data communications bus of an integrated circuit on a die, sensing the energy caused by the forced energy at a second pin of the interface, and comparing the forced energy and the sensed energy to determine an amount of current leaked by at least a portion of the interface. 1. A method comprising:applying a forced energy to a first pin of an interface of a data communications bus of an integrated circuit on a die;sensing the energy caused by the forced energy at a second pin of the interface; andcomparing the forced energy and the sensed energy to determine an amount of current leaked by at least a portion of the interface.2. The method of claim 1 , wherein the forced energy is a forced current and the sensed energy is a sensed voltage.3. The method of claim 1 , wherein the forced energy is a forced voltage and the sensed energy is a sensed voltage.4. The method of claim 1 , wherein applying a forced energy comprises applying the forced energy to the first pin through a multiplexer claim 1 , each pin being coupled to a multiplexer to determine to which pin the forced energy is applied.5. The method of claim 4 , further comprising disabling the multiplexers for pins other than the first pin and driving the forced energy also to the disabled multiplexers.6. The method of claim 4 , wherein the forced energy is a forced voltage and the sensed energy is a sensed voltage and wherein sensing the voltage comprises sensing the voltage through an observability pin claim 4 , the method further comprising calibrating the observability pin by:disabling a plurality of the multiplexers;driving a voltage onto the disabled multiplexers; andmeasuring current leaked through the observation pin.7. The method of claim 6 , further comprising:repeating calibrating an observability pin to calibrate a plurality of different observability ...

Detector circuit

A detector circuit, has a first diode, to an anode of which an AC signal is input and to which a constant voltage is supplied, a second diode, to an anode of which the constant voltage is supplied, and a difference current generation circuit, which generates the difference current between a first current flowing in the first diode and a second current flowing in the second diode.

Current Measurement For An Electric Heater

The invention relates to a method for measuring a current or voltage output quantity of a switched-mode power supply circuit (H), referred to as a chopper circuit, of period T and of cyclic ratio α, belonging to the interval ]0; 1[, such that, at each period, the supply current is non-zero during an “ON” phase of duration αT, and zero during an “OFF” phase of duration (1−α)T. The measurement method includes the following steps: measuring the value Gof an image of the output quantity during an “ON” phase; measuring the value Gof an image of the output quantity during an “OFF” phase; calculating the difference ΔG=G−G; and using the difference ΔG for evaluating the output quantity. 1. A method for measuring a current or voltage output quantity of a switched-mode power supply circuit , called chopper circuit , of period T and of duty cycle α , belonging to the interval ]0; 1[ , such that , at each period , the power supply current is non-zero during an on phase of duration αT and zero during an off phase of duration (1−α)T , wherein the measurement method comprises the following steps:{'sub': 'on', 'measuring the value Gof an image of the output quantity during an on phase;'}{'sub': 'off', 'measuring the value Gof an image of the output quantity during an off phase;'}{'sub': on', 'off, 'calculating the difference ΔG=G−G; and'}using the difference ΔG to evaluate the output quantity.2. The measurement method as claimed in claim 1 , wherein the Gand Gmeasurements are performed during the on and off phases of one and the same period.3. The measurement method as claimed in claim 2 , wherein the Gand Gmeasurements are performed at a frequency higher than the power supply switching frequency.4. The measurement method as claimed in claim 1 , wherein the Gand Gmeasurements are each performed during the respective on and off phase of two consecutive periods.5. The measurement method as claimed in claim 1 , wherein a correction component is added to the evaluated quantity before ...

Test of a testing device for determining a voltage state of a high-voltage vehicle electrical system

A method for testing a testing device for determining a voltage state of an on-board high-voltage electrical system of a motor vehicle includes establishing a predetermined voltage state in the on-board high-voltage electrical system by supplying a test voltage to the on-board high-voltage electrical system and determining the voltage state with the testing device and comparing the determined voltage state with the predetermined voltage state This ensures that, before maintenance work on the on-board high-voltage electrical system is performed, a voltage-free state of the on-board high-voltage electrical system determined by the testing device is actually present, thereby eliminating risk to maintenance personnel due to an accidentally applied voltage.

CALIBRATION DEVICE AND CALIBRATION METHOD FOR ARRAY ANTENNA

In order to perform calibration of respective systems of an array antenna with high accuracy for adapting to a change in environmental condition, provided is a calibration device (A) for calibrating an array antenna mounted on a satellite or the like, the calibration device including: a calibration coefficient calculating unit () to calculate a correlation of a plurality of input signals Xi(t,P), which are obtained by performing predetermined signal processing for signals received by an array antenna (), to calculate weighting coefficients (βW) for calibrating systems of the array antenna; and a calibration executing unit () to calibrat the systems of the array antenna based on the weighting coefficients (βW). 1. A calibration device for calibrating an array antenna arranged in space , the calibration device comprising:a calibration coefficient calculating unit to receive a plurality of input signals obtained by performing, in respective systems of the array antenna, predetermined signal processing for signals received by the array antenna, to calculate a correlation of the plurality of input signals, and to calculate weighting coefficients calibrate the array antenna; anda calibration executing unit to calibrate the array antenna based on the weighting coefficients.2. A calibration device according to claim 1 , wherein the calibration coefficient calculating unit comprises:a correlation matrix calculating section to calculate a correlation matrix of the plurality of input signals;an eigenvalue calculating section to calculate a maximum eigenvalue of the correlation matrix calculated by the correlation matrix calculating section;an eigenvector calculating section to calculate an eigenvector of the maximum eigenvalue; anda weighting coefficient calculating section to calculate a proportionality constant so that a norm of the eigenvector becomes 1, and output a product of the proportionality constant and the eigenvector as the weighting coefficients.3. A calibration ...

SERVER AND METHOD FOR TESTING SENSORS OF THE SERVER

In a method for testing sensors of a server, the method obtains serial numbers of each of the sensors from a board management controller (BMC) of the server using an intelligent platform management interface (IPMI) service of the server, and modifies lower and upper critical values to generate first and second system event logs even during normal working of the components subject to sensing. The method records a confirmed and tested status of each of the sensors if the first system event log and the second system log are right. 1. A computer-implemented method for testing sensors of a server , the method comprising:(a) obtaining serial numbers of each of the sensors from a board management controller (BMC) of the server using an intelligent platform management interface (IPMI) service of the server;(b) obtaining one of the serial numbers of the sensors, and selecting a sensor according to the obtained serial number;(c) obtaining a name of the sensor according to the serial number of the sensor;(d) modifying a lower critical value of the sensor to a first threshold value that is higher than a current value of the sensor, to generate a first system event log of the server;(e) recording a first testing status of the sensor if the first system event log includes a first keyword which presents that the first system event log is right;(f) modifying an upper critical value of the sensor to a second threshold value which is lower than the current value of the sensor, to generate a second system event log of the server;(g) recording a second testing status of the sensor if the second system event log includes a second keyword which presents that the second system event log is right;(h) repeating from the step (b) to the step (g) until all of the sensors are selected to be tested.2. The method according to claim 1 , further comprises:recording an error in the first system event log and determining that the second system event log is wrong, if the first system event log does ...

