Method for detecting the number of layers of multilayer graphene sample on composite silicon substrate

The invention discloses a method for detecting the number of layers of a multilayer graphene sample on a composite silicon substrate. The method comprises the following steps of detecting thickness of a SiO2 layer on the surface of a SiO2/Si substrate by an ellipsometer, acquiring a multilayer graphene sample from the SiO2/Si substrate by a micromechanical cleavage method or various transfer methods, respectively detecting the first-order silicon Raman signal intensity ratio I(SiG)/I(Si0) of parts of the SiO2/Si substrate covered and uncovered by the graphene sample, comparing the first-order silicon Raman signal intensity ratio and a theoretical calculation result to obtain the number of layers of the multilayer graphene sample. The test method has simple processes, is independent of SiO2/Si substrate orientation and incident laser polarization state, has universality for different test systems and is suitable for characterization of the number of layers of the multilayer graphene sample ...

Novel method for detecting high-order critical point of semiconductor energy band structure

Spin dependent transport measurement system under strong magnetic field environment and liquid nitrogen temperature

The invention discloses a spin dependent transport measurement system under a strong magnetic field environment and a liquid nitrogen temperature, which comprises a liquid nitrogen Dewar, a manual five-dimensional adjusting platform, a neodymium-iron-boron permanent magnet, an electric one-dimensional translation table, a manual one-dimensional lifting table, an overlong working distance objective, a wide band polarized non-sensitive beam splitter prism, a fluorescent light path and an exciting light path, wherein the manual five-dimensional adjusting platform is used for placing the liquid nitrogen Dewar and adjusting the spatial position of the liquid nitrogen Dewar; the neodymium-iron-boron permanent magnet is coaxially sleeved on the outer side of an aluminum sleeve of the liquid nitrogen Dewar and used for providing the strong magnetic field environment of measurement; the electric one-dimensional translation table is positioned below the neodymium-iron-boron permanent magnet; the ...

Spin dependent transport measurement system under strong magnetic field environment and liquid nitrogen temperature

The invention discloses a spin dependent transport measurement system under a strong magnetic field environment and a liquid nitrogen temperature, which comprises a liquid nitrogen Dewar, a manual five-dimensional adjusting platform, a neodymium-iron-boron permanent magnet, an electric one-dimensional translation table, a manual one-dimensional lifting table, an overlong working distance objective, a wide band polarized non-sensitive beam splitter prism, a fluorescent light path and an exciting light path, wherein the manual five-dimensional adjusting platform is used for placing the liquid nitrogen Dewar and adjusting the spatial position of the liquid nitrogen Dewar; the neodymium-iron-boron permanent magnet is coaxially sleeved on the outer side of an aluminum sleeve of the liquid nitrogen Dewar and used for providing the strong magnetic field environment of measurement; the electric one-dimensional translation table is positioned below the neodymium-iron-boron permanent magnet; the ...

Battery-based semiconductor AC differential conductive scanning measurement system

The invention provides a battery-based semiconductor AC differential conductive scanning measurement system; DC bias voltage is applied to a sample under the charging principle of the battery on transconductance-capacitor of an amplifier so that the sample is under different DC biases; meanwhile, phase-locking internal AC output signal is applied to the sample; under different DC biases, the response of the sample on the input AC signal is measured so as to gain the dynamic resistance of the sample, namely differential conductance. As the semiconductor sample is a nonlinear component, the differential conductance has different frequency responses; the working mode of phase-locking is adjusted as 2F; meanwhile, the change relationship of the differential coefficient of the sample conductance under different DC biases with the change of the biases can be read out.

Method for enhancing light-emitting efficiency of semiconductor type carbon nano-tube

The invention relates to a method for improving luminous efficiency of a semiconductor carbon nano-tube. The method is characterized in that the method includes the following steps: preparing carbon nano-tube beams which have different bandgaps; preparing the beams into a luminous element; selecting exciting light with the bandgap close to or equal to the bandgap of the semiconductor carbon nano-tube to excite the carbon nano-tube beams so as to improve the photoluminescence efficiency of the semiconductor carbon nano-tube with narrow bandgap; or preparing the carbon nano-tube beams into a luminous element and applying voltage bias to both ends of the carbon nano-tube beams so as to improve the electroluminescence efficiency of the semiconductor carbon nano-tube with narrow bandgap.

