Method and system for surface deformation detection
Номер патента: EP4352634A1
Опубликовано: 17-04-2024
Автор(ы): Eric Leonard Ferguson, Lloyd Noel WINDRIM, Nasir Ahsan, Suchet Bargoti, Toby Francis Dunne, Yuze Gong
Принадлежит: Abyss Solutions Pty Ltd
Опубликовано: 17-04-2024
Автор(ы): Eric Leonard Ferguson, Lloyd Noel WINDRIM, Nasir Ahsan, Suchet Bargoti, Toby Francis Dunne, Yuze Gong
Принадлежит: Abyss Solutions Pty Ltd
Реферат: Disclosed is a method and system for detecting surface deformation of a production asset. The method and system may include receiving a point cloud for a surface of the production asset; determining a model surface for the production asset from the point cloud, the model surface being an estimate of a deformation free representation of the surface of the production asset, the model surface being determined from points in the point cloud including points representing a surface deformation; determining a distance between at least one point in the point cloud and the model surface; and outputting the distance.
Image analysis method and image analysis system for server
Номер патента: US20190066282A1. Автор: Kuang-Hui Wu,Huang-Mu Chen. Владелец: Chiun Mai Communication Systems Inc. Дата публикации: 2019-02-28.