IMAGE FORMING APPARATUS AND METHOD OF CONTROLLING DEVELOPING UNIT THEREOF

An image forming apparatus is provided. The image forming apparatus includes a developing unit which contains a mixture of toner and carrier, a toner sensor which is disposed in the developing unit, and a controller which determines a control voltage for the toner sensor using change information on a change in a quantity of electric charge which changes according to a time during which the image forming apparatus is used or paused, and drives the toner sensor using the determined control voltage and compensates for an output value of the toner sensor. Accordingly, toner can be prevented from being supplied excessively. 1. An image forming apparatus comprising:a developing unit which contains a mixture of toner and carrier;a toner sensor which is disposed in the developing unit; anda controller which determines a control voltage for the toner sensor using change information on a change in a quantity of electric charge which changes according to a time during which the image forming apparatus is used or paused, and drives the toner sensor using the determined control voltage to compensate an output value of the toner sensor.2. The image forming apparatus as claimed in claim 1 , wherein the toner sensor is driven according to the control voltage and measures a quantity of electric charge per unit mass of a developing agent of the developing unit claim 1 , in which toner and carrier are mixed claim 1 , andwherein the controller adjusts an amount of toner to be supplied to the developing unit based on an output value of the toner sensor.3. The image forming apparatus as claimed in claim 2 , further comprising:a counter unit which counts a number of revolutions of a developing roller of the developing unit and a pause time of the image forming apparatus;a first storage unit which stores information on an initial control voltage which is matched with each quantity of electric charge; anda second storage unit which stores the change information,wherein the controller ...

Offset error compensation systems and methods in sensors

Embodiments relate to reducing offset error in sensor systems. In embodiments, the sensitivity and offset of a sensor depend differently on some parameter, e.g. voltage, such that operating the sensor at two different values of the parameter can cancel the offset error. Embodiments can have applicability to stress sensors, Hall plates, vertical Hall devices, magnetoresistive sensors and others.

MEASUREMENT ERROR CORRECTION METHOD AND ELECTRONIC COMPONENT CHARACTERISTIC MEASUREMENT APPARATUS

In a measurement error correction method and an electronic component characteristic measurement apparatus, for each of correction-data acquisition samples having electrical characteristics different from one another, electrical characteristics S, Sare measured in a first state in which the correction-data acquisition sample is mounted on a standard fixture and in a second state in which the correction-data acquisition sample is mounted on a test fixture, respectively. For each signal source port of a measurement system including a measuring instrument for measuring electrical characteristics, a mathematical expression that assumes the existence of a leakage signal that is transmitted directly between at least two ports of at least one of the standard fixture and the test fixture is determined. Electrical characteristics of a given electronic component are measured in the second state. By using the determined mathematical expressions, electrical characteristics if measurement were performed in the first state are calculated. 1. A measurement error correction method , implemented by a processor , for calculating , for n (where n is a positive integer of 2 or greater) given ports , the n given ports being two or more ports of an electronic component , an estimated value of electrical characteristics that would be obtained if measurement were performed with the electronic component mounted on a standard fixture , from a result obtained by measuring electrical characteristics of the electronic component with the electronic component mounted on a test fixture , the measurement error correction method comprising:a first step of measuring, for each of at least three first correction-data acquisition samples, electrical characteristics of the first correction-data acquisition sample with the first correction-data acquisition sample mounted on the standard fixture, the first correction-data acquisition samples having electrical characteristics that are different from one ...

APPLICATION OF ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY IN SENSOR SYSTEMS, DEVICES, AND RELATED METHODS

A diagnostic Electrochemical Impedance Spectroscopy (EIS) procedure is applied to measure values of impedance-related parameters for one or more sensing electrodes. The parameters may include real impedance, imaginary impedance, impedance magnitude, and/or phase angle. The measured values of the impedance-related parameters are then used in performing sensor diagnostics, calculating a highly-reliable fused sensor glucose value based on signals from a plurality of redundant sensing electrodes, calibrating sensors, detecting interferents within close proximity of one or more sensing electrodes, and testing surface area characteristics of electroplated electrodes. Advantageously, impedance-related parameters can be defined that are substantially glucose-independent over specific ranges of frequencies. An Application Specific Integrated Circuit (ASIC) enables implementation of the EIS-based diagnostics, fusion algorithms, and other processes based on measurement of EIS-based parameters. 1. A method of performing real-time sensor diagnostics on a subcutaneous or implanted sensor having at least one working electrode , comprising:(a) performing a first electrochemical impedance spectroscopy (EIS) procedure to generate a first set of impedance-related data for the at least one working electrode;(b) after a predetermined time interval, performing a second EIS procedure to generate a second set of impedance-related data for the at least one electrode; and(c) based on the first and second sets of impedance-related data, determining whether the sensor is functioning normally.2. The method of claim 1 , wherein each of the first and second EIS procedures is performed for a respective range of frequencies.3. The method of claim 2 , wherein the range of frequencies for the first EIS procedure is different from the range of frequencies for the second EIS procedure.4. The method of claim 1 , wherein each of the first and second sets of impedance-related data includes data for at ...

APPLICATION OF ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY IN SENSOR SYSTEMS, DEVICES, AND RELATED METHODS

A diagnostic Electrochemical Impedance Spectroscopy (EIS) procedure is applied to measure values of impedance-related parameters for one or more sensing electrodes. The parameters may include real impedance, imaginary impedance, impedance magnitude, and/or phase angle. The measured values of the impedance-related parameters are then used in performing sensor diagnostics, calculating a highly-reliable fused sensor glucose value based on signals from a plurality of redundant sensing electrodes, calibrating sensors, detecting interferents within close proximity of one or more sensing electrodes, and testing surface area characteristics of electroplated electrodes. Advantageously, impedance-related parameters can be defined that are substantially glucose-independent over specific ranges of frequencies. An Application Specific Integrated Circuit (ASIC) enables implementation of the EIS-based diagnostics, fusion algorithms, and other processes based on measurement of EIS-based parameters. 1. A method of calibrating a sensor during a period of sensor transition , the method comprising:defining an electrochemical impedance spectroscopy (EIS)-based sensor status vector (V) for each one of a plurality of sensor current (Isig)-blood glucose (BG) pairs;monitoring the status vectors for the plurality of Isig-BG pairs over time;detecting when there is a difference between a first status vector for a first Isig-BG pair and a subsequent status vector for a subsequent Isig-BG pair, said first Isig-BG pair having assigned thereto a first offset value; andif a magnitude of said difference is larger than a predetermined threshold, assigning a dynamic offset value for said subsequent Isig-BG pair that is different from said first offset value so as to maintain a substantially linear relationship between said subsequent Isig and said subsequent BG.2. The method of claim 1 , wherein claim 1 , for each Isig-BG pair claim 1 , the sensor status vector includes impedance and Nyquist slope as ...