Method for enhancing light-emitting efficiency of semiconductor type carbon nano-tube

The invention relates to a method for improving luminous efficiency of a semiconductor carbon nano-tube. The method is characterized in that the method includes the following steps: preparing carbon nano-tube beams which have different bandgaps; preparing the beams into a luminous element; selecting exciting light with the bandgap close to or equal to the bandgap of the semiconductor carbon nano-tube to excite the carbon nano-tube beams so as to improve the photoluminescence efficiency of the semiconductor carbon nano-tube with narrow bandgap; or preparing the carbon nano-tube beams into a luminous element and applying voltage bias to both ends of the carbon nano-tube beams so as to improve the electroluminescence efficiency of the semiconductor carbon nano-tube with narrow bandgap.

Light filter without ray migration capable of altering operating wavelength and usage method thereof

A light filter capable of changing working wavelength without light deflection comprises a bottom plate, a first rotating table arranged above one side of the upper part of the bottom plate, a second rotating table arranged above the other side of the upper part of the bottom plate, a first wafer fixer fixed at the central position on the first rotating table, a second wafer fixer fixed at the central position on the second rotating table, a thin-film interference light filter arranged on the first wafer fixer, an optical wafer group arranged on the second wafer fixer, a screw shaft pedestal fixed at the upper end of the middle part of the bottom plate, a screw shaft with one end arranged on the screw shaft pedestal, a slider which is arranged on the screw shaft and provided with a draw-in gear capable of fitting a slide rail on the upper part, a stepping motor which is arranged at the lower end of the middle part of the bottom plate and connected with the other end of the screw shaft, ...

Far-infrared detector spectral response measuring system in confocal microscopy

The invention provides a confocal microscopy mid and far-infrared spectral response measurement system, which comprises an infrared source; an input end of an infrared monochrometer is connected to an output end of the infrared source; an infrared confocal microscopic system is arranged on an output light path of the infrared monochrometer; a chopper light limiting unit is arranged between the infrared confocal microscopic system and a three-dimensional micro-displacement platform and arranged on the output light path of the infrared monochrometer; the three-dimensional micro-displacement platform is arranged on the output light path of the infrared monochrometer; a sample refrigeration Dewar is fixed on the three-dimensional micro-displacement platform; a preamplifier is connected with the sample refrigeration Dewar, which plays a role of amplifying the sample electric signals; a phase-locked amplifier is connected with the preamplifier; a controlling computer is connected with the phase-locked ...

Combined test system of micro-Raman spectroscopy and near infrared spectrometer

Method for measuring exciton transition energy of single-wall carbon nano-tube by using single laser line

A method for using the laser of single wavelength to test the exciton transition energy of single-walled carbon nano-tube, comprising: under the excitation of the laser of single wavelength, using Raman spectrometer to measure the stokes and anti-stokes roman spectrums of the breathing mode and the frequency doubling mode of a single-walled carbon nano-tube; plotting the function relationship chart between the signal strength ratio of the stokes and anti-stokes roman spectrums and the system energy level; obtaining the strength ratio of the stokes and anti-stokes roman spectrums of the breathing mode and the frequency doubling Raman signals from the measured Raman spectrums; obtaining four energy values corresponding to the breathing mode and the frequency doubling mode from the function relationship chart between the signal strength ratio of the stokes and anti-stokes roman spectrums and the system energy level; selecting the average value of two most closely energy values, to obtainthe ...

Rotary sample table and measuring method of microscopic Raman spectrum

The invention relates to the technical field of optical equipment, in particular to a rotary sample table and a microscopic Raman spectrum measuring method. The invention provides a rotary sample table which comprises a sample driving assembly and a sample loading assembly, and the sample loading assembly is arranged on the sample driving assembly and used for loading samples; wherein in the state that the sample is loaded on the sample loading assembly, the sample driving assembly is used for driving the sample loading assembly to rotate within the irradiation range of the laser focusing light spot and in the focal plane where the laser focusing light spot is located. The rotary sample table provided by the invention solves the technical problem that the sample is heated or damaged due to the fact that laser irradiates the same point of the sample for a long time when the micro-Raman spectrum is measured in the prior art, the measurement difficulty of the micro-Raman spectrum is reduced ...