APPLICATION OF ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY IN SENSOR SYSTEMS, DEVICES, AND RELATED METHODS

A diagnostic Electrochemical Impedance Spectroscopy (EIS) procedure is applied to measure values of impedance-related parameters for one or more sensing electrodes. The parameters may include real impedance, imaginary impedance, impedance magnitude, and/or phase angle. The measured values of the impedance-related parameters are then used in performing sensor diagnostics, calculating a highly-reliable fused sensor glucose value based on signals from a plurality of redundant sensing electrodes, calibrating sensors, detecting interferents within close proximity of one or more sensing electrodes, and testing surface area characteristics of electroplated electrodes. Advantageously, impedance-related parameters can be defined that are substantially glucose-independent over specific ranges of frequencies. An Application Specific Integrated Circuit (ASIC) enables implementation of the EIS-based diagnostics, fusion algorithms, and other processes based on measurement of EIS-based parameters. 1. A method of performing real-time sensor diagnostics on a subcutaneous or implanted sensor having at least one working electrode , comprising:(a) performing a first electrochemical impedance spectroscopy (EIS) procedure to generate a first set of impedance-related data for the at least one working electrode;(b) after a predetermined time interval, performing a second EIS procedure to generate a second set of impedance-related data for the at least one electrode; and(c) based on the first and second sets of impedance-related data, determining whether the sensor is functioning normally.2. A method of calculating a single , fused sensor glucose value based on respective glucose measurement signals of a plurality of redundant sensing electrodes , comprising:performing respective electrochemical impedance spectroscopy (EIS) procedures for each of the plurality of redundant sensing electrodes to obtain values of at least one impedance-based parameter for each said sensing electrode;measuring ...

Circuits and Methods for Generating a Diagnostic Mode of Operation in a Magnetic Field Sensor

A magnetic field sensor includes a diagnostic circuit that allows a self-test of most of, or all of, the circuitry of the magnetic field sensor, including a self-test of a magnetic field sensing element used within the magnetic field sensor. The magnetic field sensor can generate a diagnostic magnetic field to which the magnetic field sensor is responsive. 1. A magnetic field sensor , comprising:at least two magnetic field sensing elements; and a measured-magnetic-field-responsive signal portion responsive to an external magnetic field and substantially unresponsive to a diagnostic magnetic field when coupled in the normal mode configuration; and', 'a diagnostic-magnetic-field-responsive signal portion responsive to the diagnostic magnetic field and substantially unresponsive to the external magnetic field when coupled in the diagnostic mode configuration,, 'a switching circuit coupled to the at least two magnetic field sensing elements, wherein the switching circuit is configured to couple the at least two magnetic field sensing elements into a normal mode configuration when the magnetic field sensor is in a normal mode of operation, and wherein the switching circuit is configured to couple the at least two magnetic field sensing elements into a diagnostic mode configuration when the magnetic field sensor is in a diagnostic mode of operation, wherein the at least two magnetic field sensing elements are configured to generate a magnetic field signal comprisingwherein the magnetic field sensor is operable to generate a diagnostic output signal from the magnetic field sensor when in the diagnostic mode of operation, wherein the diagnostic output signal capable of indicating results of a self-test of the at least two magnetic field sensing elements and a self-test of processing circuits coupled to the at least two magnetic field sensing elements.2. The magnetic field sensor of claim 1 , wherein the switching circuit is configured to couple the at least two magnetic ...

MAGNETIC SENSORS

A governing circuit for a magneto-transistor is disclosed. The magneto-transistor comprising a first and second collector. At least one emitter and at least one base. The governing circuit is configured to measure a first calibration current at the first collector of the magneto-transistor and a second calibration current at the second collector of the magneto-transistor, while a calibration base-emitter voltage is applied to the magneto-transistor. The magneto-transistor is also configured to measure a first measurement current at the first collector of the magneto-transistor and a second measurement current at the second collector of the magneto-transistor, while a measurement base-emitter voltage is applied to the magneto-transistor, wherein the measurement base-emitter voltage is different form the calibration base-emitter voltage and determine an output signal indicative of an applied magnetic field using the measured first and second measurement current and first and second calibration currents. 1. A governing circuit for a magneto-transistor , the magneto-transistor comprising a first and second collector , at least one emitter and at least one base , wherein the governing circuit is configured to:measure a first calibration current at the first collector of the magneto-transistor and a second calibration current at the second collector of the magneto-transistor, while a calibration base-emitter voltage is applied to the magneto-transistor;measure first measurement current at the first collector of the magneto-transistor and a second measurement current at the second collector of the magneto-transistor, while a measurement base-emitter voltage is applied to the magneto-transistor, wherein the measurement base-emitter voltage is different from the calibration base-emitter voltage; anddetermine an output signal indicative of an applied magnetic field using the measured first and second measurement currents and first and second calibration currents.2. The ...

CONTROLLER FOR USE WITH A MECHANICAL SWITCH

Embodiments of the present invention relate to a controller () for use with a mechanical switch (). The controller () comprises at least one sensor (), an actuator and at least one attachment member () suitable for attaching the controller () to the mechanical switch () such that the actuator is brought into contact with the mechanical switch (). The actuator is arranged to operate the mechanical switch () in response to a signal from the at least one sensor (), in use. 1. A controller for use with a mechanical switch , the controller comprising at least one sensor;an actuator; andat least one attachment member suitable for attaching the controller to the mechanical switch such that the actuator is brought into contact with the mechanical switch, wherein the actuator is arranged to operate the mechanical switch in response to a signal from the at least one sensor, in use.2. A controller as claimed in claim 1 , wherein the sensor is a person detector.3. A controller as claimed in claim 2 , wherein the person detector is a Passive Infra Red detector.4. A controller as claimed in claim 1 , wherein at least one sensor is a timer.5. A controller as claimed in claim 1 , wherein the actuator comprises an elongate arm.6. A controller as claimed in claim 5 , wherein the actuator comprises a protrusion which extends substantially orthogonally to the longitudinal axis of the elongate arm claim 5 , and wherein the protrusion contacts the mechanical switch claim 5 , in use.7. A controller as claimed in claim 5 , wherein the elongate arm moves longitudinally to operate the mechanical switch claim 5 , in use.8. A controller as claimed in claim 1 , wherein the controller further comprises a battery.9. A controller as claimed in claim 1 , wherein the controller comprises a resilient member attached to the actuator such that moving the actuator to operate the switch places a load on the resilient member.10. A controller as claimed in claim 1 , wherein the controller comprises a ...

Insulated condition detector with fault detection and location

If a charge voltage of a read capacitor Ca measured by a microcomputer 15 is zero, the microcomputer 15 measures a charge voltage of the read capacitor Ca after the read capacitor Ca is discharged and is charged by a charge supply circuit 17 to predetermined potential, measures the same when the read capacitor Ca is isolated thereafter from a discharger of a flying capacitor C 1 , and measures the same when the read capacitor Ca is charged thereafter with a discharge voltage of the flying capacitor C 1 just after the start of discharge of the flying capacitor C 1 . Based on a pattern of the charge voltage values of the read capacitor Ca measured at the respective time points, a fault location of the insulated condition detector 10 is identified.

Method, system, and control apparatus for setting over-current protection point of electronic device

The invention discloses a method, a system, and a control apparatus for setting an over-current protection point of an electronic device. The method comprises: step 1, the parameter auto-test equipment transmitting a starting signal and outputting a target current for over-current protection based on the auto-adjustment control unit; step 2, the first driving signal generator receiving the starting signal and transmitting a driving signal to the over-current protection module; and step 3, the electronic device receiving the target current for over-current protection, and the over-current protection module receiving the driving signal and adjusting a resistance of the resistance adjusting unit to the over-current protection point of the electronic device. The invention attains fully automatic operation on the over-current protection point of the electronic device, improves stability and consistency of setting the over-current protection point, and saves labor cost at the same time.

TRAJECTORY CORRECTION METHOD AND APPARATUS FOR K-SPACE DATA IN MAGNETIC RESONANCE IMAGING

In a trajectory correction method and apparatus for k-space data points in magnetic resonance imaging, a magnetic resonance data acquisition unit is operated to execute a sampling sequence to obtain k-space to be corrected. Empirical points are selected used to divide k-space to be corrected into a central region and a peripheral region. The trajectories of the data points in the central region and the peripheral region are corrected and the sampling sequence is executed again, with the corrected trajectories, to obtain corrected k-space. 1. A trajectory correction method for k-space data points in magnetic resonance imaging , comprising:operating a magnetic resonance data acquisition unit to execute a sampling sequence to obtain k-space to be corrected;in a processor, automatically selecting empirical points, and using the empirical points to divide k-space to be corrected into a central region and a peripheral region;in said processor, automatically respectively correcting the trajectories of the data points in said central region and said peripheral region; andoperating said data acquisition unit to execute sampling sequence again, with the corrected trajectories, to obtain corrected k-space.2. The method as claimed in claim 1 , comprising selecting said empirical points by:selecting sampling points after delaying an empirical time value after an oblique acquisition period of a readout gradient is ended as said empirical points.3. The method as claimed in claim 1 , comprising respectively correcting the trajectories of the data points in said central region and said peripheral region by:operating the data acquisition unit to apply a readout gradient to each of the x axis, y axis and z axis of a Cartesian coordinate system and measuring the trajectories of the data points in k-space to be corrected, and respectively calculating actual filling positions of the data points in k-space to be corrected on the x axis, y axis and z axis;respectively calculating the ...

APPARATUS FOR TESTING AN ARC FAULT DETECTOR

An apparatus for testing an arc fault detector comprises a housing () having an ac power input plug () and an ac power output socket (), the plug being connected to supply ac power to the socket via electrical supply conductors (L, N) inside the housing. The socket () allows connection of an external appliance () to the housing for receiving power from the plug () through the internal supply conductors. An arc generator () inside the housing is connected between the plug () and the socket (). The arc generator comprises at least one pair of contacts and means to vibrate the contacts alternately open and closed. 13032100. An apparatus for testing an arc fault detector , comprising a housing () having an ac power input device ()connected to supply ac power to electrical conductors (L , N) inside the housing , and an arc generator () inside the housing connected to at least one of said conductors , the arc generator comprising at least one pair of contacts and means to vibrate said contacts alternately open and closed to generate arcing.21001820. A device as claimed in claim 1 , wherein the arc generator () comprises a loose electrical connection ( claim 1 , ) and means to vibrate said connection.3. A device as claimed in claim 2 , wherein the means to vibrate said connection comprises a mechanical oscillator operated by at least one electromagnetic winding.414. A device as claimed in claim 3 , wherein said mechanical oscillator comprises two electromagnetic windings (SOL1 claim 3 , SOL2) which are energised alternately to drive a ferromagnetic member () alternately in opposite directions.55258605852. A device as claimed in claim 3 , wherein said mechanical oscillator comprises an electromagnetic winding () which is intermittently energised to drive a ferromagnetic member () in one direction and a resilient device () to return the ferromagnetic member () in the opposite direction between successive energisations of the electromagnetic winding ().61001252. A device as ...

PROBE CARD ANALYSIS SYSTEM AND METHOD

A system and method for evaluating wafer test probe cards under real-world wafer test cell condition integrates wafer test cell components into the probe card inspection and analysis process. Disclosed embodiments may utilize existing and/or modified wafer test cell components such as, a head plate, a test head, a signal delivery system, and a manipulator to emulate wafer test cell dynamics during the probe card inspection and analysis process. 111-. (canceled)12. A method of testing a probe card , comprising:identifying a spring constant for at least one component of a wafer test cell;applying forces to the probe card based on the identified spring constant.13. The method of claim 12 , wherein the at least one component includes one of a test head claim 12 , a probe card claim 12 , a probe array claim 12 , a probe head plate and a probe chuck.14. The method of claim 12 , further comprising:measuring deflection of the probe card based on the applied forces.15. The method of claim 12 , further comprising:measuring a shape of the probe card based on the applied forces.16. The method of claim 12 , wherein identifying further comprises identifying a spring constant for each of a plurality of components of the wafer test cell.17. The method of claim 16 , wherein the plurality of components includes at least two of a test head claim 16 , a probe card claim 16 , a probe array claim 16 , and probe head plate and a probe chuck.18. A method of testing a probe card claim 16 , comprising:identifying a spring constant for at least one component of a probe array analyzer module; andapplying forces to the probe card based on the identified spring constant.19. The method of claim 18 , wherein the at least one component includes one of a probe card interface claim 18 , a probe card claim 18 , a probe array claim 18 , and probe card analyzer hardware.20. The method of claim 18 , further comprising:measuring deflection of the probe card based on the applied forces.21. The method of ...

METHOD FOR SENSOR READER CALIBRATION

In one embodiment a method for sensor reader calibration comprising: performing a calibration of a sensor reader wherein the calibration comprises open circuit calibration, a short circuit calibration, and a load circuit calibration, or any combination thereof in any succession; enabling connection of a pickup coil to the sensor reader to measure a sensor response; and applying a baseline correction to the sensor response, wherein the baseline correction is obtained utilizing measurements from the calibration step. In a further embodiment, a method for sensor response calibration incorporating environmental correction comprising: measuring a first resonance impedance spectrum of the sensor with a first applied power to the pickup coil; measuring a second resonance impedance spectrum of the sensor with a second applied power to the pickup coil; and applying a correction to the sensor response corresponding to the respective measured first and second resonance impedance spectrum to mitigate for environmental parameters. 1. A method for sensor reader calibration comprising:performing a calibration of a sensor reader wherein the calibration comprises open circuit calibration, a short circuit calibration, and a load circuit calibration, or any combination thereof in any succession;enabling connection of a pickup coil to the sensor reader to measure a sensor response; andapplying a baseline correction to the sensor response, wherein the baseline correction is obtained utilizing measurements from the calibration step.2. The method of claim 1 , wherein the open circuit calibration is obtained by taking a measurement within the sensor reader when leads from the sensor reader are in an open position and the measurement is taken across the open leads prior to electrical connection of the pickup coil.3. The method of claim 1 , wherein short circuit calibration is obtained by taking a measurement within the sensor reader when leads from the sensor reader are connected as a short ...

Method for Correcting Orientation of Magnetometer

A method for correcting an orientation of a magnetometer includes obtaining current position information through a global positioning system. A geomagnetic inclination angle list is queried according to the current position information to acquire a geomagnetic inclination angle δ corresponding to a current position. A deviation Δψ of an orientation is calculated according to the geomagnetic inclination angle δ and correcting the orientation is corrected based on the deviation Δψ of the orientation. 112-. (canceled)13. A method for correcting an orientation of a magnetometer , the method comprising:obtaining current position information through a global positioning system;querying a geomagnetic inclination angle list according to the current position information to acquire a geomagnetic inclination angle corresponding to a current position;calculating a deviation of an orientation according to the geomagnetic inclination angle; andcorrecting the orientation based on the deviation of the orientation.14. The method according to claim 13 , wherein before obtaining the current position information claim 13 , the method further comprises:obtaining the geomagnetic inclination angle list from a server, wherein the server updates the geomagnetic inclination angle list in real time.15. The method according to claim 13 , wherein obtaining the current position information through the global positioning system comprises periodically triggering the obtaining the current position information through the global positioning system.16. The method according to claim 13 , wherein after obtaining the current position information claim 13 , the method further comprises:comparing the current position information with existing position information; andquerying the geomagnetic inclination angle list according to the current position information if a difference between the current position information and the existing position information exceeds a preset range; andending the process of ...