Variable temperature microscopic measurement system for measuring related electron-spin transportation

The invention discloses a variable temperature microscopic measurement system for measuring related electron-spin transportation, which comprises an HeNe laser, a Grand taylor prism, a photoelastic modulator, a micro objective, a variable temperature liquid nitrogen Dewar sample holder, a digital voltage current source meter, a sampling resistance, a phase locked amplifier, a half-reflecting and half-transmitting lens group, a white light source, a camera, a display and a neodymium iron boron ring-shaped permanent magnet, wherein, the laser sent out by the HeNe laser is converted into linearly polarized light by the Grand taylor prism; the micro objective is used for focusing the incident lasers onto the platform surface of a sample; the variable temperature liquid nitrogen Dewar sample holder comprises a temperature control meter and a red copper cold finger which is used for fixing the sample to be detected on the top of the red copper cold finger; the control end of the digital voltage ...

Tunable laser filter

Light filter without ray migration capable of altering operating wavelength and usage method thereof

A light filter capable of changing working wavelength without light deflection comprises a bottom plate, a first rotating table arranged above one side of the upper part of the bottom plate, a second rotating table arranged above the other side of the upper part of the bottom plate, a first wafer fixer fixed at the central position on the first rotating table, a second wafer fixer fixed at the central position on the second rotating table, a thin-film interference light filter arranged on the first wafer fixer, an optical wafer group arranged on the second wafer fixer, a screw shaft pedestal fixed at the upper end of the middle part of the bottom plate, a screw shaft with one end arranged on the screw shaft pedestal, a slider which is arranged on the screw shaft and provided with a draw-in gear capable of fitting a slide rail on the upper part, a stepping motor which is arranged at the lower end of the middle part of the bottom plate and connected with the other end of the screw shaft, ...

Micrometering system for measuring electro-spin fluorescence

The invention relates to a micrometering system for measuring electro-spin fluorescence, which is characterized by comprising a micro Raman spectrometer, a broad-band line polaroid sheet, a broad-band one-fourth wave plate, a magnet system, a digital voltage source meter and an over-long operating distance microobjective. The micro Raman spectrometer, the broad-band line polaroid sheet and the broad-band one-fourth wave plate are spaced by preset distances and positioned in a same light path; the digital voltage source meter is connected in parallel with the magnet system; and the over-long operating distance microobjective is positioned between the broad-band one-fourth wave plate and the magnet system and is in the same light path with the broad-band one-fourth wave plate and the magnet system.

Graphene sheet intercalation compound preparation method and in situ microRaman representation system

The invention discloses a graphene sheet intercalation compound preparation method and an in situ micro-Raman representation system. The preparation method comprises the following steps: respectively placing the graphene sheet and ferric trichloride into a glass tube and a cuvette which are connected ang communicated with each other; vacuumizing the glass tube and the cuvette by a molecular pump; sealing the vacuumized glass tube and cuvette by an alcohol lamp; heating to 340 DEG C and keeping the temperature for 6 to 24 hours; and cooling to the normal temperature. The in situ micro-Raman representation system comprises the glass tube and the cuvette which contain the graphene sheet and the ferric trichloride and sealed from the outside and communicated with each other, a laser, a Raman spectrometer, a heating platform, a lifting platform, a translational platform and two scanners. The graphene sheet/ ferric trichloride intercalation compound preparation method is simple and practical; ...

Method for discriminating sample for containing tiny semiconductor carbon nanometer tube bundle or not

The invention provides a method for identifying whether a sample contains micro semiconductor carbon nano-tube bundle or not, which is characterized in that the method comprises: testing an absorption spectrum or Raman spectrum of a single-wall carbon nano-tube sample; confirming a band gap of a semiconductor carbon nano-tube in the single-wall carbon nano-tube sample according to the absorption spectrum or Raman spectrum; selecting an exciting light matched with an exciton energy level corresponding to a semiconductor carbon nano-tube electronic energy level with rather broad band gap to excite the photoluminescence spectrum of the single-wall carbon nano-tube sample; and judging whether the single-wall carbon nano-tube sample contains micro semiconductor carbon nano-tube bundle or not according to whether or not the photoluminescence spectrum has fluorescence signals from the semiconductor carbon nano-tube with rather narrow band gap.

Optical excitation fluorescent spectra system having no requirement of stability of excitation light source

The invention relates to an optical excitation fluorescent spectra system having no requirement of stability of excitation light source, which comprises a light source, a spectrometer, an exciting light converging element, a beam splitter, a light intensity meter, a sample, an emitted light collecting element, an emission spectrometer, a detector and a computer, wherein the spectrometer is arranged behind the light source and used for dispersing a broad-spectrum optical signal sent by the light source into a narrowband light source or monochromatic source, the exciting light converging element is arranged behind the spectrometer and used for converging exciting light emitted by the spectrometer on a sample to be tested, the beam splitter is arranged behind the exciting light converging element and used for reflecting part of the exciting light emitted by the spectrometer to another direction to enter a light intensity meter, the light intensity meter is arranged at one side of the light ...

Measuring system for enhancing magnetic circular polarization dichroism signal and promoting signal to noise ratio

The invention discloses a measuring system for enhancing the dichroism signal of the magnetic circular polarization and improving the speech to the noise ratio. The system comprises an optical source, a monochromator, a first convex lens, a Wollaston prism, a photoelastic modulator, a photoelastic modulator controller, a second convex lens, a temperature changing magnetic body system, a detecting device and a lock-in amplifier. By using the invention, a measuring signal is enhanced and the speech to the noise ratio is improved; meanwhile, the relation between the dichroism signal of the magnetic circular polarization and an external magnetic field can be measured, and be corresponding to SQUID measured magnetic hysteresis loop; the relation between the dichroism signal of the magnetic circular polarization and the temperature also can be measured, and be corresponding to the temperature dependence of SQUID measured saturation magnetization or residual magnetization, and the curie temperature ...

Temperature-changing microscopic magneto-optical spectrum system

Micrometering system for measuring electro-spin fluorescence

The invention relates to a micrometering system for measuring electro-spin fluorescence, which is characterized by comprising a micro Raman spectrometer, a broad-band line polaroid sheet, a broad-bandone-fourth wave plate, a magnet system, a digital voltage source meter and an over-long operating distance microobjective. The micro Raman spectrometer, the broad-band line polaroid sheet and the broad-band one-fourth wave plate are spaced by preset distances and positioned in a same light path; the digital voltage source meter is connected in parallel with the magnet system; and the over-long operating distance microobjective is positioned between the broad-band one-fourth wave plate and the magnet system and is in the same light path with the broad-band one-fourth wave plate and the magnetsystem.

Optical support and optical system using same

The invention relates to the technical field of optical equipment, in particular to an optical support and an optical system applying the same. According to the optical support, the supporting frame body is provided with the limiting part used for limiting the optical filter from moving in the direction of the incident laser. In the state that the optical filter is installed in the installation channel from back to front, the optical filter abuts against the limiting part to limit the position of the optical filter, the optical filter is locked through the optical filter pressing piece, when the optical filter is installed or replaced, the bearing component does not need to be detached from the installation block, the optical filter only needs to be installed in the installation channel from the third opening, and therefore the optical filter can be installed or replaced conveniently. The position of the optical filter can be determined by clamping the optical filter through the cooperation ...

Structure for altering trap filter working wavelength and prolonging its service life

Microscopic measurement system for measuring electron spin injection and filtration

The invention relates to a microscopic measurement system of measuring electron spin injection and filter. The microscopic measurement system uses Wollaston prism as an optical polarizer, for changing HeNe laser into linearly polarized light, then causes the linearly polarized light to pass through a photoelastic modulator with an included angle of 45 DEG, according to the optical theory, the polarized light is changed into left-and right-handed circularly polarized light modulated in 50 kHz, circularly polarized light irradiates samples, spin polarization electrons are generated in the samples. Under the drive of reverse electric field, ferromagnetic metal injects the spin polarization electrons to a semiconductor, but since the semiconductor has 50% spin polarization electrons under the irradiation of the circularly polarized light, thereby generating magnetoresistance effect on the injected spin polarization electrons; under the drive of positive electric field, the spin polarization ...