DYNAMICALLY SELF-ADJUSTING MAGNETOMETER

A dynamically self-adjusting magnetometer is disclosed. In one embodiment, a first sample module periodically generates an electronic signal related to at least one magnetic field characteristic of a monitored environment. A second sample module periodically generates an electronic signal related to at least one magnetic field characteristic of a monitored environment. A summing module sums the absolute value of the electronic signal from the first sample module and the electronic signal from the second sample module. A delta comparator module receives the electronic signals from each of the first sample module, the second sample module and the summing module and compares each of the electronic signals with a previously received set of electronic signals to establish a change, wherein an output is generated if the change is greater than or equal to a threshold. 1. A computer-implemented method for monitoring an environment with a dynamically adjustable magnetometer , said method comprising:periodically generating a first channel electronic signal representing a magnetic field of a monitored environment;periodically generating at least a second channel electronic signal representing said magnetic field of said monitored environment;calculating a delta change between the total value for a first period and the total value for a second period;summing an absolute value of said first channel electronic signal and an absolute value of said at least a second channel electronic signal over a period to generate a total value for said period; andgenerating an output if said total value is greater than a pre-defined threshold.2. The computer-implemented method of further comprising:utilizing the average total value for at least two of the latest periods to repeatedly generate a floating average;calculating an average delta change between a first period floating average and a second period floating average; andgenerating said output if the average delta change is greater than a ...

ELECTROSTATIC CAPACITANCE DETECTION CIRCUIT AND INPUT DEVICE

An electrostatic capacitance detection circuit includes a charge amplifier that has an operational amplifier in which a capacitor is provided on a feedback path, and into which a signal including detection of electric charge of an inter-electrode capacitor of a sensor electrode and electric charge due to an external noise, and a selection switch that can switch a direction of a capacitor that is connected to input and output terminals of the charge amplifier through a feedback path that switches the direction of the capacitor depending on a direction of electric charge flowing in from a detection-side electrode of the sensor electrode, due to a drive signal applied to the sensor electrode. 1. An electrostatic capacitance detection circuit comprising:an electric charge integral circuit into which a signal including detection electric charge of an inter-electrode capacitor of a sensor electrode and electric charge due to an external noise flows, wherein the electric charge integral circuit includes a capacitor that accumulates the electric charge transferred between the capacitor and the inter-electrode capacitor, and continuously integrates the electric charge, transferred due to a drive signal applied to a drive-side electrode of the sensor electrode, in the capacitor; andan A/D converter that converts an output of the electric charge integral circuit from an analog signal into a digital signal.2. The electrostatic capacitance detection circuit according to claim 1 ,wherein the electric charge integral circuit includes:a charge amplifier that has an operational amplifier in which the capacitor is provided on a feedback path, anda selection circuit that has multiple selection switches, each switching a direction of a signal applied to the capacitor, and that switches connection to the capacitor depending on a direction of the electric charge that flows in from a detection-side electrode of the sensor electrode, with a drive signal applied to the drive-side electrode ...

Method of locating faults on a cable

This invention concerns methods and devices for calibrating a partial discharge measuring device and for locating faults on cables. In the method, calibration signals, which can include a band-limited white noise, are used with a periodically repeated signal course. By averaging over a predetermined period duration (T) of the calibration signal, it is possible, in the case of a partial discharge measurement, to recalibrate the measuring device continuously during the measurement, and additionally on cables to determine the fault location with great precision.

SENSORS

Embodiments of the present invention provide an electromagnetic sensor () for detecting a microstructure of a metal target, comprising: a magnetic device () for providing an excitation magnetic field; a magnetometer () for detecting a resultant magnetic field induced in a metal target; and a calibration circuit () for generating a calibration magnetic field for calibrating the electromagnetic sensor, wherein the calibration reference magnetic field is generated by an electrical current induced in the calibration circuit by the excitation magnetic field. 1. An electromagnetic sensor for detecting a microstructure of a metal target , comprising:a magnetic device for providing an excitation magnetic field;a magnetometer for detecting a resultant magnetic field induced in a metal target; anda calibration circuit for generating a calibration magnetic field for calibrating the electromagnetic sensor, wherein the calibration reference magnetic field is generated by an electrical current induced in the calibration circuit by the excitation magnetic field.2. The electromagnetic sensor of claim 1 , comprising a plurality of calibration circuits.3. The electromagnetic sensor of claim 2 , wherein each of the plurality of calibration circuits is arranged to generate the calibration magnetic field at a respective frequency range.4. The electromagnetic sensor of claim 1 , wherein each calibration circuit comprises a respective impedance.5. The electromagnetic sensor of claim 1 , wherein the calibration circuit or one or more of the plurality of calibration circuits comprises a calibration coil.6. The electromagnetic sensor of claim 1 , comprising a control device for selectively controlling the generation of the calibration magnetic field.7. The electromagnetic sensor of claim 1 , wherein the magnetometer is an induction detector coil or a Hall sensor.8. The electromagnetic sensor of claim 1 , comprising a magnetic core.9. The electromagnetic sensor of claim 8 , wherein the ...

Signal Processing For A Capacitive Sensor System With Robustness To Noise

A capacitive sensor includes a transmit electrode configured to provide an alternating electric field to a sensor; one or more receive electrodes for detecting variations in the alternating electric field; and an adaptive frequency adjustment unit configured to adjust an operating frequency of the alternating electric field responsive to detection of a noise measure, such as noise power. 1. A capacitive sensor , comprising:a transmit electrode configured to provide an alternating electric field to a sensor;one or more receive electrodes for detecting variations in the alternating electric field; andan adaptive frequency adjustment unit configured to adjust an operating frequency of the alternating electric field responsive to detection of a noise measure.2. The capacitive sensor of claim 1 , wherein the adaptive frequency adjustment unit is configured to determine a plurality of noise measures at potential operating frequencies and select a new operating frequency.3. The capacitive sensor of claim 2 , wherein the new operating frequency corresponds to a minimum or maximum of the plurality of noise measures.4. The capacitive sensor of claim 2 , wherein the new operating frequency corresponds to a sufficiently high or sufficiently low noise measure of the plurality of noise measures.5. The capacitive sensor of claim 2 , wherein the noise measures comprise noise powers.6. The capacitive sensor of claim 2 , wherein the noise measure is a measure for the noise at the operating frequency.7. The capacitive sensor of claim 6 , wherein the noise measure is a measure for the noise power at the operating frequency.8. The capacitive sensor of claim 7 , wherein a carrier signal at the operating frequency is modulated by a low-frequency target signal using amplitude modulation.9. The capacitive sensor of claim 8 , wherein the modulated carrier signal is synchronously demodulated and downsampled.10. The capacitive sensor of claim 9 , wherein the noise measure is a measure of the ...

Systems and Methods of Input Power and Current Measurement

As disclosed herein, a PFC control device, may be used for power factor correction and for input power and current measurement simultaneously. To determine the input power, input voltage and input current are determined. These measurements may be performed using a current sensor and a voltage sensor, for example. In an example embodiment of the systems and methods of input power and current measurement disclosed herein, the current is measured after an electromagnetic interference (EMI) filter. The input voltage and input current should be sampled substantially simultaneously. The measured input current is adjusted due to a phase shift introduced in the current sense circuit. The input voltage and input current should be sampled substantially simultaneously. The input power is determined using the PFC input voltage and the adjusted input current. The total input current is determined using the PFC input current and the EMI filter reactive current. 1. A method of determining input power and current comprising:determining power factor correction (PFC) input current with inputs of a PFC control device;determining PFC input voltage with inputs of a PFC control device;correlating the PFC input voltage and the PFC input current such that the PFC input voltage and the PFC input current are sampled substantially simultaneously;adjusting the determined PFC input current value to compensate for a phase shift in a current sense circuit to determine an adjusted input current;calculating the input power using the correlated PFC input voltage and the adjusted input current; andadjusting the determined input current to compensate for reactive current in an electromagnetic interference (EMI) filter to determine a total input current.2. The method of claim 1 , wherein the total input current is substantially equal to a square root of a sum of a square of an EMI reactive current and a square of the determined input current claim 1 , the EMI reactive current substantially equal to the ...

DEVICE DRIVEN INERTIAL INTERFERENCE COMPENSATION

Techniques for compensating for inertial and/or magnetic interference in a mobile device are provided. The mobile device can include a vibration motor to vibrate the device, a processor, and can include an inertial sensor and/or a magnetometer. The processor can be configured to actuate the vibration motor to induce vibration of the mobile device, to measure motion of the mobile device with the inertial sensor of the device to produce sensor output data and/or to measure a magnetic field generated by the vibration motor to produce magnetometer output data, and to compensate for the vibration of the inertial sensor induced by the vibration motor to produce compensated sensor output data and/or to compensate for a magnetic field generated by the vibration motor when the vibration motor is actuated to produce compensated magnetometer output data. 1. A mobile device comprising:a vibration motor configured to vibrate the mobile device;an inertial sensor configured to sense motion of the mobile device and to provide sensor output data indicative of the motion; and actuate the vibration motor to induce vibration of the mobile device;', 'measure motion of the mobile device with the inertial sensor of the mobile device to produce sensor output data; and', 'compensate for the vibration of the inertial sensor induced by the vibration motor, the processor being configured to produce compensated sensor output data based on the sensor output data., 'a processor communicatively coupled to the vibration motor and to the inertial sensor and configured to2. The mobile device of wherein to produce the compensated sensor output data the processor is configured to blank the sensor output data during a time period of the induced vibration.3. The mobile device of wherein to produce the compensated sensor output data the processor is configured to filter the sensor output data during a time period of the induced vibration.4. The mobile device of wherein to produce the compensated sensor ...

Sensor arrangement and method

A sensor arrangement has a current regulator, a reference resistance a feed current scaler and a sensor element having an internal resistance, the internal resistance of the sensor element and the reference resistance having a predetermined ratio. The current regulator is implemented to provide a reference current by the reference resistance and to change the reference current in response to an interference influence-conditioned change of the reference resistance such that the voltage decreasing across the reference resistance remains in a predetermined range around an applied set voltage. The current regulator is implemented to provide a feed current to the feed current scaler and to change a magnitude of the feed current depending on a magnitude of the reference current. The feed current scaler is implemented to feed a scaled feed current into the sensor element to scale a voltage according to the scaling of the feed current.

VIRTUAL MODEL ADAPTER REMOVAL AND SUBSTITUTION TECHNIQUE FOR CASCADED NETWORKS

System and methods may allow an operator of a signal measurement instrument to characterize and calibrate a network with unsupported connector types, e.g., not traceable to known standards. Adapters having supported and unsupported interfaces can be used to measure the system responses of networks in a system under test. These measurements can be mathematically cascaded to deduce virtual models that produce an accurate and fully calibrated total system response. 1. A method , comprising:characterizing a total network [TN] having a first individual multiport network [N1] and a second individual multiport network [N2] that are cascaded and interconnected by an unsupported connector where ‘:’ denotes the unsupported connector interface and [TN]=[N1]:[N2];characterizing a first augmented network [M1] by adding a first adapter [A1] to the first individual multiport network [N1] where [M1]=[N1]:[A 1]; andcharacterizing a second augmented network [M2] by adding a second adapter [A2] to the second individual multiport network [N2] where [M2]=[A2]:[N2].2. The method of claim 1 , wherein characterizing either or both of the first and second augmented networks [M1] and [M2] allows for calibrated measurements.3. The method of claim 2 , wherein the calibrated measurements include measurements that can be traced to known standards.4. The method of claim 1 , wherein the unsupported connector is of a connector type that does not allow for calibrated measurements.5. The method of claim 1 , wherein the unsupported connector interface ‘:’ represents a connector type that does not have support for measurements made to known claim 1 , traceable standards.6. The method of claim 1 , wherein any of the characterizations may be represented by time domain or frequency domain calibrated measurements.7. The method of claim 1 , wherein any of the characterizations may be represented by mathematical models.8. The method of claim 1 , comprising: [VN1]=[N1][A1]=[M1]', {'sup': −1', '−1, '[VN2]=[DN ...

Method and device for testing sensorsto be applied on a patient's skin forthe detection of fluid or moisture

A method and device for testing sensors to be applied on a patient's skin for detection of liquid or moisture are described, in particular for monitoring vascular access in an extracorporeal blood treatment, in which a patient's blood is carried away from the patient via an arterial line and is fed to the patient via a venous line. A method for producing sensors to be applied on a patient's skin for detection of liquid or moisture is also described. The method and device according to the present invention are based on the testing of one or more moisture sensors which are taken from current production. The method includes providing a large number of twists of the moisture sensor applied onto a torsion body, the mechanical stresses thus recreating the stresses that can occur in practice when the moisture sensor is applied or stuck onto the patient's skin or forearm.

Shorting structure in plastic roll-to-roll process

Roll-to-roll processes for manufacturing touch sensors on a plastic base film are provided. The touch sensors can be deposited on the base film using various patterning techniques. One or more shorting bars can also be patterned onto the base film to couple together traces, such as drive lines, sense lines, conductive traces, and the like, of the touch sensor to prevent a potential difference from forming between traces due to static buildup during the manufacturing process. After the touch sensor is fully formed on the base film, the touch sensor can be removed from the base film using lithography or a physical cutting process. The removal process can separate the touch sensor from the one or more shorting bars, thereby uncoupling the traces of the touch sensor.

METHOD AND APPARATUS FOR MASSIVELY PARALLEL MULTI-WAFER TEST

Disclosed herein is a cost effective, efficient, massively parallel multi-wafer test cell. Additionally, this test cell can be used for both single-touchdown and multiple-touchdown applications. The invention uses a novel “split-cartridge” design, combined with a method for aligning wafers when they are separated from the probe card assembly, to create a cost effective, efficient multi-wafer test cell. A “probe-card stops” design may be used within the cartridge to simplify the overall cartridge design and operation. 1. A cost effective , efficient , massively parallel multi-wafer test cell for testing semiconductor wafers with probes on probe cards in a probe card assembly , said test cell including:a wafer cartridge handler designed to align said wafers to said probe cards using split wafer cartridges, each said split wafer cartridge having a cartridge top section and a cartridge bottom section;wherein said cartridge top section and bottom section are designed to be moved around said test cell separately.2. The multi-wafer test cell of claim 1 , configured to support multiple touchdown testing claim 1 , wherein a separate target slot in a cartridge rack in said wafer cartridge handler is dedicated to each touchdown.3. The multi-wafer test cell of claim 1 , wherein said wafer cartridge handler is configured to accept one or more Front Opening Unified Pods (FOUPS) containing wafers which are loaded into wafer cartridges and aligned to said probe cards.4. The multi-wafer test cell of claim 1 , including:automated test equipment; anda shared, two-sided backplane acting as an interface between said automated test equipment and said wafer cartridges.5. The multi-wafer test cell of claim 4 , wherein said automated test equipment is a set of computer-controlled electronic hardware which provides stimuli to devices on said wafers and measures and records results.6. The multi-wafer test cell of claim 4 , wherein said wafer cartridge handler includes:load ports into which ...