Method for measuring exciton transition energy of single-wall carbon nano-tube by using single laser line

A method for using the laser of single wavelength to test the exciton transition energy of single-walled carbon nano-tube, comprising: under the excitation of the laser of single wavelength, using Raman spectrometer to measure the stokes and anti-stokes roman spectrums of the breathing mode and the frequency doubling mode of a single-walled carbon nano-tube; plotting the function relationship chart between the signal strength ratio of the stokes and anti-stokes roman spectrums and the system energy level; obtaining the strength ratio of the stokes and anti-stokes roman spectrums of the breathing mode and the frequency doubling Raman signals from the measured Raman spectrums; obtaining four energy values corresponding to the breathing mode and the frequency doubling mode from the function relationship chart between the signal strength ratio of the stokes and anti-stokes roman spectrums and the system energy level; selecting the average value of two most closely energy values, to obtain the ...

Optical support and optical system using same

The invention relates to the technical field of optical equipment, in particular to an optical support and an optical system applying the same. The optical bracket provided by the invention comprises a supporting frame body and an angle adjusting structure, wherein the supporting frame body comprises a base and a mounting block; a plurality of mounting block positioning columns are arranged at the upper part of the base at intervals, the plurality of mounting block positioning columns are arranged along the height direction of the optical bracket, the plurality of mounting block positioning columns can be correspondingly embedded into the plurality of through holes of the mounting block and are used for positioning the mounting block, and the angle adjusting structure is arranged in the mounting block. According to the optical support, in the state that the optical filter is installed on the angle adjusting structure, the pitching angle and the deflection angle of the optical filter on ...

Battery-based semiconductor AC differential conductive scanning measurement system

The invention provides a battery-based semiconductor AC differential conductive scanning measurement system; DC bias voltage is applied to a sample under the charging principle of the battery on transconductance-capacitor of an amplifier so that the sample is under different DC biases; meanwhile, phase-locking internal AC output signal is applied to the sample; under different DC biases, the response of the sample on the input AC signal is measured so as to gain the dynamic resistance of the sample, namely differential conductance. As the semiconductor sample is a nonlinear component, the differential conductance has different frequency responses; the working mode of phase-locking is adjusted as 2F; meanwhile, the change relationship of the differential coefficient of the sample conductance under different DC biases with the change of the biases can be read out.

Microscopic measurement system for measuring electron spin injection and filtration

The invention relates to a microscopic measurement system of measuring electron spin injection and filter. The microscopic measurement system uses Wollaston prism as an optical polarizer, for changing HeNe laser into linearly polarized light, then causes the linearly polarized light to pass through a photoelastic modulator with an included angle of 45 DEG, according to the optical theory, the polarized light is changed into left-and right-handed circularly polarized light modulated in 50 kHz, circularly polarized light irradiates samples, spin polarization electrons are generated in the samples. Under the drive of reverse electric field, ferromagnetic metal injects the spin polarization electrons to a semiconductor, but since the semiconductor has 50% spin polarization electrons under theirradiation of the circularly polarized light, thereby generating magnetoresistance effect on the injected spin polarization electrons; under the drive of positive electric field, the spin polarization ...

Absorption, reflection or transmission spectrum system having no stability requirement for excitation light source

The invention relates to an absorption, reflection or transmission spectrum system having no stability requirement for an excitation light source, comprising a light source, a light splitter, an excitation light source focusing element, a light beam splitter, a light intensity meter, a sample, a signal light collecting element, a detector and a computer. The light splitter is positioned at the rear of the light source and used for chromatically dispersing wide-spectrum light source emitted by the light source into a narrow-band light source or a monochromatic light source; the excitation light source focusing element is positioned at the rear of the light splitter and used for focusing the excitation light source split by the light splitter onto the sample to be tested; the light beam splitter is positioned at the rear of the excitation light source focusing element and used for reflecting part of the excitation light source split by the light splitter towards another direction and enabling ...