ELECTRIC INPUT KEY

An electric input key has an actuating surface and a plurality of displacement sensors which are each designed to generate a displacement signal when the actuating surface is touched. The input key also has an evaluation unit for evaluating the displacement signals and outputting a determined switching state. The input key has at least one analog displacement sensor, at least one digital displacement sensor, and a calibration device for calibrating the analog displacement sensor by using displacement signals measured by the digital displacement sensor. The evaluation unit is designed to carry out self-diagnosis by using calibrated and measured displacement signals. 110-. (canceled)11. An electric input key comprising:an actuating surface;an analog displacement sensor to generate a first displacement signal when the actuating surface is touched;a digital displacement sensor to generate a second displacement signal when the actuating surface is touched;a calibration device to calibrate the analog displacement sensor using second displacement signals that have been recorded; andan evaluation unit to evaluate the first and second displacement signals, to output a determined switching state, and to carry out a self-diagnosis using calibrated and recorded displacement signals.12. The electric input key as claimed in claim 11 , wherein the digital displacement sensor is selected from the group consisting of a microswitch claim 11 , a digital Hall sensor and a digital magnetoresistive sensor.13. The electric input key as claimed in claim 11 , wherein the analog displacement sensor is selected from the group consisting of an inductive sensor claim 11 , a capacitive sensor claim 11 , an analog Hall sensor and an analog magnetoresistive sensor.14. The electric input key as claimed in claim 11 , wherein the calibration device calibrates the analog displacement sensor when the actuating surface is touched for a first time.15. The electric input key as claimed in claim 11 , ...

Battery System for Vehicle, On-Vehicle Battery Module, and Cell Controller

A battery system for vehicle comprises a battery unit that is constituted with a plurality of serially connected cell groups each include a plurality of serially connected battery cells, integrated circuits that are each disposed in correspondence to one of the cell groups of the battery unit and each measure terminal voltages at the battery cells in the corresponding cell group, and a signal transmission path through which one of the integrated circuits is connected to another one of the integrated circuits or to a circuit other than that of the integrated circuits.

Artificial Defect for Eddy Current Inspection

A flex circuit for creating artificial defects uses a thin conductive layer with rectangular slots therein representing defects. A thin insulating over-layer is used to protect the conductive layer as well as an eddy current probe. The flexible circuit is then temporarily attached to the surface of the part or material to be inspected. A feature of the described system is that it is directly scalable to an electric discharge machined (EDM) notch. In an embodiment, a thin conductive layer is used which is scalable to a thicker lower conductive layer like a conventional EDM notch. In this way, a thin conductive artificial defect can electromagnetically represent a thicker albeit less conductive EDM notch. The flexible circuit makes it easier to place multiple notches in complex part geometries, and allows for more accurate relative positioning between slots, e.g., for array and wide coverage probes. 1. A method of calibrating an eddy current defect detection system for a conductive material comprising:creating a flex circuit having a conductive layer and an insulating layer, and one or more slots through the conductive layer;adhering the flex circuit to a portion of the conductive material; andcalibrating the eddy current defect detection system by scanning the adhered flex circuit.2. The method of calibrating an eddy current defect detection system for a conductive material according to claim 1 , wherein the one or more slots through the conductive layer also extend through the insulating layer.3. The method of calibrating an eddy current defect detection system for a conductive material according to claim 1 , wherein the one or more slots through the conductive layer extend only through the conductive layer.4. The method of calibrating an eddy current defect detection system for a conductive material according to claim 1 , wherein the conductive layer is a copper layer.5. The method of calibrating an eddy current defect detection system for a conductive material ...

Current-Monitoring Apparatus

A local area networking apparatus comprises a power stage for connecting to a network cable for carrying power and data. The power stage comprises a main current flow path which includes a switch comprising at least one transistor positioned in the main current flow path and a current monitoring apparatus for monitoring current flow in the main current flow path, and wherein the current monitoring apparatus comprises a sensor which is not placed in series with the main current flow path. The current monitoring apparatus can comprise a current mirroring stage which is arranged to mirror current flowing in the main current flow path to a monitoring current flow path. The switch can be implemented as a set of switches. 1. A power supply apparatus for connecting to a cable which carries power and data , the power supply apparatus comprising:a main current flow path which includes a switch comprising at least one transistor positioned in the main current flow path; anda current monitoring apparatus for monitoring current flow in the main current flow path, wherein the current monitoring apparatus comprises a sensor which is not placed in series with the main current flow path.2. The power supply apparatus according to claim 1 , wherein the current monitoring apparatus comprises a current mirroring stage arranged to mirror current flowing in the main current flow path to a monitoring current flow path.3. The power supply apparatus according to claim 2 , wherein the current mirroring claim 2 , stage comprises:a mirror transistor positioned in the monitoring current flow path; anda voltage setting stage arranged to set voltages at each side of the mirror transistor equal to a corresponding voltage at a respective side of the switch, or to set voltages between terminals of the mirror transistor equal to voltages across corresponding terminals of the switch.4. The power supply apparatus according to claim 3 , wherein the voltage setting stage comprises a cascode current ...

Semiconductor device

A device, comprising an output terminal; an output circuit coupled to the output terminal and having an adjustable impedance; and an impedance adjustment circuit adjusting stepwise the adjustable impedance so as to head toward a first reference impedance. The impedance adjustment circuit changes the adjustable impedance by a first amount when the adjustable impedance is within a first range, and changes the adjustable impedance by a second amount when the adjustable impedance is out of the first range. The first amount is smaller than the second amount.

APPARATUS AND METHODS FOR DETERMINING FORCE APPLIED TO THE TIP OF A PROBE

An apparatus capable of determining the force applied to the tip of an electrical impedance spectroscopy probe comprises: ⋅an elongate probe comprising a probe tip attached to a handle, the probe tip having a substantially planar distal end for contacting human or animal tissue; ⋅a load cell located in said handle and capable of measuring a force Fapplied axially along a longitudinal axis when said probe tip is in contact with said human or animal tissue; ⋅an accelerometer located in the handle for measuring a gravity vector A; ⋅processing means for compensating for the mass of the probe tip using said measured force and gravity vector to produce a calibrated measurement of force F applied to said probe tip. 113-. (canceled)14. Apparatus capable of determining a force F applied to a tip of a probe the apparatus comprising:an elongate probe comprising said probe tip attached to a handle, the probe tip having a substantially planar distal end for contacting human or animal tissue;{'sub': 'loadcell', 'a load cell located in said handle and capable of measuring a force Fapplied axially to said elongate probe along a longitudinal axis thereof when said probe tip is in contact with said human or animal tissue;'}{'sub': 'axial', 'an accelerometer located in the handle for measuring a gravity vector A;'}processing means for compensating for the mass of the probe tip using said measured force and gravity vector to produce a calibrated measurement of said force F applied to said probe tip;display means for indicating to a user the calibrated measurement of said force F.15. Apparatus as claimed in wherein the processing means is further capable of determining an electrical conductivity of human or animal tissue to which the distal end of the probe tip is applied.16. Apparatus as claimed in wherein the human or animal tissue is cervical tissue.17. Apparatus as claimed in wherein said load cell comprises four strain gauges in a bridge configuration.18. Apparatus as claimed in ...

METHODS, APPARATUSES AND SYSTEMS FOR SENSING EXPOSURE OF ELECTRONIC DEVICES TO MOISTURE

Systems, devices and methods for sensing moisture within an electronic device are disclosed. A device may include a housing and a display defining an exterior of an electronic device and an interior of the electronic device. Further, the device may include an integrated circuit (IC) within the electronic device and a control element within the electronic device. The device may also include a moisture sensor such as an inductive sensor, a capacitance sensor, or both. The moisture sensor, which may be part of the IC, together with the control element may sense moisture within the electronic device. 1. An electronic device , comprising:a housing and a display defining an exterior of an electronic device and an interior of the electronic device;an integrated circuit (IC) within the electronic device and comprising a control element; anda moisture sensor comprising at least one of an inductive sensor and a capacitance sensor, the moisture sensor being coupled to or part of the IC and associated with the control element, the moisture sensor and the control element together being configured to sense moisture within the electronic device.2. The electronic device of claim 1 , further comprising a heating element coupled to the IC and configured to generate heat in response to moisture being sensed within the electronic device.3. The electronic device of claim 2 , the heating element comprising one or more heating traces.4. The electronic device of claim 1 , further comprising an oscillator configured to convey a clock signal to the moisture sensor and the control element.5. The electronic device of claim 1 , wherein the control element is programmable via a communications module of the IC.6. The electronic device of claim 1 , the moisture sensor comprising a capacitance sensor including a shield at least partially surrounding a sense element and separated from the sense element by an air gap.7. The electronic device of claim 1 , wherein the control element includes one or ...

SELF-CALIBRATING CONTACTLESS POWER CONSUMPTION SENSING

A system for sensing electrical power usage in an electrical power infrastructure of a structure. The system can include a sensing device configured to be attached to a panel of the circuit breaker box overlying at least part of the one or more main electrical power supply lines. The system also can include a calibration device configured to be electrically coupled to the electrical power infrastructure of the structure. The system further can include one or more processing modules configured to receive one or more output signals from the sensing device. The sensing device can be devoid of being electrically or physically coupled to the one or more main electrical power supply lines or the electrical power infrastructure when the sensing device is attached to the panel. Other embodiments are provided.

Systems and methods for shielding current transducers

A shield for protecting a current transducer from noise may include a first annular ring that may be disposed adjacent to a first side of a current sensor. The shield may also include a second annular ring that may be disposed adjacent to a second side of the current sensor opposite the first side, such that the first and second annular rings each include magnetically permeable material.

Safety Tests for Systems Monitoring Local SAR

In order to provide online monitoring of local specific absorption rate (SAR) within a body subject to a magnetic resonance imaging (MRI) scan, directional couplers measure a phase and an amplitude of a transmission radio frequency (RF) pulse generated and transmitted by an MRI system. A measured local SAR value is calculated based on the measured phase and the measured amplitude of the transmission RF pulse using a voxel model of the body and an electromagnetic (EM) simulation. In order to verify proper operation of the local SAR monitoring, the measured local SAR value is compared to a predetermined local SAR value.

SYSTEMS AND METHODS FOR CALIBRATING PHASE AND SENSITIVITY OF CURRENT TRANSDUCERS

A circuit for calibrating a current transducer may include a first resistor and a second resistor, such that the first resistor and the second resistor may adjust a measurement output by a current sensor. The first resistor and the second resistor may adjust the measurement output by adjusting a phase of the measurement output and/or adjusting a sensitivity of the measurement output. The circuit may also include a first terminal and a second terminal, such that the first terminal may be electrically coupled to the first resistor and the second resistor. Here, the first terminal may receive the measurement output by the current sensor, and the second terminal may output the adjusted measurement output. 1. A circuit , comprising: adjusting a phase of the measurement output; and', 'adjusting a sensitivity of the measurement output;, 'a first resistor and a second resistor, wherein the first resistor and the second resistor are configured to adjust a measurement output by a current sensor by performing at least one ofa first terminal configured to receive the measurement output by the current sensor, wherein the first terminal is electrically coupled to the first resistor and the second resistor; anda second terminal configured to output the adjusted measurement output.2. The circuit of claim 1 , wherein the first resistor and the second resistor are variable resistors.3. The circuit of claim 1 , wherein the first resistor comprises a first end and a second end claim 1 , wherein the second resistor comprises a third end and a fourth end claim 1 , and wherein the third end of the second resistor is coupled to the second end of the first resistor.4. The circuit of claim 3 , wherein the first terminal is electrically coupled to the first end of the first resistor and the fourth end of the second resistor; andwherein the second terminal is electrically coupled to the third end of the second resistor and the fourth end of the second resistor.5. The circuit of claim 1 , ...

SENSING DEVICE AND METHOD OF CALIBRATION

A sensing device comprises a microwave sensor () configured to emit microwave radiation and to receive microwave radiation reflected by a moving body in the field of detection of the microwave sensor and a wireless data transmitter () configured to transmit data to a remote receiver. A main power supply provides electrical power at a first voltage to the sensing device. A first regulator provided between the main power supply and the microwave sensor () provides a sensor power supply to the microwave sensor () at a voltage below the voltage of the main power supply. The wireless data transmitter () is powered from the main power supply via a transmitter power supply connection arranged in parallel with the first regulator (). The microwave sensor () is provided on a first circuit board and the wireless data transmitter () is provided on a second circuit board, with the second circuit board overlying the first circuit board and spaced therefrom. A signal processing device is configured to receive an output signal from the microwave sensor and to generate an occupancy signal indicative of the presence of a moving body in the field of detection of the microwave sensor () when the output signal of the microwave () sensor () exceeds a threshold level. The signal processing device is configured to increase the threshold level temporarily during data transmission by the wireless data transmitter (), in order to compensate for RF interference due to the data transmission. 1. A sensing device comprising:a microwave sensor configured to emit microwave radiation and to receive microwave radiation reflected by a moving body in the field of detection of the microwave sensor;a wireless data transmitter configured to transmit data to a remote receiver, a main power supply for providing electrical power at a first voltage to the sensing device,a first regulator provided between the main power supply and the microwave sensor for providing a sensor power supply to the microwave ...

Resonance based cable compensation

A system for resonance based cable compensation includes a first switch with a first terminal for connecting a first connection of a cable having a resonant circuit on an end of the cable opposite the first switch. The system also includes a second terminal for connecting a second connection of a cable that has its first connection connected to the first terminal. A logic component is operatively connected to control the first switch to selectively apply voltage pulses across the first and second terminals to generate a resonance signal in a cable connected to the terminals in order to compensate for equivalent cable capacitance.